---
_id: '11165'
abstract:
- lang: eng
  text: The reduction of CO2 emissions caused by auto-mobile traffic relies on the
    development of electric mobility infrastructure which in turn relies on efficient
    communication between charge points, used to connect electric vehicles to the
    power network, and central systems, used to manage users and transactions. The
    Open Charge Point Protocol (OCPP) is an open communication protocol designed to
    connect charge points to a central system. An important aspect of the communication
    between these entities is the security of the connection. It is conceivable, for
    instance, that an adversary could compromise a central system to attack charge
    points.This work devises three different attack scenarios which could be executed
    by a malicious OCPP central system to attack an OCPP charge point. It also assesses
    the feasibility and potential consequences of such attacks. Additionally, it presents
    an approach of an "evil" OCPP server implementation, based on the SteVe server
    which was originally developed at the RWTH Aachen. The "evil" OCPP server implements
    various attack scenarios and is intended to be used for penetration testing of
    OCPP charge points that connect to the central system via WebSockets/JSON or SOAP/XML.
author:
- first_name: Lisa Helene
  full_name: Gebauer, Lisa Helene
  id: '76524'
  last_name: Gebauer
- first_name: Henning
  full_name: Trsek, Henning
  id: '1486'
  last_name: Trsek
  orcid: 0000-0002-0133-0656
- first_name: Georg
  full_name: Lukas, Georg
  last_name: Lukas
citation:
  ama: 'Gebauer LH, Trsek H, Lukas G. Evil SteVe: An Approach to Simplify Penetration
    Testing of OCPP Charge Points. In: <i>2022 IEEE 27th International Conference
    on Emerging Technologies and Factory Automation (ETFA)</i>. IEEE; 2022. doi:<a
    href="https://doi.org/10.1109/ETFA52439.2022.9921430">10.1109/ETFA52439.2022.9921430</a>'
  apa: 'Gebauer, L. H., Trsek, H., &#38; Lukas, G. (2022). Evil SteVe: An Approach
    to Simplify Penetration Testing of OCPP Charge Points. <i>2022 IEEE 27th International
    Conference on Emerging Technologies and Factory Automation (ETFA)</i>. 27th International
    Conference on Emerging Technologies and Factory Automation (ETFA), Stuttgart.
    <a href="https://doi.org/10.1109/ETFA52439.2022.9921430">https://doi.org/10.1109/ETFA52439.2022.9921430</a>'
  bjps: '<b>Gebauer LH, Trsek H and Lukas G</b> (2022) Evil SteVe: An Approach to
    Simplify Penetration Testing of OCPP Charge Points. <i>2022 IEEE 27th International
    Conference on Emerging Technologies and Factory Automation (ETFA)</i>. Piscataway,
    NJ: IEEE.'
  chicago: 'Gebauer, Lisa Helene, Henning Trsek, and Georg Lukas. “Evil SteVe: An
    Approach to Simplify Penetration Testing of OCPP Charge Points.” In <i>2022 IEEE
    27th International Conference on Emerging Technologies and Factory Automation
    (ETFA)</i>. Piscataway, NJ: IEEE, 2022. <a href="https://doi.org/10.1109/ETFA52439.2022.9921430">https://doi.org/10.1109/ETFA52439.2022.9921430</a>.'
  chicago-de: 'Gebauer, Lisa Helene, Henning Trsek und Georg Lukas. 2022. Evil SteVe:
    An Approach to Simplify Penetration Testing of OCPP Charge Points. In: <i>2022
    IEEE 27th International Conference on Emerging Technologies and Factory Automation
    (ETFA)</i>. Piscataway, NJ: IEEE. doi:<a href="https://doi.org/10.1109/ETFA52439.2022.9921430">10.1109/ETFA52439.2022.9921430</a>,
    .'
  din1505-2-1: '<span style="font-variant:small-caps;">Gebauer, Lisa Helene</span>
    ; <span style="font-variant:small-caps;">Trsek, Henning</span> ; <span style="font-variant:small-caps;">Lukas,
    Georg</span>: Evil SteVe: An Approach to Simplify Penetration Testing of OCPP
    Charge Points. In: <i>2022 IEEE 27th International Conference on Emerging Technologies
    and Factory Automation (ETFA)</i>. Piscataway, NJ : IEEE, 2022'
  havard: 'L.H. Gebauer, H. Trsek, G. Lukas, Evil SteVe: An Approach to Simplify Penetration
    Testing of OCPP Charge Points, in: 2022 IEEE 27th International Conference on
    Emerging Technologies and Factory Automation (ETFA), IEEE, Piscataway, NJ, 2022.'
