---
_id: '12761'
abstract:
- lang: eng
  text: For modern machines, factories and electric and autonomous vehicles, the importance
    of vreliable electrical connectors cannot be overstated. With an increasing number
    of connectors being used in machines, factories and vehicles, ensuring their reliability
    is crucial for comfort and safety alike. One of the key indicators of reliability
    is the lifetime of connectors. To evaluate the lifetime of electrical connectors,
    a testing method and a model for calculating their lifetime based on the test
    data were developed. The results from these tests were compared to failure analysis
    data from long-term field operations. The findings indicate that the laboratory
    tests can accurately reproduce the main failures observed in the field. However,
    such lifetime tests can be time- and labor-intensive. To address this challenge,
    a data-driven method is proposed that predicts the lifetime of electrical connectors
    using statistical analysis of electrical contact resistance data collected from
    short-term tests. The predictions from this method were compared to actual results
    obtained from long-term tests. A strong correlation was observed between the contact
    resistance development in short-term tests and the number of failures in later
    stages of testing. Thus, apart from predicting the lifetime of connectors, this
    method can also be applied for failure prognosis in real-time operations.
author:
- first_name: Jian
  full_name: Song, Jian
  id: '5297'
  last_name: Song
- first_name: Abhay Rammurti
  full_name: Shukla, Abhay Rammurti
  id: '74188'
  last_name: Shukla
- first_name: Roman
  full_name: Probst, Roman
  id: '69156'
  last_name: Probst
citation:
  ama: Song J, Shukla AR, Probst R. The State of Health of Electrical Connectors.
    <i>Machines</i>. 2024;7(12):474. doi:<a href="https://doi.org/10.3390/machines12070474">https://doi.org/10.3390/machines12070474</a>
  apa: Song, J., Shukla, A. R., &#38; Probst, R. (2024). The State of Health of Electrical
    Connectors. <i>Machines</i>, <i>7</i>(12), 474. <a href="https://doi.org/10.3390/machines12070474">https://doi.org/10.3390/machines12070474</a>
  bjps: <b>Song J, Shukla AR and Probst R</b> (2024) The State of Health of Electrical
    Connectors. <i>Machines</i> <b>7</b>, 474.
  chicago: 'Song, Jian, Abhay Rammurti Shukla, and Roman Probst. “The State of Health
    of Electrical Connectors.” <i>Machines</i> 7, no. 12 (2024): 474. <a href="https://doi.org/10.3390/machines12070474">https://doi.org/10.3390/machines12070474</a>.'
  chicago-de: 'Song, Jian, Abhay Rammurti Shukla und Roman Probst. 2024. The State
    of Health of Electrical Connectors. <i>Machines</i> 7, Nr. 12: 474. doi:<a href="https://doi.org/10.3390/machines12070474">https://doi.org/10.3390/machines12070474</a>,
    .'
  din1505-2-1: '<span style="font-variant:small-caps;">Song, Jian</span> ; <span style="font-variant:small-caps;">Shukla,
    Abhay Rammurti</span> ; <span style="font-variant:small-caps;">Probst, Roman</span>:
    The State of Health of Electrical Connectors. In: <i>Machines</i> Bd. 7. Basel,
    MDPI (2024), Nr. 12, S. 474'
  havard: J. Song, A.R. Shukla, R. Probst, The State of Health of Electrical Connectors,
    Machines. 7 (2024) 474.
  ieee: 'J. Song, A. R. Shukla, and R. Probst, “The State of Health of Electrical
    Connectors,” <i>Machines</i>, vol. 7, no. 12, p. 474, 2024, doi: <a href="https://doi.org/10.3390/machines12070474">https://doi.org/10.3390/machines12070474</a>.'
  mla: Song, Jian, et al. “The State of Health of Electrical Connectors.” <i>Machines</i>,
    vol. 7, no. 12, 2024, p. 474, <a href="https://doi.org/10.3390/machines12070474">https://doi.org/10.3390/machines12070474</a>.
  short: J. Song, A.R. Shukla, R. Probst, Machines 7 (2024) 474.
  ufg: '<b>Song, Jian/Shukla, Abhay Rammurti/Probst, Roman</b>: The State of Health
    of Electrical Connectors, in: <i>Machines</i> 7 (2024), H. 12,  S. 474.'
  van: Song J, Shukla AR, Probst R. The State of Health of Electrical Connectors.
    Machines. 2024;7(12):474.
date_created: 2025-04-04T09:23:10Z
date_updated: 2025-06-25T13:03:28Z
department:
- _id: DEP6012
doi: https://doi.org/10.3390/machines12070474
external_id:
  isi:
  - '001277040200001'
intvolume: '         7'
isi: '1'
issue: '12'
keyword:
- electrical connectors
- accelerated life testing
- statistical model
- lifetime prognosis
- reliability
- state of health
language:
- iso: eng
page: '474'
place: Basel
publication: Machines
publication_identifier:
  eissn:
  - '2075-1702 '
publication_status: published
publisher: MDPI
quality_controlled: '1'
status: public
title: The State of Health of Electrical Connectors
type: scientific_journal_article
user_id: '83781'
volume: 7
year: '2024'
...
---
_id: '12908'
abstract:
- lang: eng
  text: In diesem Open-Access-Tagungsband sind die besten Beiträge des 9. Jahreskolloquiums
    "Bildverarbeitung in der Automation" (BVAu 2024) enthalten. Das Kolloquium fand
    am 05. November 2024 auf dem Innovation Campus Lemgo statt. Die vorgestellten
    neuesten Forschungsergebnisse auf den Gebieten der industriellen Bildverarbeitung
    erweitern den aktuellen Stand der Forschung und Technik. Die in den Beiträgen
    enthaltenen anschaulichen Anwendungsbeispiele aus dem Bereich der Automation setzen
    die Ergebnisse in den direkten Anwendungsbezug.
citation:
  ama: 'Jasperneite J, Lohweg V, eds. <i>Bildverarbeitung in der Automation: Ausgewählte
    Beiträge des Jahreskolloquiums BVAu 2024</i>. Vol 19. Springer Berlin Heidelberg;
    2024.'
  apa: 'Jasperneite, J., &#38; Lohweg, V. (Eds.). (2024). <i>Bildverarbeitung in der
    Automation: Ausgewählte Beiträge des Jahreskolloquiums BVAu 2024</i> (Vol. 19).
    Springer Berlin Heidelberg.'
  bjps: '<b>Jasperneite J and Lohweg V (eds)</b> (2024) <i>Bildverarbeitung in der
    Automation: Ausgewählte Beiträge des Jahreskolloquiums BVAu 2024</i>. Berlin,
    Heidelberg: Springer Berlin Heidelberg.'
  chicago: 'Jasperneite, Jürgen, and Volker Lohweg, eds. <i>Bildverarbeitung in der
    Automation: Ausgewählte Beiträge des Jahreskolloquiums BVAu 2024</i>. Vol. 19.
    Technologien für die intelligente Automation. Berlin, Heidelberg: Springer Berlin
    Heidelberg, 2024.'
  chicago-de: 'Jasperneite, Jürgen und Volker Lohweg, Hrsg. 2024. <i>Bildverarbeitung
    in der Automation: Ausgewählte Beiträge des Jahreskolloquiums BVAu 2024</i>. Bd.
