---
_id: '10788'
abstract:
- lang: eng
  text: For process monitoring, an adequate data preprocessing is crucial to link
    accessible inline process data with offline measured target variables. Literature,
    however, does not provide systematic preprocessing strategies. The effects of
    five different preprocessing strategies on data from a Dielectric Spectroscopy
    system applied to the Viable Cell Density (VCD) of a mammalian cell cultivation
    were thus evaluated. Single-frequency measurements are typically used to model
    the VCD over the growth phase using linear regression or the Cole-Cole model and
    served as a reference. As multi-frequency measurement is promising to model the
    VCD beyond the growth phase using Partial Least Squares Regression (PLSR), we
    further aimed to determine, whether replacing linear regression by PLSR shows
    comparable modeling performance. All five preprocessing strategies led to comparable
    results. Exemplary, when using capacitance values at a frequency of 3347 kHz,
    linear regression resulted in a R2 of 0.90 and a standard deviation of 0.4 % on
    average. Both normalization techniques had the same positive effect on the results
    of PLSR. The order of smoothing and normalization was irrelevant for both regression
    methods. Comparing the results of linear regression and PLSR, the latter obtained
    on average 9 % better results. Therefore, we concluded that PLSR is preferable
    over linear regression and is potentially suitable to model the VCD beyond the
    growth phase, which is suggested to be investigated based on more data sets.
author:
- first_name: Selina
  full_name: Ramm, Selina
  id: '68713'
  last_name: Ramm
  orcid: https://orcid.org/0000-0002-0502-8032
- first_name: Tanja
  full_name: Hernández Rodriguez, Tanja
  id: '52466'
  last_name: Hernández Rodriguez
- first_name: Björn
  full_name: Frahm, Björn
  id: '45666'
  last_name: Frahm
- first_name: Miriam
  full_name: Pein-Hackelbusch, Miriam
  id: '64952'
  last_name: Pein-Hackelbusch
  orcid: 0000-0002-7920-0595
citation:
  ama: Ramm S, Hernández Rodriguez T, Frahm B, Pein-Hackelbusch M. <i>Systematic Preprocessing
    of Dielectric Spectroscopy Data and Estimating Viable Cell Densities</i>. (Jasperneite
    J, Wisniewski L, Fung Man K, Institute of Electrical and Electronics Engineers
    , eds.). IEEE; 2023:1-6. doi:<a href="https://doi.org/10.1109/INDIN51400.2023.10218012">10.1109/INDIN51400.2023.10218012</a>
  apa: Ramm, S., Hernández Rodriguez, T., Frahm, B., &#38; Pein-Hackelbusch, M. (2023).
    Systematic Preprocessing of Dielectric Spectroscopy Data and Estimating Viable
    Cell Densities. In J. Jasperneite, L. Wisniewski, K. Fung Man, &#38; Institute
    of Electrical and Electronics Engineers  (Eds.), <i>2023 IEEE 21st International
    Conference on Industrial Informatics (INDIN)</i> (pp. 1–6). IEEE. <a href="https://doi.org/10.1109/INDIN51400.2023.10218012">https://doi.org/10.1109/INDIN51400.2023.10218012</a>
  bjps: '<b>Ramm S <i>et al.</i></b> (2023) <i>Systematic Preprocessing of Dielectric
    Spectroscopy Data and Estimating Viable Cell Densities</i>, Jasperneite J et al.
    (eds). [Piscataway, NJ]: IEEE.'
  chicago: 'Ramm, Selina, Tanja Hernández Rodriguez, Björn Frahm, and Miriam Pein-Hackelbusch.
    <i>Systematic Preprocessing of Dielectric Spectroscopy Data and Estimating Viable
    Cell Densities</i>. Edited by Jürgen Jasperneite, Lukasz Wisniewski, Kim Fung
    Man, and Institute of Electrical and Electronics Engineers . <i>2023 IEEE 21st
    International Conference on Industrial Informatics (INDIN)</i>. [Piscataway, NJ]:
    IEEE, 2023. <a href="https://doi.org/10.1109/INDIN51400.2023.10218012">https://doi.org/10.1109/INDIN51400.2023.10218012</a>.'
  chicago-de: 'Ramm, Selina, Tanja Hernández Rodriguez, Björn Frahm und Miriam Pein-Hackelbusch.
