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Jahreskolloquiums \"Bildverarbeitung in der Automation\" (BVAu 2024) enthalten. Das Kolloquium fand am 05. November 2024 auf dem Innovation Campus Lemgo statt. Die vorgestellten neuesten Forschungsergebnisse auf den Gebieten der industriellen Bildverarbeitung erweitern den aktuellen Stand der Forschung und Technik. Die in den Beiträgen enthaltenen anschaulichen Anwendungsbeispiele aus dem Bereich der Automation setzen die Ergebnisse in den direkten Anwendungsbezug."}],"department":[{"_id":"DEP5023"}],"conference":{"start_date":"2024-11-05","end_date":"2024-11-05","location":"Lemgo","name":"9. Jahreskolloquiums \"Bildverarbeitung in der Automation\" (BVAu 2020)"},"publisher":"Springer Berlin Heidelberg","date_created":"2025-05-12T08:32:01Z","publication_identifier":{"eissn":["2522-8587"],"isbn":["978-3-662-70996-2"],"issn":["2522-8579"]},"editor":[{"first_name":"Jürgen","last_name":"Jasperneite","full_name":"Jasperneite, Jürgen","id":"1899"},{"orcid":"0000-0002-3325-7887","first_name":"Volker","full_name":"Lohweg, Volker","last_name":"Lohweg","id":"1804"}],"date_updated":"2025-05-12T08:32:07Z","language":[{"iso":"ger"}],"keyword":["Industrielle Kommunikationstechnik","Industrielle Bildverarbeitung","Network reliability and redundancy methods","Networked Control Systems","Wireless real-time communication","Open Access"],"title":"Bildverarbeitung in der Automation: Ausgewählte Beiträge des Jahreskolloquiums BVAu 2024","citation":{"chicago":"Jasperneite, Jürgen, and Volker Lohweg, eds. Bildverarbeitung in der Automation: Ausgewählte Beiträge des Jahreskolloquiums BVAu 2024. Vol. 19. Technologien für die intelligente Automation. Berlin, Heidelberg: Springer Berlin Heidelberg, 2024.","ieee":"J. Jasperneite and V. Lohweg, Eds., Bildverarbeitung in der Automation: Ausgewählte Beiträge des Jahreskolloquiums BVAu 2024, vol. 19. Berlin, Heidelberg: Springer Berlin Heidelberg, 2024.","apa":"Jasperneite, J., & Lohweg, V. (Eds.). (2024). Bildverarbeitung in der Automation: Ausgewählte Beiträge des Jahreskolloquiums BVAu 2024 (Vol. 19). Springer Berlin Heidelberg.","bjps":"Jasperneite J and Lohweg V (eds) (2024) Bildverarbeitung in der Automation: Ausgewählte Beiträge des Jahreskolloquiums BVAu 2024. Berlin, Heidelberg: Springer Berlin Heidelberg.","havard":"J. Jasperneite, V. Lohweg, eds., Bildverarbeitung in der Automation: Ausgewählte Beiträge des Jahreskolloquiums BVAu 2024, Springer Berlin Heidelberg, Berlin, Heidelberg, 2024.","mla":"Jasperneite, Jürgen, and Volker Lohweg, editors. 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Berlin, Heidelberg : Springer Berlin Heidelberg, 2024","chicago-de":"Jasperneite, Jürgen und Volker Lohweg, Hrsg. 2024. Bildverarbeitung in der Automation: Ausgewählte Beiträge des Jahreskolloquiums BVAu 2024. Bd. 19. Technologien für die intelligente Automation. Berlin, Heidelberg: Springer Berlin Heidelberg.","short":"J. Jasperneite, V. Lohweg, eds., Bildverarbeitung in der Automation: Ausgewählte Beiträge des Jahreskolloquiums BVAu 2024, Springer Berlin Heidelberg, Berlin, Heidelberg, 2024."},"volume":19,"year":"2024","page":"63","status":"public"},{"abstract":[{"lang":"eng","text":"This dataset contains spectroscopic measurement data and Orange project files used in the INDIN 2023 paper \"A Novel Spectroscopic Approach for Vaseline Quality Discrimination\"."}],"main_file_link":[{"open_access":"1","url":"https://zenodo.org/records/7782808"}],"year":"2023","author":[{"id":"58709","last_name":"Fliedner","full_name":"Fliedner, Niels Hendrik","first_name":"Niels Hendrik"},{"first_name":"Volker","last_name":"Lohweg","id":"1804","full_name":"Lohweg, Volker","orcid":"0000-0002-3325-7887"},{"orcid":"0000-0002-7920-0595","first_name":"Miriam","last_name":"Pein-Hackelbusch","full_name":"Pein-Hackelbusch, Miriam","id":"64952"}],"department":[{"_id":"DEP4028"}],"publisher":"zenodo","status":"public","title":"Dataset for A Novel Spectroscopic Approach for Vaseline Quality Discrimination","citation":{"mla":"Fliedner, Niels Hendrik, et al. Dataset for A Novel Spectroscopic Approach for Vaseline Quality Discrimination. zenodo, 2023, https://doi.org/10.5281/ZENODO.7782807.","havard":"N.H. Fliedner, V. Lohweg, M. Pein-Hackelbusch, Dataset for A Novel Spectroscopic Approach for Vaseline Quality Discrimination, zenodo, 2023.","bjps":"Fliedner NH, Lohweg V and Pein-Hackelbusch M (2023) Dataset for A Novel Spectroscopic Approach for Vaseline Quality Discrimination. zenodo.","ufg":"Fliedner, Niels Hendrik/Lohweg, Volker/Pein-Hackelbusch, Miriam: Dataset for A Novel Spectroscopic Approach for Vaseline Quality Discrimination, o. O. 2023.","ama":"Fliedner NH, Lohweg V, Pein-Hackelbusch M. Dataset for A Novel Spectroscopic Approach for Vaseline Quality Discrimination. zenodo; 2023. doi:10.5281/ZENODO.7782807","van":"Fliedner NH, Lohweg V, Pein-Hackelbusch M. Dataset for A Novel Spectroscopic Approach for Vaseline Quality Discrimination. zenodo; 2023.","chicago":"Fliedner, Niels Hendrik, Volker Lohweg, and Miriam Pein-Hackelbusch. Dataset for A Novel Spectroscopic Approach for Vaseline Quality Discrimination. zenodo, 2023. https://doi.org/10.5281/ZENODO.7782807.","ieee":"N. H. Fliedner, V. Lohweg, and M. Pein-Hackelbusch, Dataset for A Novel Spectroscopic Approach for Vaseline Quality Discrimination. zenodo, 2023. doi: 10.5281/ZENODO.7782807.","apa":"Fliedner, N. H., Lohweg, V., & Pein-Hackelbusch, M. (2023). Dataset for A Novel Spectroscopic Approach for Vaseline Quality Discrimination. zenodo. https://doi.org/10.5281/ZENODO.7782807","chicago-de":"Fliedner, Niels Hendrik, Volker Lohweg und Miriam Pein-Hackelbusch. 2023. Dataset for A Novel Spectroscopic Approach for Vaseline Quality Discrimination. zenodo. doi:10.5281/ZENODO.7782807, .","din1505-2-1":"Fliedner, Niels Hendrik ; Lohweg, Volker ; Pein-Hackelbusch, Miriam: Dataset for A Novel Spectroscopic Approach for Vaseline Quality Discrimination : zenodo, 2023","short":"N.H. Fliedner, V. Lohweg, M. Pein-Hackelbusch, Dataset for A Novel Spectroscopic Approach for Vaseline Quality Discrimination, zenodo, 2023."},"oa":"1","_id":"12705","doi":"10.5281/ZENODO.7782807","type":"research_data","date_created":"2025-03-13T11:07:23Z","user_id":"64952","date_updated":"2025-10-10T07:48:02Z"},{"language":[{"iso":"eng"}],"keyword":["Plant Science","Health Professions (miscellaneous)","Health (social science)","Microbiology","Food Science"],"date_created":"2025-06-24T13:25:13Z","publication_identifier":{"eissn":["2304-8158"]},"publication":"Foods","date_updated":"2025-06-25T13:13:13Z","external_id":{"isi":["000967890400001"],"pmid":["36981272"]},"year":"2023","author":[{"first_name":"Paul","last_name":"Wunderlich","id":"52317","full_name":"Wunderlich, Paul"},{"orcid":"0000-0003-0860-4696 ","full_name":"Pauli, Daniel","first_name":"Daniel","id":"75850","last_name":"Pauli"},{"last_name":"Neumaier","id":"77059","full_name":"Neumaier, Michael","first_name":"Michael"},{"last_name":"Wisser","first_name":"Stephanie","id":"76627","full_name":"Wisser, Stephanie"},{"id":"12231","first_name":"Hans-Jürgen","full_name":"Danneel, Hans-Jürgen","last_name":"Danneel"},{"first_name":"Volker","last_name":"Lohweg","full_name":"Lohweg, Volker","id":"1804","orcid":"0000-0002-3325-7887"},{"first_name":"Helene","full_name":"Dörksen, Helene","id":"46416","last_name":"Dörksen"}],"pmid":"1","status":"public","title":"Enhancing Shelf Life Prediction of Fresh Pizza with Regression Models and Low Cost Sensors","citation":{"apa":"Wunderlich, P., Pauli, D., Neumaier, M., Wisser, S., Danneel, H.-J., Lohweg, V., & Dörksen, H. (2023). Enhancing Shelf Life Prediction of Fresh Pizza with Regression Models and Low Cost Sensors. Foods, 12(6), Article 1347. https://doi.org/10.3390/foods12061347","chicago":"Wunderlich, Paul, Daniel Pauli, Michael Neumaier, Stephanie Wisser, Hans-Jürgen Danneel, Volker Lohweg, and Helene Dörksen. “Enhancing Shelf Life Prediction of Fresh Pizza with Regression Models and Low Cost Sensors.” Foods 12, no. 6 (2023). https://doi.org/10.3390/foods12061347.","van":"Wunderlich P, Pauli D, Neumaier M, Wisser S, Danneel HJ, Lohweg V, et al. Enhancing Shelf Life Prediction of Fresh Pizza with Regression Models and Low Cost Sensors. Foods. 2023;12(6).","havard":"P. Wunderlich, D. Pauli, M. Neumaier, S. Wisser, H.-J. Danneel, V. Lohweg, H. Dörksen, Enhancing Shelf Life Prediction of Fresh Pizza with Regression Models and Low Cost Sensors, Foods. 12 (2023).","bjps":"Wunderlich P et al. (2023) Enhancing Shelf Life Prediction of Fresh Pizza with Regression Models and Low Cost Sensors. Foods 12.","mla":"Wunderlich, Paul, et al. “Enhancing Shelf Life Prediction of Fresh Pizza with Regression Models and Low Cost Sensors.” Foods, vol. 12, no. 6, 1347, 2023, https://doi.org/10.3390/foods12061347.","ufg":"Wunderlich, Paul u. a.: Enhancing Shelf Life Prediction of Fresh Pizza with Regression Models and Low Cost Sensors, in: Foods 12 (2023), H. 6.","short":"P. Wunderlich, D. Pauli, M. Neumaier, S. Wisser, H.-J. Danneel, V. Lohweg, H. Dörksen, Foods 12 (2023).","din1505-2-1":"Wunderlich, Paul ; Pauli, Daniel ; Neumaier, Michael ; Wisser, Stephanie ; Danneel, Hans-Jürgen ; Lohweg, Volker ; Dörksen, Helene: Enhancing Shelf Life Prediction of Fresh Pizza with Regression Models and Low Cost Sensors. In: Foods Bd. 12. Basel, MDPI (2023), Nr. 6","chicago-de":"Wunderlich, Paul, Daniel Pauli, Michael Neumaier, Stephanie Wisser, Hans-Jürgen Danneel, Volker Lohweg und Helene Dörksen. 2023. Enhancing Shelf Life Prediction of Fresh Pizza with Regression Models and Low Cost Sensors. Foods 12, Nr. 6. doi:10.3390/foods12061347, .","ieee":"P. Wunderlich et al., “Enhancing Shelf Life Prediction of Fresh Pizza with Regression Models and Low Cost Sensors,” Foods, vol. 12, no. 6, Art. no. 1347, 2023, doi: 10.3390/foods12061347.","ama":"Wunderlich P, Pauli D, Neumaier M, et al. Enhancing Shelf Life Prediction of Fresh Pizza with Regression Models and Low Cost Sensors. Foods. 2023;12(6). doi:10.3390/foods12061347"},"volume":12,"article_number":"1347","doi":"10.3390/foods12061347","_id":"13015","place":"Basel","type":"scientific_journal_article","intvolume":" 12","user_id":"83781","issue":"6","abstract":[{"text":"food are discarded annually, with a worldwide total exceeding 1.3 billion tonnes. A significant contributor to this issue are consumers throwing away still edible food due to the expiration of its best-before date. Best-before dates currently include large safety margins, but more precise and cost effective prediction techniques are required. To address this challenge, research was conducted on low-cost sensors and machine learning techniques were developed to predict the spoilage of fresh pizza. The findings indicate that combining a gas sensor, such as volatile organic compounds or carbon dioxide, with a random forest or extreme gradient boosting regressor can accurately predict the day of spoilage. This provides a more accurate and cost-efficient alternative to current best-before date determination methods, reducing food waste, saving resources, and improving food safety by reducing the risk of consumers consuming spoiled food.","lang":"eng"}],"department":[{"_id":"DEP5023"},{"_id":"DEP1308"}],"publisher":"MDPI ","isi":"1","publication_status":"published"},{"_id":"13070","place":"Lemgo","language":[{"iso":"ger"},{"iso":"eng"}],"has_accepted_license":"1","oa":"1","corporate_editor":["Technische Hochschule Ostwestfalen-Lippe","Institut für industrielle Informationstechnik (inIT)"],"user_id":"83781","date_updated":"2025-07-17T06:21:18Z","type":"research_paper","date_created":"2025-07-17T05:31:28Z","publisher":"Technische Hochschule Ostwestfalen-Lippe","status":"public","page":"232","abstract":[{"lang":"eng","text":"Das inIT der TH OWL hat sich auch in den Jahren 2021 und 2022 in einer Zeit starken gesellschaftlichen Wandels hervorragend positioniert. Dabei wurde die Ausrichtung auf die Intelligente Automation weiter geschärft, ohne die technologische Basis der industriellen Informations- und Kommunikationstechnologien, wie sie das inIT definiert, zu verlassen."}],"year":"2023","ddc":["006"],"author":[{"first_name":"Volker","id":"1804","last_name":"Lohweg","full_name":"Lohweg, Volker","orcid":"0000-0002-3325-7887"},{"first_name":"Carsten","id":"61525","full_name":"Röcker, Carsten","last_name":"Röcker"}],"main_file_link":[{"url":"https://report.init-owl.de/JB_inIT_2021-2022.pdf","open_access":"1"}],"department":[{"_id":"DEP5023"}],"citation":{"ama":"Lohweg V, Röcker C. Institut für industrielle Informationstechnik / Institute Industrial IT : Jahresbericht 2021 - 2022. (Technische Hochschule Ostwestfalen-Lippe, Institut für industrielle Informationstechnik (inIT), eds.). Technische Hochschule Ostwestfalen-Lippe; 2023.","ieee":"V. Lohweg and C. Röcker, Institut für industrielle Informationstechnik / Institute Industrial IT : Jahresbericht 2021 - 2022. Lemgo: Technische Hochschule Ostwestfalen-Lippe, 2023.","chicago-de":"Lohweg, Volker und Carsten Röcker. 2023. Institut für industrielle Informationstechnik / Institute Industrial IT : Jahresbericht 2021 - 2022. Hg. von Technische Hochschule Ostwestfalen-Lippe und Institut für industrielle Informationstechnik (inIT). Lemgo: Technische Hochschule Ostwestfalen-Lippe.","din1505-2-1":"Lohweg, Volker ; Röcker, Carsten ; Technische Hochschule Ostwestfalen-Lippe ; Institut für industrielle Informationstechnik (inIT) (Hrsg.): Institut für industrielle Informationstechnik / Institute Industrial IT : Jahresbericht 2021 - 2022. Lemgo : Technische Hochschule Ostwestfalen-Lippe, 2023","short":"V. Lohweg, C. Röcker, Institut für industrielle Informationstechnik / Institute Industrial IT : Jahresbericht 2021 - 2022, Technische Hochschule Ostwestfalen-Lippe, Lemgo, 2023.","bjps":"Lohweg V and Röcker C (2023) Institut für industrielle Informationstechnik / Institute Industrial IT : Jahresbericht 2021 - 2022, Technische Hochschule Ostwestfalen-Lippe and Institut für industrielle Informationstechnik (inIT) (eds). Lemgo: Technische Hochschule Ostwestfalen-Lippe.","havard":"V. Lohweg, C. Röcker, Institut für industrielle Informationstechnik / Institute Industrial IT : Jahresbericht 2021 - 2022, Technische Hochschule Ostwestfalen-Lippe, Lemgo, 2023.","mla":"Lohweg, Volker, and Carsten Röcker. Institut für industrielle Informationstechnik / Institute Industrial IT : Jahresbericht 2021 - 2022. Edited by Technische Hochschule Ostwestfalen-Lippe and Institut für industrielle Informationstechnik (inIT), Technische Hochschule Ostwestfalen-Lippe, 2023.","ufg":"Lohweg, Volker/Röcker, Carsten: Institut für industrielle Informationstechnik / Institute Industrial IT : Jahresbericht 2021 - 2022, hg. von Technische Hochschule Ostwestfalen-Lippe, Institut für industrielle Informationstechnik (inIT), Lemgo 2023.","van":"Lohweg V, Röcker C. Institut für industrielle Informationstechnik / Institute Industrial IT : Jahresbericht 2021 - 2022. Technische Hochschule Ostwestfalen-Lippe, Institut für industrielle Informationstechnik (inIT), editors. Lemgo: Technische Hochschule Ostwestfalen-Lippe; 2023. 232 p.","chicago":"Lohweg, Volker, and Carsten Röcker. Institut für industrielle Informationstechnik / Institute Industrial IT : Jahresbericht 2021 - 2022. Edited by Technische Hochschule Ostwestfalen-Lippe and Institut für industrielle Informationstechnik (inIT). Lemgo: Technische Hochschule Ostwestfalen-Lippe, 2023.","apa":"Lohweg, V., & Röcker, C. (2023). Institut für industrielle Informationstechnik / Institute Industrial IT : Jahresbericht 2021 - 2022 (Technische Hochschule Ostwestfalen-Lippe & Institut für industrielle Informationstechnik (inIT), Eds.). Technische Hochschule Ostwestfalen-Lippe."},"publication_status":"published","title":"Institut für industrielle Informationstechnik / Institute Industrial IT : Jahresbericht 2021 - 2022"},{"type":"book_editor","user_id":"83781","intvolume":" 14","place":"Berlin, Heidelberg","doi":"10.1007/978-3-662-64283-2","_id":"12907","series_title":"Technologien für die intelligente Automation","publication_status":"published","department":[{"_id":"DEP5023"}],"conference":{"name":"11. Jahreskolloquiums \"Kommunikation in der Automation\" (KommA 2020) / 7. Jahreskolloquiums \"Bildverarbeitung in der Automation\" (BVAu 2020)","location":"Lemgo","start_date":"2020-10-28","end_date":"2020-10-29"},"abstract":[{"text":"In diesem Open Access-Tagungsband sind die besten Beiträge des 11. Jahreskolloquiums \"Kommunikation in der Automation\" (KommA 2020) und des 7. Jahreskolloquiums \"Bildverarbeitung in der Automation\" (BVAu 2020) enthalten. Die Kolloquien fanden am 28. und 29. Oktober 2020 statt und wurden erstmalig als digitale Webveranstaltung auf dem Innovation Campus Lemgo organisiert.\r\nDie vorgestellten neuesten Forschungsergebnisse auf den Gebieten der industriellen Kommunikationstechnik und Bildverarbeitung erweitern den aktuellen Stand der Forschung und Technik. Die in den Beiträgen enthaltenen anschauliche Anwendungsbeispiele aus dem Bereich der Automation setzen die Ergebnisse in den direkten Anwendungsbezug.","lang":"eng"}],"publisher":"Springer Berlin Heidelberg","date_created":"2025-05-12T08:22:49Z","publication_identifier":{"eisbn":["978-3-662-64283-2"],"issn":["2522-8579"],"isbn":["978-3-662-64282-5"],"eissn":["2522-8587"]},"date_updated":"2025-05-12T08:27:40Z","editor":[{"first_name":"Jürgen","full_name":"Jasperneite, Jürgen","last_name":"Jasperneite","id":"1899"},{"orcid":"0000-0002-3325-7887","last_name":"Lohweg","full_name":"Lohweg, Volker","id":"1804","first_name":"Volker"}],"language":[{"iso":"ger"}],"keyword":["Industrielle Kommunikationstechnik","Industrielle Bildverarbeitung","Network reliability and redundancy methods","Networked Control Systems","Wireless real-time communication","Open Access"],"title":"Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2020","volume":14,"citation":{"ama":"Jasperneite J, Lohweg V, eds. Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2020. Vol 14. Springer Berlin Heidelberg; 2022. doi:10.1007/978-3-662-64283-2","ieee":"J. Jasperneite and V. Lohweg, Eds., Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2020, vol. 14. Berlin, Heidelberg: Springer Berlin Heidelberg, 2022. doi: 10.1007/978-3-662-64283-2.","short":"J. Jasperneite, V. Lohweg, eds., Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2020, Springer Berlin Heidelberg, Berlin, Heidelberg, 2022.","chicago-de":"Jasperneite, Jürgen und Volker Lohweg, Hrsg. 2022. Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2020. Bd. 14. Technologien für die intelligente Automation. Berlin, Heidelberg: Springer Berlin Heidelberg. doi:10.1007/978-3-662-64283-2, .","din1505-2-1":"Jasperneite, J. ; Lohweg, V. (Hrsg.): Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2020, Technologien für die intelligente Automation. Bd. 14. Berlin, Heidelberg : Springer Berlin Heidelberg, 2022","van":"Jasperneite J, Lohweg V, editors. Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2020. Berlin, Heidelberg: Springer Berlin Heidelberg; 2022. 329 p. (Technologien für die intelligente Automation; vol. 14).","ufg":"Jasperneite, Jürgen/Lohweg, Volker: Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2020, Bd. 14, Berlin, Heidelberg 2022 (Technologien für die intelligente Automation).","bjps":"Jasperneite J and Lohweg V (eds) (2022) Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2020. Berlin, Heidelberg: Springer Berlin Heidelberg.","havard":"J. Jasperneite, V. Lohweg, eds., Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2020, Springer Berlin Heidelberg, Berlin, Heidelberg, 2022.","mla":"Jasperneite, Jürgen, and Volker Lohweg, editors. Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2020. Springer Berlin Heidelberg, 2022, https://doi.org/10.1007/978-3-662-64283-2.","apa":"Jasperneite, J., & Lohweg, V. (Eds.). (2022). Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2020 (Vol. 14). Springer Berlin Heidelberg. https://doi.org/10.1007/978-3-662-64283-2","chicago":"Jasperneite, Jürgen, and Volker Lohweg, eds. Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2020. Vol. 14. Technologien für die intelligente Automation. Berlin, Heidelberg: Springer Berlin Heidelberg, 2022. https://doi.org/10.1007/978-3-662-64283-2."},"year":"2022","page":"329","status":"public"},{"title":"Innovation und Digitalisierung","citation":{"ama":"Jasperneite J, Löffl J, Lohweg V. Innovation und Digitalisierung. In: Hofmann ML, Lemme K, Löffl J, Nautz J, eds. 50 Jahre Technische Hochschule Ostwestfalen-Lippe. Spurbuchverlag; 2021:91-100.","ieee":"J. Jasperneite, J. Löffl, and V. Lohweg, “Innovation und Digitalisierung,” in 50 Jahre Technische Hochschule Ostwestfalen-Lippe, M. L. Hofmann, K. Lemme, J. Löffl, and J. Nautz, Eds. Baunach: Spurbuchverlag, 2021, pp. 91–100.","van":"Jasperneite J, Löffl J, Lohweg V. Innovation und Digitalisierung. In: Hofmann ML, Lemme K, Löffl J, Nautz J, editors. 50 Jahre Technische Hochschule Ostwestfalen-Lippe. Baunach: Spurbuchverlag; 2021. p. 91–100.","ufg":"Jasperneite, Jürgen/Löffl, Josef/Lohweg, Volker: Innovation und Digitalisierung, in: Hofmann, Martin Ludwig u. a. (Hgg.): 50 Jahre Technische Hochschule Ostwestfalen-Lippe, Baunach 2021, S. 91–100.","havard":"J. Jasperneite, J. Löffl, V. Lohweg, Innovation und Digitalisierung, in: M.L. Hofmann, K. Lemme, J. Löffl, J. Nautz (Eds.), 50 Jahre Technische Hochschule Ostwestfalen-Lippe, Spurbuchverlag, Baunach, 2021: pp. 91–100.","bjps":"Jasperneite J, Löffl J and Lohweg V (2021) Innovation und Digitalisierung. In Hofmann ML et al. (eds), 50 Jahre Technische Hochschule Ostwestfalen-Lippe. Baunach: Spurbuchverlag, pp. 91–100.","mla":"Jasperneite, Jürgen, et al. “Innovation und Digitalisierung.” 50 Jahre Technische Hochschule Ostwestfalen-Lippe, edited by Martin Ludwig Hofmann et al., Spurbuchverlag, 2021, pp. 91–100.","apa":"Jasperneite, J., Löffl, J., & Lohweg, V. (2021). Innovation und Digitalisierung. In M. L. Hofmann, K. Lemme, J. Löffl, & J. Nautz (Eds.), 50 Jahre Technische Hochschule Ostwestfalen-Lippe (pp. 91–100). Spurbuchverlag.","chicago":"Jasperneite, Jürgen, Josef Löffl, and Volker Lohweg. “Innovation und Digitalisierung.” In 50 Jahre Technische Hochschule Ostwestfalen-Lippe, edited by Martin Ludwig Hofmann, Kathrin Lemme, Josef Löffl, and Jürgen Nautz, 91–100. Baunach: Spurbuchverlag, 2021.","short":"J. Jasperneite, J. Löffl, V. Lohweg, in: M.L. Hofmann, K. Lemme, J. Löffl, J. Nautz (Eds.), 50 Jahre Technische Hochschule Ostwestfalen-Lippe, Spurbuchverlag, Baunach, 2021, pp. 91–100.","din1505-2-1":"Jasperneite, Jürgen ; Löffl, Josef ; Lohweg, Volker: Innovation und Digitalisierung. In: Hofmann, M. L. ; Lemme, K. ; Löffl, J. ; Nautz, J. (Hrsg.): 50 Jahre Technische Hochschule Ostwestfalen-Lippe. Baunach : Spurbuchverlag, 2021, S. 91–100","chicago-de":"Jasperneite, Jürgen, Josef Löffl und Volker Lohweg. 2021. Innovation und Digitalisierung. In: 50 Jahre Technische Hochschule Ostwestfalen-Lippe, hg. von Martin Ludwig Hofmann, Kathrin Lemme, Josef Löffl, und Jürgen Nautz, 91–100. Baunach: Spurbuchverlag."},"publication_status":"published","year":"2021","author":[{"full_name":"Jasperneite, Jürgen","last_name":"Jasperneite","id":"1899","first_name":"Jürgen"},{"full_name":"Löffl, Josef","id":"71937","last_name":"Löffl","first_name":"Josef"},{"full_name":"Lohweg, Volker","last_name":"Lohweg","id":"1804","first_name":"Volker","orcid":"0000-0002-3325-7887"}],"department":[{"_id":"DEP1200"}],"status":"public","page":"91-100","publisher":"Spurbuchverlag","publication_identifier":{"isbn":["978-3-88778-622-9"]},"publication":"50 Jahre Technische Hochschule Ostwestfalen-Lippe","date_created":"2025-02-10T07:49:34Z","type":"book_chapter","user_id":"83781","popular_science":"1","date_updated":"2025-02-10T08:30:43Z","editor":[{"last_name":"Hofmann","full_name":"Hofmann, Martin Ludwig","id":"27490","first_name":"Martin Ludwig"},{"full_name":"Lemme, Kathrin","last_name":"Lemme","id":"29189","first_name":"Kathrin"},{"first_name":"Josef","last_name":"Löffl","id":"71937","full_name":"Löffl, Josef"},{"last_name":"Nautz","full_name":"Nautz, Jürgen","first_name":"Jürgen","id":"46509"}],"place":"Baunach","language":[{"iso":"ger"}],"_id":"12413"},{"citation":{"chicago-de":"Witte, Stefan, Guido Falkemeier und Volker Lohweg. 2021. Innovationskette Bildung, Forschung und Wirtschaft als strategisches Element der Technischen Hochschule Ostwestfalen-Lippe. In: 50 Jahre Technische Hochschule Ostwestfalen-Lippe, hg. von Martin Ludwig Hofmann, Kathrin Lemme, Josef Löffl, und Jürgen Nautz, 145–154. Baunach: Spurbuchverlag.","din1505-2-1":"Witte, Stefan ; Falkemeier, Guido ; Lohweg, Volker: Innovationskette Bildung, Forschung und Wirtschaft als strategisches Element der Technischen Hochschule Ostwestfalen-Lippe. In: Hofmann, M. L. ; Lemme, K. ; Löffl, J. ; Nautz, J. (Hrsg.): 50 Jahre Technische Hochschule Ostwestfalen-Lippe. Baunach : Spurbuchverlag, 2021, S. 145–154","short":"S. Witte, G. Falkemeier, V. Lohweg, in: M.L. Hofmann, K. Lemme, J. Löffl, J. Nautz (Eds.), 50 Jahre Technische Hochschule Ostwestfalen-Lippe, Spurbuchverlag, Baunach, 2021, pp. 145–154.","ufg":"Witte, Stefan/Falkemeier, Guido/Lohweg, Volker: Innovationskette Bildung, Forschung und Wirtschaft als strategisches Element der Technischen Hochschule Ostwestfalen-Lippe, in: Hofmann, Martin Ludwig u. a. (Hgg.): 50 Jahre Technische Hochschule Ostwestfalen-Lippe, Baunach 2021, S. 145–154.","mla":"Witte, Stefan, et al. “Innovationskette Bildung, Forschung und Wirtschaft als strategisches Element der Technischen Hochschule Ostwestfalen-Lippe.” 50 Jahre Technische Hochschule Ostwestfalen-Lippe, edited by Martin Ludwig Hofmann et al., Spurbuchverlag, 2021, pp. 145–54.","havard":"S. Witte, G. Falkemeier, V. Lohweg, Innovationskette Bildung, Forschung und Wirtschaft als strategisches Element der Technischen Hochschule Ostwestfalen-Lippe, in: M.L. Hofmann, K. Lemme, J. Löffl, J. Nautz (Eds.), 50 Jahre Technische Hochschule Ostwestfalen-Lippe, Spurbuchverlag, Baunach, 2021: pp. 145–154.","bjps":"Witte S, Falkemeier G and Lohweg V (2021) Innovationskette Bildung, Forschung und Wirtschaft als strategisches Element der Technischen Hochschule Ostwestfalen-Lippe. In Hofmann ML et al. (eds), 50 Jahre Technische Hochschule Ostwestfalen-Lippe. Baunach: Spurbuchverlag, pp. 145–154.","van":"Witte S, Falkemeier G, Lohweg V. Innovationskette Bildung, Forschung und Wirtschaft als strategisches Element der Technischen Hochschule Ostwestfalen-Lippe. In: Hofmann ML, Lemme K, Löffl J, Nautz J, editors. 50 Jahre Technische Hochschule Ostwestfalen-Lippe. Baunach: Spurbuchverlag; 2021. p. 145–54.","ama":"Witte S, Falkemeier G, Lohweg V. Innovationskette Bildung, Forschung und Wirtschaft als strategisches Element der Technischen Hochschule Ostwestfalen-Lippe. In: Hofmann ML, Lemme K, Löffl J, Nautz J, eds. 50 Jahre Technische Hochschule Ostwestfalen-Lippe. 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San Francisco, California; 2020."},"department":[{"_id":"DEP5023"}],"year":2020,"author":[{"first_name":"Philip","id":"58460","full_name":"Meier, Philip","last_name":"Meier"},{"orcid":"0000-0002-3325-7887","full_name":"Lohweg, Volker","first_name":"Volker","id":"1804","last_name":"Lohweg"},{"last_name":"Dörksen","first_name":"Helene","id":"46416","full_name":"Dörksen, Helene"},{"id":"2128","first_name":"Johannes","full_name":"Schaede, Johannes","last_name":"Schaede"}],"status":"public"},{"publication_identifier":{"eissn":["2522-8587"],"isbn":["978-3-662-59894-8"],"eisbn":["978-3-662-59895-5"],"issn":["2522-8579"]},"date_created":"2021-02-02T13:12:47Z","editor":[{"first_name":"Jürgen","id":"1899","last_name":"Jasperneite","full_name":"Jasperneite, Jürgen"},{"orcid":"0000-0002-3325-7887","last_name":"Lohweg","first_name":"Volker","id":"1804","full_name":"Lohweg, Volker"}],"date_updated":"2025-05-12T08:07:26Z","oa":"1","keyword":["Industrielle Kommunikationstechnik Industrielle Bildverarbeitung Network reliability and redundancy methods Networked Control Systems Wireless real-time communication Open Access quality control","reliability","safety and risk"],"language":[{"iso":"ger"}],"title":"Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2018","citation":{"van":"Jasperneite J, Lohweg V, editors. Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2018. Berlin, Heidelberg: Springer Vieweg; 2020. 364 p. ( Technologien für die intelligente Automation; vol. 12).","ama":"Jasperneite J, Lohweg V, eds. Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2018. Vol 12. Springer Vieweg; 2020. doi:https://doi.org/10.1007/978-3-662-59895-5","ufg":"Jasperneite, Jürgen/Lohweg, Volker: Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2018, Bd. 12, Berlin, Heidelberg 2020 ( Technologien für die intelligente Automation).","mla":"Jasperneite, Jürgen, and Volker Lohweg, editors. Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2018. Springer Vieweg, 2020, https://doi.org/10.1007/978-3-662-59895-5.","havard":"J. Jasperneite, V. Lohweg, eds., Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2018, Springer Vieweg, Berlin, Heidelberg, 2020.","bjps":"Jasperneite J and Lohweg V (eds) (2020) Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2018. Berlin, Heidelberg: Springer Vieweg.","apa":"Jasperneite, J., & Lohweg, V. (Eds.). (2020). Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2018 (Vol. 12). Springer Vieweg. https://doi.org/10.1007/978-3-662-59895-5","ieee":"J. Jasperneite and V. Lohweg, Eds., Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2018, vol. 12. Berlin, Heidelberg: Springer Vieweg, 2020. doi: https://doi.org/10.1007/978-3-662-59895-5.","chicago":"Jasperneite, Jürgen, and Volker Lohweg, eds. Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2018. Vol. 12. Technologien für die intelligente Automation. Berlin, Heidelberg: Springer Vieweg, 2020. https://doi.org/10.1007/978-3-662-59895-5.","short":"J. Jasperneite, V. Lohweg, eds., Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2018, Springer Vieweg, Berlin, Heidelberg, 2020.","din1505-2-1":"Jasperneite, J. ; Lohweg, V. (Hrsg.): Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2018, Technologien für die intelligente Automation. Bd. 12. Berlin, Heidelberg : Springer Vieweg, 2020","chicago-de":"Jasperneite, Jürgen und Volker Lohweg, Hrsg. 2020. Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2018. Bd. 12. Technologien für die intelligente Automation. Berlin, Heidelberg: Springer Vieweg. doi:https://doi.org/10.1007/978-3-662-59895-5, ."},"volume":12,"year":"2020","main_file_link":[{"url":"https://link.springer.com/book/10.1007/978-3-662-59895-5?page=2#about","open_access":"1"}],"status":"public","page":"364","type":"book_editor","intvolume":" 12","user_id":"83781","_id":"4851","doi":"https://doi.org/10.1007/978-3-662-59895-5","place":"Berlin, Heidelberg","series_title":" Technologien für die intelligente Automation","publication_status":"published","abstract":[{"lang":"ger","text":"In diesem Open-Access-Tagungsband sind die besten Beiträge des 9. Jahreskolloquiums \"Kommunikation in der Automation\" (KommA 2018) und des 6. Jahreskolloquiums \"Bildverarbeitung in der Automation\" (BVAu 2018) enthalten. Die Kolloquien fanden am 20. und 21. November 2018 in der SmartFactoryOWL, einer gemeinsamen Einrichtung des Fraunhofer IOSB-INA und der Technischen Hochschule Ostwestfalen-Lippe statt.\r\nDie vorgestellten neuesten Forschungsergebnisse auf den Gebieten der industriellen Kommunikationstechnik und Bildverarbeitung erweitern den aktuellen Stand der Forschung und Technik. Die in den Beiträgen enthaltenen anschaulichen Beispiele aus dem Bereich der Automation setzen die Ergebnisse in den direkten Anwendungsbezug."}],"conference":{"start_date":"2018-11-20","end_date":"20218-11-21","name":"9. Jahreskolloquiums \"Kommunikation in der Automation\" (KommA 2018) / 6. Jahreskolloquiums \"Bildverarbeitung in der Automation\" (BVAu 2018)","location":"Lemgo"},"department":[{"_id":"DEP5023"},{"_id":"DEP5019"}],"publisher":"Springer Vieweg"},{"title":"Feature Fusion to Increase the Robustness of Machine Learners in Industrial Environments","citation":{"apa":"Holst, C.-A., & Lohweg, V. (2019). Feature Fusion to Increase the Robustness of Machine Learners in Industrial Environments. In at - Automatisierungstechnik 67 (10) (pp. 853–865). De Gruyter.","chicago":"Holst, Christoph-Alexander, and Volker Lohweg. “Feature Fusion to Increase the Robustness of Machine Learners in Industrial Environments.” In At - Automatisierungstechnik 67 (10) , 853–65. De Gruyter, 2019.","van":"Holst C-A, Lohweg V. Feature Fusion to Increase the Robustness of Machine Learners in Industrial Environments. In: at - Automatisierungstechnik 67 (10) . De Gruyter; 2019. p. 853–65.","ufg":"Holst, Christoph-Alexander/Lohweg, Volker (2019): Feature Fusion to Increase the Robustness of Machine Learners in Industrial Environments, in: at - Automatisierungstechnik 67 (10) , S. 853–865.","havard":"C.-A. Holst, V. Lohweg, Feature Fusion to Increase the Robustness of Machine Learners in Industrial Environments, in: At - Automatisierungstechnik 67 (10) , De Gruyter, 2019: pp. 853–865.","mla":"Holst, Christoph-Alexander, and Volker Lohweg. “Feature Fusion to Increase the Robustness of Machine Learners in Industrial Environments.” At - Automatisierungstechnik 67 (10) , De Gruyter, 2019, pp. 853–65.","bjps":"Holst C-A and Lohweg V (2019) Feature Fusion to Increase the Robustness of Machine Learners in Industrial Environments. At - Automatisierungstechnik 67 (10) . De Gruyter, pp. 853–865.","short":"C.-A. Holst, V. Lohweg, in: At - Automatisierungstechnik 67 (10) , De Gruyter, 2019, pp. 853–865.","chicago-de":"Holst, Christoph-Alexander und Volker Lohweg. 2019. Feature Fusion to Increase the Robustness of Machine Learners in Industrial Environments. In: at - Automatisierungstechnik 67 (10) , 853–865. De Gruyter.","din1505-2-1":"Holst, Christoph-Alexander ; Lohweg, Volker: Feature Fusion to Increase the Robustness of Machine Learners in Industrial Environments. In: at - Automatisierungstechnik 67 (10) : De Gruyter, 2019, S. 853–865","ieee":"C.-A. Holst and V. Lohweg, “Feature Fusion to Increase the Robustness of Machine Learners in Industrial Environments,” in at - Automatisierungstechnik 67 (10) , 2019, pp. 853–865.","ama":"Holst C-A, Lohweg V. Feature Fusion to Increase the Robustness of Machine Learners in Industrial Environments. In: At - Automatisierungstechnik 67 (10) . De Gruyter; 2019:853-865."},"department":[{"_id":"DEP5023"}],"year":2019,"author":[{"first_name":"Christoph-Alexander","last_name":"Holst","full_name":"Holst, Christoph-Alexander","id":"64782"},{"id":"1804","full_name":"Lohweg, Volker","first_name":"Volker","last_name":"Lohweg","orcid":"0000-0002-3325-7887"}],"abstract":[{"lang":"eng","text":"Industrial applications put special demands on machine learning algorithms. Noisy data, outliers, and sensor faults present an immense challenge for learners. A considerable part of machine learning research focuses on the selection of relevant, non-redundant features. This contribution details an approach to group and fuse redundant features prior to learning and classification. Features are grouped relying on a correlation-based redundancy measure. The fusion of features is guided by determining the majority observation based on possibility distributions. Furthermore, this paper studies the effects of feature fusion on the robustness and performance of classification with a focus on industrial applications. The approach is statistically evaluated on public datasets in comparison to classification on selected features only."}],"page":"853-865","status":"public","publisher":"De Gruyter","type":"conference","date_created":"2019-11-22T12:51:13Z","publication":"at - Automatisierungstechnik 67 (10) ","date_updated":"2023-03-15T13:49:38Z","user_id":"74004","language":[{"iso":"eng"}],"_id":"1993"},{"user_id":"83781","date_updated":"2024-04-15T12:43:21Z","publication_identifier":{"issn":["1946-0759"],"eisbn":["978-1-7281-0303-7","978-1-7281-0302-0"],"isbn":["978-1-7281-0304-4"]},"publication":"24nd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA2019) ","type":"conference","date_created":"2019-11-22T12:51:15Z","place":"Piscataway, NJ","language":[{"iso":"eng"}],"_id":"1994","doi":"10.1109/ETFA.2019.8869514","citation":{"short":"M. Bator, A. Dicks, S. Deppe, V. Lohweg, in: 24nd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA2019) , IEEE, Piscataway, NJ, 2019.","din1505-2-1":"Bator, Martyna ; Dicks, Alexander ; Deppe, Sahar ; Lohweg, Volker: Anomaly Detection with Root Cause Analysis for Bottling Process. In: 24nd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA2019) . Piscataway, NJ : IEEE, 2019","chicago-de":"Bator, Martyna, Alexander Dicks, Sahar Deppe und Volker Lohweg. 2019. Anomaly Detection with Root Cause Analysis for Bottling Process. In: 24nd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA2019) . Piscataway, NJ: IEEE. doi:10.1109/ETFA.2019.8869514, .","ama":"Bator M, Dicks A, Deppe S, Lohweg V. Anomaly Detection with Root Cause Analysis for Bottling Process. In: 24nd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA2019) . IEEE; 2019. doi:10.1109/ETFA.2019.8869514","van":"Bator M, Dicks A, Deppe S, Lohweg V. Anomaly Detection with Root Cause Analysis for Bottling Process. In: 24nd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA2019) . Piscataway, NJ: IEEE; 2019.","havard":"M. Bator, A. Dicks, S. Deppe, V. Lohweg, Anomaly Detection with Root Cause Analysis for Bottling Process, in: 24nd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA2019) , IEEE, Piscataway, NJ, 2019.","bjps":"Bator M et al. (2019) Anomaly Detection with Root Cause Analysis for Bottling Process. 24nd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA2019) . Piscataway, NJ: IEEE.","mla":"Bator, Martyna, et al. “Anomaly Detection with Root Cause Analysis for Bottling Process.” 24nd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA2019) , IEEE, 2019, https://doi.org/10.1109/ETFA.2019.8869514.","ufg":"Bator, Martyna u. a.: Anomaly Detection with Root Cause Analysis for Bottling Process, in: o. Hg.: 24nd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA2019) , Piscataway, NJ 2019.","ieee":"M. Bator, A. Dicks, S. Deppe, and V. Lohweg, “Anomaly Detection with Root Cause Analysis for Bottling Process,” presented at the 24th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA), Zaragoza, Spain , 2019. doi: 10.1109/ETFA.2019.8869514.","apa":"Bator, M., Dicks, A., Deppe, S., & Lohweg, V. (2019). Anomaly Detection with Root Cause Analysis for Bottling Process. 24nd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA2019) . 24th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA), Zaragoza, Spain . https://doi.org/10.1109/ETFA.2019.8869514","chicago":"Bator, Martyna, Alexander Dicks, Sahar Deppe, and Volker Lohweg. “Anomaly Detection with Root Cause Analysis for Bottling Process.” In 24nd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA2019) . Piscataway, NJ: IEEE, 2019. https://doi.org/10.1109/ETFA.2019.8869514."},"publication_status":"published","title":"Anomaly Detection with Root Cause Analysis for Bottling Process","status":"public","publisher":"IEEE","author":[{"id":"46440","full_name":"Bator, Martyna","first_name":"Martyna","last_name":"Bator"},{"full_name":"Dicks, Alexander","last_name":"Dicks","id":"1853","first_name":"Alexander"},{"last_name":"Deppe","first_name":"Sahar","id":"52121","full_name":"Deppe, Sahar"},{"orcid":"0000-0002-3325-7887","id":"1804","last_name":"Lohweg","first_name":"Volker","full_name":"Lohweg, Volker"}],"year":"2019","conference":{"end_date":"2019-09-13","start_date":"2019-09-10","name":"24th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)","location":" Zaragoza, Spain "},"department":[{"_id":"DEP5023"},{"_id":"DEP1308"}],"abstract":[{"lang":"eng","text":"In the filling and packaging industry, the trend is towards self-diagnosis, optimization, and quality monitoring of processes. The aim is to increase production volumes and the quality. These concepts require continuous monitoring and anomaly detection of the filling process. In addition, a root cause analysis of the failure is required because not every failure can be simulated or measured previously. Standard anomaly detection methods have no integrated root cause analysis. In this paper a fusion system is utilises for the detection of different unknown anomalies and also the failure source of them. The performance of this method is benchmarked with a real-word filling process."}]},{"citation":{"van":"Holst C-A, Röckemann K, Steinmetz A, Lohweg V. Lamb wave-based Cure Monitoring of Carbon Fibre Reinforced Polymers for On-site Aircraft Repairs. In: 5th IEEE International Forum on Research and Technologies for Society and Industry. Firenze, Italy; 2019.","ama":"Holst C-A, Röckemann K, Steinmetz A, Lohweg V. Lamb wave-based Cure Monitoring of Carbon Fibre Reinforced Polymers for On-site Aircraft Repairs. In: 5th IEEE International Forum on Research and Technologies for Society and Industry. Firenze, Italy; 2019.","ufg":"Holst, Christoph-Alexander et. al. (2019): Lamb wave-based Cure Monitoring of Carbon Fibre Reinforced Polymers for On-site Aircraft Repairs, in: 5th IEEE International Forum on Research and Technologies for Society and Industry, Firenze, Italy.","mla":"Holst, Christoph-Alexander, et al. “Lamb Wave-Based Cure Monitoring of Carbon Fibre Reinforced Polymers for On-Site Aircraft Repairs.” 5th IEEE International Forum on Research and Technologies for Society and Industry, 2019.","havard":"C.-A. Holst, K. Röckemann, A. Steinmetz, V. Lohweg, Lamb wave-based Cure Monitoring of Carbon Fibre Reinforced Polymers for On-site Aircraft Repairs, in: 5th IEEE International Forum on Research and Technologies for Society and Industry, Firenze, Italy, 2019.","bjps":"Holst C-A et al. (2019) Lamb Wave-Based Cure Monitoring of Carbon Fibre Reinforced Polymers for On-Site Aircraft Repairs. 5th IEEE International Forum on Research and Technologies for Society and Industry. Firenze, Italy.","apa":"Holst, C.-A., Röckemann, K., Steinmetz, A., & Lohweg, V. (2019). Lamb wave-based Cure Monitoring of Carbon Fibre Reinforced Polymers for On-site Aircraft Repairs. In 5th IEEE International Forum on Research and Technologies for Society and Industry. Firenze, Italy.","ieee":"C.-A. Holst, K. Röckemann, A. Steinmetz, and V. Lohweg, “Lamb wave-based Cure Monitoring of Carbon Fibre Reinforced Polymers for On-site Aircraft Repairs,” in 5th IEEE International Forum on Research and Technologies for Society and Industry, 2019.","chicago":"Holst, Christoph-Alexander, Kristian Röckemann, Andreas Steinmetz, and Volker Lohweg. “Lamb Wave-Based Cure Monitoring of Carbon Fibre Reinforced Polymers for On-Site Aircraft Repairs.” In 5th IEEE International Forum on Research and Technologies for Society and Industry. Firenze, Italy, 2019.","short":"C.-A. Holst, K. Röckemann, A. Steinmetz, V. Lohweg, in: 5th IEEE International Forum on Research and Technologies for Society and Industry, Firenze, Italy, 2019.","chicago-de":"Holst, Christoph-Alexander, Kristian Röckemann, Andreas Steinmetz und Volker Lohweg. 2019. Lamb wave-based Cure Monitoring of Carbon Fibre Reinforced Polymers for On-site Aircraft Repairs. In: 5th IEEE International Forum on Research and Technologies for Society and Industry. Firenze, Italy.","din1505-2-1":"Holst, Christoph-Alexander ; Röckemann, Kristian ; Steinmetz, Andreas ; Lohweg, Volker: Lamb wave-based Cure Monitoring of Carbon Fibre Reinforced Polymers for On-site Aircraft Repairs. In: 5th IEEE International Forum on Research and Technologies for Society and Industry. Firenze, Italy, 2019"},"title":"Lamb wave-based Cure Monitoring of Carbon Fibre Reinforced Polymers for On-site Aircraft Repairs","status":"public","abstract":[{"lang":"eng","text":"The repair of carbon fibre reinforced polymer structures of aircraft is increasingly conducted on site. Monitoring the curing process of polymers has the potential to decrease repair costs by time optimisation and quality control. In this paper Lamb waves are utilised to determine the degree of cure. Waves are excited and recorded by two piezoelectric transducers, one serving as an actuator and the other as a sensor. The recorded signals are processed with a complex wavelet transform, which allows more accurate feature extraction than calculating features in time domain. Extracted features are the transmitted signal energy of the wave and the resonance frequency of the curing polymer. Waves are excited at different frequencies to identify the current resonance frequency. Excitation at or near the current resonant frequency ensures that curing is monitored with maximum sensitivity."}],"department":[{"_id":"DEP5023"}],"author":[{"first_name":"Christoph-Alexander","id":"64782","full_name":"Holst, Christoph-Alexander","last_name":"Holst"},{"last_name":"Röckemann","first_name":"Kristian","full_name":"Röckemann, Kristian"},{"full_name":"Steinmetz, Andreas","first_name":"Andreas","last_name":"Steinmetz","id":"55232"},{"orcid":"0000-0002-3325-7887","last_name":"Lohweg","full_name":"Lohweg, Volker","id":"1804","first_name":"Volker"}],"year":2019,"date_updated":"2023-03-15T13:49:38Z","user_id":"74004","date_created":"2019-11-22T12:51:16Z","type":"conference","publication":"5th IEEE International Forum on Research and Technologies for Society and Industry","_id":"1995","language":[{"iso":"eng"}],"place":"Firenze, Italy"},{"author":[{"first_name":"Eugen","last_name":"Gillich","full_name":"Gillich, Eugen","id":"1706"},{"first_name":"Alexander","full_name":"Fritze, Alexander","last_name":"Fritze"},{"last_name":"Henning","first_name":"Kai-Fabian","id":"44017","full_name":"Henning, Kai-Fabian"},{"id":"52097","last_name":"Pfeifer","full_name":"Pfeifer, Anton","first_name":"Anton"},{"full_name":"Dörksen, Helene","id":"46416","first_name":"Helene","last_name":"Dörksen"},{"orcid":"0000-0002-3325-7887","id":"1804","first_name":"Volker","full_name":"Lohweg, Volker","last_name":"Lohweg"}],"year":2019,"department":[{"_id":"DEP5023"}],"abstract":[{"lang":"eng","text":"Intelligent technical systems need to become more flexible and adaptive in the context of Cyber-Physical-Systems and Industry 4.0. Cash supply is very important for the worldwide economy. Within the supply chain, handling processes are highly automated, e.g., automated teller machines are installed to ensure an efficient and reliable cash supply. Recently, there is a trend in automated cash handling systems to replace the cash cassettes for each denomination by a simple pitch-in-plastic-bag for all banknotes. This necessitates new automated handling approaches because the bag content will unload irregularly. We propose a new approach which is able to detect the pose and possible occlusions of randomly distributed textured banknotes with simple smartphone cameras. This information can be used to control a handling robot-picking out banknotes."}],"status":"public","title":"Camera-based Occlusion Detection for Banknote Sorting","citation":{"chicago-de":"Gillich, Eugen, Alexander Fritze, Kai-Fabian Henning, Anton Pfeifer, Helene Dörksen und Volker Lohweg. 2019. Camera-based Occlusion Detection for Banknote Sorting. In: 5th IEEE International Forum on Research and Technologies for Society and Industry. Firenze, Italy.","din1505-2-1":"Gillich, Eugen ; Fritze, Alexander ; Henning, Kai-Fabian ; Pfeifer, Anton ; Dörksen, Helene ; Lohweg, Volker: Camera-based Occlusion Detection for Banknote Sorting. In: 5th IEEE International Forum on Research and Technologies for Society and Industry. Firenze, Italy, 2019","short":"E. Gillich, A. Fritze, K.-F. Henning, A. Pfeifer, H. Dörksen, V. Lohweg, in: 5th IEEE International Forum on Research and Technologies for Society and Industry, Firenze, Italy, 2019.","chicago":"Gillich, Eugen, Alexander Fritze, Kai-Fabian Henning, Anton Pfeifer, Helene Dörksen, and Volker Lohweg. “Camera-Based Occlusion Detection for Banknote Sorting.” In 5th IEEE International Forum on Research and Technologies for Society and Industry. Firenze, Italy, 2019.","apa":"Gillich, E., Fritze, A., Henning, K.-F., Pfeifer, A., Dörksen, H., & Lohweg, V. (2019). Camera-based Occlusion Detection for Banknote Sorting. In 5th IEEE International Forum on Research and Technologies for Society and Industry. Firenze, Italy.","ieee":"E. Gillich, A. Fritze, K.-F. Henning, A. Pfeifer, H. Dörksen, and V. Lohweg, “Camera-based Occlusion Detection for Banknote Sorting,” in 5th IEEE International Forum on Research and Technologies for Society and Industry, 2019.","ufg":"Gillich, Eugen et. al. (2019): Camera-based Occlusion Detection for Banknote Sorting, in: 5th IEEE International Forum on Research and Technologies for Society and Industry, Firenze, Italy.","bjps":"Gillich E et al. (2019) Camera-Based Occlusion Detection for Banknote Sorting. 5th IEEE International Forum on Research and Technologies for Society and Industry. Firenze, Italy.","havard":"E. Gillich, A. Fritze, K.-F. Henning, A. Pfeifer, H. Dörksen, V. Lohweg, Camera-based Occlusion Detection for Banknote Sorting, in: 5th IEEE International Forum on Research and Technologies for Society and Industry, Firenze, Italy, 2019.","mla":"Gillich, Eugen, et al. “Camera-Based Occlusion Detection for Banknote Sorting.” 5th IEEE International Forum on Research and Technologies for Society and Industry, 2019.","van":"Gillich E, Fritze A, Henning K-F, Pfeifer A, Dörksen H, Lohweg V. Camera-based Occlusion Detection for Banknote Sorting. In: 5th IEEE International Forum on Research and Technologies for Society and Industry. Firenze, Italy; 2019.","ama":"Gillich E, Fritze A, Henning K-F, Pfeifer A, Dörksen H, Lohweg V. Camera-based Occlusion Detection for Banknote Sorting. In: 5th IEEE International Forum on Research and Technologies for Society and Industry. Firenze, Italy; 2019."},"place":"Firenze, Italy","language":[{"iso":"eng"}],"_id":"1996","publication":"5th IEEE International Forum on Research and Technologies for Society and Industry","date_created":"2019-11-22T12:51:17Z","type":"conference","user_id":"74004","date_updated":"2023-03-15T13:49:38Z"},{"citation":{"ieee":"V. Lohweg, “Über Informationsfusion von Daten im industriellen Kontext,” in 19. Data-Science-Ruhrgebiet-Konferenz (Vortrag), 2019.","ama":"Lohweg V. Über Informationsfusion von Daten im industriellen Kontext. In: 19. Data-Science-Ruhrgebiet-Konferenz (Vortrag),. Bochum, BO-I-T; 2019.","din1505-2-1":"Lohweg, Volker: Über Informationsfusion von Daten im industriellen Kontext. In: 19. Data-Science-Ruhrgebiet-Konferenz (Vortrag),. Bochum, BO-I-T, 2019","chicago-de":"Lohweg, Volker. 2019. Über Informationsfusion von Daten im industriellen Kontext. In: 19. Data-Science-Ruhrgebiet-Konferenz (Vortrag),. Bochum, BO-I-T.","short":"V. Lohweg, in: 19. Data-Science-Ruhrgebiet-Konferenz (Vortrag), Bochum, BO-I-T, 2019.","chicago":"Lohweg, Volker. “Über Informationsfusion von Daten Im Industriellen Kontext.” In 19. Data-Science-Ruhrgebiet-Konferenz (Vortrag),. Bochum, BO-I-T, 2019.","apa":"Lohweg, V. (2019). Über Informationsfusion von Daten im industriellen Kontext. In 19. Data-Science-Ruhrgebiet-Konferenz (Vortrag),. Bochum, BO-I-T.","ufg":"Lohweg, Volker (2019): Über Informationsfusion von Daten im industriellen Kontext, in: 19. Data-Science-Ruhrgebiet-Konferenz (Vortrag),, Bochum, BO-I-T.","havard":"V. Lohweg, Über Informationsfusion von Daten im industriellen Kontext, in: 19. Data-Science-Ruhrgebiet-Konferenz (Vortrag), Bochum, BO-I-T, 2019.","bjps":"Lohweg V (2019) Über Informationsfusion von Daten Im Industriellen Kontext. 19. Data-Science-Ruhrgebiet-Konferenz (Vortrag),. Bochum, BO-I-T.","mla":"Lohweg, Volker. “Über Informationsfusion von Daten Im Industriellen Kontext.” 19. Data-Science-Ruhrgebiet-Konferenz (Vortrag), 2019.","van":"Lohweg V. Über Informationsfusion von Daten im industriellen Kontext. In: 19 Data-Science-Ruhrgebiet-Konferenz (Vortrag),. Bochum, BO-I-T; 2019."},"title":"Über Informationsfusion von Daten im industriellen Kontext","status":"public","year":2019,"author":[{"orcid":"0000-0002-3325-7887","full_name":"Lohweg, Volker","last_name":"Lohweg","id":"1804","first_name":"Volker"}],"department":[{"_id":"DEP5023"}],"user_id":"68554","date_updated":"2023-03-15T13:49:38Z","publication":"19. Data-Science-Ruhrgebiet-Konferenz (Vortrag),","type":"conference","date_created":"2019-11-22T12:51:19Z","place":"Bochum, BO-I-T","language":[{"iso":"eng"}],"_id":"1997"},{"status":"public","department":[{"_id":"DEP5023"}],"year":2019,"author":[{"full_name":"Holst, Christoph-Alexander","first_name":"Christoph-Alexander","last_name":"Holst","id":"64782"},{"orcid":"0000-0002-3325-7887","id":"1804","last_name":"Lohweg","first_name":"Volker","full_name":"Lohweg, Volker"}],"citation":{"chicago-de":"Holst, Christoph-Alexander und Volker Lohweg. 2019. Improving Majority-guided Fuzzy Information Fusion for Industry 4.0 Condition Monitoring. In: 22nd International Conference on Information Fusion (FUSION). Ottawa, Canada.","din1505-2-1":"Holst, Christoph-Alexander ; Lohweg, Volker: Improving Majority-guided Fuzzy Information Fusion for Industry 4.0 Condition Monitoring. In: 22nd International Conference on Information Fusion (FUSION). Ottawa, Canada, 2019","short":"C.-A. Holst, V. Lohweg, in: 22nd International Conference on Information Fusion (FUSION), Ottawa, Canada, 2019.","mla":"Holst, Christoph-Alexander, and Volker Lohweg. “Improving Majority-Guided Fuzzy Information Fusion for Industry 4.0 Condition Monitoring.” 22nd International Conference on Information Fusion (FUSION), 2019.","bjps":"Holst C-A and Lohweg V (2019) Improving Majority-Guided Fuzzy Information Fusion for Industry 4.0 Condition Monitoring. 22nd International Conference on Information Fusion (FUSION). Ottawa, Canada.","havard":"C.-A. Holst, V. Lohweg, Improving Majority-guided Fuzzy Information Fusion for Industry 4.0 Condition Monitoring, in: 22nd International Conference on Information Fusion (FUSION), Ottawa, Canada, 2019.","ufg":"Holst, Christoph-Alexander/Lohweg, Volker (2019): Improving Majority-guided Fuzzy Information Fusion for Industry 4.0 Condition Monitoring, in: 22nd International Conference on Information Fusion (FUSION), Ottawa, Canada.","van":"Holst C-A, Lohweg V. Improving Majority-guided Fuzzy Information Fusion for Industry 4.0 Condition Monitoring. In: 22nd International Conference on Information Fusion (FUSION). Ottawa, Canada; 2019.","chicago":"Holst, Christoph-Alexander, and Volker Lohweg. “Improving Majority-Guided Fuzzy Information Fusion for Industry 4.0 Condition Monitoring.” In 22nd International Conference on Information Fusion (FUSION). Ottawa, Canada, 2019.","apa":"Holst, C.-A., & Lohweg, V. (2019). Improving Majority-guided Fuzzy Information Fusion for Industry 4.0 Condition Monitoring. In 22nd International Conference on Information Fusion (FUSION). Ottawa, Canada.","ama":"Holst C-A, Lohweg V. Improving Majority-guided Fuzzy Information Fusion for Industry 4.0 Condition Monitoring. In: 22nd International Conference on Information Fusion (FUSION). Ottawa, Canada; 2019.","ieee":"C.-A. Holst and V. Lohweg, “Improving Majority-guided Fuzzy Information Fusion for Industry 4.0 Condition Monitoring,” in 22nd International Conference on Information Fusion (FUSION), 2019."},"title":"Improving Majority-guided Fuzzy Information Fusion for Industry 4.0 Condition Monitoring","language":[{"iso":"eng"}],"place":"Ottawa, Canada","_id":"1998","date_updated":"2023-03-15T13:49:38Z","user_id":"68554","type":"conference","date_created":"2019-11-22T12:51:20Z","publication":"22nd International Conference on Information Fusion (FUSION)"},{"department":[{"_id":"DEP5023"}],"year":2019,"author":[{"first_name":"Volker","last_name":"Lohweg","id":"1804","full_name":"Lohweg, Volker","orcid":"0000-0002-3325-7887"}],"status":"public","title":"Künstliche Intelligenz","citation":{"ama":"Lohweg V. Künstliche Intelligenz. Schlossrunde 2019, Wirtschaft trifft Wissenschaft (eingeladener Vortrag), Abtei Marienmünster. 2019.","ieee":"V. Lohweg, “Künstliche Intelligenz,” Schlossrunde 2019, Wirtschaft trifft Wissenschaft (eingeladener Vortrag), Abtei Marienmünster, 2019.","ufg":"Lohweg, Volker (2019): Künstliche Intelligenz, in: Schlossrunde 2019, Wirtschaft trifft Wissenschaft (eingeladener Vortrag), Abtei Marienmünster.","havard":"V. Lohweg, Künstliche Intelligenz, Schlossrunde 2019, Wirtschaft Trifft Wissenschaft (Eingeladener Vortrag), Abtei Marienmünster. (2019).","mla":"Lohweg, Volker. “Künstliche Intelligenz.” Schlossrunde 2019, Wirtschaft Trifft Wissenschaft (Eingeladener Vortrag), Abtei Marienmünster, 2019.","bjps":"Lohweg V (2019) Künstliche Intelligenz. Schlossrunde 2019, Wirtschaft trifft Wissenschaft (eingeladener Vortrag), Abtei Marienmünster.","van":"Lohweg V. Künstliche Intelligenz. Schlossrunde 2019, Wirtschaft trifft Wissenschaft (eingeladener Vortrag), Abtei Marienmünster. 2019;","chicago":"Lohweg, Volker. “Künstliche Intelligenz.” Schlossrunde 2019, Wirtschaft Trifft Wissenschaft (Eingeladener Vortrag), Abtei Marienmünster, 2019.","apa":"Lohweg, V. (2019). Künstliche Intelligenz. Schlossrunde 2019, Wirtschaft Trifft Wissenschaft (Eingeladener Vortrag), Abtei Marienmünster.","din1505-2-1":"Lohweg, Volker: Künstliche Intelligenz. In: Schlossrunde 2019, Wirtschaft trifft Wissenschaft (eingeladener Vortrag), Abtei Marienmünster (2019)","chicago-de":"Lohweg, Volker. 2019. Künstliche Intelligenz. Schlossrunde 2019, Wirtschaft trifft Wissenschaft (eingeladener Vortrag), Abtei Marienmünster.","short":"V. Lohweg, Schlossrunde 2019, Wirtschaft Trifft Wissenschaft (Eingeladener Vortrag), Abtei Marienmünster (2019)."},"language":[{"iso":"eng"}],"_id":"1999","date_created":"2019-11-22T12:51:21Z","type":"journal_article","publication":"Schlossrunde 2019, Wirtschaft trifft Wissenschaft (eingeladener Vortrag), Abtei Marienmünster","date_updated":"2023-03-15T13:49:38Z","user_id":"68554"},{"status":"public","year":2019,"author":[{"first_name":"Anton","id":"52097","full_name":"Pfeifer, Anton","last_name":"Pfeifer"},{"full_name":"Dörksen, Helene","last_name":"Dörksen","first_name":"Helene","id":"46416"},{"full_name":"Lohweg, Volker","last_name":"Lohweg","id":"1804","first_name":"Volker","orcid":"0000-0002-3325-7887"}],"department":[{"_id":"DEP5023"}],"citation":{"ieee":"A. Pfeifer, H. Dörksen, and V. Lohweg, “Effective Protection of Physical Documents by Print Coding as Digital Tag and Authentication Methods,” in Digital Document Security, 2019.","ama":"Pfeifer A, Dörksen H, Lohweg V. Effective Protection of Physical Documents by Print Coding as Digital Tag and Authentication Methods. In: Digital Document Security. Berlin; 2019.","short":"A. Pfeifer, H. Dörksen, V. Lohweg, in: Digital Document Security, Berlin, 2019.","din1505-2-1":"Pfeifer, Anton ; Dörksen, Helene ; Lohweg, Volker: Effective Protection of Physical Documents by Print Coding as Digital Tag and Authentication Methods. In: Digital Document Security. Berlin, 2019","chicago-de":"Pfeifer, Anton, Helene Dörksen und Volker Lohweg. 2019. Effective Protection of Physical Documents by Print Coding as Digital Tag and Authentication Methods. In: Digital Document Security. Berlin.","apa":"Pfeifer, A., Dörksen, H., & Lohweg, V. (2019). Effective Protection of Physical Documents by Print Coding as Digital Tag and Authentication Methods. In Digital Document Security. Berlin.","chicago":"Pfeifer, Anton, Helene Dörksen, and Volker Lohweg. “Effective Protection of Physical Documents by Print Coding as Digital Tag and Authentication Methods.” In Digital Document Security. Berlin, 2019.","van":"Pfeifer A, Dörksen H, Lohweg V. Effective Protection of Physical Documents by Print Coding as Digital Tag and Authentication Methods. In: Digital Document Security. Berlin; 2019.","bjps":"Pfeifer A, Dörksen H and Lohweg V (2019) Effective Protection of Physical Documents by Print Coding as Digital Tag and Authentication Methods. Digital Document Security. Berlin.","havard":"A. Pfeifer, H. Dörksen, V. Lohweg, Effective Protection of Physical Documents by Print Coding as Digital Tag and Authentication Methods, in: Digital Document Security, Berlin, 2019.","mla":"Pfeifer, Anton, et al. “Effective Protection of Physical Documents by Print Coding as Digital Tag and Authentication Methods.” Digital Document Security, 2019.","ufg":"Pfeifer, Anton et. al. (2019): Effective Protection of Physical Documents by Print Coding as Digital Tag and Authentication Methods, in: Digital Document Security, Berlin."},"title":"Effective Protection of Physical Documents by Print Coding as Digital Tag and Authentication Methods","place":"Berlin","language":[{"iso":"eng"}],"_id":"2000","user_id":"68554","date_updated":"2023-03-15T13:49:38Z","publication":"Digital Document Security","type":"conference","date_created":"2019-11-22T12:51:23Z"},{"title":"Bildverarbeitung im industriellen Umfeld von Abfüllanlagen","citation":{"ieee":"A. Dicks, C. Wissel, M. Bator, and V. Lohweg, “Bildverarbeitung im industriellen Umfeld von Abfüllanlagen,” in Kommunikation und Bildverarbeitung in der Automation - Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2018, Lemgo, 2019, pp. 331–345. doi: 10.1007/978-3-662-59895-5_24.","ama":"Dicks A, Wissel C, Bator M, Lohweg V. Bildverarbeitung im industriellen Umfeld von Abfüllanlagen. In: Kommunikation Und Bildverarbeitung in Der Automation - Ausgewählte Beiträge Der Jahreskolloquien KommA Und BVAu 2018. Springer; 2019:331-345. doi:10.1007/978-3-662-59895-5_24","short":"A. Dicks, C. Wissel, M. Bator, V. Lohweg, in: Kommunikation Und Bildverarbeitung in Der Automation - Ausgewählte Beiträge Der Jahreskolloquien KommA Und BVAu 2018, Springer, Berlin, Heidelberg, 2019, pp. 331–345.","chicago-de":"Dicks, Alexander, Christian Wissel, Martyna Bator und Volker Lohweg. 2019. Bildverarbeitung im industriellen Umfeld von Abfüllanlagen. In: Kommunikation und Bildverarbeitung in der Automation - Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2018, 331–345. Berlin, Heidelberg: Springer. doi:10.1007/978-3-662-59895-5_24, .","din1505-2-1":"Dicks, Alexander ; Wissel, Christian ; Bator, Martyna ; Lohweg, Volker: Bildverarbeitung im industriellen Umfeld von Abfüllanlagen. In: Kommunikation und Bildverarbeitung in der Automation - Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2018. Berlin, Heidelberg : Springer, 2019, S. 331–345","apa":"Dicks, A., Wissel, C., Bator, M., & Lohweg, V. (2019). Bildverarbeitung im industriellen Umfeld von Abfüllanlagen. Kommunikation Und Bildverarbeitung in Der Automation - Ausgewählte Beiträge Der Jahreskolloquien KommA Und BVAu 2018, 331–345. https://doi.org/10.1007/978-3-662-59895-5_24","chicago":"Dicks, Alexander, Christian Wissel, Martyna Bator, and Volker Lohweg. “Bildverarbeitung Im Industriellen Umfeld von Abfüllanlagen.” In Kommunikation Und Bildverarbeitung in Der Automation - Ausgewählte Beiträge Der Jahreskolloquien KommA Und BVAu 2018, 331–45. Berlin, Heidelberg: Springer, 2019. https://doi.org/10.1007/978-3-662-59895-5_24.","van":"Dicks A, Wissel C, Bator M, Lohweg V. Bildverarbeitung im industriellen Umfeld von Abfüllanlagen. In: Kommunikation und Bildverarbeitung in der Automation - Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2018. Berlin, Heidelberg: Springer; 2019. p. 331–45.","bjps":"Dicks A et al. (2019) Bildverarbeitung Im Industriellen Umfeld von Abfüllanlagen. Kommunikation Und Bildverarbeitung in Der Automation - Ausgewählte Beiträge Der Jahreskolloquien KommA Und BVAu 2018. Berlin, Heidelberg: Springer, pp. 331–345.","mla":"Dicks, Alexander, et al. “Bildverarbeitung Im Industriellen Umfeld von Abfüllanlagen.” Kommunikation Und Bildverarbeitung in Der Automation - Ausgewählte Beiträge Der Jahreskolloquien KommA Und BVAu 2018, Springer, 2019, pp. 331–45, https://doi.org/10.1007/978-3-662-59895-5_24.","havard":"A. Dicks, C. Wissel, M. Bator, V. Lohweg, Bildverarbeitung im industriellen Umfeld von Abfüllanlagen, in: Kommunikation Und Bildverarbeitung in Der Automation - Ausgewählte Beiträge Der Jahreskolloquien KommA Und BVAu 2018, Springer, Berlin, Heidelberg, 2019: pp. 331–345.","ufg":"Dicks, Alexander u. a.: Bildverarbeitung im industriellen Umfeld von Abfüllanlagen, in: o. Hg.: Kommunikation und Bildverarbeitung in der Automation - Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2018, Berlin, Heidelberg 2019, S. 331–345."},"department":[{"_id":"DEP5023"},{"_id":"DEP1308"}],"conference":{"end_date":"2018-11-21","start_date":"2018-11-20","location":"Lemgo","name":"Jahreskolloquien KommA und BVAu 2018"},"author":[{"id":"1853","full_name":"Dicks, Alexander","last_name":"Dicks","first_name":"Alexander"},{"first_name":"Christian","id":"59157","last_name":"Wissel","full_name":"Wissel, Christian"},{"first_name":"Martyna","last_name":"Bator","id":"46440","full_name":"Bator, Martyna"},{"last_name":"Lohweg","first_name":"Volker","id":"1804","full_name":"Lohweg, Volker","orcid":"0000-0002-3325-7887"}],"year":"2019","page":"331-345","status":"public","publisher":"Springer","date_created":"2019-11-22T12:51:24Z","type":"conference","publication":"Kommunikation und Bildverarbeitung in der Automation - Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2018","date_updated":"2024-04-15T12:51:59Z","user_id":"83778","language":[{"iso":"eng"}],"place":"Berlin, Heidelberg","doi":"10.1007/978-3-662-59895-5_24","_id":"2001"},{"citation":{"ama":"Lohweg V. Künstliche Intelligenz – Wie verändert sich durch Anwendungen der Künstlichen Intelligenz unser Leben und unsere Arbeit? In: Impulsvortrag. Werkhütte; 2019.","ieee":"V. Lohweg, “Künstliche Intelligenz – Wie verändert sich durch Anwendungen der Künstlichen Intelligenz unser Leben und unsere Arbeit?,” in Impulsvortrag, 2019.","bjps":"Lohweg V (2019) Künstliche Intelligenz – Wie Verändert Sich Durch Anwendungen Der Künstlichen Intelligenz Unser Leben Und Unsere Arbeit? Impulsvortrag. Werkhütte.","mla":"Lohweg, Volker. “Künstliche Intelligenz – Wie Verändert Sich Durch Anwendungen Der Künstlichen Intelligenz Unser Leben Und Unsere Arbeit?” Impulsvortrag, 2019.","havard":"V. Lohweg, Künstliche Intelligenz – Wie verändert sich durch Anwendungen der Künstlichen Intelligenz unser Leben und unsere Arbeit?, in: Impulsvortrag, Werkhütte, 2019.","ufg":"Lohweg, Volker (2019): Künstliche Intelligenz – Wie verändert sich durch Anwendungen der Künstlichen Intelligenz unser Leben und unsere Arbeit?, in: Impulsvortrag, Werkhütte.","van":"Lohweg V. Künstliche Intelligenz – Wie verändert sich durch Anwendungen der Künstlichen Intelligenz unser Leben und unsere Arbeit? In: Impulsvortrag. Werkhütte; 2019.","chicago":"Lohweg, Volker. “Künstliche Intelligenz – Wie Verändert Sich Durch Anwendungen Der Künstlichen Intelligenz Unser Leben Und Unsere Arbeit?” In Impulsvortrag. Werkhütte, 2019.","apa":"Lohweg, V. (2019). Künstliche Intelligenz – Wie verändert sich durch Anwendungen der Künstlichen Intelligenz unser Leben und unsere Arbeit? In Impulsvortrag. Werkhütte.","chicago-de":"Lohweg, Volker. 2019. Künstliche Intelligenz – Wie verändert sich durch Anwendungen der Künstlichen Intelligenz unser Leben und unsere Arbeit? In: Impulsvortrag. Werkhütte.","din1505-2-1":"Lohweg, Volker: Künstliche Intelligenz – Wie verändert sich durch Anwendungen der Künstlichen Intelligenz unser Leben und unsere Arbeit? In: Impulsvortrag. Werkhütte, 2019","short":"V. Lohweg, in: Impulsvortrag, Werkhütte, 2019."},"title":"Künstliche Intelligenz – Wie verändert sich durch Anwendungen der Künstlichen Intelligenz unser Leben und unsere Arbeit?","status":"public","year":2019,"author":[{"full_name":"Lohweg, Volker","id":"1804","last_name":"Lohweg","first_name":"Volker","orcid":"0000-0002-3325-7887"}],"department":[{"_id":"DEP5023"}],"user_id":"68554","date_updated":"2023-03-15T13:49:38Z","publication":"Impulsvortrag","date_created":"2019-11-22T12:51:25Z","type":"conference","place":"Werkhütte","language":[{"iso":"eng"}],"_id":"2002"},{"citation":{"apa":"Holst, C.-A., Röckemann, K., Steinmetz, A., & Lohweg, V. (2019). Lamb Wave-based Quality Inspection of Repaired Carbon Fibre Reinforced Polymers for On-Site Aircraft Maintenance. In 24nd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA2019). Zaragoza, Spain.","chicago":"Holst, Christoph-Alexander, Kristian Röckemann, Andreas Steinmetz, and Volker Lohweg. “Lamb Wave-Based Quality Inspection of Repaired Carbon Fibre Reinforced Polymers for On-Site Aircraft Maintenance.” In 24nd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA2019). Zaragoza, Spain, 2019.","van":"Holst C-A, Röckemann K, Steinmetz A, Lohweg V. Lamb Wave-based Quality Inspection of Repaired Carbon Fibre Reinforced Polymers for On-Site Aircraft Maintenance. In: 24nd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA2019). Zaragoza, Spain; 2019.","ufg":"Holst, Christoph-Alexander et. al. (2019): Lamb Wave-based Quality Inspection of Repaired Carbon Fibre Reinforced Polymers for On-Site Aircraft Maintenance, in: 24nd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA2019), Zaragoza, Spain.","havard":"C.-A. Holst, K. Röckemann, A. Steinmetz, V. Lohweg, Lamb Wave-based Quality Inspection of Repaired Carbon Fibre Reinforced Polymers for On-Site Aircraft Maintenance, in: 24nd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA2019), Zaragoza, Spain, 2019.","mla":"Holst, Christoph-Alexander, et al. “Lamb Wave-Based Quality Inspection of Repaired Carbon Fibre Reinforced Polymers for On-Site Aircraft Maintenance.” 24nd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA2019), 2019.","bjps":"Holst C-A et al. (2019) Lamb Wave-Based Quality Inspection of Repaired Carbon Fibre Reinforced Polymers for On-Site Aircraft Maintenance. 24nd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA2019). Zaragoza, Spain.","short":"C.-A. Holst, K. Röckemann, A. Steinmetz, V. Lohweg, in: 24nd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA2019), Zaragoza, Spain, 2019.","din1505-2-1":"Holst, Christoph-Alexander ; Röckemann, Kristian ; Steinmetz, Andreas ; Lohweg, Volker: Lamb Wave-based Quality Inspection of Repaired Carbon Fibre Reinforced Polymers for On-Site Aircraft Maintenance. In: 24nd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA2019). Zaragoza, Spain, 2019","chicago-de":"Holst, Christoph-Alexander, Kristian Röckemann, Andreas Steinmetz und Volker Lohweg. 2019. Lamb Wave-based Quality Inspection of Repaired Carbon Fibre Reinforced Polymers for On-Site Aircraft Maintenance. In: 24nd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA2019). Zaragoza, Spain.","ieee":"C.-A. Holst, K. Röckemann, A. Steinmetz, and V. Lohweg, “Lamb Wave-based Quality Inspection of Repaired Carbon Fibre Reinforced Polymers for On-Site Aircraft Maintenance,” in 24nd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA2019), 2019.","ama":"Holst C-A, Röckemann K, Steinmetz A, Lohweg V. Lamb Wave-based Quality Inspection of Repaired Carbon Fibre Reinforced Polymers for On-Site Aircraft Maintenance. In: 24nd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA2019). Zaragoza, Spain; 2019."},"title":"Lamb Wave-based Quality Inspection of Repaired Carbon Fibre Reinforced Polymers for On-Site Aircraft Maintenance","status":"public","abstract":[{"lang":"eng","text":"On-site aircraft repairs are gaining in importance due to the susceptibility of carbon fibre reinforced polymers to damage. Repairs themselves are required to be inspected for quality, preferably cost- and time-efficiently. This paper presents an approach for the inspection of repaired composites based on guided Lamb waves. The focus is on cost-effective signal excitation and effective signal processing. Lamb waves are excited with piezoelectric transducers at the resonance frequency of the material under test. Measured signals are processed with a complex wavelet transform to improve damage detection. The proposed approach is evaluated on two test specimens, one of which has a defect in the adhesive bond."