[{"publication_status":"published","series_title":"European Conference on Power Electronics and Applications","publisher":"IEEE","conference":{"location":"Hannover","name":"24th European Conference on Power Electronics and Applications (EPE'22 ECCE Europe)","end_date":"2022-09-09","start_date":"2022-09-05"},"department":[{"_id":"DEP6020"}],"abstract":[{"lang":"eng","text":"Today DC offers far-reaching advantages over AC. Therefore, many devices have been equipped with an internal DC link for years. In the field of energy supply, the use of DC technology is also growing and is state of the art e.g. in offshore, high-voltage, automotive and data center applications. The spread of industrial open DC grids is currently starting and is completely different due to the requirements: The DC grid itself and energy flows in an industrial environment are highly dynamic and bidirectional. Due to the low impedance electrical connection of the DC links of many devices, stored energies in fault cases as well as ripple currents during operation place particular requirements on the devices."}],"user_id":"83781","type":"conference_editor_article","place":"[Piscataway, NJ]","_id":"8436","citation":{"short":"S. Puls, J.-N. Koch, M. Ehlich, H. Borcherding, Particular Requirements on Drive Inverters for Safe and Robust Operation on an Open Industrial DC Grid, IEEE, [Piscataway, NJ], 2022.","din1505-2-1":"<span style=\"font-variant:small-caps;\">Puls, Simon</span> ; <span style=\"font-variant:small-caps;\">Koch, Jan-Niklas</span> ; <span style=\"font-variant:small-caps;\">Ehlich, Martin</span> ; <span style=\"font-variant:small-caps;\">Borcherding, Holger</span>: <i>Particular Requirements on Drive Inverters for Safe and Robust Operation on an Open Industrial DC Grid</i>, <i>European Conference on Power Electronics and Applications</i>. [Piscataway, NJ] : IEEE, 2022","chicago-de":"Puls, Simon, Jan-Niklas Koch, Martin Ehlich und Holger Borcherding. 2022. <i>Particular Requirements on Drive Inverters for Safe and Robust Operation on an Open Industrial DC Grid</i>. <i>EPE Proceeding 2022</i>. European Conference on Power Electronics and Applications. [Piscataway, NJ]: IEEE.","apa":"Puls, S., Koch, J.-N., Ehlich, M., &#38; Borcherding, H. (2022). Particular Requirements on Drive Inverters for Safe and Robust Operation on an Open Industrial DC Grid. In <i>EPE Proceeding 2022</i>. 24th European Conference on Power Electronics and Applications (EPE’22 ECCE Europe), Hannover. IEEE.","chicago":"Puls, Simon, Jan-Niklas Koch, Martin Ehlich, and Holger Borcherding. <i>Particular Requirements on Drive Inverters for Safe and Robust Operation on an Open Industrial DC Grid</i>. <i>EPE Proceeding 2022</i>. European Conference on Power Electronics and Applications. [Piscataway, NJ]: IEEE, 2022.","van":"Puls S, Koch JN, Ehlich M, Borcherding H. Particular Requirements on Drive Inverters for Safe and Robust Operation on an Open Industrial DC Grid. EPE Proceeding 2022. [Piscataway, NJ]: IEEE; 2022. (European Conference on Power Electronics and Applications).","ufg":"<b>Puls, Simon u. a.</b>: Particular Requirements on Drive Inverters for Safe and Robust Operation on an Open Industrial DC Grid, [Piscataway, NJ] 2022 (European Conference on Power Electronics and Applications).","bjps":"<b>Puls S <i>et al.</i></b> (2022) <i>Particular Requirements on Drive Inverters for Safe and Robust Operation on an Open Industrial DC Grid</i>. [Piscataway, NJ]: IEEE.","havard":"S. Puls, J.