[{"editor":[{"full_name":"Dörksen, Helene","id":"46416","last_name":"Dörksen","first_name":"Helene"},{"full_name":"Scanzio, Stefano","last_name":"Scanzio","first_name":"Stefano"},{"id":"1899","last_name":"Jasperneite","first_name":"Jürgen","full_name":"Jasperneite, Jürgen"},{"full_name":"Wisniewski, Lukasz","first_name":"Lukasz","id":"1710","last_name":"Wisniewski"},{"last_name":"Man","first_name":"Kim Fung","full_name":"Man, Kim Fung"},{"full_name":"Sauter, Thilo","last_name":"Sauter","first_name":"Thilo"},{"last_name":"Seno","first_name":"Lucia","full_name":"Seno, Lucia"},{"orcid":"0000-0002-0133-0656","full_name":"Trsek, Henning","first_name":"Henning","id":"1486","last_name":"Trsek"},{"first_name":"Valeriy","last_name":"Vyatkin","full_name":"Vyatkin, Valeriy"}],"publication_identifier":{"isbn":["978-1-6654-9313-0"]},"status":"public","doi":"10.1109/indin51400.2023.10218318","citation":{"ieee":"N. H. Fliedner, V. Lohweg, C. Al-Karawi, and M. Pein-Hackelbusch, <i>A Novel Spectroscopic Approach for Vaseline Quality Discrimination</i>. [Piscataway, NJ]: IEEE, 2023. doi: <a href=\"https://doi.org/10.1109/indin51400.2023.10218318\">10.1109/indin51400.2023.10218318</a>.","mla":"Fliedner, Niels Hendrik, et al. “A Novel Spectroscopic Approach for Vaseline Quality Discrimination.” <i>2023 IEEE 21st International Conference on Industrial Informatics (INDIN 2023)</i>, edited by Helene Dörksen et al., IEEE, 2023, <a href=\"https://doi.org/10.1109/indin51400.2023.10218318\">https://doi.org/10.1109/indin51400.2023.10218318</a>.","ama":"Fliedner NH, Lohweg V, Al-Karawi C, Pein-Hackelbusch M. <i>A Novel Spectroscopic Approach for Vaseline Quality Discrimination</i>. (Dörksen H, Scanzio S, Jasperneite J, et al., eds.). IEEE; 2023. doi:<a href=\"https://doi.org/10.1109/indin51400.2023.10218318\">10.1109/indin51400.2023.10218318</a>","bjps":"<b>Fliedner NH <i>et al.</i></b> (2023) <i>A Novel Spectroscopic Approach for Vaseline Quality Discrimination</i>, Dörksen H et al. (eds). [Piscataway, NJ]: IEEE.","din1505-2-1":"<span style=\"font-variant:small-caps;\">Fliedner, Niels Hendrik</span> ; <span style=\"font-variant:small-caps;\">Lohweg, Volker</span> ; <span style=\"font-variant:small-caps;\">Al-Karawi, Claudia</span> ; <span style=\"font-variant:small-caps;\">Pein-Hackelbusch, Miriam</span> ; <span style=\"font-variant:small-caps;\"><span style=\"font-variant:small-caps;\">Dörksen, H.</span> ; <span style=\"font-variant:small-caps;\">Scanzio, S.</span> ; <span style=\"font-variant:small-caps;\">Jasperneite, J.</span> ; <span style=\"font-variant:small-caps;\">Wisniewski, L.</span> ; <span style=\"font-variant:small-caps;\">Man, K. F.</span> ; <span style=\"font-variant:small-caps;\">Sauter, T.</span> ; <span style=\"font-variant:small-caps;\">Seno, L.</span> ; <span style=\"font-variant:small-caps;\">Trsek, H.</span> ; u. a.</span> (Hrsg.): <i>A Novel Spectroscopic Approach for Vaseline Quality Discrimination</i>. [Piscataway, NJ] : IEEE, 2023","short":"N.H. Fliedner, V. Lohweg, C. Al-Karawi, M. Pein-Hackelbusch, A Novel Spectroscopic Approach for Vaseline Quality Discrimination, IEEE, [Piscataway, NJ], 2023.","van":"Fliedner NH, Lohweg V, Al-Karawi C, Pein-Hackelbusch M. A Novel Spectroscopic Approach for Vaseline Quality Discrimination. Dörksen H, Scanzio S, Jasperneite J, Wisniewski L, Man KF, Sauter T, et al., editors. 