}],"year":2019,"author":[{"full_name":"Holst, Christoph-Alexander","first_name":"Christoph-Alexander","id":"64782","last_name":"Holst"},{"full_name":"Röckemann, Kristian","first_name":"Kristian","last_name":"Röckemann"},{"first_name":"Andreas","last_name":"Steinmetz","id":"55232","full_name":"Steinmetz, Andreas"},{"first_name":"Volker","last_name":"Lohweg","id":"1804","full_name":"Lohweg, Volker","orcid":"0000-0002-3325-7887"}],"department":[{"_id":"DEP5023"}],"user_id":"74004","date_updated":"2023-03-15T13:49:38Z","publication":"24nd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA2019)","date_created":"2019-11-22T12:54:24Z","type":"conference","_id":"2003","place":"Zaragoza, Spain","language":[{"iso":"eng"}]},{"place":"Karlsruhe, Dortmund, ","language":[{"iso":"eng"}],"_id":"2172","publication":"29. Workshop Computational Intelligence VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA) KIT Scientific Publishing","type":"conference","date_created":"2019-12-05T07:01:52Z","user_id":"68554","date_updated":"2023-03-15T13:49:39Z","author":[{"last_name":"Meier","full_name":"Meier, Philip","id":"58460","first_name":"Philip"},{"orcid":"0000-0002-3325-7887","id":"1804","first_name":"Volker","full_name":"Lohweg, Volker","last_name":"Lohweg"}],"year":2019,"department":[{"_id":"DEP5023"}],"status":"public","title":"Content Representation for Neural Style Transfer Algorithms based on Structural Similarity (Best Paper Award)","citation":{"ama":"Meier P, Lohweg V. Content Representation for Neural Style Transfer Algorithms based on Structural Similarity (Best Paper Award). In: 29. Workshop Computational Intelligence VDI/VDE-Gesellschaft Mess- Und Automatisierungstechnik (GMA) KIT Scientific Publishing. Karlsruhe, Dortmund, ; 2019.","ieee":"P. Meier and V. Lohweg, “Content Representation for Neural Style Transfer Algorithms based on Structural Similarity (Best Paper Award),” in 29. Workshop Computational Intelligence VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA) KIT Scientific Publishing, 2019.","short":"P. Meier, V. Lohweg, in: 29. Workshop Computational Intelligence VDI/VDE-Gesellschaft Mess- Und Automatisierungstechnik (GMA) KIT Scientific Publishing, Karlsruhe, Dortmund, , 2019.","din1505-2-1":"Meier, Philip ; Lohweg, Volker: Content Representation for Neural Style Transfer Algorithms based on Structural Similarity (Best Paper Award). In: 29. Workshop Computational Intelligence VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA) KIT Scientific Publishing. Karlsruhe, Dortmund, , 2019","chicago-de":"Meier, Philip und Volker Lohweg. 2019. Content Representation for Neural Style Transfer Algorithms based on Structural Similarity (Best Paper Award). In: 29. Workshop Computational Intelligence VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA) KIT Scientific Publishing. Karlsruhe, Dortmund, .","van":"Meier P, Lohweg V. Content Representation for Neural Style Transfer Algorithms based on Structural Similarity (Best Paper Award). In: 29 Workshop Computational Intelligence VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA) KIT Scientific Publishing. Karlsruhe, Dortmund, ; 2019.","mla":"Meier, Philip, and Volker Lohweg. “Content Representation for Neural Style Transfer Algorithms Based on Structural Similarity (Best Paper Award).” 29. Workshop Computational Intelligence VDI/VDE-Gesellschaft Mess- Und Automatisierungstechnik (GMA) KIT Scientific Publishing, 2019.","bjps":"Meier P and Lohweg V (2019) Content Representation for Neural Style Transfer Algorithms Based on Structural Similarity (Best Paper Award). 29. Workshop Computational Intelligence VDI/VDE-Gesellschaft Mess- Und Automatisierungstechnik (GMA) KIT Scientific Publishing. Karlsruhe, Dortmund, .","havard":"P. Meier, V. Lohweg, Content Representation for Neural Style Transfer Algorithms based on Structural Similarity (Best Paper Award), in: 29. Workshop Computational Intelligence VDI/VDE-Gesellschaft Mess- Und Automatisierungstechnik (GMA) KIT Scientific Publishing, Karlsruhe, Dortmund, , 2019.","ufg":"Meier, Philip/Lohweg, Volker (2019): Content Representation for Neural Style Transfer Algorithms based on Structural Similarity (Best Paper Award), in: 29. Workshop Computational Intelligence VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA) KIT Scientific Publishing, Karlsruhe, Dortmund, .","apa":"Meier, P., & Lohweg, V. (2019). Content Representation for Neural Style Transfer Algorithms based on Structural Similarity (Best Paper Award). In 29. Workshop Computational Intelligence VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA) KIT Scientific Publishing. Karlsruhe, Dortmund, .","chicago":"Meier, Philip, and Volker Lohweg. “Content Representation for Neural Style Transfer Algorithms Based on Structural Similarity (Best Paper Award).” In 29. Workshop Computational Intelligence VDI/VDE-Gesellschaft Mess- Und Automatisierungstechnik (GMA) KIT Scientific Publishing. Karlsruhe, Dortmund, , 2019."}},{"publisher":"KIT Scientific Publishing, Karlsruhe","abstract":[{"lang":"eng","text":"The population of many industrialised countries are among the oldest in the world. In Germany, one-fifth of the population is currently over 65 years old, in 2050 it will be more than one-third [1]. Due to this demographic change, there will be more elderly people with chronic disease progressions and the number of neurodegenerative diseases such as dementia or Parkinson's disease will increase [1]. In this context, innovative approaches in medicine and care are particularly relevant for the modernisation of person-oriented …"}],"conference":{"name":"28. WORKSHOP COMPUTATIONAL INTELLIGENCE","location":"Dortmund","start_date":"2018-11-29","end_date":"2018-11-30"},"department":[{"_id":"DEP5023"}],"publication_status":"published","doi":"10.5445/KSP/1000085935","_id":"2004","place":"Dortmund","user_id":"15514","type":"conference","page":"279 - 295","status":"public","main_file_link":[{"url":"https://pdfs.semanticscholar.org/33a3/7f9f338cb00496c64eb19a66d954d486c4d5.pdf#page=291","open_access":"1"}],"author":[{"id":"52097","first_name":"Anton","full_name":"Pfeifer, Anton","last_name":"Pfeifer"},{"last_name":"Lohweg","full_name":"Lohweg, Volker","id":"1804","first_name":"Volker","orcid":"0000-0002-3325-7887"}],"year":2018,"citation":{"apa":"Pfeifer, A., & Lohweg, V. (2018). Identifying Characteristic Gait Patterns in Real-World Scenarios. In 28. Workshop Computational Intelligence VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA) (pp. 279–295). Dortmund: KIT Scientific Publishing, Karlsruhe. https://doi.org/10.5445/KSP/1000085935","chicago":"Pfeifer, Anton, and Volker Lohweg. “Identifying Characteristic Gait Patterns in Real-World Scenarios.” In 28. Workshop Computational Intelligence VDI/VDE-Gesellschaft Mess- Und Automatisierungstechnik (GMA), 279–95. Dortmund: KIT Scientific Publishing, Karlsruhe, 2018. https://doi.org/10.5445/KSP/1000085935.","van":"Pfeifer A, Lohweg V. Identifying Characteristic Gait Patterns in Real-World Scenarios. In: 28 Workshop Computational Intelligence VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA). Dortmund: KIT Scientific Publishing, Karlsruhe; 2018. p. 279–95.","ufg":"Pfeifer, Anton/Lohweg, Volker (2018): Identifying Characteristic Gait Patterns in Real-World Scenarios, in: 28. Workshop Computational Intelligence VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA), Dortmund, S. 279–295.","bjps":"Pfeifer A and Lohweg V (2018) Identifying Characteristic Gait Patterns in Real-World Scenarios. 28. Workshop Computational Intelligence VDI/VDE-Gesellschaft Mess- Und Automatisierungstechnik (GMA). Dortmund: KIT Scientific Publishing, Karlsruhe, pp. 279–295.","mla":"Pfeifer, Anton, and Volker Lohweg. “Identifying Characteristic Gait Patterns in Real-World Scenarios.” 28. Workshop Computational Intelligence VDI/VDE-Gesellschaft Mess- Und Automatisierungstechnik (GMA), KIT Scientific Publishing, Karlsruhe, 2018, pp. 279–95, doi:10.5445/KSP/1000085935.","havard":"A. Pfeifer, V. Lohweg, Identifying Characteristic Gait Patterns in Real-World Scenarios, in: 28. Workshop Computational Intelligence VDI/VDE-Gesellschaft Mess- Und Automatisierungstechnik (GMA), KIT Scientific Publishing, Karlsruhe, Dortmund, 2018: pp. 279–295.","short":"A. Pfeifer, V. Lohweg, in: 28. Workshop Computational Intelligence VDI/VDE-Gesellschaft Mess- Und Automatisierungstechnik (GMA), KIT Scientific Publishing, Karlsruhe, Dortmund, 2018, pp. 279–295.","chicago-de":"Pfeifer, Anton und Volker Lohweg. 2018. Identifying Characteristic Gait Patterns in Real-World Scenarios. In: 28. Workshop Computational Intelligence VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA), 279–295. Dortmund: KIT Scientific Publishing, Karlsruhe. doi:10.5445/KSP/1000085935, .","din1505-2-1":"Pfeifer, Anton ; Lohweg, Volker: Identifying Characteristic Gait Patterns in Real-World Scenarios. In: 28. Workshop Computational Intelligence VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA). Dortmund : KIT Scientific Publishing, Karlsruhe, 2018, S. 279–295","ieee":"A. Pfeifer and V. Lohweg, “Identifying Characteristic Gait Patterns in Real-World Scenarios,” in 28. Workshop Computational Intelligence VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA), Dortmund, 2018, pp. 279–295.","ama":"Pfeifer A, Lohweg V. Identifying Characteristic Gait Patterns in Real-World Scenarios. In: 28. Workshop Computational Intelligence VDI/VDE-Gesellschaft Mess- Und Automatisierungstechnik (GMA). Dortmund: KIT Scientific Publishing, Karlsruhe; 2018:279-295. doi:10.5445/KSP/1000085935"},"title":"Identifying Characteristic Gait Patterns in Real-World Scenarios","language":[{"iso":"eng"}],"oa":"1","date_updated":"2023-03-15T13:49:38Z","date_created":"2019-11-25T08:35:43Z","publication":"28. Workshop Computational Intelligence VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA)","publication_identifier":{"unknown":["978-3-7315-0845-8"]}},{"oa":"1","doi":"10.1109/ETFA.2018.8502485","_id":"2005","language":[{"iso":"eng"}],"keyword":["Task analysis","Software","Linear discriminant analysis","Dimensionality reduction","Mathematical model","Covariance matrices","Measurement"],"place":"Torino, Italy","date_created":"2019-11-25T08:35:44Z","type":"conference","publication":"23rd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)","date_updated":"2023-03-15T13:49:38Z","user_id":"15514","abstract":[{"text":"We present a method for the fast and robust linear classification of badly conditioned data. In our considerations, badly conditioned data are such data which are numerically difficult to handle. Due to, e.g. a large number of features or a large number of objects representing classes as well as noise, outliers or incompleteness, the common software computation of the discriminating linear combination of features between classes fails or is extremely time consuming. The theoretical foundations of our approach are based on the single feature ranking, which allows fast calculation of the approximative initial classification boundary. For the increasing of classification accuracy of this boundary, the refinement is performed in the lower dimensional space. Our approach is tested on several datasets from UCI Reposi-tiory. Experimental results indicate high classification accuracy of the approach. For the modern real industrial applications such a method is especially suitable in the Cyber-Physical-System environments and provides a part of the workflow for the automated classifier design","lang":"eng"}],"conference":{"start_date":"2018-09-04","end_date":"2018-09-07","name":" IEEE 23rd International Conference on Emerging Technologies and Factory Automation (ETFA) 2018","location":" Turin, Italy "},"department":[{"_id":"DEP5023"}],"main_file_link":[{"url":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=8502485","open_access":"1"}],"year":2018,"author":[{"last_name":"Dörksen","first_name":"Helene","full_name":"Dörksen, Helene","id":"46416"},{"last_name":"Lohweg","first_name":"Volker","id":"1804","full_name":"Lohweg, Volker","orcid":"0000-0002-3325-7887"}],"status":"public","title":"Linear Classification of Badly Conditioned Data. ","citation":{"short":"H. Dörksen, V. Lohweg, in: 23rd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA), Torino, Italy, 2018.","din1505-2-1":"Dörksen, Helene ; Lohweg, Volker: Linear Classification of Badly Conditioned Data. . In: 23rd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA). Torino, Italy, 2018","chicago-de":"Dörksen, Helene und Volker Lohweg. 2018. Linear Classification of Badly Conditioned Data. . In: 23rd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA). Torino, Italy. doi:10.1109/ETFA.2018.8502485, .","apa":"Dörksen, H., & Lohweg, V. (2018). Linear Classification of Badly Conditioned Data. . In 23rd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA). Torino, Italy. https://doi.org/10.1109/ETFA.2018.8502485","chicago":"Dörksen, Helene, and Volker Lohweg. “Linear Classification of Badly Conditioned Data. .” In 23rd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA). Torino, Italy, 2018. https://doi.org/10.1109/ETFA.2018.8502485.","van":"Dörksen H, Lohweg V. Linear Classification of Badly Conditioned Data. . In: 23rd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA). Torino, Italy; 2018.","ufg":"Dörksen, Helene/Lohweg, Volker (2018): Linear Classification of Badly Conditioned Data. , in: 23rd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA), Torino, Italy.","havard":"H. Dörksen, V. Lohweg, Linear Classification of Badly Conditioned Data. , in: 23rd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA), Torino, Italy, 2018.","bjps":"Dörksen H and Lohweg V (2018) Linear Classification of Badly Conditioned Data. . 23rd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA). Torino, Italy.","mla":"Dörksen, Helene, and Volker Lohweg. “Linear Classification of Badly Conditioned Data. .” 23rd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA), 2018, doi:10.1109/ETFA.2018.8502485.","ieee":"H. Dörksen and V. Lohweg, “Linear Classification of Badly Conditioned Data. ,” in 23rd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA), Turin, Italy , 2018.","ama":"Dörksen H, Lohweg V. Linear Classification of Badly Conditioned Data. . In: 23rd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA). Torino, Italy; 2018. doi:10.1109/ETFA.2018.8502485"}},{"date_created":"2019-11-25T08:35:46Z","type":"conference","publication":"23rd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)","date_updated":"2024-04-15T12:53:42Z","user_id":"83778","doi":" 10.1109/ETFA.2018.8502472","_id":"2006","language":[{"iso":"eng"}],"place":"Torino, Italy","title":"Feature Extraction for a Conditioning Monitoring System in a Bottling Process.","citation":{"din1505-2-1":"Bator, Martyna ; Wissel, Christian ; Dicks, Alexander ; Lohweg, Volker: Feature Extraction for a Conditioning Monitoring System in a Bottling Process. In: 23rd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA). Torino, Italy, 2018","chicago-de":"Bator, Martyna, Christian Wissel, Alexander Dicks und Volker Lohweg. 2018. Feature Extraction for a Conditioning Monitoring System in a Bottling Process. In: 23rd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA). Torino, Italy. doi: 10.1109/ETFA.2018.8502472, .","short":"M. Bator, C. Wissel, A. Dicks, V. Lohweg, in: 23rd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA), Torino, Italy, 2018.","chicago":"Bator, Martyna, Christian Wissel, Alexander Dicks, and Volker Lohweg. “Feature Extraction for a Conditioning Monitoring System in a Bottling Process.” In 23rd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA). Torino, Italy, 2018. https://doi.org/ 10.1109/ETFA.2018.8502472.","apa":"Bator, M., Wissel, C., Dicks, A., & Lohweg, V. (2018). Feature Extraction for a Conditioning Monitoring System in a Bottling Process. 23rd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA). 23rd International Conference on Emerging Technologies and Factory Automation (ETFA), Torino, Italy. https://doi.org/ 10.1109/ETFA.2018.8502472","mla":"Bator, Martyna, et al. “Feature Extraction for a Conditioning Monitoring System in a Bottling Process.” 23rd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA), 2018, https://doi.org/ 10.1109/ETFA.2018.8502472.","havard":"M. Bator, C. Wissel, A. Dicks, V. Lohweg, Feature Extraction for a Conditioning Monitoring System in a Bottling Process., in: 23rd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA), Torino, Italy, 2018.","bjps":"Bator M et al. (2018) Feature Extraction for a Conditioning Monitoring System in a Bottling Process. 23rd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA). Torino, Italy.","ufg":"Bator, Martyna u. a.: Feature Extraction for a Conditioning Monitoring System in a Bottling Process., in: o. Hg.: 23rd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA), Torino, Italy 2018.","van":"Bator M, Wissel C, Dicks A, Lohweg V. Feature Extraction for a Conditioning Monitoring System in a Bottling Process. In: 23rd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA). Torino, Italy; 2018.","ieee":"M. Bator, C. Wissel, A. Dicks, and V. Lohweg, “Feature Extraction for a Conditioning Monitoring System in a Bottling Process.,” presented at the 23rd International Conference on Emerging Technologies and Factory Automation (ETFA), Torino, Italy, 2018. doi: 10.1109/ETFA.2018.8502472.","ama":"Bator M, Wissel C, Dicks A, Lohweg V. Feature Extraction for a Conditioning Monitoring System in a Bottling Process. In: 23rd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA). ; 2018. doi: 10.1109/ETFA.2018.8502472"},"abstract":[{"lang":"eng","text":"We present an approach for feature extraction in the context of condition monitoring of a bottling process. A special focus lies on the characterisation and evaluation of liquid textures. The approach will feed into a sensor and information fusion system to monitor a bottling process. Requirements like real-time capabilities, data reduction and resource limitations necessitate a fusion approach which capture physical effects of different sensors, extract appropriate features and combine them into one state for the complete filling process. Special attention is paid to the feature extraction of the visual sensor signals to monitor the filling level, the amount of foam and the degree of turbulence in the liquid."}],"department":[{"_id":"DEP5023"},{"_id":"DEP1308"}],"conference":{"location":"Torino, Italy","name":" 23rd International Conference on Emerging Technologies and Factory Automation (ETFA)","end_date":"2018-09-07","start_date":"2018-09-04"},"main_file_link":[{"url":"https://ieeexplore.ieee.org/abstract/document/8502472"}],"author":[{"last_name":"Bator","first_name":"Martyna","id":"46440","full_name":"Bator, Martyna"},{"full_name":"Wissel, Christian","first_name":"Christian","last_name":"Wissel","id":"59157"},{"full_name":"Dicks, Alexander","id":"1853","last_name":"Dicks","first_name":"Alexander"},{"orcid":"0000-0002-3325-7887","full_name":"Lohweg, Volker","first_name":"Volker","last_name":"Lohweg","id":"1804"}],"year":"2018","status":"public"},{"status":"public","abstract":[{"lang":"eng","text":"Multisensor systems are susceptible to sensor ageing effects as well as to environmental changes. Due to these effects, the distribution of sensor measurements may change over time, which is referred to as sensor drift. A multisensor system which adapts to drift by self-monitoring is more durable, requires less manual maintenance, and provides information of higher quality. This contribution proposes an approach for detecting and adapting to sensor drift. The proposed detection algorithm determines the reliability of a sensor based on fuzzy pattern classifiers and a consistency measure. By this means, the inherent redundancy in multisensor systems is exploited to detect drift. Detected drift leads then to a retraining of the classifier on batched data guided by information fusion. The retraining incorporates the estimated magnitude of the drift. The proposed algorithms are evaluated in comparison with state-of-the-art methods in the scope of a publicly available dataset. It is shown that the drift detection algorithm yields results similar to the benchmark algorithm but is less computationally complex. Relearning with the drift-adapted approach results in more robust classifiers with regard to potential future drift."}],"department":[{"_id":"DEP5023"}],"conference":{"end_date":"2018-09-07","start_date":"2018-09-04","location":"Torino, Italy","name":"IEEE 23rd International Conference on Emerging Technologies and Factory Automation (ETFA) 2018"},"year":2018,"main_file_link":[{"url":"https://ieeexplore.ieee.org/abstract/document/8502571"}],"author":[{"id":"64782","last_name":"Holst","full_name":"Holst, Christoph-Alexander","first_name":"Christoph-Alexander"},{"last_name":"Lohweg","first_name":"Volker","full_name":"Lohweg, Volker","id":"1804","orcid":"0000-0002-3325-7887"}],"publication_status":"published","citation":{"ama":"Holst C-A, Lohweg V. A Conflict-Based Drift Detection And Adaptation Approach for Multisensor Information Fusion. In: 23rd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA). Torino, Italy; 2018. doi:10.1109/ETFA.2018.8502571","ieee":"C.-A. Holst and V. Lohweg, “A Conflict-Based Drift Detection And Adaptation Approach for Multisensor Information Fusion,” in 23rd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA), Torino, Italy, 2018.","ufg":"Holst, Christoph-Alexander/Lohweg, Volker (2018): A Conflict-Based Drift Detection And Adaptation Approach for Multisensor Information Fusion, in: 23rd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA), Torino, Italy.","bjps":"Holst C-A and Lohweg V (2018) A Conflict-Based Drift Detection And Adaptation Approach for Multisensor Information Fusion. 23rd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA). Torino, Italy.","mla":"Holst, Christoph-Alexander, and Volker Lohweg. “A Conflict-Based Drift Detection And Adaptation Approach for Multisensor Information Fusion.” 23rd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA), 2018, doi:10.1109/ETFA.2018.8502571.","havard":"C.-A. Holst, V. Lohweg, A Conflict-Based Drift Detection And Adaptation Approach for Multisensor Information Fusion, in: 23rd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA), Torino, Italy, 2018.","van":"Holst C-A, Lohweg V. A Conflict-Based Drift Detection And Adaptation Approach for Multisensor Information Fusion. In: 23rd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA). Torino, Italy; 2018.","chicago":"Holst, Christoph-Alexander, and Volker Lohweg. “A Conflict-Based Drift Detection And Adaptation Approach for Multisensor Information Fusion.” In 23rd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA). Torino, Italy, 2018. https://doi.org/10.1109/ETFA.2018.8502571.","apa":"Holst, C.-A., & Lohweg, V. (2018). A Conflict-Based Drift Detection And Adaptation Approach for Multisensor Information Fusion. In 23rd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA). Torino, Italy. https://doi.org/10.1109/ETFA.2018.8502571","chicago-de":"Holst, Christoph-Alexander und Volker Lohweg. 2018. A Conflict-Based Drift Detection And Adaptation Approach for Multisensor Information Fusion. In: 23rd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA). Torino, Italy. doi:10.1109/ETFA.2018.8502571, .","din1505-2-1":"Holst, Christoph-Alexander ; Lohweg, Volker: A Conflict-Based Drift Detection And Adaptation Approach for Multisensor Information Fusion. In: 23rd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA). Torino, Italy, 2018","short":"C.-A. Holst, V. Lohweg, in: 23rd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA), Torino, Italy, 2018."},"title":"A Conflict-Based Drift Detection And Adaptation Approach for Multisensor Information Fusion","doi":"10.1109/ETFA.2018.8502571","_id":"2007","language":[{"iso":"eng"}],"keyword":["Multisensor systems","Temperature measurement","Current measurement","Redundancy","Pollution measurement","Detection algorithms"],"place":"Torino, Italy","date_updated":"2023-03-15T13:49:38Z","user_id":"15514","type":"conference","date_created":"2019-11-25T08:35:47Z","publication":"23rd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)"},{"user_id":"15514","date_updated":"2023-03-15T13:49:38Z","publication":"European Conference on Data Analysis (ECDA2018)","type":"conference","date_created":"2019-11-25T08:35:48Z","keyword":["multivariate feature selection","Gaussian distribution","linear discriminant analysis"],"place":"Paderborn, Germany","language":[{"iso":"eng"}],"_id":"2008","citation":{"short":"H. Dörksen, V. Lohweg, in: European Conference on Data Analysis (ECDA2018), Paderborn, Germany, 2018.","chicago-de":"Dörksen, Helene und Volker Lohweg. 2018. Multivariate Gaussian Feature Selection. . In: European Conference on Data Analysis (ECDA2018). Paderborn, Germany.","din1505-2-1":"Dörksen, Helene ; Lohweg, Volker: Multivariate Gaussian Feature Selection. . In: European Conference on Data Analysis (ECDA2018). Paderborn, Germany, 2018","ieee":"H. Dörksen and V. Lohweg, “Multivariate Gaussian Feature Selection. ,” in European Conference on Data Analysis (ECDA2018), Paderborn, 2018.","apa":"Dörksen, H., & Lohweg, V. (2018). Multivariate Gaussian Feature Selection. . In European Conference on Data Analysis (ECDA2018). Paderborn, Germany.","chicago":"Dörksen, Helene, and Volker Lohweg. “Multivariate Gaussian Feature Selection. .” In European Conference on Data Analysis (ECDA2018). Paderborn, Germany, 2018.","ama":"Dörksen H, Lohweg V. Multivariate Gaussian Feature Selection. . In: European Conference on Data Analysis (ECDA2018). Paderborn, Germany; 2018.","van":"Dörksen H, Lohweg V. Multivariate Gaussian Feature Selection. . In: European Conference on Data Analysis (ECDA2018). Paderborn, Germany; 2018.","mla":"Dörksen, Helene, and Volker Lohweg. “Multivariate Gaussian Feature Selection. .” European Conference on Data Analysis (ECDA2018), 2018.","bjps":"Dörksen H and Lohweg V (2018) Multivariate Gaussian Feature Selection. . European Conference on Data Analysis (ECDA2018). Paderborn, Germany.","havard":"H. Dörksen, V. Lohweg, Multivariate Gaussian Feature Selection. , in: European Conference on Data Analysis (ECDA2018), Paderborn, Germany, 2018.","ufg":"Dörksen, Helene/Lohweg, Volker (2018): Multivariate Gaussian Feature Selection. , in: European Conference on Data Analysis (ECDA2018), Paderborn, Germany."},"title":"Multivariate Gaussian Feature Selection. ","status":"public","year":2018,"author":[{"first_name":"Helene","last_name":"Dörksen","id":"46416","full_name":"Dörksen, Helene"},{"first_name":"Volker","full_name":"Lohweg, Volker","last_name":"Lohweg","id":"1804","orcid":"0000-0002-3325-7887"}],"department":[{"_id":"DEP5023"}],"conference":{"end_date":"2018-07-06","start_date":"2018-07-04","name":"European Conference on Data Analysis","location":"Paderborn"},"abstract":[{"text":"We concentrate our research activities on the multivariate feature selection, which is one important part of many machine learning tasks. In partucular, Linear Discriminant Analysis [1] belongs to the state-of-the-art methods for the multivariate analysis. From the theoretical point of view, it is the well-known fact that LDA is best suitable in the case the features are Gaussian distributed.\r\nIn the theoretical part of the presented paper, we analyse the properties of the multivariate discriminant analysis with respect to the feature selection. In this context, we consider a binary supervised learning task and assume that the features are Gaussian distributed. The discriminant analysis solves the mentioned supervised learning task by maximising of the discriminant value, calculated for the linear combination of the features.\r\nThe initial LDA solution a 2 Rd is considered for all given features from the feature space X \u001a Rd. The corresponding discriminant is calculated by the formula:\r\nd(a; x1, . . . , xd) := (μ+ − μ−)2\r\n\u001b2+\r\n+ \u001b2−\r\n,\r\nwhere μ+/− are projected class means and \u001b2 +/− are projected class variances (with respect to a). We proof several propositions with the aim to find subsets of the features having higher discriminant value as original d(a; x1, . . . , xd). For the suitability in the real world settings, here we are interested in fast searching for such subsets.\r\nThe performance of the mentioned propositions is examined experimentally on datasets from UCI repository [2]. Several application scenarien will be discussed and tested on the datasets. In addition, tests show that the performance can be achieved also in the case the features are not Gaussian distributed.","lang":"eng"}]},{"title":"Supporting Sensor Orchestration in Non-Stationary Environments","citation":{"ama":"Holst C-A, Lohweg V. Supporting Sensor Orchestration in Non-Stationary Environments. In: ACM International Conference on Computing Frontiers 2018. ACM: New York, NY ; 2018:363-370. doi:10.1145/3203217.3203228","ieee":"C.-A. Holst and V. Lohweg, “Supporting Sensor Orchestration in Non-Stationary Environments,” in ACM International Conference on Computing Frontiers 2018, Ischia, Italy, 2018, pp. 363–370.","van":"Holst C-A, Lohweg V. Supporting Sensor Orchestration in Non-Stationary Environments. In: ACM International Conference on Computing Frontiers 2018. ACM: New York, NY ; 2018. p. 363–70.","ufg":"Holst, Christoph-Alexander/Lohweg, Volker (2018): Supporting Sensor Orchestration in Non-Stationary Environments, in: ACM International Conference on Computing Frontiers 2018, ACM, S. 363–370.","havard":"C.-A. Holst, V. Lohweg, Supporting Sensor Orchestration in Non-Stationary Environments, in: ACM International Conference on Computing Frontiers 2018, New York, NY , ACM, 2018: pp. 363–370.","mla":"Holst, Christoph-Alexander, and Volker Lohweg. “Supporting Sensor Orchestration in Non-Stationary Environments.” ACM International Conference on Computing Frontiers 2018, New York, NY , 2018, pp. 363–70, doi:10.1145/3203217.3203228.","bjps":"Holst C-A and Lohweg V (2018) Supporting Sensor Orchestration in Non-Stationary Environments. ACM International Conference on Computing Frontiers 2018. ACM: New York, NY , pp. 363–370.","apa":"Holst, C.-A., & Lohweg, V. (2018). Supporting Sensor Orchestration in Non-Stationary Environments. In ACM International Conference on Computing Frontiers 2018 (pp. 363–370). ACM: New York, NY . https://doi.org/10.1145/3203217.3203228","chicago":"Holst, Christoph-Alexander, and Volker Lohweg. “Supporting Sensor Orchestration in Non-Stationary Environments.” In ACM International Conference on Computing Frontiers 2018, 363–70. ACM: New York, NY , 2018. https://doi.org/10.1145/3203217.3203228.","short":"C.-A. Holst, V. Lohweg, in: ACM International Conference on Computing Frontiers 2018, New York, NY , ACM, 2018, pp. 363–370.","din1505-2-1":"Holst, Christoph-Alexander ; Lohweg, Volker: Supporting Sensor Orchestration in Non-Stationary Environments. In: ACM International Conference on Computing Frontiers 2018. ACM : New York, NY , 2018, S. 363–370","chicago-de":"Holst, Christoph-Alexander und Volker Lohweg. 2018. Supporting Sensor Orchestration in Non-Stationary Environments. In: ACM International Conference on Computing Frontiers 2018, 363–370. ACM: New York, NY . doi:10.1145/3203217.3203228, ."},"department":[{"_id":"DEP5023"}],"conference":{"start_date":"2018-05-08","end_date":"2018-05-10","location":"Ischia, Italy","name":"18 Proceedings of the 15th ACM International Conference on Computing "},"author":[{"id":"64782","last_name":"Holst","full_name":"Holst, Christoph-Alexander","first_name":"Christoph-Alexander"},{"id":"1804","full_name":"Lohweg, Volker","first_name":"Volker","last_name":"Lohweg","orcid":"0000-0002-3325-7887"}],"year":2018,"main_file_link":[{"open_access":"1","url":"https://dl.acm.org/ft_gateway.cfm?id=3203228&ftid=1990918&dwn=1&CFID=118496599&CFTOKEN=78ae977fe9bab251-FBE29E78-FC08-9C3A-B5261CFF94BFEF7E"}],"abstract":[{"lang":"eng","text":"The aim of sensor orchestration is to design and organise multi-sensor systems both to reduce manual design efforts and to facilitate complex sensor systems. A sensor orchestration is required to adapt to non-stationary environments, even if it is applied in streaming data scenarios where labelled data are scarce or not available. Without labels in dynamic environments, it is challenging to determine not only the accuracy of a classifier but also its reliability. This contribution proposes monitoring algorithms intended to support sensor orchestration in classification tasks in non-stationary environments. Proposed measures regard the relevance of features, the separability of classes, and the classifier's reliability. The proposed monitoring algorithms are evaluated regarding their applicability in the scope of a publicly available and synthetically created collection of datasets. It is shown that the approach (i) is able to distinguish relevant from irrelevant features, (ii) measures class separability as class representations drift through feature space, and (iii) marks a classifier as unreliable if errors in the drift-adaptation occur."}],"page":"363 - 370","status":"public","publisher":" New York, NY ","type":"conference","date_created":"2019-11-25T08:35:50Z","publication_identifier":{"eisbn":["978-1-4503-5761-6"]},"publication":"ACM International Conference on Computing Frontiers 2018","date_updated":"2023-03-15T13:49:38Z","user_id":"15514","oa":"1","language":[{"iso":"eng"}],"place":"ACM","doi":"10.1145/3203217.3203228","_id":"2009"},{"user_id":"15514","date_updated":"2023-03-15T13:49:38Z","publication":"SPS-Magazin Ausgabe 1+2/2018, TeDo Verlag GmbH, Marburg","publication_identifier":{"issn":["0935-0187 "]},"type":"journal_article","date_created":"2019-11-25T08:35:51Z","place":"Marburg","language":[{"iso":"ger"}],"_id":"2010","citation":{"short":"C. Wissel, S. Deppe, V. Lohweg, SPS-Magazin Ausgabe 1+2/2018, TeDo Verlag GmbH, Marburg (2018).","din1505-2-1":"Wissel, Christian ; Deppe, Sahar ; Lohweg, Volker: 3D-Inspektion bei 600m/s - Feinste 3D-Strukturen inline mit hohem Tempo prüfen. In: SPS-Magazin Ausgabe 1+2/2018, TeDo Verlag GmbH, Marburg. Marburg, TeDo-Verl (2018), Nr. 1/2","chicago-de":"Wissel, Christian, Sahar Deppe und Volker Lohweg. 2018. 3D-Inspektion bei 600m/s - Feinste 3D-Strukturen inline mit hohem Tempo prüfen. SPS-Magazin Ausgabe 1+2/2018, TeDo Verlag GmbH, Marburg, Nr. 1/2.","apa":"Wissel, C., Deppe, S., & Lohweg, V. (2018). 3D-Inspektion bei 600m/s - Feinste 3D-Strukturen inline mit hohem Tempo prüfen. SPS-Magazin Ausgabe 1+2/2018, TeDo Verlag GmbH, Marburg, (1/2).","ieee":"C. Wissel, S. Deppe, and V. Lohweg, “3D-Inspektion bei 600m/s - Feinste 3D-Strukturen inline mit hohem Tempo prüfen,” SPS-Magazin Ausgabe 1+2/2018, TeDo Verlag GmbH, Marburg, no. 1/2, 2018.","chicago":"Wissel, Christian, Sahar Deppe, and Volker Lohweg. “3D-Inspektion bei 600m/s - Feinste 3D-Strukturen inline mit hohem Tempo prüfen.” SPS-Magazin Ausgabe 1+2/2018, TeDo Verlag GmbH, Marburg, no. 1/2 (2018).","van":"Wissel C, Deppe S, Lohweg V. 3D-Inspektion bei 600m/s - Feinste 3D-Strukturen inline mit hohem Tempo prüfen. SPS-Magazin Ausgabe 1+2/2018, TeDo Verlag GmbH, Marburg. 2018;(1/2).","ama":"Wissel C, Deppe S, Lohweg V. 3D-Inspektion bei 600m/s - Feinste 3D-Strukturen inline mit hohem Tempo prüfen. SPS-Magazin Ausgabe 1+2/2018, TeDo Verlag GmbH, Marburg. 2018;(1/2).","ufg":"Wissel, Christian et. al. (2018): 3D-Inspektion bei 600m/s - Feinste 3D-Strukturen inline mit hohem Tempo prüfen, in: SPS-Magazin Ausgabe 1+2/2018, TeDo Verlag GmbH, Marburg (1/2).","havard":"C. Wissel, S. Deppe, V. Lohweg, 3D-Inspektion bei 600m/s - Feinste 3D-Strukturen inline mit hohem Tempo prüfen, SPS-Magazin Ausgabe 1+2/2018, TeDo Verlag GmbH, Marburg. (2018).","mla":"Wissel, Christian, et al. “3D-Inspektion bei 600m/s - Feinste 3D-Strukturen inline mit hohem Tempo prüfen.” SPS-Magazin Ausgabe 1+2/2018, TeDo Verlag GmbH, Marburg, no. 1/2, TeDo-Verl, 2018.","bjps":"Wissel C, Deppe S and Lohweg V (2018) 3D-Inspektion bei 600m/s - Feinste 3D-Strukturen inline mit hohem Tempo prüfen. SPS-Magazin Ausgabe 1+2/2018, TeDo Verlag GmbH, Marburg."},"publication_status":"published","title":"3D-Inspektion bei 600m/s - Feinste 3D-Strukturen inline mit hohem Tempo prüfen","status":"public","publisher":"TeDo-Verl","year":2018,"author":[{"id":"59157","last_name":"Wissel","full_name":"Wissel, Christian","first_name":"Christian"},{"id":"52121","first_name":"Sahar","full_name":"Deppe, Sahar","last_name":"Deppe"},{"last_name":"Lohweg","id":"1804","full_name":"Lohweg, Volker","first_name":"Volker","orcid":"0000-0002-3325-7887"}],"department":[{"_id":"DEP5023"}],"issue":"1/2 "},{"citation":{"van":"Lohweg V, Funk M, Scharf M, Dörksen H, Danneel HJ, Hübner M, et al. smartBN—Intelligent Protection and Authentication in Payment Transactions by Smart Banknotes. In: Optical Document Security - The Conference on Optical Security and Counterfeit Detection XII San Francisco. CA, USA;","mla":"Lohweg, Volker, et al. “SmartBN—Intelligent Protection and Authentication in Payment Transactions by Smart Banknotes.” Optical Document Security - The Conference on Optical Security and Counterfeit Detection XII San Francisco.","bjps":"Lohweg V et al. (n.d.) SmartBN—Intelligent Protection and Authentication in Payment Transactions by Smart Banknotes. Optical Document Security - The Conference on Optical Security and Counterfeit Detection XII San Francisco. CA, USA.","havard":"V. Lohweg, M. Funk, M. Scharf, H. Dörksen, H.-J. Danneel, M. Hübner, J. Schaede, E. Thony, A. Knobloch, D.K. Lee, U. Mönks, E. Gillich, smartBN—Intelligent Protection and Authentication in Payment Transactions by Smart Banknotes, in: Optical Document Security - The Conference on Optical Security and Counterfeit Detection XII San Francisco, CA, USA, n.d.","ufg":"Lohweg, Volker u. a.: smartBN—Intelligent Protection and Authentication in Payment Transactions by Smart Banknotes, in: o. Hg.: Optical Document Security - The Conference on Optical Security and Counterfeit Detection XII San Francisco, CA, USA o. J.","apa":"Lohweg, V., Funk, M., Scharf, M., Dörksen, H., Danneel, H.-J., Hübner, M., Schaede, J., Thony, E., Knobloch, A., Lee, D. K., Mönks, U., & Gillich, E. (n.d.). smartBN—Intelligent Protection and Authentication in Payment Transactions by Smart Banknotes. Optical Document Security - The Conference on Optical Security and Counterfeit Detection XII San Francisco. XII. Optical Document Security (ODS)Conference, San Francisco, USA.","chicago":"Lohweg, Volker, Mark Funk, Matthias Scharf, Helene Dörksen, Hans-Jürgen Danneel, Michael Hübner, Johannes Schaede, et al. “SmartBN—Intelligent Protection and Authentication in Payment Transactions by Smart Banknotes.” In Optical Document Security - The Conference on Optical Security and Counterfeit Detection XII San Francisco. CA, USA, n.d.","short":"V. Lohweg, M. Funk, M. Scharf, H. Dörksen, H.-J. Danneel, M. Hübner, J. Schaede, E. Thony, A. Knobloch, D.K. Lee, U. Mönks, E. Gillich, in: Optical Document Security - The Conference on Optical Security and Counterfeit Detection XII San Francisco, CA, USA, n.d.","chicago-de":"Lohweg, Volker, Mark Funk, Matthias Scharf, Helene Dörksen, Hans-Jürgen Danneel, Michael Hübner, Johannes Schaede, u. a. smartBN—Intelligent Protection and Authentication in Payment Transactions by Smart Banknotes. In: Optical Document Security - The Conference on Optical Security and Counterfeit Detection XII San Francisco. CA, USA.","din1505-2-1":"Lohweg, Volker ; Funk, Mark ; Scharf, Matthias ; Dörksen, Helene ; Danneel, Hans-Jürgen ; Hübner, Michael ; Schaede, Johannes ; Thony, Emmanuel ; u. a.: smartBN—Intelligent Protection and Authentication in Payment Transactions by Smart Banknotes. In: Optical Document Security - The Conference on Optical Security and Counterfeit Detection XII San Francisco. CA, USA","ama":"Lohweg V, Funk M, Scharf M, et al. smartBN—Intelligent Protection and Authentication in Payment Transactions by Smart Banknotes. In: Optical Document Security - The Conference on Optical Security and Counterfeit Detection XII San Francisco.","ieee":"V. Lohweg et al., “smartBN—Intelligent Protection and Authentication in Payment Transactions by Smart Banknotes,” presented at the XII. Optical Document Security (ODS)Conference, San Francisco, USA."},"publication_status":"submitted","title":"smartBN—Intelligent Protection and Authentication in Payment Transactions by Smart Banknotes","status":"public","year":"2018","author":[{"orcid":"0000-0002-3325-7887","last_name":"Lohweg","full_name":"Lohweg, Volker","id":"1804","first_name":"Volker"},{"full_name":"Funk, Mark","first_name":"Mark","id":"52473","last_name":"Funk"},{"first_name":"Matthias","last_name":"Scharf","id":"65179","full_name":"Scharf, Matthias"},{"id":"46416","full_name":"Dörksen, Helene","first_name":"Helene","last_name":"Dörksen"},{"first_name":"Hans-Jürgen","full_name":"Danneel, Hans-Jürgen","id":"12231","last_name":"Danneel"},{"first_name":"Michael","full_name":"Hübner, Michael","last_name":"Hübner"},{"first_name":"Johannes","id":"2128","last_name":"Schaede","full_name":"Schaede, Johannes"},{"last_name":"Thony","full_name":"Thony, Emmanuel","first_name":"Emmanuel"},{"first_name":"Alexander","full_name":"Knobloch, Alexander","last_name":"Knobloch"},{"last_name":"Lee","first_name":"Dinh Khoi","full_name":"Lee, Dinh Khoi"},{"full_name":"Mönks, Uwe","last_name":"Mönks","id":"1825","first_name":"Uwe"},{"last_name":"Gillich","full_name":"Gillich, Eugen","first_name":"Eugen","id":"1706"}],"department":[{"_id":"DEP5023"},{"_id":"DEP4027"}],"conference":{"location":"San Francisco, USA","name":"XII. Optical Document Security (ODS)Conference","start_date":"2018-01-29","end_date":"2018-01-31"},"user_id":"83781","date_updated":"2024-05-17T13:04:57Z","publication":"Optical Document Security - The Conference on Optical Security and Counterfeit Detection XII San Francisco","date_created":"2019-11-25T08:35:52Z","type":"conference","place":" CA, USA","language":[{"iso":"eng"}],"_id":"2011"},{"editor":[{"full_name":"Lohweg, Volker","last_name":"Lohweg","id":"1804","first_name":"Volker","orcid":"https://orcid.org/0000-0002-3325-7887"},{"full_name":"Jasperneite, Jürgen","first_name":"Jürgen","id":"1899","last_name":"Jasperneite"}],"user_id":"45673","date_updated":"2023-03-15T13:49:56Z","publication":"Kommunikation und Bildverarbeitung in der Automation. Technologien für die intelligente Automation ","type":"book_chapter","date_created":"2021-02-02T12:24:31Z","_id":"4834","place":"Berlin, Heidelberg","language":[{"iso":"eng"}],"citation":{"ama":"Lessmann G, Schneider D, Flatt H, Schriegel S, Jasperneite J. Modellbasierter Entwurfsassistent zur Auslegung Spezifischer Architektur- und Konfigurationseigenschaften von Kommunikationsnetzen mit Echtzeitanforderungen. In: Lohweg V, Jasperneite J, eds. Kommunikation Und Bildverarbeitung in Der Automation. Technologien Für Die Intelligente Automation . Technologies for Intelligent Automation. Berlin, Heidelberg: Springer Vieweg; 2018.","ieee":"G. Lessmann, D. Schneider, H. Flatt, S. Schriegel, and J. Jasperneite, “Modellbasierter Entwurfsassistent zur Auslegung Spezifischer Architektur- und Konfigurationseigenschaften von Kommunikationsnetzen mit Echtzeitanforderungen,” in Kommunikation und Bildverarbeitung in der Automation. Technologien für die intelligente Automation , V. Lohweg and J. Jasperneite, Eds. Berlin, Heidelberg: Springer Vieweg, 2018.","short":"G. Lessmann, D. Schneider, H. Flatt, S. Schriegel, J. Jasperneite, in: V. Lohweg, J. Jasperneite (Eds.), Kommunikation Und Bildverarbeitung in Der Automation. Technologien Für Die Intelligente Automation , Springer Vieweg, Berlin, Heidelberg, 2018.","chicago-de":"Lessmann, Gunnar, Daniel Schneider, Holger Flatt, Sebastian Schriegel und Jürgen Jasperneite. 2018. Modellbasierter Entwurfsassistent zur Auslegung Spezifischer Architektur- und Konfigurationseigenschaften von Kommunikationsnetzen mit Echtzeitanforderungen. In: Kommunikation und Bildverarbeitung in der Automation. Technologien für die intelligente Automation , hg. von Volker Lohweg und Jürgen Jasperneite. Technologies for Intelligent Automation. Berlin, Heidelberg: Springer Vieweg.","din1505-2-1":"Lessmann, Gunnar ; Schneider, Daniel ; Flatt, Holger ; Schriegel, Sebastian ; Jasperneite, Jürgen: Modellbasierter Entwurfsassistent zur Auslegung Spezifischer Architektur- und Konfigurationseigenschaften von Kommunikationsnetzen mit Echtzeitanforderungen. In: Lohweg, V. ; Jasperneite, J. (Hrsg.): Kommunikation und Bildverarbeitung in der Automation. Technologien für die intelligente Automation , Technologies for Intelligent Automation. Berlin, Heidelberg : Springer Vieweg, 2018","van":"Lessmann G, Schneider D, Flatt H, Schriegel S, Jasperneite J. Modellbasierter Entwurfsassistent zur Auslegung Spezifischer Architektur- und Konfigurationseigenschaften von Kommunikationsnetzen mit Echtzeitanforderungen. In: Lohweg V, Jasperneite J, editors. Kommunikation und Bildverarbeitung in der Automation Technologien für die intelligente Automation . Berlin, Heidelberg: Springer Vieweg; 2018. (Technologies for Intelligent Automation).","mla":"Lessmann, Gunnar, et al. “Modellbasierter Entwurfsassistent Zur Auslegung Spezifischer Architektur- Und Konfigurationseigenschaften von Kommunikationsnetzen Mit Echtzeitanforderungen.” Kommunikation Und Bildverarbeitung in Der Automation. Technologien Für Die Intelligente Automation , edited by Volker Lohweg and Jürgen Jasperneite, Springer Vieweg, 2018.","havard":"G. Lessmann, D. Schneider, H. Flatt, S. Schriegel, J. Jasperneite, Modellbasierter Entwurfsassistent zur Auslegung Spezifischer Architektur- und Konfigurationseigenschaften von Kommunikationsnetzen mit Echtzeitanforderungen, in: V. Lohweg, J. Jasperneite (Eds.), Kommunikation Und Bildverarbeitung in Der Automation. Technologien Für Die Intelligente Automation , Springer Vieweg, Berlin, Heidelberg, 2018.","bjps":"Lessmann G et al. (2018) Modellbasierter Entwurfsassistent Zur Auslegung Spezifischer Architektur- Und Konfigurationseigenschaften von Kommunikationsnetzen Mit Echtzeitanforderungen. In Lohweg V and Jasperneite J (eds), Kommunikation Und Bildverarbeitung in Der Automation. Technologien Für Die Intelligente Automation . Berlin, Heidelberg: Springer Vieweg.","ufg":"Lessmann, Gunnar et. al. (2018): Modellbasierter Entwurfsassistent zur Auslegung Spezifischer Architektur- und Konfigurationseigenschaften von Kommunikationsnetzen mit Echtzeitanforderungen, in: Volker Lohweg/Jürgen Jasperneite (Hgg.): Kommunikation und Bildverarbeitung in der Automation. Technologien für die intelligente Automation (=Technologies for Intelligent Automation), Berlin, Heidelberg.","apa":"Lessmann, G., Schneider, D., Flatt, H., Schriegel, S., & Jasperneite, J. (2018). Modellbasierter Entwurfsassistent zur Auslegung Spezifischer Architektur- und Konfigurationseigenschaften von Kommunikationsnetzen mit Echtzeitanforderungen. In V. Lohweg & J. Jasperneite (Eds.), Kommunikation und Bildverarbeitung in der Automation. Technologien für die intelligente Automation . Berlin, Heidelberg: Springer Vieweg.","chicago":"Lessmann, Gunnar, Daniel Schneider, Holger Flatt, Sebastian Schriegel, and Jürgen Jasperneite. “Modellbasierter Entwurfsassistent Zur Auslegung Spezifischer Architektur- Und Konfigurationseigenschaften von Kommunikationsnetzen Mit Echtzeitanforderungen.” In Kommunikation Und Bildverarbeitung in Der Automation. Technologien Für Die Intelligente Automation , edited by Volker Lohweg and Jürgen Jasperneite. Technologies for Intelligent Automation. Berlin, Heidelberg: Springer Vieweg, 2018."},"title":"Modellbasierter Entwurfsassistent zur Auslegung Spezifischer Architektur- und Konfigurationseigenschaften von Kommunikationsnetzen mit Echtzeitanforderungen","series_title":"Technologies for Intelligent Automation","publisher":"Springer Vieweg","status":"public","author":[{"first_name":"Gunnar","full_name":"Lessmann, Gunnar","last_name":"Lessmann"},{"full_name":"Schneider, Daniel","last_name":"Schneider","first_name":"Daniel"},{"id":"58494","last_name":"Flatt","full_name":"Flatt, Holger","first_name":"Holger"},{"last_name":"Schriegel","first_name":"Sebastian","full_name":"Schriegel, Sebastian"},{"id":"1899","first_name":"Jürgen","last_name":"Jasperneite","full_name":"Jasperneite, Jürgen"}],"year":2018,"department":[{"_id":"DEP5023"},{"_id":"DEP5019"}]},{"department":[{"_id":"DEP5023"}],"issue":"3/4","abstract":[{"lang":"eng","text":"The rapid growth of optical imaging technologies increased the access and collection of data, which boosts the demand of data and knowledge discovery. This is a fast growing topic in several industry and research areas. Nowadays, a large number of images and signals must be analysed in order to gain and learn proper knowledge. Detecting images with similar contents without specifying an image, recently attracts the researches in image processing domain. Motif discovery in image processing aims to tackle the problem of deriving structures or detecting regularities in image databases. Most of the motif discovery methods solve this problem by converting images into one dimensional time series in a pre-processing step and then applying a motif discovery on these one dimensional time series for image motifs detection. Nevertheless, this conversion might lead to information loss and also the problem of inability to discover shifted and multi-scale image motifs of different size. Contrary to other approaches, here, a method is proposed to find image motifs of different size in image data sets by employing images in original dimension (2D) without converting them to one dimensional time series.\r\nThe proposed approach consists of three steps: Mapping or transformation, feature extraction and measuring similarities. First, images are inspected by the Complex Quad Tree Wavelet Packet transform, which provides broad frequency analysis of an image in various scales. Next, statistical features are extracted from the wavelet coefficients. Finally, image motifs are detected by measuring the similarity of the features applying various similarity measures. Here, the performance of six similarity measures are benchmarked in details. Moreover, the efficiency of the proposed method is demonstrated on a data set with images from diverse applications such as hand gesture, text recognition, leaf and plant identification, etc. Additionally, the robustness of this method is examined with the image data overlaying with distortions such as noise and blur."}],"publisher":"IARIA Journals","publication_status":"published","place":" [S.l.]","_id":"2012","type":"journal_article","user_id":"45673","intvolume":" 10","year":2017,"main_file_link":[{"url":"http://www.iariajournals.org/intelligent_systems/intsys_v10_n34_2017_paged.pdf","open_access":"1"}],"author":[{"last_name":"Deppe","first_name":"Sahar","full_name":"Deppe, Sahar","id":"52121"},{"full_name":"Lohweg, Volker","last_name":"Lohweg","id":"1804","first_name":"Volker","orcid":"0000-0002-3325-7887"}],"page":"434 - 446","status":"public","title":"Evaluation of Similarity Measures for Shift-Invariant Image Motif Discovery","citation":{"short":"S. Deppe, V. Lohweg, International Journal On Advances in Intelligent Systems 10 (2017) 434–446.","chicago-de":"Deppe, Sahar und Volker Lohweg. 2017. Evaluation of Similarity Measures for Shift-Invariant Image Motif Discovery. International Journal On Advances in Intelligent Systems 10, Nr. 3/4: 434–446.","din1505-2-1":"Deppe, Sahar ; Lohweg, Volker: Evaluation of Similarity Measures for Shift-Invariant Image Motif Discovery. In: International Journal On Advances in Intelligent Systems Bd. 10. [S.l.], IARIA Journals (2017), Nr. 3/4, S. 434–446","apa":"Deppe, S., & Lohweg, V. (2017). Evaluation of Similarity Measures for Shift-Invariant Image Motif Discovery. International Journal On Advances in Intelligent Systems, 10(3/4), 434–446.","chicago":"Deppe, Sahar, and Volker Lohweg. “Evaluation of Similarity Measures for Shift-Invariant Image Motif Discovery.” International Journal On Advances in Intelligent Systems 10, no. 3/4 (2017): 434–46.","van":"Deppe S, Lohweg V. Evaluation of Similarity Measures for Shift-Invariant Image Motif Discovery. International Journal On Advances in Intelligent Systems. 2017;10(3/4):434–46.","ufg":"Deppe, Sahar/Lohweg, Volker (2017): Evaluation of Similarity Measures for Shift-Invariant Image Motif Discovery, in: International Journal On Advances in Intelligent Systems 10 (3/4), S. 434–446.","mla":"Deppe, Sahar, and Volker Lohweg. “Evaluation of Similarity Measures for Shift-Invariant Image Motif Discovery.” International Journal On Advances in Intelligent Systems, vol. 10, no. 3/4, IARIA Journals, 2017, pp. 434–46.","bjps":"Deppe S and Lohweg V (2017) Evaluation of Similarity Measures for Shift-Invariant Image Motif Discovery. International Journal On Advances in Intelligent Systems 10, 434–446.","havard":"S. Deppe, V. Lohweg, Evaluation of Similarity Measures for Shift-Invariant Image Motif Discovery, International Journal On Advances in Intelligent Systems. 10 (2017) 434–446.","ieee":"S. Deppe and V. Lohweg, “Evaluation of Similarity Measures for Shift-Invariant Image Motif Discovery,” International Journal On Advances in Intelligent Systems, vol. 10, no. 3/4, pp. 434–446, 2017.","ama":"Deppe S, Lohweg V. Evaluation of Similarity Measures for Shift-Invariant Image Motif Discovery. International Journal On Advances in Intelligent Systems. 2017;10(3/4):434-446."},"volume":10,"oa":"1","language":[{"iso":"eng"}],"keyword":["processing","Wavelet transformation."],"date_created":"2019-11-25T08:35:54Z","publication":"International Journal On Advances in Intelligent Systems","publication_identifier":{"issn":["1942-2679"]},"date_updated":"2023-03-15T13:49:38Z"},{"doi":" https://doi.org/10.3390/s17030601","article_number":"601","_id":"2014","user_id":"15514","intvolume":" 17","type":"journal_article","department":[{"_id":"DEP5023"}],"issue":"3","abstract":[{"text":"Industrial applications are in transition towards modular and flexible architectures that are capable of self-configuration and -optimisation. This is due to the demand of mass customisation and the increasing complexity of industrial systems. The conversion to modular systems is related to challenges in all disciplines. Consequently, diverse tasks such as information processing, extensive networking, or system monitoring using sensor and information fusion systems need to be reconsidered. The focus of this contribution is on distributed sensor and information fusion systems for system monitoring, which must reflect the increasing flexibility of fusion systems. This contribution thus proposes an approach, which relies on a network of self-descriptive intelligent sensor nodes, for the automatic design and update of sensor and information fusion systems. This article encompasses the fusion system configuration and adaptation as well as communication aspects. Manual interaction with the flexibly changing system is reduced to a minimum.","lang":"eng"}],"publication_status":"published","language":[{"iso":"eng"}],"keyword":["information fusion","intelligent sensor","knowledge-based system","self-configuration","sensor fusion"],"oa":"1","date_updated":"2023-03-15T13:49:38Z","date_created":"2019-11-25T08:52:14Z","publication":"Sensors","publication_identifier":{"issn":["1424-8220"]},"status":"public","main_file_link":[{"open_access":"1","url":"https://www.mdpi.com/1424-8220/17/3/601/htm"}],"year":2017,"author":[{"full_name":"Fritze, Alexander","first_name":"Alexander","last_name":"Fritze"},{"last_name":"Mönks","full_name":"Mönks, Uwe","id":"1825","first_name":"Uwe"},{"first_name":"Christoph-Alexander","last_name":"Holst","full_name":"Holst, Christoph-Alexander","id":"64782"},{"orcid":"0000-0002-3325-7887","full_name":"Lohweg, Volker","last_name":"Lohweg","id":"1804","first_name":"Volker"}],"volume":17,"citation":{"ama":"Fritze A, Mönks U, Holst C-A, Lohweg V. An Approach to Automated Fusion System Design and Adaptation. Sensors. 2017;17(3). doi: https://doi.org/10.3390/s17030601","ieee":"A. Fritze, U. Mönks, C.-A. Holst, and V. Lohweg, “An Approach to Automated Fusion System Design and Adaptation,” Sensors, vol. 17, no. 3, 2017.","van":"Fritze A, Mönks U, Holst C-A, Lohweg V. An Approach to Automated Fusion System Design and Adaptation. Sensors. 2017;17(3).","ufg":"Fritze, Alexander et. al. (2017): An Approach to Automated Fusion System Design and Adaptation, in: Sensors 17 (3).","bjps":"Fritze A et al. (2017) An Approach to Automated Fusion System Design and Adaptation. Sensors 17.","mla":"Fritze, Alexander, et al. “An Approach to Automated Fusion System Design and Adaptation.” Sensors, vol. 17, no. 3, 601, 2017, doi: https://doi.org/10.3390/s17030601.","havard":"A. Fritze, U. Mönks, C.-A. Holst, V. Lohweg, An Approach to Automated Fusion System Design and Adaptation, Sensors. 17 (2017).","apa":"Fritze, A., Mönks, U., Holst, C.-A., & Lohweg, V. (2017). An Approach to Automated Fusion System Design and Adaptation. Sensors, 17(3). https://doi.org/ https://doi.org/10.3390/s17030601","chicago":"Fritze, Alexander, Uwe Mönks, Christoph-Alexander Holst, and Volker Lohweg. “An Approach to Automated Fusion System Design and Adaptation.” Sensors 17, no. 3 (2017). https://doi.org/ https://doi.org/10.3390/s17030601.","short":"A. Fritze, U. Mönks, C.-A. Holst, V. Lohweg, Sensors 17 (2017).","din1505-2-1":"Fritze, Alexander ; Mönks, Uwe ; Holst, Christoph-Alexander ; Lohweg, Volker: An Approach to Automated Fusion System Design and Adaptation. In: Sensors Bd. 17 (2017), Nr. 3","chicago-de":"Fritze, Alexander, Uwe Mönks, Christoph-Alexander Holst und Volker Lohweg. 2017. An Approach to Automated Fusion System Design and Adaptation. Sensors 17, Nr. 3. doi: https://doi.org/10.3390/s17030601, ."},"title":"An Approach to Automated Fusion System Design and Adaptation"},{"publisher":"SCITEPRESS - Science and Technology Publications, Lda.","department":[{"_id":"DEP5023"}],"conference":{"end_date":"2017-02-26","start_date":"2017-02-24","name":"6. International Conference on Pattern Recognition Applications and Methods ","location":"Porto, Protugal"},"abstract":[{"lang":"eng","text":" In real-world scenarios it is not always possible to generate an appropriate number of measured objects for machine learning tasks. At the learning stage, for small/incomplete datasets it is nonetheless often possible to get high accuracies for several arbitrarily chosen classifiers. The fact is that many classifiers might perform accurately, but decision boundaries might be inadequate. In this situation, the decision supported by marginlike characteristics for the discrimination of classes might be taken into account. Accuracy as an exclusive measure is often not sufficient. To contribute to the solution of this problem, we present a margin-based approach originated from an existing refinement procedure. In our method, margin value is considered as optimisation criterion for the refinement of SVM models. The performance of the approach is evaluated on a real-world application dataset for Motor Drive Diagnosis coming from the field of intelligent autonomous systems in the context of I ndustry 4.0 paradigm as well as on several UCI Repository samples with different numbers of features and objects."}],"publication_status":"published","place":" [Setúbal]","_id":"2015","doi":"10.5220/0006115502930300","user_id":"15514","type":"conference","status":"public","page":"293-300","author":[{"first_name":"Helene","id":"46416","full_name":"Dörksen, Helene","last_name":"Dörksen"},{"orcid":"0000-0002-3325-7887","first_name":"Volker","id":"1804","full_name":"Lohweg, Volker","last_name":"Lohweg"}],"year":2017,"main_file_link":[{"open_access":"1","url":"http://www.scitepress.org/DigitalLibrary/Link.aspx?doi=10.5220/0006115502930300"}],"citation":{"van":"Dörksen H, Lohweg V. Margin-based Refinement for Support-Vector-Machine Classification. In: Proceedings of the 6th International Conference on Pattern Recognition Applications and Methods. [Setúbal]: SCITEPRESS - Science and Technology Publications, Lda.; 2017. p. 293–300.","mla":"Dörksen, Helene, and Volker Lohweg. “Margin-Based Refinement for Support-Vector-Machine Classification.” Proceedings of the 6th International Conference on Pattern Recognition Applications and Methods, SCITEPRESS - Science and Technology Publications, Lda., 2017, pp. 293–300, doi:10.5220/0006115502930300.","bjps":"Dörksen H and Lohweg V (2017) Margin-Based Refinement for Support-Vector-Machine Classification. Proceedings of the 6th International Conference on Pattern Recognition Applications and Methods. [Setúbal]: SCITEPRESS - Science and Technology Publications, Lda., pp. 293–300.","havard":"H. Dörksen, V. Lohweg, Margin-based Refinement for Support-Vector-Machine Classification, in: Proceedings of the 6th International Conference on Pattern Recognition Applications and Methods, SCITEPRESS - Science and Technology Publications, Lda., [Setúbal], 2017: pp. 293–300.","ufg":"Dörksen, Helene/Lohweg, Volker (2017): Margin-based Refinement for Support-Vector-Machine Classification, in: Proceedings of the 6th International Conference on Pattern Recognition Applications and Methods, [Setúbal], S. 293–300.","apa":"Dörksen, H., & Lohweg, V. (2017). Margin-based Refinement for Support-Vector-Machine Classification. In Proceedings of the 6th International Conference on Pattern Recognition Applications and Methods (pp. 293–300). [Setúbal]: SCITEPRESS - Science and Technology Publications, Lda. https://doi.org/10.5220/0006115502930300","chicago":"Dörksen, Helene, and Volker Lohweg. “Margin-Based Refinement for Support-Vector-Machine Classification.” In Proceedings of the 6th International Conference on Pattern Recognition Applications and Methods, 293–300. [Setúbal]: SCITEPRESS - Science and Technology Publications, Lda., 2017. https://doi.org/10.5220/0006115502930300.","short":"H. Dörksen, V. Lohweg, in: Proceedings of the 6th International Conference on Pattern Recognition Applications and Methods, SCITEPRESS - Science and Technology Publications, Lda., [Setúbal], 2017, pp. 293–300.","din1505-2-1":"Dörksen, Helene ; Lohweg, Volker: Margin-based Refinement for Support-Vector-Machine Classification. In: Proceedings of the 6th International Conference on Pattern Recognition Applications and Methods. [Setúbal] : SCITEPRESS - Science and Technology Publications, Lda., 2017, S. 293–300","chicago-de":"Dörksen, Helene und Volker Lohweg. 2017. Margin-based Refinement for Support-Vector-Machine Classification. In: Proceedings of the 6th International Conference on Pattern Recognition Applications and Methods, 293–300. [Setúbal]: SCITEPRESS - Science and Technology Publications, Lda. doi:10.5220/0006115502930300, .","ama":"Dörksen H, Lohweg V. Margin-based Refinement for Support-Vector-Machine Classification. In: Proceedings of the 6th International Conference on Pattern Recognition Applications and Methods. [Setúbal]: SCITEPRESS - Science and Technology Publications, Lda.; 2017:293-300. doi:10.5220/0006115502930300","ieee":"H. Dörksen and V. Lohweg, “Margin-based Refinement for Support-Vector-Machine Classification,” in Proceedings of the 6th International Conference on Pattern Recognition Applications and Methods, Porto, Protugal, 2017, pp. 293–300."},"title":"Margin-based Refinement for Support-Vector-Machine Classification","keyword":["Refinement of Classification","Robust Classification","Classification within Small/Incomplete Samples"],"language":[{"iso":"eng"}],"oa":"1","date_updated":"2023-03-15T13:49:38Z","publication":"Proceedings of the 6th International Conference on Pattern Recognition Applications and Methods","publication_identifier":{"isbn":["9789897582226"]},"date_created":"2019-11-25T08:59:43Z"},{"place":"Dortmund","language":[{"iso":"eng"}],"_id":"2018","doi":"10.5445/KSP/1000074341","oa":"1","user_id":"15514","date_updated":"2023-03-15T13:49:38Z","publication_identifier":{"eisbn":["978-3-7315-0726-0"]},"type":"conference","date_created":"2019-11-25T09:06:44Z","status":"public","page":"279-295","publisher":"27. Workshop Computational Intelligence VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA)","year":2017,"author":[{"last_name":"Holst","first_name":"Christoph-Alexander","full_name":"Holst, Christoph-Alexander","id":"64782"},{"first_name":"Uwe","id":"1825","last_name":"Mönks","full_name":"Mönks, Uwe"},{"orcid":"0000-0002-3325-7887","last_name":"Lohweg","first_name":"Volker","id":"1804","full_name":"Lohweg, Volker"}],"main_file_link":[{"url":"https://d-nb.info/1147444048/34#page=291","open_access":"1"}],"conference":{"location":"Dortmund","name":"27. Workshop Computational Intelligence ","start_date":"2017-11-23","end_date":"2017-11-24"},"department":[{"_id":"DEP5023"}],"abstract":[{"text":"Applying information fusion systems aims at gaining information of higher quality and simultaneously decreasing computational and communicational efforts. An increased availability of sensors in industrial machines, but also in everyday life, results in large amounts of potential features. Each feature entails computational and communicational costs. An information fusion system may not require all features, supported by the available sensors, to fulfil its purpose. Feature selection methods reduce the amount of features with the aim to maintain or even increase performance. This contribution proposes a feature selection approach exploiting the inherent conflict between features and utilising a state-ofthe-art information fusion operator. The performance of the proposed method is evaluated in the scope of a publicly available data set and benchmarked against an established feature selection method. It is shown that the proposed approach is faster and produces more accurate feature subsets containing very few features, although the established method produces slightly better performing subsets for large feature subsets.","lang":"eng"}],"citation":{"ieee":"C.-A. Holst, U. Mönks, and V. Lohweg, “Conflict-based Feature Selection for Information Fusion Systems,” presented at the 27. Workshop Computational Intelligence , Dortmund, 2017, pp. 279–295.","apa":"Holst, C.-A., Mönks, U., & Lohweg, V. (2017). Conflict-based Feature Selection for Information Fusion Systems (pp. 279–295). Presented at the 27. Workshop Computational Intelligence , Dortmund: 27. Workshop Computational Intelligence VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA). https://doi.org/10.5445/KSP/1000074341","chicago":"Holst, Christoph-Alexander, Uwe Mönks, and Volker Lohweg. “Conflict-Based Feature Selection for Information Fusion Systems,” 279–95. Dortmund: 27. Workshop Computational Intelligence VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA), 2017. https://doi.org/10.5445/KSP/1000074341.","ama":"Holst C-A, Mönks U, Lohweg V. Conflict-based Feature Selection for Information Fusion Systems. In: Dortmund: 27. Workshop Computational Intelligence VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA); 2017:279-295. doi:10.5445/KSP/1000074341","van":"Holst C-A, Mönks U, Lohweg V. Conflict-based Feature Selection for Information Fusion Systems. In Dortmund: 27. Workshop Computational Intelligence VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA); 2017. p. 279–95.","havard":"C.-A. Holst, U. Mönks, V. Lohweg, Conflict-based Feature Selection for Information Fusion Systems, in: 27. Workshop Computational Intelligence VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA), Dortmund, 2017: pp. 279–295.","bjps":"Holst C-A, Mönks U and Lohweg V (2017) Conflict-Based Feature Selection for Information Fusion Systems. Dortmund: 27. Workshop Computational Intelligence VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA), pp. 279–295.","mla":"Holst, Christoph-Alexander, et al. Conflict-Based Feature Selection for Information Fusion Systems. 27. Workshop Computational Intelligence VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA), 2017, pp. 279–95, doi:10.5445/KSP/1000074341.","ufg":"Holst, Christoph-Alexander et. al. (2017): Conflict-based Feature Selection for Information Fusion Systems, in: , Dortmund, S. 279–295.","short":"C.-A. Holst, U. Mönks, V. Lohweg, in: 27. Workshop Computational Intelligence VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA), Dortmund, 2017, pp. 279–295.","chicago-de":"Holst, Christoph-Alexander, Uwe Mönks und Volker Lohweg. 2017. Conflict-based Feature Selection for Information Fusion Systems. In: , 279–295. Dortmund: 27. Workshop Computational Intelligence VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA). doi:10.5445/KSP/1000074341, .","din1505-2-1":"Holst, Christoph-Alexander ; Mönks, Uwe ; Lohweg, Volker: Conflict-based Feature Selection for Information Fusion Systems. In: . Dortmund : 27. Workshop Computational Intelligence VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA), 2017, S. 279–295"},"publication_status":"published","title":"Conflict-based Feature Selection for Information Fusion Systems"},{"title":"Margin-based Refinement for Linear Discriminant Analysis","publication_status":"published","citation":{"din1505-2-1":"Dörksen, Helene ; Lohweg, Volker: Margin-based Refinement for Linear Discriminant Analysis. In: 4th European Conference on Data Analysis 2017 (ECDA 2017) . (Submitted to Journal Archives of Data Sciences) Wrocław, Poland, 2017","chicago-de":"Dörksen, Helene und Volker Lohweg. 2017. Margin-based Refinement for Linear Discriminant Analysis. In: 4th European Conference on Data Analysis 2017 (ECDA 2017) . (Submitted to Journal Archives of Data Sciences) Wrocław, Poland.","short":"H. Dörksen, V. Lohweg, in: 4th European Conference on Data Analysis 2017 (ECDA 2017) , (Submitted to Journal Archives of Data Sciences) Wrocław, Poland, 2017.","bjps":"Dörksen H and Lohweg V (2017) Margin-Based Refinement for Linear Discriminant Analysis. 4th European Conference on Data Analysis 2017 (ECDA 2017) . (Submitted to Journal Archives of Data Sciences) Wrocław, Poland.","havard":"H. Dörksen, V. Lohweg, Margin-based Refinement for Linear Discriminant Analysis, in: 4th European Conference on Data Analysis 2017 (ECDA 2017) , (Submitted to Journal Archives of Data Sciences) Wrocław, Poland, 2017.","mla":"Dörksen, Helene, and Volker Lohweg. “Margin-Based Refinement for Linear Discriminant Analysis.” 4th European Conference on Data Analysis 2017 (ECDA 2017) , 2017.","ufg":"Dörksen, Helene/Lohweg, Volker (2017): Margin-based Refinement for Linear Discriminant Analysis, in: 4th European Conference on Data Analysis 2017 (ECDA 2017) , (Submitted to Journal Archives of Data Sciences) Wrocław, Poland.","ama":"Dörksen H, Lohweg V. Margin-based Refinement for Linear Discriminant Analysis. In: 4th European Conference on Data Analysis 2017 (ECDA 2017) . (Submitted to Journal Archives of Data Sciences) Wrocław, Poland; 2017.","van":"Dörksen H, Lohweg V. Margin-based Refinement for Linear Discriminant Analysis. In: 4th European Conference on Data Analysis 2017 (ECDA 2017) . (Submitted to Journal Archives of Data Sciences) Wrocław, Poland; 2017.","chicago":"Dörksen, Helene, and Volker Lohweg. “Margin-Based Refinement for Linear Discriminant Analysis.” In 4th European Conference on Data Analysis 2017 (ECDA 2017) . (Submitted to Journal Archives of Data Sciences) Wrocław, Poland, 2017.","ieee":"H. Dörksen and V. Lohweg, “Margin-based Refinement for Linear Discriminant Analysis,” in 4th European Conference on Data Analysis 2017 (ECDA 2017) , Wroclaw, Poland, 2017.","apa":"Dörksen, H., & Lohweg, V. (2017). Margin-based Refinement for Linear Discriminant Analysis. In 4th European Conference on Data Analysis 2017 (ECDA 2017) . (Submitted to Journal Archives of Data Sciences) Wrocław, Poland."},"department":[{"_id":"DEP5023"}],"conference":{"location":"Wroclaw, Poland","name":"4th European Conference on Data Analysis (ECDA 2017)","start_date":"2017-09-27","end_date":"20197-09-29"},"author":[{"last_name":"Dörksen","first_name":"Helene","full_name":"Dörksen, Helene","id":"46416"},{"last_name":"Lohweg","id":"1804","full_name":"Lohweg, Volker","first_name":"Volker","orcid":"0000-0002-3325-7887"}],"main_file_link":[{"url":"https://www.researchgate.net/profile/Helene_Doerksen/publication/320352781_Margin-based_Refinement_for_Linear_Discriminant_Analysis_4th_European_Conference_on_Data_Analysis_ECDA_2017_Wroclaw_Poland_27-29_September_2017/links/59df674c45851593bea66c24/Margin-based-Refinement-for-Linear-Discriminant-Analysis-4th-European-Conference-on-Data-Analysis-ECDA-2017-Wroclaw-Poland-27-29-September-2017","open_access":"1"}],"year":2017,"status":"public","date_created":"2019-11-25T09:06:46Z","type":"conference_abstract","publication":"4th European Conference on Data Analysis 2017 (ECDA 2017) ","date_updated":"2023-03-15T13:49:38Z","user_id":"68554","oa":"1","language":[{"iso":"eng"}],"place":"(Submitted to Journal Archives of Data Sciences) Wrocław, Poland","_id":"2019"},{"publication_status":"published","citation":{"ufg":"Lohweg, Volker (2017): Autonome Sensoren - Wie sich die Produktion von morgen verändert wird, Forum Industrial Automation, in: Hannover Messe Industrie.","mla":"Lohweg, Volker. “Autonome Sensoren - Wie sich die Produktion von morgen verändert wird, Forum Industrial Automation.” Hannover Messe Industrie, 2017, doi:10.13140/RG.2.2.32546.63683 .","havard":"V. Lohweg, Autonome Sensoren - Wie sich die Produktion von morgen verändert wird, Forum Industrial Automation, in: Hannover Messe Industrie, 2017.","bjps":"Lohweg V (2017) Autonome Sensoren - Wie sich die Produktion von morgen verändert wird, Forum Industrial Automation. Hannover Messe Industrie.","van":"Lohweg V. Autonome Sensoren - Wie sich die Produktion von morgen verändert wird, Forum Industrial Automation. In: Hannover Messe Industrie. 