--- _id: '12761' abstract: - lang: eng text: For modern machines, factories and electric and autonomous vehicles, the importance of vreliable electrical connectors cannot be overstated. With an increasing number of connectors being used in machines, factories and vehicles, ensuring their reliability is crucial for comfort and safety alike. One of the key indicators of reliability is the lifetime of connectors. To evaluate the lifetime of electrical connectors, a testing method and a model for calculating their lifetime based on the test data were developed. The results from these tests were compared to failure analysis data from long-term field operations. The findings indicate that the laboratory tests can accurately reproduce the main failures observed in the field. However, such lifetime tests can be time- and labor-intensive. To address this challenge, a data-driven method is proposed that predicts the lifetime of electrical connectors using statistical analysis of electrical contact resistance data collected from short-term tests. The predictions from this method were compared to actual results obtained from long-term tests. A strong correlation was observed between the contact resistance development in short-term tests and the number of failures in later stages of testing. Thus, apart from predicting the lifetime of connectors, this method can also be applied for failure prognosis in real-time operations. author: - first_name: Jian full_name: Song, Jian id: '5297' last_name: Song - first_name: Abhay Rammurti full_name: Shukla, Abhay Rammurti id: '74188' last_name: Shukla - first_name: Roman full_name: Probst, Roman id: '69156' last_name: Probst citation: ama: Song J, Shukla AR, Probst R. The State of Health of Electrical Connectors. Machines. 2024;7(12):474. doi:https://doi.org/10.3390/machines12070474 apa: Song, J., Shukla, A. R., & Probst, R. (2024). The State of Health of Electrical Connectors. Machines, 7(12), 474. https://doi.org/10.3390/machines12070474 bjps: Song J, Shukla AR and Probst R (2024) The State of Health of Electrical Connectors. Machines 7, 474. chicago: 'Song, Jian, Abhay Rammurti Shukla, and Roman Probst. “The State of Health of Electrical Connectors.” Machines 7, no. 12 (2024): 474. https://doi.org/10.3390/machines12070474.' chicago-de: 'Song, Jian, Abhay Rammurti Shukla und Roman Probst. 2024. The State of Health of Electrical Connectors. Machines 7, Nr. 12: 474. doi:https://doi.org/10.3390/machines12070474, .' din1505-2-1: 'Song, Jian ; Shukla, Abhay Rammurti ; Probst, Roman: The State of Health of Electrical Connectors. In: Machines Bd. 7. Basel, MDPI (2024), Nr. 12, S. 474' havard: J. Song, A.R. Shukla, R. Probst, The State of Health of Electrical Connectors, Machines. 7 (2024) 474. ieee: 'J. Song, A. R. Shukla, and R. Probst, “The State of Health of Electrical Connectors,” Machines, vol. 7, no. 12, p. 474, 2024, doi: https://doi.org/10.3390/machines12070474.' mla: Song, Jian, et al. “The State of Health of Electrical Connectors.” Machines, vol. 7, no. 12, 2024, p. 474, https://doi.org/10.3390/machines12070474. short: J. Song, A.R. Shukla, R. Probst, Machines 7 (2024) 474. ufg: 'Song, Jian/Shukla, Abhay Rammurti/Probst, Roman: The State of Health of Electrical Connectors, in: Machines 7 (2024), H. 12,  S. 474.' van: Song J, Shukla AR, Probst R. The State of Health of Electrical Connectors. Machines. 2024;7(12):474. date_created: 2025-04-04T09:23:10Z date_updated: 2025-06-25T13:03:28Z department: - _id: DEP6012 doi: https://doi.org/10.3390/machines12070474 external_id: isi: - '001277040200001' intvolume: ' 7' isi: '1' issue: '12' keyword: - electrical connectors - accelerated life testing - statistical model - lifetime prognosis - reliability - state of health language: - iso: eng page: '474' place: Basel publication: Machines publication_identifier: eissn: - '2075-1702 ' publication_status: published publisher: MDPI quality_controlled: '1' status: public title: The State of Health of Electrical Connectors type: scientific_journal_article user_id: '83781' volume: 7 year: '2024' ... --- _id: '9206' abstract: - lang: eng text: Failure in time (FIT) is an important measure for the reliability of electrical connectors. Due to the very long lifetime of connectors, the tests for the determination of FIT rate are time and labour intensive. In this paper a data driven method using a statistical process to estimate the FIT rate of electrical connectors with data of electrical contact resistance development in short term tests is proposed. The results of prediction are then compared with the results from long term tests. The study shows a strong correlation between contact resistance development in short term tests and the development of the number of failures in later stages of tests. In order to predict the development of degradation precisely, the distribution of resistance data in many different tests with different connectors is