---
_id: '8436'
abstract:
- lang: eng
  text: 'Today DC offers far-reaching advantages over AC. Therefore, many devices
    have been equipped with an internal DC link for years. In the field of energy
    supply, the use of DC technology is also growing and is state of the art e.g.
    in offshore, high-voltage, automotive and data center applications. The spread
    of industrial open DC grids is currently starting and is completely different
    due to the requirements: The DC grid itself and energy flows in an industrial
    environment are highly dynamic and bidirectional. Due to the low impedance electrical
    connection of the DC links of many devices, stored energies in fault cases as
    well as ripple currents during operation place particular requirements on the
    devices.'
author:
- first_name: Simon
  full_name: Puls, Simon
  id: '85051'
  last_name: Puls
- first_name: Jan-Niklas
  full_name: Koch, Jan-Niklas
  id: '58889'
  last_name: Koch
- first_name: Martin
  full_name: Ehlich, Martin
  last_name: Ehlich
- first_name: Holger
  full_name: Borcherding, Holger
  id: '1693'
  last_name: Borcherding
citation:
  ama: Puls S, Koch JN, Ehlich M, Borcherding H. <i>Particular Requirements on Drive
    Inverters for Safe and Robust Operation on an Open Industrial DC Grid</i>. IEEE;
    2022.
  apa: Puls, S., Koch, J.-N., Ehlich, M., &#38; Borcherding, H. (2022). Particular
    Requirements on Drive Inverters for Safe and Robust Operation on an Open Industrial
    DC Grid. In <i>EPE Proceeding 2022</i>. 24th European Conference on Power Electronics
    and Applications (EPE’22 ECCE Europe), Hannover. IEEE.
  bjps: '<b>Puls S <i>et al.</i></b> (2022) <i>Particular Requirements on Drive Inverters
    for Safe and Robust Operation on an Open Industrial DC Grid</i>. [Piscataway,
    NJ]: IEEE.'
  chicago: 'Puls, Simon, Jan-Niklas Koch, Martin Ehlich, and Holger Borcherding. <i>Particular
    Requirements on Drive Inverters for Safe and Robust Operation on an Open Industrial
    DC Grid</i>. <i>EPE Proceeding 2022</i>. European Conference on Power Electronics
    and Applications. [Piscataway, NJ]: IEEE, 2022.'
  chicago-de: 'Puls, Simon, Jan-Niklas Koch, Martin Ehlich und Holger Borcherding.
    2022. <i>Particular Requirements on Drive Inverters for Safe and Robust Operation
    on an Open Industrial DC Grid</i>. <i>EPE Proceeding 2022</i>. European Conference
    on Power Electronics and Applications. [Piscataway, NJ]: IEEE.'
  din1505-2-1: '<span style="font-variant:small-caps;">Puls, Simon</span> ; <span
    style="font-variant:small-caps;">Koch, Jan-Niklas</span> ; <span style="font-variant:small-caps;">Ehlich,
    Martin</span> ; <span style="font-variant:small-caps;">Borcherding, Holger</span>:
    <i>Particular Requirements on Drive Inverters for Safe and Robust Operation on
    an Open Industrial DC Grid</i>, <i>European Conference on Power Electronics and
    Applications</i>. [Piscataway, NJ] : IEEE, 2022'
  havard: S. Puls, J.-N. Koch, M. Ehlich, H. Borcherding, Particular Requirements
    on Drive Inverters for Safe and Robust Operation on an Open Industrial DC Grid,
    IEEE, [Piscataway, NJ], 2022.
  ieee: 'S. Puls, J.-N. Koch, M. Ehlich, and H. Borcherding, <i>Particular Requirements
    on Drive Inverters for Safe and Robust Operation on an Open Industrial DC Grid</i>.
