[{"type":"scientific_journal_article","publisher":"Elsevier","article_type":"original","quality_controlled":"1","date_updated":"2025-04-07T12:53:17Z","doi":"10.1016/j.wear.2025.205971","department":[{"_id":"DEP6012"}],"user_id":"83781","year":"2025","status":"public","keyword":["Fretting","Wear","Fatigue","Lifetime","Electrical contacts"],"abstract":[{"text":"In a previous paper, the correlation between the wear resistance of coatings and the lifetime of electrical connectors under fretting load was discovered. Based on this knowledge, various modifications of silver-based coatings with markedly increased wear resistance have been developed, and a calculation model for predicting connector lifetime has been formulated. Investigations on silver-coated electrical contacts with increased wear resistance show extended lifetimes in fretting wear and fretting corrosion tests, and the calculation model with various modified coating materials can be validated. However, contacts with very high wear-resistant coatings fail earlier than the specific wear coefficient and the calculation model prediction suggest.\r\nThe in-depth investigation of the coating material and the wear scar revealed the reasons for this unexpectedly shorter lifetime. The high wear resistance of modified silver coatings is achieved by increased micro-hardness. Both coatings with coating materials of high hardness and high thickness can lead to longer lifetimes under fretting load. However, increased fretting cycles can also cause fatigue and electrical contacts can fail due to delamination of the surface coating caused by fretting fatigue, and this delamination can lead to a sudden exposure of the base material, thus enabling its corrosion.\r\nTherefore, both wear resistance and fatigue resistance should be increased in order to achieve a long lifetime of electrical contacts under fretting load.","lang":"eng"}],"publication_identifier":{"issn":["0043-1648"]},"author":[{"first_name":"Jian","full_name":"Song, Jian","id":"5297","last_name":"Song"},{"last_name":"Tuelling","full_name":"Tuelling, Soeren ","first_name":"Soeren "},{"last_name":"Hengstler","full_name":"Hengstler, Jonas","first_name":"Jonas"}],"publication_status":"published","date_created":"2025-04-04T11:00:08Z","language":[{"iso":"eng"}],"citation":{"van":"Song J, Tuelling S, Hengstler J. Correlation between wear and fatigue properties and the lifetime of silver coated electrical connectors. Wear : an international journal on the science and technology of friction, lubrication and wear . 2025;","ama":"Song J, Tuelling S, Hengstler J. Correlation between wear and fatigue properties and the lifetime of silver coated electrical connectors. <i>Wear : an international journal on the science and technology of friction, lubrication and wear </i>. Published online 2025. doi:<a href=\"https://doi.org/10.1016/j.wear.2025.205971\">10.1016/j.wear.2025.205971</a>","ieee":"J. Song, S. Tuelling, and J. Hengstler, “Correlation between wear and fatigue properties and the lifetime of silver coated electrical connectors,” <i>Wear : an international journal on the science and technology of friction, lubrication and wear </i>, Art. no. 205971, 2025, doi: <a href=\"https://doi.org/10.1016/j.wear.2025.205971\">10.1016/j.wear.2025.205971</a>.","chicago":"Song, Jian, Soeren  Tuelling, and Jonas Hengstler. “Correlation between Wear and Fatigue Properties and the Lifetime of Silver Coated Electrical Connectors.” <i>Wear : An International Journal on the Science and Technology of Friction, Lubrication and Wear </i>, 2025. <a href=\"https://doi.org/10.1016/j.wear.2025.205971\">https://doi.org/10.1016/j.wear.2025.205971</a>.","din1505-2-1":"<span style=\"font-variant:small-caps;\">Song, Jian</span> ; <span style=\"font-variant:small-caps;\">Tuelling, Soeren </span> ; <span style=\"font-variant:small-caps;\">Hengstler, Jonas</span>: Correlation between wear and fatigue properties and the lifetime of silver coated electrical connectors. In: <i>Wear : an international journal on the science and technology of friction, lubrication