[{"abstract":[{"lang":"eng","text":"With the human factor being identified as the weakest link in the chain of information security, we investigate the effects of the COVID-19 pandemic on approaches to develop awareness trainings. Following the literature approach of vom Brocke, we identify five focus areas in recent literature which we are able to divide further into supporting effects and human factors for information security awareness trainings. Furthermore, we identify research gaps in current literature which can inspire future investigations."}],"page":"16","conference":{"name":"19. Internationale Tagung Wirtschaftsinformatik","end_date":"2024-09-19","start_date":"2024-09-16","location":"Würzburg"},"keyword":["Information Security","Literature Review","Human Factor","Education","Awareness"],"status":"public","user_id":"83781","year":"2024","corporate_editor":["Association for Information Systems "],"department":[{"_id":"DEP1523"}],"date_updated":"2025-07-22T07:00:14Z","publisher":"WI","type":"conference_editor_article","oa":"1","_id":"11915","publication":"Wirtschaftsinformatik 2024 Proceedings","main_file_link":[{"url":"https://aisel.aisnet.org/wi2024/124","open_access":"1"}],"title":"Recent Insights in Information Security Awareness Training: A Systematic Literature Review ","citation":{"din1505-2-1":"<span style=\"font-variant:small-caps;\">Meister, Robin</span> ; <span style=\"font-variant:small-caps;\">Guhr, Nadine</span> ; <span style=\"font-variant:small-caps;\">Association for Information Systems </span> (Hrsg.): <i>Recent Insights in Information Security Awareness Training: A Systematic Literature Review </i>. Würzburg : WI, 2024","mla":"Meister, Robin, and Nadine Guhr. “Recent Insights in Information Security Awareness Training: A Systematic Literature Review .” <i>Wirtschaftsinformatik 2024 Proceedings</i>, edited by Association for Information Systems , WI, 2024, p. 16.","apa":"Meister, R., &#38; Guhr, N. (2024). Recent Insights in Information Security Awareness Training: A Systematic Literature Review . In Association for Information Systems  (Ed.), <i>Wirtschaftsinformatik 2024 Proceedings</i> (p. 16). WI.","bjps":"<b>Meister R and Guhr N</b> (2024) <i>Recent Insights in Information Security Awareness Training: A Systematic Literature Review </i>, Association for Information Systems  (ed.). Würzburg: WI.","short":"R. Meister, N. Guhr, Recent Insights in Information Security Awareness Training: A Systematic Literature Review , WI, Würzburg, 2024.","chicago-de":"Meister, Robin und Nadine Guhr. 2024. <i>Recent Insights in Information Security Awareness Training: A Systematic Literature Review </i>. Hg. von Association for Information Systems . <i>Wirtschaftsinformatik 2024 Proceedings</i>. Würzburg: WI.","chicago":"Meister, Robin, and Nadine Guhr. <i>Recent Insights in Information Security Awareness Training: A Systematic Literature Review </i>. Edited by Association for Information Systems . <i>Wirtschaftsinformatik 2024 Proceedings</i>. Würzburg: WI, 2024.","ufg":"<b>Meister, Robin/Guhr, Nadine</b>: Recent Insights in Information Security Awareness Training: A Systematic Literature Review , hg. von Association for Information Systems , Würzburg 2024.","ieee":"R. Meister and N. Guhr, <i>Recent Insights in Information Security Awareness Training: A Systematic Literature Review </i>. Würzburg: WI, 2024, p. 16.","havard":"R. Meister, N. Guhr, Recent Insights in Information Security Awareness Training: A Systematic Literature Review , WI, Würzburg, 2024.","van":"Meister R, Guhr N. Recent Insights in Information Security Awareness Training: A Systematic Literature Review . Association for Information Systems , editor. Wirtschaftsinformatik 2024 Proceedings. Würzburg: WI; 2024.","ama":"Meister R, Guhr N. <i>Recent Insights in Information Security Awareness Training: A Systematic Literature Review </i>. (Association for Information Systems , ed.). WI; 2024:16."},"place":"Würzburg","publication_status":"published","language":[{"iso":"eng"}],"date_created":"2024-09-17T11:03:28Z","author":[{"first_name":"Robin","last_name":"Meister","id":"81256","full_name":"Meister, Robin"},{"orcid":"0000-0001-8812-1488","first_name":"Nadine","full_name":"Guhr, Nadine","id":"77748","last_name":"Guhr"}]},{"_id":"12831","publication":"2024 IEEE 20th International Conference on Factory Communication Systems (WFCS)","series_title":"IEEE International Workshop on Factory Communication Systems","title":"Requirements Analysis for the Evaluation of Automated Security Risk Assessments","publication_status":"published","language":[{"iso":"eng"}],"date_created":"2025-04-23T07:50:00Z","citation":{"ieee":"M. Ehrlich, G. Lukas, H. Trsek, J. Jasperneite, W. Kastner, and C. Diedrich, <i>Requirements Analysis for the Evaluation of Automated Security Risk Assessments</i>. [Piscataway, NJ]: IEEE, 2024, pp. 180–183. doi: <a href=\"https://doi.org/10.1109/wfcs60972.2024.10540830\">10.1109/wfcs60972.2024.10540830</a>.","havard":"M. Ehrlich, G. Lukas, H. Trsek, J. Jasperneite, W. Kastner, C. Diedrich, Requirements Analysis for the Evaluation of Automated Security Risk Assessments, IEEE, [Piscataway, NJ], 2024.","van":"Ehrlich M, Lukas G, Trsek H, Jasperneite J, Kastner W, Diedrich C. Requirements Analysis for the Evaluation of Automated Security Risk Assessments. 2024 IEEE 20th International Conference on Factory Communication Systems (WFCS). [Piscataway, NJ]: IEEE; 2024. (IEEE International Workshop on Factory Communication Systems).","ama":"Ehrlich M, Lukas G, Trsek H, Jasperneite J, Kastner W, Diedrich C. <i>Requirements Analysis for the Evaluation of Automated Security Risk Assessments</i>. IEEE; 2024:180-183. doi:<a href=\"https://doi.org/10.1109/wfcs60972.2024.10540830\">10.1109/wfcs60972.2024.10540830</a>","din1505-2-1":"<span style=\"font-variant:small-caps;\">Ehrlich, Marco</span> ; <span style=\"font-variant:small-caps;\">Lukas, Georg</span> ; <span style=\"font-variant:small-caps;\">Trsek, Henning</span> ; <span style=\"font-variant:small-caps;\">Jasperneite, Jürgen</span> ; <span style=\"font-variant:small-caps;\">Kastner, Wolfgang</span> ; <span style=\"font-variant:small-caps;\">Diedrich, Christian</span>: <i>Requirements Analysis for the Evaluation of Automated Security Risk Assessments</i>, <i>IEEE International Workshop on Factory Communication Systems</i>. [Piscataway, NJ] : IEEE, 2024","mla":"Ehrlich, Marco, et al. “Requirements Analysis for the Evaluation of Automated Security Risk Assessments.” <i>2024 IEEE 20th International Conference on Factory Communication Systems (WFCS)</i>, IEEE, 2024, pp. 180–83, <a href=\"https://doi.org/10.1109/wfcs60972.2024.10540830\">https://doi.org/10.1109/wfcs60972.2024.10540830</a>.","apa":"Ehrlich, M., Lukas, G., Trsek, H., Jasperneite, J., Kastner, W., &#38; Diedrich, C. (2024). Requirements Analysis for the Evaluation of Automated Security Risk Assessments. In <i>2024 IEEE 20th International Conference on Factory Communication Systems (WFCS)</i> (pp. 180–183). IEEE. <a href=\"https://doi.org/10.1109/wfcs60972.2024.10540830\">https://doi.org/10.1109/wfcs60972.2024.10540830</a>","bjps":"<b>Ehrlich M <i>et al.</i></b> (2024) <i>Requirements Analysis for the Evaluation of Automated Security Risk Assessments</i>. [Piscataway, NJ]: IEEE.","short":"M. Ehrlich, G. Lukas, H. Trsek, J. Jasperneite, W. Kastner, C. Diedrich, Requirements Analysis for the Evaluation of Automated Security Risk Assessments, IEEE, [Piscataway, NJ], 2024.","chicago-de":"Ehrlich, Marco, Georg Lukas, Henning Trsek, Jürgen Jasperneite, Wolfgang Kastner und Christian Diedrich. 2024. <i>Requirements Analysis for the Evaluation of Automated Security Risk Assessments</i>. <i>2024 IEEE 20th International Conference on Factory Communication Systems (WFCS)</i>. IEEE International Workshop on Factory Communication Systems. [Piscataway, NJ]: IEEE. doi:<a href=\"https://doi.org/10.1109/wfcs60972.2024.10540830\">10.1109/wfcs60972.2024.10540830</a>, .","chicago":"Ehrlich, Marco, Georg Lukas, Henning Trsek, Jürgen Jasperneite, Wolfgang Kastner, and Christian Diedrich. <i>Requirements Analysis for the Evaluation of Automated Security Risk Assessments</i>. <i>2024 IEEE 20th International Conference on Factory Communication Systems (WFCS)</i>. IEEE International Workshop on Factory Communication Systems. [Piscataway, NJ]: IEEE, 2024. <a href=\"https://doi.org/10.1109/wfcs60972.2024.10540830\">https://doi.org/10.1109/wfcs60972.2024.10540830</a>.","ufg":"<b>Ehrlich, Marco u. a.</b>: Requirements Analysis for the Evaluation of Automated Security Risk Assessments, [Piscataway, NJ] 2024 (IEEE International Workshop on Factory Communication Systems)."