[{"language":[{"iso":"eng"}],"place":"San Francisco, USA.","_id":"1991","date_updated":"2024-05-17T13:23:21Z","user_id":"83781","type":"conference","date_created":"2019-11-22T12:51:11Z","publication":"ODS 2020 Review","status":"public","conference":{"location":"San Francisco","end_date":"2020-01-31","start_date":"2020-01-29"},"department":[{"_id":"DEP5023"},{"_id":"DEP4027"}],"main_file_link":[{"url":"https://opticaldigitalsecurity.com/downloads"}],"year":"2020","author":[{"full_name":"Funk, Mark","first_name":"Mark","id":"52473","last_name":"Funk"},{"id":"65179","first_name":"Matthias","last_name":"Scharf","full_name":"Scharf, Matthias"},{"id":"46416","first_name":"Helene","last_name":"Dörksen","full_name":"Dörksen, Helene"},{"last_name":"Danneel","full_name":"Danneel, Hans-Jürgen","id":"12231","first_name":"Hans-Jürgen"},{"full_name":"Lohweg, Volker","last_name":"Lohweg","id":"1804","first_name":"Volker","orcid":"0000-0002-3325-7887"},{"full_name":"Hübner, Michael","first_name":"Michael","last_name":"Hübner"},{"last_name":"Schaede","first_name":"Johannes","full_name":"Schaede, Johannes","id":"2128"},{"full_name":"Stierman, Rob","last_name":"Stierman","first_name":"Rob"},{"first_name":"Alexander","full_name":"Knobloch, Alexander","last_name":"Knobloch"},{"first_name":"Dinh Khoi","last_name":"Le","full_name":"Le, Dinh Khoi"},{"full_name":"Gillich, Eugen","last_name":"Gillich","first_name":"Eugen","id":"1706"},{"last_name":"Mönks","first_name":"Uwe","full_name":"Mönks, Uwe","id":"1825"}],"publication_status":"published","citation":{"mla":"Funk, Mark, et al. “Creating a Self-Authentication System for Smart Banknotes.” <i>ODS 2020 Review</i>, 2020.","havard":"M. Funk, M. Scharf, H. Dörksen, H.-J. Danneel, V. Lohweg, M. Hübner, J. Schaede, R. Stierman, A. Knobloch, D.K. Le, E. Gillich, U. Mönks, Creating a Self-authentication System for Smart Banknotes, in: ODS 2020 Review, San Francisco, USA., 2020.","bjps":"<b>Funk M <i>et al.</i></b> (2020) Creating a Self-Authentication System for Smart Banknotes. <i>ODS 2020 Review</i>. San Francisco, USA.","ufg":"<b>Funk, Mark u. a.</b>: Creating a Self-authentication System for Smart Banknotes, in: o. Hg.: ODS 2020 Review, San Francisco, USA. 2020.","van":"Funk M, Scharf M, Dörksen H, Danneel HJ, Lohweg V, Hübner M, et al. Creating a Self-authentication System for Smart Banknotes. In: ODS 2020 Review. San Francisco, USA.; 2020.","chicago":"Funk, Mark, Matthias Scharf, Helene Dörksen, Hans-Jürgen Danneel, Volker Lohweg, Michael Hübner, Johannes Schaede, et al. “Creating a Self-Authentication System for Smart Banknotes.” In <i>ODS 2020 Review</i>. San Francisco, USA., 2020.","apa":"Funk, M., Scharf, M., Dörksen, H., Danneel, H.-J., Lohweg, V., Hübner, M., Schaede, J., Stierman, R., Knobloch, A., Le, D. K., Gillich, E., &#38; Mönks, U. (2020). Creating a Self-authentication System for Smart Banknotes. <i>ODS 2020 Review</i>.","chicago-de":"Funk, Mark, Matthias Scharf, Helene Dörksen, Hans-Jürgen Danneel, Volker Lohweg, Michael Hübner, Johannes Schaede, u. a. 2020. Creating a Self-authentication System for Smart Banknotes. In: <i>ODS 2020 Review</i>. San Francisco, USA.","din1505-2-1":"<span style=\"font-variant:small-caps;\"><span style=\"font-variant:small-caps;\">Funk, Mark</span> ; <span style=\"font-variant:small-caps;\">Scharf, Matthias</span> ; <span style=\"font-variant:small-caps;\">Dörksen, Helene</span> ; <span style=\"font-variant:small-caps;\">Danneel, Hans-Jürgen</span> ; <span style=\"font-variant:small-caps;\">Lohweg, Volker</span> ; <span style=\"font-variant:small-caps;\">Hübner, Michael</span> ; <span style=\"font-variant:small-caps;\">Schaede, Johannes</span> ; <span style=\"font-variant:small-caps;\">Stierman, Rob</span> ; u. a.