---
_id: '1994'
abstract:
- lang: eng
  text: In the filling and packaging industry, the trend is towards self-diagnosis,
    optimization, and quality monitoring of processes. The aim is to increase production
    volumes and the quality. These concepts require continuous monitoring and anomaly
    detection of the filling process. In addition, a root cause analysis of the failure
    is required because not every failure can be simulated or measured previously.
    Standard anomaly detection methods have no integrated root cause analysis. In
    this paper a fusion system is utilises for the detection of different unknown
    anomalies and also the failure source of them. The performance of this method
    is benchmarked with a real-word filling process.
author:
- first_name: Martyna
  full_name: Bator, Martyna
  id: '46440'
  last_name: Bator
- first_name: Alexander
  full_name: Dicks, Alexander
  id: '1853'
  last_name: Dicks
- first_name: Sahar
  full_name: Deppe, Sahar
  id: '52121'
  last_name: Deppe
- first_name: Volker
  full_name: Lohweg, Volker
  id: '1804'
  last_name: Lohweg
  orcid: 0000-0002-3325-7887
citation:
  ama: 'Bator M, Dicks A, Deppe S, Lohweg V. Anomaly Detection with Root Cause Analysis
    for Bottling Process. In: <i>24nd IEEE International Conference on Emerging Technologies
    and Factory Automation (ETFA2019) </i>. IEEE; 2019. doi:<a href="https://doi.org/10.1109/ETFA.2019.8869514">10.1109/ETFA.2019.8869514</a>'
  apa: Bator, M., Dicks, A., Deppe, S., &#38; Lohweg, V. (2019). Anomaly Detection
    with Root Cause Analysis for Bottling Process. <i>24nd IEEE International Conference
    on Emerging Technologies and Factory Automation (ETFA2019) </i>. 24th IEEE International
    Conference on Emerging Technologies and Factory Automation (ETFA),  Zaragoza,
    Spain . <a href="https://doi.org/10.1109/ETFA.2019.8869514">https://doi.org/10.1109/ETFA.2019.8869514</a>
  bjps: '<b>Bator M <i>et al.</i></b> (2019) Anomaly Detection with Root Cause Analysis
    for Bottling Process. <i>24nd IEEE International Conference on Emerging Technologies
    and Factory Automation (ETFA2019) </i>. Piscataway, NJ: IEEE.'
  chicago: 'Bator, Martyna, Alexander Dicks, Sahar Deppe, and Volker Lohweg. “Anomaly
    Detection with Root Cause Analysis for Bottling Process.” In <i>24nd IEEE International
    Conference on Emerging Technologies and Factory Automation (ETFA2019) </i>. Piscataway,
    NJ: IEEE, 2019. <a href="https://doi.org/10.1109/ETFA.2019.8869514">https://doi.org/10.1109/ETFA.2019.8869514</a>.'
  chicago-de: 'Bator, Martyna, Alexander Dicks, Sahar Deppe und Volker Lohweg. 2019.
    Anomaly Detection with Root Cause Analysis for Bottling Process. In: <i>24nd IEEE
    International Conference on Emerging Technologies and Factory Automation (ETFA2019)
    </i>. Piscataway, NJ: IEEE. doi:<a href="https://doi.org/10.1109/ETFA.2019.8869514">10.1109/ETFA.2019.8869514</a>,
    .'
  din1505-2-1: '<span style="font-variant:small-caps;">Bator, Martyna</span> ; <span
    style="font-variant:small-caps;">Dicks, Alexander</span> ; <span style="font-variant:small-caps;">Deppe,
    Sahar</span> ; <span style="font-variant:small-caps;">Lohweg, Volker</span>: Anomaly
    Detection with Root Cause Analysis for Bottling Process. In: <i>24nd IEEE International
    Conference on Emerging Technologies and Factory Automation (ETFA2019) </i>. Piscataway,
    NJ : IEEE, 2019'
  havard: 'M. Bator, A. Dicks, S. Deppe, V. Lohweg, Anomaly Detection with Root Cause
    Analysis for Bottling Process, in: 24nd IEEE International Conference on Emerging
    Technologies and Factory Automation (ETFA2019) , IEEE, Piscataway, NJ, 2019.'