    19. Technologien für die intelligente Automation. Berlin, Heidelberg: Springer
    Berlin Heidelberg.'
  din1505-2-1: '<span style="font-variant:small-caps;">Jasperneite, J.</span> ; <span
    style="font-variant:small-caps;">Lohweg, V.</span> (Hrsg.): <i>Bildverarbeitung
    in der Automation: Ausgewählte Beiträge des Jahreskolloquiums BVAu 2024</i>, <i>Technologien
    für die intelligente Automation</i>. Bd. 19. Berlin, Heidelberg : Springer Berlin
    Heidelberg, 2024'
  havard: 'J. Jasperneite, V. Lohweg, eds., Bildverarbeitung in der Automation: Ausgewählte
    Beiträge des Jahreskolloquiums BVAu 2024, Springer Berlin Heidelberg, Berlin,
    Heidelberg, 2024.'
  ieee: 'J. Jasperneite and V. Lohweg, Eds., <i>Bildverarbeitung in der Automation:
    Ausgewählte Beiträge des Jahreskolloquiums BVAu 2024</i>, vol. 19. Berlin, Heidelberg:
    Springer Berlin Heidelberg, 2024.'
  mla: 'Jasperneite, Jürgen, and Volker Lohweg, editors. <i>Bildverarbeitung in der
    Automation: Ausgewählte Beiträge des Jahreskolloquiums BVAu 2024</i>. Springer
    Berlin Heidelberg, 2024.'
  short: 'J. Jasperneite, V. Lohweg, eds., Bildverarbeitung in der Automation: Ausgewählte
    Beiträge des Jahreskolloquiums BVAu 2024, Springer Berlin Heidelberg, Berlin,
    Heidelberg, 2024.'
  ufg: '<i>Jasperneite, Jürgen</i>/<i>Lohweg, Volker</i>: Bildverarbeitung in der
    Automation: Ausgewählte Beiträge des Jahreskolloquiums BVAu 2024, Bd. 19, Berlin,
    Heidelberg 2024 (Technologien für die intelligente Automation).'
  van: 'Jasperneite J, Lohweg V, editors. Bildverarbeitung in der Automation: Ausgewählte
    Beiträge des Jahreskolloquiums BVAu 2024. Berlin, Heidelberg: Springer Berlin
    Heidelberg; 2024. 63 p. (Technologien für die intelligente Automation; vol. 19).'
conference:
  end_date: 2024-11-05
  location: Lemgo
  name: 9. Jahreskolloquiums "Bildverarbeitung in der Automation" (BVAu 2020)
  start_date: 2024-11-05
date_created: 2025-05-12T08:32:01Z
date_updated: 2025-05-12T08:32:07Z
department:
- _id: DEP5023
editor:
- first_name: Jürgen
  full_name: Jasperneite, Jürgen
  id: '1899'
  last_name: Jasperneite
- first_name: Volker
  full_name: Lohweg, Volker
  id: '1804'
  last_name: Lohweg
  orcid: 0000-0002-3325-7887
intvolume: '        19'
keyword:
- Industrielle Kommunikationstechnik
- Industrielle Bildverarbeitung
- Network reliability and redundancy methods
- Networked Control Systems
- Wireless real-time communication
- Open Access
language:
- iso: ger
page: '63'
place: Berlin, Heidelberg
publication_identifier:
  eissn:
  - 2522-8587
  isbn:
  - 978-3-662-70996-2
  issn:
  - 2522-8579
publication_status: published
publisher: Springer Berlin Heidelberg
series_title: Technologien für die intelligente Automation
status: public
title: 'Bildverarbeitung in der Automation: Ausgewählte Beiträge des Jahreskolloquiums
  BVAu 2024'
type: book_editor
user_id: '83781'
volume: 19
year: '2024'
...
---
_id: '11348'
abstract:
- lang: eng
  text: Lifetime is an important feature defining the reliability of electrical connectors.
    In general practice, the lifetime tests required for reliability estimation are
    time and labor intensive. In our previous work, a data driven method using a statistical
    process, with an application of probability distributions such as standard normal
    distribution and generalized extreme value (GEV) distribution with negative skewness
    to predict degradation paths, was introduced for estimation of the lifetime and
    FIT rate with the help of electrical contact resistance data collected from short
    term tests. The proposed method proved its significance by showing the possibility
    of drastic reduction in the lifetime test duration required for reliability determination.
    In this work, a non-parametric distribution free method using percentiles of actual
    measured contact resistances is used for determining the lifetime as against the
    percentiles of probability distribution used in previous work, thereby simplifying
    the process further and leading to an even more precise estimation. The lifetimes
    calculated from parametric and non-parametric methods are compared to highlight
    the significance of distribution free method in reliability estimation.
article_number: '115216'
article_type: original
author:
- first_name: Abhay Rammurti
  full_name: Shukla, Abhay Rammurti
  id: '74188'
  last_name: Shukla
- first_name: Robert
  full_name: Martin, Robert
  last_name: Martin
- first_name: Roman
  full_name: Probst, Roman
  id: '69156'
  last_name: Probst
- first_name: Jian
  full_name: Song, Jian
  id: '5297'
  last_name: Song
citation:
  ama: Shukla AR, Martin R, Probst R, Song J. Comparison of different statistical
    methods for prediction of lifetime of electrical connectors with short term tests.
    <i>Microelectronics Reliability</i>. 2023;150. doi:<a href="https://doi.org/10.1016/j.microrel.2023.115216">10.1016/j.microrel.2023.115216</a>
  apa: Shukla, A. R., Martin, R., Probst, R., &#38; Song, J. (2023). Comparison of
    different statistical methods for prediction of lifetime of electrical connectors
    with short term tests. <i>Microelectronics Reliability</i>, <i>150</i>, Article
    115216. <a href="https://doi.org/10.1016/j.microrel.2023.115216">https://doi.org/10.1016/j.microrel.2023.115216</a>
  bjps: <b>Shukla AR <i>et al.</i></b> (2023) Comparison of Different Statistical
    Methods for Prediction of Lifetime of Electrical Connectors with Short Term Tests.
    <i>Microelectronics Reliability</i> <b>150</b>.
  chicago: Shukla, Abhay Rammurti, Robert Martin, Roman Probst, and Jian Song. “Comparison
    of Different Statistical Methods for Prediction of Lifetime of Electrical Connectors
    with Short Term Tests.” <i>Microelectronics Reliability</i> 150 (2023). <a href="https://doi.org/10.1016/j.microrel.2023.115216">https://doi.org/10.1016/j.microrel.2023.115216</a>.
  chicago-de: Shukla, Abhay Rammurti, Robert Martin, Roman Probst und Jian Song. 2023.
    Comparison of different statistical methods for prediction of lifetime of electrical
    connectors with short term tests. <i>Microelectronics Reliability</i> 150. doi:<a
    href="https://doi.org/10.1016/j.microrel.2023.115216">10.1016/j.microrel.2023.115216</a>,
    .
  din1505-2-1: '<span style="font-variant:small-caps;">Shukla, Abhay Rammurti</span>
    ; <span style="font-variant:small-caps;">Martin, Robert</span> ; <span style="font-variant:small-caps;">Probst,
    Roman</span> ; <span style="font-variant:small-caps;">Song, Jian</span>: Comparison
    of different statistical methods for prediction of lifetime of electrical connectors
    with short term tests. In: <i>Microelectronics Reliability</i> Bd. 150. Amsterdam,
    Elsevier  (2023)'
  havard: A.R. Shukla, R. Martin, R. Probst, J. Song, Comparison of different statistical
    methods for prediction of lifetime of electrical connectors with short term tests,
    Microelectronics Reliability. 150 (2023).
  ieee: 'A. R. Shukla, R. Martin, R. Probst, and J. Song, “Comparison of different
    statistical methods for prediction of lifetime of electrical connectors with short
    term tests,” <i>Microelectronics Reliability</i>, vol. 150, Art. no. 115216, 2023,
    doi: <a href="https://doi.org/10.1016/j.microrel.2023.115216">10.1016/j.microrel.2023.115216</a>.'
  mla: Shukla, Abhay Rammurti, et al. “Comparison of Different Statistical Methods
    for Prediction of Lifetime of Electrical Connectors with Short Term Tests.” <i>Microelectronics
    Reliability</i>, vol. 150, 115216, 2023, <a href="https://doi.org/10.1016/j.microrel.2023.115216">https://doi.org/10.1016/j.microrel.2023.115216</a>.
  short: A.R. Shukla, R. Martin, R. Probst, J. Song, Microelectronics Reliability
    150 (2023).
  ufg: '<b>Shukla, Abhay Rammurti u. a.</b>: Comparison of different statistical methods
    for prediction of lifetime of electrical connectors with short term tests, in:
    <i>Microelectronics Reliability</i> 150 (2023).'
  van: Shukla AR, Martin R, Probst R, Song J. Comparison of different statistical
    methods for prediction of lifetime of electrical connectors with short term tests.
