[{"citation":{"ama":"Neumann P, von Blanckenburg K. What Time Will It Be? A Comprehensive Literature Review on Daylight Saving Time. <i>Time &#38; Society</i>. Published online 2025. doi:<a href=\"https://doi.org/10.1177/0961463x241310562\">10.1177/0961463x241310562</a>","ieee":"P. Neumann and K. von Blanckenburg, “What Time Will It Be? A Comprehensive Literature Review on Daylight Saving Time,” <i>Time &#38; Society</i>, 2025, doi: <a href=\"https://doi.org/10.1177/0961463x241310562\">10.1177/0961463x241310562</a>.","din1505-2-1":"<span style=\"font-variant:small-caps;\">Neumann, Philipp</span> ; <span style=\"font-variant:small-caps;\">von Blanckenburg, Korbinian</span>: What Time Will It Be? A Comprehensive Literature Review on Daylight Saving Time. In: <i>Time &#38; Society</i>. London, SAGE Publications (2025)","chicago-de":"Neumann, Philipp und Korbinian von Blanckenburg. 2025. What Time Will It Be? A Comprehensive Literature Review on Daylight Saving Time. <i>Time &#38; Society</i>. doi:<a href=\"https://doi.org/10.1177/0961463x241310562\">10.1177/0961463x241310562</a>, .","short":"P. Neumann, K. von Blanckenburg, Time &#38; Society (2025).","bjps":"<b>Neumann P and von Blanckenburg K</b> (2025) What Time Will It Be? A Comprehensive Literature Review on Daylight Saving Time. <i>Time &#38; Society</i>.","havard":"P. Neumann, K. von Blanckenburg, What Time Will It Be? A Comprehensive Literature Review on Daylight Saving Time, Time &#38; Society. (2025).","mla":"Neumann, Philipp, and Korbinian von Blanckenburg. “What Time Will It Be? A Comprehensive Literature Review on Daylight Saving Time.” <i>Time &#38; Society</i>, 2025, <a href=\"https://doi.org/10.1177/0961463x241310562\">https://doi.org/10.1177/0961463x241310562</a>.","ufg":"<b>Neumann, Philipp/Blanckenburg, Korbinian von</b>: What Time Will It Be? A Comprehensive Literature Review on Daylight Saving Time, in: <i>Time &#38; Society</i> (2025).","van":"Neumann P, von Blanckenburg K. What Time Will It Be? A Comprehensive Literature Review on Daylight Saving Time. Time &#38; Society. 2025;","chicago":"Neumann, Philipp, and Korbinian von Blanckenburg. “What Time Will It Be? A Comprehensive Literature Review on Daylight Saving Time.” <i>Time &#38; Society</i>, 2025. <a href=\"https://doi.org/10.1177/0961463x241310562\">https://doi.org/10.1177/0961463x241310562</a>.","apa":"Neumann, P., &#38; von Blanckenburg, K. (2025). What Time Will It Be? A Comprehensive Literature Review on Daylight Saving Time. <i>Time &#38; Society</i>. <a href=\"https://doi.org/10.1177/0961463x241310562\">https://doi.org/10.1177/0961463x241310562</a>"},"title":"What Time Will It Be? A Comprehensive Literature Review on Daylight Saving Time","status":"public","external_id":{"isi":["001400931200001"]},"year":"2025","author":[{"last_name":"Neumann","first_name":"Philipp","id":"74431","full_name":"Neumann, Philipp"},{"last_name":"von Blanckenburg","first_name":"Korbinian","id":"58841","full_name":"von Blanckenburg, Korbinian"}],"date_updated":"2025-06-25T07:06:10Z","publication_identifier":{"issn":["0961-463X"],"eissn":["1461-7463"]},"publication":"Time & Society","date_created":"2025-01-24T08:29:06Z","keyword":["circadian rhythm","clock chang","crime rates","daylight saving time","economic aspects","electricity usage","health","road safety","sleep deprivation"],"language":[{"iso":"eng"}],"publication_status":"published","isi":"1","publisher":"SAGE Publications","quality_controlled":"1","abstract":[{"lang":"eng","text":"Daylight saving time (DST) affects millions of people in various everyday situations and is a common topic of debate in legislative parliaments around the world. This paper presents a literature review on the effects of the clock change and DST on electricity usage, health, crime rates, road safety, and economic aspects. This addresses a gap in current literature reviews, as there is a lack of linked analyses considering these research fields. We show that there are partial positive effects on crime rates and road safety generally that result from the delay in ambient light availability. This contrasts with the clearly negative effects on health and the economic aspects, which are mainly driven by the disturbed