---
_id: '7976'
author:
- first_name: Veronika
  full_name: Gassenmeier, Veronika
  id: '74048'
  last_name: Gassenmeier
- first_name: Sahar
  full_name: Deppe, Sahar
  id: '52121'
  last_name: Deppe
- first_name: Tanja
  full_name: Hernández Rodriguez, Tanja
  id: '52466'
  last_name: Hernández Rodriguez
- first_name: Fabian
  full_name: Kuhfuß, Fabian
  last_name: Kuhfuß
- first_name: André
  full_name: Moser, André
  last_name: Moser
- first_name: Volker C.
  full_name: Hass, Volker C.
  last_name: Hass
- first_name: Kim B.
  full_name: Kuchemüller, Kim B.
  last_name: Kuchemüller
- first_name: Ralf
  full_name: Pörtner, Ralf
  last_name: Pörtner
- first_name: Johannes
  full_name: Möller, Johannes
  last_name: Möller
- first_name: George Adrian
  full_name: Ifrim, George Adrian
  id: '73814'
  last_name: Ifrim
- first_name: Björn
  full_name: Frahm, Björn
  id: '45666'
  last_name: Frahm
citation:
  ama: Gassenmeier V, Deppe S, Hernández Rodriguez T, et al. Model-assisted DoE applied
    to microalgae processes, Current Research in Biotechnology. <i>Current Research
    in Biotechnology</i>. 2022;4:102-119. doi:<a href="https://doi.org/10.1016/j.crbiot.2022.01.005">10.1016/j.crbiot.2022.01.005</a>
  apa: Gassenmeier, V., Deppe, S., Hernández Rodriguez, T., Kuhfuß, F., Moser, A.,
    Hass, V. C., Kuchemüller, K. B., Pörtner, R., Möller, J., Ifrim, G. A., &#38;
    Frahm, B. (2022). Model-assisted DoE applied to microalgae processes, Current
    Research in Biotechnology. <i>Current Research in Biotechnology</i>, <i>4</i>,
    102–119. <a href="https://doi.org/10.1016/j.crbiot.2022.01.005">https://doi.org/10.1016/j.crbiot.2022.01.005</a>
  bjps: <b>Gassenmeier V <i>et al.</i></b> (2022) Model-Assisted DoE Applied to Microalgae
    Processes, Current Research in Biotechnology. <i>Current Research in Biotechnology</i>
    <b>4</b>, 102–119.
  chicago: 'Gassenmeier, Veronika, Sahar Deppe, Tanja Hernández Rodriguez, Fabian
    Kuhfuß, André Moser, Volker C. Hass, Kim B. Kuchemüller, et al. “Model-Assisted
    DoE Applied to Microalgae Processes, Current Research in Biotechnology.” <i>Current
    Research in Biotechnology</i> 4 (2022): 102–19. <a href="https://doi.org/10.1016/j.crbiot.2022.01.005">https://doi.org/10.1016/j.crbiot.2022.01.005</a>.'
  chicago-de: 'Gassenmeier, Veronika, Sahar Deppe, Tanja Hernández Rodriguez, Fabian
    Kuhfuß, André Moser, Volker C. Hass, Kim B. Kuchemüller, u. a. 2022. Model-assisted
    DoE applied to microalgae processes, Current Research in Biotechnology. <i>Current
    Research in Biotechnology</i> 4: 102–119. doi:<a href="https://doi.org/10.1016/j.crbiot.2022.01.005">10.1016/j.crbiot.2022.01.005</a>,
    .'
  din1505-2-1: '<span style="font-variant:small-caps;"><span style="font-variant:small-caps;">Gassenmeier,
    Veronika</span> ; <span style="font-variant:small-caps;">Deppe, Sahar</span> ;
    <span style="font-variant:small-caps;">Hernández Rodriguez, Tanja</span> ; <span
    style="font-variant:small-caps;">Kuhfuß, Fabian</span> ; <span style="font-variant:small-caps;">Moser,
    André</span> ; <span style="font-variant:small-caps;">Hass, Volker C.</span> ;
    <span style="font-variant:small-caps;">Kuchemüller, Kim B.</span> ; <span style="font-variant:small-caps;">Pörtner,
    Ralf</span> ; u. a.</span>: Model-assisted DoE applied to microalgae processes,
    Current Research in Biotechnology. In: <i>Current Research in Biotechnology</i>
    Bd. 4, Elsevier (2022), S. 102–119'
  havard: V. Gassenmeier, S. Deppe, T. Hernández Rodriguez, F. Kuhfuß, A. Moser, V.C.
    Hass, K.B. Kuchemüller, R. Pörtner, J. Möller, G.A. Ifrim, B. Frahm, Model-assisted
    DoE applied to microalgae processes, Current Research in Biotechnology, Current
    Research in Biotechnology. 4 (2022) 102–119.
  ieee: 'V. Gassenmeier <i>et al.</i>, “Model-assisted DoE applied to microalgae processes,
    Current Research in Biotechnology,” <i>Current Research in Biotechnology</i>,
    vol. 4, pp. 102–119, 2022, doi: <a href="https://doi.org/10.1016/j.crbiot.2022.01.005">10.1016/j.crbiot.2022.01.005</a>.'
  mla: Gassenmeier, Veronika, et al. “Model-Assisted DoE Applied to Microalgae Processes,
    Current Research in Biotechnology.” <i>Current Research in Biotechnology</i>,
    vol. 4, 2022, pp. 102–19, <a href="https://doi.org/10.1016/j.crbiot.2022.01.005">https://doi.org/10.1016/j.crbiot.2022.01.005</a>.
  short: V. Gassenmeier, S. Deppe, T. Hernández Rodriguez, F. Kuhfuß, A. Moser, V.C.
    Hass, K.B. Kuchemüller, R. Pörtner, J. Möller, G.A. Ifrim, B. Frahm, Current Research
    in Biotechnology 4 (2022) 102–119.
  ufg: '<b>Gassenmeier, Veronika u. a.</b>: Model-assisted DoE applied to microalgae
    processes, Current Research in Biotechnology, in: <i>Current Research in Biotechnology</i>
    4 (2022),  S. 102–119.'
  van: Gassenmeier V, Deppe S, Hernández Rodriguez T, Kuhfuß F, Moser A, Hass VC,
    et al. Model-assisted DoE applied to microalgae processes, Current Research in
    Biotechnology. Current Research in Biotechnology. 2022;4:102–19.
date_created: 2022-05-05T11:14:10Z
date_updated: 2024-08-05T07:10:50Z
department:
- _id: DEP4021
doi: 10.1016/j.crbiot.2022.01.005
intvolume: '         4'
language:
- iso: eng
page: 102-119
publication: Current Research in Biotechnology
publication_identifier:
  eissn:
  - '2590-2628 '
publication_status: published
publisher: Elsevier
quality_controlled: '1'
status: public
title: Model-assisted DoE applied to microalgae processes, Current Research in Biotechnology
type: scientific_journal_article
user_id: '83781'
volume: 4
year: '2022'
...
---
_id: '7977'
abstract:
- lang: eng
  text: Kinetic growth models are a useful tool for a better understanding of microalgal
    cultivation and for optimizing cultivation conditions. The evaluation of such
    models requires experimental data that is laborious to generate in bioreactor
    settings. The experimental shake flask setting used in this study allows to run
    12 experiments at the same time, with 6 individual light intensities and light
    durations. This way, 54 biomass data sets were generated for the cultivation of
    the microalgae Chlorella vulgaris. To identify the model parameters, a stepwise
    parameter estimation procedure was applied. First, light-associated model parameters
    were estimated using additional measurements of local light intensities at differ
    heights within medium at different biomass concentrations. Next, substrate related
    model parameters were estimated, using experiments for which biomass and nitrate
    data were provided. Afterwards, growth-related model parameters were estimated
    by application of an extensive cross validation procedure.
author:
- first_name: Fabian
  full_name: Kuhfuß, Fabian
  last_name: Kuhfuß
- first_name: Veronika
  full_name: Gassenmeier, Veronika
  id: '74048'
  last_name: Gassenmeier
- first_name: Sahar
  full_name: Deppe, Sahar
  id: '52121'
  last_name: Deppe
- first_name: George Adrian
  full_name: Ifrim, George Adrian
  id: '73814'
  last_name: Ifrim
- first_name: Tanja
  full_name: Hernández Rodriguez, Tanja
  id: '52466'
  last_name: Hernández Rodriguez
- first_name: Björn
  full_name: Frahm, Björn
  id: '45666'
  last_name: Frahm
citation:
  ama: Kuhfuß F, Gassenmeier V, Deppe S, Ifrim GA, Hernández Rodriguez T, Frahm B.