2017.","ama":"Lohweg V. Autonome Sensoren - Wie sich die Produktion von morgen verändert wird, Forum Industrial Automation. In: Hannover Messe Industrie. ; 2017. doi:10.13140/RG.2.2.32546.63683 ","chicago":"Lohweg, Volker. “Autonome Sensoren - Wie sich die Produktion von morgen verändert wird, Forum Industrial Automation.” In Hannover Messe Industrie, 2017. https://doi.org/10.13140/RG.2.2.32546.63683 .","apa":"Lohweg, V. (2017). Autonome Sensoren - Wie sich die Produktion von morgen verändert wird, Forum Industrial Automation. In Hannover Messe Industrie. Hannover. https://doi.org/10.13140/RG.2.2.32546.63683 ","ieee":"V. Lohweg, “Autonome Sensoren - Wie sich die Produktion von morgen verändert wird, Forum Industrial Automation,” in Hannover Messe Industrie, Hannover, 2017.","din1505-2-1":"Lohweg, Volker: Autonome Sensoren - Wie sich die Produktion von morgen verändert wird, Forum Industrial Automation. In: Hannover Messe Industrie, 2017","chicago-de":"Lohweg, Volker. 2017. Autonome Sensoren - Wie sich die Produktion von morgen verändert wird, Forum Industrial Automation. In: Hannover Messe Industrie. doi:10.13140/RG.2.2.32546.63683 , .","short":"V. Lohweg, in: Hannover Messe Industrie, 2017."},"title":"Autonome Sensoren - Wie sich die Produktion von morgen verändert wird, Forum Industrial Automation","status":"public","department":[{"_id":"DEP5023"}],"conference":{"name":"Forum Insustrial Automation ","location":"Hannover","end_date":"2017-04-28","start_date":"2017-04-24"},"year":2017,"author":[{"first_name":"Volker","last_name":"Lohweg","full_name":"Lohweg, Volker","id":"1804","orcid":"0000-0002-3325-7887"}],"main_file_link":[{"url":"https://www.researchgate.net/profile/Volker_Lohweg/publication/316582794_Autonome_Sensoren_-_Wie_sich_die_Produktion_von_morgen_verandert_wird/links/5904fd7fa6fdccd580d18f1a/Autonome-Sensoren-Wie-sich-die-Produktion-von-morgen-veraendert-wird.pdf"}],"abstract":[{"lang":"ger","text":"Sensor- und Informationsfusion spielt in heutigen Fertigungsanlagen als Enabler-Technologie eine entscheidende Rolle. Dabei ist es entscheidend, dass die Sensoren ein gewisse Autonomie im Rahmen ihrer Messaufgabe besitzen. Der Vortrag zielt darauf ab, einen Ansatz zur Informationsfusion vorzustellen, der darlegt, wie Sensoren sich im Kontext einer Aufgabe selbständig adaptieren und eine Kommunikation mit weiteren Sensoren aufbauen können, um verdichtete Informationen über ein Messobjekt zu generieren."}],"date_updated":"2023-03-15T13:49:38Z","user_id":"15514","date_created":"2019-11-25T09:06:49Z","type":"conference","publication":"Hannover Messe Industrie","language":[{"iso":"ger"}],"doi":"10.13140/RG.2.2.32546.63683 ","_id":"2021"},{"publication_status":"published","department":[{"_id":"DEP5023"}],"conference":{"name":"7. International Conference on Performance (PESARO 2017)","location":"Venice, Italy ","start_date":"2017-04-23","end_date":"2017-04-27"},"abstract":[{"lang":"eng","text":"Nowadays, the boost of optical imaging technologies results in more data with a faster rate are being collected. Consequently, data and knowledge discovery science has become an attractive and a fast growing topic in several industry and research area. Motif discovery in image processing aims to tackle the problem of deriving structures or detecting regularities in image databases. Most of the motif discovery methods first convert images into time series and then attempt to find motifs in such data. This might lead to information loss and also the problem of inability to detect shifted and multi-scale image motifs of different size. Here, a method is proposed to find image motifs of different size in image datasets by applying images in original dimension without converting them to time series. Images are inspected by the Complex Quad Tree Wavelet Packet transform which provides broad frequency analysis of an image in various scales. Next, features are extracted from the wavelet coefficients. Finally, image motifs are detected by measuring the similarity of the features. The performance of the proposed method is demonstrated on a dataset with images from diverse applications, such as hand gesture, text recognition, leaf and plant identification, etc. "}],"publisher":"The Seventh International Conference on Performance, Safety and Robustness in Complex Systems and Applications; Special track MAIS: Machine Learning Algorithms in Image and Signal Processing","type":"conference","user_id":"15514","place":"PESARO 2017; Venice, Italy ","_id":"2022","title":"Shift-Invariant Motif Discovery in Image Processing 'Best Paper Award'","citation":{"ieee":"S. Deppe and V. Lohweg, “Shift-Invariant Motif Discovery in Image Processing ‘Best Paper Award,’” in PESARO 2017 The Seventh International Conference on Performance, Safety and Robustness in Complex Systems and Applications, Venice, Italy , 2017, pp. 27–32.","ama":"Deppe S, Lohweg V. Shift-Invariant Motif Discovery in Image Processing “Best Paper Award.” In: Leister W, ed. PESARO 2017 The Seventh International Conference on Performance, Safety and Robustness in Complex Systems and Applications. PESARO 2017; Venice, Italy : The Seventh International Conference on Performance, Safety and Robustness in Complex Systems and Applications; Special track MAIS: Machine Learning Algorithms in Image and Signal Processing; 2017:27-32.","apa":"Deppe, S., & Lohweg, V. (2017). Shift-Invariant Motif Discovery in Image Processing “Best Paper Award.” In W. Leister (Ed.), PESARO 2017 The Seventh International Conference on Performance, Safety and Robustness in Complex Systems and Applications (pp. 27–32). PESARO 2017; Venice, Italy : The Seventh International Conference on Performance, Safety and Robustness in Complex Systems and Applications; Special track MAIS: Machine Learning Algorithms in Image and Signal Processing.","chicago":"Deppe, Sahar, and Volker Lohweg. “Shift-Invariant Motif Discovery in Image Processing ‘Best Paper Award.’” In PESARO 2017 The Seventh International Conference on Performance, Safety and Robustness in Complex Systems and Applications, edited by Wolfgang Leister, 27–32. PESARO 2017; Venice, Italy : The Seventh International Conference on Performance, Safety and Robustness in Complex Systems and Applications; Special track MAIS: Machine Learning Algorithms in Image and Signal Processing, 2017.","van":"Deppe S, Lohweg V. Shift-Invariant Motif Discovery in Image Processing “Best Paper Award.” In: Leister W, editor. PESARO 2017 The Seventh International Conference on Performance, Safety and Robustness in Complex Systems and Applications. PESARO 2017; Venice, Italy : The Seventh International Conference on Performance, Safety and Robustness in Complex Systems and Applications; Special track MAIS: Machine Learning Algorithms in Image and Signal Processing; 2017. p. 27–32.","havard":"S. Deppe, V. Lohweg, Shift-Invariant Motif Discovery in Image Processing “Best Paper Award,” in: W. Leister (Ed.), PESARO 2017 The Seventh International Conference on Performance, Safety and Robustness in Complex Systems and Applications, The Seventh International Conference on Performance, Safety and Robustness in Complex Systems and Applications; Special track MAIS: Machine Learning Algorithms in Image and Signal Processing, PESARO 2017; Venice, Italy , 2017: pp. 27–32.","bjps":"Deppe S and Lohweg V (2017) Shift-Invariant Motif Discovery in Image Processing ‘Best Paper Award’. In Leister W (ed.), PESARO 2017 The Seventh International Conference on Performance, Safety and Robustness in Complex Systems and Applications. PESARO 2017; Venice, Italy : The Seventh International Conference on Performance, Safety and Robustness in Complex Systems and Applications; Special track MAIS: Machine Learning Algorithms in Image and Signal Processing, pp. 27–32.","mla":"Deppe, Sahar, and Volker Lohweg. “Shift-Invariant Motif Discovery in Image Processing ‘Best Paper Award.’” PESARO 2017 The Seventh International Conference on Performance, Safety and Robustness in Complex Systems and Applications, edited by Wolfgang Leister, The Seventh International Conference on Performance, Safety and Robustness in Complex Systems and Applications; Special track MAIS: Machine Learning Algorithms in Image and Signal Processing, 2017, pp. 27–32.","ufg":"Deppe, Sahar/Lohweg, Volker (2017): Shift-Invariant Motif Discovery in Image Processing „Best Paper Award“, in: Wolfgang Leister (Hg.): PESARO 2017 The Seventh International Conference on Performance, Safety and Robustness in Complex Systems and Applications, PESARO 2017; Venice, Italy , S. 27–32.","short":"S. Deppe, V. Lohweg, in: W. Leister (Ed.), PESARO 2017 The Seventh International Conference on Performance, Safety and Robustness in Complex Systems and Applications, The Seventh International Conference on Performance, Safety and Robustness in Complex Systems and Applications; Special track MAIS: Machine Learning Algorithms in Image and Signal Processing, PESARO 2017; Venice, Italy , 2017, pp. 27–32.","chicago-de":"Deppe, Sahar und Volker Lohweg. 2017. Shift-Invariant Motif Discovery in Image Processing „Best Paper Award“. In: PESARO 2017 The Seventh International Conference on Performance, Safety and Robustness in Complex Systems and Applications, hg. von Wolfgang Leister, 27–32. PESARO 2017; Venice, Italy : The Seventh International Conference on Performance, Safety and Robustness in Complex Systems and Applications; Special track MAIS: Machine Learning Algorithms in Image and Signal Processing.","din1505-2-1":"Deppe, Sahar ; Lohweg, Volker: Shift-Invariant Motif Discovery in Image Processing „Best Paper Award“. In: Leister, W. (Hrsg.): PESARO 2017 The Seventh International Conference on Performance, Safety and Robustness in Complex Systems and Applications. PESARO 2017; Venice, Italy : The Seventh International Conference on Performance, Safety and Robustness in Complex Systems and Applications; Special track MAIS: Machine Learning Algorithms in Image and Signal Processing, 2017, S. 27–32"},"year":2017,"main_file_link":[{"open_access":"1","url":"http://www.thinkmind.org/index.php?view=instance&instance=PESARO+2017"}],"author":[{"id":"52121","last_name":"Deppe","full_name":"Deppe, Sahar","first_name":"Sahar"},{"orcid":"0000-0002-3325-7887","last_name":"Lohweg","first_name":"Volker","full_name":"Lohweg, Volker","id":"1804"}],"status":"public","page":"27-32","publication":"PESARO 2017 The Seventh International Conference on Performance, Safety and Robustness in Complex Systems and Applications","publication_identifier":{"eisbn":["978-1-61208-549-4"],"eissn":["2308-3700"]},"date_created":"2019-11-25T09:06:50Z","date_updated":"2023-03-15T13:49:38Z","editor":[{"full_name":"Leister, Wolfgang","last_name":"Leister","first_name":"Wolfgang"}],"oa":"1","keyword":["Motif discovery","Image processing","Wavelet transformation"],"language":[{"iso":"eng"}]},{"title":"Survey on Time Series Motif Discovery","citation":{"apa":"Deppe, S., & Lohweg, V. (2017). Survey on Time Series Motif Discovery. WIREs : Forensic Science, 7(2). https://doi.org/ https://doi.org/10.1002/widm.1199","ieee":"S. Deppe and V. Lohweg, “Survey on Time Series Motif Discovery,” WIREs : Forensic science, vol. 7, no. 2, 2017.","chicago":"Deppe, Sahar, and Volker Lohweg. “Survey on Time Series Motif Discovery.” WIREs : Forensic Science 7, no. 2 (2017). https://doi.org/ https://doi.org/10.1002/widm.1199.","van":"Deppe S, Lohweg V. Survey on Time Series Motif Discovery. WIREs : Forensic science. 2017;7(2).","ama":"Deppe S, Lohweg V. Survey on Time Series Motif Discovery. WIREs : Forensic science. 2017;7(2). doi: https://doi.org/10.1002/widm.1199","ufg":"Deppe, Sahar/Lohweg, Volker (2017): Survey on Time Series Motif Discovery, in: WIREs : Forensic science 7 (2).","bjps":"Deppe S and Lohweg V (2017) Survey on Time Series Motif Discovery. WIREs : Forensic science 7.","havard":"S. Deppe, V. Lohweg, Survey on Time Series Motif Discovery, WIREs : Forensic Science. 7 (2017).","mla":"Deppe, Sahar, and Volker Lohweg. “Survey on Time Series Motif Discovery.” WIREs : Forensic Science, vol. 7, no. 2, Wiley-Blackwell , 2017, doi: https://doi.org/10.1002/widm.1199.","short":"S. Deppe, V. Lohweg, WIREs : Forensic Science 7 (2017).","chicago-de":"Deppe, Sahar und Volker Lohweg. 2017. Survey on Time Series Motif Discovery. WIREs : Forensic science 7, Nr. 2. doi: https://doi.org/10.1002/widm.1199, .","din1505-2-1":"Deppe, Sahar ; Lohweg, Volker: Survey on Time Series Motif Discovery. In: WIREs : Forensic science Bd. 7. Danvers, MA , Wiley-Blackwell (2017), Nr. 2"},"volume":7,"author":[{"id":"52121","full_name":"Deppe, Sahar","first_name":"Sahar","last_name":"Deppe"},{"orcid":"0000-0002-3325-7887","first_name":"Volker","id":"1804","full_name":"Lohweg, Volker","last_name":"Lohweg"}],"year":2017,"status":"public","publication_identifier":{"eissn":["2573-9468 "]},"publication":" WIREs : Forensic science","date_created":"2019-11-25T09:06:51Z","date_updated":"2023-03-15T13:49:38Z","language":[{"iso":"eng"}],"publication_status":"published","abstract":[{"lang":"eng","text":"Last decades witness a huge growth in medical applications, genetic analysis,and in performance of manufacturing technologies and automatised productionsystems. A challenging task is to identify and diagnose the behavior of suchsystems, which aim to produce a product with desired quality. In order to con-trol the state of the systems, various information is gathered from differenttypes of sensors (optical, acoustic, chemical, electric, and thermal). Time seriesdata are a set of real-valued variables obtained chronologically. Data miningand machine learning help derive meaningful knowledge from time series.Such tasks include clustering, classification, anomaly detection andmotif discov-ery. Motif discovery attempts tofind meaningful, new, and unknown knowledgefrom data. Detection of motifs in a time series is beneficial for, e.g., discovery ofrules or specific events in a signal. Motifs provide useful information for theuser in order to model or analyze the data. Motif discovery is applied to variousareas as telecommunication, medicine, web, motion-capture, and sensornetworks. This contribution provides a review of the existing publications intime series motif discovery along with advantages and disadvantages of existingapproaches. Moreover, the research issues and missing points in thisfield arehighlighted. The main objective of this focus article is to serve as a glossary forresearchers in thisfield."}],"issue":"2","department":[{"_id":"DEP5023"}],"publisher":"Wiley-Blackwell ","type":"journal_article","intvolume":" 7","user_id":"15514","_id":"2023","doi":" https://doi.org/10.1002/widm.1199","place":" Danvers, MA "},{"series_title":"Technologien für die intelligente Automation ","publication_status":"published","abstract":[{"lang":"ger","text":"In diesem Tagungsband sind die besten Beiträge des 7. Jahreskolloquiums \"Kommunikation in der Automation\" (KommA 2016) und des 5. Jahreskolloquiums \"Bildverarbeitung in der Automation\" (BVAu 2016) enthalten. Die Kolloquien fanden am 30. November und 1. Dezember 2016 anlässlich des 10jährigen Jubiläums des inIT - Institut für industrielle Informationstechnik in der SmartFactoryOWL, einer herstellerunabhängigen und offenen Industrie 4.0 Forschungs- und Demonstrationsplattform und zugleich Testfeld für den Mittelstand, in Lemgo statt.\r\nDie vorgestellten neuesten Forschungsergebnisse auf den Gebieten der industriellen Kommunikationstechnik und Bildverarbeitung erweitern den aktuellen Stand der Forschung und Technik. Die in den Beiträgen enthaltenen anschauliche Anwendungsbeispiele aus dem Bereich der Automation setzen die Ergebnisse in den direkten Anwendungsbezug."}],"conference":{"name":"7. Jahreskolloquiums \"Kommunikation in der Automation\" (KommA 2016) / 5. Jahreskolloquiums \"Bildverarbeitung in der Automation\" (BVAu 2016)","location":"Lemgo","end_date":"2026-12-01","start_date":"2016-11-30"},"department":[{"_id":"DEP5023"}],"publisher":"Springer Vieweg","type":"book_editor","intvolume":" 7","user_id":"83781","_id":"4506","doi":"10.1007/978-3-662-55232-2","place":"Berlin","title":" Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2016 zum 10jährigen Jubiläum des inIT - Institut für industrielle Informationstechnik","volume":7,"citation":{"chicago-de":"Jasperneite, Jürgen und Volker Lohweg, Hrsg. 2017. Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2016 zum 10jährigen Jubiläum des inIT - Institut für industrielle Informationstechnik. Bd. 7. Technologien für die intelligente Automation . Berlin: Springer Vieweg. doi:10.1007/978-3-662-55232-2, .","din1505-2-1":"Jasperneite, J. ; Lohweg, V. (Hrsg.): Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2016 zum 10jährigen Jubiläum des inIT - Institut für industrielle Informationstechnik, Technologien für die intelligente Automation . Bd. 7. Berlin : Springer Vieweg, 2017","short":"J. Jasperneite, V. Lohweg, eds., Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2016 zum 10jährigen Jubiläum des inIT - Institut für industrielle Informationstechnik, Springer Vieweg, Berlin, 2017.","ufg":"Jasperneite, Jürgen/Lohweg, Volker: Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2016 zum 10jährigen Jubiläum des inIT - Institut für industrielle Informationstechnik, Bd. 7, Berlin 2017 (Technologien für die intelligente Automation ).","bjps":"Jasperneite J and Lohweg V (eds) (2017) Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2016 zum 10jährigen Jubiläum des inIT - Institut für industrielle Informationstechnik. Berlin: Springer Vieweg.","havard":"J. Jasperneite, V. Lohweg, eds., Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2016 zum 10jährigen Jubiläum des inIT - Institut für industrielle Informationstechnik, Springer Vieweg, Berlin, 2017.","mla":"Jasperneite, Jürgen, and Volker Lohweg, editors. Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2016 zum 10jährigen Jubiläum des inIT - Institut für industrielle Informationstechnik. Springer Vieweg, 2017, https://doi.org/10.1007/978-3-662-55232-2.","van":"Jasperneite J, Lohweg V, editors. Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2016 zum 10jährigen Jubiläum des inIT - Institut für industrielle Informationstechnik. Berlin: Springer Vieweg; 2017. 295 p. (Technologien für die intelligente Automation ; vol. 7).","ama":"Jasperneite J, Lohweg V, eds. Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2016 zum 10jährigen Jubiläum des inIT - Institut für industrielle Informationstechnik. Vol 7. Springer Vieweg; 2017. doi:10.1007/978-3-662-55232-2","chicago":"Jasperneite, Jürgen, and Volker Lohweg, eds. Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2016 zum 10jährigen Jubiläum des inIT - Institut für industrielle Informationstechnik. Vol. 7. Technologien für die intelligente Automation . Berlin: Springer Vieweg, 2017. https://doi.org/10.1007/978-3-662-55232-2.","apa":"Jasperneite, J., & Lohweg, V. (Eds.). (2017). Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2016 zum 10jährigen Jubiläum des inIT - Institut für industrielle Informationstechnik (Vol. 7). Springer Vieweg. https://doi.org/10.1007/978-3-662-55232-2","ieee":"J. Jasperneite and V. Lohweg, Eds., Kommunikation und Bildverarbeitung in der Automation : Ausgewählte Beiträge der Jahreskolloquien KommA und BVAu 2016 zum 10jährigen Jubiläum des inIT - Institut für industrielle Informationstechnik, vol. 7. Berlin: Springer Vieweg, 2017. doi: 10.1007/978-3-662-55232-2."},"year":"2017","status":"public","page":"295","publication_identifier":{"eisbn":["978-3-662-55232-2 "],"isbn":["978-3-662-55231-5"]},"date_created":"2021-01-22T08:40:04Z","editor":[{"id":"1899","first_name":"Jürgen","last_name":"Jasperneite","full_name":"Jasperneite, Jürgen"},{"orcid":"0000-0002-3325-7887","first_name":"Volker","id":"1804","last_name":"Lohweg","full_name":"Lohweg, Volker"}],"date_updated":"2025-05-12T08:19:51Z","keyword":["Industrielle Kommunikationstechnik","Industrielle Bildverarbeitung","network reliability and redundancy methods","Networked Controls Systems","wireless real-time communication","quality control","reliability","safety and risk"],"language":[{"iso":"ger"}]},{"department":[{"_id":"DEP5023"}],"author":[{"last_name":"Bator","first_name":"Martyna","full_name":"Bator, Martyna","id":"46440"},{"last_name":"Fritze","full_name":"Fritze, Alexander","first_name":"Alexander"},{"full_name":"Lohweg, Volker","first_name":"Volker","id":"1804","last_name":"Lohweg","orcid":"0000-0002-3325-7887"}],"year":2016,"status":"public","title":"Digitale Dokumentation - Der Einfluss der Digitalisierung auf die technische Dokumentation in der Produktion","volume":6,"citation":{"short":"M. Bator, A. Fritze, V. Lohweg, Industrie 4.0-Management 6 (2016).","din1505-2-1":"Bator, Martyna ; Fritze, Alexander ; Lohweg, Volker: Digitale Dokumentation - Der Einfluss der Digitalisierung auf die technische Dokumentation in der Produktion. In: Industrie 4.0-Management Bd. 6 (2016)","chicago-de":"Bator, Martyna, Alexander Fritze und Volker Lohweg. 2016. Digitale Dokumentation - Der Einfluss der Digitalisierung auf die technische Dokumentation in der Produktion. Industrie 4.0-Management 6.","ama":"Bator M, Fritze A, Lohweg V. Digitale Dokumentation - Der Einfluss der Digitalisierung auf die technische Dokumentation in der Produktion. Industrie 40-Management. 2016;6.","van":"Bator M, Fritze A, Lohweg V. Digitale Dokumentation - Der Einfluss der Digitalisierung auf die technische Dokumentation in der Produktion. Industrie 40-Management. 2016;6.","havard":"M. Bator, A. Fritze, V. Lohweg, Digitale Dokumentation - Der Einfluss der Digitalisierung auf die technische Dokumentation in der Produktion, Industrie 4.0-Management. 6 (2016).","bjps":"Bator M, Fritze A and Lohweg V (2016) Digitale Dokumentation - Der Einfluss Der Digitalisierung Auf Die Technische Dokumentation in Der Produktion. Industrie 4.0-Management 6.","mla":"Bator, Martyna, et al. “Digitale Dokumentation - Der Einfluss Der Digitalisierung Auf Die Technische Dokumentation in Der Produktion.” Industrie 4.0-Management, vol. 6, 2016.","ufg":"Bator, Martyna et. al. (2016): Digitale Dokumentation - Der Einfluss der Digitalisierung auf die technische Dokumentation in der Produktion, in: Industrie 4.0-Management 6.","ieee":"M. Bator, A. Fritze, and V. Lohweg, “Digitale Dokumentation - Der Einfluss der Digitalisierung auf die technische Dokumentation in der Produktion,” Industrie 4.0-Management, vol. 6, 2016.","apa":"Bator, M., Fritze, A., & Lohweg, V. (2016). Digitale Dokumentation - Der Einfluss der Digitalisierung auf die technische Dokumentation in der Produktion. Industrie 4.0-Management, 6.","chicago":"Bator, Martyna, Alexander Fritze, and Volker Lohweg. “Digitale Dokumentation - Der Einfluss Der Digitalisierung Auf Die Technische Dokumentation in Der Produktion.” Industrie 4.0-Management 6 (2016)."},"_id":"2028","language":[{"iso":"eng"}],"date_created":"2019-11-26T14:43:04Z","type":"journal_article","publication":"Industrie 4.0-Management","publication_identifier":{"issn":["2364-9208"]},"intvolume":" 6","date_updated":"2023-03-15T13:49:38Z","user_id":"68554"},{"citation":{"apa":"Pfeifer, A., & Lohweg, V. (2016). Design and Implementation for Authenticating Commercial Raster Printing Using Cost-Effective Hardware. Bildverarbeitung in der Automation (BVAu 2016).","chicago":"Pfeifer, Anton, and Volker Lohweg. “Design and Implementation for Authenticating Commercial Raster Printing Using Cost-Effective Hardware.” Bildverarbeitung in der Automation (BVAu 2016), 2016.","van":"Pfeifer A, Lohweg V. Design and Implementation for Authenticating Commercial Raster Printing Using Cost-Effective Hardware. In Bildverarbeitung in der Automation (BVAu 2016); 2016.","bjps":"Pfeifer A and Lohweg V (2016) Design and Implementation for Authenticating Commercial Raster Printing Using Cost-Effective Hardware. Bildverarbeitung in der Automation (BVAu 2016).","mla":"Pfeifer, Anton, and Volker Lohweg. Design and Implementation for Authenticating Commercial Raster Printing Using Cost-Effective Hardware. Bildverarbeitung in der Automation (BVAu 2016), 2016.","havard":"A. Pfeifer, V. Lohweg, Design and Implementation for Authenticating Commercial Raster Printing Using Cost-Effective Hardware, in: Bildverarbeitung in der Automation (BVAu 2016), 2016.","ufg":"Pfeifer, Anton/Lohweg, Volker (2016): Design and Implementation for Authenticating Commercial Raster Printing Using Cost-Effective Hardware, in: .","short":"A. Pfeifer, V. Lohweg, in: Bildverarbeitung in der Automation (BVAu 2016), 2016.","din1505-2-1":"Pfeifer, Anton ; Lohweg, Volker: Design and Implementation for Authenticating Commercial Raster Printing Using Cost-Effective Hardware. In: : Bildverarbeitung in der Automation (BVAu 2016), 2016","chicago-de":"Pfeifer, Anton und Volker Lohweg. 2016. Design and Implementation for Authenticating Commercial Raster Printing Using Cost-Effective Hardware. In: . Bildverarbeitung in der Automation (BVAu 2016).","ieee":"A. Pfeifer and V. Lohweg, “Design and Implementation for Authenticating Commercial Raster Printing Using Cost-Effective Hardware,” 2016.","ama":"Pfeifer A, Lohweg V. Design and Implementation for Authenticating Commercial Raster Printing Using Cost-Effective Hardware. In: Bildverarbeitung in der Automation (BVAu 2016); 2016."},"title":"Design and Implementation for Authenticating Commercial Raster Printing Using Cost-Effective Hardware","publisher":"Bildverarbeitung in der Automation (BVAu 2016)","status":"public","author":[{"full_name":"Pfeifer, Anton","id":"52097","first_name":"Anton","last_name":"Pfeifer"},{"orcid":"0000-0002-3325-7887","full_name":"Lohweg, Volker","last_name":"Lohweg","id":"1804","first_name":"Volker"}],"year":2016,"department":[{"_id":"DEP5023"}],"user_id":"68554","date_updated":"2023-03-15T13:49:38Z","date_created":"2019-11-26T14:43:05Z","type":"conference","_id":"2029","language":[{"iso":"eng"}]},{"user_id":"68554","date_updated":"2023-03-15T13:49:38Z","intvolume":" 64","publication":"Unternehmermagazin","publication_identifier":{"issn":["0022-6416"]},"date_created":"2019-11-26T14:43:07Z","type":"journal_article","language":[{"iso":"eng"}],"_id":"2030","citation":{"chicago":"Lohweg, Volker, and Uwe Mönks. “Schwellwerte Und Sensoren - Predictive Maintenance in Der Praxis.” Unternehmermagazin 64, no. 3/4 (2016).","apa":"Lohweg, V., & Mönks, U. (2016). Schwellwerte und Sensoren - Predictive Maintenance in der Praxis. Unternehmermagazin, 64(3/4).","ufg":"Lohweg, Volker/Mönks, Uwe (2016): Schwellwerte und Sensoren - Predictive Maintenance in der Praxis, in: Unternehmermagazin 64 (3/4).","mla":"Lohweg, Volker, and Uwe Mönks. “Schwellwerte Und Sensoren - Predictive Maintenance in Der Praxis.” Unternehmermagazin, vol. 64, no. 3/4, 2016.","bjps":"Lohweg V and Mönks U (2016) Schwellwerte Und Sensoren - Predictive Maintenance in Der Praxis. Unternehmermagazin 64.","havard":"V. Lohweg, U. Mönks, Schwellwerte und Sensoren - Predictive Maintenance in der Praxis, Unternehmermagazin. 64 (2016).","van":"Lohweg V, Mönks U. Schwellwerte und Sensoren - Predictive Maintenance in der Praxis. Unternehmermagazin. 2016;64(3/4).","din1505-2-1":"Lohweg, Volker ; Mönks, Uwe: Schwellwerte und Sensoren - Predictive Maintenance in der Praxis. In: Unternehmermagazin Bd. 64 (2016), Nr. 3/4","chicago-de":"Lohweg, Volker und Uwe Mönks. 2016. Schwellwerte und Sensoren - Predictive Maintenance in der Praxis. Unternehmermagazin 64, Nr. 3/4.","short":"V. Lohweg, U. Mönks, Unternehmermagazin 64 (2016).","ieee":"V. Lohweg and U. Mönks, “Schwellwerte und Sensoren - Predictive Maintenance in der Praxis,” Unternehmermagazin, vol. 64, no. 3/4, 2016.","ama":"Lohweg V, Mönks U. Schwellwerte und Sensoren - Predictive Maintenance in der Praxis. Unternehmermagazin. 2016;64(3/4)."},"volume":64,"title":"Schwellwerte und Sensoren - Predictive Maintenance in der Praxis","status":"public","year":2016,"author":[{"orcid":"0000-0002-3325-7887","last_name":"Lohweg","first_name":"Volker","full_name":"Lohweg, Volker","id":"1804"},{"first_name":"Uwe","last_name":"Mönks","full_name":"Mönks, Uwe","id":"1825"}],"department":[{"_id":"DEP5023"}],"issue":"3/4"},{"year":2016,"author":[{"first_name":"Alexander","last_name":"Fritze","full_name":"Fritze, Alexander"},{"last_name":"Mönks","id":"1825","first_name":"Uwe","full_name":"Mönks, Uwe"},{"last_name":"Lohweg","id":"1804","full_name":"Lohweg, Volker","first_name":"Volker","orcid":"0000-0002-3325-7887"}],"department":[{"_id":"DEP5023"}],"abstract":[{"text":"Currently, new research questions arise because of the paradigms of Industry 4.0, which aims to bring together mechatronic systems and information technologies. Its general idea is to create an Internet of Things consisting of communicating machines, which implement concepts for self-configuration, -diagnosis, and -optimisation. The realisation of these functionalities is in focus of current research and gains in importance not only in the industrial sector. The overall goal is to equip technical systems with intelligence to enable for autonomous behaviour. Therefore, tasks like information processing, extensive networking, or system monitoring using sensor and information fusion systems have to be reconsidered. This contribution focuses on the design and maintenance of sensor and information fusion systems and presents a preliminary evaluation of a design concept for such applications. The concept is developed to automatically configure sensor and information fusion systems, which is a time-consuming and complex task when carried out manually. It reduces the perceived complexity of the application and supports the designer during design and maintenance of the sensor and information fusion system.","lang":"eng"}],"status":"public","title":"A Concept for Self-Configuration of Adaptive Sensor and Information Fusion Systems","citation":{"apa":"Fritze, A., Mönks, U., & Lohweg, V. (2016). A Concept for Self-Configuration of Adaptive Sensor and Information Fusion Systems. In 21th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA 2016). Berlin.","chicago":"Fritze, Alexander, Uwe Mönks, and Volker Lohweg. “A Concept for Self-Configuration of Adaptive Sensor and Information Fusion Systems.” In 21th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA 2016). Berlin, 2016.","van":"Fritze A, Mönks U, Lohweg V. A Concept for Self-Configuration of Adaptive Sensor and Information Fusion Systems. In: 21th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA 2016). Berlin; 2016.","mla":"Fritze, Alexander, et al. “A Concept for Self-Configuration of Adaptive Sensor and Information Fusion Systems.” 21th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA 2016), 2016.","bjps":"Fritze A, Mönks U and Lohweg V (2016) A Concept for Self-Configuration of Adaptive Sensor and Information Fusion Systems. 21th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA 2016). Berlin.","havard":"A. Fritze, U. Mönks, V. Lohweg, A Concept for Self-Configuration of Adaptive Sensor and Information Fusion Systems, in: 21th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA 2016), Berlin, 2016.","ufg":"Fritze, Alexander et. al. (2016): A Concept for Self-Configuration of Adaptive Sensor and Information Fusion Systems, in: 21th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA 2016), Berlin.","short":"A. Fritze, U. Mönks, V. Lohweg, in: 21th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA 2016), Berlin, 2016.","din1505-2-1":"Fritze, Alexander ; Mönks, Uwe ; Lohweg, Volker: A Concept for Self-Configuration of Adaptive Sensor and Information Fusion Systems. In: 21th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA 2016). Berlin, 2016","chicago-de":"Fritze, Alexander, Uwe Mönks und Volker Lohweg. 2016. A Concept for Self-Configuration of Adaptive Sensor and Information Fusion Systems. In: 21th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA 2016). Berlin.","ieee":"A. Fritze, U. Mönks, and V. Lohweg, “A Concept for Self-Configuration of Adaptive Sensor and Information Fusion Systems,” in 21th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA 2016), 2016.","ama":"Fritze A, Mönks U, Lohweg V. A Concept for Self-Configuration of Adaptive Sensor and Information Fusion Systems. In: 21th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA 2016). Berlin; 2016."},"place":"Berlin","language":[{"iso":"eng"}],"_id":"2031","publication":"21th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA 2016)","type":"conference","date_created":"2019-11-26T14:43:08Z","user_id":"74004","date_updated":"2023-03-15T13:49:38Z"},{"citation":{"ama":"Pfeifer A, Lohweg V. Detection of Commercial Offset Printing using an Adaptive Software Architecture for the DFT. In: 21th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA 2016). ; 2016.","ieee":"A. Pfeifer and V. Lohweg, “Detection of Commercial Offset Printing using an Adaptive Software Architecture for the DFT,” in 21th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA 2016), 2016.","van":"Pfeifer A, Lohweg V. Detection of Commercial Offset Printing using an Adaptive Software Architecture for the DFT. In: 21th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA 2016). 2016.","bjps":"Pfeifer A and Lohweg V (2016) Detection of Commercial Offset Printing Using an Adaptive Software Architecture for the DFT. 21th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA 2016).","mla":"Pfeifer, Anton, and Volker Lohweg. “Detection of Commercial Offset Printing Using an Adaptive Software Architecture for the DFT.” 21th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA 2016), 2016.","havard":"A. Pfeifer, V. Lohweg, Detection of Commercial Offset Printing using an Adaptive Software Architecture for the DFT, in: 21th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA 2016), 2016.","ufg":"Pfeifer, Anton/Lohweg, Volker (2016): Detection of Commercial Offset Printing using an Adaptive Software Architecture for the DFT, in: 21th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA 2016).","apa":"Pfeifer, A., & Lohweg, V. (2016). Detection of Commercial Offset Printing using an Adaptive Software Architecture for the DFT. In 21th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA 2016).","chicago":"Pfeifer, Anton, and Volker Lohweg. “Detection of Commercial Offset Printing Using an Adaptive Software Architecture for the DFT.” In 21th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA 2016), 2016.","short":"A. Pfeifer, V. Lohweg, in: 21th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA 2016), 2016.","din1505-2-1":"Pfeifer, Anton ; Lohweg, Volker: Detection of Commercial Offset Printing using an Adaptive Software Architecture for the DFT. In: 21th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA 2016), 2016","chicago-de":"Pfeifer, Anton und Volker Lohweg. 2016. Detection of Commercial Offset Printing using an Adaptive Software Architecture for the DFT. In: 21th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA 2016)."},"title":"Detection of Commercial Offset Printing using an Adaptive Software Architecture for the DFT","status":"public","author":[{"id":"52097","first_name":"Anton","full_name":"Pfeifer, Anton","last_name":"Pfeifer"},{"first_name":"Volker","last_name":"Lohweg","id":"1804","full_name":"Lohweg, Volker","orcid":"0000-0002-3325-7887"}],"year":2016,"department":[{"_id":"DEP5023"}],"abstract":[{"lang":"eng","text":"The way how we interact with banknotes is changing. This raises questions on how we interact with electronic payment systems. The general idea is to design low-cost electronics for cash handling systems. We establish a prototypical demonstrator which allows a consistent image capture quality and is able to handle complex algorithms for banknote authentication on cost-effective hardware. Therefore, tasks regarding reducing the evaluation time, without diminishing the reliability of the algorithms have to be considered. In this contribution we focus on the re-design of an authentication module for detection of commercial offset printing. This module analyses images in view to periodic printing patterns by means of the Discrete Fourier Transform (DFT). We propose to implement two concepts: an adaptive software architecture for DFT and parallel image processing. The re-design reduces evaluation time, without compromising the reliability of the authentication algorithm."}],"user_id":"74004","date_updated":"2023-03-15T13:49:38Z","publication":"21th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA 2016)","type":"conference","date_created":"2019-11-26T14:43:10Z","language":[{"iso":"eng"}],"_id":"2032"},{"language":[{"iso":"eng"}],"_id":"2033","publication":"21th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA 2016), Berlin, ","date_created":"2019-11-26T14:43:11Z","type":"conference","user_id":"74004","date_updated":"2023-03-15T13:49:38Z","year":2016,"author":[{"id":"52121","last_name":"Deppe","full_name":"Deppe, Sahar","first_name":"Sahar"},{"first_name":"Alexander","id":"1853","last_name":"Dicks","full_name":"Dicks, Alexander"},{"id":"1804","first_name":"Volker","last_name":"Lohweg","full_name":"Lohweg, Volker","orcid":"0000-0002-3325-7887"}],"department":[{"_id":"DEP5023"}],"abstract":[{"lang":"eng","text":"Cash machines or automated teller machines (ATMs) are one of the typical ways to get cash around the world. Such machines are under a variety of criminal attacks. Most of the manipulations are performed through skimming. In 2014, such attacks led to a damage of approx. 280 million Euro within the EU. In this paper, we propose an approach to detect anomalies and attacks on ATMs via motif discovery. Motifs are frequently unknown occurring sequences or events in a time series signal. State of the ATM is captured by innovative piezoelectric sensor networks to analyse the occurring vibrations. The captured signals are inspected by the Complex Quad-Tree Wavelet Packet transform which provides broad frequency analysis of a signal in various scales. Next, features are extracted from the selected scale based on the information content, to detect motifs. Detected motifs provide the prototype patterns for anomaly detection or classification tasks."}],"status":"public","title":"Anomaly Detection on ATMs via Time Series Motif Discovery","citation":{"short":"S. Deppe, A. Dicks, V. Lohweg, in: 21th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA 2016), Berlin, , 2016.","chicago-de":"Deppe, Sahar, Alexander Dicks und Volker Lohweg. 2016. Anomaly Detection on ATMs via Time Series Motif Discovery. In: 21th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA 2016), Berlin, .","din1505-2-1":"Deppe, Sahar ; Dicks, Alexander ; Lohweg, Volker: Anomaly Detection on ATMs via Time Series Motif Discovery. In: 21th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA 2016), Berlin, , 2016","ama":"Deppe S, Dicks A, Lohweg V. Anomaly Detection on ATMs via Time Series Motif Discovery. In: 21th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA 2016), Berlin, . ; 2016.","van":"Deppe S, Dicks A, Lohweg V. Anomaly Detection on ATMs via Time Series Motif Discovery. In: 21th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA 2016), Berlin, . 2016.","havard":"S. Deppe, A. Dicks, V. Lohweg, Anomaly Detection on ATMs via Time Series Motif Discovery, in: 21th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA 2016), Berlin, , 2016.","mla":"Deppe, Sahar, et al. “Anomaly Detection on ATMs via Time Series Motif Discovery.” 21th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA 2016), Berlin, , 2016.","bjps":"Deppe S, Dicks A and Lohweg V (2016) Anomaly Detection on ATMs via Time Series Motif Discovery. 21th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA 2016), Berlin, .","ufg":"Deppe, Sahar et. al. (2016): Anomaly Detection on ATMs via Time Series Motif Discovery, in: 21th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA 2016), Berlin, .","ieee":"S. Deppe, A. Dicks, and V. Lohweg, “Anomaly Detection on ATMs via Time Series Motif Discovery,” in 21th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA 2016), Berlin, , 2016.","apa":"Deppe, S., Dicks, A., & Lohweg, V. (2016). Anomaly Detection on ATMs via Time Series Motif Discovery. In 21th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA 2016), Berlin, .","chicago":"Deppe, Sahar, Alexander Dicks, and Volker Lohweg. “Anomaly Detection on ATMs via Time Series Motif Discovery.” In 21th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA 2016), Berlin, , 2016."}},{"publication":"Journal of Sensors and Sensor Systems, ISSN 2194-8771","date_created":"2019-11-26T14:43:15Z","type":"conference","user_id":"74004","date_updated":"2023-03-15T13:49:38Z","_id":"2036","language":[{"iso":"eng"}],"title":"Sensor Defect Detection in Multisensor Information Fusion","citation":{"ieee":"J.-F. Ehlenbröker, U. Mönks, and V. Lohweg, “Sensor Defect Detection in Multisensor Information Fusion,” in Journal of Sensors and Sensor Systems, ISSN 2194-8771, 2016.","apa":"Ehlenbröker, J.-F., Mönks, U., & Lohweg, V. (2016). Sensor Defect Detection in Multisensor Information Fusion. In Journal of Sensors and Sensor Systems, ISSN 2194-8771. Copernicus Publications.","chicago":"Ehlenbröker, Jan-Friedrich, Uwe Mönks, and Volker Lohweg. “Sensor Defect Detection in Multisensor Information Fusion.” In Journal of Sensors and Sensor Systems, ISSN 2194-8771. Copernicus Publications, 2016.","ama":"Ehlenbröker J-F, Mönks U, Lohweg V. Sensor Defect Detection in Multisensor Information Fusion. In: Journal of Sensors and Sensor Systems, ISSN 2194-8771. Copernicus Publications; 2016.","van":"Ehlenbröker J-F, Mönks U, Lohweg V. Sensor Defect Detection in Multisensor Information Fusion. In: Journal of Sensors and Sensor Systems, ISSN 2194-8771. Copernicus Publications; 2016.","mla":"Ehlenbröker, Jan-Friedrich, et al. “Sensor Defect Detection in Multisensor Information Fusion.” Journal of Sensors and Sensor Systems, ISSN 2194-8771, Copernicus Publications, 2016.","havard":"J.-F. Ehlenbröker, U. Mönks, V. Lohweg, Sensor Defect Detection in Multisensor Information Fusion, in: Journal of Sensors and Sensor Systems, ISSN 2194-8771, Copernicus Publications, 2016.","bjps":"Ehlenbröker J-F, Mönks U and Lohweg V (2016) Sensor Defect Detection in Multisensor Information Fusion. Journal of Sensors and Sensor Systems, ISSN 2194-8771. Copernicus Publications.","ufg":"Ehlenbröker, Jan-Friedrich et. al. (2016): Sensor Defect Detection in Multisensor Information Fusion, in: Journal of Sensors and Sensor Systems, ISSN 2194-8771.","short":"J.-F. Ehlenbröker, U. Mönks, V. Lohweg, in: Journal of Sensors and Sensor Systems, ISSN 2194-8771, Copernicus Publications, 2016.","din1505-2-1":"Ehlenbröker, Jan-Friedrich ; Mönks, Uwe ; Lohweg, Volker: Sensor Defect Detection in Multisensor Information Fusion. In: Journal of Sensors and Sensor Systems, ISSN 2194-8771 : Copernicus Publications, 2016","chicago-de":"Ehlenbröker, Jan-Friedrich, Uwe Mönks und Volker Lohweg. 2016. Sensor Defect Detection in Multisensor Information Fusion. In: Journal of Sensors and Sensor Systems, ISSN 2194-8771. Copernicus Publications."},"abstract":[{"lang":"eng","text":"In industrial processes a vast variety of different sensors is increasingly used to measure and control processes, machines, and logistics. One way to handle the resulting large amount of data created by hundreds or even thousands of different sensors in an application is to employ information fusion systems. Information fusion systems, e.g. for condition monitoring, combine different sources of information, like sensors, to generate the state of a complex system. The result of such an information fusion process is regarded as a health indicator of a complex system. Therefore, information fusion approaches are applied to, e.g., automatically inform one about a reduction in production quality, or detect possibly dangerous situations. Considering the importance of sensors in the previously described information fusion systems and in industrial processes in general, a defective sensor has several negative consequences. It may lead to machine failure, e.g. when wear and tear of a machine is not detected sufficiently in advance. In this contribution we present a method to detect faulty sensors by computing the consistency between sensor values. The proposed sensor defect detection algorithm exemplarily utilises the structure of a multilayered group-based sensor fusion algorithm. Defect detection results of the proposed method for different test cases and the method's capability to detect a number of typical sensor defects are shown."}],"author":[{"first_name":"Jan-Friedrich","full_name":"Ehlenbröker, Jan-Friedrich","id":"1852","last_name":"Ehlenbröker"},{"first_name":"Uwe","id":"1825","last_name":"Mönks","full_name":"Mönks, Uwe"},{"orcid":"0000-0002-3325-7887","full_name":"Lohweg, Volker","last_name":"Lohweg","first_name":"Volker","id":"1804"}],"year":2016,"department":[{"_id":"DEP5023"}],"publisher":"Copernicus Publications","status":"public"},{"_id":"2037","language":[{"iso":"eng"}],"user_id":"74004","date_updated":"2023-03-15T13:49:38Z","publication":"3rd International Conference on System-Integrated Intelligence - New Challenges for Product and Production Engineering ","type":"conference","date_created":"2019-11-26T14:43:16Z","publisher":"Paderborn, Germany","status":"public","abstract":[{"lang":"eng","text":"The complexity of industrial applications has constantly increased over the last decades. New paradigms arise in the context of the fourth industrial revolution by bringing together mechatronic systems and information technologies. Tasks like information processing, extensive networking, or system monitoring using sensor and information fusion systems are incorporated with the aim to design applications that are capable for self-configuration, -diagnosis, and -optimisation. This contribution focuses on the design of sensor and information fusion systems. A methodology for the design process of such systems is proposed that serves as tool for auto-configuration to facilitate self-diagnosis and -optimisation."}],"year":2016,"author":[{"last_name":"Fritze","first_name":"Alexander","full_name":"Fritze, Alexander"},{"first_name":"Uwe","full_name":"Mönks, Uwe","id":"1825","last_name":"Mönks"},{"orcid":"0000-0002-3325-7887","first_name":"Volker","last_name":"Lohweg","id":"1804","full_name":"Lohweg, Volker"}],"department":[{"_id":"DEP5023"}],"citation":{"ieee":"A. Fritze, U. Mönks, and V. Lohweg, “A Support System for Sensor and Information Fusion System Design,” in 3rd International Conference on System-Integrated Intelligence - New Challenges for Product and Production Engineering , 2016.","ama":"Fritze A, Mönks U, Lohweg V. A Support System for Sensor and Information Fusion System Design. In: 3rd International Conference on System-Integrated Intelligence - New Challenges for Product and Production Engineering . Paderborn, Germany; 2016.","apa":"Fritze, A., Mönks, U., & Lohweg, V. (2016). A Support System for Sensor and Information Fusion System Design. In 3rd International Conference on System-Integrated Intelligence - New Challenges for Product and Production Engineering . Paderborn, Germany.","chicago":"Fritze, Alexander, Uwe Mönks, and Volker Lohweg. “A Support System for Sensor and Information Fusion System Design.” In 3rd International Conference on System-Integrated Intelligence - New Challenges for Product and Production Engineering . Paderborn, Germany, 2016.","van":"Fritze A, Mönks U, Lohweg V. A Support System for Sensor and Information Fusion System Design. In: 3rd International Conference on System-Integrated Intelligence - New Challenges for Product and Production Engineering . Paderborn, Germany; 2016.","havard":"A. Fritze, U. Mönks, V. Lohweg, A Support System for Sensor and Information Fusion System Design, in: 3rd International Conference on System-Integrated Intelligence - New Challenges for Product and Production Engineering , Paderborn, Germany, 2016.","mla":"Fritze, Alexander, et al. “A Support System for Sensor and Information Fusion System Design.” 3rd International Conference on System-Integrated Intelligence - New Challenges for Product and Production Engineering , Paderborn, Germany, 2016.","bjps":"Fritze A, Mönks U and Lohweg V (2016) A Support System for Sensor and Information Fusion System Design. 3rd International Conference on System-Integrated Intelligence - New Challenges for Product and Production Engineering . Paderborn, Germany.","ufg":"Fritze, Alexander et. al. (2016): A Support System for Sensor and Information Fusion System Design, in: 3rd International Conference on System-Integrated Intelligence - New Challenges for Product and Production Engineering .","short":"A. Fritze, U. Mönks, V. Lohweg, in: 3rd International Conference on System-Integrated Intelligence - New Challenges for Product and Production Engineering , Paderborn, Germany, 2016.","din1505-2-1":"Fritze, Alexander ; Mönks, Uwe ; Lohweg, Volker: A Support System for Sensor and Information Fusion System Design. In: 3rd International Conference on System-Integrated Intelligence - New Challenges for Product and Production Engineering : Paderborn, Germany, 2016","chicago-de":"Fritze, Alexander, Uwe Mönks und Volker Lohweg. 2016. A Support System for Sensor and Information Fusion System Design. In: 3rd International Conference on System-Integrated Intelligence - New Challenges for Product and Production Engineering . Paderborn, Germany."},"title":"A Support System for Sensor and Information Fusion System Design"},{"title":"Verteilte attributbasierte Sensor- und Informationsfusion als Basis für Condition Monitoring","citation":{"chicago":"Lohweg, Volker. “Verteilte Attributbasierte Sensor- Und Informationsfusion Als Basis Für Condition Monitoring.” In AMA Wissenschaftsrat, Saarbrücken (Eingeladener Vortrag), 2016.","apa":"Lohweg, V. (2016). Verteilte attributbasierte Sensor- und Informationsfusion als Basis für Condition Monitoring. In AMA Wissenschaftsrat, Saarbrücken (eingeladener Vortrag),.","ufg":"Lohweg, Volker (2016): Verteilte attributbasierte Sensor- und Informationsfusion als Basis für Condition Monitoring, in: AMA Wissenschaftsrat, Saarbrücken (eingeladener Vortrag),.","bjps":"Lohweg V (2016) Verteilte Attributbasierte Sensor- Und Informationsfusion Als Basis Für Condition Monitoring. AMA Wissenschaftsrat, Saarbrücken (Eingeladener Vortrag),.","havard":"V. Lohweg, Verteilte attributbasierte Sensor- und Informationsfusion als Basis für Condition Monitoring, in: AMA Wissenschaftsrat, Saarbrücken (Eingeladener Vortrag), 2016.","mla":"Lohweg, Volker. “Verteilte Attributbasierte Sensor- Und Informationsfusion Als Basis Für Condition Monitoring.” AMA Wissenschaftsrat, Saarbrücken (Eingeladener Vortrag), 2016.","van":"Lohweg V. Verteilte attributbasierte Sensor- und Informationsfusion als Basis für Condition Monitoring. In: AMA Wissenschaftsrat, Saarbrücken (eingeladener Vortrag),. 2016.","chicago-de":"Lohweg, Volker. 2016. Verteilte attributbasierte Sensor- und Informationsfusion als Basis für Condition Monitoring. In: AMA Wissenschaftsrat, Saarbrücken (eingeladener Vortrag),.","din1505-2-1":"Lohweg, Volker: Verteilte attributbasierte Sensor- und Informationsfusion als Basis für Condition Monitoring. In: AMA Wissenschaftsrat, Saarbrücken (eingeladener Vortrag),, 2016","short":"V. Lohweg, in: AMA Wissenschaftsrat, Saarbrücken (Eingeladener Vortrag), 2016.","ieee":"V. Lohweg, “Verteilte attributbasierte Sensor- und Informationsfusion als Basis für Condition Monitoring,” in AMA Wissenschaftsrat, Saarbrücken (eingeladener Vortrag), 2016.","ama":"Lohweg V. Verteilte attributbasierte Sensor- und Informationsfusion als Basis für Condition Monitoring. In: AMA Wissenschaftsrat, Saarbrücken (Eingeladener Vortrag),. ; 2016."},"year":2016,"author":[{"full_name":"Lohweg, Volker","first_name":"Volker","id":"1804","last_name":"Lohweg","orcid":"0000-0002-3325-7887"}],"department":[{"_id":"DEP5023"}],"status":"public","publication":"AMA Wissenschaftsrat, Saarbrücken (eingeladener Vortrag),","type":"conference","date_created":"2019-11-26T14:43:18Z","user_id":"68554","date_updated":"2023-03-15T13:49:38Z","_id":"2038","language":[{"iso":"eng"}]},{"publication":"Optical Document Security - The Conference on Optical Security and Counterfeit Detection V","type":"conference","date_created":"2019-11-26T14:43:19Z","user_id":"74004","date_updated":"2023-03-15T13:49:38Z","_id":"2039","place":"San Francisco, CA, USA ","language":[{"iso":"eng"}],"title":"Intaglio Quality Measurement","citation":{"ufg":"Funk, Mark et. al. (2016): Intaglio Quality Measurement, in: Optical Document Security - The Conference on Optical Security and Counterfeit Detection V, San Francisco, CA, USA .","mla":"Funk, Mark, et al. “Intaglio Quality Measurement.” Optical Document Security - The Conference on Optical Security and Counterfeit Detection V, 2016.","havard":"M. Funk, E. Gillich, T. Türke, V. Lohweg, Intaglio Quality Measurement, in: Optical Document Security - The Conference on Optical Security and Counterfeit Detection V, San Francisco, CA, USA , 2016.","bjps":"Funk M et al. (2016) Intaglio Quality Measurement. Optical Document Security - The Conference on Optical Security and Counterfeit Detection V. San Francisco, CA, USA .","van":"Funk M, Gillich E, Türke T, Lohweg V. Intaglio Quality Measurement. In: Optical Document Security - The Conference on Optical Security and Counterfeit Detection V. San Francisco, CA, USA ; 2016.","ama":"Funk M, Gillich E, Türke T, Lohweg V. Intaglio Quality Measurement. In: Optical Document Security - The Conference on Optical Security and Counterfeit Detection V. San Francisco, CA, USA ; 2016.","chicago":"Funk, Mark, Eugen Gillich, Thomas Türke, and Volker Lohweg. “Intaglio Quality Measurement.” In Optical Document Security - The Conference on Optical Security and Counterfeit Detection V. San Francisco, CA, USA , 2016.","apa":"Funk, M., Gillich, E., Türke, T., & Lohweg, V. (2016). Intaglio Quality Measurement. In Optical Document Security - The Conference on Optical Security and Counterfeit Detection V. San Francisco, CA, USA .","ieee":"M. Funk, E. Gillich, T. Türke, and V. Lohweg, “Intaglio Quality Measurement,” in Optical Document Security - The Conference on Optical Security and Counterfeit Detection V, 2016.","din1505-2-1":"Funk, Mark ; Gillich, Eugen ; Türke, Thomas ; Lohweg, Volker: Intaglio Quality Measurement. In: Optical Document Security - The Conference on Optical Security and Counterfeit Detection V. San Francisco, CA, USA , 2016","chicago-de":"Funk, Mark, Eugen Gillich, Thomas Türke und Volker Lohweg. 2016. Intaglio Quality Measurement. In: Optical Document Security - The Conference on Optical Security and Counterfeit Detection V. San Francisco, CA, USA .","short":"M. Funk, E. Gillich, T. Türke, V. Lohweg, in: Optical Document Security - The Conference on Optical Security and Counterfeit Detection V, San Francisco, CA, USA , 2016."},"abstract":[{"lang":"eng","text":"In this paper an advanced approach for Intaglio quality control is presented. In the first step, the essential informationabout the printing process, research objects and measurement setup is provided. Following, the mathematical approachbased on image processing methods is described which imitates the printers manner to examine the optical characteristicsof Intaglio prints. The main focus is the early recognition of tending quality deviations to be able to support the printerthrough recommendations on readjustments of the machine settings. Therefore, specific key values are generated whichdescribe the prints overall quality, regarding its optical characteristics and the occurrence of printing flaws. The resultsshown at the end encourage extended developments."}],"year":2016,"author":[{"first_name":"Mark","last_name":"Funk","full_name":"Funk, Mark","id":"52473"},{"first_name":"Eugen","last_name":"Gillich","id":"1706","full_name":"Gillich, Eugen"},{"first_name":"Thomas","full_name":"Türke, Thomas","last_name":"Türke"},{"orcid":"0000-0002-3325-7887","last_name":"Lohweg","first_name":"Volker","id":"1804","full_name":"Lohweg, Volker"}],"department":[{"_id":"DEP5023"}],"status":"public"},{"publication":"Optical Document Security - The Conference on Optical Security and Counterfeit Detection V","date_created":"2019-11-26T14:43:20Z","type":"conference","user_id":"74004","date_updated":"2023-03-15T13:49:38Z","place":"San Francisco, CA, USA ","language":[{"iso":"eng"}],"_id":"2040","title":"Data Collection Unit – A Platform for Printing Process Authentication","citation":{"van":"Gillich E, Hoffmann JL, Dörksen H, Lohweg V, Schaede J. Data Collection Unit – A Platform for Printing Process Authentication. In: Optical Document Security - The Conference on Optical Security and Counterfeit Detection V. San Francisco, CA, USA ; 2016.","ama":"Gillich E, Hoffmann JL, Dörksen H, Lohweg V, Schaede J. Data Collection Unit – A Platform for Printing Process Authentication. In: Optical Document Security - The Conference on Optical Security and Counterfeit Detection V. San Francisco, CA, USA ; 2016.","ufg":"Gillich, Eugen et. al. (2016): Data Collection Unit – A Platform for Printing Process Authentication, in: Optical Document Security - The Conference on Optical Security and Counterfeit Detection V, San Francisco, CA, USA .","havard":"E. Gillich, J.L. Hoffmann, H. Dörksen, V. Lohweg, J. Schaede, Data Collection Unit – A Platform for Printing Process Authentication, in: Optical Document Security - The Conference on Optical Security and Counterfeit Detection V, San Francisco, CA, USA , 2016.","bjps":"Gillich E et al. (2016) Data Collection Unit – A Platform for Printing Process Authentication. Optical Document Security - The Conference on Optical Security and Counterfeit Detection V. San Francisco, CA, USA .","mla":"Gillich, Eugen, et al. “Data Collection Unit – A Platform for Printing Process Authentication.” Optical Document Security - The Conference on Optical Security and Counterfeit Detection V, 2016.","apa":"Gillich, E., Hoffmann, J. L., Dörksen, H., Lohweg, V., & Schaede, J. (2016). Data Collection Unit – A Platform for Printing Process Authentication. In Optical Document Security - The Conference on Optical Security and Counterfeit Detection V. San Francisco, CA, USA .","ieee":"E. Gillich, J. L. Hoffmann, H. Dörksen, V. Lohweg, and J. Schaede, “Data Collection Unit – A Platform for Printing Process Authentication,” in Optical Document Security - The Conference on Optical Security and Counterfeit Detection V, 2016.","chicago":"Gillich, Eugen, Jan Leif Hoffmann, Helene Dörksen, Volker Lohweg, and Johannes Schaede. “Data Collection Unit – A Platform for Printing Process Authentication.” In Optical Document Security - The Conference on Optical Security and Counterfeit Detection V. San Francisco, CA, USA , 2016.","short":"E. Gillich, J.L. Hoffmann, H. Dörksen, V. Lohweg, J. Schaede, in: Optical Document Security - The Conference on Optical Security and Counterfeit Detection V, San Francisco, CA, USA , 2016.","din1505-2-1":"Gillich, Eugen ; Hoffmann, Jan Leif ; Dörksen, Helene ; Lohweg, Volker ; Schaede, Johannes: Data Collection Unit – A Platform for Printing Process Authentication. In: Optical Document Security - The Conference on Optical Security and Counterfeit Detection V. San Francisco, CA, USA , 2016","chicago-de":"Gillich, Eugen, Jan Leif Hoffmann, Helene Dörksen, Volker Lohweg und Johannes Schaede. 2016. Data Collection Unit – A Platform for Printing Process Authentication. In: Optical Document Security - The Conference on Optical Security and Counterfeit Detection V. San Francisco, CA, USA ."},"year":2016,"author":[{"first_name":"Eugen","id":"1706","last_name":"Gillich","full_name":"Gillich, Eugen"},{"first_name":"Jan Leif","full_name":"Hoffmann, Jan Leif","id":"46243","last_name":"Hoffmann"},{"id":"46416","first_name":"Helene","last_name":"Dörksen","full_name":"Dörksen, Helene"},{"orcid":"0000-0002-3325-7887","first_name":"Volker","full_name":"Lohweg, Volker","last_name":"Lohweg","id":"1804"},{"last_name":"Schaede","first_name":"Johannes","full_name":"Schaede, Johannes","id":"2128"}],"department":[{"_id":"DEP5023"}],"abstract":[{"text":"Banknote authentication plays a fundamental role in banknote circulation. Banknotes undergo some major changes in thenext years because electronic payment systems will get more common which will change the user behaviour. Furthermore,technologies of counterfeiters will improve progressively and continuously. We propose a two-sage procedure for theeffective development for the design of simple electronics for cash handliung systems: First, we establish a high qualityimage acquisition system which allows for a consistent image capture quality and is able to handle complex softwarealgorithms for banknote authentication. Second, we take the algorithms and port them on cost-efficient hardware. It isshown in this paper that a reliable authentication of almost each banknote is possible for to specialised low-cost systemssuch as point-of-sale cash units.","lang":"eng"}],"status":"public"},{"status":"public","department":[{"_id":"DEP5023"}],"year":2016,"author":[{"first_name":"Johannes","last_name":"Schaede","full_name":"Schaede, Johannes","id":"2128"},{"last_name":"Lohweg","id":"1804","full_name":"Lohweg, Volker","first_name":"Volker","orcid":"0000-0002-3325-7887"},{"first_name":"Alexander","last_name":"Knobloch","full_name":"Knobloch, Alexander"}],"citation":{"ieee":"J. Schaede, V. Lohweg, and A. Knobloch, “Banknote Cash Challenges met by advancing Low Cost Image Analysis Tools,” in Optical Document Security - The Conference on Optical Security and Counterfeit Detection V, 2016.","ama":"Schaede J, Lohweg V, Knobloch A. Banknote Cash Challenges met by advancing Low Cost Image Analysis Tools. In: Optical Document Security - The Conference on Optical Security and Counterfeit Detection V. San Francisco, CA, USA; 2016.","short":"J. Schaede, V. Lohweg, A. Knobloch, in: Optical Document Security - The Conference on Optical Security and Counterfeit Detection V, San Francisco, CA, USA, 2016.","chicago-de":"Schaede, Johannes, Volker Lohweg und Alexander Knobloch. 2016. Banknote Cash Challenges met by advancing Low Cost Image Analysis Tools. In: Optical Document Security - The Conference on Optical Security and Counterfeit Detection V. San Francisco, CA, USA.","din1505-2-1":"Schaede, Johannes ; Lohweg, Volker ; Knobloch, Alexander: Banknote Cash Challenges met by advancing Low Cost Image Analysis Tools. In: Optical Document Security - The Conference on Optical Security and Counterfeit Detection V. San Francisco, CA, USA, 2016","apa":"Schaede, J., Lohweg, V., & Knobloch, A. (2016). Banknote Cash Challenges met by advancing Low Cost Image Analysis Tools. In Optical Document Security - The Conference on Optical Security and Counterfeit Detection V. San Francisco, CA, USA.","chicago":"Schaede, Johannes, Volker Lohweg, and Alexander Knobloch. “Banknote Cash Challenges Met by Advancing Low Cost Image Analysis Tools.” In Optical Document Security - The Conference on Optical Security and Counterfeit Detection V. San Francisco, CA, USA, 2016.","van":"Schaede J, Lohweg V, Knobloch A. Banknote Cash Challenges met by advancing Low Cost Image Analysis Tools. In: Optical Document Security - The Conference on Optical Security and Counterfeit Detection V. San Francisco, CA, USA; 2016.","ufg":"Schaede, Johannes et. al. (2016): Banknote Cash Challenges met by advancing Low Cost Image Analysis Tools, in: Optical Document Security - The Conference on Optical Security and Counterfeit Detection V, San Francisco, CA, USA.","bjps":"Schaede J, Lohweg V and Knobloch A (2016) Banknote Cash Challenges Met by Advancing Low Cost Image Analysis Tools. Optical Document Security - The Conference on Optical Security and Counterfeit Detection V. San Francisco, CA, USA.","havard":"J. Schaede, V. Lohweg, A. Knobloch, Banknote Cash Challenges met by advancing Low Cost Image Analysis Tools, in: Optical Document Security - The Conference on Optical Security and Counterfeit Detection V, San Francisco, CA, USA, 2016.","mla":"Schaede, Johannes, et al. “Banknote Cash Challenges Met by Advancing Low Cost Image Analysis Tools.” Optical Document Security - The Conference on Optical Security and Counterfeit Detection V, 2016."},"title":"Banknote Cash Challenges met by advancing Low Cost Image Analysis Tools","_id":"2041","language":[{"iso":"eng"}],"place":"San Francisco, CA, USA","date_updated":"2023-03-15T13:49:38Z","user_id":"68554","date_created":"2019-11-26T14:43:21Z","type":"conference","publication":"Optical Document Security - The Conference on Optical Security and Counterfeit Detection V"},{"status":"public","abstract":[{"lang":"eng","text":"Today, a major part of counterfeits is produced by commercial offset printing machines. The counterfeiters use mainlyraster printing (rosette printing). Our approach aims at analysing the banknotes for the presence of commercial printingprocedures by means of intrinsic features. For this purpose, the images are analysed in view to periodic printing patternsby means of the Discrete Fourier Transformation (DFT). The typical raster frequencies are detected. The rosette pattern isseparated by suppression of the remaining image frequencies and the subsequent back-transformation."}],"year":2016,"author":[{"id":"52097","full_name":"Pfeifer, Anton","last_name":"Pfeifer","first_name":"Anton"},{"full_name":"Gillich, Eugen","last_name":"Gillich","id":"1706","first_name":"Eugen"},{"orcid":"0000-0002-3325-7887","id":"1804","first_name":"Volker","full_name":"Lohweg, Volker","last_name":"Lohweg"},{"first_name":"Johannes","full_name":"Schaede, Johannes","last_name":"Schaede","id":"2128"}],"department":[{"_id":"DEP5023"}],"citation":{"short":"A. Pfeifer, E. Gillich, V. Lohweg, J. Schaede, in: Optical Document Security - The Conference on Optical Security and Counterfeit Detection V, San Francisco, CA, USA, 2016.","din1505-2-1":"Pfeifer, Anton ; Gillich, Eugen ; Lohweg, Volker ; Schaede, Johannes: Detection of Commercial Offset Printing in Counterfeited Banknotes. In: Optical Document Security - The Conference on Optical Security and Counterfeit Detection V. San Francisco, CA, USA, 2016","chicago-de":"Pfeifer, Anton, Eugen Gillich, Volker Lohweg und Johannes Schaede. 2016. Detection of Commercial Offset Printing in Counterfeited Banknotes. In: Optical Document Security - The Conference on Optical Security and Counterfeit Detection V. San Francisco, CA, USA.","van":"Pfeifer A, Gillich E, Lohweg V, Schaede J. Detection of Commercial Offset Printing in Counterfeited Banknotes. In: Optical Document Security - The Conference on Optical Security and Counterfeit Detection V. San Francisco, CA, USA; 2016.","mla":"Pfeifer, Anton, et al. “Detection of Commercial Offset Printing in Counterfeited Banknotes.” Optical Document Security - The Conference on Optical Security and Counterfeit Detection V, 2016.","bjps":"Pfeifer A et al. (2016) Detection of Commercial Offset Printing in Counterfeited Banknotes. Optical Document Security - The Conference on Optical Security and Counterfeit Detection V. San Francisco, CA, USA.","havard":"A. Pfeifer, E. Gillich, V. Lohweg, J. Schaede, Detection of Commercial Offset Printing in Counterfeited Banknotes, in: Optical Document Security - The Conference on Optical Security and Counterfeit Detection V, San Francisco, CA, USA, 2016.","ufg":"Pfeifer, Anton et. al. (2016): Detection of Commercial Offset Printing in Counterfeited Banknotes, in: Optical Document Security - The Conference on Optical Security and Counterfeit Detection V, San Francisco, CA, USA.","apa":"Pfeifer, A., Gillich, E., Lohweg, V., & Schaede, J. (2016). Detection of Commercial Offset Printing in Counterfeited Banknotes. In Optical Document Security - The Conference on Optical Security and Counterfeit Detection V. San Francisco, CA, USA.","chicago":"Pfeifer, Anton, Eugen Gillich, Volker Lohweg, and Johannes Schaede. “Detection of Commercial Offset Printing in Counterfeited Banknotes.” In Optical Document Security - The Conference on Optical Security and Counterfeit Detection V. San Francisco, CA, USA, 2016.","ama":"Pfeifer A, Gillich E, Lohweg V, Schaede J. Detection of Commercial Offset Printing in Counterfeited Banknotes. In: Optical Document Security - The Conference on Optical Security and Counterfeit Detection V. San Francisco, CA, USA; 2016.","ieee":"A. Pfeifer, E. Gillich, V. Lohweg, and J. Schaede, “Detection of Commercial Offset Printing in Counterfeited Banknotes,” in Optical Document Security - The Conference on Optical Security and Counterfeit Detection V, 2016."},"title":"Detection of Commercial Offset Printing in Counterfeited Banknotes","_id":"2042","place":"San Francisco, CA, USA","language":[{"iso":"eng"}],"user_id":"74004","date_updated":"2023-03-15T13:49:38Z","publication":"Optical Document Security - The Conference on Optical Security and Counterfeit Detection V","date_created":"2019-11-26T14:43:23Z","type":"conference"},{"citation":{"chicago":"Lohweg, Volker. “How Will Banknotes Change in the next 20 Years - towards Smart Banknotes?” In Fakultätskolloquium Elektrotechnik Und Informationstechnik , Ruhr-Universität Bochum (Eingeladener Vortrag). Bochum, 2016.","apa":"Lohweg, V. (2016). How will banknotes change in the next 20 years - towards smart Banknotes? In Fakultätskolloquium Elektrotechnik und Informationstechnik , Ruhr-Universität Bochum (eingeladener Vortrag). Bochum.","bjps":"Lohweg V (2016) How Will Banknotes Change in the next 20 Years - towards Smart Banknotes? Fakultätskolloquium Elektrotechnik Und Informationstechnik , Ruhr-Universität Bochum (Eingeladener Vortrag). Bochum.","havard":"V. Lohweg, How will banknotes change in the next 20 years - towards smart Banknotes?, in: Fakultätskolloquium Elektrotechnik Und Informationstechnik , Ruhr-Universität Bochum (Eingeladener Vortrag), Bochum, 2016.","mla":"Lohweg, Volker. “How Will Banknotes Change in the next 20 Years - towards Smart Banknotes?” Fakultätskolloquium Elektrotechnik Und Informationstechnik , Ruhr-Universität Bochum (Eingeladener Vortrag), 2016.","ufg":"Lohweg, Volker (2016): How will banknotes change in the next 20 years - towards smart Banknotes?, in: Fakultätskolloquium Elektrotechnik und Informationstechnik , Ruhr-Universität Bochum (eingeladener Vortrag), Bochum.","van":"Lohweg V. How will banknotes change in the next 20 years - towards smart Banknotes? In: Fakultätskolloquium Elektrotechnik und Informationstechnik , Ruhr-Universität Bochum (eingeladener Vortrag). Bochum; 2016.","din1505-2-1":"Lohweg, Volker: How will banknotes change in the next 20 years - towards smart Banknotes? In: Fakultätskolloquium Elektrotechnik und Informationstechnik , Ruhr-Universität Bochum (eingeladener Vortrag). Bochum, 2016","chicago-de":"Lohweg, Volker. 2016. How will banknotes change in the next 20 years - towards smart Banknotes? In: Fakultätskolloquium Elektrotechnik und Informationstechnik , Ruhr-Universität Bochum (eingeladener Vortrag). Bochum.","short":"V. Lohweg, in: Fakultätskolloquium Elektrotechnik Und Informationstechnik , Ruhr-Universität Bochum (Eingeladener Vortrag), Bochum, 2016.","ieee":"V. Lohweg, “How will banknotes change in the next 20 years - towards smart Banknotes?,” in Fakultätskolloquium Elektrotechnik und Informationstechnik , Ruhr-Universität Bochum (eingeladener Vortrag), 2016.","ama":"Lohweg V. How will banknotes change in the next 20 years - towards smart Banknotes? In: Fakultätskolloquium Elektrotechnik Und Informationstechnik , Ruhr-Universität Bochum (Eingeladener Vortrag). Bochum; 2016."},"title":"How will banknotes change in the next 20 years - towards smart Banknotes?","status":"public","department":[{"_id":"DEP5023"}],"author":[{"orcid":"0000-0002-3325-7887","last_name":"Lohweg","first_name":"Volker","full_name":"Lohweg, Volker","id":"1804"}],"year":2016,"date_updated":"2023-03-15T13:49:38Z","user_id":"68554","date_created":"2019-11-26T14:43:24Z","type":"conference","publication":"Fakultätskolloquium Elektrotechnik und Informationstechnik , Ruhr-Universität Bochum (eingeladener Vortrag)","_id":"2043","language":[{"iso":"eng"}],"place":"Bochum"},{"status":"public","abstract":[{"text":"Sensors, and also actuators or external sources such as databases, serve as data sources in order to realise condition monitoring of industrial applications or the acquisition of characteristic parameters like production speed or reject rate. Modern facilities create such a large amount of complex data that a machine operator is unable to comprehend and process the information contained in the data. Thus, information fusion mechanisms gain increasing importance. Besides the management of large amounts of data, further challenges towards the fusion algorithms arise from epistemic uncertainties (incomplete knowledge) in the input signals as well as conflicts between them. These aspects must be considered during information processing to obtain reliable results, which are in accordance with the real world. The analysis of the scientific state of the art shows that current solutions fulfil said requirements at most only partly. This article proposes the multilayered information fusion system MACRO (multilayer attribute-based conflict-reducing observation) employing the μBalTLCS (fuzzified balanced two-layer conflict solving) fusion algorithm to reduce the impact of conflicts on the fusion result. The performance of the contribution is shown by its evaluation in the scope of a machine condition monitoring application under laboratory conditions. Here, the MACRO system yields the best results compared to state-of-the-art fusion mechanisms. The utilised data is published and freely accessible.","lang":"eng"}],"year":2016,"main_file_link":[{"open_access":"1","url":"https://www.mdpi.com/1424-8220/16/11/1798"}],"author":[{"first_name":"Uwe","last_name":"Mönks","id":"1825","full_name":"Mönks, Uwe"},{"id":"46416","first_name":"Helene","last_name":"Dörksen","full_name":"Dörksen, Helene"},{"last_name":"Lohweg","first_name":"Volker","full_name":"Lohweg, Volker","id":"1804","orcid":"0000-0002-3325-7887"},{"full_name":"Hübner, Michael","first_name":"Michael","last_name":"Hübner"}],"department":[{"_id":"DEP5023"}],"citation":{"short":"U. Mönks, H. Dörksen, V. Lohweg, M. Hübner, Sensors (2016).","din1505-2-1":"Mönks, Uwe ; Dörksen, Helene ; Lohweg, Volker ; Hübner, Michael: Information Fusion of Conflicting Input Data. In: Sensors (2016)","chicago-de":"Mönks, Uwe, Helene Dörksen, Volker Lohweg und Michael Hübner. 