-N. Koch, M. Ehlich, H. Borcherding, Particular Requirements on Drive Inverters for Safe and Robust Operation on an Open Industrial DC Grid, IEEE, [Piscataway, NJ], 2022.","mla":"Puls, Simon, et al. “Particular Requirements on Drive Inverters for Safe and Robust Operation on an Open Industrial DC Grid.” <i>EPE Proceeding 2022</i>, IEEE, 2022.","ieee":"S. Puls, J.-N. Koch, M. Ehlich, and H. Borcherding, <i>Particular Requirements on Drive Inverters for Safe and Robust Operation on an Open Industrial DC Grid</i>. [Piscataway, NJ]: IEEE, 2022.","ama":"Puls S, Koch JN, Ehlich M, Borcherding H. <i>Particular Requirements on Drive Inverters for Safe and Robust Operation on an Open Industrial DC Grid</i>. IEEE; 2022."},"title":"Particular Requirements on Drive Inverters for Safe and Robust Operation on an Open Industrial DC Grid","status":"public","year":"2022","main_file_link":[{"open_access":"1","url":"https://ieeexplore.ieee.org/document/9907118"}],"author":[{"full_name":"Puls, Simon","id":"85051","first_name":"Simon","last_name":"Puls"},{"id":"58889","first_name":"Jan-Niklas","full_name":"Koch, Jan-Niklas","last_name":"Koch"},{"first_name":"Martin","last_name":"Ehlich","full_name":"Ehlich, Martin"},{"full_name":"Borcherding, Holger","first_name":"Holger","last_name":"Borcherding","id":"1693"}],"date_updated":"2025-06-26T13:36:25Z","date_created":"2022-07-05T14:00:56Z","publication":"EPE Proceeding 2022","publication_identifier":{"issn":["2325-0313"],"isbn":["978-9-0758-1539-9"]},"language":[{"iso":"eng"}],"keyword":["Industries","Semiconductor device measurement","Capacitors","Europe","High-voltage techniques","Inverters","Circuit faults"],"oa":"1"},{"publication_identifier":{"isbn":["978-1-6654-4042-4"],"eisbn":["978-1-6654-4041-7"]},"date_created":"2022-07-06T08:55:01Z","type":"conference_editor","editor":[{"full_name":"Schaab, Darian","last_name":"Schaab","first_name":"Darian"},{"first_name":"Patrick","last_name":"Spanier","id":"43516","full_name":"Spanier, Patrick"},{"last_name":"Ehlich ","first_name":"Martin ","full_name":"Ehlich , Martin "},{"first_name":"Eric ","full_name":"Fosselmann, Eric ","last_name":"Fosselmann"}],"user_id":"83781","date_updated":"2024-08-07T09:37:05Z","_id":"8437","doi":"10.1109/CEECT53198.2021.9672633","keyword":["Renewable energy sources","Power demand","Process control","Voltage","Robustness","Planning","Stakeholders"],"place":"Piscataway, NJ","language":[{"iso":"eng"}],"title":"Design Framework for Multiple Infeed DC-Microgrids in Industrial Applications","series_title":"2021 3rd International Conference on Electrical Engineering and Control Technologies (CEECT)","citation":{"ama":"Schaab D, Spanier P, Ehlich  M, Fosselmann E, eds. <i>Design Framework for Multiple Infeed DC-Microgrids in Industrial Applications</i>. IEEE; 2022. doi:<a href=\"https://doi.org/10.1109/CEECT53198.2021.9672633\">10.1109/CEECT53198.2021.9672633</a>","ieee":"D. Schaab, P. Spanier, M. Ehlich , and E. Fosselmann, Eds., <i>Design Framework for Multiple Infeed DC-Microgrids in Industrial Applications</i>. Piscataway, NJ: IEEE, 2022. doi: <a href=\"https://doi.org/10.1109/CEECT53198.2021.9672633\">10.1109/CEECT53198.2021.9672633</a>.","van":"Schaab D, Spanier P, Ehlich  M, Fosselmann E, editors. Design Framework for Multiple Infeed DC-Microgrids in Industrial Applications. Piscataway, NJ: IEEE; 2022. (2021 3rd International Conference on Electrical Engineering and Control Technologies (CEECT)).","havard":"D. Schaab, P. Spanier, M. Ehlich , E. Fosselmann, eds., Design Framework for Multiple Infeed DC-Microgrids in Industrial Applications, IEEE, Piscataway, NJ, 2022.","bjps":"<b>Schaab D <i>et al.