[{"volume":7,"citation":{"ama":"Song J, Shukla AR, Probst R. The State of Health of Electrical Connectors. <i>Machines</i>. 2024;7(12):474. doi:<a href=\"https://doi.org/10.3390/machines12070474\">https://doi.org/10.3390/machines12070474</a>","ieee":"J. Song, A. R. Shukla, and R. Probst, “The State of Health of Electrical Connectors,” <i>Machines</i>, vol. 7, no. 12, p. 474, 2024, doi: <a href=\"https://doi.org/10.3390/machines12070474\">https://doi.org/10.3390/machines12070474</a>.","van":"Song J, Shukla AR, Probst R. The State of Health of Electrical Connectors. Machines. 2024;7(12):474.","ufg":"<b>Song, Jian/Shukla, Abhay Rammurti/Probst, Roman</b>: The State of Health of Electrical Connectors, in: <i>Machines</i> 7 (2024), H. 12,  S. 474.","mla":"Song, Jian, et al. “The State of Health of Electrical Connectors.” <i>Machines</i>, vol. 7, no. 12, 2024, p. 474, <a href=\"https://doi.org/10.3390/machines12070474\">https://doi.org/10.3390/machines12070474</a>.","bjps":"<b>Song J, Shukla AR and Probst R</b> (2024) The State of Health of Electrical Connectors. <i>Machines</i> <b>7</b>, 474.","havard":"J. Song, A.R. Shukla, R. Probst, The State of Health of Electrical Connectors, Machines. 7 (2024) 474.","apa":"Song, J., Shukla, A. R., &#38; Probst, R. (2024). The State of Health of Electrical Connectors. <i>Machines</i>, <i>7</i>(12), 474. <a href=\"https://doi.org/10.3390/machines12070474\">https://doi.org/10.3390/machines12070474</a>","chicago":"Song, Jian, Abhay Rammurti Shukla, and Roman Probst. “The State of Health of Electrical Connectors.” <i>Machines</i> 7, no. 12 (2024): 474. <a href=\"https://doi.org/10.3390/machines12070474\">https://doi.org/10.3390/machines12070474</a>.","short":"J. Song, A.R. Shukla, R. Probst, Machines 7 (2024) 474.","chicago-de":"Song, Jian, Abhay Rammurti Shukla und Roman Probst. 2024. The State of Health of Electrical Connectors. <i>Machines</i> 7, Nr. 12: 474. doi:<a href=\"https://doi.org/10.3390/machines12070474\">https://doi.org/10.3390/machines12070474</a>, .","din1505-2-1":"<span style=\"font-variant:small-caps;\">Song, Jian</span> ; <span style=\"font-variant:small-caps;\">Shukla, Abhay Rammurti</span> ; <span style=\"font-variant:small-caps;\">Probst, Roman</span>: The State of Health of Electrical Connectors. In: <i>Machines</i> Bd. 7. Basel, MDPI (2024), Nr. 12, S. 474"},"title":"The State of Health of Electrical Connectors","page":"474","status":"public","author":[{"id":"5297","full_name":"Song, Jian","last_name":"Song","first_name":"Jian"},{"full_name":"Shukla, Abhay Rammurti","last_name":"Shukla","first_name":"Abhay Rammurti","id":"74188"},{"last_name":"Probst","full_name":"Probst, Roman","first_name":"Roman","id":"69156"}],"year":"2024","external_id":{"isi":["001277040200001"]},"date_updated":"2025-06-25T13:03:28Z","date_created":"2025-04-04T09:23:10Z","publication_identifier":{"eissn":["2075-1702 "]},"publication":"Machines","language":[{"iso":"eng"}],"keyword":["electrical connectors","accelerated life testing","statistical model","lifetime prognosis","reliability","state of health"],"publication_status":"published","isi":"1","quality_controlled":"1","publisher":"MDPI","department":[{"_id":"DEP6012"}],"issue":"12","abstract":[{"lang":"eng","text":"For modern machines, factories and electric and autonomous vehicles, the importance of vreliable electrical connectors cannot be overstated. With an increasing number of connectors being used in machines, factories and vehicles, ensuring their reliability is crucial for comfort and safety alike. One of the key indicators of reliability is the lifetime of connectors. To evaluate the lifetime of electrical connectors, a testing method and a model for calculating their lifetime based on the test data were developed. The results from these tests were compared to failure analysis data from long-term field operations. The findings indicate that the laboratory tests can accurately reproduce the main failures observed in the field. However, such lifetime tests can be time- and labor-intensive. To address this challenge, a data-driven method is proposed that predicts the lifetime of electrical connectors using statistical analysis of electrical contact resistance data collected from short-term tests. The predictions from this method were compared to actual results obtained from long-term tests. A strong correlation was observed between the contact resistance development in short-term tests and the number of failures in later stages of testing. Thus, apart from predicting the lifetime of connectors, this method can also be applied for failure prognosis in real-time operations."}],"user_id":"83781","intvolume":"         7","type":"scientific_journal_article","place":"Basel","doi":"https://doi.org/10.3390/machines12070474","_id":"12761"},{"date_created":"2025-05-12T08:32:01Z","publication_identifier":{"isbn":["978-3-662-70996-2"],"eissn":["2522-8587"],"issn":["2522-8579"]},"editor":[{"last_name":"Jasperneite","full_name":"Jasperneite, Jürgen","id":"1899","first_name":"Jürgen"},{"first_name":"Volker","id":"1804","full_name":"Lohweg, Volker","last_name":"Lohweg","orcid":"0000-0002-3325-7887"}],"date_updated":"2025-05-12T08:32:07Z","language":[{"iso":"ger"}],"keyword":["Industrielle Kommunikationstechnik","Industrielle Bildverarbeitung","Network reliability and redundancy methods","Networked Control Systems","Wireless real-time communication","Open Access"],"title":"Bildverarbeitung in der Automation: Ausgewählte Beiträge des Jahreskolloquiums BVAu 2024","citation":{"ieee":"J. Jasperneite and V. Lohweg, Eds., <i>Bildverarbeitung in der Automation: Ausgewählte Beiträge des Jahreskolloquiums BVAu 2024</i>, vol. 19. Berlin, Heidelberg: Springer Berlin Heidelberg, 2024.","ama":"Jasperneite J, Lohweg V, eds. <i>Bildverarbeitung in der Automation: Ausgewählte Beiträge des Jahreskolloquiums BVAu 2024</i>. Vol 19. Springer Berlin Heidelberg; 2024.","apa":"Jasperneite, J., &#38; Lohweg, V. (Eds.). (2024). <i>Bildverarbeitung in der Automation: Ausgewählte Beiträge des Jahreskolloquiums BVAu 2024</i> (Vol. 19). Springer Berlin Heidelberg.","chicago":"Jasperneite, Jürgen, and Volker Lohweg, eds. <i>Bildverarbeitung in der Automation: Ausgewählte Beiträge des Jahreskolloquiums BVAu 2024</i>. Vol. 19. Technologien für die intelligente Automation. Berlin, Heidelberg: Springer Berlin Heidelberg, 2024.","van":"Jasperneite J, Lohweg V, editors. Bildverarbeitung in der Automation: Ausgewählte Beiträge des Jahreskolloquiums BVAu 2024. Berlin, Heidelberg: Springer Berlin Heidelberg; 2024. 