---
_id: '11360'
abstract:
- lang: eng
  text: The state of health and lifetime estimation process of electrical connectors
    via lifetime tests is a time and labor intensive process. In our previous work,
    a correlation between the contact resistance developments in the early stages
    of lifetime tests of electrical connectors with the final results was established
    using a data driven statistical process based on probability distribution. Also,
    state of health indicators for prognosis of lifetime were introduced. In this
    work, the state of health indicators have been optimized. The sensitivity analysis
    is performed with regards to the selection of the appropriate amount of test data
    based on test duration for the reliable prognosis of the state of health and the
    characteristic lifetime. Through this the possibility of further reduction of
    test duration required for the reliable prognosis of state of health is investigated.
    Based on the results of analysis, a guideline for the determination of the duration
    of lifetime tests which lead to a reliable prediction of lifetime of connectors
    can be provided. Also, an assessment of the state of art in the prognosis of the
    lifetime of electrical connectors has been presented.
author:
- first_name: Jian
  full_name: Song, Jian
  id: '5297'
  last_name: Song
- first_name: Abhay Rammurti
  full_name: Shukla, Abhay Rammurti
  id: '74188'
  last_name: Shukla
- first_name: Roman
  full_name: Probst, Roman
  id: '69156'
  last_name: Probst
citation:
  ama: Song J, Shukla AR, Probst R. <i>Advances in Evaluation of State of Health of
    Electrical Connectors</i>. IEEE; 2023:200-208. doi:<a href="https://doi.org/10.1109/holm56075.2023.10352279">10.1109/holm56075.2023.10352279</a>
  apa: Song, J., Shukla, A. R., &#38; Probst, R. (2023). Advances in Evaluation of
    State of Health of Electrical Connectors. In <i>2023 IEEE 68th Holm Conference
    on Electrical Contacts (HOLM)</i> (pp. 200–208). IEEE. <a href="https://doi.org/10.1109/holm56075.2023.10352279">https://doi.org/10.1109/holm56075.2023.10352279</a>
  bjps: '<b>Song J, Shukla AR and Probst R</b> (2023) <i>Advances in Evaluation of
    State of Health of Electrical Connectors</i>. [Piscataway, NJ]: IEEE.'
  chicago: 'Song, Jian, Abhay Rammurti Shukla, and Roman Probst. <i>Advances in Evaluation
    of State of Health of Electrical Connectors</i>. <i>2023 IEEE 68th Holm Conference
    on Electrical Contacts (HOLM)</i>. Electrical Contacts-IEEE Holm Conference on
    Electrical Contacts. [Piscataway, NJ]: IEEE, 2023. <a href="https://doi.org/10.1109/holm56075.2023.10352279">https://doi.org/10.1109/holm56075.2023.10352279</a>.'
  chicago-de: 'Song, Jian, Abhay Rammurti Shukla und Roman Probst. 2023. <i>Advances
    in Evaluation of State of Health of Electrical Connectors</i>. <i>2023 IEEE 68th
    Holm Conference on Electrical Contacts (HOLM)</i>. Electrical Contacts-IEEE Holm
    Conference on Electrical Contacts. [Piscataway, NJ]: IEEE. doi:<a href="https://doi.org/10.1109/holm56075.2023.10352279">10.1109/holm56075.2023.10352279</a>,
    .'
  din1505-2-1: '<span style="font-variant:small-caps;">Song, Jian</span> ; <span style="font-variant:small-caps;">Shukla,
    Abhay Rammurti</span> ; <span style="font-variant:small-caps;">Probst, Roman</span>:
    <i>Advances in Evaluation of State of Health of Electrical Connectors</i>, <i>Electrical
    Contacts-IEEE Holm Conference on Electrical Contacts</i>. [Piscataway, NJ] : IEEE,
    2023'
  havard: J. Song, A.R. Shukla, R. Probst, Advances in Evaluation of State of Health
    of Electrical Connectors, IEEE, [Piscataway, NJ], 2023.
  ieee: 'J. Song, A. R. Shukla, and R. Probst, <i>Advances in Evaluation of State
    of Health of Electrical Connectors</i>. [Piscataway, NJ]: IEEE, 2023, pp. 200–208.
