---
_id: '13678'
abstract:
- lang: eng
  text: The previous methodology for optimizing CO2 emissions and electricity costs
    in industrial applications is extended by integrating dynamic load shifting with
    battery energy storage. Building on earlier work that employed Mixed-Integer Linear
    Programming (MILP) to manage a stationary battery based on real-time electricity
    prices and CO2 intensity signals, two industrial machines and one electric vehicle
    (EV) are now incorporated as additional shiftable loads. These new elements introduce
    further operational constraints while enhancing energy management flexibility.
    The framework employs an adjustable weighting factor λ to balance environmental
    impact and cost, and comparative analyses across three scenarios—battery-only,
    load-shifting-only, and combined—demonstrate nearly additive CO2 reductions alongside
    non-additive cost improvements, underscoring the synergistic potential for environmental
    benefits despite diminishing cost returns. Moreover, validation against dynamic
    programming confirms the MILP approach’s accuracy and computational efficiency.
author:
- first_name: Seyed Davood
  full_name: Mousavi, Seyed Davood
  id: '79148'
  last_name: Mousavi
- first_name: Thomas
  full_name: Schulte, Thomas
  id: '46242'
  last_name: Schulte
citation:
  ama: Mousavi SD, Schulte T. <i>Enhanced Dynamic Optimization for CO2 Reduction and
    Cost Savings through Load Shifting in Smart Factories</i>. (University of Buner,
    Pakistan; Altinbas University, Türkiye, ICECCE, eds.). IEEE; 2026. doi:<a href="https://doi.org/10.1109/icecet63943.2025.11472530">10.1109/icecet63943.2025.11472530</a>
  apa: Mousavi, S. D., &#38; Schulte, T. (2026). Enhanced Dynamic Optimization for
    CO2 Reduction and Cost Savings through Load Shifting in Smart Factories. In University
    of Buner, Pakistan; Altinbas University, Türkiye &#38; ICECCE (Eds.), <i>2025
    5th International Conference on Electrical, Computer and Energy Technologies (ICECET)</i>.
    IEEE. <a href="https://doi.org/10.1109/icecet63943.2025.11472530">https://doi.org/10.1109/icecet63943.2025.11472530</a>
  bjps: '<b>Mousavi SD and Schulte T</b> (2026) <i>Enhanced Dynamic Optimization for
    CO2 Reduction and Cost Savings through Load Shifting in Smart Factories</i>, University
    of Buner, Pakistan; Altinbas University, Türkiye and ICECCE (eds). [Piscataway,
    NJ]: IEEE.'
  chicago: 'Mousavi, Seyed Davood, and Thomas Schulte. <i>Enhanced Dynamic Optimization
    for CO2 Reduction and Cost Savings through Load Shifting in Smart Factories</i>.
    Edited by University of Buner, Pakistan; Altinbas University, Türkiye and ICECCE.
    <i>2025 5th International Conference on Electrical, Computer and Energy Technologies
    (ICECET)</i>. [Piscataway, NJ]: IEEE, 2026. <a href="https://doi.org/10.1109/icecet63943.2025.11472530">https://doi.org/10.1109/icecet63943.2025.11472530</a>.'
  chicago-de: 'Mousavi, Seyed Davood und Thomas Schulte. 2026. <i>Enhanced Dynamic
    Optimization for CO2 Reduction and Cost Savings through Load Shifting in Smart
    Factories</i>. Hg. von University of Buner, Pakistan; Altinbas University, Türkiye
    und ICECCE. <i>2025 5th International Conference on Electrical, Computer and Energy
    Technologies (ICECET)</i>. [Piscataway, NJ]: IEEE. doi:<a href="https://doi.org/10.1109/icecet63943.2025.11472530">10.1109/icecet63943.2025.11472530</a>,
    .'