63 p. (Technologien für die intelligente Automation; vol. 19).","ufg":"<i>Jasperneite, Jürgen</i>/<i>Lohweg, Volker</i>: Bildverarbeitung in der Automation: Ausgewählte Beiträge des Jahreskolloquiums BVAu 2024, Bd. 19, Berlin, Heidelberg 2024 (Technologien für die intelligente Automation).","bjps":"<b>Jasperneite J and Lohweg V (eds)</b> (2024) <i>Bildverarbeitung in der Automation: Ausgewählte Beiträge des Jahreskolloquiums BVAu 2024</i>. Berlin, Heidelberg: Springer Berlin Heidelberg.","mla":"Jasperneite, Jürgen, and Volker Lohweg, editors. <i>Bildverarbeitung in der Automation: Ausgewählte Beiträge des Jahreskolloquiums BVAu 2024</i>. Springer Berlin Heidelberg, 2024.","havard":"J. Jasperneite, V. Lohweg, eds., Bildverarbeitung in der Automation: Ausgewählte Beiträge des Jahreskolloquiums BVAu 2024, Springer Berlin Heidelberg, Berlin, Heidelberg, 2024.","short":"J. Jasperneite, V. Lohweg, eds., Bildverarbeitung in der Automation: Ausgewählte Beiträge des Jahreskolloquiums BVAu 2024, Springer Berlin Heidelberg, Berlin, Heidelberg, 2024.","din1505-2-1":"<span style=\"font-variant:small-caps;\">Jasperneite, J.</span> ; <span style=\"font-variant:small-caps;\">Lohweg, V.</span> (Hrsg.): <i>Bildverarbeitung in der Automation: Ausgewählte Beiträge des Jahreskolloquiums BVAu 2024</i>, <i>Technologien für die intelligente Automation</i>. Bd. 19. Berlin, Heidelberg : Springer Berlin Heidelberg, 2024","chicago-de":"Jasperneite, Jürgen und Volker Lohweg, Hrsg. 2024. <i>Bildverarbeitung in der Automation: Ausgewählte Beiträge des Jahreskolloquiums BVAu 2024</i>. Bd. 19. Technologien für die intelligente Automation. Berlin, Heidelberg: Springer Berlin Heidelberg."},"volume":19,"year":"2024","page":"63","status":"public","type":"book_editor","intvolume":"        19","user_id":"83781","_id":"12908","place":"Berlin, Heidelberg","series_title":"Technologien für die intelligente Automation","publication_status":"published","abstract":[{"lang":"eng","text":"In diesem Open-Access-Tagungsband sind die besten Beiträge des 9. Jahreskolloquiums \"Bildverarbeitung in der Automation\" (BVAu 2024) enthalten. Das Kolloquium fand am 05. November 2024 auf dem Innovation Campus Lemgo statt. Die vorgestellten neuesten Forschungsergebnisse auf den Gebieten der industriellen Bildverarbeitung erweitern den aktuellen Stand der Forschung und Technik. Die in den Beiträgen enthaltenen anschaulichen Anwendungsbeispiele aus dem Bereich der Automation setzen die Ergebnisse in den direkten Anwendungsbezug."}],"department":[{"_id":"DEP5023"}],"conference":{"start_date":"2024-11-05","end_date":"2024-11-05","location":"Lemgo","name":"9. Jahreskolloquiums \"Bildverarbeitung in der Automation\" (BVAu 2020)"},"publisher":"Springer Berlin Heidelberg"},{"type":"scientific_journal_article","intvolume":"       150","user_id":"83781","has_accepted_license":"1","_id":"11348","doi":"10.1016/j.microrel.2023.115216","article_number":"115216","place":"Amsterdam","isi":"1","publication_status":"published","article_type":"original","abstract":[{"text":"Lifetime is an important feature defining the reliability of electrical connectors. In general practice, the lifetime tests required for reliability estimation are time and labor intensive. In our previous work, a data driven method using a statistical process, with an application of probability distributions such as standard normal distribution and generalized extreme value (GEV) distribution with negative skewness to predict degradation paths, was introduced for estimation of the lifetime and FIT rate with the help of electrical contact resistance data collected from short term tests. The proposed method proved its significance by showing the possibility of drastic reduction in the lifetime test duration required for reliability determination. In this work, a non-parametric distribution free method using percentiles of actual measured contact resistances is used for determining the lifetime as against the percentiles of probability distribution used in previous work, thereby simplifying the process further and leading to an even more precise estimation. The lifetimes calculated from parametric and non-parametric methods are compared to highlight the significance of distribution free method in reliability estimation.","lang":"eng"}],"department":[{"_id":"DEP6012"}],"publisher":"Elsevier ","publication":"Microelectronics Reliability","publication_identifier":{"unknown":["1872-941X"],"issn":["0026-2714"]},"date_created":"2024-04-18T08:55:38Z","date_updated":"2025-06-26T07:51:25Z","keyword":["Electrical and Electronic Engineering","Surfaces","Coatings and Films","Safety","Risk","Reliability and Quality","Condensed Matter Physics","Atomic and Molecular Physics","and Optics","Electronic","Optical and Magnetic Materials"],"language":[{"iso":"eng"}],"title":"Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests","citation":{"ama":"Shukla AR, Martin R, Probst R, Song J. Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests. <i>Microelectronics Reliability</i>. 2023;150. doi:<a href=\"https://doi.org/10.1016/j.microrel.2023.115216\">10.1016/j.microrel.2023.115216</a>","ieee":"A. R. Shukla, R. Martin, R. Probst, and J. Song, “Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests,” <i>Microelectronics Reliability</i>, vol. 150, Art. no. 115216, 2023, doi: <a href=\"https://doi.org/10.1016/j.microrel.2023.115216\">10.1016/j.microrel.2023.115216</a>.","short":"A.R. Shukla, R. Martin, R. Probst, J. Song, Microelectronics Reliability 150 (2023).","chicago-de":"Shukla, Abhay Rammurti, Robert Martin, Roman Probst und Jian Song. 2023. Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests. <i>Microelectronics Reliability</i> 150. doi:<a href=\"https://doi.org/10.1016/j.microrel.2023.115216\">10.1016/j.microrel.2023.115216</a>, .","din1505-2-1":"<span style=\"font-variant:small-caps;\">Shukla, Abhay Rammurti</span> ; <span style=\"font-variant:small-caps;\">Martin, Robert</span> ; <span style=\"font-variant:small-caps;\">Probst, Roman</span> ; <span style=\"font-variant:small-caps;\">Song, Jian</span>: Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests. In: <i>Microelectronics Reliability</i> Bd. 150. Amsterdam, Elsevier  (2023)","van":"Shukla AR, Martin R, Probst R, Song J. Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests. Microelectronics Reliability. 2023;150.","ufg":"<b>Shukla, Abhay Rammurti u. a.</b>: Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests, in: <i>Microelectronics Reliability</i> 150 (2023).","bjps":"<b>Shukla AR <i>et al.</i></b> (2023) Comparison of Different Statistical Methods for Prediction of Lifetime of Electrical Connectors with Short Term Tests. <i>Microelectronics Reliability</i> <b>150</b>.","havard":"A.R. Shukla, R. Martin, R. Probst, J. Song, Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests, Microelectronics Reliability. 150 (2023).","mla":"Shukla, Abhay Rammurti, et al. “Comparison of Different Statistical Methods for Prediction of Lifetime of Electrical Connectors with Short Term Tests.” <i>Microelectronics Reliability</i>, vol. 150, 115216, 2023, <a href=\"https://doi.org/10.1016/j.microrel.2023.115216\">https://doi.org/10.1016/j.microrel.2023.115216</a>.","apa":"Shukla, A. R., Martin, R., Probst, R., &#38; Song, J. (2023). Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests. <i>Microelectronics Reliability</i>, <i>150</i>, Article 115216. <a href=\"https://doi.org/10.1016/j.microrel.2023.115216\">https://doi.org/10.1016/j.microrel.2023.115216</a>","chicago":"Shukla, Abhay Rammurti, Robert Martin, Roman Probst, and Jian Song. “Comparison of Different Statistical Methods for Prediction of Lifetime of Electrical Connectors with Short Term Tests.” <i>Microelectronics Reliability</i> 150 (2023). <a href=\"https://doi.org/10.1016/j.microrel.2023.115216\">https://doi.org/10.1016/j.microrel.2023.115216</a>."},"volume":150,"external_id":{"isi":["001106942700001"]},"author":[{"last_name":"Shukla","full_name":"Shukla, Abhay Rammurti","first_name":"Abhay Rammurti","id":"74188"},{"first_name":"Robert","full_name":"Martin, Robert","last_name":"Martin"},{"first_name":"Roman","full_name":"Probst, Roman","id":"69156","last_name":"Probst"},{"first_name":"Jian","last_name":"Song","full_name":"Song, Jian","id":"5297"}],"year":"2023","status":"public"},{"series_title":"Electrical Contacts-IEEE Holm Conference on Electrical Contacts","publication_status":"published","conference":{"start_date":"2023-10-04","end_date":"2023-10-11","name":"68th Holm Conference on Electrical Contacts (HOLM)","location":"Seattle"},"abstract":[{"lang":"eng","text":"The state of health and lifetime estimation process of electrical connectors via lifetime tests is a time and labor intensive process. In our previous work, a correlation between the contact resistance developments in the early stages of lifetime tests of electrical connectors with the final results was established using a data driven statistical process based on probability distribution. Also, state of health indicators for prognosis of lifetime were introduced. In this work, the state of health indicators have been optimized. The sensitivity analysis is performed with regards to the selection of the appropriate amount of test data based on test duration for the reliable prognosis of the state of health and the characteristic lifetime. Through this the possibility of further reduction of test duration required for the reliable prognosis of state of health is investigated. Based on the results of analysis, a guideline for the determination of the duration of lifetime tests which lead to a reliable prediction of lifetime of connectors can be provided. Also, an assessment of the state of art in the prognosis of the lifetime of electrical connectors has been presented."}],"publisher":"IEEE","type":"conference_editor_article","user_id":"83781","place":"[Piscataway, NJ]","doi":"10.1109/holm56075.2023.10352279","_id":"11360","title":"Advances in Evaluation of State of Health of Electrical Connectors","citation":{"apa":"Song, J., Shukla, A. R., &#38; Probst, R. (2023). Advances in Evaluation of State of Health of Electrical Connectors. In <i>2023 IEEE 68th Holm Conference on Electrical Contacts (HOLM)</i> (pp. 200–208). IEEE. <a href=\"https://doi.org/10.1109/holm56075.2023.10352279\">https://doi.org/10.1109/holm56075.2023.10352279</a>","chicago":"Song, Jian, Abhay Rammurti Shukla, and Roman Probst. <i>Advances in Evaluation of State of Health of Electrical Connectors</i>. <i>2023 IEEE 68th Holm Conference on Electrical Contacts (HOLM)</i>. Electrical Contacts-IEEE Holm Conference on Electrical Contacts. [Piscataway, NJ]: IEEE, 2023. <a href=\"https://doi.org/10.1109/holm56075.2023.10352279\">https://doi.org/10.1109/holm56075.2023.10352279</a>.","van":"Song J, Shukla AR, Probst R. Advances in Evaluation of State of Health of Electrical Connectors. 2023 IEEE 68th Holm Conference on Electrical Contacts (HOLM). [Piscataway, NJ]: IEEE; 2023. (Electrical Contacts-IEEE Holm Conference on Electrical Contacts).","ufg":"<b>Song, Jian/Shukla, Abhay Rammurti/Probst, Roman</b>: Advances in Evaluation of State of Health of Electrical Connectors, [Piscataway, NJ] 2023 (Electrical Contacts-IEEE Holm Conference on Electrical Contacts).","havard":"J. Song, A.R. Shukla, R. Probst, Advances in Evaluation of State of Health of Electrical Connectors, IEEE, [Piscataway, NJ], 2023.","bjps":"<b>Song J, Shukla AR and Probst R</b> (2023) <i>Advances in Evaluation of State of Health of Electrical Connectors</i>. [Piscataway, NJ]: IEEE.","mla":"Song, Jian, et al. “Advances in Evaluation of State of Health of Electrical Connectors.” <i>2023 IEEE 68th Holm Conference on Electrical Contacts (HOLM)</i>, IEEE, 2023, pp. 200–08, <a href=\"https://doi.org/10.1109/holm56075.2023.10352279\">https://doi.org/10.1109/holm56075.2023.10352279</a>.","short":"J. Song, A.R. Shukla, R. Probst, Advances in Evaluation of State of Health of Electrical Connectors, IEEE, [Piscataway, NJ], 2023.","chicago-de":"Song, Jian, Abhay Rammurti Shukla und Roman Probst. 