---
_id: '9206'
abstract:
- lang: eng
  text: Failure in time (FIT) is an important measure for the reliability of electrical
    connectors. Due to the very long lifetime of connectors, the tests for the determination
    of FIT rate are time and labour intensive. In this paper a data driven method
    using a statistical process to estimate the FIT rate of electrical connectors
    with data of electrical contact resistance development in short term tests is
    proposed. The results of prediction are then compared with the results from long
    term tests. The study shows a strong correlation between contact resistance development
    in short term tests and the development of the number of failures in later stages
    of tests. In order to predict the development of degradation precisely, the distribution
    of resistance data in many different tests with different connectors is investigated.
    The Generalized Extreme Value Distribution, which reveals an ideal fitting, has
    been implemented for the prediction of the failure rates of connectors, thereby
    enabling a remarkable time-lapse of lifetime tests. This method can also be employed
    in the prognosis and management of system health through the forecast of health
    of connectors in different systems in operation.
article_number: '114684'
author:
- first_name: Jian
  full_name: Song, Jian
  id: '5297'
  last_name: Song
- first_name: Abhay Rammurti
  full_name: Shukla, Abhay Rammurti
  id: '72757'
  last_name: Shukla
- first_name: Roman
  full_name: Probst, Roman
  id: '69156'
  last_name: Probst
citation:
  ama: 'Song J, Shukla AR, Probst R. Prediction of failure in time (FIT) of electrical
    connectors with short term tests. <i>Microelectronics reliability : an internat
    journal &#38; world abstracting service</i>. 2022;138(November 2022). doi:<a href="https://doi.org/10.1016/j.microrel.2022.114684">10.1016/j.microrel.2022.114684</a>'
  apa: 'Song, J., Shukla, A. R., &#38; Probst, R. (2022). Prediction of failure in
    time (FIT) of electrical connectors with short term tests. <i>Microelectronics
    Reliability : An Internat. Journal &#38; World Abstracting Service</i>, <i>138</i>(November
    2022), Article 114684. <a href="https://doi.org/10.1016/j.microrel.2022.114684">https://doi.org/10.1016/j.microrel.2022.114684</a>'
  bjps: '<b>Song J, Shukla AR and Probst R</b> (2022) Prediction of Failure in Time
    (FIT) of Electrical Connectors with Short Term Tests. <i>Microelectronics reliability :
    an internat. journal &#38; world abstracting service</i> <b>138</b>.'
  chicago: 'Song, Jian, Abhay Rammurti Shukla, and Roman Probst. “Prediction of Failure
    in Time (FIT) of Electrical Connectors with Short Term Tests.” <i>Microelectronics
    Reliability : An Internat. Journal &#38; World Abstracting Service</i> 138, no.
    November 2022 (2022). <a href="https://doi.org/10.1016/j.microrel.2022.114684">https://doi.org/10.1016/j.microrel.2022.114684</a>.'
  chicago-de: 'Song, Jian, Abhay Rammurti Shukla und Roman Probst. 2022. Prediction
    of failure in time (FIT) of electrical connectors with short term tests. <i>Microelectronics
    reliability : an internat. journal &#38; world abstracting service</i> 138, Nr.
    November 2022. doi:<a href="https://doi.org/10.1016/j.microrel.2022.114684">10.1016/j.microrel.2022.114684</a>,
    .'
  din1505-2-1: '<span style="font-variant:small-caps;">Song, Jian</span> ; <span style="font-variant:small-caps;">Shukla,
    Abhay Rammurti</span> ; <span style="font-variant:small-caps;">Probst, Roman</span>:
    Prediction of failure in time (FIT) of electrical connectors with short term tests.
    In: <i>Microelectronics reliability : an internat. journal &#38; world abstracting
    service</i> Bd. 138. Amsterdam, Elsevier (2022), Nr. November 2022'
  havard: 'J. Song, A.R. Shukla, R. Probst, Prediction of failure in time (FIT) of
    electrical connectors with short term tests, Microelectronics Reliability : An
    Internat. Journal &#38; World Abstracting Service. 138 (2022).'
  ieee: 'J. Song, A. R. Shukla, and R. Probst, “Prediction of failure in time (FIT)
    of electrical connectors with short term tests,” <i>Microelectronics reliability :
    an internat. journal &#38; world abstracting service</i>, vol. 138, no. November
    2022, Art. no. 114684, 2022, doi: <a href="https://doi.org/10.1016/j.microrel.2022.114684">10.1016/j.microrel.2022.114684</a>.'
  mla: 'Song, Jian, et al. “Prediction of Failure in Time (FIT) of Electrical Connectors
    with Short Term Tests.” <i>Microelectronics Reliability : An Internat. Journal
    &#38; World Abstracting Service</i>, vol. 138, no. November 2022, 114684, 2022,
    <a href="https://doi.org/10.1016/j.microrel.2022.114684">https://doi.org/10.1016/j.microrel.2022.114684</a>.'
  short: 'J. Song, A.R. Shukla, R. Probst, Microelectronics Reliability : An Internat.
    Journal &#38; World Abstracting Service 138 (2022).'
  ufg: '<b>Song, Jian/Shukla, Abhay Rammurti/Probst, Roman</b>: Prediction of failure
    in time (FIT) of electrical connectors with short term tests, in: <i>Microelectronics
    reliability : an internat. journal &#38; world abstracting service</i> 138 (2022),
    H. November 2022.'
  van: 'Song J, Shukla AR, Probst R. Prediction of failure in time (FIT) of electrical
    connectors with short term tests. Microelectronics reliability : an internat journal
    &#38; world abstracting service. 2022;138(November 2022).'
date_created: 2022-12-11T13:13:46Z
date_updated: 2024-08-05T07:30:51Z
department:
- _id: DEP6012
doi: 10.1016/j.microrel.2022.114684
intvolume: '       138'
issue: November 2022
keyword:
- Electrical connectors
- Prediction of lifetime
- FIT
- Correlation between data in short and long term tests
- Time-lapse of lifetime tests
language:
- iso: eng
place: Amsterdam
publication: 'Microelectronics reliability : an internat. journal & world abstracting
  service'
publication_identifier:
  issn:
  - 0026-2714
publication_status: published
publisher: Elsevier
status: public
title: Prediction of failure in time (FIT) of electrical connectors with short term
  tests
type: scientific_journal_article
user_id: '83781'
volume: 138
year: '2022'
...