---
_id: '12995'
abstract:
- lang: eng
  text: Due to Industry 4.0 developments, the demanded modularity of manufacturing
    systems generates additional manual efforts for security experts to guarantee
    a secure operation. The rising utilization of information and the frequent changes
    of system structures necessitate a continuous and automated security engineering,
    especially by application of the mandatory security risk assessments. Collecting
    the required information for these assessments and formalising expert knowledge
    shall improve the security of modular manufacturing systems in the future. In
    order to automate the security risk assessment process, this work proposes a method
    to determine the Target Security Level (SL-T) in conformance to the IEC 62443
    standard based on the MITRE ATT&CK framework and the Intel Threat Agent Library
    (TAL).
author:
- first_name: Marco
  full_name: Ehrlich, Marco
  id: '61562'
  last_name: Ehrlich
- first_name: Andre
  full_name: Bröring, Andre
  id: '65130'
  last_name: Bröring
- first_name: Christian
  full_name: Diedrich, Christian
  last_name: Diedrich
- first_name: Jürgen
  full_name: Jasperneite, Jürgen
  id: '1899'
  last_name: Jasperneite
- first_name: Wolfgang
  full_name: Kastner, Wolfgang
  last_name: Kastner
- first_name: Henning
  full_name: Trsek, Henning
  id: '1486'
  last_name: Trsek
  orcid: 0000-0002-0133-0656
citation:
  ama: Ehrlich M, Bröring A, Diedrich C, Jasperneite J, Kastner W, Trsek H. <i>Determining
    the Target Security Level for Automated Security Risk Assessments</i>. (Jasperneite
    J, Institute of Electrical and Electronics Engineers, eds.). IEEE; 2023. doi:<a
    href="https://doi.org/10.1109/indin51400.2023.10217902">10.1109/indin51400.2023.10217902</a>
  apa: 'Ehrlich, M., Bröring, A., Diedrich, C., Jasperneite, J., Kastner, W., &#38;
    Trsek, H. (2023). Determining the Target Security Level for Automated Security
    Risk Assessments. In J. Jasperneite &#38; Institute of Electrical and Electronics
    Engineers (Eds.), <i>2023 IEEE 21st International Conference on Industrial Informatics :
    INDIN 2023 : 17-20 July 2023, Lemgo, Germany</i>. IEEE. <a href="https://doi.org/10.1109/indin51400.2023.10217902">https://doi.org/10.1109/indin51400.2023.10217902</a>'
  bjps: '<b>Ehrlich M <i>et al.</i></b> (2023) <i>Determining the Target Security
    Level for Automated Security Risk Assessments</i>, Jasperneite J and Institute
    of Electrical and Electronics Engineers (eds). [Piscataway, NJ]: IEEE.'
  chicago: 'Ehrlich, Marco, Andre Bröring, Christian Diedrich, Jürgen Jasperneite,
    Wolfgang Kastner, and Henning Trsek. <i>Determining the Target Security Level
    for Automated Security Risk Assessments</i>. Edited by Jürgen Jasperneite and
    Institute of Electrical and Electronics Engineers. <i>2023 IEEE 21st International
    Conference on Industrial Informatics : INDIN 2023 : 17-20 July 2023, Lemgo, Germany</i>.
    [Piscataway, NJ]: IEEE, 2023. <a href="https://doi.org/10.1109/indin51400.2023.10217902">https://doi.org/10.1109/indin51400.2023.10217902</a>.'
  chicago-de: 'Ehrlich, Marco, Andre Bröring, Christian Diedrich, Jürgen Jasperneite,
    Wolfgang Kastner und Henning Trsek. 2023. <i>Determining the Target Security Level
    for Automated Security Risk Assessments</i>. Hg. von Jürgen Jasperneite und Institute
    of Electrical and Electronics Engineers. <i>2023 IEEE 21st International Conference
    on Industrial Informatics : INDIN 2023 : 17-20 July 2023, Lemgo, Germany</i>.
