--- _id: '12391' abstract: - lang: eng text: 'Daylight saving time (DST) affects millions of people in various everyday situations and is a common topic of debate in legislative parliaments around the world. This paper presents a literature review on the effects of the clock change and DST on electricity usage, health, crime rates, road safety, and economic aspects. This addresses a gap in current literature reviews, as there is a lack of linked analyses considering these research fields. We show that there are partial positive effects on crime rates and road safety generally that result from the delay in ambient light availability. This contrasts with the clearly negative effects on health and the economic aspects, which are mainly driven by the disturbed circadian rhythm and the resulting sleep problems. Furthermore, we find that the initial idea of DST to save electricity will probably no longer apply and may even lead to increased usage. This literature review provides a basis for future research and promotes interdisciplinary research by summarizing current findings in a cross-disciplinary manner and identifying research gaps and opportunities. Furthermore, the findings may guide policy-making discussions and decisions. ' author: - first_name: Philipp full_name: Neumann, Philipp id: '74431' last_name: Neumann - first_name: Korbinian full_name: von Blanckenburg, Korbinian id: '58841' last_name: von Blanckenburg citation: ama: Neumann P, von Blanckenburg K. What Time Will It Be? A Comprehensive Literature Review on Daylight Saving Time. Time & Society. Published online 2025. doi:10.1177/0961463x241310562 apa: Neumann, P., & von Blanckenburg, K. (2025). What Time Will It Be? A Comprehensive Literature Review on Daylight Saving Time. Time & Society. https://doi.org/10.1177/0961463x241310562 bjps: Neumann P and von Blanckenburg K (2025) What Time Will It Be? A Comprehensive Literature Review on Daylight Saving Time. Time & Society. chicago: Neumann, Philipp, and Korbinian von Blanckenburg. “What Time Will It Be? A Comprehensive Literature Review on Daylight Saving Time.” Time & Society, 2025. https://doi.org/10.1177/0961463x241310562. chicago-de: Neumann, Philipp und Korbinian von Blanckenburg. 2025. What Time Will It Be? A Comprehensive Literature Review on Daylight Saving Time. Time & Society. doi:10.1177/0961463x241310562, . din1505-2-1: 'Neumann, Philipp ; von Blanckenburg, Korbinian: What Time Will It Be? A Comprehensive Literature Review on Daylight Saving Time. In: Time & Society. London, SAGE Publications (2025)' havard: P. Neumann, K. von Blanckenburg, What Time Will It Be? A Comprehensive Literature Review on Daylight Saving Time, Time & Society. (2025). ieee: 'P. Neumann and K. von Blanckenburg, “What Time Will It Be? A Comprehensive Literature Review on Daylight Saving Time,” Time & Society, 2025, doi: 10.1177/0961463x241310562.' mla: Neumann, Philipp, and Korbinian von Blanckenburg. “What Time Will It Be? A Comprehensive Literature Review on Daylight Saving Time.” Time & Society, 2025, https://doi.org/10.1177/0961463x241310562. short: P. Neumann, K. von Blanckenburg, Time & Society (2025). ufg: 'Neumann, Philipp/Blanckenburg, Korbinian von: What Time Will It Be? A Comprehensive Literature Review on Daylight Saving Time, in: Time & Society (2025).' van: Neumann P, von Blanckenburg K. What Time Will It Be? A Comprehensive Literature Review on Daylight Saving Time. Time & Society. 2025; date_created: 2025-01-24T08:29:06Z date_updated: 2025-06-25T07:06:10Z department: - _id: DEP1514 doi: 10.1177/0961463x241310562 external_id: isi: - '001400931200001' isi: '1' keyword: - circadian rhythm - clock chang - crime rates - daylight saving time - economic aspects - electricity usage - health - road safety - sleep deprivation language: - iso: eng place: London publication: Time & Society publication_identifier: eissn: - 1461-7463 issn: - 0961-463X publication_status: published publisher: SAGE Publications quality_controlled: '1' status: public title: What Time Will It Be? A Comprehensive Literature Review on Daylight Saving Time type: scientific_journal_article user_id: '83781' year: '2025' ... --- _id: '11348' abstract: - lang: eng text: Lifetime is an important feature defining the reliability of electrical connectors. In general practice, the lifetime tests required for reliability estimation are time and labor intensive. In our previous work, a data driven method using a statistical process, with an application of probability distributions such as standard normal distribution and generalized extreme value (GEV) distribution with negative skewness to predict degradation paths, was introduced for estimation of the lifetime and FIT rate with the help of electrical contact resistance data collected from short term tests. The proposed method proved its significance by showing the possibility of drastic reduction in the lifetime test duration required for reliability determination. In this work, a non-parametric distribution free method using percentiles of actual measured contact resistances is used for determining the lifetime as against the percentiles of probability distribution used in previous work, thereby simplifying the process further and leading to an even more precise estimation. The lifetimes calculated from parametric and non-parametric methods are compared to highlight the significance of distribution free method in reliability estimation. article_number: '115216' article_type: original author: - first_name: Abhay Rammurti full_name: Shukla, Abhay Rammurti id: '74188' last_name: Shukla - first_name: Robert full_name: Martin, Robert last_name: Martin - first_name: Roman full_name: Probst, Roman id: '69156' last_name: Probst - first_name: Jian full_name: Song, Jian id: '5297' last_name: Song citation: ama: Shukla AR, Martin R, Probst R, Song J. Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests. Microelectronics Reliability. 2023;150. doi:10.1016/j.microrel.2023.115216 apa: Shukla, A. R., Martin, R., Probst, R., & Song, J. (2023). Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests. Microelectronics Reliability, 150, Article 115216. https://doi.org/10.1016/j.microrel.2023.115216 bjps: Shukla AR et al. (2023) Comparison of Different Statistical Methods for Prediction of Lifetime of Electrical Connectors with Short Term Tests. Microelectronics Reliability 150. chicago: Shukla, Abhay Rammurti, Robert Martin, Roman Probst, and Jian Song. “Comparison of Different Statistical Methods for Prediction of Lifetime of Electrical Connectors with Short Term Tests.” Microelectronics Reliability 150 (2023). https://doi.org/10.1016/j.microrel.2023.115216. chicago-de: Shukla, Abhay Rammurti, Robert Martin, Roman Probst und Jian Song. 2023. Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests. Microelectronics Reliability 150. doi:10.1016/j.microrel.2023.115216, . din1505-2-1: 'Shukla, Abhay Rammurti ; Martin, Robert ; Probst, Roman ; Song, Jian: Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests. In: Microelectronics Reliability Bd. 150. Amsterdam, Elsevier (2023)' havard: A.R. Shukla, R. Martin, R. Probst, J. Song, Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests, Microelectronics Reliability. 150 (2023). ieee: 'A. R. Shukla, R. Martin, R. Probst, and J. Song, “Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests,” Microelectronics Reliability, vol. 150, Art. no. 115216, 2023, doi: 10.1016/j.microrel.2023.115216.' mla: Shukla, Abhay Rammurti, et al. “Comparison of Different Statistical Methods for Prediction of Lifetime of Electrical Connectors with Short Term Tests.” Microelectronics Reliability, vol. 150, 115216, 2023, https://doi.org/10.1016/j.microrel.2023.115216. short: A.R. Shukla, R. Martin, R. Probst, J. Song, Microelectronics Reliability 150 (2023). ufg: 'Shukla, Abhay Rammurti u. a.: Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests, in: Microelectronics Reliability 150 (2023).' van: Shukla AR, Martin R, Probst R, Song J. Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests. Microelectronics Reliability. 