[{"publication_status":"published","abstract":[{"text":"The previous methodology for optimizing CO2 emissions and electricity costs in industrial applications is extended by integrating dynamic load shifting with battery energy storage. Building on earlier work that employed Mixed-Integer Linear Programming (MILP) to manage a stationary battery based on real-time electricity prices and CO2 intensity signals, two industrial machines and one electric vehicle (EV) are now incorporated as additional shiftable loads. These new elements introduce further operational constraints while enhancing energy management flexibility. The framework employs an adjustable weighting factor λ to balance environmental impact and cost, and comparative analyses across three scenarios—battery-only, load-shifting-only, and combined—demonstrate nearly additive CO2 reductions alongside non-additive cost improvements, underscoring the synergistic potential for environmental benefits despite diminishing cost returns. Moreover, validation against dynamic programming confirms the MILP approach’s accuracy and computational efficiency.","lang":"eng"}],"publisher":"IEEE","author":[{"full_name":"Mousavi, Seyed Davood","first_name":"Seyed Davood","last_name":"Mousavi","id":"79148"},{"id":"46242","last_name":"Schulte","full_name":"Schulte, Thomas","first_name":"Thomas"}],"publication":"2025 5th International Conference on Electrical, Computer and Energy Technologies (ICECET)","status":"public","title":"Enhanced Dynamic Optimization for CO2 Reduction and Cost Savings through Load Shifting in Smart Factories","publication_identifier":{"eisbn":["979-8-3315-3559-9"]},"corporate_editor":["University of Buner, Pakistan; Altinbas University, Türkiye","ICECCE"],"_id":"13678","language":[{"iso":"eng"}],"place":"[Piscataway, NJ]","keyword":["Feeds","Antennas","System-on-chip","Application specific integrated circuits","Life cycle assessment","Product lifecycle management","Radio access networks","Regional area networks","Smart devices","OWL"],"doi":"10.1109/icecet63943.2025.11472530","user_id":"83781","department":[{"_id":"DEP6020"},{"_id":"DEP5022"}],"date_created":"2026-04-10T07:15:51Z","date_updated":"2026-04-13T09:32:58Z","conference":{"end_date":"2025-07-06","name":"5th International Conference on Electrical, Computer and Energy Technologies (ICECET)","location":"Paris, France ","start_date":"2025-07-03"},"type":"conference_editor_article","citation":{"apa":"Mousavi, S. D., &#38; Schulte, T. (2026). Enhanced Dynamic Optimization for CO2 Reduction and Cost Savings through Load Shifting in Smart Factories. In University of Buner, Pakistan; Altinbas University, Türkiye &#38; ICECCE (Eds.), <i>2025 5th International Conference on Electrical, Computer and Energy Technologies (ICECET)</i>. IEEE. <a href=\"https://doi.org/10.1109/icecet63943.2025.11472530\">https://doi.org/10.1109/icecet63943.2025.11472530</a>","din1505-2-1":"<span style=\"font-variant:small-caps;\">Mousavi, Seyed Davood</span> ; <span style=\"font-variant:small-caps;\">Schulte, Thomas</span> ; <span style=\"font-variant:small-caps;\">University of Buner, Pakistan; Altinbas University, Türkiye</span> ; <span style=\"font-variant:small-caps;\">ICECCE</span> (Hrsg.): <i>Enhanced Dynamic Optimization for CO2 Reduction and Cost Savings through Load Shifting in Smart Factories</i>. [Piscataway, NJ] : IEEE, 2026","mla":"Mousavi, Seyed Davood, and Thomas Schulte. “Enhanced Dynamic Optimization