</i> (eds)</b> (2022) <i>Design Framework for Multiple Infeed DC-Microgrids in Industrial Applications</i>. Piscataway, NJ: IEEE.","mla":"Schaab, Darian, et al., editors. <i>Design Framework for Multiple Infeed DC-Microgrids in Industrial Applications</i>. IEEE, 2022, <a href=\"https://doi.org/10.1109/CEECT53198.2021.9672633\">https://doi.org/10.1109/CEECT53198.2021.9672633</a>.","ufg":"<i><i>Schaab, Darian</i> u. a.</i>: Design Framework for Multiple Infeed DC-Microgrids in Industrial Applications, Piscataway, NJ 2022 (2021 3rd International Conference on Electrical Engineering and Control Technologies (CEECT)).","apa":"Schaab, D., Spanier, P., Ehlich , M., &#38; Fosselmann, E. (Eds.). (2022). <i>Design Framework for Multiple Infeed DC-Microgrids in Industrial Applications</i>. IEEE. <a href=\"https://doi.org/10.1109/CEECT53198.2021.9672633\">https://doi.org/10.1109/CEECT53198.2021.9672633</a>","chicago":"Schaab, Darian, Patrick Spanier, Martin  Ehlich , and Eric  Fosselmann, eds. <i>Design Framework for Multiple Infeed DC-Microgrids in Industrial Applications</i>. 2021 3rd International Conference on Electrical Engineering and Control Technologies (CEECT). Piscataway, NJ: IEEE, 2022. <a href=\"https://doi.org/10.1109/CEECT53198.2021.9672633\">https://doi.org/10.1109/CEECT53198.2021.9672633</a>.","short":"D. Schaab, P. Spanier, M. Ehlich , E. Fosselmann, eds., Design Framework for Multiple Infeed DC-Microgrids in Industrial Applications, IEEE, Piscataway, NJ, 2022.","din1505-2-1":"<span style=\"font-variant:small-caps;\">Schaab, D.</span> ; <span style=\"font-variant:small-caps;\">Spanier, P.</span> ; <span style=\"font-variant:small-caps;\">Ehlich , M.</span> ; <span style=\"font-variant:small-caps;\">Fosselmann, E.</span> (Hrsg.): <i>Design Framework for Multiple Infeed DC-Microgrids in Industrial Applications</i>, <i>2021 3rd International Conference on Electrical Engineering and Control Technologies (CEECT)</i>. Piscataway, NJ : IEEE, 2022","chicago-de":"Schaab, Darian, Patrick Spanier, Martin  Ehlich  und Eric  Fosselmann, Hrsg. 2022. <i>Design Framework for Multiple Infeed DC-Microgrids in Industrial Applications</i>. 2021 3rd International Conference on Electrical Engineering and Control Technologies (CEECT). Piscataway, NJ: IEEE. doi:<a href=\"https://doi.org/10.1109/CEECT53198.2021.9672633\">10.1109/CEECT53198.2021.9672633</a>, ."},"publication_status":"published","abstract":[{"lang":"eng","text":"Low voltage direct current microgrids (DC-MG) provide a solution for increased efficiency by the reduction of conversion losses, total reuse of recuperation energy and an increased share of local power generation. Especially industrial applications ask for high uptimes and a stable voltage supply, which are both at stake in a power grid dominated by renewable generation. DC-MGs overcome these drawbacks by balancing energy distribution and power demand locally. For the planning and design of these grids a systemic approach is needed, due to the fact that many components are interacting. The task arises of structuring the knowledge available for individual technologies in an overall design framework. For this purpose, current state-of-the-art design processes are discussed in this article. These processes are mapped into the context of the requirements in an industrial environment. The findings are transferred to the design of industrial DC networks. Finally, a complete design process for DC-MGs is derived, which is proposed as a basis for the development of tools."