[{"_id":"10788","type":"conference_editor_article","corporate_editor":["Institute of Electrical and Electronics Engineers "],"user_id":"83781","place":"[Piscataway, NJ]","status":"public","page":"1-6","department":[{"_id":"DEP4022"},{"_id":"DEP4028"}],"title":"Systematic Preprocessing of Dielectric Spectroscopy Data and Estimating Viable Cell Densities","doi":"10.1109/INDIN51400.2023.10218012","citation":{"chicago":"Ramm, Selina, Tanja Hernández Rodriguez, Björn Frahm, and Miriam Pein-Hackelbusch. <i>Systematic Preprocessing of Dielectric Spectroscopy Data and Estimating Viable Cell Densities</i>. Edited by Jürgen Jasperneite, Lukasz Wisniewski, Kim Fung Man, and Institute of Electrical and Electronics Engineers . <i>2023 IEEE 21st International Conference on Industrial Informatics (INDIN)</i>. [Piscataway, NJ]: IEEE, 2023. <a href=\"https://doi.org/10.1109/INDIN51400.2023.10218012\">https://doi.org/10.1109/INDIN51400.2023.10218012</a>.","chicago-de":"Ramm, Selina, Tanja Hernández Rodriguez, Björn Frahm und Miriam Pein-Hackelbusch. 2023. <i>Systematic Preprocessing of Dielectric Spectroscopy Data and Estimating Viable Cell Densities</i>. Hg. von Jürgen Jasperneite, Lukasz Wisniewski, Kim Fung Man, und Institute of Electrical and Electronics Engineers . <i>2023 IEEE 21st International Conference on Industrial Informatics (INDIN)</i>. [Piscataway, NJ]: IEEE. doi:<a href=\"https://doi.org/10.1109/INDIN51400.2023.10218012\">10.1109/INDIN51400.2023.10218012</a>, .","bjps":"<b>Ramm S <i>et al.</i></b> (2023) <i>Systematic Preprocessing of Dielectric Spectroscopy Data and Estimating Viable Cell Densities</i>, Jasperneite J et al. (eds). [Piscataway, NJ]: IEEE.","din1505-2-1":"<span style=\"font-variant:small-caps;\">Ramm, Selina</span> ; <span style=\"font-variant:small-caps;\">Hernández Rodriguez, Tanja</span> ; <span style=\"font-variant:small-caps;\">Frahm, Björn</span> ; <span style=\"font-variant:small-caps;\">Pein-Hackelbusch, Miriam</span> ; <span style=\"font-variant:small-caps;\">Jasperneite, J.</span> ; <span style=\"font-variant:small-caps;\">Wisniewski, L.</span> ; <span style=\"font-variant:small-caps;\">Fung Man, K.</span> ; <span style=\"font-variant:small-caps;\">Institute of Electrical and Electronics Engineers </span> (Hrsg.): <i>Systematic Preprocessing of Dielectric Spectroscopy Data and Estimating Viable Cell Densities</i>. [Piscataway, NJ] : IEEE, 2023","van":"Ramm S, Hernández Rodriguez T, Frahm B, Pein-Hackelbusch M. Systematic Preprocessing of Dielectric Spectroscopy Data and Estimating Viable Cell Densities. Jasperneite J, Wisniewski L, Fung Man K, Institute of Electrical and Electronics Engineers , editors. 2023 IEEE 21st International Conference on Industrial Informatics (INDIN). [Piscataway, NJ]: IEEE; 2023.","havard":"S. Ramm, T. Hernández Rodriguez, B. Frahm, M. Pein-Hackelbusch, Systematic Preprocessing of Dielectric Spectroscopy Data and Estimating Viable Cell Densities, IEEE, [Piscataway, NJ], 2023.","ama":"Ramm S, Hernández Rodriguez T, Frahm B, Pein-Hackelbusch M. <i>Systematic Preprocessing of Dielectric Spectroscopy Data and Estimating Viable Cell Densities</i>. (Jasperneite J, Wisniewski L, Fung Man K, Institute of Electrical and Electronics Engineers , eds.). IEEE; 2023:1-6. doi:<a href=\"https://doi.org/10.1109/INDIN51400.2023.10218012\">10.1109/INDIN51400.2023.10218012</a>","apa":"Ramm, S., Hernández Rodriguez, T., Frahm, B., &#38; Pein-Hackelbusch, M. (2023). Systematic Preprocessing of Dielectric Spectroscopy Data and Estimating Viable Cell Densities. In