2016. Information Fusion of Conflicting Input Data. Sensors. doi:10.3390/s16111798, .","van":"Mönks U, Dörksen H, Lohweg V, Hübner M. Information Fusion of Conflicting Input Data. Sensors. 2016;","ama":"Mönks U, Dörksen H, Lohweg V, Hübner M. Information Fusion of Conflicting Input Data. Sensors. 2016. doi:10.3390/s16111798","ufg":"Mönks, Uwe et. al. (2016): Information Fusion of Conflicting Input Data, in: Sensors.","mla":"Mönks, Uwe, et al. “Information Fusion of Conflicting Input Data.” Sensors, 1798, 2016, doi:10.3390/s16111798.","havard":"U. Mönks, H. Dörksen, V. Lohweg, M. Hübner, Information Fusion of Conflicting Input Data, Sensors. (2016).","bjps":"Mönks U et al. (2016) Information Fusion of Conflicting Input Data. Sensors.","apa":"Mönks, U., Dörksen, H., Lohweg, V., & Hübner, M. (2016). Information Fusion of Conflicting Input Data. Sensors. https://doi.org/10.3390/s16111798","ieee":"U. Mönks, H. Dörksen, V. Lohweg, and M. 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Authentication of Commercial Raster Printing on Cost-Effective Hardware. In: BVAu 2016, hg. von Volker Lohweg, 2016:1–9. Lemgo: Hochschule Ostwestfalen-Lippe.","din1505-2-1":"Pfeifer, Anton ; Lohweg, Volker: Authentication of Commercial Raster Printing on Cost-Effective Hardware. In: Lohweg, V. (Hrsg.): BVAu 2016. Bd. 2016. Lemgo : Hochschule Ostwestfalen-Lippe, 2016, S. 1–9","short":"A. Pfeifer, V. Lohweg, in: V. Lohweg (Ed.), BVAu 2016, Hochschule Ostwestfalen-Lippe, Lemgo, 2016, pp. 1–9.","chicago":"Pfeifer, Anton, and Volker Lohweg. “Authentication of Commercial Raster Printing on Cost-Effective Hardware.” In BVAu 2016, edited by Volker Lohweg, 2016:1–9. Lemgo: Hochschule Ostwestfalen-Lippe, 2016.","ieee":"A. Pfeifer and V. Lohweg, “Authentication of Commercial Raster Printing on Cost-Effective Hardware,” in BVAu 2016, Lemgo, 2016, vol. 2016, no. 5, pp. 1–9.","apa":"Pfeifer, A., & Lohweg, V. (2016). Authentication of Commercial Raster Printing on Cost-Effective Hardware. In V. 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Workshop Computational Intelligence VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA), Dortmund, S. 23–45."},"title":"Shift-Invariant Feature Extraction for Time-Series Motif Discovery","page":"23-45","status":"public","abstract":[{"text":"The means of data mining and machine learning tasks are important topics in signal processing fundamentals. An example of such tasks is motif discovery. This paper presents an efficient method for shift-invariant feature\r\nextraction in time-series motif discovery. The proposed method initiates from the machine learning procedure and tackles the drawbacks of existing methods. Moreover, the efficacy of the novel approach is benchmarked\r\nagainst various algorithms and data from diverse fields.\r\n","lang":"eng"}],"department":[{"_id":"DEP5023"}],"year":2015,"main_file_link":[{"url":"https://publikationen.bibliothek.kit.edu/1000049620","open_access":"1"}],"author":[{"first_name":"Sahar","last_name":"Deppe","id":"52121","full_name":"Deppe, Sahar"},{"orcid":"0000-0002-3325-7887","last_name":"Lohweg","full_name":"Lohweg, Volker","id":"1804","first_name":"Volker"}],"date_updated":"2023-03-15T13:49:38Z","user_id":"68554","type":"conference","date_created":"2019-12-03T13:49:19Z","publication":"25. Workshop Computational Intelligence VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA)","doi":"10.5445/KSP/1000049620","_id":"2123","language":[{"iso":"eng"}],"place":"Dortmund","oa":"1"},{"user_id":"68554","date_updated":"2023-03-15T13:49:38Z","publication":"25. 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(2015): Relevanzbewertung technischer Informationen mittels Data-Mining Verfahren am Anwendungsfall von Patentdokumenten, in: 25. Workshop Computational Intelligence VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA), Dortmund.","apa":"Bator, M., Deppe, S., & Lohweg, V. (2015). Relevanzbewertung technischer Informationen mittels Data-Mining Verfahren am Anwendungsfall von Patentdokumenten. In 25. Workshop Computational Intelligence VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA). Dortmund.","chicago":"Bator, Martyna, Sahar Deppe, and Volker Lohweg. “Relevanzbewertung Technischer Informationen Mittels Data-Mining Verfahren Am Anwendungsfall von Patentdokumenten.” In 25. Workshop Computational Intelligence VDI/VDE-Gesellschaft Mess- Und Automatisierungstechnik (GMA). Dortmund, 2015.","short":"M. Bator, S. Deppe, V. Lohweg, in: 25. Workshop Computational Intelligence VDI/VDE-Gesellschaft Mess- Und Automatisierungstechnik (GMA), Dortmund, 2015.","chicago-de":"Bator, Martyna, Sahar Deppe und Volker Lohweg. 2015. Relevanzbewertung technischer Informationen mittels Data-Mining Verfahren am Anwendungsfall von Patentdokumenten. In: 25. Workshop Computational Intelligence VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA). Dortmund.","din1505-2-1":"Bator, Martyna ; Deppe, Sahar ; Lohweg, Volker: Relevanzbewertung technischer Informationen mittels Data-Mining Verfahren am Anwendungsfall von Patentdokumenten. In: 25. Workshop Computational Intelligence VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA). Dortmund, 2015"},"title":"Relevanzbewertung technischer Informationen mittels Data-Mining Verfahren am Anwendungsfall von Patentdokumenten","status":"public","abstract":[{"lang":"ger","text":"Patente schützen das geistige Eigentum von Erfindern und verhindern, dass ihre neuen Ideen kopiert werden. Sie sind von großer Bedeutung für den wirtschaftlichen Erfolg eines Unternehmens. Vor einer geplanten Patentanmeldung ist es wichtig festzustellen, ob eine bestimmte Technik bereits patentiert ist und wie die Erfolgsaussichten beurteilt werden können. Aber auch die Identifizierung von Verstößen gegen eigene Patentanmeldungen ist für ein Unternehmen von äußerster Wichtigkeit. Verschiedene Techniken und Tools sind entwickelt worden, um Patentanalyse-Experten, Managern und Technologieämtern bei den unterschiedlichsten Anforderungen im Bezug auf eine Patentrecherche zu unterstützen."}],"author":[{"first_name":"Martyna","last_name":"Bator","full_name":"Bator, Martyna","id":"46440"},{"full_name":"Deppe, Sahar","first_name":"Sahar","last_name":"Deppe","id":"52121"},{"orcid":"0000-0002-3325-7887","first_name":"Volker","id":"1804","last_name":"Lohweg","full_name":"Lohweg, Volker"}],"year":2015,"main_file_link":[{"url":"https://www.researchgate.net/publication/281933251_Relevanzbewertung_technischer_Informationen_mittels_Data-Mining_Verfahren_am_Anwendungsfall_von_Patentdokumenten","open_access":"1"}],"department":[{"_id":"DEP5023"}]},{"oa":"1","language":[{"iso":"eng"}],"place":"Heidelberg, Germany","_id":"2125","date_created":"2019-12-03T14:02:21Z","type":"conference_abstract","publication":"Workshop on Probabilistic Graphical Models","date_updated":"2023-03-15T13:49:38Z","user_id":"68554","department":[{"_id":"DEP5023"}],"main_file_link":[{"url":"https://www.researchgate.net/publication/283481666_Multi-Scale_Motif_Discovery_in_Image_Processing","open_access":"1"}],"author":[{"id":"52121","first_name":"Sahar","last_name":"Deppe","full_name":"Deppe, Sahar"},{"id":"46416","full_name":"Dörksen, Helene","first_name":"Helene","last_name":"Dörksen"},{"orcid":"0000-0002-3325-7887","first_name":"Volker","full_name":"Lohweg, Volker","last_name":"Lohweg","id":"1804"}],"year":2015,"status":"public","title":"Multi-Scale Motif Discovery in Image Processing","citation":{"short":"S. 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GWG Gesellschaft für Wirtschaftsförderung, Göttingen.","short":"V. Lohweg, in: IT InnovationsCluster Göttingen/Südniedersachsen (Eingeladener Vortrag), GWG Gesellschaft für Wirtschaftsförderung, Göttingen, 2015.","chicago":"Lohweg, Volker. “Industrie 4.0 Aus Sicht Des CIIT.” In IT InnovationsCluster Göttingen/Südniedersachsen (Eingeladener Vortrag). GWG Gesellschaft für Wirtschaftsförderung, Göttingen, 2015.","ieee":"V. Lohweg, “Industrie 4.0 aus Sicht des CIIT,” in IT InnovationsCluster Göttingen/Südniedersachsen (Eingeladener Vortrag), 2015.","apa":"Lohweg, V. (2015). Industrie 4.0 aus Sicht des CIIT. In IT InnovationsCluster Göttingen/Südniedersachsen (Eingeladener Vortrag). GWG Gesellschaft für Wirtschaftsförderung, Göttingen.","bjps":"Lohweg V (2015) Industrie 4.0 Aus Sicht Des CIIT. IT InnovationsCluster Göttingen/Südniedersachsen (Eingeladener Vortrag). GWG Gesellschaft für Wirtschaftsförderung, Göttingen.","mla":"Lohweg, Volker. “Industrie 4.0 Aus Sicht Des CIIT.” IT InnovationsCluster Göttingen/Südniedersachsen (Eingeladener Vortrag), 2015.","havard":"V. Lohweg, Industrie 4.0 aus Sicht des CIIT, in: IT InnovationsCluster Göttingen/Südniedersachsen (Eingeladener Vortrag), GWG Gesellschaft für Wirtschaftsförderung, Göttingen, 2015.","ufg":"Lohweg, Volker (2015): Industrie 4.0 aus Sicht des CIIT, in: IT InnovationsCluster Göttingen/Südniedersachsen (Eingeladener Vortrag), GWG Gesellschaft für Wirtschaftsförderung, Göttingen.","ama":"Lohweg V. Industrie 4.0 aus Sicht des CIIT. In: IT InnovationsCluster Göttingen/Südniedersachsen (Eingeladener Vortrag). GWG Gesellschaft für Wirtschaftsförderung, Göttingen; 2015.","van":"Lohweg V. Industrie 4.0 aus Sicht des CIIT. In: IT InnovationsCluster Göttingen/Südniedersachsen (Eingeladener Vortrag). GWG Gesellschaft für Wirtschaftsförderung, Göttingen; 2015."},"_id":"2127","language":[{"iso":"eng"}],"place":"GWG Gesellschaft für Wirtschaftsförderung, Göttingen","type":"conference","date_created":"2019-12-04T09:03:51Z","publication":"IT InnovationsCluster Göttingen/Südniedersachsen (Eingeladener Vortrag)","date_updated":"2023-03-15T13:49:38Z","user_id":"68554"},{"place":"Fraunhofer Application Centre IOSB-INA, Lemgo","keyword":["Assistance System","Euler Number","Synchronous Motor","Image Processing System","Image Processing Method"],"language":[{"iso":"eng"}],"_id":"2128","doi":"10.1007/978-3-662-48838-6_8","user_id":"68554","date_updated":"2023-03-15T13:49:38Z","publication":"Conference on Machine Learning for Cyber-Physical Systems (ML4CPS)","type":"conference","date_created":"2019-12-04T09:04:50Z","status":"public","main_file_link":[{"url":"https://link.springer.com/chapter/10.1007/978-3-662-48838-6_8"}],"year":2015,"author":[{"last_name":"Vukovic","full_name":"Vukovic, Kristijan","first_name":"Kristijan"},{"full_name":"Simonis, Kristina","last_name":"Simonis","first_name":"Kristina"},{"first_name":"Helene","id":"46416","last_name":"Dörksen","full_name":"Dörksen, Helene"},{"orcid":"0000-0002-3325-7887","first_name":"Volker","full_name":"Lohweg, Volker","last_name":"Lohweg","id":"1804"}],"department":[{"_id":"DEP5023"}],"abstract":[{"text":"We present the concept of a perceptive motor in terms of a cyber-physical system (CPS). A model application monitoring a knitting process was developed, where the take-off of the produced fabric is controlled by an electric motor. The idea is to equip a synchronous motor with a smart camera and appropriate image processing hard- and software components. Subsequently, the characteristics of knitted fabric are analysed by machine-learning (ML) methods. Our concept includes motor-current analysis and image processing. The aim is to implement an assistance system for the industrial large circular knitting process. An assistance system will help to shorten the retrofitting process. The concept is based on a low cost hardware approach for a smart camera, and stems from the recent development of image processing applications for mobile devices [1–4].","lang":"eng"}],"citation":{"van":"Vukovic K, Simonis K, Dörksen H, Lohweg V. Efficient Image Processing System for an Industrial Machine Learning Task. In: Conference on Machine Learning for Cyber-Physical Systems (ML4CPS). Fraunhofer Application Centre IOSB-INA, Lemgo; 2015.","ufg":"Vukovic, Kristijan et. al. (2015): Efficient Image Processing System for an Industrial Machine Learning Task, in: Conference on Machine Learning for Cyber-Physical Systems (ML4CPS), Fraunhofer Application Centre IOSB-INA, Lemgo.","havard":"K. Vukovic, K. Simonis, H. Dörksen, V. Lohweg, Efficient Image Processing System for an Industrial Machine Learning Task, in: Conference on Machine Learning for Cyber-Physical Systems (ML4CPS), Fraunhofer Application Centre IOSB-INA, Lemgo, 2015.","bjps":"Vukovic K et al. (2015) Efficient Image Processing System for an Industrial Machine Learning Task. Conference on Machine Learning for Cyber-Physical Systems (ML4CPS). Fraunhofer Application Centre IOSB-INA, Lemgo.","mla":"Vukovic, Kristijan, et al. “Efficient Image Processing System for an Industrial Machine Learning Task.” Conference on Machine Learning for Cyber-Physical Systems (ML4CPS), 2015, doi:10.1007/978-3-662-48838-6_8.","apa":"Vukovic, K., Simonis, K., Dörksen, H., & Lohweg, V. (2015). Efficient Image Processing System for an Industrial Machine Learning Task. In Conference on Machine Learning for Cyber-Physical Systems (ML4CPS). Fraunhofer Application Centre IOSB-INA, Lemgo. https://doi.org/10.1007/978-3-662-48838-6_8","chicago":"Vukovic, Kristijan, Kristina Simonis, Helene Dörksen, and Volker Lohweg. “Efficient Image Processing System for an Industrial Machine Learning Task.” In Conference on Machine Learning for Cyber-Physical Systems (ML4CPS). Fraunhofer Application Centre IOSB-INA, Lemgo, 2015. https://doi.org/10.1007/978-3-662-48838-6_8.","short":"K. Vukovic, K. Simonis, H. Dörksen, V. Lohweg, in: Conference on Machine Learning for Cyber-Physical Systems (ML4CPS), Fraunhofer Application Centre IOSB-INA, Lemgo, 2015.","din1505-2-1":"Vukovic, Kristijan ; Simonis, Kristina ; Dörksen, Helene ; Lohweg, Volker: Efficient Image Processing System for an Industrial Machine Learning Task. In: Conference on Machine Learning for Cyber-Physical Systems (ML4CPS). Fraunhofer Application Centre IOSB-INA, Lemgo, 2015","chicago-de":"Vukovic, Kristijan, Kristina Simonis, Helene Dörksen und Volker Lohweg. 2015. Efficient Image Processing System for an Industrial Machine Learning Task. In: Conference on Machine Learning for Cyber-Physical Systems (ML4CPS). Fraunhofer Application Centre IOSB-INA, Lemgo. doi:10.1007/978-3-662-48838-6_8, .","ama":"Vukovic K, Simonis K, Dörksen H, Lohweg V. Efficient Image Processing System for an Industrial Machine Learning Task. In: Conference on Machine Learning for Cyber-Physical Systems (ML4CPS). Fraunhofer Application Centre IOSB-INA, Lemgo; 2015. doi:10.1007/978-3-662-48838-6_8","ieee":"K. Vukovic, K. Simonis, H. Dörksen, and V. Lohweg, “Efficient Image Processing System for an Industrial Machine Learning Task,” in Conference on Machine Learning for Cyber-Physical Systems (ML4CPS), 2015."},"title":"Efficient Image Processing System for an Industrial Machine Learning Task"},{"_id":"2130","language":[{"iso":"eng"}],"intvolume":" 10","user_id":"68554","date_updated":"2023-03-15T13:49:38Z","publication":"ETZ (2015)","date_created":"2019-12-04T09:08:50Z","type":"journal_article","status":"public","page":"32 - 35d","year":2015,"author":[{"first_name":"Jürgen","full_name":"Jasperneite, Jürgen","last_name":"Jasperneite","id":"1899"},{"orcid":"0000-0002-3325-7887","first_name":"Volker","full_name":"Lohweg, Volker","last_name":"Lohweg","id":"1804"}],"department":[{"_id":"DEP5023"}],"volume":10,"citation":{"bjps":"Jasperneite J and Lohweg V (2015) Intelligente Vernetzung Für Die Flexible Produktion von Morgen. ETZ (2015) 10, 32-35d.","havard":"J. Jasperneite, V. Lohweg, Intelligente Vernetzung für die flexible Produktion von morgen, ETZ (2015). 10 (2015) 32-35d.","mla":"Jasperneite, Jürgen, and Volker Lohweg. “Intelligente Vernetzung Für Die Flexible Produktion von Morgen.” ETZ (2015), vol. 10, 2015, pp. 32-35d.","ufg":"Jasperneite, Jürgen/Lohweg, Volker (2015): Intelligente Vernetzung für die flexible Produktion von morgen, in: ETZ (2015) 10, S. 32-35d.","van":"Jasperneite J, Lohweg V. Intelligente Vernetzung für die flexible Produktion von morgen. ETZ (2015). 2015;10:32-35d.","chicago":"Jasperneite, Jürgen, and Volker Lohweg. “Intelligente Vernetzung Für Die Flexible Produktion von Morgen.” ETZ (2015) 10 (2015): 32-35d.","apa":"Jasperneite, J., & Lohweg, V. (2015). Intelligente Vernetzung für die flexible Produktion von morgen. ETZ (2015), 10, 32-35d.","din1505-2-1":"Jasperneite, Jürgen ; Lohweg, Volker: Intelligente Vernetzung für die flexible Produktion von morgen. In: ETZ (2015) Bd. 10 (2015), S. 32-35d","chicago-de":"Jasperneite, Jürgen und Volker Lohweg. 2015. Intelligente Vernetzung für die flexible Produktion von morgen. ETZ (2015) 10: 32-35d.","short":"J. Jasperneite, V. Lohweg, ETZ (2015) 10 (2015) 32-35d.","ama":"Jasperneite J, Lohweg V. Intelligente Vernetzung für die flexible Produktion von morgen. ETZ (2015). 2015;10:32-35d.","ieee":"J. Jasperneite and V. Lohweg, “Intelligente Vernetzung für die flexible Produktion von morgen,” ETZ (2015), vol. 10, pp. 32-35d, 2015."},"title":"Intelligente Vernetzung für die flexible Produktion von morgen"},{"date_created":"2019-12-04T09:10:15Z","type":"conference","publication":"2. QASS-Colloqium zur Qualitätssicherung (Eingeladener Vortrag)","date_updated":"2023-03-15T13:49:38Z","user_id":"68554","_id":"2131","language":[{"iso":"eng"}],"place":"Wetter(Ruhr)","title":"Industrie 4.0 und Informationsfusion - ein Überblick","citation":{"apa":"Lohweg, V. (2015). Industrie 4.0 und Informationsfusion - ein Überblick. In 2. QASS-Colloqium zur Qualitätssicherung (Eingeladener Vortrag). Wetter(Ruhr).","chicago":"Lohweg, Volker. “Industrie 4.0 Und Informationsfusion - Ein Überblick.” In 2. QASS-Colloqium Zur Qualitätssicherung (Eingeladener Vortrag). Wetter(Ruhr), 2015.","van":"Lohweg V. Industrie 4.0 und Informationsfusion - ein Überblick. In: 2 QASS-Colloqium zur Qualitätssicherung (Eingeladener Vortrag). Wetter(Ruhr); 2015.","havard":"V. Lohweg, Industrie 4.0 und Informationsfusion - ein Überblick, in: 2. QASS-Colloqium Zur Qualitätssicherung (Eingeladener Vortrag), Wetter(Ruhr), 2015.","bjps":"Lohweg V (2015) Industrie 4.0 Und Informationsfusion - Ein Überblick. 2. QASS-Colloqium Zur Qualitätssicherung (Eingeladener Vortrag). Wetter(Ruhr).","mla":"Lohweg, Volker. “Industrie 4.0 Und Informationsfusion - Ein Überblick.” 2. QASS-Colloqium Zur Qualitätssicherung (Eingeladener Vortrag), 2015.","ufg":"Lohweg, Volker (2015): Industrie 4.0 und Informationsfusion - ein Überblick, in: 2. QASS-Colloqium zur Qualitätssicherung (Eingeladener Vortrag), Wetter(Ruhr).","short":"V. Lohweg, in: 2. QASS-Colloqium Zur Qualitätssicherung (Eingeladener Vortrag), Wetter(Ruhr), 2015.","chicago-de":"Lohweg, Volker. 2015. Industrie 4.0 und Informationsfusion - ein Überblick. In: 2. QASS-Colloqium zur Qualitätssicherung (Eingeladener Vortrag). Wetter(Ruhr).","din1505-2-1":"Lohweg, Volker: Industrie 4.0 und Informationsfusion - ein Überblick. In: 2. QASS-Colloqium zur Qualitätssicherung (Eingeladener Vortrag). Wetter(Ruhr), 2015","ieee":"V. Lohweg, “Industrie 4.0 und Informationsfusion - ein Überblick,” in 2. QASS-Colloqium zur Qualitätssicherung (Eingeladener Vortrag), 2015.","ama":"Lohweg V. Industrie 4.0 und Informationsfusion - ein Überblick. In: 2. QASS-Colloqium Zur Qualitätssicherung (Eingeladener Vortrag). Wetter(Ruhr); 2015."},"department":[{"_id":"DEP5023"}],"author":[{"orcid":"0000-0002-3325-7887","last_name":"Lohweg","full_name":"Lohweg, Volker","first_name":"Volker","id":"1804"}],"year":2015,"status":"public"},{"place":"Luxembourg","keyword":["Sensors","Actuators","Finite element analysis","Plastics","Modal analysis","Monitoring","Empirical mode decomposition"],"language":[{"iso":"eng"}],"_id":"2133","doi":" 10.1109/ETFA.2015.7301595","user_id":"68554","date_updated":"2023-03-15T13:49:39Z","publication":"20th IEEE International Conference on Emerging Technologies and Factory Automation","type":"conference","date_created":"2019-12-04T09:11:17Z","status":"public","author":[{"full_name":"Dicks, Alexander","first_name":"Alexander","last_name":"Dicks","id":"1853"},{"id":"1804","first_name":"Volker","last_name":"Lohweg","full_name":"Lohweg, Volker","orcid":"0000-0002-3325-7887"},{"first_name":"Henrik","full_name":"Wittke, Henrik","last_name":"Wittke"},{"full_name":"Linke, Stefan","last_name":"Linke","first_name":"Stefan"}],"year":2015,"department":[{"_id":"DEP5023"}],"abstract":[{"lang":"eng","text":"Due to the material changes of components from metal to plastic or composite materials, the structural health monitoring finds more and more interest in the industrial fields. The reason is that these materials are more vulnerable to damage or impacts which cannot be optically detected. In this contribution we present a method to analyze the structure of plastic components with piezo-electrical sensors and actuators. The components are stimulated by actuators, and sensors capture the injected vibrations. These signals are decomposed into Intrinsic Mode Functions to compute statistical features. A Fuzzy-Pattern-Classifier is applied to detect structural modifications at the components under test."}],"citation":{"ieee":"A. Dicks, V. Lohweg, H. Wittke, and S. Linke, “Structural Health Monitoring of Plastic Components with Piezoelectric Sensors,” in 20th IEEE International Conference on Emerging Technologies and Factory Automation, 2015.","ama":"Dicks A, Lohweg V, Wittke H, Linke S. Structural Health Monitoring of Plastic Components with Piezoelectric Sensors. In: 20th IEEE International Conference on Emerging Technologies and Factory Automation. Luxembourg; 2015. doi: 10.1109/ETFA.2015.7301595","chicago-de":"Dicks, Alexander, Volker Lohweg, Henrik Wittke und Stefan Linke. 2015. Structural Health Monitoring of Plastic Components with Piezoelectric Sensors. In: 20th IEEE International Conference on Emerging Technologies and Factory Automation. Luxembourg. doi: 10.1109/ETFA.2015.7301595, .","din1505-2-1":"Dicks, Alexander ; Lohweg, Volker ; Wittke, Henrik ; Linke, Stefan: Structural Health Monitoring of Plastic Components with Piezoelectric Sensors. In: 20th IEEE International Conference on Emerging Technologies and Factory Automation. Luxembourg, 2015","short":"A. Dicks, V. Lohweg, H. Wittke, S. Linke, in: 20th IEEE International Conference on Emerging Technologies and Factory Automation, Luxembourg, 2015.","chicago":"Dicks, Alexander, Volker Lohweg, Henrik Wittke, and Stefan Linke. “Structural Health Monitoring of Plastic Components with Piezoelectric Sensors.” In 20th IEEE International Conference on Emerging Technologies and Factory Automation. Luxembourg, 2015. https://doi.org/ 10.1109/ETFA.2015.7301595.","apa":"Dicks, A., Lohweg, V., Wittke, H., & Linke, S. (2015). Structural Health Monitoring of Plastic Components with Piezoelectric Sensors. In 20th IEEE International Conference on Emerging Technologies and Factory Automation. Luxembourg. https://doi.org/ 10.1109/ETFA.2015.7301595","ufg":"Dicks, Alexander et. al. (2015): Structural Health Monitoring of Plastic Components with Piezoelectric Sensors, in: 20th IEEE International Conference on Emerging Technologies and Factory Automation, Luxembourg.","bjps":"Dicks A et al. (2015) Structural Health Monitoring of Plastic Components with Piezoelectric Sensors. 20th IEEE International Conference on Emerging Technologies and Factory Automation. Luxembourg.","mla":"Dicks, Alexander, et al. “Structural Health Monitoring of Plastic Components with Piezoelectric Sensors.” 20th IEEE International Conference on Emerging Technologies and Factory Automation, 2015, doi: 10.1109/ETFA.2015.7301595.","havard":"A. Dicks, V. Lohweg, H. Wittke, S. Linke, Structural Health Monitoring of Plastic Components with Piezoelectric Sensors, in: 20th IEEE International Conference on Emerging Technologies and Factory Automation, Luxembourg, 2015.","van":"Dicks A, Lohweg V, Wittke H, Linke S. Structural Health Monitoring of Plastic Components with Piezoelectric Sensors. In: 20th IEEE International Conference on Emerging Technologies and Factory Automation. Luxembourg; 2015."},"title":"Structural Health Monitoring of Plastic Components with Piezoelectric Sensors"},{"citation":{"ama":"Dörksen H, Lohweg V. Automated Fuzzy Classification with Combinatorial Refinement. In: 20th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA) Luxembourg, Sep 2015. . Luxembourg: IEEE; 2015. doi: 10.1109/ETFA.2015.7301514","ieee":"H. Dörksen and V. Lohweg, “Automated Fuzzy Classification with Combinatorial Refinement,” in 20th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA) Luxembourg, Sep 2015. , 2015.","van":"Dörksen H, Lohweg V. Automated Fuzzy Classification with Combinatorial Refinement. In: 20th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA) Luxembourg, Sep 2015 . Luxembourg: IEEE; 2015.","ufg":"Dörksen, Helene/Lohweg, Volker (2015): Automated Fuzzy Classification with Combinatorial Refinement, in: 20th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA) Luxembourg, Sep 2015. , Luxembourg.","havard":"H. Dörksen, V. Lohweg, Automated Fuzzy Classification with Combinatorial Refinement, in: 20th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA) Luxembourg, Sep 2015. , IEEE, Luxembourg, 2015.","mla":"Dörksen, Helene, and Volker Lohweg. “Automated Fuzzy Classification with Combinatorial Refinement.” 20th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA) Luxembourg, Sep 2015. , IEEE, 2015, doi: 10.1109/ETFA.2015.7301514.","bjps":"Dörksen H and Lohweg V (2015) Automated Fuzzy Classification with Combinatorial Refinement. 20th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA) Luxembourg, Sep 2015. . Luxembourg: IEEE.","apa":"Dörksen, H., & Lohweg, V. (2015). Automated Fuzzy Classification with Combinatorial Refinement. In 20th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA) Luxembourg, Sep 2015. . Luxembourg: IEEE. https://doi.org/ 10.1109/ETFA.2015.7301514","chicago":"Dörksen, Helene, and Volker Lohweg. “Automated Fuzzy Classification with Combinatorial Refinement.” In 20th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA) Luxembourg, Sep 2015. . Luxembourg: IEEE, 2015. https://doi.org/ 10.1109/ETFA.2015.7301514.","short":"H. Dörksen, V. Lohweg, in: 20th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA) Luxembourg, Sep 2015. , IEEE, Luxembourg, 2015.","din1505-2-1":"Dörksen, Helene ; Lohweg, Volker: Automated Fuzzy Classification with Combinatorial Refinement. In: 20th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA) Luxembourg, Sep 2015. . Luxembourg : IEEE, 2015","chicago-de":"Dörksen, Helene und Volker Lohweg. 2015. Automated Fuzzy Classification with Combinatorial Refinement. In: 20th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA) Luxembourg, Sep 2015. . Luxembourg: IEEE. doi: 10.1109/ETFA.2015.7301514, ."},"title":"Automated Fuzzy Classification with Combinatorial Refinement","publisher":"IEEE","status":"public","abstract":[{"lang":"eng","text":"In modern industrial applications driven by Cyber-physical systems (CPS) it is a challenging task to model and optimize processes such as machine analysis and diagnosis. Since the CPS have to act autonomously, a procedure for automated decision making has to be designed. In our work we concentrate on the design of a decision procedure by a fuzzy classifier approach. For our application on decision making in an industrial environment, a fuzzy approach was picked as convenient classification technique regarding balance between accuracy and computational time. We present a supervised learning method called FUZZY-ComRef which combines fuzzy classification and our combinatorial refinement method, called ComRef [1]. Due to the fact that fuzzy classification might behave inaccurately for some datasets, the aim of our approach is to improve the results provided by the (stand-alone) fuzzy classification. We show the performance of FUZZY-ComRef evaluated on the samples from the UCI Repository and on our real-world dataset Motor Drive Diagnosis. In addition, we discuss the quadratic computational time problem arising from the combinatorial nature of ComRef. Furthermore, we show based on real-time evaluations that within parallelisation the proposed FUZZY-ComRef is suitable to many applications in CPS."}],"department":[{"_id":"DEP5023"}],"year":2015,"author":[{"last_name":"Dörksen","first_name":"Helene","id":"46416","full_name":"Dörksen, Helene"},{"id":"1804","last_name":"Lohweg","full_name":"Lohweg, Volker","first_name":"Volker","orcid":"0000-0002-3325-7887"}],"date_updated":"2023-03-15T13:49:39Z","user_id":"68554","date_created":"2019-12-04T09:23:21Z","type":"conference","publication_identifier":{"eisbn":[" 978-1-4673-7929-8"]},"publication":"20th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA) Luxembourg, Sep 2015. ","doi":" 10.1109/ETFA.2015.7301514","_id":"2136","language":[{"iso":"eng"}],"keyword":["Support vector machines","Accuracy","Time complexity","Decision making","Motor drives","Shape","Sensors"],"place":"Luxembourg"},{"type":"conference","date_created":"2019-12-04T09:26:34Z","date_updated":"2023-03-15T13:49:39Z","user_id":"68554","language":[{"iso":"eng"}],"place":"Campus Week 2015, Bundesdruckerei Berlin (eingeladener Vortrag)","_id":"2138","title":"Industrie 4.0 - Ein Überblick","citation":{"chicago":"Lohweg, Volker. “Industrie 4.0 - Ein Überblick.” Campus Week 2015, Bundesdruckerei Berlin (eingeladener Vortrag), 2015.","apa":"Lohweg, V. (2015). Industrie 4.0 - Ein Überblick. Campus Week 2015, Bundesdruckerei Berlin (eingeladener Vortrag).","ieee":"V. Lohweg, “Industrie 4.0 - Ein Überblick,” 2015.","ufg":"Lohweg, Volker (2015): Industrie 4.0 - Ein Überblick, in: , Campus Week 2015, Bundesdruckerei Berlin (eingeladener Vortrag).","havard":"V. Lohweg, Industrie 4.0 - Ein Überblick, in: Campus Week 2015, Bundesdruckerei Berlin (eingeladener Vortrag), 2015.","bjps":"Lohweg V (2015) Industrie 4.0 - Ein Überblick. Campus Week 2015, Bundesdruckerei Berlin (eingeladener Vortrag).","mla":"Lohweg, Volker. Industrie 4.0 - Ein Überblick. 2015.","van":"Lohweg V. Industrie 4.0 - Ein Überblick. In Campus Week 2015, Bundesdruckerei Berlin (eingeladener Vortrag); 2015.","ama":"Lohweg V. Industrie 4.0 - Ein Überblick. In: Campus Week 2015, Bundesdruckerei Berlin (eingeladener Vortrag); 2015.","din1505-2-1":"Lohweg, Volker: Industrie 4.0 - Ein Überblick. In: . Campus Week 2015, Bundesdruckerei Berlin (eingeladener Vortrag), 2015","chicago-de":"Lohweg, Volker. 2015. Industrie 4.0 - Ein Überblick. In: . Campus Week 2015, Bundesdruckerei Berlin (eingeladener Vortrag).","short":"V. Lohweg, in: Campus Week 2015, Bundesdruckerei Berlin (eingeladener Vortrag), 2015."},"department":[{"_id":"DEP5023"}],"year":2015,"author":[{"orcid":"0000-0002-3325-7887","id":"1804","full_name":"Lohweg, Volker","last_name":"Lohweg","first_name":"Volker"}],"status":"public"},{"status":"public","department":[{"_id":"DEP5023"}],"year":2015,"author":[{"orcid":"0000-0002-3325-7887","last_name":"Lohweg","first_name":"Volker","full_name":"Lohweg, Volker","id":"1804"}],"citation":{"din1505-2-1":"Lohweg, Volker: Banknotenauthentifikation auf Basis von Druckverfahren. In: . Campus Week 2015, Bundesdruckerei Berlin (eingeladener Vortrag), 2015","chicago-de":"Lohweg, Volker. 2015. Banknotenauthentifikation auf Basis von Druckverfahren. In: . Campus Week 2015, Bundesdruckerei Berlin (eingeladener Vortrag).","short":"V. Lohweg, in: Campus Week 2015, Bundesdruckerei Berlin (eingeladener Vortrag), 2015.","ufg":"Lohweg, Volker (2015): Banknotenauthentifikation auf Basis von Druckverfahren, in: , Campus Week 2015, Bundesdruckerei Berlin (eingeladener Vortrag).","mla":"Lohweg, Volker. Banknotenauthentifikation Auf Basis von Druckverfahren. 2015.","bjps":"Lohweg V (2015) Banknotenauthentifikation Auf Basis von Druckverfahren. Campus Week 2015, Bundesdruckerei Berlin (eingeladener Vortrag).","havard":"V. Lohweg, Banknotenauthentifikation auf Basis von Druckverfahren, in: Campus Week 2015, Bundesdruckerei Berlin (eingeladener Vortrag), 2015.","van":"Lohweg V. Banknotenauthentifikation auf Basis von Druckverfahren. In Campus Week 2015, Bundesdruckerei Berlin (eingeladener Vortrag); 2015.","chicago":"Lohweg, Volker. “Banknotenauthentifikation Auf Basis von Druckverfahren.” Campus Week 2015, Bundesdruckerei Berlin (eingeladener Vortrag), 2015.","apa":"Lohweg, V. (2015). Banknotenauthentifikation auf Basis von Druckverfahren. Campus Week 2015, Bundesdruckerei Berlin (eingeladener Vortrag).","ama":"Lohweg V. Banknotenauthentifikation auf Basis von Druckverfahren. In: Campus Week 2015, Bundesdruckerei Berlin (eingeladener Vortrag); 2015.","ieee":"V. Lohweg, “Banknotenauthentifikation auf Basis von Druckverfahren,” 2015."},"title":"Banknotenauthentifikation auf Basis von Druckverfahren","language":[{"iso":"eng"}],"place":"Campus Week 2015, Bundesdruckerei Berlin (eingeladener Vortrag)","_id":"2139","date_updated":"2023-03-15T13:49:39Z","user_id":"68554","date_created":"2019-12-04T09:28:06Z","type":"conference"},{"status":"public","page":"63-71","publisher":"Elsevier","main_file_link":[{"open_access":"1","url":"https://www.sciencedirect.com/science/article/pii/S0957415815000707"}],"year":2015,"author":[{"id":"1825","full_name":"Mönks, Uwe","first_name":"Uwe","last_name":"Mönks"},{"id":"1486","first_name":"Henning","full_name":"Trsek, Henning","last_name":"Trsek"},{"first_name":"Lars","full_name":"Dürkop, Lars","last_name":"Dürkop"},{"full_name":"Geneiß, Volker","first_name":"Volker","last_name":"Geneiß"},{"last_name":"Lohweg","id":"1804","full_name":"Lohweg, Volker","first_name":"Volker","orcid":"0000-0002-3325-7887"}],"department":[{"_id":"DEP5023"}],"issue":"34","abstract":[{"lang":"eng","text":"Recent industrial applications are implemented in a modular way, resulting in flexibility during the whole life cycle, i.e., setup, operation, and maintenance. This applies especially to larger applications like logistic, production, and printing processes. Their modular character is resulting from the constantly increasing complexity of such installations, which makes their supervision for securing reliable operation a difficult task: the data of hundreds (if not thousands) of signal sources must be acquired, communicated, and evaluated for system diagnosis. In this contribution we summarize the challenges arising in such applications and show that distributed sensor and information fusion for modular self-diagnosis tackles these challenges. Here, we propose an innovative distributed architecture encompassing intelligent sensor nodes, self-configuring real-time communication networks, and a suitable sensor and information fusion system for condition monitoring. New challenges arise in the context of distributed information fusion systems, which are identified and to which an outlook on future solutions is provided. A number of these solutions have already been discovered, implemented, and are evaluated in the context of a demonstrator, which resembles a real-world printing application."}],"citation":{"din1505-2-1":"Mönks, Uwe ; Trsek, Henning ; Dürkop, Lars ; Geneiß, Volker ; Lohweg, Volker: Towards distributed intelligent sensor and information fusion. In: Mechatronics, Elsevier (2015), Nr. 34, S. 63–71","chicago-de":"Mönks, Uwe, Henning Trsek, Lars Dürkop, Volker Geneiß und Volker Lohweg. 2015. Towards distributed intelligent sensor and information fusion. Mechatronics, Nr. 34: 63–71. doi:10.1016/j.mechatronics.2015.05.005, .","short":"U. Mönks, H. Trsek, L. Dürkop, V. Geneiß, V. Lohweg, Mechatronics (2015) 63–71.","ufg":"Mönks, Uwe et. al. (2015): Towards distributed intelligent sensor and information fusion, in: Mechatronics (34), S. 63–71.","mla":"Mönks, Uwe, et al. “Towards Distributed Intelligent Sensor and Information Fusion.” Mechatronics, no. 34, Elsevier, 2015, pp. 63–71, doi:10.1016/j.mechatronics.2015.05.005.","bjps":"Mönks U et al. (2015) Towards Distributed Intelligent Sensor and Information Fusion. Mechatronics 63–71.","havard":"U. Mönks, H. Trsek, L. Dürkop, V. Geneiß, V. Lohweg, Towards distributed intelligent sensor and information fusion, Mechatronics. (2015) 63–71.","van":"Mönks U, Trsek H, Dürkop L, Geneiß V, Lohweg V. Towards distributed intelligent sensor and information fusion. Mechatronics. 2015;(34):63–71.","ama":"Mönks U, Trsek H, Dürkop L, Geneiß V, Lohweg V. Towards distributed intelligent sensor and information fusion. Mechatronics. 2015;(34):63-71. doi:10.1016/j.mechatronics.2015.05.005","chicago":"Mönks, Uwe, Henning Trsek, Lars Dürkop, Volker Geneiß, and Volker Lohweg. “Towards Distributed Intelligent Sensor and Information Fusion.” Mechatronics, no. 34 (2015): 63–71. https://doi.org/10.1016/j.mechatronics.2015.05.005.","apa":"Mönks, U., Trsek, H., Dürkop, L., Geneiß, V., & Lohweg, V. (2015). Towards distributed intelligent sensor and information fusion. Mechatronics, (34), 63–71. https://doi.org/10.1016/j.mechatronics.2015.05.005","ieee":"U. Mönks, H. Trsek, L. Dürkop, V. Geneiß, and V. Lohweg, “Towards distributed intelligent sensor and information fusion,” Mechatronics, no. 34, pp. 63–71, 2015."},"title":"Towards distributed intelligent sensor and information fusion","keyword":["Cyber-physical systems","Information fusion","Fusion system design","Intelligent sensors","Self-configuration","Intelligent networking"],"language":[{"iso":"eng"}],"_id":"2140","doi":"10.1016/j.mechatronics.2015.05.005","oa":"1","user_id":"68554","date_updated":"2023-03-15T13:49:39Z","publication_identifier":{"issn":["0957-4158"]},"publication":"Mechatronics","date_created":"2019-12-04T09:29:07Z","type":"journal_article"},{"_id":"2143","language":[{"iso":"eng"}],"place":"Hochschule Niederrhein, Krefeld","date_created":"2019-12-04T09:38:48Z","type":"conference","publication":"2. Forschungstag IT-Sicherheit NRW, nrw.uniTS – IT-Sicherheit Nordrhein-Westfalen (eingeladener Vortrag)","date_updated":"2023-03-15T13:49:39Z","user_id":"68554","department":[{"_id":"DEP5023"}],"year":2015,"author":[{"id":"1804","first_name":"Volker","full_name":"Lohweg, Volker","last_name":"Lohweg","orcid":"0000-0002-3325-7887"}],"status":"public","title":"Bargeld- und IT-Sicherheit - Passt das zusammen?","citation":{"van":"Lohweg V. Bargeld- und IT-Sicherheit - Passt das zusammen? In: 2 Forschungstag IT-Sicherheit NRW, nrw.uniTS – IT-Sicherheit Nordrhein-Westfalen (eingeladener Vortrag). Hochschule Niederrhein, Krefeld; 2015.","ufg":"Lohweg, Volker (2015): Bargeld- und IT-Sicherheit - Passt das zusammen?, in: 2. Forschungstag IT-Sicherheit NRW, nrw.uniTS – IT-Sicherheit Nordrhein-Westfalen (eingeladener Vortrag), Hochschule Niederrhein, Krefeld.","havard":"V. Lohweg, Bargeld- und IT-Sicherheit - Passt das zusammen?, in: 2. Forschungstag IT-Sicherheit NRW, Nrw.UniTS – IT-Sicherheit Nordrhein-Westfalen (Eingeladener Vortrag), Hochschule Niederrhein, Krefeld, 2015.","bjps":"Lohweg V (2015) Bargeld- Und IT-Sicherheit - Passt Das Zusammen? 2. Forschungstag IT-Sicherheit NRW, Nrw.UniTS – IT-Sicherheit Nordrhein-Westfalen (Eingeladener Vortrag). Hochschule Niederrhein, Krefeld.","mla":"Lohweg, Volker. “Bargeld- Und IT-Sicherheit - Passt Das Zusammen?” 2. Forschungstag IT-Sicherheit NRW, Nrw.UniTS – IT-Sicherheit Nordrhein-Westfalen (Eingeladener Vortrag), 2015.","apa":"Lohweg, V. (2015). Bargeld- und IT-Sicherheit - Passt das zusammen? In 2. Forschungstag IT-Sicherheit NRW, nrw.uniTS – IT-Sicherheit Nordrhein-Westfalen (eingeladener Vortrag). Hochschule Niederrhein, Krefeld.","chicago":"Lohweg, Volker. “Bargeld- Und IT-Sicherheit - Passt Das Zusammen?” In 2. Forschungstag IT-Sicherheit NRW, Nrw.UniTS – IT-Sicherheit Nordrhein-Westfalen (Eingeladener Vortrag). Hochschule Niederrhein, Krefeld, 2015.","short":"V. Lohweg, in: 2. Forschungstag IT-Sicherheit NRW, Nrw.UniTS – IT-Sicherheit Nordrhein-Westfalen (Eingeladener Vortrag), Hochschule Niederrhein, Krefeld, 2015.","chicago-de":"Lohweg, Volker. 2015. Bargeld- und IT-Sicherheit - Passt das zusammen? In: 2. Forschungstag IT-Sicherheit NRW, nrw.uniTS – IT-Sicherheit Nordrhein-Westfalen (eingeladener Vortrag). Hochschule Niederrhein, Krefeld.","din1505-2-1":"Lohweg, Volker: Bargeld- und IT-Sicherheit - Passt das zusammen? In: 2. Forschungstag IT-Sicherheit NRW, nrw.uniTS – IT-Sicherheit Nordrhein-Westfalen (eingeladener Vortrag). Hochschule Niederrhein, Krefeld, 2015","ama":"Lohweg V. Bargeld- und IT-Sicherheit - Passt das zusammen? In: 2. Forschungstag IT-Sicherheit NRW, Nrw.UniTS – IT-Sicherheit Nordrhein-Westfalen (Eingeladener Vortrag). Hochschule Niederrhein, Krefeld; 2015.","ieee":"V. Lohweg, “Bargeld- und IT-Sicherheit - Passt das zusammen?,” in 2. Forschungstag IT-Sicherheit NRW, nrw.uniTS – IT-Sicherheit Nordrhein-Westfalen (eingeladener Vortrag), 2015."}},{"place":"Nuremberg, Germany","language":[{"iso":"eng"}],"_id":"2145","oa":"1","user_id":"68554","date_updated":"2023-03-15T13:49:39Z","publication_identifier":{"isbn":["978-3-9813484-8-4 "]},"publication":"AMA Conferences 2015, SENSOR 2015 - IRS2 2015","date_created":"2019-12-04T09:48:11Z","type":"conference","status":"public","page":"878 - 883","publisher":"AMA-Fachverband","year":2015,"author":[{"id":"1852","first_name":"Jan-Friedrich","full_name":"Ehlenbröker, Jan-Friedrich","last_name":"Ehlenbröker"},{"first_name":"Uwe","last_name":"Mönks","id":"1825","full_name":"Mönks, Uwe"},{"orcid":"0000-0002-3325-7887","first_name":"Volker","last_name":"Lohweg","full_name":"Lohweg, Volker","id":"1804"}],"main_file_link":[{"open_access":"1","url":"https://www.ama-science.org/proceedings/details/2090"}],"department":[{"_id":"DEP5023"}],"abstract":[{"text":"One general problem is the detection of sensor defects. Defective sensors can have several negative consequences, e. g., they will lead to machine failure when wear and tear of a machine is not detected sufficiently in advance. In this contribution we present a method to detect faulty sensors by calculating the consistency between sensor values. Background for this consistency-driven approach is a sensor fusion algorithm which combines sensors to attributes. These attributes are generally created based on local or thematical proximity. Therefore a consistency based approach is promising.","lang":"eng"}],"citation":{"short":"J.-F. Ehlenbröker, U. Mönks, V. Lohweg, in: AMA Conferences 2015, SENSOR 2015 - IRS2 2015, AMA-Fachverband, Nuremberg, Germany, 2015, pp. 878–883.","din1505-2-1":"Ehlenbröker, Jan-Friedrich ; Mönks, Uwe ; Lohweg, Volker: Consistency Based Sensor Defect Detection . In: AMA Conferences 2015, SENSOR 2015 - IRS2 2015. Nuremberg, Germany : AMA-Fachverband, 2015, S. 878–883","chicago-de":"Ehlenbröker, Jan-Friedrich, Uwe Mönks und Volker Lohweg. 2015. Consistency Based Sensor Defect Detection . In: AMA Conferences 2015, SENSOR 2015 - IRS2 2015, 878–883. Nuremberg, Germany: AMA-Fachverband.","apa":"Ehlenbröker, J.-F., Mönks, U., & Lohweg, V. (2015). Consistency Based Sensor Defect Detection . In AMA Conferences 2015, SENSOR 2015 - IRS2 2015 (pp. 878–883). Nuremberg, Germany: AMA-Fachverband.","ieee":"J.-F. Ehlenbröker, U. Mönks, and V. Lohweg, “Consistency Based Sensor Defect Detection ,” in AMA Conferences 2015, SENSOR 2015 - IRS2 2015, 2015, pp. 878–883.","chicago":"Ehlenbröker, Jan-Friedrich, Uwe Mönks, and Volker Lohweg. “Consistency Based Sensor Defect Detection .” In AMA Conferences 2015, SENSOR 2015 - IRS2 2015, 878–83. Nuremberg, Germany: AMA-Fachverband, 2015.","van":"Ehlenbröker J-F, Mönks U, Lohweg V. Consistency Based Sensor Defect Detection . In: AMA Conferences 2015, SENSOR 2015 - IRS2 2015. Nuremberg, Germany: AMA-Fachverband; 2015. p. 878–83.","ama":"Ehlenbröker J-F, Mönks U, Lohweg V. Consistency Based Sensor Defect Detection . In: AMA Conferences 2015, SENSOR 2015 - IRS2 2015. Nuremberg, Germany: AMA-Fachverband; 2015:878-883.","ufg":"Ehlenbröker, Jan-Friedrich et. al. (2015): Consistency Based Sensor Defect Detection , in: AMA Conferences 2015, SENSOR 2015 - IRS2 2015, Nuremberg, Germany, S. 878–883.","havard":"J.-F. Ehlenbröker, U. Mönks, V. Lohweg, Consistency Based Sensor Defect Detection , in: AMA Conferences 2015, SENSOR 2015 - IRS2 2015, AMA-Fachverband, Nuremberg, Germany, 2015: pp. 878–883.","mla":"Ehlenbröker, Jan-Friedrich, et al. “Consistency Based Sensor Defect Detection .” AMA Conferences 2015, SENSOR 2015 - IRS2 2015, AMA-Fachverband, 2015, pp. 878–83.","bjps":"Ehlenbröker J-F, Mönks U and Lohweg V (2015) Consistency Based Sensor Defect Detection . AMA Conferences 2015, SENSOR 2015 - IRS2 2015. Nuremberg, Germany: AMA-Fachverband, pp. 878–883."},"title":"Consistency Based Sensor Defect Detection "},{"author":[{"first_name":"Volker","full_name":"Lohweg, Volker","id":"1804","last_name":"Lohweg","orcid":"0000-0002-3325-7887"}],"year":2015,"department":[{"_id":"DEP5023"}],"status":"public","title":"Geld – neue Zahlungssysteme, Die Zeit des Bargeldes geht zu Ende – oder doch nicht? (Vortrag)","citation":{"ama":"Lohweg V. Geld – neue Zahlungssysteme, Die Zeit des Bargeldes geht zu Ende – oder doch nicht? (Vortrag). In: Wirtschaft Trifft Wissenschaft. MARTa, Herford; 2015.","ieee":"V. Lohweg, “Geld – neue Zahlungssysteme, Die Zeit des Bargeldes geht zu Ende – oder doch nicht? (Vortrag),” in Wirtschaft trifft Wissenschaft, 2015.","ufg":"Lohweg, Volker (2015): Geld – neue Zahlungssysteme, Die Zeit des Bargeldes geht zu Ende – oder doch nicht? (Vortrag), in: Wirtschaft trifft Wissenschaft, MARTa, Herford.","bjps":"Lohweg V (2015) Geld – Neue Zahlungssysteme, Die Zeit Des Bargeldes Geht Zu Ende – Oder Doch Nicht? (Vortrag). Wirtschaft Trifft Wissenschaft. MARTa, Herford.","mla":"Lohweg, Volker. “Geld – Neue Zahlungssysteme, Die Zeit Des Bargeldes Geht Zu Ende – Oder Doch Nicht? (Vortrag).” Wirtschaft Trifft Wissenschaft, 2015.","havard":"V. Lohweg, Geld – neue Zahlungssysteme, Die Zeit des Bargeldes geht zu Ende – oder doch nicht? (Vortrag), in: Wirtschaft Trifft Wissenschaft, MARTa, Herford, 2015.","van":"Lohweg V. Geld – neue Zahlungssysteme, Die Zeit des Bargeldes geht zu Ende – oder doch nicht? (Vortrag). In: Wirtschaft trifft Wissenschaft. MARTa, Herford; 2015.","chicago":"Lohweg, Volker. “Geld – Neue Zahlungssysteme, Die Zeit Des Bargeldes Geht Zu Ende – Oder Doch Nicht? (Vortrag).” In Wirtschaft Trifft Wissenschaft. MARTa, Herford, 2015.","apa":"Lohweg, V. (2015). Geld – neue Zahlungssysteme, Die Zeit des Bargeldes geht zu Ende – oder doch nicht? (Vortrag). In Wirtschaft trifft Wissenschaft. MARTa, Herford.","chicago-de":"Lohweg, Volker. 2015. Geld – neue Zahlungssysteme, Die Zeit des Bargeldes geht zu Ende – oder doch nicht? (Vortrag). In: Wirtschaft trifft Wissenschaft. MARTa, Herford.","din1505-2-1":"Lohweg, Volker: Geld – neue Zahlungssysteme, Die Zeit des Bargeldes geht zu Ende – oder doch nicht? (Vortrag). In: Wirtschaft trifft Wissenschaft. MARTa, Herford, 2015","short":"V. Lohweg, in: Wirtschaft Trifft Wissenschaft, MARTa, Herford, 2015."},"place":"MARTa, Herford","language":[{"iso":"eng"}],"_id":"2151","publication":"Wirtschaft trifft Wissenschaft","date_created":"2019-12-04T10:02:59Z","type":"conference_abstract","user_id":"68554","date_updated":"2023-03-15T13:49:39Z"},{"user_id":"68554","date_updated":"2023-03-15T13:49:39Z","publication":"Forum IEE-Automatisierungstechnik, Elektrotechnik 2015","type":"conference_abstract","date_created":"2019-12-04T10:04:33Z","_id":"2153","place":"Dortmund","language":[{"iso":"eng"}],"citation":{"ufg":"Lohweg, Volker (2015): Industrie 4.0 aus Sicht des Spitzenclusters it‘s OWL (eingeladener Vortrag), in: Forum IEE-Automatisierungstechnik, Elektrotechnik 2015, Dortmund.","havard":"V. Lohweg, Industrie 4.0 aus Sicht des Spitzenclusters it‘s OWL (eingeladener Vortrag), in: Forum IEE-Automatisierungstechnik, Elektrotechnik 2015, Dortmund, 2015.","mla":"Lohweg, Volker. “Industrie 4.0 Aus Sicht Des Spitzenclusters It‘s OWL (Eingeladener Vortrag).” Forum IEE-Automatisierungstechnik, Elektrotechnik 2015, 2015.","bjps":"Lohweg V (2015) Industrie 4.0 Aus Sicht Des Spitzenclusters It‘s OWL (Eingeladener Vortrag). Forum IEE-Automatisierungstechnik, Elektrotechnik 2015. Dortmund.","van":"Lohweg V. Industrie 4.0 aus Sicht des Spitzenclusters it‘s OWL (eingeladener Vortrag). In: Forum IEE-Automatisierungstechnik, Elektrotechnik 2015. Dortmund; 2015.","chicago":"Lohweg, Volker. “Industrie 4.0 Aus Sicht Des Spitzenclusters It‘s OWL (Eingeladener Vortrag).” In Forum IEE-Automatisierungstechnik, Elektrotechnik 2015. Dortmund, 2015.","apa":"Lohweg, V. (2015). Industrie 4.0 aus Sicht des Spitzenclusters it‘s OWL (eingeladener Vortrag). In Forum IEE-Automatisierungstechnik, Elektrotechnik 2015. Dortmund.","din1505-2-1":"Lohweg, Volker: Industrie 4.0 aus Sicht des Spitzenclusters it‘s OWL (eingeladener Vortrag). In: Forum IEE-Automatisierungstechnik, Elektrotechnik 2015. Dortmund, 2015","chicago-de":"Lohweg, Volker. 2015. Industrie 4.0 aus Sicht des Spitzenclusters it‘s OWL (eingeladener Vortrag). In: Forum IEE-Automatisierungstechnik, Elektrotechnik 2015. Dortmund.","short":"V. Lohweg, in: Forum IEE-Automatisierungstechnik, Elektrotechnik 2015, Dortmund, 2015.","ama":"Lohweg V. Industrie 4.0 aus Sicht des Spitzenclusters it‘s OWL (eingeladener Vortrag). In: Forum IEE-Automatisierungstechnik, Elektrotechnik 2015. Dortmund; 2015.","ieee":"V. Lohweg, “Industrie 4.0 aus Sicht des Spitzenclusters it‘s OWL (eingeladener Vortrag),” in Forum IEE-Automatisierungstechnik, Elektrotechnik 2015, 2015."},"title":"Industrie 4.0 aus Sicht des Spitzenclusters it‘s OWL (eingeladener Vortrag)","status":"public","year":2015,"author":[{"orcid":"0000-0002-3325-7887","last_name":"Lohweg","full_name":"Lohweg, Volker","id":"1804","first_name":"Volker"}],"department":[{"_id":"DEP5023"}]},{"oa":"1","doi":"10.1117/12.2076146","_id":"2155","language":[{"iso":"eng"}],"place":"San Francisco, CA, USA","keyword":["Image processing","Image acquisition","Mobile devices Sensors","Image fusion","Motion estimation","Cameras"],"type":"conference","date_created":"2019-12-04T10:07:01Z","publication":"IST/SPIE Electronic Imaging 2015, Digital Photography and Mobile Imaging XI","date_updated":"2023-03-15T13:49:39Z","user_id":"68554","abstract":[{"text":"Today, mobile devices (smartphones, tablets, etc.) are widespread and of high importance for their users. Their performance as well as versatility increases over time. This leads to the opportunity to use such devices for more specific tasks like image processing in an industrial context. For the analysis of images requirements like image quality (blur, illumination, etc.) as well as a defined relative position of the object to be inspected are crucial. Since mobile devices are handheld and used in constantly changing environments the challenge is to fulfill these requirements. We present an approach to overcome the obstacles and stabilize the image capturing process such that image analysis becomes significantly improved on mobile devices. Therefore, image processing methods are combined with sensor fusion concepts. The approach consists of three main parts. First, pose estimation methods are used to guide a user moving the device to a defined position. Second, the sensors data and the pose information are combined for relative motion estimation. Finally, the image capturing process is automated. It is triggered depending on the alignment of the device and the object as well as the image quality that can be achieved under consideration of motion and environmental effects.","lang":"eng"}],"department":[{"_id":"DEP5023"}],"author":[{"id":"44017","full_name":"Henning, Kai-Fabian","last_name":"Henning","first_name":"Kai-Fabian"},{"first_name":"Alexander","full_name":"Fritze, Alexander","last_name":"Fritze"},{"first_name":"Eugen","last_name":"Gillich","full_name":"Gillich, Eugen","id":"1706"},{"first_name":"Uwe","id":"1825","full_name":"Mönks, Uwe","last_name":"Mönks"},{"last_name":"Lohweg","full_name":"Lohweg, Volker","id":"1804","first_name":"Volker","orcid":"0000-0002-3325-7887"}],"year":2015,"main_file_link":[{"open_access":"1","url":"https://www.spiedigitallibrary.org/conference-proceedings-of-spie/9404/94040N/Stable-image-acquisition-for-mobile-image-processing-applications/10.1117/12.2076146.full?SSO=1"}],"publisher":"SPIE","page":"1-12","status":"public","title":"Stable Image Acquisition for Mobile Image Processing Applications","citation":{"din1505-2-1":"Henning, Kai-Fabian ; Fritze, Alexander ; Gillich, Eugen ; Mönks, Uwe ; Lohweg, Volker: Stable Image Acquisition for Mobile Image Processing Applications. In: IST/SPIE Electronic Imaging 2015, Digital Photography and Mobile Imaging XI. San Francisco, CA, USA : SPIE, 2015, S. 1–12","chicago-de":"Henning, Kai-Fabian, Alexander Fritze, Eugen Gillich, Uwe Mönks und Volker Lohweg. 2015. Stable Image Acquisition for Mobile Image Processing Applications. In: IST/SPIE Electronic Imaging 2015, Digital Photography and Mobile Imaging XI, 1–12. San Francisco, CA, USA: SPIE. doi:10.1117/12.2076146, .","short":"K.-F. Henning, A. Fritze, E. Gillich, U. Mönks, V. Lohweg, in: IST/SPIE Electronic Imaging 2015, Digital Photography and Mobile Imaging XI, SPIE, San Francisco, CA, USA, 2015, pp. 1–12.","bjps":"Henning K-F et al. (2015) Stable Image Acquisition for Mobile Image Processing Applications. IST/SPIE Electronic Imaging 2015, Digital Photography and Mobile Imaging XI. San Francisco, CA, USA: SPIE, pp. 1–12.","havard":"K.-F. Henning, A. Fritze, E. Gillich, U. Mönks, V. Lohweg, Stable Image Acquisition for Mobile Image Processing Applications, in: IST/SPIE Electronic Imaging 2015, Digital Photography and Mobile Imaging XI, SPIE, San Francisco, CA, USA, 2015: pp. 1–12.","mla":"Henning, Kai-Fabian, et al. “Stable Image Acquisition for Mobile Image Processing Applications.” IST/SPIE Electronic Imaging 2015, Digital Photography and Mobile Imaging XI, SPIE, 2015, pp. 1–12, doi:10.1117/12.2076146.","ufg":"Henning, Kai-Fabian et. al. (2015): Stable Image Acquisition for Mobile Image Processing Applications, in: IST/SPIE Electronic Imaging 2015, Digital Photography and Mobile Imaging XI, San Francisco, CA, USA, S. 1–12.","van":"Henning K-F, Fritze A, Gillich E, Mönks U, Lohweg V. Stable Image Acquisition for Mobile Image Processing Applications. In: IST/SPIE Electronic Imaging 2015, Digital Photography and Mobile Imaging XI. San Francisco, CA, USA: SPIE; 2015. p. 1–12.","chicago":"Henning, Kai-Fabian, Alexander Fritze, Eugen Gillich, Uwe Mönks, and Volker Lohweg. “Stable Image Acquisition for Mobile Image Processing Applications.” In IST/SPIE Electronic Imaging 2015, Digital Photography and Mobile Imaging XI, 1–12. San Francisco, CA, USA: SPIE, 2015. https://doi.org/10.1117/12.2076146.","apa":"Henning, K.-F., Fritze, A., Gillich, E., Mönks, U., & Lohweg, V. (2015). Stable Image Acquisition for Mobile Image Processing Applications. In IST/SPIE Electronic Imaging 2015, Digital Photography and Mobile Imaging XI (pp. 1–12). San Francisco, CA, USA: SPIE. https://doi.org/10.1117/12.2076146","ama":"Henning K-F, Fritze A, Gillich E, Mönks U, Lohweg V. Stable Image Acquisition for Mobile Image Processing Applications. In: IST/SPIE Electronic Imaging 2015, Digital Photography and Mobile Imaging XI. San Francisco, CA, USA: SPIE; 2015:1-12. doi:10.1117/12.2076146","ieee":"K.-F. Henning, A. Fritze, E. Gillich, U. Mönks, and V. Lohweg, “Stable Image Acquisition for Mobile Image Processing Applications,” in IST/SPIE Electronic Imaging 2015, Digital Photography and Mobile Imaging XI, 2015, pp. 1–12."}},{"publisher":"SPIE","page":"1-12","status":"public","department":[{"_id":"DEP5023"}],"author":[{"full_name":"Gillich, Eugen","id":"1706","first_name":"Eugen","last_name":"Gillich"},{"last_name":"Dörksen","first_name":"Helene","full_name":"Dörksen, Helene","id":"46416"},{"id":"1804","first_name":"Volker","last_name":"Lohweg","full_name":"Lohweg, Volker","orcid":"0000-0002-3325-7887"}],"year":2015,"citation":{"short":"E. Gillich, H. Dörksen, V. Lohweg, in: IST/SPIE Electronic Imaging 2015, Image Processing: Machine Vision Applications VIII, SPIE, San Francisco, CA, USA, 2015, pp. 1–12.","din1505-2-1":"Gillich, Eugen ; Dörksen, Helene ; Lohweg, Volker: Advanced Color Processing for Mobile Devices . In: IST/SPIE Electronic Imaging 2015, Image Processing: Machine Vision Applications VIII. San Francisco, CA, USA : SPIE, 2015, S. 1–12","chicago-de":"Gillich, Eugen, Helene Dörksen und Volker Lohweg. 2015. Advanced Color Processing for Mobile Devices . In: IST/SPIE Electronic Imaging 2015, Image Processing: Machine Vision Applications VIII, 1–12. San Francisco, CA, USA: SPIE.","apa":"Gillich, E., Dörksen, H., & Lohweg, V. (2015). Advanced Color Processing for Mobile Devices . In IST/SPIE Electronic Imaging 2015, Image Processing: Machine Vision Applications VIII (pp. 1–12). San Francisco, CA, USA: SPIE.","chicago":"Gillich, Eugen, Helene Dörksen, and Volker Lohweg. “Advanced Color Processing for Mobile Devices .” In IST/SPIE Electronic Imaging 2015, Image Processing: Machine Vision Applications VIII, 1–12. San Francisco, CA, USA: SPIE, 2015.","van":"Gillich E, Dörksen H, Lohweg V. Advanced Color Processing for Mobile Devices . In: IST/SPIE Electronic Imaging 2015, Image Processing: Machine Vision Applications VIII. 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The analysis and diagnosis of such systems is a major part of this trend: Plants should detect automatically wear, faults and suboptimal configurations. This paper reflects the current state-of- the-art in diagnosis against the requirements of CPPSs, identifies three main gaps and gives application scenarios to outline first ideas for potential solutions to close these gaps.\r\n"}],"citation":{"ama":"Niggemann O, Lohweg V. On the Diagnosis of Cyber-Physical Production Systems - State-of-the-Art and Research Agenda. In: Twenty-Ninth Conference on Artificial Intelligence (AAAI-15). Austin, Texas, USA; 2015.","ieee":"O. Niggemann and V. Lohweg, “On the Diagnosis of Cyber-Physical Production Systems - State-of-the-Art and Research Agenda,” in Twenty-Ninth Conference on Artificial Intelligence (AAAI-15), 2015.","din1505-2-1":"Niggemann, Oliver ; Lohweg, Volker: On the Diagnosis of Cyber-Physical Production Systems - State-of-the-Art and Research Agenda. 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In this paper, a new assisted design methodology for sensor and information fusion systems is proposed. It is based on an innovative system architecture consisting of the information fusion system itself, intelligent adaptable sensors, and the communication architecture of the \"Intelligent Technical Systems OstWestfalenLippe\" (it's OWL) Leading-Edge Cluster project \"Intelligent Networking\" providing an intelligent network for self-configuration and the required real-time data exchange.","lang":"eng"}],"publication_status":"published","series_title":"Procedia Technology","place":"Bremen","_id":"2146","doi":"https://doi.org/10.1016/j.protcy.2014.09.032","user_id":"45673","intvolume":" 15","type":"conference"},{"language":[{"iso":"eng"}],"_id":"2147","date_created":"2019-12-04T09:53:46Z","type":"conference","user_id":"45673","date_updated":"2023-03-15T13:49:39Z","year":2014,"author":[{"first_name":"Eugen","id":"1706","last_name":"Gillich","full_name":"Gillich, Eugen"},{"id":"46416","first_name":"Helene","last_name":"Dörksen","full_name":"Dörksen, Helene"},{"first_name":"Volker","id":"1804","full_name":"Lohweg, Volker","last_name":"Lohweg","orcid":"0000-0002-3325-7887"}],"department":[{"_id":"DEP5023"}],"status":"public","title":"Generation of robust optical paths – Color Processing for Mobile Devices. 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These are physical processing systems equipped with sensory devices which interconnect over communication networks for distributed cognitive information processing applications. Cyber-physical systems are generally limited in computational resources. Due to this fact, signal processing algorithms cannot be implemented one-to-one. Instead, efforts must be spent in algorithm optimisation towards resource efficiency and reduced computational complexity. In this contribution, we present our optimisation approach by matrix decomposition of an evidence-based conflict-reducing fusion approach which after optimisation is applicable in resource-limited devices for cognitive signal processing. We evaluate the results by comparison with the algorithm's original definition and show the improvements achieved. 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Lohweg, “Intelligente Vernetzung für Industrie 4.0,” in Norddeutsche Produktionstage 2014, Campus Universität Bremen (eingeladener Vortrag), Bremen, 2014.","ama":"Lohweg V. Intelligente Vernetzung für Industrie 4.0. In: Norddeutsche Produktionstage 2014, Campus Universität Bremen (Eingeladener Vortrag), Bremen,. ; 2014.","din1505-2-1":"Lohweg, Volker: Intelligente Vernetzung für Industrie 4.0. In: Norddeutsche Produktionstage 2014, Campus Universität Bremen (eingeladener Vortrag), Bremen,, 2014","chicago-de":"Lohweg, Volker. 2014. Intelligente Vernetzung für Industrie 4.0. In: Norddeutsche Produktionstage 2014, Campus Universität Bremen (eingeladener Vortrag), Bremen,.","short":"V. Lohweg, in: Norddeutsche Produktionstage 2014, Campus Universität Bremen (Eingeladener Vortrag), Bremen, 2014.","chicago":"Lohweg, Volker. “Intelligente Vernetzung Für Industrie 4.0.” In Norddeutsche Produktionstage 2014, Campus Universität Bremen (Eingeladener Vortrag), Bremen, 2014.","apa":"Lohweg, V. (2014). Intelligente Vernetzung für Industrie 4.0. In Norddeutsche Produktionstage 2014, Campus Universität Bremen (eingeladener Vortrag), Bremen,.","ufg":"Lohweg, Volker (2014): Intelligente Vernetzung für Industrie 4.0, in: Norddeutsche Produktionstage 2014, Campus Universität Bremen (eingeladener Vortrag), Bremen,.","bjps":"Lohweg V (2014) Intelligente Vernetzung Für Industrie 4.0. Norddeutsche Produktionstage 2014, Campus Universität Bremen (Eingeladener Vortrag), Bremen,.","mla":"Lohweg, Volker. “Intelligente Vernetzung Für Industrie 4.0.” Norddeutsche Produktionstage 2014, Campus Universität Bremen (Eingeladener Vortrag), Bremen, 2014.","havard":"V. Lohweg, Intelligente Vernetzung für Industrie 4.0, in: Norddeutsche Produktionstage 2014, Campus Universität Bremen (Eingeladener Vortrag), Bremen, 2014.","van":"Lohweg V. Intelligente Vernetzung für Industrie 4.0. In: Norddeutsche Produktionstage 2014, Campus Universität Bremen (eingeladener Vortrag), Bremen,. 2014."},"title":"Intelligente Vernetzung für Industrie 4.0"},{"type":"conference","date_created":"2019-12-04T10:16:11Z","publication_identifier":{"isbn":[" 978-1-4799-4845-1"]},"publication":"Proceedings of the 2014 IEEE Emerging Technology and Factory Automation (ETFA)","date_updated":"2023-03-15T13:49:39Z","user_id":"68554","doi":"10.1109/etfa.2014.7005264","_id":"2159","language":[{"iso":"eng"}],"title":"Condition monitoring for hazardous material storage","publication_status":"published","citation":{"ieee":"J.-F. Ehlenbröker, U. Mönks, D. Wesemann, and V. Lohweg, “Condition monitoring for hazardous material storage,” in Proceedings of the 2014 IEEE Emerging Technology and Factory Automation (ETFA), 2014.","apa":"Ehlenbröker, J.-F., Mönks, U., Wesemann, D., & Lohweg, V. (2014). Condition monitoring for hazardous material storage. In Proceedings of the 2014 IEEE Emerging Technology and Factory Automation (ETFA). https://doi.org/10.1109/etfa.2014.7005264","chicago":"Ehlenbröker, Jan-Friedrich, Uwe Mönks, Derk Wesemann, and Volker Lohweg. “Condition Monitoring for Hazardous Material Storage.” In Proceedings of the 2014 IEEE Emerging Technology and Factory Automation (ETFA), 2014. https://doi.org/10.1109/etfa.2014.7005264.","ama":"Ehlenbröker J-F, Mönks U, Wesemann D, Lohweg V. Condition monitoring for hazardous material storage. In: Proceedings of the 2014 IEEE Emerging Technology and Factory Automation (ETFA). ; 2014. doi:10.1109/etfa.2014.7005264","van":"Ehlenbröker J-F, Mönks U, Wesemann D, Lohweg V. Condition monitoring for hazardous material storage. In: Proceedings of the 2014 IEEE Emerging Technology and Factory Automation (ETFA). 2014.","mla":"Ehlenbröker, Jan-Friedrich, et al. “Condition Monitoring for Hazardous Material Storage.” Proceedings of the 2014 IEEE Emerging Technology and Factory Automation (ETFA), 2014, doi:10.1109/etfa.2014.7005264.","bjps":"Ehlenbröker J-F et al. (2014) Condition Monitoring for Hazardous Material Storage. Proceedings of the 2014 IEEE Emerging Technology and Factory Automation (ETFA).","havard":"J.-F. Ehlenbröker, U. Mönks, D. Wesemann, V. Lohweg, Condition monitoring for hazardous material storage, in: Proceedings of the 2014 IEEE Emerging Technology and Factory Automation (ETFA), 2014.","ufg":"Ehlenbröker, Jan-Friedrich et. al. (2014): Condition monitoring for hazardous material storage, in: Proceedings of the 2014 IEEE Emerging Technology and Factory Automation (ETFA).","short":"J.-F. Ehlenbröker, U. Mönks, D. Wesemann, V. Lohweg, in: Proceedings of the 2014 IEEE Emerging Technology and Factory Automation (ETFA), 2014.","din1505-2-1":"Ehlenbröker, Jan-Friedrich ; Mönks, Uwe ; Wesemann, Derk ; Lohweg, Volker: Condition monitoring for hazardous material storage. In: Proceedings of the 2014 IEEE Emerging Technology and Factory Automation (ETFA), 2014","chicago-de":"Ehlenbröker, Jan-Friedrich, Uwe Mönks, Derk Wesemann und Volker Lohweg. 2014. Condition monitoring for hazardous material storage. In: Proceedings of the 2014 IEEE Emerging Technology and Factory Automation (ETFA). doi:10.1109/etfa.2014.7005264, ."},"abstract":[{"lang":"eng","text":"In this contribution we show enhancements of the safety of hazardous material stores by the usage of a condition monitoring system. Hazardous material stores function as a store for dangerous chemicals. We use fire simulations to simulate a fire and use the results of this simulation in our condition monitoring system in order to show the attainable gains. The used condition monitoring system utilises multiple sensors which are distributed inside and outside of the hazardous material store. The values of the sensors are combined over multiple levels into one state for the complete system. This allows us to significantly enhance the detection time of dangerous operating states, compared to the use of dedicated single sensors."}],"department":[{"_id":"DEP5023"}],"year":2014,"author":[{"last_name":"Ehlenbröker","full_name":"Ehlenbröker, Jan-Friedrich","id":"1852","first_name":"Jan-Friedrich"},{"last_name":"Mönks","first_name":"Uwe","full_name":"Mönks, Uwe","id":"1825"},{"last_name":"Wesemann","first_name":"Derk","id":"1273","full_name":"Wesemann, Derk"},{"first_name":"Volker","id":"1804","last_name":"Lohweg","full_name":"Lohweg, Volker","orcid":"0000-0002-3325-7887"}],"status":"public"},{"abstract":[{"text":"We present a new approach for linear classification optimisation based on Combinatorial Refinement (ComRef) of feature weighting for cognitive signal processing in resource-limited hardware and software like in Cyber-physical systems. Despite simple construction, the approach is able to connect advantages of dimensionality reduction methods and such like combining multiple classifiers resp. Bag-of-classifiers-approaches and leads to a good generalisation ability even by use of small feature sets. Regarding generalisation ability, we benchmark the performance of ComRef on several datasets from the UCI repository. Furthermore, for an industrial dataset Motor Drive Diagnosis we show the advantage of ComRef which uses Support-Vector-Machines (SVM). In this application scenario, a trustful classifier is essential, since a small number of mis-classifications could lead to motor damages.","lang":"eng"}],"year":2014,"main_file_link":[{"url":"https://ieeexplore.ieee.org/document/7005106"}],"author":[{"full_name":"Dörksen, Helene","first_name":"Helene","id":"46416","last_name":"Dörksen"},{"first_name":"Volker","last_name":"Lohweg","full_name":"Lohweg, Volker","id":"1804","orcid":"0000-0002-3325-7887"}],"department":[{"_id":"DEP5023"}],"publisher":"IEEE","status":"public","title":"Combinatorial refinement of feature weighting for linear classification","citation":{"ieee":"H. Dörksen and V. Lohweg, “Combinatorial refinement of feature weighting for linear classification,” in Proceedings of the 2014 IEEE Emerging Technology and Factory Automation (ETFA), 2014.","ama":"Dörksen H, Lohweg V. Combinatorial refinement of feature weighting for linear classification. In: Proceedings of the 2014 IEEE Emerging Technology and Factory Automation (ETFA). IEEE; 2014. doi:10.1109/ETFA.2014.7005106","apa":"Dörksen, H., & Lohweg, V. (2014). Combinatorial refinement of feature weighting for linear classification. In Proceedings of the 2014 IEEE Emerging Technology and Factory Automation (ETFA). IEEE. https://doi.org/10.1109/ETFA.2014.7005106","chicago":"Dörksen, Helene, and Volker Lohweg. “Combinatorial Refinement of Feature Weighting for Linear Classification.” In Proceedings of the 2014 IEEE Emerging Technology and Factory Automation (ETFA). IEEE, 2014. https://doi.org/10.1109/ETFA.2014.7005106.","van":"Dörksen H, Lohweg V. Combinatorial refinement of feature weighting for linear classification. In: Proceedings of the 2014 IEEE Emerging Technology and Factory Automation (ETFA). IEEE; 2014.","bjps":"Dörksen H and Lohweg V (2014) Combinatorial Refinement of Feature Weighting for Linear Classification. Proceedings of the 2014 IEEE Emerging Technology and Factory Automation (ETFA). IEEE.","mla":"Dörksen, Helene, and Volker Lohweg. “Combinatorial Refinement of Feature Weighting for Linear Classification.” Proceedings of the 2014 IEEE Emerging Technology and Factory Automation (ETFA), IEEE, 2014, doi:10.1109/ETFA.2014.7005106.","havard":"H. Dörksen, V. Lohweg, Combinatorial refinement of feature weighting for linear classification, in: Proceedings of the 2014 IEEE Emerging Technology and Factory Automation (ETFA), IEEE, 2014.","ufg":"Dörksen, Helene/Lohweg, Volker (2014): Combinatorial refinement of feature weighting for linear classification, in: Proceedings of the 2014 IEEE Emerging Technology and Factory Automation (ETFA).","short":"H. Dörksen, V. Lohweg, in: Proceedings of the 2014 IEEE Emerging Technology and Factory Automation (ETFA), IEEE, 2014.","din1505-2-1":"Dörksen, Helene ; Lohweg, Volker: Combinatorial refinement of feature weighting for linear classification. In: Proceedings of the 2014 IEEE Emerging Technology and Factory Automation (ETFA) : IEEE, 2014","chicago-de":"Dörksen, Helene und Volker Lohweg. 2014. Combinatorial refinement of feature weighting for linear classification. In: Proceedings of the 2014 IEEE Emerging Technology and Factory Automation (ETFA). IEEE. doi:10.1109/ETFA.2014.7005106, ."},"publication_status":"published","_id":"2160","doi":"10.1109/ETFA.2014.7005106","language":[{"iso":"eng"}],"publication_identifier":{"isbn":["978-1-4799-4845-1"]},"publication":"Proceedings of the 2014 IEEE Emerging Technology and Factory Automation (ETFA)","date_created":"2019-12-04T10:17:31Z","type":"conference","user_id":"68554","date_updated":"2023-03-15T13:49:39Z"},{"publication":"19th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA) Barcelona","date_created":"2019-12-04T10:18:42Z","type":"conference","user_id":"45673","date_updated":"2023-03-15T13:49:39Z","_id":"2161","place":"Spain","language":[{"iso":"eng"}],"title":"Fast Classification in Industrial Big Data Environments","citation":{"mla":"Dörksen, Helene, et al. “Fast Classification in Industrial Big Data Environments.” 19th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA) Barcelona, 2014.","havard":"H. Dörksen, U. Mönks, V. Lohweg, Fast Classification in Industrial Big Data Environments, in: 19th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA) Barcelona, Spain, 2014.","bjps":"Dörksen H, Mönks U and Lohweg V (2014) Fast Classification in Industrial Big Data Environments. 