for CO2 Reduction and Cost Savings through Load Shifting in Smart Factories.” <i>2025 5th International Conference on Electrical, Computer and Energy Technologies (ICECET)</i>, edited by University of Buner, Pakistan; Altinbas University, Türkiye and ICECCE, IEEE, 2026, <a href=\"https://doi.org/10.1109/icecet63943.2025.11472530\">https://doi.org/10.1109/icecet63943.2025.11472530</a>.","chicago":"Mousavi, Seyed Davood, and Thomas Schulte. <i>Enhanced Dynamic Optimization for CO2 Reduction and Cost Savings through Load Shifting in Smart Factories</i>. Edited by University of Buner, Pakistan; Altinbas University, Türkiye and ICECCE. <i>2025 5th International Conference on Electrical, Computer and Energy Technologies (ICECET)</i>. [Piscataway, NJ]: IEEE, 2026. <a href=\"https://doi.org/10.1109/icecet63943.2025.11472530\">https://doi.org/10.1109/icecet63943.2025.11472530</a>.","van":"Mousavi SD, Schulte T. Enhanced Dynamic Optimization for CO2 Reduction and Cost Savings through Load Shifting in Smart Factories. University of Buner, Pakistan; Altinbas University, Türkiye, ICECCE, editors. 2025 5th International Conference on Electrical, Computer and Energy Technologies (ICECET). [Piscataway, NJ]: IEEE; 2026.","ieee":"S. D. Mousavi and T. Schulte, <i>Enhanced Dynamic Optimization for CO2 Reduction and Cost Savings through Load Shifting in Smart Factories</i>. [Piscataway, NJ]: IEEE, 2026. doi: <a href=\"https://doi.org/10.1109/icecet63943.2025.11472530\">10.1109/icecet63943.2025.11472530</a>.","chicago-de":"Mousavi, Seyed Davood und Thomas Schulte. 2026. <i>Enhanced Dynamic Optimization for CO2 Reduction and Cost Savings through Load Shifting in Smart Factories</i>. Hg. von University of Buner, Pakistan; Altinbas University, Türkiye und ICECCE. <i>2025 5th International Conference on Electrical, Computer and Energy Technologies (ICECET)</i>. [Piscataway, NJ]: IEEE. doi:<a href=\"https://doi.org/10.1109/icecet63943.2025.11472530\">10.1109/icecet63943.2025.11472530</a>, .","ufg":"<b>Mousavi, Seyed Davood/Schulte, Thomas</b>: Enhanced Dynamic Optimization for CO2 Reduction and Cost Savings through Load Shifting in Smart Factories, hg. von University of Buner, Pakistan; Altinbas University, Türkiye, ICECCE, [Piscataway, NJ] 2026.","bjps":"<b>Mousavi SD and Schulte T</b> (2026) <i>Enhanced Dynamic Optimization for CO2 Reduction and Cost Savings through Load Shifting in Smart Factories</i>, University of Buner, Pakistan; Altinbas University, Türkiye and ICECCE (eds). [Piscataway, NJ]: IEEE.","havard":"S.D. Mousavi, T. Schulte, Enhanced Dynamic Optimization for CO2 Reduction and Cost Savings through Load Shifting in Smart Factories, IEEE, [Piscataway, NJ], 2026.","short":"S.D. Mousavi, T. Schulte, Enhanced Dynamic Optimization for CO2 Reduction and Cost Savings through Load Shifting in Smart Factories, IEEE, [Piscataway, NJ], 2026.","ama":"Mousavi SD, Schulte T. <i>Enhanced Dynamic Optimization for CO2 Reduction and Cost Savings through Load Shifting in Smart Factories</i>. (University of Buner, Pakistan; Altinbas University, Türkiye, ICECCE, eds.). IEEE; 2026. doi:<a href=\"https://doi.org/10.1109/icecet63943.2025.11472530\">10.1109/icecet63943.2025.11472530</a>"},"year":"2026"},{"status":"public","publication":"2023 IEEE 21st International Conference on Industrial Informatics : INDIN 2023 : 17-20 July 