    [Piscataway, NJ]: IEEE, 2022.'
  mla: Puls, Simon, et al. “Particular Requirements on Drive Inverters for Safe and
    Robust Operation on an Open Industrial DC Grid.” <i>EPE Proceeding 2022</i>, IEEE,
    2022.
  short: S. Puls, J.-N. Koch, M. Ehlich, H. Borcherding, Particular Requirements on
    Drive Inverters for Safe and Robust Operation on an Open Industrial DC Grid, IEEE,
    [Piscataway, NJ], 2022.
  ufg: '<b>Puls, Simon u. a.</b>: Particular Requirements on Drive Inverters for Safe
    and Robust Operation on an Open Industrial DC Grid, [Piscataway, NJ] 2022 (European
    Conference on Power Electronics and Applications).'
  van: 'Puls S, Koch JN, Ehlich M, Borcherding H. Particular Requirements on Drive
    Inverters for Safe and Robust Operation on an Open Industrial DC Grid. EPE Proceeding
    2022. [Piscataway, NJ]: IEEE; 2022. (European Conference on Power Electronics
    and Applications).'
conference:
  end_date: 2022-09-09
  location: Hannover
  name: 24th European Conference on Power Electronics and Applications (EPE'22 ECCE
    Europe)
  start_date: 2022-09-05
date_created: 2022-07-05T14:00:56Z
date_updated: 2025-06-26T13:36:25Z
department:
- _id: DEP6020
keyword:
- Industries
- Semiconductor device measurement
- Capacitors
- Europe
- High-voltage techniques
- Inverters
- Circuit faults
language:
- iso: eng
main_file_link:
- open_access: '1'
  url: https://ieeexplore.ieee.org/document/9907118
oa: '1'
place: '[Piscataway, NJ]'
publication: EPE Proceeding 2022
publication_identifier:
  isbn:
  - 978-9-0758-1539-9
  issn:
  - 2325-0313
publication_status: published
publisher: IEEE
series_title: European Conference on Power Electronics and Applications
status: public
title: Particular Requirements on Drive Inverters for Safe and Robust Operation on
  an Open Industrial DC Grid
type: conference_editor_article
user_id: '83781'
year: '2022'
...
---
_id: '8437'
abstract:
- lang: eng
  text: Low voltage direct current microgrids (DC-MG) provide a solution for increased
    efficiency by the reduction of conversion losses, total reuse of recuperation
    energy and an increased share of local power generation. Especially industrial
    applications ask for high uptimes and a stable voltage supply, which are both
    at stake in a power grid dominated by renewable generation. DC-MGs overcome these
    drawbacks by balancing energy distribution and power demand locally. For the planning
    and design of these grids a systemic approach is needed, due to the fact that
    many components are interacting. The task arises of structuring the knowledge
    available for individual technologies in an overall design framework. For this
    purpose, current state-of-the-art design processes are discussed in this article.
    These processes are mapped into the context of the requirements in an industrial
    environment. The findings are transferred to the design of industrial DC networks.
    Finally, a complete design process for DC-MGs is derived, which is proposed as
    a basis for the development of tools.
citation:
  ama: Schaab D, Spanier P, Ehlich  M, Fosselmann E, eds. <i>Design Framework for
    Multiple Infeed DC-Microgrids in Industrial Applications</i>. IEEE; 2022. doi:<a
    href="https://doi.org/10.1109/CEECT53198.2021.9672633">10.1109/CEECT53198.2021.9672633</a>
  apa: Schaab, D., Spanier, P., Ehlich , M., &#38; Fosselmann, E. (Eds.). (2022).
    <i>Design Framework for Multiple Infeed DC-Microgrids in Industrial Applications</i>.
    IEEE. <a href="https://doi.org/10.1109/CEECT53198.2021.9672633">https://doi.org/10.1109/CEECT53198.2021.9672633</a>
  bjps: '<b>Schaab D <i>et al.</i> (eds)</b> (2022) <i>Design Framework for Multiple
    Infeed DC-Microgrids in Industrial Applications</i>. Piscataway, NJ: IEEE.'
  chicago: 'Schaab, Darian, Patrick Spanier, Martin  Ehlich , and Eric  Fosselmann,
    eds. <i>Design Framework for Multiple Infeed DC-Microgrids in Industrial Applications</i>.