</span>: Creating a Self-authentication System for Smart Banknotes. In: <i>ODS 2020 Review</i>. San Francisco, USA., 2020","short":"M. Funk, M. Scharf, H. Dörksen, H.-J. Danneel, V. Lohweg, M. Hübner, J. Schaede, R. Stierman, A. Knobloch, D.K. Le, E. Gillich, U. Mönks, in: ODS 2020 Review, San Francisco, USA., 2020.","ama":"Funk M, Scharf M, Dörksen H, et al. Creating a Self-authentication System for Smart Banknotes. In: <i>ODS 2020 Review</i>. ; 2020.","ieee":"M. Funk <i>et al.</i>, “Creating a Self-authentication System for Smart Banknotes,” San Francisco, 2020."},"title":"Creating a Self-authentication System for Smart Banknotes"},{"publication":"Optical Document Security - The Conference on Optical Security and Counterfeit Detection XII San Francisco","type":"conference","date_created":"2019-11-25T08:35:52Z","user_id":"83781","date_updated":"2024-05-17T13:04:57Z","_id":"2011","place":" CA, USA","language":[{"iso":"eng"}],"title":"smartBN—Intelligent Protection and Authentication in Payment Transactions by Smart Banknotes","citation":{"ama":"Lohweg V, Funk M, Scharf M, et al. smartBN—Intelligent Protection and Authentication in Payment Transactions by Smart Banknotes. In: <i>Optical Document Security - The Conference on Optical Security and Counterfeit Detection XII San Francisco</i>.","ieee":"V. Lohweg <i>et al.</i>, “smartBN—Intelligent Protection and Authentication in Payment Transactions by Smart Banknotes,” presented at the XII. Optical Document Security (ODS)Conference, San Francisco, USA.","van":"Lohweg V, Funk M, Scharf M, Dörksen H, Danneel HJ, Hübner M, et al. smartBN—Intelligent Protection and Authentication in Payment Transactions by Smart Banknotes. In: Optical Document Security - The Conference on Optical Security and Counterfeit Detection XII San Francisco.  CA, USA;","ufg":"<b>Lohweg, Volker u. a.</b>: smartBN—Intelligent Protection and Authentication in Payment Transactions by Smart Banknotes, in: o. Hg.: Optical Document Security - The Conference on Optical Security and Counterfeit Detection XII San Francisco,  CA, USA o. J.","mla":"Lohweg, Volker, et al. “SmartBN—Intelligent Protection and Authentication in Payment Transactions by Smart Banknotes.” <i>Optical Document Security - The Conference on Optical Security and Counterfeit Detection XII San Francisco</i>.","havard":"V. Lohweg, M. Funk, M. Scharf, H. Dörksen, H.-J. Danneel, M. Hübner, J. Schaede, E. Thony, A. Knobloch, D.K. Lee, U. Mönks, E. Gillich, smartBN—Intelligent Protection and Authentication in Payment Transactions by Smart Banknotes, in: Optical Document Security - The Conference on Optical Security and Counterfeit Detection XII San Francisco,  CA, USA, n.d.","bjps":"<b>Lohweg V <i>et al.</i></b> (n.d.) SmartBN—Intelligent Protection and Authentication in Payment Transactions by Smart Banknotes. <i>Optical Document Security - The Conference on Optical Security and Counterfeit Detection XII San Francisco</i>.  CA, USA.","apa":"Lohweg, V., Funk, M., Scharf, M., Dörksen, H., Danneel, H.-J., Hübner, M., Schaede, J., Thony, E., Knobloch, A., Lee, D. K., Mönks, U., &#38; Gillich, E. (n.d.). smartBN—Intelligent Protection and Authentication in Payment Transactions by Smart Banknotes. <i>Optical Document Security - The Conference on Optical Security and Counterfeit Detection XII San Francisco</i>. XII. Optical Document Security (ODS)Conference, San Francisco, USA.","chicago":"Lohweg, Volker, Mark Funk, Matthias Scharf, Helene Dörksen, Hans-Jürgen Danneel, Michael Hübner, Johannes Schaede, et al. “SmartBN—Intelligent Protection and Authentication in Payment Transactions by Smart Banknotes.” In <i>Optical Document Security - The Conference on Optical Security and Counterfeit Detection XII San Francisco</i>.  