---
_id: '7988'
author:
- first_name: Sarah
  full_name: Willmann, Sarah
  last_name: Willmann
- first_name: 'Marco '
  full_name: 'Meier, Marco '
  last_name: Meier
- first_name: 'Lutz '
  full_name: 'Rauchhaupt, Lutz '
  last_name: Rauchhaupt
- first_name: 'Nico '
  full_name: 'Wiebusch, Nico '
  last_name: Wiebusch
- first_name: Uwe
  full_name: Meier, Uwe
  id: '1143'
  last_name: Meier
citation:
  ama: 'Willmann S, Meier M, Rauchhaupt L, Wiebusch N, Meier U. <i>Towards Validation
    of Wireless Coexistence Management</i>. Lisbon, Portugal: IEEE; 2019. doi:<a href="https://doi.org/10.1109/IECON.2019.8926957">10.1109/IECON.2019.8926957</a>'
  apa: 'Willmann, S., Meier, M., Rauchhaupt, L., Wiebusch, N., &#38; Meier, U. (2019).
    <i>Towards Validation of Wireless Coexistence Management</i>. <i>45th Annual Conference
    of the IEEE Industrial Electronics Society, IEEE IECON 2019</i>. Lisbon, Portugal:
    IEEE. <a href="https://doi.org/10.1109/IECON.2019.8926957">https://doi.org/10.1109/IECON.2019.8926957</a>'
  bjps: '<b>Willmann S <i>et al.</i></b> (2019) <i>Towards Validation of Wireless
    Coexistence Management</i>. Lisbon, Portugal: IEEE.'
  chicago: 'Willmann, Sarah, Marco  Meier, Lutz  Rauchhaupt, Nico  Wiebusch, and Uwe
    Meier. <i>Towards Validation of Wireless Coexistence Management</i>. <i>45th Annual
    Conference of the IEEE Industrial Electronics Society, IEEE IECON 2019</i>. Lisbon,
    Portugal: IEEE, 2019. <a href="https://doi.org/10.1109/IECON.2019.8926957">https://doi.org/10.1109/IECON.2019.8926957</a>.'
  chicago-de: 'Willmann, Sarah, Marco  Meier, Lutz  Rauchhaupt, Nico  Wiebusch und
    Uwe Meier. 2019. <i>Towards Validation of Wireless Coexistence Management</i>.
    <i>45th Annual Conference of the IEEE Industrial Electronics Society, IEEE IECON
    2019</i>. Lisbon, Portugal: IEEE. doi:<a href="https://doi.org/10.1109/IECON.2019.8926957,">10.1109/IECON.2019.8926957,</a>
    .'
  din1505-2-1: '<span style="font-variant:small-caps;">Willmann, Sarah</span> ; <span
    style="font-variant:small-caps;">Meier, Marco </span> ; <span style="font-variant:small-caps;">Rauchhaupt,
    Lutz </span> ; <span style="font-variant:small-caps;">Wiebusch, Nico </span> ;
    <span style="font-variant:small-caps;">Meier, Uwe</span>: <i>Towards Validation
    of Wireless Coexistence Management</i>. Lisbon, Portugal : IEEE, 2019'
  havard: S. Willmann, M. Meier, L. Rauchhaupt, N. Wiebusch, U. Meier, Towards Validation
    of Wireless Coexistence Management, IEEE, Lisbon, Portugal, 2019.
  ieee: 'S. Willmann, M. Meier, L. Rauchhaupt, N. Wiebusch, and U. Meier, <i>Towards
    Validation of Wireless Coexistence Management</i>. Lisbon, Portugal: IEEE, 2019.'
  mla: Willmann, Sarah, et al. “Towards Validation of Wireless Coexistence Management.”
    <i>45th Annual Conference of the IEEE Industrial Electronics Society, IEEE IECON
    2019</i>, IEEE, 2019, doi:<a href="https://doi.org/10.1109/IECON.2019.8926957">10.1109/IECON.2019.8926957</a>.
  short: S. Willmann, M. Meier, L. Rauchhaupt, N. Wiebusch, U. Meier, Towards Validation
    of Wireless Coexistence Management, IEEE, Lisbon, Portugal, 2019.
  ufg: '<b>Willmann, Sarah et. al. (2019)</b>: Towards Validation of Wireless Coexistence
    Management, Lisbon, Portugal.'
  van: 'Willmann S, Meier M, Rauchhaupt L, Wiebusch N, Meier U. Towards Validation
    of Wireless Coexistence Management. 45th Annual Conference of the IEEE Industrial
    Electronics Society, IEEE IECON 2019. Lisbon, Portugal: IEEE; 2019.'
conference:
  end_date: 2019-10-17
  location: Lissabon
  name: IEEE IECON 2019
  start_date: 2019-10-14
date_created: 2022-05-06T09:33:46Z
date_updated: 2023-03-15T13:50:13Z
department:
- _id: DEP5014
doi: 10.1109/IECON.2019.8926957
language:
- iso: eng
place: Lisbon, Portugal
publication: 45th Annual Conference of the IEEE Industrial Electronics Society, IEEE
  IECON 2019
publication_identifier:
  eisbn:
  - 978-1-7281-4878-6
publication_status: published
publisher: IEEE
status: public
title: Towards Validation of Wireless Coexistence Management
type: conference_editor_article
user_id: '79260'
year: 2019
...
