---
_id: '11347'
abstract:
- lang: eng
  text: he lifetime of electrical contacts is influenced by various factors. Micromotions
    due to fluctuations in temperature and vibration in the field lead to fretting
    wear and fretting corrosion of electrical contacts. In case of the contacts with
    noble coatings, the fretting wear results in the wear through of the coating causing
    the exposure of the underlying non-noble metal to the surrounding atmosphere which
    in turn leads to fretting corrosion. These degradation mechanisms lead to an increase
    in electrical contact resistance and eventual failure of the system. In this study,
    the extent of contact degradation due to fretting war of galvanically silver-plated
    electrical contacts is investigated. To compare the extent of war occurring at
    different stages of the contacts’ lifetime, the fretting tests are conducted up
    to predefined fretting cycles. XRF measurements of the coating thickness before
    after the tests are performed and the wear depth after the given fretting cycles
    is determined via confocal microscopy. The results of two different types of silver
    plating are compared. Based on this, a prognosis regarding the wear behavior and
    expected lifetime of different coating systems can be made possible.
author:
- first_name: Roman
  full_name: Probst, Roman
  id: '69156'
  last_name: Probst
- first_name: Jian
  full_name: Song, Jian
  id: '5297'
  last_name: Song
citation:
  ama: Probst R, Song J. Einfluss der Mikrohärte der Ober- flächenschutzschicht auf
    den Verschleiß und die Lebensdauer von elektrischen Kontakten bei Reibverschleißbelastung.
    <i>Tribologie und Schmierungstechnik</i>. 2023;70(1):32-39. doi:<a href="https://doi.org/10.24053/tus-2023-0005">10.24053/tus-2023-0005</a>
  apa: Probst, R., &#38; Song, J. (2023). Einfluss der Mikrohärte der Ober- flächenschutzschicht
    auf den Verschleiß und die Lebensdauer von elektrischen Kontakten bei Reibverschleißbelastung.
    <i>Tribologie und Schmierungstechnik</i>, <i>70</i>(1), 32–39. <a href="https://doi.org/10.24053/tus-2023-0005">https://doi.org/10.24053/tus-2023-0005</a>
  bjps: <b>Probst R and Song J</b> (2023) Einfluss der Mikrohärte der Ober- flächenschutzschicht
    auf den Verschleiß und die Lebensdauer von elektrischen Kontakten bei Reibverschleißbelastung.
    <i>Tribologie und Schmierungstechnik</i> <b>70</b>, 32–39.
  chicago: 'Probst, Roman, and Jian Song. “Einfluss der Mikrohärte der Ober- flächenschutzschicht
    auf den Verschleiß und die Lebensdauer von elektrischen Kontakten bei Reibverschleißbelastung.”
    <i>Tribologie und Schmierungstechnik</i> 70, no. 1 (2023): 32–39. <a href="https://doi.org/10.24053/tus-2023-0005">https://doi.org/10.24053/tus-2023-0005</a>.'
  chicago-de: 'Probst, Roman und Jian Song. 2023. Einfluss der Mikrohärte der Ober-
    flächenschutzschicht auf den Verschleiß und die Lebensdauer von elektrischen Kontakten
    bei Reibverschleißbelastung. <i>Tribologie und Schmierungstechnik</i> 70, Nr.
    1: 32–39. doi:<a href="https://doi.org/10.24053/tus-2023-0005">10.24053/tus-2023-0005</a>,
    .'
  din1505-2-1: '<span style="font-variant:small-caps;">Probst, Roman</span> ; <span
    style="font-variant:small-caps;">Song, Jian</span>: Einfluss der Mikrohärte der
    Ober- flächenschutzschicht auf den Verschleiß und die Lebensdauer von elektrischen
    Kontakten bei Reibverschleißbelastung. In: <i>Tribologie und Schmierungstechnik</i>
    Bd. 70, Narr Francke Attempto Verlag GmbH + Co. KG (2023), Nr. 1, S. 32–39'
  havard: R. Probst, J. Song, Einfluss der Mikrohärte der Ober- flächenschutzschicht
    auf den Verschleiß und die Lebensdauer von elektrischen Kontakten bei Reibverschleißbelastung,
    Tribologie und Schmierungstechnik. 70 (2023) 32–39.
  ieee: 'R. Probst and J. Song, “Einfluss der Mikrohärte der Ober- flächenschutzschicht
    auf den Verschleiß und die Lebensdauer von elektrischen Kontakten bei Reibverschleißbelastung,”
    <i>Tribologie und Schmierungstechnik</i>, vol. 70, no. 1, pp. 32–39, 2023, doi:
    <a href="https://doi.org/10.24053/tus-2023-0005">10.24053/tus-2023-0005</a>.'
  mla: Probst, Roman, and Jian Song. “Einfluss der Mikrohärte der Ober- flächenschutzschicht
    auf den Verschleiß und die Lebensdauer von elektrischen Kontakten bei Reibverschleißbelastung.”