    [Piscataway, NJ]: IEEE. doi:<a href="https://doi.org/10.1109/indin51400.2023.10217902">10.1109/indin51400.2023.10217902</a>,
    .'
  din1505-2-1: '<span style="font-variant:small-caps;">Ehrlich, Marco</span> ; <span
    style="font-variant:small-caps;">Bröring, Andre</span> ; <span style="font-variant:small-caps;">Diedrich,
    Christian</span> ; <span style="font-variant:small-caps;">Jasperneite, Jürgen</span>
    ; <span style="font-variant:small-caps;">Kastner, Wolfgang</span> ; <span style="font-variant:small-caps;">Trsek,
    Henning</span> ; <span style="font-variant:small-caps;">Jasperneite, J.</span>
    ; <span style="font-variant:small-caps;">Institute of Electrical and Electronics
    Engineers</span> (Hrsg.): <i>Determining the Target Security Level for Automated
    Security Risk Assessments</i>. [Piscataway, NJ] : IEEE, 2023'
  havard: M. Ehrlich, A. Bröring, C. Diedrich, J. Jasperneite, W. Kastner, H. Trsek,
    Determining the Target Security Level for Automated Security Risk Assessments,
    IEEE, [Piscataway, NJ], 2023.
  ieee: 'M. Ehrlich, A. Bröring, C. Diedrich, J. Jasperneite, W. Kastner, and H. Trsek,
    <i>Determining the Target Security Level for Automated Security Risk Assessments</i>.
    [Piscataway, NJ]: IEEE, 2023. doi: <a href="https://doi.org/10.1109/indin51400.2023.10217902">10.1109/indin51400.2023.10217902</a>.'
  mla: 'Ehrlich, Marco, et al. “Determining the Target Security Level for Automated
    Security Risk Assessments.” <i>2023 IEEE 21st International Conference on Industrial
    Informatics : INDIN 2023 : 17-20 July 2023, Lemgo, Germany</i>, edited by Jürgen
    Jasperneite and Institute of Electrical and Electronics Engineers, IEEE, 2023,
    <a href="https://doi.org/10.1109/indin51400.2023.10217902">https://doi.org/10.1109/indin51400.2023.10217902</a>.'
  short: M. Ehrlich, A. Bröring, C. Diedrich, J. Jasperneite, W. Kastner, H. Trsek,
    Determining the Target Security Level for Automated Security Risk Assessments,
    IEEE, [Piscataway, NJ], 2023.
  ufg: '<b>Ehrlich, Marco u. a.</b>: Determining the Target Security Level for Automated
    Security Risk Assessments, hg. von Jasperneite, Jürgen, Institute of Electrical
    and Electronics Engineers, [Piscataway, NJ] 2023.'
  van: 'Ehrlich M, Bröring A, Diedrich C, Jasperneite J, Kastner W, Trsek H. Determining
    the Target Security Level for Automated Security Risk Assessments. Jasperneite
    J, Institute of Electrical and Electronics Engineers, editors. 2023 IEEE 21st
    International Conference on Industrial Informatics : INDIN 2023 : 17-20 July 2023,
    Lemgo, Germany. [Piscataway, NJ]: IEEE; 2023.'
conference:
  end_date: 2023-07-20
  location: Lemgo
  name: 21st International Conference on Industrial Informatics (INDIN)
  start_date: 2023-07-18
corporate_editor:
- Institute of Electrical and Electronics Engineers
date_created: 2025-06-18T13:30:31Z
date_updated: 2025-06-18T13:37:07Z
department:
- _id: DEP5023
doi: 10.1109/indin51400.2023.10217902
editor:
- first_name: Jürgen
  full_name: Jasperneite, Jürgen
  id: '1899'
  last_name: Jasperneite
keyword:
- Integrated circuits
- Industries
- Libraries
- Security
- Risk management
- IEC Standards
- Interviews
language:
- iso: eng
place: '[Piscataway, NJ]'
publication: '2023 IEEE 21st International Conference on Industrial Informatics :
  INDIN 2023 : 17-20 July 2023, Lemgo, Germany'
publication_identifier:
  eisbn:
  - 978-1-6654-9313-0
  isbn:
  - 978-1-6654-9314-7
publication_status: published
publisher: IEEE
status: public
title: Determining the Target Security Level for Automated Security Risk Assessments
type: conference_editor_article
user_id: '83781'
year: '2023'
...