    View on a mechanistic model of Chlorella vulgaris in incubated shake flasks. <i>Bioprocess
    and Biosystems Engineering</i>. 2022;45:15-30. doi:<a href="https://doi.org/10.1007/s00449-021-02627-2">10.1007/s00449-021-02627-2</a>
  apa: Kuhfuß, F., Gassenmeier, V., Deppe, S., Ifrim, G. A., Hernández Rodriguez,
    T., &#38; Frahm, B. (2022). View on a mechanistic model of Chlorella vulgaris
    in incubated shake flasks. <i>Bioprocess and Biosystems Engineering</i>, <i>45</i>,
    15–30. <a href="https://doi.org/10.1007/s00449-021-02627-2">https://doi.org/10.1007/s00449-021-02627-2</a>
  bjps: <b>Kuhfuß F <i>et al.</i></b> (2022) View on a Mechanistic Model of Chlorella
    Vulgaris in Incubated Shake Flasks. <i>Bioprocess and Biosystems Engineering</i>
    <b>45</b>, 15–30.
  chicago: 'Kuhfuß, Fabian, Veronika Gassenmeier, Sahar Deppe, George Adrian Ifrim,
    Tanja Hernández Rodriguez, and Björn Frahm. “View on a Mechanistic Model of Chlorella
    Vulgaris in Incubated Shake Flasks.” <i>Bioprocess and Biosystems Engineering</i>
    45 (2022): 15–30. <a href="https://doi.org/10.1007/s00449-021-02627-2">https://doi.org/10.1007/s00449-021-02627-2</a>.'
  chicago-de: 'Kuhfuß, Fabian, Veronika Gassenmeier, Sahar Deppe, George Adrian Ifrim,
    Tanja Hernández Rodriguez und Björn Frahm. 2022. View on a mechanistic model of
    Chlorella vulgaris in incubated shake flasks. <i>Bioprocess and Biosystems Engineering</i>
    45: 15–30. doi:<a href="https://doi.org/10.1007/s00449-021-02627-2">10.1007/s00449-021-02627-2</a>,
    .'
  din1505-2-1: '<span style="font-variant:small-caps;">Kuhfuß, Fabian</span> ; <span
    style="font-variant:small-caps;">Gassenmeier, Veronika</span> ; <span style="font-variant:small-caps;">Deppe,
    Sahar</span> ; <span style="font-variant:small-caps;">Ifrim, George Adrian</span>
    ; <span style="font-variant:small-caps;">Hernández Rodriguez, Tanja</span> ; <span
    style="font-variant:small-caps;">Frahm, Björn</span>: View on a mechanistic model
    of Chlorella vulgaris in incubated shake flasks. In: <i>Bioprocess and Biosystems
    Engineering</i> Bd. 45. Berlin, Springer (2022), S. 15–30'
  havard: F. Kuhfuß, V. Gassenmeier, S. Deppe, G.A. Ifrim, T. Hernández Rodriguez,
    B. Frahm, View on a mechanistic model of Chlorella vulgaris in incubated shake
    flasks, Bioprocess and Biosystems Engineering. 45 (2022) 15–30.
  ieee: 'F. Kuhfuß, V. Gassenmeier, S. Deppe, G. A. Ifrim, T. Hernández Rodriguez,
    and B. Frahm, “View on a mechanistic model of Chlorella vulgaris in incubated
    shake flasks,” <i>Bioprocess and Biosystems Engineering</i>, vol. 45, pp. 15–30,
    2022, doi: <a href="https://doi.org/10.1007/s00449-021-02627-2">10.1007/s00449-021-02627-2</a>.'
  mla: Kuhfuß, Fabian, et al. “View on a Mechanistic Model of Chlorella Vulgaris in
    Incubated Shake Flasks.” <i>Bioprocess and Biosystems Engineering</i>, vol. 45,
    2022, pp. 15–30, <a href="https://doi.org/10.1007/s00449-021-02627-2">https://doi.org/10.1007/s00449-021-02627-2</a>.
  short: F. Kuhfuß, V. Gassenmeier, S. Deppe, G.A. Ifrim, T. Hernández Rodriguez,
    B. Frahm, Bioprocess and Biosystems Engineering 45 (2022) 15–30.
  ufg: '<b>Kuhfuß, Fabian u. a.</b>: View on a mechanistic model of Chlorella vulgaris
    in incubated shake flasks, in: <i>Bioprocess and Biosystems Engineering</i> 45
    (2022),  S. 15–30.'
  van: Kuhfuß F, Gassenmeier V, Deppe S, Ifrim GA, Hernández Rodriguez T, Frahm B.
    View on a mechanistic model of Chlorella vulgaris in incubated shake flasks. Bioprocess
    and Biosystems Engineering. 2022;45:15–30.
date_created: 2022-05-05T11:28:56Z
date_updated: 2024-08-05T07:07:37Z
department:
- _id: DEP4021
doi: 10.1007/s00449-021-02627-2
intvolume: '        45'
language:
- iso: eng
page: 15-30
place: Berlin
publication: Bioprocess and Biosystems Engineering
publication_identifier:
  eissn:
  - 1615-7605
  issn:
  - '1615-7591 '
publication_status: published
publisher: Springer
quality_controlled: '1'
status: public
title: View on a mechanistic model of Chlorella vulgaris in incubated shake flasks
type: scientific_journal_article
user_id: '83781'
volume: 45
year: '2022'
...
---
_id: '1994'
abstract:
- lang: eng
  text: In the filling and packaging industry, the trend is towards self-diagnosis,
    optimization, and quality monitoring of processes. The aim is to increase production
    volumes and the quality. These concepts require continuous monitoring and anomaly
    detection of the filling process. In addition, a root cause analysis of the failure
    is required because not every failure can be simulated or measured previously.
    Standard anomaly detection methods have no integrated root cause analysis. In
    this paper a fusion system is utilises for the detection of different unknown
    anomalies and also the failure source of them. The performance of this method
    is benchmarked with a real-word filling process.
author:
- first_name: Martyna
  full_name: Bator, Martyna
  id: '46440'
  last_name: Bator
- first_name: Alexander
  full_name: Dicks, Alexander
  id: '1853'
  last_name: Dicks
- first_name: Sahar
  full_name: Deppe, Sahar
  id: '52121'
  last_name: Deppe
- first_name: Volker
  full_name: Lohweg, Volker
  id: '1804'
  last_name: Lohweg
  orcid: 0000-0002-3325-7887
citation:
  ama: 'Bator M, Dicks A, Deppe S, Lohweg V. Anomaly Detection with Root Cause Analysis
    for Bottling Process. In: <i>24nd IEEE International Conference on Emerging Technologies
    and Factory Automation (ETFA2019) </i>. IEEE; 2019. doi:<a href="https://doi.org/10.1109/ETFA.2019.8869514">10.1109/ETFA.2019.8869514</a>'
  apa: Bator, M., Dicks, A., Deppe, S., &#38; Lohweg, V. (2019). Anomaly Detection
    with Root Cause Analysis for Bottling Process. <i>24nd IEEE International Conference
    on Emerging Technologies and Factory Automation (ETFA2019) </i>. 24th IEEE International
    Conference on Emerging Technologies and Factory Automation (ETFA),  Zaragoza,
    Spain . <a href="https://doi.org/10.1109/ETFA.2019.8869514">https://doi.org/10.1109/ETFA.2019.8869514</a>
  bjps: '<b>Bator M <i>et al.</i></b> (2019) Anomaly Detection with Root Cause Analysis
    for Bottling Process. <i>24nd IEEE International Conference on Emerging Technologies
    and Factory Automation (ETFA2019) </i>. Piscataway, NJ: IEEE.'
  chicago: 'Bator, Martyna, Alexander Dicks, Sahar Deppe, and Volker Lohweg. “Anomaly
    Detection with Root Cause Analysis for Bottling Process.” In <i>24nd IEEE International
    Conference on Emerging Technologies and Factory Automation (ETFA2019) </i>. Piscataway,
    NJ: IEEE, 2019. <a href="https://doi.org/10.1109/ETFA.2019.8869514">https://doi.org/10.1109/ETFA.2019.8869514</a>.'
  chicago-de: 'Bator, Martyna, Alexander Dicks, Sahar Deppe und Volker Lohweg. 2019.