    2021 3rd International Conference on Electrical Engineering and Control Technologies
    (CEECT). Piscataway, NJ: IEEE, 2022. <a href="https://doi.org/10.1109/CEECT53198.2021.9672633">https://doi.org/10.1109/CEECT53198.2021.9672633</a>.'
  chicago-de: 'Schaab, Darian, Patrick Spanier, Martin  Ehlich  und Eric  Fosselmann,
    Hrsg. 2022. <i>Design Framework for Multiple Infeed DC-Microgrids in Industrial
    Applications</i>. 2021 3rd International Conference on Electrical Engineering
    and Control Technologies (CEECT). Piscataway, NJ: IEEE. doi:<a href="https://doi.org/10.1109/CEECT53198.2021.9672633">10.1109/CEECT53198.2021.9672633</a>,
    .'
  din1505-2-1: '<span style="font-variant:small-caps;">Schaab, D.</span> ; <span style="font-variant:small-caps;">Spanier,
    P.</span> ; <span style="font-variant:small-caps;">Ehlich , M.</span> ; <span
    style="font-variant:small-caps;">Fosselmann, E.</span> (Hrsg.): <i>Design Framework
    for Multiple Infeed DC-Microgrids in Industrial Applications</i>, <i>2021 3rd
    International Conference on Electrical Engineering and Control Technologies (CEECT)</i>.
    Piscataway, NJ : IEEE, 2022'
  havard: D. Schaab, P. Spanier, M. Ehlich , E. Fosselmann, eds., Design Framework
    for Multiple Infeed DC-Microgrids in Industrial Applications, IEEE, Piscataway,
    NJ, 2022.
  ieee: 'D. Schaab, P. Spanier, M. Ehlich , and E. Fosselmann, Eds., <i>Design Framework
    for Multiple Infeed DC-Microgrids in Industrial Applications</i>. Piscataway,
    NJ: IEEE, 2022. doi: <a href="https://doi.org/10.1109/CEECT53198.2021.9672633">10.1109/CEECT53198.2021.9672633</a>.'
  mla: Schaab, Darian, et al., editors. <i>Design Framework for Multiple Infeed DC-Microgrids
    in Industrial Applications</i>. IEEE, 2022, <a href="https://doi.org/10.1109/CEECT53198.2021.9672633">https://doi.org/10.1109/CEECT53198.2021.9672633</a>.
  short: D. Schaab, P. Spanier, M. Ehlich , E. Fosselmann, eds., Design Framework
    for Multiple Infeed DC-Microgrids in Industrial Applications, IEEE, Piscataway,
    NJ, 2022.
  ufg: '<i><i>Schaab, Darian</i> u. a.</i>: Design Framework for Multiple Infeed DC-Microgrids
    in Industrial Applications, Piscataway, NJ 2022 (2021 3rd International Conference
    on Electrical Engineering and Control Technologies (CEECT)).'
  van: 'Schaab D, Spanier P, Ehlich  M, Fosselmann E, editors. Design Framework for
    Multiple Infeed DC-Microgrids in Industrial Applications. Piscataway, NJ: IEEE;
    2022. (2021 3rd International Conference on Electrical Engineering and Control
    Technologies (CEECT)).'
conference:
  end_date: 2021-12-18
  location: ' Macau, Macao '
  name: 3rd International Conference on Electrical Engineering and Control Technologies
    (CEECT)
  start_date: 2021-12-16
date_created: 2022-07-06T08:55:01Z
date_updated: 2024-08-07T09:37:05Z
department:
- _id: DEP6020
- _id: DEP5018
doi: 10.1109/CEECT53198.2021.9672633
editor:
- first_name: Darian
  full_name: Schaab, Darian
  last_name: Schaab
- first_name: Patrick
  full_name: Spanier, Patrick
  id: '43516'
  last_name: Spanier
- first_name: 'Martin '
  full_name: 'Ehlich , Martin '
  last_name: 'Ehlich '
- first_name: 'Eric '
  full_name: 'Fosselmann, Eric '
  last_name: Fosselmann
keyword:
- Renewable energy sources
- Power demand
- Process control
- Voltage
- Robustness
- Planning
- Stakeholders
language:
- iso: eng
place: Piscataway, NJ
publication_identifier:
  eisbn:
  - 978-1-6654-4041-7
  isbn:
  - 978-1-6654-4042-4
publication_status: published
publisher: IEEE
quality_controlled: '1'
series_title: 2021 3rd International Conference on Electrical Engineering and Control
  Technologies (CEECT)
status: public
title: Design Framework for Multiple Infeed DC-Microgrids in Industrial Applications
type: conference_editor
user_id: '83781'
year: '2022'
...