---
_id: '8436'
abstract:
- lang: eng
  text: 'Today DC offers far-reaching advantages over AC. Therefore, many devices
    have been equipped with an internal DC link for years. In the field of energy
    supply, the use of DC technology is also growing and is state of the art e.g.
    in offshore, high-voltage, automotive and data center applications. The spread
    of industrial open DC grids is currently starting and is completely different
    due to the requirements: The DC grid itself and energy flows in an industrial
    environment are highly dynamic and bidirectional. Due to the low impedance electrical
    connection of the DC links of many devices, stored energies in fault cases as
    well as ripple currents during operation place particular requirements on the
    devices.'
author:
- first_name: Simon
  full_name: Puls, Simon
  id: '85051'
  last_name: Puls
- first_name: Jan-Niklas
  full_name: Koch, Jan-Niklas
  id: '58889'
  last_name: Koch
- first_name: Martin
  full_name: Ehlich, Martin
  last_name: Ehlich
- first_name: Holger
  full_name: Borcherding, Holger
  id: '1693'
  last_name: Borcherding
citation:
  ama: Puls S, Koch JN, Ehlich M, Borcherding H. <i>Particular Requirements on Drive
    Inverters for Safe and Robust Operation on an Open Industrial DC Grid</i>. IEEE;
    2022.
  apa: Puls, S., Koch, J.-N., Ehlich, M., &#38; Borcherding, H. (2022). Particular
    Requirements on Drive Inverters for Safe and Robust Operation on an Open Industrial
    DC Grid. In <i>EPE Proceeding 2022</i>. 24th European Conference on Power Electronics
    and Applications (EPE’22 ECCE Europe), Hannover. IEEE.
  bjps: '<b>Puls S <i>et al.</i></b> (2022) <i>Particular Requirements on Drive Inverters
    for Safe and Robust Operation on an Open Industrial DC Grid</i>. [Piscataway,
    NJ]: IEEE.'
  chicago: 'Puls, Simon, Jan-Niklas Koch, Martin Ehlich, and Holger Borcherding. <i>Particular
    Requirements on Drive Inverters for Safe and Robust Operation on an Open Industrial
    DC Grid</i>. <i>EPE Proceeding 2022</i>. European Conference on Power Electronics
    and Applications. [Piscataway, NJ]: IEEE, 2022.'
  chicago-de: 'Puls, Simon, Jan-Niklas Koch, Martin Ehlich und Holger Borcherding.
    2022. <i>Particular Requirements on Drive Inverters for Safe and Robust Operation
    on an Open Industrial DC Grid</i>. <i>EPE Proceeding 2022</i>. European Conference
    on Power Electronics and Applications. [Piscataway, NJ]: IEEE.'
  din1505-2-1: '<span style="font-variant:small-caps;">Puls, Simon</span> ; <span
    style="font-variant:small-caps;">Koch, Jan-Niklas</span> ; <span style="font-variant:small-caps;">Ehlich,
    Martin</span> ; <span style="font-variant:small-caps;">Borcherding, Holger</span>:
    <i>Particular Requirements on Drive Inverters for Safe and Robust Operation on
    an Open Industrial DC Grid</i>, <i>European Conference on Power Electronics and
    Applications</i>. [Piscataway, NJ] : IEEE, 2022'
  havard: S. Puls, J.-N. Koch, M. Ehlich, H. Borcherding, Particular Requirements
    on Drive Inverters for Safe and Robust Operation on an Open Industrial DC Grid,
    IEEE, [Piscataway, NJ], 2022.
  ieee: 'S. Puls, J.-N. Koch, M. Ehlich, and H. Borcherding, <i>Particular Requirements
    on Drive Inverters for Safe and Robust Operation on an Open Industrial DC Grid</i>.