    Anomaly Detection with Root Cause Analysis for Bottling Process. In: <i>24nd IEEE
    International Conference on Emerging Technologies and Factory Automation (ETFA2019)
    </i>. Piscataway, NJ: IEEE. doi:<a href="https://doi.org/10.1109/ETFA.2019.8869514">10.1109/ETFA.2019.8869514</a>,
    .'
  din1505-2-1: '<span style="font-variant:small-caps;">Bator, Martyna</span> ; <span
    style="font-variant:small-caps;">Dicks, Alexander</span> ; <span style="font-variant:small-caps;">Deppe,
    Sahar</span> ; <span style="font-variant:small-caps;">Lohweg, Volker</span>: Anomaly
    Detection with Root Cause Analysis for Bottling Process. In: <i>24nd IEEE International
    Conference on Emerging Technologies and Factory Automation (ETFA2019) </i>. Piscataway,
    NJ : IEEE, 2019'
  havard: 'M. Bator, A. Dicks, S. Deppe, V. Lohweg, Anomaly Detection with Root Cause
    Analysis for Bottling Process, in: 24nd IEEE International Conference on Emerging
    Technologies and Factory Automation (ETFA2019) , IEEE, Piscataway, NJ, 2019.'
  ieee: 'M. Bator, A. Dicks, S. Deppe, and V. Lohweg, “Anomaly Detection with Root
    Cause Analysis for Bottling Process,” presented at the 24th IEEE International
    Conference on Emerging Technologies and Factory Automation (ETFA),  Zaragoza,
    Spain , 2019. doi: <a href="https://doi.org/10.1109/ETFA.2019.8869514">10.1109/ETFA.2019.8869514</a>.'
  mla: Bator, Martyna, et al. “Anomaly Detection with Root Cause Analysis for Bottling
    Process.” <i>24nd IEEE International Conference on Emerging Technologies and Factory
    Automation (ETFA2019) </i>, IEEE, 2019, <a href="https://doi.org/10.1109/ETFA.2019.8869514">https://doi.org/10.1109/ETFA.2019.8869514</a>.
  short: 'M. Bator, A. Dicks, S. Deppe, V. Lohweg, in: 24nd IEEE International Conference
    on Emerging Technologies and Factory Automation (ETFA2019) , IEEE, Piscataway,
    NJ, 2019.'
  ufg: '<b>Bator, Martyna u. a.</b>: Anomaly Detection with Root Cause Analysis for
    Bottling Process, in: o. Hg.: 24nd IEEE International Conference on Emerging Technologies
    and Factory Automation (ETFA2019) , Piscataway, NJ 2019.'
  van: 'Bator M, Dicks A, Deppe S, Lohweg V. Anomaly Detection with Root Cause Analysis
    for Bottling Process. In: 24nd IEEE International Conference on Emerging Technologies
    and Factory Automation (ETFA2019) . Piscataway, NJ: IEEE; 2019.'
conference:
  end_date: 2019-09-13
  location: ' Zaragoza, Spain '
  name: 24th IEEE International Conference on Emerging Technologies and Factory Automation
    (ETFA)
  start_date: 2019-09-10
date_created: 2019-11-22T12:51:15Z
date_updated: 2024-04-15T12:43:21Z
department:
- _id: DEP5023
- _id: DEP1308
doi: 10.1109/ETFA.2019.8869514
language:
- iso: eng
place: Piscataway, NJ
publication: '24nd IEEE International Conference on Emerging Technologies and Factory
  Automation (ETFA2019) '
publication_identifier:
  eisbn:
  - 978-1-7281-0303-7
  - 978-1-7281-0302-0
  isbn:
  - 978-1-7281-0304-4
  issn:
  - 1946-0759
publication_status: published
publisher: IEEE
status: public
title: Anomaly Detection with Root Cause Analysis for Bottling Process
type: conference
user_id: '83781'
year: '2019'
...
---
_id: '2010'
author:
- first_name: Christian
  full_name: Wissel, Christian
  id: '59157'
  last_name: Wissel
- first_name: Sahar
  full_name: Deppe, Sahar
  id: '52121'
  last_name: Deppe
- first_name: Volker
  full_name: Lohweg, Volker
  id: '1804'
  last_name: Lohweg
  orcid: 0000-0002-3325-7887
citation:
  ama: Wissel C, Deppe S, Lohweg V. 3D-Inspektion bei 600m/s - Feinste 3D-Strukturen
    inline mit hohem Tempo prüfen. <i>SPS-Magazin Ausgabe 1+2/2018, TeDo Verlag GmbH,
    Marburg</i>. 2018;(1/2).
  apa: Wissel, C., Deppe, S., &#38; Lohweg, V. (2018). 3D-Inspektion bei 600m/s -
    Feinste 3D-Strukturen inline mit hohem Tempo prüfen. <i>SPS-Magazin Ausgabe 1+2/2018,
    TeDo Verlag GmbH, Marburg</i>, (1/2).
  bjps: <b>Wissel C, Deppe S and Lohweg V</b> (2018) 3D-Inspektion bei 600m/s - Feinste
    3D-Strukturen inline mit hohem Tempo prüfen. <i>SPS-Magazin Ausgabe 1+2/2018,
    TeDo Verlag GmbH, Marburg</i>.
  chicago: Wissel, Christian, Sahar Deppe, and Volker Lohweg. “3D-Inspektion bei 600m/s
    - Feinste 3D-Strukturen inline mit hohem Tempo prüfen.” <i>SPS-Magazin Ausgabe
    1+2/2018, TeDo Verlag GmbH, Marburg</i>, no. 1/2 (2018).
  chicago-de: Wissel, Christian, Sahar Deppe und Volker Lohweg. 2018. 3D-Inspektion
    bei 600m/s - Feinste 3D-Strukturen inline mit hohem Tempo prüfen. <i>SPS-Magazin
    Ausgabe 1+2/2018, TeDo Verlag GmbH, Marburg</i>, Nr. 1/2.
  din1505-2-1: '<span style="font-variant:small-caps;">Wissel, Christian</span> ;
    <span style="font-variant:small-caps;">Deppe, Sahar</span> ; <span style="font-variant:small-caps;">Lohweg,
    Volker</span>: 3D-Inspektion bei 600m/s - Feinste 3D-Strukturen inline mit hohem
    Tempo prüfen. In: <i>SPS-Magazin Ausgabe 1+2/2018, TeDo Verlag GmbH, Marburg</i>.
    Marburg, TeDo-Verl (2018), Nr. 1/2'
  havard: C. Wissel, S. Deppe, V. Lohweg, 3D-Inspektion bei 600m/s - Feinste 3D-Strukturen
    inline mit hohem Tempo prüfen, SPS-Magazin Ausgabe 1+2/2018, TeDo Verlag GmbH,
    Marburg. (2018).
  ieee: C. Wissel, S. Deppe, and V. Lohweg, “3D-Inspektion bei 600m/s - Feinste 3D-Strukturen
    inline mit hohem Tempo prüfen,” <i>SPS-Magazin Ausgabe 1+2/2018, TeDo Verlag GmbH,
    Marburg</i>, no. 1/2, 2018.
  mla: Wissel, Christian, et al. “3D-Inspektion bei 600m/s - Feinste 3D-Strukturen
    inline mit hohem Tempo prüfen.” <i>SPS-Magazin Ausgabe 1+2/2018, TeDo Verlag GmbH,
    Marburg</i>, no. 1/2, TeDo-Verl, 2018.
  short: C. Wissel, S. Deppe, V. Lohweg, SPS-Magazin Ausgabe 1+2/2018, TeDo Verlag
    GmbH, Marburg (2018).
  ufg: '<b>Wissel, Christian et. al. (2018)</b>: 3D-Inspektion bei 600m/s - Feinste
    3D-Strukturen inline mit hohem Tempo prüfen, in: <i>SPS-Magazin Ausgabe 1+2/2018,
    TeDo Verlag GmbH, Marburg</i> (<i>1/2</i>).'
  van: Wissel C, Deppe S, Lohweg V. 3D-Inspektion bei 600m/s - Feinste 3D-Strukturen
    inline mit hohem Tempo prüfen. SPS-Magazin Ausgabe 1+2/2018, TeDo Verlag GmbH,
    Marburg. 2018;(1/2).
date_created: 2019-11-25T08:35:51Z
date_updated: 2023-03-15T13:49:38Z
department:
- _id: DEP5023
issue: '1/2 '
language:
- iso: ger
place: Marburg
publication: SPS-Magazin Ausgabe 1+2/2018, TeDo Verlag GmbH, Marburg
publication_identifier:
  issn:
  - '0935-0187 '
publication_status: published
publisher: TeDo-Verl
status: public
title: 3D-Inspektion bei 600m/s - Feinste 3D-Strukturen inline mit hohem Tempo prüfen
type: journal_article
user_id: '15514'
year: 2018
...