    doi: <a href="https://doi.org/10.1109/holm56075.2023.10352279">10.1109/holm56075.2023.10352279</a>.'
  mla: Song, Jian, et al. “Advances in Evaluation of State of Health of Electrical
    Connectors.” <i>2023 IEEE 68th Holm Conference on Electrical Contacts (HOLM)</i>,
    IEEE, 2023, pp. 200–08, <a href="https://doi.org/10.1109/holm56075.2023.10352279">https://doi.org/10.1109/holm56075.2023.10352279</a>.
  short: J. Song, A.R. Shukla, R. Probst, Advances in Evaluation of State of Health
    of Electrical Connectors, IEEE, [Piscataway, NJ], 2023.
  ufg: '<b>Song, Jian/Shukla, Abhay Rammurti/Probst, Roman</b>: Advances in Evaluation
    of State of Health of Electrical Connectors, [Piscataway, NJ] 2023 (Electrical
    Contacts-IEEE Holm Conference on Electrical Contacts).'
  van: 'Song J, Shukla AR, Probst R. Advances in Evaluation of State of Health of
    Electrical Connectors. 2023 IEEE 68th Holm Conference on Electrical Contacts (HOLM).
    [Piscataway, NJ]: IEEE; 2023. (Electrical Contacts-IEEE Holm Conference on Electrical
    Contacts).'
conference:
  end_date: 2023-10-11
  location: Seattle
  name: 68th Holm Conference on Electrical Contacts (HOLM)
  start_date: 2023-10-04
date_created: 2024-04-18T10:11:50Z
date_updated: 2025-06-26T07:54:50Z
doi: 10.1109/holm56075.2023.10352279
keyword:
- accelerated life testing
- test duration
- contact resistance
- statistical model
- connector reliability
language:
- iso: eng
page: 200-208
place: '[Piscataway, NJ]'
publication: 2023 IEEE 68th Holm Conference on Electrical Contacts (HOLM)
publication_identifier:
  eisbn:
  - 979‐8‐3503‐4246‐8
  - '979‐8‐3503‐4245‐1 '
  eissn:
  - 2158‐9992
  isbn:
  - 979‐8‐3503‐4244‐4
  issn:
  - 2158-9992
publication_status: published
publisher: IEEE
series_title: Electrical Contacts-IEEE Holm Conference on Electrical Contacts
status: public
title: Advances in Evaluation of State of Health of Electrical Connectors
type: conference_editor_article
user_id: '83781'
year: '2023'
...
---
_id: '9211'
abstract:
- lang: eng
  text: Lifetime tests of connectors are time consuming and labor intensive. Our study
    reveals a strong correlation between the statistical characteristics of contact
    resistance development in the early stages of lifetime tests and the final results
    of the tests. This correlation enables a further time lapse of lifetime tests
    and the prediction of the state of the health of connectors which can be utilized
    in the development of diagnostic strategy in sophisticated networks with very
    high number of connectors as well as in a quick classification of connectors with
    respect to their design features. Methods of statistical evaluation are introduced
    and the sensitivity analyses of different characteristics for the state of health
    of connectors are conducted.
author:
- first_name: Jian
  full_name: Song, Jian
  id: '5297'
  last_name: Song
- first_name: Abhay Rammurti
  full_name: Shukla, Abhay Rammurti
  id: '72757'
  last_name: Shukla
- first_name: Roman
  full_name: Probst, Roman
  id: '69156'
  last_name: Probst
citation:
  ama: Song J, Shukla AR, Probst R. <i>State of Health of Connectors – Early Indicators</i>.
