---
_id: '10787'
abstract:
- lang: eng
  text: Cyber-physical production systems have emerged with the rise of Industry 4.0
    in different industrial fields. Especially the food sector, where inhomogeneous
    input products like beer/yeast suspensions with different qualities and properties
    have yet slowed down automation, has potential for this evolution. This contribution
    presents optimization methods for a dynamical cross-flow filtration plant which
    is driven by an advanced control concept in combination with data driven product
    monitoring via inline near infrared spectroscopy (NIR) in order to improve energy
    savings and filtration performance. Using a hierarchical control and optimization
    structure, the non stationary batch process is steered towards a high production
    rate with low energy consumption for a variety of different input products.
author:
- first_name: Jörn
  full_name: Tebbe, Jörn
  id: '79072'
  last_name: Tebbe
- first_name: Thomas
  full_name: Pawlik, Thomas
  id: '58915'
  last_name: Pawlik
- first_name: Marc
  full_name: Trilling-Haasler, Marc
  id: '81622'
  last_name: Trilling-Haasler
  orcid: 0000-0002-3685-6383
- first_name: Jannis
  full_name: Löbner, Jannis
  id: '74097'
  last_name: Löbner
- first_name: Markus
  full_name: Lange-Hegermann, Markus
  id: '71761'
  last_name: Lange-Hegermann
- first_name: Jan
  full_name: Schneider, Jan
  id: '13209'
  last_name: Schneider
  orcid: 0000-0001-6401-8873
citation:
  ama: Tebbe J, Pawlik T, Trilling-Haasler M, Löbner J, Lange-Hegermann M, Schneider
    J. <i>Holistic Optimization of a Dynamic Cross-Flow Filtration Process towards
    a Cyber-Physical System</i>. (Jasperneite J, Wisniewski L, Fung Man K, Institute
    of Electrical and Electronics Engineers , eds.). IEEE; 2023:1-7. doi:<a href="https://doi.org/10.1109/INDIN51400.2023.10217913">10.1109/INDIN51400.2023.10217913</a>
  apa: Tebbe, J., Pawlik, T., Trilling-Haasler, M., Löbner, J., Lange-Hegermann, M.,
    &#38; Schneider, J. (2023). Holistic optimization of a dynamic cross-flow filtration
    process towards a cyber-physical system. In J. Jasperneite, L. Wisniewski, K.
    Fung Man, &#38; Institute of Electrical and Electronics Engineers  (Eds.), <i>2023
    IEEE 21st International Conference on Industrial Informatics (INDIN)</i> (pp.
    1–7). IEEE. <a href="https://doi.org/10.1109/INDIN51400.2023.10217913">https://doi.org/10.1109/INDIN51400.2023.10217913</a>
  bjps: '<b>Tebbe J <i>et al.</i></b> (2023) <i>Holistic Optimization of a Dynamic
    Cross-Flow Filtration Process towards a Cyber-Physical System</i>, Jasperneite
    J et al. (eds). [Piscataway, NJ]: IEEE.'
  chicago: 'Tebbe, Jörn, Thomas Pawlik, Marc Trilling-Haasler, Jannis Löbner, Markus
    Lange-Hegermann, and Jan Schneider. <i>Holistic Optimization of a Dynamic Cross-Flow
    Filtration Process towards a Cyber-Physical System</i>. Edited by Jürgen Jasperneite,
    Lukasz Wisniewski, Kim Fung Man, and Institute of Electrical and Electronics Engineers
    . <i>2023 IEEE 21st International Conference on Industrial Informatics (INDIN)</i>.
    [Piscataway, NJ]: IEEE, 2023. <a href="https://doi.org/10.1109/INDIN51400.2023.10217913">https://doi.org/10.1109/INDIN51400.2023.10217913</a>.'
  chicago-de: 'Tebbe, Jörn, Thomas Pawlik, Marc Trilling-Haasler, Jannis Löbner, Markus
    Lange-Hegermann und Jan Schneider. 2023. <i>Holistic optimization of a dynamic
    cross-flow filtration process towards a cyber-physical system</i>. Hg. von Jürgen
    Jasperneite, Lukasz Wisniewski, Kim Fung Man, und Institute of Electrical and
    Electronics Engineers . <i>2023 IEEE 21st International Conference on Industrial
    Informatics (INDIN)</i>. [Piscataway, NJ]: IEEE. doi:<a href="https://doi.org/10.1109/INDIN51400.2023.10217913">10.1109/INDIN51400.2023.10217913</a>,
    .'
  din1505-2-1: '<span style="font-variant:small-caps;">Tebbe, Jörn</span> ; <span
    style="font-variant:small-caps;">Pawlik, Thomas</span> ; <span style="font-variant:small-caps;">Trilling-Haasler,
    Marc</span> ; <span style="font-variant:small-caps;">Löbner, Jannis</span> ; <span
    style="font-variant:small-caps;">Lange-Hegermann, Markus</span> ; <span style="font-variant:small-caps;">Schneider,
    Jan</span> ; <span style="font-variant:small-caps;">Jasperneite, J.</span> ; <span
    style="font-variant:small-caps;">Wisniewski, L.</span> ; <span style="font-variant:small-caps;">Fung
    Man, K.</span> ; <span style="font-variant:small-caps;">Institute of Electrical
    and Electronics Engineers </span> (Hrsg.): <i>Holistic optimization of a dynamic
    cross-flow filtration process towards a cyber-physical system</i>. [Piscataway,
    NJ] : IEEE, 2023'
  havard: J. Tebbe, T. Pawlik, M. Trilling-Haasler, J. Löbner, M. Lange-Hegermann,
    J. Schneider, Holistic optimization of a dynamic cross-flow filtration process
    towards a cyber-physical system, IEEE, [Piscataway, NJ], 2023.
  ieee: 'J. Tebbe, T. Pawlik, M. Trilling-Haasler, J. Löbner, M. Lange-Hegermann,
    and J. Schneider, <i>Holistic optimization of a dynamic cross-flow filtration
    process towards a cyber-physical system</i>. [Piscataway, NJ]: IEEE, 2023, pp.
