[{"_id":"2098","type":"conference","date_updated":"2023-03-15T13:49:38Z","title":"A Framework for Possibilistic Multi-source Data Fusion with Monitoring of Sensor Reliability, World Conference on Soft Computing","citation":{"bjps":"<b>Glock S <i>et al.</i></b> (2011) A Framework for Possibilistic Multi-Source Data Fusion with Monitoring of Sensor Reliability, World Conference on Soft Computing.","chicago":"Glock, Stefan, Karl Voth, Johannes Schaede, and Volker Lohweg. “A Framework for Possibilistic Multi-Source Data Fusion with Monitoring of Sensor Reliability, World Conference on Soft Computing,” 2011.","chicago-de":"Glock, Stefan, Karl Voth, Johannes Schaede und Volker Lohweg. 2011. A Framework for Possibilistic Multi-source Data Fusion with Monitoring of Sensor Reliability, World Conference on Soft Computing. In: .","van":"Glock S, Voth K, Schaede J, Lohweg V. A Framework for Possibilistic Multi-source Data Fusion with Monitoring of Sensor Reliability, World Conference on Soft Computing. In 2011.","havard":"S. Glock, K. Voth, J. Schaede, V. Lohweg, A Framework for Possibilistic Multi-source Data Fusion with Monitoring of Sensor Reliability, World Conference on Soft Computing, in: 2011.","din1505-2-1":"<span style=\"font-variant:small-caps;\">Glock, Stefan</span> ; <span style=\"font-variant:small-caps;\">Voth, Karl</span> ; <span style=\"font-variant:small-caps;\">Schaede, Johannes</span> ; <span style=\"font-variant:small-caps;\">Lohweg, Volker</span>: A Framework for Possibilistic Multi-source Data Fusion with Monitoring of Sensor Reliability, World Conference on Soft Computing. In: , 2011","apa":"Glock, S., Voth, K., Schaede, J., &#38; Lohweg, V. (2011). A Framework for Possibilistic Multi-source Data Fusion with Monitoring of Sensor Reliability, World Conference on Soft Computing.","ieee":"S. Glock, K. Voth, J. Schaede, and V. Lohweg, “A Framework for Possibilistic Multi-source Data Fusion with Monitoring of Sensor Reliability, World Conference on Soft Computing,” 2011.","ama":"Glock S, Voth K, Schaede J, Lohweg V. A Framework for Possibilistic Multi-source Data Fusion with Monitoring of Sensor Reliability, World Conference on Soft Computing. In: ; 2011.","short":"S. Glock, K. Voth, J. Schaede, V. Lohweg, in: 2011.","ufg":"<b>Glock, Stefan et. al. (2011)</b>: A Framework for Possibilistic Multi-source Data Fusion with Monitoring of Sensor Reliability, World Conference on Soft Computing, in: .","mla":"Glock, Stefan, et al. <i>A Framework for Possibilistic Multi-Source Data Fusion with Monitoring of Sensor Reliability, World Conference on Soft Computing</i>. 2011."},"author":[{"first_name":"Stefan","full_name":"Glock, Stefan","id":"44020","last_name":"Glock"},{"full_name":"Voth, Karl","first_name":"Karl","last_name":"Voth"},{"first_name":"Johannes","id":"2128","full_name":"Schaede, Johannes","last_name":"Schaede"},{"orcid":"0000-0002-3325-7887","full_name":"Lohweg, Volker","id":"1804","first_name":"Volker","last_name":"Lohweg"}],"date_created":"2019-12-02T10:40:20Z","language":[{"iso":"eng"}],"user_id":"45673","year":2011,"status":"public","department":[{"_id":"DEP5023"}]},{"oa":"1","publication_identifier":{"isbn":["978-3-9810993-9-3"]},"abstract":[{"text":"In order to reduce time consuming and expensive flawed production in Security Printing Machines an inspection system for early recognition of consecutive errors is developed. It shall avoid printing errors by combining measuring data from several sensors with expert knowledge. The inspection quality is improved by acquiring several information sources, using different physical quantities, integrating expert knowledge and perception, extracting reasonable features, and generating intuitive results.\r\nThe TLCS (Two Layer Conflict Solving) approach is based on the Evidence Theory and uses conflict solving to fuse data. The first layer applies the Conflict Modified Dempster-Shafer-Theory (CMDST). Every two sensors‘ data are combined and conflicts are solved between individuals. In the second layer the data is fused using the results from the CMDST and the sensors’ original observations by the Group Conflict Redistribution (GCR). We introduce an improvement of the TLCS approach with reference to highly complex machine conditioning applications. In this context, the sensors are grouped to attributes applying expert knowledge. The fusion of the fuzzyfied sensor’s observations that are elements of one particular attribute is accomplished by the TLCS. Subsequently, the attributes’ conditions are merged using an Ordered Weighted Averaging Operator.