@misc{12995,
  abstract     = {{Due to Industry 4.0 developments, the demanded modularity of manufacturing systems generates additional manual efforts for security experts to guarantee a secure operation. The rising utilization of information and the frequent changes of system structures necessitate a continuous and automated security engineering, especially by application of the mandatory security risk assessments. Collecting the required information for these assessments and formalising expert knowledge shall improve the security of modular manufacturing systems in the future. In order to automate the security risk assessment process, this work proposes a method to determine the Target Security Level (SL-T) in conformance to the IEC 62443 standard based on the MITRE ATT&CK framework and the Intel Threat Agent Library (TAL).}},
  author       = {{Ehrlich, Marco and Bröring, Andre and Diedrich, Christian and Jasperneite, Jürgen and Kastner, Wolfgang and Trsek, Henning}},
  booktitle    = {{2023 IEEE 21st International Conference on Industrial Informatics : INDIN 2023 : 17-20 July 2023, Lemgo, Germany}},
  editor       = {{Jasperneite, Jürgen}},
  isbn         = {{978-1-6654-9314-7}},
  keywords     = {{Integrated circuits, Industries, Libraries, Security, Risk management, IEC Standards, Interviews}},
  location     = {{Lemgo}},
  publisher    = {{IEEE}},
  title        = {{{Determining the Target Security Level for Automated Security Risk Assessments}}},
  doi          = {{10.1109/indin51400.2023.10217902}},
  year         = {{2023}},
}

@misc{8436,
  abstract     = {{Today DC offers far-reaching advantages over AC. Therefore, many devices have been equipped with an internal DC link for years. In the field of energy supply, the use of DC technology is also growing and is state of the art e.g. in offshore, high-voltage, automotive and data center applications. The spread of industrial open DC grids is currently starting and is completely different due to the requirements: The DC grid itself and energy flows in an industrial environment are highly dynamic and bidirectional. Due to the low impedance electrical connection of the DC links of many devices, stored energies in fault cases as well as ripple currents during operation place particular requirements on the devices.}},
  author       = {{Puls, Simon and Koch, Jan-Niklas and Ehlich, Martin and Borcherding, Holger}},
  booktitle    = {{EPE Proceeding 2022}},
  isbn         = {{978-9-0758-1539-9}},
  issn         = {{2325-0313}},
  keywords     = {{Industries, Semiconductor device measurement, Capacitors, Europe, High-voltage techniques, Inverters, Circuit faults}},
  location     = {{Hannover}},
  publisher    = {{IEEE}},
  title        = {{{Particular Requirements on Drive Inverters for Safe and Robust Operation on an Open Industrial DC Grid}}},
  year         = {{2022}},
}

@inproceedings{10668,
  abstract     = {{Digitalization has a significant impact on our working life and it allows whole industries to rethink their value chains. This paper examines how digitalization relates to complexity in work systems with respect to relevant organizational fields of work organization. 23 semi-structured interviews with experts from science and economy were conducted and analyzed. Key findings are that digitalization has far-reaching, interrelated implications for all organizational fields. Moreover, digitalization-related aspects were identified which have the potential to increase complexity in work systems.}},
  author       = {{Latos, Benedikt and Harlacher, Markus and Przybysz, Philipp M. and Mutze-Niewohner, Susanne}},
  booktitle    = {{2017 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM)}},
  issn         = {{2157-362X}},
  keywords     = {{Complexity theory, Interviews, Organizations, Industries, Task analysis, Acceleration}},
  location     = {{Singapore}},
  publisher    = {{IEEE}},
  title        = {{{Transformation of working environments through digitalization: Exploration and systematization of complexity drivers}}},
  doi          = {{10.1109/ieem.2017.8290059}},
  year         = {{2018}},
}