    1–7. doi: <a href="https://doi.org/10.1109/INDIN51400.2023.10217913">10.1109/INDIN51400.2023.10217913</a>.'
  mla: Tebbe, Jörn, et al. “Holistic Optimization of a Dynamic Cross-Flow Filtration
    Process towards a Cyber-Physical System.” <i>2023 IEEE 21st International Conference
    on Industrial Informatics (INDIN)</i>, edited by Jürgen Jasperneite et al., IEEE,
    2023, pp. 1–7, <a href="https://doi.org/10.1109/INDIN51400.2023.10217913">https://doi.org/10.1109/INDIN51400.2023.10217913</a>.
  short: J. Tebbe, T. Pawlik, M. Trilling-Haasler, J. Löbner, M. Lange-Hegermann,
    J. Schneider, Holistic Optimization of a Dynamic Cross-Flow Filtration Process
    towards a Cyber-Physical System, IEEE, [Piscataway, NJ], 2023.
  ufg: '<b>Tebbe, Jörn u. a.</b>: Holistic optimization of a dynamic cross-flow filtration
    process towards a cyber-physical system, hg. von Jasperneite, Jürgen u. a., [Piscataway,
    NJ] 2023.'
  van: 'Tebbe J, Pawlik T, Trilling-Haasler M, Löbner J, Lange-Hegermann M, Schneider
    J. Holistic optimization of a dynamic cross-flow filtration process towards a
    cyber-physical system. Jasperneite J, Wisniewski L, Fung Man K, Institute of Electrical
    and Electronics Engineers , editors. 2023 IEEE 21st International Conference on
    Industrial Informatics (INDIN). [Piscataway, NJ]: IEEE; 2023.'
conference:
  end_date: 2023-07-20
  location: Lemgo
  name: 21st International Conference on Industrial Informatics ; INDIN 2023
  start_date: 2023-07-17
corporate_editor:
- 'Institute of Electrical and Electronics Engineers '
date_created: 2023-11-21T08:04:41Z
date_updated: 2025-06-26T07:48:22Z
department:
- _id: DEP4018
- _id: DEP1308
- _id: DEP4028
doi: 10.1109/INDIN51400.2023.10217913
editor:
- first_name: Jürgen
  full_name: Jasperneite, Jürgen
  id: '1899'
  last_name: Jasperneite
- first_name: Lukasz
  full_name: Wisniewski, Lukasz
  id: '1710'
  last_name: Wisniewski
- first_name: Kim
  full_name: Fung Man, Kim
  last_name: Fung Man
keyword:
- Spectroscopy
- Production systems
- Filtration
- Velocity control
- Optimization methods
- Cyber-physical systems
- Nonhomogeneous media
language:
- iso: eng
page: 1-7
place: '[Piscataway, NJ]'
publication: 2023 IEEE 21st International Conference on Industrial Informatics (INDIN)
publication_identifier:
  eisbn:
  - 978-1-6654-9313-0
  isbn:
  - '978-1-6654-9314-7 '
  issn:
  - 1935-4576
publication_status: published
publisher: IEEE
status: public
title: Holistic optimization of a dynamic cross-flow filtration process towards a
  cyber-physical system
type: conference_editor_article
user_id: '83781'
year: '2023'
...
---
_id: '10788'
abstract:
- lang: eng
  text: For process monitoring, an adequate data preprocessing is crucial to link
    accessible inline process data with offline measured target variables. Literature,
    however, does not provide systematic preprocessing strategies. The effects of
    five different preprocessing strategies on data from a Dielectric Spectroscopy
    system applied to the Viable Cell Density (VCD) of a mammalian cell cultivation
    were thus evaluated. Single-frequency measurements are typically used to model
    the VCD over the growth phase using linear regression or the Cole-Cole model and
    served as a reference. As multi-frequency measurement is promising to model the
    VCD beyond the growth phase using Partial Least Squares Regression (PLSR), we
    further aimed to determine, whether replacing linear regression by PLSR shows
    comparable modeling performance. All five preprocessing strategies led to comparable
    results. Exemplary, when using capacitance values at a frequency of 3347 kHz,
    linear regression resulted in a R2 of 0.90 and a standard deviation of 0.4 % on
    average. Both normalization techniques had the same positive effect on the results
    of PLSR. The order of smoothing and normalization was irrelevant for both regression
    methods. Comparing the results of linear regression and PLSR, the latter obtained
    on average 9 % better results. Therefore, we concluded that PLSR is preferable
    over linear regression and is potentially suitable to model the VCD beyond the
    growth phase, which is suggested to be investigated based on more data sets.
author:
- first_name: Selina
  full_name: Ramm, Selina
  id: '68713'
  last_name: Ramm
  orcid: https://orcid.org/0000-0002-0502-8032
- first_name: Tanja
  full_name: Hernández Rodriguez, Tanja
  id: '52466'
  last_name: Hernández Rodriguez
- first_name: Björn
  full_name: Frahm, Björn
  id: '45666'
  last_name: Frahm
- first_name: Miriam
  full_name: Pein-Hackelbusch, Miriam
  id: '64952'
  last_name: Pein-Hackelbusch
  orcid: 0000-0002-7920-0595
citation:
  ama: Ramm S, Hernández Rodriguez T, Frahm B, Pein-Hackelbusch M. <i>Systematic Preprocessing
    of Dielectric Spectroscopy Data and Estimating Viable Cell Densities</i>. (Jasperneite
    J, Wisniewski L, Fung Man K, Institute of Electrical and Electronics Engineers
    , eds.). IEEE; 2023:1-6. doi:<a href="https://doi.org/10.1109/INDIN51400.2023.10218012">10.1109/INDIN51400.2023.10218012</a>
  apa: Ramm, S., Hernández Rodriguez, T., Frahm, B., &#38; Pein-Hackelbusch, M. (2023).