    Microelectronics Reliability. 2023;150.
date_created: 2024-04-18T08:55:38Z
date_updated: 2025-06-26T07:51:25Z
department:
- _id: DEP6012
doi: 10.1016/j.microrel.2023.115216
external_id:
  isi:
  - '001106942700001'
has_accepted_license: '1'
intvolume: '       150'
isi: '1'
keyword:
- Electrical and Electronic Engineering
- Surfaces
- Coatings and Films
- Safety
- Risk
- Reliability and Quality
- Condensed Matter Physics
- Atomic and Molecular Physics
- and Optics
- Electronic
- Optical and Magnetic Materials
language:
- iso: eng
place: Amsterdam
publication: Microelectronics Reliability
publication_identifier:
  issn:
  - 0026-2714
  unknown:
  - 1872-941X
publication_status: published
publisher: 'Elsevier '
status: public
title: Comparison of different statistical methods for prediction of lifetime of electrical
  connectors with short term tests
type: scientific_journal_article
user_id: '83781'
volume: 150
year: '2023'
...
---
_id: '11360'
abstract:
- lang: eng
  text: The state of health and lifetime estimation process of electrical connectors
    via lifetime tests is a time and labor intensive process. In our previous work,
    a correlation between the contact resistance developments in the early stages
    of lifetime tests of electrical connectors with the final results was established
    using a data driven statistical process based on probability distribution. Also,
    state of health indicators for prognosis of lifetime were introduced. In this
    work, the state of health indicators have been optimized. The sensitivity analysis
    is performed with regards to the selection of the appropriate amount of test data
    based on test duration for the reliable prognosis of the state of health and the
    characteristic lifetime. Through this the possibility of further reduction of
    test duration required for the reliable prognosis of state of health is investigated.
    Based on the results of analysis, a guideline for the determination of the duration
    of lifetime tests which lead to a reliable prediction of lifetime of connectors
    can be provided. Also, an assessment of the state of art in the prognosis of the
    lifetime of electrical connectors has been presented.
author:
- first_name: Jian
  full_name: Song, Jian
  id: '5297'
  last_name: Song
- first_name: Abhay Rammurti
  full_name: Shukla, Abhay Rammurti
  id: '74188'
  last_name: Shukla
- first_name: Roman
  full_name: Probst, Roman
  id: '69156'
  last_name: Probst
citation:
  ama: Song J, Shukla AR, Probst R. <i>Advances in Evaluation of State of Health of
    Electrical Connectors</i>. IEEE; 2023:200-208. doi:<a href="https://doi.org/10.1109/holm56075.2023.10352279">10.1109/holm56075.2023.10352279</a>
  apa: Song, J., Shukla, A. R., &#38; Probst, R. (2023). Advances in Evaluation of
    State of Health of Electrical Connectors. In <i>2023 IEEE 68th Holm Conference
    on Electrical Contacts (HOLM)</i> (pp. 200–208). IEEE. <a href="https://doi.org/10.1109/holm56075.2023.10352279">https://doi.org/10.1109/holm56075.2023.10352279</a>
  bjps: '<b>Song J, Shukla AR and Probst R</b> (2023) <i>Advances in Evaluation of
    State of Health of Electrical Connectors</i>. [Piscataway, NJ]: IEEE.'
  chicago: 'Song, Jian, Abhay Rammurti Shukla, and Roman Probst. <i>Advances in Evaluation
    of State of Health of Electrical Connectors</i>. <i>2023 IEEE 68th Holm Conference
    on Electrical Contacts (HOLM)</i>. Electrical Contacts-IEEE Holm Conference on
    Electrical Contacts. [Piscataway, NJ]: IEEE, 2023. <a href="https://doi.org/10.1109/holm56075.2023.10352279">https://doi.org/10.1109/holm56075.2023.10352279</a>.'
  chicago-de: 'Song, Jian, Abhay Rammurti Shukla und Roman Probst. 2023. <i>Advances
    in Evaluation of State of Health of Electrical Connectors</i>. <i>2023 IEEE 68th
    Holm Conference on Electrical Contacts (HOLM)</i>. Electrical Contacts-IEEE Holm
    Conference on Electrical Contacts. [Piscataway, NJ]: IEEE. doi:<a href="https://doi.org/10.1109/holm56075.2023.10352279">10.1109/holm56075.2023.10352279</a>,
    .'
  din1505-2-1: '<span style="font-variant:small-caps;">Song, Jian</span> ; <span style="font-variant:small-caps;">Shukla,
    Abhay Rammurti</span> ; <span style="font-variant:small-caps;">Probst, Roman</span>:
    <i>Advances in Evaluation of State of Health of Electrical Connectors</i>, <i>Electrical
    Contacts-IEEE Holm Conference on Electrical Contacts</i>. [Piscataway, NJ] : IEEE,
    2023'
  havard: J. Song, A.R. Shukla, R. Probst, Advances in Evaluation of State of Health
    of Electrical Connectors, IEEE, [Piscataway, NJ], 2023.
  ieee: 'J. Song, A. R. Shukla, and R. Probst, <i>Advances in Evaluation of State
    of Health of Electrical Connectors</i>. [Piscataway, NJ]: IEEE, 2023, pp. 200–208.
    doi: <a href="https://doi.org/10.1109/holm56075.2023.10352279">10.1109/holm56075.2023.10352279</a>.'
  mla: Song, Jian, et al. “Advances in Evaluation of State of Health of Electrical
    Connectors.” <i>2023 IEEE 68th Holm Conference on Electrical Contacts (HOLM)</i>,
    IEEE, 2023, pp. 200–08, <a href="https://doi.org/10.1109/holm56075.2023.10352279">https://doi.org/10.1109/holm56075.2023.10352279</a>.
  short: J. Song, A.R. Shukla, R. Probst, Advances in Evaluation of State of Health
    of Electrical Connectors, IEEE, [Piscataway, NJ], 2023.
  ufg: '<b>Song, Jian/Shukla, Abhay Rammurti/Probst, Roman</b>: Advances in Evaluation
    of State of Health of Electrical Connectors, [Piscataway, NJ] 2023 (Electrical
    Contacts-IEEE Holm Conference on Electrical Contacts).'
  van: 'Song J, Shukla AR, Probst R. Advances in Evaluation of State of Health of
    Electrical Connectors. 2023 IEEE 68th Holm Conference on Electrical Contacts (HOLM).