---
_id: '9210'
abstract:
- lang: eng
  text: In order to guarantee long lifetime and high performance of electrical contacts,
    a plating is usually applied on the base material. Silver is a promising plating
    material because of a good balance between performance and costs. The conventional
    silver plating is soft; therefore, a thick silver plating should be used to prevent
    the wear through during the operation. In order to enhance the wear resistance
    and prolong the lifetime of the silver plating, silver platings are modified by
    co-depositing nanoparticles with a core/shell structure into the silver matrix.
    A novel method to prepare the Ag (shell)@Al 2 O 3 (core) nanoparticles by galvanic
    process is introduced in this paper. The influence of fabrication parameters in
    the galvanic process such as the concentration of silver nitrate solution and
    the plating voltage on the silver content in the Ag@Al 2 O 3 nanoparticles is
    investigated. Afterwards, different concentrations of core/shell nanoparticles
    are co-deposited into the silver plating to study the effect of nanoparticles
    on the microhardness, microstructure and the lifetime of the silver plating. As
    a result, the microhardness and the lifetime of the silver plating are significantly
    improved and a favorable nanoparticle concentration exists for the longest lifetime.
    Moreover, the mechanism of the lifetime improvement is determined.
author:
- first_name: Haomiao
  full_name: Yuan, Haomiao
  id: '61860'
  last_name: Yuan
- first_name: Roman
  full_name: Probst, Roman
  id: '69156'
  last_name: Probst
- first_name: Jian
  full_name: Song, Jian
  id: '5297'
  last_name: Song
citation:
  ama: Yuan H, Probst R, Song J. <i>Influence of Core/Shell Nanoparticles on the Fretting
    Behavior of Electrical Contacts</i>. IEEE; 2022:166-173. doi:<a href="https://doi.org/10.1109/HLM54538.2022.9969773">10.1109/HLM54538.2022.9969773</a>
  apa: 'Yuan, H., Probst, R., &#38; Song, J. (2022). Influence of Core/Shell Nanoparticles
    on the Fretting Behavior of Electrical Contacts. In <i>Electrical contacts - 2022 :
    proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts</i>
    (pp. 166–173). IEEE. <a href="https://doi.org/10.1109/HLM54538.2022.9969773">https://doi.org/10.1109/HLM54538.2022.9969773</a>'
  bjps: '<b>Yuan H, Probst R and Song J</b> (2022) <i>Influence of Core/Shell Nanoparticles
    on the Fretting Behavior of Electrical Contacts</i>. Piscataway, NJ: IEEE.'
  chicago: 'Yuan, Haomiao, Roman Probst, and Jian Song. <i>Influence of Core/Shell
    Nanoparticles on the Fretting Behavior of Electrical Contacts</i>. <i>Electrical
    Contacts - 2022 : Proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical
    Contacts</i>. Piscataway, NJ: IEEE, 2022. <a href="https://doi.org/10.1109/HLM54538.2022.9969773">https://doi.org/10.1109/HLM54538.2022.9969773</a>.'
  chicago-de: 'Yuan, Haomiao, Roman Probst und Jian Song. 2022. <i>Influence of Core/Shell
    Nanoparticles on the Fretting Behavior of Electrical Contacts</i>. <i>Electrical
    contacts - 2022 : proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical
    Contacts</i>. Piscataway, NJ: IEEE. doi:<a href="https://doi.org/10.1109/HLM54538.2022.9969773">10.1109/HLM54538.2022.9969773</a>,
    .'
  din1505-2-1: '<span style="font-variant:small-caps;">Yuan, Haomiao</span> ; <span
    style="font-variant:small-caps;">Probst, Roman</span> ; <span style="font-variant:small-caps;">Song,
    Jian</span>: <i>Influence of Core/Shell Nanoparticles on the Fretting Behavior
    of Electrical Contacts</i>. Piscataway, NJ : IEEE, 2022'
  havard: H. Yuan, R. Probst, J. Song, Influence of Core/Shell Nanoparticles on the
    Fretting Behavior of Electrical Contacts, IEEE, Piscataway, NJ, 2022.
