---
_id: '13433'
abstract:
- lang: eng
  text: The use of lubricants on electrical connector contacts is essential for certain
    applications in order to reduce mating forces, minimize wear, and mitigate fretting
    corrosion. However, increasing performance requirements (e.g., operation at elevated
    temperatures) and regulatory restrictions are prompting a reassessment of lubricant
    selection. In this study, the influence of three lubricants (one oil and two greases),
    operating temperature (room temperature and 130°C), and applied volume (low, medium
    and high volume) on electrical contact resistance (ECR) and coefficient of friction
    (CoF) is investigated by means of fretting wear tests on silver-plated contacts.
    The results show that unlubricated silver contacts exhibit a longer stable phase
    at 130 °C than at room temperature. For lubricated contacts, service life is influenced
    by both temperature and lubricant volume. Certain lubricants demonstrate earlier
    fail at room temperature than at elevated temperatures. The findings highlight
    the importance of careful selection and optimization of lubricants for electrical
    connectors under varying environmental conditions.
author:
- first_name: Michael
  full_name: Blauth, Michael
  id: '49095'
  last_name: Blauth
- first_name: Sören
  full_name: Tülling, Sören
  id: '71422'
  last_name: Tülling
- first_name: Jian
  full_name: Song, Jian
  id: '5297'
  last_name: Song
citation:
  ama: Blauth M, Tülling S, Song J. <i>Effect of Operating Temperature and Application
    Quantity of Lubricants on the Fretting Behavior of Silver Plated Electrical Contacts</i>.
    (ieee-holm, ed.). IEEE; 2025. doi:<a href="https://doi.org/10.1109/hlm51652.2025.11278329">10.1109/hlm51652.2025.11278329</a>
  apa: Blauth, M., Tülling, S., &#38; Song, J. (2025). Effect of Operating Temperature
    and Application Quantity of Lubricants on the Fretting Behavior of Silver Plated
    Electrical Contacts. In ieee-holm (Ed.), <i>Proceedings of the 70th IEEE Holm
    Conference on Electrical Contacts (HLM)</i>. IEEE. <a href="https://doi.org/10.1109/hlm51652.2025.11278329">https://doi.org/10.1109/hlm51652.2025.11278329</a>
  bjps: '<b>Blauth M, Tülling S and Song J</b> (2025) <i>Effect of Operating Temperature
    and Application Quantity of Lubricants on the Fretting Behavior of Silver Plated
    Electrical Contacts</i>, ieee-holm (ed.). Piscataway, NJ: IEEE.'
  chicago: 'Blauth, Michael, Sören Tülling, and Jian Song. <i>Effect of Operating
    Temperature and Application Quantity of Lubricants on the Fretting Behavior of
    Silver Plated Electrical Contacts</i>. Edited by ieee-holm. <i>Proceedings of
    the 70th IEEE Holm Conference on Electrical Contacts (HLM)</i>. Electrical Contacts.
    Piscataway, NJ: IEEE, 2025. <a href="https://doi.org/10.1109/hlm51652.2025.11278329">https://doi.org/10.1109/hlm51652.2025.11278329</a>.'
  chicago-de: 'Blauth, Michael, Sören Tülling und Jian Song. 2025. <i>Effect of Operating
    Temperature and Application Quantity of Lubricants on the Fretting Behavior of
    Silver Plated Electrical Contacts</i>. Hg. von ieee-holm. <i>Proceedings of the
    70th IEEE Holm Conference on Electrical Contacts (HLM)</i>. Electrical contacts.
    Piscataway, NJ: IEEE. doi:<a href="https://doi.org/10.1109/hlm51652.2025.11278329">10.1109/hlm51652.2025.11278329</a>,
    .'
  din1505-2-1: '<span style="font-variant:small-caps;">Blauth, Michael</span> ; <span
    style="font-variant:small-caps;">Tülling, Sören</span> ; <span style="font-variant:small-caps;">Song,
    Jian</span> ; <span style="font-variant:small-caps;">ieee-holm</span> (Hrsg.):
    <i>Effect of Operating Temperature and Application Quantity of Lubricants on the
    Fretting Behavior of Silver Plated Electrical Contacts</i>, <i>Electrical contacts</i>.
    Piscataway, NJ : IEEE, 2025'
  havard: M. Blauth, S. Tülling, J. Song, Effect of Operating Temperature and Application
    Quantity of Lubricants on the Fretting Behavior of Silver Plated Electrical Contacts,
    IEEE, Piscataway, NJ, 2025.
  ieee: 'M. Blauth, S. Tülling, and J. Song, <i>Effect of Operating Temperature and
    Application Quantity of Lubricants on the Fretting Behavior of Silver Plated Electrical
    Contacts</i>. Piscataway, NJ: IEEE, 2025. doi: <a href="https://doi.org/10.1109/hlm51652.2025.11278329">10.1109/hlm51652.2025.11278329</a>.'
  mla: Blauth, Michael, et al. “Effect of Operating Temperature and Application Quantity
    of Lubricants on the Fretting Behavior of Silver Plated Electrical Contacts.”