circadian rhythm and the resulting sleep problems. Furthermore, we find that the initial idea of DST to save electricity will probably no longer apply and may even lead to increased usage. This literature review provides a basis for future research and promotes interdisciplinary research by summarizing current findings in a cross-disciplinary manner and identifying research gaps and opportunities. Furthermore, the findings may guide policy-making discussions and decisions. "}],"department":[{"_id":"DEP1514"}],"user_id":"83781","type":"scientific_journal_article","_id":"12391","doi":"10.1177/0961463x241310562","place":"London"},{"user_id":"83781","intvolume":"       150","type":"scientific_journal_article","place":"Amsterdam","_id":"11348","doi":"10.1016/j.microrel.2023.115216","article_number":"115216","has_accepted_license":"1","publication_status":"published","article_type":"original","isi":"1","publisher":"Elsevier ","department":[{"_id":"DEP6012"}],"abstract":[{"lang":"eng","text":"Lifetime is an important feature defining the reliability of electrical connectors. In general practice, the lifetime tests required for reliability estimation are time and labor intensive. In our previous work, a data driven method using a statistical process, with an application of probability distributions such as standard normal distribution and generalized extreme value (GEV) distribution with negative skewness to predict degradation paths, was introduced for estimation of the lifetime and FIT rate with the help of electrical contact resistance data collected from short term tests. The proposed method proved its significance by showing the possibility of drastic reduction in the lifetime test duration required for reliability determination. In this work, a non-parametric distribution free method using percentiles of actual measured contact resistances is used for determining the lifetime as against the percentiles of probability distribution used in previous work, thereby simplifying the process further and leading to an even more precise estimation. The lifetimes calculated from parametric and non-parametric methods are compared to highlight the significance of distribution free method in reliability estimation."}],"date_updated":"2025-06-26T07:51:25Z","publication":"Microelectronics Reliability","publication_identifier":{"unknown":["1872-941X"],"issn":["0026-2714"]},"date_created":"2024-04-18T08:55:38Z","keyword":["Electrical and Electronic Engineering","Surfaces","Coatings and Films","Safety","Risk","Reliability and Quality","Condensed Matter Physics","Atomic and Molecular Physics","and Optics","Electronic","Optical and Magnetic Materials"],"language":[{"iso":"eng"}],"citation":{"apa":"Shukla, A. R., Martin, R., Probst, R., &#38; Song, J. (2023). Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests. <i>Microelectronics Reliability</i>, <i>150</i>, Article 115216. <a href=\"https://doi.org/10.1016/j.microrel.2023.115216\">https://doi.org/10.1016/j.microrel.2023.115216</a>","ieee":"A. R. Shukla, R. Martin, R. Probst, and J. Song, “Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests,” <i>Microelectronics Reliability</i>, vol. 150, Art. no. 115216, 2023, doi: <a href=\"https://doi.org/10.1016/j.microrel.2023.115216\">10.1016/j.microrel.2023.115216</a>.","chicago":"Shukla, Abhay Rammurti, Robert Martin, Roman Probst, and Jian Song. “Comparison of Different Statistical Methods for Prediction of Lifetime of Electrical Connectors with Short Term Tests.” <i>Microelectronics Reliability</i> 150 (2023). <a href=\"https://doi.org/10.1016/j.microrel.2023.115216\">https://doi.org/10.1016/j.microrel.2023.115216</a>.","van":"Shukla AR, Martin R, Probst R, Song J. Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests. Microelectronics Reliability. 2023;150.","ama":"Shukla AR, Martin R, Probst R, Song J. Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests. <i>Microelectronics Reliability</i>. 2023;150. doi:<a href=\"https://doi.org/10.1016/j.microrel.2023.115216\">10.1016/j.microrel.2023.115216</a>","ufg":"<b>Shukla, Abhay Rammurti u. a.