[{"department":[{"_id":"DEP6012"}],"abstract":[{"text":"he lifetime of electrical contacts is influenced by various factors. Micromotions due to fluctuations in temperature and vibration in the field lead to fretting wear and fretting corrosion of electrical contacts. In case of the contacts with noble coatings, the fretting wear results in the wear through of the coating causing the exposure of the underlying non-noble metal to the surrounding atmosphere which in turn leads to fretting corrosion. These degradation mechanisms lead to an increase in electrical contact resistance and eventual failure of the system. In this study, the extent of contact degradation due to fretting war of galvanically silver-plated electrical contacts is investigated. To compare the extent of war occurring at different stages of the contacts’ lifetime, the fretting tests are conducted up to predefined fretting cycles. XRF measurements of the coating thickness before after the tests are performed and the wear depth after the given fretting cycles is determined via confocal microscopy. The results of two different types of silver plating are compared. Based on this, a prognosis regarding the wear behavior and expected lifetime of different coating systems can be made possible.","lang":"eng"}],"issue":"1","publisher":"Narr Francke Attempto Verlag GmbH + Co. KG","publication_status":"published","has_accepted_license":"1","_id":"11347","doi":"10.24053/tus-2023-0005","type":"scientific_journal_article","user_id":"83781","intvolume":"        70","year":"2023","author":[{"first_name":"Roman","full_name":"Probst, Roman","last_name":"Probst","id":"69156"},{"id":"5297","first_name":"Jian","last_name":"Song","full_name":"Song, Jian"}],"status":"public","page":"32-39","title":"Einfluss der Mikrohärte der Ober- flächenschutzschicht auf den Verschleiß und die Lebensdauer von elektrischen Kontakten bei Reibverschleißbelastung","citation":{"ama":"Probst R, Song J. Einfluss der Mikrohärte der Ober- flächenschutzschicht auf den Verschleiß und die Lebensdauer von elektrischen Kontakten bei Reibverschleißbelastung. <i>Tribologie und Schmierungstechnik</i>. 2023;70(1):32-39. doi:<a href=\"https://doi.org/10.24053/tus-2023-0005\">10.24053/tus-2023-0005</a>","ieee":"R. Probst and J. Song, “Einfluss der Mikrohärte der Ober- flächenschutzschicht auf den Verschleiß und die Lebensdauer von elektrischen Kontakten bei Reibverschleißbelastung,” <i>Tribologie und Schmierungstechnik</i>, vol. 70, no. 1, pp. 32–39, 2023, doi: <a href=\"https://doi.org/10.24053/tus-2023-0005\">10.24053/tus-2023-0005</a>.","short":"R. Probst, J. Song, Tribologie und Schmierungstechnik 70 (2023) 32–39.","din1505-2-1":"<span style=\"font-variant:small-caps;\">Probst, Roman</span> ; <span style=\"font-variant:small-caps;\">Song, Jian</span>: Einfluss der Mikrohärte der Ober- flächenschutzschicht auf den Verschleiß und die Lebensdauer von elektrischen Kontakten bei Reibverschleißbelastung. In: <i>Tribologie und Schmierungstechnik</i> Bd. 70, Narr Francke Attempto Verlag GmbH + Co. KG (2023), Nr. 1, S. 32–39","chicago-de":"Probst, Roman und Jian Song. 2023. Einfluss der Mikrohärte der Ober- flächenschutzschicht auf den Verschleiß und die Lebensdauer von elektrischen Kontakten bei Reibverschleißbelastung. <i>Tribologie und Schmierungstechnik</i> 70, Nr. 1: 32–39. doi:<a href=\"https://doi.org/10.24053/tus-2023-0005\">10.24053/tus-2023-0005</a>, .","van":"Probst R, Song J. Einfluss der Mikrohärte der Ober- flächenschutzschicht auf den Verschleiß und die Lebensdauer von elektrischen Kontakten bei Reibverschleißbelastung. Tribologie und Schmierungstechnik. 