    2023. <i>Systematic Preprocessing of Dielectric Spectroscopy Data and Estimating
    Viable Cell Densities</i>. Hg. von Jürgen Jasperneite, Lukasz Wisniewski, Kim
    Fung Man, und Institute of Electrical and Electronics Engineers . <i>2023 IEEE
    21st International Conference on Industrial Informatics (INDIN)</i>. [Piscataway,
    NJ]: IEEE. doi:<a href="https://doi.org/10.1109/INDIN51400.2023.10218012">10.1109/INDIN51400.2023.10218012</a>,
    .'
  din1505-2-1: '<span style="font-variant:small-caps;">Ramm, Selina</span> ; <span
    style="font-variant:small-caps;">Hernández Rodriguez, Tanja</span> ; <span style="font-variant:small-caps;">Frahm,
    Björn</span> ; <span style="font-variant:small-caps;">Pein-Hackelbusch, Miriam</span>
    ; <span style="font-variant:small-caps;">Jasperneite, J.</span> ; <span style="font-variant:small-caps;">Wisniewski,
    L.</span> ; <span style="font-variant:small-caps;">Fung Man, K.</span> ; <span
    style="font-variant:small-caps;">Institute of Electrical and Electronics Engineers
    </span> (Hrsg.): <i>Systematic Preprocessing of Dielectric Spectroscopy Data and
    Estimating Viable Cell Densities</i>. [Piscataway, NJ] : IEEE, 2023'
  havard: S. Ramm, T. Hernández Rodriguez, B. Frahm, M. Pein-Hackelbusch, Systematic
    Preprocessing of Dielectric Spectroscopy Data and Estimating Viable Cell Densities,
    IEEE, [Piscataway, NJ], 2023.
  ieee: 'S. Ramm, T. Hernández Rodriguez, B. Frahm, and M. Pein-Hackelbusch, <i>Systematic
    Preprocessing of Dielectric Spectroscopy Data and Estimating Viable Cell Densities</i>.
    [Piscataway, NJ]: IEEE, 2023, pp. 1–6. doi: <a href="https://doi.org/10.1109/INDIN51400.2023.10218012">10.1109/INDIN51400.2023.10218012</a>.'
  mla: Ramm, Selina, et al. “Systematic Preprocessing of Dielectric Spectroscopy Data
    and Estimating Viable Cell Densities.” <i>2023 IEEE 21st International Conference
    on Industrial Informatics (INDIN)</i>, edited by Jürgen Jasperneite et al., IEEE,
    2023, pp. 1–6, <a href="https://doi.org/10.1109/INDIN51400.2023.10218012">https://doi.org/10.1109/INDIN51400.2023.10218012</a>.
  short: S. Ramm, T. Hernández Rodriguez, B. Frahm, M. Pein-Hackelbusch, Systematic
    Preprocessing of Dielectric Spectroscopy Data and Estimating Viable Cell Densities,
    IEEE, [Piscataway, NJ], 2023.
  ufg: '<b>Ramm, Selina u. a.</b>: Systematic Preprocessing of Dielectric Spectroscopy
    Data and Estimating Viable Cell Densities, hg. von Jasperneite, Jürgen u. a.,
    [Piscataway, NJ] 2023.'
  van: 'Ramm S, Hernández Rodriguez T, Frahm B, Pein-Hackelbusch M. Systematic Preprocessing
    of Dielectric Spectroscopy Data and Estimating Viable Cell Densities. Jasperneite
    J, Wisniewski L, Fung Man K, Institute of Electrical and Electronics Engineers
    , editors. 2023 IEEE 21st International Conference on Industrial Informatics (INDIN).