    [Piscataway, NJ]: IEEE; 2023. (Electrical Contacts-IEEE Holm Conference on Electrical
    Contacts).'
conference:
  end_date: 2023-10-11
  location: Seattle
  name: 68th Holm Conference on Electrical Contacts (HOLM)
  start_date: 2023-10-04
date_created: 2024-04-18T10:11:50Z
date_updated: 2025-06-26T07:54:50Z
doi: 10.1109/holm56075.2023.10352279
keyword:
- accelerated life testing
- test duration
- contact resistance
- statistical model
- connector reliability
language:
- iso: eng
page: 200-208
place: '[Piscataway, NJ]'
publication: 2023 IEEE 68th Holm Conference on Electrical Contacts (HOLM)
publication_identifier:
  eisbn:
  - 979‐8‐3503‐4246‐8
  - '979‐8‐3503‐4245‐1 '
  eissn:
  - 2158‐9992
  isbn:
  - 979‐8‐3503‐4244‐4
  issn:
  - 2158-9992
publication_status: published
publisher: IEEE
series_title: Electrical Contacts-IEEE Holm Conference on Electrical Contacts
status: public
title: Advances in Evaluation of State of Health of Electrical Connectors
type: conference_editor_article
user_id: '83781'
year: '2023'
...
---
_id: '9211'
abstract:
- lang: eng
  text: Lifetime tests of connectors are time consuming and labor intensive. Our study
    reveals a strong correlation between the statistical characteristics of contact
    resistance development in the early stages of lifetime tests and the final results
    of the tests. This correlation enables a further time lapse of lifetime tests
    and the prediction of the state of the health of connectors which can be utilized
    in the development of diagnostic strategy in sophisticated networks with very
    high number of connectors as well as in a quick classification of connectors with
    respect to their design features. Methods of statistical evaluation are introduced
    and the sensitivity analyses of different characteristics for the state of health
    of connectors are conducted.
author:
- first_name: Jian
  full_name: Song, Jian
  id: '5297'
  last_name: Song
- first_name: Abhay Rammurti
  full_name: Shukla, Abhay Rammurti
  id: '72757'
  last_name: Shukla
- first_name: Roman
  full_name: Probst, Roman
  id: '69156'
  last_name: Probst
citation:
  ama: Song J, Shukla AR, Probst R. <i>State of Health of Connectors – Early Indicators</i>.
    IEEE; 2022:272-278. doi:<a href="https://doi.org/10.1109/HLM54538.2022.9969839">10.1109/HLM54538.2022.9969839</a>
  apa: 'Song, J., Shukla, A. R., &#38; Probst, R. (2022). State of Health of Connectors
    – Early Indicators. In <i>Electrical contacts - 2022 : proceedings of the Sixty-Seventh
    IEEE Holm Conference on Electrical Contacts</i> (pp. 272–278). IEEE. <a href="https://doi.org/10.1109/HLM54538.2022.9969839">https://doi.org/10.1109/HLM54538.2022.9969839</a>'
  bjps: '<b>Song J, Shukla AR and Probst R</b> (2022) <i>State of Health of Connectors
    – Early Indicators</i>. Piscataway, NJ: IEEE.'
  chicago: 'Song, Jian, Abhay Rammurti Shukla, and Roman Probst. <i>State of Health
    of Connectors – Early Indicators</i>. <i>Electrical Contacts - 2022 : Proceedings
    of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts</i>. Piscataway,
    NJ: IEEE, 2022. <a href="https://doi.org/10.1109/HLM54538.2022.9969839">https://doi.org/10.1109/HLM54538.2022.9969839</a>.'
  chicago-de: 'Song, Jian, Abhay Rammurti Shukla und Roman Probst. 2022. <i>State
    of Health of Connectors – Early Indicators</i>. <i>Electrical contacts - 2022 :
    proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts</i>.
    Piscataway, NJ: IEEE. doi:<a href="https://doi.org/10.1109/HLM54538.2022.9969839">10.1109/HLM54538.2022.9969839</a>,
    .'
  din1505-2-1: '<span style="font-variant:small-caps;">Song, Jian</span> ; <span style="font-variant:small-caps;">Shukla,
    Abhay Rammurti</span> ; <span style="font-variant:small-caps;">Probst, Roman</span>:
    <i>State of Health of Connectors – Early Indicators</i>. Piscataway, NJ : IEEE,
    2022'
  havard: J. Song, A.R. Shukla, R. Probst, State of Health of Connectors – Early Indicators,
    IEEE, Piscataway, NJ, 2022.
  ieee: 'J. Song, A. R. Shukla, and R. Probst, <i>State of Health of Connectors –
    Early Indicators</i>. Piscataway, NJ: IEEE, 2022, pp. 272–278. doi: <a href="https://doi.org/10.1109/HLM54538.2022.9969839">10.1109/HLM54538.2022.9969839</a>.'
  mla: 'Song, Jian, et al. “State of Health of Connectors – Early Indicators.” <i>Electrical
    Contacts - 2022 : Proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical
    Contacts</i>, IEEE, 2022, pp. 272–78, <a href="https://doi.org/10.1109/HLM54538.2022.9969839">https://doi.org/10.1109/HLM54538.2022.9969839</a>.'
  short: J. Song, A.R. Shukla, R. Probst, State of Health of Connectors – Early Indicators,
    IEEE, Piscataway, NJ, 2022.
  ufg: '<b>Song, Jian/Shukla, Abhay Rammurti/Probst, Roman</b>: State of Health of
    Connectors – Early Indicators, Piscataway, NJ 2022.'
  van: 'Song J, Shukla AR, Probst R. State of Health of Connectors – Early Indicators.
    Electrical contacts - 2022 : proceedings of the Sixty-Seventh IEEE Holm Conference
    on Electrical Contacts. Piscataway, NJ: IEEE; 2022.'
conference:
  end_date: 2022-10-26
  location: Tampa, FL, USA
  name: 67th Holm Conference on Electrical Contacts
  start_date: 2022-10-23
date_created: 2022-12-11T13:50:30Z
date_updated: 2024-08-05T08:01:22Z
department:
- _id: DEP6012
doi: 10.1109/HLM54538.2022.9969839
keyword:
- Connectors
- Correlation
- Sensitivity analysis
- Contact resistance
- Lifetime estimation
- Reliability
- Electrical resistance measurement
language:
- iso: eng
page: 272 - 278
place: Piscataway, NJ
publication: 'Electrical contacts - 2022 : proceedings of the Sixty-Seventh IEEE Holm
  Conference on Electrical Contacts'
publication_identifier:
  eisbn:
  - 978-1-6654-5965-5
  isbn:
  - 978-1-6654-5966-2
  - 978-1-6654-5967-9
  issn:
  - 2158-9992
publication_status: published
publisher: IEEE
status: public
title: State of Health of Connectors – Early Indicators
type: conference_editor_article
user_id: '83781'
year: '2022'
...
---
_id: '12907'
abstract:
- lang: eng
  text: "In diesem Open Access-Tagungsband sind die besten Beiträge des 11. Jahreskolloquiums
    \"Kommunikation in der Automation\" (KommA 2020) und des 7. Jahreskolloquiums
    \"Bildverarbeitung in der Automation\" (BVAu 2020) enthalten. Die Kolloquien fanden
    am 28. und 29. Oktober 2020 statt und wurden erstmalig als digitale Webveranstaltung
    auf dem Innovation Campus Lemgo organisiert.\r\nDie vorgestellten neuesten Forschungsergebnisse
    auf den Gebieten der industriellen Kommunikationstechnik und Bildverarbeitung
    erweitern den aktuellen Stand der Forschung und Technik. Die in den Beiträgen
    enthaltenen anschauliche Anwendungsbeispiele aus dem Bereich der Automation setzen
    die Ergebnisse in den direkten Anwendungsbezug."
citation:
  ama: 'Jasperneite J, Lohweg V, eds. <i>Kommunikation und Bildverarbeitung in der
    Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2020</i>.