},"place":"[Piscataway, NJ]","publication_identifier":{"eisbn":["979-8-3503-1934-7"],"isbn":["979-8-3503-1935-4","979-8-3503-1933-0"],"issn":["2835-8511"]},"author":[{"first_name":"Marco","last_name":"Ehrlich","id":"61562","full_name":"Ehrlich, Marco"},{"full_name":"Lukas, Georg","last_name":"Lukas","first_name":"Georg"},{"orcid":"0000-0002-0133-0656","full_name":"Trsek, Henning","id":"1486","last_name":"Trsek","first_name":"Henning"},{"id":"1899","last_name":"Jasperneite","full_name":"Jasperneite, Jürgen","first_name":"Jürgen"},{"last_name":"Kastner","full_name":"Kastner, Wolfgang","first_name":"Wolfgang"},{"last_name":"Diedrich","full_name":"Diedrich, Christian","first_name":"Christian"}],"conference":{"location":"Toulouse, FRANCE","start_date":"2024-04-17","end_date":"2024-04-19","name":"20th International Conference on Factory Communication Systems (WFCS)"},"page":"180-183","abstract":[{"text":"The overall Industry 4.0 developments and the highly dynamic threat landscape enhance the need for continuous security engineering of industrial components, modules, and systems. Security risk assessments play a major role to ensure a secure operation of Industrial Automation and Control Systems (IACSs) but are mostly neglected due to missing resources and a lack of human experts for the sophisticated manual tasks. Therefore, a method for information and process modelling regarding the automation of security risk assessments has been previously designed, but not yet evaluated. This work in progress begins the evaluation of the automated security risk assessment concept by investigating the related work and identifying the main deficits. The results include a requirements analysis for the verification and an outlook towards future evaluation aspects.","lang":"eng"}],"keyword":["Industry 4.0","Security","Risk Assessment","Automation","Requirements","Evaluation","Verification"],"status":"public","department":[{"_id":"DEP5023"}],"year":"2024","user_id":"83781","date_updated":"2025-06-25T12:59:44Z","doi":"10.1109/wfcs60972.2024.10540830","publisher":"IEEE","type":"conference_editor_article"},{"_id":"12875","publication":"Automatisierungstechnik : AT ","title":"Towards automated risk assessments for modular manufacturing systems","alternative_title":["Process analysis and information model proposal"],"place":"Berlin","citation":{"short":"M. Ehrlich, A. Bröring, C. Diedrich, J. Jasperneite, Automatisierungstechnik : AT  71 (2023) 453–466.","apa":"Ehrlich, M., Bröring, A., Diedrich, C., &#38; Jasperneite, J. (2023). Towards automated risk assessments for modular manufacturing systems. <i>Automatisierungstechnik : AT </i>, <i>71</i>(6), 453–466. <a href=\"https://doi.org/10.1515/auto-2022-0098\">https://doi.org/10.1515/auto-2022-0098</a>","mla":"Ehrlich, Marco, et al. “Towards Automated Risk Assessments for Modular Manufacturing Systems.” <i>Automatisierungstechnik : AT </i>, vol. 71, no. 6, 2023, pp. 453–66, <a href=\"https://doi.org/10.1515/auto-2022-0098\">https://doi.org/10.1515/auto-2022-0098</a>.","ufg":"<b>Ehrlich, Marco u. a.</b>: Towards automated risk assessments for modular manufacturing systems, in: <i>Automatisierungstechnik : AT </i> 71 (2023), H. 6,  S. 453–466.","chicago-de":"Ehrlich, Marco, Andre Bröring, Christian Diedrich und Jürgen Jasperneite. 2023. Towards automated risk assessments for modular manufacturing systems. <i>Automatisierungstechnik : AT </i> 71, Nr. 6: 453–466. doi:<a href=\"https://doi.org/10.1515/auto-2022-0098\">10.1515/auto-2022-0098</a>, .","havard":"M. Ehrlich, A. Bröring, C. Diedrich, J. Jasperneite, Towards automated risk assessments for modular manufacturing systems, Automatisierungstechnik : AT . 71 (2023) 453–466.","bjps":"<b>Ehrlich M <i>et al.</i></b> (2023) Towards Automated Risk Assessments for Modular Manufacturing Systems. <i>Automatisierungstechnik : AT </i> <b>71</b>, 453–466.","din1505-2-1":"<span style=\"font-variant:small-caps;\">Ehrlich, Marco</span> ; <span style=\"font-variant:small-caps;\">Bröring, Andre</span> ; <span style=\"font-variant:small-caps;\">Diedrich, Christian</span> ; <span style=\"font-variant:small-caps;\">Jasperneite, Jürgen</span>: Towards automated risk assessments for modular manufacturing systems. In: <i>Automatisierungstechnik : AT </i> Bd. 71. Berlin, Walter de Gruyter GmbH (2023), Nr. 6, S. 453–466","chicago":"Ehrlich, Marco, Andre Bröring, Christian Diedrich, and Jürgen Jasperneite. “Towards Automated Risk Assessments for Modular Manufacturing Systems.” <i>Automatisierungstechnik : AT </i> 71, no. 6 (2023): 453–66. <a href=\"https://doi.org/10.1515/auto-2022-0098\">https://doi.org/10.1515/auto-2022-0098</a>.","ieee":"M. Ehrlich, A. Bröring, C. Diedrich, and J. Jasperneite, “Towards automated risk assessments for modular manufacturing systems,” <i>Automatisierungstechnik : AT </i>, vol. 71, no. 6, pp. 453–466, 2023, doi: <a href=\"https://doi.org/10.1515/auto-2022-0098\">10.1515/auto-2022-0098</a>.","van":"Ehrlich M, Bröring A, Diedrich C, Jasperneite J. Towards automated risk assessments for modular manufacturing systems. Automatisierungstechnik : AT . 2023;71(6):453–66.","ama":"Ehrlich M, Bröring A, Diedrich C, Jasperneite J. Towards automated risk assessments for modular manufacturing systems. <i>Automatisierungstechnik : AT </i>. 2023;71(6):453-466. doi:<a href=\"https://doi.org/10.1515/auto-2022-0098\">10.1515/auto-2022-0098</a>"},"date_created":"2025-04-29T07:17:44Z","language":[{"iso":"eng"}],"volume":71,"publication_status":"published","isi":"1","author":[{"last_name":"Ehrlich","id":"61562","full_name":"Ehrlich, Marco","first_name":"Marco"},{"full_name":"Bröring, Andre","id":"65130","last_name":"Bröring","first_name":"Andre"},{"full_name":"Diedrich, Christian","last_name":"Diedrich","first_name":"Christian"},{"id":"1899","last_name":"Jasperneite","full_name":"Jasperneite, Jürgen","first_name":"Jürgen"}],"intvolume":"        71","publication_identifier":{"issn":["0178-2312"],"eissn":["2196-677X"]},"abstract":[{"lang":"eng","text":"Manufacturing systems based on Industry 4.0 concepts provide a greater availability of data and have modular characteristics enabling frequent changes. This raises the need for new security engineering concepts that cover the increasing complexity and frequency of mandatory security risk assessments. In contrast, the current standardization landscape used for the assessment of these systems only offers abstract, static, manual, and resource-intensive procedures. Therefore, this work proposes a method that further specifies the IEC 62443 aiming to automate the security risk assessments in such a way that manual efforts can be reduced and a consistent quality can be achieved. The methodology is presented using network segmentation as a guiding example and consists of four main steps: Information collection based on a process analysis, information formalisation with a semi-formal model, information usage applying first order logic to extract expert knowledge, and information access using the concept of the digital twin. In addition, the applicability of the IEC 62443 standard to the risk assessment of modular manufacturing systems is evaluated."}],"page":"453-466","keyword":["sasset administration shell","automation","information model","modular manufacturing system","risk assessment","security"],"status":"public","user_id":"83781","year":"2023","department":[{"_id":"DEP5023"}],"doi":"10.1515/auto-2022-0098","date_updated":"2025-06-25T13:14:59Z","external_id":{"isi":["001004217900004"]},"issue":"6","publisher":"Walter de Gruyter GmbH","type":"scientific_journal_article"},{"editor":[{"first_name":"Jürgen","full_name":"Jasperneite, Jürgen","id":"1899","last_name":"Jasperneite"}],"publisher":"IEEE","type":"conference_editor_article","doi":"10.1109/indin51400.2023.10217902","date_updated":"2025-06-18T13:37:07Z","status":"public","year":"2023","user_id":"83781","corporate_editor":["Institute of Electrical and Electronics Engineers"],"department":[{"_id":"DEP5023"}],"abstract":[{"text":"Due to Industry 4.0 developments, the demanded modularity of manufacturing systems generates additional manual efforts for security experts to guarantee a secure operation. The rising utilization of information and the frequent changes of system structures necessitate a continuous and automated security engineering, especially by application of the mandatory security risk assessments. Collecting the required information for these assessments and formalising expert knowledge shall improve the security of modular manufacturing systems in the future. In order to automate the security risk assessment process, this work proposes a method to determine the Target Security Level (SL-T) in conformance to the IEC 62443 standard based on the MITRE ATT&CK framework and the Intel Threat Agent Library (TAL).","lang":"eng"}],"conference":{"name":"21st International Conference on Industrial Informatics (INDIN)","start_date":"2023-07-18","end_date":"2023-07-20","location":"Lemgo"},"keyword":["Integrated circuits","Industries","Libraries","Security","Risk management","IEC Standards","Interviews"],"citation":{"chicago":"Ehrlich, Marco, Andre Bröring, Christian Diedrich, Jürgen Jasperneite, Wolfgang Kastner, and Henning Trsek. <i>Determining the Target Security Level for Automated Security Risk Assessments</i>. Edited by Jürgen Jasperneite and Institute of Electrical and Electronics Engineers. <i>2023 IEEE 21st International Conference on Industrial Informatics : INDIN 2023 : 17-20 July 2023, Lemgo, Germany</i>. [Piscataway, NJ]: IEEE, 2023. <a href=\"https://doi.org/10.1109/indin51400.2023.10217902\">https://doi.org/10.1109/indin51400.2023.10217902</a>.","din1505-2-1":"<span style=\"font-variant:small-caps;\">Ehrlich, Marco</span> ; <span style=\"font-variant:small-caps;\">Bröring, Andre</span> ; <span style=\"font-variant:small-caps;\">Diedrich, Christian</span> ; <span style=\"font-variant:small-caps;\">Jasperneite, Jürgen</span> ; <span style=\"font-variant:small-caps;\">Kastner, Wolfgang</span> ; <span style=\"font-variant:small-caps;\">Trsek, Henning</span> ; <span style=\"font-variant:small-caps;\">Jasperneite, J.