    Systematic Preprocessing of Dielectric Spectroscopy Data and Estimating Viable
    Cell Densities. In J. Jasperneite, L. Wisniewski, K. Fung Man, &#38; Institute
    of Electrical and Electronics Engineers  (Eds.), <i>2023 IEEE 21st International
    Conference on Industrial Informatics (INDIN)</i> (pp. 1–6). IEEE. <a href="https://doi.org/10.1109/INDIN51400.2023.10218012">https://doi.org/10.1109/INDIN51400.2023.10218012</a>
  bjps: '<b>Ramm S <i>et al.</i></b> (2023) <i>Systematic Preprocessing of Dielectric
    Spectroscopy Data and Estimating Viable Cell Densities</i>, Jasperneite J et al.
    (eds). [Piscataway, NJ]: IEEE.'
  chicago: 'Ramm, Selina, Tanja Hernández Rodriguez, Björn Frahm, and Miriam Pein-Hackelbusch.
    <i>Systematic Preprocessing of Dielectric Spectroscopy Data and Estimating Viable
    Cell Densities</i>. Edited by Jürgen Jasperneite, Lukasz Wisniewski, Kim Fung
    Man, and Institute of Electrical and Electronics Engineers . <i>2023 IEEE 21st
    International Conference on Industrial Informatics (INDIN)</i>. [Piscataway, NJ]:
    IEEE, 2023. <a href="https://doi.org/10.1109/INDIN51400.2023.10218012">https://doi.org/10.1109/INDIN51400.2023.10218012</a>.'
  chicago-de: 'Ramm, Selina, Tanja Hernández Rodriguez, Björn Frahm und Miriam Pein-Hackelbusch.
    2023. <i>Systematic Preprocessing of Dielectric Spectroscopy Data and Estimating
    Viable Cell Densities</i>. Hg. von Jürgen Jasperneite, Lukasz Wisniewski, Kim
    Fung Man, und Institute of Electrical and Electronics Engineers . <i>2023 IEEE
    21st International Conference on Industrial Informatics (INDIN)</i>. [Piscataway,
    NJ]: IEEE. doi:<a href="https://doi.org/10.1109/INDIN51400.2023.10218012">10.1109/INDIN51400.2023.10218012</a>,
    .'
  din1505-2-1: '<span style="font-variant:small-caps;">Ramm, Selina</span> ; <span
    style="font-variant:small-caps;">Hernández Rodriguez, Tanja</span> ; <span style="font-variant:small-caps;">Frahm,
    Björn</span> ; <span style="font-variant:small-caps;">Pein-Hackelbusch, Miriam</span>
    ; <span style="font-variant:small-caps;">Jasperneite, J.</span> ; <span style="font-variant:small-caps;">Wisniewski,
    L.</span> ; <span style="font-variant:small-caps;">Fung Man, K.</span> ; <span
    style="font-variant:small-caps;">Institute of Electrical and Electronics Engineers
    </span> (Hrsg.): <i>Systematic Preprocessing of Dielectric Spectroscopy Data and
    Estimating Viable Cell Densities</i>. [Piscataway, NJ] : IEEE, 2023'
  havard: S. Ramm, T. Hernández Rodriguez, B. Frahm, M. Pein-Hackelbusch, Systematic
    Preprocessing of Dielectric Spectroscopy Data and Estimating Viable Cell Densities,
    IEEE, [Piscataway, NJ], 2023.
  ieee: 'S. Ramm, T. Hernández Rodriguez, B. Frahm, and M. Pein-Hackelbusch, <i>Systematic
    Preprocessing of Dielectric Spectroscopy Data and Estimating Viable Cell Densities</i>.
    [Piscataway, NJ]: IEEE, 2023, pp. 1–6. doi: <a href="https://doi.org/10.1109/INDIN51400.2023.10218012">10.1109/INDIN51400.2023.10218012</a>.'
  mla: Ramm, Selina, et al. “Systematic Preprocessing of Dielectric Spectroscopy Data
    and Estimating Viable Cell Densities.” <i>2023 IEEE 21st International Conference
    on Industrial Informatics (INDIN)</i>, edited by Jürgen Jasperneite et al., IEEE,
    2023, pp. 1–6, <a href="https://doi.org/10.1109/INDIN51400.2023.10218012">https://doi.org/10.1109/INDIN51400.2023.10218012</a>.
  short: S. Ramm, T. Hernández Rodriguez, B. Frahm, M. Pein-Hackelbusch, Systematic
    Preprocessing of Dielectric Spectroscopy Data and Estimating Viable Cell Densities,
    IEEE, [Piscataway, NJ], 2023.
  ufg: '<b>Ramm, Selina u. a.</b>: Systematic Preprocessing of Dielectric Spectroscopy
    Data and Estimating Viable Cell Densities, hg. von Jasperneite, Jürgen u. a.,
    [Piscataway, NJ] 2023.'
  van: 'Ramm S, Hernández Rodriguez T, Frahm B, Pein-Hackelbusch M. Systematic Preprocessing
    of Dielectric Spectroscopy Data and Estimating Viable Cell Densities. Jasperneite
    J, Wisniewski L, Fung Man K, Institute of Electrical and Electronics Engineers
    , editors. 2023 IEEE 21st International Conference on Industrial Informatics (INDIN).