  ieee: 'M. Bator, A. Dicks, S. Deppe, and V. Lohweg, “Anomaly Detection with Root
    Cause Analysis for Bottling Process,” presented at the 24th IEEE International
    Conference on Emerging Technologies and Factory Automation (ETFA),  Zaragoza,
    Spain , 2019. doi: <a href="https://doi.org/10.1109/ETFA.2019.8869514">10.1109/ETFA.2019.8869514</a>.'
  mla: Bator, Martyna, et al. “Anomaly Detection with Root Cause Analysis for Bottling
    Process.” <i>24nd IEEE International Conference on Emerging Technologies and Factory
    Automation (ETFA2019) </i>, IEEE, 2019, <a href="https://doi.org/10.1109/ETFA.2019.8869514">https://doi.org/10.1109/ETFA.2019.8869514</a>.
  short: 'M. Bator, A. Dicks, S. Deppe, V. Lohweg, in: 24nd IEEE International Conference
    on Emerging Technologies and Factory Automation (ETFA2019) , IEEE, Piscataway,
    NJ, 2019.'
  ufg: '<b>Bator, Martyna u. a.</b>: Anomaly Detection with Root Cause Analysis for
    Bottling Process, in: o. Hg.: 24nd IEEE International Conference on Emerging Technologies
    and Factory Automation (ETFA2019) , Piscataway, NJ 2019.'
  van: 'Bator M, Dicks A, Deppe S, Lohweg V. Anomaly Detection with Root Cause Analysis
    for Bottling Process. In: 24nd IEEE International Conference on Emerging Technologies
    and Factory Automation (ETFA2019) . Piscataway, NJ: IEEE; 2019.'
conference:
  end_date: 2019-09-13
  location: ' Zaragoza, Spain '
  name: 24th IEEE International Conference on Emerging Technologies and Factory Automation
    (ETFA)
  start_date: 2019-09-10
date_created: 2019-11-22T12:51:15Z
date_updated: 2024-04-15T12:43:21Z
department:
- _id: DEP5023
- _id: DEP1308
doi: 10.1109/ETFA.2019.8869514
language:
- iso: eng
place: Piscataway, NJ
publication: '24nd IEEE International Conference on Emerging Technologies and Factory
  Automation (ETFA2019) '
publication_identifier:
  eisbn:
  - 978-1-7281-0303-7
  - 978-1-7281-0302-0
  isbn:
  - 978-1-7281-0304-4
  issn:
  - 1946-0759
publication_status: published
publisher: IEEE
status: public
title: Anomaly Detection with Root Cause Analysis for Bottling Process
type: conference
user_id: '83781'
year: '2019'
...
---
_id: '12826'
abstract:
- lang: eng
  text: The configuration of current automated production systems is complex and therefore
    time consuming while the market demands an easy setup and adaptability due to
    smaller batch sizes and volatile markets. While there are different concepts in
    research on how to simplify the engineering process by using generic skills or
    capabilities of devices, run-time control is still achieved with proprietary communication
    protocols and commands. The concept in this paper uses skills not only in the
    phase of engineering but also consequently for direct and generic control of field-devices.
    An executable skill-metamodel therefore describes the methodological functionality
    which is implemented by using OPC UA due to its vendor independence as well as
    built-in services and information model. The implementation uses client/server-based
    OPC UA and the pub/sub pattern to prepare for a deterministic real-time control
    in conjunction with TSN, which is required by industrial automation.
author:
- first_name: Patrick
  full_name: Zimmermann, Patrick
  last_name: Zimmermann
- first_name: Etienne
  full_name: Axmann, Etienne
  last_name: Axmann
- first_name: Benjamin
  full_name: Brandenbourger, Benjamin
  last_name: Brandenbourger
- first_name: Kirill
  full_name: Dorofeev, Kirill
  last_name: Dorofeev
- first_name: Andre
  full_name: Mankowski, Andre
  id: '51482'
  last_name: Mankowski
- first_name: Paulo
  full_name: Zanini, Paulo
  last_name: Zanini
citation:
  ama: Zimmermann P, Axmann E, Brandenbourger B, Dorofeev K, Mankowski A, Zanini P.