</span> ; <span style=\"font-variant:small-caps;\">Institute of Electrical and Electronics Engineers</span> (Hrsg.): <i>Determining the Target Security Level for Automated Security Risk Assessments</i>. [Piscataway, NJ] : IEEE, 2023","bjps":"<b>Ehrlich M <i>et al.</i></b> (2023) <i>Determining the Target Security Level for Automated Security Risk Assessments</i>, Jasperneite J and Institute of Electrical and Electronics Engineers (eds). [Piscataway, NJ]: IEEE.","ama":"Ehrlich M, Bröring A, Diedrich C, Jasperneite J, Kastner W, Trsek H. <i>Determining the Target Security Level for Automated Security Risk Assessments</i>. (Jasperneite J, Institute of Electrical and Electronics Engineers, eds.). IEEE; 2023. doi:<a href=\"https://doi.org/10.1109/indin51400.2023.10217902\">10.1109/indin51400.2023.10217902</a>","van":"Ehrlich M, Bröring A, Diedrich C, Jasperneite J, Kastner W, Trsek H. Determining the Target Security Level for Automated Security Risk Assessments. Jasperneite J, Institute of Electrical and Electronics Engineers, editors. 2023 IEEE 21st International Conference on Industrial Informatics : INDIN 2023 : 17-20 July 2023, Lemgo, Germany. [Piscataway, NJ]: IEEE; 2023.","ieee":"M. Ehrlich, A. Bröring, C. Diedrich, J. Jasperneite, W. Kastner, and H. Trsek, <i>Determining the Target Security Level for Automated Security Risk Assessments</i>. [Piscataway, NJ]: IEEE, 2023. doi: <a href=\"https://doi.org/10.1109/indin51400.2023.10217902\">10.1109/indin51400.2023.10217902</a>.","chicago-de":"Ehrlich, Marco, Andre Bröring, Christian Diedrich, Jürgen Jasperneite, Wolfgang Kastner und Henning Trsek. 2023. <i>Determining the Target Security Level for Automated Security Risk Assessments</i>. Hg. von Jürgen Jasperneite und Institute of Electrical and Electronics Engineers. <i>2023 IEEE 21st International Conference on Industrial Informatics : INDIN 2023 : 17-20 July 2023, Lemgo, Germany</i>. [Piscataway, NJ]: IEEE. doi:<a href=\"https://doi.org/10.1109/indin51400.2023.10217902\">10.1109/indin51400.2023.10217902</a>, .","ufg":"<b>Ehrlich, Marco u. a.</b>: Determining the Target Security Level for Automated Security Risk Assessments, hg. von Jasperneite, Jürgen, Institute of Electrical and Electronics Engineers, [Piscataway, NJ] 2023.","mla":"Ehrlich, Marco, et al. “Determining the Target Security Level for Automated Security Risk Assessments.” <i>2023 IEEE 21st International Conference on Industrial Informatics : INDIN 2023 : 17-20 July 2023, Lemgo, Germany</i>, edited by Jürgen Jasperneite and Institute of Electrical and Electronics Engineers, IEEE, 2023, <a href=\"https://doi.org/10.1109/indin51400.2023.10217902\">https://doi.org/10.1109/indin51400.2023.10217902</a>.","apa":"Ehrlich, M., Bröring, A., Diedrich, C., Jasperneite, J., Kastner, W., &#38; Trsek, H. (2023). Determining the Target Security Level for Automated Security Risk Assessments. In J. Jasperneite &#38; Institute of Electrical and Electronics Engineers (Eds.), <i>2023 IEEE 21st International Conference on Industrial Informatics : INDIN 2023 : 17-20 July 2023, Lemgo, Germany</i>. IEEE. <a href=\"https://doi.org/10.1109/indin51400.2023.10217902\">https://doi.org/10.1109/indin51400.2023.10217902</a>","short":"M. Ehrlich, A. Bröring, C. Diedrich, J. Jasperneite, W. Kastner, H. Trsek, Determining the Target Security Level for Automated Security Risk Assessments, IEEE, [Piscataway, NJ], 2023.","havard":"M. Ehrlich, A. Bröring, C. Diedrich, J. Jasperneite, W. Kastner, H. Trsek, Determining the Target Security Level for Automated Security Risk Assessments, IEEE, [Piscataway, NJ], 2023."},"place":"[Piscataway, NJ]","publication_status":"published","date_created":"2025-06-18T13:30:31Z","language":[{"iso":"eng"}],"author":[{"first_name":"Marco","full_name":"Ehrlich, Marco","id":"61562","last_name":"Ehrlich"},{"first_name":"Andre","id":"65130","last_name":"Bröring","full_name":"Bröring, Andre"},{"full_name":"Diedrich, Christian","last_name":"Diedrich","first_name":"Christian"},{"full_name":"Jasperneite, Jürgen","last_name":"Jasperneite","id":"1899","first_name":"Jürgen"},{"full_name":"Kastner, Wolfgang","last_name":"Kastner","first_name":"Wolfgang"},{"orcid":"0000-0002-0133-0656","first_name":"Henning","full_name":"Trsek, Henning","last_name":"Trsek","id":"1486"}],"publication_identifier":{"isbn":["978-1-6654-9314-7"],"eisbn":["978-1-6654-9313-0"]},"title":"Determining the Target Security Level for Automated Security Risk Assessments","publication":"2023 IEEE 21st International Conference on Industrial Informatics : INDIN 2023 : 17-20 July 2023, Lemgo, Germany","_id":"12995"},{"abstract":[{"text":"n order to ensure the safety and security of industrial systems with regard to all life cycle phases from development through operation to disposal, specific regulatory and normative requirements are imposed. Due to the digitalization, interconnection, and constantly increasing complexity of manufacturing systems in the context of Industrie 4.0, the manual effort necessary to achieve the required safety and security is becoming ever greater and almost impossible to manage, especially for small and medium-sized enterprises. Therefore, this paper examines the existing challenges in this area in more detail and gives an outlook on the possible solutions to ensure safety and security much quicker and with less manual effort. The overall vision is a (partially) automated risk assessment of modular systems with respect to safety and security, including the alignment of the corresponding processes from both domains and the formalization of the information models needed.","lang":"eng"}],"page":"454-461","keyword":["safety","security","alignment","automation","processes","models"],"status":"public","year":"2021","user_id":"83781","department":[{"_id":"DEP5019"},{"_id":"DEP5023"}],"date_updated":"2025-06-26T13:28:58Z","doi":"10.1007/s00502-021-00927-9","external_id":{"isi":["000696142100001"]},"issue":"6","publisher":"Springer","type":"journal_article","_id":"6932","publication":"Elektrotechnik und Informationstechnik : e & i","title":"Alignment of safety and security risk assessments for modular production systems","citation":{"ama":"Ehrlich M, Bröring A, Harder D, et al. Alignment of safety and security risk assessments for modular production systems. <i>Elektrotechnik und Informationstechnik : e &#38; i</i>. 2021;138(6):454-461. doi:<a href=\"https://doi.org/10.1007/s00502-021-00927-9\">10.1007/s00502-021-00927-9</a>","van":"Ehrlich M, Bröring A, Harder D, Auhagen-Meyer T, Kleen P, Wisniewski L, et al. Alignment of safety and security risk assessments for modular production systems. Elektrotechnik und Informationstechnik : e &#38; i. 2021;138(6):454–61.","havard":"M. Ehrlich, A. Bröring, D. Harder, T. Auhagen-Meyer, P. Kleen, L. Wisniewski, H. Trsek, J. Jasperneite, Alignment of safety and security risk assessments for modular production systems, Elektrotechnik Und Informationstechnik : E &#38; i. 138 (2021) 454–461.","ieee":"M. Ehrlich <i>et al.</i>, “Alignment of safety and security risk assessments for modular production systems,” <i>Elektrotechnik und Informationstechnik : e &#38; i</i>, vol. 138, no. 6, pp. 454–461, 2021, doi: <a href=\"https://doi.org/10.1007/s00502-021-00927-9\">10.1007/s00502-021-00927-9</a>.","chicago-de":"Ehrlich, Marco, Andre Bröring, Dimitri Harder, Torben Auhagen-Meyer, Philip Kleen, Lukasz Wisniewski, Henning Trsek und Jürgen Jasperneite. 2021. Alignment of safety and security risk assessments for modular production systems. <i>Elektrotechnik und Informationstechnik : e &#38; i</i> 138, Nr. 6: 454–461. doi:<a href=\"https://doi.org/10.1007/s00502-021-00927-9\">10.1007/s00502-021-00927-9</a>, .","chicago":"Ehrlich, Marco, Andre Bröring, Dimitri Harder, Torben Auhagen-Meyer, Philip Kleen, Lukasz Wisniewski, Henning Trsek, and Jürgen Jasperneite. “Alignment of Safety and Security Risk Assessments for Modular Production Systems.” <i>Elektrotechnik Und Informationstechnik : E &#38; i</i> 138, no. 6 (2021): 454–61. <a href=\"https://doi.org/10.1007/s00502-021-00927-9\">https://doi.org/10.1007/s00502-021-00927-9</a>.","ufg":"<b>Ehrlich, Marco u. a.