    <i>Proceedings of the 70th IEEE Holm Conference on Electrical Contacts (HLM)</i>,
    edited by ieee-holm, IEEE, 2025, <a href="https://doi.org/10.1109/hlm51652.2025.11278329">https://doi.org/10.1109/hlm51652.2025.11278329</a>.
  short: M. Blauth, S. Tülling, J. Song, Effect of Operating Temperature and Application
    Quantity of Lubricants on the Fretting Behavior of Silver Plated Electrical Contacts,
    IEEE, Piscataway, NJ, 2025.
  ufg: '<b>Blauth, Michael/Tülling, Sören/Song, Jian</b>: Effect of Operating Temperature
    and Application Quantity of Lubricants on the Fretting Behavior of Silver Plated
    Electrical Contacts, hg. von ieee-holm, Piscataway, NJ 2025 (Electrical contacts).'
  van: 'Blauth M, Tülling S, Song J. Effect of Operating Temperature and Application
    Quantity of Lubricants on the Fretting Behavior of Silver Plated Electrical Contacts.
    ieee-holm, editor. Proceedings of the 70th IEEE Holm Conference on Electrical
    Contacts (HLM). Piscataway, NJ: IEEE; 2025. (Electrical contacts).'
conference:
  end_date: 2025-10-22
  location: 'San Antonio, TX, USA '
  name: 70th Holm Conference on Electrical Contacts (HLM)
  start_date: 2025-10-15
corporate_editor:
- ieee-holm
date_created: 2026-02-24T14:48:06Z
date_updated: 2026-02-27T11:06:57Z
department:
- _id: DEP6000
- _id: DEP6012
doi: 10.1109/hlm51652.2025.11278329
keyword:
- Connectors
- Resistance
- Silver
- Lubricants
- Contacts
- Oils
- Friction
- Corrosion
- Optimization
language:
- iso: eng
place: Piscataway, NJ
publication: Proceedings of the 70th IEEE Holm Conference on Electrical Contacts (HLM)
publication_identifier:
  eisbn:
  - 979-8-3315-5996-0
  isbn:
  - 979-8-3315-5997-7
  issn:
  - 2158-9992
publication_status: published
publisher: IEEE
series_title: Electrical contacts
status: public
title: Effect of Operating Temperature and Application Quantity of Lubricants on the
  Fretting Behavior of Silver Plated Electrical Contacts
type: conference_editor_article
user_id: '83778'
year: '2025'
...
---
_id: '12761'
abstract:
- lang: eng
  text: For modern machines, factories and electric and autonomous vehicles, the importance
    of vreliable electrical connectors cannot be overstated. With an increasing number
    of connectors being used in machines, factories and vehicles, ensuring their reliability
    is crucial for comfort and safety alike. One of the key indicators of reliability
    is the lifetime of connectors. To evaluate the lifetime of electrical connectors,
    a testing method and a model for calculating their lifetime based on the test
    data were developed. The results from these tests were compared to failure analysis
    data from long-term field operations. The findings indicate that the laboratory
    tests can accurately reproduce the main failures observed in the field. However,
    such lifetime tests can be time- and labor-intensive. To address this challenge,
    a data-driven method is proposed that predicts the lifetime of electrical connectors
    using statistical analysis of electrical contact resistance data collected from
    short-term tests. The predictions from this method were compared to actual results
    obtained from long-term tests. A strong correlation was observed between the contact
    resistance development in short-term tests and the number of failures in later
    stages of testing. Thus, apart from predicting the lifetime of connectors, this
    method can also be applied for failure prognosis in real-time operations.
author:
- first_name: Jian
  full_name: Song, Jian
  id: '5297'
  last_name: Song
- first_name: Abhay Rammurti
  full_name: Shukla, Abhay Rammurti
  id: '74188'
  last_name: Shukla
- first_name: Roman
  full_name: Probst, Roman
  id: '69156'
  last_name: Probst
citation:
  ama: Song J, Shukla AR, Probst R. The State of Health of Electrical Connectors.
    <i>Machines</i>. 2024;7(12):474. doi:<a href="https://doi.org/10.3390/machines12070474">https://doi.org/10.3390/machines12070474</a>
  apa: Song, J., Shukla, A. R., &#38; Probst, R. (2024). The State of Health of Electrical
    Connectors. <i>Machines</i>, <i>7</i>(12), 474. <a href="https://doi.org/10.3390/machines12070474">https://doi.org/10.3390/machines12070474</a>
  bjps: <b>Song J, Shukla AR and Probst R</b> (2024) The State of Health of Electrical
    Connectors. <i>Machines</i> <b>7</b>, 474.
  chicago: 'Song, Jian, Abhay Rammurti Shukla, and Roman Probst. “The State of Health
    of Electrical Connectors.” <i>Machines</i> 7, no. 12 (2024): 474. <a href="https://doi.org/10.3390/machines12070474">https://doi.org/10.3390/machines12070474</a>.'
  chicago-de: 'Song, Jian, Abhay Rammurti Shukla und Roman Probst. 2024. The State
    of Health of Electrical Connectors. <i>Machines</i> 7, Nr. 12: 474. doi:<a href="https://doi.org/10.3390/machines12070474">https://doi.org/10.3390/machines12070474</a>,
    .'
  din1505-2-1: '<span style="font-variant:small-caps;">Song, Jian</span> ; <span style="font-variant:small-caps;">Shukla,
    Abhay Rammurti</span> ; <span style="font-variant:small-caps;">Probst, Roman</span>:
    The State of Health of Electrical Connectors. In: <i>Machines</i> Bd. 7. Basel,
    MDPI (2024), Nr. 12, S. 474'
  havard: J. Song, A.R. Shukla, R. Probst, The State of Health of Electrical Connectors,
    Machines. 7 (2024) 474.
  ieee: 'J. Song, A. R. Shukla, and R. Probst, “The State of Health of Electrical
    Connectors,” <i>Machines</i>, vol. 7, no. 12, p. 474, 2024, doi: <a href="https://doi.org/10.3390/machines12070474">https://doi.org/10.3390/machines12070474</a>.'
  mla: Song, Jian, et al. “The State of Health of Electrical Connectors.” <i>Machines</i>,
    vol. 7, no. 12, 2024, p. 474, <a href="https://doi.org/10.3390/machines12070474">https://doi.org/10.3390/machines12070474</a>.
  short: J. Song, A.R. Shukla, R. Probst, Machines 7 (2024) 474.
  ufg: '<b>Song, Jian/Shukla, Abhay Rammurti/Probst, Roman</b>: The State of Health
    of Electrical Connectors, in: <i>Machines</i> 7 (2024), H. 12,  S. 474.'
  van: Song J, Shukla AR, Probst R. The State of Health of Electrical Connectors.