    [Piscataway, NJ]: IEEE; 2023.'
conference:
  end_date: 2023-07-20
  location: Lemgo
  name: 21st International Conference on Industrial Informatics (INDIN)
  start_date: 2023-07-18
corporate_editor:
- 'Institute of Electrical and Electronics Engineers '
date_created: 2023-11-21T08:17:12Z
date_updated: 2025-04-29T07:38:03Z
department:
- _id: DEP4022
- _id: DEP4028
doi: 10.1109/INDIN51400.2023.10218012
editor:
- first_name: Jürgen
  full_name: Jasperneite, Jürgen
  id: '1899'
  last_name: Jasperneite
- first_name: Lukasz
  full_name: Wisniewski, Lukasz
  id: '1710'
  last_name: Wisniewski
- first_name: Kim
  full_name: Fung Man, Kim
  last_name: Fung Man
keyword:
- Spectroscopy
- Smoothing methods
- Systematics
- Phase measurement
- Linear regression
- Data models
- Dielectric measurement
language:
- iso: eng
main_file_link:
- open_access: '1'
  url: https://ieeexplore.ieee.org/document/10218012
oa: '1'
page: 1-6
place: '[Piscataway, NJ]'
publication: 2023 IEEE 21st International Conference on Industrial Informatics (INDIN)
publication_identifier:
  eisbn:
  - 978-1-6654-9313-0
  isbn:
  - 978-1-6654-9314-7
  issn:
  - 1935-4576
publication_status: published
publisher: IEEE
status: public
title: Systematic Preprocessing of Dielectric Spectroscopy Data and Estimating Viable
  Cell Densities
type: conference_editor_article
user_id: '83781'
year: '2023'
...
---
_id: '4327'
abstract:
- lang: eng
  text: In ever changing world, the industrial systems become more and more complex.
    Machine feedback in the form of alarms and notifications, due to its growing volume,
    becomes overwhelming for the operator. In addition, expectations in relation to
    system availability are growing as well. Therefore, there exists strong need for
    new solutions guaranteeing fast troubleshooting of problems that arise during
    system operation. The approach proposed in this study uses advantages of the Asset
    Administration Shell, machine learning, and human-machine interaction in order
    to create the assistance system which holistically addresses the issue of troubleshooting
    complex industrial systems.
author:
- first_name: Dorota
  full_name: Lang, Dorota
  id: '68941'
  last_name: Lang
- first_name: Paul
  full_name: Wunderlich, Paul
  id: '52317'
  last_name: Wunderlich
- first_name: Mario
  full_name: Heinz, Mario
  id: '68913'
  last_name: Heinz
- first_name: Lukasz
  full_name: Wisniewski, Lukasz
  id: '1710'
  last_name: Wisniewski
- first_name: Jürgen
  full_name: Jasperneite, Jürgen
  id: '1899'
  last_name: Jasperneite
- first_name: Oliver
  full_name: Niggemann, Oliver
  id: '10876'
  last_name: Niggemann
- first_name: Carsten
  full_name: Röcker, Carsten
  id: '61525'
  last_name: Röcker
citation:
  ama: 'Lang D, Wunderlich P, Heinz M, et al. Assistance System to Support Troubleshooting
    of Complex Industrial Systems. In: <i>14th IEEE International Workshop on Factory
    Communication Systems (WFCS)</i>. Piscataway, NJ: IEEE; 2018. doi:<a href="https://doi.org/10.1109/WFCS.2018.8402380">10.1109/WFCS.2018.8402380</a>'
  apa: 'Lang, D., Wunderlich, P., Heinz, M., Wisniewski, L., Jasperneite, J., Niggemann,
    O., &#38; Röcker, C. (2018). Assistance System to Support Troubleshooting of Complex
    Industrial Systems. In <i>14th IEEE International Workshop on Factory Communication
    Systems (WFCS)</i>. Piscataway, NJ: IEEE. <a href="https://doi.org/10.1109/WFCS.2018.8402380">https://doi.org/10.1109/WFCS.2018.8402380</a>'
  bjps: '<b>Lang D <i>et al.</i></b> (2018) Assistance System to Support Troubleshooting
    of Complex Industrial Systems. <i>14th IEEE International Workshop on Factory
    Communication Systems (WFCS)</i>. Piscataway, NJ: IEEE.'
  chicago: 'Lang, Dorota, Paul Wunderlich, Mario Heinz, Lukasz Wisniewski, Jürgen
    Jasperneite, Oliver Niggemann, and Carsten Röcker. “Assistance System to Support
    Troubleshooting of Complex Industrial Systems.” In <i>14th IEEE International
    Workshop on Factory Communication Systems (WFCS)</i>. Piscataway, NJ: IEEE, 2018.
