---
_id: '9210'
abstract:
- lang: eng
  text: In order to guarantee long lifetime and high performance of electrical contacts,
    a plating is usually applied on the base material. Silver is a promising plating
    material because of a good balance between performance and costs. The conventional
    silver plating is soft; therefore, a thick silver plating should be used to prevent
    the wear through during the operation. In order to enhance the wear resistance
    and prolong the lifetime of the silver plating, silver platings are modified by
    co-depositing nanoparticles with a core/shell structure into the silver matrix.
    A novel method to prepare the Ag (shell)@Al 2 O 3 (core) nanoparticles by galvanic
    process is introduced in this paper. The influence of fabrication parameters in
    the galvanic process such as the concentration of silver nitrate solution and
    the plating voltage on the silver content in the Ag@Al 2 O 3 nanoparticles is
    investigated. Afterwards, different concentrations of core/shell nanoparticles
    are co-deposited into the silver plating to study the effect of nanoparticles
    on the microhardness, microstructure and the lifetime of the silver plating. As
    a result, the microhardness and the lifetime of the silver plating are significantly
    improved and a favorable nanoparticle concentration exists for the longest lifetime.
    Moreover, the mechanism of the lifetime improvement is determined.
author:
- first_name: Haomiao
  full_name: Yuan, Haomiao
  id: '61860'
  last_name: Yuan
- first_name: Roman
  full_name: Probst, Roman
  id: '69156'
  last_name: Probst
- first_name: Jian
  full_name: Song, Jian
  id: '5297'
  last_name: Song
citation:
  ama: Yuan H, Probst R, Song J. <i>Influence of Core/Shell Nanoparticles on the Fretting
    Behavior of Electrical Contacts</i>. IEEE; 2022:166-173. doi:<a href="https://doi.org/10.1109/HLM54538.2022.9969773">10.1109/HLM54538.2022.9969773</a>
  apa: 'Yuan, H., Probst, R., &#38; Song, J. (2022). Influence of Core/Shell Nanoparticles
    on the Fretting Behavior of Electrical Contacts. In <i>Electrical contacts - 2022 :
    proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts</i>
    (pp. 166–173). IEEE. <a href="https://doi.org/10.1109/HLM54538.2022.9969773">https://doi.org/10.1109/HLM54538.2022.9969773</a>'
  bjps: '<b>Yuan H, Probst R and Song J</b> (2022) <i>Influence of Core/Shell Nanoparticles
    on the Fretting Behavior of Electrical Contacts</i>. Piscataway, NJ: IEEE.'
  chicago: 'Yuan, Haomiao, Roman Probst, and Jian Song. <i>Influence of Core/Shell
    Nanoparticles on the Fretting Behavior of Electrical Contacts</i>. <i>Electrical
    Contacts - 2022 : Proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical
    Contacts</i>. Piscataway, NJ: IEEE, 2022. <a href="https://doi.org/10.1109/HLM54538.2022.9969773">https://doi.org/10.1109/HLM54538.2022.9969773</a>.'
  chicago-de: 'Yuan, Haomiao, Roman Probst und Jian Song. 2022. <i>Influence of Core/Shell
    Nanoparticles on the Fretting Behavior of Electrical Contacts</i>. <i>Electrical
    contacts - 2022 : proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical
    Contacts</i>. Piscataway, NJ: IEEE. doi:<a href="https://doi.org/10.1109/HLM54538.2022.9969773">10.1109/HLM54538.2022.9969773</a>,
    .'
  din1505-2-1: '<span style="font-variant:small-caps;">Yuan, Haomiao</span> ; <span
    style="font-variant:small-caps;">Probst, Roman</span> ; <span style="font-variant:small-caps;">Song,
    Jian</span>: <i>Influence of Core/Shell Nanoparticles on the Fretting Behavior
    of Electrical Contacts</i>. Piscataway, NJ : IEEE, 2022'
  havard: H. Yuan, R. Probst, J. Song, Influence of Core/Shell Nanoparticles on the
    Fretting Behavior of Electrical Contacts, IEEE, Piscataway, NJ, 2022.
  ieee: 'H. Yuan, R. Probst, and J. Song, <i>Influence of Core/Shell Nanoparticles
    on the Fretting Behavior of Electrical Contacts</i>. Piscataway, NJ: IEEE, 2022,
    pp. 166–173. doi: <a href="https://doi.org/10.1109/HLM54538.2022.9969773">10.1109/HLM54538.2022.9969773</a>.'
  mla: 'Yuan, Haomiao, et al. “Influence of Core/Shell Nanoparticles on the Fretting
    Behavior of Electrical Contacts.” <i>Electrical Contacts - 2022 : Proceedings
    of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts</i>, IEEE, 2022,
    pp. 166–73, <a href="https://doi.org/10.1109/HLM54538.2022.9969773">https://doi.org/10.1109/HLM54538.2022.9969773</a>.'