\r\nIn security printing machines the wiping unit is the most sensible part. It is responsible for removing surplus ink around the engravings. Even small parameter manipulations cause errors during the production. Experienced machine operators recognize errors before they occur and stabilize the production by changing wiping unit parameters mainly. The fusion approach is evaluated in a wiping simulator. Current, impact sound, temperature and force are acquired and processed. Wear, parameter changes, and mechanical disturbances are detected by the introduced algorithm.","lang":"eng"}],"publisher":"7 – 9 June 2011, Nürnberg, Germany ","type":"conference","_id":"2099","date_updated":"2023-03-15T13:49:38Z","publication":"SENSOR+TEST Conference 2011,","year":2011,"status":"public","department":[{"_id":"DEP5023"}],"main_file_link":[{"open_access":"1","url":"https://www.ama-science.org/proceedings/details/528"}],"page":"686-691","user_id":"45673","language":[{"iso":"eng"}],"author":[{"last_name":"Voth","first_name":"Karl","full_name":"Voth, Karl"},{"last_name":"Glock","first_name":"Stefan","full_name":"Glock, Stefan","id":"44020"},{"first_name":"Uwe","full_name":"Mönks, Uwe","id":"1825","last_name":"Mönks"},{"last_name":"Türke","first_name":"Thomas","full_name":"Türke, Thomas"},{"orcid":"0000-0002-3325-7887","full_name":"Lohweg, Volker","id":"1804","first_name":"Volker","last_name":"Lohweg"}],"date_created":"2019-12-02T10:41:46Z","series_title":"Proceedings SENSOR 2011","title":"Multi-sensory Machine Diagnosis on Security Printing Machines with Two Layer Conflict Solving","publication_status":"published","doi":"10.5162/sensor11/sp2.1","citation":{"din1505-2-1":"<span style=\"font-variant:small-caps;\">Voth, Karl</span> ; <span style=\"font-variant:small-caps;\">Glock, Stefan</span> ; <span style=\"font-variant:small-caps;\">Mönks, Uwe</span> ; <span style=\"font-variant:small-caps;\">Türke, Thomas</span> ; <span style=\"font-variant:small-caps;\">Lohweg, Volker</span>: Multi-sensory Machine Diagnosis on Security Printing Machines with Two Layer Conflict Solving. In: <i>SENSOR+TEST Conference 2011,</i>, <i>Proceedings SENSOR 2011</i> : 7 – 9 June 2011, Nürnberg, Germany , 2011, S. 686–691","havard":"K. Voth, S. Glock, U. Mönks, T. Türke, V. Lohweg, Multi-sensory Machine Diagnosis on Security Printing Machines with Two Layer Conflict Solving, in: SENSOR+TEST Conference 2011, 7 – 9 June 2011, Nürnberg, Germany , 2011: pp. 686–691.","van":"Voth K, Glock S, Mönks U, Türke T, Lohweg V. Multi-sensory Machine Diagnosis on Security Printing Machines with Two Layer Conflict Solving. In: SENSOR+TEST Conference 2011,. 7 – 9 June 2011, Nürnberg, Germany ; 2011. p. 686–91. (Proceedings SENSOR 2011).","chicago-de":"Voth, Karl, Stefan Glock, Uwe Mönks, Thomas Türke und Volker Lohweg. 2011. Multi-sensory Machine Diagnosis on Security Printing Machines with Two Layer Conflict Solving. In: <i>SENSOR+TEST Conference 2011,</i> 686–691. Proceedings SENSOR 2011. 7 – 9 June 2011, Nürnberg, Germany . doi:<a href=\"https://doi.org/10.5162/sensor11/sp2.1,\">10.5162/sensor11/sp2.1,</a> .","chicago":"Voth, Karl, Stefan Glock, Uwe Mönks, Thomas Türke, and Volker Lohweg. “Multi-Sensory Machine Diagnosis on Security Printing Machines with Two Layer Conflict Solving.” In <i>SENSOR+TEST Conference 2011,</i> 686–91. Proceedings SENSOR 2011. 7 – 9 June 2011, Nürnberg, Germany , 2011. <a href=\"https://doi.org/10.5162/sensor11/sp2.1\">https://doi.org/10.5162/sensor11/sp2.1</a>.","bjps":"<b>Voth K <i>et al.</i></b> (2011) Multi-Sensory Machine Diagnosis on Security Printing Machines with Two Layer Conflict Solving. <i>SENSOR+TEST Conference 2011,</i>. 