    IEEE; 2022:272-278. doi:<a href="https://doi.org/10.1109/HLM54538.2022.9969839">10.1109/HLM54538.2022.9969839</a>
  apa: 'Song, J., Shukla, A. R., &#38; Probst, R. (2022). State of Health of Connectors
    – Early Indicators. In <i>Electrical contacts - 2022 : proceedings of the Sixty-Seventh
    IEEE Holm Conference on Electrical Contacts</i> (pp. 272–278). IEEE. <a href="https://doi.org/10.1109/HLM54538.2022.9969839">https://doi.org/10.1109/HLM54538.2022.9969839</a>'
  bjps: '<b>Song J, Shukla AR and Probst R</b> (2022) <i>State of Health of Connectors
    – Early Indicators</i>. Piscataway, NJ: IEEE.'
  chicago: 'Song, Jian, Abhay Rammurti Shukla, and Roman Probst. <i>State of Health
    of Connectors – Early Indicators</i>. <i>Electrical Contacts - 2022 : Proceedings
    of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts</i>. Piscataway,
    NJ: IEEE, 2022. <a href="https://doi.org/10.1109/HLM54538.2022.9969839">https://doi.org/10.1109/HLM54538.2022.9969839</a>.'
  chicago-de: 'Song, Jian, Abhay Rammurti Shukla und Roman Probst. 2022. <i>State
    of Health of Connectors – Early Indicators</i>. <i>Electrical contacts - 2022 :
    proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts</i>.
    Piscataway, NJ: IEEE. doi:<a href="https://doi.org/10.1109/HLM54538.2022.9969839">10.1109/HLM54538.2022.9969839</a>,
    .'
  din1505-2-1: '<span style="font-variant:small-caps;">Song, Jian</span> ; <span style="font-variant:small-caps;">Shukla,
    Abhay Rammurti</span> ; <span style="font-variant:small-caps;">Probst, Roman</span>:
    <i>State of Health of Connectors – Early Indicators</i>. Piscataway, NJ : IEEE,
    2022'
  havard: J. Song, A.R. Shukla, R. Probst, State of Health of Connectors – Early Indicators,
    IEEE, Piscataway, NJ, 2022.
  ieee: 'J. Song, A. R. Shukla, and R. Probst, <i>State of Health of Connectors –
    Early Indicators</i>. Piscataway, NJ: IEEE, 2022, pp. 272–278. doi: <a href="https://doi.org/10.1109/HLM54538.2022.9969839">10.1109/HLM54538.2022.9969839</a>.'
  mla: 'Song, Jian, et al. “State of Health of Connectors – Early Indicators.” <i>Electrical
    Contacts - 2022 : Proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical
    Contacts</i>, IEEE, 2022, pp. 272–78, <a href="https://doi.org/10.1109/HLM54538.2022.9969839">https://doi.org/10.1109/HLM54538.2022.9969839</a>.'
  short: J. Song, A.R. Shukla, R. Probst, State of Health of Connectors – Early Indicators,
    IEEE, Piscataway, NJ, 2022.
  ufg: '<b>Song, Jian/Shukla, Abhay Rammurti/Probst, Roman</b>: State of Health of
    Connectors – Early Indicators, Piscataway, NJ 2022.'
  van: 'Song J, Shukla AR, Probst R. State of Health of Connectors – Early Indicators.
    Electrical contacts - 2022 : proceedings of the Sixty-Seventh IEEE Holm Conference
    on Electrical Contacts. Piscataway, NJ: IEEE; 2022.'
conference:
  end_date: 2022-10-26
  location: Tampa, FL, USA
  name: 67th Holm Conference on Electrical Contacts
  start_date: 2022-10-23
date_created: 2022-12-11T13:50:30Z
date_updated: 2024-08-05T08:01:22Z
department:
- _id: DEP6012
doi: 10.1109/HLM54538.2022.9969839
keyword:
- Connectors
- Correlation
- Sensitivity analysis
- Contact resistance
- Lifetime estimation
- Reliability
- Electrical resistance measurement
language:
- iso: eng
page: 272 - 278
place: Piscataway, NJ
publication: 'Electrical contacts - 2022 : proceedings of the Sixty-Seventh IEEE Holm
  Conference on Electrical Contacts'
publication_identifier:
  eisbn:
  - 978-1-6654-5965-5
  isbn:
  - 978-1-6654-5966-2
  - 978-1-6654-5967-9
  issn:
  - 2158-9992
publication_status: published
publisher: IEEE
status: public
title: State of Health of Connectors – Early Indicators
type: conference_editor_article
user_id: '83781'
year: '2022'
...