---
_id: '4756'
abstract:
- lang: eng
  text: Due to the dynamic nature of the Industrie 4.0 developments, future production
    systems will be reconfigured more frequently and new system configurations will
    be deployed automatically. In order to keep pace with this development, it will
    be required to observe and ensure the needed security functionalities and corresponding
    certifications in an automated way. This implies an improvement of today's static
    procedures and manual efforts as much as possible in favor of a dynamic standard
    establishment. Therefore, this paper evaluates the state of the art of the industrial
    security standardization landscape and proposes a concept for the automated support
    of certification processes with information from industrial communication networks
    in order to enhance the usability of the standards establishments and the certifications
    within organizations and companies, especially small and medium-sized enterprises.
author:
- first_name: Marco
  full_name: Ehrlich, Marco
  id: '61562'
  last_name: Ehrlich
- first_name: Henning
  full_name: Trsek, Henning
  id: '1486'
  last_name: Trsek
  orcid: 0000-0002-0133-0656
- first_name: Lukasz
  full_name: Wisniewski, Lukasz
  id: '1710'
  last_name: Wisniewski
- first_name: Jürgen
  full_name: Jasperneite, Jürgen
  id: '1899'
  last_name: Jasperneite
citation:
  ama: 'Ehrlich M, Trsek H, Wisniewski L, Jasperneite J. Survey of Security Standards
    for an automated Industrie 4.0 compatible Manufacturing. In:  IEEE Industrial
    Electronics Society. Annual Conference , IEEE Industrial Electronics Society ,
    Universidade Nova de Lisboa , Institute of Electrical and Electronics Engineers,
    eds. <i>IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics
    Society (IES)</i>. IEEE Industrial Electronics Society. IEEE; 2019:2849-2854.'
  apa: Ehrlich, M., Trsek, H., Wisniewski, L., &#38; Jasperneite, J. (2019). Survey
    of Security Standards for an automated Industrie 4.0 compatible Manufacturing.
    In  IEEE Industrial Electronics Society. Annual Conference , IEEE Industrial Electronics
    Society , Universidade Nova de Lisboa , &#38; Institute of Electrical and Electronics
    Engineers (Eds.), <i>IECON 2019 - 45th Annual Conference of the IEEE Industrial
    Electronics Society (IES)</i> (pp. 2849–2854). IEEE.
  bjps: '<b>Ehrlich M <i>et al.</i></b> (2019) Survey of Security Standards for an
    Automated Industrie 4.0 Compatible Manufacturing. In  IEEE Industrial Electronics
    Society. Annual Conference  et al. (eds), <i>IECON 2019 - 45th Annual Conference
    of the IEEE Industrial Electronics Society (IES)</i>. [Piscataway, NJ]: IEEE,
    pp. 2849–2854.'
  chicago: 'Ehrlich, Marco, Henning Trsek, Lukasz Wisniewski, and Jürgen Jasperneite.
    “Survey of Security Standards for an Automated Industrie 4.0 Compatible Manufacturing.”
    In <i>IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society
    (IES)</i>, edited by  IEEE Industrial Electronics Society. Annual Conference ,
    IEEE Industrial Electronics Society , Universidade Nova de Lisboa , and Institute
    of Electrical and Electronics Engineers, 2849–54. IEEE Industrial Electronics
    Society. [Piscataway, NJ]: IEEE, 2019.'
  chicago-de: 'Ehrlich, Marco, Henning Trsek, Lukasz Wisniewski und Jürgen Jasperneite.
    2019. Survey of Security Standards for an automated Industrie 4.0 compatible Manufacturing.
    In: <i>IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics
    Society (IES)</i>, hg. von  IEEE Industrial Electronics Society. Annual Conference
    , IEEE Industrial Electronics Society , Universidade Nova de Lisboa , und Institute
    of Electrical and Electronics Engineers, 2849–2854. IEEE Industrial Electronics
    Society. [Piscataway, NJ]: IEEE.'
  din1505-2-1: '<span style="font-variant:small-caps;">Ehrlich, Marco</span> ; <span
    style="font-variant:small-caps;">Trsek, Henning</span> ; <span style="font-variant:small-caps;">Wisniewski,
    Lukasz</span> ; <span style="font-variant:small-caps;">Jasperneite, Jürgen</span>:
    Survey of Security Standards for an automated Industrie 4.0 compatible Manufacturing.