---
_id: '2012'
abstract:
- lang: eng
  text: "The rapid growth of optical imaging technologies increased the access and
    collection of data, which boosts the demand of data and knowledge discovery. This
    is a fast growing topic in several industry and research areas. Nowadays, a large
    number of images and signals must be analysed in order to gain and learn proper
    knowledge. Detecting images with similar contents without specifying an image,
    recently attracts the researches in image processing domain. Motif discovery in
    image processing aims to tackle the problem of deriving structures or detecting
    regularities in image databases. Most of the motif discovery methods solve this
    problem by converting images into one dimensional time series in a pre-processing
    step and then applying a motif discovery on these one dimensional time series
    for image motifs detection. Nevertheless, this conversion might lead to information
    loss and also the problem of inability to discover shifted and multi-scale image
    motifs of different size. Contrary to other approaches, here, a method is proposed
    to find image motifs of different size in image data sets by employing images
    in original dimension (2D) without converting them to one dimensional time series.\r\nThe
    proposed approach consists of three steps: Mapping or transformation, feature
    extraction and measuring similarities. First, images are inspected by the Complex
    Quad Tree Wavelet Packet transform, which provides broad frequency analysis of
    an image in various scales. Next, statistical features are extracted from the
    wavelet coefficients. Finally, image motifs are detected by measuring the similarity
    of the features applying various similarity measures. Here, the performance of
    six similarity measures are benchmarked in details. Moreover, the efficiency of
    the proposed method is demonstrated on a data set with images from diverse applications
    such as hand gesture, text recognition, leaf and plant identification, etc. Additionally,
    the robustness of this method is examined with the image data overlaying with
    distortions such as noise and blur."
author:
- first_name: Sahar
  full_name: Deppe, Sahar
  id: '52121'
  last_name: Deppe
- first_name: Volker
  full_name: Lohweg, Volker
  id: '1804'
  last_name: Lohweg
  orcid: 0000-0002-3325-7887
citation:
  ama: Deppe S, Lohweg V. Evaluation of Similarity Measures for Shift-Invariant Image
    Motif Discovery. <i>International Journal On Advances in Intelligent Systems</i>.
    2017;10(3/4):434-446.
  apa: Deppe, S., &#38; Lohweg, V. (2017). Evaluation of Similarity Measures for Shift-Invariant
    Image Motif Discovery. <i>International Journal On Advances in Intelligent Systems</i>,
    <i>10</i>(3/4), 434–446.
  bjps: <b>Deppe S and Lohweg V</b> (2017) Evaluation of Similarity Measures for Shift-Invariant
    Image Motif Discovery. <i>International Journal On Advances in Intelligent Systems</i>
    <b>10</b>, 434–446.
  chicago: 'Deppe, Sahar, and Volker Lohweg. “Evaluation of Similarity Measures for
    Shift-Invariant Image Motif Discovery.” <i>International Journal On Advances in
    Intelligent Systems</i> 10, no. 3/4 (2017): 434–46.'
  chicago-de: 'Deppe, Sahar und Volker Lohweg. 2017. Evaluation of Similarity Measures
    for Shift-Invariant Image Motif Discovery. <i>International Journal On Advances
    in Intelligent Systems</i> 10, Nr. 3/4: 434–446.'
  din1505-2-1: '<span style="font-variant:small-caps;">Deppe, Sahar</span> ; <span
    style="font-variant:small-caps;">Lohweg, Volker</span>: Evaluation of Similarity
    Measures for Shift-Invariant Image Motif Discovery. In: <i>International Journal
    On Advances in Intelligent Systems</i> Bd. 10.   [S.l.], IARIA Journals (2017),
    Nr. 3/4, S. 434–446'
  havard: S. Deppe, V. Lohweg, Evaluation of Similarity Measures for Shift-Invariant
    Image Motif Discovery, International Journal On Advances in Intelligent Systems.
    10 (2017) 434–446.
  ieee: S. Deppe and V. Lohweg, “Evaluation of Similarity Measures for Shift-Invariant
    Image Motif Discovery,” <i>International Journal On Advances in Intelligent Systems</i>,
    vol. 10, no. 3/4, pp. 434–446, 2017.
  mla: Deppe, Sahar, and Volker Lohweg. “Evaluation of Similarity Measures for Shift-Invariant
    Image Motif Discovery.” <i>International Journal On Advances in Intelligent Systems</i>,
    vol. 10, no. 3/4, IARIA Journals, 2017, pp. 434–46.
  short: S. Deppe, V. Lohweg, International Journal On Advances in Intelligent Systems
    10 (2017) 434–446.
  ufg: '<b>Deppe, Sahar/Lohweg, Volker (2017)</b>: Evaluation of Similarity Measures
    for Shift-Invariant Image Motif Discovery, in: <i>International Journal On Advances
    in Intelligent Systems</i> <i>10</i> (<i>3/4</i>), S. 434–446.'
  van: Deppe S, Lohweg V. Evaluation of Similarity Measures for Shift-Invariant Image
    Motif Discovery. International Journal On Advances in Intelligent Systems. 2017;10(3/4):434–46.
date_created: 2019-11-25T08:35:54Z
date_updated: 2023-03-15T13:49:38Z
department:
- _id: DEP5023
intvolume: '        10'
issue: 3/4
keyword:
- processing
- Wavelet transformation.
language:
- iso: eng
main_file_link:
- open_access: '1'
  url: http://www.iariajournals.org/intelligent_systems/intsys_v10_n34_2017_paged.pdf
oa: '1'
page: 434 - 446
place: '  [S.l.]'
publication: International Journal On Advances in Intelligent Systems
publication_identifier:
  issn:
  - 1942-2679
publication_status: published
publisher: IARIA Journals
status: public
title: Evaluation of Similarity Measures for Shift-Invariant Image Motif Discovery
type: journal_article
user_id: '45673'
volume: 10
year: 2017
...
---
_id: '2022'
abstract:
- lang: eng
  text: 'Nowadays, the boost of optical imaging technologies results in more data
    with a faster rate are being collected. Consequently, data and knowledge discovery
    science has become an attractive and a fast growing topic in several industry
    and research area. Motif discovery in image processing aims to tackle the problem
    of deriving structures or detecting regularities in image databases. Most of the
    motif discovery methods first convert images into time series and then attempt
    to find motifs in such data. This might lead to information loss and also the
    problem of inability to detect shifted and multi-scale image motifs  of different
    size. Here, a method is proposed to find image motifs of different size in image
    datasets by applying images in original dimension without converting them to time
    series. Images are inspected by the Complex Quad Tree Wavelet Packet transform
    which provides broad frequency analysis of an image in various scales. Next, features
    are extracted from the wavelet coefficients. Finally, image motifs are detected
    by measuring the similarity of the features. The performance of the proposed method
    is demonstrated on a dataset with images from diverse applications, such as hand
    gesture, text recognition, leaf and plant identification, etc. '
author:
- first_name: Sahar
  full_name: Deppe, Sahar
  id: '52121'
  last_name: Deppe
- first_name: Volker
  full_name: Lohweg, Volker
  id: '1804'
  last_name: Lohweg
  orcid: 0000-0002-3325-7887
citation:
  ama: 'Deppe S, Lohweg V. Shift-Invariant Motif Discovery in Image Processing “Best
    Paper Award.” In: Leister W, ed. <i>PESARO 2017 The Seventh International Conference
    on Performance, Safety and Robustness in Complex Systems and Applications</i>.
    PESARO 2017; Venice, Italy  : The Seventh International Conference on Performance,
    Safety and Robustness in Complex Systems and Applications; Special track MAIS:
    Machine Learning Algorithms in Image and Signal Processing; 2017:27-32.'
  apa: 'Deppe, S., &#38; Lohweg, V. (2017). Shift-Invariant Motif Discovery in Image
    Processing “Best Paper Award.” In W. Leister (Ed.), <i>PESARO 2017 The Seventh
    International Conference on Performance, Safety and Robustness in Complex Systems
    and Applications</i> (pp. 27–32). PESARO 2017; Venice, Italy  : The Seventh International
    Conference on Performance, Safety and Robustness in Complex Systems and Applications;
    Special track MAIS: Machine Learning Algorithms in Image and Signal Processing.'
  bjps: '<b>Deppe S and Lohweg V</b> (2017) Shift-Invariant Motif Discovery in Image
    Processing ‘Best Paper Award’. In Leister W (ed.), <i>PESARO 2017 The Seventh
    International Conference on Performance, Safety and Robustness in Complex Systems
    and Applications</i>. PESARO 2017; Venice, Italy  : The Seventh International
    Conference on Performance, Safety and Robustness in Complex Systems and Applications;
    Special track MAIS: Machine Learning Algorithms in Image and Signal Processing,
    pp. 27–32.'
  chicago: 'Deppe, Sahar, and Volker Lohweg. “Shift-Invariant Motif Discovery in Image
    Processing ‘Best Paper Award.’” In <i>PESARO 2017 The Seventh International Conference
    on Performance, Safety and Robustness in Complex Systems and Applications</i>,
    edited by Wolfgang Leister, 27–32. PESARO 2017; Venice, Italy  : The Seventh International
    Conference on Performance, Safety and Robustness in Complex Systems and Applications;
    Special track MAIS: Machine Learning Algorithms in Image and Signal Processing,
    2017.'