2023 IEEE 21st International Conference on Industrial Informatics (INDIN 2023). [Piscataway, NJ]: IEEE; 2023.","chicago":"Fliedner, Niels Hendrik, Volker Lohweg, Claudia Al-Karawi, and Miriam Pein-Hackelbusch. <i>A Novel Spectroscopic Approach for Vaseline Quality Discrimination</i>. Edited by Helene Dörksen, Stefano Scanzio, Jürgen Jasperneite, Lukasz Wisniewski, Kim Fung Man, Thilo Sauter, Lucia Seno, Henning Trsek, Valeriy Vyatkin, and Institute of Electrical and Electronics Engineers . <i>2023 IEEE 21st International Conference on Industrial Informatics (INDIN 2023)</i>. [Piscataway, NJ]: IEEE, 2023. <a href=\"https://doi.org/10.1109/indin51400.2023.10218318\">https://doi.org/10.1109/indin51400.2023.10218318</a>.","havard":"N.H. Fliedner, V. Lohweg, C. Al-Karawi, M. Pein-Hackelbusch, A Novel Spectroscopic Approach for Vaseline Quality Discrimination, IEEE, [Piscataway, NJ], 2023.","ufg":"<b>Fliedner, Niels Hendrik u. a.</b>: A Novel Spectroscopic Approach for Vaseline Quality Discrimination, hg. von Dörksen, Helene u. a., [Piscataway, NJ] 2023.","apa":"Fliedner, N. H., Lohweg, V., Al-Karawi, C., &#38; Pein-Hackelbusch, M. (2023). A Novel Spectroscopic Approach for Vaseline Quality Discrimination. In H. Dörksen, S. Scanzio, J. Jasperneite, L. Wisniewski, K. F. Man, T. Sauter, L. Seno, H. Trsek, V. Vyatkin, &#38; Institute of Electrical and Electronics Engineers  (Eds.), <i>2023 IEEE 21st International Conference on Industrial Informatics (INDIN 2023)</i>. IEEE. <a href=\"https://doi.org/10.1109/indin51400.2023.10218318\">https://doi.org/10.1109/indin51400.2023.10218318</a>","chicago-de":"Fliedner, Niels Hendrik, Volker Lohweg, Claudia Al-Karawi und Miriam Pein-Hackelbusch. 2023. <i>A Novel Spectroscopic Approach for Vaseline Quality Discrimination</i>. Hg. von Helene Dörksen, Stefano Scanzio, Jürgen Jasperneite, Lukasz Wisniewski, Kim Fung Man, Thilo Sauter, Lucia Seno, Henning Trsek, Valeriy Vyatkin, und Institute of Electrical and Electronics Engineers . <i>2023 IEEE 21st International Conference on Industrial Informatics (INDIN 2023)</i>. [Piscataway, NJ]: IEEE. doi:<a href=\"https://doi.org/10.1109/indin51400.2023.10218318\">10.1109/indin51400.2023.10218318</a>, ."},"language":[{"iso":"eng"}],"title":"A Novel Spectroscopic Approach for Vaseline Quality Discrimination","author":[{"full_name":"Fliedner, Niels Hendrik","orcid":"0000-0003-0484-1328","id":"58709","last_name":"Fliedner","first_name":"Niels Hendrik"},{"orcid":"0000-0002-3325-7887","full_name":"Lohweg, Volker","first_name":"Volker","id":"1804","last_name":"Lohweg"},{"full_name":"Al-Karawi, Claudia","first_name":"Claudia","last_name":"Al-Karawi"},{"orcid":"0000-0002-7920-0595","full_name":"Pein-Hackelbusch, Miriam","first_name":"Miriam","id":"64952","last_name":"Pein-Hackelbusch"}],"date_updated":"2026-06-29T08:24:26Z","publication_status":"published","user_id":"83781","corporate_editor":["Institute of Electrical and Electronics Engineers "],"publication":"2023 IEEE 21st International Conference on Industrial Informatics (INDIN 2023)","place":"[Piscataway, NJ]","department":[{"_id":"DEP5011"},{"_id":"DEP5023"}],"type":"conference_editor_article","_id":"13828","date_created":"2026-06-28T17:08:41Z","keyword":["Reflectivity","Industries","Wounds","Hydrocarbons","Behavioral sciences","Thermal analysis","Sensors"],"conference":{"end_date":"2023-07-20","location":"Lemgo","name":"21st International Conference on Industrial Informatics (INDIN 2023)","start_date":"2023-07-18"},"year":"2023","abstract":[{"lang":"eng","text":"Vaseline, also referred to as petrolatum, is a colloidal dispersion of liquid-crystalline structures of hydrocarbons derived from petroleum. It has long been recognized for its versatile applications in the pharmaceutical industry, with its use in the formulation of various topical medications, wound care products, and drug delivery systems. For pharmaceutical use, petrolatum has to meet the quality standards described in its Pharmacopoeia monograph. The comprised test ranges allow for a broad range of Vaseline qualities on the market, while the tests themselves only poorly discriminate between grades. The only differentiating properties are related to the melting behavior, which is tested via drop point analysis, and the consistency, addressed in the