@misc{9211,
  abstract     = {{Lifetime tests of connectors are time consuming and labor intensive. Our study reveals a strong correlation between the statistical characteristics of contact resistance development in the early stages of lifetime tests and the final results of the tests. This correlation enables a further time lapse of lifetime tests and the prediction of the state of the health of connectors which can be utilized in the development of diagnostic strategy in sophisticated networks with very high number of connectors as well as in a quick classification of connectors with respect to their design features. Methods of statistical evaluation are introduced and the sensitivity analyses of different characteristics for the state of health of connectors are conducted.}},
  author       = {{Song, Jian and Shukla, Abhay Rammurti and Probst, Roman}},
  booktitle    = {{Electrical contacts - 2022 : proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts}},
  isbn         = {{978-1-6654-5966-2}},
  issn         = {{2158-9992}},
  keywords     = {{Connectors, Correlation, Sensitivity analysis, Contact resistance, Lifetime estimation, Reliability, Electrical resistance measurement}},
  location     = {{Tampa, FL, USA}},
  pages        = {{272 -- 278}},
  publisher    = {{IEEE}},
  title        = {{{State of Health of Connectors – Early Indicators}}},
  doi          = {{10.1109/HLM54538.2022.9969839}},
  year         = {{2022}},
}

@misc{9213,
  abstract     = {{The function and reliability of electrical connectors in automotive applications is crucial for vehicle safety, especially with regard to E-mobility and autonomous driving. For this reason, electrical connectors are being developed for long-term use applications. However, a small amount of function failures are still being observed in long-term use field vehicles. In this study all electrical connectors of five long-term driven vehicles from various car manufacturers are disassembled and analyzed. The same analysis procedure is followed for every vehicle and the electrical resistance of the connectors is measured to determine electrical failures. The contacts of failed connectors are further analyzed using optical microscopy, XRF spectroscopy, EDS and detailed contact resistance mapping. By comparing the connectors with electrical failures to the same types of connectors with a proper electrical resistance, failure mechanisms can be detected and analyzed. The frequency of various failure mechanisms is statistically evaluated. The results of the analysis provide valuable indications with respect to improvement of the reliability of connectors.}},
  author       = {{Hilmert, Dirk and Yuan, Haomiao and Song, Jian}},
  booktitle    = {{Electrical contacts - 2022 : proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts}},
  isbn         = {{978-1-6654-5966-2}},
  issn         = {{2158-9992}},
  keywords     = {{Connectors, Resistance, Spectroscopy, Optical microscopy, Microscopy, Vehicle safety, Failure analysis}},
  location     = {{Tampa, FL, USA}},
  pages        = {{9 -- 16}},
  publisher    = {{IEEE}},
  title        = {{{The Analysis of Failure Mechanisms of Electrical Connectors in Long-term Use Field Vehicles}}},
  doi          = {{10.1109/HLM54538.2022.9969820}},
  year         = {{2022}},
}