2023. <i>Advances in Evaluation of State of Health of Electrical Connectors</i>. <i>2023 IEEE 68th Holm Conference on Electrical Contacts (HOLM)</i>. Electrical Contacts-IEEE Holm Conference on Electrical Contacts. [Piscataway, NJ]: IEEE. doi:<a href=\"https://doi.org/10.1109/holm56075.2023.10352279\">10.1109/holm56075.2023.10352279</a>, .","din1505-2-1":"<span style=\"font-variant:small-caps;\">Song, Jian</span> ; <span style=\"font-variant:small-caps;\">Shukla, Abhay Rammurti</span> ; <span style=\"font-variant:small-caps;\">Probst, Roman</span>: <i>Advances in Evaluation of State of Health of Electrical Connectors</i>, <i>Electrical Contacts-IEEE Holm Conference on Electrical Contacts</i>. [Piscataway, NJ] : IEEE, 2023","ieee":"J. Song, A. R. Shukla, and R. Probst, <i>Advances in Evaluation of State of Health of Electrical Connectors</i>. [Piscataway, NJ]: IEEE, 2023, pp. 200–208. doi: <a href=\"https://doi.org/10.1109/holm56075.2023.10352279\">10.1109/holm56075.2023.10352279</a>.","ama":"Song J, Shukla AR, Probst R. <i>Advances in Evaluation of State of Health of Electrical Connectors</i>. IEEE; 2023:200-208. doi:<a href=\"https://doi.org/10.1109/holm56075.2023.10352279\">10.1109/holm56075.2023.10352279</a>"},"author":[{"full_name":"Song, Jian","last_name":"Song","id":"5297","first_name":"Jian"},{"id":"74188","first_name":"Abhay Rammurti","last_name":"Shukla","full_name":"Shukla, Abhay Rammurti"},{"first_name":"Roman","id":"69156","full_name":"Probst, Roman","last_name":"Probst"}],"year":"2023","page":"200-208","status":"public","date_created":"2024-04-18T10:11:50Z","publication":"2023 IEEE 68th Holm Conference on Electrical Contacts (HOLM)","publication_identifier":{"isbn":["979‐8‐3503‐4244‐4"],"eissn":["2158‐9992"],"eisbn":["979‐8‐3503‐4246‐8","979‐8‐3503‐4245‐1 "],"issn":["2158-9992"]},"date_updated":"2025-06-26T07:54:50Z","language":[{"iso":"eng"}],"keyword":["accelerated life testing","test duration","contact resistance","statistical model","connector reliability"]},{"date_created":"2022-12-11T13:50:30Z","publication":"Electrical contacts - 2022 : proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts","publication_identifier":{"isbn":["978-1-6654-5966-2","978-1-6654-5967-9"],"issn":["2158-9992"],"eisbn":["978-1-6654-5965-5"]},"date_updated":"2024-08-05T08:01:22Z","language":[{"iso":"eng"}],"keyword":["Connectors","Correlation","Sensitivity analysis","Contact resistance","Lifetime estimation","Reliability","Electrical resistance measurement"],"title":"State of Health of Connectors – Early Indicators","citation":{"ama":"Song J, Shukla AR, Probst R. <i>State of Health of Connectors – Early Indicators</i>. IEEE; 2022:272-278. doi:<a href=\"https://doi.org/10.1109/HLM54538.2022.9969839\">10.1109/HLM54538.2022.9969839</a>","ieee":"J. Song, A. R. Shukla, and R. Probst, <i>State of Health of Connectors – Early Indicators</i>. Piscataway, NJ: IEEE, 2022, pp. 272–278. doi: <a href=\"https://doi.org/10.1109/HLM54538.2022.9969839\">10.1109/HLM54538.2022.9969839</a>.","short":"J. Song, A.R. Shukla, R. Probst, State of Health of Connectors – Early Indicators, IEEE, Piscataway, NJ, 2022.","din1505-2-1":"<span style=\"font-variant:small-caps;\">Song, Jian</span> ; <span style=\"font-variant:small-caps;\">Shukla, Abhay Rammurti</span> ; <span style=\"font-variant:small-caps;\">Probst, Roman</span>: <i>State of Health of Connectors – Early Indicators</i>. Piscataway, NJ : IEEE, 2022","chicago-de":"Song, Jian, Abhay Rammurti Shukla und Roman Probst. 2022. <i>State of Health of Connectors – Early Indicators</i>. <i>Electrical contacts - 2022 : proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts</i>. Piscataway, NJ: IEEE. doi:<a href=\"https://doi.org/10.1109/HLM54538.2022.9969839\">10.1109/HLM54538.2022.9969839</a>, .","van":"Song J, Shukla AR, Probst R. State of Health of Connectors – Early Indicators. Electrical contacts - 2022 : proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts. Piscataway, NJ: IEEE; 2022.","ufg":"<b>Song, Jian/Shukla, Abhay Rammurti/Probst, Roman</b>: State of Health of Connectors – Early Indicators, Piscataway, NJ 2022.","bjps":"<b>Song J, Shukla AR and Probst R</b> (2022) <i>State of Health of Connectors – Early Indicators</i>. Piscataway, NJ: IEEE.","havard":"J. Song, A.R. Shukla, R. Probst, State of Health of Connectors – Early Indicators, IEEE, Piscataway, NJ, 2022.","mla":"Song, Jian, et al. “State of Health of Connectors – Early Indicators.” <i>Electrical Contacts - 2022 : Proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts</i>, IEEE, 2022, pp. 272–78, <a href=\"https://doi.org/10.1109/HLM54538.2022.9969839\">https://doi.org/10.1109/HLM54538.2022.9969839</a>.","apa":"Song, J., Shukla, A. R., &#38; Probst, R. (2022). State of Health of Connectors – Early Indicators. In <i>Electrical contacts - 2022 : proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts</i> (pp. 272–278). IEEE. <a href=\"https://doi.org/10.1109/HLM54538.2022.9969839\">https://doi.org/10.1109/HLM54538.2022.9969839</a>","chicago":"Song, Jian, Abhay Rammurti Shukla, and Roman Probst. <i>State of Health of Connectors – Early Indicators</i>. <i>Electrical Contacts - 2022 : Proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts</i>. Piscataway, NJ: IEEE, 2022. <a href=\"https://doi.org/10.1109/HLM54538.2022.9969839\">https://doi.org/10.1109/HLM54538.2022.9969839</a>."},"year":"2022","author":[{"id":"5297","last_name":"Song","full_name":"Song, Jian","first_name":"Jian"},{"id":"72757","full_name":"Shukla, Abhay Rammurti","first_name":"Abhay Rammurti","last_name":"Shukla"},{"first_name":"Roman","id":"69156","full_name":"Probst, Roman","last_name":"Probst"}],"page":"272 - 278","status":"public","type":"conference_editor_article","user_id":"83781","place":"Piscataway, NJ","doi":"10.1109/HLM54538.2022.9969839","_id":"9211","publication_status":"published","department":[{"_id":"DEP6012"}],"conference":{"location":"Tampa, FL, USA","name":"67th Holm Conference on Electrical Contacts","end_date":"2022-10-26","start_date":"2022-10-23"},"abstract":[{"text":"Lifetime tests of connectors are time consuming and labor intensive. Our study reveals a strong correlation between the statistical characteristics of contact resistance development in the early stages of lifetime tests and the final results of the tests. This correlation enables a further time lapse of lifetime tests and the prediction of the state of the health of connectors which can be utilized in the development of diagnostic strategy in sophisticated networks with very high number of connectors as well as in a quick classification of connectors with respect to their design features. Methods of statistical evaluation are introduced and the sensitivity analyses of different characteristics for the state of health of connectors are conducted.","lang":"eng"}],"publisher":"IEEE"},{"year":"2022","page":"329","status":"public","title":"Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2020","volume":14,"citation":{"short":"J. Jasperneite, V. Lohweg, eds., Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2020, Springer Berlin Heidelberg, Berlin, Heidelberg, 2022.","din1505-2-1":"<span style=\"font-variant:small-caps;\">Jasperneite, J.