[{"citation":{"ama":"Yuan H, Probst R, Song J. <i>Influence of Core/Shell Nanoparticles on the Fretting Behavior of Electrical Contacts</i>. IEEE; 2022:166-173. doi:<a href=\"https://doi.org/10.1109/HLM54538.2022.9969773\">10.1109/HLM54538.2022.9969773</a>","ieee":"H. Yuan, R. Probst, and J. Song, <i>Influence of Core/Shell Nanoparticles on the Fretting Behavior of Electrical Contacts</i>. Piscataway, NJ: IEEE, 2022, pp. 166–173. doi: <a href=\"https://doi.org/10.1109/HLM54538.2022.9969773\">10.1109/HLM54538.2022.9969773</a>.","chicago-de":"Yuan, Haomiao, Roman Probst und Jian Song. 2022. <i>Influence of Core/Shell Nanoparticles on the Fretting Behavior of Electrical Contacts</i>. <i>Electrical contacts - 2022 : proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts</i>. Piscataway, NJ: IEEE. doi:<a href=\"https://doi.org/10.1109/HLM54538.2022.9969773\">10.1109/HLM54538.2022.9969773</a>, .","din1505-2-1":"<span style=\"font-variant:small-caps;\">Yuan, Haomiao</span> ; <span style=\"font-variant:small-caps;\">Probst, Roman</span> ; <span style=\"font-variant:small-caps;\">Song, Jian</span>: <i>Influence of Core/Shell Nanoparticles on the Fretting Behavior of Electrical Contacts</i>. Piscataway, NJ : IEEE, 2022","short":"H. Yuan, R. Probst, J. Song, Influence of Core/Shell Nanoparticles on the Fretting Behavior of Electrical Contacts, IEEE, Piscataway, NJ, 2022.","ufg":"<b>Yuan, Haomiao/Probst, Roman/Song, Jian</b>: Influence of Core/Shell Nanoparticles on the Fretting Behavior of Electrical Contacts, Piscataway, NJ 2022.","mla":"Yuan, Haomiao, et al. “Influence of Core/Shell Nanoparticles on the Fretting Behavior of Electrical Contacts.” <i>Electrical Contacts - 2022 : Proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts</i>, IEEE, 2022, pp. 166–73, <a href=\"https://doi.org/10.1109/HLM54538.2022.9969773\">https://doi.org/10.1109/HLM54538.2022.9969773</a>.","bjps":"<b>Yuan H, Probst R and Song J</b> (2022) <i>Influence of Core/Shell Nanoparticles on the Fretting Behavior of Electrical Contacts</i>. Piscataway, NJ: IEEE.","havard":"H. Yuan, R. Probst, J. Song, Influence of Core/Shell Nanoparticles on the Fretting Behavior of Electrical Contacts, IEEE, Piscataway, NJ, 2022.","van":"Yuan H, Probst R, Song J. Influence of Core/Shell Nanoparticles on the Fretting Behavior of Electrical Contacts. Electrical contacts - 2022 : proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts. Piscataway, NJ: IEEE; 2022.","chicago":"Yuan, Haomiao, Roman Probst, and Jian Song. <i>Influence of Core/Shell Nanoparticles on the Fretting Behavior of Electrical Contacts</i>. <i>Electrical Contacts - 2022 : Proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts</i>. Piscataway, NJ: IEEE, 2022. <a href=\"https://doi.org/10.1109/HLM54538.2022.9969773\">https://doi.org/10.1109/HLM54538.2022.9969773</a>.","apa":"Yuan, H., Probst, R., &#38; Song, J. (2022). Influence of Core/Shell Nanoparticles on the Fretting Behavior of Electrical Contacts. In <i>Electrical contacts - 2022 : proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts</i> (pp. 166–173). IEEE. <a href=\"https://doi.org/10.1109/HLM54538.2022.9969773\">https://doi.org/10.1109/HLM54538.2022.9969773</a>"},"title":"Influence of Core/Shell Nanoparticles on the Fretting Behavior of Electrical Contacts","status":"public","page":"166 - 173","author":[{"full_name":"Yuan, Haomiao","last_name":"Yuan","first_name":"Haomiao","id":"61860"},{"full_name":"Probst, Roman","first_name":"Roman","last_name":"Probst","id":"69156"},{"first_name":"Jian","full_name":"Song, Jian","last_name":"Song","id":"5297"}],"year":"2022","date_updated":"2024-08-05T08:01:04Z","publication":"Electrical contacts - 2022 : proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts","publication_identifier":{"issn":["2158-9992"],"isbn":["978-1-6654-5966-2","978-1-6654-5967-9"],"eissn":["978-1-6654-5965-5"]},"date_created":"2022-12-11T13:46:02Z","keyword":["Nanoparticles","Resistance","Fabrication","Silver","Costs","Contacts","Voltage"],"language":[{"iso":"eng"}],"publication_status":"published","publisher":"IEEE","department":[{"_id":"DEP6012"}],"conference":{"location":" Tampa, FL, USA","name":"67th