---
_id: '8353'
abstract:
- lang: eng
  text: A new model for the reliability prediction was developed and validated in
    previous investigations in order to enable the determination of the failure in
    time (FIT) of electrical connectors from highly accelerated life tests (HALT).
    The established testing method considers the influence of temperature, thermal
    cycling and vibration on the failure rates of electrical connectors. Various stress
    levels, i.e. the combinations of different test parameters, were derived from
    the ZVEI Technical Guideline TLF 0214 for low voltage automotive connectors. The
    applied vibrational load was initially defined as a sinusoidal test mode. The
    aim of this study is to investigate the influence of the vibration test mode on
    the failure rates. Two commonly used automotive connectors are chosen and subjected
    to stresses in HALT under two different types of vibrational load. The sinusoidal
    test mode along with the random vibration test mode are taken into account. The
    influence of the vibration test modes is subsequently determined by comparing
    the numbers of failures. Additionally, the principles of determining the coefficient
    of vibration are discussed and the specific coefficients for the chosen connectors
    are calculated based on the test results. A guideline, derived from this investigation,
    to select an appropriate vibration mode and vibration level is provided in order
    to compare the reliability of different electrical connectors.
article_number: '114567'
article_type: original
author:
- first_name: Kevin
  full_name: Krüger, Kevin
  id: '76831'
  last_name: Krüger
- first_name: Haomiao
  full_name: Yuan, Haomiao
  id: '61860'
  last_name: Yuan
- first_name: Jian
  full_name: Song, Jian
  id: '5297'
  last_name: Song
citation:
  ama: 'Krüger K, Yuan H, Song J. The influence of the vibration test mode on the
    failure rate of electrical connectors. <i>Microelectronics reliability : an internat
    journal &#38; world abstracting service</i>. 2022;135(8). doi:<a href="https://doi.org/10.1016/j.microrel.2022.114567">https://doi.org/10.1016/j.microrel.2022.114567</a>'
  apa: 'Krüger, K., Yuan, H., &#38; Song, J. (2022). The influence of the vibration
    test mode on the failure rate of electrical connectors. <i>Microelectronics Reliability :
    An Internat. Journal &#38; World Abstracting Service</i>, <i>135</i>(8), Article
    114567. <a href="https://doi.org/10.1016/j.microrel.2022.114567">https://doi.org/10.1016/j.microrel.2022.114567</a>'
  bjps: '<b>Krüger K, Yuan H and Song J</b> (2022) The Influence of the Vibration
    Test Mode on the Failure Rate of Electrical Connectors. <i>Microelectronics reliability :
    an internat. journal &#38; world abstracting service</i> <b>135</b>.'
  chicago: 'Krüger, Kevin, Haomiao Yuan, and Jian Song. “The Influence of the Vibration
    Test Mode on the Failure Rate of Electrical Connectors.” <i>Microelectronics Reliability :
    An Internat. Journal &#38; World Abstracting Service</i> 135, no. 8 (2022). <a
    href="https://doi.org/10.1016/j.microrel.2022.114567">https://doi.org/10.1016/j.microrel.2022.114567</a>.'
  chicago-de: 'Krüger, Kevin, Haomiao Yuan und Jian Song. 2022. The influence of the
    vibration test mode on the failure rate of electrical connectors. <i>Microelectronics
    reliability : an internat. journal &#38; world abstracting service</i> 135, Nr.
    8. doi:<a href="https://doi.org/10.1016/j.microrel.2022.114567">https://doi.org/10.1016/j.microrel.2022.114567</a>,
    .'
  din1505-2-1: '<span style="font-variant:small-caps;">Krüger, Kevin</span> ; <span
    style="font-variant:small-caps;">Yuan, Haomiao</span> ; <span style="font-variant:small-caps;">Song,
    Jian</span>: The influence of the vibration test mode on the failure rate of electrical
    connectors. In: <i>Microelectronics reliability : an internat. journal &#38; world
    abstracting service</i> Bd. 135. Amsterdam, Elsevier (2022), Nr. 8'
  havard: 'K. Krüger, H. Yuan, J. Song, The influence of the vibration test mode on
    the failure rate of electrical connectors, Microelectronics Reliability : An Internat.
    Journal &#38; World Abstracting Service. 135 (2022).'
  ieee: 'K. Krüger, H. Yuan, and J. Song, “The influence of the vibration test mode
    on the failure rate of electrical connectors,” <i>Microelectronics reliability :
    an internat. journal &#38; world abstracting service</i>, vol. 135, no. 8, Art.
    no. 114567, 2022, doi: <a href="https://doi.org/10.1016/j.microrel.2022.114567">https://doi.org/10.1016/j.microrel.2022.114567</a>.'
  mla: 'Krüger, Kevin, et al. “The Influence of the Vibration Test Mode on the Failure
    Rate of Electrical Connectors.” <i>Microelectronics Reliability : An Internat.