    Machines. 2024;7(12):474.
date_created: 2025-04-04T09:23:10Z
date_updated: 2025-06-25T13:03:28Z
department:
- _id: DEP6012
doi: https://doi.org/10.3390/machines12070474
external_id:
  isi:
  - '001277040200001'
intvolume: '         7'
isi: '1'
issue: '12'
keyword:
- electrical connectors
- accelerated life testing
- statistical model
- lifetime prognosis
- reliability
- state of health
language:
- iso: eng
page: '474'
place: Basel
publication: Machines
publication_identifier:
  eissn:
  - '2075-1702 '
publication_status: published
publisher: MDPI
quality_controlled: '1'
status: public
title: The State of Health of Electrical Connectors
type: scientific_journal_article
user_id: '83781'
volume: 7
year: '2024'
...
---
_id: '9206'
abstract:
- lang: eng
  text: Failure in time (FIT) is an important measure for the reliability of electrical
    connectors. Due to the very long lifetime of connectors, the tests for the determination
    of FIT rate are time and labour intensive. In this paper a data driven method
    using a statistical process to estimate the FIT rate of electrical connectors
    with data of electrical contact resistance development in short term tests is
    proposed. The results of prediction are then compared with the results from long
    term tests. The study shows a strong correlation between contact resistance development
    in short term tests and the development of the number of failures in later stages
    of tests. In order to predict the development of degradation precisely, the distribution
    of resistance data in many different tests with different connectors is investigated.
    The Generalized Extreme Value Distribution, which reveals an ideal fitting, has
    been implemented for the prediction of the failure rates of connectors, thereby
    enabling a remarkable time-lapse of lifetime tests. This method can also be employed
    in the prognosis and management of system health through the forecast of health
    of connectors in different systems in operation.
article_number: '114684'
author:
- first_name: Jian
  full_name: Song, Jian
  id: '5297'
  last_name: Song
- first_name: Abhay Rammurti
  full_name: Shukla, Abhay Rammurti
  id: '72757'
  last_name: Shukla
- first_name: Roman
  full_name: Probst, Roman
  id: '69156'
  last_name: Probst
citation:
  ama: 'Song J, Shukla AR, Probst R. Prediction of failure in time (FIT) of electrical
    connectors with short term tests. <i>Microelectronics reliability : an internat
    journal &#38; world abstracting service</i>. 2022;138(November 2022). doi:<a href="https://doi.org/10.1016/j.microrel.2022.114684">10.1016/j.microrel.2022.114684</a>'
  apa: 'Song, J., Shukla, A. R., &#38; Probst, R. (2022). Prediction of failure in
    time (FIT) of electrical connectors with short term tests. <i>Microelectronics
    Reliability : An Internat. Journal &#38; World Abstracting Service</i>, <i>138</i>(November
    2022), Article 114684. <a href="https://doi.org/10.1016/j.microrel.2022.114684">https://doi.org/10.1016/j.microrel.2022.114684</a>'
  bjps: '<b>Song J, Shukla AR and Probst R</b> (2022) Prediction of Failure in Time
    (FIT) of Electrical Connectors with Short Term Tests. <i>Microelectronics reliability :
    an internat. journal &#38; world abstracting service</i> <b>138</b>.'
  chicago: 'Song, Jian, Abhay Rammurti Shukla, and Roman Probst. “Prediction of Failure
    in Time (FIT) of Electrical Connectors with Short Term Tests.” <i>Microelectronics
    Reliability : An Internat. Journal &#38; World Abstracting Service</i> 138, no.
    November 2022 (2022). <a href="https://doi.org/10.1016/j.microrel.2022.114684">https://doi.org/10.1016/j.microrel.2022.114684</a>.'
  chicago-de: 'Song, Jian, Abhay Rammurti Shukla und Roman Probst. 2022. Prediction
    of failure in time (FIT) of electrical connectors with short term tests. <i>Microelectronics
    reliability : an internat. journal &#38; world abstracting service</i> 138, Nr.
    November 2022. doi:<a href="https://doi.org/10.1016/j.microrel.2022.114684">10.1016/j.microrel.2022.114684</a>,
    .'
  din1505-2-1: '<span style="font-variant:small-caps;">Song, Jian</span> ; <span style="font-variant:small-caps;">Shukla,
    Abhay Rammurti</span> ; <span style="font-variant:small-caps;">Probst, Roman</span>:
    Prediction of failure in time (FIT) of electrical connectors with short term tests.