and wear </i>. Amsterdam [u.a.], Elsevier (2025)","bjps":"<b>Song J, Tuelling S and Hengstler J</b> (2025) Correlation between Wear and Fatigue Properties and the Lifetime of Silver Coated Electrical Connectors. <i>Wear : an international journal on the science and technology of friction, lubrication and wear </i>.","havard":"J. Song, S. Tuelling, J. Hengstler, Correlation between wear and fatigue properties and the lifetime of silver coated electrical connectors, Wear : An International Journal on the Science and Technology of Friction, Lubrication and Wear . (2025).","chicago-de":"Song, Jian, Soeren  Tuelling und Jonas Hengstler. 2025. Correlation between wear and fatigue properties and the lifetime of silver coated electrical connectors. <i>Wear : an international journal on the science and technology of friction, lubrication and wear </i>. doi:<a href=\"https://doi.org/10.1016/j.wear.2025.205971\">10.1016/j.wear.2025.205971</a>, .","ufg":"<b>Song, Jian/Tuelling, Soeren/Hengstler, Jonas</b>: Correlation between wear and fatigue properties and the lifetime of silver coated electrical connectors, in: <i>Wear : an international journal on the science and technology of friction, lubrication and wear </i> (2025).","mla":"Song, Jian, et al. “Correlation between Wear and Fatigue Properties and the Lifetime of Silver Coated Electrical Connectors.” <i>Wear : An International Journal on the Science and Technology of Friction, Lubrication and Wear </i>, 205971, 2025, <a href=\"https://doi.org/10.1016/j.wear.2025.205971\">https://doi.org/10.1016/j.wear.2025.205971</a>.","apa":"Song, J., Tuelling, S., &#38; Hengstler, J. (2025). Correlation between wear and fatigue properties and the lifetime of silver coated electrical connectors. <i>Wear : An International Journal on the Science and Technology of Friction, Lubrication and Wear </i>, Article 205971. <a href=\"https://doi.org/10.1016/j.wear.2025.205971\">https://doi.org/10.1016/j.wear.2025.205971</a>","short":"J. Song, S. Tuelling, J. Hengstler, Wear : An International Journal on the Science and Technology of Friction, Lubrication and Wear  (2025)."},"place":"Amsterdam [u.a.]","title":"Correlation between wear and fatigue properties and the lifetime of silver coated electrical connectors","publication":"Wear : an international journal on the science and technology of friction, lubrication and wear ","_id":"12763","article_number":"205971"},{"title":"The State of Health of Electrical Connectors","publication_identifier":{"eissn":["2075-1702 "]},"intvolume":"         7","author":[{"last_name":"Song","id":"5297","full_name":"Song, Jian","first_name":"Jian"},{"first_name":"Abhay Rammurti","last_name":"Shukla","id":"74188","full_name":"Shukla, Abhay Rammurti"},{"last_name":"Probst","id":"69156","full_name":"Probst, Roman","first_name":"Roman"}],"isi":"1","publication_status":"published","volume":7,"date_created":"2025-04-04T09:23:10Z","language":[{"iso":"eng"}],"citation":{"havard":"J. Song, A.R. Shukla, R. Probst, The State of Health of Electrical Connectors, Machines. 7 (2024) 474.","ufg":"<b>Song, Jian/Shukla, Abhay Rammurti/Probst, Roman</b>: The State of Health of Electrical Connectors, in: <i>Machines</i> 7 (2024), H. 12,  S. 474.","chicago-de":"Song, Jian, Abhay Rammurti Shukla und Roman Probst. 2024. The State of Health of Electrical Connectors. <i>Machines</i> 7, Nr. 12: 474. doi:<a href=\"https://doi.org/10.3390/machines12070474\">https://doi.org/10.3390/machines12070474</a>, .","short":"J. Song, A.R. Shukla, R. Probst, Machines 7 (2024) 474.","mla":"Song, Jian, et al. “The State of Health of Electrical Connectors.” <i>Machines</i>, vol. 7, no. 12, 2024, p. 474, <a href=\"https://doi.org/10.3390/machines12070474\">https://doi.org/10.3390/machines12070474</a>.","apa":"Song, J., Shukla, A. R., &#38; Probst, R. (2024). The State of Health of Electrical Connectors. <i>Machines</i>, <i>7</i>(12), 474. <a href=\"https://doi.org/10.3390/machines12070474\">https://doi.org/10.3390/machines12070474</a>","van":"Song J, Shukla AR, Probst R. The State of Health of Electrical Connectors. Machines. 