[{"publication":"Elektrische und optische Verbindungstechnik 2025 : Tagungsband der VDE/VDI GMM-Fachtagung : 10. Symposium Connectors","status":"public","department":[{"_id":"DEP6012"}],"corporate_editor":["VDE/VDI-Gesellschaft Mikroelektronik, Mikrosystem- und Feinwerktechnik (GMM)","Technische Hochschule Ostwestfalen-Lippe"],"user_id":"83778","year":"2025","page":"222-230","conference":{"location":"Lemgo","name":"10. Symposium Connectors","start_date":"2025-03-19","end_date":"2025-03-20"},"_id":"12887","date_created":"2025-05-05T11:19:47Z","language":[{"iso":"ger"}],"publisher":"Labor für Feinsystemtechnik, Technische Hochschule Ostwestfalen-Lippe","editor":[{"first_name":"Jian","full_name":"Song, Jian","last_name":"Song","id":"5297"}],"publication_status":"published","place":"Lemgo","citation":{"ufg":"<b>Probst, Roman/Song, Jian</b>: Einfluss von Vibration auf die Mikrobewegung von Steckverbindern, hg. von Song, Jian/VDE/VDI-Gesellschaft Mikroelektronik, Mikrosystem- und Feinwerktechnik (GMM), Technische Hochschule Ostwestfalen-Lippe, Lemgo 2025.","chicago-de":"Probst, Roman und Jian Song. 2025. <i>Einfluss von Vibration auf die Mikrobewegung von Steckverbindern</i>. Hg. von Jian Song, VDE/VDI-Gesellschaft Mikroelektronik, Mikrosystem- und Feinwerktechnik (GMM), und Technische Hochschule Ostwestfalen-Lippe. <i>Elektrische und optische Verbindungstechnik 2025 : Tagungsband der VDE/VDI GMM-Fachtagung : 10. Symposium Connectors</i>. Lemgo: Labor für Feinsystemtechnik, Technische Hochschule Ostwestfalen-Lippe.","short":"R. Probst, J. Song, Einfluss von Vibration auf die Mikrobewegung von Steckverbindern, Labor für Feinsystemtechnik, Technische Hochschule Ostwestfalen-Lippe, Lemgo, 2025.","mla":"Probst, Roman, and Jian Song. “Einfluss von Vibration auf die Mikrobewegung von Steckverbindern.” <i>Elektrische und optische Verbindungstechnik 2025 : Tagungsband der VDE/VDI GMM-Fachtagung : 10. Symposium Connectors</i>, edited by Jian Song et al., Labor für Feinsystemtechnik, Technische Hochschule Ostwestfalen-Lippe, 2025, pp. 222–30.","apa":"Probst, R., &#38; Song, J. (2025). Einfluss von Vibration auf die Mikrobewegung von Steckverbindern. In J. Song, VDE/VDI-Gesellschaft Mikroelektronik, Mikrosystem- und Feinwerktechnik (GMM), &#38; Technische Hochschule Ostwestfalen-Lippe (Eds.), <i>Elektrische und optische Verbindungstechnik 2025 : Tagungsband der VDE/VDI GMM-Fachtagung : 10. Symposium Connectors</i> (pp. 222–230). Labor für Feinsystemtechnik, Technische Hochschule Ostwestfalen-Lippe.","havard":"R. Probst, J. Song, Einfluss von Vibration auf die Mikrobewegung von Steckverbindern, Labor für Feinsystemtechnik, Technische Hochschule Ostwestfalen-Lippe, Lemgo, 2025.","chicago":"Probst, Roman, and Jian Song. <i>Einfluss von Vibration auf die Mikrobewegung von Steckverbindern</i>. Edited by Jian Song, VDE/VDI-Gesellschaft Mikroelektronik, Mikrosystem- und Feinwerktechnik (GMM), and Technische Hochschule Ostwestfalen-Lippe. <i>Elektrische und optische Verbindungstechnik 2025 : Tagungsband der VDE/VDI GMM-Fachtagung : 10. Symposium Connectors</i>. Lemgo: Labor für Feinsystemtechnik, Technische Hochschule Ostwestfalen-Lippe, 2025.","bjps":"<b>Probst R and Song J</b> (2025) <i>Einfluss von Vibration auf die Mikrobewegung von Steckverbindern</i>, Song J, VDE/VDI-Gesellschaft Mikroelektronik, Mikrosystem- und Feinwerktechnik (GMM), and Technische Hochschule Ostwestfalen-Lippe (eds). Lemgo: Labor für Feinsystemtechnik, Technische Hochschule Ostwestfalen-Lippe.","din1505-2-1":"<span style=\"font-variant:small-caps;\">Probst, Roman</span> ; <span style=\"font-variant:small-caps;\">Song, Jian</span> ; <span style=\"font-variant:small-caps;\">Song, J.</span> ; <span style=\"font-variant:small-caps;\">VDE/VDI-Gesellschaft Mikroelektronik, Mikrosystem- und Feinwerktechnik (GMM)</span> ; <span style=\"font-variant:small-caps;\">Technische Hochschule Ostwestfalen-Lippe</span> (Hrsg.): <i>Einfluss von Vibration auf die Mikrobewegung von Steckverbindern</i>. Lemgo : Labor für Feinsystemtechnik, Technische Hochschule Ostwestfalen-Lippe, 2025","van":"Probst R, Song J. Einfluss von Vibration auf die Mikrobewegung von Steckverbindern. Song J, VDE/VDI-Gesellschaft Mikroelektronik, Mikrosystem- und Feinwerktechnik (GMM), Technische Hochschule Ostwestfalen-Lippe, editors. Elektrische und optische Verbindungstechnik 2025 : Tagungsband der VDE/VDI GMM-Fachtagung : 10. Symposium Connectors. Lemgo: Labor für Feinsystemtechnik, Technische Hochschule Ostwestfalen-Lippe; 2025.","ama":"Probst R, Song J. <i>Einfluss von Vibration auf die Mikrobewegung von Steckverbindern</i>. (Song J, VDE/VDI-Gesellschaft Mikroelektronik, Mikrosystem- und Feinwerktechnik (GMM), Technische Hochschule Ostwestfalen-Lippe, eds.). Labor für Feinsystemtechnik, Technische Hochschule Ostwestfalen-Lippe; 2025:222-230.","ieee":"R. Probst and J. Song, <i>Einfluss von Vibration auf die Mikrobewegung von Steckverbindern</i>. Lemgo: Labor für Feinsystemtechnik, Technische Hochschule Ostwestfalen-Lippe, 2025, pp. 222–230."