  chicago-de: 'Deppe, Sahar und Volker Lohweg. 2017. Shift-Invariant Motif Discovery
    in Image Processing „Best Paper Award“. In: <i>PESARO 2017 The Seventh International
    Conference on Performance, Safety and Robustness in Complex Systems and Applications</i>,
    hg. von Wolfgang Leister, 27–32. PESARO 2017; Venice, Italy  : The Seventh International
    Conference on Performance, Safety and Robustness in Complex Systems and Applications;
    Special track MAIS: Machine Learning Algorithms in Image and Signal Processing.'
  din1505-2-1: '<span style="font-variant:small-caps;">Deppe, Sahar</span> ; <span
    style="font-variant:small-caps;">Lohweg, Volker</span>: Shift-Invariant Motif
    Discovery in Image Processing „Best Paper Award“. In: <span style="font-variant:small-caps;">Leister,
    W.</span> (Hrsg.): <i>PESARO 2017 The Seventh International Conference on Performance,
    Safety and Robustness in Complex Systems and Applications</i>. PESARO 2017; Venice,
    Italy   : The Seventh International Conference on Performance, Safety and Robustness
    in Complex Systems and Applications; Special track MAIS: Machine Learning Algorithms
    in Image and Signal Processing, 2017, S. 27–32'
  havard: 'S. Deppe, V. Lohweg, Shift-Invariant Motif Discovery in Image Processing
    “Best Paper Award,” in: W. Leister (Ed.), PESARO 2017 The Seventh International
    Conference on Performance, Safety and Robustness in Complex Systems and Applications,
    The Seventh International Conference on Performance, Safety and Robustness in
    Complex Systems and Applications; Special track MAIS: Machine Learning Algorithms
    in Image and Signal Processing, PESARO 2017; Venice, Italy  , 2017: pp. 27–32.'
  ieee: S. Deppe and V. Lohweg, “Shift-Invariant Motif Discovery in Image Processing
    ‘Best Paper Award,’” in <i>PESARO 2017 The Seventh International Conference on
    Performance, Safety and Robustness in Complex Systems and Applications</i>, Venice,
    Italy , 2017, pp. 27–32.
  mla: 'Deppe, Sahar, and Volker Lohweg. “Shift-Invariant Motif Discovery in Image
    Processing ‘Best Paper Award.’” <i>PESARO 2017 The Seventh International Conference
    on Performance, Safety and Robustness in Complex Systems and Applications</i>,
    edited by Wolfgang Leister, The Seventh International Conference on Performance,
    Safety and Robustness in Complex Systems and Applications; Special track MAIS:
    Machine Learning Algorithms in Image and Signal Processing, 2017, pp. 27–32.'
  short: 'S. Deppe, V. Lohweg, in: W. Leister (Ed.), PESARO 2017 The Seventh International
    Conference on Performance, Safety and Robustness in Complex Systems and Applications,
    The Seventh International Conference on Performance, Safety and Robustness in
    Complex Systems and Applications; Special track MAIS: Machine Learning Algorithms
    in Image and Signal Processing, PESARO 2017; Venice, Italy  , 2017, pp. 27–32.'
  ufg: '<b>Deppe, Sahar/Lohweg, Volker (2017)</b>: Shift-Invariant Motif Discovery
    in Image Processing „Best Paper Award“, in: Wolfgang Leister (Hg.): <i>PESARO
    2017 The Seventh International Conference on Performance, Safety and Robustness
    in Complex Systems and Applications</i>, PESARO 2017; Venice, Italy  , S. 27–32.'
  van: 'Deppe S, Lohweg V. Shift-Invariant Motif Discovery in Image Processing “Best
    Paper Award.” In: Leister W, editor. PESARO 2017 The Seventh International Conference
    on Performance, Safety and Robustness in Complex Systems and Applications. PESARO
    2017; Venice, Italy  : The Seventh International Conference on Performance, Safety
    and Robustness in Complex Systems and Applications; Special track MAIS: Machine
    Learning Algorithms in Image and Signal Processing; 2017. p. 27–32.'
conference:
  end_date: 2017-04-27
  location: 'Venice, Italy '
  name: 7. International Conference on Performance (PESARO 2017)
  start_date: 2017-04-23
date_created: 2019-11-25T09:06:50Z
date_updated: 2023-03-15T13:49:38Z
department:
- _id: DEP5023
editor:
- first_name: Wolfgang
  full_name: Leister, Wolfgang
  last_name: Leister
keyword:
- Motif discovery
- Image processing
- Wavelet transformation
language:
- iso: eng
main_file_link:
- open_access: '1'
  url: http://www.thinkmind.org/index.php?view=instance&instance=PESARO+2017
oa: '1'
page: 27-32
place: 'PESARO 2017; Venice, Italy  '
publication: PESARO 2017 The Seventh International Conference on Performance, Safety
  and Robustness in Complex Systems and Applications
publication_identifier:
  eisbn:
  - 978-1-61208-549-4
  eissn:
  - 2308-3700
publication_status: published
publisher: 'The Seventh International Conference on Performance, Safety and Robustness
  in Complex Systems and Applications; Special track MAIS: Machine Learning Algorithms
  in Image and Signal Processing'
status: public
title: Shift-Invariant Motif Discovery in Image Processing 'Best Paper Award'
type: conference
user_id: '15514'
year: 2017
...
---
_id: '2023'
abstract:
- lang: eng
  text: Last decades witness a huge growth in medical applications, genetic analysis,and
    in performance of manufacturing technologies and automatised productionsystems.
    A challenging task is to identify and diagnose the behavior of suchsystems, which
    aim to produce a product with desired quality. In order to con-trol the state
    of the systems, various information is gathered from differenttypes of sensors
    (optical, acoustic, chemical, electric, and thermal). Time seriesdata are a set
    of real-valued variables obtained chronologically. Data miningand machine learning
    help derive meaningful knowledge from time series.Such tasks include clustering,
    classification, anomaly detection andmotif discov-ery. Motif discovery attempts
    tofind meaningful, new, and unknown knowledgefrom data. Detection of motifs in
    a time series is beneficial for, e.g., discovery ofrules or specific events in
    a signal. Motifs provide useful information for theuser in order to model or analyze
    the data. Motif discovery is applied to variousareas  as  telecommunication,  medicine,  web,  motion-capture,  and  sensornetworks.
    This contribution provides a review of the existing publications intime series
    motif discovery along with advantages and disadvantages of existingapproaches.
    Moreover, the research issues and missing points in thisfield arehighlighted.
    The main objective of this focus article is to serve as a glossary forresearchers
    in thisfield.
author:
- first_name: Sahar
  full_name: Deppe, Sahar
  id: '52121'
  last_name: Deppe
- first_name: Volker
  full_name: Lohweg, Volker
  id: '1804'
  last_name: Lohweg
  orcid: 0000-0002-3325-7887
citation:
  ama: 'Deppe S, Lohweg V. Survey on Time Series Motif Discovery. <i>  WIREs : Forensic
    science</i>. 2017;7(2). doi:<a href="https://doi.org/ https://doi.org/10.1002/widm.1199">
    https://doi.org/10.1002/widm.1199</a>'
  apa: 'Deppe, S., &#38; Lohweg, V. (2017). Survey on Time Series Motif Discovery.
    <i>  WIREs : Forensic Science</i>, <i>7</i>(2). <a href="https://doi.org/ https://doi.org/10.1002/widm.1199">https://doi.org/
    https://doi.org/10.1002/widm.1199</a>'
  bjps: '<b>Deppe S and Lohweg V</b> (2017) Survey on Time Series Motif Discovery.
    <i>  WIREs : Forensic science</i> <b>7</b>.'
  chicago: 'Deppe, Sahar, and Volker Lohweg. “Survey on Time Series Motif Discovery.”
    <i>  WIREs : Forensic Science</i> 7, no. 2 (2017). <a href="https://doi.org/ https://doi.org/10.1002/widm.1199">https://doi.org/
    https://doi.org/10.1002/widm.1199</a>.'
  chicago-de: 'Deppe, Sahar und Volker Lohweg. 2017. Survey on Time Series Motif Discovery.
    <i>  WIREs : Forensic science</i> 7, Nr. 2. doi:<a href="https://doi.org/ https://doi.org/10.1002/widm.1199,">
    https://doi.org/10.1002/widm.1199,</a> .'
  din1505-2-1: '<span style="font-variant:small-caps;">Deppe, Sahar</span> ; <span
    style="font-variant:small-caps;">Lohweg, Volker</span>: Survey on Time Series
    Motif Discovery. In: <i>  WIREs : Forensic science</i> Bd. 7.   Danvers, MA ,
    Wiley-Blackwell  (2017), Nr. 2'
  havard: 'S. Deppe, V. Lohweg, Survey on Time Series Motif Discovery,   WIREs : Forensic
    Science. 7 (2017).'
  ieee: 'S. Deppe and V. Lohweg, “Survey on Time Series Motif Discovery,” <i>  WIREs :
    Forensic science</i>, vol. 7, no. 2, 2017.'
  mla: 'Deppe, Sahar, and Volker Lohweg. “Survey on Time Series Motif Discovery.”