7 – 9 June 2011, Nürnberg, Germany , pp. 686–691.","mla":"Voth, Karl, et al. “Multi-Sensory Machine Diagnosis on Security Printing Machines with Two Layer Conflict Solving.” <i>SENSOR+TEST Conference 2011,</i> 7 – 9 June 2011, Nürnberg, Germany , 2011, pp. 686–91, doi:<a href=\"https://doi.org/10.5162/sensor11/sp2.1\">10.5162/sensor11/sp2.1</a>.","ufg":"<b>Voth, Karl et. al. (2011)</b>: Multi-sensory Machine Diagnosis on Security Printing Machines with Two Layer Conflict Solving, in: <i>SENSOR+TEST Conference 2011,</i> (=<i>Proceedings SENSOR 2011</i>), S. 686–691.","short":"K. Voth, S. Glock, U. Mönks, T. Türke, V. Lohweg, in: SENSOR+TEST Conference 2011, 7 – 9 June 2011, Nürnberg, Germany , 2011, pp. 686–691.","ama":"Voth K, Glock S, Mönks U, Türke T, Lohweg V. Multi-sensory Machine Diagnosis on Security Printing Machines with Two Layer Conflict Solving. In: <i>SENSOR+TEST Conference 2011,</i>. Proceedings SENSOR 2011. 7 – 9 June 2011, Nürnberg, Germany ; 2011:686-691. doi:<a href=\"https://doi.org/10.5162/sensor11/sp2.1\">10.5162/sensor11/sp2.1</a>","ieee":"K. Voth, S. Glock, U. Mönks, T. Türke, and V. Lohweg, “Multi-sensory Machine Diagnosis on Security Printing Machines with Two Layer Conflict Solving,” in <i>SENSOR+TEST Conference 2011,</i> 2011, pp. 686–691.","apa":"Voth, K., Glock, S., Mönks, U., Türke, T., &#38; Lohweg, V. (2011). Multi-sensory Machine Diagnosis on Security Printing Machines with Two Layer Conflict Solving. In <i>SENSOR+TEST Conference 2011,</i> (pp. 686–691). 7 – 9 June 2011, Nürnberg, Germany . <a href=\"https://doi.org/10.5162/sensor11/sp2.1\">https://doi.org/10.5162/sensor11/sp2.1</a>"}},{"_id":"2101","type":"conference","date_updated":"2023-03-15T13:49:38Z","publisher":"Intech Publishers","oa":"1","title":"A Possibilistic Framework for Sensor Fusion with Monitoring of Sensor Reliability, Sensor Fusion – Foundation and Applications","publication_status":"published","citation":{"chicago-de":"Lohweg, Volker, Stefan Glock und Karl Voth. 2011. A Possibilistic Framework for Sensor Fusion with Monitoring of Sensor Reliability, Sensor Fusion – Foundation and Applications. In: . Vienna, July 2011: Intech Publishers. doi:<a href=\"https://doi.org/10.5772/17384,\">10.5772/17384,</a> .","chicago":"Lohweg, Volker, Stefan Glock, and Karl Voth. “A Possibilistic Framework for Sensor Fusion with Monitoring of Sensor Reliability, Sensor Fusion – Foundation and Applications.” Vienna, July 2011: Intech Publishers, 2011. <a href=\"https://doi.org/10.5772/17384\">https://doi.org/10.5772/17384</a>.","bjps":"<b>Lohweg V, Glock S and Voth K</b> (2011) A Possibilistic Framework for Sensor Fusion with Monitoring of Sensor Reliability, Sensor Fusion – Foundation and Applications. Vienna, July 2011: Intech Publishers.","din1505-2-1":"<span style=\"font-variant:small-caps;\">Lohweg, Volker</span> ; <span style=\"font-variant:small-caps;\">Glock, Stefan</span> ; <span style=\"font-variant:small-caps;\">Voth, Karl</span>: A Possibilistic Framework for Sensor Fusion with Monitoring of Sensor Reliability, Sensor Fusion – Foundation and Applications. In: . Vienna, July 2011 : Intech Publishers, 2011","havard":"V. Lohweg, S. Glock, K. Voth, A Possibilistic Framework for Sensor Fusion with Monitoring of Sensor Reliability, Sensor Fusion – Foundation and Applications, in: Intech Publishers, Vienna, July 2011, 2011.","van":"Lohweg V, Glock S, Voth K. A Possibilistic Framework for Sensor Fusion with Monitoring of Sensor Reliability, Sensor Fusion – Foundation and Applications. In Vienna, July 2011: Intech Publishers; 2011.","ama":"Lohweg V, Glock S, Voth K. A Possibilistic Framework for Sensor Fusion with Monitoring of Sensor Reliability, Sensor Fusion – Foundation and Applications. In: Vienna, July 2011: Intech Publishers; 2011. doi:<a href=\"https://doi.org/10.5772/17384\">10.5772/17384</a>","ieee":"V. Lohweg, S. Glock, and K. Voth, “A Possibilistic Framework for Sensor Fusion with Monitoring of Sensor Reliability, Sensor Fusion – Foundation and Applications,” 2011.","apa":"Lohweg, V., Glock, S., &#38; Voth, K. (2011). A Possibilistic Framework for Sensor Fusion with Monitoring of Sensor Reliability, Sensor Fusion – Foundation and Applications. Vienna, July 2011: Intech Publishers. <a href=\"https://doi.org/10.5772/17384\">https://doi.org/10.5772/17384</a>","mla":"Lohweg, Volker, et al. <i>A Possibilistic Framework for Sensor Fusion with Monitoring of Sensor Reliability, Sensor Fusion – Foundation and Applications</i>. Intech Publishers, 2011, doi:<a href=\"https://doi.org/10.5772/17384\">10.5772/17384</a>.","short":"V. Lohweg, S. Glock, K. Voth, in: Intech Publishers, Vienna, July 2011, 2011.","ufg":"<b>Lohweg, Volker et. al. (2011)</b>: A Possibilistic Framework for Sensor Fusion with Monitoring of Sensor Reliability, Sensor Fusion – Foundation and Applications, in: , Vienna, July 2011."},"doi":"10.5772/17384","author":[{"last_name":"Lohweg","first_name":"Volker","orcid":"0000-0002-3325-7887","id":"1804","full_name":"Lohweg, Volker"},{"last_name":"Glock","first_name":"Stefan","id":"44020","full_name":"Glock, Stefan"},{"first_name":"Karl","full_name":"Voth, Karl","last_name":"Voth"}],"date_created":"2019-12-02T14:30:38Z","place":"Vienna, July 2011","language":[{"iso":"eng"}],"user_id":"45673","status":"public","year":2011,"main_file_link":[{"open_access":"1","url":"https://www.intechopen.com/books/sensor-fusion-foundation-and-applications/a-possibilistic-framework-for-sensor-fusion-with-monitoring-of-sensor-reliability"}],"department":[{"_id":"DEP5023"}]},{"user_id":"45673","language":[{"iso":"eng"}],"department":[{"_id":"DEP5023"}],"year":2010,"status":"public","citation":{"mla":"Lohweg, Volker, et al. “Intaglio Based Banknote Authentication.” <i>2. InIT KBA-Giori International Workshop on “Detection of Banknote Forgeries,”</i> Orell Füssli, Zürich, 22-24 March 2010, 2010.","short":"V. Lohweg, E. Gillich, S. Glock, U. Mönks, J. Schaede, in: 2. InIT KBA-Giori International Workshop on “Detection of Banknote Forgeries,” Orell Füssli, Zürich, 22-24 March 2010, 2010.","ufg":"<b>Lohweg, Volker et. al. (2010)</b>: Intaglio Based Banknote Authentication, in: <i>2. inIT KBA-Giori International Workshop on „Detection of Banknote Forgeries“</i>.","ama":"Lohweg V, Gillich E, Glock S, Mönks U, Schaede J. Intaglio Based Banknote Authentication. In: <i>2. InIT KBA-Giori International Workshop on “Detection of Banknote Forgeries.”</i> Orell Füssli, Zürich, 22-24 March 2010; 2010.","ieee":"V. Lohweg, E. Gillich, S. Glock, U. Mönks, and J. Schaede, “Intaglio Based Banknote Authentication,” in <i>2. inIT KBA-Giori International Workshop on “Detection of Banknote Forgeries,”</i> 2010.","apa":"Lohweg, V., Gillich, E., Glock, S., Mönks, U., &#38; Schaede, J. (2010). Intaglio Based Banknote Authentication. In <i>2. inIT KBA-Giori International Workshop on “Detection of Banknote Forgeries.”</i> Orell Füssli, Zürich, 22-24 March 2010.","din1505-2-1":"<span style=\"font-variant:small-caps;\">Lohweg, Volker</span> ; <span style=\"font-variant:small-caps;\">Gillich, Eugen</span> ; <span style=\"font-variant:small-caps;\">Glock, Stefan</span> ; <span style=\"font-variant:small-caps;\">Mönks, Uwe</span> ; <span style=\"font-variant:small-caps;\">Schaede, Johannes</span>: Intaglio Based Banknote Authentication. In: <i>2. inIT KBA-Giori International Workshop on „Detection of Banknote Forgeries“</i> : Orell Füssli, Zürich, 22-24 March 2010, 2010","havard":"V. Lohweg, E. Gillich, S. Glock, U. Mönks, J. Schaede, Intaglio Based Banknote Authentication, in: 2. InIT KBA-Giori International Workshop on “Detection of Banknote Forgeries,” Orell Füssli, Zürich, 22-24 March 2010, 2010.","van":"Lohweg V, Gillich E, Glock S, Mönks U, Schaede J. Intaglio Based Banknote Authentication. In: 2 inIT KBA-Giori International Workshop on “Detection of Banknote Forgeries.” Orell Füssli, Zürich, 22-24 March 2010; 2010.","chicago-de":"Lohweg, Volker, Eugen Gillich, Stefan Glock, Uwe Mönks und Johannes Schaede. 2010. Intaglio Based Banknote Authentication. In: <i>2. inIT KBA-Giori International Workshop on „Detection of Banknote Forgeries“</i>. Orell Füssli, Zürich, 22-24 March 2010.","chicago":"Lohweg, Volker, Eugen Gillich, Stefan Glock, Uwe Mönks, and Johannes Schaede. “Intaglio Based Banknote Authentication.” In <i>2. InIT KBA-Giori International Workshop on “Detection of Banknote Forgeries.”