    In: <i>Microelectronics reliability : an internat. journal &#38; world abstracting
    service</i> Bd. 138. Amsterdam, Elsevier (2022), Nr. November 2022'
  havard: 'J. Song, A.R. Shukla, R. Probst, Prediction of failure in time (FIT) of
    electrical connectors with short term tests, Microelectronics Reliability : An
    Internat. Journal &#38; World Abstracting Service. 138 (2022).'
  ieee: 'J. Song, A. R. Shukla, and R. Probst, “Prediction of failure in time (FIT)
    of electrical connectors with short term tests,” <i>Microelectronics reliability :
    an internat. journal &#38; world abstracting service</i>, vol. 138, no. November
    2022, Art. no. 114684, 2022, doi: <a href="https://doi.org/10.1016/j.microrel.2022.114684">10.1016/j.microrel.2022.114684</a>.'
  mla: 'Song, Jian, et al. “Prediction of Failure in Time (FIT) of Electrical Connectors
    with Short Term Tests.” <i>Microelectronics Reliability : An Internat. Journal
    &#38; World Abstracting Service</i>, vol. 138, no. November 2022, 114684, 2022,
    <a href="https://doi.org/10.1016/j.microrel.2022.114684">https://doi.org/10.1016/j.microrel.2022.114684</a>.'
  short: 'J. Song, A.R. Shukla, R. Probst, Microelectronics Reliability : An Internat.
    Journal &#38; World Abstracting Service 138 (2022).'
  ufg: '<b>Song, Jian/Shukla, Abhay Rammurti/Probst, Roman</b>: Prediction of failure
    in time (FIT) of electrical connectors with short term tests, in: <i>Microelectronics
    reliability : an internat. journal &#38; world abstracting service</i> 138 (2022),
    H. November 2022.'
  van: 'Song J, Shukla AR, Probst R. Prediction of failure in time (FIT) of electrical
    connectors with short term tests. Microelectronics reliability : an internat journal
    &#38; world abstracting service. 2022;138(November 2022).'
date_created: 2022-12-11T13:13:46Z
date_updated: 2024-08-05T07:30:51Z
department:
- _id: DEP6012
doi: 10.1016/j.microrel.2022.114684
intvolume: '       138'
issue: November 2022
keyword:
- Electrical connectors
- Prediction of lifetime
- FIT
- Correlation between data in short and long term tests
- Time-lapse of lifetime tests
language:
- iso: eng
place: Amsterdam
publication: 'Microelectronics reliability : an internat. journal & world abstracting
  service'
publication_identifier:
  issn:
  - 0026-2714
publication_status: published
publisher: Elsevier
status: public
title: Prediction of failure in time (FIT) of electrical connectors with short term
  tests
type: scientific_journal_article
user_id: '83781'
volume: 138
year: '2022'
...
---
_id: '9207'
abstract:
- lang: eng
  text: A new acceleration model for the reliability prediction of electrical connectors
    has recently been published. This model enables the evaluation of failure rates
    gained in highly accelerated life tests (HALT) and considers thermal and vibrational
    loading. However, since the initial study only covered a small set of test parameters,
    further study of the model is required. Previous studies have sufficiently investigated
    the influence of the vibration test mode on the failure rate of electrical connectors.
    Therefore, this study now focuses on the influence of the thermal cycling test.
    A commonly used automotive connector is chosen and subjected to stresses in HALT
    covering various upper temperatures, test durations and thermal cycling frequencies.
    Additionally, the principles of determining the coefficient of temperature difference
    and the coefficient of the thermal cycling frequency are presented, since these
    coefficients are connector specific and required for the acceleration model. Based
    on the numbers of failures in test, the influence of the various thermal cycling
    tests is discussed, and the coefficients are calculated for the chosen connector.
    In conclusion a guideline to select an appropriate upper temperature and test
    duration in order to compare the reliability of different electrical connectors
    is provided.
article_number: '114633'
author:
- first_name: Kevin
  full_name: Krüger, Kevin
  id: '76831'
  last_name: Krüger
- first_name: Jian
  full_name: Song, Jian
  id: '5297'
  last_name: Song
citation:
  ama: 'Krüger K, Song J. The influence of thermal cycling test parameters on the
    failure rate of electrical connectors. <i>Microelectronics reliability : an internat
    journal &#38; world abstracting service</i>. 2022;138(November 2022). doi:<a href="https://doi.org/10.1016/j.microrel.2022.114633">https://doi.org/10.1016/j.microrel.2022.114633</a>'
  apa: 'Krüger, K., &#38; Song, J. (2022). The influence of thermal cycling test parameters
    on the failure rate of electrical connectors. <i>Microelectronics Reliability :
    An Internat. Journal &#38; World Abstracting Service</i>, <i>138</i>(November
    2022), Article 114633. <a href="https://doi.org/10.1016/j.microrel.2022.114633">https://doi.org/10.1016/j.microrel.2022.114633</a>'
  bjps: '<b>Krüger K and Song J</b> (2022) The Influence of Thermal Cycling Test Parameters
    on the Failure Rate of Electrical Connectors. <i>Microelectronics reliability :
    an internat. journal &#38; world abstracting service</i> <b>138</b>.'
  chicago: 'Krüger, Kevin, and Jian Song. “The Influence of Thermal Cycling Test Parameters
    on the Failure Rate of Electrical Connectors.” <i>Microelectronics Reliability :
    An Internat. Journal &#38; World Abstracting Service</i> 138, no. November 2022
    (2022). <a href="https://doi.org/10.1016/j.microrel.2022.114633">https://doi.org/10.1016/j.microrel.2022.114633</a>.'
  chicago-de: 'Krüger, Kevin und Jian Song. 2022. The influence of thermal cycling
    test parameters on the failure rate of electrical connectors. <i>Microelectronics
    reliability : an internat. journal &#38; world abstracting service</i> 138, Nr.