    <a href="https://doi.org/10.1109/WFCS.2018.8402380">https://doi.org/10.1109/WFCS.2018.8402380</a>.'
  chicago-de: 'Lang, Dorota, Paul Wunderlich, Mario Heinz, Lukasz Wisniewski, Jürgen
    Jasperneite, Oliver Niggemann und Carsten Röcker. 2018. Assistance System to Support
    Troubleshooting of Complex Industrial Systems. In: <i>14th IEEE International
    Workshop on Factory Communication Systems (WFCS)</i>. Piscataway, NJ: IEEE. doi:<a
    href="https://doi.org/10.1109/WFCS.2018.8402380,">10.1109/WFCS.2018.8402380,</a>
    .'
  din1505-2-1: '<span style="font-variant:small-caps;">Lang, Dorota</span> ; <span
    style="font-variant:small-caps;">Wunderlich, Paul</span> ; <span style="font-variant:small-caps;">Heinz,
    Mario</span> ; <span style="font-variant:small-caps;">Wisniewski, Lukasz</span>
    ; <span style="font-variant:small-caps;">Jasperneite, Jürgen</span> ; <span style="font-variant:small-caps;">Niggemann,
    Oliver</span> ; <span style="font-variant:small-caps;">Röcker, Carsten</span>:
    Assistance System to Support Troubleshooting of Complex Industrial Systems. In:
    <i>14th IEEE International Workshop on Factory Communication Systems (WFCS)</i>.
    Piscataway, NJ : IEEE, 2018'
  havard: 'D. Lang, P. Wunderlich, M. Heinz, L. Wisniewski, J. Jasperneite, O. Niggemann,
    C. Röcker, Assistance System to Support Troubleshooting of Complex Industrial
    Systems, in: 14th IEEE International Workshop on Factory Communication Systems
    (WFCS), IEEE, Piscataway, NJ, 2018.'
  ieee: D. Lang <i>et al.</i>, “Assistance System to Support Troubleshooting of Complex
    Industrial Systems,” in <i>14th IEEE International Workshop on Factory Communication
    Systems (WFCS)</i>, Imperia, Italy , 2018.
  mla: Lang, Dorota, et al. “Assistance System to Support Troubleshooting of Complex
    Industrial Systems.” <i>14th IEEE International Workshop on Factory Communication
    Systems (WFCS)</i>, IEEE, 2018, doi:<a href="https://doi.org/10.1109/WFCS.2018.8402380">10.1109/WFCS.2018.8402380</a>.
  short: 'D. Lang, P. Wunderlich, M. Heinz, L. Wisniewski, J. Jasperneite, O. Niggemann,
    C. Röcker, in: 14th IEEE International Workshop on Factory Communication Systems
    (WFCS), IEEE, Piscataway, NJ, 2018.'
  ufg: '<b>Lang, Dorota et. al. (2018)</b>: Assistance System to Support Troubleshooting
    of Complex Industrial Systems, in: <i>14th IEEE International Workshop on Factory
    Communication Systems (WFCS)</i>, Piscataway, NJ.'
  van: 'Lang D, Wunderlich P, Heinz M, Wisniewski L, Jasperneite J, Niggemann O, et
    al. Assistance System to Support Troubleshooting of Complex Industrial Systems.
    In: 14th IEEE International Workshop on Factory Communication Systems (WFCS).
    Piscataway, NJ: IEEE; 2018.'
conference:
  end_date: 2018-06-15
  location: 'Imperia, Italy '
  name: 14th IEEE International Workshop on Factory Communication Systems (WFCS)
  start_date: 2018-06-13
date_created: 2021-01-08T08:26:30Z
date_updated: 2023-03-15T13:49:52Z
department:
- _id: DEP5023
- _id: DEP5019
doi: 10.1109/WFCS.2018.8402380
keyword:
- Maintenance engineering
- Adaptation models
- Machine learning
- Data models
- Standards
- Software
- Bayes methods
language:
- iso: eng
main_file_link:
- open_access: '1'
oa: '1'
place: Piscataway, NJ
publication: 14th IEEE International Workshop on Factory Communication Systems (WFCS)
publication_identifier:
  eisbn:
  - 978-1-5386-1066-4
publication_status: published
publisher: IEEE
status: public
title: Assistance System to Support Troubleshooting of Complex Industrial Systems
type: conference
user_id: '45673'
year: 2018
...