2024;7(12):474.","ama":"Song J, Shukla AR, Probst R. The State of Health of Electrical Connectors. <i>Machines</i>. 2024;7(12):474. doi:<a href=\"https://doi.org/10.3390/machines12070474\">https://doi.org/10.3390/machines12070474</a>","ieee":"J. Song, A. R. Shukla, and R. Probst, “The State of Health of Electrical Connectors,” <i>Machines</i>, vol. 7, no. 12, p. 474, 2024, doi: <a href=\"https://doi.org/10.3390/machines12070474\">https://doi.org/10.3390/machines12070474</a>.","chicago":"Song, Jian, Abhay Rammurti Shukla, and Roman Probst. “The State of Health of Electrical Connectors.” <i>Machines</i> 7, no. 12 (2024): 474. <a href=\"https://doi.org/10.3390/machines12070474\">https://doi.org/10.3390/machines12070474</a>.","bjps":"<b>Song J, Shukla AR and Probst R</b> (2024) The State of Health of Electrical Connectors. <i>Machines</i> <b>7</b>, 474.","din1505-2-1":"<span style=\"font-variant:small-caps;\">Song, Jian</span> ; <span style=\"font-variant:small-caps;\">Shukla, Abhay Rammurti</span> ; <span style=\"font-variant:small-caps;\">Probst, Roman</span>: The State of Health of Electrical Connectors. In: <i>Machines</i> Bd. 7. Basel, MDPI (2024), Nr. 12, S. 474"},"place":"Basel","_id":"12761","publication":"Machines","issue":"12","quality_controlled":"1","external_id":{"isi":["001277040200001"]},"date_updated":"2025-06-25T13:03:28Z","doi":"https://doi.org/10.3390/machines12070474","type":"scientific_journal_article","publisher":"MDPI","keyword":["electrical connectors","accelerated life testing","statistical model","lifetime prognosis","reliability","state of health"],"page":"474","abstract":[{"lang":"eng","text":"For modern machines, factories and electric and autonomous vehicles, the importance of vreliable electrical connectors cannot be overstated. With an increasing number of connectors being used in machines, factories and vehicles, ensuring their reliability is crucial for comfort and safety alike. One of the key indicators of reliability is the lifetime of connectors. To evaluate the lifetime of electrical connectors, a testing method and a model for calculating their lifetime based on the test data were developed. The results from these tests were compared to failure analysis data from long-term field operations. The findings indicate that the laboratory tests can accurately reproduce the main failures observed in the field. However, such lifetime tests can be time- and labor-intensive. To address this challenge, a data-driven method is proposed that predicts the lifetime of electrical connectors using statistical analysis of electrical contact resistance data collected from short-term tests. The predictions from this method were compared to actual results obtained from long-term tests. A strong correlation was observed between the contact resistance development in short-term tests and the number of failures in later stages of testing. Thus, apart from predicting the lifetime of connectors, this method can also be applied for failure prognosis in real-time operations."}],"department":[{"_id":"DEP6012"}],"user_id":"83781","year":"2024","status":"public"},{"publisher":"IEEE","type":"conference_editor_article","doi":"10.1109/holm56075.2023.10352299","date_updated":"2025-06-26T07:54:13Z","status":"public","department":[{"_id":"DEP6012"}],"user_id":"83781","year":"2023","page":"88 - 94","conference":{"location":"Seattle ","start_date":"2023-10-04","end_date":"2023-10-11","name":"68th Holm Conference on Electrical Contacts (HOLM)"},"abstract":[{"text":"The reliability and lifetime of electrical contacts is an important aspect in system reliability and is influenced by numerous factors. Micro motions as well as vibrations lead to fretting wear, which can result in wear through of the protective coating. If this layer is worn through, the non-noble layer underneath is exposed, resulting in the occurrence of fretting corrosion with further relative motion. This leads to an increased electrical contact resistance (ECR) and can cause the contact to fail. Increasing the hardness of the coating material