    In: <span style="font-variant:small-caps;"> IEEE Industrial Electronics Society.
    Annual Conference </span> ; <span style="font-variant:small-caps;">IEEE Industrial
    Electronics Society </span> ; <span style="font-variant:small-caps;">Universidade
    Nova de Lisboa </span> ; <span style="font-variant:small-caps;">Institute of Electrical
    and Electronics Engineers</span> (Hrsg.): <i>IECON 2019 - 45th Annual Conference
    of the IEEE Industrial Electronics Society (IES)</i>, <i>IEEE Industrial Electronics
    Society</i>. [Piscataway, NJ] : IEEE, 2019, S. 2849–2854'
  havard: 'M. Ehrlich, H. Trsek, L. Wisniewski, J. Jasperneite, Survey of Security
    Standards for an automated Industrie 4.0 compatible Manufacturing, in:  IEEE Industrial
    Electronics Society. Annual Conference , IEEE Industrial Electronics Society ,
    Universidade Nova de Lisboa , Institute of Electrical and Electronics Engineers
    (Eds.), IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics
    Society (IES), IEEE, [Piscataway, NJ], 2019: pp. 2849–2854.'
  ieee: M. Ehrlich, H. Trsek, L. Wisniewski, and J. Jasperneite, “Survey of Security
    Standards for an automated Industrie 4.0 compatible Manufacturing,” in <i>IECON
    2019 - 45th Annual Conference of the IEEE Industrial Electronics Society (IES)</i>,
    Lisbon, PORTUGAL, 2019, pp. 2849–2854.
  mla: Ehrlich, Marco, et al. “Survey of Security Standards for an Automated Industrie
    4.0 Compatible Manufacturing.” <i>IECON 2019 - 45th Annual Conference of the IEEE
    Industrial Electronics Society (IES)</i>, edited by  IEEE Industrial Electronics
    Society. Annual Conference  et al., IEEE, 2019, pp. 2849–54.
  short: 'M. Ehrlich, H. Trsek, L. Wisniewski, J. Jasperneite, in:  IEEE Industrial
    Electronics Society. Annual Conference , IEEE Industrial Electronics Society ,
    Universidade Nova de Lisboa , Institute of Electrical and Electronics Engineers
    (Eds.), IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics
    Society (IES), IEEE, [Piscataway, NJ], 2019, pp. 2849–2854.'
  ufg: '<b>Ehrlich, Marco u. a.</b>: Survey of Security Standards for an automated
    Industrie 4.0 compatible Manufacturing, in: <i> IEEE Industrial Electronics Society.
    Annual Conference  u. a. (Hgg.)</i>: IECON 2019 - 45th Annual Conference of the
    IEEE Industrial Electronics Society (IES), [Piscataway, NJ] 2019 (IEEE Industrial
    Electronics Society),  S. 2849–2854.'
  van: 'Ehrlich M, Trsek H, Wisniewski L, Jasperneite J. Survey of Security Standards
    for an automated Industrie 4.0 compatible Manufacturing. In:  IEEE Industrial
    Electronics Society. Annual Conference , IEEE Industrial Electronics Society ,
    Universidade Nova de Lisboa , Institute of Electrical and Electronics Engineers,
    editors. IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics
    Society (IES). [Piscataway, NJ]: IEEE; 2019. p. 2849–54. (IEEE Industrial Electronics
    Society).'
conference:
  end_date: 2019-10-19
  location: Lisbon, PORTUGAL
  name: 45th Annual Conference of the IEEE Industrial Electronics Society (IECON)
  start_date: 2019-10-14
corporate_editor:
- ' IEEE Industrial Electronics Society. Annual Conference '
- 'IEEE Industrial Electronics Society '
- 'Universidade Nova de Lisboa '
- Institute of Electrical and Electronics Engineers
date_created: 2021-01-28T14:47:12Z
date_updated: 2025-06-26T13:31:27Z
department:
- _id: DEP5023
- _id: DEP5019
keyword:
- Industrial Automation
- Security
- Toolchain
- Standardization
- Communication Networks
language:
- iso: eng
page: 2849-2854
place: '[Piscataway, NJ]'
publication: IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics
  Society (IES)
publication_identifier:
  eisbn:
  - 978-1-7281-4878-6
  isbn:
  - 978-1-7281-4879-3
  issn:
  - 1553-572X
publication_status: published
publisher: IEEE
series_title: IEEE Industrial Electronics Society
status: public
title: Survey of Security Standards for an automated Industrie 4.0 compatible Manufacturing
type: conference
user_id: '83781'
year: '2019'
...