  ieee: 'H. Yuan, R. Probst, and J. Song, <i>Influence of Core/Shell Nanoparticles
    on the Fretting Behavior of Electrical Contacts</i>. Piscataway, NJ: IEEE, 2022,
    pp. 166–173. doi: <a href="https://doi.org/10.1109/HLM54538.2022.9969773">10.1109/HLM54538.2022.9969773</a>.'
  mla: 'Yuan, Haomiao, et al. “Influence of Core/Shell Nanoparticles on the Fretting
    Behavior of Electrical Contacts.” <i>Electrical Contacts - 2022 : Proceedings
    of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts</i>, IEEE, 2022,
    pp. 166–73, <a href="https://doi.org/10.1109/HLM54538.2022.9969773">https://doi.org/10.1109/HLM54538.2022.9969773</a>.'
  short: H. Yuan, R. Probst, J. Song, Influence of Core/Shell Nanoparticles on the
    Fretting Behavior of Electrical Contacts, IEEE, Piscataway, NJ, 2022.
  ufg: '<b>Yuan, Haomiao/Probst, Roman/Song, Jian</b>: Influence of Core/Shell Nanoparticles
    on the Fretting Behavior of Electrical Contacts, Piscataway, NJ 2022.'
  van: 'Yuan H, Probst R, Song J. Influence of Core/Shell Nanoparticles on the Fretting
    Behavior of Electrical Contacts. Electrical contacts - 2022 : proceedings of the
    Sixty-Seventh IEEE Holm Conference on Electrical Contacts. Piscataway, NJ: IEEE;
    2022.'
conference:
  end_date: 2022-10-26
  location: ' Tampa, FL, USA'
  name: 67th Holm Conference on Electrical Contacts
  start_date: 2022-10-23
date_created: 2022-12-11T13:46:02Z
date_updated: 2024-08-05T08:01:04Z
department:
- _id: DEP6012
doi: 10.1109/HLM54538.2022.9969773
keyword:
- Nanoparticles
- Resistance
- Fabrication
- Silver
- Costs
- Contacts
- Voltage
language:
- iso: eng
page: 166 - 173
place: Piscataway, NJ
publication: 'Electrical contacts - 2022 : proceedings of the Sixty-Seventh IEEE Holm
  Conference on Electrical Contacts'
publication_identifier:
  eissn:
  - 978-1-6654-5965-5
  isbn:
  - 978-1-6654-5966-2
  - 978-1-6654-5967-9
  issn:
  - 2158-9992
publication_status: published
publisher: IEEE
status: public
title: Influence of Core/Shell Nanoparticles on the Fretting Behavior of Electrical
  Contacts
type: conference_editor_article
user_id: '83781'
year: '2022'
...
---
_id: '328'
abstract:
- lang: eng
  text: "In  this  paper,  concepts  for  an  extended  DC network for the main power
    supply of components from various manufacturers in industrial production are presented.
    In the first part,  detailed  requirements  for  such  a  network  are  given
    \ from the  viewpoint  of  a  customer.  Based  on  those,  different  concepts
    for AC/DC conversion and energy management are discussed. As far  as  AC/DC  conversion
    \ is  concerned,  the  advantages  and drawbacks of several rectifier topologies
    are listed, as they have a significant  impact  on  the  system  behavior  and
    \ EMC  properties. \r\nAn  intelligent  energy  management  can  improve  the
    \ energy efficiency  and  reduce  downtimes  of  a  plant,  which  are  major
    requirements from a customer’s viewpoint. "
author:
- first_name: Holger
  full_name: Borcherding, Holger
  id: '1693'
  last_name: Borcherding
- first_name: Johann
  full_name: Austermann, Johann
  id: '42114'
  last_name: Austermann
- first_name: Timm
  full_name: Kuhlmann, Timm
  last_name: Kuhlmann
- first_name: Benno
  full_name: Weis, Benno
  last_name: Weis
- first_name: Andre
  full_name: Leonide, Andre
  last_name: Leonide
citation:
  ama: 'Borcherding H, Austermann J, Kuhlmann T, Weis B, Leonide A. Concepts for a
    DC Network in Industrial Production. In: Institute of Electrical and Electronics
    Engineers (IEEE), ed. <i>2017 IEEE Second International Conference on DC Microgrids
    (ICDCM)</i>. Danvers; 2017:227-234. doi:<a href="https://doi.org/10.1109/ICDCM.2017.8001049">10.1109/ICDCM.2017.8001049</a>'
  apa: Borcherding, H., Austermann, J., Kuhlmann, T., Weis, B., &#38; Leonide, A.