    [Piscataway, NJ]: IEEE; 2023.'
conference:
  end_date: 2023-07-20
  location: Lemgo
  name: 21st International Conference on Industrial Informatics (INDIN)
  start_date: 2023-07-18
corporate_editor:
- 'Institute of Electrical and Electronics Engineers '
date_created: 2023-11-21T08:17:12Z
date_updated: 2025-04-29T07:38:03Z
department:
- _id: DEP4022
- _id: DEP4028
doi: 10.1109/INDIN51400.2023.10218012
editor:
- first_name: Jürgen
  full_name: Jasperneite, Jürgen
  id: '1899'
  last_name: Jasperneite
- first_name: Lukasz
  full_name: Wisniewski, Lukasz
  id: '1710'
  last_name: Wisniewski
- first_name: Kim
  full_name: Fung Man, Kim
  last_name: Fung Man
keyword:
- Spectroscopy
- Smoothing methods
- Systematics
- Phase measurement
- Linear regression
- Data models
- Dielectric measurement
language:
- iso: eng
main_file_link:
- open_access: '1'
  url: https://ieeexplore.ieee.org/document/10218012
oa: '1'
page: 1-6
place: '[Piscataway, NJ]'
publication: 2023 IEEE 21st International Conference on Industrial Informatics (INDIN)
publication_identifier:
  eisbn:
  - 978-1-6654-9313-0
  isbn:
  - 978-1-6654-9314-7
  issn:
  - 1935-4576
publication_status: published
publisher: IEEE
status: public
title: Systematic Preprocessing of Dielectric Spectroscopy Data and Estimating Viable
  Cell Densities
type: conference_editor_article
user_id: '83781'
year: '2023'
...
---
_id: '12706'
abstract:
- lang: eng
  text: Vaseline, also referred to as petrolatum, is a colloidal dispersion of liquid-crystalline
    structures of hydrocarbons derived from petroleum. It has long been recognized
    for its versatile applications in the pharmaceutical industry, with its use in
    the formulation of various topical medications, wound care products, and drug
    delivery systems. For pharmaceutical use, petrolatum has to meet the quality standards
    described in its Pharmacopoeia monograph. The comprised test ranges allow for
    a broad range of Vaseline qualities on the market, while the tests themselves
    only poorly discriminate between grades. The only differentiating properties are
    related to the melting behavior, which is tested via drop point analysis, and
    the consistency, addressed in the functionality-related characteristics section.
    In this study, we propose the hypothesis that Near-infrared spectroscopy (NIRS)
    could be a comparably simple method to evaluate the crystalline behavior of Vaseline
    qualities. We expect such information to provide additional details for Vaseline
    quality discrimination. This discrimination would allow the most suitable petroleum
    jelly to be selected for an existing formulation when the previous one needs to
    be replaced; for example, due to a manufacturer change. We demonstrate that NIRS
    in transmission and reflectance mode obtained by traditional continuous spectra
    acquisition and fragmented NIR spectra acquisition through multi-optical, multi-modal
    excitation, respectively, can both serve as a basis for detecting Vaseline quality
    differences, which we have further proven by thermal analysis and tests with semisolid
    formulations. Additionally, we demonstrate that a lower-cost multi-optical spectrometer
    in reflectance mode can detect Vaseline quality differences in rotated samples.
author:
- first_name: Niels Hendrik
  full_name: Fliedner, Niels Hendrik
  last_name: Fliedner
- first_name: Volker
  full_name: Lohweg, Volker
  last_name: Lohweg
- first_name: Claudia
  full_name: Al-Karawi, Claudia
  last_name: Al-Karawi
- first_name: Miriam
  full_name: Pein-Hackelbusch, Miriam
  last_name: Pein-Hackelbusch
citation:
  ama: Fliedner NH, Lohweg V, Al-Karawi C, Pein-Hackelbusch M. <i>A Novel Spectroscopic
    Approach for Vaseline Quality Discrimination</i>. (Dörksen H, Scanzio S, Jasperneite
    J, et al., eds.). IEEE; 2023. doi:<a href="https://doi.org/10.1109/indin51400.2023.10218318">10.1109/indin51400.2023.10218318</a>
  apa: Fliedner, N. H., Lohweg, V., Al-Karawi, C., &#38; Pein-Hackelbusch, M. (2023).
    A Novel Spectroscopic Approach for Vaseline Quality Discrimination. In H. Dörksen,
    S. Scanzio, J. Jasperneite, L. Wisniewski, K. F. Man, T. Sauter, L. Seno, H. Trsek,
    V. Vyatkin, &#38; Institute of Electrical and Electronics Engineers  (Eds.), <i>2023
    IEEE 21st International Conference on Industrial Informatics (INDIN)</i>. IEEE.
    <a href="https://doi.org/10.1109/indin51400.2023.10218318">https://doi.org/10.1109/indin51400.2023.10218318</a>
  bjps: '<b>Fliedner NH <i>et al.</i></b> (2023) <i>A Novel Spectroscopic Approach
    for Vaseline Quality Discrimination</i>, Dörksen H et al. (eds). [Piscataway,
    NJ] : IEEE.'
  chicago: 'Fliedner, Niels Hendrik, Volker Lohweg, Claudia Al-Karawi, and Miriam
    Pein-Hackelbusch. <i>A Novel Spectroscopic Approach for Vaseline Quality Discrimination</i>.
    Edited by Helene Dörksen, Stefano  Scanzio, Jürgen Jasperneite, Lukasz Wisniewski,
    Kim Fung  Man, Thilo  Sauter, Lucia  Seno, Henning Trsek, Valeriy  Vyatkin, and
    Institute of Electrical and Electronics Engineers . <i>2023 IEEE 21st International
    Conference on Industrial Informatics (INDIN)</i>. [Piscataway, NJ] : IEEE, 2023.