can reduce the wear and in turn increase contacts’ lifetime. The micro hardness, wear and lifetime of contacts with modified hard silver coatings are investigated in fretting wear and corrosion tests and the results compared to a conventional silver coating. Since one of the modifications shows a significant reduction in wear and hence improvement in lifetime, further analysis with SEM and FIB is conducted in order to identify the key mechanisms leading to this improvement. With a further increase in lifetime however, fatigue as well as delamination of the coating are revealed to be of high relevance. Both can be main causes of electrical contact failure under fretting load. In general, at lower number of cycles, increased micro hardness has the greatest effect on lifetime and wear while at the higher number of cycles, fatigue is observed to be the dominant failure mechanism.","lang":"eng"}],"keyword":["electrical contacts","lifetime","silver coating","fretting corrosion","fatigue","wear through"],"language":[{"iso":"eng"}],"date_created":"2024-04-18T10:05:51Z","publication_status":"published","place":"[Piscataway, NJ]","citation":{"ufg":"<b>Probst, Roman/Song, Jian</b>: Influence of Hardness and Fatigue on the Lifetime of a Modified Silver Coating in Fretting Wear and Corrosion Tests, [Piscataway, NJ] 2023 (Electrical Contacts-IEEE Holm Conference on Electrical Contacts).","chicago-de":"Probst, Roman und Jian Song. 2023. <i>Influence of Hardness and Fatigue on the Lifetime of a Modified Silver Coating in Fretting Wear and Corrosion Tests</i>. <i>2023 IEEE 68th Holm Conference on Electrical Contacts (HOLM)</i>. Electrical Contacts-IEEE Holm Conference on Electrical Contacts. [Piscataway, NJ]: IEEE. doi:<a href=\"https://doi.org/10.1109/holm56075.2023.10352299\">10.1109/holm56075.2023.10352299</a>, .","short":"R. Probst, J. Song, Influence of Hardness and Fatigue on the Lifetime of a Modified Silver Coating in Fretting Wear and Corrosion Tests, IEEE, [Piscataway, NJ], 2023.","mla":"Probst, Roman, and Jian Song. “Influence of Hardness and Fatigue on the Lifetime of a Modified Silver Coating in Fretting Wear and Corrosion Tests.” <i>2023 IEEE 68th Holm Conference on Electrical Contacts (HOLM)</i>, IEEE, 2023, pp. 88–94, <a href=\"https://doi.org/10.1109/holm56075.2023.10352299\">https://doi.org/10.1109/holm56075.2023.10352299</a>.","apa":"Probst, R., &#38; Song, J. (2023). Influence of Hardness and Fatigue on the Lifetime of a Modified Silver Coating in Fretting Wear and Corrosion Tests. In <i>2023 IEEE 68th Holm Conference on Electrical Contacts (HOLM)</i> (pp. 88–94). IEEE. <a href=\"https://doi.org/10.1109/holm56075.2023.10352299\">https://doi.org/10.1109/holm56075.2023.10352299</a>","havard":"R. Probst, J. Song, Influence of Hardness and Fatigue on the Lifetime of a Modified Silver Coating in Fretting Wear and Corrosion Tests, IEEE, [Piscataway, NJ], 2023.","chicago":"Probst, Roman, and Jian Song. <i>Influence of Hardness and Fatigue on the Lifetime of a Modified Silver Coating in Fretting Wear and Corrosion Tests</i>. <i>2023 IEEE 68th Holm Conference on Electrical Contacts (HOLM)</i>. Electrical Contacts-IEEE Holm Conference on Electrical Contacts. [Piscataway, NJ]: IEEE, 2023. <a href=\"https://doi.org/10.1109/holm56075.2023.10352299\">https://doi.org/10.1109/holm56075.2023.10352299</a>.","bjps":"<b>Probst R and Song J</b> (2023) <i>Influence of Hardness and Fatigue on the Lifetime of a Modified Silver Coating in Fretting Wear and Corrosion Tests</i>. [Piscataway, NJ]: IEEE.","din1505-2-1":"<span style=\"font-variant:small-caps;\">Probst, Roman</span> ; <span style=\"font-variant:small-caps;\">Song, Jian</span>: <i>Influence of Hardness and Fatigue on the Lifetime of a Modified Silver Coating in Fretting Wear and Corrosion Tests</i>, <i>Electrical Contacts-IEEE Holm Conference on Electrical Contacts</i>. [Piscataway, NJ] : IEEE, 2023","ama":"Probst R, Song J. <i>Influence of Hardness and Fatigue on the Lifetime of a Modified Silver Coating in Fretting Wear and Corrosion Tests</i>. IEEE; 2023:88-94. doi:<a href=\"https://doi.org/10.1109/holm56075.2023.10352299\">10.1109/holm56075.2023.10352299</a>","van":"Probst R, Song J. Influence of Hardness and Fatigue on the Lifetime of a Modified Silver Coating in Fretting Wear and Corrosion Tests. 