[{"_id":"13336","user_id":"83781","keyword":["Automotive Engineering","Computer Engineering and Networks","Electrical and Electronic Engineering","Marine Engineering","Mechanical Engineering","Civil Engineering"],"type":"book","date_updated":"2026-01-12T09:13:58Z","publication_identifier":{"isbn":["978-3-658-49183-3"],"eisbn":["978-3-658-49184-0"]},"place":"Wiesbaden","status":"public","page":"587","citation":{"bjps":"<b>Meier U and Stübbe O</b> (2026) <i>Elektrotechnik zum Selbststudium : Grundlagen und Vertiefung</i>, 2nd ed. Wiesbaden: Springer Vieweg.","ieee":"U. Meier and O. Stübbe, <i>Elektrotechnik zum Selbststudium : Grundlagen und Vertiefung</i>, 2nd ed. Wiesbaden: Springer Vieweg, 2026.","short":"U. Meier, O. Stübbe, Elektrotechnik zum Selbststudium : Grundlagen und Vertiefung, 2nd ed., Springer Vieweg, Wiesbaden, 2026.","mla":"Meier, Uwe, and Oliver Stübbe. <i>Elektrotechnik zum Selbststudium : Grundlagen und Vertiefung</i>. 2nd ed., Springer Vieweg, 2026.","van":"Meier U, Stübbe O. Elektrotechnik zum Selbststudium : Grundlagen und Vertiefung. 2nd ed. Wiesbaden: Springer Vieweg; 2026. 587 p.","apa":"Meier, U., &#38; Stübbe, O. (2026). <i>Elektrotechnik zum Selbststudium : Grundlagen und Vertiefung</i> (2nd ed.). Springer Vieweg.","din1505-2-1":"<span style=\"font-variant:small-caps;\">Meier, Uwe</span> ; <span style=\"font-variant:small-caps;\">Stübbe, Oliver</span>: <i>Elektrotechnik zum Selbststudium : Grundlagen und Vertiefung</i>. 2. Aufl. Wiesbaden : Springer Vieweg, 2026","havard":"U. Meier, O. Stübbe, Elektrotechnik zum Selbststudium : Grundlagen und Vertiefung, 2nd ed., Springer Vieweg, Wiesbaden, 2026.","ama":"Meier U, Stübbe O. <i>Elektrotechnik zum Selbststudium : Grundlagen und Vertiefung</i>. 2nd ed. Springer Vieweg; 2026.","ufg":"<b>Meier, Uwe/Stübbe, Oliver</b>: Elektrotechnik zum Selbststudium : Grundlagen und Vertiefung, Wiesbaden <sup>2</sup>2026.","chicago":"Meier, Uwe, and Oliver Stübbe. <i>Elektrotechnik zum Selbststudium : Grundlagen und Vertiefung</i>. 2nd ed. Wiesbaden: Springer Vieweg, 2026.","chicago-de":"Meier, Uwe und Oliver Stübbe. 2026. <i>Elektrotechnik zum Selbststudium : Grundlagen und Vertiefung</i>. 2. Aufl. Wiesbaden: Springer Vieweg."},"abstract":[{"lang":"eng","text":"Das Lehr- und Arbeitsbuch entspricht der Einführungsvorlesung der Elektrotechnik an Hochschulen und ist explizit für das Selbststudium konzipiert.\r\nVon den physikalischen Grundlagen, elektrotechnischen Grundbegriffen und elektromagnetischen Feldern bis hin zu Fourier-Reihen und transienten Vorgängen werden in 22 Kapiteln grundlegende und vertiefende Vorlesungsinhalte der Elektrotechnik wiedergegeben. Aufgaben, Lösungen und kleinere Zusammenfassungen am Ende jedes Kapitels unterstützen beim selbstständigen Lernen und Erarbeiten der Inhalte.\r\nDas Buch führt als Selbststudium leicht lesbar durch die Basis der Elektrotechnik. Das Lernen mit diesem Arbeitsbuch ist in einem Bachelor-Fernstudiengang Elektrotechnik erprobt."}],"publisher":"Springer Vieweg","date_created":"2026-01-10T12:44:38Z","title":"Elektrotechnik zum Selbststudium : Grundlagen und Vertiefung","author":[{"full_name":"Meier, Uwe","id":"1143","first_name":"Uwe","last_name":"Meier"},{"full_name":"Stübbe, Oliver","last_name":"Stübbe","id":"51864","first_name":"Oliver","orcid":"0000-0001-7293-6893"}],"edition":"2","year":"2026","publication_status":"published","language":[{"iso":"ger"}],"department":[{"_id":"DEP5000"},{"_id":"DEP5014"}]},{"doi":"10.1016/j.microrel.2023.115216","volume":150,"user_id":"83781","type":"scientific_journal_article","date_updated":"2025-06-26T07:51:25Z","has_accepted_license":"1","article_number":"115216","intvolume":"       150","date_created":"2024-04-18T08:55:38Z","publisher":"Elsevier ","abstract":[{"text":"Lifetime is an important feature defining the reliability of electrical connectors. In general practice, the lifetime tests required for reliability estimation are time and labor intensive. In our previous work, a data driven method using a statistical process, with an application of probability distributions such as standard normal distribution and generalized extreme value (GEV) distribution with negative skewness to predict degradation paths, was introduced for estimation of the lifetime and FIT rate with the help of electrical contact resistance data collected from short term tests. The proposed method proved its significance by showing the possibility of drastic reduction in the lifetime test duration required for reliability determination. In