    <i>Skill-Based Engineering and Control on Field-Device-Level with OPC UA</i>.
    (IEEE International Conference on Emerging Technologies and Factory Automation
    , Institute of Electrical and Electronics Engineers, Universidad de Zaragoza ,
    IEEE Industrial Electronics Society , eds.). IEEE; 2019:1101-1108. doi:<a href="https://doi.org/10.1109/etfa.2019.8869473">10.1109/etfa.2019.8869473</a>
  apa: Zimmermann, P., Axmann, E., Brandenbourger, B., Dorofeev, K., Mankowski, A.,
    &#38; Zanini, P. (2019). Skill-based Engineering and Control on Field-Device-Level
    with OPC UA. In IEEE International Conference on Emerging Technologies and Factory
    Automation , Institute of Electrical and Electronics Engineers, Universidad de
    Zaragoza , &#38; IEEE Industrial Electronics Society  (Eds.), <i>24th IEEE International
    Conference on Emerging Technologies and Factory Automation (ETFA)</i> (pp. 1101–1108).
    IEEE. <a href="https://doi.org/10.1109/etfa.2019.8869473">https://doi.org/10.1109/etfa.2019.8869473</a>
  bjps: '<b>Zimmermann P <i>et al.</i></b> (2019) <i>Skill-Based Engineering and Control
    on Field-Device-Level with OPC UA</i>, IEEE International Conference on Emerging
    Technologies and Factory Automation  et al. (eds). [Piscataway, NJ]: IEEE.'
  chicago: 'Zimmermann, Patrick, Etienne Axmann, Benjamin Brandenbourger, Kirill Dorofeev,
    Andre Mankowski, and Paulo Zanini. <i>Skill-Based Engineering and Control on Field-Device-Level
    with OPC UA</i>. Edited by IEEE International Conference on Emerging Technologies
    and Factory Automation , Institute of Electrical and Electronics Engineers, Universidad
    de Zaragoza , and IEEE Industrial Electronics Society . <i>24th IEEE International
    Conference on Emerging Technologies and Factory Automation (ETFA)</i>. IEEE International
    Conference on Emerging Technologies and Factory Automation-ETFA. [Piscataway,
    NJ]: IEEE, 2019. <a href="https://doi.org/10.1109/etfa.2019.8869473">https://doi.org/10.1109/etfa.2019.8869473</a>.'
  chicago-de: 'Zimmermann, Patrick, Etienne Axmann, Benjamin Brandenbourger, Kirill
    Dorofeev, Andre Mankowski und Paulo Zanini. 2019. <i>Skill-based Engineering and
    Control on Field-Device-Level with OPC UA</i>. Hg. von IEEE International Conference
    on Emerging Technologies and Factory Automation , Institute of Electrical and
    Electronics Engineers, Universidad de Zaragoza , und IEEE Industrial Electronics
    Society . <i>24th IEEE International Conference on Emerging Technologies and Factory
    Automation (ETFA)</i>. IEEE International Conference on Emerging Technologies
    and Factory Automation-ETFA. [Piscataway, NJ]: IEEE. doi:<a href="https://doi.org/10.1109/etfa.2019.8869473">10.1109/etfa.2019.8869473</a>,
    .'
  din1505-2-1: '<span style="font-variant:small-caps;">Zimmermann, Patrick</span>
    ; <span style="font-variant:small-caps;">Axmann, Etienne</span> ; <span style="font-variant:small-caps;">Brandenbourger,
    Benjamin</span> ; <span style="font-variant:small-caps;">Dorofeev, Kirill</span>
    ; <span style="font-variant:small-caps;">Mankowski, Andre</span> ; <span style="font-variant:small-caps;">Zanini,
    Paulo</span> ; <span style="font-variant:small-caps;">IEEE International Conference
    on Emerging Technologies and Factory Automation </span> ; <span style="font-variant:small-caps;">Institute
    of Electrical and Electronics Engineers</span> ; <span style="font-variant:small-caps;">Universidad
    de Zaragoza </span> ; <span style="font-variant:small-caps;">IEEE Industrial Electronics
    Society </span> (Hrsg.): <i>Skill-based Engineering and Control on Field-Device-Level
    with OPC UA</i>, <i>IEEE International Conference on Emerging Technologies and
    Factory Automation-ETFA</i>. [Piscataway, NJ] : IEEE, 2019'
  havard: P. Zimmermann, E. Axmann, B. Brandenbourger, K. Dorofeev, A. Mankowski,
    P. Zanini, Skill-based Engineering and Control on Field-Device-Level with OPC
    UA, IEEE, [Piscataway, NJ], 2019.