2023, Lemgo, Germany","author":[{"id":"61562","last_name":"Ehrlich","first_name":"Marco","full_name":"Ehrlich, Marco"},{"first_name":"Andre","full_name":"Bröring, Andre","last_name":"Bröring","id":"65130"},{"full_name":"Diedrich, Christian","first_name":"Christian","last_name":"Diedrich"},{"full_name":"Jasperneite, Jürgen","first_name":"Jürgen","last_name":"Jasperneite","id":"1899"},{"last_name":"Kastner","full_name":"Kastner, Wolfgang","first_name":"Wolfgang"},{"first_name":"Henning","full_name":"Trsek, Henning","last_name":"Trsek","orcid":"0000-0002-0133-0656","id":"1486"}],"publisher":"IEEE","abstract":[{"lang":"eng","text":"Due to Industry 4.0 developments, the demanded modularity of manufacturing systems generates additional manual efforts for security experts to guarantee a secure operation. The rising utilization of information and the frequent changes of system structures necessitate a continuous and automated security engineering, especially by application of the mandatory security risk assessments. Collecting the required information for these assessments and formalising expert knowledge shall improve the security of modular manufacturing systems in the future. In order to automate the security risk assessment process, this work proposes a method to determine the Target Security Level (SL-T) in conformance to the IEC 62443 standard based on the MITRE ATT&CK framework and the Intel Threat Agent Library (TAL)."}],"publication_status":"published","publication_identifier":{"eisbn":["978-1-6654-9313-0"],"isbn":["978-1-6654-9314-7"]},"title":"Determining the Target Security Level for Automated Security Risk Assessments","keyword":["Integrated circuits","Industries","Libraries","Security","Risk management","IEC Standards","Interviews"],"place":"[Piscataway, NJ]","language":[{"iso":"eng"}],"_id":"12995","corporate_editor":["Institute of Electrical and Electronics Engineers"],"editor":[{"last_name":"Jasperneite","first_name":"Jürgen","full_name":"Jasperneite, Jürgen","id":"1899"}],"year":"2023","citation":{"mla":"Ehrlich, Marco, et al. “Determining the Target Security Level for Automated Security Risk Assessments.” <i>2023 IEEE 21st International Conference on Industrial Informatics : INDIN 2023 : 17-20 July 2023, Lemgo, Germany</i>, edited by Jürgen Jasperneite and Institute of Electrical and Electronics Engineers, IEEE, 2023, <a href=\"https://doi.org/10.1109/indin51400.2023.10217902\">https://doi.org/10.1109/indin51400.2023.10217902</a>.","chicago":"Ehrlich, Marco, Andre Bröring, Christian Diedrich, Jürgen Jasperneite, Wolfgang Kastner, and Henning Trsek. <i>Determining the Target Security Level for Automated Security Risk Assessments</i>. Edited by Jürgen Jasperneite and Institute of Electrical and Electronics Engineers. <i>2023 IEEE 21st International Conference on Industrial Informatics : INDIN 2023 : 17-20 July 2023, Lemgo, Germany</i>. [Piscataway, NJ]: IEEE, 2023. <a href=\"https://doi.org/10.1109/indin51400.2023.10217902\">https://doi.org/10.1109/indin51400.2023.10217902</a>.","van":"Ehrlich M, Bröring A, Diedrich C, Jasperneite J, Kastner W, Trsek H. Determining the Target Security Level for Automated Security Risk Assessments. Jasperneite J, Institute of Electrical and Electronics Engineers, editors. 