  ieee: 'L. H. Gebauer, H. Trsek, and G. Lukas, “Evil SteVe: An Approach to Simplify
    Penetration Testing of OCPP Charge Points,” presented at the 27th International
    Conference on Emerging Technologies and Factory Automation (ETFA), Stuttgart,
    2022. doi: <a href="https://doi.org/10.1109/ETFA52439.2022.9921430">10.1109/ETFA52439.2022.9921430</a>.'
  mla: 'Gebauer, Lisa Helene, et al. “Evil SteVe: An Approach to Simplify Penetration
    Testing of OCPP Charge Points.” <i>2022 IEEE 27th International Conference on
    Emerging Technologies and Factory Automation (ETFA)</i>, IEEE, 2022, <a href="https://doi.org/10.1109/ETFA52439.2022.9921430">https://doi.org/10.1109/ETFA52439.2022.9921430</a>.'
  short: 'L.H. Gebauer, H. Trsek, G. Lukas, in: 2022 IEEE 27th International Conference
    on Emerging Technologies and Factory Automation (ETFA), IEEE, Piscataway, NJ,
    2022.'
  ufg: '<b>Gebauer, Lisa Helene/Trsek, Henning/Lukas, Georg</b>: Evil SteVe: An Approach
    to Simplify Penetration Testing of OCPP Charge Points, in: o. Hg.: 2022 IEEE 27th
    International Conference on Emerging Technologies and Factory Automation (ETFA),
    Piscataway, NJ 2022.'
  van: 'Gebauer LH, Trsek H, Lukas G. Evil SteVe: An Approach to Simplify Penetration
    Testing of OCPP Charge Points. In: 2022 IEEE 27th International Conference on
    Emerging Technologies and Factory Automation (ETFA). Piscataway, NJ: IEEE; 2022.'
conference:
  end_date: 2022-09-09
  location: Stuttgart
  name: 27th International Conference on Emerging Technologies and Factory Automation
    (ETFA)
  start_date: 2022-09-06
date_created: 2024-03-01T14:36:19Z
date_updated: 2024-03-05T14:17:17Z
department:
- _id: DEP5023
doi: 10.1109/ETFA52439.2022.9921430
language:
- iso: eng
place: Piscataway, NJ
publication: 2022 IEEE 27th International Conference on Emerging Technologies and
  Factory Automation (ETFA)
publication_identifier:
  isbn:
  - '9781665499965'
publication_status: published
publisher: IEEE
status: public
title: 'Evil SteVe: An Approach to Simplify Penetration Testing of OCPP Charge Points'
type: conference
user_id: '83781'
year: '2022'
...
---
_id: '11166'
abstract:
- lang: eng
  text: n order to utilize the full potential of an assembly assistant, it is necessary
    for the system to be able to adapt to the worker’s individual needs and capabilities.
    The required amount of necessary assistance changes during the assembly work because
    the worker memorizes the steps and learns the task and might be bothered by unnecessary
    assistance. Finding the point in time where the learning phase of the worker is
    finished is therefore an important aspect. In this work, we propose and evaluate
    a novel method to identify the end of the worker’s learning phase. The method
    makes use of learning curve models and curve fitting in order to determine the
    progress of the worker.
author:
- first_name: Philip
  full_name: Sehr, Philip
  id: '71582'
  last_name: Sehr
- first_name: Natalia
  full_name: Moriz, Natalia
  id: '44238'
  last_name: Moriz
- first_name: Mario
  full_name: Heinz-Jakobs, Mario
  id: '85220'
  last_name: Heinz-Jakobs
- first_name: Henning
  full_name: Trsek, Henning
  id: '1486'
  last_name: Trsek
  orcid: 0000-0002-0133-0656
citation:
  ama: 'Sehr P, Moriz N, Heinz-Jakobs M, Trsek H. Am I Done Learning? - Determining
    Learning States in Adaptive Assembly Systems. In: <i>2022 27th IEEE International
    Conference on Emerging Technologies and Factory Automation (ETFA)</i>. IEEE; 2022.
    doi:<a href="https://doi.org/10.1109/ETFA52439.2022.9921676">10.1109/ETFA52439.2022.9921676</a>'
  apa: Sehr, P., Moriz, N., Heinz-Jakobs, M., &#38; Trsek, H. (2022). Am I Done Learning?