    <i>  WIREs : Forensic Science</i>, vol. 7, no. 2, Wiley-Blackwell , 2017, doi:<a
    href="https://doi.org/ https://doi.org/10.1002/widm.1199"> https://doi.org/10.1002/widm.1199</a>.'
  short: 'S. Deppe, V. Lohweg,   WIREs : Forensic Science 7 (2017).'
  ufg: '<b>Deppe, Sahar/Lohweg, Volker (2017)</b>: Survey on Time Series Motif Discovery,
    in: <i>  WIREs : Forensic science</i> <i>7</i> (<i>2</i>).'
  van: 'Deppe S, Lohweg V. Survey on Time Series Motif Discovery.   WIREs : Forensic
    science. 2017;7(2).'
date_created: 2019-11-25T09:06:51Z
date_updated: 2023-03-15T13:49:38Z
department:
- _id: DEP5023
doi: ' https://doi.org/10.1002/widm.1199'
intvolume: '         7'
issue: '2'
language:
- iso: eng
place: '  Danvers, MA '
publication: '  WIREs : Forensic science'
publication_identifier:
  eissn:
  - '2573-9468 '
publication_status: published
publisher: 'Wiley-Blackwell '
status: public
title: Survey on Time Series Motif Discovery
type: journal_article
user_id: '15514'
volume: 7
year: 2017
...
---
_id: '2033'
abstract:
- lang: eng
  text: Cash machines or automated teller machines (ATMs) are one of the typical ways
    to get cash around the world. Such machines are under a variety of criminal attacks.
    Most of the manipulations are performed through skimming. In 2014, such attacks
    led to a damage of approx. 280 million Euro within the EU. In this paper, we propose
    an approach to detect anomalies and attacks on ATMs via motif discovery. Motifs
    are frequently unknown occurring sequences or events in a time series signal.
    State of the ATM is captured by innovative piezoelectric sensor networks to analyse
    the occurring vibrations. The captured signals are inspected by the Complex Quad-Tree
    Wavelet Packet transform which provides broad frequency analysis of a signal in
    various scales. Next, features are extracted from the selected scale based on
    the information content, to detect motifs. Detected motifs provide the prototype
    patterns for anomaly detection or classification tasks.
author:
- first_name: Sahar
  full_name: Deppe, Sahar
  id: '52121'
  last_name: Deppe
- first_name: Alexander
  full_name: Dicks, Alexander
  id: '1853'
  last_name: Dicks
- first_name: Volker
  full_name: Lohweg, Volker
  id: '1804'
  last_name: Lohweg
  orcid: 0000-0002-3325-7887
citation:
  ama: 'Deppe S, Dicks A, Lohweg V. Anomaly Detection on ATMs via Time Series Motif
    Discovery. In: <i>21th IEEE International Conference on Emerging Technologies
    and Factory Automation (ETFA 2016), Berlin, </i>. ; 2016.'
  apa: Deppe, S., Dicks, A., &#38; Lohweg, V. (2016). Anomaly Detection on ATMs via
    Time Series Motif Discovery. In <i>21th IEEE International Conference on Emerging
    Technologies and Factory Automation (ETFA 2016), Berlin, </i>.
  bjps: <b>Deppe S, Dicks A and Lohweg V</b> (2016) Anomaly Detection on ATMs via
    Time Series Motif Discovery. <i>21th IEEE International Conference on Emerging
    Technologies and Factory Automation (ETFA 2016), Berlin, </i>.
  chicago: Deppe, Sahar, Alexander Dicks, and Volker Lohweg. “Anomaly Detection on
    ATMs via Time Series Motif Discovery.” In <i>21th IEEE International Conference
    on Emerging Technologies and Factory Automation (ETFA 2016), Berlin, </i>, 2016.
  chicago-de: 'Deppe, Sahar, Alexander Dicks und Volker Lohweg. 2016. Anomaly Detection
    on ATMs via Time Series Motif Discovery. In: <i>21th IEEE International Conference
    on Emerging Technologies and Factory Automation (ETFA 2016), Berlin, </i>.'
  din1505-2-1: '<span style="font-variant:small-caps;">Deppe, Sahar</span> ; <span
    style="font-variant:small-caps;">Dicks, Alexander</span> ; <span style="font-variant:small-caps;">Lohweg,
    Volker</span>: Anomaly Detection on ATMs via Time Series Motif Discovery. In:
    <i>21th IEEE International Conference on Emerging Technologies and Factory Automation
    (ETFA 2016), Berlin, </i>, 2016'
  havard: 'S. Deppe, A. Dicks, V. Lohweg, Anomaly Detection on ATMs via Time Series
    Motif Discovery, in: 21th IEEE International Conference on Emerging Technologies
    and Factory Automation (ETFA 2016), Berlin, , 2016.'
  ieee: S. Deppe, A. Dicks, and V. Lohweg, “Anomaly Detection on ATMs via Time Series
    Motif Discovery,” in <i>21th IEEE International Conference on Emerging Technologies
    and Factory Automation (ETFA 2016), Berlin, </i>, 2016.
  mla: Deppe, Sahar, et al. “Anomaly Detection on ATMs via Time Series Motif Discovery.”
    <i>21th IEEE International Conference on Emerging Technologies and Factory Automation
    (ETFA 2016), Berlin, </i>, 2016.
  short: 'S. Deppe, A. Dicks, V. Lohweg, in: 21th IEEE International Conference on
    Emerging Technologies and Factory Automation (ETFA 2016), Berlin, , 2016.'
  ufg: '<b>Deppe, Sahar et. al. (2016)</b>: Anomaly Detection on ATMs via Time Series
    Motif Discovery, in: <i>21th IEEE International Conference on Emerging Technologies
    and Factory Automation (ETFA 2016), Berlin, </i>.'
  van: 'Deppe S, Dicks A, Lohweg V. Anomaly Detection on ATMs via Time Series Motif
    Discovery. In: 21th IEEE International Conference on Emerging Technologies and
    Factory Automation (ETFA 2016), Berlin, . 2016.'
date_created: 2019-11-26T14:43:11Z
date_updated: 2023-03-15T13:49:38Z
department:
- _id: DEP5023
language:
- iso: eng
publication: '21th IEEE International Conference on Emerging Technologies and Factory
  Automation (ETFA 2016), Berlin, '
status: public
title: Anomaly Detection on ATMs via Time Series Motif Discovery
type: conference
user_id: '74004'
year: 2016
...
---
_id: '2123'
abstract:
- lang: eng
  text: "The means of data mining and machine learning tasks are important topics
    in signal processing fundamentals. An example of such tasks is motif discovery.
    This paper presents an efficient method for shift-invariant feature\r\nextraction
    in time-series motif discovery. The proposed method initiates from the machine
    learning procedure and tackles the drawbacks of existing methods. Moreover, the
    efficacy of the novel approach is benchmarked\r\nagainst various algorithms and
    data from diverse fields.\r\n"
author:
- first_name: Sahar
  full_name: Deppe, Sahar
  id: '52121'
  last_name: Deppe
- first_name: Volker
  full_name: Lohweg, Volker
  id: '1804'
  last_name: Lohweg
  orcid: 0000-0002-3325-7887
citation:
  ama: 'Deppe S, Lohweg V. Shift-Invariant Feature Extraction for Time-Series Motif
    Discovery. In: <i>25. Workshop Computational Intelligence VDI/VDE-Gesellschaft
    Mess- Und Automatisierungstechnik (GMA)</i>. Dortmund; 2015:23-45. doi:<a href="https://doi.org/10.5445/KSP/1000049620">10.5445/KSP/1000049620</a>'
  apa: Deppe, S., &#38; Lohweg, V. (2015). Shift-Invariant Feature Extraction for
    Time-Series Motif Discovery. In <i>25. Workshop Computational Intelligence VDI/VDE-Gesellschaft
    Mess- und Automatisierungstechnik (GMA)</i> (pp. 23–45). Dortmund. <a href="https://doi.org/10.5445/KSP/1000049620">https://doi.org/10.5445/KSP/1000049620</a>
  bjps: <b>Deppe S and Lohweg V</b> (2015) Shift-Invariant Feature Extraction for
    Time-Series Motif Discovery. <i>25. Workshop Computational Intelligence VDI/VDE-Gesellschaft
    Mess- Und Automatisierungstechnik (GMA)</i>. Dortmund, pp. 23–45.
  chicago: Deppe, Sahar, and Volker Lohweg. “Shift-Invariant Feature Extraction for
    Time-Series Motif Discovery.” In <i>25. Workshop Computational Intelligence VDI/VDE-Gesellschaft
    Mess- Und Automatisierungstechnik (GMA)</i>, 23–45. Dortmund, 2015. <a href="https://doi.org/10.5445/KSP/1000049620">https://doi.org/10.5445/KSP/1000049620</a>.
  chicago-de: 'Deppe, Sahar und Volker Lohweg. 2015. Shift-Invariant Feature Extraction
    for Time-Series Motif Discovery. In: <i>25. Workshop Computational Intelligence
    VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA)</i>, 23–45. Dortmund.
    doi:<a href="https://doi.org/10.5445/KSP/1000049620,">10.5445/KSP/1000049620,</a>
    .'
  din1505-2-1: '<span style="font-variant:small-caps;">Deppe, Sahar</span> ; <span
    style="font-variant:small-caps;">Lohweg, Volker</span>: Shift-Invariant Feature
    Extraction for Time-Series Motif Discovery. In: <i>25. Workshop Computational
    Intelligence VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA)</i>.