    <a href="https://doi.org/10.1109/indin51400.2023.10218318">https://doi.org/10.1109/indin51400.2023.10218318</a>.'
  chicago-de: 'Fliedner, Niels Hendrik, Volker Lohweg, Claudia Al-Karawi und Miriam
    Pein-Hackelbusch. 2023. <i>A Novel Spectroscopic Approach for Vaseline Quality
    Discrimination</i>. Hg. von Helene Dörksen, Stefano  Scanzio, Jürgen Jasperneite,
    Lukasz Wisniewski, Kim Fung  Man, Thilo  Sauter, Lucia  Seno, Henning Trsek, Valeriy  Vyatkin,
    und Institute of Electrical and Electronics Engineers . <i>2023 IEEE 21st International
    Conference on Industrial Informatics (INDIN)</i>. [Piscataway, NJ] : IEEE. doi:<a
    href="https://doi.org/10.1109/indin51400.2023.10218318">10.1109/indin51400.2023.10218318</a>,
    .'
  din1505-2-1: '<span style="font-variant:small-caps;">Fliedner, Niels Hendrik</span>
    ; <span style="font-variant:small-caps;">Lohweg, Volker</span> ; <span style="font-variant:small-caps;">Al-Karawi,
    Claudia</span> ; <span style="font-variant:small-caps;">Pein-Hackelbusch, Miriam</span>
    ; <span style="font-variant:small-caps;"><span style="font-variant:small-caps;">Dörksen,
    H.</span> ; <span style="font-variant:small-caps;">Scanzio, S.</span> ; <span
    style="font-variant:small-caps;">Jasperneite, J.</span> ; <span style="font-variant:small-caps;">Wisniewski,
    L.</span> ; <span style="font-variant:small-caps;">Man, K. F.</span> ; <span style="font-variant:small-caps;">Sauter,
    T.</span> ; <span style="font-variant:small-caps;">Seno, L.</span> ; <span style="font-variant:small-caps;">Trsek,
    H.</span> ; u. a.</span> (Hrsg.): <i>A Novel Spectroscopic Approach for Vaseline
    Quality Discrimination</i>. [Piscataway, NJ]  : IEEE, 2023'
  havard: N.H. Fliedner, V. Lohweg, C. Al-Karawi, M. Pein-Hackelbusch, A Novel Spectroscopic
    Approach for Vaseline Quality Discrimination, IEEE, [Piscataway, NJ] , 2023.
  ieee: 'N. H. Fliedner, V. Lohweg, C. Al-Karawi, and M. Pein-Hackelbusch, <i>A Novel
    Spectroscopic Approach for Vaseline Quality Discrimination</i>. [Piscataway, NJ]
    : IEEE, 2023. doi: <a href="https://doi.org/10.1109/indin51400.2023.10218318">10.1109/indin51400.2023.10218318</a>.'
  mla: Fliedner, Niels Hendrik, et al. “A Novel Spectroscopic Approach for Vaseline
    Quality Discrimination.” <i>2023 IEEE 21st International Conference on Industrial
    Informatics (INDIN)</i>, edited by Helene Dörksen et al., IEEE, 2023, <a href="https://doi.org/10.1109/indin51400.2023.10218318">https://doi.org/10.1109/indin51400.2023.10218318</a>.
  short: N.H. Fliedner, V. Lohweg, C. Al-Karawi, M. Pein-Hackelbusch, A Novel Spectroscopic
    Approach for Vaseline Quality Discrimination, IEEE, [Piscataway, NJ] , 2023.
  ufg: '<b>Fliedner, Niels Hendrik u. a.</b>: A Novel Spectroscopic Approach for Vaseline
    Quality Discrimination, hg. von Dörksen, Helene u. a., [Piscataway, NJ]  2023.'
  van: 'Fliedner NH, Lohweg V, Al-Karawi C, Pein-Hackelbusch M. A Novel Spectroscopic
    Approach for Vaseline Quality Discrimination. Dörksen H, Scanzio S, Jasperneite
    J, Wisniewski L, Man KF, Sauter T, et al., editors. 2023 IEEE 21st International
    Conference on Industrial Informatics (INDIN). [Piscataway, NJ] : IEEE; 2023.'
conference:
  end_date: 2023-07-20
  location: Lemgo
  name: 21st International Conference on Industrial Informatics (INDIN 2023)
  start_date: 2023-07-18
corporate_editor:
- 'Institute of Electrical and Electronics Engineers '
date_created: 2025-03-13T13:48:58Z
date_updated: 2025-03-13T14:44:34Z
department:
- _id: DEP5019
- _id: DEP5023
doi: 10.1109/indin51400.2023.10218318
editor:
- first_name: Helene
  full_name: Dörksen, Helene
  id: '46416'
  last_name: Dörksen
- first_name: 'Stefano '
  full_name: 'Scanzio, Stefano '
  last_name: Scanzio
- first_name: Jürgen
  full_name: Jasperneite, Jürgen
  id: '1899'
  last_name: Jasperneite
- first_name: Lukasz
  full_name: Wisniewski, Lukasz
  id: '1710'
  last_name: Wisniewski
- first_name: 'Kim Fung '
  full_name: 'Man, Kim Fung '
  last_name: Man
- first_name: 'Thilo '
  full_name: 'Sauter, Thilo '
  last_name: Sauter
- first_name: 'Lucia '
  full_name: 'Seno, Lucia '
  last_name: Seno
- first_name: Henning
  full_name: Trsek, Henning
  id: '1486'
  last_name: Trsek
  orcid: 0000-0002-0133-0656
- first_name: 'Valeriy '
  full_name: 'Vyatkin, Valeriy '
  last_name: Vyatkin
keyword:
- multimodal sensing
- crystalline materials
- microstructure
- rotation measurement
- PCA
- calorimetry
- pharmaceuticals
- European Pharmacopoeia
language:
- iso: eng
place: '[Piscataway, NJ] '
publication: 2023 IEEE 21st International Conference on Industrial Informatics (INDIN)
publication_identifier:
  eisbn:
  - 978-1-6654-9313-0
  isbn:
  - 978-1-6654-9314-7
publication_status: published
publisher: IEEE
quality_controlled: '1'
status: public
title: A Novel Spectroscopic Approach for Vaseline Quality Discrimination
type: conference_editor_article
user_id: '83781'
year: '2023'
...