    (2017). Concepts for a DC Network in Industrial Production. In Institute of Electrical
    and Electronics Engineers (IEEE) (Ed.), <i>2017 IEEE Second International Conference
    on DC Microgrids (ICDCM)</i> (pp. 227–234). Danvers. <a href="https://doi.org/10.1109/ICDCM.2017.8001049">https://doi.org/10.1109/ICDCM.2017.8001049</a>
  bjps: <b>Borcherding H <i>et al.</i></b> (2017) Concepts for a DC Network in Industrial
    Production. In Institute of Electrical and Electronics Engineers (IEEE) (ed.),
    <i>2017 IEEE Second International Conference on DC Microgrids (ICDCM)</i>. Danvers,
    pp. 227–234.
  chicago: Borcherding, Holger, Johann Austermann, Timm Kuhlmann, Benno Weis, and
    Andre Leonide. “Concepts for a DC Network in Industrial Production.” In <i>2017
    IEEE Second International Conference on DC Microgrids (ICDCM)</i>, edited by Institute
    of Electrical and Electronics Engineers (IEEE), 227–34. Danvers, 2017. <a href="https://doi.org/10.1109/ICDCM.2017.8001049">https://doi.org/10.1109/ICDCM.2017.8001049</a>.
  chicago-de: 'Borcherding, Holger, Johann Austermann, Timm Kuhlmann, Benno Weis und
    Andre Leonide. 2017. Concepts for a DC Network in Industrial Production. In: <i>2017
    IEEE Second International Conference on DC Microgrids (ICDCM)</i>, hg. von Institute
    of Electrical and Electronics Engineers (IEEE), 227–234. Danvers. doi:<a href="https://doi.org/10.1109/ICDCM.2017.8001049,">10.1109/ICDCM.2017.8001049,</a>
    .'
  din1505-2-1: '<span style="font-variant:small-caps;">Borcherding, Holger</span>
    ; <span style="font-variant:small-caps;">Austermann, Johann</span> ; <span style="font-variant:small-caps;">Kuhlmann,
    Timm</span> ; <span style="font-variant:small-caps;">Weis, Benno</span> ; <span
    style="font-variant:small-caps;">Leonide, Andre</span>: Concepts for a DC Network
    in Industrial Production. In: <span style="font-variant:small-caps;">Institute
    of Electrical and Electronics Engineers (IEEE)</span> (Hrsg.): <i>2017 IEEE Second
    International Conference on DC Microgrids (ICDCM)</i>. Danvers, 2017, S. 227–234'
  havard: 'H. Borcherding, J. Austermann, T. Kuhlmann, B. Weis, A. Leonide, Concepts
    for a DC Network in Industrial Production, in: Institute of Electrical and Electronics
    Engineers (IEEE) (Ed.), 2017 IEEE Second International Conference on DC Microgrids
    (ICDCM), Danvers, 2017: pp. 227–234.'
  ieee: H. Borcherding, J. Austermann, T. Kuhlmann, B. Weis, and A. Leonide, “Concepts
    for a DC Network in Industrial Production,” in <i>2017 IEEE Second International
    Conference on DC Microgrids (ICDCM)</i>, Nürnberg, 2017, no. 1, pp. 227–234.
  mla: Borcherding, Holger, et al. “Concepts for a DC Network in Industrial Production.”
    <i>2017 IEEE Second International Conference on DC Microgrids (ICDCM)</i>, edited
    by Institute of Electrical and Electronics Engineers (IEEE), no. 1, 2017, pp.