</b>: Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests, in: <i>Microelectronics Reliability</i> 150 (2023).","havard":"A.R. Shukla, R. Martin, R. Probst, J. Song, Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests, Microelectronics Reliability. 150 (2023).","mla":"Shukla, Abhay Rammurti, et al. “Comparison of Different Statistical Methods for Prediction of Lifetime of Electrical Connectors with Short Term Tests.” <i>Microelectronics Reliability</i>, vol. 150, 115216, 2023, <a href=\"https://doi.org/10.1016/j.microrel.2023.115216\">https://doi.org/10.1016/j.microrel.2023.115216</a>.","bjps":"<b>Shukla AR <i>et al.</i></b> (2023) Comparison of Different Statistical Methods for Prediction of Lifetime of Electrical Connectors with Short Term Tests. <i>Microelectronics Reliability</i> <b>150</b>.","short":"A.R. Shukla, R. Martin, R. Probst, J. Song, Microelectronics Reliability 150 (2023).","chicago-de":"Shukla, Abhay Rammurti, Robert Martin, Roman Probst und Jian Song. 2023. Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests. <i>Microelectronics Reliability</i> 150. doi:<a href=\"https://doi.org/10.1016/j.microrel.2023.115216\">10.1016/j.microrel.2023.115216</a>, .","din1505-2-1":"<span style=\"font-variant:small-caps;\">Shukla, Abhay Rammurti</span> ; <span style=\"font-variant:small-caps;\">Martin, Robert</span> ; <span style=\"font-variant:small-caps;\">Probst, Roman</span> ; <span style=\"font-variant:small-caps;\">Song, Jian</span>: Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests. In: <i>Microelectronics Reliability</i> Bd. 150. Amsterdam, Elsevier  (2023)"},"volume":150,"title":"Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests","status":"public","year":"2023","author":[{"id":"74188","first_name":"Abhay Rammurti","full_name":"Shukla, Abhay Rammurti","last_name":"Shukla"},{"full_name":"Martin, Robert","last_name":"Martin","first_name":"Robert"},{"id":"69156","first_name":"Roman","full_name":"Probst, Roman","last_name":"Probst"},{"full_name":"Song, Jian","id":"5297","first_name":"Jian","last_name":"Song"}],"external_id":{"isi":["001106942700001"]}},{"publication_status":"published","abstract":[{"lang":"eng","text":"The function and reliability of electrical connectors in automotive applications is crucial for vehicle safety, especially with regard to E-mobility and autonomous driving. For this reason, electrical connectors are being developed for long-term use applications. However, a small amount of function failures are still being observed in long-term use field vehicles. In this study all electrical connectors of five long-term driven vehicles from various car manufacturers are disassembled and analyzed. The same analysis procedure is followed for every vehicle and the electrical resistance of the connectors is measured to determine electrical failures. The contacts of failed connectors are further analyzed using optical microscopy, XRF spectroscopy, EDS and detailed contact resistance mapping. By comparing the connectors with electrical failures to the same types of connectors with a proper electrical resistance, failure mechanisms can be detected and analyzed. The frequency of various failure mechanisms is statistically evaluated. The results of the analysis provide valuable indications with respect to improvement of the reliability of connectors."}],"conference":{"name":"67th Holm Conference on Electrical Contacts","location":"Tampa, FL, USA","start_date":"2022-10-23","end_date":"2022-10-26"},"department":[{"_id":"DEP6012"}],"publisher":"IEEE","type":"conference_editor_article","user_id":"83781","_id":"9213","doi":"10.1109/HLM54538.2022.9969820","place":"Piscataway, NJ","title":"The Analysis of Failure Mechanisms of Electrical Connectors in Long-term Use Field Vehicles","citation":{"short":"D. Hilmert, H. Yuan, J. Song, The Analysis of Failure Mechanisms of Electrical Connectors in Long-Term Use Field Vehicles, IEEE, Piscataway, NJ, 2022.","din1505-2-1":"<span style=\"font-variant:small-caps;\">Hilmert, Dirk</span> ; <span style=\"font-variant:small-caps;\">Yuan, Haomiao</span> ; <span style=\"font-variant:small-caps;\">Song, Jian</span>: <i>The Analysis of Failure Mechanisms of Electrical Connectors in Long-term Use Field Vehicles</i>. Piscataway, NJ : IEEE, 2022","chicago-de":"Hilmert, Dirk, Haomiao Yuan und Jian Song. 