2023;70(1):32–9.","ufg":"<b>Probst, Roman/Song, Jian</b>: Einfluss der Mikrohärte der Ober- flächenschutzschicht auf den Verschleiß und die Lebensdauer von elektrischen Kontakten bei Reibverschleißbelastung, in: <i>Tribologie und Schmierungstechnik</i> 70 (2023), H. 1,  S. 32–39.","bjps":"<b>Probst R and Song J</b> (2023) Einfluss der Mikrohärte der Ober- flächenschutzschicht auf den Verschleiß und die Lebensdauer von elektrischen Kontakten bei Reibverschleißbelastung. <i>Tribologie und Schmierungstechnik</i> <b>70</b>, 32–39.","mla":"Probst, Roman, and Jian Song. “Einfluss der Mikrohärte der Ober- flächenschutzschicht auf den Verschleiß und die Lebensdauer von elektrischen Kontakten bei Reibverschleißbelastung.” <i>Tribologie und Schmierungstechnik</i>, vol. 70, no. 1, 2023, pp. 32–39, <a href=\"https://doi.org/10.24053/tus-2023-0005\">https://doi.org/10.24053/tus-2023-0005</a>.","havard":"R. Probst, J. Song, Einfluss der Mikrohärte der Ober- flächenschutzschicht auf den Verschleiß und die Lebensdauer von elektrischen Kontakten bei Reibverschleißbelastung, Tribologie und Schmierungstechnik. 70 (2023) 32–39.","apa":"Probst, R., &#38; Song, J. (2023). Einfluss der Mikrohärte der Ober- flächenschutzschicht auf den Verschleiß und die Lebensdauer von elektrischen Kontakten bei Reibverschleißbelastung. <i>Tribologie und Schmierungstechnik</i>, <i>70</i>(1), 32–39. <a href=\"https://doi.org/10.24053/tus-2023-0005\">https://doi.org/10.24053/tus-2023-0005</a>","chicago":"Probst, Roman, and Jian Song. “Einfluss der Mikrohärte der Ober- flächenschutzschicht auf den Verschleiß und die Lebensdauer von elektrischen Kontakten bei Reibverschleißbelastung.” <i>Tribologie und Schmierungstechnik</i> 70, no. 1 (2023): 32–39. <a href=\"https://doi.org/10.24053/tus-2023-0005\">https://doi.org/10.24053/tus-2023-0005</a>."},"volume":70,"keyword":["Surfaces","Coatings and Films","Surfaces and Interfaces","Mechanical Engineering","Mechanics of Materials"],"language":[{"iso":"ger"}],"publication":"Tribologie und Schmierungstechnik","publication_identifier":{"issn":["0724-3472"]},"date_created":"2024-04-18T08:47:22Z","date_updated":"2024-05-21T12:27:48Z"},{"publisher":"Elsevier ","abstract":[{"text":"Lifetime is an important feature defining the reliability of electrical connectors. In general practice, the lifetime tests required for reliability estimation are time and labor intensive. In our previous work, a data driven method using a statistical process, with an application of probability distributions such as standard normal distribution and generalized extreme value (GEV) distribution with negative skewness to predict degradation paths, was introduced for estimation of the lifetime and FIT rate with the help of electrical contact resistance data collected from short term tests. The proposed method proved its significance by showing the possibility of drastic reduction in the lifetime test duration required for reliability determination. In this work, a non-parametric distribution free method using percentiles of actual measured contact resistances is used for determining the lifetime as against the percentiles of probability distribution used in previous work, thereby simplifying the process further and leading to an even more precise estimation. The lifetimes calculated from parametric and non-parametric methods are compared to highlight the significance of distribution free method in reliability estimation.","lang":"eng"}],"department":[{"_id":"DEP6012"}],"publication_status":"published","article_type":"original","isi":"1","_id":"11348","article_number":"115216","doi":"10.1016/j.microrel.2023.115216","place":"Amsterdam","has_accepted_license":"1","intvolume":"       150","user_id":"83781","type":"scientific_journal_article","status":"public","external_id":{"isi":["001106942700001"]},"year":"2023","author":[{"first_name":"Abhay Rammurti","id":"74188","full_name":"Shukla, Abhay Rammurti","last_name":"Shukla"},{"full_name":"Martin, Robert","first_name":"Robert","last_name":"Martin"},{"first_name":"Roman","id":"69156","full_name":"Probst, Roman","last_name":"Probst"},{"id":"5297","full_name":"Song, Jian","first_name":"Jian","last_name":"Song"}],"citation":{"apa":"Shukla, A. R., Martin, R., Probst, R., &#38; Song, J. (2023). Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests. <i>Microelectronics Reliability</i>, <i>150</i>, Article 115216. <a href=\"https://doi.org/10.1016/j.microrel.2023.115216\">https://doi.org/10.1016/j.microrel.2023.115216</a>","ieee":"A. R. Shukla, R. Martin, R. Probst, and J. Song, “Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests,” <i>Microelectronics Reliability</i>, vol. 150, Art. no. 115216, 2023, doi: <a href=\"https://doi.org/10.1016/j.microrel.2023.115216\">10.1016/j.microrel.2023.115216</a>.","chicago":"Shukla, Abhay Rammurti, Robert Martin, Roman Probst, and Jian Song. “Comparison of Different Statistical Methods for Prediction of Lifetime of Electrical Connectors with Short Term Tests.” <i>Microelectronics Reliability</i> 150 (2023). <a href=\"https://doi.org/10.1016/j.microrel.2023.115216\">https://doi.org/10.1016/j.microrel.2023.115216</a>.","van":"Shukla AR, Martin R, Probst R, Song J. Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests. Microelectronics Reliability. 2023;150.","ama":"Shukla AR, Martin R, Probst R, Song J. Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests. <i>Microelectronics Reliability</i>. 2023;150. doi:<a href=\"https://doi.org/10.1016/j.microrel.2023.115216\">10.1016/j.microrel.2023.115216</a>","ufg":"<b>Shukla, Abhay Rammurti u. a.</b>: Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests, in: <i>Microelectronics Reliability</i> 150 (2023).","havard":"A.R. Shukla, R. Martin, R. Probst, J. Song, Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests, Microelectronics Reliability. 150 (2023).","mla":"Shukla, Abhay Rammurti, et al. “Comparison of Different Statistical Methods for Prediction of Lifetime of Electrical Connectors with Short Term Tests.” <i>Microelectronics Reliability</i>, vol. 150, 115216, 2023, <a href=\"https://doi.org/10.1016/j.microrel.2023.115216\">https://doi.org/10.1016/j.microrel.2023.115216</a>.","bjps":"<b>Shukla AR <i>et al.</i></b> (2023) Comparison of Different Statistical Methods for Prediction of Lifetime of Electrical Connectors with Short Term Tests. <i>Microelectronics Reliability</i> <b>150</b>.","short":"A.R. Shukla, R. Martin, R. Probst, J. Song, Microelectronics Reliability 150 (2023).","chicago-de":"Shukla, Abhay Rammurti, Robert Martin, Roman Probst und Jian Song. 2023. Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests. <i>Microelectronics Reliability</i> 150. doi:<a href=\"https://doi.org/10.1016/j.microrel.2023.115216\">10.1016/j.microrel.2023.115216</a>, .","din1505-2-1":"<span style=\"font-variant:small-caps;\">Shukla, Abhay Rammurti</span> ; <span style=\"font-variant:small-caps;\">Martin, Robert</span> ; <span style=\"font-variant:small-caps;\">Probst, Roman</span> ; <span style=\"font-variant:small-caps;\">Song, Jian</span>: Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests. In: <i>Microelectronics Reliability</i> Bd. 150. Amsterdam, Elsevier  (2023)"},"volume":150,"title":"Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests","keyword":["Electrical and Electronic Engineering","Surfaces","Coatings and Films","Safety","Risk","Reliability and Quality","Condensed Matter Physics","Atomic and Molecular Physics","and Optics","Electronic","Optical and Magnetic Materials"],"language":[{"iso":"eng"}],"date_updated":"2025-06-26T07:51:25Z","publication_identifier":{"unknown":["1872-941X"],"issn":["0026-2714"]},"publication":"Microelectronics Reliability","date_created":"2024-04-18T08:55:38Z"}]