Holm Conference on Electrical Contacts","end_date":"2022-10-26","start_date":"2022-10-23"},"abstract":[{"lang":"eng","text":"In order to guarantee long lifetime and high performance of electrical contacts, a plating is usually applied on the base material. Silver is a promising plating material because of a good balance between performance and costs. The conventional silver plating is soft; therefore, a thick silver plating should be used to prevent the wear through during the operation. In order to enhance the wear resistance and prolong the lifetime of the silver plating, silver platings are modified by co-depositing nanoparticles with a core/shell structure into the silver matrix. A novel method to prepare the Ag (shell)@Al 2 O 3 (core) nanoparticles by galvanic process is introduced in this paper. The influence of fabrication parameters in the galvanic process such as the concentration of silver nitrate solution and the plating voltage on the silver content in the Ag@Al 2 O 3 nanoparticles is investigated. Afterwards, different concentrations of core/shell nanoparticles are co-deposited into the silver plating to study the effect of nanoparticles on the microhardness, microstructure and the lifetime of the silver plating. As a result, the microhardness and the lifetime of the silver plating are significantly improved and a favorable nanoparticle concentration exists for the longest lifetime. Moreover, the mechanism of the lifetime improvement is determined."}],"user_id":"83781","type":"conference_editor_article","place":"Piscataway, NJ","_id":"9210","doi":"10.1109/HLM54538.2022.9969773"},{"page":"272 - 278","status":"public","year":"2022","author":[{"id":"5297","last_name":"Song","full_name":"Song, Jian","first_name":"Jian"},{"last_name":"Shukla","id":"72757","full_name":"Shukla, Abhay Rammurti","first_name":"Abhay Rammurti"},{"id":"69156","first_name":"Roman","last_name":"Probst","full_name":"Probst, Roman"}],"citation":{"ama":"Song J, Shukla AR, Probst R. <i>State of Health of Connectors – Early Indicators</i>. IEEE; 2022:272-278. doi:<a href=\"https://doi.org/10.1109/HLM54538.2022.9969839\">10.1109/HLM54538.2022.9969839</a>","ieee":"J. Song, A. R. Shukla, and R. Probst, <i>State of Health of Connectors – Early Indicators</i>. Piscataway, NJ: IEEE, 2022, pp. 272–278. doi: <a href=\"https://doi.org/10.1109/HLM54538.2022.9969839\">10.1109/HLM54538.2022.9969839</a>.","bjps":"<b>Song J, Shukla AR and Probst R</b> (2022) <i>State of Health of Connectors – Early Indicators</i>. Piscataway, NJ: IEEE.","mla":"Song, Jian, et al. “State of Health of Connectors – Early Indicators.” <i>Electrical Contacts - 2022 : Proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts</i>, IEEE, 2022, pp. 272–78, <a href=\"https://doi.org/10.1109/HLM54538.2022.9969839\">https://doi.org/10.1109/HLM54538.2022.9969839</a>.","havard":"J. Song, A.R. Shukla, R. Probst, State of Health of Connectors – Early Indicators, IEEE, Piscataway, NJ, 2022.","ufg":"<b>Song, Jian/Shukla, Abhay Rammurti/Probst, Roman</b>: State of Health of Connectors – Early Indicators, Piscataway, NJ 2022.","van":"Song J, Shukla AR, Probst R. State of Health of Connectors – Early Indicators. Electrical contacts - 2022 : proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts. Piscataway, NJ: IEEE; 2022.","chicago":"Song, Jian, Abhay Rammurti Shukla, and Roman Probst. <i>State of Health of Connectors – Early Indicators</i>. <i>Electrical Contacts - 2022 : Proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts</i>. Piscataway, NJ: IEEE, 2022. <a href=\"https://doi.org/10.1109/HLM54538.2022.9969839\">https://doi.org/10.1109/HLM54538.2022.9969839</a>.","apa":"Song, J., Shukla, A. R., &#38; Probst, R. (2022). State of Health of Connectors – Early Indicators. In <i>Electrical contacts - 2022 : proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts</i> (pp. 272–278). IEEE. <a href=\"https://doi.org/10.1109/HLM54538.2022.9969839\">https://doi.org/10.1109/HLM54538.2022.9969839</a>","din1505-2-1":"<span style=\"font-variant:small-caps;\">Song, Jian</span> ; <span style=\"font-variant:small-caps;\">Shukla, Abhay Rammurti</span> ; <span style=\"font-variant:small-caps;\">Probst, Roman</span>: <i>State of Health of Connectors – Early Indicators</i>. Piscataway, NJ : IEEE, 2022","chicago-de":"Song, Jian, Abhay Rammurti Shukla und Roman Probst. 