    227–34, doi:<a href="https://doi.org/10.1109/ICDCM.2017.8001049">10.1109/ICDCM.2017.8001049</a>.
  short: 'H. Borcherding, J. Austermann, T. Kuhlmann, B. Weis, A. Leonide, in: Institute
    of Electrical and Electronics Engineers (IEEE) (Ed.), 2017 IEEE Second International
    Conference on DC Microgrids (ICDCM), Danvers, 2017, pp. 227–234.'
  ufg: '<b>Borcherding, Holger et. al. (2017)</b>: Concepts for a DC Network in Industrial
    Production, in: Institute of Electrical and Electronics Engineers (IEEE) (Hg.):
    <i>2017 IEEE Second International Conference on DC Microgrids (ICDCM)</i>, Danvers,
    S. 227–234.'
  van: 'Borcherding H, Austermann J, Kuhlmann T, Weis B, Leonide A. Concepts for a
    DC Network in Industrial Production. In: Institute of Electrical and Electronics
    Engineers (IEEE), editor. 2017 IEEE Second International Conference on DC Microgrids
    (ICDCM). Danvers; 2017. p. 227–34.'
conference:
  end_date: 2017-06-29
  location: Nürnberg
  name: 'IEEE Second International Conference on DC Microgrids (ICDCM) '
  start_date: 2017-06-27
corporate_editor:
- Institute of Electrical and Electronics Engineers (IEEE)
date_created: 2018-12-10T15:11:18Z
date_updated: 2023-03-15T13:49:46Z
department:
- _id: DEP5018
doi: 10.1109/ICDCM.2017.8001049
issue: '1'
keyword:
- AC-DC power convertors
- electromagnetic compatibility
- energy conservation
- energy management systems
- rectifiers
- main power supply
- industrial production
- DC network
- AC-DC conversion
- rectifier topologies
- EMC properties
- intelligent energy management
- energy efficiency improvement
- downtime reduction
- Rectifiers
- Switches
- Voltage control
- Topology
- Network topology
- Production
- Grounding
- industrial DC grid
- SMART Grid
language:
- iso: eng
main_file_link:
- url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=8001049
page: 227-234
place: Danvers
publication: 2017 IEEE Second International Conference on DC Microgrids (ICDCM)
related_material:
  link:
  - relation: contains
    url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=8001049
status: public
title: Concepts for a DC Network in Industrial Production
type: conference
user_id: '45673'
year: 2017
...
---
_id: '10155'
abstract:
- lang: eng
  text: This paper describes a method for automatically obtaining the order and position
    of contactless connected network participants in a linear physical topology. While
    the sequence of network devices can be determined with quite simple methods in
    networks with physical interconnections, these methods can not be applied in contactless
    networks. This work is based on a linear network topology using a backbone rail,
    which includes mechanisms for contactless energy and data transmission. The position
    estimation for each attached network device can be performed by determining a
    specific physical characteristic, which is altered along the rail extension. The
    proposed solution uses a capacitive resonant circuit to achieve a position detection.
author:
- first_name: Derk
  full_name: Wesemann, Derk
  id: '1273'
  last_name: Wesemann
- first_name: Stefan
  full_name: Witte, Stefan
  id: '1605'
  last_name: Witte
- first_name: Jan-Stefan
  full_name: Michels, Jan-Stefan
  last_name: Michels
citation:
  ama: Wesemann D, Witte S, Michels JS. <i>Position Detection in Linear, Proximity
    Coupling Networks</i>. (Institute of Electrical and Electronics Engineers, ed.).
    IEEE; 2009. doi:<a href="https://doi.org/10.1109/ELECO.2009.5355273">10.1109/ELECO.2009.5355273</a>
  apa: Wesemann, D., Witte, S., &#38; Michels, J.-S. (2009). Position Detection in
    linear, proximity coupling Networks. In Institute of Electrical and Electronics
    Engineers (Ed.), <i>2009 International Conference on Electrical and Electronics
    Engineering - ELECO 2009</i>. IEEE. <a href="https://doi.org/10.1109/ELECO.2009.5355273">https://doi.org/10.1109/ELECO.2009.5355273</a>
  bjps: '<b>Wesemann D, Witte S and Michels J-S</b> (2009) <i>Position Detection in
    Linear, Proximity Coupling Networks</i>, Institute of Electrical and Electronics
    Engineers (ed.). Piscataway, NJ: IEEE.'