},"publication_identifier":{"isbn":["978-3-00-081713-7"]},"type":"conference_editor_article","author":[{"full_name":"Probst, Roman","id":"69156","last_name":"Probst","first_name":"Roman"},{"first_name":"Jian","last_name":"Song","id":"5297","full_name":"Song, Jian"}],"title":"Einfluss von Vibration auf die Mikrobewegung von Steckverbindern","date_updated":"2026-04-01T12:40:40Z"},{"_id":"12761","publication":"Machines","title":"The State of Health of Electrical Connectors","date_created":"2025-04-04T09:23:10Z","language":[{"iso":"eng"}],"publication_status":"published","volume":7,"place":"Basel","citation":{"havard":"J. Song, A.R. Shukla, R. Probst, The State of Health of Electrical Connectors, Machines. 7 (2024) 474.","apa":"Song, J., Shukla, A. R., &#38; Probst, R. (2024). The State of Health of Electrical Connectors. <i>Machines</i>, <i>7</i>(12), 474. <a href=\"https://doi.org/10.3390/machines12070474\">https://doi.org/10.3390/machines12070474</a>","mla":"Song, Jian, et al. “The State of Health of Electrical Connectors.” <i>Machines</i>, vol. 7, no. 12, 2024, p. 474, <a href=\"https://doi.org/10.3390/machines12070474\">https://doi.org/10.3390/machines12070474</a>.","short":"J. Song, A.R. Shukla, R. Probst, Machines 7 (2024) 474.","chicago-de":"Song, Jian, Abhay Rammurti Shukla und Roman Probst. 2024. The State of Health of Electrical Connectors. <i>Machines</i> 7, Nr. 12: 474. doi:<a href=\"https://doi.org/10.3390/machines12070474\">https://doi.org/10.3390/machines12070474</a>, .","ufg":"<b>Song, Jian/Shukla, Abhay Rammurti/Probst, Roman</b>: The State of Health of Electrical Connectors, in: <i>Machines</i> 7 (2024), H. 12,  S. 474.","ieee":"J. Song, A. R. Shukla, and R. Probst, “The State of Health of Electrical Connectors,” <i>Machines</i>, vol. 7, no. 12, p. 474, 2024, doi: <a href=\"https://doi.org/10.3390/machines12070474\">https://doi.org/10.3390/machines12070474</a>.","ama":"Song J, Shukla AR, Probst R. The State of Health of Electrical Connectors. <i>Machines</i>. 2024;7(12):474. doi:<a href=\"https://doi.org/10.3390/machines12070474\">https://doi.org/10.3390/machines12070474</a>","van":"Song J, Shukla AR, Probst R. The State of Health of Electrical Connectors. Machines. 2024;7(12):474.","din1505-2-1":"<span style=\"font-variant:small-caps;\">Song, Jian</span> ; <span style=\"font-variant:small-caps;\">Shukla, Abhay Rammurti</span> ; <span style=\"font-variant:small-caps;\">Probst, Roman</span>: The State of Health of Electrical Connectors. In: <i>Machines</i> Bd. 7. Basel, MDPI (2024), Nr. 12, S. 474","bjps":"<b>Song J, Shukla AR and Probst R</b> (2024) The State of Health of Electrical Connectors. <i>Machines</i> <b>7</b>, 474.","chicago":"Song, Jian, Abhay Rammurti Shukla, and Roman Probst. “The State of Health of Electrical Connectors.” <i>Machines</i> 7, no. 12 (2024): 474. <a href=\"https://doi.org/10.3390/machines12070474\">https://doi.org/10.3390/machines12070474</a>."},"publication_identifier":{"eissn":["2075-1702 "]},"isi":"1","intvolume":"         7","author":[{"first_name":"Jian","full_name":"Song, Jian","last_name":"Song","id":"5297"},{"first_name":"Abhay Rammurti","full_name":"Shukla, Abhay Rammurti","last_name":"Shukla","id":"74188"},{"first_name":"Roman","full_name":"Probst, Roman","id":"69156","last_name":"Probst"}],"page":"474","abstract":[{"lang":"eng","text":"For modern machines, factories and electric and autonomous vehicles, the importance of vreliable electrical connectors cannot be overstated. With an increasing number of connectors being used in machines, factories and vehicles, ensuring their reliability is crucial for comfort and safety alike. One of the key indicators of reliability is the lifetime of connectors. To evaluate the lifetime of electrical connectors, a testing method and a model for calculating their lifetime based on the test data were developed. The results from these tests were compared to failure analysis data from long-term field operations. The findings indicate that the laboratory tests can accurately reproduce the main failures observed in the field. However, such lifetime tests can be time- and labor-intensive. To address this challenge, a data-driven method is proposed that predicts the lifetime of electrical connectors using statistical analysis of electrical contact resistance data collected from short-term tests. The predictions from this method were compared to actual results obtained from long-term tests. A strong correlation was observed between the contact resistance development in short-term tests and the number of failures in later stages of testing. Thus, apart from predicting the lifetime of connectors, this method can also be applied for failure prognosis in real-time operations."