    Journal &#38; World Abstracting Service</i>, vol. 135, no. 8, 114567, 2022, <a
    href="https://doi.org/10.1016/j.microrel.2022.114567">https://doi.org/10.1016/j.microrel.2022.114567</a>.'
  short: 'K. Krüger, H. Yuan, J. Song, Microelectronics Reliability : An Internat.
    Journal &#38; World Abstracting Service 135 (2022).'
  ufg: '<b>Krüger, Kevin/Yuan, Haomiao/Song, Jian</b>: The influence of the vibration
    test mode on the failure rate of electrical connectors, in: <i>Microelectronics
    reliability : an internat. journal &#38; world abstracting service</i> 135 (2022),
    H. 8.'
  van: 'Krüger K, Yuan H, Song J. The influence of the vibration test mode on the
    failure rate of electrical connectors. Microelectronics reliability : an internat
    journal &#38; world abstracting service. 2022;135(8).'
date_created: 2022-06-14T14:59:08Z
date_updated: 2024-08-08T08:45:25Z
ddc:
- '620'
department:
- _id: DEP6012
doi: https://doi.org/10.1016/j.microrel.2022.114567
has_accepted_license: '1'
intvolume: '       135'
issue: '8'
keyword:
- Acceleration factor
- Coefficient of vibration
- Sine sweep
- Random vibration
- Failure rate
language:
- iso: eng
place: Amsterdam
publication: 'Microelectronics reliability : an internat. journal & world abstracting
  service'
publication_identifier:
  issn:
  - 0026-2714
publication_status: published
publisher: Elsevier
status: public
title: The influence of the vibration test mode on the failure rate of electrical
  connectors
type: scientific_journal_article
user_id: '83781'
volume: 135
year: '2022'
...
---
_id: '8386'
abstract:
- lang: eng
  text: The dynamic emulation of mechanical loads is required in a variety of applications
    to test and validate control algorithms. Typical test setups consist of two mechanically
    coupled motors, one of which is the Device Under Test (DUT) while the other is
    used as a load drive for emulation. Existing emulation concepts either rely on
    the differentiation of velocity feedback or utilize measured quantities of the
    DUT. The emulation method proposed in this paper uses acceleration feedback to
    control the torque of the load drive. It does not require any measured quantities
    of the DUT which allows a simple replacement of the DUT’s motor and/or inverter
    without the need of any conceptual changes. Based on a physical model, the emulation
    method is derived analytically and analyzed numerically for the emulation of one-mass-systems.
    The stability and emulation quality is evaluated considering two controller architectures.
    Finally, experiments are conducted and compared to numeric simulations to test
    the correct emulation.
author:
- first_name: Michael
  full_name: Epp, Michael
  last_name: Epp
- first_name: Martin
  full_name: Griese, Martin
  id: '52308'
  last_name: Griese
- first_name: Thomas
  full_name: Schulte, Thomas
  id: '46242'
  last_name: Schulte
citation:
  ama: Epp M, Griese M, Schulte T. <i>Acceleration Feedback Concepts for Dynamic Emulation
    of Mechanical Loads</i>. IEEE; 2021:1-6. doi:<a href="https://doi.org/10.1109/IECON48115.2021.9589449">10.1109/IECON48115.2021.9589449</a>
  apa: 'Epp, M., Griese, M., &#38; Schulte, T. (2021). <i>Acceleration Feedback Concepts
    for Dynamic Emulation of Mechanical Loads</i>. <i>IECON 2021 – 47th Annual Conference
    of the IEEE Industrial Electronics Society</i> (pp. 1–6). Toronto, ON, Canada
    : IEEE. <a href="https://doi.org/10.1109/IECON48115.2021.9589449">https://doi.org/10.1109/IECON48115.2021.9589449</a>'
  bjps: <b>Epp M, Griese M and Schulte T</b> (2021) <i>Acceleration Feedback Concepts
    for Dynamic Emulation of Mechanical Loads</i>. IEEE.
  chicago: Epp, Michael, Martin Griese, and Thomas Schulte. <i>Acceleration Feedback
    Concepts for Dynamic Emulation of Mechanical Loads</i>. <i>IECON 2021 – 47th Annual
    Conference of the IEEE Industrial Electronics Society</i>. IEEE, 2021. <a href="https://doi.org/10.1109/IECON48115.2021.9589449">https://doi.org/10.1109/IECON48115.2021.9589449</a>.
  chicago-de: Epp, Michael, Martin Griese und Thomas Schulte. 2021. <i>Acceleration
    Feedback Concepts for Dynamic Emulation of Mechanical Loads</i>. <i>IECON 2021
    – 47th Annual Conference of the IEEE Industrial Electronics Society</i>. IEEE.