functionality-related characteristics section. In this study, we propose the hypothesis that Near-infrared spectroscopy (NIRS) could be a comparably simple method to evaluate the crystalline behavior of Vaseline qualities. We expect such information to provide additional details for Vaseline quality discrimination. This discrimination would allow the most suitable petroleum jelly to be selected for an existing formulation when the previous one needs to be replaced; for example, due to a manufacturer change. We demonstrate that NIRS in transmission and reflectance mode obtained by traditional continuous spectra acquisition and fragmented NIR spectra acquisition through multi-optical, multi-modal excitation, respectively, can both serve as a basis for detecting Vaseline quality differences, which we have further proven by thermal analysis and tests with semisolid formulations. Additionally, we demonstrate that a lower-cost multi-optical spectrometer in reflectance mode can detect Vaseline quality differences in rotated samples."}],"publisher":"IEEE"},{"department":[{"_id":"DEP5023"}],"type":"conference_editor_article","place":"[Piscataway, NJ]","date_created":"2025-06-18T13:30:31Z","_id":"12995","keyword":["Integrated circuits","Industries","Libraries","Security","Risk management","IEC Standards","Interviews"],"publisher":"IEEE","year":"2023","abstract":[{"lang":"eng","text":"Due to Industry 4.0 developments, the demanded modularity of manufacturing systems generates additional manual efforts for security experts to guarantee a secure operation. The rising utilization of information and the frequent changes of system structures necessitate a continuous and automated security engineering, especially by application of the mandatory security risk assessments. Collecting the required information for these assessments and formalising expert knowledge shall improve the security of modular manufacturing systems in the future. In order to automate the security risk assessment process, this work proposes a method to determine the Target Security Level (SL-T) in conformance to the IEC 62443 standard based on the MITRE ATT&CK framework and the Intel Threat Agent Library (TAL)."}],"conference":{"end_date":"2023-07-20","name":"21st International Conference on Industrial Informatics (INDIN)","location":"Lemgo","start_date":"2023-07-18"},"doi":"10.1109/indin51400.2023.10217902","status":"public","publication_identifier":{"isbn":["978-1-6654-9314-7"],"eisbn":["978-1-6654-9313-0"]},"editor":[{"first_name":"Jürgen","last_name":"Jasperneite","id":"1899","full_name":"Jasperneite, Jürgen"}],"citation":{"ieee":"M. Ehrlich, A. Bröring, C. Diedrich, J. Jasperneite, W. Kastner, and H. Trsek, <i>Determining the Target Security Level for Automated Security Risk Assessments</i>. [Piscataway, NJ]: IEEE, 2023. doi: <a href=\"https://doi.org/10.1109/indin51400.2023.10217902\">10.1109/indin51400.2023.10217902</a>.","mla":"Ehrlich, Marco, et al. “Determining the Target Security Level for Automated Security Risk Assessments.” <i>2023 IEEE 21st International Conference on Industrial Informatics : INDIN 2023 : 17-20 July 2023, Lemgo, Germany</i>, edited by Jürgen Jasperneite and Institute of Electrical and Electronics Engineers, IEEE, 2023, <a href=\"https://doi.org/10.1109/indin51400.2023.10217902\">https://doi.org/10.1109/indin51400.2023.10217902</a>.","bjps":"<b>Ehrlich M <i>et al.