</b>: Alignment of safety and security risk assessments for modular production systems, in: <i>Elektrotechnik und Informationstechnik : e &#38; i</i> 138 (2021), H. 6,  S. 454–461.","apa":"Ehrlich, M., Bröring, A., Harder, D., Auhagen-Meyer, T., Kleen, P., Wisniewski, L., Trsek, H., &#38; Jasperneite, J. (2021). Alignment of safety and security risk assessments for modular production systems. <i>Elektrotechnik Und Informationstechnik : E &#38; i</i>, <i>138</i>(6), 454–461. <a href=\"https://doi.org/10.1007/s00502-021-00927-9\">https://doi.org/10.1007/s00502-021-00927-9</a>","mla":"Ehrlich, Marco, et al. “Alignment of Safety and Security Risk Assessments for Modular Production Systems.” <i>Elektrotechnik Und Informationstechnik : E &#38; i</i>, vol. 138, no. 6, 2021, pp. 454–61, <a href=\"https://doi.org/10.1007/s00502-021-00927-9\">https://doi.org/10.1007/s00502-021-00927-9</a>.","din1505-2-1":"<span style=\"font-variant:small-caps;\">Ehrlich, Marco</span> ; <span style=\"font-variant:small-caps;\">Bröring, Andre</span> ; <span style=\"font-variant:small-caps;\">Harder, Dimitri</span> ; <span style=\"font-variant:small-caps;\">Auhagen-Meyer, Torben</span> ; <span style=\"font-variant:small-caps;\">Kleen, Philip</span> ; <span style=\"font-variant:small-caps;\">Wisniewski, Lukasz</span> ; <span style=\"font-variant:small-caps;\">Trsek, Henning</span> ; <span style=\"font-variant:small-caps;\">Jasperneite, Jürgen</span>: Alignment of safety and security risk assessments for modular production systems. In: <i>Elektrotechnik und Informationstechnik : e &#38; i</i> Bd. 138, Springer (2021), Nr. 6, S. 454–461","short":"M. Ehrlich, A. Bröring, D. Harder, T. Auhagen-Meyer, P. Kleen, L. Wisniewski, H. Trsek, J. Jasperneite, Elektrotechnik Und Informationstechnik : E &#38; i 138 (2021) 454–461.","bjps":"<b>Ehrlich M <i>et al.</i></b> (2021) Alignment of Safety and Security Risk Assessments for Modular Production Systems. <i>Elektrotechnik und Informationstechnik : e &#38; i</i> <b>138</b>, 454–461."},"publication_status":"published","volume":138,"date_created":"2021-12-23T17:37:45Z","language":[{"iso":"eng"}],"author":[{"first_name":"Marco","full_name":"Ehrlich, Marco","id":"61562","last_name":"Ehrlich"},{"full_name":"Bröring, Andre","id":"65130","last_name":"Bröring","first_name":"Andre"},{"id":"69147","last_name":"Harder","full_name":"Harder, Dimitri","first_name":"Dimitri"},{"first_name":"Torben","full_name":"Auhagen-Meyer, Torben","last_name":"Auhagen-Meyer"},{"full_name":"Kleen, Philip","last_name":"Kleen","id":"44776","first_name":"Philip"},{"full_name":"Wisniewski, Lukasz","id":"1710","last_name":"Wisniewski","first_name":"Lukasz"},{"first_name":"Henning","full_name":"Trsek, Henning","id":"1486","last_name":"Trsek","orcid":"0000-0002-0133-0656"},{"first_name":"Jürgen","full_name":"Jasperneite, Jürgen","last_name":"Jasperneite","id":"1899"}],"intvolume":"       138","isi":"1","publication_identifier":{"issn":["0932-383X"],"eissn":["1613-7620"]}},{"year":"2020","user_id":"83781","department":[{"_id":"DEP5023"}],"status":"public","publication":"25th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)","_id":"11147","keyword":["Security","Automation","OT","Sec4ICS","iRefA"],"abstract":[{"text":"The current developments towards the visions of Industrie 4.0 will create open and dynamic architectures being supervised by Industrial Automation and Control Systems. Due to this new connectivity and flexibility, future industrial production systems need to be inspected during all phases of the whole lifecycle from a security point of view as well. Frequent reconfiguration and adaptation based on smart services impose advanced requirements on the audits and certification with regard to security. To facilitate that, this work presents an approach for the modeling of security requirements and capabilities within the Industrial Reference Architecture and evaluates it based on the concrete system architectures of a number of industrial use cases. The result is the Sec4ICS tooling-based concept for the automated assessment of security-related functionalities within industrial systems.","lang":"eng"}],"page":"1640-1647","conference":{"location":"Wien","end_date":"2020-09-11","start_date":"2020-09-08","name":"25th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)"},"type":"conference","author":[{"first_name":"Marco","last_name":"Ehrlich","id":"61562","full_name":"Ehrlich, Marco"},{"full_name":"Gergeleit, Martin","last_name":"Gergeleit","first_name":"Martin"},{"last_name":"Trsek","id":"1486","full_name":"Trsek, Henning","first_name":"Henning","orcid":"0000-0002-0133-0656"},{"last_name":"Lukas","full_name":"Lukas, Georg","first_name":"Georg"}],"publication_identifier":{"eissn":["1946-0759"],"issn":["1946-0740"],"isbn":["978-1-7281-8957-4"],"eisbn":[" 978-1-7281-8956-7 "]},"place":"Piscataway, NJ","citation":{"din1505-2-1":"<span style=\"font-variant:small-caps;\">Ehrlich, Marco</span> ; <span style=\"font-variant:small-caps;\">Gergeleit, Martin</span> ; <span style=\"font-variant:small-caps;\">Trsek, Henning</span> ; <span style=\"font-variant:small-caps;\">Lukas, Georg</span>: Towards Automated Security Evaluation within the Industrial Reference Architecture. In: <i>25th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)</i>. Piscataway, NJ : IEEE, 2020, S. 1640–1647","bjps":"<b>Ehrlich M <i>et al.</i></b> (2020) Towards Automated Security Evaluation within the Industrial Reference Architecture. <i>25th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)</i>. Piscataway, NJ: IEEE, pp. 1640–1647.","chicago":"Ehrlich, Marco, Martin Gergeleit, Henning Trsek, and Georg Lukas. “Towards Automated Security Evaluation within the Industrial Reference Architecture.” In <i>25th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)</i>, 1640–47. Piscataway, NJ: IEEE, 2020. <a href=\"https://doi.org/10.1109/ETFA46521.2020.9211883\">https://doi.org/10.1109/ETFA46521.2020.9211883</a>.","ieee":"M. Ehrlich, M. Gergeleit, H. Trsek, and G. Lukas, “Towards Automated Security Evaluation within the Industrial Reference Architecture,” in <i>25th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)</i>, Wien, 2020, pp. 1640–1647. doi: <a href=\"https://doi.org/10.1109/ETFA46521.2020.9211883\">10.1109/ETFA46521.2020.9211883</a>.","ama":"Ehrlich M, Gergeleit M, Trsek H, Lukas G. Towards Automated Security Evaluation within the Industrial Reference Architecture. In: <i>25th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)</i>. IEEE; 2020:1640-1647. doi:<a href=\"https://doi.org/10.1109/ETFA46521.2020.9211883\">10.1109/ETFA46521.2020.9211883</a>","van":"Ehrlich M, Gergeleit M, Trsek H, Lukas G. Towards Automated Security Evaluation within the Industrial Reference Architecture. In: 25th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA). Piscataway, NJ: IEEE; 2020. p. 1640–7.","mla":"Ehrlich, Marco, et al. “Towards Automated Security Evaluation within the Industrial Reference Architecture.” <i>25th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)</i>, IEEE, 2020, pp. 1640–47, <a href=\"https://doi.org/10.1109/ETFA46521.2020.9211883\">https://doi.org/10.1109/ETFA46521.2020.9211883</a>.","apa":"Ehrlich, M., Gergeleit, M., Trsek, H., &#38; Lukas, G. (2020). Towards Automated Security Evaluation within the Industrial Reference Architecture. <i>25th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)</i>, 1640–1647. <a href=\"https://doi.org/10.1109/ETFA46521.2020.9211883\">https://doi.org/10.1109/ETFA46521.2020.9211883</a>","short":"M. Ehrlich, M. Gergeleit, H. Trsek, G. Lukas, in: 25th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA), IEEE, Piscataway, NJ, 2020, pp. 1640–1647.","chicago-de":"Ehrlich, Marco, Martin Gergeleit, Henning Trsek und Georg Lukas. 2020. Towards Automated Security Evaluation within the Industrial Reference Architecture. In: <i>25th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)</i>, 1640–1647. Piscataway, NJ: IEEE. doi:<a href=\"https://doi.org/10.1109/ETFA46521.2020.9211883\">10.1109/ETFA46521.2020.9211883</a>, .","ufg":"<b>Ehrlich, Marco u. a.</b>: Towards Automated Security Evaluation within the Industrial Reference Architecture, in: o. Hg.: 25th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA), Piscataway, NJ 2020,  S. 1640–1647.","havard":"M. Ehrlich, M. Gergeleit, H. Trsek, G. Lukas, Towards Automated Security Evaluation within the Industrial Reference Architecture, in: 25th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA), IEEE, Piscataway, NJ, 2020: pp. 1640–1647."