[{"title":"Evil SteVe: An Approach to Simplify Penetration Testing of OCPP Charge Points","citation":{"mla":"Gebauer, Lisa Helene, et al. “Evil SteVe: An Approach to Simplify Penetration Testing of OCPP Charge Points.” <i>2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA)</i>, IEEE, 2022, <a href=\"https://doi.org/10.1109/ETFA52439.2022.9921430\">https://doi.org/10.1109/ETFA52439.2022.9921430</a>.","bjps":"<b>Gebauer LH, Trsek H and Lukas G</b> (2022) Evil SteVe: An Approach to Simplify Penetration Testing of OCPP Charge Points. <i>2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA)</i>. Piscataway, NJ: IEEE.","havard":"L.H. Gebauer, H. Trsek, G. Lukas, Evil SteVe: An Approach to Simplify Penetration Testing of OCPP Charge Points, in: 2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA), IEEE, Piscataway, NJ, 2022.","ufg":"<b>Gebauer, Lisa Helene/Trsek, Henning/Lukas, Georg</b>: Evil SteVe: An Approach to Simplify Penetration Testing of OCPP Charge Points, in: o. Hg.: 2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA), Piscataway, NJ 2022.","van":"Gebauer LH, Trsek H, Lukas G. Evil SteVe: An Approach to Simplify Penetration Testing of OCPP Charge Points. In: 2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA). Piscataway, NJ: IEEE; 2022.","chicago":"Gebauer, Lisa Helene, Henning Trsek, and Georg Lukas. “Evil SteVe: An Approach to Simplify Penetration Testing of OCPP Charge Points.” In <i>2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA)</i>. Piscataway, NJ: IEEE, 2022. <a href=\"https://doi.org/10.1109/ETFA52439.2022.9921430\">https://doi.org/10.1109/ETFA52439.2022.9921430</a>.","apa":"Gebauer, L. H., Trsek, H., &#38; Lukas, G. (2022). Evil SteVe: An Approach to Simplify Penetration Testing of OCPP Charge Points. <i>2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA)</i>. 27th International Conference on Emerging Technologies and Factory Automation (ETFA), Stuttgart. <a href=\"https://doi.org/10.1109/ETFA52439.2022.9921430\">https://doi.org/10.1109/ETFA52439.2022.9921430</a>","din1505-2-1":"<span style=\"font-variant:small-caps;\">Gebauer, Lisa Helene</span> ; <span style=\"font-variant:small-caps;\">Trsek, Henning</span> ; <span style=\"font-variant:small-caps;\">Lukas, Georg</span>: Evil SteVe: An Approach to Simplify Penetration Testing of OCPP Charge Points. In: <i>2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA)</i>. Piscataway, NJ : IEEE, 2022","chicago-de":"Gebauer, Lisa Helene, Henning Trsek und Georg Lukas. 2022. Evil SteVe: An Approach to Simplify Penetration Testing of OCPP Charge Points. In: <i>2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA)</i>. Piscataway, NJ: IEEE. doi:<a href=\"https://doi.org/10.1109/ETFA52439.2022.9921430\">10.1109/ETFA52439.2022.9921430</a>, .","short":"L.H. Gebauer, H. Trsek, G. Lukas, in: 2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA), IEEE, Piscataway, NJ, 2022.","ama":"Gebauer LH, Trsek H, Lukas G. Evil SteVe: An Approach to Simplify Penetration Testing of OCPP Charge Points. In: <i>2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA)</i>. IEEE; 2022. doi:<a href=\"https://doi.org/10.1109/ETFA52439.2022.9921430\">10.1109/ETFA52439.2022.9921430</a>","ieee":"L. H. Gebauer, H. Trsek, and G. Lukas, “Evil SteVe: An Approach to Simplify Penetration Testing of OCPP Charge Points,” presented at the 27th International Conference on Emerging Technologies and Factory Automation (ETFA), Stuttgart, 2022. doi: <a href=\"https://doi.org/10.1109/ETFA52439.2022.9921430\">10.1109/ETFA52439.2022.9921430</a>."},"publication_status":"published","abstract":[{"text":"The reduction of CO2 emissions caused by auto-mobile traffic relies on the development of electric mobility infrastructure which in turn relies on efficient communication between charge points, used to connect electric vehicles to the power network, and central systems, used to manage users and transactions. The Open Charge Point Protocol (OCPP) is an open communication protocol designed to connect charge points to a central system. An important aspect of the communication between these entities is the security of the connection. It is conceivable, for instance, that an adversary could compromise a central system to attack charge points.This work devises three