</i></b> (2023) <i>Determining the Target Security Level for Automated Security Risk Assessments</i>, Jasperneite J and Institute of Electrical and Electronics Engineers (eds). [Piscataway, NJ]: IEEE.","ama":"Ehrlich M, Bröring A, Diedrich C, Jasperneite J, Kastner W, Trsek H. <i>Determining the Target Security Level for Automated Security Risk Assessments</i>. (Jasperneite J, Institute of Electrical and Electronics Engineers, eds.). IEEE; 2023. doi:<a href=\"https://doi.org/10.1109/indin51400.2023.10217902\">10.1109/indin51400.2023.10217902</a>","chicago":"Ehrlich, Marco, Andre Bröring, Christian Diedrich, Jürgen Jasperneite, Wolfgang Kastner, and Henning Trsek. <i>Determining the Target Security Level for Automated Security Risk Assessments</i>. Edited by Jürgen Jasperneite and Institute of Electrical and Electronics Engineers. <i>2023 IEEE 21st International Conference on Industrial Informatics : INDIN 2023 : 17-20 July 2023, Lemgo, Germany</i>. [Piscataway, NJ]: IEEE, 2023. <a href=\"https://doi.org/10.1109/indin51400.2023.10217902\">https://doi.org/10.1109/indin51400.2023.10217902</a>.","havard":"M. Ehrlich, A. Bröring, C. Diedrich, J. Jasperneite, W. Kastner, H. Trsek, Determining the Target Security Level for Automated Security Risk Assessments, IEEE, [Piscataway, NJ], 2023.","short":"M. Ehrlich, A. Bröring, C. Diedrich, J. Jasperneite, W. Kastner, H. Trsek, Determining the Target Security Level for Automated Security Risk Assessments, IEEE, [Piscataway, NJ], 2023.","din1505-2-1":"<span style=\"font-variant:small-caps;\">Ehrlich, Marco</span> ; <span style=\"font-variant:small-caps;\">Bröring, Andre</span> ; <span style=\"font-variant:small-caps;\">Diedrich, Christian</span> ; <span style=\"font-variant:small-caps;\">Jasperneite, Jürgen</span> ; <span style=\"font-variant:small-caps;\">Kastner, Wolfgang</span> ; <span style=\"font-variant:small-caps;\">Trsek, Henning</span> ; <span style=\"font-variant:small-caps;\">Jasperneite, J.</span> ; <span style=\"font-variant:small-caps;\">Institute of Electrical and Electronics Engineers</span> (Hrsg.): <i>Determining the Target Security Level for Automated Security Risk Assessments</i>. [Piscataway, NJ] : IEEE, 2023","van":"Ehrlich M, Bröring A, Diedrich C, Jasperneite J, Kastner W, Trsek H. Determining the Target Security Level for Automated Security Risk Assessments. Jasperneite J, Institute of Electrical and Electronics Engineers, editors. 2023 IEEE 21st International Conference on Industrial Informatics : INDIN 2023 : 17-20 July 2023, Lemgo, Germany. [Piscataway, NJ]: IEEE; 2023.","ufg":"<b>Ehrlich, Marco u. a.</b>: Determining the Target Security Level for Automated Security Risk Assessments, hg. von Jasperneite, Jürgen, Institute of Electrical and Electronics Engineers, [Piscataway, NJ] 2023.","chicago-de":"Ehrlich, Marco, Andre Bröring, Christian Diedrich, Jürgen Jasperneite, Wolfgang Kastner und Henning Trsek. 2023. <i>Determining the Target Security Level for Automated Security Risk Assessments</i>. Hg. von Jürgen Jasperneite und Institute of Electrical and Electronics Engineers. <i>2023 IEEE 21st International Conference on Industrial Informatics : INDIN 2023 : 17-20 July 2023, Lemgo, Germany</i>. [Piscataway, NJ]: IEEE. doi:<a href=\"https://doi.org/10.1109/indin51400.2023.10217902\">10.1109/indin51400.2023.10217902</a>, .","apa":"Ehrlich, M., Bröring, A., Diedrich, C., Jasperneite, J., Kastner, W., &#38; Trsek, H. (2023). Determining the Target Security Level for Automated Security Risk Assessments. In J. Jasperneite &#38; Institute of Electrical and Electronics Engineers (Eds.), <i>2023 IEEE 21st International Conference on Industrial Informatics : INDIN 2023 : 17-20 July 2023, Lemgo, Germany</i>. IEEE. <a href=\"https://doi.org/10.1109/indin51400.2023.10217902\">https://doi.org/10.1109/indin51400.2023.10217902</a>"},"language":[{"iso":"eng"}],"publication_status":"published","user_id":"83781","title":"Determining the Target Security Level for Automated Security Risk