</i> Orell Füssli, Zürich, 22-24 March 2010, 2010.","bjps":"<b>Lohweg V <i>et al.</i></b> (2010) Intaglio Based Banknote Authentication. <i>2. InIT KBA-Giori International Workshop on ‘Detection of Banknote Forgeries’</i>. Orell Füssli, Zürich, 22-24 March 2010."},"title":"Intaglio Based Banknote Authentication","author":[{"last_name":"Lohweg","full_name":"Lohweg, Volker","orcid":"0000-0002-3325-7887","id":"1804","first_name":"Volker"},{"first_name":"Eugen","id":"1706","full_name":"Gillich, Eugen","last_name":"Gillich"},{"last_name":"Glock","id":"44020","full_name":"Glock, Stefan","first_name":"Stefan"},{"id":"1825","full_name":"Mönks, Uwe","first_name":"Uwe","last_name":"Mönks"},{"last_name":"Schaede","first_name":"Johannes","id":"2128","full_name":"Schaede, Johannes"}],"date_created":"2019-12-02T08:03:04Z","publication":"2. inIT KBA-Giori International Workshop on \"Detection of Banknote Forgeries\"","date_updated":"2023-03-15T13:49:38Z","_id":"2085","type":"conference","publisher":"Orell Füssli, Zürich, 22-24 March 2010"},{"language":[{"iso":"eng"}],"main_file_link":[{"url":"https://link.springer.com/chapter/10.1007/978-3-642-03798-6_43"}],"year":2009,"volume":5748,"keyword":["Discrete Wavelet Transform","Wavelet Transform","Wavelet Packet","Decomposition Level","Printing Technique"],"publication_status":"published","author":[{"full_name":"Glock, Stefan","id":"44020","first_name":"Stefan","last_name":"Glock"},{"first_name":"Eugen","full_name":"Gillich, Eugen","id":"1706","last_name":"Gillich"},{"last_name":"Schaede","first_name":"Johannes","id":"2128","full_name":"Schaede, Johannes"},{"last_name":"Lohweg","orcid":"0000-0002-3325-7887","id":"1804","full_name":"Lohweg, Volker","first_name":"Volker"}],"date_created":"2019-11-29T14:35:35Z","abstract":[{"text":"Segmentation and feature extraction algorithms based on Wavelet Transform or Wavelet Packet Transform are established in pattern recognition. Especially in the field of texture analysis they are known to be practical. One difficulty of texture analysis was in the past the characterization of different printing processes. In this paper we present a new algorithmic concept to feature extraction of textures, printed by different printing techniques, without the necessity of a previous teaching phase. The typical characters of distinct printed textures are extracted by first order statistical moments of wavelet coefficients. The algorithm uses the 2D incomplete shift invariant Wavelet Packet Transform, resulting in a fast execution time of O(<i>N</i>log<sub>2</sub>(<i>N</i>)). Since the incomplete shift invariant Wavelet Packet Transform was exclusively defined for 1D-signals, it has been modified in this research. The application describes the detection of different printed security textures. ","lang":"eng"}],"publication_identifier":{"isbn":["978-3-642-03797-9"],"eisbn":["978-3-642-03798-6"]},"publication":"Pattern Recognition","date_updated":"2023-03-15T13:49:38Z","publisher":"Springer","place":"Berlin","user_id":"45673","department":[{"_id":"DEP5023"}],"page":"422-431","intvolume":"      5748","status":"public","editor":[{"last_name":"Denzler","first_name":"J.","full_name":"Denzler, J."},{"last_name":"Notni","full_name":"Notni, G.","first_name":"G."},{"last_name":"Süße","full_name":"Süße, H.","first_name":"H."}],"doi":"https://doi.org/10.1007/978-3-642-03798-6_43","citation":{"ama":"Glock S, Gillich E, Schaede J, Lohweg V. Feature Extraction Algorithm for Banknote Textures based on Incomplete Shift Invariant Wavelet Packet Transform. In: Denzler J, Notni G, Süße H, eds. <i>Pattern Recognition</i>. Vol 5748. Lecture Notes in Computer Science. Berlin: Springer; 2009:422-431. doi:<a href=\"https://doi.org/10.1007/978-3-642-03798-6_43\">https://doi.org/10.1007/978-3-642-03798-6_43</a>","ieee":"S. Glock, E. Gillich, J. Schaede, and V. Lohweg, “Feature Extraction Algorithm for Banknote Textures based on Incomplete Shift Invariant Wavelet Packet Transform,” in <i>Pattern Recognition</i>, vol. 5748, J. Denzler, G. Notni, and H. Süße, Eds. Berlin: Springer, 2009, pp. 422–431.","apa":"Glock, S., Gillich, E., Schaede, J., &#38; Lohweg, V. (2009). Feature