different attack scenarios which could be executed by a malicious OCPP central system to attack an OCPP charge point. It also assesses the feasibility and potential consequences of such attacks. Additionally, it presents an approach of an \"evil\" OCPP server implementation, based on the SteVe server which was originally developed at the RWTH Aachen. The \"evil\" OCPP server implements various attack scenarios and is intended to be used for penetration testing of OCPP charge points that connect to the central system via WebSockets/JSON or SOAP/XML.","lang":"eng"}],"author":[{"first_name":"Lisa Helene","id":"76524","full_name":"Gebauer, Lisa Helene","last_name":"Gebauer"},{"id":"1486","first_name":"Henning","last_name":"Trsek","full_name":"Trsek, Henning","orcid":"0000-0002-0133-0656"},{"first_name":"Georg","last_name":"Lukas","full_name":"Lukas, Georg"}],"year":"2022","department":[{"_id":"DEP5023"}],"conference":{"location":"Stuttgart","name":"27th International Conference on Emerging Technologies and Factory Automation (ETFA)","end_date":"2022-09-09","start_date":"2022-09-06"},"publisher":"IEEE","status":"public","publication_identifier":{"isbn":["9781665499965"]},"publication":"2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA)","type":"conference","date_created":"2024-03-01T14:36:19Z","user_id":"83781","date_updated":"2024-03-05T14:17:17Z","_id":"11165","doi":"10.1109/ETFA52439.2022.9921430","place":"Piscataway, NJ","language":[{"iso":"eng"}]},{"date_created":"2024-03-01T14:36:35Z","type":"conference","publication":"2022 27th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)","publication_identifier":{"isbn":["9781665499965"]},"date_updated":"2024-03-05T14:09:00Z","user_id":"83781","doi":"10.1109/ETFA52439.2022.9921676","_id":"11166","language":[{"iso":"eng"}],"place":"Piscataway, NJ","title":"Am I Done Learning? - Determining Learning States in Adaptive Assembly Systems","publication_status":"published","citation":{"din1505-2-1":"<span style=\"font-variant:small-caps;\">Sehr, Philip</span> ; <span style=\"font-variant:small-caps;\">Moriz, Natalia</span> ; <span style=\"font-variant:small-caps;\">Heinz-Jakobs, Mario</span> ; <span style=\"font-variant:small-caps;\">Trsek, Henning</span>: Am I Done Learning? - Determining Learning States in Adaptive Assembly Systems. In: <i>2022 27th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)</i>. Piscataway, NJ : IEEE, 2022","chicago-de":"Sehr, Philip, Natalia Moriz, Mario Heinz-Jakobs und Henning Trsek. 2022. Am I Done Learning? - Determining Learning States in Adaptive Assembly Systems. In: <i>2022 27th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)</i>. Piscataway, NJ: IEEE. doi:<a href=\"https://doi.org/10.1109/ETFA52439.2022.9921676\">10.1109/ETFA52439.2022.9921676</a>, .","short":"P. Sehr, N. Moriz, M. Heinz-Jakobs, H. Trsek, in: 2022 27th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA), IEEE, Piscataway, NJ, 2022.","bjps":"<b>Sehr P <i>et al.</i></b> (2022) Am I Done Learning? - Determining Learning States in Adaptive Assembly Systems. <i>2022 27th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)</i>. Piscataway, NJ: IEEE.","havard":"P. Sehr, N. Moriz, M. Heinz-Jakobs, H. Trsek, Am I Done Learning? - Determining Learning States in Adaptive Assembly Systems, in: 2022 27th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA), IEEE, Piscataway, NJ, 2022.","mla":"Sehr, Philip, et al. “Am I Done Learning? - Determining Learning States in Adaptive Assembly Systems.” <i>2022 27th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)</i>, IEEE, 2022, <a href=\"https://doi.org/10.1109/ETFA52439.2022.9921676\">https://doi.org/10.1109/ETFA52439.2022.9921676</a>.","ufg":"<b>Sehr, Philip u. a.