2022. <i>The Analysis of Failure Mechanisms of Electrical Connectors in Long-term Use Field Vehicles</i>. <i>Electrical contacts - 2022 : proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts</i>. Piscataway, NJ: IEEE. doi:<a href=\"https://doi.org/10.1109/HLM54538.2022.9969820\">10.1109/HLM54538.2022.9969820</a>, .","van":"Hilmert D, Yuan H, Song J. The Analysis of Failure Mechanisms of Electrical Connectors in Long-term Use Field Vehicles. Electrical contacts - 2022 : proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts. Piscataway, NJ: IEEE; 2022.","ama":"Hilmert D, Yuan H, Song J. <i>The Analysis of Failure Mechanisms of Electrical Connectors in Long-Term Use Field Vehicles</i>. IEEE; 2022:9-16. doi:<a href=\"https://doi.org/10.1109/HLM54538.2022.9969820\">10.1109/HLM54538.2022.9969820</a>","ufg":"<b>Hilmert, Dirk/Yuan, Haomiao/Song, Jian</b>: The Analysis of Failure Mechanisms of Electrical Connectors in Long-term Use Field Vehicles, Piscataway, NJ 2022.","havard":"D. Hilmert, H. Yuan, J. Song, The Analysis of Failure Mechanisms of Electrical Connectors in Long-term Use Field Vehicles, IEEE, Piscataway, NJ, 2022.","bjps":"<b>Hilmert D, Yuan H and Song J</b> (2022) <i>The Analysis of Failure Mechanisms of Electrical Connectors in Long-Term Use Field Vehicles</i>. Piscataway, NJ: IEEE.","mla":"Hilmert, Dirk, et al. “The Analysis of Failure Mechanisms of Electrical Connectors in Long-Term Use Field Vehicles.” <i>Electrical Contacts - 2022 : Proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts</i>, IEEE, 2022, pp. 9–16, <a href=\"https://doi.org/10.1109/HLM54538.2022.9969820\">https://doi.org/10.1109/HLM54538.2022.9969820</a>.","apa":"Hilmert, D., Yuan, H., &#38; Song, J. (2022). The Analysis of Failure Mechanisms of Electrical Connectors in Long-term Use Field Vehicles. In <i>Electrical contacts - 2022 : proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts</i> (pp. 9–16). IEEE. <a href=\"https://doi.org/10.1109/HLM54538.2022.9969820\">https://doi.org/10.1109/HLM54538.2022.9969820</a>","ieee":"D. Hilmert, H. Yuan, and J. Song, <i>The Analysis of Failure Mechanisms of Electrical Connectors in Long-term Use Field Vehicles</i>. Piscataway, NJ: IEEE, 2022, pp. 9–16. doi: <a href=\"https://doi.org/10.1109/HLM54538.2022.9969820\">10.1109/HLM54538.2022.9969820</a>.","chicago":"Hilmert, Dirk, Haomiao Yuan, and Jian Song. <i>The Analysis of Failure Mechanisms of Electrical Connectors in Long-Term Use Field Vehicles</i>. <i>Electrical Contacts - 2022 : Proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts</i>. Piscataway, NJ: IEEE, 2022. <a href=\"https://doi.org/10.1109/HLM54538.2022.9969820\">https://doi.org/10.1109/HLM54538.2022.9969820</a>."},"author":[{"first_name":"Dirk","full_name":"Hilmert, Dirk","id":"74212","last_name":"Hilmert"},{"last_name":"Yuan","id":"61860","full_name":"Yuan, Haomiao","first_name":"Haomiao"},{"first_name":"Jian","id":"5297","full_name":"Song, Jian","last_name":"Song"}],"year":"2022","status":"public","page":"9 - 16","publication_identifier":{"eisbn":["978-1-6654-5965-5"],"issn":["2158-9992"],"isbn":["978-1-6654-5966-2","978-1-6654-5967-9"]},"publication":"Electrical contacts - 2022 : proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts","date_created":"2022-12-11T13:55:18Z","date_updated":"2024-08-05T08:18:13Z","keyword":["Connectors","Resistance","Spectroscopy","Optical microscopy","Microscopy","Vehicle safety","Failure analysis"],"language":[{"iso":"eng"}]},{"intvolume":"       138","user_id":"83781","type":"journal_article","doi":"10.1007/s00502-021-00927-9","_id":"6932","publication_status":"published","isi":"1","publisher":"Springer","abstract":[{"text":"n order to ensure the safety and security of industrial systems with regard to all life cycle phases from development through operation to disposal, specific regulatory and normative requirements are imposed. Due to the digitalization, interconnection, and constantly increasing complexity of manufacturing systems in the context of Industrie 4.0, the manual effort necessary to achieve the required safety and security is becoming ever greater and almost impossible to manage, especially for small and medium-sized enterprises. Therefore, this