19th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA) Barcelona. Spain.","ufg":"Dörksen, Helene et. al. (2014): Fast Classification in Industrial Big Data Environments, in: 19th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA) Barcelona, Spain.","ama":"Dörksen H, Mönks U, Lohweg V. Fast Classification in Industrial Big Data Environments. In: 19th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA) Barcelona. Spain; 2014.","van":"Dörksen H, Mönks U, Lohweg V. Fast Classification in Industrial Big Data Environments. In: 19th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA) Barcelona. Spain; 2014.","chicago":"Dörksen, Helene, Uwe Mönks, and Volker Lohweg. “Fast Classification in Industrial Big Data Environments.” In 19th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA) Barcelona. Spain, 2014.","ieee":"H. Dörksen, U. Mönks, and V. Lohweg, “Fast Classification in Industrial Big Data Environments,” in 19th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA) Barcelona, 2014.","apa":"Dörksen, H., Mönks, U., & Lohweg, V. (2014). Fast Classification in Industrial Big Data Environments. In 19th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA) Barcelona. Spain.","chicago-de":"Dörksen, Helene, Uwe Mönks und Volker Lohweg. 2014. Fast Classification in Industrial Big Data Environments. In: 19th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA) Barcelona. Spain.","din1505-2-1":"Dörksen, Helene ; Mönks, Uwe ; Lohweg, Volker: Fast Classification in Industrial Big Data Environments. In: 19th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA) Barcelona. Spain, 2014","short":"H. Dörksen, U. Mönks, V. Lohweg, in: 19th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA) Barcelona, Spain, 2014."},"author":[{"first_name":"Helene","last_name":"Dörksen","full_name":"Dörksen, Helene","id":"46416"},{"full_name":"Mönks, Uwe","last_name":"Mönks","id":"1825","first_name":"Uwe"},{"orcid":"0000-0002-3325-7887","full_name":"Lohweg, Volker","last_name":"Lohweg","id":"1804","first_name":"Volker"}],"year":2014,"department":[{"_id":"DEP5023"}],"status":"public"},{"_id":"2162","place":"Lemgo","language":[{"iso":"eng"}],"publication":"Bildverarbeitung in der Automation 2014","type":"conference","date_created":"2019-12-04T10:19:50Z","user_id":"45673","date_updated":"2023-03-15T13:49:39Z","abstract":[{"lang":"ger","text":"Das 4. Jahreskolloquium „Bildverarbeitung in der Automation (BVAu 2014)“ ist ein Forum für Wissenschaft und Industrie im deutschsprachigen Raum für alle technisch/wissenschaftlichen Fragestellungen rund um die industrielle Bildverarbeitung und Mustererkennung.Die industrielle Bildverarbeitung und Mustererkennung ist eine der Schlüsseltechnologien für die Produkte von morgen sowie die Basis „intelligenter“ Qualitätssicherungssysteme in produzierenden Unternehmen. Interdisziplinäre Ansätze aus Technik, Biologie und Psychologie ermöglichen neue zukunftsweisende Lösungen. Durch den vermehrten Einsatz von Bildverarbeitung ergeben sich neue Möglichkeiten in rasanter Geschwindigkeit, gleichzeitig aber auch neue zu lösende Herausforderungen. Insbesondere in Bezug auf Industrie-4.0-Aspekte steht die industrielle Bildverarbeitung als Schlüsseltechnologie vor neuen Herausforderungen, die in den nächsten Jahren zu bewältigen sind. Dazu gehören unter anderem: kostengünstige Systeme, die massentauglich sind; schnelle Adaptierbarbeit in beliebige Systeme; intelligente Kameras, die leistungsfähig sind, usw.Die beiden Forschungseinrichtungen GET Lab – Technische kognitive Systeme der Universität Paderborn und inIT – Institut für industrielle Informationstechnik der Hochschule OWL widmen diesem wichtigen Fachgebiet das seit 2010 stattfindende Jahreskolloquium „Bildverarbeitung in der Automation (BVAu)“ im Rahmen der Initiative Industrielle Bildverarbeitung OWL.Die Veranstaltungsreihe, die wechselnd in Lemgo und Paderborn stattfindet, weist einen klaren aktuellen fachlichen Fokus und eine entsprechende Detailtiefe auf. Hierzu vermitteln sieben Fachbeiträge und zwei Keynotes aus Industrie und Wissenschaft einen guten Überblick zum momentanen Stand der Technik und zu aktuellen Innovationen in den Bereichen Technical Aspects of Vision Systems, Practical Image Processing und Algorithmic Approaches to Image Processing.Wir möchten uns an dieser Stelle bei allen Autoren und Koautoren für ihre qualitativ hochwertigen Beiträge bedanken. Außerdem geht ein herzliches Dankeschön an die Mitglieder des Programm- und Organisationskomitees für ihr Engagement."}],"author":[{"last_name":"Lohweg","full_name":"Lohweg, Volker","id":"1804","first_name":"Volker","orcid":"0000-0002-3325-7887"},{"first_name":"Bärbel","last_name":"Mertsching","full_name":"Mertsching, Bärbel"}],"year":2014,"department":[{"_id":"DEP5023"}],"publisher":"inIT-Schriftenreihe, ISBN 978-3-9814062-5-2","status":"public","title":"4. Jahreskolloquium Bildverarbeitung in der Automation 2014 (BVAu2014)","citation":{"van":"Lohweg V, Mertsching B. 4. Jahreskolloquium Bildverarbeitung in der Automation 2014 (BVAu2014). In: Bildverarbeitung in der Automation 2014. Lemgo: inIT-Schriftenreihe, ISBN 978-3-9814062-5-2; 2014.","mla":"Lohweg, Volker, and Bärbel Mertsching. “4. Jahreskolloquium Bildverarbeitung in Der Automation 2014 (BVAu2014).” Bildverarbeitung in Der Automation 2014, inIT-Schriftenreihe, ISBN 978-3-9814062-5-2, 2014.","havard":"V. Lohweg, B. Mertsching, 4. Jahreskolloquium Bildverarbeitung in der Automation 2014 (BVAu2014), in: Bildverarbeitung in Der Automation 2014, inIT-Schriftenreihe, ISBN 978-3-9814062-5-2, Lemgo, 2014.","bjps":"Lohweg V and Mertsching B (2014) 4. Jahreskolloquium Bildverarbeitung in Der Automation 2014 (BVAu2014). Bildverarbeitung in Der Automation 2014. Lemgo: inIT-Schriftenreihe, ISBN 978-3-9814062-5-2.","ufg":"Lohweg, Volker/Mertsching, Bärbel (2014): 4. Jahreskolloquium Bildverarbeitung in der Automation 2014 (BVAu2014), in: Bildverarbeitung in der Automation 2014, Lemgo.","apa":"Lohweg, V., & Mertsching, B. (2014). 4. Jahreskolloquium Bildverarbeitung in der Automation 2014 (BVAu2014). In Bildverarbeitung in der Automation 2014. Lemgo: inIT-Schriftenreihe, ISBN 978-3-9814062-5-2.","chicago":"Lohweg, Volker, and Bärbel Mertsching. “4. Jahreskolloquium Bildverarbeitung in Der Automation 2014 (BVAu2014).” In Bildverarbeitung in Der Automation 2014. Lemgo: inIT-Schriftenreihe, ISBN 978-3-9814062-5-2, 2014.","short":"V. Lohweg, B. Mertsching, in: Bildverarbeitung in Der Automation 2014, inIT-Schriftenreihe, ISBN 978-3-9814062-5-2, Lemgo, 2014.","din1505-2-1":"Lohweg, Volker ; Mertsching, Bärbel: 4. Jahreskolloquium Bildverarbeitung in der Automation 2014 (BVAu2014). In: Bildverarbeitung in der Automation 2014. Lemgo : inIT-Schriftenreihe, ISBN 978-3-9814062-5-2, 2014","chicago-de":"Lohweg, Volker und Bärbel Mertsching. 2014. 4. Jahreskolloquium Bildverarbeitung in der Automation 2014 (BVAu2014). In: Bildverarbeitung in der Automation 2014. Lemgo: inIT-Schriftenreihe, ISBN 978-3-9814062-5-2.","ama":"Lohweg V, Mertsching B. 4. Jahreskolloquium Bildverarbeitung in der Automation 2014 (BVAu2014). In: Bildverarbeitung in Der Automation 2014. Lemgo: inIT-Schriftenreihe, ISBN 978-3-9814062-5-2; 2014.","ieee":"V. Lohweg and B. Mertsching, “4. Jahreskolloquium Bildverarbeitung in der Automation 2014 (BVAu2014),” in Bildverarbeitung in der Automation 2014, 2014."}},{"title":"Occlusion Detection for Textured 2D-Objects on a Heap ","citation":{"van":"Henning K-F, Lohweg V. Occlusion Detection for Textured 2D-Objects on a Heap . In: BVAu 2014 - Bildverarbeitung für die Automation. Lemgo, Germany: inIT - Lemgoer Schriftenreihe; 2014. p. 1–8.","ufg":"Henning, Kai-Fabian/Lohweg, Volker (2014): Occlusion Detection for Textured 2D-Objects on a Heap , in: BVAu 2014 - Bildverarbeitung für die Automation, Lemgo, Germany, S. 1–8.","bjps":"Henning K-F and Lohweg V (2014) Occlusion Detection for Textured 2D-Objects on a Heap . BVAu 2014 - Bildverarbeitung Für Die Automation. Lemgo, Germany: inIT - Lemgoer Schriftenreihe, pp. 1–8.","havard":"K.-F. Henning, V. Lohweg, Occlusion Detection for Textured 2D-Objects on a Heap , in: BVAu 2014 - Bildverarbeitung Für Die Automation, inIT - Lemgoer Schriftenreihe, Lemgo, Germany, 2014: pp. 1–8.","mla":"Henning, Kai-Fabian, and Volker Lohweg. “Occlusion Detection for Textured 2D-Objects on a Heap .” BVAu 2014 - Bildverarbeitung Für Die Automation, inIT - Lemgoer Schriftenreihe, 2014, pp. 1–8.","apa":"Henning, K.-F., & Lohweg, V. (2014). Occlusion Detection for Textured 2D-Objects on a Heap . In BVAu 2014 - Bildverarbeitung für die Automation (pp. 1–8). Lemgo, Germany: inIT - Lemgoer Schriftenreihe.","chicago":"Henning, Kai-Fabian, and Volker Lohweg. “Occlusion Detection for Textured 2D-Objects on a Heap .” In BVAu 2014 - Bildverarbeitung Für Die Automation, 1–8. Lemgo, Germany: inIT - Lemgoer Schriftenreihe, 2014.","short":"K.-F. Henning, V. Lohweg, in: BVAu 2014 - Bildverarbeitung Für Die Automation, inIT - Lemgoer Schriftenreihe, Lemgo, Germany, 2014, pp. 1–8.","chicago-de":"Henning, Kai-Fabian und Volker Lohweg. 2014. Occlusion Detection for Textured 2D-Objects on a Heap . In: BVAu 2014 - Bildverarbeitung für die Automation, 1–8. Lemgo, Germany: inIT - Lemgoer Schriftenreihe.","din1505-2-1":"Henning, Kai-Fabian ; Lohweg, Volker: Occlusion Detection for Textured 2D-Objects on a Heap . In: BVAu 2014 - Bildverarbeitung für die Automation. Lemgo, Germany : inIT - Lemgoer Schriftenreihe, 2014, S. 1–8","ama":"Henning K-F, Lohweg V. Occlusion Detection for Textured 2D-Objects on a Heap . In: BVAu 2014 - Bildverarbeitung Für Die Automation. Lemgo, Germany: inIT - Lemgoer Schriftenreihe; 2014:1-8.","ieee":"K.-F. Henning and V. Lohweg, “Occlusion Detection for Textured 2D-Objects on a Heap ,” in BVAu 2014 - Bildverarbeitung für die Automation, 2014, pp. 1–8."},"department":[{"_id":"DEP5023"}],"author":[{"first_name":"Kai-Fabian","last_name":"Henning","full_name":"Henning, Kai-Fabian","id":"44017"},{"orcid":"0000-0002-3325-7887","last_name":"Lohweg","first_name":"Volker","id":"1804","full_name":"Lohweg, Volker"}],"year":2014,"publisher":"inIT - Lemgoer Schriftenreihe","page":"1-8","status":"public","type":"conference","date_created":"2019-12-04T10:21:01Z","publication":"BVAu 2014 - Bildverarbeitung für die Automation","date_updated":"2023-03-15T13:49:39Z","user_id":"45673","_id":"2163","language":[{"iso":"eng"}],"place":"Lemgo, Germany"},{"_id":"2164","place":"Dortmund","language":[{"iso":"ger"}],"oa":"1","user_id":"45673","date_updated":"2023-03-15T13:49:39Z","publication_identifier":{"isbn":["978-3-7315-0275-3"]},"publication":"24. Workshop Computational Intelligence","date_created":"2019-12-04T10:23:15Z","type":"conference","publisher":"VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA)","status":"public","page":"315-332","author":[{"last_name":"Neumann","first_name":"Richard","full_name":"Neumann, Richard"},{"full_name":"Dicks, Alexander","id":"1853","last_name":"Dicks","first_name":"Alexander"},{"full_name":"Mönks, Uwe","first_name":"Uwe","id":"1825","last_name":"Mönks"},{"orcid":"0000-0002-3325-7887","last_name":"Lohweg","first_name":"Volker","full_name":"Lohweg, Volker","id":"1804"}],"year":2014,"main_file_link":[{"open_access":"1","url":"https://publikationen.bibliothek.kit.edu/1000043427/3301103"}],"department":[{"_id":"DEP5023"}],"citation":{"short":"R. Neumann, A. Dicks, U. Mönks, V. Lohweg, in: 24. Workshop Computational Intelligence, VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA), Dortmund, 2014, pp. 315–332.","din1505-2-1":"Neumann, Richard ; Dicks, Alexander ; Mönks, Uwe ; Lohweg, Volker: Fuzzy Pattern Klassifikation von Datensätzen mit nichtkonvexen Objektmorphologien. In: 24. Workshop Computational Intelligence. Dortmund : VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA), 2014, S. 315–332","chicago-de":"Neumann, Richard, Alexander Dicks, Uwe Mönks und Volker Lohweg. 2014. Fuzzy Pattern Klassifikation von Datensätzen mit nichtkonvexen Objektmorphologien. In: 24. Workshop Computational Intelligence, 315–332. Dortmund: VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA).","apa":"Neumann, R., Dicks, A., Mönks, U., & Lohweg, V. (2014). Fuzzy Pattern Klassifikation von Datensätzen mit nichtkonvexen Objektmorphologien. In 24. Workshop Computational Intelligence (pp. 315–332). Dortmund: VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA).","chicago":"Neumann, Richard, Alexander Dicks, Uwe Mönks, and Volker Lohweg. “Fuzzy Pattern Klassifikation von Datensätzen mit nichtkonvexen Objektmorphologien.” In 24. Workshop Computational Intelligence, 315–32. Dortmund: VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA), 2014.","van":"Neumann R, Dicks A, Mönks U, Lohweg V. Fuzzy Pattern Klassifikation von Datensätzen mit nichtkonvexen Objektmorphologien. In: 24 Workshop Computational Intelligence. Dortmund: VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA); 2014. p. 315–32.","ufg":"Neumann, Richard et. al. (2014): Fuzzy Pattern Klassifikation von Datensätzen mit nichtkonvexen Objektmorphologien, in: 24. Workshop Computational Intelligence, Dortmund, S. 315–332.","havard":"R. Neumann, A. Dicks, U. Mönks, V. Lohweg, Fuzzy Pattern Klassifikation von Datensätzen mit nichtkonvexen Objektmorphologien, in: 24. Workshop Computational Intelligence, VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA), Dortmund, 2014: pp. 315–332.","bjps":"Neumann R et al. (2014) Fuzzy Pattern Klassifikation von Datensätzen mit nichtkonvexen Objektmorphologien. 24. Workshop Computational Intelligence. Dortmund: VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA), pp. 315–332.","mla":"Neumann, Richard, et al. “Fuzzy Pattern Klassifikation von Datensätzen mit nichtkonvexen Objektmorphologien.” 24. Workshop Computational Intelligence, VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA), 2014, pp. 315–32.","ieee":"R. Neumann, A. Dicks, U. Mönks, and V. Lohweg, “Fuzzy Pattern Klassifikation von Datensätzen mit nichtkonvexen Objektmorphologien,” in 24. Workshop Computational Intelligence, 2014, pp. 315–332.","ama":"Neumann R, Dicks A, Mönks U, Lohweg V. Fuzzy Pattern Klassifikation von Datensätzen mit nichtkonvexen Objektmorphologien. In: 24. Workshop Computational Intelligence. Dortmund: VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA); 2014:315-332."},"publication_status":"published","title":"Fuzzy Pattern Klassifikation von Datensätzen mit nichtkonvexen Objektmorphologien"},{"status":"public","page":"277-298","publisher":"VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA)","main_file_link":[{"url":"https://publikationen.bibliothek.kit.edu/1000043427/3301103","open_access":"1"}],"year":2014,"author":[{"last_name":"Deppe","full_name":"Deppe, Sahar","id":"52121","first_name":"Sahar"},{"first_name":"Volker","full_name":"Lohweg, Volker","last_name":"Lohweg","id":"1804","orcid":"0000-0002-3325-7887"}],"department":[{"_id":"DEP5023"}],"citation":{"chicago-de":"Deppe, Sahar und Volker Lohweg. 2014. Identification of Multi-Scale Motifs. In: 24. Workshop Computational Intelligence, 277–298. Dortmund: VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA).","din1505-2-1":"Deppe, Sahar ; Lohweg, Volker: Identification of Multi-Scale Motifs. In: 24. Workshop Computational Intelligence. Dortmund : VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA), 2014, S. 277–298","short":"S. Deppe, V. Lohweg, in: 24. Workshop Computational Intelligence, VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA), Dortmund, 2014, pp. 277–298.","chicago":"Deppe, Sahar, and Volker Lohweg. “Identification of Multi-Scale Motifs.” In 24. Workshop Computational Intelligence, 277–98. Dortmund: VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA), 2014.","apa":"Deppe, S., & Lohweg, V. (2014). Identification of Multi-Scale Motifs. In 24. Workshop Computational Intelligence (pp. 277–298). Dortmund: VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA).","ufg":"Deppe, Sahar/Lohweg, Volker (2014): Identification of Multi-Scale Motifs, in: 24. Workshop Computational Intelligence, Dortmund, S. 277–298.","bjps":"Deppe S and Lohweg V (2014) Identification of Multi-Scale Motifs. 24. Workshop Computational Intelligence. Dortmund: VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA), pp. 277–298.","havard":"S. Deppe, V. Lohweg, Identification of Multi-Scale Motifs, in: 24. Workshop Computational Intelligence, VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA), Dortmund, 2014: pp. 277–298.","mla":"Deppe, Sahar, and Volker Lohweg. “Identification of Multi-Scale Motifs.” 24. Workshop Computational Intelligence, VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA), 2014, pp. 277–98.","van":"Deppe S, Lohweg V. Identification of Multi-Scale Motifs. In: 24 Workshop Computational Intelligence. Dortmund: VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA); 2014. p. 277–98.","ieee":"S. Deppe and V. Lohweg, “Identification of Multi-Scale Motifs,” in 24. Workshop Computational Intelligence, 2014, pp. 277–298.","ama":"Deppe S, Lohweg V. Identification of Multi-Scale Motifs. In: 24. Workshop Computational Intelligence. Dortmund: VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA); 2014:277-298."},"publication_status":"published","title":"Identification of Multi-Scale Motifs","place":"Dortmund","language":[{"iso":"eng"}],"_id":"2165","oa":"1","user_id":"45673","date_updated":"2023-03-15T13:49:39Z","publication_identifier":{"isbn":["978-3-7315-0275-3"]},"publication":"24. Workshop Computational Intelligence","date_created":"2019-12-04T10:25:35Z","type":"conference"},{"doi":"https://doi.org/10.1117/12.2001444","_id":"2129","language":[{"iso":"eng"}],"place":"San Francisco, USA","date_created":"2019-12-04T09:08:30Z","type":"conference","publication":"Media Watermarking, Security, and Forensics 2013","date_updated":"2023-03-15T13:49:38Z","user_id":"45673","abstract":[{"lang":"eng","text":"Maintaining confidence in security documents, especially banknotes, is and remains a major concern for the central banks in order to maintain the stability of the economy around the world. In this paper we describe an image processing and pattern recognition approach which is based on the Sound-of-Intaglio principle for the usage in smart devices such as smartphones. Today, in many world regions smartphones are in use. These devices become more and more computing units, equipped with resource-limited, but effective CPUs, cameras with illumination, and flexible operating systems. Hence, it is obvious to apply smartphones for banknote authentication, especially for visually impaired persons. Our approach shows that those devices are capable of processing data under the constraints of image quality and processing power. Strictly a mobile device as such is not an industrial product for harsh environments, but it is possible to use mobile devices for banknote authentication. The concept is based on a new strategy for constructing adaptive Wavelets for the analysis of different print patterns on a banknote. Furthermore, a banknote specific feature vector is generated which describes an authentic banknote effectively under various illumination conditions. A multi-stage Lineardiscriminant- analysis classifier generates stable and reliable output."}],"department":[{"_id":"DEP5023"}],"author":[{"first_name":"Volker","id":"1804","full_name":"Lohweg, Volker","last_name":"Lohweg","orcid":"0000-0002-3325-7887"},{"full_name":"Dörksen, Helene","last_name":"Dörksen","first_name":"Helene","id":"46416"},{"first_name":"Jan Leif","full_name":"Hoffmann, Jan Leif","id":"46243","last_name":"Hoffmann"},{"last_name":"Hildebrand","full_name":"Hildebrand, Roland","id":"1639","first_name":"Roland"},{"last_name":"Gillich","full_name":"Gillich, Eugen","id":"1706","first_name":"Eugen"},{"first_name":"Johannes","id":"2128","last_name":"Schaede","full_name":"Schaede, Johannes"},{"last_name":"Hofmann","full_name":"Hofmann, Jürg","first_name":"Jürg"}],"year":2013,"publisher":"(03-07.02.2013) IST/SPIE Electronic Imaging 2013","status":"public","title":"Banknote authentication with mobile devices","publication_status":"published","citation":{"havard":"V. Lohweg, H. Dörksen, J.L. Hoffmann, R. Hildebrand, E. Gillich, J. Schaede, J. Hofmann, Banknote authentication with mobile devices, in: Media Watermarking, Security, and Forensics 2013, (03-07.02.2013) IST/SPIE Electronic Imaging 2013, San Francisco, USA, 2013.","bjps":"Lohweg V et al. (2013) Banknote Authentication with Mobile Devices. Media Watermarking, Security, and Forensics 2013. San Francisco, USA: (03-07.02.2013) IST/SPIE Electronic Imaging 2013.","mla":"Lohweg, Volker, et al. “Banknote Authentication with Mobile Devices.” Media Watermarking, Security, and Forensics 2013, (03-07.02.2013) IST/SPIE Electronic Imaging 2013, 2013, doi:https://doi.org/10.1117/12.2001444.","ufg":"Lohweg, Volker et. al. (2013): Banknote authentication with mobile devices, in: Media Watermarking, Security, and Forensics 2013, San Francisco, USA.","van":"Lohweg V, Dörksen H, Hoffmann JL, Hildebrand R, Gillich E, Schaede J, et al. Banknote authentication with mobile devices. In: Media Watermarking, Security, and Forensics 2013. San Francisco, USA: (03-07.02.2013) IST/SPIE Electronic Imaging 2013; 2013.","chicago":"Lohweg, Volker, Helene Dörksen, Jan Leif Hoffmann, Roland Hildebrand, Eugen Gillich, Johannes Schaede, and Jürg Hofmann. “Banknote Authentication with Mobile Devices.” In Media Watermarking, Security, and Forensics 2013. San Francisco, USA: (03-07.02.2013) IST/SPIE Electronic Imaging 2013, 2013. https://doi.org/10.1117/12.2001444.","apa":"Lohweg, V., Dörksen, H., Hoffmann, J. L., Hildebrand, R., Gillich, E., Schaede, J., & Hofmann, J. (2013). Banknote authentication with mobile devices. In Media Watermarking, Security, and Forensics 2013. San Francisco, USA: (03-07.02.2013) IST/SPIE Electronic Imaging 2013. https://doi.org/10.1117/12.2001444","din1505-2-1":"Lohweg, Volker ; Dörksen, Helene ; Hoffmann, Jan Leif ; Hildebrand, Roland ; Gillich, Eugen ; Schaede, Johannes ; Hofmann, Jürg: Banknote authentication with mobile devices. In: Media Watermarking, Security, and Forensics 2013. San Francisco, USA : (03-07.02.2013) IST/SPIE Electronic Imaging 2013, 2013","chicago-de":"Lohweg, Volker, Helene Dörksen, Jan Leif Hoffmann, Roland Hildebrand, Eugen Gillich, Johannes Schaede und Jürg Hofmann. 2013. Banknote authentication with mobile devices. In: Media Watermarking, Security, and Forensics 2013. San Francisco, USA: (03-07.02.2013) IST/SPIE Electronic Imaging 2013. doi:https://doi.org/10.1117/12.2001444, .","short":"V. Lohweg, H. Dörksen, J.L. Hoffmann, R. Hildebrand, E. Gillich, J. Schaede, J. Hofmann, in: Media Watermarking, Security, and Forensics 2013, (03-07.02.2013) IST/SPIE Electronic Imaging 2013, San Francisco, USA, 2013.","ama":"Lohweg V, Dörksen H, Hoffmann JL, et al. Banknote authentication with mobile devices. In: Media Watermarking, Security, and Forensics 2013. San Francisco, USA: (03-07.02.2013) IST/SPIE Electronic Imaging 2013; 2013. doi:https://doi.org/10.1117/12.2001444","ieee":"V. Lohweg et al., “Banknote authentication with mobile devices,” in Media Watermarking, Security, and Forensics 2013, 2013."}},{"user_id":"45673","date_updated":"2023-03-15T13:49:39Z","publication":"Quality Engineering","date_created":"2019-12-04T09:10:45Z","type":"conference","language":[{"iso":"ger"}],"_id":"2132","citation":{"ama":"Lohweg V. Industrielle Bildverarbeitung und Mustererkennung – Schlüssel für Industrie 4.0? In: Quality Engineering. Konradin-Verlag, R. Kohlhammer GmbH; 2013:58-59.","ieee":"V. Lohweg, “Industrielle Bildverarbeitung und Mustererkennung – Schlüssel für Industrie 4.0?,” in Quality Engineering, 2013, pp. 58–59.","van":"Lohweg V. Industrielle Bildverarbeitung und Mustererkennung – Schlüssel für Industrie 4.0? In: Quality Engineering. Konradin-Verlag, R. 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Kohlhammer GmbH.","chicago":"Lohweg, Volker. “Industrielle Bildverarbeitung und Mustererkennung – Schlüssel für Industrie 4.0?” In Quality Engineering, 58–59. Konradin-Verlag, R. Kohlhammer GmbH, 2013.","short":"V. Lohweg, in: Quality Engineering, Konradin-Verlag, R. Kohlhammer GmbH, 2013, pp. 58–59.","chicago-de":"Lohweg, Volker. 2013. Industrielle Bildverarbeitung und Mustererkennung – Schlüssel für Industrie 4.0? In: Quality Engineering, 58–59. Konradin-Verlag, R. Kohlhammer GmbH.","din1505-2-1":"Lohweg, Volker: Industrielle Bildverarbeitung und Mustererkennung – Schlüssel für Industrie 4.0? In: Quality Engineering : Konradin-Verlag, R. Kohlhammer GmbH, 2013, S. 58–59"},"publication_status":"published","title":"Industrielle Bildverarbeitung und Mustererkennung – Schlüssel für Industrie 4.0?","status":"public","page":"58-59","publisher":"Konradin-Verlag, R. Kohlhammer GmbH","author":[{"orcid":"0000-0002-3325-7887","id":"1804","full_name":"Lohweg, Volker","last_name":"Lohweg","first_name":"Volker"}],"year":2013,"department":[{"_id":"DEP5023"}]},{"date_updated":"2023-03-15T13:49:39Z","user_id":"45673","date_created":"2019-12-04T09:12:23Z","type":"conference","publication":"Forum Robotics, Automation Vision","language":[{"iso":"ger"}],"_id":"2134","publication_status":"published","citation":{"chicago-de":"Lohweg, Volker. 2013. Industrielle Bildverarbeitung und Mustererkennung– Schlüssel für Industrie 4.0. In: Forum Robotics, Automation Vision. Hannover Messe Industrie.","din1505-2-1":"Lohweg, Volker: Industrielle Bildverarbeitung und Mustererkennung– Schlüssel für Industrie 4.0. In: Forum Robotics, Automation Vision : Hannover Messe Industrie, 2013","short":"V. Lohweg, in: Forum Robotics, Automation Vision, Hannover Messe Industrie, 2013.","mla":"Lohweg, Volker. “Industrielle Bildverarbeitung und Mustererkennung– Schlüssel für Industrie 4.0.” Forum Robotics, Automation Vision, Hannover Messe Industrie, 2013.","havard":"V. Lohweg, Industrielle Bildverarbeitung und Mustererkennung– Schlüssel für Industrie 4.0, in: Forum Robotics, Automation Vision, Hannover Messe Industrie, 2013.","bjps":"Lohweg V (2013) Industrielle Bildverarbeitung und Mustererkennung– Schlüssel für Industrie 4.0. Forum Robotics, Automation Vision. Hannover Messe Industrie.","ufg":"Lohweg, Volker (2013): Industrielle Bildverarbeitung und Mustererkennung– Schlüssel für Industrie 4.0, in: Forum Robotics, Automation Vision.","ama":"Lohweg V. Industrielle Bildverarbeitung und Mustererkennung– Schlüssel für Industrie 4.0. In: Forum Robotics, Automation Vision. Hannover Messe Industrie; 2013.","van":"Lohweg V. Industrielle Bildverarbeitung und Mustererkennung– Schlüssel für Industrie 4.0. In: Forum Robotics, Automation Vision. Hannover Messe Industrie; 2013.","chicago":"Lohweg, Volker. “Industrielle Bildverarbeitung und Mustererkennung– Schlüssel für Industrie 4.0.” In Forum Robotics, Automation Vision. Hannover Messe Industrie, 2013.","ieee":"V. Lohweg, “Industrielle Bildverarbeitung und Mustererkennung– Schlüssel für Industrie 4.0,” in Forum Robotics, Automation Vision, 2013.","apa":"Lohweg, V. (2013). Industrielle Bildverarbeitung und Mustererkennung– Schlüssel für Industrie 4.0. In Forum Robotics, Automation Vision. Hannover Messe Industrie."},"title":"Industrielle Bildverarbeitung und Mustererkennung– Schlüssel für Industrie 4.0","status":"public","publisher":"Hannover Messe Industrie","department":[{"_id":"DEP5023"}],"year":2013,"author":[{"orcid":"0000-0002-3325-7887","full_name":"Lohweg, Volker","last_name":"Lohweg","id":"1804","first_name":"Volker"}]},{"abstract":[{"text":"Eine Zustandsüberwachung elektrischer Antriebe erfolgt derzeit in der Regel durch Einsatz spezieller Sensorik, bspw. durch Vibrationsmessungen. Außerdem werden die Antriebe lediglich isoliert betrachtet, eine Zusammenführung anfallender Informationen eines räumlich verteilten Antriebsverbunds findet meist nicht statt. Es wird ein neuartiges Motor-as-Sensor-Konzept vorgeschlagen und validiert, das eine antizipatorische Zustandsüberwachung ohne Einsatz zusätzlicher Sensorik allein durch Verarbeitung der phasenbezogenen Motorströme ermöglicht. Zusätzlich wird ein Informationsfusionskonzept vorgestellt, das die Informationen aller im Verbund beteiligten Antriebe zusammenführt, um darüber eine mit weniger Unsicherheiten behaftete Aussage über den Zustand einer Applikation herbeizuführen. Das Hauptaugenmerk liegt hierbei insbesondere auf der Beherrschung der anfallenden riesigen Datenmengen. die zur Verarbeitung in eingebetteten Systemen reduziert werden müssen.","lang":"ger"}],"department":[{"_id":"DEP5023"}],"author":[{"last_name":"Mönks","full_name":"Mönks, Uwe","id":"1825","first_name":"Uwe"},{"id":"46440","last_name":"Bator","full_name":"Bator, Martyna","first_name":"Martyna"},{"id":"1853","full_name":"Dicks, Alexander","first_name":"Alexander","last_name":"Dicks"},{"orcid":"0000-0002-3325-7887","last_name":"Lohweg","full_name":"Lohweg, Volker","first_name":"Volker","id":"1804"}],"year":2013,"publisher":"Universität Paderborn","page":"305-315","status":"public","title":"Informationsfusion mit verteilter elektromotorischer Sensorik im Maschinen- und Anlagenbau","publication_status":"published","volume":"9. Paderborner Workshop Entwurf mechatronischer Systeme","citation":{"chicago-de":"Mönks, Uwe, Martyna Bator, Alexander Dicks und Volker Lohweg. 2013. Informationsfusion mit verteilter elektromotorischer Sensorik im Maschinen- und Anlagenbau. Wissenschaftsforum Intelligente Technische Systeme (Heinz Nixdorf Institut, Paderborn) 9. Paderborner Workshop Entwurf mechatronischer Systeme: 305–315.","din1505-2-1":"Mönks, Uwe ; Bator, Martyna ; Dicks, Alexander ; Lohweg, Volker: Informationsfusion mit verteilter elektromotorischer Sensorik im Maschinen- und Anlagenbau. In: Wissenschaftsforum Intelligente Technische Systeme (Heinz Nixdorf Institut, Paderborn) Bd. 9. Paderborner Workshop Entwurf mechatronischer Systeme. Paderborn, Universität Paderborn (2013), S. 305–315","short":"U. Mönks, M. Bator, A. Dicks, V. Lohweg, Wissenschaftsforum Intelligente Technische Systeme (Heinz Nixdorf Institut, Paderborn) 9. Paderborner Workshop Entwurf mechatronischer Systeme (2013) 305–315.","chicago":"Mönks, Uwe, Martyna Bator, Alexander Dicks, and Volker Lohweg. “Informationsfusion mit verteilter elektromotorischer Sensorik im Maschinen- und Anlagenbau.” Wissenschaftsforum Intelligente Technische Systeme (Heinz Nixdorf Institut, Paderborn) 9. Paderborner Workshop Entwurf mechatronischer Systeme (2013): 305–15.","ieee":"U. Mönks, M. Bator, A. Dicks, and V. Lohweg, “Informationsfusion mit verteilter elektromotorischer Sensorik im Maschinen- und Anlagenbau,” Wissenschaftsforum Intelligente Technische Systeme (Heinz Nixdorf Institut, Paderborn), vol. 9. Paderborner Workshop Entwurf mechatronischer Systeme, pp. 305–315, 2013.","apa":"Mönks, U., Bator, M., Dicks, A., & Lohweg, V. (2013). Informationsfusion mit verteilter elektromotorischer Sensorik im Maschinen- und Anlagenbau. Wissenschaftsforum Intelligente Technische Systeme (Heinz Nixdorf Institut, Paderborn), 9. Paderborner Workshop Entwurf mechatronischer Systeme, 305–315.","mla":"Mönks, Uwe, et al. “Informationsfusion mit verteilter elektromotorischer Sensorik im Maschinen- und Anlagenbau.” Wissenschaftsforum Intelligente Technische Systeme (Heinz Nixdorf Institut, Paderborn), vol. 9. Paderborner Workshop Entwurf mechatronischer Systeme, Universität Paderborn, 2013, pp. 305–15.","havard":"U. Mönks, M. Bator, A. Dicks, V. Lohweg, Informationsfusion mit verteilter elektromotorischer Sensorik im Maschinen- und Anlagenbau, Wissenschaftsforum Intelligente Technische Systeme (Heinz Nixdorf Institut, Paderborn). 9. Paderborner Workshop Entwurf mechatronischer Systeme (2013) 305–315.","bjps":"Mönks U et al. (2013) Informationsfusion mit verteilter elektromotorischer Sensorik im Maschinen- und Anlagenbau. Wissenschaftsforum Intelligente Technische Systeme (Heinz Nixdorf Institut, Paderborn) 9. Paderborner Workshop Entwurf mechatronischer Systeme, 305–315.","ufg":"Mönks, Uwe et. al. (2013): Informationsfusion mit verteilter elektromotorischer Sensorik im Maschinen- und Anlagenbau, in: Wissenschaftsforum Intelligente Technische Systeme (Heinz Nixdorf Institut, Paderborn) 9. Paderborner Workshop Entwurf mechatronischer Systeme, S. 305–315.","ama":"Mönks U, Bator M, Dicks A, Lohweg V. Informationsfusion mit verteilter elektromotorischer Sensorik im Maschinen- und Anlagenbau. Wissenschaftsforum Intelligente Technische Systeme (Heinz Nixdorf Institut, Paderborn). 2013;9. Paderborner Workshop Entwurf mechatronischer Systeme:305-315.","van":"Mönks U, Bator M, Dicks A, Lohweg V. Informationsfusion mit verteilter elektromotorischer Sensorik im Maschinen- und Anlagenbau. Wissenschaftsforum Intelligente Technische Systeme (Heinz Nixdorf Institut, Paderborn). 2013;9. Paderborner Workshop Entwurf mechatronischer Systeme:305–15."},"_id":"2135","language":[{"iso":"ger"}],"place":"Paderborn","type":"journal_article","date_created":"2019-12-04T09:21:33Z","publication_identifier":{"isbn":["978-3-942647-29-8"]},"publication":"Wissenschaftsforum Intelligente Technische Systeme (Heinz Nixdorf Institut, Paderborn)","date_updated":"2023-03-15T13:49:39Z","user_id":"45673"},{"doi":" 10.1109/ETFA.2013.6648126","_id":"2137","language":[{"iso":"eng"}],"place":"Cagliari, Italy","oa":"1","date_updated":"2023-03-15T13:49:39Z","user_id":"45673","type":"conference","date_created":"2019-12-04T09:25:43Z","publication_identifier":{"eisbn":["978-1-4799-0864-6"],"isbn":["978-1-4799-0862-2"]},"publisher":"18th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)","status":"public","abstract":[{"lang":"eng","text":"Systems for process automation become increasingly complex and also tend to be composed of autonomous subsystems, which is strongly driven by the progress made in information technology. An active field of research is the implementation of monitoring and control at sub-system level using cognitive approaches. In this paper we present a method for autonomous and sensorless condition monitoring of an electric drive train. Based on experiment design we measured phase currents of a physical demonstrator device including mechanical defects and extracted signal features using proper orthogonal decomposition. In favor of classification of different defect states we performed a linear discriminant analysis, which yields appropriate data for a Fuzzy-Pattern-Classification algorithm. As a result we were able to identify different reference defect states as well as previously unknown states."}],"department":[{"_id":"DEP5023"}],"year":2013,"main_file_link":[{"open_access":"1","url":"http://publica.fraunhofer.de/eprints/urn_nbn_de_0011-n-2666279.pdf"}],"author":[{"first_name":"Christian","last_name":"Bayer","full_name":"Bayer, Christian"},{"id":"46440","full_name":"Bator, Martyna","last_name":"Bator","first_name":"Martyna"},{"full_name":"Enge-Rosenblatt, Olaf","first_name":"Olaf","last_name":"Enge-Rosenblatt"},{"id":"1825","full_name":"Mönks, Uwe","first_name":"Uwe","last_name":"Mönks"},{"id":"1853","last_name":"Dicks","full_name":"Dicks, Alexander","first_name":"Alexander"},{"full_name":"Lohweg, Volker","first_name":"Volker","last_name":"Lohweg","id":"1804","orcid":"0000-0002-3325-7887"}],"publication_status":"published","citation":{"ieee":"C. Bayer, M. Bator, O. Enge-Rosenblatt, U. Mönks, A. Dicks, and V. Lohweg, “Sensorless Drive Diagnosis Using Automated Feature Extraction, Significance Ranking and Reduction.,” 2013.","ama":"Bayer C, Bator M, Enge-Rosenblatt O, Mönks U, Dicks A, Lohweg V. Sensorless Drive Diagnosis Using Automated Feature Extraction, Significance Ranking and Reduction. In: Cagliari, Italy: 18th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA); 2013. doi: 10.1109/ETFA.2013.6648126","chicago-de":"Bayer, Christian, Martyna Bator, Olaf Enge-Rosenblatt, Uwe Mönks, Alexander Dicks und Volker Lohweg. 2013. Sensorless Drive Diagnosis Using Automated Feature Extraction, Significance Ranking and Reduction. In: . Cagliari, Italy: 18th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA). doi: 10.1109/ETFA.2013.6648126, .","din1505-2-1":"Bayer, Christian ; Bator, Martyna ; Enge-Rosenblatt, Olaf ; Mönks, Uwe ; Dicks, Alexander ; Lohweg, Volker: Sensorless Drive Diagnosis Using Automated Feature Extraction, Significance Ranking and Reduction. In: . Cagliari, Italy : 18th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA), 2013","short":"C. Bayer, M. Bator, O. Enge-Rosenblatt, U. Mönks, A. Dicks, V. Lohweg, in: 18th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA), Cagliari, Italy, 2013.","chicago":"Bayer, Christian, Martyna Bator, Olaf Enge-Rosenblatt, Uwe Mönks, Alexander Dicks, and Volker Lohweg. “Sensorless Drive Diagnosis Using Automated Feature Extraction, Significance Ranking and Reduction.” Cagliari, Italy: 18th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA), 2013. https://doi.org/ 10.1109/ETFA.2013.6648126.","apa":"Bayer, C., Bator, M., Enge-Rosenblatt, O., Mönks, U., Dicks, A., & Lohweg, V. (2013). Sensorless Drive Diagnosis Using Automated Feature Extraction, Significance Ranking and Reduction. Cagliari, Italy: 18th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA). https://doi.org/ 10.1109/ETFA.2013.6648126","ufg":"Bayer, Christian et. al. (2013): Sensorless Drive Diagnosis Using Automated Feature Extraction, Significance Ranking and Reduction., in: , Cagliari, Italy.","mla":"Bayer, Christian, et al. Sensorless Drive Diagnosis Using Automated Feature Extraction, Significance Ranking and Reduction. 18th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA), 2013, doi: 10.1109/ETFA.2013.6648126.","bjps":"Bayer C et al. (2013) Sensorless Drive Diagnosis Using Automated Feature Extraction, Significance Ranking and Reduction. Cagliari, Italy: 18th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA).","havard":"C. Bayer, M. Bator, O. Enge-Rosenblatt, U. Mönks, A. Dicks, V. Lohweg, Sensorless Drive Diagnosis Using Automated Feature Extraction, Significance Ranking and Reduction., in: 18th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA), Cagliari, Italy, 2013.","van":"Bayer C, Bator M, Enge-Rosenblatt O, Mönks U, Dicks A, Lohweg V. Sensorless Drive Diagnosis Using Automated Feature Extraction, Significance Ranking and Reduction. In Cagliari, Italy: 18th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA); 2013."},"title":"Sensorless Drive Diagnosis Using Automated Feature Extraction, Significance Ranking and Reduction."},{"status":"public","abstract":[{"text":"Sensor and information fusion is recently a major topic which becomes important in machine diagnosis and conditioning for complex production machines and process engineering. It is a known fact that distributed automation systems have a major impact on signal processing and pattern recognition for machine diagnosis. Therefore, it is necessary to research and develop smart diagnosis methods which are applicable for distributed systems like resource-limited cyber-physical systems. In this paper we propose an new approach for sensor and information fusion based on Evidence Theory and socio-psychological decision-making. We show that context based condition monitoring is instantiated even in conflict situations, oc-curing in real life scenarios permanently. A simple but effective importance measure is proposed which controls the significance of conditioning propositions in a system.","lang":"eng"}],"year":2013,"author":[{"id":"1825","first_name":"Uwe","last_name":"Mönks","full_name":"Mönks, Uwe"},{"orcid":"0000-0002-3325-7887","id":"1804","full_name":"Lohweg, Volker","last_name":"Lohweg","first_name":"Volker"}],"department":[{"_id":"DEP5023"}],"citation":{"din1505-2-1":"Mönks, Uwe ; Lohweg, Volker: Machine Conditioning by Importance Controlled Information Fusion. In: IEEE (Hrsg.): 18th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA). Cagliari, Italy, 2013","chicago-de":"Mönks, Uwe und Volker Lohweg. 2013. Machine Conditioning by Importance Controlled Information Fusion. In: 18th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA), hg. von IEEE. Cagliari, Italy. doi:10.1109/ETFA.2013.6647984, .","short":"U. Mönks, V. Lohweg, in: IEEE (Ed.), 18th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA), Cagliari, Italy, 2013.","chicago":"Mönks, Uwe, and Volker Lohweg. “Machine Conditioning by Importance Controlled Information Fusion.” In 18th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA), edited by IEEE. Cagliari, Italy, 2013. https://doi.org/10.1109/ETFA.2013.6647984.","apa":"Mönks, U., & Lohweg, V. (2013). Machine Conditioning by Importance Controlled Information Fusion. In IEEE (Ed.), 18th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA). Cagliari, Italy. https://doi.org/10.1109/ETFA.2013.6647984","mla":"Mönks, Uwe, and Volker Lohweg. “Machine Conditioning by Importance Controlled Information Fusion.” 18th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA), edited by IEEE, 2013, doi:10.1109/ETFA.2013.6647984.","bjps":"Mönks U and Lohweg V (2013) Machine Conditioning by Importance Controlled Information Fusion. In IEEE (ed.), 18th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA). Cagliari, Italy.","havard":"U. Mönks, V. Lohweg, Machine Conditioning by Importance Controlled Information Fusion, in: IEEE (Ed.), 18th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA), Cagliari, Italy, 2013.","ufg":"Mönks, Uwe/Lohweg, Volker (2013): Machine Conditioning by Importance Controlled Information Fusion, in: IEEE (Hg.): 18th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA), Cagliari, Italy.","van":"Mönks U, Lohweg V. Machine Conditioning by Importance Controlled Information Fusion. In: IEEE, editor. 18th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA). Cagliari, Italy; 2013.","ieee":"U. Mönks and V. Lohweg, “Machine Conditioning by Importance Controlled Information Fusion,” in 18th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA), 2013.","ama":"Mönks U, Lohweg V. Machine Conditioning by Importance Controlled Information Fusion. In: IEEE, ed. 18th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA). Cagliari, Italy; 2013. doi:10.1109/ETFA.2013.6647984"},"publication_status":"published","title":"Machine Conditioning by Importance Controlled Information Fusion","_id":"2141","doi":"10.1109/ETFA.2013.6647984","keyword":["Decision making","Robot sensing systems","Reliability","Production","Context","Fuzzy set theory","Data integration"],"place":"Cagliari, Italy","language":[{"iso":"eng"}],"corporate_editor":["IEEE"],"user_id":"45673","date_updated":"2023-03-15T13:49:39Z","publication_identifier":{"eisbn":["978-1-4799-0864-6"],"issn":["1946-0740 "],"eissn":["1946-0759 "],"isbn":["978-1-4799-0862-2"]},"publication":"18th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)","type":"conference","date_created":"2019-12-04T09:30:15Z"},{"title":"Sensorlose Zustandsüberwachung an Synchronmotoren.","volume":46,"citation":{"chicago-de":"Paschke, Fabian, Christian Bayer, Martyna Bator, Uwe Mönks, Alexander Dicks, Olaf Enge-Rosenblatt und Volker Lohweg. 2013. Sensorlose Zustandsüberwachung an Synchronmotoren. In: 23. Workshop Computational Intelligence 2013. Proceedings, hg. von F. Hoffmann, 46:211–225. Karlsruher Institut für Technologie, Institut für Angewandte Informatik, Automatisierungstechnik. Schriftenreihe. Karlsruhe: KIT Scientific Publishing.","din1505-2-1":"Paschke, Fabian ; Bayer, Christian ; Bator, Martyna ; Mönks, Uwe ; Dicks, Alexander ; Enge-Rosenblatt, Olaf ; Lohweg, Volker: Sensorlose Zustandsüberwachung an Synchronmotoren. In: Hoffmann, F. (Hrsg.): 23. Workshop Computational Intelligence 2013. Proceedings, Karlsruher Institut für Technologie, Institut für Angewandte Informatik, Automatisierungstechnik. Schriftenreihe. Bd. 46. Karlsruhe : KIT Scientific Publishing, 2013, S. 211–225","short":"F. Paschke, C. Bayer, M. Bator, U. Mönks, A. Dicks, O. Enge-Rosenblatt, V. Lohweg, in: F. Hoffmann (Ed.), 23. Workshop Computational Intelligence 2013. Proceedings, KIT Scientific Publishing, Karlsruhe, 2013, pp. 211–225.","havard":"F. Paschke, C. Bayer, M. Bator, U. Mönks, A. Dicks, O. Enge-Rosenblatt, V. Lohweg, Sensorlose Zustandsüberwachung an Synchronmotoren., in: F. Hoffmann (Ed.), 23. Workshop Computational Intelligence 2013. Proceedings, KIT Scientific Publishing, Karlsruhe, 2013: pp. 211–225.","bjps":"Paschke F et al. (2013) Sensorlose Zustandsüberwachung an Synchronmotoren. In Hoffmann F (ed.), 23. Workshop Computational Intelligence 2013. Proceedings, vol. 46. Karlsruhe: KIT Scientific Publishing, pp. 211–225.","mla":"Paschke, Fabian, et al. “Sensorlose Zustandsüberwachung an Synchronmotoren.” 23. Workshop Computational Intelligence 2013. Proceedings, edited by F. Hoffmann, vol. 46, KIT Scientific Publishing, 2013, pp. 211–25.","ufg":"Paschke, Fabian et. al. (2013): Sensorlose Zustandsüberwachung an Synchronmotoren., in: F. Hoffmann (Hg.): 23. Workshop Computational Intelligence 2013. Proceedings (=Karlsruher Institut für Technologie, Institut für Angewandte Informatik, Automatisierungstechnik. Schriftenreihe 46), Karlsruhe, S. 211–225.","ama":"Paschke F, Bayer C, Bator M, et al. Sensorlose Zustandsüberwachung an Synchronmotoren. In: Hoffmann F, ed. 23. Workshop Computational Intelligence 2013. Proceedings. Vol 46. Karlsruher Institut für Technologie, Institut für Angewandte Informatik, Automatisierungstechnik. Schriftenreihe. Karlsruhe: KIT Scientific Publishing; 2013:211-225.","van":"Paschke F, Bayer C, Bator M, Mönks U, Dicks A, Enge-Rosenblatt O, et al. Sensorlose Zustandsüberwachung an Synchronmotoren. In: Hoffmann F, editor. 23 Workshop Computational Intelligence 2013 Proceedings. Karlsruhe: KIT Scientific Publishing; 2013. p. 211–25. (Karlsruher Institut für Technologie, Institut für Angewandte Informatik, Automatisierungstechnik. Schriftenreihe; vol. 46).","chicago":"Paschke, Fabian, Christian Bayer, Martyna Bator, Uwe Mönks, Alexander Dicks, Olaf Enge-Rosenblatt, and Volker Lohweg. “Sensorlose Zustandsüberwachung an Synchronmotoren.” In 23. Workshop Computational Intelligence 2013. Proceedings, edited by F. Hoffmann, 46:211–25. Karlsruher Institut für Technologie, Institut für Angewandte Informatik, Automatisierungstechnik. Schriftenreihe. Karlsruhe: KIT Scientific Publishing, 2013.","ieee":"F. Paschke et al., “Sensorlose Zustandsüberwachung an Synchronmotoren.,” in 23. Workshop Computational Intelligence 2013. Proceedings, Dortmund, 2013, vol. 46, pp. 211–225.","apa":"Paschke, F., Bayer, C., Bator, M., Mönks, U., Dicks, A., Enge-Rosenblatt, O., & Lohweg, V. (2013). Sensorlose Zustandsüberwachung an Synchronmotoren. In F. Hoffmann (Ed.), 23. Workshop Computational Intelligence 2013. Proceedings (Vol. 46, pp. 211–225). Karlsruhe: KIT Scientific Publishing."},"year":2013,"author":[{"full_name":"Paschke, Fabian","first_name":"Fabian","last_name":"Paschke"},{"last_name":"Bayer","first_name":"Christian","full_name":"Bayer, Christian"},{"full_name":"Bator, Martyna","id":"46440","first_name":"Martyna","last_name":"Bator"},{"full_name":"Mönks, Uwe","id":"1825","last_name":"Mönks","first_name":"Uwe"},{"last_name":"Dicks","id":"1853","full_name":"Dicks, Alexander","first_name":"Alexander"},{"full_name":"Enge-Rosenblatt, Olaf","first_name":"Olaf","last_name":"Enge-Rosenblatt"},{"last_name":"Lohweg","first_name":"Volker","full_name":"Lohweg, Volker","id":"1804","orcid":"0000-0002-3325-7887"}],"main_file_link":[{"url":"http://publica.fraunhofer.de/eprints/urn_nbn_de_0011-n-2754970.pdf","open_access":"1"}],"status":"public","page":"211-225","publication":"23. Workshop Computational Intelligence 2013. Proceedings","publication_identifier":{"isbn":["978-3-7315-0126-8"]},"date_created":"2019-12-04T09:35:47Z","editor":[{"full_name":"Hoffmann, F.","first_name":"F.","last_name":"Hoffmann"}],"date_updated":"2023-03-15T13:49:39Z","oa":"1","language":[{"iso":"ger"}],"series_title":"Karlsruher Institut für Technologie, Institut für Angewandte Informatik, Automatisierungstechnik. Schriftenreihe","publication_status":"published","abstract":[{"lang":"ger","text":"Die aktive Zustandsüberwachung von Automatisierungssystemen rückt immer weiter in den Vordergrund und ist daher ein zentraler Forschungsgegenstand. In diesem Beitrag werden Ansätze der sensorlosen Überwachung eines Synchronmotors diskutiert. Basierend auf Messungen der Phasenströme des Motors werden mit der Hilbert-Transformation bzw. mit der Empirical Mode Decomposition charakteristische Merkmale aus den Signalen berechnet. Anschließend werden diese mittels Hauptkomponentenanalyse bzw. der linearen Diskriminanzanalyse reduziert. Die daraus berechneten Charakteristischen Merkmale dienen als Grundlage für die abschließende Fuzzy-Pattern-Klassifikation. Basierend auf dem erläuterten Ansatz ist die Identifikation typischer Betriebs- bzw. Fehlerzustände, aber auch das Erkennen nicht gelernter Zustände möglich. Das dabei vorgestellte Vorgehen ist vergleichsweise generisch und lässt sich gut auf andere Anwendungsgebiete übertragen."}],"conference":{"end_date":"2013-12-06","start_date":"2013-12-05","location":"Dortmund","name":"23. Workshop Computational Intelligence 2013. Proceedings"},"department":[{"_id":"DEP5023"}],"publisher":"KIT Scientific Publishing","type":"conference","intvolume":" 46","user_id":"45673","_id":"2142","place":"Karlsruhe"},{"date_created":"2019-12-04T09:42:45Z","type":"conference","publication_identifier":{"issn":["1614-5267"],"isbn":["978-3-7315-0126-8"]},"publication":"23. Workshop Computational Intelligence, 05.-06.12.2013, Dortmund VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA), Düsseldorf ","intvolume":" 46","date_updated":"2023-03-15T13:49:39Z","user_id":"45673","oa":"1","doi":"DOI: 10.5445/KSP/1000036887 ","_id":"2144","language":[{"iso":"eng"}],"place":"Karlsruhe","title":"Automated Fusion Attribute Generation for Conditioning Monitoring.","series_title":"Schriftenreihe des Instituts für Angewandte Informatik - Automatisierungstechnik, Karlsruher Institut für Technologie ","citation":{"van":"Mönks U, Priesterjahn S, Lohweg V. Automated Fusion Attribute Generation for Conditioning Monitoring. In: 23 Workshop Computational Intelligence, 05-06122013, Dortmund VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA), Düsseldorf . Karlsruhe: KIT Scientific Publishing; 2013. p. 339–54. (Schriftenreihe des Instituts für Angewandte Informatik - Automatisierungstechnik, Karlsruher Institut für Technologie ; vol. 46).","ufg":"Mönks, Uwe et. al. (2013): Automated Fusion Attribute Generation for Conditioning Monitoring., in: 23. Workshop Computational Intelligence, 05.-06.12.2013, Dortmund VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA), Düsseldorf (=Schriftenreihe des Instituts für Angewandte Informatik - Automatisierungstechnik, Karlsruher Institut für Technologie 46), Karlsruhe, S. 339–354.","havard":"U. Mönks, S. Priesterjahn, V. Lohweg, Automated Fusion Attribute Generation for Conditioning Monitoring., in: 23. Workshop Computational Intelligence, 05.-06.12.2013, Dortmund VDI/VDE-Gesellschaft Mess- Und Automatisierungstechnik (GMA), Düsseldorf , KIT Scientific Publishing, Karlsruhe, 2013: pp. 339–354.","mla":"Mönks, Uwe, et al. “Automated Fusion Attribute Generation for Conditioning Monitoring.” 23. Workshop Computational Intelligence, 05.-06.12.2013, Dortmund VDI/VDE-Gesellschaft Mess- Und Automatisierungstechnik (GMA), Düsseldorf , vol. 46, KIT Scientific Publishing, 2013, pp. 339–54, doi:DOI: 10.5445/KSP/1000036887 .","bjps":"Mönks U, Priesterjahn S and Lohweg V (2013) Automated Fusion Attribute Generation for Conditioning Monitoring. 23. Workshop Computational Intelligence, 05.-06.12.2013, Dortmund VDI/VDE-Gesellschaft Mess- Und Automatisierungstechnik (GMA), Düsseldorf , vol. 46. Karlsruhe: KIT Scientific Publishing, pp. 339–354.","apa":"Mönks, U., Priesterjahn, S., & Lohweg, V. (2013). Automated Fusion Attribute Generation for Conditioning Monitoring. In 23. Workshop Computational Intelligence, 05.-06.12.2013, Dortmund VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA), Düsseldorf (Vol. 46, pp. 339–354). Karlsruhe: KIT Scientific Publishing. https://doi.org/DOI: 10.5445/KSP/1000036887 ","chicago":"Mönks, Uwe, Steffen Priesterjahn, and Volker Lohweg. “Automated Fusion Attribute Generation for Conditioning Monitoring.” In 23. Workshop Computational Intelligence, 05.-06.12.2013, Dortmund VDI/VDE-Gesellschaft Mess- Und Automatisierungstechnik (GMA), Düsseldorf , 46:339–54. Schriftenreihe Des Instituts Für Angewandte Informatik - Automatisierungstechnik, Karlsruher Institut Für Technologie . Karlsruhe: KIT Scientific Publishing, 2013. https://doi.org/DOI: 10.5445/KSP/1000036887 .","short":"U. Mönks, S. Priesterjahn, V. Lohweg, in: 23. Workshop Computational Intelligence, 05.-06.12.2013, Dortmund VDI/VDE-Gesellschaft Mess- Und Automatisierungstechnik (GMA), Düsseldorf , KIT Scientific Publishing, Karlsruhe, 2013, pp. 339–354.","chicago-de":"Mönks, Uwe, Steffen Priesterjahn und Volker Lohweg. 2013. Automated Fusion Attribute Generation for Conditioning Monitoring. In: 23. Workshop Computational Intelligence, 05.-06.12.2013, Dortmund VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA), Düsseldorf , 46:339–354. Schriftenreihe des Instituts für Angewandte Informatik - Automatisierungstechnik, Karlsruher Institut für Technologie . Karlsruhe: KIT Scientific Publishing. doi:DOI: 10.5445/KSP/1000036887 , .","din1505-2-1":"Mönks, Uwe ; Priesterjahn, Steffen ; Lohweg, Volker: Automated Fusion Attribute Generation for Conditioning Monitoring. In: 23. Workshop Computational Intelligence, 05.-06.12.2013, Dortmund VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA), Düsseldorf , Schriftenreihe des Instituts für Angewandte Informatik - Automatisierungstechnik, Karlsruher Institut für Technologie . Bd. 46. Karlsruhe : KIT Scientific Publishing, 2013, S. 339–354","ama":"Mönks U, Priesterjahn S, Lohweg V. Automated Fusion Attribute Generation for Conditioning Monitoring. In: 23. Workshop Computational Intelligence, 05.-06.12.2013, Dortmund VDI/VDE-Gesellschaft Mess- Und Automatisierungstechnik (GMA), Düsseldorf . Vol 46. Schriftenreihe des Instituts für Angewandte Informatik - Automatisierungstechnik, Karlsruher Institut für Technologie . Karlsruhe: KIT Scientific Publishing; 2013:339-354. doi:DOI: 10.5445/KSP/1000036887 ","ieee":"U. Mönks, S. Priesterjahn, and V. Lohweg, “Automated Fusion Attribute Generation for Conditioning Monitoring.,” in 23. Workshop Computational Intelligence, 05.-06.12.2013, Dortmund VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA), Düsseldorf , 2013, vol. 46, pp. 339–354."},"volume":46,"department":[{"_id":"DEP5023"}],"main_file_link":[{"open_access":"1","url":"https://publikationen.bibliothek.kit.edu/1000036887"}],"author":[{"last_name":"Mönks","id":"1825","full_name":"Mönks, Uwe","first_name":"Uwe"},{"first_name":"Steffen","full_name":"Priesterjahn, Steffen","last_name":"Priesterjahn"},{"orcid":"0000-0002-3325-7887","full_name":"Lohweg, Volker","last_name":"Lohweg","id":"1804","first_name":"Volker"}],"year":2013,"publisher":"KIT Scientific Publishing","page":"339-354","status":"public"},{"department":[{"_id":"DEP5023"}],"author":[{"last_name":"Ehlenbröker","full_name":"Ehlenbröker, Jan-Friedrich","first_name":"Jan-Friedrich","id":"1852"},{"full_name":"Priesterjahn, Steffen","last_name":"Priesterjahn","first_name":"Steffen"},{"first_name":"Alexander","last_name":"Drichel","full_name":"Drichel, Alexander"},{"orcid":"0000-0002-3325-7887","id":"1804","last_name":"Lohweg","full_name":"Lohweg, Volker","first_name":"Volker"}],"year":2012,"status":"public","title":"Robust ATM PIN Pad Authentication with Coded Features. In: Optical Document Security - The Conference on Optical Security and Counterfeit Detection III, San Francisco, CA, USA, January 18-20, 2012. ","citation":{"chicago-de":"Ehlenbröker, Jan-Friedrich, Steffen Priesterjahn, Alexander Drichel und Volker Lohweg. 2012. Robust ATM PIN Pad Authentication with Coded Features. In: Optical Document Security - The Conference on Optical Security and Counterfeit Detection III, San Francisco, CA, USA, January 18-20, 2012. . Optical Document Security - The Conference on Optical Security and Counterfeit Detection III.","din1505-2-1":"Ehlenbröker, Jan-Friedrich ; Priesterjahn, Steffen ; Drichel, Alexander ; Lohweg, Volker: Robust ATM PIN Pad Authentication with Coded Features. In: Optical Document Security - The Conference on Optical Security and Counterfeit Detection III, San Francisco, CA, USA, January 18-20, 2012. . In: Optical Document Security - The Conference on Optical Security and Counterfeit Detection III (2012)","short":"J.-F. Ehlenbröker, S. Priesterjahn, A. Drichel, V. Lohweg, Optical Document Security - The Conference on Optical Security and Counterfeit Detection III (2012).","havard":"J.-F. Ehlenbröker, S. Priesterjahn, A. Drichel, V. Lohweg, Robust ATM PIN Pad Authentication with Coded Features. In: Optical Document Security - The Conference on Optical Security and Counterfeit Detection III, San Francisco, CA, USA, January 18-20, 2012. , Optical Document Security - The Conference on Optical Security and Counterfeit Detection III. (2012).","bjps":"Ehlenbröker J-F et al. (2012) Robust ATM PIN Pad Authentication with Coded Features. In: Optical Document Security - The Conference on Optical Security and Counterfeit Detection III, San Francisco, CA, USA, January 18-20, 2012. . Optical Document Security - The Conference on Optical Security and Counterfeit Detection III.","mla":"Ehlenbröker, Jan-Friedrich, et al. “Robust ATM PIN Pad Authentication with Coded Features. In: Optical Document Security - The Conference on Optical Security and Counterfeit Detection III, San Francisco, CA, USA, January 18-20, 2012. .” Optical Document Security - The Conference on Optical Security and Counterfeit Detection III, 2012.","ufg":"Ehlenbröker, Jan-Friedrich et. al. (2012): Robust ATM PIN Pad Authentication with Coded Features. In: Optical Document Security - The Conference on Optical Security and Counterfeit Detection III, San Francisco, CA, USA, January 18-20, 2012. , in: Optical Document Security - The Conference on Optical Security and Counterfeit Detection III.","ama":"Ehlenbröker J-F, Priesterjahn S, Drichel A, Lohweg V. Robust ATM PIN Pad Authentication with Coded Features. In: Optical Document Security - The Conference on Optical Security and Counterfeit Detection III, San Francisco, CA, USA, January 18-20, 2012. . Optical Document Security - The Conference on Optical Security and Counterfeit Detection III. 2012.","van":"Ehlenbröker J-F, Priesterjahn S, Drichel A, Lohweg V. Robust ATM PIN Pad Authentication with Coded Features. In: Optical Document Security - The Conference on Optical Security and Counterfeit Detection III, San Francisco, CA, USA, January 18-20, 2012. . Optical Document Security - The Conference on Optical Security and Counterfeit Detection III. 2012;","chicago":"Ehlenbröker, Jan-Friedrich, Steffen Priesterjahn, Alexander Drichel, and Volker Lohweg. “Robust ATM PIN Pad Authentication with Coded Features. In: Optical Document Security - The Conference on Optical Security and Counterfeit Detection III, San Francisco, CA, USA, January 18-20, 2012. .” Optical Document Security - The Conference on Optical Security and Counterfeit Detection III, 2012.","ieee":"J.-F. Ehlenbröker, S. Priesterjahn, A. Drichel, and V. Lohweg, “Robust ATM PIN Pad Authentication with Coded Features. In: Optical Document Security - The Conference on Optical Security and Counterfeit Detection III, San Francisco, CA, USA, January 18-20, 2012. ,” Optical Document Security - The Conference on Optical Security and Counterfeit Detection III, 2012.","apa":"Ehlenbröker, J.-F., Priesterjahn, S., Drichel, A., & Lohweg, V. (2012). Robust ATM PIN Pad Authentication with Coded Features. In: Optical Document Security - The Conference on Optical Security and Counterfeit Detection III, San Francisco, CA, USA, January 18-20, 2012. . Optical Document Security - The Conference on Optical Security and Counterfeit Detection III."},"_id":"2103","language":[{"iso":"eng"}],"date_created":"2019-12-03T06:32:37Z","type":"journal_article","publication":"Optical Document Security - The Conference on Optical Security and Counterfeit Detection III","date_updated":"2023-03-15T13:49:38Z","user_id":"45673"},{"abstract":[{"lang":"eng","text":"Maintaining confidence in security documents, especially banknotes, is and remains a major concern for the central banks in order to maintain the stability of the economy around the world. In this paper we describe an image processing and pattern recognition approach which is based on the Sound-of-Intaglio concept [1] for the usage in smart devices such as smartphones. Today, in many world regions smartphones are in use. These devices become more and more computing units, equipped with resource-limited but effective CPUs, cameras with illumination, and flexible operating systems. Hence, it appears to be obvious, to apply those smartphones for banknote authentication, especially for visually impaired persons. However, it has to be researched, whether those devices are capable of processing the data under the constraints of image quality and processing power. Our results show that it is in general possible to use such devices for banknote authentication applications."}],"department":[{"_id":"DEP5023"}],"author":[{"id":"1804","first_name":"Volker","full_name":"Lohweg, Volker","last_name":"Lohweg","orcid":"0000-0002-3325-7887"},{"first_name":"Helene","full_name":"Dörksen, Helene","id":"46416","last_name":"Dörksen"},{"first_name":"Eugen","last_name":"Gillich","id":"1706","full_name":"Gillich, Eugen"},{"id":"1639","full_name":"Hildebrand, Roland","first_name":"Roland","last_name":"Hildebrand"},{"last_name":"Hoffmann","first_name":"Jan Leif","id":"46243","full_name":"Hoffmann, Jan Leif"},{"last_name":"Schaede","first_name":"Johannes","id":"2128","full_name":"Schaede, Johannes"}],"year":2012,"status":"public","title":"Mobile Devices for Banknote Authentication – is it possible? In: Optical Document Security - The Conference on Optical Security and Counterfeit Detection III, San Francisco, CA, USA, January 18-20, 2012. ","citation":{"ieee":"V. Lohweg, H. Dörksen, E. Gillich, R. Hildebrand, J. L. Hoffmann, and J. Schaede, “Mobile Devices for Banknote Authentication – is it possible? In: Optical Document Security - The Conference on Optical Security and Counterfeit Detection III, San Francisco, CA, USA, January 18-20, 2012. ,” Optical Document Security - The Conference on Optical Security and Counterfeit Detection III, 2012.","apa":"Lohweg, V., Dörksen, H., Gillich, E., Hildebrand, R., Hoffmann, J. L., & Schaede, J. (2012). Mobile Devices for Banknote Authentication – is it possible? In: Optical Document Security - The Conference on Optical Security and Counterfeit Detection III, San Francisco, CA, USA, January 18-20, 2012. . Optical Document Security - The Conference on Optical Security and Counterfeit Detection III.","chicago":"Lohweg, Volker, Helene Dörksen, Eugen Gillich, Roland Hildebrand, Jan Leif Hoffmann, and Johannes Schaede. “Mobile Devices for Banknote Authentication – Is It Possible? In: Optical Document Security - The Conference on Optical Security and Counterfeit Detection III, San Francisco, CA, USA, January 18-20, 2012. .” Optical Document Security - The Conference on Optical Security and Counterfeit Detection III, 2012.","ama":"Lohweg V, Dörksen H, Gillich E, Hildebrand R, Hoffmann JL, Schaede J. Mobile Devices for Banknote Authentication – is it possible? In: Optical Document Security - The Conference on Optical Security and Counterfeit Detection III, San Francisco, CA, USA, January 18-20, 2012. . Optical Document Security - The Conference on Optical Security and Counterfeit Detection III. 2012.","van":"Lohweg V, Dörksen H, Gillich E, Hildebrand R, Hoffmann JL, Schaede J. Mobile Devices for Banknote Authentication – is it possible? In: Optical Document Security - The Conference on Optical Security and Counterfeit Detection III, San Francisco, CA, USA, January 18-20, 2012. . Optical Document Security - The Conference on Optical Security and Counterfeit Detection III. 2012;","bjps":"Lohweg V et al. (2012) Mobile Devices for Banknote Authentication – Is It Possible? In: Optical Document Security - The Conference on Optical Security and Counterfeit Detection III, San Francisco, CA, USA, January 18-20, 2012. . Optical Document Security - The Conference on Optical Security and Counterfeit Detection III.","havard":"V. Lohweg, H. Dörksen, E. Gillich, R. Hildebrand, J.L. Hoffmann, J. Schaede, Mobile Devices for Banknote Authentication – is it possible? In: Optical Document Security - The Conference on Optical Security and Counterfeit Detection III, San Francisco, CA, USA, January 18-20, 2012. , Optical Document Security - The Conference on Optical Security and Counterfeit Detection III. (2012).","mla":"Lohweg, Volker, et al. “Mobile Devices for Banknote Authentication – Is It Possible? In: Optical Document Security - The Conference on Optical Security and Counterfeit Detection III, San Francisco, CA, USA, January 18-20, 2012. .” Optical Document Security - The Conference on Optical Security and Counterfeit Detection III, 2012.","ufg":"Lohweg, Volker et. al. (2012): Mobile Devices for Banknote Authentication – is it possible? In: Optical Document Security - The Conference on Optical Security and Counterfeit Detection III, San Francisco, CA, USA, January 18-20, 2012. , in: Optical Document Security - The Conference on Optical Security and Counterfeit Detection III.","short":"V. Lohweg, H. Dörksen, E. Gillich, R. Hildebrand, J.L. Hoffmann, J. Schaede, Optical Document Security - The Conference on Optical Security and Counterfeit Detection III (2012).","chicago-de":"Lohweg, Volker, Helene Dörksen, Eugen Gillich, Roland Hildebrand, Jan Leif Hoffmann und Johannes Schaede. 2012. Mobile Devices for Banknote Authentication – is it possible? In: Optical Document Security - The Conference on Optical Security and Counterfeit Detection III, San Francisco, CA, USA, January 18-20, 2012. . Optical Document Security - The Conference on Optical Security and Counterfeit Detection III.","din1505-2-1":"Lohweg, Volker ; Dörksen, Helene ; Gillich, Eugen ; Hildebrand, Roland ; Hoffmann, Jan Leif ; Schaede, Johannes: Mobile Devices for Banknote Authentication – is it possible? In: Optical Document Security - The Conference on Optical Security and Counterfeit Detection III, San Francisco, CA, USA, January 18-20, 2012. . In: Optical Document Security - The Conference on Optical Security and Counterfeit Detection III (2012)"},"_id":"2104","language":[{"iso":"eng"}],"keyword":["authentication","anti-counterfeit features","mobile device","smartphone","wavelet transform","pattern recognition","Sound-of-Intaglio"],"date_created":"2019-12-03T06:34:28Z","type":"journal_article","publication":"Optical Document Security - The Conference on Optical Security and Counterfeit Detection III","date_updated":"2023-03-15T13:49:38Z","user_id":"45673"},{"author":[{"first_name":"Alexander","last_name":"Dicks","full_name":"Dicks, Alexander","id":"1853"},{"first_name":"Martyna","full_name":"Bator, Martyna","id":"46440","last_name":"Bator"},{"first_name":"Volker","full_name":"Lohweg, Volker","last_name":"Lohweg","id":"1804","orcid":"0000-0002-3325-7887"},{"full_name":"Faltinski, Sebastian","last_name":"Faltinski","first_name":"Sebastian"},{"full_name":"Niggemann, Oliver","last_name":"Niggemann","first_name":"Oliver","id":"10876"}],"year":2012,"page":"51-56","status":"public","title":"Cyber-Physical Systems im Maschinen- und Anlagenbau – ein Konzept für die Zukunft?","citation":{"chicago-de":"Dicks, Alexander, Martyna Bator, Volker Lohweg, Sebastian Faltinski und Oliver Niggemann. 2012. Cyber-Physical Systems im Maschinen- und Anlagenbau – ein Konzept für die Zukunft? In: Cyber-Physical Systems – Enabling Multi-Nature Systems (CPMNS), Dresden, April 18, , 51–56. Stuttgart: Fraunhofer-Verlag.","din1505-2-1":"Dicks, Alexander ; Bator, Martyna ; Lohweg, Volker ; Faltinski, Sebastian ; Niggemann, Oliver: Cyber-Physical Systems im Maschinen- und Anlagenbau – ein Konzept für die Zukunft? In: Cyber-Physical Systems – Enabling Multi-Nature Systems (CPMNS), Dresden, April 18, . Stuttgart : Fraunhofer-Verlag, 2012, S. 51–56","short":"A. Dicks, M. Bator, V. Lohweg, S. Faltinski, O. Niggemann, in: Cyber-Physical Systems – Enabling Multi-Nature Systems (CPMNS), Dresden, April 18, , Fraunhofer-Verlag, Stuttgart, 2012, pp. 51–56.","ufg":"Dicks, Alexander et. al. (2012): Cyber-Physical Systems im Maschinen- und Anlagenbau – ein Konzept für die Zukunft?, in: Cyber-Physical Systems – Enabling Multi-Nature Systems (CPMNS), Dresden, April 18, , Stuttgart, S. 51–56.","mla":"Dicks, Alexander, et al. “Cyber-Physical Systems im Maschinen- und Anlagenbau – ein Konzept für die Zukunft?” Cyber-Physical Systems – Enabling Multi-Nature Systems (CPMNS), Dresden, April 18, , Fraunhofer-Verlag, 2012, pp. 51–56.","havard":"A. Dicks, M. Bator, V. Lohweg, S. Faltinski, O. Niggemann, Cyber-Physical Systems im Maschinen- und Anlagenbau – ein Konzept für die Zukunft?, in: Cyber-Physical Systems – Enabling Multi-Nature Systems (CPMNS), Dresden, April 18, , Fraunhofer-Verlag, Stuttgart, 2012: pp. 51–56.","bjps":"Dicks A et al. (2012) Cyber-Physical Systems im Maschinen- und Anlagenbau – ein Konzept für die Zukunft? Cyber-Physical Systems – Enabling Multi-Nature Systems (CPMNS), Dresden, April 18, . Stuttgart: Fraunhofer-Verlag, pp. 51–56.","van":"Dicks A, Bator M, Lohweg V, Faltinski S, Niggemann O. Cyber-Physical Systems im Maschinen- und Anlagenbau – ein Konzept für die Zukunft? In: Cyber-Physical Systems – Enabling Multi-Nature Systems (CPMNS), Dresden, April 18, . Stuttgart: Fraunhofer-Verlag; 2012. p. 51–6.","ama":"Dicks A, Bator M, Lohweg V, Faltinski S, Niggemann O. Cyber-Physical Systems im Maschinen- und Anlagenbau – ein Konzept für die Zukunft? In: Cyber-Physical Systems – Enabling Multi-Nature Systems (CPMNS), Dresden, April 18, . Stuttgart: Fraunhofer-Verlag; 2012:51-56.","chicago":"Dicks, Alexander, Martyna Bator, Volker Lohweg, Sebastian Faltinski, and Oliver Niggemann. “Cyber-Physical Systems im Maschinen- und Anlagenbau – ein Konzept für die Zukunft?” In Cyber-Physical Systems – Enabling Multi-Nature Systems (CPMNS), Dresden, April 18, , 51–56. Stuttgart: Fraunhofer-Verlag, 2012.","apa":"Dicks, A., Bator, M., Lohweg, V., Faltinski, S., & Niggemann, O. (2012). Cyber-Physical Systems im Maschinen- und Anlagenbau – ein Konzept für die Zukunft? In Cyber-Physical Systems – Enabling Multi-Nature Systems (CPMNS), Dresden, April 18, (pp. 51–56). Stuttgart: Fraunhofer-Verlag.","ieee":"A. Dicks, M. Bator, V. Lohweg, S. Faltinski, and O. Niggemann, “Cyber-Physical Systems im Maschinen- und Anlagenbau – ein Konzept für die Zukunft?,” in Cyber-Physical Systems – Enabling Multi-Nature Systems (CPMNS), Dresden, April 18, , 2012, pp. 51–56."},"language":[{"iso":"ger"}],"date_created":"2019-12-03T06:37:27Z","publication":"Cyber-Physical Systems – Enabling Multi-Nature Systems (CPMNS), Dresden, April 18, ","publication_identifier":{"isbn":["978-3-8396-0398-7 "]},"date_updated":"2023-03-15T13:49:38Z","file_date_updated":"2019-12-03T06:39:10Z","department":[{"_id":"DEP5023"}],"ddc":["620"],"publisher":"Fraunhofer-Verlag","file":[{"access_level":"closed","file_id":"2106","file_size":314865,"file_name":"lohweg_cyber.pdf","date_created":"2019-12-03T06:39:10Z","content_type":"application/pdf","creator":"6bl-f5s","relation":"main_file","date_updated":"2019-12-03T06:39:10Z"}],"publication_status":"published","has_accepted_license":"1","place":"Stuttgart","_id":"2105","type":"conference","user_id":"45673"},{"type":"conference","date_created":"2019-12-03T06:40:20Z","publication_identifier":{"issn":["2327-1671 "],"eisbn":["978-1-4673-1878-5"],"eissn":["2327-1698 "],"isbn":["978-1-4673-1877-8"]},"publication":"IEEE CIP 2012, Third International Workshop on Cognitive Information Processing, May 28-30 2012, Parador de Baiona, Spain","date_updated":"2023-03-15T13:49:38Z","user_id":"45673","language":[{"iso":"eng"}],"keyword":["Sensor phenomena and characterization","Production","Sensor fusion","Fuzzy set theory","Conferences","Possibility theory"],"doi":"10.1109/CIP.2012.6232905","_id":"2107","title":"An Extended Perspective on Evidential Aggregation Rules in Machine Conditioning","publication_status":"published","citation":{"din1505-2-1":"Mönks, Uwe ; Voth, Karl ; Lohweg, Volker: An Extended Perspective on Evidential Aggregation Rules in Machine Conditioning. In: IEEE CIP 2012, Third International Workshop on Cognitive Information Processing, May 28-30 2012, Parador de Baiona, Spain, 2012","chicago-de":"Mönks, Uwe, Karl Voth und Volker Lohweg. 