  short: H. Yuan, R. Probst, J. Song, Influence of Core/Shell Nanoparticles on the
    Fretting Behavior of Electrical Contacts, IEEE, Piscataway, NJ, 2022.
  ufg: '<b>Yuan, Haomiao/Probst, Roman/Song, Jian</b>: Influence of Core/Shell Nanoparticles
    on the Fretting Behavior of Electrical Contacts, Piscataway, NJ 2022.'
  van: 'Yuan H, Probst R, Song J. Influence of Core/Shell Nanoparticles on the Fretting
    Behavior of Electrical Contacts. Electrical contacts - 2022 : proceedings of the
    Sixty-Seventh IEEE Holm Conference on Electrical Contacts. Piscataway, NJ: IEEE;
    2022.'
conference:
  end_date: 2022-10-26
  location: ' Tampa, FL, USA'
  name: 67th Holm Conference on Electrical Contacts
  start_date: 2022-10-23
date_created: 2022-12-11T13:46:02Z
date_updated: 2024-08-05T08:01:04Z
department:
- _id: DEP6012
doi: 10.1109/HLM54538.2022.9969773
keyword:
- Nanoparticles
- Resistance
- Fabrication
- Silver
- Costs
- Contacts
- Voltage
language:
- iso: eng
page: 166 - 173
place: Piscataway, NJ
publication: 'Electrical contacts - 2022 : proceedings of the Sixty-Seventh IEEE Holm
  Conference on Electrical Contacts'
publication_identifier:
  eissn:
  - 978-1-6654-5965-5
  isbn:
  - 978-1-6654-5966-2
  - 978-1-6654-5967-9
  issn:
  - 2158-9992
publication_status: published
publisher: IEEE
status: public
title: Influence of Core/Shell Nanoparticles on the Fretting Behavior of Electrical
  Contacts
type: conference_editor_article
user_id: '83781'
year: '2022'
...
---
_id: '9211'
abstract:
- lang: eng
  text: Lifetime tests of connectors are time consuming and labor intensive. Our study
    reveals a strong correlation between the statistical characteristics of contact
    resistance development in the early stages of lifetime tests and the final results
    of the tests. This correlation enables a further time lapse of lifetime tests
    and the prediction of the state of the health of connectors which can be utilized
    in the development of diagnostic strategy in sophisticated networks with very
    high number of connectors as well as in a quick classification of connectors with
    respect to their design features. Methods of statistical evaluation are introduced
    and the sensitivity analyses of different characteristics for the state of health
    of connectors are conducted.
author:
- first_name: Jian
  full_name: Song, Jian
  id: '5297'
  last_name: Song
- first_name: Abhay Rammurti
  full_name: Shukla, Abhay Rammurti
  id: '72757'
  last_name: Shukla
- first_name: Roman
  full_name: Probst, Roman
  id: '69156'
  last_name: Probst
citation:
  ama: Song J, Shukla AR, Probst R. <i>State of Health of Connectors – Early Indicators</i>.
    IEEE; 2022:272-278. doi:<a href="https://doi.org/10.1109/HLM54538.2022.9969839">10.1109/HLM54538.2022.9969839</a>
  apa: 'Song, J., Shukla, A. R., &#38; Probst, R. (2022). State of Health of Connectors
    – Early Indicators. In <i>Electrical contacts - 2022 : proceedings of the Sixty-Seventh
    IEEE Holm Conference on Electrical Contacts</i> (pp. 272–278). IEEE. <a href="https://doi.org/10.1109/HLM54538.2022.9969839">https://doi.org/10.1109/HLM54538.2022.9969839</a>'
  bjps: '<b>Song J, Shukla AR and Probst R</b> (2022) <i>State of Health of Connectors
    – Early Indicators</i>. Piscataway, NJ: IEEE.'
  chicago: 'Song, Jian, Abhay Rammurti Shukla, and Roman Probst. <i>State of Health
    of Connectors – Early Indicators</i>. <i>Electrical Contacts - 2022 : Proceedings
    of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts</i>. Piscataway,
    NJ: IEEE, 2022. <a href="https://doi.org/10.1109/HLM54538.2022.9969839">https://doi.org/10.1109/HLM54538.2022.9969839</a>.'
  chicago-de: 'Song, Jian, Abhay Rammurti Shukla und Roman Probst. 2022. <i>State
    of Health of Connectors – Early Indicators</i>. <i>Electrical contacts - 2022 :
    proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts</i>.