},"language":[{"iso":"eng"}],"publisher":"IEEE","date_created":"2024-03-01T08:41:28Z","publication_status":"published","doi":"10.1109/ETFA46521.2020.9211883","date_updated":"2025-06-26T13:33:05Z","title":"Towards Automated Security Evaluation within the Industrial Reference Architecture"},{"status":"public","department":[{"_id":"DEP5023"},{"_id":"DEP5019"}],"corporate_editor":[" IEEE Industrial Electronics Society. Annual Conference ","IEEE Industrial Electronics Society ","Universidade Nova de Lisboa ","Institute of Electrical and Electronics Engineers"],"year":"2019","user_id":"83781","page":"2849-2854","conference":{"location":"Lisbon, PORTUGAL","name":"45th Annual Conference of the IEEE Industrial Electronics Society (IECON)","end_date":"2019-10-19","start_date":"2019-10-14"},"abstract":[{"text":"Due to the dynamic nature of the Industrie 4.0 developments, future production systems will be reconfigured more frequently and new system configurations will be deployed automatically. In order to keep pace with this development, it will be required to observe and ensure the needed security functionalities and corresponding certifications in an automated way. This implies an improvement of today's static procedures and manual efforts as much as possible in favor of a dynamic standard establishment. Therefore, this paper evaluates the state of the art of the industrial security standardization landscape and proposes a concept for the automated support of certification processes with information from industrial communication networks in order to enhance the usability of the standards establishments and the certifications within organizations and companies, especially small and medium-sized enterprises.","lang":"eng"}],"keyword":["Industrial Automation","Security","Toolchain","Standardization","Communication Networks"],"publisher":"IEEE","type":"conference","date_updated":"2025-06-26T13:31:27Z","publication":"IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society (IES)","series_title":"IEEE Industrial Electronics Society","_id":"4756","date_created":"2021-01-28T14:47:12Z","language":[{"iso":"eng"}],"publication_status":"published","place":"[Piscataway, NJ]","citation":{"chicago":"Ehrlich, Marco, Henning Trsek, Lukasz Wisniewski, and Jürgen Jasperneite. “Survey of Security Standards for an Automated Industrie 4.0 Compatible Manufacturing.” In <i>IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society (IES)</i>, edited by  IEEE Industrial Electronics Society. Annual Conference , IEEE Industrial Electronics Society , Universidade Nova de Lisboa , and Institute of Electrical and Electronics Engineers, 2849–54. IEEE Industrial Electronics Society. [Piscataway, NJ]: IEEE, 2019.","din1505-2-1":"<span style=\"font-variant:small-caps;\">Ehrlich, Marco</span> ; <span style=\"font-variant:small-caps;\">Trsek, Henning</span> ; <span style=\"font-variant:small-caps;\">Wisniewski, Lukasz</span> ; <span style=\"font-variant:small-caps;\">Jasperneite, Jürgen</span>: Survey of Security Standards for an automated Industrie 4.0 compatible Manufacturing. In: <span style=\"font-variant:small-caps;\"> IEEE Industrial Electronics Society. Annual Conference </span> ; <span style=\"font-variant:small-caps;\">IEEE Industrial Electronics Society </span> ; <span style=\"font-variant:small-caps;\">Universidade Nova de Lisboa </span> ; <span style=\"font-variant:small-caps;\">Institute of Electrical and Electronics Engineers</span> (Hrsg.): <i>IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society (IES)</i>, <i>IEEE Industrial Electronics Society</i>. [Piscataway, NJ] : IEEE, 2019, S. 2849–2854","bjps":"<b>Ehrlich M <i>et al.</i></b> (2019) Survey of Security Standards for an Automated Industrie 4.0 Compatible Manufacturing. In  IEEE Industrial Electronics Society. Annual Conference  et al. (eds), <i>IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society (IES)</i>. [Piscataway, NJ]: IEEE, pp. 2849–2854.","ama":"Ehrlich M, Trsek H, Wisniewski L, Jasperneite J. Survey of Security Standards for an automated Industrie 4.0 compatible Manufacturing. In:  IEEE Industrial Electronics Society. Annual Conference , IEEE Industrial Electronics Society , Universidade Nova de Lisboa , Institute of Electrical and Electronics Engineers, eds. <i>IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society (IES)</i>. IEEE Industrial Electronics Society. IEEE; 2019:2849-2854.","van":"Ehrlich M, Trsek H, Wisniewski L, Jasperneite J. Survey of Security Standards for an automated Industrie 4.0 compatible Manufacturing. In:  IEEE Industrial Electronics Society. Annual Conference , IEEE Industrial Electronics Society , Universidade Nova de Lisboa , Institute of Electrical and Electronics Engineers, editors. IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society (IES). [Piscataway, NJ]: IEEE; 2019. p. 2849–54. (IEEE Industrial Electronics Society).","ieee":"M. Ehrlich, H. Trsek, L. Wisniewski, and J. Jasperneite, “Survey of Security Standards for an automated Industrie 4.0 compatible Manufacturing,” in <i>IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society (IES)</i>, Lisbon, PORTUGAL, 2019, pp. 2849–2854.","chicago-de":"Ehrlich, Marco, Henning Trsek, Lukasz Wisniewski und Jürgen Jasperneite. 2019. Survey of Security Standards for an automated Industrie 4.0 compatible Manufacturing. In: <i>IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society (IES)</i>, hg. von  IEEE Industrial Electronics Society. Annual Conference , IEEE Industrial Electronics Society , Universidade Nova de Lisboa , und Institute of Electrical and Electronics Engineers, 2849–2854. IEEE Industrial Electronics Society. [Piscataway, NJ]: IEEE.","ufg":"<b>Ehrlich, Marco u. a.</b>: Survey of Security Standards for an automated Industrie 4.0 compatible Manufacturing, in: <i> IEEE Industrial Electronics Society. Annual Conference  u. a. (Hgg.)</i>: IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society (IES), [Piscataway, NJ] 2019 (IEEE Industrial Electronics Society),  S. 2849–2854.","mla":"Ehrlich, Marco, et al. “Survey of Security Standards for an Automated Industrie 4.0 Compatible Manufacturing.” <i>IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society (IES)</i>, edited by  IEEE Industrial Electronics Society. Annual Conference  et al., IEEE, 2019, pp. 2849–54.","apa":"Ehrlich, M., Trsek, H., Wisniewski, L., &#38; Jasperneite, J. (2019). Survey of Security Standards for an automated Industrie 4.0 compatible Manufacturing. In  IEEE Industrial Electronics Society. Annual Conference , IEEE Industrial Electronics Society , Universidade Nova de Lisboa , &#38; Institute of Electrical and Electronics Engineers (Eds.), <i>IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society (IES)</i> (pp. 2849–2854). IEEE.","short":"M. Ehrlich, H. Trsek, L. Wisniewski, J. Jasperneite, in:  IEEE Industrial Electronics Society. Annual Conference , IEEE Industrial Electronics Society , Universidade Nova de Lisboa , Institute of Electrical and Electronics Engineers (Eds.), IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society (IES), IEEE, [Piscataway, NJ], 2019, pp. 2849–2854.","havard":"M. Ehrlich, H. Trsek, L. Wisniewski, J. Jasperneite, Survey of Security Standards for an automated Industrie 4.0 compatible Manufacturing, in:  IEEE Industrial Electronics Society. Annual Conference , IEEE Industrial Electronics Society , Universidade Nova de Lisboa , Institute of Electrical and Electronics Engineers (Eds.), IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society (IES), IEEE, [Piscataway, NJ], 2019: pp. 2849–2854."},"publication_identifier":{"eisbn":["978-1-7281-4878-6"],"isbn":["978-1-7281-4879-3"],"issn":["1553-572X"]},"author":[{"last_name":"Ehrlich","id":"61562","full_name":"Ehrlich, Marco","first_name":"Marco"},{"full_name":"Trsek, Henning","last_name":"Trsek","id":"1486","first_name":"Henning","orcid":"0000-0002-0133-0656"},{"full_name":"Wisniewski, Lukasz","id":"1710","last_name":"Wisniewski","first_name":"Lukasz"},{"full_name":"Jasperneite, Jürgen","id":"1899","last_name":"Jasperneite","first_name":"Jürgen"}],"title":"Survey of Security Standards for an automated Industrie 4.0 compatible Manufacturing"},{"editor":[{"first_name":"Theo","full_name":"Tryfonas, Theo","last_name":"Tryfonas"},{"full_name":"Askoxylakis, Ioannis","last_name":"Askoxylakis","first_name":"Ioannis"}],"publisher":"Springer","type":"conference","date_updated":"2025-04-11T09:03:48Z","doi":"10.1007/978-3-319-20376-8_38","status":"public","year":"2015","user_id":"83781","department":[{"_id":"DEP5023"}],"abstract":[{"text":"When a user enters a personal identification number (PIN) into an automated teller machine or a point of sale terminal, there is a risk of some one watching from behind, trying to guess the PIN code. Such shoulder-surfing is a major security threat. In order to overcome this problem different PIN entry methods have been suggested. In this regard, gaze interaction methods are receiving attention in recent years, owing to the lowering cost of eye tracking technology. In this paper, we present SafetyPIN - an eye tracking based PIN entry system - which is aimed at making the PIN entry more secure with the help of an eye tracking device. We discuss the implementation and the initial evaluation of this system.","lang":"eng"}],"page":"426-435","conference":{"location":"Los Angeles, CA, USA","end_date":"2015-08-07","start_date":"2015-08-02","name":"3. International Conference, HAS 2015, Held as Part of HCI International 2015"},"keyword":["PIN entry","Eye tracking","Security","Usability","Point of sale terminals"],"citation":{"ufg":"<b>Seetharama, Mythreya/Paelke, Volker/Röcker, Carsten</b>: SafetyPIN: Secure PIN Entry through Eye Tracking, in: <i>Tryfonas, Theo/Askoxylakis, Ioannis (Hgg.)