</span> ; <span style=\"font-variant:small-caps;\">Lohweg, V.</span> (Hrsg.): <i>Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2020</i>, <i>Technologien für die intelligente Automation</i>. Bd. 14. Berlin, Heidelberg : Springer Berlin Heidelberg, 2022","chicago-de":"Jasperneite, Jürgen und Volker Lohweg, Hrsg. 2022. <i>Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2020</i>. Bd. 14. Technologien für die intelligente Automation. Berlin, Heidelberg: Springer Berlin Heidelberg. doi:<a href=\"https://doi.org/10.1007/978-3-662-64283-2\">10.1007/978-3-662-64283-2</a>, .","van":"Jasperneite J, Lohweg V, editors. Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2020. Berlin, Heidelberg: Springer Berlin Heidelberg; 2022. 329 p. (Technologien für die intelligente Automation; vol. 14).","ama":"Jasperneite J, Lohweg V, eds. <i>Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2020</i>. Vol 14. Springer Berlin Heidelberg; 2022. doi:<a href=\"https://doi.org/10.1007/978-3-662-64283-2\">10.1007/978-3-662-64283-2</a>","ufg":"<i>Jasperneite, Jürgen</i>/<i>Lohweg, Volker</i>: Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2020, Bd. 14, Berlin, Heidelberg 2022 (Technologien für die intelligente Automation).","bjps":"<b>Jasperneite J and Lohweg V (eds)</b> (2022) <i>Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2020</i>. Berlin, Heidelberg: Springer Berlin Heidelberg.","havard":"J. Jasperneite, V. Lohweg, eds., Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2020, Springer Berlin Heidelberg, Berlin, Heidelberg, 2022.","mla":"Jasperneite, Jürgen, and Volker Lohweg, editors. <i>Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2020</i>. Springer Berlin Heidelberg, 2022, <a href=\"https://doi.org/10.1007/978-3-662-64283-2\">https://doi.org/10.1007/978-3-662-64283-2</a>.","apa":"Jasperneite, J., &#38; Lohweg, V. (Eds.). (2022). <i>Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2020</i> (Vol. 14). Springer Berlin Heidelberg. <a href=\"https://doi.org/10.1007/978-3-662-64283-2\">https://doi.org/10.1007/978-3-662-64283-2</a>","ieee":"J. Jasperneite and V. Lohweg, Eds., <i>Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2020</i>, vol. 14. Berlin, Heidelberg: Springer Berlin Heidelberg, 2022. doi: <a href=\"https://doi.org/10.1007/978-3-662-64283-2\">10.1007/978-3-662-64283-2</a>.","chicago":"Jasperneite, Jürgen, and Volker Lohweg, eds. <i>Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2020</i>. Vol. 14. Technologien für die intelligente Automation. Berlin, Heidelberg: Springer Berlin Heidelberg, 2022. <a href=\"https://doi.org/10.1007/978-3-662-64283-2\">https://doi.org/10.1007/978-3-662-64283-2</a>."},"language":[{"iso":"ger"}],"keyword":["Industrielle Kommunikationstechnik","Industrielle Bildverarbeitung","Network reliability and redundancy methods","Networked Control Systems","Wireless real-time communication","Open Access"],"date_created":"2025-05-12T08:22:49Z","publication_identifier":{"isbn":["978-3-662-64282-5"],"eissn":["2522-8587"],"eisbn":["978-3-662-64283-2"],"issn":["2522-8579"]},"date_updated":"2025-05-12T08:27:40Z","editor":[{"last_name":"Jasperneite","first_name":"Jürgen","full_name":"Jasperneite, Jürgen","id":"1899"},{"full_name":"Lohweg, Volker","first_name":"Volker","last_name":"Lohweg","id":"1804","orcid":"0000-0002-3325-7887"}],"conference":{"end_date":"2020-10-29","start_date":"2020-10-28","name":"11. Jahreskolloquiums \"Kommunikation in der Automation\" (KommA 2020) / 7. Jahreskolloquiums \"Bildverarbeitung in der Automation\" (BVAu 2020)","location":"Lemgo"},"department":[{"_id":"DEP5023"}],"abstract":[{"lang":"eng","text":"In diesem Open Access-Tagungsband sind die besten Beiträge des 11. Jahreskolloquiums \"Kommunikation in der Automation\" (KommA 2020) und des 7. Jahreskolloquiums \"Bildverarbeitung in der Automation\" (BVAu 2020) enthalten. Die Kolloquien fanden am 28. und 29. Oktober 2020 statt und wurden erstmalig als digitale Webveranstaltung auf dem Innovation Campus Lemgo organisiert.\r\nDie vorgestellten neuesten Forschungsergebnisse auf den Gebieten der industriellen Kommunikationstechnik und Bildverarbeitung erweitern den aktuellen Stand der Forschung und Technik. Die in den Beiträgen enthaltenen anschauliche Anwendungsbeispiele aus dem Bereich der Automation setzen die Ergebnisse in den direkten Anwendungsbezug."}],"publisher":"Springer Berlin Heidelberg","series_title":"Technologien für die intelligente Automation","publication_status":"published","place":"Berlin, Heidelberg","doi":"10.1007/978-3-662-64283-2","_id":"12907","type":"book_editor","user_id":"83781","intvolume":"        14"},{"publisher":"Elsevier","abstract":[{"lang":"eng","text":"The real and effective ground of all new concepts dedicated to the current advanced factories, as well as to the future digital ones, is close cooperativity of scattered applications in highly heterogeneous systems. Communication is the key enabling component, and all new approaches are inspired in practice to the demanding characteristics of industrial networks. These kinds of computer networks, together with new technologies derived from distant application fields, are the main technological means to accelerate the fast evolution of modern factory systems. Due to various communication requirements coming from the plurality of structures, components and application contexts, communication subsystems must be increasingly heterogeneous. Let us say clearly: this evolution cannot be stopped at this stage, no special universal solution is possible, and thinking about monogamous networking is a kind of dreamland. This paper is an analysis of the state of the art in the matter of heterogeneous networking in industry. It deeply investigates both wired and wireless technologies from the point of view of technological aspects and relevant key performance indicators, such as those related to dependability, and it contains a prospective estimation of future trends."