}],"keyword":["electrical connectors","accelerated life testing","statistical model","lifetime prognosis","reliability","state of health"],"status":"public","department":[{"_id":"DEP6012"}],"user_id":"83781","year":"2024","external_id":{"isi":["001277040200001"]},"quality_controlled":"1","date_updated":"2025-06-25T13:03:28Z","doi":"https://doi.org/10.3390/machines12070474","issue":"12","publisher":"MDPI","type":"scientific_journal_article"},{"page":"32-39","abstract":[{"text":"he lifetime of electrical contacts is influenced by various factors. Micromotions due to fluctuations in temperature and vibration in the field lead to fretting wear and fretting corrosion of electrical contacts. In case of the contacts with noble coatings, the fretting wear results in the wear through of the coating causing the exposure of the underlying non-noble metal to the surrounding atmosphere which in turn leads to fretting corrosion. These degradation mechanisms lead to an increase in electrical contact resistance and eventual failure of the system. In this study, the extent of contact degradation due to fretting war of galvanically silver-plated electrical contacts is investigated. To compare the extent of war occurring at different stages of the contacts’ lifetime, the fretting tests are conducted up to predefined fretting cycles. XRF measurements of the coating thickness before after the tests are performed and the wear depth after the given fretting cycles is determined via confocal microscopy. The results of two different types of silver plating are compared. Based on this, a prognosis regarding the wear behavior and expected lifetime of different coating systems can be made possible.","lang":"eng"}],"keyword":["Surfaces","Coatings and Films","Surfaces and Interfaces","Mechanical Engineering","Mechanics of Materials"],"status":"public","department":[{"_id":"DEP6012"}],"user_id":"83781","year":"2023","date_updated":"2024-05-21T12:27:48Z","doi":"10.24053/tus-2023-0005","issue":"1","publisher":"Narr Francke Attempto Verlag GmbH + Co. KG","type":"scientific_journal_article","_id":"11347","publication":"Tribologie und Schmierungstechnik","title":"Einfluss der Mikrohärte der Ober- flächenschutzschicht auf den Verschleiß und die Lebensdauer von elektrischen Kontakten bei Reibverschleißbelastung","has_accepted_license":"1","language":[{"iso":"ger"}],"date_created":"2024-04-18T08:47:22Z","volume":70,"publication_status":"published","citation":{"ufg":"<b>Probst, Roman/Song, Jian</b>: Einfluss der Mikrohärte der Ober- flächenschutzschicht auf den Verschleiß und die Lebensdauer von elektrischen Kontakten bei Reibverschleißbelastung, in: <i>Tribologie und Schmierungstechnik</i> 70 (2023), H. 1,  S. 32–39.","chicago-de":"Probst, Roman und Jian Song. 2023. Einfluss der Mikrohärte der Ober- flächenschutzschicht auf den Verschleiß und die Lebensdauer von elektrischen Kontakten bei Reibverschleißbelastung. <i>Tribologie und Schmierungstechnik</i> 70, Nr. 1: 32–39. doi:<a href=\"https://doi.org/10.24053/tus-2023-0005\">10.24053/tus-2023-0005</a>, .","short":"R. Probst, J. Song, Tribologie und Schmierungstechnik 70 (2023) 32–39.","apa":"Probst, R., &#38; Song, J. (2023). Einfluss der Mikrohärte der Ober- flächenschutzschicht auf den Verschleiß und die Lebensdauer von elektrischen Kontakten bei Reibverschleißbelastung. <i>Tribologie und Schmierungstechnik</i>, <i>70</i>(1), 32–39. <a href=\"https://doi.org/10.24053/tus-2023-0005\">https://doi.org/10.24053/tus-2023-0005</a>","mla":"Probst, Roman, and Jian Song. “Einfluss der Mikrohärte der Ober- flächenschutzschicht auf den Verschleiß und die Lebensdauer von elektrischen Kontakten bei Reibverschleißbelastung.” <i>Tribologie und Schmierungstechnik</i>, vol. 70, no. 1, 2023, pp. 32–39, <a href=\"https://doi.org/10.24053/tus-2023-0005\">https://doi.org/10.24053/tus-2023-0005</a>.","havard":"R. Probst, J. Song, Einfluss der Mikrohärte der Ober- flächenschutzschicht auf den Verschleiß und die Lebensdauer von elektrischen Kontakten bei Reibverschleißbelastung, Tribologie und Schmierungstechnik. 