Extraction Algorithm for Banknote Textures based on Incomplete Shift Invariant Wavelet Packet Transform. In J. Denzler, G. Notni, &#38; H. Süße (Eds.), <i>Pattern Recognition</i> (Vol. 5748, pp. 422–431). Berlin: Springer. <a href=\"https://doi.org/10.1007/978-3-642-03798-6_43\">https://doi.org/10.1007/978-3-642-03798-6_43</a>","mla":"Glock, Stefan, et al. “Feature Extraction Algorithm for Banknote Textures Based on Incomplete Shift Invariant Wavelet Packet Transform.” <i>Pattern Recognition</i>, edited by J. Denzler et al., vol. 5748, Springer, 2009, pp. 422–31, doi:<a href=\"https://doi.org/10.1007/978-3-642-03798-6_43\">https://doi.org/10.1007/978-3-642-03798-6_43</a>.","short":"S. Glock, E. Gillich, J. Schaede, V. Lohweg, in: J. Denzler, G. Notni, H. Süße (Eds.), Pattern Recognition, Springer, Berlin, 2009, pp. 422–431.","ufg":"<b>Glock, Stefan et. al. (2009)</b>: Feature Extraction Algorithm for Banknote Textures based on Incomplete Shift Invariant Wavelet Packet Transform, in: J. Denzler et. al. (Hgg.): <i>Pattern Recognition</i> (=<i>Lecture Notes in Computer Science 5748</i>), Berlin, S. 422–431.","chicago-de":"Glock, Stefan, Eugen Gillich, Johannes Schaede und Volker Lohweg. 2009. Feature Extraction Algorithm for Banknote Textures based on Incomplete Shift Invariant Wavelet Packet Transform. In: <i>Pattern Recognition</i>, hg. von J. Denzler, G. Notni, und H. Süße, 5748:422–431. Lecture Notes in Computer Science. Berlin: Springer. doi:<a href=\"https://doi.org/10.1007/978-3-642-03798-6_43,\">https://doi.org/10.1007/978-3-642-03798-6_43,</a> .","chicago":"Glock, Stefan, Eugen Gillich, Johannes Schaede, and Volker Lohweg. “Feature Extraction Algorithm for Banknote Textures Based on Incomplete Shift Invariant Wavelet Packet Transform.” In <i>Pattern Recognition</i>, edited by J. Denzler, G. Notni, and H. Süße, 5748:422–31. Lecture Notes in Computer Science. Berlin: Springer, 2009. <a href=\"https://doi.org/10.1007/978-3-642-03798-6_43\">https://doi.org/10.1007/978-3-642-03798-6_43</a>.","bjps":"<b>Glock S <i>et al.</i></b> (2009) Feature Extraction Algorithm for Banknote Textures Based on Incomplete Shift Invariant Wavelet Packet Transform. In Denzler J, Notni G and Süße H (eds), <i>Pattern Recognition</i>, vol. 5748. Berlin: Springer, pp. 422–431.","din1505-2-1":"<span style=\"font-variant:small-caps;\">Glock, Stefan</span> ; <span style=\"font-variant:small-caps;\">Gillich, Eugen</span> ; <span style=\"font-variant:small-caps;\">Schaede, Johannes</span> ; <span style=\"font-variant:small-caps;\">Lohweg, Volker</span>: Feature Extraction Algorithm for Banknote Textures based on Incomplete Shift Invariant Wavelet Packet Transform. In: <span style=\"font-variant:small-caps;\">Denzler, J.</span> ; <span style=\"font-variant:small-caps;\">Notni, G.</span> ; <span style=\"font-variant:small-caps;\">Süße, H.</span> (Hrsg.): <i>Pattern Recognition</i>, <i>Lecture Notes in Computer Science</i>. Bd. 5748. Berlin : Springer, 2009, S. 422–431","havard":"S. Glock, E. Gillich, J. Schaede, V. Lohweg, Feature Extraction Algorithm for Banknote Textures based on Incomplete Shift Invariant Wavelet Packet Transform, in: J. Denzler, G. Notni, H. Süße (Eds.), Pattern Recognition, Springer, Berlin, 2009: pp. 422–431.","van":"Glock S, Gillich E, Schaede J, Lohweg V. Feature Extraction Algorithm for Banknote Textures based on Incomplete Shift Invariant Wavelet Packet Transform. In: Denzler J, Notni G, Süße H, editors. Pattern Recognition. Berlin: Springer; 2009. p. 422–31. (Lecture Notes in Computer Science; vol. 5748)."