}],"year":"2022","department":[{"_id":"DEP6020"},{"_id":"DEP5018"}],"conference":{"end_date":"2021-12-18","start_date":"2021-12-16","location":" Macau, Macao ","name":"3rd International Conference on Electrical Engineering and Control Technologies (CEECT)"},"publisher":"IEEE","quality_controlled":"1","status":"public"},{"title":"Influence of Core/Shell Nanoparticles on the Fretting Behavior of Electrical Contacts","citation":{"short":"H. Yuan, R. Probst, J. Song, Influence of Core/Shell Nanoparticles on the Fretting Behavior of Electrical Contacts, IEEE, Piscataway, NJ, 2022.","chicago-de":"Yuan, Haomiao, Roman Probst und Jian Song. 2022. <i>Influence of Core/Shell Nanoparticles on the Fretting Behavior of Electrical Contacts</i>. <i>Electrical contacts - 2022 : proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts</i>. Piscataway, NJ: IEEE. doi:<a href=\"https://doi.org/10.1109/HLM54538.2022.9969773\">10.1109/HLM54538.2022.9969773</a>, .","din1505-2-1":"<span style=\"font-variant:small-caps;\">Yuan, Haomiao</span> ; <span style=\"font-variant:small-caps;\">Probst, Roman</span> ; <span style=\"font-variant:small-caps;\">Song, Jian</span>: <i>Influence of Core/Shell Nanoparticles on the Fretting Behavior of Electrical Contacts</i>. Piscataway, NJ : IEEE, 2022","ama":"Yuan H, Probst R, Song J. <i>Influence of Core/Shell Nanoparticles on the Fretting Behavior of Electrical Contacts</i>. IEEE; 2022:166-173. doi:<a href=\"https://doi.org/10.1109/HLM54538.2022.9969773\">10.1109/HLM54538.2022.9969773</a>","van":"Yuan H, Probst R, Song J. Influence of Core/Shell Nanoparticles on the Fretting Behavior of Electrical Contacts. Electrical contacts - 2022 : proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts. Piscataway, NJ: IEEE; 2022.","havard":"H. Yuan, R. Probst, J. Song, Influence of Core/Shell Nanoparticles on the Fretting Behavior of Electrical Contacts, IEEE, Piscataway, NJ, 2022.","mla":"Yuan, Haomiao, et al. “Influence of Core/Shell Nanoparticles on the Fretting Behavior of Electrical Contacts.” <i>Electrical Contacts - 2022 : Proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts</i>, IEEE, 2022, pp. 166–73, <a href=\"https://doi.org/10.1109/HLM54538.2022.9969773\">https://doi.org/10.1109/HLM54538.2022.9969773</a>.","bjps":"<b>Yuan H, Probst R and Song J</b> (2022) <i>Influence of Core/Shell Nanoparticles on the Fretting Behavior of Electrical Contacts</i>. Piscataway, NJ: IEEE.","ufg":"<b>Yuan, Haomiao/Probst, Roman/Song, Jian</b>: Influence of Core/Shell Nanoparticles on the Fretting Behavior of Electrical Contacts, Piscataway, NJ 2022.","ieee":"H. Yuan, R. Probst, and J. Song, <i>Influence of Core/Shell Nanoparticles on the Fretting Behavior of Electrical Contacts</i>. Piscataway, NJ: IEEE, 2022, pp. 166–173. doi: <a href=\"https://doi.org/10.1109/HLM54538.2022.9969773\">10.1109/HLM54538.2022.9969773</a>.","apa":"Yuan, H., Probst, R., &#38; Song, J. (2022). Influence of Core/Shell Nanoparticles on the Fretting Behavior of Electrical Contacts. In <i>Electrical contacts - 2022 : proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts</i> (pp. 166–173). IEEE. <a href=\"https://doi.org/10.1109/HLM54538.2022.9969773\">https://doi.org/10.1109/HLM54538.2022.9969773</a>","chicago":"Yuan, Haomiao, Roman Probst, and Jian Song. <i>Influence of Core/Shell Nanoparticles on the Fretting Behavior of Electrical Contacts</i>. <i>Electrical Contacts - 2022 : Proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts</i>. Piscataway, NJ: IEEE, 2022. <a href=\"https://doi.org/10.1109/HLM54538.2022.9969773\">https://doi.org/10.1109/HLM54538.2022.9969773</a>."