  din1505-2-1: '<span style="font-variant:small-caps;">Mousavi, Seyed Davood</span>
    ; <span style="font-variant:small-caps;">Schulte, Thomas</span> ; <span style="font-variant:small-caps;">University
    of Buner, Pakistan; Altinbas University, Türkiye</span> ; <span style="font-variant:small-caps;">ICECCE</span>
    (Hrsg.): <i>Enhanced Dynamic Optimization for CO2 Reduction and Cost Savings through
    Load Shifting in Smart Factories</i>. [Piscataway, NJ] : IEEE, 2026'
  havard: S.D. Mousavi, T. Schulte, Enhanced Dynamic Optimization for CO2 Reduction
    and Cost Savings through Load Shifting in Smart Factories, IEEE, [Piscataway,
    NJ], 2026.
  ieee: 'S. D. Mousavi and T. Schulte, <i>Enhanced Dynamic Optimization for CO2 Reduction
    and Cost Savings through Load Shifting in Smart Factories</i>. [Piscataway, NJ]:
    IEEE, 2026. doi: <a href="https://doi.org/10.1109/icecet63943.2025.11472530">10.1109/icecet63943.2025.11472530</a>.'
  mla: Mousavi, Seyed Davood, and Thomas Schulte. “Enhanced Dynamic Optimization for
    CO2 Reduction and Cost Savings through Load Shifting in Smart Factories.” <i>2025
    5th International Conference on Electrical, Computer and Energy Technologies (ICECET)</i>,
    edited by University of Buner, Pakistan; Altinbas University, Türkiye and ICECCE,
    IEEE, 2026, <a href="https://doi.org/10.1109/icecet63943.2025.11472530">https://doi.org/10.1109/icecet63943.2025.11472530</a>.
  short: S.D. Mousavi, T. Schulte, Enhanced Dynamic Optimization for CO2 Reduction
    and Cost Savings through Load Shifting in Smart Factories, IEEE, [Piscataway,
    NJ], 2026.
  ufg: '<b>Mousavi, Seyed Davood/Schulte, Thomas</b>: Enhanced Dynamic Optimization
    for CO2 Reduction and Cost Savings through Load Shifting in Smart Factories, hg.
    von University of Buner, Pakistan; Altinbas University, Türkiye, ICECCE, [Piscataway,
    NJ] 2026.'
  van: 'Mousavi SD, Schulte T. Enhanced Dynamic Optimization for CO2 Reduction and
    Cost Savings through Load Shifting in Smart Factories. University of Buner, Pakistan;
    Altinbas University, Türkiye, ICECCE, editors. 2025 5th International Conference
    on Electrical, Computer and Energy Technologies (ICECET). [Piscataway, NJ]: IEEE;
    2026.'
conference:
  end_date: 2025-07-06
  location: 'Paris, France '
  name: 5th International Conference on Electrical, Computer and Energy Technologies
    (ICECET)
  start_date: 2025-07-03
corporate_editor:
- University of Buner, Pakistan; Altinbas University, Türkiye
- ICECCE
date_created: 2026-04-10T07:15:51Z
date_updated: 2026-04-13T09:32:58Z
department:
- _id: DEP6020
- _id: DEP5022
doi: 10.1109/icecet63943.2025.11472530
keyword:
- Feeds
- Antennas
- System-on-chip
- Application specific integrated circuits
- Life cycle assessment
- Product lifecycle management
- Radio access networks
- Regional area networks
- Smart devices
- OWL
language:
- iso: eng
place: '[Piscataway, NJ]'
publication: 2025 5th International Conference on Electrical, Computer and Energy
  Technologies (ICECET)
publication_identifier:
  eisbn:
  - 979-8-3315-3559-9
publication_status: published
publisher: IEEE
status: public
title: Enhanced Dynamic Optimization for CO2 Reduction and Cost Savings through Load
  Shifting in Smart Factories
type: conference_editor_article
user_id: '83781'
year: '2026'
...