}],"issue":"Febr. 2021","department":[{"_id":"DEP5023"}],"publication_status":"published","_id":"4899","article_number":"103388","doi":"10.1016/j.compind.2020.103388","intvolume":"       125","user_id":"15514","type":"journal_article","status":"public","author":[{"last_name":"Scanzio","first_name":"Stefano","full_name":"Scanzio, Stefano"},{"first_name":"Lukasz","last_name":"Wisniewski","full_name":"Wisniewski, Lukasz","id":"1710"},{"last_name":"Gaj","full_name":"Gaj, Piotr","first_name":"Piotr"}],"year":2021,"citation":{"chicago-de":"Scanzio, Stefano, Lukasz Wisniewski und Piotr Gaj. 2021. Heterogeneous and Dependable Networks in Industry - a Survey. <i>Journal Computers in Industry</i> 125, Nr. Febr. 2021. doi:<a href=\"https://doi.org/10.1016/j.compind.2020.103388,\">10.1016/j.compind.2020.103388,</a> .","din1505-2-1":"<span style=\"font-variant:small-caps;\">Scanzio, Stefano</span> ; <span style=\"font-variant:small-caps;\">Wisniewski, Lukasz</span> ; <span style=\"font-variant:small-caps;\">Gaj, Piotr</span>: Heterogeneous and Dependable Networks in Industry - a Survey. In: <i>Journal Computers in Industry</i> Bd. 125, Elsevier (2021), Nr. Febr. 2021","short":"S. Scanzio, L. Wisniewski, P. Gaj, Journal Computers in Industry 125 (2021).","chicago":"Scanzio, Stefano, Lukasz Wisniewski, and Piotr Gaj. “Heterogeneous and Dependable Networks in Industry - a Survey.” <i>Journal Computers in Industry</i> 125, no. Febr. 2021 (2021). <a href=\"https://doi.org/10.1016/j.compind.2020.103388\">https://doi.org/10.1016/j.compind.2020.103388</a>.","apa":"Scanzio, S., Wisniewski, L., &#38; Gaj, P. (2021). Heterogeneous and Dependable Networks in Industry - a Survey. <i>Journal Computers in Industry</i>, <i>125</i>(Febr. 2021). <a href=\"https://doi.org/10.1016/j.compind.2020.103388\">https://doi.org/10.1016/j.compind.2020.103388</a>","bjps":"<b>Scanzio S, Wisniewski L and Gaj P</b> (2021) Heterogeneous and Dependable Networks in Industry - a Survey. <i>Journal Computers in Industry</i> <b>125</b>.","havard":"S. Scanzio, L. Wisniewski, P. Gaj, Heterogeneous and Dependable Networks in Industry - a Survey, Journal Computers in Industry. 125 (2021).","mla":"Scanzio, Stefano, et al. “Heterogeneous and Dependable Networks in Industry - a Survey.” <i>Journal Computers in Industry</i>, vol. 125, no. Febr. 2021, 103388, Elsevier, 2021, doi:<a href=\"https://doi.org/10.1016/j.compind.2020.103388\">10.1016/j.compind.2020.103388</a>.","ufg":"<b>Scanzio, Stefano et. al. (2021)</b>: Heterogeneous and Dependable Networks in Industry - a Survey, in: <i>Journal Computers in Industry</i> <i>125</i> (<i>Febr. 2021</i>).","van":"Scanzio S, Wisniewski L, Gaj P. Heterogeneous and Dependable Networks in Industry - a Survey. Journal Computers in Industry. 2021;125(Febr. 2021).","ieee":"S. Scanzio, L. Wisniewski, and P. Gaj, “Heterogeneous and Dependable Networks in Industry - a Survey,” <i>Journal Computers in Industry</i>, vol. 125, no. Febr. 2021, 2021.","ama":"Scanzio S, Wisniewski L, Gaj P. Heterogeneous and Dependable Networks in Industry - a Survey. <i>Journal Computers in Industry</i>. 2021;125(Febr. 2021). doi:<a href=\"https://doi.org/10.1016/j.compind.2020.103388\">10.1016/j.compind.2020.103388</a>"},"volume":125,"title":"Heterogeneous and Dependable Networks in Industry - a Survey","keyword":["Industrial networks","Heterogeneity","Dependability","Interoperability","Real-time","Reliability","Ethernet","Wireless","Wi-Fi","WSAN","SDN","TSN","5G","CPS","IIoT","I4.0"],"language":[{"iso":"eng"}],"date_updated":"2023-03-15T13:49:56Z","publication":"Journal Computers in Industry","publication_identifier":{"eissn":["0166-3615"]},"date_created":"2021-02-05T10:11:22Z"},{"department":[{"_id":"DEP5023"},{"_id":"DEP5019"}],"conference":{"end_date":"20218-11-21","start_date":"2018-11-20","location":"Lemgo","name":"9. Jahreskolloquiums \"Kommunikation in der Automation\" (KommA 2018) / 6. Jahreskolloquiums \"Bildverarbeitung in der Automation\" (BVAu 2018)"},"abstract":[{"lang":"ger","text":"In diesem Open-Access-Tagungsband sind die besten Beiträge des 9. Jahreskolloquiums \"Kommunikation in der Automation\" (KommA 2018) und des 6. Jahreskolloquiums \"Bildverarbeitung in der Automation\" (BVAu 2018) enthalten. Die Kolloquien fanden am 20. und 21. November 2018 in der SmartFactoryOWL, einer gemeinsamen Einrichtung des Fraunhofer IOSB-INA und der Technischen Hochschule Ostwestfalen-Lippe statt.\r\nDie vorgestellten neuesten Forschungsergebnisse auf den Gebieten der industriellen Kommunikationstechnik und Bildverarbeitung erweitern den aktuellen Stand der Forschung und Technik. Die in den Beiträgen enthaltenen anschaulichen Beispiele aus dem Bereich der Automation setzen die Ergebnisse in den direkten Anwendungsbezug."}],"publisher":"Springer Vieweg","series_title":" Technologien für die intelligente Automation","publication_status":"published","place":"Berlin, Heidelberg","doi":"https://doi.org/10.1007/978-3-662-59895-5","_id":"4851","type":"book_editor","user_id":"83781","intvolume":"        12","year":"2020","main_file_link":[{"open_access":"1","url":"https://link.springer.com/book/10.1007/978-3-662-59895-5?page=2#about"}],"page":"364","status":"public","title":"Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2018","citation":{"ama":"Jasperneite J, Lohweg V, eds. <i>Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2018</i>. Vol 12. Springer Vieweg; 2020. doi:<a href=\"https://doi.org/10.1007/978-3-662-59895-5\">https://doi.org/10.1007/978-3-662-59895-5</a>","ieee":"J. Jasperneite and V. Lohweg, Eds., <i>Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2018</i>, vol. 12. Berlin, Heidelberg: Springer Vieweg, 2020. doi: <a href=\"https://doi.org/10.1007/978-3-662-59895-5\">https://doi.org/10.1007/978-3-662-59895-5</a>.","chicago-de":"Jasperneite, Jürgen und Volker Lohweg, Hrsg. 2020. <i>Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2018</i>. Bd. 12.  Technologien für die intelligente Automation. Berlin, Heidelberg: Springer Vieweg. doi:<a href=\"https://doi.org/10.1007/978-3-662-59895-5\">https://doi.org/10.1007/978-3-662-59895-5</a>, .","din1505-2-1":"<span style=\"font-variant:small-caps;\">Jasperneite, J.</span> ; <span style=\"font-variant:small-caps;\">Lohweg, V.