70 (2023) 32–39.","chicago":"Probst, Roman, and Jian Song. “Einfluss der Mikrohärte der Ober- flächenschutzschicht auf den Verschleiß und die Lebensdauer von elektrischen Kontakten bei Reibverschleißbelastung.” <i>Tribologie und Schmierungstechnik</i> 70, no. 1 (2023): 32–39. <a href=\"https://doi.org/10.24053/tus-2023-0005\">https://doi.org/10.24053/tus-2023-0005</a>.","bjps":"<b>Probst R and Song J</b> (2023) Einfluss der Mikrohärte der Ober- flächenschutzschicht auf den Verschleiß und die Lebensdauer von elektrischen Kontakten bei Reibverschleißbelastung. <i>Tribologie und Schmierungstechnik</i> <b>70</b>, 32–39.","din1505-2-1":"<span style=\"font-variant:small-caps;\">Probst, Roman</span> ; <span style=\"font-variant:small-caps;\">Song, Jian</span>: Einfluss der Mikrohärte der Ober- flächenschutzschicht auf den Verschleiß und die Lebensdauer von elektrischen Kontakten bei Reibverschleißbelastung. In: <i>Tribologie und Schmierungstechnik</i> Bd. 70, Narr Francke Attempto Verlag GmbH + Co. KG (2023), Nr. 1, S. 32–39","ama":"Probst R, Song J. Einfluss der Mikrohärte der Ober- flächenschutzschicht auf den Verschleiß und die Lebensdauer von elektrischen Kontakten bei Reibverschleißbelastung. <i>Tribologie und Schmierungstechnik</i>. 2023;70(1):32-39. doi:<a href=\"https://doi.org/10.24053/tus-2023-0005\">10.24053/tus-2023-0005</a>","van":"Probst R, Song J. Einfluss der Mikrohärte der Ober- flächenschutzschicht auf den Verschleiß und die Lebensdauer von elektrischen Kontakten bei Reibverschleißbelastung. Tribologie und Schmierungstechnik. 2023;70(1):32–9.","ieee":"R. Probst and J. Song, “Einfluss der Mikrohärte der Ober- flächenschutzschicht auf den Verschleiß und die Lebensdauer von elektrischen Kontakten bei Reibverschleißbelastung,” <i>Tribologie und Schmierungstechnik</i>, vol. 70, no. 1, pp. 32–39, 2023, doi: <a href=\"https://doi.org/10.24053/tus-2023-0005\">10.24053/tus-2023-0005</a>."},"publication_identifier":{"issn":["0724-3472"]},"intvolume":"        70","author":[{"first_name":"Roman","id":"69156","last_name":"Probst","full_name":"Probst, Roman"},{"first_name":"Jian","id":"5297","last_name":"Song","full_name":"Song, Jian"}]},{"article_number":"115216","_id":"11348","publication":"Microelectronics Reliability","title":"Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests","has_accepted_license":"1","publication_status":"published","volume":150,"date_created":"2024-04-18T08:55:38Z","language":[{"iso":"eng"}],"citation":{"havard":"A.R. Shukla, R. Martin, R. Probst, J. Song, Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests, Microelectronics Reliability. 150 (2023).","ufg":"<b>Shukla, Abhay Rammurti u. a.</b>: Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests, in: <i>Microelectronics Reliability</i> 150 (2023).","chicago-de":"Shukla, Abhay Rammurti, Robert Martin, Roman Probst und Jian Song. 2023. Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests. <i>Microelectronics Reliability</i> 150. doi:<a href=\"https://doi.org/10.1016/j.microrel.2023.115216\">10.1016/j.microrel.2023.115216</a>, .","short":"A.R. Shukla, R. Martin, R. Probst, J. Song, Microelectronics Reliability 150 (2023).","apa":"Shukla, A. R., Martin, R., Probst, R., &#38; Song, J. (2023). Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests. <i>Microelectronics Reliability</i>, <i>150</i>, Article 115216. <a href=\"https://doi.org/10.1016/j.microrel.2023.115216\">https://doi.org/10.1016/j.microrel.2023.115216</a>","mla":"Shukla, Abhay Rammurti, et al. “Comparison of Different Statistical Methods for Prediction of Lifetime of Electrical Connectors with Short Term Tests.” <i>Microelectronics Reliability</i>, vol. 150, 115216, 2023, <a href=\"https://doi.org/10.1016/j.microrel.2023.115216\">https://doi.org/10.1016/j.microrel.2023.115216</a>.","ama":"Shukla AR, Martin R, Probst R, Song J. Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests. <i>Microelectronics Reliability</i>. 2023;150. doi:<a href=\"https://doi.org/10.1016/j.microrel.2023.115216\">10.1016/j.microrel.2023.115216</a>","van":"Shukla AR, Martin R, Probst R, Song J. Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests. Microelectronics Reliability. 2023;150.","ieee":"A. R. Shukla, R. Martin, R. Probst, and J. Song, “Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests,” <i>Microelectronics Reliability</i>, vol. 150, Art. no. 115216, 2023, doi: <a href=\"https://doi.org/10.1016/j.microrel.2023.115216\">10.1016/j.microrel.2023.115216</a>.","chicago":"Shukla, Abhay Rammurti, Robert Martin, Roman Probst, and Jian Song. “Comparison of Different Statistical Methods for Prediction of Lifetime of Electrical Connectors with Short Term Tests.” <i>Microelectronics Reliability</i> 150 (2023). <a href=\"https://doi.org/10.1016/j.microrel.2023.115216\">https://doi.org/10.1016/j.microrel.2023.115216</a>.","bjps":"<b>Shukla AR <i>et al.