2023;150. date_created: 2024-04-18T08:55:38Z date_updated: 2025-06-26T07:51:25Z department: - _id: DEP6012 doi: 10.1016/j.microrel.2023.115216 external_id: isi: - '001106942700001' has_accepted_license: '1' intvolume: ' 150' isi: '1' keyword: - Electrical and Electronic Engineering - Surfaces - Coatings and Films - Safety - Risk - Reliability and Quality - Condensed Matter Physics - Atomic and Molecular Physics - and Optics - Electronic - Optical and Magnetic Materials language: - iso: eng place: Amsterdam publication: Microelectronics Reliability publication_identifier: issn: - 0026-2714 unknown: - 1872-941X publication_status: published publisher: 'Elsevier ' status: public title: Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests type: scientific_journal_article user_id: '83781' volume: 150 year: '2023' ... --- _id: '9213' abstract: - lang: eng text: The function and reliability of electrical connectors in automotive applications is crucial for vehicle safety, especially with regard to E-mobility and autonomous driving. For this reason, electrical connectors are being developed for long-term use applications. However, a small amount of function failures are still being observed in long-term use field vehicles. In this study all electrical connectors of five long-term driven vehicles from various car manufacturers are disassembled and analyzed. The same analysis procedure is followed for every vehicle and the electrical resistance of the connectors is measured to determine electrical failures. The contacts of failed connectors are further analyzed using optical microscopy, XRF spectroscopy, EDS and detailed contact resistance mapping. By comparing the connectors with electrical failures to the same types of connectors with a proper electrical resistance, failure mechanisms can be detected and analyzed. The frequency of various failure mechanisms is statistically evaluated. The results of the analysis provide valuable indications with respect to improvement of the reliability of connectors. author: - first_name: Dirk full_name: Hilmert, Dirk id: '74212' last_name: Hilmert - first_name: Haomiao full_name: Yuan, Haomiao id: '61860' last_name: Yuan - first_name: Jian full_name: Song, Jian id: '5297' last_name: Song citation: ama: Hilmert D, Yuan H, Song J. The Analysis of Failure Mechanisms of Electrical Connectors in Long-Term Use Field Vehicles. IEEE; 2022:9-16. doi:10.1109/HLM54538.2022.9969820 apa: 'Hilmert, D., Yuan, H., & Song, J. (2022). The Analysis of Failure Mechanisms of Electrical Connectors in Long-term Use Field Vehicles. In Electrical contacts - 2022 : proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts (pp. 9–16). IEEE. https://doi.org/10.1109/HLM54538.2022.9969820' bjps: 'Hilmert D, Yuan H and Song J (2022) The Analysis of Failure Mechanisms of Electrical Connectors in Long-Term Use Field Vehicles. Piscataway, NJ: IEEE.' chicago: 'Hilmert, Dirk, Haomiao Yuan, and Jian Song. The Analysis of Failure Mechanisms of Electrical Connectors in Long-Term Use Field Vehicles. Electrical Contacts - 2022 : Proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts. Piscataway, NJ: IEEE, 2022. https://doi.org/10.1109/HLM54538.2022.9969820.' chicago-de: 'Hilmert, Dirk, Haomiao Yuan und Jian Song. 2022. The Analysis of Failure Mechanisms of Electrical Connectors in Long-term Use Field Vehicles. Electrical contacts - 2022 : proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts. Piscataway, NJ: IEEE. doi:10.1109/HLM54538.2022.9969820, .' din1505-2-1: 'Hilmert, Dirk ; Yuan, Haomiao ; Song, Jian: The Analysis of Failure Mechanisms of Electrical Connectors in Long-term Use Field Vehicles. Piscataway, NJ : IEEE, 2022' havard: D. Hilmert, H. Yuan, J. Song, The Analysis of Failure Mechanisms of Electrical Connectors in Long-term Use Field Vehicles, IEEE, Piscataway, NJ, 2022. ieee: 'D. Hilmert, H. Yuan, and J. Song, The Analysis of Failure Mechanisms of Electrical Connectors in Long-term Use Field Vehicles. Piscataway, NJ: IEEE, 2022, pp. 9–16. doi: 10.1109/HLM54538.2022.9969820.' mla: 'Hilmert, Dirk, et al. “The Analysis of Failure Mechanisms of Electrical Connectors in Long-Term Use Field Vehicles.” Electrical Contacts - 2022 : Proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts, IEEE, 2022, pp. 9–16, https://doi.org/10.1109/HLM54538.2022.9969820.' short: D. Hilmert, H. Yuan, J. Song, The