    Vol 14. Springer Berlin Heidelberg; 2022. doi:<a href="https://doi.org/10.1007/978-3-662-64283-2">10.1007/978-3-662-64283-2</a>'
  apa: 'Jasperneite, J., &#38; Lohweg, V. (Eds.). (2022). <i>Kommunikation und Bildverarbeitung
    in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2020</i>
    (Vol. 14). Springer Berlin Heidelberg. <a href="https://doi.org/10.1007/978-3-662-64283-2">https://doi.org/10.1007/978-3-662-64283-2</a>'
  bjps: '<b>Jasperneite J and Lohweg V (eds)</b> (2022) <i>Kommunikation und Bildverarbeitung
    in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2020</i>.
    Berlin, Heidelberg: Springer Berlin Heidelberg.'
  chicago: 'Jasperneite, Jürgen, and Volker Lohweg, eds. <i>Kommunikation und Bildverarbeitung
    in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2020</i>.
    Vol. 14. Technologien für die intelligente Automation. Berlin, Heidelberg: Springer
    Berlin Heidelberg, 2022. <a href="https://doi.org/10.1007/978-3-662-64283-2">https://doi.org/10.1007/978-3-662-64283-2</a>.'
  chicago-de: 'Jasperneite, Jürgen und Volker Lohweg, Hrsg. 2022. <i>Kommunikation
    und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien
    KommA und BVAu 2020</i>. Bd. 14. Technologien für die intelligente Automation.
    Berlin, Heidelberg: Springer Berlin Heidelberg. doi:<a href="https://doi.org/10.1007/978-3-662-64283-2">10.1007/978-3-662-64283-2</a>,
    .'
  din1505-2-1: '<span style="font-variant:small-caps;">Jasperneite, J.</span> ; <span
    style="font-variant:small-caps;">Lohweg, V.</span> (Hrsg.): <i>Kommunikation und
    Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien
    KommA und BVAu 2020</i>, <i>Technologien für die intelligente Automation</i>.
    Bd. 14. Berlin, Heidelberg : Springer Berlin Heidelberg, 2022'
  havard: 'J. Jasperneite, V. Lohweg, eds., Kommunikation und Bildverarbeitung in
    der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2020,
    Springer Berlin Heidelberg, Berlin, Heidelberg, 2022.'
  ieee: 'J. Jasperneite and V. Lohweg, Eds., <i>Kommunikation und Bildverarbeitung
    in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2020</i>,
    vol. 14. Berlin, Heidelberg: Springer Berlin Heidelberg, 2022. doi: <a href="https://doi.org/10.1007/978-3-662-64283-2">10.1007/978-3-662-64283-2</a>.'
  mla: 'Jasperneite, Jürgen, and Volker Lohweg, editors. <i>Kommunikation und Bildverarbeitung
    in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2020</i>.
    Springer Berlin Heidelberg, 2022, <a href="https://doi.org/10.1007/978-3-662-64283-2">https://doi.org/10.1007/978-3-662-64283-2</a>.'
  short: 'J. Jasperneite, V. Lohweg, eds., Kommunikation und Bildverarbeitung in der
    Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2020, Springer
    Berlin Heidelberg, Berlin, Heidelberg, 2022.'
  ufg: '<i>Jasperneite, Jürgen</i>/<i>Lohweg, Volker</i>: Kommunikation und Bildverarbeitung
    in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2020,
    Bd. 14, Berlin, Heidelberg 2022 (Technologien für die intelligente Automation).'
  van: 'Jasperneite J, Lohweg V, editors. Kommunikation und Bildverarbeitung in der
    Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2020. Berlin,
    Heidelberg: Springer Berlin Heidelberg; 2022. 329 p. (Technologien für die intelligente
    Automation; vol. 14).'
conference:
  end_date: 2020-10-29
  location: Lemgo
  name: 11. Jahreskolloquiums "Kommunikation in der Automation" (KommA 2020) / 7.
    Jahreskolloquiums "Bildverarbeitung in der Automation" (BVAu 2020)
  start_date: 2020-10-28
date_created: 2025-05-12T08:22:49Z
date_updated: 2025-05-12T08:27:40Z
department:
- _id: DEP5023
doi: 10.1007/978-3-662-64283-2
editor:
- first_name: Jürgen
  full_name: Jasperneite, Jürgen
  id: '1899'
  last_name: Jasperneite
- first_name: Volker
  full_name: Lohweg, Volker
  id: '1804'
  last_name: Lohweg
  orcid: 0000-0002-3325-7887
intvolume: '        14'
keyword:
- Industrielle Kommunikationstechnik
- Industrielle Bildverarbeitung
- Network reliability and redundancy methods
- Networked Control Systems
- Wireless real-time communication
- Open Access
language:
- iso: ger
page: '329'
place: Berlin, Heidelberg
publication_identifier:
  eisbn:
  - 978-3-662-64283-2
  eissn:
  - 2522-8587
  isbn:
  - 978-3-662-64282-5
  issn:
  - 2522-8579
publication_status: published
publisher: Springer Berlin Heidelberg
series_title: Technologien für die intelligente Automation
status: public
title: 'Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge
  der Jahreskolloquien KommA und BVAu 2020'
type: book_editor
user_id: '83781'
volume: 14
year: '2022'
...
---
_id: '4899'
abstract:
- lang: eng
  text: 'The real and effective ground of all new concepts dedicated to the current
    advanced factories, as well as to the future digital ones, is close cooperativity
    of scattered applications in highly heterogeneous systems. Communication is the
    key enabling component, and all new approaches are inspired in practice to the
    demanding characteristics of industrial networks. These kinds of computer networks,
    together with new technologies derived from distant application fields, are the
    main technological means to accelerate the fast evolution of modern factory systems.
    Due to various communication requirements coming from the plurality of structures,
    components and application contexts, communication subsystems must be increasingly
    heterogeneous. Let us say clearly: this evolution cannot be stopped at this stage,
    no special universal solution is possible, and thinking about monogamous networking
    is a kind of dreamland. This paper is an analysis of the state of the art in the
    matter of heterogeneous networking in industry. It deeply investigates both wired
    and wireless technologies from the point of view of technological aspects and
    relevant key performance indicators, such as those related to dependability, and
    it contains a prospective estimation of future trends.'
article_number: '103388'
author:
- first_name: Stefano
  full_name: Scanzio, Stefano
  last_name: Scanzio
- first_name: Lukasz
  full_name: Wisniewski, Lukasz
  id: '1710'
  last_name: Wisniewski
- first_name: Piotr
  full_name: Gaj, Piotr
  last_name: Gaj
citation:
  ama: Scanzio S, Wisniewski L, Gaj P. Heterogeneous and Dependable Networks in Industry
    - a Survey. <i>Journal Computers in Industry</i>. 2021;125(Febr. 2021). doi:<a
    href="https://doi.org/10.1016/j.compind.2020.103388">10.1016/j.compind.2020.103388</a>
  apa: Scanzio, S., Wisniewski, L., &#38; Gaj, P. (2021). Heterogeneous and Dependable
    Networks in Industry - a Survey. <i>Journal Computers in Industry</i>, <i>125</i>(Febr.