Assessments","author":[{"full_name":"Ehrlich, Marco","first_name":"Marco","id":"61562","last_name":"Ehrlich"},{"last_name":"Bröring","id":"65130","first_name":"Andre","full_name":"Bröring, Andre"},{"full_name":"Diedrich, Christian","first_name":"Christian","last_name":"Diedrich"},{"first_name":"Jürgen","id":"1899","last_name":"Jasperneite","full_name":"Jasperneite, Jürgen"},{"full_name":"Kastner, Wolfgang","first_name":"Wolfgang","last_name":"Kastner"},{"full_name":"Trsek, Henning","orcid":"0000-0002-0133-0656","first_name":"Henning","id":"1486","last_name":"Trsek"}],"date_updated":"2025-06-18T13:37:07Z","publication":"2023 IEEE 21st International Conference on Industrial Informatics : INDIN 2023 : 17-20 July 2023, Lemgo, Germany","corporate_editor":["Institute of Electrical and Electronics Engineers"]},{"conference":{"start_date":"2022-09-05","name":"24th European Conference on Power Electronics and Applications (EPE'22 ECCE Europe)","location":"Hannover","end_date":"2022-09-09"},"publication":"EPE Proceeding 2022","year":"2022","abstract":[{"lang":"eng","text":"Today DC offers far-reaching advantages over AC. Therefore, many devices have been equipped with an internal DC link for years. In the field of energy supply, the use of DC technology is also growing and is state of the art e.g. in offshore, high-voltage, automotive and data center applications. The spread of industrial open DC grids is currently starting and is completely different due to the requirements: The DC grid itself and energy flows in an industrial environment are highly dynamic and bidirectional. Due to the low impedance electrical connection of the DC links of many devices, stored energies in fault cases as well as ripple currents during operation place particular requirements on the devices."}],"series_title":"European Conference on Power Electronics and Applications","publisher":"IEEE","title":"Particular Requirements on Drive Inverters for Safe and Robust Operation on an Open Industrial DC Grid","date_updated":"2025-06-26T13:36:25Z","author":[{"first_name":"Simon","id":"85051","last_name":"Puls","full_name":"Puls, Simon"},{"full_name":"Koch, Jan-Niklas","first_name":"Jan-Niklas","last_name":"Koch","id":"58889"},{"last_name":"Ehlich","first_name":"Martin","full_name":"Ehlich, Martin"},{"full_name":"Borcherding, Holger","first_name":"Holger","id":"1693","last_name":"Borcherding"}],"keyword":["Industries","Semiconductor device measurement","Capacitors","Europe","High-voltage techniques","Inverters","Circuit faults"],"publication_status":"published","user_id":"83781","_id":"8436","citation":{"bjps":"<b>Puls S <i>et al.</i></b> (2022) <i>Particular Requirements on Drive Inverters for Safe and Robust Operation on an Open Industrial DC Grid</i>. [Piscataway, NJ]: IEEE.","ama":"Puls S, Koch JN, Ehlich M, Borcherding H. <i>Particular Requirements on Drive Inverters for Safe and Robust Operation on an Open Industrial DC Grid</i>. IEEE; 2022.","chicago":"Puls, Simon, Jan-Niklas Koch, Martin Ehlich, and Holger Borcherding. <i>Particular Requirements on Drive Inverters for Safe and Robust Operation on an Open Industrial DC Grid</i>. <i>EPE Proceeding 2022</i>. European Conference on Power Electronics and Applications. [Piscataway, NJ]: IEEE, 2022.","havard":"S. Puls, J.-N. Koch, M. Ehlich, H. Borcherding, Particular Requirements on Drive Inverters for Safe and Robust Operation on an Open Industrial DC Grid, IEEE, [Piscataway, NJ], 2022.","din1505-2-1":"<span style=\"font-variant:small-caps;\">Puls, Simon</span> ; <span style=\"font-variant:small-caps;\">Koch, Jan-Niklas</span> ; <span style=\"font-variant:small-caps;\">Ehlich, Martin</span> ; <span style=\"font-variant:small-caps;\">Borcherding, Holger</span>: <i>Particular Requirements on Drive Inverters for Safe and Robust Operation on an Open Industrial DC Grid</i>, <i>European Conference on Power Electronics and Applications</i>. [Piscataway, NJ] : IEEE, 2022","van":"Puls S, Koch JN, Ehlich M, Borcherding H. Particular Requirements on Drive Inverters for Safe and Robust Operation on an Open Industrial DC Grid. EPE Proceeding 2022. [Piscataway, NJ]: IEEE; 2022. (European Conference on Power Electronics and Applications).","short":"S. Puls, J.