---
_id: '12995'
abstract:
- lang: eng
  text: Due to Industry 4.0 developments, the demanded modularity of manufacturing
    systems generates additional manual efforts for security experts to guarantee
    a secure operation. The rising utilization of information and the frequent changes
    of system structures necessitate a continuous and automated security engineering,
    especially by application of the mandatory security risk assessments. Collecting
    the required information for these assessments and formalising expert knowledge
    shall improve the security of modular manufacturing systems in the future. In
    order to automate the security risk assessment process, this work proposes a method
    to determine the Target Security Level (SL-T) in conformance to the IEC 62443
    standard based on the MITRE ATT&CK framework and the Intel Threat Agent Library
    (TAL).
author:
- first_name: Marco
  full_name: Ehrlich, Marco
  id: '61562'
  last_name: Ehrlich
- first_name: Andre
  full_name: Bröring, Andre
  id: '65130'
  last_name: Bröring
- first_name: Christian
  full_name: Diedrich, Christian
  last_name: Diedrich
- first_name: Jürgen
  full_name: Jasperneite, Jürgen
  id: '1899'
  last_name: Jasperneite
- first_name: Wolfgang
  full_name: Kastner, Wolfgang
  last_name: Kastner
- first_name: Henning
  full_name: Trsek, Henning
  id: '1486'
  last_name: Trsek
  orcid: 0000-0002-0133-0656
citation:
  ama: Ehrlich M, Bröring A, Diedrich C, Jasperneite J, Kastner W, Trsek H. <i>Determining
    the Target Security Level for Automated Security Risk Assessments</i>. (Jasperneite
    J, Institute of Electrical and Electronics Engineers, eds.). IEEE; 2023. doi:<a
    href="https://doi.org/10.1109/indin51400.2023.10217902">10.1109/indin51400.2023.10217902</a>
  apa: 'Ehrlich, M., Bröring, A., Diedrich, C., Jasperneite, J., Kastner, W., &#38;
    Trsek, H. (2023). Determining the Target Security Level for Automated Security
    Risk Assessments. In J. Jasperneite &#38; Institute of Electrical and Electronics
    Engineers (Eds.), <i>2023 IEEE 21st International Conference on Industrial Informatics :
    INDIN 2023 : 17-20 July 2023, Lemgo, Germany</i>. IEEE. <a href="https://doi.org/10.1109/indin51400.2023.10217902">https://doi.org/10.1109/indin51400.2023.10217902</a>'
  bjps: '<b>Ehrlich M <i>et al.</i></b> (2023) <i>Determining the Target Security
    Level for Automated Security Risk Assessments</i>, Jasperneite J and Institute
    of Electrical and Electronics Engineers (eds). [Piscataway, NJ]: IEEE.'
  chicago: 'Ehrlich, Marco, Andre Bröring, Christian Diedrich, Jürgen Jasperneite,
    Wolfgang Kastner, and Henning Trsek. <i>Determining the Target Security Level
    for Automated Security Risk Assessments</i>. Edited by Jürgen Jasperneite and
    Institute of Electrical and Electronics Engineers. <i>2023 IEEE 21st International
    Conference on Industrial Informatics : INDIN 2023 : 17-20 July 2023, Lemgo, Germany</i>.
    [Piscataway, NJ]: IEEE, 2023. <a href="https://doi.org/10.1109/indin51400.2023.10217902">https://doi.org/10.1109/indin51400.2023.10217902</a>.'
  chicago-de: 'Ehrlich, Marco, Andre Bröring, Christian Diedrich, Jürgen Jasperneite,
    Wolfgang Kastner und Henning Trsek. 2023. <i>Determining the Target Security Level
    for Automated Security Risk Assessments</i>. Hg. von Jürgen Jasperneite und Institute
    of Electrical and Electronics Engineers. <i>2023 IEEE 21st International Conference
    on Industrial Informatics : INDIN 2023 : 17-20 July 2023, Lemgo, Germany</i>.