},"author":[{"first_name":"Haomiao","full_name":"Yuan, Haomiao","id":"61860","last_name":"Yuan"},{"first_name":"Roman","last_name":"Probst","full_name":"Probst, Roman","id":"69156"},{"id":"5297","first_name":"Jian","full_name":"Song, Jian","last_name":"Song"}],"year":"2022","status":"public","page":"166 - 173","publication_identifier":{"eissn":["978-1-6654-5965-5"],"isbn":["978-1-6654-5966-2","978-1-6654-5967-9"],"issn":["2158-9992"]},"publication":"Electrical contacts - 2022 : proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts","date_created":"2022-12-11T13:46:02Z","date_updated":"2024-08-05T08:01:04Z","keyword":["Nanoparticles","Resistance","Fabrication","Silver","Costs","Contacts","Voltage"],"language":[{"iso":"eng"}],"publication_status":"published","abstract":[{"lang":"eng","text":"In order to guarantee long lifetime and high performance of electrical contacts, a plating is usually applied on the base material. Silver is a promising plating material because of a good balance between performance and costs. The conventional silver plating is soft; therefore, a thick silver plating should be used to prevent the wear through during the operation. In order to enhance the wear resistance and prolong the lifetime of the silver plating, silver platings are modified by co-depositing nanoparticles with a core/shell structure into the silver matrix. A novel method to prepare the Ag (shell)@Al 2 O 3 (core) nanoparticles by galvanic process is introduced in this paper. The influence of fabrication parameters in the galvanic process such as the concentration of silver nitrate solution and the plating voltage on the silver content in the Ag@Al 2 O 3 nanoparticles is investigated. Afterwards, different concentrations of core/shell nanoparticles are co-deposited into the silver plating to study the effect of nanoparticles on the microhardness, microstructure and the lifetime of the silver plating. As a result, the microhardness and the lifetime of the silver plating are significantly improved and a favorable nanoparticle concentration exists for the longest lifetime. Moreover, the mechanism of the lifetime improvement is determined."}],"conference":{"location":" Tampa, FL, USA","name":"67th Holm Conference on Electrical Contacts","end_date":"2022-10-26","start_date":"2022-10-23"},"department":[{"_id":"DEP6012"}],"publisher":"IEEE","type":"conference_editor_article","user_id":"83781","_id":"9210","doi":"10.1109/HLM54538.2022.9969773","place":"Piscataway, NJ"},{"date_created":"2018-12-10T15:11:18Z","publication":"2017 IEEE Second International Conference on DC Microgrids (ICDCM)","related_material":{"link":[{"relation":"contains","url":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=8001049"}]},"date_updated":"2023-03-15T13:49:46Z","corporate_editor":["Institute of Electrical and Electronics Engineers (IEEE)"],"language":[{"iso":"eng"}],"keyword":["AC-DC power convertors","electromagnetic compatibility","energy conservation","energy management systems","rectifiers","main power supply","industrial production","DC network","AC-DC conversion","rectifier topologies","EMC properties","intelligent energy management","energy efficiency improvement","downtime reduction","Rectifiers","Switches","Voltage control","Topology","Network topology","Production","Grounding","industrial DC grid","SMART Grid"],"title":"Concepts for a DC Network in Industrial Production","citation":{"ama":"Borcherding H, Austermann J, Kuhlmann T, Weis B, Leonide A. Concepts for a DC Network in Industrial Production. In: Institute of Electrical and Electronics Engineers (IEEE), ed. <i>2017 IEEE Second International Conference on DC Microgrids (ICDCM)</i>. Danvers; 2017:227-234. doi:<a href=\"https://doi.org/10.1109/ICDCM.2017.8001049\">10.1109/ICDCM.2017.8001049</a>","ieee":"H. Borcherding, J. Austermann, T. Kuhlmann, B. Weis, and A. Leonide, “Concepts for a DC Network in Industrial Production,” in <i>2017 IEEE Second International Conference on DC Microgrids (ICDCM)</i>, Nürnberg, 2017, no. 1, pp. 227–234.","van":"Borcherding H, Austermann J, Kuhlmann T, Weis B, Leonide A. Concepts for a DC Network in Industrial Production. In: Institute of Electrical and Electronics Engineers (IEEE), editor. 