    <i>Tribologie und Schmierungstechnik</i>, vol. 70, no. 1, 2023, pp. 32–39, <a
    href="https://doi.org/10.24053/tus-2023-0005">https://doi.org/10.24053/tus-2023-0005</a>.
  short: R. Probst, J. Song, Tribologie und Schmierungstechnik 70 (2023) 32–39.
  ufg: '<b>Probst, Roman/Song, Jian</b>: Einfluss der Mikrohärte der Ober- flächenschutzschicht
    auf den Verschleiß und die Lebensdauer von elektrischen Kontakten bei Reibverschleißbelastung,
    in: <i>Tribologie und Schmierungstechnik</i> 70 (2023), H. 1,  S. 32–39.'
  van: Probst R, Song J. Einfluss der Mikrohärte der Ober- flächenschutzschicht auf
    den Verschleiß und die Lebensdauer von elektrischen Kontakten bei Reibverschleißbelastung.
    Tribologie und Schmierungstechnik. 2023;70(1):32–9.
date_created: 2024-04-18T08:47:22Z
date_updated: 2024-05-21T12:27:48Z
department:
- _id: DEP6012
doi: 10.24053/tus-2023-0005
has_accepted_license: '1'
intvolume: '        70'
issue: '1'
keyword:
- Surfaces
- Coatings and Films
- Surfaces and Interfaces
- Mechanical Engineering
- Mechanics of Materials
language:
- iso: ger
page: 32-39
publication: Tribologie und Schmierungstechnik
publication_identifier:
  issn:
  - 0724-3472
publication_status: published
publisher: Narr Francke Attempto Verlag GmbH + Co. KG
status: public
title: Einfluss der Mikrohärte der Ober- flächenschutzschicht auf den Verschleiß und
  die Lebensdauer von elektrischen Kontakten bei Reibverschleißbelastung
type: scientific_journal_article
user_id: '83781'
volume: 70
year: '2023'
...
---
_id: '11348'
abstract:
- lang: eng
  text: Lifetime is an important feature defining the reliability of electrical connectors.
    In general practice, the lifetime tests required for reliability estimation are
    time and labor intensive. In our previous work, a data driven method using a statistical
    process, with an application of probability distributions such as standard normal
    distribution and generalized extreme value (GEV) distribution with negative skewness
    to predict degradation paths, was introduced for estimation of the lifetime and
    FIT rate with the help of electrical contact resistance data collected from short
    term tests. The proposed method proved its significance by showing the possibility
    of drastic reduction in the lifetime test duration required for reliability determination.
    In this work, a non-parametric distribution free method using percentiles of actual
    measured contact resistances is used for determining the lifetime as against the
    percentiles of probability distribution used in previous work, thereby simplifying
    the process further and leading to an even more precise estimation. The lifetimes
    calculated from parametric and non-parametric methods are compared to highlight
    the significance of distribution free method in reliability estimation.
article_number: '115216'
article_type: original
author:
- first_name: Abhay Rammurti
  full_name: Shukla, Abhay Rammurti
  id: '74188'
  last_name: Shukla
- first_name: Robert
  full_name: Martin, Robert
  last_name: Martin
- first_name: Roman
  full_name: Probst, Roman
  id: '69156'
  last_name: Probst
- first_name: Jian
  full_name: Song, Jian
  id: '5297'
  last_name: Song
citation:
  ama: Shukla AR, Martin R, Probst R, Song J. Comparison of different statistical
    methods for prediction of lifetime of electrical connectors with short term tests.