2022. <i>State of Health of Connectors – Early Indicators</i>. <i>Electrical contacts - 2022 : proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts</i>. Piscataway, NJ: IEEE. doi:<a href=\"https://doi.org/10.1109/HLM54538.2022.9969839\">10.1109/HLM54538.2022.9969839</a>, .","short":"J. Song, A.R. Shukla, R. Probst, State of Health of Connectors – Early Indicators, IEEE, Piscataway, NJ, 2022."},"title":"State of Health of Connectors – Early Indicators","language":[{"iso":"eng"}],"keyword":["Connectors","Correlation","Sensitivity analysis","Contact resistance","Lifetime estimation","Reliability","Electrical resistance measurement"],"date_updated":"2024-08-05T08:01:22Z","date_created":"2022-12-11T13:50:30Z","publication_identifier":{"isbn":["978-1-6654-5966-2","978-1-6654-5967-9"],"issn":["2158-9992"],"eisbn":["978-1-6654-5965-5"]},"publication":"Electrical contacts - 2022 : proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts","publisher":"IEEE","abstract":[{"lang":"eng","text":"Lifetime tests of connectors are time consuming and labor intensive. Our study reveals a strong correlation between the statistical characteristics of contact resistance development in the early stages of lifetime tests and the final results of the tests. This correlation enables a further time lapse of lifetime tests and the prediction of the state of the health of connectors which can be utilized in the development of diagnostic strategy in sophisticated networks with very high number of connectors as well as in a quick classification of connectors with respect to their design features. Methods of statistical evaluation are introduced and the sensitivity analyses of different characteristics for the state of health of connectors are conducted."}],"department":[{"_id":"DEP6012"}],"conference":{"name":"67th Holm Conference on Electrical Contacts","location":"Tampa, FL, USA","start_date":"2022-10-23","end_date":"2022-10-26"},"publication_status":"published","doi":"10.1109/HLM54538.2022.9969839","_id":"9211","place":"Piscataway, NJ","user_id":"83781","type":"conference_editor_article"},{"publication_status":"published","abstract":[{"lang":"eng","text":"The function and reliability of electrical connectors in automotive applications is crucial for vehicle safety, especially with regard to E-mobility and autonomous driving. For this reason, electrical connectors are being developed for long-term use applications. However, a small amount of function failures are still being observed in long-term use field vehicles. In this study all electrical connectors of five long-term driven vehicles from various car manufacturers are disassembled and analyzed. The same analysis procedure is followed for every vehicle and the electrical resistance of the connectors is measured to determine electrical failures. The contacts of failed connectors are further analyzed using optical microscopy, XRF spectroscopy, EDS and detailed contact resistance mapping. By comparing the connectors with electrical failures to the same types of connectors with a proper electrical resistance, failure mechanisms can be detected and analyzed. The frequency of various failure mechanisms is statistically evaluated. The results of the analysis provide valuable indications with respect to improvement of the reliability of connectors."