[{"title":"Anomaly Detection with Root Cause Analysis for Bottling Process","publication_identifier":{"isbn":["978-1-7281-0304-4"],"issn":["1946-0759"],"eisbn":["978-1-7281-0303-7","978-1-7281-0302-0"]},"publication_status":"published","abstract":[{"text":"In the filling and packaging industry, the trend is towards self-diagnosis, optimization, and quality monitoring of processes. The aim is to increase production volumes and the quality. These concepts require continuous monitoring and anomaly detection of the filling process. In addition, a root cause analysis of the failure is required because not every failure can be simulated or measured previously. Standard anomaly detection methods have no integrated root cause analysis. In this paper a fusion system is utilises for the detection of different unknown anomalies and also the failure source of them. The performance of this method is benchmarked with a real-word filling process.","lang":"eng"}],"author":[{"last_name":"Bator","first_name":"Martyna","full_name":"Bator, Martyna","id":"46440"},{"id":"1853","last_name":"Dicks","full_name":"Dicks, Alexander","first_name":"Alexander"},{"id":"52121","last_name":"Deppe","full_name":"Deppe, Sahar","first_name":"Sahar"},{"first_name":"Volker","full_name":"Lohweg, Volker","last_name":"Lohweg","orcid":"0000-0002-3325-7887","id":"1804"}],"publisher":"IEEE","publication":"24nd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA2019) ","status":"public","doi":"10.1109/ETFA.2019.8869514","user_id":"83781","date_updated":"2024-04-15T12:43:21Z","department":[{"_id":"DEP5023"},{"_id":"DEP1308"}],"date_created":"2019-11-22T12:51:15Z","conference":{"start_date":"2019-09-10","location":" Zaragoza, Spain ","name":"24th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)","end_date":"2019-09-13"},"citation":{"short":"M. Bator, A. Dicks, S. Deppe, V. Lohweg, in: 24nd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA2019) , IEEE, Piscataway, NJ, 2019.","ama":"Bator M, Dicks A, Deppe S, Lohweg V. Anomaly Detection with Root Cause Analysis for Bottling Process. In: <i>24nd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA2019) </i>. IEEE; 2019. doi:<a href=\"https://doi.org/10.1109/ETFA.2019.8869514\">10.1109/ETFA.2019.8869514</a>","mla":"Bator, Martyna, et al. “Anomaly Detection with Root Cause Analysis for Bottling Process.” <i>24nd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA2019) </i>, IEEE, 2019, <a href=\"https://doi.org/10.1109/ETFA.2019.8869514\">https://doi.org/10.1109/ETFA.2019.8869514</a>.","chicago":"Bator, Martyna, Alexander Dicks, Sahar Deppe, and Volker Lohweg. “Anomaly Detection with Root Cause Analysis for Bottling Process.” In <i>24nd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA2019) </i>. Piscataway, NJ: IEEE, 2019. <a href=\"https://doi.org/10.1109/ETFA.2019.8869514\">https://doi.org/10.1109/ETFA.2019.8869514</a>.","ieee":"M. Bator, A. Dicks, S. Deppe, and V. Lohweg, “Anomaly Detection with Root Cause Analysis for Bottling Process,” presented at the 24th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA),  Zaragoza, Spain , 2019. doi: <a href=\"https://doi.org/10.1109/ETFA.2019.8869514\">10.1109/ETFA.2019.8869514</a>.","van":"Bator M, Dicks A, Deppe S, Lohweg V. Anomaly Detection with Root Cause Analysis for Bottling Process. In: 24nd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA2019) . Piscataway, NJ: IEEE; 2019.","chicago-de":"Bator, Martyna, Alexander Dicks, Sahar Deppe und Volker Lohweg. 2019. Anomaly Detection with Root Cause Analysis for Bottling Process. In: <i>24nd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA2019) </i>. Piscataway, NJ: IEEE. doi:<a href=\"https://doi.org/10.1109/ETFA.2019.8869514\">10.1109/ETFA.2019.8869514</a>, .","ufg":"<b>Bator, Martyna u. a.</b>: Anomaly Detection with Root Cause Analysis for Bottling Process, in: o. Hg.: 24nd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA2019) , Piscataway, NJ 2019.","bjps":"<b>Bator M <i>et al.</i></b> (2019) Anomaly Detection with Root Cause Analysis for Bottling Process. <i>24nd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA2019) </i>. Piscataway, NJ: IEEE.","apa":"Bator, M., Dicks, A., Deppe, S., &#38; Lohweg, V. (2019). Anomaly Detection with Root Cause Analysis for Bottling Process. <i>24nd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA2019) </i>. 