    doi:<a href="https://doi.org/10.1109/IECON48115.2021.9589449,">10.1109/IECON48115.2021.9589449,</a>
    .
  din1505-2-1: '<span style="font-variant:small-caps;">Epp, Michael</span> ; <span
    style="font-variant:small-caps;">Griese, Martin</span> ; <span style="font-variant:small-caps;">Schulte,
    Thomas</span>: <i>Acceleration Feedback Concepts for Dynamic Emulation of Mechanical
    Loads</i> : IEEE, 2021'
  havard: M. Epp, M. Griese, T. Schulte, Acceleration Feedback Concepts for Dynamic
    Emulation of Mechanical Loads, IEEE, 2021.
  ieee: M. Epp, M. Griese, and T. Schulte, <i>Acceleration Feedback Concepts for Dynamic
    Emulation of Mechanical Loads</i>. IEEE, 2021, pp. 1–6.
  mla: Epp, Michael, et al. “Acceleration Feedback Concepts for Dynamic Emulation
    of Mechanical Loads.” <i>IECON 2021 – 47th Annual Conference of the IEEE Industrial
    Electronics Society</i>, IEEE, 2021, pp. 1–6, doi:<a href="https://doi.org/10.1109/IECON48115.2021.9589449">10.1109/IECON48115.2021.9589449</a>.
  short: M. Epp, M. Griese, T. Schulte, Acceleration Feedback Concepts for Dynamic
    Emulation of Mechanical Loads, IEEE, 2021.
  ufg: '<b>Epp, Michael et. al. (2021)</b>: Acceleration Feedback Concepts for Dynamic
    Emulation of Mechanical Loads.'
  van: Epp M, Griese M, Schulte T. Acceleration Feedback Concepts for Dynamic Emulation
    of Mechanical Loads. IECON 2021 – 47th Annual Conference of the IEEE Industrial
    Electronics Society. IEEE; 2021.
conference:
  end_date: 2021-10-16
  location: 'Toronto, ON, Canada '
  name: IECON 2021 – 47th Annual Conference of the IEEE Industrial Electronics Society
  start_date: 2021-10-13
date_created: 2022-06-22T14:29:18Z
date_updated: 2023-03-15T13:50:15Z
department:
- _id: DEP6020
- _id: DEP5022
doi: 10.1109/IECON48115.2021.9589449
keyword:
- Acceleration feedback
- emulation of mechanical loads
- motion and servo control
- machine and drive testing
language:
- iso: eng
page: 1-6
publication: IECON 2021 – 47th Annual Conference of the IEEE Industrial Electronics
  Society
publication_identifier:
  isbn:
  - 978-1-6654-3554-3
  issn:
  - 2577-1647
publication_status: published
publisher: IEEE
status: public
title: Acceleration Feedback Concepts for Dynamic Emulation of Mechanical Loads
type: conference_editor_article
user_id: '56955'
year: 2021
...
---
_id: '10668'
abstract:
- lang: eng
  text: Digitalization has a significant impact on our working life and it allows
    whole industries to rethink their value chains. This paper examines how digitalization
    relates to complexity in work systems with respect to relevant organizational
    fields of work organization. 23 semi-structured interviews with experts from science
    and economy were conducted and analyzed. Key findings are that digitalization
    has far-reaching, interrelated implications for all organizational fields. Moreover,
    digitalization-related aspects were identified which have the potential to increase
    complexity in work systems.
author:
- first_name: Benedikt
  full_name: Latos, Benedikt
  id: '84474'
  last_name: Latos
- first_name: Markus
  full_name: Harlacher, Markus
  last_name: Harlacher
- first_name: Philipp M.
  full_name: Przybysz, Philipp M.
  last_name: Przybysz
- first_name: Susanne
  full_name: Mutze-Niewohner, Susanne
  last_name: Mutze-Niewohner
citation:
  ama: 'Latos B, Harlacher M, Przybysz PM, Mutze-Niewohner S. Transformation of working
    environments through digitalization: Exploration and systematization of complexity
    drivers. In: <i>2017 IEEE International Conference on Industrial Engineering and
    Engineering Management (IEEM)</i>. IEEE; 2018. doi:<a href="https://doi.org/10.1109/ieem.2017.8290059">10.1109/ieem.2017.8290059</a>'
  apa: 'Latos, B., Harlacher, M., Przybysz, P. M., &#38; Mutze-Niewohner, S. (2018).
    Transformation of working environments through digitalization: Exploration and
    systematization of complexity drivers. <i>2017 IEEE International Conference on
    Industrial Engineering and Engineering Management (IEEM)</i>. 2017 IEEE International
    Conference on Industrial Engineering and Engineering Management (IEEM), Singapore.