2017 IEEE Second International Conference on DC Microgrids (ICDCM). Danvers; 2017. p. 227–34.","havard":"H. Borcherding, J. Austermann, T. Kuhlmann, B. Weis, A. Leonide, Concepts for a DC Network in Industrial Production, in: Institute of Electrical and Electronics Engineers (IEEE) (Ed.), 2017 IEEE Second International Conference on DC Microgrids (ICDCM), Danvers, 2017: pp. 227–234.","bjps":"<b>Borcherding H <i>et al.</i></b> (2017) Concepts for a DC Network in Industrial Production. In Institute of Electrical and Electronics Engineers (IEEE) (ed.), <i>2017 IEEE Second International Conference on DC Microgrids (ICDCM)</i>. Danvers, pp. 227–234.","mla":"Borcherding, Holger, et al. “Concepts for a DC Network in Industrial Production.” <i>2017 IEEE Second International Conference on DC Microgrids (ICDCM)</i>, edited by Institute of Electrical and Electronics Engineers (IEEE), no. 1, 2017, pp. 227–34, doi:<a href=\"https://doi.org/10.1109/ICDCM.2017.8001049\">10.1109/ICDCM.2017.8001049</a>.","ufg":"<b>Borcherding, Holger et. al. (2017)</b>: Concepts for a DC Network in Industrial Production, in: Institute of Electrical and Electronics Engineers (IEEE) (Hg.): <i>2017 IEEE Second International Conference on DC Microgrids (ICDCM)</i>, Danvers, S. 227–234.","apa":"Borcherding, H., Austermann, J., Kuhlmann, T., Weis, B., &#38; Leonide, A. (2017). Concepts for a DC Network in Industrial Production. In Institute of Electrical and Electronics Engineers (IEEE) (Ed.), <i>2017 IEEE Second International Conference on DC Microgrids (ICDCM)</i> (pp. 227–234). Danvers. <a href=\"https://doi.org/10.1109/ICDCM.2017.8001049\">https://doi.org/10.1109/ICDCM.2017.8001049</a>","chicago":"Borcherding, Holger, Johann Austermann, Timm Kuhlmann, Benno Weis, and Andre Leonide. “Concepts for a DC Network in Industrial Production.” In <i>2017 IEEE Second International Conference on DC Microgrids (ICDCM)</i>, edited by Institute of Electrical and Electronics Engineers (IEEE), 227–34. Danvers, 2017. <a href=\"https://doi.org/10.1109/ICDCM.2017.8001049\">https://doi.org/10.1109/ICDCM.2017.8001049</a>.","short":"H. Borcherding, J. Austermann, T. Kuhlmann, B. Weis, A. Leonide, in: Institute of Electrical and Electronics Engineers (IEEE) (Ed.), 2017 IEEE Second International Conference on DC Microgrids (ICDCM), Danvers, 2017, pp. 227–234.","din1505-2-1":"<span style=\"font-variant:small-caps;\">Borcherding, Holger</span> ; <span style=\"font-variant:small-caps;\">Austermann, Johann</span> ; <span style=\"font-variant:small-caps;\">Kuhlmann, Timm</span> ; <span style=\"font-variant:small-caps;\">Weis, Benno</span> ; <span style=\"font-variant:small-caps;\">Leonide, Andre</span>: Concepts for a DC Network in Industrial Production. In: <span style=\"font-variant:small-caps;\">Institute of Electrical and Electronics Engineers (IEEE)</span> (Hrsg.): <i>2017 IEEE Second International Conference on DC Microgrids (ICDCM)</i>. Danvers, 2017, S. 227–234","chicago-de":"Borcherding, Holger, Johann Austermann, Timm Kuhlmann, Benno Weis und Andre Leonide. 2017. Concepts for a DC Network in Industrial Production. In: <i>2017 IEEE Second International Conference on DC Microgrids (ICDCM)</i>, hg. von Institute of Electrical and Electronics Engineers (IEEE), 227–234. Danvers. doi:<a href=\"https://doi.org/10.1109/ICDCM.2017.8001049,\">10.1109/ICDCM.2017.8001049,</a> ."