[{"_id":"11167","abstract":[{"lang":"eng","text":"Integrity as one property of trustworthiness is an important aspect for the adoption of the Asset Administration Shell (AAS) as a data exchange format and source for data driven services. Until now, the AAS offers an access control solution as a preventive integrity measure. Nevertheless, preventive methods lack in detecting integrity violations due to accidental or malicious modifications from access permitted endpoints. This work in progress paper proposes a concept to complement the access control with a detective integrity measure. By signing submodels of the AAS, business partners along the life cycle can verify the integrity of the data inside the AAS. Therefore, a Certificates Submodel and a Signature Submodel are proposed in the concept to enable a flexible and interoperable integrity verification. In future work, the concept will be implemented and evaluated."}],"page":"1-4","conference":{"name":"27th International Conference on Emerging Technologies and Factory Automation (ETFA)","end_date":"2022-09-09","start_date":"2022-09-06","location":" Stuttgart"},"year":"2022","user_id":"83781","department":[{"_id":"DEP5023"}],"status":"public","publication":"2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA)","doi":"10.1109/ETFA52439.2022.9921521","date_updated":"2024-03-05T14:03:56Z","title":"Towards an Asset Administration Shell Integrity Verification Scheme","author":[{"id":"63800","last_name":"Bröring","full_name":"Bröring, Andre","first_name":"Andre"},{"first_name":"Marco","full_name":"Ehrlich, Marco","id":"61562","last_name":"Ehrlich"},{"first_name":"Lukasz","full_name":"Wisniewski, Lukasz","last_name":"Wisniewski","id":"1710"},{"orcid":"0000-0002-0133-0656","first_name":"Henning","id":"1486","last_name":"Trsek","full_name":"Trsek, Henning"},{"last_name":"Heiss","id":"1031","full_name":"Heiss, Stefan","first_name":"Stefan"}],"type":"conference","publication_identifier":{"isbn":[" 9781665499965 "]},"place":"Piscataway, NJ","citation":{"ufg":"<b>Bröring, Andre u. a.</b>: Towards an Asset Administration Shell Integrity Verification Scheme, in: o. Hg.: 2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA), Piscataway, NJ 2022,  S. 1–4.","chicago":"Bröring, Andre, Marco Ehrlich, Lukasz Wisniewski, Henning Trsek, and Stefan Heiss. “Towards an Asset Administration Shell Integrity Verification Scheme.” In <i>2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA)</i>, 1–4. Piscataway, NJ: IEEE, 2022. <a href=\"https://doi.org/10.1109/ETFA52439.2022.9921521\">https://doi.org/10.1109/ETFA52439.2022.9921521</a>.","chicago-de":"Bröring, Andre, Marco Ehrlich, Lukasz Wisniewski, Henning Trsek und Stefan Heiss. 2022. Towards an Asset Administration Shell Integrity Verification Scheme. In: <i>2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA)</i>, 1–4. Piscataway, NJ: IEEE. doi:<a href=\"https://doi.org/10.1109/ETFA52439.2022.9921521\">10.1109/ETFA52439.2022.9921521</a>, .","bjps":"<b>Bröring A <i>et al.</i></b> (2022) Towards an Asset Administration Shell Integrity Verification Scheme. <i>2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA)</i>. Piscataway, NJ: IEEE, pp. 1–4.","short":"A. Bröring, M. Ehrlich, L. Wisniewski, H. Trsek, S. Heiss, in: 2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA), IEEE, Piscataway, NJ, 2022, pp. 1–4.","din1505-2-1":"<span style=\"font-variant:small-caps;\">Bröring, Andre</span> ; <span style=\"font-variant:small-caps;\">Ehrlich, Marco</span> ; <span style=\"font-variant:small-caps;\">Wisniewski, Lukasz</span> ; <span style=\"font-variant:small-caps;\">Trsek, Henning</span> ; <span style=\"font-variant:small-caps;\">Heiss, Stefan</span>: Towards an Asset Administration Shell Integrity Verification Scheme. In: <i>2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA)</i>. Piscataway, NJ : IEEE, 2022, S. 1–4","mla":"Bröring, Andre, et al. “Towards an Asset Administration Shell Integrity Verification Scheme.” <i>2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA)</i>, IEEE, 2022, pp. 1–4, <a href=\"https://doi.org/10.1109/ETFA52439.2022.9921521\">https://doi.org/10.1109/ETFA52439.2022.9921521</a>.","apa":"Bröring, A., Ehrlich, M., Wisniewski, L., Trsek, H., &#38; Heiss, S. (2022). Towards an Asset Administration Shell Integrity Verification Scheme. <i>2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA)</i>, 1–4. <a href=\"https://doi.org/10.1109/ETFA52439.2022.9921521\">https://doi.org/10.1109/ETFA52439.2022.9921521</a>","van":"Bröring A, Ehrlich M, Wisniewski L, Trsek H, Heiss S. Towards an Asset Administration Shell Integrity Verification Scheme. In: 2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA). Piscataway, NJ: IEEE; 2022. p. 1–4.","ama":"Bröring A, Ehrlich M, Wisniewski L, Trsek H, Heiss S. Towards an Asset Administration Shell Integrity Verification Scheme. In: <i>2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA)</i>. IEEE; 2022:1-4. doi:<a href=\"https://doi.org/10.1109/ETFA52439.2022.9921521\">10.1109/ETFA52439.2022.9921521</a>","ieee":"A. Bröring, M. Ehrlich, L. Wisniewski, H. Trsek, and S. Heiss, “Towards an Asset Administration Shell Integrity Verification Scheme,” in <i>2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA)</i>,  Stuttgart, 2022, pp. 1–4. doi: <a href=\"https://doi.org/10.1109/ETFA52439.2022.9921521\">10.1109/ETFA52439.2022.9921521</a>.","havard":"A. Bröring, M. Ehrlich, L. Wisniewski, H. Trsek, S. Heiss, Towards an Asset Administration Shell Integrity Verification Scheme, in: 2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA), IEEE, Piscataway, NJ, 2022: pp. 1–4."},"language":[{"iso":"eng"}],"date_created":"2024-03-01T14:36:47Z","publisher":"IEEE","publication_status":"epub_ahead"}]