</b>: Am I Done Learning? - Determining Learning States in Adaptive Assembly Systems, in: o. Hg.: 2022 27th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA), Piscataway, NJ 2022.","ama":"Sehr P, Moriz N, Heinz-Jakobs M, Trsek H. Am I Done Learning? - Determining Learning States in Adaptive Assembly Systems. In: <i>2022 27th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)</i>. IEEE; 2022. doi:<a href=\"https://doi.org/10.1109/ETFA52439.2022.9921676\">10.1109/ETFA52439.2022.9921676</a>","van":"Sehr P, Moriz N, Heinz-Jakobs M, Trsek H. Am I Done Learning? - Determining Learning States in Adaptive Assembly Systems. In: 2022 27th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA). Piscataway, NJ: IEEE; 2022.","chicago":"Sehr, Philip, Natalia Moriz, Mario Heinz-Jakobs, and Henning Trsek. “Am I Done Learning? - Determining Learning States in Adaptive Assembly Systems.” In <i>2022 27th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)</i>. Piscataway, NJ: IEEE, 2022. <a href=\"https://doi.org/10.1109/ETFA52439.2022.9921676\">https://doi.org/10.1109/ETFA52439.2022.9921676</a>.","ieee":"P. Sehr, N. Moriz, M. Heinz-Jakobs, and H. Trsek, “Am I Done Learning? - Determining Learning States in Adaptive Assembly Systems,” presented at the 27th International Conference on Emerging Technologies and Factory Automation (ETFA), Stuttgart, 2022. doi: <a href=\"https://doi.org/10.1109/ETFA52439.2022.9921676\">10.1109/ETFA52439.2022.9921676</a>.","apa":"Sehr, P., Moriz, N., Heinz-Jakobs, M., &#38; Trsek, H. (2022). Am I Done Learning? - Determining Learning States in Adaptive Assembly Systems. <i>2022 27th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)</i>. 27th International Conference on Emerging Technologies and Factory Automation (ETFA), Stuttgart. <a href=\"https://doi.org/10.1109/ETFA52439.2022.9921676\">https://doi.org/10.1109/ETFA52439.2022.9921676</a>"},"abstract":[{"text":"n order to utilize the full potential of an assembly assistant, it is necessary for the system to be able to adapt to the worker’s individual needs and capabilities. The required amount of necessary assistance changes during the assembly work because the worker memorizes the steps and learns the task and might be bothered by unnecessary assistance. Finding the point in time where the learning phase of the worker is finished is therefore an important aspect. In this work, we propose and evaluate a novel method to identify the end of the worker’s learning phase. The method makes use of learning curve models and curve fitting in order to determine the progress of the worker.","lang":"eng"}],"conference":{"location":"Stuttgart","name":"27th International Conference on Emerging Technologies and Factory Automation (ETFA)","start_date":"2022-09-06","end_date":"2022-09-09"},"department":[{"_id":"DEP5023"}],"year":"2022","author":[{"first_name":"Philip","last_name":"Sehr","id":"71582","full_name":"Sehr, Philip"},{"first_name":"Natalia","full_name":"Moriz, Natalia","last_name":"Moriz","id":"44238"},{"last_name":"Heinz-Jakobs","first_name":"Mario","full_name":"Heinz-Jakobs, Mario","id":"85220"},{"last_name":"Trsek","id":"1486","first_name":"Henning","full_name":"Trsek, Henning","orcid":"0000-0002-0133-0656"}],"publisher":"IEEE","status":"public"},{"place":"Piscataway, NJ","language":[{"iso":"eng"}],"_id":"11163","doi":"10.1109/ETFA52439.2022.9921646","user_id":"83781","date_updated":"2024-03-05T14:09:35Z","publication":"2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA)","publication_identifier":{"isbn":["9781665499965"]},"date_created":"2024-03-01T14:35:50Z","type":"conference","status":"public","publisher":"IEEE","author":[{"id":"68628","last_name":"Konradi","first_name":"Oliver","full_name":"Konradi, Oliver"},{"full_name":"Mankowski, Andre","first_name":"Andre","last_name":"Mankowski","id":"51482"},{"id":"1710","last_name":"Wisniewski","full_name":"Wisniewski, Lukasz","first_name":"Lukasz"},{"orcid":"0000-0002-0133-0656","first_name":"Henning","full_name":"Trsek, Henning","id":"1486","last_name":"Trsek"}],"year":"2022","department":[{"_id":"DEP5023"}],"conference":{"location":"Stuttgart","name":"27th International Conference on Emerging Technologies and Factory Automation (ETFA)","start_date":"2022-09-06","end_date":"2022-09-09"},"abstract":[{"lang":"eng","text":"Technologies such as TSN and OPC UA are enablers for converged networks in industrial applications. TSN enables the coexistence of network traffic with real-time requirements and best-effort requirements. On the other hand, OPC UA defines a common information model in addition to secure communication, scalability, and platform independence. The new specification of OPC UA PubSub enables the possibility of implementing OPC UA on the lower levels of the automation pyramid, the field level. Therefore, combining these