    Piscataway, NJ: IEEE. doi:<a href="https://doi.org/10.1109/HLM54538.2022.9969839">10.1109/HLM54538.2022.9969839</a>,
    .'
  din1505-2-1: '<span style="font-variant:small-caps;">Song, Jian</span> ; <span style="font-variant:small-caps;">Shukla,
    Abhay Rammurti</span> ; <span style="font-variant:small-caps;">Probst, Roman</span>:
    <i>State of Health of Connectors – Early Indicators</i>. Piscataway, NJ : IEEE,
    2022'
  havard: J. Song, A.R. Shukla, R. Probst, State of Health of Connectors – Early Indicators,
    IEEE, Piscataway, NJ, 2022.
  ieee: 'J. Song, A. R. Shukla, and R. Probst, <i>State of Health of Connectors –
    Early Indicators</i>. Piscataway, NJ: IEEE, 2022, pp. 272–278. doi: <a href="https://doi.org/10.1109/HLM54538.2022.9969839">10.1109/HLM54538.2022.9969839</a>.'
  mla: 'Song, Jian, et al. “State of Health of Connectors – Early Indicators.” <i>Electrical
    Contacts - 2022 : Proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical
    Contacts</i>, IEEE, 2022, pp. 272–78, <a href="https://doi.org/10.1109/HLM54538.2022.9969839">https://doi.org/10.1109/HLM54538.2022.9969839</a>.'
  short: J. Song, A.R. Shukla, R. Probst, State of Health of Connectors – Early Indicators,
    IEEE, Piscataway, NJ, 2022.
  ufg: '<b>Song, Jian/Shukla, Abhay Rammurti/Probst, Roman</b>: State of Health of
    Connectors – Early Indicators, Piscataway, NJ 2022.'
  van: 'Song J, Shukla AR, Probst R. State of Health of Connectors – Early Indicators.
    Electrical contacts - 2022 : proceedings of the Sixty-Seventh IEEE Holm Conference
    on Electrical Contacts. Piscataway, NJ: IEEE; 2022.'
conference:
  end_date: 2022-10-26
  location: Tampa, FL, USA
  name: 67th Holm Conference on Electrical Contacts
  start_date: 2022-10-23
date_created: 2022-12-11T13:50:30Z
date_updated: 2024-08-05T08:01:22Z
department:
- _id: DEP6012
doi: 10.1109/HLM54538.2022.9969839
keyword:
- Connectors
- Correlation
- Sensitivity analysis
- Contact resistance
- Lifetime estimation
- Reliability
- Electrical resistance measurement
language:
- iso: eng
page: 272 - 278
place: Piscataway, NJ
publication: 'Electrical contacts - 2022 : proceedings of the Sixty-Seventh IEEE Holm
  Conference on Electrical Contacts'
publication_identifier:
  eisbn:
  - 978-1-6654-5965-5
  isbn:
  - 978-1-6654-5966-2
  - 978-1-6654-5967-9
  issn:
  - 2158-9992
publication_status: published
publisher: IEEE
status: public
title: State of Health of Connectors – Early Indicators
type: conference_editor_article
user_id: '83781'
year: '2022'
...
---
_id: '9213'
abstract:
- lang: eng
  text: The function and reliability of electrical connectors in automotive applications
    is crucial for vehicle safety, especially with regard to E-mobility and autonomous
    driving. For this reason, electrical connectors are being developed for long-term
    use applications. However, a small amount of function failures are still being
    observed in long-term use field vehicles. In this study all electrical connectors
    of five long-term driven vehicles from various car manufacturers are disassembled
    and analyzed. The same analysis procedure is followed for every vehicle and the
    electrical resistance of the connectors is measured to determine electrical failures.
    The contacts of failed connectors are further analyzed using optical microscopy,
    XRF spectroscopy, EDS and detailed contact resistance mapping. By comparing the
    connectors with electrical failures to the same types of connectors with a proper
    electrical resistance, failure mechanisms can be detected and analyzed. The frequency
    of various failure mechanisms is statistically evaluated. The results of the analysis
    provide valuable indications with respect to improvement of the reliability of
    connectors.
author:
- first_name: Dirk
  full_name: Hilmert, Dirk
  id: '74212'
  last_name: Hilmert
- first_name: Haomiao
  full_name: Yuan, Haomiao
  id: '61860'
  last_name: Yuan
- first_name: Jian
  full_name: Song, Jian
  id: '5297'
  last_name: Song
citation:
  ama: Hilmert D, Yuan H, Song J. <i>The Analysis of Failure Mechanisms of Electrical
    Connectors in Long-Term Use Field Vehicles</i>. IEEE; 2022:9-16. doi:<a href="https://doi.org/10.1109/HLM54538.2022.9969820">10.1109/HLM54538.2022.9969820</a>
  apa: 'Hilmert, D., Yuan, H., &#38; Song, J. (2022). The Analysis of Failure Mechanisms
    of Electrical Connectors in Long-term Use Field Vehicles. In <i>Electrical contacts
    - 2022 : proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts</i>
    (pp. 9–16). IEEE. <a href="https://doi.org/10.1109/HLM54538.2022.9969820">https://doi.org/10.1109/HLM54538.2022.9969820</a>'
  bjps: '<b>Hilmert D, Yuan H and Song J</b> (2022) <i>The Analysis of Failure Mechanisms
    of Electrical Connectors in Long-Term Use Field Vehicles</i>. Piscataway, NJ:
    IEEE.'