    Dortmund, 2015, S. 23–45'
  havard: 'S. Deppe, V. Lohweg, Shift-Invariant Feature Extraction for Time-Series
    Motif Discovery, in: 25. Workshop Computational Intelligence VDI/VDE-Gesellschaft
    Mess- Und Automatisierungstechnik (GMA), Dortmund, 2015: pp. 23–45.'
  ieee: S. Deppe and V. Lohweg, “Shift-Invariant Feature Extraction for Time-Series
    Motif Discovery,” in <i>25. Workshop Computational Intelligence VDI/VDE-Gesellschaft
    Mess- und Automatisierungstechnik (GMA)</i>, 2015, pp. 23–45.
  mla: Deppe, Sahar, and Volker Lohweg. “Shift-Invariant Feature Extraction for Time-Series
    Motif Discovery.” <i>25. Workshop Computational Intelligence VDI/VDE-Gesellschaft
    Mess- Und Automatisierungstechnik (GMA)</i>, 2015, pp. 23–45, doi:<a href="https://doi.org/10.5445/KSP/1000049620">10.5445/KSP/1000049620</a>.
  short: 'S. Deppe, V. Lohweg, in: 25. Workshop Computational Intelligence VDI/VDE-Gesellschaft
    Mess- Und Automatisierungstechnik (GMA), Dortmund, 2015, pp. 23–45.'
  ufg: '<b>Deppe, Sahar/Lohweg, Volker (2015)</b>: Shift-Invariant Feature Extraction
    for Time-Series Motif Discovery, in: <i>25. Workshop Computational Intelligence
    VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA)</i>, Dortmund, S.
    23–45.'
  van: 'Deppe S, Lohweg V. Shift-Invariant Feature Extraction for Time-Series Motif
    Discovery. In: 25 Workshop Computational Intelligence VDI/VDE-Gesellschaft Mess-
    und Automatisierungstechnik (GMA). Dortmund; 2015. p. 23–45.'
date_created: 2019-12-03T13:49:19Z
date_updated: 2023-03-15T13:49:38Z
department:
- _id: DEP5023
doi: 10.5445/KSP/1000049620
language:
- iso: eng
main_file_link:
- open_access: '1'
  url: https://publikationen.bibliothek.kit.edu/1000049620
oa: '1'
page: 23-45
place: Dortmund
publication: 25. Workshop Computational Intelligence VDI/VDE-Gesellschaft Mess- und
  Automatisierungstechnik (GMA)
status: public
title: Shift-Invariant Feature Extraction for Time-Series Motif Discovery
type: conference
user_id: '68554'
year: 2015
...
---
_id: '2124'
abstract:
- lang: ger
  text: Patente schützen das geistige Eigentum von Erfindern und verhindern, dass
    ihre neuen Ideen kopiert werden. Sie sind von großer Bedeutung für den wirtschaftlichen
    Erfolg eines Unternehmens. Vor einer geplanten Patentanmeldung ist es wichtig
    festzustellen, ob eine bestimmte Technik bereits patentiert ist und wie die Erfolgsaussichten
    beurteilt werden können. Aber auch die Identifizierung von Verstößen gegen eigene
    Patentanmeldungen ist für ein Unternehmen von äußerster Wichtigkeit. Verschiedene
    Techniken und Tools sind entwickelt worden, um Patentanalyse-Experten, Managern
    und Technologieämtern bei den unterschiedlichsten Anforderungen im Bezug auf eine
    Patentrecherche zu unterstützen.
author:
- first_name: Martyna
  full_name: Bator, Martyna
  id: '46440'
  last_name: Bator
- first_name: Sahar
  full_name: Deppe, Sahar
  id: '52121'
  last_name: Deppe
- first_name: Volker
  full_name: Lohweg, Volker
  id: '1804'
  last_name: Lohweg
  orcid: 0000-0002-3325-7887
citation:
  ama: 'Bator M, Deppe S, Lohweg V. Relevanzbewertung technischer Informationen mittels
    Data-Mining Verfahren am Anwendungsfall von Patentdokumenten. In: <i>25. Workshop
    Computational Intelligence VDI/VDE-Gesellschaft Mess- Und Automatisierungstechnik
    (GMA)</i>. Dortmund; 2015.'
  apa: Bator, M., Deppe, S., &#38; Lohweg, V. (2015). Relevanzbewertung technischer
    Informationen mittels Data-Mining Verfahren am Anwendungsfall von Patentdokumenten.
    In <i>25. Workshop Computational Intelligence VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik
    (GMA)</i>. Dortmund.
  bjps: <b>Bator M, Deppe S and Lohweg V</b> (2015) Relevanzbewertung Technischer
    Informationen Mittels Data-Mining Verfahren Am Anwendungsfall von Patentdokumenten.
    <i>25. Workshop Computational Intelligence VDI/VDE-Gesellschaft Mess- Und Automatisierungstechnik
    (GMA)</i>. Dortmund.
  chicago: Bator, Martyna, Sahar Deppe, and Volker Lohweg. “Relevanzbewertung Technischer
    Informationen Mittels Data-Mining Verfahren Am Anwendungsfall von Patentdokumenten.”
    In <i>25. Workshop Computational Intelligence VDI/VDE-Gesellschaft Mess- Und Automatisierungstechnik
    (GMA)</i>. Dortmund, 2015.
  chicago-de: 'Bator, Martyna, Sahar Deppe und Volker Lohweg. 2015. Relevanzbewertung
    technischer Informationen mittels Data-Mining Verfahren am Anwendungsfall von
    Patentdokumenten. In: <i>25. Workshop Computational Intelligence VDI/VDE-Gesellschaft
    Mess- und Automatisierungstechnik (GMA)</i>. Dortmund.'
  din1505-2-1: '<span style="font-variant:small-caps;">Bator, Martyna</span> ; <span
    style="font-variant:small-caps;">Deppe, Sahar</span> ; <span style="font-variant:small-caps;">Lohweg,
    Volker</span>: Relevanzbewertung technischer Informationen mittels Data-Mining
    Verfahren am Anwendungsfall von Patentdokumenten. In: <i>25. Workshop Computational
    Intelligence VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA)</i>.
    Dortmund, 2015'
  havard: 'M. Bator, S. Deppe, V. Lohweg, Relevanzbewertung technischer Informationen
    mittels Data-Mining Verfahren am Anwendungsfall von Patentdokumenten, in: 25.
    Workshop Computational Intelligence VDI/VDE-Gesellschaft Mess- Und Automatisierungstechnik
    (GMA), Dortmund, 2015.'
  ieee: M. Bator, S. Deppe, and V. Lohweg, “Relevanzbewertung technischer Informationen
    mittels Data-Mining Verfahren am Anwendungsfall von Patentdokumenten,” in <i>25.
    Workshop Computational Intelligence VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik
    (GMA)</i>, 2015.
  mla: Bator, Martyna, et al. “Relevanzbewertung Technischer Informationen Mittels
    Data-Mining Verfahren Am Anwendungsfall von Patentdokumenten.” <i>25. Workshop
    Computational Intelligence VDI/VDE-Gesellschaft Mess- Und Automatisierungstechnik
    (GMA)</i>, 2015.
  short: 'M. Bator, S. Deppe, V. Lohweg, in: 25. Workshop Computational Intelligence
    VDI/VDE-Gesellschaft Mess- Und Automatisierungstechnik (GMA), Dortmund, 2015.'
  ufg: '<b>Bator, Martyna et. al. (2015)</b>: Relevanzbewertung technischer Informationen
    mittels Data-Mining Verfahren am Anwendungsfall von Patentdokumenten, in: <i>25.