2023 IEEE 68th Holm Conference on Electrical Contacts (HOLM). [Piscataway, NJ]: IEEE; 2023. (Electrical Contacts-IEEE Holm Conference on Electrical Contacts).","ieee":"R. Probst and J. Song, <i>Influence of Hardness and Fatigue on the Lifetime of a Modified Silver Coating in Fretting Wear and Corrosion Tests</i>. [Piscataway, NJ]: IEEE, 2023, pp. 88–94. doi: <a href=\"https://doi.org/10.1109/holm56075.2023.10352299\">10.1109/holm56075.2023.10352299</a>."},"publication_identifier":{"isbn":["979‐8‐3503‐4244‐4"],"issn":["2158‐9992"],"eisbn":["979‐8‐3503‐4246‐8 ","979‐8‐3503‐4245‐1"]},"author":[{"full_name":"Probst, Roman","last_name":"Probst","id":"69156","first_name":"Roman"},{"first_name":"Jian","full_name":"Song, Jian","id":"5297","last_name":"Song"}],"title":"Influence of Hardness and Fatigue on the Lifetime of a Modified Silver Coating in Fretting Wear and Corrosion Tests","publication":"2023 IEEE 68th Holm Conference on Electrical Contacts (HOLM)","series_title":"Electrical Contacts-IEEE Holm Conference on Electrical Contacts","_id":"11359"},{"issue":"November 2022","date_updated":"2024-08-05T07:30:51Z","doi":"10.1016/j.microrel.2022.114684","type":"scientific_journal_article","publisher":"Elsevier","keyword":["Electrical connectors","Prediction of lifetime","FIT","Correlation between data in short and long term tests","Time-lapse of lifetime tests"],"abstract":[{"lang":"eng","text":"Failure in time (FIT) is an important measure for the reliability of electrical connectors. Due to the very long lifetime of connectors, the tests for the determination of FIT rate are time and labour intensive. In this paper a data driven method using a statistical process to estimate the FIT rate of electrical connectors with data of electrical contact resistance development in short term tests is proposed. The results of prediction are then compared with the results from long term tests. The study shows a strong correlation between contact resistance development in short term tests and the development of the number of failures in later stages of tests. In order to predict the development of degradation precisely, the distribution of resistance data in many different tests with different connectors is investigated. The Generalized Extreme Value Distribution, which reveals an ideal fitting, has been implemented for the prediction of the failure rates of connectors, thereby enabling a remarkable time-lapse of lifetime tests. This method can also be employed in the prognosis and management of system health through the forecast of health of connectors in different systems in operation."}],"department":[{"_id":"DEP6012"}],"year":"2022","user_id":"83781","status":"public","title":"Prediction of failure in time (FIT) of electrical connectors with short term tests","publication_identifier":{"issn":["0026-2714"]},"intvolume":"       138","author":[{"first_name":"Jian","last_name":"Song","id":"5297","full_name":"Song, Jian"},{"first_name":"Abhay Rammurti","id":"72757","last_name":"Shukla","full_name":"Shukla, Abhay Rammurti"},{"id":"69156","last_name":"Probst","full_name":"Probst, Roman","first_name":"Roman"}],"volume":138,"publication_status":"published","language":[{"iso":"eng"}],"date_created":"2022-12-11T13:13:46Z","citation":{"chicago-de":"Song, Jian, Abhay Rammurti Shukla und Roman Probst. 