24th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA),  Zaragoza, Spain . <a href=\"https://doi.org/10.1109/ETFA.2019.8869514\">https://doi.org/10.1109/ETFA.2019.8869514</a>","havard":"M. Bator, A. Dicks, S. Deppe, V. Lohweg, Anomaly Detection with Root Cause Analysis for Bottling Process, in: 24nd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA2019) , IEEE, Piscataway, NJ, 2019.","din1505-2-1":"<span style=\"font-variant:small-caps;\">Bator, Martyna</span> ; <span style=\"font-variant:small-caps;\">Dicks, Alexander</span> ; <span style=\"font-variant:small-caps;\">Deppe, Sahar</span> ; <span style=\"font-variant:small-caps;\">Lohweg, Volker</span>: Anomaly Detection with Root Cause Analysis for Bottling Process. In: <i>24nd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA2019) </i>. Piscataway, NJ : IEEE, 2019"},"type":"conference","year":"2019","language":[{"iso":"eng"}],"_id":"1994","place":"Piscataway, NJ"},{"publication":"24th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)","status":"public","publication_status":"published","abstract":[{"text":"The configuration of current automated production systems is complex and therefore time consuming while the market demands an easy setup and adaptability due to smaller batch sizes and volatile markets. While there are different concepts in research on how to simplify the engineering process by using generic skills or capabilities of devices, run-time control is still achieved with proprietary communication protocols and commands. The concept in this paper uses skills not only in the phase of engineering but also consequently for direct and generic control of field-devices. An executable skill-metamodel therefore describes the methodological functionality which is implemented by using OPC UA due to its vendor independence as well as built-in services and information model. The implementation uses client/server-based OPC UA and the pub/sub pattern to prepare for a deterministic real-time control in conjunction with TSN, which is required by industrial automation.","lang":"eng"}],"publisher":"IEEE","author":[{"last_name":"Zimmermann","full_name":"Zimmermann, Patrick","first_name":"Patrick"},{"full_name":"Axmann, Etienne","first_name":"Etienne","last_name":"Axmann"},{"last_name":"Brandenbourger","first_name":"Benjamin","full_name":"Brandenbourger, Benjamin"},{"last_name":"Dorofeev","first_name":"Kirill","full_name":"Dorofeev, Kirill"},{"id":"51482","last_name":"Mankowski","full_name":"Mankowski, Andre","first_name":"Andre"},{"full_name":"Zanini, Paulo","first_name":"Paulo","last_name":"Zanini"}],"publication_identifier":{"eisbn":["978-1-7281-0302-0"],"isbn":["978-1-7281-0303-7"],"issn":["1946-0740"],"eissn":["1946-0759"]},"title":"Skill-based Engineering and Control on Field-Device-Level with OPC UA","page":"1101-1108","keyword":["OPC UA","Skills","Capabilities","Engineering","Field-Device","Interoperability","Control"],"corporate_editor":["IEEE International Conference on Emerging Technologies and Factory Automation ","Institute of Electrical and Electronics Engineers","Universidad de Zaragoza ","IEEE Industrial Electronics Society "],"language":[{"iso":"eng"}],"_id":"12826","place":"[Piscataway, NJ]","conference":{"name":"24th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)","end_date":"201-09-13","start_date":"2019-09-10","location":"Zaragoza, SPAIN"},"type":"conference_editor_article","citation":{"havard":"P. Zimmermann, E. Axmann, B. Brandenbourger, K. Dorofeev, A. Mankowski, P. Zanini, Skill-based Engineering and Control on Field-Device-Level with OPC UA, IEEE, [Piscataway, NJ], 2019.","chicago-de":"Zimmermann, Patrick, Etienne Axmann, Benjamin Brandenbourger, Kirill Dorofeev, Andre Mankowski und Paulo Zanini. 2019. <i>Skill-based Engineering and Control on Field-Device-Level with OPC UA</i>. Hg. von IEEE International Conference on Emerging Technologies and Factory Automation , Institute of Electrical and Electronics Engineers, Universidad de Zaragoza , und IEEE Industrial Electronics Society . <i>24th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)</i>. IEEE International Conference on Emerging Technologies and Factory Automation-ETFA. [Piscataway, NJ]: IEEE. doi:<a href=\"https://doi.org/10.1109/etfa.2019.8869473\">10.1109/etfa.2019.8869473</a>, .","bjps":"<b>Zimmermann P <i>et al.</i></b> (2019) <i>Skill-Based Engineering and Control on Field-Device-Level with OPC UA</i>, IEEE International Conference on Emerging Technologies and Factory Automation  et al. (eds). [Piscataway, NJ]: IEEE.","ufg":"<b>Zimmermann, Patrick u. a.