---
_id: '12763'
abstract:
- lang: eng
text: "In a previous paper, the correlation between the wear resistance of coatings
and the lifetime of electrical connectors under fretting load was discovered.
Based on this knowledge, various modifications of silver-based coatings with markedly
increased wear resistance have been developed, and a calculation model for predicting
connector lifetime has been formulated. Investigations on silver-coated electrical
contacts with increased wear resistance show extended lifetimes in fretting wear
and fretting corrosion tests, and the calculation model with various modified
coating materials can be validated. However, contacts with very high wear-resistant
coatings fail earlier than the specific wear coefficient and the calculation model
prediction suggest.\r\nThe in-depth investigation of the coating material and
the wear scar revealed the reasons for this unexpectedly shorter lifetime. The
high wear resistance of modified silver coatings is achieved by increased micro-hardness.
Both coatings with coating materials of high hardness and high thickness can lead
to longer lifetimes under fretting load. However, increased fretting cycles can
also cause fatigue and electrical contacts can fail due to delamination of the
surface coating caused by fretting fatigue, and this delamination can lead to
a sudden exposure of the base material, thus enabling its corrosion.\r\nTherefore,
both wear resistance and fatigue resistance should be increased in order to achieve
a long lifetime of electrical contacts under fretting load."
article_number: '205971'
article_type: original
author:
- first_name: Jian
full_name: Song, Jian
id: '5297'
last_name: Song
- first_name: 'Soeren '
full_name: 'Tuelling, Soeren '
last_name: Tuelling
- first_name: Jonas
full_name: Hengstler, Jonas
last_name: Hengstler
citation:
ama: 'Song J, Tuelling S, Hengstler J. Correlation between wear and fatigue properties
and the lifetime of silver coated electrical connectors. Wear : an international
journal on the science and technology of friction, lubrication and wear .
Published online 2025. doi:10.1016/j.wear.2025.205971'
apa: 'Song, J., Tuelling, S., & Hengstler, J. (2025). Correlation between wear
and fatigue properties and the lifetime of silver coated electrical connectors.
Wear : An International Journal on the Science and Technology of Friction,
Lubrication and Wear , Article 205971. https://doi.org/10.1016/j.wear.2025.205971'
bjps: 'Song J, Tuelling S and Hengstler J (2025) Correlation between Wear
and Fatigue Properties and the Lifetime of Silver Coated Electrical Connectors.
Wear : an international journal on the science and technology of friction,
lubrication and wear .'
chicago: 'Song, Jian, Soeren Tuelling, and Jonas Hengstler. “Correlation between
Wear and Fatigue Properties and the Lifetime of Silver Coated Electrical Connectors.”
Wear : An International Journal on the Science and Technology of Friction,
Lubrication and Wear , 2025. https://doi.org/10.1016/j.wear.2025.205971.'
chicago-de: 'Song, Jian, Soeren Tuelling und Jonas Hengstler. 2025. Correlation
between wear and fatigue properties and the lifetime of silver coated electrical
connectors. Wear : an international journal on the science and technology of
friction, lubrication and wear . doi:10.1016/j.wear.2025.205971,
.'
din1505-2-1: 'Song, Jian ; Tuelling,
Soeren ; Hengstler, Jonas:
Correlation between wear and fatigue properties and the lifetime of silver coated
electrical connectors. In: Wear : an international journal on the science and
technology of friction, lubrication and wear . Amsterdam [u.a.], Elsevier
(2025)'
havard: 'J. Song, S. Tuelling, J. Hengstler, Correlation between wear and fatigue
properties and the lifetime of silver coated electrical connectors, Wear : An
International Journal on the Science and Technology of Friction, Lubrication and
Wear . (2025).'
ieee: 'J. Song, S. Tuelling, and J. Hengstler, “Correlation between wear and fatigue
properties and the lifetime of silver coated electrical connectors,” Wear :
an international journal on the science and technology of friction, lubrication
and wear , Art. no. 205971, 2025, doi: 10.1016/j.wear.2025.205971.'
mla: 'Song, Jian, et al. “Correlation between Wear and Fatigue Properties and the
Lifetime of Silver Coated Electrical Connectors.” Wear : An International Journal
on the Science and Technology of Friction, Lubrication and Wear , 205971,
2025, https://doi.org/10.1016/j.wear.2025.205971.'
short: 'J. Song, S. Tuelling, J. Hengstler, Wear : An International Journal on the
Science and Technology of Friction, Lubrication and Wear (2025).'