</i></b> (2023) Comparison of Different Statistical Methods for Prediction of Lifetime of Electrical Connectors with Short Term Tests. <i>Microelectronics Reliability</i> <b>150</b>.","din1505-2-1":"<span style=\"font-variant:small-caps;\">Shukla, Abhay Rammurti</span> ; <span style=\"font-variant:small-caps;\">Martin, Robert</span> ; <span style=\"font-variant:small-caps;\">Probst, Roman</span> ; <span style=\"font-variant:small-caps;\">Song, Jian</span>: Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests. In: <i>Microelectronics Reliability</i> Bd. 150. Amsterdam, Elsevier  (2023)"},"place":"Amsterdam","publication_identifier":{"issn":["0026-2714"],"unknown":["1872-941X"]},"intvolume":"       150","author":[{"first_name":"Abhay Rammurti","full_name":"Shukla, Abhay Rammurti","last_name":"Shukla","id":"74188"},{"last_name":"Martin","full_name":"Martin, Robert","first_name":"Robert"},{"first_name":"Roman","last_name":"Probst","id":"69156","full_name":"Probst, Roman"},{"first_name":"Jian","full_name":"Song, Jian","last_name":"Song","id":"5297"}],"isi":"1","abstract":[{"lang":"eng","text":"Lifetime is an important feature defining the reliability of electrical connectors. In general practice, the lifetime tests required for reliability estimation are time and labor intensive. In our previous work, a data driven method using a statistical process, with an application of probability distributions such as standard normal distribution and generalized extreme value (GEV) distribution with negative skewness to predict degradation paths, was introduced for estimation of the lifetime and FIT rate with the help of electrical contact resistance data collected from short term tests. The proposed method proved its significance by showing the possibility of drastic reduction in the lifetime test duration required for reliability determination. In this work, a non-parametric distribution free method using percentiles of actual measured contact resistances is used for determining the lifetime as against the percentiles of probability distribution used in previous work, thereby simplifying the process further and leading to an even more precise estimation. The lifetimes calculated from parametric and non-parametric methods are compared to highlight the significance of distribution free method in reliability estimation."}],"keyword":["Electrical and Electronic Engineering","Surfaces","Coatings and Films","Safety","Risk","Reliability and Quality","Condensed Matter Physics","Atomic and Molecular Physics","and Optics","Electronic","Optical and Magnetic Materials"],"status":"public","department":[{"_id":"DEP6012"}],"year":"2023","user_id":"83781","external_id":{"isi":["001106942700001"]},"date_updated":"2025-06-26T07:51:25Z","doi":"10.1016/j.microrel.2023.115216","article_type":"original","publisher":"Elsevier ","type":"scientific_journal_article"},{"_id":"11349","publication":"Elektrische und optische Verbindungstechnik 2023 : Tagungsband der VDE/VDI GMM-Fachtagung : 9. Symposium Connectors","title":"Bestimmung der charakteristischen Lebensdauer von Steckverbindern aus der Frühphase beschleunigter Lebensdauerprüfungen – State of Health. Tagungsband der VDE/VDI-GMM- Fachtagung „Symposium Connectors“, 166 – 177, Lemgo 2023","has_accepted_license":"1","ddc":["620"],"publication_identifier":{"unknown":["978-3-00-074593-5"]},"author":[{"id":"69156","last_name":"Probst","full_name":"Probst, Roman","first_name":"Roman"},{"first_name":"Jian","full_name":"Song, Jian","last_name":"Song","id":"5297"}],"date_created":"2024-04-18T09:11:18Z","language":[{"iso":"ger"}],"publication_status":"published","place":"Lemgo","citation":{"chicago-de":"Probst, Roman und Jian Song. 2023. <i>Bestimmung der charakteristischen Lebensdauer von Steckverbindern aus der Frühphase beschleunigter Lebensdauerprüfungen – State of Health. Tagungsband der VDE/VDI-GMM- Fachtagung „Symposium Connectors“, 166 – 177, Lemgo 2023</i>. Hg. von Jian Song und Labor für Feinsystemtechnik, Technische Hochschule Ostwestfalen-Lippe. <i>Elektrische und optische Verbindungstechnik 2023 : Tagungsband der VDE/VDI GMM-Fachtagung : 9. Symposium Connectors</i>. Lemgo: Labor für Feinsystemtechnik, TH OWL.","ufg":"<b>Probst, Roman/Song, Jian</b>: Bestimmung der charakteristischen Lebensdauer von Steckverbindern aus der Frühphase beschleunigter Lebensdauerprüfungen – State of Health. Tagungsband der VDE/VDI-GMM- Fachtagung „Symposium Connectors“, 