    - Determining Learning States in Adaptive Assembly Systems. <i>2022 27th IEEE
    International Conference on Emerging Technologies and Factory Automation (ETFA)</i>.
    27th International Conference on Emerging Technologies and Factory Automation
    (ETFA), Stuttgart. <a href="https://doi.org/10.1109/ETFA52439.2022.9921676">https://doi.org/10.1109/ETFA52439.2022.9921676</a>
  bjps: '<b>Sehr P <i>et al.</i></b> (2022) Am I Done Learning? - Determining Learning
    States in Adaptive Assembly Systems. <i>2022 27th IEEE International Conference
    on Emerging Technologies and Factory Automation (ETFA)</i>. Piscataway, NJ: IEEE.'
  chicago: 'Sehr, Philip, Natalia Moriz, Mario Heinz-Jakobs, and Henning Trsek. “Am
    I Done Learning? - Determining Learning States in Adaptive Assembly Systems.”
    In <i>2022 27th IEEE International Conference on Emerging Technologies and Factory
    Automation (ETFA)</i>. Piscataway, NJ: IEEE, 2022. <a href="https://doi.org/10.1109/ETFA52439.2022.9921676">https://doi.org/10.1109/ETFA52439.2022.9921676</a>.'
  chicago-de: 'Sehr, Philip, Natalia Moriz, Mario Heinz-Jakobs und Henning Trsek.
    2022. Am I Done Learning? - Determining Learning States in Adaptive Assembly Systems.
    In: <i>2022 27th IEEE International Conference on Emerging Technologies and Factory
    Automation (ETFA)</i>. Piscataway, NJ: IEEE. doi:<a href="https://doi.org/10.1109/ETFA52439.2022.9921676">10.1109/ETFA52439.2022.9921676</a>,
    .'
  din1505-2-1: '<span style="font-variant:small-caps;">Sehr, Philip</span> ; <span
    style="font-variant:small-caps;">Moriz, Natalia</span> ; <span style="font-variant:small-caps;">Heinz-Jakobs,
    Mario</span> ; <span style="font-variant:small-caps;">Trsek, Henning</span>: Am
    I Done Learning? - Determining Learning States in Adaptive Assembly Systems. In:
    <i>2022 27th IEEE International Conference on Emerging Technologies and Factory
    Automation (ETFA)</i>. Piscataway, NJ : IEEE, 2022'
  havard: 'P. Sehr, N. Moriz, M. Heinz-Jakobs, H. Trsek, Am I Done Learning? - Determining
    Learning States in Adaptive Assembly Systems, in: 2022 27th IEEE International
    Conference on Emerging Technologies and Factory Automation (ETFA), IEEE, Piscataway,
    NJ, 2022.'
  ieee: 'P. Sehr, N. Moriz, M. Heinz-Jakobs, and H. Trsek, “Am I Done Learning? -
    Determining Learning States in Adaptive Assembly Systems,” presented at the 27th
    International Conference on Emerging Technologies and Factory Automation (ETFA),
    Stuttgart, 2022. doi: <a href="https://doi.org/10.1109/ETFA52439.2022.9921676">10.1109/ETFA52439.2022.9921676</a>.'
  mla: Sehr, Philip, et al. “Am I Done Learning? - Determining Learning States in
    Adaptive Assembly Systems.” <i>2022 27th IEEE International Conference on Emerging
    Technologies and Factory Automation (ETFA)</i>, IEEE, 2022, <a href="https://doi.org/10.1109/ETFA52439.2022.9921676">https://doi.org/10.1109/ETFA52439.2022.9921676</a>.
  short: 'P. Sehr, N. Moriz, M. Heinz-Jakobs, H. Trsek, in: 2022 27th IEEE International
    Conference on Emerging Technologies and Factory Automation (ETFA), IEEE, Piscataway,
    NJ, 2022.'