---
_id: '12995'
abstract:
- lang: eng
  text: Due to Industry 4.0 developments, the demanded modularity of manufacturing
    systems generates additional manual efforts for security experts to guarantee
    a secure operation. The rising utilization of information and the frequent changes
    of system structures necessitate a continuous and automated security engineering,
    especially by application of the mandatory security risk assessments. Collecting
    the required information for these assessments and formalising expert knowledge
    shall improve the security of modular manufacturing systems in the future. In
    order to automate the security risk assessment process, this work proposes a method
    to determine the Target Security Level (SL-T) in conformance to the IEC 62443
    standard based on the MITRE ATT&CK framework and the Intel Threat Agent Library
    (TAL).
author:
- first_name: Marco
  full_name: Ehrlich, Marco
  id: '61562'
  last_name: Ehrlich
- first_name: Andre
  full_name: Bröring, Andre
  id: '65130'
  last_name: Bröring
- first_name: Christian
  full_name: Diedrich, Christian
  last_name: Diedrich
- first_name: Jürgen
  full_name: Jasperneite, Jürgen
  id: '1899'
  last_name: Jasperneite
- first_name: Wolfgang
  full_name: Kastner, Wolfgang
  last_name: Kastner
- first_name: Henning
  full_name: Trsek, Henning
  id: '1486'
  last_name: Trsek
  orcid: 0000-0002-0133-0656
citation:
  ama: Ehrlich M, Bröring A, Diedrich C, Jasperneite J, Kastner W, Trsek H. <i>Determining
    the Target Security Level for Automated Security Risk Assessments</i>. (Jasperneite
    J, Institute of Electrical and Electronics Engineers, eds.). IEEE; 2023. doi:<a
    href="https://doi.org/10.1109/indin51400.2023.10217902">10.1109/indin51400.2023.10217902</a>
  apa: 'Ehrlich, M., Bröring, A., Diedrich, C., Jasperneite, J., Kastner, W., &#38;
    Trsek, H. (2023). Determining the Target Security Level for Automated Security
    Risk Assessments. In J. Jasperneite &#38; Institute of Electrical and Electronics
    Engineers (Eds.), <i>2023 IEEE 21st International Conference on Industrial Informatics :
    INDIN 2023 : 17-20 July 2023, Lemgo, Germany</i>. IEEE. <a href="https://doi.org/10.1109/indin51400.2023.10217902">https://doi.org/10.1109/indin51400.2023.10217902</a>'
  bjps: '<b>Ehrlich M <i>et al.</i></b> (2023) <i>Determining the Target Security
    Level for Automated Security Risk Assessments</i>, Jasperneite J and Institute
    of Electrical and Electronics Engineers (eds). [Piscataway, NJ]: IEEE.'
  chicago: 'Ehrlich, Marco, Andre Bröring, Christian Diedrich, Jürgen Jasperneite,
    Wolfgang Kastner, and Henning Trsek. <i>Determining the Target Security Level
    for Automated Security Risk Assessments</i>. Edited by Jürgen Jasperneite and
    Institute of Electrical and Electronics Engineers. <i>2023 IEEE 21st International
    Conference on Industrial Informatics : INDIN 2023 : 17-20 July 2023, Lemgo, Germany</i>.
    [Piscataway, NJ]: IEEE, 2023. <a href="https://doi.org/10.1109/indin51400.2023.10217902">https://doi.org/10.1109/indin51400.2023.10217902</a>.'
  chicago-de: 'Ehrlich, Marco, Andre Bröring, Christian Diedrich, Jürgen Jasperneite,
    Wolfgang Kastner und Henning Trsek. 2023. <i>Determining the Target Security Level
    for Automated Security Risk Assessments</i>. Hg. von Jürgen Jasperneite und Institute
    of Electrical and Electronics Engineers. <i>2023 IEEE 21st International Conference
    on Industrial Informatics : INDIN 2023 : 17-20 July 2023, Lemgo, Germany</i>.
    [Piscataway, NJ]: IEEE. doi:<a href="https://doi.org/10.1109/indin51400.2023.10217902">10.1109/indin51400.2023.10217902</a>,
    .'
  din1505-2-1: '<span style="font-variant:small-caps;">Ehrlich, Marco</span> ; <span
    style="font-variant:small-caps;">Bröring, Andre</span> ; <span style="font-variant:small-caps;">Diedrich,
    Christian</span> ; <span style="font-variant:small-caps;">Jasperneite, Jürgen</span>
    ; <span style="font-variant:small-caps;">Kastner, Wolfgang</span> ; <span style="font-variant:small-caps;">Trsek,
    Henning</span> ; <span style="font-variant:small-caps;">Jasperneite, J.</span>
    ; <span style="font-variant:small-caps;">Institute of Electrical and Electronics
    Engineers</span> (Hrsg.): <i>Determining the Target Security Level for Automated
    Security Risk Assessments</i>. [Piscataway, NJ] : IEEE, 2023'
  havard: M. Ehrlich, A. Bröring, C. Diedrich, J. Jasperneite, W. Kastner, H. Trsek,
    Determining the Target Security Level for Automated Security Risk Assessments,
    IEEE, [Piscataway, NJ], 2023.
  ieee: 'M. Ehrlich, A. Bröring, C. Diedrich, J. Jasperneite, W. Kastner, and H. Trsek,
    <i>Determining the Target Security Level for Automated Security Risk Assessments</i>.