paper examines the existing challenges in this area in more detail and gives an outlook on the possible solutions to ensure safety and security much quicker and with less manual effort. The overall vision is a (partially) automated risk assessment of modular systems with respect to safety and security, including the alignment of the corresponding processes from both domains and the formalization of the information models needed.","lang":"eng"}],"issue":"6","department":[{"_id":"DEP5019"},{"_id":"DEP5023"}],"date_updated":"2025-06-26T13:28:58Z","date_created":"2021-12-23T17:37:45Z","publication":"Elektrotechnik und Informationstechnik : e & i","publication_identifier":{"eissn":["1613-7620"],"issn":["0932-383X"]},"language":[{"iso":"eng"}],"keyword":["safety","security","alignment","automation","processes","models"],"citation":{"chicago":"Ehrlich, Marco, Andre Bröring, Dimitri Harder, Torben Auhagen-Meyer, Philip Kleen, Lukasz Wisniewski, Henning Trsek, and Jürgen Jasperneite. “Alignment of Safety and Security Risk Assessments for Modular Production Systems.” <i>Elektrotechnik Und Informationstechnik : E &#38; i</i> 138, no. 6 (2021): 454–61. <a href=\"https://doi.org/10.1007/s00502-021-00927-9\">https://doi.org/10.1007/s00502-021-00927-9</a>.","apa":"Ehrlich, M., Bröring, A., Harder, D., Auhagen-Meyer, T., Kleen, P., Wisniewski, L., Trsek, H., &#38; Jasperneite, J. (2021). Alignment of safety and security risk assessments for modular production systems. <i>Elektrotechnik Und Informationstechnik : E &#38; i</i>, <i>138</i>(6), 454–461. <a href=\"https://doi.org/10.1007/s00502-021-00927-9\">https://doi.org/10.1007/s00502-021-00927-9</a>","havard":"M. Ehrlich, A. Bröring, D. Harder, T. Auhagen-Meyer, P. Kleen, L. Wisniewski, H. Trsek, J. Jasperneite, Alignment of safety and security risk assessments for modular production systems, Elektrotechnik Und Informationstechnik : E &#38; i. 138 (2021) 454–461.","bjps":"<b>Ehrlich M <i>et al.</i></b> (2021) Alignment of Safety and Security Risk Assessments for Modular Production Systems. <i>Elektrotechnik und Informationstechnik : e &#38; i</i> <b>138</b>, 454–461.","mla":"Ehrlich, Marco, et al. “Alignment of Safety and Security Risk Assessments for Modular Production Systems.” <i>Elektrotechnik Und Informationstechnik : E &#38; i</i>, vol. 138, no. 6, 2021, pp. 454–61, <a href=\"https://doi.org/10.1007/s00502-021-00927-9\">https://doi.org/10.1007/s00502-021-00927-9</a>.","ufg":"<b>Ehrlich, Marco u. a.</b>: Alignment of safety and security risk assessments for modular production systems, in: <i>Elektrotechnik und Informationstechnik : e &#38; i</i> 138 (2021), H. 6,  S. 454–461.","van":"Ehrlich M, Bröring A, Harder D, Auhagen-Meyer T, Kleen P, Wisniewski L, et al. Alignment of safety and security risk assessments for modular production systems. Elektrotechnik und Informationstechnik : e &#38; i. 2021;138(6):454–61.","din1505-2-1":"<span style=\"font-variant:small-caps;\">Ehrlich, Marco</span> ; <span style=\"font-variant:small-caps;\">Bröring, Andre</span> ; <span style=\"font-variant:small-caps;\">Harder, Dimitri</span> ; <span style=\"font-variant:small-caps;\">Auhagen-Meyer, Torben</span> ; <span style=\"font-variant:small-caps;\">Kleen, Philip</span> ; <span style=\"font-variant:small-caps;\">Wisniewski, Lukasz</span> ; <span style=\"font-variant:small-caps;\">Trsek, Henning</span> ; <span style=\"font-variant:small-caps;\">Jasperneite, Jürgen</span>: Alignment of safety and security risk assessments for modular production systems. In: <i>Elektrotechnik und Informationstechnik : e &#38; i</i> Bd. 138, Springer (2021), Nr. 6, S. 454–461","chicago-de":"Ehrlich, Marco, Andre Bröring, Dimitri Harder, Torben Auhagen-Meyer, Philip Kleen, Lukasz Wisniewski, Henning Trsek und Jürgen Jasperneite. 2021. Alignment of safety and security risk assessments for modular production systems. <i>Elektrotechnik und Informationstechnik : e &#38; i</i> 138, Nr. 6: 454–461. doi:<a href=\"https://doi.org/10.1007/s00502-021-00927-9\">10.1007/s00502-021-00927-9</a>, .","short":"M. Ehrlich, A. Bröring, D. Harder, T. Auhagen-Meyer, P. Kleen, L. Wisniewski, H. Trsek, J. Jasperneite, Elektrotechnik Und Informationstechnik : E &#38; i 138 (2021) 454–461.","ieee":"M. Ehrlich <i>et al.