    2021). <a href="https://doi.org/10.1016/j.compind.2020.103388">https://doi.org/10.1016/j.compind.2020.103388</a>
  bjps: <b>Scanzio S, Wisniewski L and Gaj P</b> (2021) Heterogeneous and Dependable
    Networks in Industry - a Survey. <i>Journal Computers in Industry</i> <b>125</b>.
  chicago: Scanzio, Stefano, Lukasz Wisniewski, and Piotr Gaj. “Heterogeneous and
    Dependable Networks in Industry - a Survey.” <i>Journal Computers in Industry</i>
    125, no. Febr. 2021 (2021). <a href="https://doi.org/10.1016/j.compind.2020.103388">https://doi.org/10.1016/j.compind.2020.103388</a>.
  chicago-de: Scanzio, Stefano, Lukasz Wisniewski und Piotr Gaj. 2021. Heterogeneous
    and Dependable Networks in Industry - a Survey. <i>Journal Computers in Industry</i>
    125, Nr. Febr. 2021. doi:<a href="https://doi.org/10.1016/j.compind.2020.103388,">10.1016/j.compind.2020.103388,</a>
    .
  din1505-2-1: '<span style="font-variant:small-caps;">Scanzio, Stefano</span> ; <span
    style="font-variant:small-caps;">Wisniewski, Lukasz</span> ; <span style="font-variant:small-caps;">Gaj,
    Piotr</span>: Heterogeneous and Dependable Networks in Industry - a Survey. In:
    <i>Journal Computers in Industry</i> Bd. 125, Elsevier (2021), Nr. Febr. 2021'
  havard: S. Scanzio, L. Wisniewski, P. Gaj, Heterogeneous and Dependable Networks
    in Industry - a Survey, Journal Computers in Industry. 125 (2021).
  ieee: S. Scanzio, L. Wisniewski, and P. Gaj, “Heterogeneous and Dependable Networks
    in Industry - a Survey,” <i>Journal Computers in Industry</i>, vol. 125, no. Febr.
    2021, 2021.
  mla: Scanzio, Stefano, et al. “Heterogeneous and Dependable Networks in Industry
    - a Survey.” <i>Journal Computers in Industry</i>, vol. 125, no. Febr. 2021, 103388,
    Elsevier, 2021, doi:<a href="https://doi.org/10.1016/j.compind.2020.103388">10.1016/j.compind.2020.103388</a>.
  short: S. Scanzio, L. Wisniewski, P. Gaj, Journal Computers in Industry 125 (2021).
  ufg: '<b>Scanzio, Stefano et. al. (2021)</b>: Heterogeneous and Dependable Networks
    in Industry - a Survey, in: <i>Journal Computers in Industry</i> <i>125</i> (<i>Febr.
    2021</i>).'
  van: Scanzio S, Wisniewski L, Gaj P. Heterogeneous and Dependable Networks in Industry
    - a Survey. Journal Computers in Industry. 2021;125(Febr. 2021).
date_created: 2021-02-05T10:11:22Z
date_updated: 2023-03-15T13:49:56Z
department:
- _id: DEP5023
doi: 10.1016/j.compind.2020.103388
intvolume: '       125'
issue: Febr. 2021
keyword:
- Industrial networks
- Heterogeneity
- Dependability
- Interoperability
- Real-time
- Reliability
- Ethernet
- Wireless
- Wi-Fi
- WSAN
- SDN
- TSN
- 5G
- CPS
- IIoT
- I4.0
language:
- iso: eng
publication: Journal Computers in Industry
publication_identifier:
  eissn:
  - 0166-3615
publication_status: published
publisher: Elsevier
status: public
title: Heterogeneous and Dependable Networks in Industry - a Survey
type: journal_article
user_id: '15514'
volume: 125
year: 2021
...
---
_id: '4851'
abstract:
- lang: ger
  text: "In diesem Open-Access-Tagungsband sind die besten Beiträge des 9. Jahreskolloquiums
    \"Kommunikation in der Automation\" (KommA 2018) und des 6. Jahreskolloquiums
    \"Bildverarbeitung in der Automation\" (BVAu 2018) enthalten. Die Kolloquien fanden
    am 20. und 21. November 2018 in der SmartFactoryOWL, einer gemeinsamen Einrichtung
    des Fraunhofer IOSB-INA und der Technischen Hochschule Ostwestfalen-Lippe statt.\r\nDie
    vorgestellten neuesten Forschungsergebnisse auf den Gebieten der industriellen
    Kommunikationstechnik und Bildverarbeitung erweitern den aktuellen Stand der Forschung
    und Technik. Die in den Beiträgen enthaltenen anschaulichen Beispiele aus dem
    Bereich der Automation setzen die Ergebnisse in den direkten Anwendungsbezug."
citation:
  ama: 'Jasperneite J, Lohweg V, eds. <i>Kommunikation und Bildverarbeitung in der
    Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2018</i>.
    Vol 12. Springer Vieweg; 2020. doi:<a href="https://doi.org/10.1007/978-3-662-59895-5">https://doi.org/10.1007/978-3-662-59895-5</a>'
  apa: 'Jasperneite, J., &#38; Lohweg, V. (Eds.). (2020). <i>Kommunikation und Bildverarbeitung
    in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2018</i>
    (Vol. 12). Springer Vieweg. <a href="https://doi.org/10.1007/978-3-662-59895-5">https://doi.org/10.1007/978-3-662-59895-5</a>'
  bjps: '<b>Jasperneite J and Lohweg V (eds)</b> (2020) <i>Kommunikation und Bildverarbeitung
    in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2018</i>.
    Berlin, Heidelberg: Springer Vieweg.'
  chicago: 'Jasperneite, Jürgen, and Volker Lohweg, eds. <i>Kommunikation und Bildverarbeitung
    in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2018</i>.
    Vol. 12.  Technologien für die intelligente Automation. Berlin, Heidelberg: Springer
    Vieweg, 2020. <a href="https://doi.org/10.1007/978-3-662-59895-5">https://doi.org/10.1007/978-3-662-59895-5</a>.'
  chicago-de: 'Jasperneite, Jürgen und Volker Lohweg, Hrsg. 2020. <i>Kommunikation
    und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien
    KommA und BVAu 2018</i>. Bd. 12.  Technologien für die intelligente Automation.
    Berlin, Heidelberg: Springer Vieweg. doi:<a href="https://doi.org/10.1007/978-3-662-59895-5">https://doi.org/10.1007/978-3-662-59895-5</a>,
    .'
  din1505-2-1: '<span style="font-variant:small-caps;">Jasperneite, J.</span> ; <span
    style="font-variant:small-caps;">Lohweg, V.</span> (Hrsg.): <i>Kommunikation und
    Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien
    KommA und BVAu 2018</i>, <i> Technologien für die intelligente Automation</i>.
    Bd. 12. Berlin, Heidelberg : Springer Vieweg, 2020'
  havard: 'J. Jasperneite, V. Lohweg, eds., Kommunikation und Bildverarbeitung in
    der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2018,
    Springer Vieweg, Berlin, Heidelberg, 2020.'
  ieee: 'J. Jasperneite and V. Lohweg, Eds., <i>Kommunikation und Bildverarbeitung
    in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2018</i>,
    vol. 12. Berlin, Heidelberg: Springer Vieweg, 2020. doi: <a href="https://doi.org/10.1007/978-3-662-59895-5">https://doi.org/10.1007/978-3-662-59895-5</a>.'
  mla: 'Jasperneite, Jürgen, and Volker Lohweg, editors. <i>Kommunikation und Bildverarbeitung
    in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2018</i>.