J. Jasperneite, L. Wisniewski, K. Fung Man, &#38; Institute of Electrical and Electronics Engineers  (Eds.), <i>2023 IEEE 21st International Conference on Industrial Informatics (INDIN)</i> (pp. 1–6). IEEE. <a href=\"https://doi.org/10.1109/INDIN51400.2023.10218012\">https://doi.org/10.1109/INDIN51400.2023.10218012</a>","ieee":"S. Ramm, T. Hernández Rodriguez, B. Frahm, and M. Pein-Hackelbusch, <i>Systematic Preprocessing of Dielectric Spectroscopy Data and Estimating Viable Cell Densities</i>. [Piscataway, NJ]: IEEE, 2023, pp. 1–6. doi: <a href=\"https://doi.org/10.1109/INDIN51400.2023.10218012\">10.1109/INDIN51400.2023.10218012</a>.","mla":"Ramm, Selina, et al. “Systematic Preprocessing of Dielectric Spectroscopy Data and Estimating Viable Cell Densities.” <i>2023 IEEE 21st International Conference on Industrial Informatics (INDIN)</i>, edited by Jürgen Jasperneite et al., IEEE, 2023, pp. 1–6, <a href=\"https://doi.org/10.1109/INDIN51400.2023.10218012\">https://doi.org/10.1109/INDIN51400.2023.10218012</a>.","ufg":"<b>Ramm, Selina u. a.</b>: Systematic Preprocessing of Dielectric Spectroscopy Data and Estimating Viable Cell Densities, hg. von Jasperneite, Jürgen u. a., [Piscataway, NJ] 2023.","short":"S. Ramm, T. Hernández Rodriguez, B. Frahm, M. Pein-Hackelbusch, Systematic Preprocessing of Dielectric Spectroscopy Data and Estimating Viable Cell Densities, IEEE, [Piscataway, NJ], 2023."},"editor":[{"first_name":"Jürgen","full_name":"Jasperneite, Jürgen","id":"1899","last_name":"Jasperneite"},{"first_name":"Lukasz","full_name":"Wisniewski, Lukasz","id":"1710","last_name":"Wisniewski"},{"full_name":"Fung Man, Kim","first_name":"Kim","last_name":"Fung Man"}],"conference":{"name":"21st International Conference on Industrial Informatics (INDIN)","location":"Lemgo","start_date":"2023-07-18","end_date":"2023-07-20"},"abstract":[{"lang":"eng","text":"For process monitoring, an adequate data preprocessing is crucial to link accessible inline process data with offline measured target variables. Literature, however, does not provide systematic preprocessing strategies. The effects of five different preprocessing strategies on data from a Dielectric Spectroscopy system applied to the Viable Cell Density (VCD) of a mammalian cell cultivation were thus evaluated. Single-frequency measurements are typically used to model the VCD over the growth phase using linear regression or the Cole-Cole model and served as a reference. As multi-frequency measurement is promising to model the VCD beyond the growth phase using Partial Least Squares Regression (PLSR), we further aimed to determine, whether replacing linear regression by PLSR shows comparable modeling performance. All five preprocessing strategies led to comparable results. Exemplary, when using capacitance values at a frequency of 3347 kHz, linear regression resulted in a R2 of 0.90 and a standard deviation of 0.4 % on average. Both normalization techniques had the same positive effect on the results of PLSR. The order of smoothing and normalization was irrelevant for both regression methods. Comparing the results of linear regression and PLSR, the latter obtained on average 9 % better results. Therefore, we concluded that PLSR is preferable over linear regression and is potentially suitable to model the VCD beyond the growth phase, which is suggested to be investigated based on more data sets."