166 – 177, Lemgo 2023, hg. von Song, Jian, Labor für Feinsystemtechnik, Technische Hochschule Ostwestfalen-Lippe, Lemgo 2023.","apa":"Probst, R., &#38; Song, J. (2023). Bestimmung der charakteristischen Lebensdauer von Steckverbindern aus der Frühphase beschleunigter Lebensdauerprüfungen – State of Health. Tagungsband der VDE/VDI-GMM- Fachtagung „Symposium Connectors“, 166 – 177, Lemgo 2023. In J. Song &#38; Labor für Feinsystemtechnik, Technische Hochschule Ostwestfalen-Lippe (Eds.), <i>Elektrische und optische Verbindungstechnik 2023 : Tagungsband der VDE/VDI GMM-Fachtagung : 9. Symposium Connectors</i> (pp. 166–177). Labor für Feinsystemtechnik, TH OWL.","mla":"Probst, Roman, and Jian Song. “Bestimmung der charakteristischen Lebensdauer von Steckverbindern aus der Frühphase beschleunigter Lebensdauerprüfungen – State of Health. Tagungsband der VDE/VDI-GMM- Fachtagung „Symposium Connectors“, 166 – 177, Lemgo 2023.” <i>Elektrische und optische Verbindungstechnik 2023 : Tagungsband der VDE/VDI GMM-Fachtagung : 9. Symposium Connectors</i>, edited by Jian Song and Labor für Feinsystemtechnik, Technische Hochschule Ostwestfalen-Lippe, Labor für Feinsystemtechnik, TH OWL, 2023, pp. 166–77.","short":"R. Probst, J. Song, Bestimmung der charakteristischen Lebensdauer von Steckverbindern aus der Frühphase beschleunigter Lebensdauerprüfungen – State of Health. Tagungsband der VDE/VDI-GMM- Fachtagung „Symposium Connectors“, 166 – 177, Lemgo 2023, Labor für Feinsystemtechnik, TH OWL, Lemgo, 2023.","havard":"R. Probst, J. Song, Bestimmung der charakteristischen Lebensdauer von Steckverbindern aus der Frühphase beschleunigter Lebensdauerprüfungen – State of Health. Tagungsband der VDE/VDI-GMM- Fachtagung „Symposium Connectors“, 166 – 177, Lemgo 2023, Labor für Feinsystemtechnik, TH OWL, Lemgo, 2023.","chicago":"Probst, Roman, and Jian Song. <i>Bestimmung der charakteristischen Lebensdauer von Steckverbindern aus der Frühphase beschleunigter Lebensdauerprüfungen – State of Health. Tagungsband der VDE/VDI-GMM- Fachtagung „Symposium Connectors“, 166 – 177, Lemgo 2023</i>. Edited by Jian Song and Labor für Feinsystemtechnik, Technische Hochschule Ostwestfalen-Lippe. <i>Elektrische und optische Verbindungstechnik 2023 : Tagungsband der VDE/VDI GMM-Fachtagung : 9. Symposium Connectors</i>. Lemgo: Labor für Feinsystemtechnik, TH OWL, 2023.","din1505-2-1":"<span style=\"font-variant:small-caps;\">Probst, Roman</span> ; <span style=\"font-variant:small-caps;\">Song, Jian</span> ; <span style=\"font-variant:small-caps;\">Song, J.</span> ; <span style=\"font-variant:small-caps;\">Labor für Feinsystemtechnik, Technische Hochschule Ostwestfalen-Lippe</span> (Hrsg.): <i>Bestimmung der charakteristischen Lebensdauer von Steckverbindern aus der Frühphase beschleunigter Lebensdauerprüfungen – State of Health. Tagungsband der VDE/VDI-GMM- Fachtagung „Symposium Connectors“, 166 – 177, Lemgo 2023</i>. Lemgo : Labor für Feinsystemtechnik, TH OWL, 2023","bjps":"<b>Probst R and Song J</b> (2023) <i>Bestimmung der charakteristischen Lebensdauer von Steckverbindern aus der Frühphase beschleunigter Lebensdauerprüfungen – State of Health. Tagungsband der VDE/VDI-GMM- Fachtagung „Symposium Connectors“, 166 – 177, Lemgo 2023</i>, Song J and Labor für Feinsystemtechnik, Technische Hochschule Ostwestfalen-Lippe (eds). Lemgo: Labor für Feinsystemtechnik, TH OWL.","ama":"Probst R, Song J. <i>Bestimmung der charakteristischen Lebensdauer von Steckverbindern aus der Frühphase beschleunigter Lebensdauerprüfungen – State of Health. Tagungsband der VDE/VDI-GMM- Fachtagung „Symposium Connectors“, 166 – 177, Lemgo 2023</i>. (Song J, Labor für Feinsystemtechnik, Technische Hochschule Ostwestfalen-Lippe, eds.). Labor für Feinsystemtechnik, TH OWL; 2023:166-177.","van":"Probst R, Song J. Bestimmung der charakteristischen Lebensdauer von Steckverbindern aus der Frühphase beschleunigter Lebensdauerprüfungen – State of Health. Tagungsband der VDE/VDI-GMM- Fachtagung „Symposium Connectors“, 166 – 177, Lemgo 2023. Song J, Labor für Feinsystemtechnik, Technische Hochschule Ostwestfalen-Lippe, editors. Elektrische und optische Verbindungstechnik 2023 : Tagungsband der VDE/VDI GMM-Fachtagung : 9. Symposium Connectors. Lemgo: Labor für Feinsystemtechnik, TH OWL; 2023.","ieee":"R. Probst and J. Song, <i>Bestimmung der charakteristischen Lebensdauer von Steckverbindern aus der Frühphase beschleunigter Lebensdauerprüfungen – State of Health. Tagungsband der VDE/VDI-GMM- Fachtagung „Symposium Connectors“, 166 – 177, Lemgo 2023</i>. Lemgo: Labor für Feinsystemtechnik, TH OWL, 2023, pp. 166–177."