</i>, “Alignment of safety and security risk assessments for modular production systems,” <i>Elektrotechnik und Informationstechnik : e &#38; i</i>, vol. 138, no. 6, pp. 454–461, 2021, doi: <a href=\"https://doi.org/10.1007/s00502-021-00927-9\">10.1007/s00502-021-00927-9</a>.","ama":"Ehrlich M, Bröring A, Harder D, et al. Alignment of safety and security risk assessments for modular production systems. <i>Elektrotechnik und Informationstechnik : e &#38; i</i>. 2021;138(6):454-461. doi:<a href=\"https://doi.org/10.1007/s00502-021-00927-9\">10.1007/s00502-021-00927-9</a>"},"volume":138,"title":"Alignment of safety and security risk assessments for modular production systems","page":"454-461","status":"public","external_id":{"isi":["000696142100001"]},"author":[{"first_name":"Marco","full_name":"Ehrlich, Marco","last_name":"Ehrlich","id":"61562"},{"first_name":"Andre","full_name":"Bröring, Andre","id":"65130","last_name":"Bröring"},{"full_name":"Harder, Dimitri","id":"69147","last_name":"Harder","first_name":"Dimitri"},{"full_name":"Auhagen-Meyer, Torben","first_name":"Torben","last_name":"Auhagen-Meyer"},{"first_name":"Philip","id":"44776","last_name":"Kleen","full_name":"Kleen, Philip"},{"first_name":"Lukasz","id":"1710","full_name":"Wisniewski, Lukasz","last_name":"Wisniewski"},{"first_name":"Henning","id":"1486","last_name":"Trsek","full_name":"Trsek, Henning","orcid":"0000-0002-0133-0656"},{"first_name":"Jürgen","id":"1899","last_name":"Jasperneite","full_name":"Jasperneite, Jürgen"}],"year":"2021"},{"series_title":" Technologien für die intelligente Automation","publication_status":"published","abstract":[{"text":"In diesem Open-Access-Tagungsband sind die besten Beiträge des 9. Jahreskolloquiums \"Kommunikation in der Automation\" (KommA 2018) und des 6. Jahreskolloquiums \"Bildverarbeitung in der Automation\" (BVAu 2018) enthalten. Die Kolloquien fanden am 20. und 21. November 2018 in der SmartFactoryOWL, einer gemeinsamen Einrichtung des Fraunhofer IOSB-INA und der Technischen Hochschule Ostwestfalen-Lippe statt.\r\nDie vorgestellten neuesten Forschungsergebnisse auf den Gebieten der industriellen Kommunikationstechnik und Bildverarbeitung erweitern den aktuellen Stand der Forschung und Technik. Die in den Beiträgen enthaltenen anschaulichen Beispiele aus dem Bereich der Automation setzen die Ergebnisse in den direkten Anwendungsbezug.","lang":"ger"}],"department":[{"_id":"DEP5023"},{"_id":"DEP5019"}],"conference":{"location":"Lemgo","name":"9. Jahreskolloquiums \"Kommunikation in der Automation\" (KommA 2018) / 6. Jahreskolloquiums \"Bildverarbeitung in der Automation\" (BVAu 2018)","start_date":"2018-11-20","end_date":"20218-11-21"},"publisher":"Springer Vieweg","type":"book_editor","intvolume":"        12","user_id":"83781","_id":"4851","doi":"https://doi.org/10.1007/978-3-662-59895-5","place":"Berlin, Heidelberg","title":"Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2018","volume":12,"citation":{"van":"Jasperneite J, Lohweg V, editors. Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2018. Berlin, Heidelberg: Springer Vieweg; 2020. 364 p. ( Technologien für die intelligente Automation; vol. 12).","ama":"Jasperneite J, Lohweg V, eds. <i>Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2018</i>. Vol 12. Springer Vieweg; 2020. doi:<a href=\"https://doi.org/10.1007/978-3-662-59895-5\">https://doi.org/10.1007/978-3-662-59895-5</a>","ufg":"<i>Jasperneite, Jürgen</i>/<i>Lohweg, Volker</i>: Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2018, Bd. 12, Berlin, Heidelberg 2020 ( Technologien für die intelligente Automation).","havard":"J. Jasperneite, V. Lohweg, eds., Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2018, Springer Vieweg, Berlin, Heidelberg, 2020.","mla":"Jasperneite, Jürgen, and Volker Lohweg, editors. <i>Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2018</i>. Springer Vieweg, 2020, <a href=\"https://doi.org/10.1007/978-3-662-59895-5\">https://doi.org/10.1007/978-3-662-59895-5</a>.","bjps":"<b>Jasperneite J and Lohweg V (eds)</b> (2020) <i>Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2018</i>. Berlin, Heidelberg: Springer Vieweg.","apa":"Jasperneite, J., &#38; Lohweg, V. (Eds.). (2020). <i>Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2018</i> (Vol. 12). Springer Vieweg. <a href=\"https://doi.org/10.1007/978-3-662-59895-5\">https://doi.org/10.1007/978-3-662-59895-5</a>","ieee":"J. Jasperneite and V. Lohweg, Eds., <i>Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2018</i>, vol. 12. Berlin, Heidelberg: Springer Vieweg, 2020. doi: <a href=\"https://doi.org/10.1007/978-3-662-59895-5\">https://doi.org/10.1007/978-3-662-59895-5</a>.","chicago":"Jasperneite, Jürgen, and Volker Lohweg, eds. <i>Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2018</i>. Vol. 12.  