    November 2022. doi:<a href="https://doi.org/10.1016/j.microrel.2022.114633">https://doi.org/10.1016/j.microrel.2022.114633</a>,
    .'
  din1505-2-1: '<span style="font-variant:small-caps;">Krüger, Kevin</span> ; <span
    style="font-variant:small-caps;">Song, Jian</span>: The influence of thermal cycling
    test parameters on the failure rate of electrical connectors. In: <i>Microelectronics
    reliability : an internat. journal &#38; world abstracting service</i> Bd. 138.
    Amsterdam, Elsevier (2022), Nr. November 2022'
  havard: 'K. Krüger, J. Song, The influence of thermal cycling test parameters on
    the failure rate of electrical connectors, Microelectronics Reliability : An Internat.
    Journal &#38; World Abstracting Service. 138 (2022).'
  ieee: 'K. Krüger and J. Song, “The influence of thermal cycling test parameters
    on the failure rate of electrical connectors,” <i>Microelectronics reliability :
    an internat. journal &#38; world abstracting service</i>, vol. 138, no. November
    2022, Art. no. 114633, 2022, doi: <a href="https://doi.org/10.1016/j.microrel.2022.114633">https://doi.org/10.1016/j.microrel.2022.114633</a>.'
  mla: 'Krüger, Kevin, and Jian Song. “The Influence of Thermal Cycling Test Parameters
    on the Failure Rate of Electrical Connectors.” <i>Microelectronics Reliability :
    An Internat. Journal &#38; World Abstracting Service</i>, vol. 138, no. November
    2022, 114633, 2022, <a href="https://doi.org/10.1016/j.microrel.2022.114633">https://doi.org/10.1016/j.microrel.2022.114633</a>.'
  short: 'K. Krüger, J. Song, Microelectronics Reliability : An Internat. Journal
    &#38; World Abstracting Service 138 (2022).'
  ufg: '<b>Krüger, Kevin/Song, Jian</b>: The influence of thermal cycling test parameters
    on the failure rate of electrical connectors, in: <i>Microelectronics reliability :
    an internat. journal &#38; world abstracting service</i> 138 (2022), H. November
    2022.'
  van: 'Krüger K, Song J. The influence of thermal cycling test parameters on the
    failure rate of electrical connectors. Microelectronics reliability : an internat
    journal &#38; world abstracting service. 2022;138(November 2022).'
date_created: 2022-12-11T13:17:29Z
date_updated: 2024-08-05T07:33:56Z
department:
- _id: DEP6012
doi: https://doi.org/10.1016/j.microrel.2022.114633
intvolume: '       138'
issue: November 2022
keyword:
- Electrical connectors
- Life test
- Thermal cycling
- Upper temperature Duration
- Temperature difference
- Cycling frequency
language:
- iso: eng
place: Amsterdam
publication: 'Microelectronics reliability : an internat. journal & world abstracting
  service'
publication_identifier:
  issn:
  - 0026-2714
publication_status: published
publisher: Elsevier
status: public
title: The influence of thermal cycling test parameters on the failure rate of electrical
  connectors
type: scientific_journal_article
user_id: '83781'
volume: 138
year: '2022'
...
---
_id: '9211'
abstract:
- lang: eng
  text: Lifetime tests of connectors are time consuming and labor intensive. Our study
    reveals a strong correlation between the statistical characteristics of contact
    resistance development in the early stages of lifetime tests and the final results
    of the tests. This correlation enables a further time lapse of lifetime tests
    and the prediction of the state of the health of connectors which can be utilized
    in the development of diagnostic strategy in sophisticated networks with very
    high number of connectors as well as in a quick classification of connectors with
    respect to their design features. Methods of statistical evaluation are introduced
    and the sensitivity analyses of different characteristics for the state of health
    of connectors are conducted.
author:
- first_name: Jian
  full_name: Song, Jian
  id: '5297'
  last_name: Song
- first_name: Abhay Rammurti
  full_name: Shukla, Abhay Rammurti
  id: '72757'
  last_name: Shukla
- first_name: Roman
  full_name: Probst, Roman
  id: '69156'
  last_name: Probst
citation:
  ama: Song J, Shukla AR, Probst R. <i>State of Health of Connectors – Early Indicators</i>.
    IEEE; 2022:272-278. doi:<a href="https://doi.org/10.1109/HLM54538.2022.9969839">10.1109/HLM54538.2022.9969839</a>
  apa: 'Song, J., Shukla, A. R., &#38; Probst, R. (2022). State of Health of Connectors
    – Early Indicators. In <i>Electrical contacts - 2022 : proceedings of the Sixty-Seventh
    IEEE Holm Conference on Electrical Contacts</i> (pp. 272–278). IEEE. <a href="https://doi.org/10.1109/HLM54538.2022.9969839">https://doi.org/10.1109/HLM54538.2022.9969839</a>'
  bjps: '<b>Song J, Shukla AR and Probst R</b> (2022) <i>State of Health of Connectors
    – Early Indicators</i>. Piscataway, NJ: IEEE.'
  chicago: 'Song, Jian, Abhay Rammurti Shukla, and Roman Probst. <i>State of Health
    of Connectors – Early Indicators</i>. <i>Electrical Contacts - 2022 : Proceedings
    of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts</i>. Piscataway,
    NJ: IEEE, 2022. <a href="https://doi.org/10.1109/HLM54538.2022.9969839">https://doi.org/10.1109/HLM54538.2022.9969839</a>.'
  chicago-de: 'Song, Jian, Abhay Rammurti Shukla und Roman Probst. 2022. <i>State
    of Health of Connectors – Early Indicators</i>. <i>Electrical contacts - 2022 :
    proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts</i>.