2012. An Extended Perspective on Evidential Aggregation Rules in Machine Conditioning. In: IEEE CIP 2012, Third International Workshop on Cognitive Information Processing, May 28-30 2012, Parador de Baiona, Spain. doi:10.1109/CIP.2012.6232905, .","short":"U. Mönks, K. Voth, V. Lohweg, in: IEEE CIP 2012, Third International Workshop on Cognitive Information Processing, May 28-30 2012, Parador de Baiona, Spain, 2012.","ufg":"Mönks, Uwe et. al. (2012): An Extended Perspective on Evidential Aggregation Rules in Machine Conditioning, in: IEEE CIP 2012, Third International Workshop on Cognitive Information Processing, May 28-30 2012, Parador de Baiona, Spain.","mla":"Mönks, Uwe, et al. “An Extended Perspective on Evidential Aggregation Rules in Machine Conditioning.” IEEE CIP 2012, Third International Workshop on Cognitive Information Processing, May 28-30 2012, Parador de Baiona, Spain, 2012, doi:10.1109/CIP.2012.6232905.","bjps":"Mönks U, Voth K and Lohweg V (2012) An Extended Perspective on Evidential Aggregation Rules in Machine Conditioning. IEEE CIP 2012, Third International Workshop on Cognitive Information Processing, May 28-30 2012, Parador de Baiona, Spain.","havard":"U. Mönks, K. Voth, V. Lohweg, An Extended Perspective on Evidential Aggregation Rules in Machine Conditioning, in: IEEE CIP 2012, Third International Workshop on Cognitive Information Processing, May 28-30 2012, Parador de Baiona, Spain, 2012.","van":"Mönks U, Voth K, Lohweg V. An Extended Perspective on Evidential Aggregation Rules in Machine Conditioning. In: IEEE CIP 2012, Third International Workshop on Cognitive Information Processing, May 28-30 2012, Parador de Baiona, Spain. 2012.","chicago":"Mönks, Uwe, Karl Voth, and Volker Lohweg. “An Extended Perspective on Evidential Aggregation Rules in Machine Conditioning.” In IEEE CIP 2012, Third International Workshop on Cognitive Information Processing, May 28-30 2012, Parador de Baiona, Spain, 2012. https://doi.org/10.1109/CIP.2012.6232905.","apa":"Mönks, U., Voth, K., & Lohweg, V. (2012). An Extended Perspective on Evidential Aggregation Rules in Machine Conditioning. In IEEE CIP 2012, Third International Workshop on Cognitive Information Processing, May 28-30 2012, Parador de Baiona, Spain. https://doi.org/10.1109/CIP.2012.6232905","ama":"Mönks U, Voth K, Lohweg V. An Extended Perspective on Evidential Aggregation Rules in Machine Conditioning. In: IEEE CIP 2012, Third International Workshop on Cognitive Information Processing, May 28-30 2012, Parador de Baiona, Spain. ; 2012. doi:10.1109/CIP.2012.6232905","ieee":"U. Mönks, K. Voth, and V. Lohweg, “An Extended Perspective on Evidential Aggregation Rules in Machine Conditioning,” in IEEE CIP 2012, Third International Workshop on Cognitive Information Processing, May 28-30 2012, Parador de Baiona, Spain, 2012."},"department":[{"_id":"DEP5023"}],"author":[{"id":"1825","first_name":"Uwe","full_name":"Mönks, Uwe","last_name":"Mönks"},{"first_name":"Karl","last_name":"Voth","full_name":"Voth, Karl"},{"orcid":"0000-0002-3325-7887","id":"1804","first_name":"Volker","last_name":"Lohweg","full_name":"Lohweg, Volker"}],"year":2012,"main_file_link":[{"url":"https://ieeexplore.ieee.org/abstract/document/6232905/keywords#keywords"}],"abstract":[{"lang":"eng","text":"In this paper we propose a novel, extended perspective on evidential aggregation rules in machine condition monitoring. First, aspects regarding the interconnections between Dempster-Shafer, Fuzzy Set, and Possibility Theory are shown. Subsequently, a novel approach for direct determination of basic probability assignments using Fuzzy membership functions is proposed. Finally, it is applied to a pipe extrusion line's condition monitoring system, considering and reducing pairwise conflicts."}],"status":"public"},{"year":2012,"author":[{"orcid":"0000-0002-3325-7887","first_name":"Volker","id":"1804","full_name":"Lohweg, Volker","last_name":"Lohweg"}],"department":[{"_id":"DEP5023"}],"abstract":[{"lang":"ger","text":"1. Forum Produktion im Maschinenbau NRW, Herausforderungen und Produktionsstrategien für den mittelständischen Maschinenbau im globalen Wettbewerb, 14. Juni 2012, Vortrag, Miele Cie. KG, Gütersloh"}],"status":"public","title":"QS in der Produktion durch Industrielle Bildverarbeitung, 1. Forum Produktion im Maschinenbau NRW, Herausforderungen und Produktionsstrategien für den mittelständischen Maschinenbau im globalen Wettbewerb, 14. Juni 2012, Vortrag, Gütersloh","citation":{"short":"V. 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Forum Produktion Im Maschinenbau NRW, Herausforderungen Und Produktionsstrategien Für Den Mittelständischen Maschinenbau Im Globalen Wettbewerb, 14. Juni 2012, Vortrag, Gütersloh,” 2012.","van":"Lohweg V. QS in der Produktion durch Industrielle Bildverarbeitung, 1. Forum Produktion im Maschinenbau NRW, Herausforderungen und Produktionsstrategien für den mittelständischen Maschinenbau im globalen Wettbewerb, 14. Juni 2012, Vortrag, Gütersloh. 2012.","mla":"Lohweg, Volker. QS in Der Produktion Durch Industrielle Bildverarbeitung, 1. Forum Produktion Im Maschinenbau NRW, Herausforderungen Und Produktionsstrategien Für Den Mittelständischen Maschinenbau Im Globalen Wettbewerb, 14. Juni 2012, Vortrag, Gütersloh. 2012.","havard":"V. Lohweg, QS in der Produktion durch Industrielle Bildverarbeitung, 1. Forum Produktion im Maschinenbau NRW, Herausforderungen und Produktionsstrategien für den mittelständischen Maschinenbau im globalen Wettbewerb, 14. Juni 2012, Vortrag, Gütersloh, (2012).","bjps":"Lohweg V (2012) QS in Der Produktion Durch Industrielle Bildverarbeitung, 1. Forum Produktion Im Maschinenbau NRW, Herausforderungen Und Produktionsstrategien Für Den Mittelständischen Maschinenbau Im Globalen Wettbewerb, 14. Juni 2012, Vortrag, Gütersloh.","ufg":"Lohweg, Volker (2012): QS in der Produktion durch Industrielle Bildverarbeitung, 1. Forum Produktion im Maschinenbau NRW, Herausforderungen und Produktionsstrategien für den mittelständischen Maschinenbau im globalen Wettbewerb, 14. Juni 2012, Vortrag, Gütersloh.","ieee":"V. Lohweg, “QS in der Produktion durch Industrielle Bildverarbeitung, 1. Forum Produktion im Maschinenbau NRW, Herausforderungen und Produktionsstrategien für den mittelständischen Maschinenbau im globalen Wettbewerb, 14. Juni 2012, Vortrag, Gütersloh.” 2012.","ama":"Lohweg V. QS in der Produktion durch Industrielle Bildverarbeitung, 1. 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Authentifikation von Banknoten - Müssen Banknoten Intelligent Werden?, 5. Executive Technology Meeting, Wincor World 2012, Vortrag, 18.10.2012, A2 Forum, Rheda-Wiedenbrück. 2012.","havard":"V. Lohweg, Authentifikation von Banknoten - Müssen Banknoten intelligent werden?, 5. Executive Technology Meeting, Wincor World 2012, Vortrag, 18.10.2012, A2 Forum, Rheda-Wiedenbrück, (2012).","bjps":"Lohweg V (2012) Authentifikation von Banknoten - Müssen Banknoten Intelligent Werden?, 5. Executive Technology Meeting, Wincor World 2012, Vortrag, 18.10.2012, A2 Forum, Rheda-Wiedenbrück.","ufg":"Lohweg, Volker (2012): Authentifikation von Banknoten - Müssen Banknoten intelligent werden?, 5. Executive Technology Meeting, Wincor World 2012, Vortrag, 18.10.2012, A2 Forum, Rheda-Wiedenbrück.","apa":"Lohweg, V. (2012). Authentifikation von Banknoten - Müssen Banknoten intelligent werden?, 5. Executive Technology Meeting, Wincor World 2012, Vortrag, 18.10.2012, A2 Forum, Rheda-Wiedenbrück.","chicago":"Lohweg, Volker. “Authentifikation von Banknoten - Müssen Banknoten Intelligent Werden?, 5. Executive Technology Meeting, Wincor World 2012, Vortrag, 18.10.2012, A2 Forum, Rheda-Wiedenbrück,” 2012."}},{"_id":"2111","place":"Bad Salzuflen","language":[{"iso":"eng"}],"publication":"Forum Maschinenbau Kompakt","date_created":"2019-12-03T06:48:24Z","type":"conference","user_id":"45673","date_updated":"2023-03-15T13:49:38Z","author":[{"orcid":"0000-0002-3325-7887","first_name":"Volker","last_name":"Lohweg","id":"1804","full_name":"Lohweg, Volker"}],"year":2012,"department":[{"_id":"DEP5023"}],"status":"public","title":"Vom Produkt zum Prozess - Qualitätssicherung in der Produktion durch industrielle Bildverarbeitung und Mustererkennung","citation":{"din1505-2-1":"Lohweg, Volker: Vom Produkt zum Prozess - Qualitätssicherung in der Produktion durch industrielle Bildverarbeitung und Mustererkennung. In: Forum Maschinenbau Kompakt. Bad Salzuflen, 2012","chicago-de":"Lohweg, Volker. 2012. 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Lohweg, Vom Produkt zum Prozess - Qualitätssicherung in der Produktion durch industrielle Bildverarbeitung und Mustererkennung, in: Forum Maschinenbau Kompakt, Bad Salzuflen, 2012.","van":"Lohweg V. Vom Produkt zum Prozess - Qualitätssicherung in der Produktion durch industrielle Bildverarbeitung und Mustererkennung. In: Forum Maschinenbau Kompakt. Bad Salzuflen; 2012.","chicago":"Lohweg, Volker. “Vom Produkt Zum Prozess - Qualitätssicherung in Der Produktion Durch Industrielle Bildverarbeitung Und Mustererkennung.” In Forum Maschinenbau Kompakt. Bad Salzuflen, 2012.","apa":"Lohweg, V. (2012). Vom Produkt zum Prozess - Qualitätssicherung in der Produktion durch industrielle Bildverarbeitung und Mustererkennung. In Forum Maschinenbau Kompakt. Bad Salzuflen.","ama":"Lohweg V. Vom Produkt zum Prozess - Qualitätssicherung in der Produktion durch industrielle Bildverarbeitung und Mustererkennung. In: Forum Maschinenbau Kompakt. Bad Salzuflen; 2012.","ieee":"V. Lohweg, “Vom Produkt zum Prozess - Qualitätssicherung in der Produktion durch industrielle Bildverarbeitung und Mustererkennung,” in Forum Maschinenbau Kompakt, 2012."}},{"date_created":"2019-12-03T06:49:14Z","type":"conference_editor","publication_identifier":{"isbn":["978-3-9814062-3-8"]},"editor":[{"last_name":"Lohweg","full_name":"Lohweg, Volker","id":"1804","first_name":"Volker","orcid":"0000-0002-3325-7887"}],"date_updated":"2023-03-15T13:49:38Z","user_id":"45673","_id":"2112","language":[{"iso":"eng"}],"title":"Tagungsband \"Bildverarbeitung in der Automation - BVAu2012\"","citation":{"short":"V. Lohweg, ed., Tagungsband “Bildverarbeitung in Der Automation - BVAu2012,” inIT - Institut für industrielle Imformationstechnik, ISBN 978-3-9814062-3-8, 2012.","chicago-de":"Lohweg, Volker, Hrsg. 2012. Tagungsband „Bildverarbeitung in der Automation - BVAu2012“. inIT - Institut für industrielle Imformationstechnik, ISBN 978-3-9814062-3-8.","din1505-2-1":"Lohweg, V. 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Tagungsband “Bildverarbeitung in Der Automation - BVAu2012.” inIT - Institut für industrielle Imformationstechnik, ISBN 978-3-9814062-3-8, 2012.","ufg":"Lohweg, Volker (Hg.) (2012): Tagungsband „Bildverarbeitung in der Automation - BVAu2012“.","ieee":"V. Lohweg, Ed., Tagungsband “Bildverarbeitung in der Automation - BVAu2012.” inIT - Institut für industrielle Imformationstechnik, ISBN 978-3-9814062-3-8, 2012.","apa":"Lohweg, V. (Ed.). (2012). Tagungsband “Bildverarbeitung in der Automation - BVAu2012.” inIT - Institut für industrielle Imformationstechnik, ISBN 978-3-9814062-3-8.","chicago":"Lohweg, Volker, ed. Tagungsband “Bildverarbeitung in Der Automation - BVAu2012.” inIT - Institut für industrielle Imformationstechnik, ISBN 978-3-9814062-3-8, 2012."},"department":[{"_id":"DEP5023"}],"year":2012,"publisher":"inIT - Institut für industrielle Imformationstechnik, ISBN 978-3-9814062-3-8","status":"public"},{"citation":{"chicago-de":"Hempel, Arne-Jens, Holger Hähnel, Uwe Mönks und Volker Lohweg. 2012. SVM-integrated Fuzzy Pattern Classification for Nonconvex Data-Inherent Structures Applied to Banknote Authentication. In: BVAu 2012 - 3. Jahresolloquium „Bildverarbeitung in der Automation“ Centrum Industrial IT, Lemgo,. inIT-Institut für industrielle Informationstechnik.","din1505-2-1":"Hempel, Arne-Jens ; Hähnel, Holger ; Mönks, Uwe ; Lohweg, Volker: SVM-integrated Fuzzy Pattern Classification for Nonconvex Data-Inherent Structures Applied to Banknote Authentication. In: BVAu 2012 - 3. Jahresolloquium „Bildverarbeitung in der Automation“ Centrum Industrial IT, Lemgo, : inIT-Institut für industrielle Informationstechnik, 2012","short":"A.-J. Hempel, H. Hähnel, U. Mönks, V. Lohweg, in: BVAu 2012 - 3. Jahresolloquium “Bildverarbeitung in Der Automation” Centrum Industrial IT, Lemgo, inIT-Institut für industrielle Informationstechnik, 2012.","havard":"A.-J. Hempel, H. Hähnel, U. Mönks, V. Lohweg, SVM-integrated Fuzzy Pattern Classification for Nonconvex Data-Inherent Structures Applied to Banknote Authentication, in: BVAu 2012 - 3. Jahresolloquium “Bildverarbeitung in Der Automation” Centrum Industrial IT, Lemgo, inIT-Institut für industrielle Informationstechnik, 2012.","bjps":"Hempel A-J et al. (2012) SVM-Integrated Fuzzy Pattern Classification for Nonconvex Data-Inherent Structures Applied to Banknote Authentication. BVAu 2012 - 3. Jahresolloquium ‘Bildverarbeitung in Der Automation’ Centrum Industrial IT, Lemgo,. inIT-Institut für industrielle Informationstechnik.","mla":"Hempel, Arne-Jens, et al. “SVM-Integrated Fuzzy Pattern Classification for Nonconvex Data-Inherent Structures Applied to Banknote Authentication.” BVAu 2012 - 3. Jahresolloquium “Bildverarbeitung in Der Automation” Centrum Industrial IT, Lemgo, inIT-Institut für industrielle Informationstechnik, 2012.","ufg":"Hempel, Arne-Jens et. al. (2012): SVM-integrated Fuzzy Pattern Classification for Nonconvex Data-Inherent Structures Applied to Banknote Authentication, in: BVAu 2012 - 3. Jahresolloquium „Bildverarbeitung in der Automation“ Centrum Industrial IT, Lemgo,.","van":"Hempel A-J, Hähnel H, Mönks U, Lohweg V. SVM-integrated Fuzzy Pattern Classification for Nonconvex Data-Inherent Structures Applied to Banknote Authentication. In: BVAu 2012 - 3 Jahresolloquium “Bildverarbeitung in der Automation” Centrum Industrial IT, Lemgo,. inIT-Institut für industrielle Informationstechnik; 2012.","chicago":"Hempel, Arne-Jens, Holger Hähnel, Uwe Mönks, and Volker Lohweg. “SVM-Integrated Fuzzy Pattern Classification for Nonconvex Data-Inherent Structures Applied to Banknote Authentication.” In BVAu 2012 - 3. Jahresolloquium “Bildverarbeitung in Der Automation” Centrum Industrial IT, Lemgo,. inIT-Institut für industrielle Informationstechnik, 2012.","apa":"Hempel, A.-J., Hähnel, H., Mönks, U., & Lohweg, V. (2012). SVM-integrated Fuzzy Pattern Classification for Nonconvex Data-Inherent Structures Applied to Banknote Authentication. In BVAu 2012 - 3. Jahresolloquium “Bildverarbeitung in der Automation” Centrum Industrial IT, Lemgo,. inIT-Institut für industrielle Informationstechnik.","ama":"Hempel A-J, Hähnel H, Mönks U, Lohweg V. SVM-integrated Fuzzy Pattern Classification for Nonconvex Data-Inherent Structures Applied to Banknote Authentication. In: BVAu 2012 - 3. Jahresolloquium “Bildverarbeitung in Der Automation” Centrum Industrial IT, Lemgo,. inIT-Institut für industrielle Informationstechnik; 2012.","ieee":"A.-J. Hempel, H. Hähnel, U. Mönks, and V. Lohweg, “SVM-integrated Fuzzy Pattern Classification for Nonconvex Data-Inherent Structures Applied to Banknote Authentication,” in BVAu 2012 - 3. Jahresolloquium “Bildverarbeitung in der Automation” Centrum Industrial IT, Lemgo, 2012."},"title":"SVM-integrated Fuzzy Pattern Classification for Nonconvex Data-Inherent Structures Applied to Banknote Authentication","status":"public","publisher":"inIT-Institut für industrielle Informationstechnik","year":2012,"author":[{"last_name":"Hempel","first_name":"Arne-Jens","full_name":"Hempel, Arne-Jens"},{"last_name":"Hähnel","full_name":"Hähnel, Holger","first_name":"Holger"},{"last_name":"Mönks","first_name":"Uwe","id":"1825","full_name":"Mönks, Uwe"},{"first_name":"Volker","id":"1804","last_name":"Lohweg","full_name":"Lohweg, Volker","orcid":"0000-0002-3325-7887"}],"department":[{"_id":"DEP5023"}],"abstract":[{"lang":"eng","text":"In this paper, we sketch an idea for the integration of singleclass support vector machines (SVM) into fuzzy class learning. As result,we obtain robust and transparent rule-based fuzzy classification models suitable for online-classification tasks. In particular, the singleclass SVM is employed to extend the applicability of convex fuzzy classifica-tion models to nonconvex datainherent structures. The key point of thisextension is the preservation of the interpretability for both, the classlearning and the classification process. The feasibility of the approach isdemonstrated in the context of a banknote authentication application."}],"user_id":"45673","date_updated":"2023-03-15T13:49:38Z","publication":"BVAu 2012 - 3. Jahresolloquium \"Bildverarbeitung in der Automation\" Centrum Industrial IT, Lemgo,","type":"conference","date_created":"2019-12-03T06:50:52Z","keyword":["fuzzy classification","pattern recognition","single-class support vector machine","data mining"],"language":[{"iso":"eng"}],"_id":"2113"},{"department":[{"_id":"DEP5023"}],"year":2012,"author":[{"full_name":"Ehlenbröker, Jan-Friedrich","last_name":"Ehlenbröker","id":"1852","first_name":"Jan-Friedrich"},{"orcid":"0000-0002-3325-7887","id":"1804","first_name":"Volker","last_name":"Lohweg","full_name":"Lohweg, Volker"}],"ddc":["600"],"abstract":[{"lang":"eng","text":"Since the development of the first computers (and even before), there is a steady growth of available digital data and information. E.g. estimations say that the amount of digital information will grow about 50 percent in the year 2012 compared to the year 2011. Following the rising availability of digital data, there is also an inherent need for methods to transport these data, as the data is to be used and processed at some time. Many methods and channels are available for the transportation of these digital data. This research work presents the foundation work for the new microIDENT coding (2D-code) for document authentication. As a coding for document authentication it is one objective of microIDENT, to increase the difficulty of copying a document without the destruction of the coding. The new coding requires, in comparison to other 2D-codes, less space when printed. This is achieved by omitting some of the features that are used in standard 2D-codes for stabilisation and that are necessary in a mobile environment. In addition, we will also show that this new 2D-code delivers, under certain constraints, a better performance than other 2D-codes. "}],"status":"public","publisher":"inIT-Institut für industrielle Informationstechnik","title":"Video-Based Data Transfer for Document Authentication","file":[{"access_level":"closed","creator":"6bl-f5s","relation":"main_file","date_updated":"2019-12-03T06:54:49Z","date_created":"2019-12-03T06:54:49Z","content_type":"application/pdf","file_name":"lohweg_viedo.pdf","file_id":"2115","file_size":551584}],"publication_status":"published","citation":{"din1505-2-1":"Ehlenbröker, Jan-Friedrich ; Lohweg, Volker: Video-Based Data Transfer for Document Authentication. In: BVAu 2012 - 3. Jahresolloquium „Bildverarbeitung in der Automation“ Centrum Industrial IT, Lemgo, : inIT-Institut für industrielle Informationstechnik, 2012","chicago-de":"Ehlenbröker, Jan-Friedrich und Volker Lohweg. 2012. Video-Based Data Transfer for Document Authentication. In: BVAu 2012 - 3. Jahresolloquium „Bildverarbeitung in der Automation“ Centrum Industrial IT, Lemgo,. inIT-Institut für industrielle Informationstechnik.","short":"J.-F. Ehlenbröker, V. Lohweg, in: BVAu 2012 - 3. Jahresolloquium “Bildverarbeitung in Der Automation” Centrum Industrial IT, Lemgo, inIT-Institut für industrielle Informationstechnik, 2012.","chicago":"Ehlenbröker, Jan-Friedrich, and Volker Lohweg. “Video-Based Data Transfer for Document Authentication.” In BVAu 2012 - 3. Jahresolloquium “Bildverarbeitung in Der Automation” Centrum Industrial IT, Lemgo,. inIT-Institut für industrielle Informationstechnik, 2012.","apa":"Ehlenbröker, J.-F., & Lohweg, V. (2012). Video-Based Data Transfer for Document Authentication. In BVAu 2012 - 3. Jahresolloquium “Bildverarbeitung in der Automation” Centrum Industrial IT, Lemgo,. inIT-Institut für industrielle Informationstechnik.","ieee":"J.-F. Ehlenbröker and V. Lohweg, “Video-Based Data Transfer for Document Authentication,” in BVAu 2012 - 3. Jahresolloquium “Bildverarbeitung in der Automation” Centrum Industrial IT, Lemgo, 2012.","ufg":"Ehlenbröker, Jan-Friedrich/Lohweg, Volker (2012): Video-Based Data Transfer for Document Authentication, in: BVAu 2012 - 3. Jahresolloquium „Bildverarbeitung in der Automation“ Centrum Industrial IT, Lemgo,.","havard":"J.-F. Ehlenbröker, V. Lohweg, Video-Based Data Transfer for Document Authentication, in: BVAu 2012 - 3. Jahresolloquium “Bildverarbeitung in Der Automation” Centrum Industrial IT, Lemgo, inIT-Institut für industrielle Informationstechnik, 2012.","mla":"Ehlenbröker, Jan-Friedrich, and Volker Lohweg. “Video-Based Data Transfer for Document Authentication.” BVAu 2012 - 3. Jahresolloquium “Bildverarbeitung in Der Automation” Centrum Industrial IT, Lemgo, inIT-Institut für industrielle Informationstechnik, 2012.","bjps":"Ehlenbröker J-F and Lohweg V (2012) Video-Based Data Transfer for Document Authentication. BVAu 2012 - 3. Jahresolloquium ‘Bildverarbeitung in Der Automation’ Centrum Industrial IT, Lemgo,. inIT-Institut für industrielle Informationstechnik.","van":"Ehlenbröker J-F, Lohweg V. Video-Based Data Transfer for Document Authentication. In: BVAu 2012 - 3 Jahresolloquium “Bildverarbeitung in der Automation” Centrum Industrial IT, Lemgo,. inIT-Institut für industrielle Informationstechnik; 2012.","ama":"Ehlenbröker J-F, Lohweg V. Video-Based Data Transfer for Document Authentication. In: BVAu 2012 - 3. Jahresolloquium “Bildverarbeitung in Der Automation” Centrum Industrial IT, Lemgo,. inIT-Institut für industrielle Informationstechnik; 2012."},"has_accepted_license":"1","language":[{"iso":"eng"}],"keyword":["Authentifikation","Automation","Datentransfer","Digitale Daten","Zerstörung"],"_id":"2114","date_created":"2019-12-03T06:53:56Z","type":"conference","publication_identifier":{"isbn":["978-3-9814062-3-8"]},"publication":"BVAu 2012 - 3. Jahresolloquium \"Bildverarbeitung in der Automation\" Centrum Industrial IT, Lemgo,","date_updated":"2023-03-15T13:49:38Z","user_id":"45673","file_date_updated":"2019-12-03T06:54:49Z"},{"publication_status":"published","citation":{"chicago-de":"Gillich, Eugen, Roland Hildebrand, Jan Leif Hoffmann, Helene Dörksen und Volker Lohweg. 2012. Smartphones as Smart Cameras – Is It Possible? In: BVAu 2012 - 3. Jahreskolloquium „Bildverarbeitung in der Automation“ Centrum Industrial IT, Lemgo,. inIT-Institut für industrielle Informationstechnik.","din1505-2-1":"Gillich, Eugen ; Hildebrand, Roland ; Hoffmann, Jan Leif ; Dörksen, Helene ; Lohweg, Volker: Smartphones as Smart Cameras – Is It Possible? In: BVAu 2012 - 3. Jahreskolloquium „Bildverarbeitung in der Automation“ Centrum Industrial IT, Lemgo, : inIT-Institut für industrielle Informationstechnik, 2012","short":"E. Gillich, R. Hildebrand, J.L. Hoffmann, H. Dörksen, V. Lohweg, in: BVAu 2012 - 3. Jahreskolloquium “Bildverarbeitung in Der Automation” Centrum Industrial IT, Lemgo, inIT-Institut für industrielle Informationstechnik, 2012.","chicago":"Gillich, Eugen, Roland Hildebrand, Jan Leif Hoffmann, Helene Dörksen, and Volker Lohweg. “Smartphones as Smart Cameras – Is It Possible?” In BVAu 2012 - 3. Jahreskolloquium “Bildverarbeitung in Der Automation” Centrum Industrial IT, Lemgo,. inIT-Institut für industrielle Informationstechnik, 2012.","apa":"Gillich, E., Hildebrand, R., Hoffmann, J. L., Dörksen, H., & Lohweg, V. (2012). Smartphones as Smart Cameras – Is It Possible? In BVAu 2012 - 3. Jahreskolloquium “Bildverarbeitung in der Automation” Centrum Industrial IT, Lemgo,. inIT-Institut für industrielle Informationstechnik.","ieee":"E. Gillich, R. Hildebrand, J. L. Hoffmann, H. Dörksen, and V. Lohweg, “Smartphones as Smart Cameras – Is It Possible?,” in BVAu 2012 - 3. Jahreskolloquium “Bildverarbeitung in der Automation” Centrum Industrial IT, Lemgo, 2012.","ufg":"Gillich, Eugen et. al. (2012): Smartphones as Smart Cameras – Is It Possible?, in: BVAu 2012 - 3. Jahreskolloquium „Bildverarbeitung in der Automation“ Centrum Industrial IT, Lemgo,.","bjps":"Gillich E et al. (2012) Smartphones as Smart Cameras – Is It Possible? BVAu 2012 - 3. Jahreskolloquium ‘Bildverarbeitung in Der Automation’ Centrum Industrial IT, Lemgo,. inIT-Institut für industrielle Informationstechnik.","havard":"E. Gillich, R. Hildebrand, J.L. Hoffmann, H. Dörksen, V. Lohweg, Smartphones as Smart Cameras – Is It Possible?, in: BVAu 2012 - 3. Jahreskolloquium “Bildverarbeitung in Der Automation” Centrum Industrial IT, Lemgo, inIT-Institut für industrielle Informationstechnik, 2012.","mla":"Gillich, Eugen, et al. “Smartphones as Smart Cameras – Is It Possible?” BVAu 2012 - 3. Jahreskolloquium “Bildverarbeitung in Der Automation” Centrum Industrial IT, Lemgo, inIT-Institut für industrielle Informationstechnik, 2012.","van":"Gillich E, Hildebrand R, Hoffmann JL, Dörksen H, Lohweg V. Smartphones as Smart Cameras – Is It Possible? In: BVAu 2012 - 3 Jahreskolloquium “Bildverarbeitung in der Automation” Centrum Industrial IT, Lemgo,. inIT-Institut für industrielle Informationstechnik; 2012.","ama":"Gillich E, Hildebrand R, Hoffmann JL, Dörksen H, Lohweg V. Smartphones as Smart Cameras – Is It Possible? In: BVAu 2012 - 3. Jahreskolloquium “Bildverarbeitung in Der Automation” Centrum Industrial IT, Lemgo,. inIT-Institut für industrielle Informationstechnik; 2012."},"title":"Smartphones as Smart Cameras – Is It Possible?","status":"public","publisher":"inIT-Institut für industrielle Informationstechnik","department":[{"_id":"DEP5023"}],"author":[{"full_name":"Gillich, Eugen","first_name":"Eugen","id":"1706","last_name":"Gillich"},{"id":"1639","first_name":"Roland","full_name":"Hildebrand, Roland","last_name":"Hildebrand"},{"id":"46243","first_name":"Jan Leif","full_name":"Hoffmann, Jan Leif","last_name":"Hoffmann"},{"last_name":"Dörksen","first_name":"Helene","id":"46416","full_name":"Dörksen, Helene"},{"full_name":"Lohweg, Volker","id":"1804","last_name":"Lohweg","first_name":"Volker","orcid":"0000-0002-3325-7887"}],"year":2012,"abstract":[{"text":"Favored by hardware development, since the mid-2000s, cameras can be found in mobile phones. With the advent of the Apple iPhonethey are equipped with a multi-touch high-resolution display. Their included battery and low costs make them attractive for smart cameraapplications. This paper shows several scenarios, in which advantagesand disadvantages of smartphones are inspected. A real-life applicationis given, which shows that a phone of this kind can be used for printinspection and banknote authentication","lang":"eng"}],"date_updated":"2023-03-15T13:49:38Z","user_id":"45673","date_created":"2019-12-03T06:56:37Z","type":"conference","publication":"BVAu 2012 - 3. Jahreskolloquium \"Bildverarbeitung in der Automation\" Centrum Industrial IT, Lemgo,","language":[{"iso":"eng"}],"keyword":["smart camera","smartphones","banknotes","authentication"],"_id":"2116"},{"type":"conference","user_id":"45673","has_accepted_license":"1","_id":"2117","place":"Düsseldorf","file":[{"content_type":"application/pdf","file_name":"lohweg_integration.pdf","date_created":"2019-12-03T07:00:42Z","file_id":"2118","file_size":728201,"relation":"main_file","creator":"6bl-f5s","date_updated":"2019-12-03T07:00:42Z","access_level":"closed"}],"abstract":[{"text":"The present work aims at a statistically motivated parameterisation for a fuzzy classification approach. Its key points are the determination of robust parameterisations for the data-driven fuzzy class learning based an statistical analyses as well as the preservation of the interpretability of the fuzzy class models and the classification process. In particular, order statistics and Monte Carlo methods are used to determine distributions and moments of class border parameters. These distributions and moments are further applied to evaluate the robustness of parameters of the current fuzzy classification model and to propose alternative robust parameterisations. The feasibility of the approach is demonstrated in the context of a machine diagnosis application.","lang":"eng"}],"ddc":["600"],"department":[{"_id":"DEP5023"}],"publisher":"VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA)","publication_identifier":{"isbn":["978-3-86644-917-6"]},"publication":"22. Workshop Computational Intelligence, 06.-7.12.2012, Dortmund ","date_created":"2019-12-03T06:59:40Z","file_date_updated":"2019-12-03T07:00:42Z","editor":[{"last_name":"Hüllermeier","full_name":"Hüllermeier, Eike ","first_name":"Eike "},{"first_name":"Frank","full_name":"Hoffmann, Frank","last_name":"Hoffmann"}],"date_updated":"2023-03-15T13:49:38Z","keyword":["Fuzzy-Regelung"],"language":[{"iso":"eng"}],"title":"Integration of Statistical Analyses for Parametrisation of the Fuzzy Pattern Classification","citation":{"bjps":"Hähnel H et al. (2012) Integration of Statistical Analyses for Parametrisation of the Fuzzy Pattern Classification. In Hüllermeier E and Hoffmann F (eds), 22. Workshop Computational Intelligence, 06.-7.12.2012, Dortmund . Düsseldorf: VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA), pp. 115–131.","mla":"Hähnel, Holger, et al. “Integration of Statistical Analyses for Parametrisation of the Fuzzy Pattern Classification.” 22. Workshop Computational Intelligence, 06.-7.12.2012, Dortmund , edited by Eike Hüllermeier and Frank Hoffmann, VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA), 2012, pp. 115–31.","havard":"H. Hähnel, A.-J. Hempel, U. Mönks, V. Lohweg, Integration of Statistical Analyses for Parametrisation of the Fuzzy Pattern Classification, in: E. Hüllermeier, F. Hoffmann (Eds.), 22. Workshop Computational Intelligence, 06.-7.12.2012, Dortmund , VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA), Düsseldorf, 2012: pp. 115–131.","ufg":"Hähnel, Holger et. al. (2012): Integration of Statistical Analyses for Parametrisation of the Fuzzy Pattern Classification, in: Eike Hüllermeier/Frank Hoffmann (Hgg.): 22. Workshop Computational Intelligence, 06.-7.12.2012, Dortmund , Düsseldorf, S. 115–131.","van":"Hähnel H, Hempel A-J, Mönks U, Lohweg V. Integration of Statistical Analyses for Parametrisation of the Fuzzy Pattern Classification. In: Hüllermeier E, Hoffmann F, editors. 22 Workshop Computational Intelligence, 06-7122012, Dortmund . Düsseldorf: VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA); 2012. p. 115–31.","chicago":"Hähnel, Holger, Arne-Jens Hempel, Uwe Mönks, and Volker Lohweg. “Integration of Statistical Analyses for Parametrisation of the Fuzzy Pattern Classification.” In 22. Workshop Computational Intelligence, 06.-7.12.2012, Dortmund , edited by Eike Hüllermeier and Frank Hoffmann, 115–31. Düsseldorf: VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA), 2012.","apa":"Hähnel, H., Hempel, A.-J., Mönks, U., & Lohweg, V. (2012). Integration of Statistical Analyses for Parametrisation of the Fuzzy Pattern Classification. In E. Hüllermeier & F. Hoffmann (Eds.), 22. Workshop Computational Intelligence, 06.-7.12.2012, Dortmund (pp. 115–131). Düsseldorf: VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA).","din1505-2-1":"Hähnel, Holger ; Hempel, Arne-Jens ; Mönks, Uwe ; Lohweg, Volker: Integration of Statistical Analyses for Parametrisation of the Fuzzy Pattern Classification. In: Hüllermeier, E. ; Hoffmann, F. (Hrsg.): 22. Workshop Computational Intelligence, 06.-7.12.2012, Dortmund . Düsseldorf : VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA), 2012, S. 115–131","chicago-de":"Hähnel, Holger, Arne-Jens Hempel, Uwe Mönks und Volker Lohweg. 2012. Integration of Statistical Analyses for Parametrisation of the Fuzzy Pattern Classification. In: 22. Workshop Computational Intelligence, 06.-7.12.2012, Dortmund , hg. von Eike Hüllermeier und Frank Hoffmann, 115–131. Düsseldorf: VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA).","short":"H. Hähnel, A.-J. Hempel, U. Mönks, V. Lohweg, in: E. Hüllermeier, F. Hoffmann (Eds.), 22. Workshop Computational Intelligence, 06.-7.12.2012, Dortmund , VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA), Düsseldorf, 2012, pp. 115–131.","ama":"Hähnel H, Hempel A-J, Mönks U, Lohweg V. Integration of Statistical Analyses for Parametrisation of the Fuzzy Pattern Classification. In: Hüllermeier E, Hoffmann F, eds. 22. Workshop Computational Intelligence, 06.-7.12.2012, Dortmund . Düsseldorf: VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA); 2012:115-131.","ieee":"H. Hähnel, A.-J. Hempel, U. Mönks, and V. Lohweg, “Integration of Statistical Analyses for Parametrisation of the Fuzzy Pattern Classification,” in 22. Workshop Computational Intelligence, 06.-7.12.2012, Dortmund , 2012, pp. 115–131."},"year":2012,"author":[{"first_name":"Holger","full_name":"Hähnel, Holger","last_name":"Hähnel"},{"first_name":"Arne-Jens","last_name":"Hempel","full_name":"Hempel, Arne-Jens"},{"first_name":"Uwe","last_name":"Mönks","id":"1825","full_name":"Mönks, Uwe"},{"first_name":"Volker","last_name":"Lohweg","full_name":"Lohweg, Volker","id":"1804","orcid":"0000-0002-3325-7887"}],"status":"public","page":"115-131"},{"status":"public","page":"163-177","year":2012,"author":[{"id":"46440","last_name":"Bator","full_name":"Bator, Martyna","first_name":"Martyna"},{"full_name":"Dicks, Alexander","first_name":"Alexander","last_name":"Dicks","id":"1853"},{"first_name":"Uwe","full_name":"Mönks, Uwe","id":"1825","last_name":"Mönks"},{"id":"1804","first_name":"Volker","last_name":"Lohweg","full_name":"Lohweg, Volker","orcid":"0000-0002-3325-7887"}],"citation":{"chicago":"Bator, Martyna, Alexander Dicks, Uwe Mönks, and Volker Lohweg. “Feature Extraction and Reduction Applied to Sensorless Drive Diagnosis.” In 22. Workshop Computational Intelligence, 06.-7.12.2012, Dortmund, edited by Eike Hüllermeier Frank Hoffmann, 163–77. Düsseldorf: VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA), 2012.","apa":"Bator, M., Dicks, A., Mönks, U., & Lohweg, V. (2012). Feature Extraction and Reduction Applied to Sensorless Drive Diagnosis. In E. H. Frank Hoffmann (Ed.), 22. Workshop Computational Intelligence, 06.-7.12.2012, Dortmund (pp. 163–177). Düsseldorf: VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA).","mla":"Bator, Martyna, et al. “Feature Extraction and Reduction Applied to Sensorless Drive Diagnosis.” 22. Workshop Computational Intelligence, 06.-7.12.2012, Dortmund, edited by Eike Hüllermeier Frank Hoffmann, VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA), 2012, pp. 163–77.","havard":"M. Bator, A. Dicks, U. Mönks, V. Lohweg, Feature Extraction and Reduction Applied to Sensorless Drive Diagnosis, in: E.H. Frank Hoffmann (Ed.), 22. Workshop Computational Intelligence, 06.-7.12.2012, Dortmund, VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA), Düsseldorf, 2012: pp. 163–177.","bjps":"Bator M et al. (2012) Feature Extraction and Reduction Applied to Sensorless Drive Diagnosis. In Frank Hoffmann EH (ed.), 22. Workshop Computational Intelligence, 06.-7.12.2012, Dortmund. Düsseldorf: VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA), pp. 163–177.","ufg":"Bator, Martyna et. al. (2012): Feature Extraction and Reduction Applied to Sensorless Drive Diagnosis, in: Eike Hüllermeier Frank Hoffmann (Hg.): 22. Workshop Computational Intelligence, 06.-7.12.2012, Dortmund, Düsseldorf, S. 163–177.","van":"Bator M, Dicks A, Mönks U, Lohweg V. Feature Extraction and Reduction Applied to Sensorless Drive Diagnosis. In: Frank Hoffmann EH, editor. 22 Workshop Computational Intelligence, 06-7122012, Dortmund. Düsseldorf: VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA); 2012. p. 163–77.","chicago-de":"Bator, Martyna, Alexander Dicks, Uwe Mönks und Volker Lohweg. 2012. Feature Extraction and Reduction Applied to Sensorless Drive Diagnosis. In: 22. Workshop Computational Intelligence, 06.-7.12.2012, Dortmund, hg. von Eike Hüllermeier Frank Hoffmann, 163–177. Düsseldorf: VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA).","din1505-2-1":"Bator, Martyna ; Dicks, Alexander ; Mönks, Uwe ; Lohweg, Volker: Feature Extraction and Reduction Applied to Sensorless Drive Diagnosis. In: Frank Hoffmann, E. H. (Hrsg.): 22. Workshop Computational Intelligence, 06.-7.12.2012, Dortmund. Düsseldorf : VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA), 2012, S. 163–177","short":"M. Bator, A. Dicks, U. Mönks, V. Lohweg, in: E.H. Frank Hoffmann (Ed.), 22. Workshop Computational Intelligence, 06.-7.12.2012, Dortmund, VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA), Düsseldorf, 2012, pp. 163–177.","ieee":"M. Bator, A. Dicks, U. Mönks, and V. Lohweg, “Feature Extraction and Reduction Applied to Sensorless Drive Diagnosis,” in 22. Workshop Computational Intelligence, 06.-7.12.2012, Dortmund, 2012, pp. 163–177.","ama":"Bator M, Dicks A, Mönks U, Lohweg V. Feature Extraction and Reduction Applied to Sensorless Drive Diagnosis. In: Frank Hoffmann EH, ed. 22. Workshop Computational Intelligence, 06.-7.12.2012, Dortmund. Düsseldorf: VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA); 2012:163-177."},"title":"Feature Extraction and Reduction Applied to Sensorless Drive Diagnosis","language":[{"iso":"eng"}],"file_date_updated":"2019-12-03T07:03:37Z","editor":[{"last_name":"Frank Hoffmann","first_name":"Eike Hüllermeier","full_name":"Frank Hoffmann, Eike Hüllermeier"}],"date_updated":"2023-03-15T13:49:38Z","publication_identifier":{"isbn":["978-3-86644-917-6"]},"publication":"22. Workshop Computational Intelligence, 06.-7.12.2012, Dortmund","date_created":"2019-12-03T07:02:29Z","publisher":"VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA)","abstract":[{"lang":"eng","text":"In this paper, it is proposed a feature selection procedure based on Linear Discriminant Analysis. The aim behind this approach is to obtain a minimal set of features still enabling a separation between a number of different classes. Additionally, the reduced number of features implies faster computation and enables resource-limited hardware implementations for real-time signal processing applications. Also, incorporating only a small number of features retains the application's interpretability as a feature space of maximum three features can be visualised directly. Due to this, an expert can directly follow a decision system's answer. The proposed method has been evaluated in the context of an electric drive diagnosis application. In this scope, the LDA feature selection approach is at least as good as the benchmarked feature selection methods. When regarding only a minimal number of features, LDA outperforms the other approaches in terms of classification accuracy. As a secondary result. one can see how important a sensible choice of features is. While some arbitrary combinations produce completely inseparable feature spaces. Three are still combinations that can separate the classes even linearly such that no sophisticated classification concept (e.g. SVM) is needed. The authors are aware of the fact that the findings are shown only in the context of one specific application. Based on the work elaborated here, further research towards generalisation of the proposed approach is intended to be carried out. Additionally, the findings shall be examined using classifier concepts different from SVM, such as Fuzzy Pattern Classifiers."}],"ddc":["600"],"department":[{"_id":"DEP5023"}],"file":[{"access_level":"closed","file_name":"lohweg_feature.pdf","date_created":"2019-12-03T07:03:37Z","content_type":"application/pdf","file_id":"2120","file_size":580127,"creator":"6bl-f5s","relation":"main_file","date_updated":"2019-12-03T07:03:37Z"}],"publication_status":"published","_id":"2119","place":"Düsseldorf","has_accepted_license":"1","user_id":"45673","type":"conference"},{"publication_status":"published","citation":{"ama":"Petker D, Türke T, Willeke H, Schaede J, Gillich E, Lohweg V. Real-time Wavelet-Based Inline Banknote-in-Bundle Counting for Cut-and-Bundle Machines. In: IST/SPIE Electronic Imaging 2011 Conference. San Francisco, California, United States; 2011. doi:https://doi.org/10.1117/12.872357","ieee":"D. Petker, T. Türke, H. Willeke, J. Schaede, E. Gillich, and V. Lohweg, “Real-time Wavelet-Based Inline Banknote-in-Bundle Counting for Cut-and-Bundle Machines,” in IST/SPIE Electronic Imaging 2011 Conference, 2011.","short":"D. Petker, T. Türke, H. Willeke, J. Schaede, E. Gillich, V. Lohweg, in: IST/SPIE Electronic Imaging 2011 Conference, San Francisco, California, United States, 2011.","chicago-de":"Petker, Denis, Thomas Türke, Harald Willeke, Johannes Schaede, Eugen Gillich und Volker Lohweg. 2011. Real-time Wavelet-Based Inline Banknote-in-Bundle Counting for Cut-and-Bundle Machines. In: IST/SPIE Electronic Imaging 2011 Conference. San Francisco, California, United States. doi:https://doi.org/10.1117/12.872357, .","din1505-2-1":"Petker, Denis ; Türke, Thomas ; Willeke, Harald ; Schaede, Johannes ; Gillich, Eugen ; Lohweg, Volker: Real-time Wavelet-Based Inline Banknote-in-Bundle Counting for Cut-and-Bundle Machines. In: IST/SPIE Electronic Imaging 2011 Conference : San Francisco, California, United States, 2011","van":"Petker D, Türke T, Willeke H, Schaede J, Gillich E, Lohweg V. Real-time Wavelet-Based Inline Banknote-in-Bundle Counting for Cut-and-Bundle Machines. In: IST/SPIE Electronic Imaging 2011 Conference. San Francisco, California, United States; 2011.","mla":"Petker, Denis, et al. “Real-Time Wavelet-Based Inline Banknote-in-Bundle Counting for Cut-and-Bundle Machines.” IST/SPIE Electronic Imaging 2011 Conference, San Francisco, California, United States, 2011, doi:https://doi.org/10.1117/12.872357.","bjps":"Petker D et al. (2011) Real-Time Wavelet-Based Inline Banknote-in-Bundle Counting for Cut-and-Bundle Machines. IST/SPIE Electronic Imaging 2011 Conference. San Francisco, California, United States.","havard":"D. Petker, T. Türke, H. Willeke, J. Schaede, E. Gillich, V. Lohweg, Real-time Wavelet-Based Inline Banknote-in-Bundle Counting for Cut-and-Bundle Machines, in: IST/SPIE Electronic Imaging 2011 Conference, San Francisco, California, United States, 2011.","ufg":"Petker, Denis et. al. (2011): Real-time Wavelet-Based Inline Banknote-in-Bundle Counting for Cut-and-Bundle Machines, in: IST/SPIE Electronic Imaging 2011 Conference.","apa":"Petker, D., Türke, T., Willeke, H., Schaede, J., Gillich, E., & Lohweg, V. (2011). Real-time Wavelet-Based Inline Banknote-in-Bundle Counting for Cut-and-Bundle Machines. In IST/SPIE Electronic Imaging 2011 Conference. San Francisco, California, United States. https://doi.org/10.1117/12.872357","chicago":"Petker, Denis, Thomas Türke, Harald Willeke, Johannes Schaede, Eugen Gillich, and Volker Lohweg. “Real-Time Wavelet-Based Inline Banknote-in-Bundle Counting for Cut-and-Bundle Machines.” In IST/SPIE Electronic Imaging 2011 Conference. San Francisco, California, United States, 2011. https://doi.org/10.1117/12.872357."},"title":"Real-time Wavelet-Based Inline Banknote-in-Bundle Counting for Cut-and-Bundle Machines","publisher":"San Francisco, California, United States","status":"public","abstract":[{"lang":"eng","text":"Automatic banknote sheet cut-and-bundle machines are widely used within the scope of banknote production. Beside the cutting-and-bundling, which is a mature technology, image-processing-based quality inspection for this type of machine is attractive. We present in this work a new real-time Touchless Counting and perspective cutting blade quality insurance system, based on a Color-CCD-Camera and a dual-core Computer, for cut-and-bundle applications in banknote production. The system, which applies Wavelet-based multi-scale filtering is able to count banknotes inside a 100-bundle within 200-300 ms depending on the window size."}],"department":[{"_id":"DEP5023"}],"main_file_link":[{"url":"https://www.spiedigitallibrary.org/conference-proceedings-of-spie/7877/787703/Real-time-wavelet-based-inline-banknote-in-bundle-counting-for/10.1117/12.872357.full?SSO=1"}],"year":2011,"author":[{"first_name":"Denis","last_name":"Petker","full_name":"Petker, Denis"},{"last_name":"Türke","full_name":"Türke, Thomas","first_name":"Thomas"},{"first_name":"Harald","last_name":"Willeke","full_name":"Willeke, Harald"},{"first_name":"Johannes","full_name":"Schaede, Johannes","last_name":"Schaede","id":"2128"},{"last_name":"Gillich","first_name":"Eugen","full_name":"Gillich, Eugen","id":"1706"},{"orcid":"0000-0002-3325-7887","last_name":"Lohweg","full_name":"Lohweg, Volker","id":"1804","first_name":"Volker"}],"date_updated":"2023-03-15T13:49:38Z","user_id":"45673","type":"conference","date_created":"2019-12-02T10:36:37Z","publication":"IST/SPIE Electronic Imaging 2011 Conference","doi":"https://doi.org/10.1117/12.872357","_id":"2096","language":[{"iso":"eng"}]},{"_id":"2097","language":[{"iso":"eng"}],"date_updated":"2023-03-15T13:49:38Z","user_id":"45673","date_created":"2019-12-02T10:38:58Z","type":"conference","publication":"Museumsrunde - IHK Lippe zu Detmold","publisher":"Detmold","status":"public","department":[{"_id":"DEP5023"}],"author":[{"last_name":"Lohweg","first_name":"Volker","id":"1804","full_name":"Lohweg, Volker","orcid":"0000-0002-3325-7887"}],"year":2011,"citation":{"ama":"Lohweg V. Banknotenauthentifikation - Ohne Bildverarbeitung geht es nicht! In: Museumsrunde - IHK Lippe Zu Detmold. Detmold; 2011.","ieee":"V. Lohweg, “Banknotenauthentifikation - Ohne Bildverarbeitung geht es nicht!,” in Museumsrunde - IHK Lippe zu Detmold, 2011.","ufg":"Lohweg, Volker (2011): Banknotenauthentifikation - Ohne Bildverarbeitung geht es nicht!, in: Museumsrunde - IHK Lippe zu Detmold.","bjps":"Lohweg V (2011) Banknotenauthentifikation - Ohne Bildverarbeitung Geht Es Nicht! Museumsrunde - IHK Lippe Zu Detmold. Detmold.","havard":"V. Lohweg, Banknotenauthentifikation - Ohne Bildverarbeitung geht es nicht!, in: Museumsrunde - IHK Lippe Zu Detmold, Detmold, 2011.","mla":"Lohweg, Volker. “Banknotenauthentifikation - Ohne Bildverarbeitung Geht Es Nicht!” Museumsrunde - IHK Lippe Zu Detmold, Detmold, 2011.","van":"Lohweg V. Banknotenauthentifikation - Ohne Bildverarbeitung geht es nicht! In: Museumsrunde - IHK Lippe zu Detmold. Detmold; 2011.","chicago":"Lohweg, Volker. “Banknotenauthentifikation - Ohne Bildverarbeitung Geht Es Nicht!” In Museumsrunde - IHK Lippe Zu Detmold. Detmold, 2011.","apa":"Lohweg, V. (2011). Banknotenauthentifikation - Ohne Bildverarbeitung geht es nicht! In Museumsrunde - IHK Lippe zu Detmold. Detmold.","din1505-2-1":"Lohweg, Volker: Banknotenauthentifikation - Ohne Bildverarbeitung geht es nicht! In: Museumsrunde - IHK Lippe zu Detmold : Detmold, 2011","chicago-de":"Lohweg, Volker. 2011. Banknotenauthentifikation - Ohne Bildverarbeitung geht es nicht! In: Museumsrunde - IHK Lippe zu Detmold. Detmold.","short":"V. Lohweg, in: Museumsrunde - IHK Lippe Zu Detmold, Detmold, 2011."},"title":"Banknotenauthentifikation - Ohne Bildverarbeitung geht es nicht!"},{"status":"public","department":[{"_id":"DEP5023"}],"year":2011,"author":[{"full_name":"Glock, Stefan","id":"44020","last_name":"Glock","first_name":"Stefan"},{"first_name":"Karl","full_name":"Voth, Karl","last_name":"Voth"},{"id":"2128","full_name":"Schaede, Johannes","last_name":"Schaede","first_name":"Johannes"},{"orcid":"0000-0002-3325-7887","full_name":"Lohweg, Volker","id":"1804","first_name":"Volker","last_name":"Lohweg"}],"citation":{"ama":"Glock S, Voth K, Schaede J, Lohweg V. A Framework for Possibilistic Multi-source Data Fusion with Monitoring of Sensor Reliability, World Conference on Soft Computing. In: ; 2011.","ieee":"S. Glock, K. Voth, J. Schaede, and V. Lohweg, “A Framework for Possibilistic Multi-source Data Fusion with Monitoring of Sensor Reliability, World Conference on Soft Computing,” 2011.","short":"S. Glock, K. Voth, J. Schaede, V. Lohweg, in: 2011.","chicago-de":"Glock, Stefan, Karl Voth, Johannes Schaede und Volker Lohweg. 2011. A Framework for Possibilistic Multi-source Data Fusion with Monitoring of Sensor Reliability, World Conference on Soft Computing. In: .","din1505-2-1":"Glock, Stefan ; Voth, Karl ; Schaede, Johannes ; Lohweg, Volker: A Framework for Possibilistic Multi-source Data Fusion with Monitoring of Sensor Reliability, World Conference on Soft Computing. In: , 2011","van":"Glock S, Voth K, Schaede J, Lohweg V. A Framework for Possibilistic Multi-source Data Fusion with Monitoring of Sensor Reliability, World Conference on Soft Computing. In 2011.","mla":"Glock, Stefan, et al. A Framework for Possibilistic Multi-Source Data Fusion with Monitoring of Sensor Reliability, World Conference on Soft Computing. 2011.","bjps":"Glock S et al. (2011) A Framework for Possibilistic Multi-Source Data Fusion with Monitoring of Sensor Reliability, World Conference on Soft Computing.","havard":"S. Glock, K. Voth, J. Schaede, V. Lohweg, A Framework for Possibilistic Multi-source Data Fusion with Monitoring of Sensor Reliability, World Conference on Soft Computing, in: 2011.","ufg":"Glock, Stefan et. al. (2011): A Framework for Possibilistic Multi-source Data Fusion with Monitoring of Sensor Reliability, World Conference on Soft Computing, in: .","apa":"Glock, S., Voth, K., Schaede, J., & Lohweg, V. (2011). A Framework for Possibilistic Multi-source Data Fusion with Monitoring of Sensor Reliability, World Conference on Soft Computing.","chicago":"Glock, Stefan, Karl Voth, Johannes Schaede, and Volker Lohweg. “A Framework for Possibilistic Multi-Source Data Fusion with Monitoring of Sensor Reliability, World Conference on Soft Computing,” 2011."},"title":"A Framework for Possibilistic Multi-source Data Fusion with Monitoring of Sensor Reliability, World Conference on Soft Computing","_id":"2098","language":[{"iso":"eng"}],"date_updated":"2023-03-15T13:49:38Z","user_id":"45673","date_created":"2019-12-02T10:40:20Z","type":"conference"},{"doi":"10.5162/sensor11/sp2.1","_id":"2099","language":[{"iso":"eng"}],"oa":"1","date_updated":"2023-03-15T13:49:38Z","user_id":"45673","date_created":"2019-12-02T10:41:46Z","type":"conference","publication_identifier":{"isbn":["978-3-9810993-9-3"]},"publication":"SENSOR+TEST Conference 2011,","publisher":"7 – 9 June 2011, Nürnberg, Germany ","page":"686-691","status":"public","abstract":[{"text":"In order to reduce time consuming and expensive flawed production in Security Printing Machines an inspection system for early recognition of consecutive errors is developed. It shall avoid printing errors by combining measuring data from several sensors with expert knowledge. The inspection quality is improved by acquiring several information sources, using different physical quantities, integrating expert knowledge and perception, extracting reasonable features, and generating intuitive results.\r\nThe TLCS (Two Layer Conflict Solving) approach is based on the Evidence Theory and uses conflict solving to fuse data. The first layer applies the Conflict Modified Dempster-Shafer-Theory (CMDST). Every two sensors‘ data are combined and conflicts are solved between individuals. In the second layer the data is fused using the results from the CMDST and the sensors’ original observations by the Group Conflict Redistribution (GCR). We introduce an improvement of the TLCS approach with reference to highly complex machine conditioning applications. In this context, the sensors are grouped to attributes applying expert knowledge. The fusion of the fuzzyfied sensor’s observations that are elements of one particular attribute is accomplished by the TLCS. Subsequently, the attributes’ conditions are merged using an Ordered Weighted Averaging Operator.\r\nIn security printing machines the wiping unit is the most sensible part. It is responsible for removing surplus ink around the engravings. Even small parameter manipulations cause errors during the production. Experienced machine operators recognize errors before they occur and stabilize the production by changing wiping unit parameters mainly. The fusion approach is evaluated in a wiping simulator. Current, impact sound, temperature and force are acquired and processed. Wear, parameter changes, and mechanical disturbances are detected by the introduced algorithm.","lang":"eng"}],"department":[{"_id":"DEP5023"}],"main_file_link":[{"url":"https://www.ama-science.org/proceedings/details/528","open_access":"1"}],"author":[{"last_name":"Voth","full_name":"Voth, Karl","first_name":"Karl"},{"first_name":"Stefan","full_name":"Glock, Stefan","id":"44020","last_name":"Glock"},{"id":"1825","full_name":"Mönks, Uwe","last_name":"Mönks","first_name":"Uwe"},{"first_name":"Thomas","last_name":"Türke","full_name":"Türke, Thomas"},{"orcid":"0000-0002-3325-7887","id":"1804","full_name":"Lohweg, Volker","first_name":"Volker","last_name":"Lohweg"}],"year":2011,"publication_status":"published","citation":{"din1505-2-1":"Voth, Karl ; Glock, Stefan ; Mönks, Uwe ; Türke, Thomas ; Lohweg, Volker: Multi-sensory Machine Diagnosis on Security Printing Machines with Two Layer Conflict Solving. In: SENSOR+TEST Conference 2011,, Proceedings SENSOR 2011 : 7 – 9 June 2011, Nürnberg, Germany , 2011, S. 686–691","chicago-de":"Voth, Karl, Stefan Glock, Uwe Mönks, Thomas Türke und Volker Lohweg. 2011. Multi-sensory Machine Diagnosis on Security Printing Machines with Two Layer Conflict Solving. In: SENSOR+TEST Conference 2011, 686–691. Proceedings SENSOR 2011. 7 – 9 June 2011, Nürnberg, Germany . doi:10.5162/sensor11/sp2.1, .","short":"K. Voth, S. Glock, U. Mönks, T. Türke, V. Lohweg, in: SENSOR+TEST Conference 2011, 7 – 9 June 2011, Nürnberg, Germany , 2011, pp. 686–691.","chicago":"Voth, Karl, Stefan Glock, Uwe Mönks, Thomas Türke, and Volker Lohweg. “Multi-Sensory Machine Diagnosis on Security Printing Machines with Two Layer Conflict Solving.” In SENSOR+TEST Conference 2011, 686–91. Proceedings SENSOR 2011. 7 – 9 June 2011, Nürnberg, Germany , 2011. https://doi.org/10.5162/sensor11/sp2.1.","apa":"Voth, K., Glock, S., Mönks, U., Türke, T., & Lohweg, V. (2011). Multi-sensory Machine Diagnosis on Security Printing Machines with Two Layer Conflict Solving. In SENSOR+TEST Conference 2011, (pp. 686–691). 7 – 9 June 2011, Nürnberg, Germany . https://doi.org/10.5162/sensor11/sp2.1","ufg":"Voth, Karl et. al. (2011): Multi-sensory Machine Diagnosis on Security Printing Machines with Two Layer Conflict Solving, in: SENSOR+TEST Conference 2011, (=Proceedings SENSOR 2011), S. 686–691.","havard":"K. Voth, S. Glock, U. Mönks, T. Türke, V. Lohweg, Multi-sensory Machine Diagnosis on Security Printing Machines with Two Layer Conflict Solving, in: SENSOR+TEST Conference 2011, 7 – 9 June 2011, Nürnberg, Germany , 2011: pp. 686–691.","bjps":"Voth K et al. (2011) Multi-Sensory Machine Diagnosis on Security Printing Machines with Two Layer Conflict Solving. SENSOR+TEST Conference 2011,. 7 – 9 June 2011, Nürnberg, Germany , pp. 686–691.","mla":"Voth, Karl, et al. “Multi-Sensory Machine Diagnosis on Security Printing Machines with Two Layer Conflict Solving.” SENSOR+TEST Conference 2011, 7 – 9 June 2011, Nürnberg, Germany , 2011, pp. 686–91, doi:10.5162/sensor11/sp2.1.","van":"Voth K, Glock S, Mönks U, Türke T, Lohweg V. Multi-sensory Machine Diagnosis on Security Printing Machines with Two Layer Conflict Solving. In: SENSOR+TEST Conference 2011,. 7 – 9 June 2011, Nürnberg, Germany ; 2011. p. 686–91. (Proceedings SENSOR 2011).","ieee":"K. Voth, S. Glock, U. Mönks, T. Türke, and V. Lohweg, “Multi-sensory Machine Diagnosis on Security Printing Machines with Two Layer Conflict Solving,” in SENSOR+TEST Conference 2011, 2011, pp. 686–691.","ama":"Voth K, Glock S, Mönks U, Türke T, Lohweg V. Multi-sensory Machine Diagnosis on Security Printing Machines with Two Layer Conflict Solving. In: SENSOR+TEST Conference 2011,. Proceedings SENSOR 2011. 7 – 9 June 2011, Nürnberg, Germany ; 2011:686-691. doi:10.5162/sensor11/sp2.1"},"title":"Multi-sensory Machine Diagnosis on Security Printing Machines with Two Layer Conflict Solving","series_title":"Proceedings SENSOR 2011"},{"user_id":"45673","date_updated":"2023-03-15T13:49:38Z","publication":"6. Innovationsforum \"Automation als Innovationsmotor des deutschen Maschinenbaus\" ","date_created":"2019-12-02T14:29:03Z","type":"conference","_id":"2100","place":"Lemgo","language":[{"iso":"ger"}],"citation":{"ama":"Lohweg V. Kontextbasierte antizipatorische Multi-Sensor-Fusion – Mehr als Machine Conditioning (Vortrag). In: 6. Innovationsforum “Automation als Innovationsmotor des deutschen Maschinenbaus” . Lemgo: OWL-Maschinenbau; 2011.","van":"Lohweg V. Kontextbasierte antizipatorische Multi-Sensor-Fusion – Mehr als Machine Conditioning (Vortrag). In: 6 Innovationsforum “Automation als Innovationsmotor des deutschen Maschinenbaus” . Lemgo: OWL-Maschinenbau; 2011.","mla":"Lohweg, Volker. “Kontextbasierte antizipatorische Multi-Sensor-Fusion – Mehr als Machine Conditioning (Vortrag).” 6. Innovationsforum “Automation als Innovationsmotor des deutschen Maschinenbaus” , OWL-Maschinenbau, 2011.","havard":"V. Lohweg, Kontextbasierte antizipatorische Multi-Sensor-Fusion – Mehr als Machine Conditioning (Vortrag), in: 6. Innovationsforum “Automation als Innovationsmotor des deutschen Maschinenbaus” , OWL-Maschinenbau, Lemgo, 2011.","bjps":"Lohweg V (2011) Kontextbasierte antizipatorische Multi-Sensor-Fusion – Mehr als Machine Conditioning (Vortrag). 6. Innovationsforum ‘Automation als Innovationsmotor des deutschen Maschinenbaus’ . Lemgo: OWL-Maschinenbau.","ufg":"Lohweg, Volker (2011): Kontextbasierte antizipatorische Multi-Sensor-Fusion – Mehr als Machine Conditioning (Vortrag), in: 6. Innovationsforum „Automation als Innovationsmotor des deutschen Maschinenbaus“ , Lemgo.","ieee":"V. Lohweg, “Kontextbasierte antizipatorische Multi-Sensor-Fusion – Mehr als Machine Conditioning (Vortrag),” in 6. Innovationsforum “Automation als Innovationsmotor des deutschen Maschinenbaus” , 2011.","apa":"Lohweg, V. (2011). Kontextbasierte antizipatorische Multi-Sensor-Fusion – Mehr als Machine Conditioning (Vortrag). In 6. Innovationsforum “Automation als Innovationsmotor des deutschen Maschinenbaus” . Lemgo: OWL-Maschinenbau.","chicago":"Lohweg, Volker. “Kontextbasierte antizipatorische Multi-Sensor-Fusion – Mehr als Machine Conditioning (Vortrag).” In 6. Innovationsforum “Automation als Innovationsmotor des deutschen Maschinenbaus” . Lemgo: OWL-Maschinenbau, 2011.","short":"V. Lohweg, in: 6. Innovationsforum “Automation als Innovationsmotor des deutschen Maschinenbaus” , OWL-Maschinenbau, Lemgo, 2011.","chicago-de":"Lohweg, Volker. 2011. Kontextbasierte antizipatorische Multi-Sensor-Fusion – Mehr als Machine Conditioning (Vortrag). In: 6. Innovationsforum „Automation als Innovationsmotor des deutschen Maschinenbaus“ . Lemgo: OWL-Maschinenbau.","din1505-2-1":"Lohweg, Volker: Kontextbasierte antizipatorische Multi-Sensor-Fusion – Mehr als Machine Conditioning (Vortrag). In: 6. Innovationsforum „Automation als Innovationsmotor des deutschen Maschinenbaus“ . Lemgo : OWL-Maschinenbau, 2011"},"publication_status":"published","title":"Kontextbasierte antizipatorische Multi-Sensor-Fusion – Mehr als Machine Conditioning (Vortrag)","publisher":"OWL-Maschinenbau","status":"public","author":[{"orcid":"0000-0002-3325-7887","full_name":"Lohweg, Volker","last_name":"Lohweg","id":"1804","first_name":"Volker"}],"year":2011,"department":[{"_id":"DEP5023"}]},{"type":"conference","date_created":"2019-12-02T14:30:38Z","user_id":"45673","date_updated":"2023-03-15T13:49:38Z","oa":"1","place":"Vienna, July 2011","language":[{"iso":"eng"}],"_id":"2101","doi":"10.5772/17384","title":"A Possibilistic Framework for Sensor Fusion with Monitoring of Sensor Reliability, Sensor Fusion – Foundation and Applications","citation":{"chicago":"Lohweg, Volker, Stefan Glock, and Karl Voth. “A Possibilistic Framework for Sensor Fusion with Monitoring of Sensor Reliability, Sensor Fusion – Foundation and Applications.” Vienna, July 2011: Intech Publishers, 2011. https://doi.org/10.5772/17384.","ieee":"V. Lohweg, S. Glock, and K. Voth, “A Possibilistic Framework for Sensor Fusion with Monitoring of Sensor Reliability, Sensor Fusion – Foundation and Applications,” 2011.","apa":"Lohweg, V., Glock, S., & Voth, K. (2011). A Possibilistic Framework for Sensor Fusion with Monitoring of Sensor Reliability, Sensor Fusion – Foundation and Applications. Vienna, July 2011: Intech Publishers. https://doi.org/10.5772/17384","bjps":"Lohweg V, Glock S and Voth K (2011) A Possibilistic Framework for Sensor Fusion with Monitoring of Sensor Reliability, Sensor Fusion – Foundation and Applications. Vienna, July 2011: Intech Publishers.","havard":"V. Lohweg, S. Glock, K. Voth, A Possibilistic Framework for Sensor Fusion with Monitoring of Sensor Reliability, Sensor Fusion – Foundation and Applications, in: Intech Publishers, Vienna, July 2011, 2011.","mla":"Lohweg, Volker, et al. A Possibilistic Framework for Sensor Fusion with Monitoring of Sensor Reliability, Sensor Fusion – Foundation and Applications. Intech Publishers, 2011, doi:10.5772/17384.","ufg":"Lohweg, Volker et. al. (2011): A Possibilistic Framework for Sensor Fusion with Monitoring of Sensor Reliability, Sensor Fusion – Foundation and Applications, in: , Vienna, July 2011.","ama":"Lohweg V, Glock S, Voth K. A Possibilistic Framework for Sensor Fusion with Monitoring of Sensor Reliability, Sensor Fusion – Foundation and Applications. In: Vienna, July 2011: Intech Publishers; 2011. doi:10.5772/17384","van":"Lohweg V, Glock S, Voth K. A Possibilistic Framework for Sensor Fusion with Monitoring of Sensor Reliability, Sensor Fusion – Foundation and Applications. In Vienna, July 2011: Intech Publishers; 2011.","chicago-de":"Lohweg, Volker, Stefan Glock und Karl Voth. 2011. A Possibilistic Framework for Sensor Fusion with Monitoring of Sensor Reliability, Sensor Fusion – Foundation and Applications. In: . Vienna, July 2011: Intech Publishers. doi:10.5772/17384, .","din1505-2-1":"Lohweg, Volker ; Glock, Stefan ; Voth, Karl: A Possibilistic Framework for Sensor Fusion with Monitoring of Sensor Reliability, Sensor Fusion – Foundation and Applications. In: . Vienna, July 2011 : Intech Publishers, 2011","short":"V. Lohweg, S. Glock, K. Voth, in: Intech Publishers, Vienna, July 2011, 2011."},"publication_status":"published","year":2011,"main_file_link":[{"url":"https://www.intechopen.com/books/sensor-fusion-foundation-and-applications/a-possibilistic-framework-for-sensor-fusion-with-monitoring-of-sensor-reliability","open_access":"1"}],"author":[{"orcid":"0000-0002-3325-7887","full_name":"Lohweg, Volker","last_name":"Lohweg","id":"1804","first_name":"Volker"},{"first_name":"Stefan","full_name":"Glock, Stefan","id":"44020","last_name":"Glock"},{"first_name":"Karl","last_name":"Voth","full_name":"Voth, Karl"}],"department":[{"_id":"DEP5023"}],"status":"public","publisher":"Intech Publishers"},{"_id":"2102","language":[{"iso":"ger"}],"keyword":["Sensor- und Informationsfusion","elektrischer Antrieb","Cyber-Physical System","Industrie 4.0","Big Data"],"type":"conference","date_created":"2019-12-02T14:32:58Z","date_updated":"2023-03-15T13:49:38Z","user_id":"45673","abstract":[{"text":"Die Zustandsüberwachung erfolgt derzeit in der Regel durch Einsatz spezieller Sensorik, bspw. durch Vibrationsmessungen. Außerdem werden die Antriebe lediglich isoliert betrachtet, eine Zusammenführung anfallender Informationen eines räumlich verteilten Antriebsverbunds findet meist nicht statt. Im Folgenden wird ein neuartiges Motor-as-Sensor-Konzept vorgeschlagen und validiert, das eine antizipatorische Zustandsüberwachung ohne Einsatz zusätzlicher Sensorik allein durch Verarbeitung der phasenbezogenen Motorströme ermöglicht. Zusätzlich wird ein Informationsfusionskonzept vorge-stellt, das die Informationen aller im Verbund beteiligten Antriebe zusammenführt, um darüber eine mit weniger Unsicherheiten behaftete Aussage über den Zustand einer Ap-plikation herbeizuführen. Das Hauptaugenmerk liegt hierbei insbesondere auf der Beherrschung der anfallenden riesigen Datenmengen, die zur Verarbeitung in eingebetteten Systemen reduziert werden müssen.","lang":"ger"}],"department":[{"_id":"DEP5023"}],"author":[{"first_name":"Karl","last_name":"Voth","full_name":"Voth, Karl"},{"first_name":"Alexander","id":"1853","full_name":"Dicks, Alexander","last_name":"Dicks"},{"orcid":"0000-0002-3325-7887","first_name":"Volker","full_name":"Lohweg, Volker","id":"1804","last_name":"Lohweg"}],"year":2011,"status":"public","title":"Konfliktlösende Informationsfusion zur Maschinendiagnose am Beispiel von Extrusionsanlagen, 21. Workshop Computational Intelligence, VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA), 30. November - 02. Dezember 2011, Dortmund","publication_status":"published","citation":{"short":"K. Voth, A. Dicks, V. Lohweg, in: 2011.","chicago-de":"Voth, Karl, Alexander Dicks und Volker Lohweg. 2011. Konfliktlösende Informationsfusion zur Maschinendiagnose am Beispiel von Extrusionsanlagen, 21. Workshop Computational Intelligence, VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA), 30. November - 02. Dezember 2011, Dortmund. In: .","din1505-2-1":"Voth, Karl ; Dicks, Alexander ; Lohweg, Volker: Konfliktlösende Informationsfusion zur Maschinendiagnose am Beispiel von Extrusionsanlagen, 21. Workshop Computational Intelligence, VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA), 30. November - 02. Dezember 2011, Dortmund. In: , 2011","apa":"Voth, K., Dicks, A., & Lohweg, V. (2011). Konfliktlösende Informationsfusion zur Maschinendiagnose am Beispiel von Extrusionsanlagen, 21. Workshop Computational Intelligence, VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA), 30. November - 02. Dezember 2011, Dortmund.","ieee":"K. Voth, A. Dicks, and V. Lohweg, “Konfliktlösende Informationsfusion zur Maschinendiagnose am Beispiel von Extrusionsanlagen, 21. Workshop Computational Intelligence, VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA), 30. November - 02. Dezember 2011, Dortmund,” 2011.","chicago":"Voth, Karl, Alexander Dicks, and Volker Lohweg. “Konfliktlösende Informationsfusion zur Maschinendiagnose am Beispiel von Extrusionsanlagen, 21. Workshop Computational Intelligence, VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA), 30. November - 02. Dezember 2011, Dortmund,” 2011.","van":"Voth K, Dicks A, Lohweg V. Konfliktlösende Informationsfusion zur Maschinendiagnose am Beispiel von Extrusionsanlagen, 21. Workshop Computational Intelligence, VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA), 30. November - 02. Dezember 2011, Dortmund. In 2011.","ama":"Voth K, Dicks A, Lohweg V. Konfliktlösende Informationsfusion zur Maschinendiagnose am Beispiel von Extrusionsanlagen, 21. Workshop Computational Intelligence, VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA), 30. November - 02. Dezember 2011, Dortmund. In: ; 2011.","ufg":"Voth, Karl et. al. (2011): Konfliktlösende Informationsfusion zur Maschinendiagnose am Beispiel von Extrusionsanlagen, 21. Workshop Computational Intelligence, VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA), 30. November - 02. Dezember 2011, Dortmund, in: .","mla":"Voth, Karl, et al. Konfliktlösende Informationsfusion zur Maschinendiagnose am Beispiel von Extrusionsanlagen, 21. Workshop Computational Intelligence, VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA), 30. November - 02. Dezember 2011, Dortmund. 2011.","havard":"K. Voth, A. Dicks, V. Lohweg, Konfliktlösende Informationsfusion zur Maschinendiagnose am Beispiel von Extrusionsanlagen, 21. Workshop Computational Intelligence, VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA), 30. November - 02. Dezember 2011, Dortmund, in: 2011.","bjps":"Voth K, Dicks A and Lohweg V (2011) Konfliktlösende Informationsfusion zur Maschinendiagnose am Beispiel von Extrusionsanlagen, 21. Workshop Computational Intelligence, VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA), 30. November - 02. Dezember 2011, Dortmund."}},{"type":"conference","date_created":"2019-12-02T08:01:27Z","publication":"Optical Document Security - The Conference on Optical Security and Counterfeit Detection, San Francisco, CA, USA, January 20-22, 2010","date_updated":"2023-03-15T13:49:38Z","user_id":"45673","language":[{"iso":"eng"}],"_id":"2084","title":"Document Production and Verification by Optimization of Feature Platform Exploitation","citation":{"ama":"Lohweg V, Schaede J. Document Production and Verification by Optimization of Feature Platform Exploitation. In: Optical Document Security - The Conference on Optical Security and Counterfeit Detection, San Francisco, CA, USA, January 20-22, 2010. ; 2010.","ieee":"V. Lohweg and J. Schaede, “Document Production and Verification by Optimization of Feature Platform Exploitation,” in Optical Document Security - The Conference on Optical Security and Counterfeit Detection, San Francisco, CA, USA, January 20-22, 2010, 2010.","short":"V. Lohweg, J. Schaede, in: Optical Document Security - The Conference on Optical Security and Counterfeit Detection, San Francisco, CA, USA, January 20-22, 2010, 2010.","chicago-de":"Lohweg, Volker und Johannes Schaede. 2010. Document Production and Verification by Optimization of Feature Platform Exploitation. In: Optical Document Security - The Conference on Optical Security and Counterfeit Detection, San Francisco, CA, USA, January 20-22, 2010.","din1505-2-1":"Lohweg, Volker ; Schaede, Johannes: Document Production and Verification by Optimization of Feature Platform Exploitation. In: Optical Document Security - The Conference on Optical Security and Counterfeit Detection, San Francisco, CA, USA, January 20-22, 2010, 2010","van":"Lohweg V, Schaede J. Document Production and Verification by Optimization of Feature Platform Exploitation. In: Optical Document Security - The Conference on Optical Security and Counterfeit Detection, San Francisco, CA, USA, January 20-22, 2010. 2010.","ufg":"Lohweg, Volker/Schaede, Johannes (2010): Document Production and Verification by Optimization of Feature Platform Exploitation, in: Optical Document Security - The Conference on Optical Security and Counterfeit Detection, San Francisco, CA, USA, January 20-22, 2010.","havard":"V. Lohweg, J. Schaede, Document Production and Verification by Optimization of Feature Platform Exploitation, in: Optical Document Security - The Conference on Optical Security and Counterfeit Detection, San Francisco, CA, USA, January 20-22, 2010, 2010.","bjps":"Lohweg V and Schaede J (2010) Document Production and Verification by Optimization of Feature Platform Exploitation. Optical Document Security - The Conference on Optical Security and Counterfeit Detection, San Francisco, CA, USA, January 20-22, 2010.","mla":"Lohweg, Volker, and Johannes Schaede. “Document Production and Verification by Optimization of Feature Platform Exploitation.” Optical Document Security - The Conference on Optical Security and Counterfeit Detection, San Francisco, CA, USA, January 20-22, 2010, 2010.","apa":"Lohweg, V., & Schaede, J. (2010). Document Production and Verification by Optimization of Feature Platform Exploitation. In Optical Document Security - The Conference on Optical Security and Counterfeit Detection, San Francisco, CA, USA, January 20-22, 2010.","chicago":"Lohweg, Volker, and Johannes Schaede. “Document Production and Verification by Optimization of Feature Platform Exploitation.” In Optical Document Security - The Conference on Optical Security and Counterfeit Detection, San Francisco, CA, USA, January 20-22, 2010, 2010."},"department":[{"_id":"DEP5023"}],"author":[{"orcid":"0000-0002-3325-7887","first_name":"Volker","id":"1804","full_name":"Lohweg, Volker","last_name":"Lohweg"},{"last_name":"Schaede","first_name":"Johannes","id":"2128","full_name":"Schaede, Johannes"}],"year":2010,"status":"public"},{"department":[{"_id":"DEP5023"}],"year":2010,"author":[{"last_name":"Lohweg","id":"1804","full_name":"Lohweg, Volker","first_name":"Volker","orcid":"0000-0002-3325-7887"},{"full_name":"Gillich, Eugen","id":"1706","last_name":"Gillich","first_name":"Eugen"},{"full_name":"Glock, Stefan","first_name":"Stefan","last_name":"Glock","id":"44020"},{"full_name":"Mönks, Uwe","id":"1825","first_name":"Uwe","last_name":"Mönks"},{"last_name":"Schaede","id":"2128","first_name":"Johannes","full_name":"Schaede, Johannes"}],"status":"public","publisher":"Orell Füssli, Zürich, 22-24 March 2010","title":"Intaglio Based Banknote Authentication","citation":{"short":"V. Lohweg, E. Gillich, S. Glock, U. Mönks, J. Schaede, in: 2. InIT KBA-Giori International Workshop on “Detection of Banknote Forgeries,” Orell Füssli, Zürich, 22-24 March 2010, 2010.","din1505-2-1":"Lohweg, Volker ; Gillich, Eugen ; Glock, Stefan ; Mönks, Uwe ; Schaede, Johannes: Intaglio Based Banknote Authentication. In: 2. inIT KBA-Giori International Workshop on „Detection of Banknote Forgeries“ : Orell Füssli, Zürich, 22-24 March 2010, 2010","chicago-de":"Lohweg, Volker, Eugen Gillich, Stefan Glock, Uwe Mönks und Johannes Schaede. 2010. Intaglio Based Banknote Authentication. In: 2. inIT KBA-Giori International Workshop on „Detection of Banknote Forgeries“. Orell Füssli, Zürich, 22-24 March 2010.","van":"Lohweg V, Gillich E, Glock S, Mönks U, Schaede J. Intaglio Based Banknote Authentication. In: 2 inIT KBA-Giori International Workshop on “Detection of Banknote Forgeries.” Orell Füssli, Zürich, 22-24 March 2010; 2010.","mla":"Lohweg, Volker, et al. “Intaglio Based Banknote Authentication.” 