2022. Prediction of failure in time (FIT) of electrical connectors with short term tests. <i>Microelectronics reliability : an internat. journal &#38; world abstracting service</i> 138, Nr. November 2022. doi:<a href=\"https://doi.org/10.1016/j.microrel.2022.114684\">10.1016/j.microrel.2022.114684</a>, .","ufg":"<b>Song, Jian/Shukla, Abhay Rammurti/Probst, Roman</b>: Prediction of failure in time (FIT) of electrical connectors with short term tests, in: <i>Microelectronics reliability : an internat. journal &#38; world abstracting service</i> 138 (2022), H. November 2022.","mla":"Song, Jian, et al. “Prediction of Failure in Time (FIT) of Electrical Connectors with Short Term Tests.” <i>Microelectronics Reliability : An Internat. Journal &#38; World Abstracting Service</i>, vol. 138, no. November 2022, 114684, 2022, <a href=\"https://doi.org/10.1016/j.microrel.2022.114684\">https://doi.org/10.1016/j.microrel.2022.114684</a>.","apa":"Song, J., Shukla, A. R., &#38; Probst, R. (2022). Prediction of failure in time (FIT) of electrical connectors with short term tests. <i>Microelectronics Reliability : An Internat. Journal &#38; World Abstracting Service</i>, <i>138</i>(November 2022), Article 114684. <a href=\"https://doi.org/10.1016/j.microrel.2022.114684\">https://doi.org/10.1016/j.microrel.2022.114684</a>","short":"J. Song, A.R. Shukla, R. Probst, Microelectronics Reliability : An Internat. Journal &#38; World Abstracting Service 138 (2022).","havard":"J. Song, A.R. Shukla, R. Probst, Prediction of failure in time (FIT) of electrical connectors with short term tests, Microelectronics Reliability : An Internat. Journal &#38; World Abstracting Service. 138 (2022).","chicago":"Song, Jian, Abhay Rammurti Shukla, and Roman Probst. “Prediction of Failure in Time (FIT) of Electrical Connectors with Short Term Tests.” <i>Microelectronics Reliability : An Internat. Journal &#38; World Abstracting Service</i> 138, no. November 2022 (2022). <a href=\"https://doi.org/10.1016/j.microrel.2022.114684\">https://doi.org/10.1016/j.microrel.2022.114684</a>.","din1505-2-1":"<span style=\"font-variant:small-caps;\">Song, Jian</span> ; <span style=\"font-variant:small-caps;\">Shukla, Abhay Rammurti</span> ; <span style=\"font-variant:small-caps;\">Probst, Roman</span>: Prediction of failure in time (FIT) of electrical connectors with short term tests. In: <i>Microelectronics reliability : an internat. journal &#38; world abstracting service</i> Bd. 138. Amsterdam, Elsevier (2022), Nr. November 2022","bjps":"<b>Song J, Shukla AR and Probst R</b> (2022) Prediction of Failure in Time (FIT) of Electrical Connectors with Short Term Tests. <i>Microelectronics reliability : an internat. journal &#38; world abstracting service</i> <b>138</b>.","van":"Song J, Shukla AR, Probst R. Prediction of failure in time (FIT) of electrical connectors with short term tests. Microelectronics reliability : an internat journal &#38; world abstracting service. 2022;138(November 2022).","ama":"Song J, Shukla AR, Probst R. Prediction of failure in time (FIT) of electrical connectors with short term tests. <i>Microelectronics reliability : an internat journal &#38; world abstracting service</i>. 2022;138(November 2022). doi:<a href=\"https://doi.org/10.1016/j.microrel.2022.114684\">10.1016/j.microrel.2022.114684</a>","ieee":"J. Song, A. R. Shukla, and R. Probst, “Prediction of failure in time (FIT) of electrical connectors with short term tests,” <i>Microelectronics reliability : an internat. journal &#38; world abstracting service</i>, vol. 138, no. November 2022, Art. no. 114684, 2022, doi: <a href=\"https://doi.org/10.1016/j.microrel.2022.114684\">10.1016/j.microrel.2022.114684</a>."},"place":"Amsterdam","_id":"9206","article_number":"114684","publication":"Microelectronics reliability : an internat. journal & world abstracting service"},{"publication":"Electrical contacts - 2022 : proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts","_id":"9211","date_created":"2022-12-11T13:50:30Z","language":[{"iso":"eng"}],"publication_status":"published","place":"Piscataway, NJ","citation":{"din1505-2-1":"<span style=\"font-variant:small-caps;\">Song, Jian</span> ; <span style=\"font-variant:small-caps;\">Shukla, Abhay Rammurti</span> ; <span style=\"font-variant:small-caps;\">Probst, Roman</span>: <i>State of Health of Connectors – Early Indicators</i>. Piscataway, NJ : IEEE, 2022","bjps":"<b>Song J, Shukla AR and Probst R</b> (2022) <i>State of Health of Connectors – Early Indicators</i>. Piscataway, NJ: IEEE.","chicago":"Song, Jian, Abhay Rammurti Shukla, and Roman Probst. <i>State of