  chicago: 'Wesemann, Derk, Stefan Witte, and Jan-Stefan Michels. <i>Position Detection
    in Linear, Proximity Coupling Networks</i>. Edited by Institute of Electrical
    and Electronics Engineers. <i>2009 International Conference on Electrical and
    Electronics Engineering - ELECO 2009</i>. Piscataway, NJ: IEEE, 2009. <a href="https://doi.org/10.1109/ELECO.2009.5355273">https://doi.org/10.1109/ELECO.2009.5355273</a>.'
  chicago-de: 'Wesemann, Derk, Stefan Witte und Jan-Stefan Michels. 2009. <i>Position
    Detection in linear, proximity coupling Networks</i>. Hg. von Institute of Electrical
    and Electronics Engineers. <i>2009 International Conference on Electrical and
    Electronics Engineering - ELECO 2009</i>. Piscataway, NJ: IEEE. doi:<a href="https://doi.org/10.1109/ELECO.2009.5355273">10.1109/ELECO.2009.5355273</a>,
    .'
  din1505-2-1: '<span style="font-variant:small-caps;">Wesemann, Derk</span> ; <span
    style="font-variant:small-caps;">Witte, Stefan</span> ; <span style="font-variant:small-caps;">Michels,
    Jan-Stefan</span> ; <span style="font-variant:small-caps;">Institute of Electrical
    and Electronics Engineers</span> (Hrsg.): <i>Position Detection in linear, proximity
    coupling Networks</i>. Piscataway, NJ : IEEE, 2009'
  havard: D. Wesemann, S. Witte, J.-S. Michels, Position Detection in linear, proximity
    coupling Networks, IEEE, Piscataway, NJ, 2009.
  ieee: 'D. Wesemann, S. Witte, and J.-S. Michels, <i>Position Detection in linear,
    proximity coupling Networks</i>. Piscataway, NJ: IEEE, 2009. doi: <a href="https://doi.org/10.1109/ELECO.2009.5355273">10.1109/ELECO.2009.5355273</a>.'
  mla: Wesemann, Derk, et al. “Position Detection in Linear, Proximity Coupling Networks.”
    <i>2009 International Conference on Electrical and Electronics Engineering - ELECO
    2009</i>, edited by Institute of Electrical and Electronics Engineers, IEEE, 2009,
    <a href="https://doi.org/10.1109/ELECO.2009.5355273">https://doi.org/10.1109/ELECO.2009.5355273</a>.
  short: D. Wesemann, S. Witte, J.-S. Michels, Position Detection in Linear, Proximity
    Coupling Networks, IEEE, Piscataway, NJ, 2009.
  ufg: '<b>Wesemann, Derk/Witte, Stefan/Michels, Jan-Stefan</b>: Position Detection
    in linear, proximity coupling Networks, hg. von Institute of Electrical and Electronics
    Engineers, Piscataway, NJ 2009.'
  van: 'Wesemann D, Witte S, Michels JS. Position Detection in linear, proximity coupling
    Networks. Institute of Electrical and Electronics Engineers, editor. 2009 International
    Conference on Electrical and Electronics Engineering - ELECO 2009. Piscataway,
    NJ: IEEE; 2009.'
conference:
  end_date: 2009-09-08
  location: 'Bursa, Turkey '
  name: 6th International Conference on Electrical and Electronics Engineering, ELECO
  start_date: 2009-09-05
corporate_editor:
- Institute of Electrical and Electronics Engineers
date_created: 2023-07-27T10:06:21Z
date_updated: 2023-08-03T08:05:57Z
department:
- _id: DEP5000
- _id: DEP5023
doi: 10.1109/ELECO.2009.5355273
keyword:
- network topology
- position measurement
- voltage measurement
- wireless sensor networks
language:
- iso: eng
place: Piscataway, NJ
publication: 2009 International Conference on Electrical and Electronics Engineering
  - ELECO 2009
publication_identifier:
  isbn:
  - 978-9944-89-818-8
  unknown:
  - 978-1424-45-106-7
publication_status: published
publisher: IEEE
status: public
title: Position Detection in linear, proximity coupling Networks
type: conference_editor_article
user_id: '83781'
year: '2009'
...