    [Piscataway, NJ]: IEEE, 2022.'
  mla: Puls, Simon, et al. “Particular Requirements on Drive Inverters for Safe and
    Robust Operation on an Open Industrial DC Grid.” <i>EPE Proceeding 2022</i>, IEEE,
    2022.
  short: S. Puls, J.-N. Koch, M. Ehlich, H. Borcherding, Particular Requirements on
    Drive Inverters for Safe and Robust Operation on an Open Industrial DC Grid, IEEE,
    [Piscataway, NJ], 2022.
  ufg: '<b>Puls, Simon u. a.</b>: Particular Requirements on Drive Inverters for Safe
    and Robust Operation on an Open Industrial DC Grid, [Piscataway, NJ] 2022 (European
    Conference on Power Electronics and Applications).'
  van: 'Puls S, Koch JN, Ehlich M, Borcherding H. Particular Requirements on Drive
    Inverters for Safe and Robust Operation on an Open Industrial DC Grid. EPE Proceeding
    2022. [Piscataway, NJ]: IEEE; 2022. (European Conference on Power Electronics
    and Applications).'
conference:
  end_date: 2022-09-09
  location: Hannover
  name: 24th European Conference on Power Electronics and Applications (EPE'22 ECCE
    Europe)
  start_date: 2022-09-05
date_created: 2022-07-05T14:00:56Z
date_updated: 2025-06-26T13:36:25Z
department:
- _id: DEP6020
keyword:
- Industries
- Semiconductor device measurement
- Capacitors
- Europe
- High-voltage techniques
- Inverters
- Circuit faults
language:
- iso: eng
main_file_link:
- open_access: '1'
  url: https://ieeexplore.ieee.org/document/9907118
oa: '1'
place: '[Piscataway, NJ]'
publication: EPE Proceeding 2022
publication_identifier:
  isbn:
  - 978-9-0758-1539-9
  issn:
  - 2325-0313
publication_status: published
publisher: IEEE
series_title: European Conference on Power Electronics and Applications
status: public
title: Particular Requirements on Drive Inverters for Safe and Robust Operation on
  an Open Industrial DC Grid
type: conference_editor_article
user_id: '83781'
year: '2022'
...
---
_id: '10668'
abstract:
- lang: eng
  text: Digitalization has a significant impact on our working life and it allows
    whole industries to rethink their value chains. This paper examines how digitalization
    relates to complexity in work systems with respect to relevant organizational
    fields of work organization. 23 semi-structured interviews with experts from science
    and economy were conducted and analyzed. Key findings are that digitalization
    has far-reaching, interrelated implications for all organizational fields. Moreover,
    digitalization-related aspects were identified which have the potential to increase
    complexity in work systems.
author:
- first_name: Benedikt
  full_name: Latos, Benedikt
  id: '84474'
  last_name: Latos
- first_name: Markus
  full_name: Harlacher, Markus
  last_name: Harlacher
- first_name: Philipp M.
  full_name: Przybysz, Philipp M.
  last_name: Przybysz
- first_name: Susanne
  full_name: Mutze-Niewohner, Susanne
  last_name: Mutze-Niewohner
citation:
  ama: 'Latos B, Harlacher M, Przybysz PM, Mutze-Niewohner S. Transformation of working
    environments through digitalization: Exploration and systematization of complexity
    drivers. In: <i>2017 IEEE International Conference on Industrial Engineering and
    Engineering Management (IEEM)</i>. IEEE; 2018. doi:<a href="https://doi.org/10.1109/ieem.2017.8290059">10.1109/ieem.2017.8290059</a>'
  apa: 'Latos, B., Harlacher, M., Przybysz, P. M., &#38; Mutze-Niewohner, S. (2018).
    Transformation of working environments through digitalization: Exploration and
    systematization of complexity drivers. <i>2017 IEEE International Conference on
    Industrial Engineering and Engineering Management (IEEM)</i>. 2017 IEEE International
    Conference on Industrial Engineering and Engineering Management (IEEM), Singapore.
    <a href="https://doi.org/10.1109/ieem.2017.8290059">https://doi.org/10.1109/ieem.2017.8290059</a>'
  bjps: '<b>Latos B <i>et al.</i></b> (2018) Transformation of Working Environments
    through Digitalization: Exploration and Systematization of Complexity Drivers.
    <i>2017 IEEE International Conference on Industrial Engineering and Engineering
    Management (IEEM)</i>. IEEE.'
  chicago: 'Latos, Benedikt, Markus Harlacher, Philipp M. Przybysz, and Susanne Mutze-Niewohner.