},"year":2017,"main_file_link":[{"url":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=8001049"}],"author":[{"last_name":"Borcherding","first_name":"Holger","full_name":"Borcherding, Holger","id":"1693"},{"first_name":"Johann","last_name":"Austermann","id":"42114","full_name":"Austermann, Johann"},{"last_name":"Kuhlmann","full_name":"Kuhlmann, Timm","first_name":"Timm"},{"last_name":"Weis","first_name":"Benno","full_name":"Weis, Benno"},{"last_name":"Leonide","full_name":"Leonide, Andre","first_name":"Andre"}],"page":"227-234","status":"public","type":"conference","user_id":"45673","place":"Danvers","doi":"10.1109/ICDCM.2017.8001049","_id":"328","department":[{"_id":"DEP5018"}],"conference":{"location":"Nürnberg","name":"IEEE Second International Conference on DC Microgrids (ICDCM) ","start_date":"2017-06-27","end_date":"2017-06-29"},"abstract":[{"lang":"eng","text":"In  this  paper,  concepts  for  an  extended  DC network for the main power supply of components from various manufacturers in industrial production are presented. In the first part,  detailed  requirements  for  such  a  network  are  given  from the  viewpoint  of  a  customer.  Based  on  those,  different  concepts for AC/DC conversion and energy management are discussed. As far  as  AC/DC  conversion  is  concerned,  the  advantages  and drawbacks of several rectifier topologies are listed, as they have a significant  impact  on  the  system  behavior  and  EMC  properties. \r\nAn  intelligent  energy  management  can  improve  the  energy efficiency  and  reduce  downtimes  of  a  plant,  which  are  major requirements from a customer’s viewpoint. "}],"issue":"1"},{"publication_status":"published","department":[{"_id":"DEP5000"},{"_id":"DEP5023"}],"conference":{"name":"6th International Conference on Electrical and Electronics Engineering, ELECO","location":"Bursa, Turkey ","end_date":"2009-09-08","start_date":"2009-09-05"},"abstract":[{"text":"This paper describes a method for automatically obtaining the order and position of contactless connected network participants in a linear physical topology. While the sequence of network devices can be determined with quite simple methods in networks with physical interconnections, these methods can not be applied in contactless networks. This work is based on a linear network topology using a backbone rail, which includes mechanisms for contactless energy and data transmission. The position estimation for each attached network device can be performed by determining a specific physical characteristic, which is altered along the rail extension. The proposed solution uses a capacitive resonant circuit to achieve a position detection.","lang":"eng"}],"publisher":"IEEE","type":"conference_editor_article","user_id":"83781","place":"Piscataway, NJ","doi":"10.1109/ELECO.2009.5355273","_id":"10155","title":"Position Detection in linear, proximity coupling Networks","citation":{"ama":"Wesemann D, Witte S, Michels JS. <i>Position Detection in Linear, Proximity Coupling Networks</i>. (Institute of Electrical and Electronics Engineers, ed.). IEEE; 2009. doi:<a href=\"https://doi.org/10.1109/ELECO.2009.5355273\">10.1109/ELECO.2009.5355273</a>","ieee":"D. Wesemann, S. Witte, and J.-S. Michels, <i>Position Detection in linear, proximity coupling Networks</i>. Piscataway, NJ: IEEE, 2009. doi: <a href=\"https://doi.org/10.1109/ELECO.2009.5355273\">10.1109/ELECO.2009.5355273</a>.","havard":"D. Wesemann, S. Witte, J.