    [Piscataway, NJ]: IEEE. doi:<a href="https://doi.org/10.1109/indin51400.2023.10217902">10.1109/indin51400.2023.10217902</a>,
    .'
  din1505-2-1: '<span style="font-variant:small-caps;">Ehrlich, Marco</span> ; <span
    style="font-variant:small-caps;">Bröring, Andre</span> ; <span style="font-variant:small-caps;">Diedrich,
    Christian</span> ; <span style="font-variant:small-caps;">Jasperneite, Jürgen</span>
    ; <span style="font-variant:small-caps;">Kastner, Wolfgang</span> ; <span style="font-variant:small-caps;">Trsek,
    Henning</span> ; <span style="font-variant:small-caps;">Jasperneite, J.</span>
    ; <span style="font-variant:small-caps;">Institute of Electrical and Electronics
    Engineers</span> (Hrsg.): <i>Determining the Target Security Level for Automated
    Security Risk Assessments</i>. [Piscataway, NJ] : IEEE, 2023'
  havard: M. Ehrlich, A. Bröring, C. Diedrich, J. Jasperneite, W. Kastner, H. Trsek,
    Determining the Target Security Level for Automated Security Risk Assessments,
    IEEE, [Piscataway, NJ], 2023.
  ieee: 'M. Ehrlich, A. Bröring, C. Diedrich, J. Jasperneite, W. Kastner, and H. Trsek,
    <i>Determining the Target Security Level for Automated Security Risk Assessments</i>.
    [Piscataway, NJ]: IEEE, 2023. doi: <a href="https://doi.org/10.1109/indin51400.2023.10217902">10.1109/indin51400.2023.10217902</a>.'
  mla: 'Ehrlich, Marco, et al. “Determining the Target Security Level for Automated
    Security Risk Assessments.” <i>2023 IEEE 21st International Conference on Industrial
    Informatics : INDIN 2023 : 17-20 July 2023, Lemgo, Germany</i>, edited by Jürgen
    Jasperneite and Institute of Electrical and Electronics Engineers, IEEE, 2023,
    <a href="https://doi.org/10.1109/indin51400.2023.10217902">https://doi.org/10.1109/indin51400.2023.10217902</a>.'
  short: M. Ehrlich, A. Bröring, C. Diedrich, J. Jasperneite, W. Kastner, H. Trsek,
    Determining the Target Security Level for Automated Security Risk Assessments,
    IEEE, [Piscataway, NJ], 2023.
  ufg: '<b>Ehrlich, Marco u. a.</b>: Determining the Target Security Level for Automated
    Security Risk Assessments, hg. von Jasperneite, Jürgen, Institute of Electrical
    and Electronics Engineers, [Piscataway, NJ] 2023.'
  van: 'Ehrlich M, Bröring A, Diedrich C, Jasperneite J, Kastner W, Trsek H. Determining
    the Target Security Level for Automated Security Risk Assessments. Jasperneite
    J, Institute of Electrical and Electronics Engineers, editors. 2023 IEEE 21st
    International Conference on Industrial Informatics : INDIN 2023 : 17-20 July 2023,
    Lemgo, Germany. [Piscataway, NJ]: IEEE; 2023.'
conference:
  end_date: 2023-07-20
  location: Lemgo
  name: 21st International Conference on Industrial Informatics (INDIN)
  start_date: 2023-07-18
corporate_editor:
- Institute of Electrical and Electronics Engineers
date_created: 2025-06-18T13:30:31Z
date_updated: 2025-06-18T13:37:07Z
department:
- _id: DEP5023
doi: 10.1109/indin51400.2023.10217902
editor:
- first_name: Jürgen
  full_name: Jasperneite, Jürgen
  id: '1899'
  last_name: Jasperneite
keyword:
- Integrated circuits
- Industries
- Libraries
- Security
- Risk management
- IEC Standards
- Interviews
language:
- iso: eng
place: '[Piscataway, NJ]'
publication: '2023 IEEE 21st International Conference on Industrial Informatics :
  INDIN 2023 : 17-20 July 2023, Lemgo, Germany'
publication_identifier:
  eisbn:
  - 978-1-6654-9313-0
  isbn:
  - 978-1-6654-9314-7
publication_status: published
publisher: IEEE
status: public
title: Determining the Target Security Level for Automated Security Risk Assessments
type: conference_editor_article
user_id: '83781'
year: '2023'
...