    Piscataway, NJ: IEEE. doi:<a href="https://doi.org/10.1109/HLM54538.2022.9969839">10.1109/HLM54538.2022.9969839</a>,
    .'
  din1505-2-1: '<span style="font-variant:small-caps;">Song, Jian</span> ; <span style="font-variant:small-caps;">Shukla,
    Abhay Rammurti</span> ; <span style="font-variant:small-caps;">Probst, Roman</span>:
    <i>State of Health of Connectors – Early Indicators</i>. Piscataway, NJ : IEEE,
    2022'
  havard: J. Song, A.R. Shukla, R. Probst, State of Health of Connectors – Early Indicators,
    IEEE, Piscataway, NJ, 2022.
  ieee: 'J. Song, A. R. Shukla, and R. Probst, <i>State of Health of Connectors –
    Early Indicators</i>. Piscataway, NJ: IEEE, 2022, pp. 272–278. doi: <a href="https://doi.org/10.1109/HLM54538.2022.9969839">10.1109/HLM54538.2022.9969839</a>.'
  mla: 'Song, Jian, et al. “State of Health of Connectors – Early Indicators.” <i>Electrical
    Contacts - 2022 : Proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical
    Contacts</i>, IEEE, 2022, pp. 272–78, <a href="https://doi.org/10.1109/HLM54538.2022.9969839">https://doi.org/10.1109/HLM54538.2022.9969839</a>.'
  short: J. Song, A.R. Shukla, R. Probst, State of Health of Connectors – Early Indicators,
    IEEE, Piscataway, NJ, 2022.
  ufg: '<b>Song, Jian/Shukla, Abhay Rammurti/Probst, Roman</b>: State of Health of
    Connectors – Early Indicators, Piscataway, NJ 2022.'
  van: 'Song J, Shukla AR, Probst R. State of Health of Connectors – Early Indicators.
    Electrical contacts - 2022 : proceedings of the Sixty-Seventh IEEE Holm Conference
    on Electrical Contacts. Piscataway, NJ: IEEE; 2022.'
conference:
  end_date: 2022-10-26
  location: Tampa, FL, USA
  name: 67th Holm Conference on Electrical Contacts
  start_date: 2022-10-23
date_created: 2022-12-11T13:50:30Z
date_updated: 2024-08-05T08:01:22Z
department:
- _id: DEP6012
doi: 10.1109/HLM54538.2022.9969839
keyword:
- Connectors
- Correlation
- Sensitivity analysis
- Contact resistance
- Lifetime estimation
- Reliability
- Electrical resistance measurement
language:
- iso: eng
page: 272 - 278
place: Piscataway, NJ
publication: 'Electrical contacts - 2022 : proceedings of the Sixty-Seventh IEEE Holm
  Conference on Electrical Contacts'
publication_identifier:
  eisbn:
  - 978-1-6654-5965-5
  isbn:
  - 978-1-6654-5966-2
  - 978-1-6654-5967-9
  issn:
  - 2158-9992
publication_status: published
publisher: IEEE
status: public
title: State of Health of Connectors – Early Indicators
type: conference_editor_article
user_id: '83781'
year: '2022'
...
---
_id: '9213'
abstract:
- lang: eng
  text: The function and reliability of electrical connectors in automotive applications
    is crucial for vehicle safety, especially with regard to E-mobility and autonomous
    driving. For this reason, electrical connectors are being developed for long-term
    use applications. However, a small amount of function failures are still being
    observed in long-term use field vehicles. In this study all electrical connectors
    of five long-term driven vehicles from various car manufacturers are disassembled
    and analyzed. The same analysis procedure is followed for every vehicle and the
    electrical resistance of the connectors is measured to determine electrical failures.
    The contacts of failed connectors are further analyzed using optical microscopy,
    XRF spectroscopy, EDS and detailed contact resistance mapping. By comparing the
    connectors with electrical failures to the same types of connectors with a proper
    electrical resistance, failure mechanisms can be detected and analyzed. The frequency
    of various failure mechanisms is statistically evaluated. The results of the analysis
    provide valuable indications with respect to improvement of the reliability of
    connectors.
author:
- first_name: Dirk
  full_name: Hilmert, Dirk
  id: '74212'
  last_name: Hilmert
- first_name: Haomiao
  full_name: Yuan, Haomiao
  id: '61860'
  last_name: Yuan
- first_name: Jian
  full_name: Song, Jian
  id: '5297'
  last_name: Song
citation:
  ama: Hilmert D, Yuan H, Song J. <i>The Analysis of Failure Mechanisms of Electrical
    Connectors in Long-Term Use Field Vehicles</i>. IEEE; 2022:9-16. doi:<a href="https://doi.org/10.1109/HLM54538.2022.9969820">10.1109/HLM54538.2022.9969820</a>
  apa: 'Hilmert, D., Yuan, H., &#38; Song, J. (2022). The Analysis of Failure Mechanisms
    of Electrical Connectors in Long-term Use Field Vehicles. In <i>Electrical contacts
    - 2022 : proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts</i>
    (pp. 9–16). IEEE. <a href="https://doi.org/10.1109/HLM54538.2022.9969820">https://doi.org/10.1109/HLM54538.2022.9969820</a>'
  bjps: '<b>Hilmert D, Yuan H and Song J</b> (2022) <i>The Analysis of Failure Mechanisms
    of Electrical Connectors in Long-Term Use Field Vehicles</i>. Piscataway, NJ:
    IEEE.'
  chicago: 'Hilmert, Dirk, Haomiao Yuan, and Jian Song. <i>The Analysis of Failure
    Mechanisms of Electrical Connectors in Long-Term Use Field Vehicles</i>. <i>Electrical
    Contacts - 2022 : Proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical
    Contacts</i>. Piscataway, NJ: IEEE, 2022. <a href="https://doi.org/10.1109/HLM54538.2022.9969820">https://doi.org/10.1109/HLM54538.2022.9969820</a>.'
  chicago-de: 'Hilmert, Dirk, Haomiao Yuan und Jian Song. 2022. <i>The Analysis of
    Failure Mechanisms of Electrical Connectors in Long-term Use Field Vehicles</i>.