  ufg: '<b>Sehr, Philip u. a.</b>: Am I Done Learning? - Determining Learning States
    in Adaptive Assembly Systems, in: o. Hg.: 2022 27th IEEE International Conference
    on Emerging Technologies and Factory Automation (ETFA), Piscataway, NJ 2022.'
  van: 'Sehr P, Moriz N, Heinz-Jakobs M, Trsek H. Am I Done Learning? - Determining
    Learning States in Adaptive Assembly Systems. In: 2022 27th IEEE International
    Conference on Emerging Technologies and Factory Automation (ETFA). Piscataway,
    NJ: IEEE; 2022.'
conference:
  end_date: 2022-09-09
  location: Stuttgart
  name: 27th International Conference on Emerging Technologies and Factory Automation
    (ETFA)
  start_date: 2022-09-06
date_created: 2024-03-01T14:36:35Z
date_updated: 2024-03-05T14:09:00Z
department:
- _id: DEP5023
doi: 10.1109/ETFA52439.2022.9921676
language:
- iso: eng
place: Piscataway, NJ
publication: 2022 27th IEEE International Conference on Emerging Technologies and
  Factory Automation (ETFA)
publication_identifier:
  isbn:
  - '9781665499965'
publication_status: published
publisher: IEEE
status: public
title: Am I Done Learning? - Determining Learning States in Adaptive Assembly Systems
type: conference
user_id: '83781'
year: '2022'
...
---
_id: '11163'
abstract:
- lang: eng
  text: Technologies such as TSN and OPC UA are enablers for converged networks in
    industrial applications. TSN enables the coexistence of network traffic with real-time
    requirements and best-effort requirements. On the other hand, OPC UA defines a
    common information model in addition to secure communication, scalability, and
    platform independence. The new specification of OPC UA PubSub enables the possibility
    of implementing OPC UA on the lower levels of the automation pyramid, the field
    level. Therefore, combining these two technologies can in principle be implemented
    for every vertical and horizontal communication. This document analyzes the state
    of the art of OPC UA over TSN and explains the first steps towards an easy to
    use proof-of-concept for a converged network that is also designed to be a testbed.
    The testbed will be used to evaluate the interoperability of TSN-capable devices
    from different vendors. In addition to that, different OPC UA PubSub implementations
    will be used and benchmarked. These future results will present an overview of
    the currently available products and provides hands-on experiences for practical
    implementations of converged networks.
author:
- first_name: Oliver
  full_name: Konradi, Oliver
  id: '68628'
  last_name: Konradi
- first_name: Andre
  full_name: Mankowski, Andre
  id: '51482'
  last_name: Mankowski
- first_name: Lukasz
  full_name: Wisniewski, Lukasz
  id: '1710'
  last_name: Wisniewski
- first_name: Henning
  full_name: Trsek, Henning
  id: '1486'
  last_name: Trsek
  orcid: 0000-0002-0133-0656
citation:
  ama: 'Konradi O, Mankowski A, Wisniewski L, Trsek H. Towards an Industrial Converged
    Network with OPC UA PubSub and TSN. In: <i>2022 IEEE 27th International Conference
    on Emerging Technologies and Factory Automation (ETFA)</i>. IEEE; 2022. doi:<a
    href="https://doi.org/10.1109/ETFA52439.2022.9921646">10.1109/ETFA52439.2022.9921646</a>'
  apa: Konradi, O., Mankowski, A., Wisniewski, L., &#38; Trsek, H. (2022). Towards
    an Industrial Converged Network with OPC UA PubSub and TSN. <i>2022 IEEE 27th
    International Conference on Emerging Technologies and Factory Automation (ETFA)</i>.
    27th International Conference on Emerging Technologies and Factory Automation
    (ETFA), Stuttgart. <a href="https://doi.org/10.1109/ETFA52439.2022.9921646">https://doi.org/10.1109/ETFA52439.2022.9921646</a>
  bjps: '<b>Konradi O <i>et al.</i></b> (2022) Towards an Industrial Converged Network
    with OPC UA PubSub and TSN. <i>2022 IEEE 27th International Conference on Emerging
    Technologies and Factory Automation (ETFA)</i>. Piscataway, NJ: IEEE.'
  chicago: 'Konradi, Oliver, Andre Mankowski, Lukasz Wisniewski, and Henning Trsek.