},"title":"Feature Extraction Algorithm for Banknote Textures based on Incomplete Shift Invariant Wavelet Packet Transform","series_title":"Lecture Notes in Computer Science","conference":{"name":"The 31st annual pattern recognition symposium of the German Association for Pattern Recognition DAGM (Deutsche Arbeitsgemeinschaft für Mustererkennung DAGM e.V.) September 9-11, 2009, accepted for publication","start_date":"2009-11-09","end_date":"2009-11-11"},"type":"book_chapter","_id":"2076"},{"publisher":"SPIE ","publication":"Optical measurement systems for industrial inspection VI : 15 - 18 June 2009, Munich, Germany / sponsored by SPIE Europe. Peter H. Lehmann, ed. ; Pt. 2 ","date_updated":"2023-08-14T13:24:22Z","publication_identifier":{"isbn":[" 9780819476722 "]},"abstract":[{"lang":"eng","text":"In this paper we present an optical measurement system approach for quality analysis of brakes which are used in high-speed trains. The brakes consist of the so called brake discs and pads. In a deceleration process the discs will be heated up to 500°C. The quality measure is based on the fact that the heated brake discs should not generate hot spots inside the brake material. Instead, the brake disc should be heated homogeneously by the deceleration. Therefore, it makes sense to analyze the number of hot spots and their relative gradients to create a quality measure for train brakes. In this contribution we present a new approach for a quality measurement system which is based on an image analysis and classification of infra-red based heat images. Brake images which are represented in pseudo-color are first transformed in a linear grayscale space by a hue-saturation-intensity (HSI) space. This transform is necessary for the following gradient analysis which is based on gray scale gradient filters. Furthermore, different features based on Haralick's measures are generated from the gray scale and gradient images. A following Fuzzy-Pattern-Classifier is used for the classification of good and bad brakes. It has to be pointed out that the classifier returns a score value for each brake which is between 0 and 100% good quality. This fact guarantees that not only good and bad bakes can be distinguished, but also their quality can be labeled. The results show that all critical thermal patterns of train brakes can be sensed and verified."}],"date_created":"2019-11-29T14:42:59Z","author":[{"last_name":"Glock","full_name":"Glock, Stefan","id":"44020","first_name":"Stefan"},{"last_name":"Hausmann","first_name":"Stefan","full_name":"Hausmann, Stefan"},{"last_name":"Gerke","id":"73865","full_name":"Gerke, Sebastian","first_name":"Sebastian"},{"full_name":"Warok, Alexander","first_name":"Alexander","last_name":"Warok"},{"last_name":"Spiess","full_name":"Spiess, Peter","first_name":"Peter"},{"id":"1605","full_name":"Witte, Stefan","first_name":"Stefan","last_name":"Witte"},{"last_name":"Lohweg","full_name":"Lohweg, Volker","orcid":"0000-0002-3325-7887","id":"1804","first_name":"Volker"}],"volume":7389,"publication_status":"published","main_file_link":[{"url":"https://www.spiedigitallibrary.org/conference-proceedings-of-spie/7389/73891Y/Optical-classification-for-quality-and-defect-analysis-of-train-brakes/10.1117/12.827457.full"}],"year":"2009","language":[{"iso":"eng"}],"type":"conference","_id":"2077","article_number":"7389 1Y","series_title":" Proceedings of SPIE","conference":{"start_date":"2009-06-15","end_date":"2009-06-18","location":"München","name":"VI. Optical measurement systems for industrial inspection "},"doi":"https://doi.org/10.1117/12.827457","citation":{"din1505-2-1":"<span style=\"font-variant:small-caps;\">Glock, Stefan</span> ; <span style=\"font-variant:small-caps;\">Hausmann, Stefan</span> ; <span style=\"font-variant:small-caps;\">Gerke, Sebastian</span> ; <span style=\"font-variant:small-caps;\">Warok, Alexander</span> ; <span style=\"font-variant:small-caps;\">Spiess, Peter</span> ; <span style=\"font-variant:small-caps;\">Witte, Stefan</span> ; <span style=\"font-variant:small-caps;\">Lohweg, Volker</span>: Optical classification for quality and defect analysis of train brakes. In: <i>Optical measurement systems for industrial inspection VI : 15 - 18 June 2009, Munich, Germany / sponsored by SPIE Europe. Peter H. Lehmann, ed. ; Pt. 2 </i>, <i> Proceedings of SPIE</i>. Bd. 7389.  Bellingham, Wash.  : SPIE , 2009","van":"Glock S, Hausmann S, Gerke S, Warok A, Spiess P, Witte S, et al. Optical classification for quality and defect analysis of train brakes. In: Optical measurement systems for industrial inspection VI : 15 - 18 June 2009, Munich, Germany / sponsored by SPIE Europe Peter H Lehmann, ed ; Pt 2 .  