2. InIT KBA-Giori International Workshop on “Detection of Banknote Forgeries,” Orell Füssli, Zürich, 22-24 March 2010, 2010.","havard":"V. Lohweg, E. Gillich, S. Glock, U. Mönks, J. Schaede, Intaglio Based Banknote Authentication, in: 2. InIT KBA-Giori International Workshop on “Detection of Banknote Forgeries,” Orell Füssli, Zürich, 22-24 March 2010, 2010.","bjps":"Lohweg V et al. (2010) Intaglio Based Banknote Authentication. 2. InIT KBA-Giori International Workshop on ‘Detection of Banknote Forgeries’. Orell Füssli, Zürich, 22-24 March 2010.","ufg":"Lohweg, Volker et. al. (2010): Intaglio Based Banknote Authentication, in: 2. inIT KBA-Giori International Workshop on „Detection of Banknote Forgeries“.","apa":"Lohweg, V., Gillich, E., Glock, S., Mönks, U., & Schaede, J. (2010). Intaglio Based Banknote Authentication. In 2. inIT KBA-Giori International Workshop on “Detection of Banknote Forgeries.” Orell Füssli, Zürich, 22-24 March 2010.","chicago":"Lohweg, Volker, Eugen Gillich, Stefan Glock, Uwe Mönks, and Johannes Schaede. “Intaglio Based Banknote Authentication.” In 2. InIT KBA-Giori International Workshop on “Detection of Banknote Forgeries.” Orell Füssli, Zürich, 22-24 March 2010, 2010.","ama":"Lohweg V, Gillich E, Glock S, Mönks U, Schaede J. Intaglio Based Banknote Authentication. In: 2. InIT KBA-Giori International Workshop on “Detection of Banknote Forgeries.” Orell Füssli, Zürich, 22-24 March 2010; 2010.","ieee":"V. Lohweg, E. Gillich, S. Glock, U. Mönks, and J. Schaede, “Intaglio Based Banknote Authentication,” in 2. inIT KBA-Giori International Workshop on “Detection of Banknote Forgeries,” 2010."},"language":[{"iso":"eng"}],"_id":"2085","date_created":"2019-12-02T08:03:04Z","type":"conference","publication":"2. inIT KBA-Giori International Workshop on \"Detection of Banknote Forgeries\"","date_updated":"2023-03-15T13:49:38Z","user_id":"45673"},{"publication_status":"published","citation":{"din1505-2-1":"Lohweg, Volker ; Mönks, Uwe: Sensor Fusion by Two-Layer Conflict Solving. In: The 2nd International Workshop on Cognitive Information Processing : 14-16 June, 2010, Elba Island (Tuscany), Italy, 2010","chicago-de":"Lohweg, Volker und Uwe Mönks. 2010. Sensor Fusion by Two-Layer Conflict Solving. In: The 2nd International Workshop on Cognitive Information Processing. 14-16 June, 2010, Elba Island (Tuscany), Italy. doi:10.1109/CIP.2010.5604094, .","short":"V. Lohweg, U. Mönks, in: The 2nd International Workshop on Cognitive Information Processing, 14-16 June, 2010, Elba Island (Tuscany), Italy, 2010.","chicago":"Lohweg, Volker, and Uwe Mönks. “Sensor Fusion by Two-Layer Conflict Solving.” In The 2nd International Workshop on Cognitive Information Processing. 14-16 June, 2010, Elba Island (Tuscany), Italy, 2010. https://doi.org/10.1109/CIP.2010.5604094.","apa":"Lohweg, V., & Mönks, U. (2010). Sensor Fusion by Two-Layer Conflict Solving. In The 2nd International Workshop on Cognitive Information Processing. Elba: 14-16 June, 2010, Elba Island (Tuscany), Italy. https://doi.org/10.1109/CIP.2010.5604094","bjps":"Lohweg V and Mönks U (2010) Sensor Fusion by Two-Layer Conflict Solving. The 2nd International Workshop on Cognitive Information Processing. 14-16 June, 2010, Elba Island (Tuscany), Italy.","mla":"Lohweg, Volker, and Uwe Mönks. “Sensor Fusion by Two-Layer Conflict Solving.” The 2nd International Workshop on Cognitive Information Processing, 14-16 June, 2010, Elba Island (Tuscany), Italy, 2010, doi:10.1109/CIP.2010.5604094.","havard":"V. Lohweg, U. Mönks, Sensor Fusion by Two-Layer Conflict Solving, in: The 2nd International Workshop on Cognitive Information Processing, 14-16 June, 2010, Elba Island (Tuscany), Italy, 2010.","ufg":"Lohweg, Volker/Mönks, Uwe (2010): Sensor Fusion by Two-Layer Conflict Solving, in: The 2nd International Workshop on Cognitive Information Processing.","van":"Lohweg V, Mönks U. Sensor Fusion by Two-Layer Conflict Solving. In: The 2nd International Workshop on Cognitive Information Processing. 14-16 June, 2010, Elba Island (Tuscany), Italy; 2010.","ieee":"V. Lohweg and U. Mönks, “Sensor Fusion by Two-Layer Conflict Solving,” in The 2nd International Workshop on Cognitive Information Processing, Elba, 2010.","ama":"Lohweg V, Mönks U. Sensor Fusion by Two-Layer Conflict Solving. In: The 2nd International Workshop on Cognitive Information Processing. 14-16 June, 2010, Elba Island (Tuscany), Italy; 2010. doi:10.1109/CIP.2010.5604094"},"title":"Sensor Fusion by Two-Layer Conflict Solving","status":"public","publisher":"14-16 June, 2010, Elba Island (Tuscany), Italy","department":[{"_id":"DEP5023"}],"conference":{"location":"Elba","name":" 2010 2nd International Workshop on Cognitive Information Processing","start_date":"2010-06-14","end_date":"2010-06-16"},"author":[{"first_name":"Volker","full_name":"Lohweg, Volker","id":"1804","last_name":"Lohweg","orcid":"0000-0002-3325-7887"},{"last_name":"Mönks","full_name":"Mönks, Uwe","id":"1825","first_name":"Uwe"}],"year":2010,"abstract":[{"lang":"eng","text":"Many of the existing fusion approaches based on Dempster-Shafer Theory (DST) tend to be unreliable in various scenarios. Therefore, this topic is still in discussion. In this work a Two-Layer Conflict Solving (TLCS) data fusion scheme is proposed which is based on Dempster-Shafer Theory and on Fuzzy-Pattern-Classification (FPC) concepts. The aim is to provide an approach to data fusion which provides a stable conflict scenario handling. Furthermore, the scheme can easily be extended to fuzzy classification and is applicable to sensor fusion applications. Therefore, the suggested approach will contribute as a novel fuzzy fusion method."}],"date_updated":"2023-03-15T13:49:38Z","user_id":"45673","type":"conference","date_created":"2019-12-02T08:04:18Z","publication_identifier":{"issn":["2327-1671 "],"unknown":["2327-1698 "],"eisbn":["978-1-4244-6459-3"],"isbn":["978-1-4244-6457-9"]},"publication":"The 2nd International Workshop on Cognitive Information Processing","language":[{"iso":"eng"}],"keyword":["Noise measurement","Fuzzy sets","Noise","Sensor fusion","Logic gates","Feature extraction","Fuses"],"doi":"10.1109/CIP.2010.5604094","_id":"2086"},{"year":2010,"main_file_link":[{"url":"https://www.th-owl.de/init/uploads/tx_initdb/00800426_01.pdf","open_access":"1"}],"author":[{"first_name":"Uwe","last_name":"Mönks","id":"1825","full_name":"Mönks, Uwe"},{"orcid":"0000-0002-3325-7887","full_name":"Lohweg, Volker","first_name":"Volker","last_name":"Lohweg","id":"1804"},{"full_name":"Petker, Denis","first_name":"Denis","last_name":"Petker"}],"department":[{"_id":"DEP5023"}],"abstract":[{"text":"It is likely in real-world applications that only little data isavailable for training a knowledge-based system. We present a method forautomatically training the knowledge-representing membership functionsof a Fuzzy-Pattern-Classification system that works also when only littledata is available and the universal set is described insufficiently. Actually,this paper presents how the Modified-Fuzzy-Pattern-Classifier’s member-ship functions are trained using probability distribution functions.","lang":"eng"}],"status":"public","publisher":"28 Jun 2010 - 02 July 2010, Dortmund, Germany","title":"Fuzzy-Pattern-Classifier Training with Small Data Sets","citation":{"mla":"Mönks, Uwe, et al. “Fuzzy-Pattern-Classifier Training with Small Data Sets.” IPMU 2010 - International Conference on Information Processing and Management of Uncertainty in Knowledge Based Systems, 28 Jun 2010 - 02 July 2010, Dortmund, Germany, 2010.","bjps":"Mönks U, Lohweg V and Petker D (2010) Fuzzy-Pattern-Classifier Training with Small Data Sets. IPMU 2010 - International Conference on Information Processing and Management of Uncertainty in Knowledge Based Systems. 28 Jun 2010 - 02 July 2010, Dortmund, Germany.","havard":"U. Mönks, V. Lohweg, D. Petker, Fuzzy-Pattern-Classifier Training with Small Data Sets, in: IPMU 2010 - International Conference on Information Processing and Management of Uncertainty in Knowledge Based Systems, 28 Jun 2010 - 02 July 2010, Dortmund, Germany, 2010.","ufg":"Mönks, Uwe et. al. (2010): Fuzzy-Pattern-Classifier Training with Small Data Sets, in: IPMU 2010 - International Conference on Information Processing and Management of Uncertainty in Knowledge Based Systems.","van":"Mönks U, Lohweg V, Petker D. Fuzzy-Pattern-Classifier Training with Small Data Sets. In: IPMU 2010 - International Conference on Information Processing and Management of Uncertainty in Knowledge Based Systems. 28 Jun 2010 - 02 July 2010, Dortmund, Germany; 2010.","chicago":"Mönks, Uwe, Volker Lohweg, and Denis Petker. “Fuzzy-Pattern-Classifier Training with Small Data Sets.” In IPMU 2010 - International Conference on Information Processing and Management of Uncertainty in Knowledge Based Systems. 28 Jun 2010 - 02 July 2010, Dortmund, Germany, 2010.","apa":"Mönks, U., Lohweg, V., & Petker, D. (2010). Fuzzy-Pattern-Classifier Training with Small Data Sets. In IPMU 2010 - International Conference on Information Processing and Management of Uncertainty in Knowledge Based Systems. 28 Jun 2010 - 02 July 2010, Dortmund, Germany.","din1505-2-1":"Mönks, Uwe ; Lohweg, Volker ; Petker, Denis: Fuzzy-Pattern-Classifier Training with Small Data Sets. In: IPMU 2010 - International Conference on Information Processing and Management of Uncertainty in Knowledge Based Systems : 28 Jun 2010 - 02 July 2010, Dortmund, Germany, 2010","chicago-de":"Mönks, Uwe, Volker Lohweg und Denis Petker. 2010. Fuzzy-Pattern-Classifier Training with Small Data Sets. In: IPMU 2010 - International Conference on Information Processing and Management of Uncertainty in Knowledge Based Systems. 28 Jun 2010 - 02 July 2010, Dortmund, Germany.","short":"U. Mönks, V. Lohweg, D. Petker, in: IPMU 2010 - International Conference on Information Processing and Management of Uncertainty in Knowledge Based Systems, 28 Jun 2010 - 02 July 2010, Dortmund, Germany, 2010.","ama":"Mönks U, Lohweg V, Petker D. Fuzzy-Pattern-Classifier Training with Small Data Sets. In: IPMU 2010 - International Conference on Information Processing and Management of Uncertainty in Knowledge Based Systems. 28 Jun 2010 - 02 July 2010, Dortmund, Germany; 2010.","ieee":"U. Mönks, V. Lohweg, and D. Petker, “Fuzzy-Pattern-Classifier Training with Small Data Sets,” in IPMU 2010 - International Conference on Information Processing and Management of Uncertainty in Knowledge Based Systems, 2010."},"publication_status":"published","oa":"1","keyword":["Fuzzy Logic","Probability Theory","Fuzzy-Pattern-Classification","Machine Learning","Artificial Intelligence","Pattern Recognition"],"language":[{"iso":"eng"}],"_id":"2087","publication":"IPMU 2010 - International Conference on Information Processing and Management of Uncertainty in Knowledge Based Systems","date_created":"2019-12-02T08:15:18Z","type":"conference","user_id":"45673","date_updated":"2023-03-15T13:49:38Z"},{"status":"public","page":"184-194","author":[{"first_name":"Oliver","full_name":"Niggemann, Oliver","last_name":"Niggemann","id":"10876"},{"orcid":"0000-0002-3325-7887","first_name":"Volker","full_name":"Lohweg, Volker","last_name":"Lohweg","id":"1804"},{"first_name":"Tim","last_name":"Tack","full_name":"Tack, Tim"}],"main_file_link":[{"url":"https://link.springer.com/chapter/10.1007/978-3-642-16111-7_21"}],"year":2010,"volume":6359,"citation":{"short":"O. Niggemann, V. Lohweg, T. Tack, in: 33rd Annual German Conference on Artificial Intelligence (KI 2010), Springer, Berlin, 2010, pp. 184–194.","din1505-2-1":"Niggemann, Oliver ; Lohweg, Volker ; Tack, Tim: A Probabilistic MajorClust Variant for the Clustering of Near-Homogeneous Graphs. In: 33rd Annual German Conference on Artificial Intelligence (KI 2010), Lecture Notes in Computer Science. Bd. 6359. Berlin : Springer, 2010, S. 184–194","chicago-de":"Niggemann, Oliver, Volker Lohweg und Tim Tack. 2010. A Probabilistic MajorClust Variant for the Clustering of Near-Homogeneous Graphs. In: 33rd Annual German Conference on Artificial Intelligence (KI 2010), 6359:184–194. Lecture Notes in Computer Science. Berlin: Springer. doi:https://doi.org/10.1007/978-3-642-16111-7_21, .","apa":"Niggemann, O., Lohweg, V., & Tack, T. (2010). A Probabilistic MajorClust Variant for the Clustering of Near-Homogeneous Graphs. In 33rd Annual German Conference on Artificial Intelligence (KI 2010) (Vol. 6359, pp. 184–194). Berlin: Springer. https://doi.org/10.1007/978-3-642-16111-7_21","chicago":"Niggemann, Oliver, Volker Lohweg, and Tim Tack. “A Probabilistic MajorClust Variant for the Clustering of Near-Homogeneous Graphs.” In 33rd Annual German Conference on Artificial Intelligence (KI 2010), 6359:184–94. Lecture Notes in Computer Science. Berlin: Springer, 2010. https://doi.org/10.1007/978-3-642-16111-7_21.","van":"Niggemann O, Lohweg V, Tack T. A Probabilistic MajorClust Variant for the Clustering of Near-Homogeneous Graphs. In: 33rd Annual German Conference on Artificial Intelligence (KI 2010). Berlin: Springer; 2010. p. 184–94. (Lecture Notes in Computer Science; vol. 6359).","ufg":"Niggemann, Oliver et. al. (2010): A Probabilistic MajorClust Variant for the Clustering of Near-Homogeneous Graphs, in: 33rd Annual German Conference on Artificial Intelligence (KI 2010) (=Lecture Notes in Computer Science 6359), Berlin, S. 184–194.","havard":"O. Niggemann, V. Lohweg, T. Tack, A Probabilistic MajorClust Variant for the Clustering of Near-Homogeneous Graphs, in: 33rd Annual German Conference on Artificial Intelligence (KI 2010), Springer, Berlin, 2010: pp. 184–194.","bjps":"Niggemann O, Lohweg V and Tack T (2010) A Probabilistic MajorClust Variant for the Clustering of Near-Homogeneous Graphs. 33rd Annual German Conference on Artificial Intelligence (KI 2010), vol. 6359. Berlin: Springer, pp. 184–194.","mla":"Niggemann, Oliver, et al. “A Probabilistic MajorClust Variant for the Clustering of Near-Homogeneous Graphs.” 33rd Annual German Conference on Artificial Intelligence (KI 2010), vol. 6359, Springer, 2010, pp. 184–94, doi:https://doi.org/10.1007/978-3-642-16111-7_21.","ieee":"O. Niggemann, V. Lohweg, and T. Tack, “A Probabilistic MajorClust Variant for the Clustering of Near-Homogeneous Graphs,” in 33rd Annual German Conference on Artificial Intelligence (KI 2010), 2010, vol. 6359, pp. 184–194.","ama":"Niggemann O, Lohweg V, Tack T. A Probabilistic MajorClust Variant for the Clustering of Near-Homogeneous Graphs. In: 33rd Annual German Conference on Artificial Intelligence (KI 2010). Vol 6359. Lecture Notes in Computer Science. Berlin: Springer; 2010:184-194. doi:https://doi.org/10.1007/978-3-642-16111-7_21"},"title":"A Probabilistic MajorClust Variant for the Clustering of Near-Homogeneous Graphs","keyword":["Markov Chain","Cluster Algorithm","Edge Weight","Spectral Cluster","Stable Distribution"],"language":[{"iso":"eng"}],"date_updated":"2023-03-15T13:49:38Z","publication":"33rd Annual German Conference on Artificial Intelligence (KI 2010)","publication_identifier":{"isbn":["978-3-642-16110-0"],"eisbn":["978-3-642-16111-7"]},"date_created":"2019-12-02T08:21:26Z","publisher":"Springer","abstract":[{"lang":"eng","text":"Clustering remains a major topic in machine learning; it is used e.g. for document categorization, for data mining, and for image analysis. In all these application areas, clustering algorithms try to identify groups of related data in large data sets.\r\n\r\nIn this paper, the established clustering algorithm MajorClust ([12]) is improved; making it applicable to data sets with few structure on the local scale—so called near-homogeneous graphs. This new algorithm MCProb is verified empirically using the problem of image clustering. Furthermore, MCProb is analyzed theoretically. For the applications examined so-far, MCProb outperforms other established clustering techniques."}],"department":[{"_id":"DEP5023"}],"publication_status":"published","series_title":"Lecture Notes in Computer Science","_id":"2088","doi":"https://doi.org/10.1007/978-3-642-16111-7_21","place":"Berlin","intvolume":" 6359","user_id":"45673","type":"conference"},{"title":"Fuzzy-Pattern-Classifier based Sensor Fusion for Machine Conditioning","citation":{"chicago":"Lohweg, Volker, and Uwe Mönks. “Fuzzy-Pattern-Classifier Based Sensor Fusion for Machine Conditioning.” In Sensor Fusion ISBN 978-953-307-101-5 Ed by Ciza Thomas, edited by Ciza Thomas (ed). SCIYO, 2010.","ieee":"V. Lohweg and U. Mönks, “Fuzzy-Pattern-Classifier based Sensor Fusion for Machine Conditioning,” in Sensor Fusion ISBN 978-953-307-101-5 ed by Ciza Thomas, 2010.","apa":"Lohweg, V., & Mönks, U. (2010). Fuzzy-Pattern-Classifier based Sensor Fusion for Machine Conditioning. In C. Thomas (ed) (Ed.), Sensor Fusion ISBN 978-953-307-101-5 ed by Ciza Thomas. SCIYO.","bjps":"Lohweg V and Mönks U (2010) Fuzzy-Pattern-Classifier Based Sensor Fusion for Machine Conditioning. In Thomas (ed) C (ed.), Sensor Fusion ISBN 978-953-307-101-5 Ed by Ciza Thomas. SCIYO.","havard":"V. Lohweg, U. Mönks, Fuzzy-Pattern-Classifier based Sensor Fusion for Machine Conditioning, in: C. Thomas (ed) (Ed.), Sensor Fusion ISBN 978-953-307-101-5 Ed by Ciza Thomas, SCIYO, 2010.","mla":"Lohweg, Volker, and Uwe Mönks. “Fuzzy-Pattern-Classifier Based Sensor Fusion for Machine Conditioning.” Sensor Fusion ISBN 978-953-307-101-5 Ed by Ciza Thomas, edited by Ciza Thomas (ed), SCIYO, 2010.","ufg":"Lohweg, Volker/Mönks, Uwe (2010): Fuzzy-Pattern-Classifier based Sensor Fusion for Machine Conditioning, in: Ciza Thomas (ed) (Hg.): Sensor Fusion ISBN 978-953-307-101-5 ed by Ciza Thomas.","ama":"Lohweg V, Mönks U. Fuzzy-Pattern-Classifier based Sensor Fusion for Machine Conditioning. 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Jahreskolloquium \"Bildverarbeitung in der Automation - BVAu2010\"","status":"public","author":[{"orcid":"0000-0002-3325-7887","full_name":"Lohweg, Volker","first_name":"Volker","id":"1804","last_name":"Lohweg"},{"last_name":"Mertsching","first_name":"Bärbel","full_name":"Mertsching, Bärbel"}],"year":2010,"department":[{"_id":"DEP5023"}]},{"date_updated":"2023-03-15T13:49:38Z","user_id":"45673","date_created":"2019-11-29T14:33:24Z","type":"conference","publication":"21st annual Symposium on IST/SPIE Electronic Imaging, 18 -22 January 2009,","doi":"https://doi.org/10.1117/12.805427","_id":"2075","language":[{"iso":"eng"}],"place":"San Jose, California USA. Accepted for publication","publication_status":"published","citation":{"ama":"Lohweg V, Li R, Türke T, Willeke H, Schaede J. FPGA-based Multi-sensor Real Time Machine Vision for Banknote Printing. In: 21st Annual Symposium on IST/SPIE Electronic Imaging, 18 -22 January 2009,. San Jose, California USA. Accepted for publication; 2009. doi:https://doi.org/10.1117/12.805427","ieee":"V. Lohweg, R. Li, T. Türke, H. Willeke, and J. Schaede, “FPGA-based Multi-sensor Real Time Machine Vision for Banknote Printing,” in 21st annual Symposium on IST/SPIE Electronic Imaging, 18 -22 January 2009, 2009.","short":"V. Lohweg, R. Li, T. Türke, H. Willeke, J. Schaede, in: 21st Annual Symposium on IST/SPIE Electronic Imaging, 18 -22 January 2009, San Jose, California USA. Accepted for publication, 2009.","din1505-2-1":"Lohweg, Volker ; Li, Rui ; Türke, Thomas ; Willeke, Harald ; Schaede, Johannes: FPGA-based Multi-sensor Real Time Machine Vision for Banknote Printing. In: 21st annual Symposium on IST/SPIE Electronic Imaging, 18 -22 January 2009,. San Jose, California USA. Accepted for publication, 2009","chicago-de":"Lohweg, Volker, Rui Li, Thomas Türke, Harald Willeke und Johannes Schaede. 2009. FPGA-based Multi-sensor Real Time Machine Vision for Banknote Printing. In: 21st annual Symposium on IST/SPIE Electronic Imaging, 18 -22 January 2009,. San Jose, California USA. Accepted for publication. doi:https://doi.org/10.1117/12.805427, .","van":"Lohweg V, Li R, Türke T, Willeke H, Schaede J. FPGA-based Multi-sensor Real Time Machine Vision for Banknote Printing. In: 21st annual Symposium on IST/SPIE Electronic Imaging, 18 -22 January 2009,. San Jose, California USA. Accepted for publication; 2009.","ufg":"Lohweg, Volker et. al. (2009): FPGA-based Multi-sensor Real Time Machine Vision for Banknote Printing, in: 21st annual Symposium on IST/SPIE Electronic Imaging, 18 -22 January 2009,, San Jose, California USA. Accepted for publication.","havard":"V. Lohweg, R. Li, T. Türke, H. Willeke, J. Schaede, FPGA-based Multi-sensor Real Time Machine Vision for Banknote Printing, in: 21st Annual Symposium on IST/SPIE Electronic Imaging, 18 -22 January 2009, San Jose, California USA. Accepted for publication, 2009.","mla":"Lohweg, Volker, et al. “FPGA-Based Multi-Sensor Real Time Machine Vision for Banknote Printing.” 21st Annual Symposium on IST/SPIE Electronic Imaging, 18 -22 January 2009, 2009, doi:https://doi.org/10.1117/12.805427.","bjps":"Lohweg V et al. (2009) FPGA-Based Multi-Sensor Real Time Machine Vision for Banknote Printing. 21st Annual Symposium on IST/SPIE Electronic Imaging, 18 -22 January 2009,. San Jose, California USA. Accepted for publication.","apa":"Lohweg, V., Li, R., Türke, T., Willeke, H., & Schaede, J. (2009). FPGA-based Multi-sensor Real Time Machine Vision for Banknote Printing. In 21st annual Symposium on IST/SPIE Electronic Imaging, 18 -22 January 2009,. San Jose, California USA. Accepted for publication. https://doi.org/10.1117/12.805427","chicago":"Lohweg, Volker, Rui Li, Thomas Türke, Harald Willeke, and Johannes Schaede. “FPGA-Based Multi-Sensor Real Time Machine Vision for Banknote Printing.” In 21st Annual Symposium on IST/SPIE Electronic Imaging, 18 -22 January 2009,. San Jose, California USA. Accepted for publication, 2009. https://doi.org/10.1117/12.805427."},"title":"FPGA-based Multi-sensor Real Time Machine Vision for Banknote Printing","status":"public","abstract":[{"lang":"eng","text":"Automatic sheet inspection in banknote production has been used as a standard quality control tool for more than a decade. As more and more print techniques and new security features are established, total quality in bank note printing must be guaranteed. This aspect has a direct impact on the research and development for bank note inspection systems in general in the sense of technological sustainability. It is accepted, that print defects are generated not only by printing parameter changes, but also by mechanical machine parameter changes, which will change unnoticed in production. Therefore, a new concept for a multi-sensory adaptive learning and classification model based on Fuzzy-Pattern- Classifiers for data inspection and machine conditioning is proposed. A general aim is to improve the known inspection techniques and propose an inspection methodology that can ensure a comprehensive quality control of the printed substrates processed by printing presses, especially printing presses which are designed to process substrates used in the course of the production of banknotes, security documents and others. Therefore, the research and development work in this area necessitates a change in concept for banknote inspection in general. In this paper a new generation of FPGA (Field Programmable Gate Array) based real time inspection technology is presented, which allows not only colour inspection on banknote sheets, but has also the implementation flexibility for various inspection algorithms for security features, such as window threads, embedded threads, OVDs, watermarks, screen printing etc., and multi-sensory data processing. A variety of algorithms is described in the paper, which are designed for and implemented on FPGAs. The focus is based on algorithmic approaches"}],"department":[{"_id":"DEP5023"}],"year":2009,"main_file_link":[{"url":"https://www.spiedigitallibrary.org/conference-proceedings-of-spie/7251/72510S/FPGA-based-multisensor-real-time-machine-vision-for-banknote-printing/10.1117/12.805427.full"}],"author":[{"orcid":"0000-0002-3325-7887","first_name":"Volker","full_name":"Lohweg, Volker","last_name":"Lohweg","id":"1804"},{"last_name":"Li","full_name":"Li, Rui","first_name":"Rui","id":"2000"},{"last_name":"Türke","first_name":"Thomas","full_name":"Türke, Thomas"},{"last_name":"Willeke","first_name":"Harald","full_name":"Willeke, Harald"},{"id":"2128","first_name":"Johannes","full_name":"Schaede, Johannes","last_name":"Schaede"}]},{"keyword":["Discrete Wavelet Transform","Wavelet Transform","Wavelet Packet","Decomposition Level","Printing Technique"],"language":[{"iso":"eng"}],"date_updated":"2023-03-15T13:49:38Z","editor":[{"first_name":"J.","last_name":"Denzler","full_name":"Denzler, J."},{"last_name":"Notni","first_name":"G.","full_name":"Notni, G."},{"first_name":"H.","last_name":"Süße","full_name":"Süße, H."}],"publication":"Pattern Recognition","publication_identifier":{"eisbn":["978-3-642-03798-6"],"isbn":["978-3-642-03797-9"]},"date_created":"2019-11-29T14:35:35Z","status":"public","page":"422-431","author":[{"id":"44020","first_name":"Stefan","last_name":"Glock","full_name":"Glock, Stefan"},{"first_name":"Eugen","full_name":"Gillich, Eugen","id":"1706","last_name":"Gillich"},{"first_name":"Johannes","id":"2128","full_name":"Schaede, Johannes","last_name":"Schaede"},{"last_name":"Lohweg","first_name":"Volker","full_name":"Lohweg, Volker","id":"1804","orcid":"0000-0002-3325-7887"}],"main_file_link":[{"url":"https://link.springer.com/chapter/10.1007/978-3-642-03798-6_43"}],"year":2009,"volume":5748,"citation":{"chicago":"Glock, Stefan, Eugen Gillich, Johannes Schaede, and Volker Lohweg. “Feature Extraction Algorithm for Banknote Textures Based on Incomplete Shift Invariant Wavelet Packet Transform.” In Pattern Recognition, edited by J. Denzler, G. Notni, and H. Süße, 5748:422–31. Lecture Notes in Computer Science. Berlin: Springer, 2009. https://doi.org/10.1007/978-3-642-03798-6_43.","apa":"Glock, S., Gillich, E., Schaede, J., & Lohweg, V. (2009). Feature Extraction Algorithm for Banknote Textures based on Incomplete Shift Invariant Wavelet Packet Transform. In J. Denzler, G. Notni, & H. Süße (Eds.), Pattern Recognition (Vol. 5748, pp. 422–431). Berlin: Springer. https://doi.org/10.1007/978-3-642-03798-6_43","mla":"Glock, Stefan, et al. “Feature Extraction Algorithm for Banknote Textures Based on Incomplete Shift Invariant Wavelet Packet Transform.” Pattern Recognition, edited by J. Denzler et al., vol. 5748, Springer, 2009, pp. 422–31, doi:https://doi.org/10.1007/978-3-642-03798-6_43.","bjps":"Glock S et al. (2009) Feature Extraction Algorithm for Banknote Textures Based on Incomplete Shift Invariant Wavelet Packet Transform. In Denzler J, Notni G and Süße H (eds), Pattern Recognition, vol. 5748. Berlin: Springer, pp. 422–431.","havard":"S. Glock, E. Gillich, J. Schaede, V. Lohweg, Feature Extraction Algorithm for Banknote Textures based on Incomplete Shift Invariant Wavelet Packet Transform, in: J. Denzler, G. Notni, H. Süße (Eds.), Pattern Recognition, Springer, Berlin, 2009: pp. 422–431.","ufg":"Glock, Stefan et. al. (2009): Feature Extraction Algorithm for Banknote Textures based on Incomplete Shift Invariant Wavelet Packet Transform, in: J. Denzler et. al. (Hgg.): Pattern Recognition (=Lecture Notes in Computer Science 5748), Berlin, S. 422–431.","van":"Glock S, Gillich E, Schaede J, Lohweg V. Feature Extraction Algorithm for Banknote Textures based on Incomplete Shift Invariant Wavelet Packet Transform. In: Denzler J, Notni G, Süße H, editors. Pattern Recognition. Berlin: Springer; 2009. p. 422–31. (Lecture Notes in Computer Science; vol. 5748).","din1505-2-1":"Glock, Stefan ; Gillich, Eugen ; Schaede, Johannes ; Lohweg, Volker: Feature Extraction Algorithm for Banknote Textures based on Incomplete Shift Invariant Wavelet Packet Transform. In: Denzler, J. ; Notni, G. ; Süße, H. (Hrsg.): Pattern Recognition, Lecture Notes in Computer Science. Bd. 5748. Berlin : Springer, 2009, S. 422–431","chicago-de":"Glock, Stefan, Eugen Gillich, Johannes Schaede und Volker Lohweg. 2009. Feature Extraction Algorithm for Banknote Textures based on Incomplete Shift Invariant Wavelet Packet Transform. In: Pattern Recognition, hg. von J. Denzler, G. Notni, und H. Süße, 5748:422–431. Lecture Notes in Computer Science. Berlin: Springer. doi:https://doi.org/10.1007/978-3-642-03798-6_43, .","short":"S. Glock, E. Gillich, J. Schaede, V. Lohweg, in: J. Denzler, G. Notni, H. Süße (Eds.), Pattern Recognition, Springer, Berlin, 2009, pp. 422–431.","ieee":"S. Glock, E. Gillich, J. Schaede, and V. Lohweg, “Feature Extraction Algorithm for Banknote Textures based on Incomplete Shift Invariant Wavelet Packet Transform,” in Pattern Recognition, vol. 5748, J. Denzler, G. Notni, and H. Süße, Eds. Berlin: Springer, 2009, pp. 422–431.","ama":"Glock S, Gillich E, Schaede J, Lohweg V. Feature Extraction Algorithm for Banknote Textures based on Incomplete Shift Invariant Wavelet Packet Transform. In: Denzler J, Notni G, Süße H, eds. Pattern Recognition. Vol 5748. Lecture Notes in Computer Science. Berlin: Springer; 2009:422-431. doi:https://doi.org/10.1007/978-3-642-03798-6_43"},"title":"Feature Extraction Algorithm for Banknote Textures based on Incomplete Shift Invariant Wavelet Packet Transform","place":"Berlin","_id":"2076","doi":"https://doi.org/10.1007/978-3-642-03798-6_43","user_id":"45673","intvolume":" 5748","type":"book_chapter","publisher":"Springer","department":[{"_id":"DEP5023"}],"conference":{"start_date":"2009-11-09","end_date":"2009-11-11","name":"The 31st annual pattern recognition symposium of the German Association for Pattern Recognition DAGM (Deutsche Arbeitsgemeinschaft für Mustererkennung DAGM e.V.) September 9-11, 2009, accepted for publication"},"abstract":[{"lang":"eng","text":"Segmentation and feature extraction algorithms based on Wavelet Transform or Wavelet Packet Transform are established in pattern recognition. Especially in the field of texture analysis they are known to be practical. One difficulty of texture analysis was in the past the characterization of different printing processes. In this paper we present a new algorithmic concept to feature extraction of textures, printed by different printing techniques, without the necessity of a previous teaching phase. The typical characters of distinct printed textures are extracted by first order statistical moments of wavelet coefficients. The algorithm uses the 2D incomplete shift invariant Wavelet Packet Transform, resulting in a fast execution time of O(Nlog2(N)). Since the incomplete shift invariant Wavelet Packet Transform was exclusively defined for 1D-signals, it has been modified in this research. The application describes the detection of different printed security textures. "}],"publication_status":"published","series_title":"Lecture Notes in Computer Science"},{"publication_status":"published","series_title":" Proceedings of SPIE","publisher":"SPIE ","conference":{"end_date":"2009-06-18","start_date":"2009-06-15","location":"München","name":"VI. Optical measurement systems for industrial inspection "},"department":[{"_id":"DEP5023"}],"abstract":[{"lang":"eng","text":"In this paper we present an optical measurement system approach for quality analysis of brakes which are used in high-speed trains. The brakes consist of the so called brake discs and pads. In a deceleration process the discs will be heated up to 500°C. The quality measure is based on the fact that the heated brake discs should not generate hot spots inside the brake material. Instead, the brake disc should be heated homogeneously by the deceleration. Therefore, it makes sense to analyze the number of hot spots and their relative gradients to create a quality measure for train brakes. In this contribution we present a new approach for a quality measurement system which is based on an image analysis and classification of infra-red based heat images. Brake images which are represented in pseudo-color are first transformed in a linear grayscale space by a hue-saturation-intensity (HSI) space. This transform is necessary for the following gradient analysis which is based on gray scale gradient filters. Furthermore, different features based on Haralick's measures are generated from the gray scale and gradient images. A following Fuzzy-Pattern-Classifier is used for the classification of good and bad brakes. It has to be pointed out that the classifier returns a score value for each brake which is between 0 and 100% good quality. This fact guarantees that not only good and bad bakes can be distinguished, but also their quality can be labeled. The results show that all critical thermal patterns of train brakes can be sensed and verified."}],"user_id":"83781","intvolume":" 7389","type":"conference","place":" Bellingham, Wash. ","_id":"2077","doi":"https://doi.org/10.1117/12.827457","article_number":"7389 1Y","volume":7389,"citation":{"ama":"Glock S, Hausmann S, Gerke S, et al. Optical classification for quality and defect analysis of train brakes. In: Optical Measurement Systems for Industrial Inspection VI : 15 - 18 June 2009, Munich, Germany / Sponsored by SPIE Europe. Peter H. Lehmann, Ed. ; Pt. 2 . Vol 7389. Proceedings of SPIE. SPIE ; 2009. doi:https://doi.org/10.1117/12.827457","ieee":"S. Glock et al., “Optical classification for quality and defect analysis of train brakes,” in Optical measurement systems for industrial inspection VI : 15 - 18 June 2009, Munich, Germany / sponsored by SPIE Europe. Peter H. Lehmann, ed. ; Pt. 2 , München, 2009, vol. 7389. doi: https://doi.org/10.1117/12.827457.","van":"Glock S, Hausmann S, Gerke S, Warok A, Spiess P, Witte S, et al. Optical classification for quality and defect analysis of train brakes. In: Optical measurement systems for industrial inspection VI : 15 - 18 June 2009, Munich, Germany / sponsored by SPIE Europe Peter H Lehmann, ed ; Pt 2 . Bellingham, Wash. : SPIE ; 2009. ( Proceedings of SPIE; vol. 7389).","ufg":"Glock, Stefan u. a.: Optical classification for quality and defect analysis of train brakes, in: o. Hg.: Optical measurement systems for industrial inspection VI : 15 - 18 June 2009, Munich, Germany / sponsored by SPIE Europe. Peter H. Lehmann, ed. ; Pt. 2 , Bd. 7389, Bellingham, Wash. 2009 ( Proceedings of SPIE).","havard":"S. Glock, S. Hausmann, S. Gerke, A. Warok, P. Spiess, S. Witte, V. Lohweg, Optical classification for quality and defect analysis of train brakes, in: Optical Measurement Systems for Industrial Inspection VI : 15 - 18 June 2009, Munich, Germany / Sponsored by SPIE Europe. Peter H. Lehmann, Ed. ; Pt. 2 , SPIE , Bellingham, Wash. , 2009.","mla":"Glock, Stefan, et al. “Optical Classification for Quality and Defect Analysis of Train Brakes.” Optical Measurement Systems for Industrial Inspection VI : 15 - 18 June 2009, Munich, Germany / Sponsored by SPIE Europe. Peter H. Lehmann, Ed. ; Pt. 2 , vol. 7389, 7389 1Y, SPIE , 2009, https://doi.org/10.1117/12.827457.","bjps":"Glock S et al. (2009) Optical Classification for Quality and Defect Analysis of Train Brakes. Optical Measurement Systems for Industrial Inspection VI : 15 - 18 June 2009, Munich, Germany / Sponsored by SPIE Europe. Peter H. Lehmann, Ed. ; Pt. 2 , vol. 7389. Bellingham, Wash. : SPIE .","apa":"Glock, S., Hausmann, S., Gerke, S., Warok, A., Spiess, P., Witte, S., & Lohweg, V. (2009). Optical classification for quality and defect analysis of train brakes. Optical Measurement Systems for Industrial Inspection VI : 15 - 18 June 2009, Munich, Germany / Sponsored by SPIE Europe. Peter H. Lehmann, Ed. ; Pt. 2 , 7389, Article 7389 1Y. https://doi.org/10.1117/12.827457","chicago":"Glock, Stefan, Stefan Hausmann, Sebastian Gerke, Alexander Warok, Peter Spiess, Stefan Witte, and Volker Lohweg. “Optical Classification for Quality and Defect Analysis of Train Brakes.” In Optical Measurement Systems for Industrial Inspection VI : 15 - 18 June 2009, Munich, Germany / Sponsored by SPIE Europe. Peter H. Lehmann, Ed. ; Pt. 2 , Vol. 7389. Proceedings of SPIE. Bellingham, Wash. : SPIE , 2009. https://doi.org/10.1117/12.827457.","short":"S. Glock, S. Hausmann, S. Gerke, A. Warok, P. Spiess, S. Witte, V. Lohweg, in: Optical Measurement Systems for Industrial Inspection VI : 15 - 18 June 2009, Munich, Germany / Sponsored by SPIE Europe. Peter H. Lehmann, Ed. ; Pt. 2 , SPIE , Bellingham, Wash. , 2009.","chicago-de":"Glock, Stefan, Stefan Hausmann, Sebastian Gerke, Alexander Warok, Peter Spiess, Stefan Witte und Volker Lohweg. 2009. Optical classification for quality and defect analysis of train brakes. In: Optical measurement systems for industrial inspection VI : 15 - 18 June 2009, Munich, Germany / sponsored by SPIE Europe. Peter H. Lehmann, ed. ; Pt. 2 , 7389:. Proceedings of SPIE. Bellingham, Wash. : SPIE . doi:https://doi.org/10.1117/12.827457, .","din1505-2-1":"Glock, Stefan ; Hausmann, Stefan ; Gerke, Sebastian ; Warok, Alexander ; Spiess, Peter ; Witte, Stefan ; Lohweg, Volker: Optical classification for quality and defect analysis of train brakes. In: Optical measurement systems for industrial inspection VI : 15 - 18 June 2009, Munich, Germany / sponsored by SPIE Europe. Peter H. Lehmann, ed. ; Pt. 2 , Proceedings of SPIE. Bd. 7389. Bellingham, Wash. : SPIE , 2009"},"title":"Optical classification for quality and defect analysis of train brakes","status":"public","main_file_link":[{"url":"https://www.spiedigitallibrary.org/conference-proceedings-of-spie/7389/73891Y/Optical-classification-for-quality-and-defect-analysis-of-train-brakes/10.1117/12.827457.full"}],"year":"2009","author":[{"full_name":"Glock, Stefan","last_name":"Glock","id":"44020","first_name":"Stefan"},{"last_name":"Hausmann","first_name":"Stefan","full_name":"Hausmann, Stefan"},{"last_name":"Gerke","full_name":"Gerke, Sebastian","id":"73865","first_name":"Sebastian"},{"full_name":"Warok, Alexander","first_name":"Alexander","last_name":"Warok"},{"full_name":"Spiess, Peter","first_name":"Peter","last_name":"Spiess"},{"last_name":"Witte","full_name":"Witte, Stefan","id":"1605","first_name":"Stefan"},{"last_name":"Lohweg","first_name":"Volker","full_name":"Lohweg, Volker","id":"1804","orcid":"0000-0002-3325-7887"}],"date_updated":"2023-08-14T13:24:22Z","publication_identifier":{"isbn":[" 9780819476722 "]},"publication":"Optical measurement systems for industrial inspection VI : 15 - 18 June 2009, Munich, Germany / sponsored by SPIE Europe. Peter H. Lehmann, ed. ; Pt. 2 ","date_created":"2019-11-29T14:42:59Z","language":[{"iso":"eng"}]},{"status":"public","author":[{"full_name":"Lohweg, Volker","first_name":"Volker","id":"1804","last_name":"Lohweg","orcid":"0000-0002-3325-7887"},{"full_name":"Gillich, Eugen","first_name":"Eugen","last_name":"Gillich","id":"1706"},{"id":"2128","full_name":"Schaede, Johannes","last_name":"Schaede","first_name":"Johannes"}],"year":2009,"department":[{"_id":"DEP5023"}],"citation":{"apa":"Lohweg, V., Gillich, E., & Schaede, J. (2009). New Concepts in Banknote Authentication. In inIT KBA-Giori International Workshop on “Detection of Banknote Forgeries”, Blomberg, 10-12 August 2009.","chicago":"Lohweg, Volker, Eugen Gillich, and Johannes Schaede. “New Concepts in Banknote Authentication.” In InIT KBA-Giori International Workshop on “Detection of Banknote Forgeries”, Blomberg, 10-12 August 2009, 2009.","van":"Lohweg V, Gillich E, Schaede J. New Concepts in Banknote Authentication. In: inIT KBA-Giori International Workshop on “Detection of Banknote Forgeries”, Blomberg, 10-12 August 2009. 2009.","bjps":"Lohweg V, Gillich E and Schaede J (2009) New Concepts in Banknote Authentication. InIT KBA-Giori International Workshop on ‘Detection of Banknote Forgeries’, Blomberg, 10-12 August 2009.","mla":"Lohweg, Volker, et al. “New Concepts in Banknote Authentication.” InIT KBA-Giori International Workshop on “Detection of Banknote Forgeries”, Blomberg, 10-12 August 2009, 2009.","havard":"V. Lohweg, E. Gillich, J. Schaede, New Concepts in Banknote Authentication, in: InIT KBA-Giori International Workshop on “Detection of Banknote Forgeries”, Blomberg, 10-12 August 2009, 2009.","ufg":"Lohweg, Volker et. al. (2009): New Concepts in Banknote Authentication, in: inIT KBA-Giori International Workshop on „Detection of Banknote Forgeries“, Blomberg, 10-12 August 2009.","short":"V. Lohweg, E. Gillich, J. Schaede, in: InIT KBA-Giori International Workshop on “Detection of Banknote Forgeries”, Blomberg, 10-12 August 2009, 2009.","chicago-de":"Lohweg, Volker, Eugen Gillich und Johannes Schaede. 2009. New Concepts in Banknote Authentication. In: inIT KBA-Giori International Workshop on „Detection of Banknote Forgeries“, Blomberg, 10-12 August 2009.","din1505-2-1":"Lohweg, Volker ; Gillich, Eugen ; Schaede, Johannes: New Concepts in Banknote Authentication. In: inIT KBA-Giori International Workshop on „Detection of Banknote Forgeries“, Blomberg, 10-12 August 2009, 2009","ieee":"V. Lohweg, E. Gillich, and J. Schaede, “New Concepts in Banknote Authentication,” in inIT KBA-Giori International Workshop on “Detection of Banknote Forgeries”, Blomberg, 10-12 August 2009, 2009.","ama":"Lohweg V, Gillich E, Schaede J. New Concepts in Banknote Authentication. In: InIT KBA-Giori International Workshop on “Detection of Banknote Forgeries”, Blomberg, 10-12 August 2009. ; 2009."},"title":"New Concepts in Banknote Authentication","_id":"2078","language":[{"iso":"eng"}],"user_id":"45673","date_updated":"2023-03-15T13:49:38Z","publication":"inIT KBA-Giori International Workshop on \"Detection of Banknote Forgeries\", Blomberg, 10-12 August 2009","date_created":"2019-11-29T14:46:08Z","type":"conference"},{"department":[{"_id":"DEP5023"}],"year":2009,"author":[{"first_name":"Taswar","last_name":"Iqbal","full_name":"Iqbal, Taswar"},{"id":"1853","full_name":"Dicks, Alexander","last_name":"Dicks","first_name":"Alexander"},{"last_name":"Lohweg","first_name":"Volker","id":"1804","full_name":"Lohweg, Volker","orcid":"0000-0002-3325-7887"}],"publisher":"32nd Annual Conference on Artificial Intelligence Paderborn | September 15 – 18, 2009, accepted for Publication","status":"public","title":"Metal Surface Coding as a trusted body for brand labeling, KI 2009, Artificial Intelligence and Automation (AI at Universities of Applied Sciences)","citation":{"havard":"T. Iqbal, A. Dicks, V. Lohweg, Metal Surface Coding as a trusted body for brand labeling, KI 2009, Artificial Intelligence and Automation (AI at Universities of Applied Sciences), in: 32nd Annual Conference on Artificial Intelligence Paderborn | September 15 – 18, 2009, accepted for Publication, 2009.","bjps":"Iqbal T, Dicks A and Lohweg V (2009) Metal Surface Coding as a Trusted Body for Brand Labeling, KI 2009, Artificial Intelligence and Automation (AI at Universities of Applied Sciences). 32nd Annual Conference on Artificial Intelligence Paderborn | September 15 – 18, 2009, accepted for Publication.","mla":"Iqbal, Taswar, et al. Metal Surface Coding as a Trusted Body for Brand Labeling, KI 2009, Artificial Intelligence and Automation (AI at Universities of Applied Sciences). 32nd Annual Conference on Artificial Intelligence Paderborn | September 15 – 18, 2009, accepted for Publication, 2009.","ufg":"Iqbal, Taswar et. al. (2009): Metal Surface Coding as a trusted body for brand labeling, KI 2009, Artificial Intelligence and Automation (AI at Universities of Applied Sciences), in: .","ama":"Iqbal T, Dicks A, Lohweg V. Metal Surface Coding as a trusted body for brand labeling, KI 2009, Artificial Intelligence and Automation (AI at Universities of Applied Sciences). In: 32nd Annual Conference on Artificial Intelligence Paderborn | September 15 – 18, 2009, accepted for Publication; 2009.","van":"Iqbal T, Dicks A, Lohweg V. Metal Surface Coding as a trusted body for brand labeling, KI 2009, Artificial Intelligence and Automation (AI at Universities of Applied Sciences). In 32nd Annual Conference on Artificial Intelligence Paderborn | September 15 – 18, 2009, accepted for Publication; 2009.","chicago":"Iqbal, Taswar, Alexander Dicks, and Volker Lohweg. “Metal Surface Coding as a Trusted Body for Brand Labeling, KI 2009, Artificial Intelligence and Automation (AI at Universities of Applied Sciences).” 32nd Annual Conference on Artificial Intelligence Paderborn | September 15 – 18, 2009, accepted for Publication, 2009.","ieee":"T. Iqbal, A. Dicks, and V. Lohweg, “Metal Surface Coding as a trusted body for brand labeling, KI 2009, Artificial Intelligence and Automation (AI at Universities of Applied Sciences),” 2009.","apa":"Iqbal, T., Dicks, A., & Lohweg, V. (2009). Metal Surface Coding as a trusted body for brand labeling, KI 2009, Artificial Intelligence and Automation (AI at Universities of Applied Sciences). 32nd Annual Conference on Artificial Intelligence Paderborn | September 15 – 18, 2009, accepted for Publication.","din1505-2-1":"Iqbal, Taswar ; Dicks, Alexander ; Lohweg, Volker: Metal Surface Coding as a trusted body for brand labeling, KI 2009, Artificial Intelligence and Automation (AI at Universities of Applied Sciences). In: : 32nd Annual Conference on Artificial Intelligence Paderborn | September 15 – 18, 2009, accepted for Publication, 2009","chicago-de":"Iqbal, Taswar, Alexander Dicks und Volker Lohweg. 2009. Metal Surface Coding as a trusted body for brand labeling, KI 2009, Artificial Intelligence and Automation (AI at Universities of Applied Sciences). In: . 32nd Annual Conference on Artificial Intelligence Paderborn | September 15 – 18, 2009, accepted for Publication.","short":"T. Iqbal, A. Dicks, V. Lohweg, in: 32nd Annual Conference on Artificial Intelligence Paderborn | September 15 – 18, 2009, accepted for Publication, 2009."},"_id":"2079","language":[{"iso":"eng"}],"date_created":"2019-11-29T14:47:48Z","type":"conference","date_updated":"2023-03-15T13:49:38Z","user_id":"45673"},{"citation":{"short":"J.-F. Ehlenbröker, K. Voth, V. Lohweg, in: 32nd Annual Conference on Artificial Intelligence Paderborn | September 15 – 18, 2009, Accepted for Publication, 2009.","chicago-de":"Ehlenbröker, Jan-Friedrich, Karl Voth und Volker Lohweg. 2009. Human-based surface detection: KI 2009, Artificial Intelligence and Automation (AI at Universities of Applied Sciences) . In: 32nd Annual Conference on Artificial Intelligence Paderborn | September 15 – 18, 2009, accepted for Publication.","din1505-2-1":"Ehlenbröker, Jan-Friedrich ; Voth, Karl ; Lohweg, Volker: Human-based surface detection: KI 2009, Artificial Intelligence and Automation (AI at Universities of Applied Sciences) . In: 32nd Annual Conference on Artificial Intelligence Paderborn | September 15 – 18, 2009, accepted for Publication, 2009","apa":"Ehlenbröker, J.-F., Voth, K., & Lohweg, V. (2009). Human-based surface detection: KI 2009, Artificial Intelligence and Automation (AI at Universities of Applied Sciences) . In 32nd Annual Conference on Artificial Intelligence Paderborn | September 15 – 18, 2009, accepted for Publication.","chicago":"Ehlenbröker, Jan-Friedrich, Karl Voth, and Volker Lohweg. “Human-Based Surface Detection: KI 2009, Artificial Intelligence and Automation (AI at Universities of Applied Sciences) .” In 32nd Annual Conference on Artificial Intelligence Paderborn | September 15 – 18, 2009, Accepted for Publication, 2009.","van":"Ehlenbröker J-F, Voth K, Lohweg V. Human-based surface detection: KI 2009, Artificial Intelligence and Automation (AI at Universities of Applied Sciences) . In: 32nd Annual Conference on Artificial Intelligence Paderborn | September 15 – 18, 2009, accepted for Publication. 2009.","havard":"J.-F. Ehlenbröker, K. Voth, V. Lohweg, Human-based surface detection: KI 2009, Artificial Intelligence and Automation (AI at Universities of Applied Sciences) , in: 32nd Annual Conference on Artificial Intelligence Paderborn | September 15 – 18, 2009, Accepted for Publication, 2009.","mla":"Ehlenbröker, Jan-Friedrich, et al. “Human-Based Surface Detection: KI 2009, Artificial Intelligence and Automation (AI at Universities of Applied Sciences) .” 32nd Annual Conference on Artificial Intelligence Paderborn | September 15 – 18, 2009, Accepted for Publication, 2009.","bjps":"Ehlenbröker J-F, Voth K and Lohweg V (2009) Human-Based Surface Detection: KI 2009, Artificial Intelligence and Automation (AI at Universities of Applied Sciences) . 32nd Annual Conference on Artificial Intelligence Paderborn | September 15 – 18, 2009, Accepted for Publication.","ufg":"Ehlenbröker, Jan-Friedrich et. al. (2009): Human-based surface detection: KI 2009, Artificial Intelligence and Automation (AI at Universities of Applied Sciences) , in: 32nd Annual Conference on Artificial Intelligence Paderborn | September 15 – 18, 2009, accepted for Publication.","ieee":"J.-F. Ehlenbröker, K. Voth, and V. Lohweg, “Human-based surface detection: KI 2009, Artificial Intelligence and Automation (AI at Universities of Applied Sciences) ,” in 32nd Annual Conference on Artificial Intelligence Paderborn | September 15 – 18, 2009, accepted for Publication, 2009.","ama":"Ehlenbröker J-F, Voth K, Lohweg V. Human-based surface detection: KI 2009, Artificial Intelligence and Automation (AI at Universities of Applied Sciences) . In: 32nd Annual Conference on Artificial Intelligence Paderborn | September 15 – 18, 2009, Accepted for Publication. ; 2009."},"title":"Human-based surface detection: KI 2009, Artificial Intelligence and Automation (AI at Universities of Applied Sciences) ","status":"public","year":2009,"author":[{"last_name":"Ehlenbröker","first_name":"Jan-Friedrich","full_name":"Ehlenbröker, Jan-Friedrich","id":"1852"},{"first_name":"Karl","full_name":"Voth, Karl","last_name":"Voth"},{"orcid":"0000-0002-3325-7887","full_name":"Lohweg, Volker","first_name":"Volker","id":"1804","last_name":"Lohweg"}],"department":[{"_id":"DEP5023"}],"user_id":"45673","date_updated":"2023-03-15T13:49:38Z","publication":"32nd Annual Conference on Artificial Intelligence Paderborn | September 15 – 18, 2009, accepted for Publication","date_created":"2019-11-29T14:49:27Z","type":"conference","language":[{"iso":"eng"}],"_id":"2080"},{"date_created":"2019-11-29T14:50:48Z","type":"conference","publication":"KI 2009 Workshop, Paderborn | September 15th, 2009, accepted for Publication","date_updated":"2023-03-15T13:49:38Z","user_id":"45673","oa":"1","_id":"2081","language":[{"iso":"eng"}],"title":"Aggregation Operator Based Fuzzy Pattern Classifier Design, Machine Learning in Real-Time Applications (MLRTA 09)","publication_status":"published","citation":{"chicago-de":"Mönks, Uwe, Volker Lohweg und Henrik Legind Larsen. 2009. Aggregation Operator Based Fuzzy Pattern Classifier Design, Machine Learning in Real-Time Applications (MLRTA 09). In: KI 2009 Workshop, Paderborn | September 15th, 2009, accepted for Publication.","din1505-2-1":"Mönks, Uwe ; Lohweg, Volker ; Larsen, Henrik Legind: Aggregation Operator Based Fuzzy Pattern Classifier Design, Machine Learning in Real-Time Applications (MLRTA 09). In: KI 2009 Workshop, Paderborn | September 15th, 2009, accepted for Publication, 2009","short":"U. Mönks, V. Lohweg, H.L. Larsen, in: KI 2009 Workshop, Paderborn | September 15th, 2009, Accepted for Publication, 2009.","chicago":"Mönks, Uwe, Volker Lohweg, and Henrik Legind Larsen. “Aggregation Operator Based Fuzzy Pattern Classifier Design, Machine Learning in Real-Time Applications (MLRTA 09).” In KI 2009 Workshop, Paderborn | September 15th, 2009, Accepted for Publication, 2009.","ieee":"U. Mönks, V. Lohweg, and H. L. Larsen, “Aggregation Operator Based Fuzzy Pattern Classifier Design, Machine Learning in Real-Time Applications (MLRTA 09),” in KI 2009 Workshop, Paderborn | September 15th, 2009, accepted for Publication, 2009.","apa":"Mönks, U., Lohweg, V., & Larsen, H. L. (2009). Aggregation Operator Based Fuzzy Pattern Classifier Design, Machine Learning in Real-Time Applications (MLRTA 09). In KI 2009 Workshop, Paderborn | September 15th, 2009, accepted for Publication.","mla":"Mönks, Uwe, et al. “Aggregation Operator Based Fuzzy Pattern Classifier Design, Machine Learning in Real-Time Applications (MLRTA 09).” KI 2009 Workshop, Paderborn | September 15th, 2009, Accepted for Publication, 2009.","havard":"U. Mönks, V. Lohweg, H.L. Larsen, Aggregation Operator Based Fuzzy Pattern Classifier Design, Machine Learning in Real-Time Applications (MLRTA 09), in: KI 2009 Workshop, Paderborn | September 15th, 2009, Accepted for Publication, 2009.","bjps":"Mönks U, Lohweg V and Larsen HL (2009) Aggregation Operator Based Fuzzy Pattern Classifier Design, Machine Learning in Real-Time Applications (MLRTA 09). KI 2009 Workshop, Paderborn | September 15th, 2009, Accepted for Publication.","ufg":"Mönks, Uwe et. al. (2009): Aggregation Operator Based Fuzzy Pattern Classifier Design, Machine Learning in Real-Time Applications (MLRTA 09), in: KI 2009 Workshop, Paderborn | September 15th, 2009, accepted for Publication.","ama":"Mönks U, Lohweg V, Larsen HL. Aggregation Operator Based Fuzzy Pattern Classifier Design, Machine Learning in Real-Time Applications (MLRTA 09). In: KI 2009 Workshop, Paderborn | September 15th, 2009, Accepted for Publication. ; 2009.","van":"Mönks U, Lohweg V, Larsen HL. Aggregation Operator Based Fuzzy Pattern Classifier Design, Machine Learning in Real-Time Applications (MLRTA 09). In: KI 2009 Workshop, Paderborn | September 15th, 2009, accepted for Publication. 2009."},"abstract":[{"text":"This paper presents a novel modular fuzzy patternclassifier design framework for intelligent automation systems, developed on the base of the established Modified Fuzzy PatternClassifier (MFPC) and that allows designing novel classifier mod-els which are hardware-efficiently implementable. The perfor-mances of novel classifiers using substitutes of MFPC’s geometricmean aggregator are benchmarked in the scope of an imageprocessing application against the MFPC to reveal classificationimprovement potentials for obtaining higher classification rates.","lang":"eng"}],"department":[{"_id":"DEP5023"}],"year":2009,"main_file_link":[{"url":"https://www.th-owl.de/init/uploads/tx_initdb/MLRTA2009_paper_4_01.pdf","open_access":"1"}],"author":[{"id":"1825","first_name":"Uwe","last_name":"Mönks","full_name":"Mönks, Uwe"},{"first_name":"Volker","last_name":"Lohweg","full_name":"Lohweg, Volker","id":"1804","orcid":"0000-0002-3325-7887"},{"first_name":"Henrik Legind","full_name":"Larsen, Henrik Legind","last_name":"Larsen"}],"status":"public"},{"intvolume":" 5803","user_id":"45673","type":"conference","doi":"https://doi.org/10.1007/978-3-642-04617-9_44","_id":"2082","place":"Berlin","publication_status":"published","series_title":"Lecture Notes in Computer Science","publisher":"Springer","abstract":[{"text":"A robust vision system for the counterfeit detection of bank ATM keyboards is presented. The approach is based on the continuous inspection of a keyboard surface by the authenticity verification of coded covert surface features. For the surface coding suitable visual patterns on the keyboard are selected while considering constraints from the visual imperceptibility, robustness and geometrical disturbances to be encountered from the aging effects. The system’s robustness against varying camera-keyboard distances, lighting conditions and dirt-and-scratches effects is investigated. Finally, a demonstrator working in real-time is developed in order to publicly demonstrate the surface authentication process.","lang":"eng"}],"department":[{"_id":"DEP5023"}],"date_updated":"2023-03-15T13:49:38Z","date_created":"2019-11-29T14:54:54Z","publication":"32nd Annual Conference on Artificial Intelligence Paderborn | September 15 – 18, 2009, accepted for Publication","publication_identifier":{"isbn":["978-3-642-04616-2"],"eisbn":["978-3-642-04617-9"]},"language":[{"iso":"eng"}],"keyword":["ATMs","human perception","counterfeit resistance","digital authentication","surface coding","pattern recognition"],"citation":{"ufg":"Iqbal, Taswar et. al. (2009): Human Perception Based Counterfeit Detection for Automated Teller Machines, KI 2009, Artificial Intelligence and Automation , in: 32nd Annual Conference on Artificial Intelligence Paderborn | September 15 – 18, 2009, accepted for Publication (=Lecture Notes in Computer Science 5803), Berlin, S. 347–354.","bjps":"Iqbal T et al. (2009) Human Perception Based Counterfeit Detection for Automated Teller Machines, KI 2009, Artificial Intelligence and Automation . 32nd Annual Conference on Artificial Intelligence Paderborn | September 15 – 18, 2009, Accepted for Publication, vol. 5803. Berlin: Springer, pp. 347–354.","mla":"Iqbal, Taswar, et al. “Human Perception Based Counterfeit Detection for Automated Teller Machines, KI 2009, Artificial Intelligence and Automation .” 32nd Annual Conference on Artificial Intelligence Paderborn | September 15 – 18, 2009, Accepted for Publication, vol. 5803, Springer, 2009, pp. 347–54, doi:https://doi.org/10.1007/978-3-642-04617-9_44.","havard":"T. Iqbal, D.K. Le, M. Nolte, V. Lohweg, Human Perception Based Counterfeit Detection for Automated Teller Machines, KI 2009, Artificial Intelligence and Automation , in: 32nd Annual Conference on Artificial Intelligence Paderborn | September 15 – 18, 2009, Accepted for Publication, Springer, Berlin, 2009: pp. 347–354.","van":"Iqbal T, Le DK, Nolte M, Lohweg V. Human Perception Based Counterfeit Detection for Automated Teller Machines, KI 2009, Artificial Intelligence and Automation . In: 32nd Annual Conference on Artificial Intelligence Paderborn | September 15 – 18, 2009, accepted for Publication. Berlin: Springer; 2009. p. 347–54. (Lecture Notes in Computer Science; vol. 5803).","ama":"Iqbal T, Le DK, Nolte M, Lohweg V. Human Perception Based Counterfeit Detection for Automated Teller Machines, KI 2009, Artificial Intelligence and Automation . In: 32nd Annual Conference on Artificial Intelligence Paderborn | September 15 – 18, 2009, Accepted for Publication. Vol 5803. Lecture Notes in Computer Science. Berlin: Springer; 2009:347-354. doi:https://doi.org/10.1007/978-3-642-04617-9_44","chicago":"Iqbal, Taswar, Dinh Khoi Le, Michael Nolte, and Volker Lohweg. “Human Perception Based Counterfeit Detection for Automated Teller Machines, KI 2009, Artificial Intelligence and Automation .” In 32nd Annual Conference on Artificial Intelligence Paderborn | September 15 – 18, 2009, Accepted for Publication, 5803:347–54. Lecture Notes in Computer Science. Berlin: Springer, 2009. https://doi.org/10.1007/978-3-642-04617-9_44.","apa":"Iqbal, T., Le, D. K., Nolte, M., & Lohweg, V. (2009). Human Perception Based Counterfeit Detection for Automated Teller Machines, KI 2009, Artificial Intelligence and Automation . In 32nd Annual Conference on Artificial Intelligence Paderborn | September 15 – 18, 2009, accepted for Publication (Vol. 5803, pp. 347–354). Berlin: Springer. https://doi.org/10.1007/978-3-642-04617-9_44","ieee":"T. Iqbal, D. K. Le, M. Nolte, and V. Lohweg, “Human Perception Based Counterfeit Detection for Automated Teller Machines, KI 2009, Artificial Intelligence and Automation ,” in 32nd Annual Conference on Artificial Intelligence Paderborn | September 15 – 18, 2009, accepted for Publication, 2009, vol. 5803, pp. 347–354.","din1505-2-1":"Iqbal, Taswar ; Le, Dinh Khoi ; Nolte, Michael ; Lohweg, Volker: Human Perception Based Counterfeit Detection for Automated Teller Machines, KI 2009, Artificial Intelligence and Automation . In: 32nd Annual Conference on Artificial Intelligence Paderborn | September 15 – 18, 2009, accepted for Publication, Lecture Notes in Computer Science. Bd. 5803. Berlin : Springer, 2009, S. 347–354","chicago-de":"Iqbal, Taswar, Dinh Khoi Le, Michael Nolte und Volker Lohweg. 2009. Human Perception Based Counterfeit Detection for Automated Teller Machines, KI 2009, Artificial Intelligence and Automation . In: 32nd Annual Conference on Artificial Intelligence Paderborn | September 15 – 18, 2009, accepted for Publication, 5803:347–354. Lecture Notes in Computer Science. Berlin: Springer. doi:https://doi.org/10.1007/978-3-642-04617-9_44, .","short":"T. Iqbal, D.K. Le, M. Nolte, V. Lohweg, in: 32nd Annual Conference on Artificial Intelligence Paderborn | September 15 – 18, 2009, Accepted for Publication, Springer, Berlin, 2009, pp. 347–354."},"volume":5803,"title":"Human Perception Based Counterfeit Detection for Automated Teller Machines, KI 2009, Artificial Intelligence and Automation ","page":"347-354","status":"public","author":[{"first_name":"Taswar","full_name":"Iqbal, Taswar","last_name":"Iqbal"},{"full_name":"Le, Dinh Khoi","last_name":"Le","first_name":"Dinh Khoi"},{"last_name":"Nolte","first_name":"Michael","full_name":"Nolte, Michael"},{"orcid":"0000-0002-3325-7887","last_name":"Lohweg","full_name":"Lohweg, Volker","first_name":"Volker","id":"1804"}],"year":2009,"main_file_link":[{"url":"https://link.springer.com/chapter/10.1007/978-3-642-04617-9_44"}]},{"citation":{"short":"V. Lohweg, O. Niggemann, in: Lemgoer Schriften Zur Industriellen Informationstechnik (Lemgo Series on Industrial Information Technology), Vol. 3, ISSN 1869-2087, Lemgo 2009, 2009.","chicago-de":"Lohweg, Volker und Oliver Niggemann. 2009. Machine Learning in Real-time Applications (MLRTA09 - KI 2009 Workshop). In: Lemgoer Schriften zur industriellen Informationstechnik (Lemgo Series on Industrial Information Technology), Vol. 3, ISSN 1869-2087, Lemgo 2009.","din1505-2-1":"Lohweg, Volker ; Niggemann, Oliver: Machine Learning in Real-time Applications (MLRTA09 - KI 2009 Workshop). In: Lemgoer Schriften zur industriellen Informationstechnik (Lemgo Series on Industrial Information Technology), Vol. 3, ISSN 1869-2087, Lemgo 2009, 2009","van":"Lohweg V, Niggemann O. Machine Learning in Real-time Applications (MLRTA09 - KI 2009 Workshop). In: Lemgoer Schriften zur industriellen Informationstechnik (Lemgo Series on Industrial Information Technology), Vol 3, ISSN 1869-2087, Lemgo 2009. 2009.","ama":"Lohweg V, Niggemann O. Machine Learning in Real-time Applications (MLRTA09 - KI 2009 Workshop). In: Lemgoer Schriften Zur Industriellen Informationstechnik (Lemgo Series on Industrial Information Technology), Vol. 3, ISSN 1869-2087, Lemgo 2009. ; 2009.","ufg":"Lohweg, Volker/Niggemann, Oliver (2009): Machine Learning in Real-time Applications (MLRTA09 - KI 2009 Workshop), in: Lemgoer Schriften zur industriellen Informationstechnik (Lemgo Series on Industrial Information Technology), Vol. 3, ISSN 1869-2087, Lemgo 2009.","bjps":"Lohweg V and Niggemann O (2009) Machine Learning in Real-Time Applications (MLRTA09 - KI 2009 Workshop). Lemgoer Schriften Zur Industriellen Informationstechnik (Lemgo Series on Industrial Information Technology), Vol. 3, ISSN 1869-2087, Lemgo 2009.","havard":"V. Lohweg, O. Niggemann, Machine Learning in Real-time Applications (MLRTA09 - KI 2009 Workshop), in: Lemgoer Schriften Zur Industriellen Informationstechnik (Lemgo Series on Industrial Information Technology), Vol. 3, ISSN 1869-2087, Lemgo 2009, 2009.","mla":"Lohweg, Volker, and Oliver Niggemann. “Machine Learning in Real-Time Applications (MLRTA09 - KI 2009 Workshop).” Lemgoer Schriften Zur Industriellen Informationstechnik (Lemgo Series on Industrial Information Technology), Vol. 3, ISSN 1869-2087, Lemgo 2009, 2009.","apa":"Lohweg, V., & Niggemann, O. (2009). Machine Learning in Real-time Applications (MLRTA09 - KI 2009 Workshop). In Lemgoer Schriften zur industriellen Informationstechnik (Lemgo Series on Industrial Information Technology), Vol. 3, ISSN 1869-2087, Lemgo 2009.","ieee":"V. Lohweg and O. Niggemann, “Machine Learning in Real-time Applications (MLRTA09 - KI 2009 Workshop),” in Lemgoer Schriften zur industriellen Informationstechnik (Lemgo Series on Industrial Information Technology), Vol. 3, ISSN 1869-2087, Lemgo 2009, 2009.","chicago":"Lohweg, Volker, and Oliver Niggemann. “Machine Learning in Real-Time Applications (MLRTA09 - KI 2009 Workshop).” In Lemgoer Schriften Zur Industriellen Informationstechnik (Lemgo Series on Industrial Information Technology), Vol. 3, ISSN 1869-2087, Lemgo 2009, 2009."},"title":"Machine Learning in Real-time Applications (MLRTA09 - KI 2009 Workshop)","status":"public","year":2009,"author":[{"orcid":"0000-0002-3325-7887","first_name":"Volker","id":"1804","full_name":"Lohweg, Volker","last_name":"Lohweg"},{"full_name":"Niggemann, Oliver","first_name":"Oliver","last_name":"Niggemann","id":"10876"}],"department":[{"_id":"DEP5023"}],"user_id":"45673","date_updated":"2023-03-15T13:49:38Z","publication":"Lemgoer Schriften zur industriellen Informationstechnik (Lemgo Series on Industrial Information Technology), Vol. 3, ISSN 1869-2087, Lemgo 2009","date_created":"2019-11-29T14:59:42Z","type":"conference","language":[{"iso":"eng"}],"_id":"2083"},{"_id":"2069","keyword":["authentification","anti-counterfeit features","inspection","quality","sensor fusion","pattern recognition"],"language":[{"iso":"eng"}],"publication":"Optical Document Security - The 2008 Conference on Optical Security and Counterfeit Deterrence; Reconnaissance International Publishers and Consultants, San Francisco, CA, USA","type":"journal_article","date_created":"2019-11-29T14:02:12Z","user_id":"45673","date_updated":"2023-03-15T13:49:38Z","abstract":[{"lang":"eng","text":"During printed product manufacturing, measures are taken to ensure a certain level of printing quality and security via authentification methods. This is particularly true in the field of security printing, where the quality standards, which must be reached by the end-products, i.e. banknotes, security documents and the like, are very high. It is accepted, that print defects are generated because printing parameters but also machine parameters will change unnoticed in production. Therefore, a new concept for a multi-sensory adaptive learning and classification model based on Fuzzy-Pattern-Classifiers for data inspection, authentification and machine conditioning is proposed. This kind of inspection concept, which combines optical, acoustical and other machine information, produces a large amount of data, which leads to multivariate methods for data analysis. Multivariate methods are useful for analysis of large and complex data sets that consist of many variables measured on large numbers of physical data. A general aim is to improve the known inspection techniques and propose an inspection methodology that can ensure a comprehensive quality control of the printed substrates processed by printing presses, especially printing presses which are designed to process substrates used in the course of the production of banknotes, security documents and others. "}],"author":[{"full_name":"Dyck, Walter","first_name":"Walter","last_name":"Dyck"},{"last_name":"Türke","full_name":"Türke, Thomas","first_name":"Thomas"},{"full_name":"Schaede, Johannes","first_name":"Johannes","last_name":"Schaede","id":"2128"},{"last_name":"Lohweg","first_name":"Volker","full_name":"Lohweg, Volker","id":"1804","orcid":"0000-0002-3325-7887"}],"year":2008,"department":[{"_id":"DEP5023"}],"status":"public","title":"A New Concept on Quality Inspection and Machine Conditioning for Security Prints","citation":{"apa":"Dyck, W., Türke, T., Schaede, J., & Lohweg, V. (2008). A New Concept on Quality Inspection and Machine Conditioning for Security Prints. Optical Document Security - The 2008 Conference on Optical Security and Counterfeit Deterrence; Reconnaissance International Publishers and Consultants, San Francisco, CA, USA.","chicago":"Dyck, Walter, Thomas Türke, Johannes Schaede, and Volker Lohweg. “A New Concept on Quality Inspection and Machine Conditioning for Security Prints.” Optical Document Security - The 2008 Conference on Optical Security and Counterfeit Deterrence; Reconnaissance International Publishers and Consultants, San Francisco, CA, USA, 2008.","van":"Dyck W, Türke T, Schaede J, Lohweg V. A New Concept on Quality Inspection and Machine Conditioning for Security Prints. Optical Document Security - The 2008 Conference on Optical Security and Counterfeit Deterrence; Reconnaissance International Publishers and Consultants, San Francisco, CA, USA. 2008;","ufg":"Dyck, Walter et. al. (2008): A New Concept on Quality Inspection and Machine Conditioning for Security Prints, in: Optical Document Security - The 2008 Conference on Optical Security and Counterfeit Deterrence; Reconnaissance International Publishers and Consultants, San Francisco, CA, USA.","bjps":"Dyck W et al. (2008) A New Concept on Quality Inspection and Machine Conditioning for Security Prints. Optical Document Security - The 2008 Conference on Optical Security and Counterfeit Deterrence; Reconnaissance International Publishers and Consultants, San Francisco, CA, USA.","mla":"Dyck, Walter, et al. “A New Concept on Quality Inspection and Machine Conditioning for Security Prints.” Optical Document Security - The 2008 Conference on Optical Security and Counterfeit Deterrence; Reconnaissance International Publishers and Consultants, San Francisco, CA, USA, 2008.","havard":"W. Dyck, T. Türke, J. Schaede, V. Lohweg, A New Concept on Quality Inspection and Machine Conditioning for Security Prints, Optical Document Security - The 2008 Conference on Optical Security and Counterfeit Deterrence; Reconnaissance International Publishers and Consultants, San Francisco, CA, USA. (2008).","short":"W. Dyck, T. Türke, J. Schaede, V. Lohweg, Optical Document Security - The 2008 Conference on Optical Security and Counterfeit Deterrence; Reconnaissance International Publishers and Consultants, San Francisco, CA, USA (2008).","chicago-de":"Dyck, Walter, Thomas Türke, Johannes Schaede und Volker Lohweg. 2008. A New Concept on Quality Inspection and Machine Conditioning for Security Prints. Optical Document Security - The 2008 Conference on Optical Security and Counterfeit Deterrence; Reconnaissance International Publishers and Consultants, San Francisco, CA, USA.","din1505-2-1":"Dyck, Walter ; Türke, Thomas ; Schaede, Johannes ; Lohweg, Volker: A New Concept on Quality Inspection and Machine Conditioning for Security Prints. In: Optical Document Security - The 2008 Conference on Optical Security and Counterfeit Deterrence; Reconnaissance International Publishers and Consultants, San Francisco, CA, USA (2008)","ieee":"W. Dyck, T. Türke, J. Schaede, and V. Lohweg, “A New Concept on Quality Inspection and Machine Conditioning for Security Prints,” Optical Document Security - The 2008 Conference on Optical Security and Counterfeit Deterrence; Reconnaissance International Publishers and Consultants, San Francisco, CA, USA, 2008.","ama":"Dyck W, Türke T, Schaede J, Lohweg V. A New Concept on Quality Inspection and Machine Conditioning for Security Prints. Optical Document Security - The 2008 Conference on Optical Security and Counterfeit Deterrence; Reconnaissance International Publishers and Consultants, San Francisco, CA, USA. 2008."}},{"main_file_link":[{"url":"https://www.eurasip.org/Proceedings/Ext/CIP2008/papers/1569094849.pdf","open_access":"1"}],"year":2008,"author":[{"id":"2000","first_name":"Rui","last_name":"Li","full_name":"Li, Rui"},{"first_name":"Volker","last_name":"Lohweg","full_name":"Lohweg, Volker","id":"1804","orcid":"0000-0002-3325-7887"}],"department":[{"_id":"DEP5023"}],"abstract":[{"text":"A Two-Layer Conflict Solving data fusion approach is proposed in this work, with an aim to provide another approach to data fusion community. Since the evidence of Dempster-Shafer Theory, algorithms for combining pieces of evidence have drawn a considerable attention from data fusion researchers, along with many alternatives invented. However, none of these approaches receive an agreement for being able to perform very successfully in all scenarios and hence this topic is still in hot discussion. Therefore, the suggested approach in this work will contribute as a novel method and present its own merits. ","lang":"eng"}],"status":"public","title":"A Novel Data Fusion Approach using Two-Layer Conflict Solving","citation":{"ieee":"R. Li and V. Lohweg, “A Novel Data Fusion Approach using Two-Layer Conflict Solving,” 2008.","ama":"Li R, Lohweg V. A Novel Data Fusion Approach using Two-Layer Conflict Solving. In: ; 2008.","apa":"Li, R., & Lohweg, V. (2008). A Novel Data Fusion Approach using Two-Layer Conflict Solving.","chicago":"Li, Rui, and Volker Lohweg. “A Novel Data Fusion Approach Using Two-Layer Conflict Solving,” 2008.","van":"Li R, Lohweg V. A Novel Data Fusion Approach using Two-Layer Conflict Solving. In 2008.","ufg":"Li, Rui/Lohweg, Volker (2008): A Novel Data Fusion Approach using Two-Layer Conflict Solving, in: .","bjps":"Li R and Lohweg V (2008) A Novel Data Fusion Approach Using Two-Layer Conflict Solving.","mla":"Li, Rui, and Volker Lohweg. A Novel Data Fusion Approach Using Two-Layer Conflict Solving. 2008.","havard":"R. Li, V. Lohweg, A Novel Data Fusion Approach using Two-Layer Conflict Solving, in: 2008.","short":"R. Li, V. Lohweg, in: 2008.","chicago-de":"Li, Rui und Volker Lohweg. 