Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests
A.R. Shukla, R. Martin, R. Probst, J. Song, Microelectronics Reliability 150 (2023).

Prediction of failure in time (FIT) of electrical connectors with short term tests
J. Song, A.R. Shukla, R. Probst, Microelectronics Reliabilityf: An Internat. Journal &; World Abstracting Service 138 (2022).

The influence of thermal cycling test parameters on the failure rate of electrical connectors
K. Krüger, J. Song, Microelectronics Reliabilityf: An Internat. Journal &; World Abstracting Service 138 (2022).

The influence of the vibration test mode on the failure rate of electrical connectors
K. Krüger, H. Yuan, J. Song, Microelectronics Reliabilityf: An Internat. Journal &; World Abstracting Service 135 (2022).