    [Piscataway, NJ]: IEEE, 2023. doi: <a href="https://doi.org/10.1109/indin51400.2023.10217902">10.1109/indin51400.2023.10217902</a>.'
  mla: 'Ehrlich, Marco, et al. “Determining the Target Security Level for Automated
    Security Risk Assessments.” <i>2023 IEEE 21st International Conference on Industrial
    Informatics : INDIN 2023 : 17-20 July 2023, Lemgo, Germany</i>, edited by Jürgen
    Jasperneite and Institute of Electrical and Electronics Engineers, IEEE, 2023,
    <a href="https://doi.org/10.1109/indin51400.2023.10217902">https://doi.org/10.1109/indin51400.2023.10217902</a>.'
  short: M. Ehrlich, A. Bröring, C. Diedrich, J. Jasperneite, W. Kastner, H. Trsek,
    Determining the Target Security Level for Automated Security Risk Assessments,
    IEEE, [Piscataway, NJ], 2023.
  ufg: '<b>Ehrlich, Marco u. a.</b>: Determining the Target Security Level for Automated
    Security Risk Assessments, hg. von Jasperneite, Jürgen, Institute of Electrical
    and Electronics Engineers, [Piscataway, NJ] 2023.'
  van: 'Ehrlich M, Bröring A, Diedrich C, Jasperneite J, Kastner W, Trsek H. Determining
    the Target Security Level for Automated Security Risk Assessments. Jasperneite
    J, Institute of Electrical and Electronics Engineers, editors. 2023 IEEE 21st
    International Conference on Industrial Informatics : INDIN 2023 : 17-20 July 2023,
    Lemgo, Germany. [Piscataway, NJ]: IEEE; 2023.'
conference:
  end_date: 2023-07-20
  location: Lemgo
  name: 21st International Conference on Industrial Informatics (INDIN)
  start_date: 2023-07-18
corporate_editor:
- Institute of Electrical and Electronics Engineers
date_created: 2025-06-18T13:30:31Z
date_updated: 2025-06-18T13:37:07Z
department:
- _id: DEP5023
doi: 10.1109/indin51400.2023.10217902
editor:
- first_name: Jürgen
  full_name: Jasperneite, Jürgen
  id: '1899'
  last_name: Jasperneite
keyword:
- Integrated circuits
- Industries
- Libraries
- Security
- Risk management
- IEC Standards
- Interviews
language:
- iso: eng
place: '[Piscataway, NJ]'
publication: '2023 IEEE 21st International Conference on Industrial Informatics :
  INDIN 2023 : 17-20 July 2023, Lemgo, Germany'
publication_identifier:
  eisbn:
  - 978-1-6654-9313-0
  isbn:
  - 978-1-6654-9314-7
publication_status: published
publisher: IEEE
status: public
title: Determining the Target Security Level for Automated Security Risk Assessments
type: conference_editor_article
user_id: '83781'
year: '2023'
...
---
_id: '13010'
abstract:
- lang: eng
  text: Especially in highly interdisciplinary fields such as automation engineering,
    contemporary programming education with tailored assignments and individual feedback
    is a major challenge for educational institutions due to the increasing number
    of students per teacher and the ever-increasing demand for computer science professionals.
    To address this gap, we present ”KIAAA” an AI Assistant for Automation Engineering
    Teaching, a work-in-progress approach for an integrated, customized, and AI-based
    learning support system for automation and programming courses based on instructor-defined
    course objectives. Thereby in the KIAAA system, the individual knowledge level
    of the students is determined and individually tailored virtual learning scenarios
    are generated based on the knowledge and learning profile of the students. These
    are iteratively adapted based on the answers given. To achieve this, KIAAA uses
    several AI components, a hybrid rule-based scenario generation component, a Help-DKT-based
    cognitive model, and a solution assessor that uses a combination of traditional
    code analysis methods and AI-based analyses methods for automated programming
    task assessment. These components are the main parts of KIAAA to generate customized
    programming scenarios as well as visualization and simulation based on a modern
    game and physics engine.
author:
- first_name: Sebastian
  full_name: Eilermann, Sebastian
  last_name: Eilermann
- first_name: Leon
  full_name: Wehmeier, Leon
  id: '81257'
  last_name: Wehmeier
- first_name: Oliver
  full_name: Niggemann, Oliver
  last_name: Niggemann
- first_name: Andreas
  full_name: Deuter, Andreas
  id: '62088'
  last_name: Deuter
  orcid: 0000-0002-6529-6215
citation:
  ama: 'Eilermann S, Wehmeier L, Niggemann O, Deuter A. <i>KIAAA: An AI Assistant
    for Teaching Programming in the Field of Automation</i>. (Jasperneite J, IEEE
    International Conference on Industrial Informatics , Institute of Electrical and
    Electronics Engineers, eds.). IEEE; 2023. doi:<a href="https://doi.org/10.1109/indin51400.2023.10218157">10.1109/indin51400.2023.10218157</a>'
  apa: 'Eilermann, S., Wehmeier, L., Niggemann, O., &#38; Deuter, A. (2023). KIAAA:
    An AI Assistant for Teaching Programming in the Field of Automation. In J. Jasperneite,
    IEEE International Conference on Industrial Informatics , &#38; Institute of Electrical
    and Electronics Engineers (Eds.), <i>2023 IEEE 21st International Conference on
    Industrial Informatics (INDIN)</i>. IEEE. <a href="https://doi.org/10.1109/indin51400.2023.10218157">https://doi.org/10.1109/indin51400.2023.10218157</a>'
  bjps: '<b>Eilermann S <i>et al.</i></b> (2023) <i>KIAAA: An AI Assistant for Teaching
    Programming in the Field of Automation</i>, Jasperneite J, IEEE International
    Conference on Industrial Informatics , and Institute of Electrical and Electronics
    Engineers (eds). [Piscataway, NJ]: IEEE.'
  chicago: 'Eilermann, Sebastian, Leon Wehmeier, Oliver Niggemann, and Andreas Deuter.