Analysis of Failure Mechanisms of Electrical Connectors in Long-Term Use Field Vehicles, IEEE, Piscataway, NJ, 2022. ufg: 'Hilmert, Dirk/Yuan, Haomiao/Song, Jian: The Analysis of Failure Mechanisms of Electrical Connectors in Long-term Use Field Vehicles, Piscataway, NJ 2022.' van: 'Hilmert D, Yuan H, Song J. The Analysis of Failure Mechanisms of Electrical Connectors in Long-term Use Field Vehicles. Electrical contacts - 2022 : proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts. Piscataway, NJ: IEEE; 2022.' conference: end_date: 2022-10-26 location: Tampa, FL, USA name: 67th Holm Conference on Electrical Contacts start_date: 2022-10-23 date_created: 2022-12-11T13:55:18Z date_updated: 2024-08-05T08:18:13Z department: - _id: DEP6012 doi: 10.1109/HLM54538.2022.9969820 keyword: - Connectors - Resistance - Spectroscopy - Optical microscopy - Microscopy - Vehicle safety - Failure analysis language: - iso: eng page: 9 - 16 place: Piscataway, NJ publication: 'Electrical contacts - 2022 : proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts' publication_identifier: eisbn: - 978-1-6654-5965-5 isbn: - 978-1-6654-5966-2 - 978-1-6654-5967-9 issn: - 2158-9992 publication_status: published publisher: IEEE status: public title: The Analysis of Failure Mechanisms of Electrical Connectors in Long-term Use Field Vehicles type: conference_editor_article user_id: '83781' year: '2022' ... --- _id: '6932' abstract: - lang: eng text: n order to ensure the safety and security of industrial systems with regard to all life cycle phases from development through operation to disposal, specific regulatory and normative requirements are imposed. Due to the digitalization, interconnection, and constantly increasing complexity of manufacturing systems in the context of Industrie 4.0, the manual effort necessary to achieve the required safety and security is becoming ever greater and almost impossible to manage, especially for small and medium-sized enterprises. Therefore, this paper examines the existing challenges in this area in more detail and gives an outlook on the possible solutions to ensure safety and security much quicker and with less manual effort. The overall vision is a (partially) automated risk assessment of modular systems with respect to safety and security, including the alignment of the corresponding processes from both domains and the formalization of the information models needed. author: - first_name: Marco full_name: Ehrlich, Marco id: '61562' last_name: Ehrlich - first_name: Andre full_name: Bröring, Andre id: '65130' last_name: Bröring - first_name: Dimitri full_name: Harder, Dimitri id: '69147' last_name: Harder - first_name: Torben full_name: Auhagen-Meyer, Torben last_name: Auhagen-Meyer - first_name: Philip full_name: Kleen, Philip id: '44776' last_name: Kleen - first_name: Lukasz full_name: Wisniewski, Lukasz id: '1710' last_name: Wisniewski - first_name: Henning full_name: Trsek, Henning id: '1486' last_name: Trsek orcid: 0000-0002-0133-0656 - first_name: Jürgen full_name: Jasperneite, Jürgen id: '1899' last_name: Jasperneite citation: ama: 'Ehrlich M, Bröring A, Harder D, et al. Alignment of safety and security risk assessments for modular production systems. Elektrotechnik und Informationstechnik : e & i. 2021;138(6):454-461. doi:10.1007/s00502-021-00927-9' apa: 'Ehrlich, M., Bröring, A., Harder, D., Auhagen-Meyer, T., Kleen, P., Wisniewski, L., Trsek, H., & Jasperneite, J. (2021). Alignment of safety and security risk assessments for modular production systems. Elektrotechnik Und Informationstechnik : E & i, 138(6), 454–461. https://doi.org/10.1007/s00502-021-00927-9' bjps: 'Ehrlich M et al. (2021) Alignment of Safety and Security Risk Assessments for Modular Production Systems. Elektrotechnik und Informationstechnik : e & i 138, 454–461.' chicago: 'Ehrlich, Marco, Andre Bröring, Dimitri Harder, Torben Auhagen-Meyer, Philip Kleen, Lukasz Wisniewski, Henning Trsek, and Jürgen Jasperneite. “Alignment of Safety and Security Risk Assessments for Modular Production Systems.” Elektrotechnik Und Informationstechnik : E & i 138, no. 6 (2021): 454–61. https://doi.org/10.1007/s00502-021-00927-9.' chicago-de: 'Ehrlich, Marco, Andre Bröring, Dimitri Harder, Torben Auhagen-Meyer, Philip Kleen, Lukasz Wisniewski, Henning Trsek und Jürgen Jasperneite. 