    “Towards an Industrial Converged Network with OPC UA PubSub and TSN.” In <i>2022
    IEEE 27th International Conference on Emerging Technologies and Factory Automation
    (ETFA)</i>. Piscataway, NJ: IEEE, 2022. <a href="https://doi.org/10.1109/ETFA52439.2022.9921646">https://doi.org/10.1109/ETFA52439.2022.9921646</a>.'
  chicago-de: 'Konradi, Oliver, Andre Mankowski, Lukasz Wisniewski und Henning Trsek.
    2022. Towards an Industrial Converged Network with OPC UA PubSub and TSN. In:
    <i>2022 IEEE 27th International Conference on Emerging Technologies and Factory
    Automation (ETFA)</i>. Piscataway, NJ: IEEE. doi:<a href="https://doi.org/10.1109/ETFA52439.2022.9921646">10.1109/ETFA52439.2022.9921646</a>,
    .'
  din1505-2-1: '<span style="font-variant:small-caps;">Konradi, Oliver</span> ; <span
    style="font-variant:small-caps;">Mankowski, Andre</span> ; <span style="font-variant:small-caps;">Wisniewski,
    Lukasz</span> ; <span style="font-variant:small-caps;">Trsek, Henning</span>:
    Towards an Industrial Converged Network with OPC UA PubSub and TSN. In: <i>2022
    IEEE 27th International Conference on Emerging Technologies and Factory Automation
    (ETFA)</i>. Piscataway, NJ : IEEE, 2022'
  havard: 'O. Konradi, A. Mankowski, L. Wisniewski, H. Trsek, Towards an Industrial
    Converged Network with OPC UA PubSub and TSN, in: 2022 IEEE 27th International
    Conference on Emerging Technologies and Factory Automation (ETFA), IEEE, Piscataway,
    NJ, 2022.'
  ieee: 'O. Konradi, A. Mankowski, L. Wisniewski, and H. Trsek, “Towards an Industrial
    Converged Network with OPC UA PubSub and TSN,” presented at the 27th International
    Conference on Emerging Technologies and Factory Automation (ETFA), Stuttgart,
    2022. doi: <a href="https://doi.org/10.1109/ETFA52439.2022.9921646">10.1109/ETFA52439.2022.9921646</a>.'
  mla: Konradi, Oliver, et al. “Towards an Industrial Converged Network with OPC UA
    PubSub and TSN.” <i>2022 IEEE 27th International Conference on Emerging Technologies
    and Factory Automation (ETFA)</i>, IEEE, 2022, <a href="https://doi.org/10.1109/ETFA52439.2022.9921646">https://doi.org/10.1109/ETFA52439.2022.9921646</a>.
  short: 'O. Konradi, A. Mankowski, L. Wisniewski, H. Trsek, in: 2022 IEEE 27th International
    Conference on Emerging Technologies and Factory Automation (ETFA), IEEE, Piscataway,
    NJ, 2022.'
  ufg: '<b>Konradi, Oliver u. a.</b>: Towards an Industrial Converged Network with
    OPC UA PubSub and TSN, in: o. Hg.: 2022 IEEE 27th International Conference on
    Emerging Technologies and Factory Automation (ETFA), Piscataway, NJ 2022.'
  van: 'Konradi O, Mankowski A, Wisniewski L, Trsek H. Towards an Industrial Converged
    Network with OPC UA PubSub and TSN. In: 2022 IEEE 27th International Conference
    on Emerging Technologies and Factory Automation (ETFA). Piscataway, NJ: IEEE;
    2022.'
conference:
  end_date: 2022-09-09
  location: Stuttgart
  name: 27th International Conference on Emerging Technologies and Factory Automation
    (ETFA)
  start_date: 2022-09-06
date_created: 2024-03-01T14:35:50Z
date_updated: 2024-03-05T14:09:35Z
department:
- _id: DEP5023
doi: 10.1109/ETFA52439.2022.9921646
language:
- iso: eng
place: Piscataway, NJ
publication: 2022 IEEE 27th International Conference on Emerging Technologies and
  Factory Automation (ETFA)
publication_identifier:
  isbn:
  - '9781665499965'
publication_status: published
publisher: IEEE
status: public
title: Towards an Industrial Converged Network with OPC UA PubSub and TSN
type: conference
user_id: '83781'
year: '2022'
...