Technologien für die intelligente Automation. Berlin, Heidelberg: Springer Vieweg, 2020. <a href=\"https://doi.org/10.1007/978-3-662-59895-5\">https://doi.org/10.1007/978-3-662-59895-5</a>.","short":"J. Jasperneite, V. Lohweg, eds., Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2018, Springer Vieweg, Berlin, Heidelberg, 2020.","din1505-2-1":"<span style=\"font-variant:small-caps;\">Jasperneite, J.</span> ; <span style=\"font-variant:small-caps;\">Lohweg, V.</span> (Hrsg.): <i>Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2018</i>, <i> Technologien für die intelligente Automation</i>. Bd. 12. Berlin, Heidelberg : Springer Vieweg, 2020","chicago-de":"Jasperneite, Jürgen und Volker Lohweg, Hrsg. 2020. <i>Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2018</i>. Bd. 12.  Technologien für die intelligente Automation. Berlin, Heidelberg: Springer Vieweg. doi:<a href=\"https://doi.org/10.1007/978-3-662-59895-5\">https://doi.org/10.1007/978-3-662-59895-5</a>, ."},"main_file_link":[{"url":"https://link.springer.com/book/10.1007/978-3-662-59895-5?page=2#about","open_access":"1"}],"year":"2020","status":"public","page":"364","publication_identifier":{"eisbn":["978-3-662-59895-5"],"issn":["2522-8579"],"isbn":["978-3-662-59894-8"],"eissn":["2522-8587"]},"date_created":"2021-02-02T13:12:47Z","editor":[{"first_name":"Jürgen","last_name":"Jasperneite","full_name":"Jasperneite, Jürgen","id":"1899"},{"id":"1804","first_name":"Volker","last_name":"Lohweg","full_name":"Lohweg, Volker","orcid":"0000-0002-3325-7887"}],"date_updated":"2025-05-12T08:07:26Z","oa":"1","keyword":["Industrielle Kommunikationstechnik Industrielle Bildverarbeitung Network reliability and redundancy methods Networked Control Systems Wireless real-time communication Open Access quality control","reliability","safety and risk"],"language":[{"iso":"ger"}]},{"year":"2017","status":"public","page":"295","title":" Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2016 zum 10jährigen Jubiläum des inIT - Institut für industrielle Informationstechnik","volume":7,"citation":{"apa":"Jasperneite, J., &#38; Lohweg, V. (Eds.). (2017). <i> Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2016 zum 10jährigen Jubiläum des inIT - Institut für industrielle Informationstechnik</i> (Vol. 7). Springer Vieweg. <a href=\"https://doi.org/10.1007/978-3-662-55232-2\">https://doi.org/10.1007/978-3-662-55232-2</a>","ieee":"J. Jasperneite and V. Lohweg, Eds., <i> Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2016 zum 10jährigen Jubiläum des inIT - Institut für industrielle Informationstechnik</i>, vol. 7. Berlin: Springer Vieweg, 2017. doi: <a href=\"https://doi.org/10.1007/978-3-662-55232-2\">10.1007/978-3-662-55232-2</a>.","chicago":"Jasperneite, Jürgen, and Volker Lohweg, eds. <i> Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2016 zum 10jährigen Jubiläum des inIT - Institut für industrielle Informationstechnik</i>. Vol. 7. Technologien für die intelligente Automation . Berlin: Springer Vieweg, 2017. <a href=\"https://doi.org/10.1007/978-3-662-55232-2\">https://doi.org/10.1007/978-3-662-55232-2</a>.","van":"Jasperneite J, Lohweg V, editors.  Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2016 zum 10jährigen Jubiläum des inIT - Institut für industrielle Informationstechnik. Berlin: Springer Vieweg; 2017. 