</i>: Human Aspects of Information Security, Privacy, and Trust, Bd. 9190, Cham 2015 (Lecture Notes in Computer Science ;  Information Systems and Applications, incl. Internet/Web, and HCI),  S. 426–435.","chicago":"Seetharama, Mythreya, Volker Paelke, and Carsten Röcker. “SafetyPIN: Secure PIN Entry through Eye Tracking.” In <i>Human Aspects of Information Security, Privacy, and Trust</i>, edited by Theo Tryfonas and Ioannis Askoxylakis, 9190:426–35. Lecture Notes in Computer Science ;  Information Systems and Applications, Incl. Internet/Web, and HCI. Cham: Springer, 2015. <a href=\"https://doi.org/10.1007/978-3-319-20376-8_38\">https://doi.org/10.1007/978-3-319-20376-8_38</a>.","chicago-de":"Seetharama, Mythreya, Volker Paelke und Carsten Röcker. 2015. SafetyPIN: Secure PIN Entry through Eye Tracking. In: <i>Human Aspects of Information Security, Privacy, and Trust</i>, hg. von Theo Tryfonas und Ioannis Askoxylakis, 9190:426–435. Lecture Notes in Computer Science ;  Information Systems and Applications, incl. Internet/Web, and HCI. Cham: Springer. doi:<a href=\"https://doi.org/10.1007/978-3-319-20376-8_38\">10.1007/978-3-319-20376-8_38</a>, .","bjps":"<b>Seetharama M, Paelke V and Röcker C</b> (2015) SafetyPIN: Secure PIN Entry through Eye Tracking. In Tryfonas T and Askoxylakis I (eds), <i>Human Aspects of Information Security, Privacy, and Trust</i>, vol. 9190. Cham: Springer, pp. 426–435.","short":"M. Seetharama, V. Paelke, C. Röcker, in: T. Tryfonas, I. Askoxylakis (Eds.), Human Aspects of Information Security, Privacy, and Trust, Springer, Cham, 2015, pp. 426–435.","din1505-2-1":"<span style=\"font-variant:small-caps;\">Seetharama, Mythreya</span> ; <span style=\"font-variant:small-caps;\">Paelke, Volker</span> ; <span style=\"font-variant:small-caps;\">Röcker, Carsten</span>: SafetyPIN: Secure PIN Entry through Eye Tracking. In: <span style=\"font-variant:small-caps;\">Tryfonas, T.</span> ; <span style=\"font-variant:small-caps;\">Askoxylakis, I.</span> (Hrsg.): <i>Human Aspects of Information Security, Privacy, and Trust</i>, <i>Lecture Notes in Computer Science ;  Information Systems and Applications, incl. Internet/Web, and HCI</i>. Bd. 9190. Cham : Springer, 2015, S. 426–435","apa":"Seetharama, M., Paelke, V., &#38; Röcker, C. (2015). SafetyPIN: Secure PIN Entry through Eye Tracking. In T. Tryfonas &#38; I. Askoxylakis (Eds.), <i>Human Aspects of Information Security, Privacy, and Trust</i> (Vol. 9190, pp. 426–435). Springer. <a href=\"https://doi.org/10.1007/978-3-319-20376-8_38\">https://doi.org/10.1007/978-3-319-20376-8_38</a>","mla":"Seetharama, Mythreya, et al. “SafetyPIN: Secure PIN Entry through Eye Tracking.” <i>Human Aspects of Information Security, Privacy, and Trust</i>, edited by Theo Tryfonas and Ioannis Askoxylakis, vol. 9190, Springer, 2015, pp. 426–35, <a href=\"https://doi.org/10.1007/978-3-319-20376-8_38\">https://doi.org/10.1007/978-3-319-20376-8_38</a>.","van":"Seetharama M, Paelke V, Röcker C. SafetyPIN: Secure PIN Entry through Eye Tracking. In: Tryfonas T, Askoxylakis I, editors. Human Aspects of Information Security, Privacy, and Trust. Cham: Springer; 2015. p. 426–35. (Lecture Notes in Computer Science ;  Information Systems and Applications, incl. Internet/Web, and HCI; vol. 9190).","ama":"Seetharama M, Paelke V, Röcker C. SafetyPIN: Secure PIN Entry through Eye Tracking. In: Tryfonas T, Askoxylakis I, eds. <i>Human Aspects of Information Security, Privacy, and Trust</i>. Vol 9190. Lecture Notes in Computer Science ;  Information Systems and Applications, incl. Internet/Web, and HCI. Springer; 2015:426-435. doi:<a href=\"https://doi.org/10.1007/978-3-319-20376-8_38\">10.1007/978-3-319-20376-8_38</a>","ieee":"M. Seetharama, V. Paelke, and C. Röcker, “SafetyPIN: Secure PIN Entry through Eye Tracking,” in <i>Human Aspects of Information Security, Privacy, and Trust</i>, Los Angeles, CA, USA, 2015, vol. 9190, pp. 426–435. doi: <a href=\"https://doi.org/10.1007/978-3-319-20376-8_38\">10.1007/978-3-319-20376-8_38</a>.","havard":"M. Seetharama, V. Paelke, C. Röcker, SafetyPIN: Secure PIN Entry through Eye Tracking, in: T. Tryfonas, I. Askoxylakis (Eds.), Human Aspects of Information Security, Privacy, and Trust, Springer, Cham, 2015: pp. 426–435."},"place":"Cham","publication_status":"published","volume":9190,"language":[{"iso":"eng"}],"date_created":"2021-01-08T12:03:45Z","author":[{"first_name":"Mythreya","full_name":"Seetharama, Mythreya","last_name":"Seetharama"},{"full_name":"Paelke, Volker","last_name":"Paelke","first_name":"Volker"},{"full_name":"Röcker, Carsten","id":"61525","last_name":"Röcker","first_name":"Carsten"}],"intvolume":"      9190","publication_identifier":{"eisbn":["978-3-319-20376-8"],"isbn":["978-3-319-20375-1"]},"title":"SafetyPIN: Secure PIN Entry through Eye Tracking","publication":"Human Aspects of Information Security, Privacy, and Trust","series_title":"Lecture Notes in Computer Science ;  Information Systems and Applications, incl. Internet/Web, and HCI","_id":"4331"},{"title":"SEC_PRO : sichere Produktion mit verteilten Automatisierungssystemen","date_updated":"2023-03-15T13:50:00Z","doi":"https://doi.org/10.25968/opus-499","author":[{"first_name":"Markus","full_name":"Runde, Markus","last_name":"Runde"},{"last_name":"Hausmann","full_name":"Hausmann, Stefan","first_name":"Stefan"},{"first_name":"Christopher","full_name":"Tebbe, Christopher","last_name":"Tebbe"},{"first_name":"Björn","full_name":"Czybik, Björn","last_name":"Czybik","id":"76180"},{"full_name":"Niemann, Karl-Heinz","last_name":"Niemann","first_name":"Karl-Heinz"},{"id":"1031","last_name":"Heiss","full_name":"Heiss, Stefan","first_name":"Stefan"},{"first_name":"Jürgen","full_name":"Jasperneite, Jürgen","id":"1899","last_name":"Jasperneite"}],"type":"book","publication_status":"published","date_created":"2021-04-19T09:28:14Z","publisher":"Hochschule Hannover ","language":[{"iso":"ger"}],"citation":{"ufg":"<b>Runde, Markus et. al. (2014)</b>: SEC_PRO : sichere Produktion mit verteilten Automatisierungssystemen, Hannover .","chicago-de":"Runde, Markus, Stefan Hausmann, Christopher Tebbe, Björn Czybik, Karl-Heinz Niemann, Stefan Heiss und Jürgen Jasperneite. 2014. <i>SEC_PRO : sichere Produktion mit verteilten Automatisierungssystemen</i>. Hannover : Hochschule Hannover . doi:<a href=\"https://doi.org/10.25968/opus-499,\">https://doi.org/10.25968/opus-499,</a> .","short":"M. Runde, S. Hausmann, C. Tebbe, B. Czybik, K.-H. Niemann, S. Heiss, J. Jasperneite, SEC_PRO : sichere Produktion mit verteilten Automatisierungssystemen, Hochschule Hannover , Hannover , 2014.","mla":"Runde, Markus, et al. <i>SEC_PRO : sichere Produktion mit verteilten Automatisierungssystemen</i>. Hochschule Hannover , 2014, doi:<a href=\"https://doi.org/10.25968/opus-499\">https://doi.org/10.25968/opus-499</a>.","apa":"Runde, M., Hausmann, S., Tebbe, C., Czybik, B., Niemann, K.-H., Heiss, S., &#38; Jasperneite, J. (2014). <i>SEC_PRO : sichere Produktion mit verteilten Automatisierungssystemen</i>. Hannover : Hochschule Hannover . <a href=\"https://doi.org/10.25968/opus-499\">https://doi.org/10.25968/opus-499</a>","havard":"M. Runde, S. Hausmann, C. Tebbe, B. Czybik, K.-H. Niemann, S. Heiss, J. Jasperneite, SEC_PRO : sichere Produktion mit verteilten Automatisierungssystemen, Hochschule Hannover , Hannover , 2014.","chicago":"Runde, Markus, Stefan Hausmann, Christopher Tebbe, Björn Czybik, Karl-Heinz Niemann, Stefan Heiss, and Jürgen Jasperneite. <i>SEC_PRO : sichere Produktion mit verteilten Automatisierungssystemen</i>. Hannover : Hochschule Hannover , 2014. <a href=\"https://doi.org/10.25968/opus-499\">https://doi.org/10.25968/opus-499</a>.","bjps":"<b>Runde M <i>et al.</i></b> (2014) <i>SEC_PRO : sichere Produktion mit verteilten Automatisierungssystemen</i>. Hannover : Hochschule Hannover .","din1505-2-1":"<span style=\"font-variant:small-caps;\">Runde, Markus</span> ; <span style=\"font-variant:small-caps;\">Hausmann, Stefan</span> ; <span style=\"font-variant:small-caps;\">Tebbe, Christopher</span> ; <span style=\"font-variant:small-caps;\">Czybik, Björn</span> ; <span style=\"font-variant:small-caps;\">Niemann, Karl-Heinz</span> ; <span style=\"font-variant:small-caps;\">Heiss, Stefan</span> ; <span style=\"font-variant:small-caps;\">Jasperneite, Jürgen</span>: <i>SEC_PRO : sichere Produktion mit verteilten Automatisierungssystemen</i>. Hannover  : Hochschule Hannover , 2014","van":"Runde M, Hausmann S, Tebbe C, Czybik B, Niemann K-H, Heiss S, et al. SEC_PRO : sichere Produktion mit verteilten Automatisierungssystemen. Hannover : Hochschule Hannover ; 2014. 99 p.","ama":"Runde M, Hausmann S, Tebbe C, et al. <i>SEC_PRO : sichere Produktion mit verteilten Automatisierungssystemen</i>. Hannover : Hochschule Hannover ; 2014. doi:<a href=\"https://doi.org/10.25968/opus-499\">https://doi.org/10.25968/opus-499</a>","ieee":"M. Runde <i>et al.</i>, <i>SEC_PRO : sichere Produktion mit verteilten Automatisierungssystemen</i>. Hannover : Hochschule Hannover , 2014."