    “Transformation of Working Environments through Digitalization: Exploration and
    Systematization of Complexity Drivers.” In <i>2017 IEEE International Conference
    on Industrial Engineering and Engineering Management (IEEM)</i>. IEEE, 2018. <a
    href="https://doi.org/10.1109/ieem.2017.8290059">https://doi.org/10.1109/ieem.2017.8290059</a>.'
  chicago-de: 'Latos, Benedikt, Markus Harlacher, Philipp M. Przybysz und Susanne
    Mutze-Niewohner. 2018. Transformation of working environments through digitalization:
    Exploration and systematization of complexity drivers. In: <i>2017 IEEE International
    Conference on Industrial Engineering and Engineering Management (IEEM)</i>. IEEE.
    doi:<a href="https://doi.org/10.1109/ieem.2017.8290059">10.1109/ieem.2017.8290059</a>,
    .'
  din1505-2-1: '<span style="font-variant:small-caps;">Latos, Benedikt</span> ; <span
    style="font-variant:small-caps;">Harlacher, Markus</span> ; <span style="font-variant:small-caps;">Przybysz,
    Philipp M.</span> ; <span style="font-variant:small-caps;">Mutze-Niewohner, Susanne</span>:
    Transformation of working environments through digitalization: Exploration and
    systematization of complexity drivers. In: <i>2017 IEEE International Conference
    on Industrial Engineering and Engineering Management (IEEM)</i> : IEEE, 2018'
  havard: 'B. Latos, M. Harlacher, P.M. Przybysz, S. Mutze-Niewohner, Transformation
    of working environments through digitalization: Exploration and systematization
    of complexity drivers, in: 2017 IEEE International Conference on Industrial Engineering
    and Engineering Management (IEEM), IEEE, 2018.'
  ieee: 'B. Latos, M. Harlacher, P. M. Przybysz, and S. Mutze-Niewohner, “Transformation
    of working environments through digitalization: Exploration and systematization
    of complexity drivers,” presented at the 2017 IEEE International Conference on
    Industrial Engineering and Engineering Management (IEEM), Singapore, 2018. doi:
    <a href="https://doi.org/10.1109/ieem.2017.8290059">10.1109/ieem.2017.8290059</a>.'
  mla: 'Latos, Benedikt, et al. “Transformation of Working Environments through Digitalization:
    Exploration and Systematization of Complexity Drivers.” <i>2017 IEEE International
    Conference on Industrial Engineering and Engineering Management (IEEM)</i>, IEEE,
    2018, <a href="https://doi.org/10.1109/ieem.2017.8290059">https://doi.org/10.1109/ieem.2017.8290059</a>.'
  short: 'B. Latos, M. Harlacher, P.M. Przybysz, S. Mutze-Niewohner, in: 2017 IEEE
    International Conference on Industrial Engineering and Engineering Management
    (IEEM), IEEE, 2018.'
  ufg: '<b>Latos, Benedikt u. a.</b>: Transformation of working environments through
    digitalization: Exploration and systematization of complexity drivers, in: o. Hg.:
    2017 IEEE International Conference on Industrial Engineering and Engineering Management
    (IEEM), o. O. 2018.'
  van: 'Latos B, Harlacher M, Przybysz PM, Mutze-Niewohner S. Transformation of working
    environments through digitalization: Exploration and systematization of complexity
    drivers. In: 2017 IEEE International Conference on Industrial Engineering and
    Engineering Management (IEEM). IEEE; 2018.'
conference:
  end_date: 2017-12-13
  location: Singapore
  name: 2017 IEEE International Conference on Industrial Engineering and Engineering
    Management (IEEM)
  start_date: 2017-12-10
date_created: 2023-10-30T13:02:52Z
date_updated: 2023-10-31T11:24:15Z
department:
- _id: DEP1522
doi: 10.1109/ieem.2017.8290059
extern: '1'
keyword:
- Complexity theory
- Interviews
- Organizations
- Industries
- Task analysis
- Acceleration
language:
- iso: eng
publication: 2017 IEEE International Conference on Industrial Engineering and Engineering
  Management (IEEM)
publication_identifier:
  eissn:
  - 2157-362X
publication_status: published
publisher: IEEE
status: public
title: 'Transformation of working environments through digitalization: Exploration
  and systematization of complexity drivers'
type: conference
user_id: '83781'
year: '2018'
...