-S. Michels, Position Detection in linear, proximity coupling Networks, IEEE, Piscataway, NJ, 2009.","bjps":"<b>Wesemann D, Witte S and Michels J-S</b> (2009) <i>Position Detection in Linear, Proximity Coupling Networks</i>, Institute of Electrical and Electronics Engineers (ed.). Piscataway, NJ: IEEE.","mla":"Wesemann, Derk, et al. “Position Detection in Linear, Proximity Coupling Networks.” <i>2009 International Conference on Electrical and Electronics Engineering - ELECO 2009</i>, edited by Institute of Electrical and Electronics Engineers, IEEE, 2009, <a href=\"https://doi.org/10.1109/ELECO.2009.5355273\">https://doi.org/10.1109/ELECO.2009.5355273</a>.","ufg":"<b>Wesemann, Derk/Witte, Stefan/Michels, Jan-Stefan</b>: Position Detection in linear, proximity coupling Networks, hg. von Institute of Electrical and Electronics Engineers, Piscataway, NJ 2009.","van":"Wesemann D, Witte S, Michels JS. Position Detection in linear, proximity coupling Networks. Institute of Electrical and Electronics Engineers, editor. 2009 International Conference on Electrical and Electronics Engineering - ELECO 2009. Piscataway, NJ: IEEE; 2009.","chicago":"Wesemann, Derk, Stefan Witte, and Jan-Stefan Michels. <i>Position Detection in Linear, Proximity Coupling Networks</i>. Edited by Institute of Electrical and Electronics Engineers. <i>2009 International Conference on Electrical and Electronics Engineering - ELECO 2009</i>. Piscataway, NJ: IEEE, 2009. <a href=\"https://doi.org/10.1109/ELECO.2009.5355273\">https://doi.org/10.1109/ELECO.2009.5355273</a>.","apa":"Wesemann, D., Witte, S., &#38; Michels, J.-S. (2009). Position Detection in linear, proximity coupling Networks. In Institute of Electrical and Electronics Engineers (Ed.), <i>2009 International Conference on Electrical and Electronics Engineering - ELECO 2009</i>. IEEE. <a href=\"https://doi.org/10.1109/ELECO.2009.5355273\">https://doi.org/10.1109/ELECO.2009.5355273</a>","chicago-de":"Wesemann, Derk, Stefan Witte und Jan-Stefan Michels. 2009. <i>Position Detection in linear, proximity coupling Networks</i>. Hg. von Institute of Electrical and Electronics Engineers. <i>2009 International Conference on Electrical and Electronics Engineering - ELECO 2009</i>. Piscataway, NJ: IEEE. doi:<a href=\"https://doi.org/10.1109/ELECO.2009.5355273\">10.1109/ELECO.2009.5355273</a>, .","din1505-2-1":"<span style=\"font-variant:small-caps;\">Wesemann, Derk</span> ; <span style=\"font-variant:small-caps;\">Witte, Stefan</span> ; <span style=\"font-variant:small-caps;\">Michels, Jan-Stefan</span> ; <span style=\"font-variant:small-caps;\">Institute of Electrical and Electronics Engineers</span> (Hrsg.): <i>Position Detection in linear, proximity coupling Networks</i>. Piscataway, NJ : IEEE, 2009","short":"D. Wesemann, S. Witte, J.-S. Michels, Position Detection in Linear, Proximity Coupling Networks, IEEE, Piscataway, NJ, 2009."},"author":[{"id":"1273","full_name":"Wesemann, Derk","last_name":"Wesemann","first_name":"Derk"},{"last_name":"Witte","full_name":"Witte, Stefan","first_name":"Stefan","id":"1605"},{"full_name":"Michels, Jan-Stefan","first_name":"Jan-Stefan","last_name":"Michels"}],"year":"2009","status":"public","date_created":"2023-07-27T10:06:21Z","publication_identifier":{"isbn":["978-9944-89-818-8"],"unknown":["978-1424-45-106-7"]},"publication":"2009 International Conference on Electrical and Electronics Engineering - ELECO 2009","date_updated":"2023-08-03T08:05:57Z","corporate_editor":["Institute of Electrical and Electronics Engineers"],"language":[{"iso":"eng"}],"keyword":["network topology","position measurement","voltage measurement","wireless sensor networks"]}]