ufg: 'Song, Jian/Tuelling, Soeren/Hengstler, Jonas: Correlation between wear
and fatigue properties and the lifetime of silver coated electrical connectors,
in: Wear : an international journal on the science and technology of friction,
lubrication and wear (2025).'
van: 'Song J, Tuelling S, Hengstler J. Correlation between wear and fatigue properties
and the lifetime of silver coated electrical connectors. Wear : an international
journal on the science and technology of friction, lubrication and wear . 2025;'
date_created: 2025-04-04T11:00:08Z
date_updated: 2025-04-07T12:53:17Z
department:
- _id: DEP6012
doi: 10.1016/j.wear.2025.205971
keyword:
- Fretting
- Wear
- Fatigue
- Lifetime
- Electrical contacts
language:
- iso: eng
place: Amsterdam [u.a.]
publication: 'Wear : an international journal on the science and technology of friction,
lubrication and wear '
publication_identifier:
issn:
- 0043-1648
publication_status: published
publisher: Elsevier
quality_controlled: '1'
status: public
title: Correlation between wear and fatigue properties and the lifetime of silver
coated electrical connectors
type: scientific_journal_article
user_id: '83781'
year: '2025'
...
---
_id: '12761'
abstract:
- lang: eng
text: For modern machines, factories and electric and autonomous vehicles, the importance
of vreliable electrical connectors cannot be overstated. With an increasing number
of connectors being used in machines, factories and vehicles, ensuring their reliability
is crucial for comfort and safety alike. One of the key indicators of reliability
is the lifetime of connectors. To evaluate the lifetime of electrical connectors,
a testing method and a model for calculating their lifetime based on the test
data were developed. The results from these tests were compared to failure analysis
data from long-term field operations. The findings indicate that the laboratory
tests can accurately reproduce the main failures observed in the field. However,
such lifetime tests can be time- and labor-intensive. To address this challenge,
a data-driven method is proposed that predicts the lifetime of electrical connectors
using statistical analysis of electrical contact resistance data collected from
short-term tests. The predictions from this method were compared to actual results
obtained from long-term tests. A strong correlation was observed between the contact
resistance development in short-term tests and the number of failures in later
stages of testing. Thus, apart from predicting the lifetime of connectors, this
method can also be applied for failure prognosis in real-time operations.
author:
- first_name: Jian
full_name: Song, Jian
id: '5297'
last_name: Song
- first_name: Abhay Rammurti
full_name: Shukla, Abhay Rammurti
id: '74188'
last_name: Shukla
- first_name: Roman
full_name: Probst, Roman
id: '69156'
last_name: Probst
citation:
ama: Song J, Shukla AR, Probst R. The State of Health of Electrical Connectors.
Machines. 2024;7(12):474. doi:https://doi.org/10.3390/machines12070474
apa: Song, J., Shukla, A. R., & Probst, R. (2024). The State of Health of Electrical
Connectors. Machines, 7(12), 474. https://doi.org/10.3390/machines12070474
bjps: Song J, Shukla AR and Probst R (2024) The State of Health of Electrical
Connectors. Machines 7, 474.
chicago: 'Song, Jian, Abhay Rammurti Shukla, and Roman Probst. “The State of Health
of Electrical Connectors.” Machines 7, no. 12 (2024): 474. https://doi.org/10.3390/machines12070474.'
chicago-de: 'Song, Jian, Abhay Rammurti Shukla und Roman Probst. 2024. The State
of Health of Electrical Connectors. Machines 7, Nr. 12: 474. doi:https://doi.org/10.3390/machines12070474,
.'
din1505-2-1: 'Song, Jian ; Shukla,
Abhay Rammurti ; Probst, Roman:
The State of Health of Electrical Connectors. In: Machines Bd. 7. Basel,
MDPI (2024), Nr. 12, S. 474'
havard: J. Song, A.R. Shukla, R. Probst, The State of Health of Electrical Connectors,
Machines. 7 (2024) 474.
ieee: 'J. Song, A. R. Shukla, and R. Probst, “The State of Health of Electrical
Connectors,” Machines, vol. 7, no. 12, p. 474, 2024, doi: https://doi.org/10.3390/machines12070474.'
mla: Song, Jian, et al. “The State of Health of Electrical Connectors.” Machines,
vol. 7, no. 12, 2024, p. 474, https://doi.org/10.3390/machines12070474.
short: J. Song, A.R. Shukla, R. Probst, Machines 7 (2024) 474.
ufg: 'Song, Jian/Shukla, Abhay Rammurti/Probst, Roman: The State of Health
of Electrical Connectors, in: Machines 7 (2024), H. 12, S. 474.'
van: Song J, Shukla AR, Probst R. The State of Health of Electrical Connectors.