-N. Koch, M. Ehlich, H. Borcherding, Particular Requirements on Drive Inverters for Safe and Robust Operation on an Open Industrial DC Grid, IEEE, [Piscataway, NJ], 2022.","ufg":"<b>Puls, Simon u. a.</b>: Particular Requirements on Drive Inverters for Safe and Robust Operation on an Open Industrial DC Grid, [Piscataway, NJ] 2022 (European Conference on Power Electronics and Applications).","apa":"Puls, S., Koch, J.-N., Ehlich, M., &#38; Borcherding, H. (2022). Particular Requirements on Drive Inverters for Safe and Robust Operation on an Open Industrial DC Grid. In <i>EPE Proceeding 2022</i>. 24th European Conference on Power Electronics and Applications (EPE’22 ECCE Europe), Hannover. IEEE.","chicago-de":"Puls, Simon, Jan-Niklas Koch, Martin Ehlich und Holger Borcherding. 2022. <i>Particular Requirements on Drive Inverters for Safe and Robust Operation on an Open Industrial DC Grid</i>. <i>EPE Proceeding 2022</i>. European Conference on Power Electronics and Applications. [Piscataway, NJ]: IEEE.","ieee":"S. Puls, J.-N. Koch, M. Ehlich, and H. Borcherding, <i>Particular Requirements on Drive Inverters for Safe and Robust Operation on an Open Industrial DC Grid</i>. [Piscataway, NJ]: IEEE, 2022.","mla":"Puls, Simon, et al. “Particular Requirements on Drive Inverters for Safe and Robust Operation on an Open Industrial DC Grid.” <i>EPE Proceeding 2022</i>, IEEE, 2022."},"language":[{"iso":"eng"}],"date_created":"2022-07-05T14:00:56Z","main_file_link":[{"open_access":"1","url":"https://ieeexplore.ieee.org/document/9907118"}],"place":"[Piscataway, NJ]","department":[{"_id":"DEP6020"}],"oa":"1","publication_identifier":{"isbn":["978-9-0758-1539-9"],"issn":["2325-0313"]},"type":"conference_editor_article","status":"public"},{"doi":"10.1109/ieem.2017.8290059","status":"public","publication_identifier":{"eissn":["2157-362X"]},"language":[{"iso":"eng"}],"citation":{"mla":"Latos, Benedikt, et al. “Transformation of Working Environments through Digitalization: Exploration and Systematization of Complexity Drivers.” <i>2017 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM)</i>, IEEE, 2018, <a href=\"https://doi.org/10.1109/ieem.2017.8290059\">https://doi.org/10.1109/ieem.2017.8290059</a>.","ieee":"B. Latos, M. Harlacher, P. M. Przybysz, and S. Mutze-Niewohner, “Transformation of working environments through digitalization: Exploration and systematization of complexity drivers,” presented at the 2017 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM), Singapore, 2018. doi: <a href=\"https://doi.org/10.1109/ieem.2017.8290059\">10.1109/ieem.2017.8290059</a>.","bjps":"<b>Latos B <i>et al.</i></b> (2018) Transformation of Working Environments through Digitalization: Exploration and Systematization of Complexity Drivers. <i>2017 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM)</i>. IEEE.","ama":"Latos B, Harlacher M, Przybysz PM, Mutze-Niewohner S. Transformation of working environments through digitalization: Exploration and systematization of complexity drivers. In: <i>2017 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM)</i>. IEEE; 2018. doi:<a href=\"https://doi.org/10.1109/ieem.2017.8290059\">10.1109/ieem.2017.8290059</a>","apa":"Latos, B., Harlacher, M., Przybysz, P. M., &#38; Mutze-Niewohner, S. (2018). Transformation of working environments through digitalization: Exploration and systematization of complexity drivers. <i>2017 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM)</i>. 2017 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM), Singapore. <a href=\"https://doi.org/10.1109/ieem.2017.8290059\">https://doi.org/10.1109/ieem.2017.8290059</a>","chicago-de":"Latos, Benedikt, Markus Harlacher, Philipp M. Przybysz und Susanne Mutze-Niewohner. 