    <a href="https://doi.org/10.1109/ieem.2017.8290059">https://doi.org/10.1109/ieem.2017.8290059</a>'
  bjps: '<b>Latos B <i>et al.</i></b> (2018) Transformation of Working Environments
    through Digitalization: Exploration and Systematization of Complexity Drivers.
    <i>2017 IEEE International Conference on Industrial Engineering and Engineering
    Management (IEEM)</i>. IEEE.'
  chicago: 'Latos, Benedikt, Markus Harlacher, Philipp M. Przybysz, and Susanne Mutze-Niewohner.
    “Transformation of Working Environments through Digitalization: Exploration and
    Systematization of Complexity Drivers.” In <i>2017 IEEE International Conference
    on Industrial Engineering and Engineering Management (IEEM)</i>. IEEE, 2018. <a
    href="https://doi.org/10.1109/ieem.2017.8290059">https://doi.org/10.1109/ieem.2017.8290059</a>.'
  chicago-de: 'Latos, Benedikt, Markus Harlacher, Philipp M. Przybysz und Susanne
    Mutze-Niewohner. 2018. Transformation of working environments through digitalization:
    Exploration and systematization of complexity drivers. In: <i>2017 IEEE International
    Conference on Industrial Engineering and Engineering Management (IEEM)</i>. IEEE.
    doi:<a href="https://doi.org/10.1109/ieem.2017.8290059">10.1109/ieem.2017.8290059</a>,
    .'
  din1505-2-1: '<span style="font-variant:small-caps;">Latos, Benedikt</span> ; <span
    style="font-variant:small-caps;">Harlacher, Markus</span> ; <span style="font-variant:small-caps;">Przybysz,
    Philipp M.</span> ; <span style="font-variant:small-caps;">Mutze-Niewohner, Susanne</span>:
    Transformation of working environments through digitalization: Exploration and
    systematization of complexity drivers. In: <i>2017 IEEE International Conference
    on Industrial Engineering and Engineering Management (IEEM)</i> : IEEE, 2018'
  havard: 'B. Latos, M. Harlacher, P.M. Przybysz, S. Mutze-Niewohner, Transformation
    of working environments through digitalization: Exploration and systematization
    of complexity drivers, in: 2017 IEEE International Conference on Industrial Engineering
    and Engineering Management (IEEM), IEEE, 2018.'
  ieee: 'B. Latos, M. Harlacher, P. M. Przybysz, and S. Mutze-Niewohner, “Transformation
    of working environments through digitalization: Exploration and systematization
    of complexity drivers,” presented at the 2017 IEEE International Conference on
    Industrial Engineering and Engineering Management (IEEM), Singapore, 2018. doi:
    <a href="https://doi.org/10.1109/ieem.2017.8290059">10.1109/ieem.2017.8290059</a>.'
  mla: 'Latos, Benedikt, et al. “Transformation of Working Environments through Digitalization:
    Exploration and Systematization of Complexity Drivers.” <i>2017 IEEE International
    Conference on Industrial Engineering and Engineering Management (IEEM)</i>, IEEE,
    2018, <a href="https://doi.org/10.1109/ieem.2017.8290059">https://doi.org/10.1109/ieem.2017.8290059</a>.'
  short: 'B. Latos, M. Harlacher, P.M. Przybysz, S. Mutze-Niewohner, in: 2017 IEEE
    International Conference on Industrial Engineering and Engineering Management
    (IEEM), IEEE, 2018.'
  ufg: '<b>Latos, Benedikt u. a.</b>: Transformation of working environments through
    digitalization: Exploration and systematization of complexity drivers, in: o. Hg.:
    2017 IEEE International Conference on Industrial Engineering and Engineering Management
    (IEEM), o. O. 2018.'
  van: 'Latos B, Harlacher M, Przybysz PM, Mutze-Niewohner S. Transformation of working
    environments through digitalization: Exploration and systematization of complexity
    drivers. In: 2017 IEEE International Conference on Industrial Engineering and
    Engineering Management (IEEM). IEEE; 2018.'
conference:
  end_date: 2017-12-13
  location: Singapore
  name: 2017 IEEE International Conference on Industrial Engineering and Engineering
    Management (IEEM)
  start_date: 2017-12-10
date_created: 2023-10-30T13:02:52Z
date_updated: 2023-10-31T11:24:15Z
department:
- _id: DEP1522
doi: 10.1109/ieem.2017.8290059
extern: '1'
keyword:
- Complexity theory
- Interviews
- Organizations
- Industries
- Task analysis
- Acceleration
language:
- iso: eng
publication: 2017 IEEE International Conference on Industrial Engineering and Engineering
  Management (IEEM)
publication_identifier:
  eissn:
  - 2157-362X
publication_status: published
publisher: IEEE
status: public
title: 'Transformation of working environments through digitalization: Exploration
  and systematization of complexity drivers'
type: conference
user_id: '83781'
year: '2018'
...