</span> (Hrsg.): <i>Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2018</i>, <i> Technologien für die intelligente Automation</i>. Bd. 12. Berlin, Heidelberg : Springer Vieweg, 2020","short":"J. Jasperneite, V. Lohweg, eds., Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2018, Springer Vieweg, Berlin, Heidelberg, 2020.","mla":"Jasperneite, Jürgen, and Volker Lohweg, editors. <i>Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2018</i>. Springer Vieweg, 2020, <a href=\"https://doi.org/10.1007/978-3-662-59895-5\">https://doi.org/10.1007/978-3-662-59895-5</a>.","havard":"J. Jasperneite, V. Lohweg, eds., Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2018, Springer Vieweg, Berlin, Heidelberg, 2020.","bjps":"<b>Jasperneite J and Lohweg V (eds)</b> (2020) <i>Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2018</i>. Berlin, Heidelberg: Springer Vieweg.","ufg":"<i>Jasperneite, Jürgen</i>/<i>Lohweg, Volker</i>: Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2018, Bd. 12, Berlin, Heidelberg 2020 ( Technologien für die intelligente Automation).","van":"Jasperneite J, Lohweg V, editors. Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2018. Berlin, Heidelberg: Springer Vieweg; 2020. 364 p. ( Technologien für die intelligente Automation; vol. 12).","chicago":"Jasperneite, Jürgen, and Volker Lohweg, eds. <i>Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2018</i>. Vol. 12.  Technologien für die intelligente Automation. Berlin, Heidelberg: Springer Vieweg, 2020. <a href=\"https://doi.org/10.1007/978-3-662-59895-5\">https://doi.org/10.1007/978-3-662-59895-5</a>.","apa":"Jasperneite, J., &#38; Lohweg, V. (Eds.). (2020). <i>Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2018</i> (Vol. 12). Springer Vieweg. <a href=\"https://doi.org/10.1007/978-3-662-59895-5\">https://doi.org/10.1007/978-3-662-59895-5</a>"},"volume":12,"oa":"1","language":[{"iso":"ger"}],"keyword":["Industrielle Kommunikationstechnik Industrielle Bildverarbeitung Network reliability and redundancy methods Networked Control Systems Wireless real-time communication Open Access quality control","reliability","safety and risk"],"date_created":"2021-02-02T13:12:47Z","publication_identifier":{"eissn":["2522-8587"],"isbn":["978-3-662-59894-8"],"issn":["2522-8579"],"eisbn":["978-3-662-59895-5"]},"date_updated":"2025-05-12T08:07:26Z","editor":[{"full_name":"Jasperneite, Jürgen","last_name":"Jasperneite","first_name":"Jürgen","id":"1899"},{"orcid":"0000-0002-3325-7887","first_name":"Volker","last_name":"Lohweg","id":"1804","full_name":"Lohweg, Volker"}]},{"status":"public","page":"295","year":"2017","volume":7,"citation":{"chicago":"Jasperneite, Jürgen, and Volker Lohweg, eds. <i> Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2016 zum 10jährigen Jubiläum des inIT - Institut für industrielle Informationstechnik</i>. Vol. 7. Technologien für die intelligente Automation . Berlin: Springer Vieweg, 2017. <a href=\"https://doi.org/10.1007/978-3-662-55232-2\">https://doi.org/10.1007/978-3-662-55232-2</a>.","ieee":"J. Jasperneite and V. Lohweg, Eds., <i> Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2016 zum 10jährigen Jubiläum des inIT - Institut für industrielle Informationstechnik</i>, vol. 7. Berlin: Springer Vieweg, 2017. doi: <a href=\"https://doi.org/10.1007/978-3-662-55232-2\">10.1007/978-3-662-55232-2</a>.","apa":"Jasperneite, J., &#38; Lohweg, V. (Eds.). (2017). <i> Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2016 zum 10jährigen Jubiläum des inIT - Institut für industrielle Informationstechnik</i> (Vol. 7). Springer Vieweg. <a href=\"https://doi.org/10.1007/978-3-662-55232-2\">https://doi.org/10.1007/978-3-662-55232-2</a>","havard":"J. Jasperneite, V. Lohweg, eds.,  Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2016 zum 10jährigen Jubiläum des inIT - Institut für industrielle Informationstechnik, Springer Vieweg, Berlin, 2017.","bjps":"<b>Jasperneite J and Lohweg V (eds)</b> (2017) <i> Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2016 zum 10jährigen Jubiläum des inIT - Institut für industrielle Informationstechnik</i>. Berlin: Springer Vieweg.","mla":"Jasperneite, Jürgen, and Volker Lohweg, editors. <i> Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2016 zum 10jährigen Jubiläum des inIT - Institut für industrielle Informationstechnik</i>. Springer Vieweg, 2017, <a href=\"https://doi.org/10.1007/978-3-662-55232-2\">https://doi.org/10.1007/978-3-662-55232-2</a>.","ufg":"<i>Jasperneite, Jürgen</i>/<i>Lohweg, Volker</i>:  Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2016 zum 10jährigen Jubiläum des inIT - Institut für industrielle Informationstechnik, Bd. 7, Berlin 2017 (Technologien für die intelligente Automation ).","ama":"Jasperneite J, Lohweg V, eds. <i> Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2016 zum 10jährigen Jubiläum des inIT - Institut für industrielle Informationstechnik</i>. Vol 7. Springer Vieweg; 2017. doi:<a href=\"https://doi.org/10.1007/978-3-662-55232-2\">10.1007/978-3-662-55232-2</a>","van":"Jasperneite J, Lohweg V, editors.  Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2016 zum 10jährigen Jubiläum des inIT - Institut für industrielle Informationstechnik. Berlin: Springer Vieweg; 2017. 295 p. (Technologien für die intelligente Automation ; vol. 7).","din1505-2-1":"<span style=\"font-variant:small-caps;\">Jasperneite, J.</span> ; <span style=\"font-variant:small-caps;\">Lohweg, V.</span> (Hrsg.): <i> Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2016 zum 10jährigen Jubiläum des inIT - Institut für industrielle Informationstechnik</i>, <i>Technologien für die intelligente Automation </i>. Bd. 7. Berlin : Springer Vieweg, 2017","chicago-de":"Jasperneite, Jürgen und Volker Lohweg, Hrsg. 2017. <i> Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2016 zum 10jährigen Jubiläum des inIT - Institut für industrielle Informationstechnik</i>. Bd. 7. Technologien für die intelligente Automation . Berlin: Springer Vieweg. doi:<a href=\"https://doi.org/10.1007/978-3-662-55232-2\">10.1007/978-3-662-55232-2</a>, .","short":"J. Jasperneite, V. Lohweg, eds.,  Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2016 zum 10jährigen Jubiläum des inIT - Institut für industrielle Informationstechnik, Springer Vieweg, Berlin, 2017."