[{"publication_status":"published","citation":{"chicago":"Song, Jian, Abhay Rammurti Shukla, and Roman Probst. <i>Advances in Evaluation of State of Health of Electrical Connectors</i>. <i>2023 IEEE 68th Holm Conference on Electrical Contacts (HOLM)</i>. Electrical Contacts-IEEE Holm Conference on Electrical Contacts. [Piscataway, NJ]: IEEE, 2023. <a href=\"https://doi.org/10.1109/holm56075.2023.10352279\">https://doi.org/10.1109/holm56075.2023.10352279</a>.","apa":"Song, J., Shukla, A. R., &#38; Probst, R. (2023). Advances in Evaluation of State of Health of Electrical Connectors. In <i>2023 IEEE 68th Holm Conference on Electrical Contacts (HOLM)</i> (pp. 200–208). IEEE. <a href=\"https://doi.org/10.1109/holm56075.2023.10352279\">https://doi.org/10.1109/holm56075.2023.10352279</a>","mla":"Song, Jian, et al. “Advances in Evaluation of State of Health of Electrical Connectors.” <i>2023 IEEE 68th Holm Conference on Electrical Contacts (HOLM)</i>, IEEE, 2023, pp. 200–08, <a href=\"https://doi.org/10.1109/holm56075.2023.10352279\">https://doi.org/10.1109/holm56075.2023.10352279</a>.","bjps":"<b>Song J, Shukla AR and Probst R</b> (2023) <i>Advances in Evaluation of State of Health of Electrical Connectors</i>. [Piscataway, NJ]: IEEE.","havard":"J. Song, A.R. Shukla, R. Probst, Advances in Evaluation of State of Health of Electrical Connectors, IEEE, [Piscataway, NJ], 2023.","ufg":"<b>Song, Jian/Shukla, Abhay Rammurti/Probst, Roman</b>: Advances in Evaluation of State of Health of Electrical Connectors, [Piscataway, NJ] 2023 (Electrical Contacts-IEEE Holm Conference on Electrical Contacts).","van":"Song J, Shukla AR, Probst R. Advances in Evaluation of State of Health of Electrical Connectors. 2023 IEEE 68th Holm Conference on Electrical Contacts (HOLM). [Piscataway, NJ]: IEEE; 2023. (Electrical Contacts-IEEE Holm Conference on Electrical Contacts).","din1505-2-1":"<span style=\"font-variant:small-caps;\">Song, Jian</span> ; <span style=\"font-variant:small-caps;\">Shukla, Abhay Rammurti</span> ; <span style=\"font-variant:small-caps;\">Probst, Roman</span>: <i>Advances in Evaluation of State of Health of Electrical Connectors</i>, <i>Electrical Contacts-IEEE Holm Conference on Electrical Contacts</i>. [Piscataway, NJ] : IEEE, 2023","chicago-de":"Song, Jian, Abhay Rammurti Shukla und Roman Probst. 2023. <i>Advances in Evaluation of State of Health of Electrical Connectors</i>. <i>2023 IEEE 68th Holm Conference on Electrical Contacts (HOLM)</i>. Electrical Contacts-IEEE Holm Conference on Electrical Contacts. [Piscataway, NJ]: IEEE. doi:<a href=\"https://doi.org/10.1109/holm56075.2023.10352279\">10.1109/holm56075.2023.10352279</a>, .","short":"J. Song, A.R. Shukla, R. Probst, Advances in Evaluation of State of Health of Electrical Connectors, IEEE, [Piscataway, NJ], 2023.","ieee":"J. Song, A. R. Shukla, and R. Probst, <i>Advances in Evaluation of State of Health of Electrical Connectors</i>. [Piscataway, NJ]: IEEE, 2023, pp. 200–208. doi: <a href=\"https://doi.org/10.1109/holm56075.2023.10352279\">10.1109/holm56075.2023.10352279</a>.","ama":"Song J, Shukla AR, Probst R. <i>Advances in Evaluation of State of Health of Electrical Connectors</i>. IEEE; 2023:200-208. doi:<a href=\"https://doi.org/10.1109/holm56075.2023.10352279\">10.1109/holm56075.2023.10352279</a>"},"series_title":"Electrical Contacts-IEEE Holm Conference on Electrical Contacts","title":"Advances in Evaluation of State of Health of Electrical