CA, USA, n.d.","short":"V. Lohweg, M. Funk, M. Scharf, H. Dörksen, H.-J. Danneel, M. Hübner, J. Schaede, E. Thony, A. Knobloch, D.K. Lee, U. Mönks, E. Gillich, in: Optical Document Security - The Conference on Optical Security and Counterfeit Detection XII San Francisco,  CA, USA, n.d.","din1505-2-1":"<span style=\"font-variant:small-caps;\"><span style=\"font-variant:small-caps;\">Lohweg, Volker</span> ; <span style=\"font-variant:small-caps;\">Funk, Mark</span> ; <span style=\"font-variant:small-caps;\">Scharf, Matthias</span> ; <span style=\"font-variant:small-caps;\">Dörksen, Helene</span> ; <span style=\"font-variant:small-caps;\">Danneel, Hans-Jürgen</span> ; <span style=\"font-variant:small-caps;\">Hübner, Michael</span> ; <span style=\"font-variant:small-caps;\">Schaede, Johannes</span> ; <span style=\"font-variant:small-caps;\">Thony, Emmanuel</span> ; u. a.</span>: smartBN—Intelligent Protection and Authentication in Payment Transactions by Smart Banknotes. In: <i>Optical Document Security - The Conference on Optical Security and Counterfeit Detection XII San Francisco</i>.  CA, USA","chicago-de":"Lohweg, Volker, Mark Funk, Matthias Scharf, Helene Dörksen, Hans-Jürgen Danneel, Michael Hübner, Johannes Schaede, u. a. smartBN—Intelligent Protection and Authentication in Payment Transactions by Smart Banknotes. In: <i>Optical Document Security - The Conference on Optical Security and Counterfeit Detection XII San Francisco</i>.  CA, USA."},"publication_status":"submitted","author":[{"orcid":"0000-0002-3325-7887","first_name":"Volker","full_name":"Lohweg, Volker","id":"1804","last_name":"Lohweg"},{"full_name":"Funk, Mark","id":"52473","last_name":"Funk","first_name":"Mark"},{"last_name":"Scharf","first_name":"Matthias","id":"65179","full_name":"Scharf, Matthias"},{"last_name":"Dörksen","id":"46416","full_name":"Dörksen, Helene","first_name":"Helene"},{"last_name":"Danneel","first_name":"Hans-Jürgen","id":"12231","full_name":"Danneel, Hans-Jürgen"},{"first_name":"Michael","last_name":"Hübner","full_name":"Hübner, Michael"},{"first_name":"Johannes","id":"2128","full_name":"Schaede, Johannes","last_name":"Schaede"},{"full_name":"Thony, Emmanuel","first_name":"Emmanuel","last_name":"Thony"},{"last_name":"Knobloch","full_name":"Knobloch, Alexander","first_name":"Alexander"},{"first_name":"Dinh Khoi","last_name":"Lee","full_name":"Lee, Dinh Khoi"},{"last_name":"Mönks","full_name":"Mönks, Uwe","id":"1825","first_name":"Uwe"},{"last_name":"Gillich","first_name":"Eugen","full_name":"Gillich, Eugen","id":"1706"}],"year":"2018","department":[{"_id":"DEP5023"},{"_id":"DEP4027"}],"conference":{"location":"San Francisco, USA","name":"XII. Optical Document Security (ODS)Conference","start_date":"2018-01-29","end_date":"2018-01-31"},"status":"public"},{"date_created":"2019-11-26T14:43:19Z","type":"conference","publication":"Optical Document Security - The Conference on Optical Security and Counterfeit Detection V","date_updated":"2023-03-15T13:49:38Z","user_id":"74004","language":[{"iso":"eng"}],"place":"San Francisco, CA, USA ","_id":"2039","title":"Intaglio Quality Measurement","citation":{"din1505-2-1":"<span style=\"font-variant:small-caps;\">Funk, Mark</span> ; <span style=\"font-variant:small-caps;\">Gillich, Eugen</span> ; <span style=\"font-variant:small-caps;\">Türke, Thomas</span> ; <span style=\"font-variant:small-caps;\">Lohweg, Volker</span>: Intaglio Quality Measurement. In: <i>Optical Document Security - The Conference on Optical Security and Counterfeit Detection V</i>. San Francisco, CA, USA , 2016","chicago-de":"Funk, Mark, Eugen Gillich, Thomas Türke und Volker Lohweg. 