},"title":" Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2016 zum 10jährigen Jubiläum des inIT - Institut für industrielle Informationstechnik","keyword":["Industrielle Kommunikationstechnik","Industrielle Bildverarbeitung","network reliability and redundancy methods","Networked Controls Systems","wireless real-time communication","quality control","reliability","safety and risk"],"language":[{"iso":"ger"}],"editor":[{"full_name":"Jasperneite, Jürgen","first_name":"Jürgen","last_name":"Jasperneite","id":"1899"},{"first_name":"Volker","last_name":"Lohweg","id":"1804","full_name":"Lohweg, Volker","orcid":"0000-0002-3325-7887"}],"date_updated":"2025-05-12T08:19:51Z","publication_identifier":{"eisbn":["978-3-662-55232-2 "],"isbn":["978-3-662-55231-5"]},"date_created":"2021-01-22T08:40:04Z","publisher":"Springer Vieweg","abstract":[{"text":"In diesem Tagungsband sind die besten Beiträge des 7. Jahreskolloquiums \"Kommunikation in der Automation\" (KommA 2016) und des  5. Jahreskolloquiums \"Bildverarbeitung in der Automation\" (BVAu 2016) enthalten. Die Kolloquien fanden am 30. November und 1. Dezember 2016 anlässlich des 10jährigen Jubiläums des inIT - Institut für industrielle Informationstechnik in der SmartFactoryOWL, einer herstellerunabhängigen und offenen Industrie 4.0 Forschungs- und Demonstrationsplattform und zugleich Testfeld für den Mittelstand, in Lemgo statt.\r\nDie vorgestellten neuesten Forschungsergebnisse auf den Gebieten der industriellen Kommunikationstechnik und Bildverarbeitung erweitern den aktuellen Stand der Forschung und Technik. Die in den Beiträgen enthaltenen anschauliche Anwendungsbeispiele aus dem Bereich der Automation setzen die Ergebnisse in den direkten Anwendungsbezug.","lang":"ger"}],"conference":{"end_date":"2026-12-01","start_date":"2016-11-30","name":"7. Jahreskolloquiums \"Kommunikation in der Automation\" (KommA 2016)  /  5. Jahreskolloquiums \"Bildverarbeitung in der Automation\" (BVAu 2016)","location":"Lemgo"},"department":[{"_id":"DEP5023"}],"publication_status":"published","series_title":"Technologien für die intelligente Automation ","_id":"4506","doi":"10.1007/978-3-662-55232-2","place":"Berlin","intvolume":"         7","user_id":"83781","type":"book_editor"},{"date_updated":"2023-03-15T13:49:39Z","user_id":"45673","corporate_editor":["IEEE"],"date_created":"2019-12-04T09:30:15Z","type":"conference","publication":"18th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)","publication_identifier":{"eissn":["1946-0759 "],"isbn":["978-1-4799-0862-2"],"eisbn":["978-1-4799-0864-6"],"issn":["1946-0740 "]},"language":[{"iso":"eng"}],"place":"Cagliari, Italy","keyword":["Decision making","Robot sensing systems","Reliability","Production","Context","Fuzzy set theory","Data integration"],"doi":"10.1109/ETFA.2013.6647984","_id":"2141","publication_status":"published","citation":{"short":"U. Mönks, V. Lohweg, in: IEEE (Ed.), 18th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA), Cagliari, Italy, 2013.","chicago-de":"Mönks, Uwe und Volker Lohweg. 2013. Machine Conditioning by Importance Controlled Information Fusion. In: <i>18th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)</i>, hg. von IEEE. Cagliari, Italy. doi:<a href=\"https://doi.org/10.1109/ETFA.2013.6647984,\">10.1109/ETFA.2013.6647984,</a> .","din1505-2-1":"<span style=\"font-variant:small-caps;\">Mönks, Uwe</span> ; <span style=\"font-variant:small-caps;\">Lohweg, Volker</span>: Machine Conditioning by Importance Controlled Information Fusion. In: <span style=\"font-variant:small-caps;\">IEEE</span> (Hrsg.): <i>18th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)</i>. Cagliari, Italy, 2013","van":"Mönks U, Lohweg V. Machine Conditioning by Importance Controlled Information Fusion. In: IEEE, editor. 18th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA). Cagliari, Italy; 2013.","mla":"Mönks, Uwe, and Volker Lohweg. “Machine Conditioning by Importance Controlled Information Fusion.” <i>18th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)</i>, edited by IEEE, 2013, doi:<a href=\"https://doi.org/10.1109/ETFA.2013.6647984\">10.1109/ETFA.2013.6647984</a>.","havard":"U. Mönks, V. Lohweg, Machine Conditioning by Importance Controlled Information Fusion, in: IEEE (Ed.), 18th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA), Cagliari, Italy, 2013.","bjps":"<b>Mönks U and Lohweg V</b> (2013) Machine Conditioning by Importance Controlled Information Fusion. In IEEE (ed.), <i>18th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)</i>. Cagliari, Italy.","ufg":"<b>Mönks, Uwe/Lohweg, Volker (2013)</b>: Machine Conditioning by Importance Controlled Information Fusion, in: IEEE (Hg.): <i>18th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)</i>, Cagliari, Italy.","apa":"Mönks, U., &#38; Lohweg, V. (2013). Machine Conditioning by Importance Controlled Information Fusion. In IEEE (Ed.), <i>18th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)</i>. Cagliari, Italy. <a href=\"https://doi.org/10.1109/ETFA.2013.6647984\">https://doi.org/10.1109/ETFA.2013.6647984</a>","chicago":"Mönks, Uwe, and Volker Lohweg. “Machine Conditioning by Importance Controlled Information Fusion.” In <i>18th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)</i>, edited by IEEE. Cagliari, Italy, 2013. <a href=\"https://doi.org/10.1109/ETFA.2013.6647984\">https://doi.org/10.1109/ETFA.2013.6647984</a>.","ama":"Mönks U, Lohweg V. Machine Conditioning by Importance Controlled Information Fusion. In: IEEE, ed. <i>18th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)</i>. Cagliari, Italy; 2013. doi:<a href=\"https://doi.org/10.1109/ETFA.2013.6647984\">10.1109/ETFA.2013.6647984</a>","ieee":"U. Mönks and V. Lohweg, “Machine Conditioning by Importance Controlled Information Fusion,” in <i>18th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)</i>, 2013."},"title":"Machine Conditioning by Importance Controlled Information Fusion","status":"public","department":[{"_id":"DEP5023"}],"year":2013,"author":[{"full_name":"Mönks, Uwe","id":"1825","first_name":"Uwe","last_name":"Mönks"},{"orcid":"0000-0002-3325-7887","id":"1804","first_name":"Volker","full_name":"Lohweg, Volker","last_name":"Lohweg"}],"abstract":[{"lang":"eng","text":"Sensor and information fusion is recently a major topic which becomes important in machine diagnosis and conditioning for complex production machines and process engineering. It is a known fact that distributed automation systems have a major impact on signal processing and pattern recognition for machine diagnosis. Therefore, it is necessary to research and develop smart diagnosis methods which are applicable for distributed systems like resource-limited cyber-physical systems. In this paper we propose an new approach for sensor and information fusion based on Evidence Theory and socio-psychological decision-making. We show that context based condition monitoring is instantiated even in conflict situations, oc-curing in real life scenarios permanently. A simple but effective importance measure is proposed which controls the significance of conditioning propositions in a system."}]}]