Connectors","page":"200-208","status":"public","publisher":"IEEE","conference":{"start_date":"2023-10-04","end_date":"2023-10-11","location":"Seattle","name":"68th Holm Conference on Electrical Contacts (HOLM)"},"author":[{"id":"5297","full_name":"Song, Jian","last_name":"Song","first_name":"Jian"},{"full_name":"Shukla, Abhay Rammurti","first_name":"Abhay Rammurti","id":"74188","last_name":"Shukla"},{"id":"69156","last_name":"Probst","full_name":"Probst, Roman","first_name":"Roman"}],"year":"2023","abstract":[{"text":"The state of health and lifetime estimation process of electrical connectors via lifetime tests is a time and labor intensive process. In our previous work, a correlation between the contact resistance developments in the early stages of lifetime tests of electrical connectors with the final results was established using a data driven statistical process based on probability distribution. Also, state of health indicators for prognosis of lifetime were introduced. In this work, the state of health indicators have been optimized. The sensitivity analysis is performed with regards to the selection of the appropriate amount of test data based on test duration for the reliable prognosis of the state of health and the characteristic lifetime. Through this the possibility of further reduction of test duration required for the reliable prognosis of state of health is investigated. Based on the results of analysis, a guideline for the determination of the duration of lifetime tests which lead to a reliable prediction of lifetime of connectors can be provided. Also, an assessment of the state of art in the prognosis of the lifetime of electrical connectors has been presented.","lang":"eng"}],"date_updated":"2025-06-26T07:54:50Z","user_id":"83781","date_created":"2024-04-18T10:11:50Z","type":"conference_editor_article","publication_identifier":{"issn":["2158-9992"],"eisbn":["979‐8‐3503‐4246‐8","979‐8‐3503‐4245‐1 "],"eissn":["2158‐9992"],"isbn":["979‐8‐3503‐4244‐4"]},"publication":"2023 IEEE 68th Holm Conference on Electrical Contacts (HOLM)","language":[{"iso":"eng"}],"place":"[Piscataway, NJ]","keyword":["accelerated life testing","test duration","contact resistance","statistical model","connector reliability"],"doi":"10.1109/holm56075.2023.10352279","_id":"11360"},{"_id":"9211","doi":"10.1109/HLM54538.2022.9969839","place":"Piscataway, NJ","keyword":["Connectors","Correlation","Sensitivity analysis","Contact resistance","Lifetime estimation","Reliability","Electrical resistance measurement"],"language":[{"iso":"eng"}],"user_id":"83781","date_updated":"2024-08-05T08:01:22Z","publication_identifier":{"eisbn":["978-1-6654-5965-5"],"issn":["2158-9992"],"isbn":["978-1-6654-5966-2","978-1-6654-5967-9"]},"publication":"Electrical contacts - 2022 : proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts","type":"conference_editor_article","date_created":"2022-12-11T13:50:30Z","publisher":"IEEE","status":"public","page":"272 - 278","abstract":[{"lang":"eng","text":"Lifetime tests of connectors are time consuming and labor intensive. Our study reveals a strong correlation between the statistical characteristics of contact resistance development in the early stages of lifetime tests and the final results of the tests. This correlation enables a further time lapse of lifetime tests and the prediction of the state of the health of connectors which can be utilized in the development of diagnostic strategy in sophisticated networks with very high number of connectors as well as in a quick classification of connectors with respect to their design features. Methods of statistical evaluation are introduced and the sensitivity analyses of different characteristics for the state of health of connectors are conducted."