  ieee: 'P. Zimmermann, E. Axmann, B. Brandenbourger, K. Dorofeev, A. Mankowski, and
    P. Zanini, <i>Skill-based Engineering and Control on Field-Device-Level with OPC
    UA</i>. [Piscataway, NJ]: IEEE, 2019, pp. 1101–1108. doi: <a href="https://doi.org/10.1109/etfa.2019.8869473">10.1109/etfa.2019.8869473</a>.'
  mla: Zimmermann, Patrick, et al. “Skill-Based Engineering and Control on Field-Device-Level
    with OPC UA.” <i>24th IEEE International Conference on Emerging Technologies and
    Factory Automation (ETFA)</i>, edited by IEEE International Conference on Emerging
    Technologies and Factory Automation  et al., IEEE, 2019, pp. 1101–08, <a href="https://doi.org/10.1109/etfa.2019.8869473">https://doi.org/10.1109/etfa.2019.8869473</a>.
  short: P. Zimmermann, E. Axmann, B. Brandenbourger, K. Dorofeev, A. Mankowski, P.
    Zanini, Skill-Based Engineering and Control on Field-Device-Level with OPC UA,
    IEEE, [Piscataway, NJ], 2019.
  ufg: '<b>Zimmermann, Patrick u. a.</b>: Skill-based Engineering and Control on Field-Device-Level
    with OPC UA, hg. von IEEE International Conference on Emerging Technologies and
    Factory Automation  u. a., [Piscataway, NJ] 2019 (IEEE International Conference
    on Emerging Technologies and Factory Automation-ETFA).'
  van: 'Zimmermann P, Axmann E, Brandenbourger B, Dorofeev K, Mankowski A, Zanini
    P. Skill-based Engineering and Control on Field-Device-Level with OPC UA. IEEE
    International Conference on Emerging Technologies and Factory Automation , Institute
    of Electrical and Electronics Engineers, Universidad de Zaragoza , IEEE Industrial
    Electronics Society , editors. 24th IEEE International Conference on Emerging
    Technologies and Factory Automation (ETFA). [Piscataway, NJ]: IEEE; 2019. (IEEE
    International Conference on Emerging Technologies and Factory Automation-ETFA).'
conference:
  end_date: 201-09-13
  location: Zaragoza, SPAIN
  name: 24th IEEE International Conference on Emerging Technologies and Factory Automation
    (ETFA)
  start_date: 2019-09-10
corporate_editor:
- 'IEEE International Conference on Emerging Technologies and Factory Automation '
- Institute of Electrical and Electronics Engineers
- 'Universidad de Zaragoza '
- 'IEEE Industrial Electronics Society '
date_created: 2025-04-22T13:52:53Z
date_updated: 2025-06-26T13:27:46Z
department:
- _id: DEP5023
doi: 10.1109/etfa.2019.8869473
keyword:
- OPC UA
- Skills
- Capabilities
- Engineering
- Field-Device
- Interoperability
- Control
language:
- iso: eng
page: 1101-1108
place: '[Piscataway, NJ]'
publication: 24th IEEE International Conference on Emerging Technologies and Factory
  Automation (ETFA)
publication_identifier:
  eisbn:
  - 978-1-7281-0302-0
  eissn:
  - 1946-0759
  isbn:
  - 978-1-7281-0303-7
  issn:
  - 1946-0740
publication_status: published
publisher: IEEE
series_title: IEEE International Conference on Emerging Technologies and Factory Automation-ETFA
status: public
title: Skill-based Engineering and Control on Field-Device-Level with OPC UA
type: conference_editor_article
user_id: '83781'
year: '2019'
...