2023 IEEE 21st International Conference on Industrial Informatics : INDIN 2023 : 17-20 July 2023, Lemgo, Germany. [Piscataway, NJ]: IEEE; 2023.","ieee":"M. Ehrlich, A. Bröring, C. Diedrich, J. Jasperneite, W. Kastner, and H. Trsek, <i>Determining the Target Security Level for Automated Security Risk Assessments</i>. [Piscataway, NJ]: IEEE, 2023. doi: <a href=\"https://doi.org/10.1109/indin51400.2023.10217902\">10.1109/indin51400.2023.10217902</a>.","din1505-2-1":"<span style=\"font-variant:small-caps;\">Ehrlich, Marco</span> ; <span style=\"font-variant:small-caps;\">Bröring, Andre</span> ; <span style=\"font-variant:small-caps;\">Diedrich, Christian</span> ; <span style=\"font-variant:small-caps;\">Jasperneite, Jürgen</span> ; <span style=\"font-variant:small-caps;\">Kastner, Wolfgang</span> ; <span style=\"font-variant:small-caps;\">Trsek, Henning</span> ; <span style=\"font-variant:small-caps;\">Jasperneite, J.</span> ; <span style=\"font-variant:small-caps;\">Institute of Electrical and Electronics Engineers</span> (Hrsg.): <i>Determining the Target Security Level for Automated Security Risk Assessments</i>. [Piscataway, NJ] : IEEE, 2023","apa":"Ehrlich, M., Bröring, A., Diedrich, C., Jasperneite, J., Kastner, W., &#38; Trsek, H. (2023). Determining the Target Security Level for Automated Security Risk Assessments. In J. Jasperneite &#38; Institute of Electrical and Electronics Engineers (Eds.), <i>2023 IEEE 21st International Conference on Industrial Informatics : INDIN 2023 : 17-20 July 2023, Lemgo, Germany</i>. IEEE. <a href=\"https://doi.org/10.1109/indin51400.2023.10217902\">https://doi.org/10.1109/indin51400.2023.10217902</a>","ama":"Ehrlich M, Bröring A, Diedrich C, Jasperneite J, Kastner W, Trsek H. <i>Determining the Target Security Level for Automated Security Risk Assessments</i>. (Jasperneite J, Institute of Electrical and Electronics Engineers, eds.). IEEE; 2023. doi:<a href=\"https://doi.org/10.1109/indin51400.2023.10217902\">10.1109/indin51400.2023.10217902</a>","short":"M. Ehrlich, A. Bröring, C. Diedrich, J. Jasperneite, W. Kastner, H. Trsek, Determining the Target Security Level for Automated Security Risk Assessments, IEEE, [Piscataway, NJ], 2023.","havard":"M. Ehrlich, A. Bröring, C. Diedrich, J. Jasperneite, W. Kastner, H. Trsek, Determining the Target Security Level for Automated Security Risk Assessments, IEEE, [Piscataway, NJ], 2023.","ufg":"<b>Ehrlich, Marco u. a.</b>: Determining the Target Security Level for Automated Security Risk Assessments, hg. von Jasperneite, Jürgen, Institute of Electrical and Electronics Engineers, [Piscataway, NJ] 2023.","bjps":"<b>Ehrlich M <i>et al.</i></b> (2023) <i>Determining the Target Security Level for Automated Security Risk Assessments</i>, Jasperneite J and Institute of Electrical and Electronics Engineers (eds). [Piscataway, NJ]: IEEE.","chicago-de":"Ehrlich, Marco, Andre Bröring, Christian Diedrich, Jürgen Jasperneite, Wolfgang Kastner und Henning Trsek. 2023. <i>Determining the Target Security Level for Automated Security Risk Assessments</i>. Hg. von Jürgen Jasperneite und Institute of Electrical and Electronics Engineers. <i>2023 IEEE 21st International Conference on Industrial Informatics : INDIN 2023 : 17-20 July 2023, Lemgo, Germany</i>. [Piscataway, NJ]: IEEE. doi:<a href=\"https://doi.org/10.1109/indin51400.2023.10217902\">10.1109/indin51400.2023.10217902</a>, ."},"type":"conference_editor_article","conference":{"location":"Lemgo","start_date":"2023-07-18","end_date":"2023-07-20","name":"21st International Conference on Industrial Informatics (INDIN)"},"date_updated":"2025-06-18T13:37:07Z","date_created":"2025-06-18T13:30:31Z","department":[{"_id":"DEP5023"}],"user_id":"83781","doi":"10.1109/indin51400.2023.10217902"}]