Machines. 2024;7(12):474.
date_created: 2025-04-04T09:23:10Z
date_updated: 2025-06-25T13:03:28Z
department:
- _id: DEP6012
doi: https://doi.org/10.3390/machines12070474
external_id:
isi:
- '001277040200001'
intvolume: ' 7'
isi: '1'
issue: '12'
keyword:
- electrical connectors
- accelerated life testing
- statistical model
- lifetime prognosis
- reliability
- state of health
language:
- iso: eng
page: '474'
place: Basel
publication: Machines
publication_identifier:
eissn:
- '2075-1702 '
publication_status: published
publisher: MDPI
quality_controlled: '1'
status: public
title: The State of Health of Electrical Connectors
type: scientific_journal_article
user_id: '83781'
volume: 7
year: '2024'
...
---
_id: '11359'
abstract:
- lang: eng
text: The reliability and lifetime of electrical contacts is an important aspect
in system reliability and is influenced by numerous factors. Micro motions as
well as vibrations lead to fretting wear, which can result in wear through of
the protective coating. If this layer is worn through, the non-noble layer underneath
is exposed, resulting in the occurrence of fretting corrosion with further relative
motion. This leads to an increased electrical contact resistance (ECR) and can
cause the contact to fail. Increasing the hardness of the coating material can
reduce the wear and in turn increase contacts’ lifetime. The micro hardness, wear
and lifetime of contacts with modified hard silver coatings are investigated in
fretting wear and corrosion tests and the results compared to a conventional silver
coating. Since one of the modifications shows a significant reduction in wear
and hence improvement in lifetime, further analysis with SEM and FIB is conducted
in order to identify the key mechanisms leading to this improvement. With a further
increase in lifetime however, fatigue as well as delamination of the coating are
revealed to be of high relevance. Both can be main causes of electrical contact
failure under fretting load. In general, at lower number of cycles, increased
micro hardness has the greatest effect on lifetime and wear while at the higher
number of cycles, fatigue is observed to be the dominant failure mechanism.
author:
- first_name: Roman
full_name: Probst, Roman
id: '69156'
last_name: Probst
- first_name: Jian
full_name: Song, Jian
id: '5297'
last_name: Song
citation:
ama: Probst R, Song J. Influence of Hardness and Fatigue on the Lifetime of a
Modified Silver Coating in Fretting Wear and Corrosion Tests. IEEE; 2023:88-94.
doi:10.1109/holm56075.2023.10352299
apa: Probst, R., & Song, J. (2023). Influence of Hardness and Fatigue on the
Lifetime of a Modified Silver Coating in Fretting Wear and Corrosion Tests. In
2023 IEEE 68th Holm Conference on Electrical Contacts (HOLM) (pp. 88–94).
IEEE. https://doi.org/10.1109/holm56075.2023.10352299
bjps: 'Probst R and Song J (2023) Influence of Hardness and Fatigue on
the Lifetime of a Modified Silver Coating in Fretting Wear and Corrosion Tests.
[Piscataway, NJ]: IEEE.'
chicago: 'Probst, Roman, and Jian Song. Influence of Hardness and Fatigue on
the Lifetime of a Modified Silver Coating in Fretting Wear and Corrosion Tests.
2023 IEEE 68th Holm Conference on Electrical Contacts (HOLM). Electrical
Contacts-IEEE Holm Conference on Electrical Contacts. [Piscataway, NJ]: IEEE,
2023. https://doi.org/10.1109/holm56075.2023.10352299.'
chicago-de: 'Probst, Roman und Jian Song. 2023. Influence of Hardness and Fatigue
on the Lifetime of a Modified Silver Coating in Fretting Wear and Corrosion Tests.
2023 IEEE 68th Holm Conference on Electrical Contacts (HOLM). Electrical
Contacts-IEEE Holm Conference on Electrical Contacts. [Piscataway, NJ]: IEEE.
doi:10.1109/holm56075.2023.10352299,
.'
din1505-2-1: 'Probst, Roman ; Song, Jian: Influence of Hardness and
Fatigue on the Lifetime of a Modified Silver Coating in Fretting Wear and Corrosion
Tests, Electrical Contacts-IEEE Holm Conference on Electrical Contacts.