investigated. The Generalized Extreme Value Distribution, which reveals an ideal fitting, has been implemented for the prediction of the failure rates of connectors, thereby enabling a remarkable time-lapse of lifetime tests. This method can also be employed in the prognosis and management of system health through the forecast of health of connectors in different systems in operation. article_number: '114684' author: - first_name: Jian full_name: Song, Jian id: '5297' last_name: Song - first_name: Abhay Rammurti full_name: Shukla, Abhay Rammurti id: '72757' last_name: Shukla - first_name: Roman full_name: Probst, Roman id: '69156' last_name: Probst citation: ama: 'Song J, Shukla AR, Probst R. Prediction of failure in time (FIT) of electrical connectors with short term tests. Microelectronics reliability : an internat journal & world abstracting service. 2022;138(November 2022). doi:10.1016/j.microrel.2022.114684' apa: 'Song, J., Shukla, A. R., & Probst, R. (2022). Prediction of failure in time (FIT) of electrical connectors with short term tests. Microelectronics Reliability : An Internat. Journal & World Abstracting Service, 138(November 2022), Article 114684. https://doi.org/10.1016/j.microrel.2022.114684' bjps: 'Song J, Shukla AR and Probst R (2022) Prediction of Failure in Time (FIT) of Electrical Connectors with Short Term Tests. Microelectronics reliability : an internat. journal & world abstracting service 138.' chicago: 'Song, Jian, Abhay Rammurti Shukla, and Roman Probst. “Prediction of Failure in Time (FIT) of Electrical Connectors with Short Term Tests.” Microelectronics Reliability : An Internat. Journal & World Abstracting Service 138, no. November 2022 (2022). https://doi.org/10.1016/j.microrel.2022.114684.' chicago-de: 'Song, Jian, Abhay Rammurti Shukla und Roman Probst. 2022. Prediction of failure in time (FIT) of electrical connectors with short term tests. Microelectronics reliability : an internat. journal & world abstracting service 138, Nr. November 2022. doi:10.1016/j.microrel.2022.114684, .' din1505-2-1: 'Song, Jian ; Shukla, Abhay Rammurti ; Probst, Roman: Prediction of failure in time (FIT) of electrical connectors with short term tests. In: Microelectronics reliability : an internat. journal & world abstracting service Bd. 138. Amsterdam, Elsevier (2022), Nr. November 2022' havard: 'J. Song, A.R. Shukla, R. Probst, Prediction of failure in time (FIT) of electrical connectors with short term tests, Microelectronics Reliability : An Internat. Journal & World Abstracting Service. 138 (2022).' ieee: 'J. Song, A. R. Shukla, and R. Probst, “Prediction of failure in time (FIT) of electrical connectors with short term tests,” Microelectronics reliability : an internat. journal & world abstracting service, vol. 138, no. November 2022, Art. no. 114684, 2022, doi: 10.1016/j.microrel.2022.114684.' mla: 'Song, Jian, et al. “Prediction of Failure in Time (FIT) of Electrical Connectors with Short Term Tests.” Microelectronics Reliability : An Internat. Journal & World Abstracting Service, vol. 138, no. November 2022, 114684, 2022, https://doi.org/10.1016/j.microrel.2022.114684.' short: 'J. Song, A.R. Shukla, R. Probst, Microelectronics Reliability : An Internat. Journal & World Abstracting Service 138 (2022).' ufg: 'Song, Jian/Shukla, Abhay Rammurti/Probst, Roman: Prediction of failure in time (FIT) of electrical connectors with short term tests, in: Microelectronics reliability : an internat. journal & world abstracting service 138 (2022), H. November 2022.' van: 'Song J, Shukla AR, Probst R. Prediction of failure in time (FIT) of electrical connectors with short term tests. Microelectronics reliability : an internat journal & world abstracting service. 2022;138(November 2022).' date_created: 2022-12-11T13:13:46Z date_updated: 2024-08-05T07:30:51Z department: - _id: DEP6012 doi: 10.1016/j.microrel.2022.114684 intvolume: ' 138' issue: November 2022 keyword: - Electrical connectors - Prediction of lifetime - FIT - Correlation between data in short and long term tests - Time-lapse of lifetime tests language: - iso: eng place: Amsterdam publication: 'Microelectronics reliability : an internat. journal & world abstracting service' publication_identifier: issn: - 0026-2714 publication_status: published publisher: Elsevier status: public title: Prediction of failure in time (FIT) of electrical connectors with short term tests type: scientific_journal_article user_id: '83781' volume: 138 year: '2022' ... --- _id: '9207' abstract: - lang: eng text: A new acceleration model for the reliability prediction of electrical connectors has recently been published. This model enables the evaluation of failure rates gained in highly accelerated life tests (HALT) and considers thermal and vibrational loading. However, since the initial study only covered a small set of test parameters, further study of the model is required. Previous studies have sufficiently