},"page":"166 - 177","conference":{"end_date":"2023-03-22","start_date":"2023-03-21","name":"VDE/VDI-GMM- Fachtagung „Symposium Connectors“","location":"Lemgo"},"department":[{"_id":"DEP6012"}],"corporate_editor":["Labor für Feinsystemtechnik, Technische Hochschule Ostwestfalen-Lippe"],"year":"2023","user_id":"83781","status":"public","date_updated":"2024-05-13T12:25:49Z","type":"conference_editor_article","publisher":"Labor für Feinsystemtechnik, TH OWL","editor":[{"first_name":"Jian","last_name":"Song","id":"5297","full_name":"Song, Jian"}]},{"status":"public","publication":"Reibung, Schmierung und Verschleiß : Forschung und praktische Anwendungen : 64. Tribologie-Fachtagung : 25. September bis 27. September 2023 in Göttingen","user_id":"83781","year":"2023","department":[{"_id":"DEP6012"}],"corporate_editor":["Gesellschaft für Tribologie "],"page":"06/1-4","conference":{"start_date":"2023-09-25","end_date":"2023-09-27","name":"64. Tribologie-Fachtagung","location":"Göttingen "},"_id":"11357","place":"Jülich","citation":{"van":"Song J, Probst R. Einfluss von Schmiermitteln und thermischer Belastung auf das Reibkorrosionsverhalten von elektrischen Kontakten. Gesellschaft für Tribologie , editor. Reibung, Schmierung und Verschleiß : Forschung und praktische Anwendungen : 64. Tribologie-Fachtagung : 25. September bis 27. September 2023 in Göttingen. Jülich: Gesellschaft für Tribologie; 2023.","ama":"Song J, Probst R. <i>Einfluss von Schmiermitteln und thermischer Belastung auf das Reibkorrosionsverhalten von elektrischen Kontakten</i>. (Gesellschaft für Tribologie , ed.). Gesellschaft für Tribologie; 2023:06/1-4.","ieee":"J. Song and R. Probst, <i>Einfluss von Schmiermitteln und thermischer Belastung auf das Reibkorrosionsverhalten von elektrischen Kontakten</i>. Jülich: Gesellschaft für Tribologie, 2023, p. 06/1–4.","chicago":"Song, Jian, and Roman Probst. <i>Einfluss von Schmiermitteln und thermischer Belastung auf das Reibkorrosionsverhalten von elektrischen Kontakten</i>. Edited by Gesellschaft für Tribologie . <i>Reibung, Schmierung und Verschleiß : Forschung und praktische Anwendungen : 64. Tribologie-Fachtagung : 25. September bis 27. September 2023 in Göttingen</i>. Jülich: Gesellschaft für Tribologie, 2023.","din1505-2-1":"<span style=\"font-variant:small-caps;\">Song, Jian</span> ; <span style=\"font-variant:small-caps;\">Probst, Roman</span> ; <span style=\"font-variant:small-caps;\">Gesellschaft für Tribologie </span> (Hrsg.): <i>Einfluss von Schmiermitteln und thermischer Belastung auf das Reibkorrosionsverhalten von elektrischen Kontakten</i>. Jülich : Gesellschaft für Tribologie, 2023","bjps":"<b>Song J and Probst R</b> (2023) <i>Einfluss von Schmiermitteln und thermischer Belastung auf das Reibkorrosionsverhalten von elektrischen Kontakten</i>, Gesellschaft für Tribologie  (ed.). Jülich: Gesellschaft für Tribologie.","havard":"J. Song, R. Probst, Einfluss von Schmiermitteln und thermischer Belastung auf das Reibkorrosionsverhalten von elektrischen Kontakten, Gesellschaft für Tribologie, Jülich, 2023.","chicago-de":"Song, Jian und Roman Probst. 2023. <i>Einfluss von Schmiermitteln und thermischer Belastung auf das Reibkorrosionsverhalten von elektrischen Kontakten</i>. Hg. von Gesellschaft für Tribologie . <i>Reibung, Schmierung und Verschleiß : Forschung und praktische Anwendungen : 64. Tribologie-Fachtagung : 25. September bis 27. September 2023 in Göttingen</i>. Jülich: Gesellschaft für Tribologie.","ufg":"<b>Song, Jian/Probst, Roman</b>: Einfluss von Schmiermitteln und thermischer Belastung auf das Reibkorrosionsverhalten von elektrischen Kontakten, hg. von Gesellschaft für Tribologie , Jülich 2023.","mla":"Song, Jian, and Roman Probst. “Einfluss von Schmiermitteln und thermischer Belastung auf das Reibkorrosionsverhalten von elektrischen Kontakten.” <i>Reibung, Schmierung und Verschleiß : Forschung und praktische Anwendungen : 64. Tribologie-Fachtagung : 25. September bis 27. September 2023 in Göttingen</i>, edited by Gesellschaft für Tribologie , Gesellschaft für Tribologie, 2023, p. 06/1-4.","apa":"Song, J., &#38; Probst, R. (2023). Einfluss von Schmiermitteln und thermischer Belastung auf das Reibkorrosionsverhalten von elektrischen Kontakten. In Gesellschaft für Tribologie  (Ed.), <i>Reibung, Schmierung und Verschleiß : Forschung und praktische Anwendungen : 64. Tribologie-Fachtagung : 25. September bis 27. September 2023 in Göttingen</i> (p. 06/1-4). Gesellschaft für Tribologie.","short":"J. Song, R. Probst, Einfluss von Schmiermitteln und thermischer Belastung auf das Reibkorrosionsverhalten von elektrischen Kontakten, Gesellschaft für Tribologie, Jülich, 2023."