}],"oa":"1","publication_identifier":{"issn":["1935-4576"],"isbn":["978-1-6654-9314-7"],"eisbn":["978-1-6654-9313-0"]},"publication":"2023 IEEE 21st International Conference on Industrial Informatics (INDIN)","date_updated":"2025-04-29T07:38:03Z","publisher":"IEEE","language":[{"iso":"eng"}],"year":"2023","main_file_link":[{"url":"https://ieeexplore.ieee.org/document/10218012","open_access":"1"}],"keyword":["Spectroscopy","Smoothing methods","Systematics","Phase measurement","Linear regression","Data models","Dielectric measurement"],"publication_status":"published","author":[{"last_name":"Ramm","orcid":"https://orcid.org/0000-0002-0502-8032","id":"68713","full_name":"Ramm, Selina","first_name":"Selina"},{"first_name":"Tanja","id":"52466","full_name":"Hernández Rodriguez, Tanja","last_name":"Hernández Rodriguez"},{"last_name":"Frahm","full_name":"Frahm, Björn","id":"45666","first_name":"Björn"},{"full_name":"Pein-Hackelbusch, Miriam","orcid":"0000-0002-7920-0595","id":"64952","first_name":"Miriam","last_name":"Pein-Hackelbusch"}],"date_created":"2023-11-21T08:17:12Z"},{"language":[{"iso":"eng"}],"main_file_link":[{"open_access":"1"}],"year":2018,"keyword":["Maintenance engineering","Adaptation models","Machine learning","Data models","Standards","Software","Bayes methods"],"publication_status":"published","author":[{"last_name":"Lang","id":"68941","full_name":"Lang, Dorota","first_name":"Dorota"},{"last_name":"Wunderlich","full_name":"Wunderlich, Paul","id":"52317","first_name":"Paul"},{"full_name":"Heinz, Mario","id":"68913","first_name":"Mario","last_name":"Heinz"},{"last_name":"Wisniewski","id":"1710","full_name":"Wisniewski, Lukasz","first_name":"Lukasz"},{"full_name":"Jasperneite, Jürgen","id":"1899","first_name":"Jürgen","last_name":"Jasperneite"},{"first_name":"Oliver","full_name":"Niggemann, Oliver","id":"10876","last_name":"Niggemann"},{"last_name":"Röcker","first_name":"Carsten","full_name":"Röcker, Carsten","id":"61525"}],"date_created":"2021-01-08T08:26:30Z","abstract":[{"lang":"eng","text":"In ever changing world, the industrial systems become more and more complex. Machine feedback in the form of alarms and notifications, due to its growing volume, becomes overwhelming for the operator. In addition, expectations in relation to system availability are growing as well. Therefore, there exists strong need for new solutions guaranteeing fast troubleshooting of problems that arise during system operation. The approach proposed in this study uses advantages of the Asset Administration Shell, machine learning, and human-machine interaction in order to create the assistance system which holistically addresses the issue of troubleshooting complex industrial systems."}],"publication_identifier":{"eisbn":["978-1-5386-1066-4"]},"oa":"1","date_updated":"2023-03-15T13:49:52Z","publication":"14th IEEE International Workshop on Factory Communication Systems (WFCS)","publisher":"IEEE","user_id":"45673","place":"Piscataway, NJ","department":[{"_id":"DEP5023"},{"_id":"DEP5019"}],"status":"public","citation":{"bjps":"<b>Lang D <i>et al.</i></b> (2018) Assistance System to Support Troubleshooting of Complex Industrial Systems. <i>14th IEEE International Workshop on Factory Communication Systems (WFCS)</i>. Piscataway, NJ: IEEE.","chicago":"Lang, Dorota, Paul Wunderlich, Mario Heinz, Lukasz Wisniewski, Jürgen Jasperneite, Oliver Niggemann, and Carsten Röcker. “Assistance System to Support Troubleshooting of Complex Industrial Systems.” In <i>14th IEEE International Workshop on Factory Communication Systems (WFCS)</i>. Piscataway, NJ: IEEE, 2018. <a href=\"https://doi.org/10.1109/WFCS.2018.8402380\">https://doi.org/10.1109/WFCS.2018.8402380</a>.","chicago-de":"Lang, Dorota, Paul Wunderlich, Mario Heinz, Lukasz Wisniewski, Jürgen Jasperneite, Oliver Niggemann und Carsten Röcker. 