    <i>KIAAA: An AI Assistant for Teaching Programming in the Field of Automation</i>.
    Edited by Jürgen Jasperneite, IEEE International Conference on Industrial Informatics
    , and Institute of Electrical and Electronics Engineers. <i>2023 IEEE 21st International
    Conference on Industrial Informatics (INDIN)</i>. [Piscataway, NJ]: IEEE, 2023.
    <a href="https://doi.org/10.1109/indin51400.2023.10218157">https://doi.org/10.1109/indin51400.2023.10218157</a>.'
  chicago-de: 'Eilermann, Sebastian, Leon Wehmeier, Oliver Niggemann und Andreas Deuter.
    2023. <i>KIAAA: An AI Assistant for Teaching Programming in the Field of Automation</i>.
    Hg. von Jürgen Jasperneite, IEEE International Conference on Industrial Informatics
    , und Institute of Electrical and Electronics Engineers. <i>2023 IEEE 21st International
    Conference on Industrial Informatics (INDIN)</i>. [Piscataway, NJ]: IEEE. doi:<a
    href="https://doi.org/10.1109/indin51400.2023.10218157">10.1109/indin51400.2023.10218157</a>,
    .'
  din1505-2-1: '<span style="font-variant:small-caps;">Eilermann, Sebastian</span>
    ; <span style="font-variant:small-caps;">Wehmeier, Leon</span> ; <span style="font-variant:small-caps;">Niggemann,
    Oliver</span> ; <span style="font-variant:small-caps;">Deuter, Andreas</span>
    ; <span style="font-variant:small-caps;">Jasperneite, J.</span> ; <span style="font-variant:small-caps;">IEEE
    International Conference on Industrial Informatics </span> ; <span style="font-variant:small-caps;">Institute
    of Electrical and Electronics Engineers</span> (Hrsg.): <i>KIAAA: An AI Assistant
    for Teaching Programming in the Field of Automation</i>. [Piscataway, NJ] : IEEE,
    2023'
  havard: 'S. Eilermann, L. Wehmeier, O. Niggemann, A. Deuter, KIAAA: An AI Assistant
    for Teaching Programming in the Field of Automation, IEEE, [Piscataway, NJ], 2023.'
  ieee: 'S. Eilermann, L. Wehmeier, O. Niggemann, and A. Deuter, <i>KIAAA: An AI Assistant
    for Teaching Programming in the Field of Automation</i>. [Piscataway, NJ]: IEEE,
    2023. doi: <a href="https://doi.org/10.1109/indin51400.2023.10218157">10.1109/indin51400.2023.10218157</a>.'
  mla: 'Eilermann, Sebastian, et al. “KIAAA: An AI Assistant for Teaching Programming
    in the Field of Automation.” <i>2023 IEEE 21st International Conference on Industrial
    Informatics (INDIN)</i>, edited by Jürgen Jasperneite et al., IEEE, 2023, <a href="https://doi.org/10.1109/indin51400.2023.10218157">https://doi.org/10.1109/indin51400.2023.10218157</a>.'
  short: 'S. Eilermann, L. Wehmeier, O. Niggemann, A. Deuter, KIAAA: An AI Assistant
    for Teaching Programming in the Field of Automation, IEEE, [Piscataway, NJ], 2023.'
  ufg: '<b>Eilermann, Sebastian u. a.</b>: KIAAA: An AI Assistant for Teaching Programming
    in the Field of Automation, hg. von Jasperneite, Jürgen/IEEE International Conference
    on Industrial Informatics , Institute of Electrical and Electronics Engineers,
    [Piscataway, NJ] 2023.'
  van: 'Eilermann S, Wehmeier L, Niggemann O, Deuter A. KIAAA: An AI Assistant for
    Teaching Programming in the Field of Automation. Jasperneite J, IEEE International
    Conference on Industrial Informatics , Institute of Electrical and Electronics
    Engineers, editors. 2023 IEEE 21st International Conference on Industrial Informatics
    (INDIN). [Piscataway, NJ]: IEEE; 2023.'
conference:
  end_date: 2023-07-20
  location: Lemgo
  name: 21st International Conference on Industrial Informatics (INDIN)
  start_date: 2023-07-18
corporate_editor:
- 'IEEE International Conference on Industrial Informatics '
- Institute of Electrical and Electronics Engineers
date_created: 2025-06-24T09:24:47Z
date_updated: 2025-06-24T09:38:24Z
department:
- _id: DEP7022
- _id: DEP1306
- _id: DEP7001
doi: 10.1109/indin51400.2023.10218157
editor:
- first_name: Jürgen
  full_name: Jasperneite, Jürgen
  id: '1899'
  last_name: Jasperneite
keyword:
- Visualization
- Automation
- Education
- Games
- Hybrid power systems
- Task analysis
- Artificial intelligence
language:
- iso: eng
place: '[Piscataway, NJ]'
publication: 2023 IEEE 21st International Conference on Industrial Informatics (INDIN)
publication_identifier:
  eisbn:
  - 978-1-6654-9313-0
  isbn:
  - 978-1-6654-9314-7
publication_status: published
publisher: IEEE
quality_controlled: '1'
status: public
title: 'KIAAA: An AI Assistant for Teaching Programming in the Field of Automation'
type: conference_editor_article
user_id: '83781'
year: '2023'
...