2021. Alignment of safety and security risk assessments for modular production systems. Elektrotechnik und Informationstechnik : e & i 138, Nr. 6: 454–461. doi:10.1007/s00502-021-00927-9, .' din1505-2-1: 'Ehrlich, Marco ; Bröring, Andre ; Harder, Dimitri ; Auhagen-Meyer, Torben ; Kleen, Philip ; Wisniewski, Lukasz ; Trsek, Henning ; Jasperneite, Jürgen: Alignment of safety and security risk assessments for modular production systems. In: Elektrotechnik und Informationstechnik : e & i Bd. 138, Springer (2021), Nr. 6, S. 454–461' havard: 'M. Ehrlich, A. Bröring, D. Harder, T. Auhagen-Meyer, P. Kleen, L. Wisniewski, H. Trsek, J. Jasperneite, Alignment of safety and security risk assessments for modular production systems, Elektrotechnik Und Informationstechnik : E & i. 138 (2021) 454–461.' ieee: 'M. Ehrlich et al., “Alignment of safety and security risk assessments for modular production systems,” Elektrotechnik und Informationstechnik : e & i, vol. 138, no. 6, pp. 454–461, 2021, doi: 10.1007/s00502-021-00927-9.' mla: 'Ehrlich, Marco, et al. “Alignment of Safety and Security Risk Assessments for Modular Production Systems.” Elektrotechnik Und Informationstechnik : E & i, vol. 138, no. 6, 2021, pp. 454–61, https://doi.org/10.1007/s00502-021-00927-9.' short: 'M. Ehrlich, A. Bröring, D. Harder, T. Auhagen-Meyer, P. Kleen, L. Wisniewski, H. Trsek, J. Jasperneite, Elektrotechnik Und Informationstechnik : E & i 138 (2021) 454–461.' ufg: 'Ehrlich, Marco u. a.: Alignment of safety and security risk assessments for modular production systems, in: Elektrotechnik und Informationstechnik : e & i 138 (2021), H. 6,  S. 454–461.' van: 'Ehrlich M, Bröring A, Harder D, Auhagen-Meyer T, Kleen P, Wisniewski L, et al. Alignment of safety and security risk assessments for modular production systems. Elektrotechnik und Informationstechnik : e & i. 2021;138(6):454–61.' date_created: 2021-12-23T17:37:45Z date_updated: 2025-06-26T13:28:58Z department: - _id: DEP5019 - _id: DEP5023 doi: 10.1007/s00502-021-00927-9 external_id: isi: - '000696142100001' intvolume: ' 138' isi: '1' issue: '6' keyword: - safety - security - alignment - automation - processes - models language: - iso: eng page: 454-461 publication: 'Elektrotechnik und Informationstechnik : e & i' publication_identifier: eissn: - 1613-7620 issn: - 0932-383X publication_status: published publisher: Springer status: public title: Alignment of safety and security risk assessments for modular production systems type: journal_article user_id: '83781' volume: 138 year: '2021' ... --- _id: '4851' abstract: - lang: ger text: "In diesem Open-Access-Tagungsband sind die besten Beiträge des 9. Jahreskolloquiums \"Kommunikation in der Automation\" (KommA 2018) und des 6. Jahreskolloquiums \"Bildverarbeitung in der Automation\" (BVAu 2018) enthalten. Die Kolloquien fanden am 20. und 21. November 2018 in der SmartFactoryOWL, einer gemeinsamen Einrichtung des Fraunhofer IOSB-INA und der Technischen Hochschule Ostwestfalen-Lippe statt.\r\nDie vorgestellten neuesten Forschungsergebnisse auf den Gebieten der industriellen Kommunikationstechnik und Bildverarbeitung erweitern den aktuellen Stand der Forschung und Technik. Die in den Beiträgen enthaltenen anschaulichen Beispiele aus dem Bereich der Automation setzen die Ergebnisse in den direkten Anwendungsbezug." citation: ama: 'Jasperneite J, Lohweg V, eds. Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2018. Vol 12. Springer Vieweg; 2020. doi:https://doi.org/10.1007/978-3-662-59895-5' apa: 'Jasperneite, J., & Lohweg, V. (Eds.). (2020). Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2018 (Vol. 12). Springer Vieweg. https://doi.org/10.1007/978-3-662-59895-5' bjps: 'Jasperneite J and Lohweg V (eds) (2020) Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2018. Berlin, Heidelberg: Springer Vieweg.' chicago: 'Jasperneite, Jürgen, and Volker Lohweg, eds. Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2018. Vol. 12. Technologien für die intelligente Automation. Berlin, Heidelberg: Springer Vieweg, 2020. https://doi.org/10.1007/978-3-662-59895-5.' chicago-de: 'Jasperneite, Jürgen und Volker Lohweg, Hrsg. 2020. Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2018. Bd. 12. Technologien für die intelligente Automation. Berlin, Heidelberg: Springer Vieweg. doi:https://doi.org/10.1007/978-3-662-59895-5, .' din1505-2-1: 'Jasperneite, J. ; Lohweg, V. (Hrsg.): Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2018, Technologien für die intelligente Automation. Bd. 12. Berlin, Heidelberg : Springer Vieweg, 2020' havard: 'J. Jasperneite, V. Lohweg, eds., Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2018, Springer Vieweg, Berlin, Heidelberg, 2020.' ieee: 'J. Jasperneite and V. Lohweg, Eds., Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2018, vol. 12. Berlin, Heidelberg: Springer Vieweg, 2020. doi: https://doi.org/10.1007/978-3-662-59895-5.' mla: 'Jasperneite, Jürgen, and Volker Lohweg, editors. Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2018. Springer Vieweg, 2020, https://doi.org/10.1007/978-3-662-59895-5.' short: 'J. Jasperneite, V. Lohweg, eds., Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2018, Springer Vieweg, Berlin, Heidelberg, 2020.' ufg: 'Jasperneite, Jürgen/Lohweg, Volker: Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2018, Bd. 12, Berlin, Heidelberg 2020 ( Technologien für die intelligente Automation).' van: 'Jasperneite J, Lohweg V, editors. Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2018. Berlin, Heidelberg: Springer Vieweg; 2020. 364 p. ( Technologien für die intelligente Automation; vol. 12).' conference: end_date: 20218-11-21 location: Lemgo name: 9. Jahreskolloquiums "Kommunikation in der Automation" (KommA 2018) / 6. Jahreskolloquiums "Bildverarbeitung in der Automation" (BVAu 2018) start_date: 2018-11-20 date_created: 2021-02-02T13:12:47Z date_updated: 2025-05-12T08:07:26Z department: - _id: DEP5023 - _id: DEP5019 doi: https://doi.org/10.1007/978-3-662-59895-5 editor: - first_name: Jürgen full_name: Jasperneite, Jürgen id: '1899' last_name: Jasperneite - first_name: Volker full_name: Lohweg, Volker id: '1804' last_name: Lohweg orcid: 0000-0002-3325-7887 intvolume: ' 12' keyword: - Industrielle Kommunikationstechnik Industrielle Bildverarbeitung Network reliability and redundancy methods Networked Control Systems Wireless real-time communication Open Access quality control - reliability - safety and risk language: - iso: ger main_file_link: - open_access: '1' url: https://link.springer.com/book/10.1007/978-3-662-59895-5?page=2#about oa: '1' page: '364' place: Berlin, Heidelberg publication_identifier: eisbn: - 978-3-662-59895-5 eissn: - 2522-8587 isbn: - 978-3-662-59894-8 issn: - 2522-8579 publication_status: published publisher: Springer Vieweg series_title: ' Technologien für die intelligente Automation' status: public title: 'Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2018' type: book_editor user_id: '83781' volume: 12 year: '2020' ... --- _id: '4506' abstract: - lang: ger text: "In diesem Tagungsband sind die besten Beiträge des 7. Jahreskolloquiums \"Kommunikation in der Automation\" (KommA 2016) und des 5. Jahreskolloquiums \"Bildverarbeitung in der Automation\" (BVAu 2016) enthalten. Die Kolloquien fanden am 30. November und 1. Dezember 2016 anlässlich des 10jährigen Jubiläums des inIT - Institut für industrielle Informationstechnik in der SmartFactoryOWL, einer herstellerunabhängigen und offenen Industrie 4.0 Forschungs- und Demonstrationsplattform und zugleich Testfeld für den Mittelstand, in Lemgo statt.\r\nDie vorgestellten neuesten Forschungsergebnisse auf den Gebieten der industriellen Kommunikationstechnik und Bildverarbeitung erweitern den aktuellen Stand der Forschung und Technik. Die in den Beiträgen enthaltenen anschauliche Anwendungsbeispiele aus dem Bereich der Automation setzen die Ergebnisse in den direkten Anwendungsbezug." citation: ama: 'Jasperneite J, Lohweg V, eds. Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2016 zum 10jährigen Jubiläum des inIT - Institut für industrielle Informationstechnik. Vol 7. Springer Vieweg; 2017. doi:10.1007/978-3-662-55232-2' apa: 'Jasperneite, J., & Lohweg, V. (Eds.). (2017). Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2016 zum 10jährigen Jubiläum des inIT - Institut für industrielle Informationstechnik (Vol. 7). Springer Vieweg. https://doi.org/10.1007/978-3-662-55232-2' bjps: 'Jasperneite J and Lohweg V (eds) (2017) Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2016 zum 10jährigen Jubiläum des inIT - Institut für industrielle Informationstechnik. Berlin: Springer Vieweg.' chicago: 'Jasperneite, Jürgen, and Volker Lohweg, eds. Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2016 zum 10jährigen Jubiläum des inIT - Institut für industrielle Informationstechnik. Vol. 7. Technologien für die intelligente Automation . Berlin: Springer Vieweg, 2017. https://doi.org/10.1007/978-3-662-55232-2.' chicago-de: 'Jasperneite, Jürgen und Volker Lohweg, Hrsg. 2017. Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2016 zum 10jährigen Jubiläum des inIT - Institut für industrielle Informationstechnik. Bd. 7. Technologien für die intelligente Automation . Berlin: Springer Vieweg. doi:10.1007/978-3-662-55232-2, .' din1505-2-1: 'Jasperneite, J. ; Lohweg, V. (Hrsg.): Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2016 zum 10jährigen Jubiläum des inIT - Institut für industrielle Informationstechnik, Technologien für die intelligente Automation . Bd. 7. Berlin : Springer Vieweg, 2017' havard: 'J. Jasperneite, V. Lohweg, eds., Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2016 zum 10jährigen Jubiläum des inIT - Institut für industrielle Informationstechnik, Springer Vieweg, Berlin, 2017.' ieee: 'J. Jasperneite and V. Lohweg, Eds., Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2016 zum 10jährigen Jubiläum des inIT - Institut für industrielle Informationstechnik, vol. 7. Berlin: Springer Vieweg, 2017. doi: 10.1007/978-3-662-55232-2.' mla: 'Jasperneite, Jürgen, and Volker Lohweg, editors. Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2016 zum 10jährigen Jubiläum des inIT - Institut für industrielle Informationstechnik. Springer Vieweg, 2017, https://doi.org/10.1007/978-3-662-55232-2.' short: 'J. Jasperneite, V. Lohweg, eds., Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2016 zum 10jährigen Jubiläum des inIT - Institut für industrielle Informationstechnik, Springer Vieweg, Berlin, 2017.' ufg: 'Jasperneite, Jürgen/Lohweg, Volker: Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2016 zum 10jährigen Jubiläum des inIT - Institut für industrielle Informationstechnik, Bd. 7, Berlin 2017 (Technologien für die intelligente Automation ).' van: 'Jasperneite J, Lohweg V, editors. Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2016 zum 10jährigen Jubiläum des inIT - Institut für industrielle Informationstechnik. Berlin: Springer Vieweg; 2017. 295 p. (Technologien für die intelligente Automation ; vol. 7).' conference: end_date: 2026-12-01 location: Lemgo name: 7. Jahreskolloquiums "Kommunikation in der Automation" (KommA 2016) / 5. Jahreskolloquiums "Bildverarbeitung in der Automation" (BVAu 2016) start_date: 2016-11-30 date_created: 2021-01-22T08:40:04Z date_updated: 2025-05-12T08:19:51Z department: - _id: DEP5023 doi: 10.1007/978-3-662-55232-2 editor: - first_name: Jürgen full_name: Jasperneite, Jürgen id: '1899' last_name: Jasperneite - first_name: Volker full_name: Lohweg, Volker id: '1804' last_name: Lohweg orcid: 0000-0002-3325-7887 intvolume: ' 7' keyword: - Industrielle Kommunikationstechnik - Industrielle Bildverarbeitung - network reliability and redundancy methods - Networked Controls Systems - wireless real-time communication - quality control - reliability - safety and risk language: - iso: ger page: '295' place: Berlin publication_identifier: eisbn: - '978-3-662-55232-2 ' isbn: - 978-3-662-55231-5 publication_status: published publisher: Springer Vieweg series_title: 'Technologien für die intelligente Automation ' status: public title: ' Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2016 zum 10jährigen Jubiläum des inIT - Institut für industrielle Informationstechnik' type: book_editor user_id: '83781' volume: 7 year: '2017' ...