    Springer Vieweg, 2020, <a href="https://doi.org/10.1007/978-3-662-59895-5">https://doi.org/10.1007/978-3-662-59895-5</a>.'
  short: 'J. Jasperneite, V. Lohweg, eds., Kommunikation und Bildverarbeitung in der
    Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2018, Springer
    Vieweg, Berlin, Heidelberg, 2020.'
  ufg: '<i>Jasperneite, Jürgen</i>/<i>Lohweg, Volker</i>: Kommunikation und Bildverarbeitung
    in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2018,
    Bd. 12, Berlin, Heidelberg 2020 ( Technologien für die intelligente Automation).'
  van: 'Jasperneite J, Lohweg V, editors. Kommunikation und Bildverarbeitung in der
    Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2018. Berlin,
    Heidelberg: Springer Vieweg; 2020. 364 p. ( Technologien für die intelligente
    Automation; vol. 12).'
conference:
  end_date: 20218-11-21
  location: Lemgo
  name: 9. Jahreskolloquiums "Kommunikation in der Automation" (KommA 2018) / 6. Jahreskolloquiums
    "Bildverarbeitung in der Automation" (BVAu 2018)
  start_date: 2018-11-20
date_created: 2021-02-02T13:12:47Z
date_updated: 2025-05-12T08:07:26Z
department:
- _id: DEP5023
- _id: DEP5019
doi: https://doi.org/10.1007/978-3-662-59895-5
editor:
- first_name: Jürgen
  full_name: Jasperneite, Jürgen
  id: '1899'
  last_name: Jasperneite
- first_name: Volker
  full_name: Lohweg, Volker
  id: '1804'
  last_name: Lohweg
  orcid: 0000-0002-3325-7887
intvolume: '        12'
keyword:
- Industrielle Kommunikationstechnik Industrielle Bildverarbeitung Network reliability
  and redundancy methods Networked Control Systems Wireless real-time communication
  Open Access quality control
- reliability
- safety and risk
language:
- iso: ger
main_file_link:
- open_access: '1'
  url: https://link.springer.com/book/10.1007/978-3-662-59895-5?page=2#about
oa: '1'
page: '364'
place: Berlin, Heidelberg
publication_identifier:
  eisbn:
  - 978-3-662-59895-5
  eissn:
  - 2522-8587
  isbn:
  - 978-3-662-59894-8
  issn:
  - 2522-8579
publication_status: published
publisher: Springer Vieweg
series_title: ' Technologien für die intelligente Automation'
status: public
title: 'Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge
  der Jahreskolloquien KommA und BVAu 2018'
type: book_editor
user_id: '83781'
volume: 12
year: '2020'
...
---
_id: '4506'
abstract:
- lang: ger
  text: "In diesem Tagungsband sind die besten Beiträge des 7. Jahreskolloquiums \"Kommunikation
    in der Automation\" (KommA 2016) und des  5. Jahreskolloquiums \"Bildverarbeitung
    in der Automation\" (BVAu 2016) enthalten. Die Kolloquien fanden am 30. November
    und 1. Dezember 2016 anlässlich des 10jährigen Jubiläums des inIT - Institut für
    industrielle Informationstechnik in der SmartFactoryOWL, einer herstellerunabhängigen
    und offenen Industrie 4.0 Forschungs- und Demonstrationsplattform und zugleich
    Testfeld für den Mittelstand, in Lemgo statt.\r\nDie vorgestellten neuesten Forschungsergebnisse
    auf den Gebieten der industriellen Kommunikationstechnik und Bildverarbeitung
    erweitern den aktuellen Stand der Forschung und Technik. Die in den Beiträgen
    enthaltenen anschauliche Anwendungsbeispiele aus dem Bereich der Automation setzen
    die Ergebnisse in den direkten Anwendungsbezug."
citation:
  ama: 'Jasperneite J, Lohweg V, eds. <i> Kommunikation und Bildverarbeitung in der
    Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2016 zum
    10jährigen Jubiläum des inIT - Institut für industrielle Informationstechnik</i>.
    Vol 7. Springer Vieweg; 2017. doi:<a href="https://doi.org/10.1007/978-3-662-55232-2">10.1007/978-3-662-55232-2</a>'
  apa: 'Jasperneite, J., &#38; Lohweg, V. (Eds.). (2017). <i> Kommunikation und Bildverarbeitung
    in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2016
    zum 10jährigen Jubiläum des inIT - Institut für industrielle Informationstechnik</i>
    (Vol. 7). Springer Vieweg. <a href="https://doi.org/10.1007/978-3-662-55232-2">https://doi.org/10.1007/978-3-662-55232-2</a>'
  bjps: '<b>Jasperneite J and Lohweg V (eds)</b> (2017) <i> Kommunikation und Bildverarbeitung
    in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2016
    zum 10jährigen Jubiläum des inIT - Institut für industrielle Informationstechnik</i>.
    Berlin: Springer Vieweg.'
  chicago: 'Jasperneite, Jürgen, and Volker Lohweg, eds. <i> Kommunikation und Bildverarbeitung
    in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2016
    zum 10jährigen Jubiläum des inIT - Institut für industrielle Informationstechnik</i>.
    Vol. 7. Technologien für die intelligente Automation . Berlin: Springer Vieweg,
    2017. <a href="https://doi.org/10.1007/978-3-662-55232-2">https://doi.org/10.1007/978-3-662-55232-2</a>.'
  chicago-de: 'Jasperneite, Jürgen und Volker Lohweg, Hrsg. 2017. <i> Kommunikation
    und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien
    KommA und BVAu 2016 zum 10jährigen Jubiläum des inIT - Institut für industrielle
    Informationstechnik</i>. Bd. 7. Technologien für die intelligente Automation .
    Berlin: Springer Vieweg. doi:<a href="https://doi.org/10.1007/978-3-662-55232-2">10.1007/978-3-662-55232-2</a>,
    .'
  din1505-2-1: '<span style="font-variant:small-caps;">Jasperneite, J.</span> ; <span
    style="font-variant:small-caps;">Lohweg, V.</span> (Hrsg.): <i> Kommunikation
    und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien
    KommA und BVAu 2016 zum 10jährigen Jubiläum des inIT - Institut für industrielle
    Informationstechnik</i>, <i>Technologien für die intelligente Automation </i>.
    Bd. 7. Berlin : Springer Vieweg, 2017'
  havard: 'J. Jasperneite, V. Lohweg, eds.,  Kommunikation und Bildverarbeitung in
    der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2016
    zum 10jährigen Jubiläum des inIT - Institut für industrielle Informationstechnik,
    Springer Vieweg, Berlin, 2017.'
  ieee: 'J. Jasperneite and V. Lohweg, Eds., <i> Kommunikation und Bildverarbeitung
    in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2016
    zum 10jährigen Jubiläum des inIT - Institut für industrielle Informationstechnik</i>,
    vol. 7. Berlin: Springer Vieweg, 2017. doi: <a href="https://doi.org/10.1007/978-3-662-55232-2">10.1007/978-3-662-55232-2</a>.'
  mla: 'Jasperneite, Jürgen, and Volker Lohweg, editors. <i> Kommunikation und Bildverarbeitung
    in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2016
    zum 10jährigen Jubiläum des inIT - Institut für industrielle Informationstechnik</i>.
    Springer Vieweg, 2017, <a href="https://doi.org/10.1007/978-3-662-55232-2">https://doi.org/10.1007/978-3-662-55232-2</a>.'
  short: 'J. Jasperneite, V. Lohweg, eds.,  Kommunikation und Bildverarbeitung in
    der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2016
    zum 10jährigen Jubiläum des inIT - Institut für industrielle Informationstechnik,
    Springer Vieweg, Berlin, 2017.'
  ufg: '<i>Jasperneite, Jürgen</i>/<i>Lohweg, Volker</i>:  Kommunikation und Bildverarbeitung
    in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2016
    zum 10jährigen Jubiläum des inIT - Institut für industrielle Informationstechnik,
    Bd. 7, Berlin 2017 (Technologien für die intelligente Automation ).'
  van: 'Jasperneite J, Lohweg V, editors.  Kommunikation und Bildverarbeitung in der
    Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2016 zum
    10jährigen Jubiläum des inIT - Institut für industrielle Informationstechnik.
