Evil SteVe: An Approach to Simplify Penetration Testing of OCPP Charge Points
L.H. Gebauer, H. Trsek, G. Lukas, in: 2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA), IEEE, Piscataway, NJ, 2022.

Am I Done Learning? - Determining Learning States in Adaptive Assembly Systems
P. Sehr, N. Moriz, M. Heinz-Jakobs, H. Trsek, in: 2022 27th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA), IEEE, Piscataway, NJ, 2022.

Towards an Industrial Converged Network with OPC UA PubSub and TSN
O. Konradi, A. Mankowski, L. Wisniewski, H. Trsek, in: 2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA), IEEE, Piscataway, NJ, 2022.