}],"department":[{"_id":"DEP6012"}],"conference":{"start_date":"2022-10-23","end_date":"2022-10-26","location":"Tampa, FL, USA","name":"67th Holm Conference on Electrical Contacts"},"publisher":"IEEE","type":"conference_editor_article","user_id":"83781","_id":"9213","doi":"10.1109/HLM54538.2022.9969820","place":"Piscataway, NJ","title":"The Analysis of Failure Mechanisms of Electrical Connectors in Long-term Use Field Vehicles","citation":{"din1505-2-1":"<span style=\"font-variant:small-caps;\">Hilmert, Dirk</span> ; <span style=\"font-variant:small-caps;\">Yuan, Haomiao</span> ; <span style=\"font-variant:small-caps;\">Song, Jian</span>: <i>The Analysis of Failure Mechanisms of Electrical Connectors in Long-term Use Field Vehicles</i>. Piscataway, NJ : IEEE, 2022","chicago-de":"Hilmert, Dirk, Haomiao Yuan und Jian Song. 2022. <i>The Analysis of Failure Mechanisms of Electrical Connectors in Long-term Use Field Vehicles</i>. <i>Electrical contacts - 2022 : proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts</i>. Piscataway, NJ: IEEE. doi:<a href=\"https://doi.org/10.1109/HLM54538.2022.9969820\">10.1109/HLM54538.2022.9969820</a>, .","short":"D. Hilmert, H. Yuan, J. Song, The Analysis of Failure Mechanisms of Electrical Connectors in Long-Term Use Field Vehicles, IEEE, Piscataway, NJ, 2022.","ufg":"<b>Hilmert, Dirk/Yuan, Haomiao/Song, Jian</b>: The Analysis of Failure Mechanisms of Electrical Connectors in Long-term Use Field Vehicles, Piscataway, NJ 2022.","bjps":"<b>Hilmert D, Yuan H and Song J</b> (2022) <i>The Analysis of Failure Mechanisms of Electrical Connectors in Long-Term Use Field Vehicles</i>. Piscataway, NJ: IEEE.","havard":"D. Hilmert, H. Yuan, J. Song, The Analysis of Failure Mechanisms of Electrical Connectors in Long-term Use Field Vehicles, IEEE, Piscataway, NJ, 2022.","mla":"Hilmert, Dirk, et al. “The Analysis of Failure Mechanisms of Electrical Connectors in Long-Term Use Field Vehicles.” <i>Electrical Contacts - 2022 : Proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts</i>, IEEE, 2022, pp. 9–16, <a href=\"https://doi.org/10.1109/HLM54538.2022.9969820\">https://doi.org/10.1109/HLM54538.2022.9969820</a>.","van":"Hilmert D, Yuan H, Song J. The Analysis of Failure Mechanisms of Electrical Connectors in Long-term Use Field Vehicles. Electrical contacts - 2022 : proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts. Piscataway, NJ: IEEE; 2022.","chicago":"Hilmert, Dirk, Haomiao Yuan, and Jian Song. <i>The Analysis of Failure Mechanisms of Electrical Connectors in Long-Term Use Field Vehicles</i>. <i>Electrical Contacts - 2022 : Proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts</i>. Piscataway, NJ: IEEE, 2022. <a href=\"https://doi.org/10.1109/HLM54538.2022.9969820\">https://doi.org/10.1109/HLM54538.2022.9969820</a>.","apa":"Hilmert, D., Yuan, H., &#38; Song, J. (2022). The Analysis of Failure Mechanisms of Electrical Connectors in Long-term Use Field Vehicles. In <i>Electrical contacts - 2022 : proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts</i> (pp. 9–16). IEEE. <a href=\"https://doi.org/10.1109/HLM54538.2022.9969820\">https://doi.org/10.1109/HLM54538.2022.9969820</a>","ama":"Hilmert D, Yuan H, Song J. <i>The Analysis of Failure Mechanisms of Electrical Connectors in Long-Term Use Field Vehicles</i>. IEEE; 2022:9-16. doi:<a href=\"https://doi.org/10.1109/HLM54538.2022.9969820\">10.1109/HLM54538.2022.9969820</a>","ieee":"D. Hilmert, H. Yuan, and J. Song, <i>The Analysis of Failure Mechanisms of Electrical Connectors in Long-term Use Field Vehicles</i>. Piscataway, NJ: IEEE, 2022, pp. 9–16. doi: <a href=\"https://doi.org/10.1109/HLM54538.2022.9969820\">10.1109/HLM54538.2022.9969820</a>."},"year":"2022","author":[{"full_name":"Hilmert, Dirk","first_name":"Dirk","id":"74212","last_name":"Hilmert"},{"first_name":"Haomiao","id":"61860","full_name":"Yuan, Haomiao","last_name":"Yuan"},{"first_name":"Jian","last_name":"Song","id":"5297","full_name":"Song, Jian"}],"status":"public","page":"9 - 16","publication":"Electrical contacts - 2022 : proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts","publication_identifier":{"isbn":["978-1-6654-5966-2","978-1-6654-5967-9"],"issn":["2158-9992"],"eisbn":["978-1-6654-5965-5"]},"date_created":"2022-12-11T13:55:18Z","date_updated":"2024-08-05T08:18:13Z","keyword":["Connectors","Resistance","Spectroscopy","Optical microscopy","Microscopy","Vehicle safety","Failure analysis"],"language":[{"iso":"eng"}]}]