    Berlin: Springer Vieweg; 2017. 295 p. (Technologien für die intelligente Automation
    ; vol. 7).'
conference:
  end_date: 2026-12-01
  location: Lemgo
  name: 7. Jahreskolloquiums "Kommunikation in der Automation" (KommA 2016)  /  5.
    Jahreskolloquiums "Bildverarbeitung in der Automation" (BVAu 2016)
  start_date: 2016-11-30
date_created: 2021-01-22T08:40:04Z
date_updated: 2025-05-12T08:19:51Z
department:
- _id: DEP5023
doi: 10.1007/978-3-662-55232-2
editor:
- first_name: Jürgen
  full_name: Jasperneite, Jürgen
  id: '1899'
  last_name: Jasperneite
- first_name: Volker
  full_name: Lohweg, Volker
  id: '1804'
  last_name: Lohweg
  orcid: 0000-0002-3325-7887
intvolume: '         7'
keyword:
- Industrielle Kommunikationstechnik
- Industrielle Bildverarbeitung
- network reliability and redundancy methods
- Networked Controls Systems
- wireless real-time communication
- quality control
- reliability
- safety and risk
language:
- iso: ger
page: '295'
place: Berlin
publication_identifier:
  eisbn:
  - '978-3-662-55232-2 '
  isbn:
  - 978-3-662-55231-5
publication_status: published
publisher: Springer Vieweg
series_title: 'Technologien für die intelligente Automation '
status: public
title: ' Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge
  der Jahreskolloquien KommA und BVAu 2016 zum 10jährigen Jubiläum des inIT - Institut
  für industrielle Informationstechnik'
type: book_editor
user_id: '83781'
volume: 7
year: '2017'
...
---
_id: '2141'
abstract:
- lang: eng
  text: Sensor and information fusion is recently a major topic which becomes important
    in machine diagnosis and conditioning for complex production machines and process
    engineering. It is a known fact that distributed automation systems have a major
    impact on signal processing and pattern recognition for machine diagnosis. Therefore,
    it is necessary to research and develop smart diagnosis methods which are applicable
    for distributed systems like resource-limited cyber-physical systems. In this
    paper we propose an new approach for sensor and information fusion based on Evidence
    Theory and socio-psychological decision-making. We show that context based condition
    monitoring is instantiated even in conflict situations, oc-curing in real life
    scenarios permanently. A simple but effective importance measure is proposed which
    controls the significance of conditioning propositions in a system.
author:
- first_name: Uwe
  full_name: Mönks, Uwe
  id: '1825'
  last_name: Mönks
- first_name: Volker
  full_name: Lohweg, Volker
  id: '1804'
  last_name: Lohweg
  orcid: 0000-0002-3325-7887
citation:
  ama: 'Mönks U, Lohweg V. Machine Conditioning by Importance Controlled Information
    Fusion. In: IEEE, ed. <i>18th IEEE International Conference on Emerging Technologies
    and Factory Automation (ETFA)</i>. Cagliari, Italy; 2013. doi:<a href="https://doi.org/10.1109/ETFA.2013.6647984">10.1109/ETFA.2013.6647984</a>'
  apa: Mönks, U., &#38; Lohweg, V. (2013). Machine Conditioning by Importance Controlled
    Information Fusion. In IEEE (Ed.), <i>18th IEEE International Conference on Emerging
    Technologies and Factory Automation (ETFA)</i>. Cagliari, Italy. <a href="https://doi.org/10.1109/ETFA.2013.6647984">https://doi.org/10.1109/ETFA.2013.6647984</a>
  bjps: <b>Mönks U and Lohweg V</b> (2013) Machine Conditioning by Importance Controlled
    Information Fusion. In IEEE (ed.), <i>18th IEEE International Conference on Emerging
    Technologies and Factory Automation (ETFA)</i>. Cagliari, Italy.
  chicago: Mönks, Uwe, and Volker Lohweg. “Machine Conditioning by Importance Controlled
    Information Fusion.” In <i>18th IEEE International Conference on Emerging Technologies
    and Factory Automation (ETFA)</i>, edited by IEEE. Cagliari, Italy, 2013. <a href="https://doi.org/10.1109/ETFA.2013.6647984">https://doi.org/10.1109/ETFA.2013.6647984</a>.
  chicago-de: 'Mönks, Uwe und Volker Lohweg. 2013. Machine Conditioning by Importance
    Controlled Information Fusion. In: <i>18th IEEE International Conference on Emerging
    Technologies and Factory Automation (ETFA)</i>, hg. von IEEE. Cagliari, Italy.
    doi:<a href="https://doi.org/10.1109/ETFA.2013.6647984,">10.1109/ETFA.2013.6647984,</a>
    .'
  din1505-2-1: '<span style="font-variant:small-caps;">Mönks, Uwe</span> ; <span style="font-variant:small-caps;">Lohweg,
    Volker</span>: Machine Conditioning by Importance Controlled Information Fusion.
    In: <span style="font-variant:small-caps;">IEEE</span> (Hrsg.): <i>18th IEEE International
    Conference on Emerging Technologies and Factory Automation (ETFA)</i>. Cagliari,
    Italy, 2013'
  havard: 'U. Mönks, V. Lohweg, Machine Conditioning by Importance Controlled Information
    Fusion, in: IEEE (Ed.), 18th IEEE International Conference on Emerging Technologies
    and Factory Automation (ETFA), Cagliari, Italy, 2013.'
  ieee: U. Mönks and V. Lohweg, “Machine Conditioning by Importance Controlled Information
    Fusion,” in <i>18th IEEE International Conference on Emerging Technologies and
    Factory Automation (ETFA)</i>, 2013.
  mla: Mönks, Uwe, and Volker Lohweg. “Machine Conditioning by Importance Controlled
    Information Fusion.” <i>18th IEEE International Conference on Emerging Technologies
    and Factory Automation (ETFA)</i>, edited by IEEE, 2013, doi:<a href="https://doi.org/10.1109/ETFA.2013.6647984">10.1109/ETFA.2013.6647984</a>.
  short: 'U. Mönks, V. Lohweg, in: IEEE (Ed.), 18th IEEE International Conference
    on Emerging Technologies and Factory Automation (ETFA), Cagliari, Italy, 2013.'
  ufg: '<b>Mönks, Uwe/Lohweg, Volker (2013)</b>: Machine Conditioning by Importance
    Controlled Information Fusion, in: IEEE (Hg.): <i>18th IEEE International Conference
    on Emerging Technologies and Factory Automation (ETFA)</i>, Cagliari, Italy.'
  van: 'Mönks U, Lohweg V. Machine Conditioning by Importance Controlled Information
    Fusion. In: IEEE, editor. 18th IEEE International Conference on Emerging Technologies
    and Factory Automation (ETFA). Cagliari, Italy; 2013.'
corporate_editor:
- IEEE
date_created: 2019-12-04T09:30:15Z
date_updated: 2023-03-15T13:49:39Z
department:
- _id: DEP5023
doi: 10.1109/ETFA.2013.6647984
keyword:
- Decision making
- Robot sensing systems
- Reliability
- Production
- Context
- Fuzzy set theory
- Data integration
language:
- iso: eng
place: Cagliari, Italy
publication: 18th IEEE International Conference on Emerging Technologies and Factory
  Automation (ETFA)
publication_identifier:
  eisbn:
  - 978-1-4799-0864-6
  eissn:
  - '1946-0759 '
  isbn:
  - 978-1-4799-0862-2
  issn:
  - '1946-0740 '
publication_status: published
status: public
title: Machine Conditioning by Importance Controlled Information Fusion
type: conference
user_id: '45673'
year: 2013
...