2018. Transformation of working environments through digitalization: Exploration and systematization of complexity drivers. In: <i>2017 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM)</i>. IEEE. doi:<a href=\"https://doi.org/10.1109/ieem.2017.8290059\">10.1109/ieem.2017.8290059</a>, .","ufg":"<b>Latos, Benedikt u. a.</b>: Transformation of working environments through digitalization: Exploration and systematization of complexity drivers, in: o. Hg.: 2017 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM), o. O. 2018.","chicago":"Latos, Benedikt, Markus Harlacher, Philipp M. Przybysz, and Susanne Mutze-Niewohner. “Transformation of Working Environments through Digitalization: Exploration and Systematization of Complexity Drivers.” In <i>2017 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM)</i>. IEEE, 2018. <a href=\"https://doi.org/10.1109/ieem.2017.8290059\">https://doi.org/10.1109/ieem.2017.8290059</a>.","havard":"B. Latos, M. Harlacher, P.M. Przybysz, S. Mutze-Niewohner, Transformation of working environments through digitalization: Exploration and systematization of complexity drivers, in: 2017 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM), IEEE, 2018.","din1505-2-1":"<span style=\"font-variant:small-caps;\">Latos, Benedikt</span> ; <span style=\"font-variant:small-caps;\">Harlacher, Markus</span> ; <span style=\"font-variant:small-caps;\">Przybysz, Philipp M.</span> ; <span style=\"font-variant:small-caps;\">Mutze-Niewohner, Susanne</span>: Transformation of working environments through digitalization: Exploration and systematization of complexity drivers. In: <i>2017 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM)</i> : IEEE, 2018","short":"B. Latos, M. Harlacher, P.M. Przybysz, S. Mutze-Niewohner, in: 2017 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM), IEEE, 2018.","van":"Latos B, Harlacher M, Przybysz PM, Mutze-Niewohner S. Transformation of working environments through digitalization: Exploration and systematization of complexity drivers. In: 2017 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM). IEEE; 2018."},"publication_status":"published","user_id":"83781","title":"Transformation of working environments through digitalization: Exploration and systematization of complexity drivers","date_updated":"2023-10-31T11:24:15Z","author":[{"full_name":"Latos, Benedikt","first_name":"Benedikt","last_name":"Latos","id":"84474"},{"first_name":"Markus","last_name":"Harlacher","full_name":"Harlacher, Markus"},{"first_name":"Philipp M.","last_name":"Przybysz","full_name":"Przybysz, Philipp M."},{"first_name":"Susanne","last_name":"Mutze-Niewohner","full_name":"Mutze-Niewohner, Susanne"}],"publication":"2017 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM)","department":[{"_id":"DEP1522"}],"type":"conference","date_created":"2023-10-30T13:02:52Z","_id":"10668","extern":"1","keyword":["Complexity theory","Interviews","Organizations","Industries","Task analysis","Acceleration"],"publisher":"IEEE","year":"2018","abstract":[{"lang":"eng","text":"Digitalization has a significant impact on our working life and it allows whole industries to rethink their value chains. This paper examines how digitalization relates to complexity in work systems with respect to relevant organizational fields of work organization. 23 semi-structured interviews with experts from science and economy were conducted and analyzed. Key findings are that digitalization has far-reaching, interrelated implications for all organizational fields. Moreover, digitalization-related aspects were identified which have the potential to increase complexity in work systems."}],"conference":{"end_date":"2017-12-13","name":"2017 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM)","location":"Singapore","start_date":"2017-12-10"}}]