this work, a non-parametric distribution free method using percentiles of actual measured contact resistances is used for determining the lifetime as against the percentiles of probability distribution used in previous work, thereby simplifying the process further and leading to an even more precise estimation. The lifetimes calculated from parametric and non-parametric methods are compared to highlight the significance of distribution free method in reliability estimation.","lang":"eng"}],"author":[{"id":"74188","first_name":"Abhay Rammurti","last_name":"Shukla","full_name":"Shukla, Abhay Rammurti"},{"full_name":"Martin, Robert","last_name":"Martin","first_name":"Robert"},{"first_name":"Roman","id":"69156","last_name":"Probst","full_name":"Probst, Roman"},{"last_name":"Song","first_name":"Jian","id":"5297","full_name":"Song, Jian"}],"title":"Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests","department":[{"_id":"DEP6012"}],"language":[{"iso":"eng"}],"publication":"Microelectronics Reliability","year":"2023","keyword":["Electrical and Electronic Engineering","Surfaces","Coatings and Films","Safety","Risk","Reliability and Quality","Condensed Matter Physics","Atomic and Molecular Physics","and Optics","Electronic","Optical and Magnetic Materials"],"_id":"11348","publication_identifier":{"unknown":["1872-941X"],"issn":["0026-2714"]},"article_type":"original","citation":{"chicago-de":"Shukla, Abhay Rammurti, Robert Martin, Roman Probst und Jian Song. 2023. Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests. <i>Microelectronics Reliability</i> 150. doi:<a href=\"https://doi.org/10.1016/j.microrel.2023.115216\">10.1016/j.microrel.2023.115216</a>, .","chicago":"Shukla, Abhay Rammurti, Robert Martin, Roman Probst, and Jian Song. “Comparison of Different Statistical Methods for Prediction of Lifetime of Electrical Connectors with Short Term Tests.” <i>Microelectronics Reliability</i> 150 (2023). <a href=\"https://doi.org/10.1016/j.microrel.2023.115216\">https://doi.org/10.1016/j.microrel.2023.115216</a>.","ama":"Shukla AR, Martin R, Probst R, Song J. Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests. <i>Microelectronics Reliability</i>. 2023;150. doi:<a href=\"https://doi.org/10.1016/j.microrel.2023.115216\">10.1016/j.microrel.2023.115216</a>","ufg":"<b>Shukla, Abhay Rammurti u. a.</b>: Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests, in: <i>Microelectronics Reliability</i> 150 (2023).","havard":"A.R. Shukla, R. Martin, R. Probst, J. Song, Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests, Microelectronics Reliability. 150 (2023).","din1505-2-1":"<span style=\"font-variant:small-caps;\">Shukla, Abhay Rammurti</span> ; <span style=\"font-variant:small-caps;\">Martin, Robert</span> ; <span style=\"font-variant:small-caps;\">Probst, Roman</span> ; <span style=\"font-variant:small-caps;\">Song, Jian</span>: Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests. In: <i>Microelectronics Reliability</i> Bd. 150. Amsterdam, Elsevier  (2023)","van":"Shukla AR, Martin R, Probst R, Song J. Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests. Microelectronics Reliability. 2023;150.","apa":"Shukla, A. R., Martin, R., Probst, R., &#38; Song, J. (2023). Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests. <i>Microelectronics Reliability</i>, <i>150</i>, Article 115216. <a href=\"https://doi.org/10.1016/j.microrel.2023.115216\">https://doi.org/10.1016/j.microrel.2023.115216</a>","mla":"Shukla, Abhay Rammurti, et al. “Comparison of Different Statistical Methods for Prediction of Lifetime of Electrical Connectors with Short Term Tests.” <i>Microelectronics Reliability</i>, vol. 150, 115216, 2023, <a href=\"https://doi.org/10.1016/j.microrel.2023.115216\">https://doi.org/10.1016/j.microrel.2023.115216</a>.","short":"A.R. Shukla, R. Martin, R. Probst, J. Song, Microelectronics Reliability 150 (2023).","ieee":"A. R. Shukla, R. Martin, R. Probst, and J. Song, “Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests,” <i>Microelectronics Reliability</i>, vol. 150, Art. no. 115216, 2023, doi: <a href=\"https://doi.org/10.1016/j.microrel.2023.115216\">10.1016/j.microrel.2023.115216</a>.","bjps":"<b>Shukla AR <i>et al.</i></b> (2023) Comparison of Different Statistical Methods for Prediction of Lifetime of Electrical Connectors with Short Term Tests. <i>Microelectronics Reliability</i> <b>150</b>."},"place":"Amsterdam","status":"public","external_id":{"isi":["001106942700001"]},"isi":"1","publication_status":"published"}]