two technologies can in principle be implemented for every vertical and horizontal communication. This document analyzes the state of the art of OPC UA over TSN and explains the first steps towards an easy to use proof-of-concept for a converged network that is also designed to be a testbed. The testbed will be used to evaluate the interoperability of TSN-capable devices from different vendors. In addition to that, different OPC UA PubSub implementations will be used and benchmarked. These future results will present an overview of the currently available products and provides hands-on experiences for practical implementations of converged networks."}],"citation":{"ieee":"O. Konradi, A. Mankowski, L. Wisniewski, and H. Trsek, “Towards an Industrial Converged Network with OPC UA PubSub and TSN,” presented at the 27th International Conference on Emerging Technologies and Factory Automation (ETFA), Stuttgart, 2022. doi: <a href=\"https://doi.org/10.1109/ETFA52439.2022.9921646\">10.1109/ETFA52439.2022.9921646</a>.","ama":"Konradi O, Mankowski A, Wisniewski L, Trsek H. Towards an Industrial Converged Network with OPC UA PubSub and TSN. In: <i>2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA)</i>. IEEE; 2022. doi:<a href=\"https://doi.org/10.1109/ETFA52439.2022.9921646\">10.1109/ETFA52439.2022.9921646</a>","short":"O. Konradi, A. Mankowski, L. Wisniewski, H. Trsek, in: 2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA), IEEE, Piscataway, NJ, 2022.","din1505-2-1":"<span style=\"font-variant:small-caps;\">Konradi, Oliver</span> ; <span style=\"font-variant:small-caps;\">Mankowski, Andre</span> ; <span style=\"font-variant:small-caps;\">Wisniewski, Lukasz</span> ; <span style=\"font-variant:small-caps;\">Trsek, Henning</span>: Towards an Industrial Converged Network with OPC UA PubSub and TSN. In: <i>2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA)</i>. Piscataway, NJ : IEEE, 2022","chicago-de":"Konradi, Oliver, Andre Mankowski, Lukasz Wisniewski und Henning Trsek. 2022. Towards an Industrial Converged Network with OPC UA PubSub and TSN. In: <i>2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA)</i>. Piscataway, NJ: IEEE. doi:<a href=\"https://doi.org/10.1109/ETFA52439.2022.9921646\">10.1109/ETFA52439.2022.9921646</a>, .","apa":"Konradi, O., Mankowski, A., Wisniewski, L., &#38; Trsek, H. (2022). Towards an Industrial Converged Network with OPC UA PubSub and TSN. <i>2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA)</i>. 27th International Conference on Emerging Technologies and Factory Automation (ETFA), Stuttgart. <a href=\"https://doi.org/10.1109/ETFA52439.2022.9921646\">https://doi.org/10.1109/ETFA52439.2022.9921646</a>","chicago":"Konradi, Oliver, Andre Mankowski, Lukasz Wisniewski, and Henning Trsek. “Towards an Industrial Converged Network with OPC UA PubSub and TSN.” In <i>2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA)</i>. Piscataway, NJ: IEEE, 2022. <a href=\"https://doi.org/10.1109/ETFA52439.2022.9921646\">https://doi.org/10.1109/ETFA52439.2022.9921646</a>.","van":"Konradi O, Mankowski A, Wisniewski L, Trsek H. Towards an Industrial Converged Network with OPC UA PubSub and TSN. In: 2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA). Piscataway, NJ: IEEE; 2022.","ufg":"<b>Konradi, Oliver u. a.</b>: Towards an Industrial Converged Network with OPC UA PubSub and TSN, in: o. Hg.: 2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA), Piscataway, NJ 2022.","bjps":"<b>Konradi O <i>et al.</i></b> (2022) Towards an Industrial Converged Network with OPC UA PubSub and TSN. <i>2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA)</i>. Piscataway, NJ: IEEE.","mla":"Konradi, Oliver, et al. “Towards an Industrial Converged Network with OPC UA PubSub and TSN.” <i>2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA)</i>, IEEE, 2022, <a href=\"https://doi.org/10.1109/ETFA52439.2022.9921646\">https://doi.org/10.1109/ETFA52439.2022.9921646</a>.","havard":"O. Konradi, A. Mankowski, L. Wisniewski, H. Trsek, Towards an Industrial Converged Network with OPC UA PubSub and TSN, in: 2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA), IEEE, Piscataway, NJ, 2022."},"publication_status":"published","title":"Towards an Industrial Converged Network with OPC UA PubSub and TSN"}]