Bellingham, Wash. : SPIE ; 2009. ( Proceedings of SPIE; vol. 7389).","havard":"S. Glock, S. Hausmann, S. Gerke, A. Warok, P. Spiess, S. Witte, V. Lohweg, Optical classification for quality and defect analysis of train brakes, in: Optical Measurement Systems for Industrial Inspection VI : 15 - 18 June 2009, Munich, Germany / Sponsored by SPIE Europe. Peter H. Lehmann, Ed. ; Pt. 2 , SPIE ,  Bellingham, Wash. , 2009.","chicago":"Glock, Stefan, Stefan Hausmann, Sebastian Gerke, Alexander Warok, Peter Spiess, Stefan Witte, and Volker Lohweg. “Optical Classification for Quality and Defect Analysis of Train Brakes.” In <i>Optical Measurement Systems for Industrial Inspection VI : 15 - 18 June 2009, Munich, Germany / Sponsored by SPIE Europe. Peter H. Lehmann, Ed. ; Pt. 2 </i>, Vol. 7389.  Proceedings of SPIE.  Bellingham, Wash. : SPIE , 2009. <a href=\"https://doi.org/10.1117/12.827457\">https://doi.org/10.1117/12.827457</a>.","chicago-de":"Glock, Stefan, Stefan Hausmann, Sebastian Gerke, Alexander Warok, Peter Spiess, Stefan Witte und Volker Lohweg. 2009. Optical classification for quality and defect analysis of train brakes. In: <i>Optical measurement systems for industrial inspection VI : 15 - 18 June 2009, Munich, Germany / sponsored by SPIE Europe. Peter H. Lehmann, ed. ; Pt. 2 </i>, 7389:.  Proceedings of SPIE.  Bellingham, Wash. : SPIE . doi:<a href=\"https://doi.org/10.1117/12.827457\">https://doi.org/10.1117/12.827457</a>, .","bjps":"<b>Glock S <i>et al.</i></b> (2009) Optical Classification for Quality and Defect Analysis of Train Brakes. <i>Optical Measurement Systems for Industrial Inspection VI : 15 - 18 June 2009, Munich, Germany / Sponsored by SPIE Europe. Peter H. Lehmann, Ed. ; Pt. 2 </i>, vol. 7389.  Bellingham, Wash. : SPIE .","mla":"Glock, Stefan, et al. “Optical Classification for Quality and Defect Analysis of Train Brakes.” <i>Optical Measurement Systems for Industrial Inspection VI : 15 - 18 June 2009, Munich, Germany / Sponsored by SPIE Europe. Peter H. Lehmann, Ed. ; Pt. 2 </i>, vol. 7389, 7389 1Y, SPIE , 2009, <a href=\"https://doi.org/10.1117/12.827457\">https://doi.org/10.1117/12.827457</a>.","ufg":"<b>Glock, Stefan u. a.</b>: Optical classification for quality and defect analysis of train brakes, in: o. Hg.: Optical measurement systems for industrial inspection VI : 15 - 18 June 2009, Munich, Germany / sponsored by SPIE Europe. Peter H. Lehmann, ed. ; Pt. 2 , Bd. 7389,  Bellingham, Wash.  2009 ( Proceedings of SPIE).","short":"S. Glock, S. Hausmann, S. Gerke, A. Warok, P. Spiess, S. Witte, V. Lohweg, in: Optical Measurement Systems for Industrial Inspection VI : 15 - 18 June 2009, Munich, Germany / Sponsored by SPIE Europe. Peter H. Lehmann, Ed. ; Pt. 2 , SPIE ,  Bellingham, Wash. , 2009.","ama":"Glock S, Hausmann S, Gerke S, et al. Optical classification for quality and defect analysis of train brakes. In: <i>Optical Measurement Systems for Industrial Inspection VI : 15 - 18 June 2009, Munich, Germany / Sponsored by SPIE Europe. Peter H. Lehmann, Ed. ; Pt. 2 </i>. Vol 7389.  Proceedings of SPIE. SPIE ; 2009. doi:<a href=\"https://doi.org/10.1117/12.827457\">https://doi.org/10.1117/12.827457</a>","apa":"Glock, S., Hausmann, S., Gerke, S., Warok, A., Spiess, P., Witte, S., &#38; Lohweg, V. (2009). Optical classification for quality and defect analysis of train brakes. <i>Optical Measurement Systems for Industrial Inspection VI : 15 - 18 June 2009, Munich, Germany / Sponsored by SPIE Europe. Peter H. Lehmann, Ed. ; Pt. 2 </i>, <i>7389</i>, Article 7389 1Y. <a href=\"https://doi.org/10.1117/12.827457\">https://doi.org/10.1117/12.827457</a>","ieee":"S. Glock <i>et al.</i>, “Optical classification for quality and defect analysis of train brakes,” in <i>Optical measurement systems for industrial inspection VI : 15 - 18 June 2009, Munich, Germany / sponsored by SPIE Europe. Peter H. Lehmann, ed. ; Pt. 2 </i>, München, 2009, vol. 7389. doi: <a href=\"https://doi.org/10.1117/12.827457\">https://doi.org/10.1117/12.827457</a>."},"title":"Optical classification for quality and defect analysis of train brakes","department":[{"_id":"DEP5023"}],"intvolume":"      7389","status":"public","user_id":"83781","place":" Bellingham, Wash. "}]