2008. A Novel Data Fusion Approach using Two-Layer Conflict Solving. In: .","din1505-2-1":"Li, Rui ; Lohweg, Volker: A Novel Data Fusion Approach using Two-Layer Conflict Solving. In: , 2008"},"publication_status":"published","oa":"1","keyword":["fusion community","data fusion researcher","dempster-shafer theory","many alternative","novel method","considerable attention","hot discussion","suggested approach"],"language":[{"iso":"eng"}],"_id":"2070","type":"conference","date_created":"2019-11-29T14:05:44Z","user_id":"45673","date_updated":"2023-03-15T13:49:38Z"},{"keyword":["tuning parameter","information fusion","fuzzy cmeans","membership function","fuzzy pattern classification"],"language":[{"iso":"eng"}],"_id":"2071","publication_identifier":{"isbn":["978-3-8007-3092-6"]},"date_created":"2019-11-29T14:09:33Z","type":"conference","user_id":"45673","date_updated":"2023-03-15T13:49:38Z","year":2008,"author":[{"first_name":"Rui","last_name":"Li","full_name":"Li, Rui","id":"2000"},{"orcid":"0000-0002-3325-7887","last_name":"Lohweg","first_name":"Volker","full_name":"Lohweg, Volker","id":"1804"}],"main_file_link":[{"url":"https://ieeexplore.ieee.org/document/4632223/keywords#full-text-header"}],"department":[{"_id":"DEP5023"}],"abstract":[{"lang":"eng","text":"In this paper, a fuzzy pattern classification tuning approach is proposed, which is based on fusion concept. In this method, tuning parameters are learned in a training procedure, enabling system to be capable of managing individual classification task. Fuzzy c-means, as a specific instance of Tuning Reference, is employed as a tool to offer membership function which is used for making decisions and its membership function fuses (tunes) another membership function captured from fuzzy pattern classification and then final decisions are made upon fused one. Experiments are taken on five benchmark datasets, one of them shows an equal performance and the other four present better results than each single classifier."}],"status":"public","publisher":"In: The 11th Conference on Information Fusion, June 30 - July 3, Cologne, Germany","title":"Fuzzy Pattern Classification Tuning by Parameter Learning based on Fusion Concept","citation":{"ufg":"Li, Rui/Lohweg, Volker (2008): Fuzzy Pattern Classification Tuning by Parameter Learning based on Fusion Concept, in: .","havard":"R. Li, V. Lohweg, Fuzzy Pattern Classification Tuning by Parameter Learning based on Fusion Concept, in: In: The 11th Conference on Information Fusion, June 30 - July 3, Cologne, Germany, 2008.","bjps":"Li R and Lohweg V (2008) Fuzzy Pattern Classification Tuning by Parameter Learning Based on Fusion Concept. In: The 11th Conference on Information Fusion, June 30 - July 3, Cologne, Germany.","mla":"Li, Rui, and Volker Lohweg. Fuzzy Pattern Classification Tuning by Parameter Learning Based on Fusion Concept. In: The 11th Conference on Information Fusion, June 30 - July 3, Cologne, Germany, 2008.","van":"Li R, Lohweg V. Fuzzy Pattern Classification Tuning by Parameter Learning based on Fusion Concept. In In: The 11th Conference on Information Fusion, June 30 - July 3, Cologne, Germany; 2008.","chicago":"Li, Rui, and Volker Lohweg. “Fuzzy Pattern Classification Tuning by Parameter Learning Based on Fusion Concept.” In: The 11th Conference on Information Fusion, June 30 - July 3, Cologne, Germany, 2008.","apa":"Li, R., & Lohweg, V. (2008). Fuzzy Pattern Classification Tuning by Parameter Learning based on Fusion Concept. In: The 11th Conference on Information Fusion, June 30 - July 3, Cologne, Germany.","din1505-2-1":"Li, Rui ; Lohweg, Volker: Fuzzy Pattern Classification Tuning by Parameter Learning based on Fusion Concept. In: : In: The 11th Conference on Information Fusion, June 30 - July 3, Cologne, Germany, 2008","chicago-de":"Li, Rui und Volker Lohweg. 2008. Fuzzy Pattern Classification Tuning by Parameter Learning based on Fusion Concept. In: . In: The 11th Conference on Information Fusion, June 30 - July 3, Cologne, Germany.","short":"R. Li, V. Lohweg, in: In: The 11th Conference on Information Fusion, June 30 - July 3, Cologne, Germany, 2008.","ama":"Li R, Lohweg V. Fuzzy Pattern Classification Tuning by Parameter Learning based on Fusion Concept. In: In: The 11th Conference on Information Fusion, June 30 - July 3, Cologne, Germany; 2008.","ieee":"R. Li and V. Lohweg, “Fuzzy Pattern Classification Tuning by Parameter Learning based on Fusion Concept,” 2008."},"publication_status":"published"},{"user_id":"45673","date_updated":"2023-03-15T13:49:38Z","type":"conference","date_created":"2019-11-29T14:13:23Z","language":[{"iso":"eng"}],"_id":"2072","citation":{"din1505-2-1":"Lohweg, Volker ; Possel-Dölken, Frank: Oberflächenanalyse mit intelligenten Netzwerk-Kameras - Virtuelle Produktentwicklung mit Simulation/Verkürzung Time-to-Market durch Einsatz von Simulationstechniken. In: : Innovationsdialog NRW, dSPACE GmbH, Technologiepark, Paderborn, 2008","chicago-de":"Lohweg, Volker und Frank Possel-Dölken. 2008. Oberflächenanalyse mit intelligenten Netzwerk-Kameras - Virtuelle Produktentwicklung mit Simulation/Verkürzung Time-to-Market durch Einsatz von Simulationstechniken. In: . Innovationsdialog NRW, dSPACE GmbH, Technologiepark, Paderborn.","short":"V. Lohweg, F. Possel-Dölken, in: Innovationsdialog NRW, dSPACE GmbH, Technologiepark, Paderborn, 2008.","chicago":"Lohweg, Volker, and Frank Possel-Dölken. “Oberflächenanalyse Mit Intelligenten Netzwerk-Kameras - Virtuelle Produktentwicklung Mit Simulation/Verkürzung Time-to-Market Durch Einsatz von Simulationstechniken.” Innovationsdialog NRW, dSPACE GmbH, Technologiepark, Paderborn, 2008.","ieee":"V. Lohweg and F. Possel-Dölken, “Oberflächenanalyse mit intelligenten Netzwerk-Kameras - Virtuelle Produktentwicklung mit Simulation/Verkürzung Time-to-Market durch Einsatz von Simulationstechniken,” 2008.","apa":"Lohweg, V., & Possel-Dölken, F. (2008). Oberflächenanalyse mit intelligenten Netzwerk-Kameras - Virtuelle Produktentwicklung mit Simulation/Verkürzung Time-to-Market durch Einsatz von Simulationstechniken. Innovationsdialog NRW, dSPACE GmbH, Technologiepark, Paderborn.","havard":"V. Lohweg, F. Possel-Dölken, Oberflächenanalyse mit intelligenten Netzwerk-Kameras - Virtuelle Produktentwicklung mit Simulation/Verkürzung Time-to-Market durch Einsatz von Simulationstechniken, in: Innovationsdialog NRW, dSPACE GmbH, Technologiepark, Paderborn, 2008.","bjps":"Lohweg V and Possel-Dölken F (2008) Oberflächenanalyse Mit Intelligenten Netzwerk-Kameras - Virtuelle Produktentwicklung Mit Simulation/Verkürzung Time-to-Market Durch Einsatz von Simulationstechniken. Innovationsdialog NRW, dSPACE GmbH, Technologiepark, Paderborn.","mla":"Lohweg, Volker, and Frank Possel-Dölken. Oberflächenanalyse Mit Intelligenten Netzwerk-Kameras - Virtuelle Produktentwicklung Mit Simulation/Verkürzung Time-to-Market Durch Einsatz von Simulationstechniken. Innovationsdialog NRW, dSPACE GmbH, Technologiepark, Paderborn, 2008.","ufg":"Lohweg, Volker/Possel-Dölken, Frank (2008): Oberflächenanalyse mit intelligenten Netzwerk-Kameras - Virtuelle Produktentwicklung mit Simulation/Verkürzung Time-to-Market durch Einsatz von Simulationstechniken, in: .","ama":"Lohweg V, Possel-Dölken F. Oberflächenanalyse mit intelligenten Netzwerk-Kameras - Virtuelle Produktentwicklung mit Simulation/Verkürzung Time-to-Market durch Einsatz von Simulationstechniken. In: Innovationsdialog NRW, dSPACE GmbH, Technologiepark, Paderborn; 2008.","van":"Lohweg V, Possel-Dölken F. Oberflächenanalyse mit intelligenten Netzwerk-Kameras - Virtuelle Produktentwicklung mit Simulation/Verkürzung Time-to-Market durch Einsatz von Simulationstechniken. In Innovationsdialog NRW, dSPACE GmbH, Technologiepark, Paderborn; 2008."},"publication_status":"published","title":"Oberflächenanalyse mit intelligenten Netzwerk-Kameras - Virtuelle Produktentwicklung mit Simulation/Verkürzung Time-to-Market durch Einsatz von Simulationstechniken","status":"public","publisher":"Innovationsdialog NRW, dSPACE GmbH, Technologiepark, Paderborn","year":2008,"author":[{"orcid":"0000-0002-3325-7887","first_name":"Volker","full_name":"Lohweg, Volker","id":"1804","last_name":"Lohweg"},{"full_name":"Possel-Dölken, Frank","last_name":"Possel-Dölken","first_name":"Frank"}],"department":[{"_id":"DEP5023"}]},{"publication":"13th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA 2008)","type":"conference","date_created":"2019-11-29T14:22:03Z","user_id":"45673","date_updated":"2023-03-15T13:49:38Z","place":"Hamburg, Germany","language":[{"iso":"eng"}],"_id":"2073","doi":"10.1109/ETFA.2008.4638397","title":"Application-based Approach for Automatic Texture Defect Recognition on Synthetic Surfaces","citation":{"ieee":"M. Niederhöfer and V. Lohweg, “Application-based Approach for Automatic Texture Defect Recognition on Synthetic Surfaces,” in 13th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA 2008), 2008.","ama":"Niederhöfer M, Lohweg V. Application-based Approach for Automatic Texture Defect Recognition on Synthetic Surfaces. In: 13th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA 2008). Hamburg, Germany; 2008. doi:10.1109/ETFA.2008.4638397","short":"M. Niederhöfer, V. Lohweg, in: 13th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA 2008), Hamburg, Germany, 2008.","din1505-2-1":"Niederhöfer, Marcus ; Lohweg, Volker: Application-based Approach for Automatic Texture Defect Recognition on Synthetic Surfaces. In: 13th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA 2008). Hamburg, Germany, 2008","chicago-de":"Niederhöfer, Marcus und Volker Lohweg. 2008. Application-based Approach for Automatic Texture Defect Recognition on Synthetic Surfaces. In: 13th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA 2008). Hamburg, Germany. doi:10.1109/ETFA.2008.4638397, .","apa":"Niederhöfer, M., & Lohweg, V. (2008). Application-based Approach for Automatic Texture Defect Recognition on Synthetic Surfaces. In 13th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA 2008). Hamburg, Germany. https://doi.org/10.1109/ETFA.2008.4638397","chicago":"Niederhöfer, Marcus, and Volker Lohweg. “Application-Based Approach for Automatic Texture Defect Recognition on Synthetic Surfaces.” In 13th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA 2008). Hamburg, Germany, 2008. https://doi.org/10.1109/ETFA.2008.4638397.","van":"Niederhöfer M, Lohweg V. Application-based Approach for Automatic Texture Defect Recognition on Synthetic Surfaces. In: 13th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA 2008). Hamburg, Germany; 2008.","mla":"Niederhöfer, Marcus, and Volker Lohweg. “Application-Based Approach for Automatic Texture Defect Recognition on Synthetic Surfaces.” 13th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA 2008), 2008, doi:10.1109/ETFA.2008.4638397.","havard":"M. Niederhöfer, V. Lohweg, Application-based Approach for Automatic Texture Defect Recognition on Synthetic Surfaces, in: 13th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA 2008), Hamburg, Germany, 2008.","bjps":"Niederhöfer M and Lohweg V (2008) Application-Based Approach for Automatic Texture Defect Recognition on Synthetic Surfaces. 13th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA 2008). Hamburg, Germany.","ufg":"Niederhöfer, Marcus/Lohweg, Volker (2008): Application-based Approach for Automatic Texture Defect Recognition on Synthetic Surfaces, in: 13th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA 2008), Hamburg, Germany."},"publication_status":"published","author":[{"last_name":"Niederhöfer","full_name":"Niederhöfer, Marcus","first_name":"Marcus"},{"orcid":"0000-0002-3325-7887","full_name":"Lohweg, Volker","first_name":"Volker","id":"1804","last_name":"Lohweg"}],"year":2008,"department":[{"_id":"DEP5023"}],"abstract":[{"text":"Synthetic surfaces, in particular polymer structures, which are used for electronic components, have to be inspected in industrial processes. Polymers show some specific surface characteristics. This a-priori knowledge is useable for the feature extraction of a surface texture and a following classification. The feature extraction is performed by using statistical information, calculated from sum and difference histograms, while the classification is executed by a fuzzy pattern classifier. A defect area can be recognized just on the basis of the tested image and without the need of any further reference learning data. The classification of a defect part is achieved by analyzing the divergence of the extracted feature values from their median related to the inspected area. Surfaces that contain an inconsistent texture will be rejected.","lang":"eng"}],"status":"public"},{"citation":{"ama":"Lohweg V. Intelligente Automation durch Sensorfusion, Adaptronik - Mediatronik - Kognitronik – Schlüssel für die Entwicklung intelligenter Systeme. In: Veranstaltungsreihe “solution OWL”, Claas Technoparc, Harsewinkel, 28.10.2008; 2008.","ieee":"V. Lohweg, “Intelligente Automation durch Sensorfusion, Adaptronik - Mediatronik - Kognitronik – Schlüssel für die Entwicklung intelligenter Systeme,” 2008.","van":"Lohweg V. Intelligente Automation durch Sensorfusion, Adaptronik - Mediatronik - Kognitronik – Schlüssel für die Entwicklung intelligenter Systeme. In Veranstaltungsreihe “solution OWL”, Claas Technoparc, Harsewinkel, 28.10.2008; 2008.","mla":"Lohweg, Volker. Intelligente Automation Durch Sensorfusion, Adaptronik - Mediatronik - Kognitronik – Schlüssel Für Die Entwicklung Intelligenter Systeme. Veranstaltungsreihe “solution OWL”, Claas Technoparc, Harsewinkel, 28.10.2008, 2008.","havard":"V. Lohweg, Intelligente Automation durch Sensorfusion, Adaptronik - Mediatronik - Kognitronik – Schlüssel für die Entwicklung intelligenter Systeme, in: Veranstaltungsreihe “solution OWL”, Claas Technoparc, Harsewinkel, 28.10.2008, 2008.","bjps":"Lohweg V (2008) Intelligente Automation Durch Sensorfusion, Adaptronik - Mediatronik - Kognitronik – Schlüssel Für Die Entwicklung Intelligenter Systeme. Veranstaltungsreihe ‘solution OWL’, Claas Technoparc, Harsewinkel, 28.10.2008.","ufg":"Lohweg, Volker (2008): Intelligente Automation durch Sensorfusion, Adaptronik - Mediatronik - Kognitronik – Schlüssel für die Entwicklung intelligenter Systeme, in: .","apa":"Lohweg, V. (2008). Intelligente Automation durch Sensorfusion, Adaptronik - Mediatronik - Kognitronik – Schlüssel für die Entwicklung intelligenter Systeme. Veranstaltungsreihe “solution OWL”, Claas Technoparc, Harsewinkel, 28.10.2008.","chicago":"Lohweg, Volker. “Intelligente Automation Durch Sensorfusion, Adaptronik - Mediatronik - Kognitronik – Schlüssel Für Die Entwicklung Intelligenter Systeme.” Veranstaltungsreihe “solution OWL”, Claas Technoparc, Harsewinkel, 28.10.2008, 2008.","short":"V. Lohweg, in: Veranstaltungsreihe “solution OWL”, Claas Technoparc, Harsewinkel, 28.10.2008, 2008.","din1505-2-1":"Lohweg, Volker: Intelligente Automation durch Sensorfusion, Adaptronik - Mediatronik - Kognitronik – Schlüssel für die Entwicklung intelligenter Systeme. In: : Veranstaltungsreihe „solution OWL“, Claas Technoparc, Harsewinkel, 28.10.2008, 2008","chicago-de":"Lohweg, Volker. 2008. Intelligente Automation durch Sensorfusion, Adaptronik - Mediatronik - Kognitronik – Schlüssel für die Entwicklung intelligenter Systeme. In: . Veranstaltungsreihe „solution OWL“, Claas Technoparc, Harsewinkel, 28.10.2008."},"title":"Intelligente Automation durch Sensorfusion, Adaptronik - Mediatronik - Kognitronik – Schlüssel für die Entwicklung intelligenter Systeme","publisher":"Veranstaltungsreihe \"solution OWL\", Claas Technoparc, Harsewinkel, 28.10.2008","status":"public","abstract":[{"text":"Veranstaltungsreihe quot;solution OWLquot;; ","lang":"eng"}],"author":[{"orcid":"0000-0002-3325-7887","first_name":"Volker","last_name":"Lohweg","id":"1804","full_name":"Lohweg, Volker"}],"year":2008,"department":[{"_id":"DEP5023"}],"user_id":"45673","date_updated":"2023-03-15T13:49:38Z","type":"conference","date_created":"2019-11-29T14:25:52Z","_id":"2074","language":[{"iso":"eng"}]},{"title":"Zukunftstechnologie Multisensorische Mustererkennung","file":[{"access_level":"closed","date_updated":"2019-11-29T13:46:16Z","relation":"main_file","creator":"6bl-f5s","date_created":"2019-11-29T13:46:16Z","content_type":"application/pdf","file_name":"aale2007_lohweg.pdf","file_size":1867664,"file_id":"2066"}],"publication_status":"published","citation":{"short":"V. Lohweg, in: Vortrag 4. Fachwissenschaftliches Kolloquium für Angewandte Automatisierungstechnik in Lehre und Entwicklung an Fachhochschulen (AALE2007) in Lemgo, 2007.","din1505-2-1":"Lohweg, Volker: Zukunftstechnologie Multisensorische Mustererkennung. In: : Vortrag 4. Fachwissenschaftliches Kolloquium für Angewandte Automatisierungstechnik in Lehre und Entwicklung an Fachhochschulen (AALE2007) in Lemgo, 2007","chicago-de":"Lohweg, Volker. 2007. Zukunftstechnologie Multisensorische Mustererkennung. In: . Vortrag 4. Fachwissenschaftliches Kolloquium für Angewandte Automatisierungstechnik in Lehre und Entwicklung an Fachhochschulen (AALE2007) in Lemgo.","ama":"Lohweg V. Zukunftstechnologie Multisensorische Mustererkennung. In: Vortrag 4. Fachwissenschaftliches Kolloquium für Angewandte Automatisierungstechnik in Lehre und Entwicklung an Fachhochschulen (AALE2007) in Lemgo; 2007.","van":"Lohweg V. Zukunftstechnologie Multisensorische Mustererkennung. In Vortrag 4. Fachwissenschaftliches Kolloquium für Angewandte Automatisierungstechnik in Lehre und Entwicklung an Fachhochschulen (AALE2007) in Lemgo; 2007.","havard":"V. Lohweg, Zukunftstechnologie Multisensorische Mustererkennung, in: Vortrag 4. Fachwissenschaftliches Kolloquium für Angewandte Automatisierungstechnik in Lehre und Entwicklung an Fachhochschulen (AALE2007) in Lemgo, 2007.","mla":"Lohweg, Volker. Zukunftstechnologie Multisensorische Mustererkennung. Vortrag 4. Fachwissenschaftliches Kolloquium für Angewandte Automatisierungstechnik in Lehre und Entwicklung an Fachhochschulen (AALE2007) in Lemgo, 2007.","bjps":"Lohweg V (2007) Zukunftstechnologie Multisensorische Mustererkennung. Vortrag 4. Fachwissenschaftliches Kolloquium für Angewandte Automatisierungstechnik in Lehre und Entwicklung an Fachhochschulen (AALE2007) in Lemgo.","ufg":"Lohweg, Volker (2007): Zukunftstechnologie Multisensorische Mustererkennung, in: .","ieee":"V. Lohweg, “Zukunftstechnologie Multisensorische Mustererkennung,” 2007.","apa":"Lohweg, V. (2007). Zukunftstechnologie Multisensorische Mustererkennung. Vortrag 4. Fachwissenschaftliches Kolloquium für Angewandte Automatisierungstechnik in Lehre und Entwicklung an Fachhochschulen (AALE2007) in Lemgo.","chicago":"Lohweg, Volker. “Zukunftstechnologie Multisensorische Mustererkennung.” Vortrag 4. Fachwissenschaftliches Kolloquium für Angewandte Automatisierungstechnik in Lehre und Entwicklung an Fachhochschulen (AALE2007) in Lemgo, 2007."},"department":[{"_id":"DEP5023"}],"ddc":["600"],"year":2007,"author":[{"orcid":"0000-0002-3325-7887","id":"1804","first_name":"Volker","last_name":"Lohweg","full_name":"Lohweg, Volker"}],"status":"public","publisher":"Vortrag 4. Fachwissenschaftliches Kolloquium für Angewandte Automatisierungstechnik in Lehre und Entwicklung an Fachhochschulen (AALE2007) in Lemgo","type":"conference","date_created":"2019-11-29T13:45:14Z","date_updated":"2023-03-15T13:49:38Z","user_id":"45673","file_date_updated":"2019-11-29T13:46:16Z","has_accepted_license":"1","language":[{"iso":"ger"}],"_id":"2065"},{"title":"Fuzzy-Pattern-Classifier Multisensor-Fusion am Beispiel von Wertdruckproduktionsanlagen","citation":{"ama":"Lohweg V. Fuzzy-Pattern-Classifier Multisensor-Fusion am Beispiel von Wertdruckproduktionsanlagen. In: Universität Paderborn, GET Lab Forschungsseminar; 2007.","ieee":"V. Lohweg, “Fuzzy-Pattern-Classifier Multisensor-Fusion am Beispiel von Wertdruckproduktionsanlagen,” 2007.","din1505-2-1":"Lohweg, Volker: Fuzzy-Pattern-Classifier Multisensor-Fusion am Beispiel von Wertdruckproduktionsanlagen. In: : Universität Paderborn, GET Lab Forschungsseminar, 2007","chicago-de":"Lohweg, Volker. 2007. Fuzzy-Pattern-Classifier Multisensor-Fusion am Beispiel von Wertdruckproduktionsanlagen. In: . Universität Paderborn, GET Lab Forschungsseminar.","short":"V. Lohweg, in: Universität Paderborn, GET Lab Forschungsseminar, 2007.","ufg":"Lohweg, Volker (2007): Fuzzy-Pattern-Classifier Multisensor-Fusion am Beispiel von Wertdruckproduktionsanlagen, in: .","havard":"V. Lohweg, Fuzzy-Pattern-Classifier Multisensor-Fusion am Beispiel von Wertdruckproduktionsanlagen, in: Universität Paderborn, GET Lab Forschungsseminar, 2007.","bjps":"Lohweg V (2007) Fuzzy-Pattern-Classifier Multisensor-Fusion Am Beispiel von Wertdruckproduktionsanlagen. Universität Paderborn, GET Lab Forschungsseminar.","mla":"Lohweg, Volker. Fuzzy-Pattern-Classifier Multisensor-Fusion Am Beispiel von Wertdruckproduktionsanlagen. Universität Paderborn, GET Lab Forschungsseminar, 2007.","van":"Lohweg V. Fuzzy-Pattern-Classifier Multisensor-Fusion am Beispiel von Wertdruckproduktionsanlagen. In Universität Paderborn, GET Lab Forschungsseminar; 2007.","chicago":"Lohweg, Volker. “Fuzzy-Pattern-Classifier Multisensor-Fusion Am Beispiel von Wertdruckproduktionsanlagen.” Universität Paderborn, GET Lab Forschungsseminar, 2007.","apa":"Lohweg, V. (2007). Fuzzy-Pattern-Classifier Multisensor-Fusion am Beispiel von Wertdruckproduktionsanlagen. Universität Paderborn, GET Lab Forschungsseminar."},"department":[{"_id":"DEP5023"}],"author":[{"last_name":"Lohweg","full_name":"Lohweg, Volker","id":"1804","first_name":"Volker","orcid":"0000-0002-3325-7887"}],"year":2007,"publisher":"Universität Paderborn, GET Lab Forschungsseminar","status":"public","type":"conference","date_created":"2019-11-29T13:48:53Z","date_updated":"2023-03-15T13:49:38Z","user_id":"45673","_id":"2067","language":[{"iso":"eng"}]},{"abstract":[{"lang":"eng","text":"The production of printing goods is laborious. Furthermore, the print quality, especially in banknotes, must be assured. It is accepted, that print defects are generated because printing parameters, also machine parameters can change unnoticed. Therefore, a combined concept for a multi-sensory learning and classification model based on new adaptive fuzzy-pattern-classifiers for data inspection is proposed. This inspection concept, which combines optical, acoustical and other machine information, comes up with a large amount of data, which leads to multivariate methods for data analysis. Multivariate methods are useful for analysis of large and complex data sets that consist of many variables measured on large numbers of physical data."}],"department":[{"_id":"DEP5023"}],"main_file_link":[{"url":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=4414320&tag=1"}],"author":[{"full_name":"Dyck, Walter","first_name":"Walter","last_name":"Dyck"},{"last_name":"Türke","first_name":"Thomas","full_name":"Türke, Thomas"},{"first_name":"Johannes","id":"2128","last_name":"Schaede","full_name":"Schaede, Johannes"},{"orcid":"0000-0002-3325-7887","id":"1804","last_name":"Lohweg","full_name":"Lohweg, Volker","first_name":"Volker"}],"year":2007,"publisher":"MLSP 2007 - International Workshop on MACHINE LEARNING FOR SIGNAL PROCESSING","page":"accepted for publication","status":"public","title":"A Fuzzy-Pattern-Classifier-Based Adaptive Learning Model for Sensor Fusion","publication_status":"published","citation":{"chicago-de":"Dyck, Walter, Thomas Türke, Johannes Schaede und Volker Lohweg. 2007. A Fuzzy-Pattern-Classifier-Based Adaptive Learning Model for Sensor Fusion. In: , accepted for publication. Thessaloniki, Greece: MLSP 2007 - International Workshop on MACHINE LEARNING FOR SIGNAL PROCESSING. doi:10.1109/MLSP.2007.4414320, .","din1505-2-1":"Dyck, Walter ; Türke, Thomas ; Schaede, Johannes ; Lohweg, Volker: A Fuzzy-Pattern-Classifier-Based Adaptive Learning Model for Sensor Fusion. In: . Thessaloniki, Greece : MLSP 2007 - International Workshop on MACHINE LEARNING FOR SIGNAL PROCESSING, 2007, S. accepted for publication","short":"W. Dyck, T. Türke, J. Schaede, V. Lohweg, in: MLSP 2007 - International Workshop on MACHINE LEARNING FOR SIGNAL PROCESSING, Thessaloniki, Greece, 2007, p. accepted for publication.","havard":"W. Dyck, T. Türke, J. Schaede, V. Lohweg, A Fuzzy-Pattern-Classifier-Based Adaptive Learning Model for Sensor Fusion, in: MLSP 2007 - International Workshop on MACHINE LEARNING FOR SIGNAL PROCESSING, Thessaloniki, Greece, 2007: p. accepted for publication.","mla":"Dyck, Walter, et al. A Fuzzy-Pattern-Classifier-Based Adaptive Learning Model for Sensor Fusion. MLSP 2007 - International Workshop on MACHINE LEARNING FOR SIGNAL PROCESSING, 2007, p. accepted for publication, doi:10.1109/MLSP.2007.4414320.","bjps":"Dyck W et al. (2007) A Fuzzy-Pattern-Classifier-Based Adaptive Learning Model for Sensor Fusion. Thessaloniki, Greece: MLSP 2007 - International Workshop on MACHINE LEARNING FOR SIGNAL PROCESSING, p. accepted for publication.","ufg":"Dyck, Walter et. al. (2007): A Fuzzy-Pattern-Classifier-Based Adaptive Learning Model for Sensor Fusion, in: , Thessaloniki, Greece, S. accepted for publication.","ama":"Dyck W, Türke T, Schaede J, Lohweg V. A Fuzzy-Pattern-Classifier-Based Adaptive Learning Model for Sensor Fusion. In: Thessaloniki, Greece: MLSP 2007 - International Workshop on MACHINE LEARNING FOR SIGNAL PROCESSING; 2007:accepted for publication. doi:10.1109/MLSP.2007.4414320","van":"Dyck W, Türke T, Schaede J, Lohweg V. A Fuzzy-Pattern-Classifier-Based Adaptive Learning Model for Sensor Fusion. In Thessaloniki, Greece: MLSP 2007 - International Workshop on MACHINE LEARNING FOR SIGNAL PROCESSING; 2007. p. accepted for publication.","chicago":"Dyck, Walter, Thomas Türke, Johannes Schaede, and Volker Lohweg. “A Fuzzy-Pattern-Classifier-Based Adaptive Learning Model for Sensor Fusion,” accepted for publication. Thessaloniki, Greece: MLSP 2007 - International Workshop on MACHINE LEARNING FOR SIGNAL PROCESSING, 2007. https://doi.org/10.1109/MLSP.2007.4414320.","ieee":"W. Dyck, T. Türke, J. Schaede, and V. Lohweg, “A Fuzzy-Pattern-Classifier-Based Adaptive Learning Model for Sensor Fusion,” 2007, p. accepted for publication.","apa":"Dyck, W., Türke, T., Schaede, J., & Lohweg, V. (2007). A Fuzzy-Pattern-Classifier-Based Adaptive Learning Model for Sensor Fusion (p. accepted for publication). 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The Mechanisms of Human Recognition as a Guideline For Security Feature Development. In: IST/SPIE 18th Annual Symposium on Electronic Imaging - Optical Security and Counterfeit Deterrence Techniques VI - Vol 6075, hg. von Rundolf van Renesse, 1–12. SPIE. doi:https://doi.org/10.1117/12.656529, .","din1505-2-1":"Schaede, Johannes ; Lohweg, Volker: The Mechanisms of Human Recognition as a Guideline For Security Feature Development. In: van Renesse, R. (Hrsg.): IST/SPIE 18th Annual Symposium on Electronic Imaging - Optical Security and Counterfeit Deterrence Techniques VI - Vol 6075 : SPIE, 2006, S. 1–12","short":"J. Schaede, V. 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However with the advent of more and more sophisticated security features, both visible and invisible, and the requirement of cost reduction in the printing process, it is clear that automation is required. As more and more print techniques and new security features will be established, total quality security, authenticity and bank note printing must be assured. Therefore, this factor necessitates amplification of a sensorial concept in general. We propose a concept for both authenticity checking and inspection methods for pattern recognition and classification for securities and banknotes, which is based on the concept of sensor fusion and fuzzy interpretation of data measures. In the approach different methods of authenticity analysis and print flaw detection are combined, which can be used for vending or sorting machines, as well as for printing machines. Usually only the existence or appearance of colours and their textures are checked by cameras. Our method combines the visible camera images with IR-spectral sensitive sensors, acoustical and other measurements like temperature and pressure of printing machines.","lang":"eng"}],"status":"public","publisher":"SPIE","title":"Robust and Reliable Banknote Authentification and Print Flaw Detection with Opto-Acoustical Sensor Fusion Methods","publication_status":"published","citation":{"ama":"Lohweg V, Schaede J, Türke T. Robust and Reliable Banknote Authentification and Print Flaw Detection with Opto-Acoustical Sensor Fusion Methods. In: IS&T/SPIE 18th Annual Symposium on Electronic Imaging - Optical Security and Counterfeit Deterrence Techniques VI, Proceedings(18) SPIE, Feb 2006. . SPIE; 2006.","ieee":"V. Lohweg, J. Schaede, and T. 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SPIE.","mla":"Lohweg, Volker, et al. “Robust and Reliable Banknote Authentification and Print Flaw Detection with Opto-Acoustical Sensor Fusion Methods.” IS&T/SPIE 18th Annual Symposium on Electronic Imaging - Optical Security and Counterfeit Deterrence Techniques VI, Proceedings(18) SPIE, Feb 2006. , SPIE, 2006.","havard":"V. Lohweg, J. Schaede, T. Türke, Robust and Reliable Banknote Authentification and Print Flaw Detection with Opto-Acoustical Sensor Fusion Methods, in: IS&T/SPIE 18th Annual Symposium on Electronic Imaging - Optical Security and Counterfeit Deterrence Techniques VI, Proceedings(18) SPIE, Feb 2006. , SPIE, 2006.","van":"Lohweg V, Schaede J, Türke T. Robust and Reliable Banknote Authentification and Print Flaw Detection with Opto-Acoustical Sensor Fusion Methods. In: IS&T/SPIE 18th Annual Symposium on Electronic Imaging - Optical Security and Counterfeit Deterrence Techniques VI, Proceedings(18) SPIE, Feb 2006 . 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Therefore, this factor necessitates change of a sensorial concept in general. We propose an optical-acoustical inspection method based upon the concepts of information fusion and fuzzy interpretation of data measures. Furthermore, we present a simplified scheme for information fusion for pattern recognition and data classification based on parametrical unimodal potential functions and a Sugeno-type score value analysis. Digital Object Identifier: 10.1109/ICIF.2006.301779
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Besser unscharf, aber genau als präzise und falsch! - Was hat Bildverarbeitung mit Banknoten zu tun? In: . Detmold: IHK Lippe zu Detmold.","short":"V. Lohweg, J. Schaede, in: IHK Lippe zu Detmold, Detmold, 2005."},"year":2005,"author":[{"first_name":"Volker","full_name":"Lohweg, Volker","id":"1804","last_name":"Lohweg","orcid":"0000-0002-3325-7887"},{"full_name":"Schaede, Johannes","last_name":"Schaede","id":"2128","first_name":"Johannes"}],"department":[{"_id":"DEP5023"}],"status":"public","publisher":"IHK Lippe zu Detmold","type":"conference","date_created":"2019-11-29T13:13:49Z","user_id":"45673","date_updated":"2023-03-15T13:49:38Z","place":"Detmold","language":[{"iso":"eng"}],"_id":"2057"},{"doi":" 10.1109/ICIP.2005.1529759","_id":"2058","place":"Genova","type":"conference","user_id":"45673","abstract":[{"lang":"eng","text":"Nonlinear spatial transforms and fuzzy pattern classification with unimodal potential functions are established in signal processing. They have proved to be excellent tools in feature extraction and classification. In this paper we present a hardware accelerated image processing and classification scheme for rotation and translation tolerant two-dimensional pattern recognition, which is based on one-dimensional nonlinear discrete circular transforms. However, the scheme is simple; it is stable and therefore well suited for industrial applications. An implementation on one field programmable gate array (FPGA) is proposed."}],"department":[{"_id":"DEP5023"}],"publisher":"IEEE","publication_status":"published","language":[{"iso":"eng"}],"keyword":["Pattern recognition","Field programmable gate arrays","Neural networks","Image processing","Discrete transforms","Signal processing","Image retrieval","Image recognition","Transient analysis","Fuzzy systems"],"date_created":"2019-11-29T13:17:49Z","publication_identifier":{"issn":["1522-4880 "],"eissn":["2381-8549 "],"isbn":["0-7803-9134-9"]},"publication":"IEEE International Conference On Image Processing (ICIP), Proceedings","date_updated":"2023-03-15T13:49:38Z","main_file_link":[{"url":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=1529759"}],"author":[{"last_name":"Henke","first_name":"Tobias","full_name":"Henke, Tobias"},{"full_name":"Lohweg, Volker","last_name":"Lohweg","id":"1804","first_name":"Volker","orcid":"0000-0002-3325-7887"}],"year":2005,"page":"349 - 352","status":"public","title":"A Simplified Scheme For Hardware-Based Pattern Recognition","citation":{"ama":"Henke T, Lohweg V. A Simplified Scheme For Hardware-Based Pattern Recognition. In: IEEE International Conference On Image Processing (ICIP), Proceedings. Genova: IEEE; 2005:349-352. doi: 10.1109/ICIP.2005.1529759","ieee":"T. Henke and V. Lohweg, “A Simplified Scheme For Hardware-Based Pattern Recognition,” in IEEE International Conference On Image Processing (ICIP), Proceedings, 2005, pp. 349–352.","short":"T. Henke, V. Lohweg, in: IEEE International Conference On Image Processing (ICIP), Proceedings, IEEE, Genova, 2005, pp. 349–352.","chicago-de":"Henke, Tobias und Volker Lohweg. 2005. A Simplified Scheme For Hardware-Based Pattern Recognition. In: IEEE International Conference On Image Processing (ICIP), Proceedings, 349–352. Genova: IEEE. doi: 10.1109/ICIP.2005.1529759, .","din1505-2-1":"Henke, Tobias ; Lohweg, Volker: A Simplified Scheme For Hardware-Based Pattern Recognition. In: IEEE International Conference On Image Processing (ICIP), Proceedings. Genova : IEEE, 2005, S. 349–352","van":"Henke T, Lohweg V. A Simplified Scheme For Hardware-Based Pattern Recognition. In: IEEE International Conference On Image Processing (ICIP), Proceedings. Genova: IEEE; 2005. p. 349–52.","ufg":"Henke, Tobias/Lohweg, Volker (2005): A Simplified Scheme For Hardware-Based Pattern Recognition, in: IEEE International Conference On Image Processing (ICIP), Proceedings, Genova, S. 349–352.","bjps":"Henke T and Lohweg V (2005) A Simplified Scheme For Hardware-Based Pattern Recognition. IEEE International Conference On Image Processing (ICIP), Proceedings. Genova: IEEE, pp. 349–352.","havard":"T. Henke, V. Lohweg, A Simplified Scheme For Hardware-Based Pattern Recognition, in: IEEE International Conference On Image Processing (ICIP), Proceedings, IEEE, Genova, 2005: pp. 349–352.","mla":"Henke, Tobias, and Volker Lohweg. “A Simplified Scheme For Hardware-Based Pattern Recognition.” IEEE International Conference On Image Processing (ICIP), Proceedings, IEEE, 2005, pp. 349–52, doi: 10.1109/ICIP.2005.1529759.","apa":"Henke, T., & Lohweg, V. (2005). A Simplified Scheme For Hardware-Based Pattern Recognition. In IEEE International Conference On Image Processing (ICIP), Proceedings (pp. 349–352). Genova: IEEE. https://doi.org/ 10.1109/ICIP.2005.1529759","chicago":"Henke, Tobias, and Volker Lohweg. “A Simplified Scheme For Hardware-Based Pattern Recognition.” In IEEE International Conference On Image Processing (ICIP), Proceedings, 349–52. Genova: IEEE, 2005. https://doi.org/ 10.1109/ICIP.2005.1529759."}},{"publication_status":"published","citation":{"chicago-de":"Türke, Thomas und Volker Lohweg. 2004. Real-time image-processing-system-on-chip for security feature detection and classification. In: IST/SPIE 16th Annual Symposium on Electronic Imaging - Real-Time Imaging VIII - Vol 5297, hg. von Phillip A. Laplante Nasser Kehtarnavaz, 204–211. San José: SPIE. doi:dx.doi.org/10.1117/12.527452, .","din1505-2-1":"Türke, Thomas ; Lohweg, Volker: Real-time image-processing-system-on-chip for security feature detection and classification. In: Nasser Kehtarnavaz, P. A. L. (Hrsg.): IST/SPIE 16th Annual Symposium on Electronic Imaging - Real-Time Imaging VIII - Vol 5297. San José : SPIE, 2004, S. 204–211","short":"T. Türke, V. Lohweg, in: P.A.L. Nasser Kehtarnavaz (Ed.), IST/SPIE 16th Annual Symposium on Electronic Imaging - Real-Time Imaging VIII - Vol 5297, SPIE, San José, 2004, pp. 204–211.","chicago":"Türke, Thomas, and Volker Lohweg. “Real-Time Image-Processing-System-on-Chip for Security Feature Detection and Classification.” In IST/SPIE 16th Annual Symposium on Electronic Imaging - Real-Time Imaging VIII - Vol 5297, edited by Phillip A. Laplante Nasser Kehtarnavaz, 204–11. San José: SPIE, 2004. https://doi.org/dx.doi.org/10.1117/12.527452.","apa":"Türke, T., & Lohweg, V. (2004). Real-time image-processing-system-on-chip for security feature detection and classification. In P. A. L. Nasser Kehtarnavaz (Ed.), IST/SPIE 16th Annual Symposium on Electronic Imaging - Real-Time Imaging VIII - Vol 5297 (pp. 204–211). San José: SPIE. https://doi.org/dx.doi.org/10.1117/12.527452","ufg":"Türke, Thomas/Lohweg, Volker (2004): Real-time image-processing-system-on-chip for security feature detection and classification, in: Phillip A. Laplante Nasser Kehtarnavaz (Hg.): IST/SPIE 16th Annual Symposium on Electronic Imaging - Real-Time Imaging VIII - Vol 5297, San José, S. 204–211.","bjps":"Türke T and Lohweg V (2004) Real-Time Image-Processing-System-on-Chip for Security Feature Detection and Classification. In Nasser Kehtarnavaz PAL (ed.), IST/SPIE 16th Annual Symposium on Electronic Imaging - Real-Time Imaging VIII - Vol 5297. San José: SPIE, pp. 204–211.","mla":"Türke, Thomas, and Volker Lohweg. “Real-Time Image-Processing-System-on-Chip for Security Feature Detection and Classification.” IST/SPIE 16th Annual Symposium on Electronic Imaging - Real-Time Imaging VIII - Vol 5297, edited by Phillip A. Laplante Nasser Kehtarnavaz, SPIE, 2004, pp. 204–11, doi:dx.doi.org/10.1117/12.527452.","havard":"T. Türke, V. Lohweg, Real-time image-processing-system-on-chip for security feature detection and classification, in: P.A.L. Nasser Kehtarnavaz (Ed.), IST/SPIE 16th Annual Symposium on Electronic Imaging - Real-Time Imaging VIII - Vol 5297, SPIE, San José, 2004: pp. 204–211.","van":"Türke T, Lohweg V. Real-time image-processing-system-on-chip for security feature detection and classification. In: Nasser Kehtarnavaz PAL, editor. IST/SPIE 16th Annual Symposium on Electronic Imaging - Real-Time Imaging VIII - Vol 5297. San José: SPIE; 2004. p. 204–11.","ieee":"T. Türke and V. Lohweg, “Real-time image-processing-system-on-chip for security feature detection and classification,” in IST/SPIE 16th Annual Symposium on Electronic Imaging - Real-Time Imaging VIII - Vol 5297, 2004, pp. 204–211.","ama":"Türke T, Lohweg V. Real-time image-processing-system-on-chip for security feature detection and classification. In: Nasser Kehtarnavaz PAL, ed. IST/SPIE 16th Annual Symposium on Electronic Imaging - Real-Time Imaging VIII - Vol 5297. San José: SPIE; 2004:204-211. doi:dx.doi.org/10.1117/12.527452"},"title":"Real-time image-processing-system-on-chip for security feature detection and classification","publisher":"SPIE","page":"204-211","status":"public","abstract":[{"lang":"eng","text":"Nonlinear spatial transforms and fuzzy pattern classification with unimodal potential functions are already established in signal processing. They have proved to be excellent tools in feature extraction and classification. We propose an inspection method for pattern recognition and classification of two dimensional translation variant security elements such as stripes, kinegrams and others, which are widely used as applications in bank note printing. The system is based on discrete non linear translation invariant circular transforms and fuzzy pattern classification. Nonlinear discrete circular transforms are adaptable transforms, which can be optimized for different application tasks, such as translation variant object analysis and position location. They are mainly used as generators for feature vectors. Even though, the feature vector is theoretically translation invariant, the object movement creates a translation tolerant feature vector, because in real systems and applications many problems can occur, such as signal and optical distortions. Therefore, the features should be further analysed by a fuzzy pattern classifier. Implementation of the transforms and fuzzy pattern classifier in radix-2-structures is possible, allowing fast calculations with a computational complexity of O(N) up to O(Nld(N)). Furthermore, the algorithms can be implemented in one Field Programmable Gate Array (FPGA), which operates with 40 MHz clock rate."}],"department":[{"_id":"DEP5023"}],"author":[{"last_name":"Türke","full_name":"Türke, Thomas","first_name":"Thomas"},{"orcid":"0000-0002-3325-7887","first_name":"Volker","id":"1804","full_name":"Lohweg, Volker","last_name":"Lohweg"}],"year":2004,"editor":[{"last_name":"Nasser Kehtarnavaz","first_name":"Phillip A. Laplante","full_name":"Nasser Kehtarnavaz, Phillip A. Laplante"}],"date_updated":"2023-03-15T13:49:38Z","user_id":"45673","type":"conference","date_created":"2019-11-29T13:05:16Z","publication":"IST/SPIE 16th Annual Symposium on Electronic Imaging - Real-Time Imaging VIII - Vol 5297","doi":"dx.doi.org/10.1117/12.527452","_id":"2055","language":[{"iso":"eng"}],"place":"San José"},{"page":"1912-1920","status":"public","year":2004,"main_file_link":[{"open_access":"1","url":"https://asp-eurasipjournals.springeropen.com/track/pdf/10.1155/S1110865704404247"}],"author":[{"orcid":"0000-0002-3325-7887","id":"1804","full_name":"Lohweg, Volker","first_name":"Volker","last_name":"Lohweg"},{"last_name":"Diederichs","full_name":"Diederichs, Carsten","id":"44209","first_name":"Carsten"},{"last_name":"Müller","first_name":"Dietmar","full_name":"Müller, Dietmar"}],"volume":12,"citation":{"ufg":"Lohweg, Volker et. al. (2004): Algorithms for Hardware-Based Pattern Recognition, in: EURASIP journal on applied signal processing : a publication of the European Association for Speech, Signal, and Image Processing 12 (1), S. 1912–1920.","mla":"Lohweg, Volker, et al. “Algorithms for Hardware-Based Pattern Recognition.” EURASIP Journal on Applied Signal Processing : A Publication of the European Association for Speech, Signal, and Image Processing , vol. 12, no. 1, Hindawi Publ., 2004, pp. 1912–20, doi:https://doi.org/10.1155/S1110865704404247.","havard":"V. Lohweg, C. Diederichs, D. Müller, Algorithms for Hardware-Based Pattern Recognition, EURASIP Journal on Applied Signal Processing : A Publication of the European Association for Speech, Signal, and Image Processing . 12 (2004) 1912–1920.","bjps":"Lohweg V, Diederichs C and Müller D (2004) Algorithms for Hardware-Based Pattern Recognition. EURASIP journal on applied signal processing : a publication of the European Association for Speech, Signal, and Image Processing 12, 1912–1920.","van":"Lohweg V, Diederichs C, Müller D. Algorithms for Hardware-Based Pattern Recognition. EURASIP journal on applied signal processing : a publication of the European Association for Speech, Signal, and Image Processing . 2004;12(1):1912–20.","ama":"Lohweg V, Diederichs C, Müller D. Algorithms for Hardware-Based Pattern Recognition. EURASIP journal on applied signal processing : a publication of the European Association for Speech, Signal, and Image Processing . 2004;12(1):1912-1920. doi:https://doi.org/10.1155/S1110865704404247","chicago":"Lohweg, Volker, Carsten Diederichs, and Dietmar Müller. “Algorithms for Hardware-Based Pattern Recognition.” EURASIP Journal on Applied Signal Processing : A Publication of the European Association for Speech, Signal, and Image Processing 12, no. 1 (2004): 1912–20. https://doi.org/10.1155/S1110865704404247.","apa":"Lohweg, V., Diederichs, C., & Müller, D. (2004). Algorithms for Hardware-Based Pattern Recognition. EURASIP Journal on Applied Signal Processing : A Publication of the European Association for Speech, Signal, and Image Processing , 12(1), 1912–1920. https://doi.org/10.1155/S1110865704404247","ieee":"V. Lohweg, C. Diederichs, and D. 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Müller, EURASIP Journal on Applied Signal Processing : A Publication of the European Association for Speech, Signal, and Image Processing 12 (2004) 1912–1920."},"title":"Algorithms for Hardware-Based Pattern Recognition","language":[{"iso":"eng"}],"keyword":["image processing","nonlinear circular transforms","feature extraction","fuzzy pattern recognition"],"oa":"1","date_updated":"2023-03-15T13:49:38Z","date_created":"2019-11-29T13:09:05Z","publication":"EURASIP journal on applied signal processing : a publication of the European Association for Speech, Signal, and Image Processing ","publication_identifier":{"issn":["1110-8657 "]},"publisher":"Hindawi Publ.","department":[{"_id":"DEP5023"}],"abstract":[{"text":"Nonlinear spatial transforms and fuzzy pattern classification with unimodal potential functions are established in signal processing. They have proved to be excellent tools in feature extraction and classification. In this paper, we will present a hardware-accelerated image processing and classification system which is implemented on one field-programmable gate array (FPGA). Nonlinear discrete circular transforms generate a feature vector. The features are analyzed by a fuzzy classifier. This principle can be used for feature extraction, pattern recognition, and classification tasks. Implementation in radix-2 structures is possible, allowing fast calculations with a computational complexity of up to. Furthermore, the pattern separability properties of these transforms are better than those achieved with the well-known method based on the power spectrum of the Fourier Transform, or on several other transforms. Using different signal flow structures, the transforms can be adapted to different image and signal processing applications.","lang":"eng"}],"issue":"1","publication_status":"published","place":"Akron, Ohio","doi":"https://doi.org/10.1155/S1110865704404247","_id":"2056","user_id":"15514","intvolume":" 12","type":"journal_article"},{"status":"public","page":"207","publisher":"Technische Universität Chemnitz","main_file_link":[{"open_access":"1","url":"https://nbn-resolving.org/urn:nbn:de:swb:ch1-200400031"}],"author":[{"orcid":"0000-0002-3325-7887","first_name":"Volker","full_name":"Lohweg, Volker","last_name":"Lohweg","id":"1804"}],"year":2003,"ddc":["620"],"department":[{"_id":"DEP5023"}],"abstract":[{"text":"In vielen Bereichen der ein- und zweidimensionalen Signalverarbeitung besteht die Aufgabe Signale oder Objekte unabhängig von ihren aktuellen Positionen mittels geeigneter Merkmale zu klassifizieren. Mit Hilfe schneller nichtlinearer Spektraltransformationen ist eine positionsinvariante Merkmalgewinnung möglich. In dieser Arbeit werden reelle Transformationen vorgestellt, deren Eigenschaften in Bezug auf verschiedene Parameter angepasst werden können. Zu nennen ist das gruppeninvariante Verhalten, der rechentechnische Aufwand und die Implementierbarkeit in applikationsspezifische Schaltungen. Durch unterschiedliche Berechnungsstrukturen kann beispielsweise die Separationseigenschaft aufgabengemäß adaptiert werden. Basierend auf dem Konzept charakteristischer Matrizen wird ein generalisiertes Verfahren zur Berechnung der Transformationen abgeleitet. Bezüglich ihrer Charakteristika können die vorzustellenden Transformationen gegenüber anderen als ebenbürtig oder sogar überlegen bezeichnet werden. In Kombination mit einem Fuzzy-Klassifikationsverfahren (Fuzzy-Pattern-Classification, FPC) wird ein System-On-Programmable-Chip Mustererkennungssystem entwickelt, das auf einem programmierbaren applikationsspezifischen Schaltkreis (FPGA) implementiert wird. Das System ist in der Lage pixel-basierende Bilder zu klassifizieren. In der Anwendung der Druckbildinspektion erweist sich das Mustererkennungssystem als praxisgerecht einsetzbar.","lang":"ger"},{"text":" Image retrieval, texture analysis, optical character recognition and general inspection tasks are of main interest in the field of image processing and pattern recognition. Methods which operate automatically are of interest in the above mentioned areas. Therefore, translation invariant transforms are helpful tools for pattern recognition tasks. Nonlinear spatial transforms and fuzzy pattern classification with unimodal potential functions are established in signal processing. They have proved to be excellent tools in feature extraction and classification. In this thesis nonlinear discrete transforms, which are adaptable for different application tasks, will be presented. The adaptivity includes the group specific behaviour, the amount of calculations and the implementability in application specific integrated circuits. The pattern separability properties of these transforms are better compared to that of the well known power spectrum of the Fourier transform and several other known transforms. Furthermore, a hardware accelerator image processing and classification system will presented, which is implemented on one field programmable gate array (FPGA). The system can be used for feature extraction, pattern recognition and classification tasks. In the field of printed image inspection the system is applicable under practical aspects.","lang":"eng"}],"citation":{"short":"V. Lohweg, Ein Beitrag zur effektiven Implementierung adaptiver Spektraltransformationen in applikationsspezifische integrierte Schaltkreise, Technische Universität Chemnitz, Chemnitz, 2003.","chicago-de":"Lohweg, Volker. 2003. Ein Beitrag zur effektiven Implementierung adaptiver Spektraltransformationen in applikationsspezifische integrierte Schaltkreise. Chemnitz: Technische Universität Chemnitz.","din1505-2-1":"Lohweg, Volker: Ein Beitrag zur effektiven Implementierung adaptiver Spektraltransformationen in applikationsspezifische integrierte Schaltkreise. Chemnitz : Technische Universität Chemnitz, 2003","apa":"Lohweg, V. (2003). Ein Beitrag zur effektiven Implementierung adaptiver Spektraltransformationen in applikationsspezifische integrierte Schaltkreise. Chemnitz: Technische Universität Chemnitz.","chicago":"Lohweg, Volker. Ein Beitrag zur effektiven Implementierung adaptiver Spektraltransformationen in applikationsspezifische integrierte Schaltkreise. 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Chemnitz: Technische Universität Chemnitz; 2003."},"publication_status":"published","title":"Ein Beitrag zur effektiven Implementierung adaptiver Spektraltransformationen in applikationsspezifische integrierte Schaltkreise","place":"Chemnitz","keyword":["ASIC","Abbildungseigenschaft","Druckbildkontrolle","Prozessorelement","Systolisches Array","Fuzzy-Maß","Invarianz","Klassifikation","Mehrdimensionale Bildverarbeitung","Mustererkennung","Nichtlineare Transformation"],"language":[{"iso":"ger"}],"_id":"2053","oa":"1","alternative_title":[" On Effective Implementation of Adaptive Spectral Transforms in Application Specific Integrated Circuits"],"user_id":"45673","date_updated":"2023-03-15T13:49:38Z","type":"dissertation","date_created":"2019-11-29T12:54:10Z","supervisor":[{"last_name":"Müller","first_name":"Dietmar","full_name":"Müller, Dietmar"},{"full_name":"Scarbata, Gerd","last_name":"Scarbata","first_name":"Gerd"},{"first_name":"Norman","last_name":"Bitterlin","full_name":"Bitterlin, Norman"}]},{"department":[{"_id":"DEP5023"}],"author":[{"first_name":"Carsten","id":"44209","last_name":"Diederichs","full_name":"Diederichs, Carsten"},{"full_name":"Lohweg, Volker","first_name":"Volker","id":"1804","last_name":"Lohweg","orcid":"0000-0002-3325-7887"}],"year":2003,"status":"public","publisher":"EURASIP","title":"An Image-Processing-System-On-Chip Based on Nonlinear Generalized Circular Transforms and Fuzzy Pattern Classification","citation":{"ama":"Diederichs C, Lohweg V. An Image-Processing-System-On-Chip Based on Nonlinear Generalized Circular Transforms and Fuzzy Pattern Classification. In: Sicuranza G, ed. IEEE-EURASIP Workshop on Nonlinear Signal and Image Processing. Grade- Trieste, Italy: EURASIP; 2003.","ieee":"C. Diederichs and V. Lohweg, “An Image-Processing-System-On-Chip Based on Nonlinear Generalized Circular Transforms and Fuzzy Pattern Classification,” in IEEE-EURASIP Workshop on Nonlinear Signal and Image Processing, 2003.","short":"C. Diederichs, V. Lohweg, in: G. Sicuranza (Ed.), IEEE-EURASIP Workshop on Nonlinear Signal and Image Processing, EURASIP, Grade- Trieste, Italy, 2003.","chicago-de":"Diederichs, Carsten und Volker Lohweg. 2003. An Image-Processing-System-On-Chip Based on Nonlinear Generalized Circular Transforms and Fuzzy Pattern Classification. In: IEEE-EURASIP Workshop on Nonlinear Signal and Image Processing, hg. von Giovanni Sicuranza. Grade- Trieste, Italy: EURASIP.","din1505-2-1":"Diederichs, Carsten ; Lohweg, Volker: An Image-Processing-System-On-Chip Based on Nonlinear Generalized Circular Transforms and Fuzzy Pattern Classification. In: Sicuranza, G. (Hrsg.): IEEE-EURASIP Workshop on Nonlinear Signal and Image Processing. Grade- Trieste, Italy : EURASIP, 2003","van":"Diederichs C, Lohweg V. An Image-Processing-System-On-Chip Based on Nonlinear Generalized Circular Transforms and Fuzzy Pattern Classification. In: Sicuranza G, editor. IEEE-EURASIP Workshop on Nonlinear Signal and Image Processing. Grade- Trieste, Italy: EURASIP; 2003.","mla":"Diederichs, Carsten, and Volker Lohweg. “An Image-Processing-System-On-Chip Based on Nonlinear Generalized Circular Transforms and Fuzzy Pattern Classification.” IEEE-EURASIP Workshop on Nonlinear Signal and Image Processing, edited by Giovanni Sicuranza, EURASIP, 2003.","havard":"C. Diederichs, V. Lohweg, An Image-Processing-System-On-Chip Based on Nonlinear Generalized Circular Transforms and Fuzzy Pattern Classification, in: G. Sicuranza (Ed.), IEEE-EURASIP Workshop on Nonlinear Signal and Image Processing, EURASIP, Grade- Trieste, Italy, 2003.","bjps":"Diederichs C and Lohweg V (2003) An Image-Processing-System-On-Chip Based on Nonlinear Generalized Circular Transforms and Fuzzy Pattern Classification. In Sicuranza G (ed.), IEEE-EURASIP Workshop on Nonlinear Signal and Image Processing. Grade- Trieste, Italy: EURASIP.","ufg":"Diederichs, Carsten/Lohweg, Volker (2003): An Image-Processing-System-On-Chip Based on Nonlinear Generalized Circular Transforms and Fuzzy Pattern Classification, in: Giovanni Sicuranza (Hg.): IEEE-EURASIP Workshop on Nonlinear Signal and Image Processing, Grade- Trieste, Italy.","apa":"Diederichs, C., & Lohweg, V. (2003). An Image-Processing-System-On-Chip Based on Nonlinear Generalized Circular Transforms and Fuzzy Pattern Classification. In G. 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Technische Universität Chemnitz.","mla":"Lohweg, Volker. “Ein Auf Zirkular-Transformationen Und Fuzzy Pattern Classifier Basierendes System-on-Chip Mustererkennungssystem - Mit Beispielen Aus Der Druckindustrie.” Technische Universität Chemnitz, Technische Universität Chemnitz, 2003.","havard":"V. Lohweg, Ein auf Zirkular-Transformationen und Fuzzy Pattern Classifier basierendes System-on-Chip Mustererkennungssystem - mit Beispielen aus der Druckindustrie, Technische Universität Chemnitz. (2003).","van":"Lohweg V. Ein auf Zirkular-Transformationen und Fuzzy Pattern Classifier basierendes System-on-Chip Mustererkennungssystem - mit Beispielen aus der Druckindustrie. Technische Universität Chemnitz. 2003;","ama":"Lohweg V. Ein auf Zirkular-Transformationen und Fuzzy Pattern Classifier basierendes System-on-Chip Mustererkennungssystem - mit Beispielen aus der Druckindustrie. 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Lohweg, “Ein auf Zirkular-Transformationen und Fuzzy Pattern Classifier basierendes System-on-Chip Mustererkennungssystem - mit Beispielen aus der Druckindustrie,” Technische Universität Chemnitz, 2003."},"title":"Ein auf Zirkular-Transformationen und Fuzzy Pattern Classifier basierendes System-on-Chip Mustererkennungssystem - mit Beispielen aus der Druckindustrie","status":"public","publisher":"Technische Universität Chemnitz","department":[{"_id":"DEP5023"}],"year":2003,"author":[{"last_name":"Lohweg","first_name":"Volker","full_name":"Lohweg, Volker","id":"1804","orcid":"0000-0002-3325-7887"}],"date_updated":"2023-03-15T13:49:38Z","user_id":"45673","type":"journal_article","date_created":"2019-12-03T07:06:29Z","publication":"Technische Universität Chemnitz","language":[{"iso":"eng"}],"place":"Chemnitz","_id":"2121"},{"date_updated":"2023-03-15T13:49:38Z","user_id":"45673","type":"conference","date_created":"2019-11-29T12:41:33Z","publication":"Digital Image Computing Techniques and Applications ","language":[{"iso":"eng"}],"place":"Melbourne, Australia","_id":"2051","publication_status":"published","citation":{"short":"V. 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Workshop Bildverarbeitung für die Medizin","type":"conference","date_created":"2019-11-29T12:34:54Z","user_id":"45673","date_updated":"2023-03-15T13:49:38Z","editor":[{"first_name":"Heinz","last_name":"Handels","full_name":"Handels, Heinz"}],"place":"Kiel","language":[{"iso":"ger"}],"_id":"2049","title":"Unscharfe Histogramm Klassifikation mit nichtlinearen Zirkulartransformationen und Potentialfunktionen für die Bildfindung und -analyse","citation":{"chicago-de":"Lohweg, Volker und Dietmar Müller. 2001. Unscharfe Histogramm Klassifikation mit nichtlinearen Zirkulartransformationen und Potentialfunktionen für die Bildfindung und -analyse. In: 4. Workshop Bildverarbeitung für die Medizin, hg. von Heinz Handels, 325–329. Kiel: Springer-Verlag.","din1505-2-1":"Lohweg, Volker ; Müller, Dietmar: Unscharfe Histogramm Klassifikation mit nichtlinearen Zirkulartransformationen und Potentialfunktionen für die Bildfindung und -analyse. In: Handels, H. (Hrsg.): 4. Workshop Bildverarbeitung für die Medizin. Kiel : Springer-Verlag, 2001, S. 325–329","short":"V. Lohweg, D. Müller, in: H. Handels (Ed.), 4. Workshop Bildverarbeitung für die Medizin, Springer-Verlag, Kiel, 2001, pp. 325–329.","chicago":"Lohweg, Volker, and Dietmar Müller. “Unscharfe Histogramm Klassifikation mit nichtlinearen Zirkulartransformationen und Potentialfunktionen für die Bildfindung und -analyse.” In 4. Workshop Bildverarbeitung für die Medizin, edited by Heinz Handels, 325–29. Kiel: Springer-Verlag, 2001.","apa":"Lohweg, V., & Müller, D. (2001). Unscharfe Histogramm Klassifikation mit nichtlinearen Zirkulartransformationen und Potentialfunktionen für die Bildfindung und -analyse. In H. Handels (Ed.), 4. Workshop Bildverarbeitung für die Medizin (pp. 325–329). Kiel: Springer-Verlag.","ieee":"V. Lohweg and D. Müller, “Unscharfe Histogramm Klassifikation mit nichtlinearen Zirkulartransformationen und Potentialfunktionen für die Bildfindung und -analyse,” in 4. 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Müller, Unscharfe Histogramm Klassifikation mit nichtlinearen Zirkulartransformationen und Potentialfunktionen für die Bildfindung und -analyse, in: H. Handels (Ed.), 4. Workshop Bildverarbeitung für die Medizin, Springer-Verlag, Kiel, 2001: pp. 325–329.","van":"Lohweg V, Müller D. Unscharfe Histogramm Klassifikation mit nichtlinearen Zirkulartransformationen und Potentialfunktionen für die Bildfindung und -analyse. In: Handels H, editor. 4 Workshop Bildverarbeitung für die Medizin. Kiel: Springer-Verlag; 2001. p. 325–9.","ama":"Lohweg V, Müller D. Unscharfe Histogramm Klassifikation mit nichtlinearen Zirkulartransformationen und Potentialfunktionen für die Bildfindung und -analyse. In: Handels H, ed. 4. Workshop Bildverarbeitung für die Medizin. Kiel: Springer-Verlag; 2001:325-329."},"publication_status":"published","author":[{"orcid":"0000-0002-3325-7887","last_name":"Lohweg","first_name":"Volker","id":"1804","full_name":"Lohweg, Volker"},{"full_name":"Müller, Dietmar","first_name":"Dietmar","last_name":"Müller"}],"year":2001,"department":[{"_id":"DEP5023"}],"status":"public","page":"325-329","publisher":"Springer-Verlag"},{"place":"Baltimore","language":[{"iso":"eng"}],"_id":"2050","publication":"IEEE-Eurasip Workshop on Nonlinear Signal and Image Processing","type":"conference","date_created":"2019-11-29T12:38:08Z","user_id":"45673","date_updated":"2023-03-15T13:49:38Z","editor":[{"first_name":"Gonzalo","full_name":"Arce, Gonzalo","last_name":"Arce"}],"year":2001,"author":[{"orcid":"0000-0002-3325-7887","first_name":"Volker","last_name":"Lohweg","full_name":"Lohweg, Volker","id":"1804"},{"last_name":"Müller","full_name":"Müller, Dietmar","first_name":"Dietmar"}],"department":[{"_id":"DEP5023"}],"status":"public","publisher":"Eurasip","title":"Nonlinear Generalized Circular Transforms for Signal Processing and Pattern Recognition","citation":{"short":"V. Lohweg, D. Müller, in: G. Arce (Ed.), IEEE-Eurasip Workshop on Nonlinear Signal and Image Processing, Eurasip, Baltimore, 2001.","chicago-de":"Lohweg, Volker und Dietmar Müller. 2001. Nonlinear Generalized Circular Transforms for Signal Processing and Pattern Recognition. In: IEEE-Eurasip Workshop on Nonlinear Signal and Image Processing, hg. von Gonzalo Arce. Baltimore: Eurasip.","din1505-2-1":"Lohweg, Volker ; Müller, Dietmar: Nonlinear Generalized Circular Transforms for Signal Processing and Pattern Recognition. In: Arce, G. (Hrsg.): IEEE-Eurasip Workshop on Nonlinear Signal and Image Processing. Baltimore : Eurasip, 2001","ieee":"V. Lohweg and D. Müller, “Nonlinear Generalized Circular Transforms for Signal Processing and Pattern Recognition,” in IEEE-Eurasip Workshop on Nonlinear Signal and Image Processing, 2001.","apa":"Lohweg, V., & Müller, D. (2001). Nonlinear Generalized Circular Transforms for Signal Processing and Pattern Recognition. In G. Arce (Ed.), IEEE-Eurasip Workshop on Nonlinear Signal and Image Processing. Baltimore: Eurasip.","chicago":"Lohweg, Volker, and Dietmar Müller. “Nonlinear Generalized Circular Transforms for Signal Processing and Pattern Recognition.” In IEEE-Eurasip Workshop on Nonlinear Signal and Image Processing, edited by Gonzalo Arce. Baltimore: Eurasip, 2001.","ama":"Lohweg V, Müller D. Nonlinear Generalized Circular Transforms for Signal Processing and Pattern Recognition. In: Arce G, ed. IEEE-Eurasip Workshop on Nonlinear Signal and Image Processing. Baltimore: Eurasip; 2001.","van":"Lohweg V, Müller D. Nonlinear Generalized Circular Transforms for Signal Processing and Pattern Recognition. In: Arce G, editor. IEEE-Eurasip Workshop on Nonlinear Signal and Image Processing. Baltimore: Eurasip; 2001.","bjps":"Lohweg V and Müller D (2001) Nonlinear Generalized Circular Transforms for Signal Processing and Pattern Recognition. In Arce G (ed.), IEEE-Eurasip Workshop on Nonlinear Signal and Image Processing. Baltimore: Eurasip.","havard":"V. Lohweg, D. Müller, Nonlinear Generalized Circular Transforms for Signal Processing and Pattern Recognition, in: G. Arce (Ed.), IEEE-Eurasip Workshop on Nonlinear Signal and Image Processing, Eurasip, Baltimore, 2001.","mla":"Lohweg, Volker, and Dietmar Müller. “Nonlinear Generalized Circular Transforms for Signal Processing and Pattern Recognition.” IEEE-Eurasip Workshop on Nonlinear Signal and Image Processing, edited by Gonzalo Arce, Eurasip, 2001.","ufg":"Lohweg, Volker/Müller, Dietmar (2001): Nonlinear Generalized Circular Transforms for Signal Processing and Pattern Recognition, in: Gonzalo Arce (Hg.): IEEE-Eurasip Workshop on Nonlinear Signal and Image Processing, Baltimore."},"publication_status":"published"},{"doi":"https://doi.org/10.1007/978-3-642-59757-2_70","_id":"2047","language":[{"iso":"ger"}],"place":"München","keyword":["Positionsspektrum","Zirkulartransformationen","schwach kommutative Abbildungen"],"editor":[{"first_name":"Alexander","last_name":"Horsch","full_name":"Horsch, Alexander"}],"date_updated":"2023-03-15T13:49:38Z","user_id":"45673","type":"conference","date_created":"2019-11-29T12:24:40Z","publication":"3. Workshop Bildverarbeitung für die Medizin","publication_identifier":{"isbn":["978-3-540-67123-7"],"eisbn":["978-3-642-59757-2"]},"publisher":"Springer-Verlag","page":"371-375","status":"public","abstract":[{"text":"Basierend auf der Klasse der Zirkulartransformationen wird ein generalisiertes Positionsspektrum vorgestellt. Die Berechnung des Positionsspektrums kann für alle Transformationen auf ein einheitliches Gerüst aufgebaut werden. Im Unterschied zu anderen in der Literatur bekannten Berechnungsstrategien kann die algorithmische Struktur unabhängig von einer Transformation der o.g. Klasse beibehalten werden. Mit Hilfe von schwach kommutativen Abbildungen kann ein datenreduziertes Positionsspektrum bestimmt werden, das eine Positionsunterscheidung in jedem Fall zulässt. Dieser Ansatz beruht letztendlich auf einer Interpretation des Positionsvektors im Sinne einer Klassentrennbarkeit von Positionen als Merkmal.","lang":"ger"}],"department":[{"_id":"DEP5023"}],"year":2000,"author":[{"orcid":"0000-0002-3325-7887","first_name":"Volker","last_name":"Lohweg","id":"1804","full_name":"Lohweg, Volker"},{"last_name":"Müller","full_name":"Müller, Dietmar","first_name":"Dietmar"}],"publication_status":"published","citation":{"chicago":"Lohweg, Volker, and Dietmar Müller. “Das generalisierte Positionsspektrum der Zirkulartransformationen.” In 3. Workshop Bildverarbeitung für die Medizin, edited by Alexander Horsch, 371–75. München: Springer-Verlag, 2000. https://doi.org/10.1007/978-3-642-59757-2_70.","apa":"Lohweg, V., & Müller, D. (2000). Das generalisierte Positionsspektrum der Zirkulartransformationen. In A. Horsch (Ed.), 3. Workshop Bildverarbeitung für die Medizin (pp. 371–375). München: Springer-Verlag. https://doi.org/10.1007/978-3-642-59757-2_70","ieee":"V. Lohweg and D. Müller, “Das generalisierte Positionsspektrum der Zirkulartransformationen,” in 3. Workshop Bildverarbeitung für die Medizin, 2000, pp. 371–375.","ufg":"Lohweg, Volker/Müller, Dietmar (2000): Das generalisierte Positionsspektrum der Zirkulartransformationen, in: Alexander Horsch (Hg.): 3. Workshop Bildverarbeitung für die Medizin, München, S. 371–375.","bjps":"Lohweg V and Müller D (2000) Das generalisierte Positionsspektrum der Zirkulartransformationen. In Horsch A (ed.), 3. Workshop Bildverarbeitung für die Medizin. München: Springer-Verlag, pp. 371–375.","mla":"Lohweg, Volker, and Dietmar Müller. “Das generalisierte Positionsspektrum der Zirkulartransformationen.” 3. Workshop Bildverarbeitung für die Medizin, edited by Alexander Horsch, Springer-Verlag, 2000, pp. 371–75, doi:https://doi.org/10.1007/978-3-642-59757-2_70.","havard":"V. Lohweg, D. Müller, Das generalisierte Positionsspektrum der Zirkulartransformationen, in: A. Horsch (Ed.), 3. Workshop Bildverarbeitung für die Medizin, Springer-Verlag, München, 2000: pp. 371–375.","van":"Lohweg V, Müller D. Das generalisierte Positionsspektrum der Zirkulartransformationen. In: Horsch A, editor. 3 Workshop Bildverarbeitung für die Medizin. München: Springer-Verlag; 2000. p. 371–5.","ama":"Lohweg V, Müller D. Das generalisierte Positionsspektrum der Zirkulartransformationen. In: Horsch A, ed. 3. Workshop Bildverarbeitung für die Medizin. München: Springer-Verlag; 2000:371-375. doi:https://doi.org/10.1007/978-3-642-59757-2_70","din1505-2-1":"Lohweg, Volker ; Müller, Dietmar: Das generalisierte Positionsspektrum der Zirkulartransformationen. In: Horsch, A. (Hrsg.): 3. Workshop Bildverarbeitung für die Medizin. München : Springer-Verlag, 2000, S. 371–375","chicago-de":"Lohweg, Volker und Dietmar Müller. 2000. Das generalisierte Positionsspektrum der Zirkulartransformationen. In: 3. Workshop Bildverarbeitung für die Medizin, hg. von Alexander Horsch, 371–375. München: Springer-Verlag. doi:https://doi.org/10.1007/978-3-642-59757-2_70, .","short":"V. Lohweg, D. Müller, in: A. Horsch (Ed.), 3. Workshop Bildverarbeitung für die Medizin, Springer-Verlag, München, 2000, pp. 371–375."},"title":"Das generalisierte Positionsspektrum der Zirkulartransformationen"},{"place":"Kiel","keyword":["Translationsinvariante Transformation","Mustererkennung","Betragsspektrum","Zirkulartransformation"],"language":[{"iso":"ger"}],"_id":"2048","doi":"https://doi.org/10.1007/978-3-642-59802-9_27","user_id":"45673","date_updated":"2023-03-15T13:49:38Z","editor":[{"first_name":"Gerald","full_name":"Sommer, Gerald","last_name":"Sommer"}],"publication":"Mustererkennung 2000 - 22. DAGM-Symposium","publication_identifier":{"isbn":["978-3-540-67886-1"],"eisbn":["978-3-540-67886-1"]},"date_created":"2019-11-29T12:30:09Z","type":"conference","status":"public","page":"213-220","publisher":"Springer-Verlag","year":2000,"author":[{"last_name":"Lohweg","first_name":"Volker","id":"1804","full_name":"Lohweg, Volker","orcid":"0000-0002-3325-7887"},{"last_name":"Müller","first_name":"Dietmar","full_name":"Müller, Dietmar"}],"department":[{"_id":"DEP5023"}],"abstract":[{"lang":"ger","text":"Mit Hilfe schneller nichtlinearer Spektraltransformationen ist eine translationsinvariante Merkmalgewinnung möglich. Basierend auf dem Konzept der charakteristischen Matrizen wird ein generalisiertes Verfahren zur Berechnung von Zirkulartransformationen vorgestellt. Durch unterschiedliche Berechnungsstrukturen können die Trenneigenschaften aufgabenspezifisch verändert werden. Die in dieser Arbeit vorgestellten Zirkulartransformationen sind in den praktisch erprobten Trenneigenschaften denen der bekannten CT-Transformation und dem Betragsspektrum der Fourier-Transformation überlegen. Dabei werden keine schwach kommutativen Abbildungen im Eingang benötigt. Anhand von Beispielen wird das Verhalten der Zirkulartransformation demonstriert."}],"citation":{"chicago-de":"Lohweg, Volker und Dietmar Müller. 2000. Ein generalisiertes Verfahren zur Berechnung von translationsinvarianten Zirkulartransformationen für die Anwendung in der Signal- und Bildverarbeitung. In: Mustererkennung 2000 - 22. DAGM-Symposium, hg. von Gerald Sommer, 213–220. Kiel: Springer-Verlag. doi:https://doi.org/10.1007/978-3-642-59802-9_27, .","din1505-2-1":"Lohweg, Volker ; Müller, Dietmar: Ein generalisiertes Verfahren zur Berechnung von translationsinvarianten Zirkulartransformationen für die Anwendung in der Signal- und Bildverarbeitung. In: Sommer, G. (Hrsg.): Mustererkennung 2000 - 22. DAGM-Symposium. Kiel : Springer-Verlag, 2000, S. 213–220","short":"V. Lohweg, D. Müller, in: G. Sommer (Ed.), Mustererkennung 2000 - 22. DAGM-Symposium, Springer-Verlag, Kiel, 2000, pp. 213–220.","chicago":"Lohweg, Volker, and Dietmar Müller. “Ein generalisiertes Verfahren zur Berechnung von translationsinvarianten Zirkulartransformationen für die Anwendung in der Signal- und Bildverarbeitung.” In Mustererkennung 2000 - 22. DAGM-Symposium, edited by Gerald Sommer, 213–20. Kiel: Springer-Verlag, 2000. https://doi.org/10.1007/978-3-642-59802-9_27.","apa":"Lohweg, V., & Müller, D. (2000). Ein generalisiertes Verfahren zur Berechnung von translationsinvarianten Zirkulartransformationen für die Anwendung in der Signal- und Bildverarbeitung. In G. Sommer (Ed.), Mustererkennung 2000 - 22. DAGM-Symposium (pp. 213–220). Kiel: Springer-Verlag. https://doi.org/10.1007/978-3-642-59802-9_27","havard":"V. Lohweg, D. Müller, Ein generalisiertes Verfahren zur Berechnung von translationsinvarianten Zirkulartransformationen für die Anwendung in der Signal- und Bildverarbeitung, in: G. Sommer (Ed.), Mustererkennung 2000 - 22. DAGM-Symposium, Springer-Verlag, Kiel, 2000: pp. 213–220.","bjps":"Lohweg V and Müller D (2000) Ein generalisiertes Verfahren zur Berechnung von translationsinvarianten Zirkulartransformationen für die Anwendung in der Signal- und Bildverarbeitung. In Sommer G (ed.), Mustererkennung 2000 - 22. DAGM-Symposium. Kiel: Springer-Verlag, pp. 213–220.","mla":"Lohweg, Volker, and Dietmar Müller. “Ein generalisiertes Verfahren zur Berechnung von translationsinvarianten Zirkulartransformationen für die Anwendung in der Signal- und Bildverarbeitung.” Mustererkennung 2000 - 22. DAGM-Symposium, edited by Gerald Sommer, Springer-Verlag, 2000, pp. 213–20, doi:https://doi.org/10.1007/978-3-642-59802-9_27.","ufg":"Lohweg, Volker/Müller, Dietmar (2000): Ein generalisiertes Verfahren zur Berechnung von translationsinvarianten Zirkulartransformationen für die Anwendung in der Signal- und Bildverarbeitung, in: Gerald Sommer (Hg.): Mustererkennung 2000 - 22. DAGM-Symposium, Kiel, S. 213–220.","van":"Lohweg V, Müller D. Ein generalisiertes Verfahren zur Berechnung von translationsinvarianten Zirkulartransformationen für die Anwendung in der Signal- und Bildverarbeitung. In: Sommer G, editor. Mustererkennung 2000 - 22 DAGM-Symposium. Kiel: Springer-Verlag; 2000. p. 213–20.","ieee":"V. Lohweg and D. Müller, “Ein generalisiertes Verfahren zur Berechnung von translationsinvarianten Zirkulartransformationen für die Anwendung in der Signal- und Bildverarbeitung,” in Mustererkennung 2000 - 22. DAGM-Symposium, 2000, pp. 213–220.","ama":"Lohweg V, Müller D. Ein generalisiertes Verfahren zur Berechnung von translationsinvarianten Zirkulartransformationen für die Anwendung in der Signal- und Bildverarbeitung. In: Sommer G, ed. Mustererkennung 2000 - 22. DAGM-Symposium. Kiel: Springer-Verlag; 2000:213-220. doi:https://doi.org/10.1007/978-3-642-59802-9_27"},"publication_status":"published","title":"Ein generalisiertes Verfahren zur Berechnung von translationsinvarianten Zirkulartransformationen für die Anwendung in der Signal- und Bildverarbeitung"}]