    <i>Electrical contacts - 2022 : proceedings of the Sixty-Seventh IEEE Holm Conference
    on Electrical Contacts</i>. Piscataway, NJ: IEEE. doi:<a href="https://doi.org/10.1109/HLM54538.2022.9969820">10.1109/HLM54538.2022.9969820</a>,
    .'
  din1505-2-1: '<span style="font-variant:small-caps;">Hilmert, Dirk</span> ; <span
    style="font-variant:small-caps;">Yuan, Haomiao</span> ; <span style="font-variant:small-caps;">Song,
    Jian</span>: <i>The Analysis of Failure Mechanisms of Electrical Connectors in
    Long-term Use Field Vehicles</i>. Piscataway, NJ : IEEE, 2022'
  havard: D. Hilmert, H. Yuan, J. Song, The Analysis of Failure Mechanisms of Electrical
    Connectors in Long-term Use Field Vehicles, IEEE, Piscataway, NJ, 2022.
  ieee: 'D. Hilmert, H. Yuan, and J. Song, <i>The Analysis of Failure Mechanisms of
    Electrical Connectors in Long-term Use Field Vehicles</i>. Piscataway, NJ: IEEE,
    2022, pp. 9–16. doi: <a href="https://doi.org/10.1109/HLM54538.2022.9969820">10.1109/HLM54538.2022.9969820</a>.'
  mla: 'Hilmert, Dirk, et al. “The Analysis of Failure Mechanisms of Electrical Connectors
    in Long-Term Use Field Vehicles.” <i>Electrical Contacts - 2022 : Proceedings
    of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts</i>, IEEE, 2022,
    pp. 9–16, <a href="https://doi.org/10.1109/HLM54538.2022.9969820">https://doi.org/10.1109/HLM54538.2022.9969820</a>.'
  short: D. Hilmert, H. Yuan, J. Song, The Analysis of Failure Mechanisms of Electrical
    Connectors in Long-Term Use Field Vehicles, IEEE, Piscataway, NJ, 2022.
  ufg: '<b>Hilmert, Dirk/Yuan, Haomiao/Song, Jian</b>: The Analysis of Failure Mechanisms
    of Electrical Connectors in Long-term Use Field Vehicles, Piscataway, NJ 2022.'
  van: 'Hilmert D, Yuan H, Song J. The Analysis of Failure Mechanisms of Electrical
    Connectors in Long-term Use Field Vehicles. Electrical contacts - 2022 : proceedings
    of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts. Piscataway,
    NJ: IEEE; 2022.'
conference:
  end_date: 2022-10-26
  location: Tampa, FL, USA
  name: 67th Holm Conference on Electrical Contacts
  start_date: 2022-10-23
date_created: 2022-12-11T13:55:18Z
date_updated: 2024-08-05T08:18:13Z
department:
- _id: DEP6012
doi: 10.1109/HLM54538.2022.9969820
keyword:
- Connectors
- Resistance
- Spectroscopy
- Optical microscopy
- Microscopy
- Vehicle safety
- Failure analysis
language:
- iso: eng
page: 9 - 16
place: Piscataway, NJ
publication: 'Electrical contacts - 2022 : proceedings of the Sixty-Seventh IEEE Holm
  Conference on Electrical Contacts'
publication_identifier:
  eisbn:
  - 978-1-6654-5965-5
  isbn:
  - 978-1-6654-5966-2
  - 978-1-6654-5967-9
  issn:
  - 2158-9992
publication_status: published
publisher: IEEE
status: public
title: The Analysis of Failure Mechanisms of Electrical Connectors in Long-term Use
  Field Vehicles
type: conference_editor_article
user_id: '83781'
year: '2022'
...
---
_id: '6317'
abstract:
- lang: eng
  text: The electrical-thermal behavior of an electrical connector is determined by
    heat generation due to Joule heating and heat absorption by conduction, convection
    and radiation. Heat flow from the connector to the wire is an important heat absorption
    mechanism for most electrical connectors. The temperature difference between the
    connector and the wire at infinity is proportional to the axial heat flow induced
    into the wire. The purpose of this study is to dimension the electrical resistance
    of a connector for power distribution by the heat flow into the wire. The heat
    flow is used as a design factor in order to define the maximum power loss for
    wires with different cross-section areas. With this approach the maximum acceptable
    electrical resistance for connectors with different sizes can be estimated in
    the early stages of the design process.
author:
- first_name: Michael
  full_name: Blauth, Michael
  id: '49095'
  last_name: Blauth
- first_name: Frank
  full_name: Berger, Frank
  last_name: Berger
- first_name: Jian
  full_name: Song, Jian
  id: '5297'
  last_name: Song
citation:
  ama: 'Blauth M, Berger F, Song J. Influence of the Electrical Resistance and Wire
    Size on the Current Carrying Capacity of Connectors. In: IEEE, ed. <i>60th IEEE
    Holm Conference on Electrical Contacts</i>. IEEE; 2014:192-199. doi:<a href="https://doi.org/10.1109/HOLM.2014.7031043">10.1109/HOLM.2014.7031043</a>'
  apa: Blauth, M., Berger, F., &#38; Song, J. (2014). Influence of the Electrical
    Resistance and Wire Size on the Current Carrying Capacity of Connectors. In IEEE
    (Ed.), <i>60th IEEE Holm Conference on Electrical Contacts</i> (pp. 192–199).
