---
_id: '9207'
abstract:
- lang: eng
  text: A new acceleration model for the reliability prediction of electrical connectors
    has recently been published. This model enables the evaluation of failure rates
    gained in highly accelerated life tests (HALT) and considers thermal and vibrational
    loading. However, since the initial study only covered a small set of test parameters,
    further study of the model is required. Previous studies have sufficiently investigated
    the influence of the vibration test mode on the failure rate of electrical connectors.
    Therefore, this study now focuses on the influence of the thermal cycling test.
    A commonly used automotive connector is chosen and subjected to stresses in HALT
    covering various upper temperatures, test durations and thermal cycling frequencies.
    Additionally, the principles of determining the coefficient of temperature difference
    and the coefficient of the thermal cycling frequency are presented, since these
    coefficients are connector specific and required for the acceleration model. Based
    on the numbers of failures in test, the influence of the various thermal cycling
    tests is discussed, and the coefficients are calculated for the chosen connector.
    In conclusion a guideline to select an appropriate upper temperature and test
    duration in order to compare the reliability of different electrical connectors
    is provided.
article_number: '114633'
author:
- first_name: Kevin
  full_name: Krüger, Kevin
  id: '76831'
  last_name: Krüger
- first_name: Jian
  full_name: Song, Jian
  id: '5297'
  last_name: Song
citation:
  ama: 'Krüger K, Song J. The influence of thermal cycling test parameters on the
    failure rate of electrical connectors. <i>Microelectronics reliability : an internat
    journal &#38; world abstracting service</i>. 2022;138(November 2022). doi:<a href="https://doi.org/10.1016/j.microrel.2022.114633">https://doi.org/10.1016/j.microrel.2022.114633</a>'
  apa: 'Krüger, K., &#38; Song, J. (2022). The influence of thermal cycling test parameters
    on the failure rate of electrical connectors. <i>Microelectronics Reliability :
    An Internat. Journal &#38; World Abstracting Service</i>, <i>138</i>(November
    2022), Article 114633. <a href="https://doi.org/10.1016/j.microrel.2022.114633">https://doi.org/10.1016/j.microrel.2022.114633</a>'
  bjps: '<b>Krüger K and Song J</b> (2022) The Influence of Thermal Cycling Test Parameters
    on the Failure Rate of Electrical Connectors. <i>Microelectronics reliability :
    an internat. journal &#38; world abstracting service</i> <b>138</b>.'
  chicago: 'Krüger, Kevin, and Jian Song. “The Influence of Thermal Cycling Test Parameters
    on the Failure Rate of Electrical Connectors.” <i>Microelectronics Reliability :
    An Internat. Journal &#38; World Abstracting Service</i> 138, no. November 2022
    (2022). <a href="https://doi.org/10.1016/j.microrel.2022.114633">https://doi.org/10.1016/j.microrel.2022.114633</a>.'
  chicago-de: 'Krüger, Kevin und Jian Song. 2022. The influence of thermal cycling
    test parameters on the failure rate of electrical connectors. <i>Microelectronics
    reliability : an internat. journal &#38; world abstracting service</i> 138, Nr.
    November 2022. doi:<a href="https://doi.org/10.1016/j.microrel.2022.114633">https://doi.org/10.1016/j.microrel.2022.114633</a>,
    .'
  din1505-2-1: '<span style="font-variant:small-caps;">Krüger, Kevin</span> ; <span
    style="font-variant:small-caps;">Song, Jian</span>: The influence of thermal cycling
    test parameters on the failure rate of electrical connectors. In: <i>Microelectronics
    reliability : an internat. journal &#38; world abstracting service</i> Bd. 138.
    Amsterdam, Elsevier (2022), Nr. November 2022'
  havard: 'K. Krüger, J. Song, The influence of thermal cycling test parameters on
    the failure rate of electrical connectors, Microelectronics Reliability : An Internat.
    Journal &#38; World Abstracting Service. 138 (2022).'
  ieee: 'K. Krüger and J. Song, “The influence of thermal cycling test parameters
    on the failure rate of electrical connectors,” <i>Microelectronics reliability :
    an internat. journal &#38; world abstracting service</i>, vol. 138, no. November
    2022, Art. no. 114633, 2022, doi: <a href="https://doi.org/10.1016/j.microrel.2022.114633">https://doi.org/10.1016/j.microrel.2022.114633</a>.'
  mla: 'Krüger, Kevin, and Jian Song. “The Influence of Thermal Cycling Test Parameters
    on the Failure Rate of Electrical Connectors.” <i>Microelectronics Reliability :
    An Internat. Journal &#38; World Abstracting Service</i>, vol. 138, no. November
    2022, 114633, 2022, <a href="https://doi.org/10.1016/j.microrel.2022.114633">https://doi.org/10.1016/j.microrel.2022.114633</a>.'
  short: 'K. Krüger, J. Song, Microelectronics Reliability : An Internat. Journal
    &#38; World Abstracting Service 138 (2022).'
  ufg: '<b>Krüger, Kevin/Song, Jian</b>: The influence of thermal cycling test parameters
    on the failure rate of electrical connectors, in: <i>Microelectronics reliability :
    an internat. journal &#38; world abstracting service</i> 138 (2022), H. November
    2022.'
  van: 'Krüger K, Song J. The influence of thermal cycling test parameters on the
    failure rate of electrical connectors. Microelectronics reliability : an internat
    journal &#38; world abstracting service. 2022;138(November 2022).'
date_created: 2022-12-11T13:17:29Z
date_updated: 2024-08-05T07:33:56Z
department:
- _id: DEP6012
doi: https://doi.org/10.1016/j.microrel.2022.114633
intvolume: '       138'
issue: November 2022
keyword:
- Electrical connectors
- Life test
- Thermal cycling
- Upper temperature Duration
- Temperature difference
- Cycling frequency
language:
- iso: eng
place: Amsterdam
publication: 'Microelectronics reliability : an internat. journal & world abstracting
  service'
publication_identifier:
  issn:
  - 0026-2714
publication_status: published
publisher: Elsevier
status: public
title: The influence of thermal cycling test parameters on the failure rate of electrical
  connectors
type: scientific_journal_article
user_id: '83781'
volume: 138
year: '2022'
...