2016. Intaglio Quality Measurement. In: <i>Optical Document Security - The Conference on Optical Security and Counterfeit Detection V</i>. San Francisco, CA, USA .","short":"M. Funk, E. Gillich, T. Türke, V. Lohweg, in: Optical Document Security - The Conference on Optical Security and Counterfeit Detection V, San Francisco, CA, USA , 2016.","mla":"Funk, Mark, et al. “Intaglio Quality Measurement.” <i>Optical Document Security - The Conference on Optical Security and Counterfeit Detection V</i>, 2016.","havard":"M. Funk, E. Gillich, T. Türke, V. Lohweg, Intaglio Quality Measurement, in: Optical Document Security - The Conference on Optical Security and Counterfeit Detection V, San Francisco, CA, USA , 2016.","bjps":"<b>Funk M <i>et al.</i></b> (2016) Intaglio Quality Measurement. <i>Optical Document Security - The Conference on Optical Security and Counterfeit Detection V</i>. San Francisco, CA, USA .","ufg":"<b>Funk, Mark et. al. (2016)</b>: Intaglio Quality Measurement, in: <i>Optical Document Security - The Conference on Optical Security and Counterfeit Detection V</i>, San Francisco, CA, USA .","ama":"Funk M, Gillich E, Türke T, Lohweg V. Intaglio Quality Measurement. In: <i>Optical Document Security - The Conference on Optical Security and Counterfeit Detection V</i>. San Francisco, CA, USA ; 2016.","van":"Funk M, Gillich E, Türke T, Lohweg V. Intaglio Quality Measurement. In: Optical Document Security - The Conference on Optical Security and Counterfeit Detection V. San Francisco, CA, USA ; 2016.","chicago":"Funk, Mark, Eugen Gillich, Thomas Türke, and Volker Lohweg. “Intaglio Quality Measurement.” In <i>Optical Document Security - The Conference on Optical Security and Counterfeit Detection V</i>. San Francisco, CA, USA , 2016.","ieee":"M. Funk, E. Gillich, T. Türke, and V. Lohweg, “Intaglio Quality Measurement,” in <i>Optical Document Security - The Conference on Optical Security and Counterfeit Detection V</i>, 2016.","apa":"Funk, M., Gillich, E., Türke, T., &#38; Lohweg, V. (2016). Intaglio Quality Measurement. In <i>Optical Document Security - The Conference on Optical Security and Counterfeit Detection V</i>. San Francisco, CA, USA ."},"department":[{"_id":"DEP5023"}],"year":2016,"author":[{"first_name":"Mark","last_name":"Funk","full_name":"Funk, Mark","id":"52473"},{"id":"1706","last_name":"Gillich","full_name":"Gillich, Eugen","first_name":"Eugen"},{"last_name":"Türke","first_name":"Thomas","full_name":"Türke, Thomas"},{"orcid":"0000-0002-3325-7887","first_name":"Volker","id":"1804","last_name":"Lohweg","full_name":"Lohweg, Volker"}],"abstract":[{"text":"In this paper an advanced approach for Intaglio quality control is presented.  In the first step, the essential informationabout the printing process, research objects and measurement setup is provided.  Following, the mathematical approachbased on image processing methods is described which imitates the printers manner to examine the optical characteristicsof Intaglio prints.  The main focus is the early recognition of tending quality deviations to be able to support the printerthrough recommendations on readjustments of the machine settings.  Therefore, specific key values are generated whichdescribe the prints overall quality, regarding its optical characteristics and the occurrence of printing flaws.  The resultsshown at the end encourage extended developments.","lang":"eng"}],"status":"public"}]