}],"year":"2022","author":[{"first_name":"Jian","last_name":"Song","full_name":"Song, Jian","id":"5297"},{"last_name":"Shukla","full_name":"Shukla, Abhay Rammurti","id":"72757","first_name":"Abhay Rammurti"},{"id":"69156","full_name":"Probst, Roman","last_name":"Probst","first_name":"Roman"}],"department":[{"_id":"DEP6012"}],"conference":{"end_date":"2022-10-26","start_date":"2022-10-23","name":"67th Holm Conference on Electrical Contacts","location":"Tampa, FL, USA"},"citation":{"short":"J. Song, A.R. Shukla, R. Probst, State of Health of Connectors – Early Indicators, IEEE, Piscataway, NJ, 2022.","din1505-2-1":"<span style=\"font-variant:small-caps;\">Song, Jian</span> ; <span style=\"font-variant:small-caps;\">Shukla, Abhay Rammurti</span> ; <span style=\"font-variant:small-caps;\">Probst, Roman</span>: <i>State of Health of Connectors – Early Indicators</i>. Piscataway, NJ : IEEE, 2022","chicago-de":"Song, Jian, Abhay Rammurti Shukla und Roman Probst. 2022. <i>State of Health of Connectors – Early Indicators</i>. <i>Electrical contacts - 2022 : proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts</i>. Piscataway, NJ: IEEE. doi:<a href=\"https://doi.org/10.1109/HLM54538.2022.9969839\">10.1109/HLM54538.2022.9969839</a>, .","ama":"Song J, Shukla AR, Probst R. <i>State of Health of Connectors – Early Indicators</i>. IEEE; 2022:272-278. doi:<a href=\"https://doi.org/10.1109/HLM54538.2022.9969839\">10.1109/HLM54538.2022.9969839</a>","van":"Song J, Shukla AR, Probst R. State of Health of Connectors – Early Indicators. Electrical contacts - 2022 : proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts. Piscataway, NJ: IEEE; 2022.","bjps":"<b>Song J, Shukla AR and Probst R</b> (2022) <i>State of Health of Connectors – Early Indicators</i>. Piscataway, NJ: IEEE.","havard":"J. Song, A.R. Shukla, R. Probst, State of Health of Connectors – Early Indicators, IEEE, Piscataway, NJ, 2022.","mla":"Song, Jian, et al. “State of Health of Connectors – Early Indicators.” <i>Electrical Contacts - 2022 : Proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts</i>, IEEE, 2022, pp. 272–78, <a href=\"https://doi.org/10.1109/HLM54538.2022.9969839\">https://doi.org/10.1109/HLM54538.2022.9969839</a>.","ufg":"<b>Song, Jian/Shukla, Abhay Rammurti/Probst, Roman</b>: State of Health of Connectors – Early Indicators, Piscataway, NJ 2022.","ieee":"J. Song, A. R. Shukla, and R. Probst, <i>State of Health of Connectors – Early Indicators</i>. Piscataway, NJ: IEEE, 2022, pp. 272–278. doi: <a href=\"https://doi.org/10.1109/HLM54538.2022.9969839\">10.1109/HLM54538.2022.9969839</a>.","apa":"Song, J., Shukla, A. R., &#38; Probst, R. (2022). State of Health of Connectors – Early Indicators. In <i>Electrical contacts - 2022 : proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts</i> (pp. 272–278). IEEE. <a href=\"https://doi.org/10.1109/HLM54538.2022.9969839\">https://doi.org/10.1109/HLM54538.2022.9969839</a>","chicago":"Song, Jian, Abhay Rammurti Shukla, and Roman Probst. <i>State of Health of Connectors – Early Indicators</i>. <i>Electrical Contacts - 2022 : Proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts</i>. Piscataway, NJ: IEEE, 2022. <a href=\"https://doi.org/10.1109/HLM54538.2022.9969839\">https://doi.org/10.1109/HLM54538.2022.9969839</a>."},"publication_status":"published","title":"State of Health of Connectors – Early Indicators"}]