},"place":"Hannover ","keyword":["Automatisierungstechnik","IT-Sicherheit","PROFINET","SEC_PRO IT Security"],"_id":"5601","page":"99","abstract":[{"text":"Das Projekt SEC_PRO verfolgte die Möglichkeit der Erarbeitung einer neuartigen IT-Sicherheitslösung für Automatisierungssysteme. Die Ermittlung des Stands der Technik zeigte, dass die IT-Sicherheit in der Automatisierungstechnik von Lösungen der Standard-IT in Büronetzwerken geprägt ist, ohne auf spezielle Anforderungen der Automatisierungstechnik einzugehen. Eine Anforderungsanalyse erbrachte, dass IT-Sicherheitslösungen benötigt werden, die sich mit dem zunehmenden Vernetzungsgrad von Automatisierungssystemen in Einklang bringen lassen. Dazu ist eine IT-Sicherheitsschicht für das PROFINET-Protokoll konzipiert und implementiert worden, die einen integrierten Schutz der Kommunikation und der Komponenten selbst ermöglicht. Dabei kommen gezielt Security Token Technologien zum Einsatz. Eine Evaluierung der kryptografischen Funktionen zeigte, dass deren Verwendung unter gewissen Voraussetzungen möglich ist. Mit Hilfe eines Demonstrators ist konnte die Echtzeitfähigkeit der IT-Sicherheitsschicht validiert und dessen Schutzwirkung nachgewiesen werden. SEC_PRO kann als Ausgangspunkt für weitere Vorhaben bezüglich integrierter IT-Sicherheitsmaßnahmen gesehen werden, die auf eine Anwendung der Kryptografie in der Automatisierungstechnik abzielen.","lang":"ger"}],"department":[{"_id":"DEP5000"},{"_id":"DEP5023"}],"user_id":"15514","year":2014,"status":"public"},{"oa":"1","_id":"4381","publication":"Universal Journal of Psychology","main_file_link":[{"open_access":"1"}],"title":"Privacy and Security in Technology-Enhanced Environments: Exploring Users’ Knowledge about Technological Processes of Diverse User Groups","place":"  Alhambra, Calif.","citation":{"din1505-2-1":"<span style=\"font-variant:small-caps;\">Sack, Oliver</span> ; <span style=\"font-variant:small-caps;\">Röcker, Carsten</span>: Privacy and Security in Technology-Enhanced Environments: Exploring Users’ Knowledge about Technological Processes of Diverse User Groups. In: <i>Universal Journal of Psychology</i> Bd. 1.   Alhambra, Calif., Horizion  (2013), Nr. 2, S. 72–83","apa":"Sack, O., &#38; Röcker, C. (2013). Privacy and Security in Technology-Enhanced Environments: Exploring Users’ Knowledge about Technological Processes of Diverse User Groups. <i>Universal Journal of Psychology</i>, <i>1</i>(2), 72–83. <a href=\"https://doi.org/10.13189/ujp.2013.010207\">https://doi.org/10.13189/ujp.2013.010207</a>","mla":"Sack, Oliver, and Carsten Röcker. “Privacy and Security in Technology-Enhanced Environments: Exploring Users’ Knowledge about Technological Processes of Diverse User Groups.” <i>Universal Journal of Psychology</i>, vol. 1, no. 2, Horizion , 2013, pp. 72–83, doi:<a href=\"https://doi.org/10.13189/ujp.2013.010207\">10.13189/ujp.2013.010207</a>.","short":"O. Sack, C. Röcker, Universal Journal of Psychology 1 (2013) 72–83.","bjps":"<b>Sack O and Röcker C</b> (2013) Privacy and Security in Technology-Enhanced Environments: Exploring Users’ Knowledge about Technological Processes of Diverse User Groups. <i>Universal Journal of Psychology</i> <b>1</b>, 72–83.","chicago-de":"Sack, Oliver und Carsten Röcker. 2013. Privacy and Security in Technology-Enhanced Environments: Exploring Users’ Knowledge about Technological Processes of Diverse User Groups. <i>Universal Journal of Psychology</i> 1, Nr. 2: 72–83. doi:<a href=\"https://doi.org/10.13189/ujp.2013.010207,\">10.13189/ujp.2013.010207,</a> .","chicago":"Sack, Oliver, and Carsten Röcker. “Privacy and Security in Technology-Enhanced Environments: Exploring Users’ Knowledge about Technological Processes of Diverse User Groups.” <i>Universal Journal of Psychology</i> 1, no. 2 (2013): 72–83. <a href=\"https://doi.org/10.13189/ujp.2013.010207\">https://doi.org/10.13189/ujp.2013.010207</a>.","ufg":"<b>Sack, Oliver/Röcker, Carsten (2013)</b>: Privacy and Security in Technology-Enhanced Environments: Exploring Users’ Knowledge about Technological Processes of Diverse User Groups, in: <i>Universal Journal of Psychology</i> <i>1</i> (<i>2</i>), S. 72–83.","ieee":"O. Sack and C. Röcker, “Privacy and Security in Technology-Enhanced Environments: Exploring Users’ Knowledge about Technological Processes of Diverse User Groups,” <i>Universal Journal of Psychology</i>, vol. 1, no. 2, pp. 72–83, 2013.","havard":"O. Sack, C. Röcker, Privacy and Security in Technology-Enhanced Environments: Exploring Users’ Knowledge about Technological Processes of Diverse User Groups, Universal Journal of Psychology. 1 (2013) 72–83.","van":"Sack O, Röcker C. Privacy and Security in Technology-Enhanced Environments: Exploring Users’ Knowledge about Technological Processes of Diverse User Groups. Universal Journal of Psychology. 2013;1(2):72–83.","ama":"Sack O, Röcker C. Privacy and Security in Technology-Enhanced Environments: Exploring Users’ Knowledge about Technological Processes of Diverse User Groups. <i>Universal Journal of Psychology</i>. 2013;1(2):72-83. doi:<a href=\"https://doi.org/10.13189/ujp.2013.010207\">10.13189/ujp.2013.010207</a>"},"date_created":"2021-01-15T10:49:18Z","language":[{"iso":"eng"}],"volume":1,"publication_status":"published","author":[{"first_name":"Oliver","full_name":"Sack, Oliver","last_name":"Sack"},{"full_name":"Röcker, Carsten","id":"61525","last_name":"Röcker","first_name":"Carsten"}],"intvolume":"         1","publication_identifier":{"isbn":["2332-3477"],"eissn":["2332-3485 "]},"abstract":[{"lang":"eng","text":"This article reports on two user studies exploring the knowledge of end users about technical processes of technology-enhanced home environments, which are often assumed to play an important role for attitudes such as privacy and security. In the first study (n=12 participants between 19-71 years of age), we analyzed user knowledge about technical processes using the teach-back methodology. In the second study, we additionally applied new developed questionnaires and analyzed participants’ data (n=24 participants between 19-76 years of age) regarding relations of user factors, users’ knowledge about technical processes and attitudes such as privacy and security of technology-enhanced environments. In contrast to existing assumptions, the results showed that general structural knowledge about technical processes was not related with attitudes such as privacy and security. Additionally, we found that most participants had only relatively superficial knowledge about technical processes, which was further influenced by age and technology experience."}],"page":"72 - 83","extern":"1","keyword":["Technology-enhanced Environment","Ambient Assisted Living","Mental Model","Teach Back","Privacy","Security"],"status":"public","user_id":"15514","year":2013,"department":[{"_id":"DEP5023"}],"date_updated":"2023-03-15T13:49:52Z","doi":"10.13189/ujp.2013.010207","issue":"2","publisher":"Horizion ","type":"journal_article"},{"year":2007,"user_id":"45673","department":[{"_id":"DEP5023"}],"status":"public","_id":"2068","keyword":["Sensor fusion","Inspection","Optical sensors","Printing machinery","Data security","Data analysis","Production","Degradation","Principal component analysis","Karhunen-Loeve transforms"],"abstract":[{"lang":"eng","text":"The production of printing goods is laborious. Furthermore, the print quality, especially in banknotes, must be assured. It is accepted, that print defects are generated because printing parameters, also machine parameters can change unnoticed. Therefore, a combined concept for a multi-sensory learning and classification model based on new adaptive fuzzy-pattern-classifiers for data inspection is proposed. This inspection concept, which combines optical, acoustical and other machine information, comes up with a large amount of data, which leads to multivariate methods for data analysis. Multivariate methods are useful for analysis of large and complex data sets that consist of many variables measured on large numbers of physical data."}],"page":"accepted for publication","type":"conference","author":[{"first_name":"Walter","last_name":"Dyck","full_name":"Dyck, Walter"},{"full_name":"Türke, Thomas","last_name":"Türke","first_name":"Thomas"},{"first_name":"Johannes","last_name":"Schaede","id":"2128","full_name":"Schaede, Johannes"},{"orcid":"0000-0002-3325-7887","id":"1804","last_name":"Lohweg","full_name":"Lohweg, Volker","first_name":"Volker"}],"publication_identifier":{"eisbn":["978-1-4244-1566-3"],"isbn":["978-1-4244-1565-6"],"issn":["1551-2541 "],"unknown":["2378-928X "]},"citation":{"ieee":"W. Dyck, T. Türke, J. Schaede, and V. Lohweg, “A Fuzzy-Pattern-Classifier-Based Adaptive Learning Model for Sensor Fusion,” 2007, p. accepted for publication.","havard":"W. Dyck, T. Türke, J. Schaede, V. Lohweg, A Fuzzy-Pattern-Classifier-Based Adaptive Learning Model for Sensor Fusion, in: MLSP 2007 - International Workshop on MACHINE LEARNING FOR SIGNAL PROCESSING, Thessaloniki, Greece, 2007: p. accepted for publication.","van":"Dyck W, Türke T, Schaede J, Lohweg V. A Fuzzy-Pattern-Classifier-Based Adaptive Learning Model for Sensor Fusion. In Thessaloniki, Greece: MLSP 2007 - International Workshop on MACHINE LEARNING FOR SIGNAL PROCESSING; 2007. p. accepted for publication.","ama":"Dyck W, Türke T, Schaede J, Lohweg V. A Fuzzy-Pattern-Classifier-Based Adaptive Learning Model for Sensor Fusion. In: Thessaloniki, Greece: MLSP 2007 - International