[{"conference":{"location":"Vancouver, British Columbia, Canada","name":"55th IEEE Holm Conference on Electrical Contacts","end_date":"2009-09-16","start_date":"2009-09-14"},"department":[{"_id":"DEP6012"}],"year":2009,"main_file_link":[{"url":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5284381"}],"author":[{"last_name":"Song","id":"5297","full_name":"Song, Jian","first_name":"Jian"},{"first_name":"Helge","last_name":"Schmidt","full_name":"Schmidt, Helge"}],"page":"331 - 338","status":"public","title":"Electrical Resistance of Connectors with Different Contact Finishes under Low Level Conditions","publication_status":"published","citation":{"ieee":"J. Song and H. Schmidt, “Electrical Resistance of Connectors with Different Contact Finishes under Low Level Conditions,” in <i>2009 Proceedings of the 55th IEEE Holm Conference on Electrical Contacts</i>, Vancouver, British Columbia, Canada, 2009, vol. 55, pp. 331–338.","ama":"Song J, Schmidt H. Electrical Resistance of Connectors with Different Contact Finishes under Low Level Conditions. In: IEEE, ed. <i>2009 Proceedings of the 55th IEEE Holm Conference on Electrical Contacts</i>. Vol 55. ; 2009:331-338.","short":"J. Song, H. Schmidt, in: IEEE (Ed.), 2009 Proceedings of the 55th IEEE Holm Conference on Electrical Contacts, 2009, pp. 331–338.","chicago-de":"Song, Jian und Helge Schmidt. 2009. Electrical Resistance of Connectors with Different Contact Finishes under Low Level Conditions. In: <i>2009 Proceedings of the 55th IEEE Holm Conference on Electrical Contacts</i>, hg. von IEEE, 55:331–338.","din1505-2-1":"<span style=\"font-variant:small-caps;\">Song, Jian</span> ; <span style=\"font-variant:small-caps;\">Schmidt, Helge</span>: Electrical Resistance of Connectors with Different Contact Finishes under Low Level Conditions. In: <span style=\"font-variant:small-caps;\">IEEE</span> (Hrsg.): <i>2009 Proceedings of the 55th IEEE Holm Conference on Electrical Contacts</i>. Bd. 55, 2009, S. 331–338","apa":"Song, J., &#38; Schmidt, H. (2009). Electrical Resistance of Connectors with Different Contact Finishes under Low Level Conditions. In IEEE (Ed.), <i>2009 Proceedings of the 55th IEEE Holm Conference on Electrical Contacts</i> (Vol. 55, pp. 331–338). Vancouver, British Columbia, Canada.","chicago":"Song, Jian, and Helge Schmidt. “Electrical Resistance of Connectors with Different Contact Finishes under Low Level Conditions.” In <i>2009 Proceedings of the 55th IEEE Holm Conference on Electrical Contacts</i>, edited by IEEE, 55:331–38, 2009.","van":"Song J, Schmidt H. Electrical Resistance of Connectors with Different Contact Finishes under Low Level Conditions. In: IEEE, editor. 2009 Proceedings of the 55th IEEE Holm Conference on Electrical Contacts. 2009. p. 331–8.","havard":"J. Song, H. Schmidt, Electrical Resistance of Connectors with Different Contact Finishes under Low Level Conditions, in: IEEE (Ed.), 2009 Proceedings of the 55th IEEE Holm Conference on Electrical Contacts, 2009: pp. 331–338.","bjps":"<b>Song J and Schmidt H</b> (2009) Electrical Resistance of Connectors with Different Contact Finishes under Low Level Conditions. In IEEE (ed.), <i>2009 Proceedings of the 55th IEEE Holm Conference on Electrical Contacts</i>, vol. 55. pp. 331–338.","mla":"Song, Jian, and Helge Schmidt. “Electrical Resistance of Connectors with Different Contact Finishes under Low Level Conditions.” <i>2009 Proceedings of the 55th IEEE Holm Conference on Electrical Contacts</i>, edited by IEEE, vol. 55, 2009, pp. 331–38.","ufg":"<b>Song, Jian/Schmidt, Helge (2009)</b>: Electrical Resistance of Connectors with Different Contact Finishes under Low Level Conditions, in: IEEE (Hg.): <i>2009 Proceedings of the 55th IEEE Holm Conference on Electrical Contacts</i> (=<i> 55</i>), S. 331–338."},"volume":55,"language":[{"iso":"eng"}],"_id":"3658","date_created":"2020-10-08T10:12:45Z","type":"conference","publication_identifier":{"isbn":["978-1-4244-3612-5"]},"publication":"2009 Proceedings of the 55th IEEE Holm Conference on Electrical Contacts","date_updated":"2023-03-15T13:49:48Z","user_id":"74004","intvolume":"        55","corporate_editor":["IEEE"]}]