</b>: Skill-based Engineering and Control on Field-Device-Level with OPC UA, hg. von IEEE International Conference on Emerging Technologies and Factory Automation  u. a., [Piscataway, NJ] 2019 (IEEE International Conference on Emerging Technologies and Factory Automation-ETFA).","ama":"Zimmermann P, Axmann E, Brandenbourger B, Dorofeev K, Mankowski A, Zanini P. <i>Skill-Based Engineering and Control on Field-Device-Level with OPC UA</i>. (IEEE International Conference on Emerging Technologies and Factory Automation , Institute of Electrical and Electronics Engineers, Universidad de Zaragoza , IEEE Industrial Electronics Society , eds.). IEEE; 2019:1101-1108. doi:<a href=\"https://doi.org/10.1109/etfa.2019.8869473\">10.1109/etfa.2019.8869473</a>","short":"P. Zimmermann, E. Axmann, B. Brandenbourger, K. Dorofeev, A. Mankowski, P. Zanini, Skill-Based Engineering and Control on Field-Device-Level with OPC UA, IEEE, [Piscataway, NJ], 2019.","din1505-2-1":"<span style=\"font-variant:small-caps;\">Zimmermann, Patrick</span> ; <span style=\"font-variant:small-caps;\">Axmann, Etienne</span> ; <span style=\"font-variant:small-caps;\">Brandenbourger, Benjamin</span> ; <span style=\"font-variant:small-caps;\">Dorofeev, Kirill</span> ; <span style=\"font-variant:small-caps;\">Mankowski, Andre</span> ; <span style=\"font-variant:small-caps;\">Zanini, Paulo</span> ; <span style=\"font-variant:small-caps;\">IEEE International Conference on Emerging Technologies and Factory Automation </span> ; <span style=\"font-variant:small-caps;\">Institute of Electrical and Electronics Engineers</span> ; <span style=\"font-variant:small-caps;\">Universidad de Zaragoza </span> ; <span style=\"font-variant:small-caps;\">IEEE Industrial Electronics Society </span> (Hrsg.): <i>Skill-based Engineering and Control on Field-Device-Level with OPC UA</i>, <i>IEEE International Conference on Emerging Technologies and Factory Automation-ETFA</i>. [Piscataway, NJ] : IEEE, 2019","apa":"Zimmermann, P., Axmann, E., Brandenbourger, B., Dorofeev, K., Mankowski, A., &#38; Zanini, P. (2019). Skill-based Engineering and Control on Field-Device-Level with OPC UA. In IEEE International Conference on Emerging Technologies and Factory Automation , Institute of Electrical and Electronics Engineers, Universidad de Zaragoza , &#38; IEEE Industrial Electronics Society  (Eds.), <i>24th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)</i> (pp. 1101–1108). IEEE. <a href=\"https://doi.org/10.1109/etfa.2019.8869473\">https://doi.org/10.1109/etfa.2019.8869473</a>","ieee":"P. Zimmermann, E. Axmann, B. Brandenbourger, K. Dorofeev, A. Mankowski, and P. Zanini, <i>Skill-based Engineering and Control on Field-Device-Level with OPC UA</i>. [Piscataway, NJ]: IEEE, 2019, pp. 1101–1108. doi: <a href=\"https://doi.org/10.1109/etfa.2019.8869473\">10.1109/etfa.2019.8869473</a>.","van":"Zimmermann P, Axmann E, Brandenbourger B, Dorofeev K, Mankowski A, Zanini P. Skill-based Engineering and Control on Field-Device-Level with OPC UA. IEEE International Conference on Emerging Technologies and Factory Automation , Institute of Electrical and Electronics Engineers, Universidad de Zaragoza , IEEE Industrial Electronics Society , editors. 24th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA). [Piscataway, NJ]: IEEE; 2019. (IEEE International Conference on Emerging Technologies and Factory Automation-ETFA).","mla":"Zimmermann, Patrick, et al. “Skill-Based Engineering and Control on Field-Device-Level with OPC UA.” <i>24th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)</i>, edited by IEEE International Conference on Emerging Technologies and Factory Automation  et al., IEEE, 2019, pp. 1101–08, <a href=\"https://doi.org/10.1109/etfa.2019.8869473\">https://doi.org/10.1109/etfa.2019.8869473</a>.","chicago":"Zimmermann, Patrick, Etienne Axmann, Benjamin Brandenbourger, Kirill Dorofeev, Andre Mankowski, and Paulo Zanini. <i>Skill-Based Engineering and Control on Field-Device-Level with OPC UA</i>. Edited by IEEE International Conference on Emerging Technologies and Factory Automation , Institute of Electrical and Electronics Engineers, Universidad de Zaragoza , and IEEE Industrial Electronics Society . <i>24th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)</i>. IEEE International Conference on Emerging Technologies and Factory Automation-ETFA. [Piscataway, NJ]: IEEE, 2019. <a href=\"https://doi.org/10.1109/etfa.2019.8869473\">https://doi.org/10.1109/etfa.2019.8869473</a>."},"year":"2019","series_title":"IEEE International Conference on Emerging Technologies and Factory Automation-ETFA","doi":"10.1109/etfa.2019.8869473","user_id":"83781","date_updated":"2025-06-26T13:27:46Z","date_created":"2025-04-22T13:52:53Z","department":[{"_id":"DEP5023"}]}]