Workshop on MACHINE LEARNING FOR SIGNAL PROCESSING; 2007:accepted for publication. doi:<a href=\"https://doi.org/10.1109/MLSP.2007.4414320\">10.1109/MLSP.2007.4414320</a>","din1505-2-1":"<span style=\"font-variant:small-caps;\">Dyck, Walter</span> ; <span style=\"font-variant:small-caps;\">Türke, Thomas</span> ; <span style=\"font-variant:small-caps;\">Schaede, Johannes</span> ; <span style=\"font-variant:small-caps;\">Lohweg, Volker</span>: A Fuzzy-Pattern-Classifier-Based Adaptive Learning Model for Sensor Fusion. In: . Thessaloniki, Greece : MLSP 2007 - International Workshop on MACHINE LEARNING FOR SIGNAL PROCESSING, 2007, S. accepted for publication","apa":"Dyck, W., Türke, T., Schaede, J., &#38; Lohweg, V. (2007). A Fuzzy-Pattern-Classifier-Based Adaptive Learning Model for Sensor Fusion (p. accepted for publication). Thessaloniki, Greece: MLSP 2007 - International Workshop on MACHINE LEARNING FOR SIGNAL PROCESSING. <a href=\"https://doi.org/10.1109/MLSP.2007.4414320\">https://doi.org/10.1109/MLSP.2007.4414320</a>","mla":"Dyck, Walter, et al. <i>A Fuzzy-Pattern-Classifier-Based Adaptive Learning Model for Sensor Fusion</i>. MLSP 2007 - International Workshop on MACHINE LEARNING FOR SIGNAL PROCESSING, 2007, p. accepted for publication, doi:<a href=\"https://doi.org/10.1109/MLSP.2007.4414320\">10.1109/MLSP.2007.4414320</a>.","bjps":"<b>Dyck W <i>et al.</i></b> (2007) A Fuzzy-Pattern-Classifier-Based Adaptive Learning Model for Sensor Fusion. Thessaloniki, Greece: MLSP 2007 - International Workshop on MACHINE LEARNING FOR SIGNAL PROCESSING, p. accepted for publication.","short":"W. Dyck, T. Türke, J. Schaede, V. Lohweg, in: MLSP 2007 - International Workshop on MACHINE LEARNING FOR SIGNAL PROCESSING, Thessaloniki, Greece, 2007, p. accepted for publication.","chicago-de":"Dyck, Walter, Thomas Türke, Johannes Schaede und Volker Lohweg. 2007. A Fuzzy-Pattern-Classifier-Based Adaptive Learning Model for Sensor Fusion. In: , accepted for publication. Thessaloniki, Greece: MLSP 2007 - International Workshop on MACHINE LEARNING FOR SIGNAL PROCESSING. doi:<a href=\"https://doi.org/10.1109/MLSP.2007.4414320,\">10.1109/MLSP.2007.4414320,</a> .","chicago":"Dyck, Walter, Thomas Türke, Johannes Schaede, and Volker Lohweg. “A Fuzzy-Pattern-Classifier-Based Adaptive Learning Model for Sensor Fusion,” accepted for publication. Thessaloniki, Greece: MLSP 2007 - International Workshop on MACHINE LEARNING FOR SIGNAL PROCESSING, 2007. <a href=\"https://doi.org/10.1109/MLSP.2007.4414320\">https://doi.org/10.1109/MLSP.2007.4414320</a>.","ufg":"<b>Dyck, Walter et. al. (2007)</b>: A Fuzzy-Pattern-Classifier-Based Adaptive Learning Model for Sensor Fusion, in: , Thessaloniki, Greece, S. accepted for publication."},"place":"Thessaloniki, Greece","publication_status":"published","date_created":"2019-11-29T13:50:28Z","publisher":"MLSP 2007 - International Workshop on MACHINE LEARNING FOR SIGNAL PROCESSING","language":[{"iso":"eng"}],"doi":"10.1109/MLSP.2007.4414320","date_updated":"2023-03-15T13:49:38Z","main_file_link":[{"url":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=4414320&tag=1"}],"title":"A Fuzzy-Pattern-Classifier-Based Adaptive Learning Model for Sensor Fusion"},{"year":2006,"user_id":"45673","department":[{"_id":"DEP5023"}],"status":"public","publication":" 2006 9th International Conference on Information Fusion","_id":"2062","keyword":["Information security","Inspection","Printing machinery","Optical sensors","Data security","Personnel","Fuzzy systems","Sensor systems","Expert systems","Ink"],"abstract":[{"text":"Bank note inspection is a complex task. As more and more print techniques and new security features are established, total quality security and bank note printing must be assured. Therefore, this factor necessitates change of a sensorial concept in general. We propose an optical-acoustical inspection method based upon the concepts of information fusion and fuzzy interpretation of data measures. Furthermore, we present a simplified scheme for information fusion for pattern recognition and data classification based on parametrical unimodal potential functions and a Sugeno-type score value analysis. Digital Object Identifier: 10.1109/ICIF.2006.301779 <br />","lang":"eng"}],"page":"1-8","author":[{"last_name":"Dyck","full_name":"Dyck, Walter","first_name":"Walter"},{"first_name":"Johannes","id":"2128","last_name":"Schaede","full_name":"Schaede, Johannes"},{"full_name":"Türke, Thomas","last_name":"Türke","first_name":"Thomas"},{"full_name":"Lohweg, Volker","id":"1804","last_name":"Lohweg","first_name":"Volker","orcid":"0000-0002-3325-7887"}],"type":"conference","publication_identifier":{"isbn":[" 1-4244-0953-5"]},"citation":{"din1505-2-1":"<span style=\"font-variant:small-caps;\">Dyck, Walter</span> ; <span style=\"font-variant:small-caps;\">Schaede, Johannes</span> ; <span style=\"font-variant:small-caps;\">Türke, Thomas</span> ; <span style=\"font-variant:small-caps;\">Lohweg, Volker</span>: Information Fusion Application On Security Printing With Parametrical Fuzzy Classification. In: <i> 2006 9th International Conference on Information Fusion</i> : 9th International Conference on Information Fusion, 2006. ICIF ’06, 2006, S. 1–8","mla":"Dyck, Walter, et al. “Information Fusion Application On Security Printing With Parametrical Fuzzy Classification.” <i> 2006 9th International Conference on Information Fusion</i>, 9th International Conference on Information Fusion, 2006. ICIF ’06, 2006, pp. 1–8, doi:<a href=\"https://doi.org/10.1109/ICIF.2006.301779\">10.1109/ICIF.2006.301779</a>.","apa":"Dyck, W., Schaede, J., Türke, T., &#38; Lohweg, V. (2006). Information Fusion Application On Security Printing With Parametrical Fuzzy Classification. In <i> 2006 9th International Conference on Information Fusion</i> (pp. 1–8). 9th International Conference on Information Fusion, 2006. ICIF ’06. <a href=\"https://doi.org/10.1109/ICIF.2006.301779\">https://doi.org/10.1109/ICIF.2006.301779</a>","short":"W. Dyck, J. Schaede, T. Türke, V. Lohweg, in:  2006 9th International Conference on Information Fusion, 9th International Conference on Information Fusion, 2006. ICIF ’06, 2006, pp. 1–8.","bjps":"<b>Dyck W <i>et al.</i></b> (2006) Information Fusion Application On Security Printing With Parametrical Fuzzy Classification. <i> 2006 9th International Conference on Information Fusion</i>. 9th International Conference on Information Fusion, 2006. ICIF ’06, pp. 1–8.","chicago":"Dyck, Walter, Johannes Schaede, Thomas Türke, and Volker Lohweg. “Information Fusion Application On Security Printing With Parametrical Fuzzy Classification.” In <i> 2006 9th International Conference on Information Fusion</i>, 1–8. 9th International Conference on Information Fusion, 2006. ICIF ’06, 2006. <a href=\"https://doi.org/10.1109/ICIF.2006.301779\">https://doi.org/10.1109/ICIF.2006.301779</a>.","chicago-de":"Dyck, Walter, Johannes Schaede, Thomas Türke und Volker Lohweg. 2006. Information Fusion Application On Security Printing With Parametrical Fuzzy Classification. In: <i> 2006 9th International Conference on Information Fusion</i>, 1–8. 9th International Conference on Information Fusion, 2006. ICIF ’06. doi:<a href=\"https://doi.org/10.1109/ICIF.2006.301779,\">10.1109/ICIF.2006.301779,</a> .","ufg":"<b>Dyck, Walter et. al. (2006)</b>: Information Fusion Application On Security Printing With Parametrical Fuzzy Classification, in: <i> 2006 9th International Conference on Information Fusion</i>, S. 1–8.","ieee":"W. Dyck, J. Schaede, T. Türke, and V. Lohweg, “Information Fusion Application On Security Printing With Parametrical Fuzzy Classification,” in <i> 2006 9th International Conference on Information Fusion</i>, 2006, pp. 1–8.","havard":"W. Dyck, J. Schaede, T. Türke, V. Lohweg, Information Fusion Application On Security Printing With Parametrical Fuzzy Classification, in:  2006 9th International Conference on Information Fusion, 9th International Conference on Information Fusion, 2006. ICIF ’06, 2006: pp. 1–8.","van":"Dyck W, Schaede J, Türke T, Lohweg V. Information Fusion Application On Security Printing With Parametrical Fuzzy Classification. In:  2006 9th International Conference on Information Fusion. 9th International Conference on Information Fusion, 2006. ICIF ’06; 2006. p. 1–8.","ama":"Dyck W, Schaede J, Türke T, Lohweg V. Information Fusion Application On Security Printing With Parametrical Fuzzy Classification. In: <i> 2006 9th International Conference on Information Fusion</i>. 9th International Conference on Information Fusion, 2006. ICIF ’06; 2006:1-8. doi:<a href=\"https://doi.org/10.1109/ICIF.2006.301779\">10.1109/ICIF.2006.301779</a>"},"publisher":"9th International Conference on Information Fusion, 2006. ICIF '06","language":[{"iso":"eng"}],"date_created":"2019-11-29T13:35:03Z","publication_status":"published","doi":"10.1109/ICIF.2006.301779","date_updated":"2023-03-15T13:49:38Z","main_file_link":[{"url":"https://ieeexplore.ieee.org/document/4086065/keywords#full-text-header"}],"title":"Information Fusion Application On Security Printing With Parametrical Fuzzy Classification"}]