    IEEE. <a href="https://doi.org/10.1109/HOLM.2014.7031043">https://doi.org/10.1109/HOLM.2014.7031043</a>
  bjps: '<b>Blauth M, Berger F and Song J</b> (2014) Influence of the Electrical Resistance
    and Wire Size on the Current Carrying Capacity of Connectors. In IEEE (ed.), <i>60th
    IEEE Holm Conference on Electrical Contacts</i>. Piscataway, NJ: IEEE, pp. 192–199.'
  chicago: 'Blauth, Michael, Frank Berger, and Jian Song. “Influence of the Electrical
    Resistance and Wire Size on the Current Carrying Capacity of Connectors.” In <i>60th
    IEEE Holm Conference on Electrical Contacts</i>, edited by IEEE, 192–99. Piscataway,
    NJ: IEEE, 2014. <a href="https://doi.org/10.1109/HOLM.2014.7031043">https://doi.org/10.1109/HOLM.2014.7031043</a>.'
  chicago-de: 'Blauth, Michael, Frank Berger und Jian Song. 2014. Influence of the
    Electrical Resistance and Wire Size on the Current Carrying Capacity of Connectors.
    In: <i>60th IEEE Holm Conference on Electrical Contacts</i>, hg. von IEEE, 192–199.
    Piscataway, NJ: IEEE. doi:<a href="https://doi.org/10.1109/HOLM.2014.7031043">10.1109/HOLM.2014.7031043</a>,
    .'
  din1505-2-1: '<span style="font-variant:small-caps;">Blauth, Michael</span> ; <span
    style="font-variant:small-caps;">Berger, Frank</span> ; <span style="font-variant:small-caps;">Song,
    Jian</span>: Influence of the Electrical Resistance and Wire Size on the Current
    Carrying Capacity of Connectors. In: <span style="font-variant:small-caps;">IEEE</span>
    (Hrsg.): <i>60th IEEE Holm Conference on Electrical Contacts</i>. Piscataway,
    NJ : IEEE, 2014, S. 192–199'
  havard: 'M. Blauth, F. Berger, J. Song, Influence of the Electrical Resistance and
    Wire Size on the Current Carrying Capacity of Connectors, in: IEEE (Ed.), 60th
    IEEE Holm Conference on Electrical Contacts, IEEE, Piscataway, NJ, 2014: pp. 192–199.'
  ieee: 'M. Blauth, F. Berger, and J. Song, “Influence of the Electrical Resistance
    and Wire Size on the Current Carrying Capacity of Connectors,” in <i>60th IEEE
    Holm Conference on Electrical Contacts</i>, New Orleans, LA, USA , 2014, pp. 192–199.
    doi: <a href="https://doi.org/10.1109/HOLM.2014.7031043">10.1109/HOLM.2014.7031043</a>.'
  mla: Blauth, Michael, et al. “Influence of the Electrical Resistance and Wire Size
    on the Current Carrying Capacity of Connectors.” <i>60th IEEE Holm Conference
    on Electrical Contacts</i>, edited by IEEE, IEEE, 2014, pp. 192–99, <a href="https://doi.org/10.1109/HOLM.2014.7031043">https://doi.org/10.1109/HOLM.2014.7031043</a>.
  short: 'M. Blauth, F. Berger, J. Song, in: IEEE (Ed.), 60th IEEE Holm Conference
    on Electrical Contacts, IEEE, Piscataway, NJ, 2014, pp. 192–199.'
  ufg: '<b>Blauth, Michael/Berger, Frank/Song, Jian</b>: Influence of the Electrical
    Resistance and Wire Size on the Current Carrying Capacity of Connectors, in: <i>IEEE
    (Hg.)</i>: 60th IEEE Holm Conference on Electrical Contacts, Piscataway, NJ 2014, 
    S. 192–199.'
  van: 'Blauth M, Berger F, Song J. Influence of the Electrical Resistance and Wire
    Size on the Current Carrying Capacity of Connectors. In: IEEE, editor. 60th IEEE
    Holm Conference on Electrical Contacts. Piscataway, NJ: IEEE; 2014. p. 192–9.'
conference:
  end_date: 2014-10-15
  location: 'New Orleans, LA, USA '
  name: 60th IEEE Holm Conference on Electrical Contacts
  start_date: 2014-10-12
corporate_editor:
- IEEE
date_created: 2021-09-16T08:10:59Z
date_updated: 2026-03-04T14:13:15Z
department:
- _id: DEP6012
doi: 10.1109/HOLM.2014.7031043
keyword:
- Wires
- Connectors
- Temperature measurement
- Resistance
- Heat transfer
- Resistance heating
language:
- iso: eng
page: 192 - 199
place: Piscataway, NJ
publication: 60th IEEE Holm Conference on Electrical Contacts
publication_identifier:
  eisbn:
  - 978-1-4799-6068-2
  isbn:
  - '978-1-4799-6069-9 '
publication_status: published
publisher: IEEE
status: public
title: Influence of the Electrical Resistance and Wire Size on the Current Carrying
  Capacity of Connectors
type: conference
user_id: '83781'
year: '2014'
...