[Piscataway, NJ] : IEEE, 2023'
havard: R. Probst, J. Song, Influence of Hardness and Fatigue on the Lifetime of
a Modified Silver Coating in Fretting Wear and Corrosion Tests, IEEE, [Piscataway,
NJ], 2023.
ieee: 'R. Probst and J. Song, Influence of Hardness and Fatigue on the Lifetime
of a Modified Silver Coating in Fretting Wear and Corrosion Tests. [Piscataway,
NJ]: IEEE, 2023, pp. 88–94. doi: 10.1109/holm56075.2023.10352299.'
mla: Probst, Roman, and Jian Song. “Influence of Hardness and Fatigue on the Lifetime
of a Modified Silver Coating in Fretting Wear and Corrosion Tests.” 2023 IEEE
68th Holm Conference on Electrical Contacts (HOLM), IEEE, 2023, pp. 88–94,
https://doi.org/10.1109/holm56075.2023.10352299.
short: R. Probst, J. Song, Influence of Hardness and Fatigue on the Lifetime of
a Modified Silver Coating in Fretting Wear and Corrosion Tests, IEEE, [Piscataway,
NJ], 2023.
ufg: 'Probst, Roman/Song, Jian: Influence of Hardness and Fatigue on the
Lifetime of a Modified Silver Coating in Fretting Wear and Corrosion Tests, [Piscataway,
NJ] 2023 (Electrical Contacts-IEEE Holm Conference on Electrical Contacts).'
van: 'Probst R, Song J. Influence of Hardness and Fatigue on the Lifetime of a Modified
Silver Coating in Fretting Wear and Corrosion Tests. 2023 IEEE 68th Holm Conference
on Electrical Contacts (HOLM). [Piscataway, NJ]: IEEE; 2023. (Electrical Contacts-IEEE
Holm Conference on Electrical Contacts).'
conference:
end_date: 2023-10-11
location: 'Seattle '
name: 68th Holm Conference on Electrical Contacts (HOLM)
start_date: 2023-10-04
date_created: 2024-04-18T10:05:51Z
date_updated: 2025-06-26T07:54:13Z
department:
- _id: DEP6012
doi: 10.1109/holm56075.2023.10352299
keyword:
- electrical contacts
- lifetime
- silver coating
- fretting corrosion
- fatigue
- wear through
language:
- iso: eng
page: 88 - 94
place: '[Piscataway, NJ]'
publication: 2023 IEEE 68th Holm Conference on Electrical Contacts (HOLM)
publication_identifier:
eisbn:
- '979‐8‐3503‐4246‐8 '
- 979‐8‐3503‐4245‐1
isbn:
- 979‐8‐3503‐4244‐4
issn:
- 2158‐9992
publication_status: published
publisher: IEEE
series_title: Electrical Contacts-IEEE Holm Conference on Electrical Contacts
status: public
title: Influence of Hardness and Fatigue on the Lifetime of a Modified Silver Coating
in Fretting Wear and Corrosion Tests
type: conference_editor_article
user_id: '83781'
year: '2023'
...
---
_id: '9206'
abstract:
- lang: eng
text: Failure in time (FIT) is an important measure for the reliability of electrical
connectors. Due to the very long lifetime of connectors, the tests for the determination
of FIT rate are time and labour intensive. In this paper a data driven method
using a statistical process to estimate the FIT rate of electrical connectors
with data of electrical contact resistance development in short term tests is
proposed. The results of prediction are then compared with the results from long
term tests. The study shows a strong correlation between contact resistance development
in short term tests and the development of the number of failures in later stages
of tests. In order to predict the development of degradation precisely, the distribution
of resistance data in many different tests with different connectors is investigated.
