---
_id: '8353'
abstract:
- lang: eng
text: A new model for the reliability prediction was developed and validated in
previous investigations in order to enable the determination of the failure in
time (FIT) of electrical connectors from highly accelerated life tests (HALT).
The established testing method considers the influence of temperature, thermal
cycling and vibration on the failure rates of electrical connectors. Various stress
levels, i.e. the combinations of different test parameters, were derived from
the ZVEI Technical Guideline TLF 0214 for low voltage automotive connectors. The
applied vibrational load was initially defined as a sinusoidal test mode. The
aim of this study is to investigate the influence of the vibration test mode on
the failure rates. Two commonly used automotive connectors are chosen and subjected
to stresses in HALT under two different types of vibrational load. The sinusoidal
test mode along with the random vibration test mode are taken into account. The
influence of the vibration test modes is subsequently determined by comparing
the numbers of failures. Additionally, the principles of determining the coefficient
of vibration are discussed and the specific coefficients for the chosen connectors
are calculated based on the test results. A guideline, derived from this investigation,
to select an appropriate vibration mode and vibration level is provided in order
to compare the reliability of different electrical connectors.
article_number: '114567'
article_type: original
author:
- first_name: Kevin
full_name: Krüger, Kevin
id: '76831'
last_name: Krüger
- first_name: Haomiao
full_name: Yuan, Haomiao
id: '61860'
last_name: Yuan
- first_name: Jian
full_name: Song, Jian
id: '5297'
last_name: Song
citation:
ama: 'Krüger K, Yuan H, Song J. The influence of the vibration test mode on the
failure rate of electrical connectors. Microelectronics reliability : an internat
journal & world abstracting service. 2022;135(8). doi:https://doi.org/10.1016/j.microrel.2022.114567'
apa: 'Krüger, K., Yuan, H., & Song, J. (2022). The influence of the vibration
test mode on the failure rate of electrical connectors. Microelectronics Reliability :
An Internat. Journal & World Abstracting Service, 135(8), Article
114567. https://doi.org/10.1016/j.microrel.2022.114567'
bjps: 'Krüger K, Yuan H and Song J (2022) The Influence of the Vibration
Test Mode on the Failure Rate of Electrical Connectors. Microelectronics reliability :
an internat. journal & world abstracting service 135.'
chicago: 'Krüger, Kevin, Haomiao Yuan, and Jian Song. “The Influence of the Vibration
Test Mode on the Failure Rate of Electrical Connectors.” Microelectronics Reliability :
An Internat. Journal & World Abstracting Service 135, no. 8 (2022). https://doi.org/10.1016/j.microrel.2022.114567.'
chicago-de: 'Krüger, Kevin, Haomiao Yuan und Jian Song. 2022. The influence of the
vibration test mode on the failure rate of electrical connectors. Microelectronics
reliability : an internat. journal & world abstracting service 135, Nr.
8. doi:https://doi.org/10.1016/j.microrel.2022.114567,
.'
din1505-2-1: 'Krüger, Kevin ; Yuan, Haomiao ; Song,
Jian: The influence of the vibration test mode on the failure rate of electrical
connectors. In: Microelectronics reliability : an internat. journal & world
abstracting service Bd. 135. Amsterdam, Elsevier (2022), Nr. 8'
havard: 'K. Krüger, H. Yuan, J. Song, The influence of the vibration test mode on
the failure rate of electrical connectors, Microelectronics Reliability : An Internat.
Journal & World Abstracting Service. 135 (2022).'
ieee: 'K. Krüger, H. Yuan, and J. Song, “The influence of the vibration test mode
on the failure rate of electrical connectors,” Microelectronics reliability :
an internat. journal & world abstracting service, vol. 135, no. 8, Art.
no. 114567, 2022, doi: https://doi.org/10.1016/j.microrel.2022.114567.'
mla: 'Krüger, Kevin, et al. “The Influence of the Vibration Test Mode on the Failure
Rate of Electrical Connectors.” Microelectronics Reliability : An Internat.
Journal & World Abstracting Service, vol. 135, no. 8, 114567, 2022, https://doi.org/10.1016/j.microrel.2022.114567.'
short: 'K. Krüger, H. Yuan, J. Song, Microelectronics Reliability : An Internat.
Journal & World Abstracting Service 135 (2022).'
ufg: 'Krüger, Kevin/Yuan, Haomiao/Song, Jian: The influence of the vibration
test mode on the failure rate of electrical connectors, in: Microelectronics
reliability : an internat. journal & world abstracting service 135 (2022),
H. 8.'
van: 'Krüger K, Yuan H, Song J. The influence of the vibration test mode on the
failure rate of electrical connectors. Microelectronics reliability : an internat
journal & world abstracting service. 2022;135(8).'
date_created: 2022-06-14T14:59:08Z
date_updated: 2024-08-08T08:45:25Z
ddc:
- '620'
department:
- _id: DEP6012
doi: https://doi.org/10.1016/j.microrel.2022.114567
has_accepted_license: '1'
intvolume: ' 135'
issue: '8'
keyword:
- Acceleration factor
- Coefficient of vibration
- Sine sweep
- Random vibration
- Failure rate
language:
- iso: eng
place: Amsterdam
publication: 'Microelectronics reliability : an internat. journal & world abstracting
service'
publication_identifier:
issn:
- 0026-2714
publication_status: published
publisher: Elsevier
status: public
title: The influence of the vibration test mode on the failure rate of electrical
connectors
type: scientific_journal_article
user_id: '83781'
volume: 135
year: '2022'
...