2018. Assistance System to Support Troubleshooting of Complex Industrial Systems. In: <i>14th IEEE International Workshop on Factory Communication Systems (WFCS)</i>. Piscataway, NJ: IEEE. doi:<a href=\"https://doi.org/10.1109/WFCS.2018.8402380,\">10.1109/WFCS.2018.8402380,</a> .","van":"Lang D, Wunderlich P, Heinz M, Wisniewski L, Jasperneite J, Niggemann O, et al. Assistance System to Support Troubleshooting of Complex Industrial Systems. In: 14th IEEE International Workshop on Factory Communication Systems (WFCS). Piscataway, NJ: IEEE; 2018.","havard":"D. Lang, P. Wunderlich, M. Heinz, L. Wisniewski, J. Jasperneite, O. Niggemann, C. Röcker, Assistance System to Support Troubleshooting of Complex Industrial Systems, in: 14th IEEE International Workshop on Factory Communication Systems (WFCS), IEEE, Piscataway, NJ, 2018.","din1505-2-1":"<span style=\"font-variant:small-caps;\">Lang, Dorota</span> ; <span style=\"font-variant:small-caps;\">Wunderlich, Paul</span> ; <span style=\"font-variant:small-caps;\">Heinz, Mario</span> ; <span style=\"font-variant:small-caps;\">Wisniewski, Lukasz</span> ; <span style=\"font-variant:small-caps;\">Jasperneite, Jürgen</span> ; <span style=\"font-variant:small-caps;\">Niggemann, Oliver</span> ; <span style=\"font-variant:small-caps;\">Röcker, Carsten</span>: Assistance System to Support Troubleshooting of Complex Industrial Systems. In: <i>14th IEEE International Workshop on Factory Communication Systems (WFCS)</i>. Piscataway, NJ : IEEE, 2018","apa":"Lang, D., Wunderlich, P., Heinz, M., Wisniewski, L., Jasperneite, J., Niggemann, O., &#38; Röcker, C. (2018). Assistance System to Support Troubleshooting of Complex Industrial Systems. In <i>14th IEEE International Workshop on Factory Communication Systems (WFCS)</i>. Piscataway, NJ: IEEE. <a href=\"https://doi.org/10.1109/WFCS.2018.8402380\">https://doi.org/10.1109/WFCS.2018.8402380</a>","ieee":"D. Lang <i>et al.</i>, “Assistance System to Support Troubleshooting of Complex Industrial Systems,” in <i>14th IEEE International Workshop on Factory Communication Systems (WFCS)</i>, Imperia, Italy , 2018.","ama":"Lang D, Wunderlich P, Heinz M, et al. Assistance System to Support Troubleshooting of Complex Industrial Systems. In: <i>14th IEEE International Workshop on Factory Communication Systems (WFCS)</i>. Piscataway, NJ: IEEE; 2018. doi:<a href=\"https://doi.org/10.1109/WFCS.2018.8402380\">10.1109/WFCS.2018.8402380</a>","short":"D. Lang, P. Wunderlich, M. Heinz, L. Wisniewski, J. Jasperneite, O. Niggemann, C. Röcker, in: 14th IEEE International Workshop on Factory Communication Systems (WFCS), IEEE, Piscataway, NJ, 2018.","ufg":"<b>Lang, Dorota et. al. (2018)</b>: Assistance System to Support Troubleshooting of Complex Industrial Systems, in: <i>14th IEEE International Workshop on Factory Communication Systems (WFCS)</i>, Piscataway, NJ.","mla":"Lang, Dorota, et al. “Assistance System to Support Troubleshooting of Complex Industrial Systems.” <i>14th IEEE International Workshop on Factory Communication Systems (WFCS)</i>, IEEE, 2018, doi:<a href=\"https://doi.org/10.1109/WFCS.2018.8402380\">10.1109/WFCS.2018.8402380</a>."},"doi":"10.1109/WFCS.2018.8402380","title":"Assistance System to Support Troubleshooting of Complex Industrial Systems","conference":{"start_date":"2018-06-13","end_date":"2018-06-15","name":"14th IEEE International Workshop on Factory Communication Systems (WFCS)","location":"Imperia, Italy "},"type":"conference","_id":"4327"}]