    Workshop Computational Intelligence VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik
    (GMA)</i>, Dortmund.'
  van: 'Bator M, Deppe S, Lohweg V. Relevanzbewertung technischer Informationen mittels
    Data-Mining Verfahren am Anwendungsfall von Patentdokumenten. In: 25 Workshop
    Computational Intelligence VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik
    (GMA). Dortmund; 2015.'
date_created: 2019-12-03T13:59:40Z
date_updated: 2023-03-15T13:49:38Z
department:
- _id: DEP5023
language:
- iso: eng
main_file_link:
- open_access: '1'
  url: https://www.researchgate.net/publication/281933251_Relevanzbewertung_technischer_Informationen_mittels_Data-Mining_Verfahren_am_Anwendungsfall_von_Patentdokumenten
oa: '1'
place: Dortmund
publication: 25. Workshop Computational Intelligence VDI/VDE-Gesellschaft Mess- und
  Automatisierungstechnik (GMA)
status: public
title: Relevanzbewertung technischer Informationen mittels Data-Mining Verfahren am
  Anwendungsfall von Patentdokumenten
type: conference
user_id: '68554'
year: 2015
...
---
_id: '2125'
author:
- first_name: Sahar
  full_name: Deppe, Sahar
  id: '52121'
  last_name: Deppe
- first_name: Helene
  full_name: Dörksen, Helene
  id: '46416'
  last_name: Dörksen
- first_name: Volker
  full_name: Lohweg, Volker
  id: '1804'
  last_name: Lohweg
  orcid: 0000-0002-3325-7887
citation:
  ama: 'Deppe S, Dörksen H, Lohweg V. Multi-Scale Motif Discovery in Image Processing.
    In: <i>Workshop on Probabilistic Graphical Models</i>. Heidelberg, Germany; 2015.'
  apa: Deppe, S., Dörksen, H., &#38; Lohweg, V. (2015). Multi-Scale Motif Discovery
    in Image Processing. In <i>Workshop on Probabilistic Graphical Models</i>. Heidelberg,
    Germany.
  bjps: <b>Deppe S, Dörksen H and Lohweg V</b> (2015) Multi-Scale Motif Discovery
    in Image Processing. <i>Workshop on Probabilistic Graphical Models</i>. Heidelberg,
    Germany.
  chicago: Deppe, Sahar, Helene Dörksen, and Volker Lohweg. “Multi-Scale Motif Discovery
    in Image Processing.” In <i>Workshop on Probabilistic Graphical Models</i>. Heidelberg,
    Germany, 2015.
  chicago-de: 'Deppe, Sahar, Helene Dörksen und Volker Lohweg. 2015. Multi-Scale Motif
    Discovery in Image Processing. In: <i>Workshop on Probabilistic Graphical Models</i>.
    Heidelberg, Germany.'
  din1505-2-1: '<span style="font-variant:small-caps;">Deppe, Sahar</span> ; <span
    style="font-variant:small-caps;">Dörksen, Helene</span> ; <span style="font-variant:small-caps;">Lohweg,
    Volker</span>: Multi-Scale Motif Discovery in Image Processing. In: <i>Workshop
    on Probabilistic Graphical Models</i>. Heidelberg, Germany, 2015'
  havard: 'S. Deppe, H. Dörksen, V. Lohweg, Multi-Scale Motif Discovery in Image Processing,
    in: Workshop on Probabilistic Graphical Models, Heidelberg, Germany, 2015.'
  ieee: S. Deppe, H. Dörksen, and V. Lohweg, “Multi-Scale Motif Discovery in Image
    Processing,” in <i>Workshop on Probabilistic Graphical Models</i>, 2015.
  mla: Deppe, Sahar, et al. “Multi-Scale Motif Discovery in Image Processing.” <i>Workshop
    on Probabilistic Graphical Models</i>, 2015.
  short: 'S. Deppe, H. Dörksen, V. Lohweg, in: Workshop on Probabilistic Graphical
    Models, Heidelberg, Germany, 2015.'
  ufg: '<b>Deppe, Sahar et. al. (2015)</b>: Multi-Scale Motif Discovery in Image Processing,
    in: <i>Workshop on Probabilistic Graphical Models</i>, Heidelberg, Germany.'
  van: 'Deppe S, Dörksen H, Lohweg V. Multi-Scale Motif Discovery in Image Processing.
    In: Workshop on Probabilistic Graphical Models. Heidelberg, Germany; 2015.'
date_created: 2019-12-03T14:02:21Z
date_updated: 2023-03-15T13:49:38Z
department:
- _id: DEP5023
language:
- iso: eng
main_file_link:
- open_access: '1'
  url: https://www.researchgate.net/publication/283481666_Multi-Scale_Motif_Discovery_in_Image_Processing
oa: '1'
place: Heidelberg, Germany
publication: Workshop on Probabilistic Graphical Models
status: public
title: Multi-Scale Motif Discovery in Image Processing
type: conference_abstract
user_id: '68554'
year: 2015
...
---
_id: '2165'
author:
- first_name: Sahar
  full_name: Deppe, Sahar
  id: '52121'
  last_name: Deppe
- first_name: Volker
  full_name: Lohweg, Volker
  id: '1804'
  last_name: Lohweg
  orcid: 0000-0002-3325-7887
citation:
  ama: 'Deppe S, Lohweg V. Identification of Multi-Scale Motifs. In: <i>24. Workshop
    Computational Intelligence</i>. Dortmund: VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik
    (GMA); 2014:277-298.'
  apa: 'Deppe, S., &#38; Lohweg, V. (2014). Identification of Multi-Scale Motifs.
    In <i>24. Workshop Computational Intelligence</i> (pp. 277–298). Dortmund: VDI/VDE-Gesellschaft
    Mess- und Automatisierungstechnik (GMA).'
  bjps: '<b>Deppe S and Lohweg V</b> (2014) Identification of Multi-Scale Motifs.
    <i>24. Workshop Computational Intelligence</i>. Dortmund: VDI/VDE-Gesellschaft
    Mess- und Automatisierungstechnik (GMA), pp. 277–298.'
  chicago: 'Deppe, Sahar, and Volker Lohweg. “Identification of Multi-Scale Motifs.”
    In <i>24. Workshop Computational Intelligence</i>, 277–98. Dortmund: VDI/VDE-Gesellschaft
    Mess- und Automatisierungstechnik (GMA), 2014.'
  chicago-de: 'Deppe, Sahar und Volker Lohweg. 2014. Identification of Multi-Scale
    Motifs. In: <i>24. Workshop Computational Intelligence</i>, 277–298. Dortmund:
    VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA).'
  din1505-2-1: '<span style="font-variant:small-caps;">Deppe, Sahar</span> ; <span
    style="font-variant:small-caps;">Lohweg, Volker</span>: Identification of Multi-Scale
    Motifs. In: <i>24. Workshop Computational Intelligence</i>. Dortmund : VDI/VDE-Gesellschaft
    Mess- und Automatisierungstechnik (GMA), 2014, S. 277–298'
  havard: 'S. Deppe, V. Lohweg, Identification of Multi-Scale Motifs, in: 24. Workshop
    Computational Intelligence, VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik
    (GMA), Dortmund, 2014: pp. 277–298.'
  ieee: S. Deppe and V. Lohweg, “Identification of Multi-Scale Motifs,” in <i>24.
    Workshop Computational Intelligence</i>, 2014, pp. 277–298.
  mla: Deppe, Sahar, and Volker Lohweg. “Identification of Multi-Scale Motifs.” <i>24.
    Workshop Computational Intelligence</i>, VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik
    (GMA), 2014, pp. 277–98.
  short: 'S. Deppe, V. Lohweg, in: 24. Workshop Computational Intelligence, VDI/VDE-Gesellschaft
    Mess- und Automatisierungstechnik (GMA), Dortmund, 2014, pp. 277–298.'
  ufg: '<b>Deppe, Sahar/Lohweg, Volker (2014)</b>: Identification of Multi-Scale Motifs,
    in: <i>24. Workshop Computational Intelligence</i>, Dortmund, S. 277–298.'
  van: 'Deppe S, Lohweg V. Identification of Multi-Scale Motifs. In: 24 Workshop Computational
    Intelligence. Dortmund: VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik
    (GMA); 2014. p. 277–98.'
date_created: 2019-12-04T10:25:35Z
date_updated: 2023-03-15T13:49:39Z
department:
- _id: DEP5023
language:
- iso: eng
main_file_link:
- open_access: '1'
  url: https://publikationen.bibliothek.kit.edu/1000043427/3301103
oa: '1'
page: 277-298
place: Dortmund
publication: 24. Workshop Computational Intelligence
publication_identifier:
  isbn:
  - 978-3-7315-0275-3
publication_status: published
publisher: VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik (GMA)
status: public
title: Identification of Multi-Scale Motifs
type: conference
user_id: '45673'
year: 2014
...