  chicago: 'Hilmert, Dirk, Haomiao Yuan, and Jian Song. <i>The Analysis of Failure
    Mechanisms of Electrical Connectors in Long-Term Use Field Vehicles</i>. <i>Electrical
    Contacts - 2022 : Proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical
    Contacts</i>. Piscataway, NJ: IEEE, 2022. <a href="https://doi.org/10.1109/HLM54538.2022.9969820">https://doi.org/10.1109/HLM54538.2022.9969820</a>.'
  chicago-de: 'Hilmert, Dirk, Haomiao Yuan und Jian Song. 2022. <i>The Analysis of
    Failure Mechanisms of Electrical Connectors in Long-term Use Field Vehicles</i>.
    <i>Electrical contacts - 2022 : proceedings of the Sixty-Seventh IEEE Holm Conference
    on Electrical Contacts</i>. Piscataway, NJ: IEEE. doi:<a href="https://doi.org/10.1109/HLM54538.2022.9969820">10.1109/HLM54538.2022.9969820</a>,
    .'
  din1505-2-1: '<span style="font-variant:small-caps;">Hilmert, Dirk</span> ; <span
    style="font-variant:small-caps;">Yuan, Haomiao</span> ; <span style="font-variant:small-caps;">Song,
    Jian</span>: <i>The Analysis of Failure Mechanisms of Electrical Connectors in
    Long-term Use Field Vehicles</i>. Piscataway, NJ : IEEE, 2022'
  havard: D. Hilmert, H. Yuan, J. Song, The Analysis of Failure Mechanisms of Electrical
    Connectors in Long-term Use Field Vehicles, IEEE, Piscataway, NJ, 2022.
  ieee: 'D. Hilmert, H. Yuan, and J. Song, <i>The Analysis of Failure Mechanisms of
    Electrical Connectors in Long-term Use Field Vehicles</i>. Piscataway, NJ: IEEE,
    2022, pp. 9–16. doi: <a href="https://doi.org/10.1109/HLM54538.2022.9969820">10.1109/HLM54538.2022.9969820</a>.'
  mla: 'Hilmert, Dirk, et al. “The Analysis of Failure Mechanisms of Electrical Connectors
    in Long-Term Use Field Vehicles.” <i>Electrical Contacts - 2022 : Proceedings
    of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts</i>, IEEE, 2022,
    pp. 9–16, <a href="https://doi.org/10.1109/HLM54538.2022.9969820">https://doi.org/10.1109/HLM54538.2022.9969820</a>.'
  short: D. Hilmert, H. Yuan, J. Song, The Analysis of Failure Mechanisms of Electrical
    Connectors in Long-Term Use Field Vehicles, IEEE, Piscataway, NJ, 2022.
  ufg: '<b>Hilmert, Dirk/Yuan, Haomiao/Song, Jian</b>: The Analysis of Failure Mechanisms
    of Electrical Connectors in Long-term Use Field Vehicles, Piscataway, NJ 2022.'
  van: 'Hilmert D, Yuan H, Song J. The Analysis of Failure Mechanisms of Electrical
    Connectors in Long-term Use Field Vehicles. Electrical contacts - 2022 : proceedings
    of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts. Piscataway,
    NJ: IEEE; 2022.'
conference:
  end_date: 2022-10-26
  location: Tampa, FL, USA
  name: 67th Holm Conference on Electrical Contacts
  start_date: 2022-10-23
date_created: 2022-12-11T13:55:18Z
date_updated: 2024-08-05T08:18:13Z
department:
- _id: DEP6012
doi: 10.1109/HLM54538.2022.9969820
keyword:
- Connectors
- Resistance
- Spectroscopy
- Optical microscopy
- Microscopy
- Vehicle safety
- Failure analysis
language:
- iso: eng
page: 9 - 16
place: Piscataway, NJ
publication: 'Electrical contacts - 2022 : proceedings of the Sixty-Seventh IEEE Holm
  Conference on Electrical Contacts'
publication_identifier:
  eisbn:
  - 978-1-6654-5965-5
  isbn:
  - 978-1-6654-5966-2
  - 978-1-6654-5967-9
  issn:
  - 2158-9992
publication_status: published
publisher: IEEE
status: public
title: The Analysis of Failure Mechanisms of Electrical Connectors in Long-term Use
  Field Vehicles
type: conference_editor_article
user_id: '83781'
year: '2022'
...