investigated the influence of the vibration test mode on the failure rate of electrical connectors. Therefore, this study now focuses on the influence of the thermal cycling test. A commonly used automotive connector is chosen and subjected to stresses in HALT covering various upper temperatures, test durations and thermal cycling frequencies. Additionally, the principles of determining the coefficient of temperature difference and the coefficient of the thermal cycling frequency are presented, since these coefficients are connector specific and required for the acceleration model. Based on the numbers of failures in test, the influence of the various thermal cycling tests is discussed, and the coefficients are calculated for the chosen connector. In conclusion a guideline to select an appropriate upper temperature and test duration in order to compare the reliability of different electrical connectors is provided. article_number: '114633' author: - first_name: Kevin full_name: Krüger, Kevin id: '76831' last_name: Krüger - first_name: Jian full_name: Song, Jian id: '5297' last_name: Song citation: ama: 'Krüger K, Song J. The influence of thermal cycling test parameters on the failure rate of electrical connectors. Microelectronics reliability : an internat journal & world abstracting service. 2022;138(November 2022). doi:https://doi.org/10.1016/j.microrel.2022.114633' apa: 'Krüger, K., & Song, J. (2022). The influence of thermal cycling test parameters on the failure rate of electrical connectors. Microelectronics Reliability : An Internat. Journal & World Abstracting Service, 138(November 2022), Article 114633. https://doi.org/10.1016/j.microrel.2022.114633' bjps: 'Krüger K and Song J (2022) The Influence of Thermal Cycling Test Parameters on the Failure Rate of Electrical Connectors. Microelectronics reliability : an internat. journal & world abstracting service 138.' chicago: 'Krüger, Kevin, and Jian Song. “The Influence of Thermal Cycling Test Parameters on the Failure Rate of Electrical Connectors.” Microelectronics Reliability : An Internat. Journal & World Abstracting Service 138, no. November 2022 (2022). https://doi.org/10.1016/j.microrel.2022.114633.' chicago-de: 'Krüger, Kevin und Jian Song. 2022. The influence of thermal cycling test parameters on the failure rate of electrical connectors. Microelectronics reliability : an internat. journal & world abstracting service 138, Nr. November 2022. doi:https://doi.org/10.1016/j.microrel.2022.114633, .' din1505-2-1: 'Krüger, Kevin ; Song, Jian: The influence of thermal cycling test parameters on the failure rate of electrical connectors. In: Microelectronics reliability : an internat. journal & world abstracting service Bd. 138. Amsterdam, Elsevier (2022), Nr. November 2022' havard: 'K. Krüger, J. Song, The influence of thermal cycling test parameters on the failure rate of electrical connectors, Microelectronics Reliability : An Internat. Journal & World Abstracting Service. 138 (2022).' ieee: 'K. Krüger and J. Song, “The influence of thermal cycling test parameters on the failure rate of electrical connectors,” Microelectronics reliability : an internat. journal & world abstracting service, vol. 138, no. November 2022, Art. no. 114633, 2022, doi: https://doi.org/10.1016/j.microrel.2022.114633.' mla: 'Krüger, Kevin, and Jian Song. “The Influence of Thermal Cycling Test Parameters on the Failure Rate of Electrical Connectors.” Microelectronics Reliability : An Internat. Journal & World Abstracting Service, vol. 138, no. November 2022, 114633, 2022, https://doi.org/10.1016/j.microrel.2022.114633.' short: 'K. Krüger, J. Song, Microelectronics Reliability : An Internat. Journal & World Abstracting Service 138 (2022).' ufg: 'Krüger, Kevin/Song, Jian: The influence of thermal cycling test parameters on the failure rate of electrical connectors, in: Microelectronics reliability : an internat. journal & world abstracting service 138 (2022), H. November 2022.' van: 'Krüger K, Song J. The influence of thermal cycling test parameters on the failure rate of electrical connectors. Microelectronics reliability : an internat journal & world abstracting service. 2022;138(November 2022).' date_created: 2022-12-11T13:17:29Z date_updated: 2024-08-05T07:33:56Z department: - _id: DEP6012 doi: https://doi.org/10.1016/j.microrel.2022.114633 intvolume: ' 138' issue: November 2022 keyword: - Electrical connectors - Life test - Thermal cycling - Upper temperature Duration - Temperature difference - Cycling frequency language: - iso: eng place: Amsterdam publication: 'Microelectronics reliability : an internat. journal & world abstracting service' publication_identifier: issn: - 0026-2714 publication_status: published publisher: Elsevier status: public title: The influence of thermal cycling test parameters on the failure rate of electrical connectors type: scientific_journal_article user_id: '83781' volume: 138 year: '2022' ...