Health of Connectors – Early Indicators</i>. <i>Electrical Contacts - 2022 : Proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts</i>. Piscataway, NJ: IEEE, 2022. <a href=\"https://doi.org/10.1109/HLM54538.2022.9969839\">https://doi.org/10.1109/HLM54538.2022.9969839</a>.","ieee":"J. Song, A. R. Shukla, and R. Probst, <i>State of Health of Connectors – Early Indicators</i>. Piscataway, NJ: IEEE, 2022, pp. 272–278. doi: <a href=\"https://doi.org/10.1109/HLM54538.2022.9969839\">10.1109/HLM54538.2022.9969839</a>.","ama":"Song J, Shukla AR, Probst R. <i>State of Health of Connectors – Early Indicators</i>. IEEE; 2022:272-278. doi:<a href=\"https://doi.org/10.1109/HLM54538.2022.9969839\">10.1109/HLM54538.2022.9969839</a>","van":"Song J, Shukla AR, Probst R. State of Health of Connectors – Early Indicators. Electrical contacts - 2022 : proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts. Piscataway, NJ: IEEE; 2022.","mla":"Song, Jian, et al. “State of Health of Connectors – Early Indicators.” <i>Electrical Contacts - 2022 : Proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts</i>, IEEE, 2022, pp. 272–78, <a href=\"https://doi.org/10.1109/HLM54538.2022.9969839\">https://doi.org/10.1109/HLM54538.2022.9969839</a>.","apa":"Song, J., Shukla, A. R., &#38; Probst, R. (2022). State of Health of Connectors – Early Indicators. In <i>Electrical contacts - 2022 : proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts</i> (pp. 272–278). IEEE. <a href=\"https://doi.org/10.1109/HLM54538.2022.9969839\">https://doi.org/10.1109/HLM54538.2022.9969839</a>","short":"J. Song, A.R. Shukla, R. Probst, State of Health of Connectors – Early Indicators, IEEE, Piscataway, NJ, 2022.","chicago-de":"Song, Jian, Abhay Rammurti Shukla und Roman Probst. 2022. <i>State of Health of Connectors – Early Indicators</i>. <i>Electrical contacts - 2022 : proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts</i>. Piscataway, NJ: IEEE. doi:<a href=\"https://doi.org/10.1109/HLM54538.2022.9969839\">10.1109/HLM54538.2022.9969839</a>, .","ufg":"<b>Song, Jian/Shukla, Abhay Rammurti/Probst, Roman</b>: State of Health of Connectors – Early Indicators, Piscataway, NJ 2022.","havard":"J. Song, A.R. Shukla, R. Probst, State of Health of Connectors – Early Indicators, IEEE, Piscataway, NJ, 2022."},"publication_identifier":{"issn":["2158-9992"],"isbn":["978-1-6654-5966-2","978-1-6654-5967-9"],"eisbn":["978-1-6654-5965-5"]},"author":[{"last_name":"Song","id":"5297","full_name":"Song, Jian","first_name":"Jian"},{"full_name":"Shukla, Abhay Rammurti","last_name":"Shukla","id":"72757","first_name":"Abhay Rammurti"},{"first_name":"Roman","last_name":"Probst","id":"69156","full_name":"Probst, Roman"}],"title":"State of Health of Connectors – Early Indicators","status":"public","department":[{"_id":"DEP6012"}],"year":"2022","user_id":"83781","page":"272 - 278","conference":{"end_date":"2022-10-26","start_date":"2022-10-23","name":"67th Holm Conference on Electrical Contacts","location":"Tampa, FL, USA"},"abstract":[{"text":"Lifetime tests of connectors are time consuming and labor intensive. Our study reveals a strong correlation between the statistical characteristics of contact resistance development in the early stages of lifetime tests and the final results of the tests. This correlation enables a further time lapse of lifetime tests and the prediction of the state of the health of connectors which can be utilized in the development of diagnostic strategy in sophisticated networks with very high number of connectors as well as in a quick classification of connectors with respect to their design features. Methods of statistical evaluation are introduced and the sensitivity analyses of different characteristics for the state of health of connectors are conducted.","lang":"eng"}],"keyword":["Connectors","Correlation","Sensitivity analysis","Contact resistance","Lifetime estimation","Reliability","Electrical resistance measurement"],"publisher":"IEEE","type":"conference_editor_article","date_updated":"2024-08-05T08:01:22Z","doi":"10.1109/HLM54538.2022.9969839"}]