295 p. (Technologien für die intelligente Automation ; vol. 7).","ama":"Jasperneite J, Lohweg V, eds. <i> Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2016 zum 10jährigen Jubiläum des inIT - Institut für industrielle Informationstechnik</i>. Vol 7. Springer Vieweg; 2017. doi:<a href=\"https://doi.org/10.1007/978-3-662-55232-2\">10.1007/978-3-662-55232-2</a>","ufg":"<i>Jasperneite, Jürgen</i>/<i>Lohweg, Volker</i>:  Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2016 zum 10jährigen Jubiläum des inIT - Institut für industrielle Informationstechnik, Bd. 7, Berlin 2017 (Technologien für die intelligente Automation ).","bjps":"<b>Jasperneite J and Lohweg V (eds)</b> (2017) <i> Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2016 zum 10jährigen Jubiläum des inIT - Institut für industrielle Informationstechnik</i>. Berlin: Springer Vieweg.","havard":"J. Jasperneite, V. Lohweg, eds.,  Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2016 zum 10jährigen Jubiläum des inIT - Institut für industrielle Informationstechnik, Springer Vieweg, Berlin, 2017.","mla":"Jasperneite, Jürgen, and Volker Lohweg, editors. <i> Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2016 zum 10jährigen Jubiläum des inIT - Institut für industrielle Informationstechnik</i>. Springer Vieweg, 2017, <a href=\"https://doi.org/10.1007/978-3-662-55232-2\">https://doi.org/10.1007/978-3-662-55232-2</a>.","short":"J. Jasperneite, V. Lohweg, eds.,  Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2016 zum 10jährigen Jubiläum des inIT - Institut für industrielle Informationstechnik, Springer Vieweg, Berlin, 2017.","din1505-2-1":"<span style=\"font-variant:small-caps;\">Jasperneite, J.</span> ; <span style=\"font-variant:small-caps;\">Lohweg, V.</span> (Hrsg.): <i> Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2016 zum 10jährigen Jubiläum des inIT - Institut für industrielle Informationstechnik</i>, <i>Technologien für die intelligente Automation </i>. Bd. 7. Berlin : Springer Vieweg, 2017","chicago-de":"Jasperneite, Jürgen und Volker Lohweg, Hrsg. 2017. <i> Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2016 zum 10jährigen Jubiläum des inIT - Institut für industrielle Informationstechnik</i>. Bd. 7. Technologien für die intelligente Automation . Berlin: Springer Vieweg. doi:<a href=\"https://doi.org/10.1007/978-3-662-55232-2\">10.1007/978-3-662-55232-2</a>, ."},"keyword":["Industrielle Kommunikationstechnik","Industrielle Bildverarbeitung","network reliability and redundancy methods","Networked Controls Systems","wireless real-time communication","quality control","reliability","safety and risk"],"language":[{"iso":"ger"}],"publication_identifier":{"isbn":["978-3-662-55231-5"],"eisbn":["978-3-662-55232-2 "]},"date_created":"2021-01-22T08:40:04Z","editor":[{"first_name":"Jürgen","id":"1899","full_name":"Jasperneite, Jürgen","last_name":"Jasperneite"},{"orcid":"0000-0002-3325-7887","first_name":"Volker","last_name":"Lohweg","full_name":"Lohweg, Volker","id":"1804"}],"date_updated":"2025-05-12T08:19:51Z","abstract":[{"lang":"ger","text":"In diesem Tagungsband sind die besten Beiträge des 7. Jahreskolloquiums \"Kommunikation in der Automation\" (KommA 2016) und des  5. Jahreskolloquiums \"Bildverarbeitung in der Automation\" (BVAu 2016) enthalten. Die Kolloquien fanden am 30. November und 1. Dezember 2016 anlässlich des 10jährigen Jubiläums des inIT - Institut für industrielle Informationstechnik in der SmartFactoryOWL, einer herstellerunabhängigen und offenen Industrie 4.0 Forschungs- und Demonstrationsplattform und zugleich Testfeld für den Mittelstand, in Lemgo statt.\r\nDie vorgestellten neuesten Forschungsergebnisse auf den Gebieten der industriellen Kommunikationstechnik und Bildverarbeitung erweitern den aktuellen Stand der Forschung und Technik. Die in den Beiträgen enthaltenen anschauliche Anwendungsbeispiele aus dem Bereich der Automation setzen die Ergebnisse in den direkten Anwendungsbezug."}],"conference":{"start_date":"2016-11-30","end_date":"2026-12-01","name":"7. Jahreskolloquiums \"Kommunikation in der Automation\" (KommA 2016)  /  5. Jahreskolloquiums \"Bildverarbeitung in der Automation\" (BVAu 2016)","location":"Lemgo"},"department":[{"_id":"DEP5023"}],"publisher":"Springer Vieweg","series_title":"Technologien für die intelligente Automation ","publication_status":"published","_id":"4506","doi":"10.1007/978-3-662-55232-2","place":"Berlin","type":"book_editor","intvolume":"         7","user_id":"83781"}]