The Generalized Extreme Value Distribution, which reveals an ideal fitting, has
been implemented for the prediction of the failure rates of connectors, thereby
enabling a remarkable time-lapse of lifetime tests. This method can also be employed
in the prognosis and management of system health through the forecast of health
of connectors in different systems in operation.
article_number: '114684'
author:
- first_name: Jian
full_name: Song, Jian
id: '5297'
last_name: Song
- first_name: Abhay Rammurti
full_name: Shukla, Abhay Rammurti
id: '72757'
last_name: Shukla
- first_name: Roman
full_name: Probst, Roman
id: '69156'
last_name: Probst
citation:
ama: 'Song J, Shukla AR, Probst R. Prediction of failure in time (FIT) of electrical
connectors with short term tests. Microelectronics reliability : an internat
journal & world abstracting service. 2022;138(November 2022). doi:10.1016/j.microrel.2022.114684'
apa: 'Song, J., Shukla, A. R., & Probst, R. (2022). Prediction of failure in
time (FIT) of electrical connectors with short term tests. Microelectronics
Reliability : An Internat. Journal & World Abstracting Service, 138(November
2022), Article 114684. https://doi.org/10.1016/j.microrel.2022.114684'
bjps: 'Song J, Shukla AR and Probst R (2022) Prediction of Failure in Time
(FIT) of Electrical Connectors with Short Term Tests. Microelectronics reliability :
an internat. journal & world abstracting service 138.'
chicago: 'Song, Jian, Abhay Rammurti Shukla, and Roman Probst. “Prediction of Failure
in Time (FIT) of Electrical Connectors with Short Term Tests.” Microelectronics
Reliability : An Internat. Journal & World Abstracting Service 138, no.
November 2022 (2022). https://doi.org/10.1016/j.microrel.2022.114684.'
chicago-de: 'Song, Jian, Abhay Rammurti Shukla und Roman Probst. 2022. Prediction
of failure in time (FIT) of electrical connectors with short term tests. Microelectronics
reliability : an internat. journal & world abstracting service 138, Nr.
November 2022. doi:10.1016/j.microrel.2022.114684,
.'
din1505-2-1: 'Song, Jian ; Shukla,
Abhay Rammurti ; Probst, Roman:
Prediction of failure in time (FIT) of electrical connectors with short term tests.
In: Microelectronics reliability : an internat. journal & world abstracting
service Bd. 138. Amsterdam, Elsevier (2022), Nr. November 2022'
havard: 'J. Song, A.R. Shukla, R. Probst, Prediction of failure in time (FIT) of
electrical connectors with short term tests, Microelectronics Reliability : An
Internat. Journal & World Abstracting Service. 138 (2022).'
ieee: 'J. Song, A. R. Shukla, and R. Probst, “Prediction of failure in time (FIT)
of electrical connectors with short term tests,” Microelectronics reliability :
an internat. journal & world abstracting service, vol. 138, no. November
2022, Art. no. 114684, 2022, doi: 10.1016/j.microrel.2022.114684.'
mla: 'Song, Jian, et al. “Prediction of Failure in Time (FIT) of Electrical Connectors
with Short Term Tests.” Microelectronics Reliability : An Internat. Journal
& World Abstracting Service, vol. 138, no. November 2022, 114684, 2022,
https://doi.org/10.1016/j.microrel.2022.114684.'
short: 'J. Song, A.R. Shukla, R. Probst, Microelectronics Reliability : An Internat.
Journal & World Abstracting Service 138 (2022).'
ufg: 'Song, Jian/Shukla, Abhay Rammurti/Probst, Roman: Prediction of failure
in time (FIT) of electrical connectors with short term tests, in: Microelectronics
reliability : an internat. journal & world abstracting service 138 (2022),
H. November 2022.'
van: 'Song J, Shukla AR, Probst R. Prediction of failure in time (FIT) of electrical
connectors with short term tests. Microelectronics reliability : an internat journal
& world abstracting service. 2022;138(November 2022).'
date_created: 2022-12-11T13:13:46Z
date_updated: 2024-08-05T07:30:51Z
department:
- _id: DEP6012
doi: 10.1016/j.microrel.2022.114684
intvolume: ' 138'
issue: November 2022
keyword:
- Electrical connectors
- Prediction of lifetime
- FIT
- Correlation between data in short and long term tests
- Time-lapse of lifetime tests
language:
- iso: eng
place: Amsterdam
publication: 'Microelectronics reliability : an internat. journal & world abstracting
service'
publication_identifier:
issn:
- 0026-2714
publication_status: published
publisher: Elsevier
status: public
title: Prediction of failure in time (FIT) of electrical connectors with short term
tests
type: scientific_journal_article
user_id: '83781'
volume: 138
year: '2022'
...