    <i>Microelectronics Reliability</i>. 2023;150. doi:<a href="https://doi.org/10.1016/j.microrel.2023.115216">10.1016/j.microrel.2023.115216</a>
  apa: Shukla, A. R., Martin, R., Probst, R., &#38; Song, J. (2023). Comparison of
    different statistical methods for prediction of lifetime of electrical connectors
    with short term tests. <i>Microelectronics Reliability</i>, <i>150</i>, Article
    115216. <a href="https://doi.org/10.1016/j.microrel.2023.115216">https://doi.org/10.1016/j.microrel.2023.115216</a>
  bjps: <b>Shukla AR <i>et al.</i></b> (2023) Comparison of Different Statistical
    Methods for Prediction of Lifetime of Electrical Connectors with Short Term Tests.
    <i>Microelectronics Reliability</i> <b>150</b>.
  chicago: Shukla, Abhay Rammurti, Robert Martin, Roman Probst, and Jian Song. “Comparison
    of Different Statistical Methods for Prediction of Lifetime of Electrical Connectors
    with Short Term Tests.” <i>Microelectronics Reliability</i> 150 (2023). <a href="https://doi.org/10.1016/j.microrel.2023.115216">https://doi.org/10.1016/j.microrel.2023.115216</a>.
  chicago-de: Shukla, Abhay Rammurti, Robert Martin, Roman Probst und Jian Song. 2023.
    Comparison of different statistical methods for prediction of lifetime of electrical
    connectors with short term tests. <i>Microelectronics Reliability</i> 150. doi:<a
    href="https://doi.org/10.1016/j.microrel.2023.115216">10.1016/j.microrel.2023.115216</a>,
    .
  din1505-2-1: '<span style="font-variant:small-caps;">Shukla, Abhay Rammurti</span>
    ; <span style="font-variant:small-caps;">Martin, Robert</span> ; <span style="font-variant:small-caps;">Probst,
    Roman</span> ; <span style="font-variant:small-caps;">Song, Jian</span>: Comparison
    of different statistical methods for prediction of lifetime of electrical connectors
    with short term tests. In: <i>Microelectronics Reliability</i> Bd. 150. Amsterdam,
    Elsevier  (2023)'
  havard: A.R. Shukla, R. Martin, R. Probst, J. Song, Comparison of different statistical
    methods for prediction of lifetime of electrical connectors with short term tests,
    Microelectronics Reliability. 150 (2023).
  ieee: 'A. R. Shukla, R. Martin, R. Probst, and J. Song, “Comparison of different
    statistical methods for prediction of lifetime of electrical connectors with short
    term tests,” <i>Microelectronics Reliability</i>, vol. 150, Art. no. 115216, 2023,
    doi: <a href="https://doi.org/10.1016/j.microrel.2023.115216">10.1016/j.microrel.2023.115216</a>.'
  mla: Shukla, Abhay Rammurti, et al. “Comparison of Different Statistical Methods
    for Prediction of Lifetime of Electrical Connectors with Short Term Tests.” <i>Microelectronics
    Reliability</i>, vol. 150, 115216, 2023, <a href="https://doi.org/10.1016/j.microrel.2023.115216">https://doi.org/10.1016/j.microrel.2023.115216</a>.
  short: A.R. Shukla, R. Martin, R. Probst, J. Song, Microelectronics Reliability
    150 (2023).
  ufg: '<b>Shukla, Abhay Rammurti u. a.</b>: Comparison of different statistical methods
    for prediction of lifetime of electrical connectors with short term tests, in:
    <i>Microelectronics Reliability</i> 150 (2023).'
  van: Shukla AR, Martin R, Probst R, Song J. Comparison of different statistical
    methods for prediction of lifetime of electrical connectors with short term tests.
    Microelectronics Reliability. 2023;150.
date_created: 2024-04-18T08:55:38Z
date_updated: 2025-06-26T07:51:25Z
department:
- _id: DEP6012
doi: 10.1016/j.microrel.2023.115216
external_id:
  isi:
  - '001106942700001'
has_accepted_license: '1'
intvolume: '       150'
isi: '1'
keyword:
- Electrical and Electronic Engineering
- Surfaces
- Coatings and Films
- Safety
- Risk
- Reliability and Quality
- Condensed Matter Physics
- Atomic and Molecular Physics
- and Optics
- Electronic
- Optical and Magnetic Materials
language:
- iso: eng
place: Amsterdam
publication: Microelectronics Reliability
publication_identifier:
  issn:
  - 0026-2714
  unknown:
  - 1872-941X
publication_status: published
publisher: 'Elsevier '
status: public
title: Comparison of different statistical methods for prediction of lifetime of electrical
  connectors with short term tests
type: scientific_journal_article
user_id: '83781'
volume: 150
year: '2023'
...