---
_id: '9211'
abstract:
- lang: eng
text: Lifetime tests of connectors are time consuming and labor intensive. Our study
reveals a strong correlation between the statistical characteristics of contact
resistance development in the early stages of lifetime tests and the final results
of the tests. This correlation enables a further time lapse of lifetime tests
and the prediction of the state of the health of connectors which can be utilized
in the development of diagnostic strategy in sophisticated networks with very
high number of connectors as well as in a quick classification of connectors with
respect to their design features. Methods of statistical evaluation are introduced
and the sensitivity analyses of different characteristics for the state of health
of connectors are conducted.
author:
- first_name: Jian
full_name: Song, Jian
id: '5297'
last_name: Song
- first_name: Abhay Rammurti
full_name: Shukla, Abhay Rammurti
id: '72757'
last_name: Shukla
- first_name: Roman
full_name: Probst, Roman
id: '69156'
last_name: Probst
citation:
ama: Song J, Shukla AR, Probst R. State of Health of Connectors – Early Indicators.
IEEE; 2022:272-278. doi:10.1109/HLM54538.2022.9969839
apa: 'Song, J., Shukla, A. R., & Probst, R. (2022). State of Health of Connectors
– Early Indicators. In Electrical contacts - 2022 : proceedings of the Sixty-Seventh
IEEE Holm Conference on Electrical Contacts (pp. 272–278). IEEE. https://doi.org/10.1109/HLM54538.2022.9969839'
bjps: 'Song J, Shukla AR and Probst R (2022) State of Health of Connectors
– Early Indicators. Piscataway, NJ: IEEE.'
chicago: 'Song, Jian, Abhay Rammurti Shukla, and Roman Probst. State of Health
of Connectors – Early Indicators. Electrical Contacts - 2022 : Proceedings
of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts. Piscataway,
NJ: IEEE, 2022. https://doi.org/10.1109/HLM54538.2022.9969839.'
chicago-de: 'Song, Jian, Abhay Rammurti Shukla und Roman Probst. 2022. State
of Health of Connectors – Early Indicators. Electrical contacts - 2022 :
proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts.
Piscataway, NJ: IEEE. doi:10.1109/HLM54538.2022.9969839,
.'
din1505-2-1: 'Song, Jian ; Shukla,
Abhay Rammurti ; Probst, Roman:
State of Health of Connectors – Early Indicators. Piscataway, NJ : IEEE,
2022'
havard: J. Song, A.R. Shukla, R. Probst, State of Health of Connectors – Early Indicators,
IEEE, Piscataway, NJ, 2022.
ieee: 'J. Song, A. R. Shukla, and R. Probst, State of Health of Connectors –
Early Indicators. Piscataway, NJ: IEEE, 2022, pp. 272–278. doi: 10.1109/HLM54538.2022.9969839.'
mla: 'Song, Jian, et al. “State of Health of Connectors – Early Indicators.” Electrical
Contacts - 2022 : Proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical
Contacts, IEEE, 2022, pp. 272–78, https://doi.org/10.1109/HLM54538.2022.9969839.'
short: J. Song, A.R. Shukla, R. Probst, State of Health of Connectors – Early Indicators,
IEEE, Piscataway, NJ, 2022.
ufg: 'Song, Jian/Shukla, Abhay Rammurti/Probst, Roman: State of Health of
Connectors – Early Indicators, Piscataway, NJ 2022.'
van: 'Song J, Shukla AR, Probst R. State of Health of Connectors – Early Indicators.
Electrical contacts - 2022 : proceedings of the Sixty-Seventh IEEE Holm Conference
on Electrical Contacts. Piscataway, NJ: IEEE; 2022.'
conference:
end_date: 2022-10-26
location: Tampa, FL, USA
name: 67th Holm Conference on Electrical Contacts
start_date: 2022-10-23
date_created: 2022-12-11T13:50:30Z
date_updated: 2024-08-05T08:01:22Z
department:
- _id: DEP6012
doi: 10.1109/HLM54538.2022.9969839
keyword:
- Connectors
- Correlation
- Sensitivity analysis
- Contact resistance
- Lifetime estimation
- Reliability
- Electrical resistance measurement
language:
- iso: eng
page: 272 - 278
place: Piscataway, NJ
publication: 'Electrical contacts - 2022 : proceedings of the Sixty-Seventh IEEE Holm
Conference on Electrical Contacts'
publication_identifier:
eisbn:
- 978-1-6654-5965-5
isbn:
- 978-1-6654-5966-2
- 978-1-6654-5967-9
issn:
- 2158-9992
publication_status: published
publisher: IEEE
status: public
title: State of Health of Connectors – Early Indicators
type: conference_editor_article
user_id: '83781'
year: '2022'
...