},"date_created":"2024-04-18T09:54:34Z","publisher":"Gesellschaft für Tribologie","language":[{"iso":"ger"}],"publication_status":"published","author":[{"id":"5297","last_name":"Song","full_name":"Song, Jian","first_name":"Jian"},{"first_name":"Roman","last_name":"Probst","id":"69156","full_name":"Probst, Roman"}],"type":"conference_editor_article","publication_identifier":{"eisbn":["978-3-9817451-8-4"]},"date_updated":"2024-05-21T12:20:05Z","title":"Einfluss von Schmiermitteln und thermischer Belastung auf das Reibkorrosionsverhalten von elektrischen Kontakten"},{"type":"conference_editor_article","publisher":"IEEE","doi":"10.1109/holm56075.2023.10352299","date_updated":"2025-06-26T07:54:13Z","user_id":"83781","year":"2023","department":[{"_id":"DEP6012"}],"status":"public","keyword":["electrical contacts","lifetime","silver coating","fretting corrosion","fatigue","wear through"],"abstract":[{"lang":"eng","text":"The reliability and lifetime of electrical contacts is an important aspect in system reliability and is influenced by numerous factors. Micro motions as well as vibrations lead to fretting wear, which can result in wear through of the protective coating. If this layer is worn through, the non-noble layer underneath is exposed, resulting in the occurrence of fretting corrosion with further relative motion. This leads to an increased electrical contact resistance (ECR) and can cause the contact to fail. Increasing the hardness of the coating material can reduce the wear and in turn increase contacts’ lifetime. The micro hardness, wear and lifetime of contacts with modified hard silver coatings are investigated in fretting wear and corrosion tests and the results compared to a conventional silver coating. Since one of the modifications shows a significant reduction in wear and hence improvement in lifetime, further analysis with SEM and FIB is conducted in order to identify the key mechanisms leading to this improvement. With a further increase in lifetime however, fatigue as well as delamination of the coating are revealed to be of high relevance. Both can be main causes of electrical contact failure under fretting load. In general, at lower number of cycles, increased micro hardness has the greatest effect on lifetime and wear while at the higher number of cycles, fatigue is observed to be the dominant failure mechanism."}],"conference":{"location":"Seattle ","name":"68th Holm Conference on Electrical Contacts (HOLM)","end_date":"2023-10-11","start_date":"2023-10-04"},"page":"88 - 94","author":[{"last_name":"Probst","id":"69156","full_name":"Probst, Roman","first_name":"Roman"},{"first_name":"Jian","last_name":"Song","id":"5297","full_name":"Song, Jian"}],"publication_identifier":{"eisbn":["979‐8‐3503‐4246‐8 ","979‐8‐3503‐4245‐1"],"issn":["2158‐9992"],"isbn":["979‐8‐3503‐4244‐4"]},"citation":{"mla":"Probst, Roman, and Jian Song. “Influence of Hardness and Fatigue on the Lifetime of a Modified Silver Coating in Fretting Wear and Corrosion Tests.” <i>2023 IEEE 68th Holm Conference on Electrical Contacts (HOLM)</i>, IEEE, 2023, pp. 88–94, <a href=\"https://doi.org/10.1109/holm56075.2023.10352299\">https://doi.org/10.1109/holm56075.2023.10352299</a>.","apa":"Probst, R., &#38; Song, J. (2023). Influence of Hardness and Fatigue on the Lifetime of a Modified Silver Coating in Fretting Wear and Corrosion Tests. In <i>2023 IEEE 68th Holm Conference on Electrical Contacts (HOLM)</i> (pp. 88–94). IEEE. <a href=\"https://doi.org/10.1109/holm56075.2023.10352299\">https://doi.org/10.1109/holm56075.2023.10352299</a>","short":"R. Probst, J. Song, Influence of Hardness and Fatigue on the Lifetime of a Modified Silver Coating in Fretting Wear and Corrosion Tests, IEEE, [Piscataway, NJ], 2023.","chicago-de":"Probst, Roman und Jian Song. 2023. <i>Influence of Hardness and Fatigue on the Lifetime of a Modified Silver Coating in Fretting Wear and Corrosion Tests</i>. <i>2023 IEEE 68th Holm Conference on Electrical Contacts (HOLM)</i>. Electrical Contacts-IEEE Holm Conference on Electrical Contacts. [Piscataway, NJ]: IEEE. doi:<a href=\"https://doi.org/10.1109/holm56075.2023.10352299\">10.1109/holm56075.2023.10352299</a>, .","ufg":"<b>Probst, Roman/Song, Jian</b>: Influence of Hardness and Fatigue on the Lifetime of a Modified Silver Coating in Fretting Wear and Corrosion Tests, [Piscataway, NJ] 2023 (Electrical Contacts-IEEE Holm Conference on Electrical Contacts).","havard":"R. Probst, J. Song, Influence of Hardness and Fatigue on the Lifetime of a Modified Silver Coating in Fretting Wear and Corrosion Tests, IEEE, [Piscataway, NJ], 2023.","din1505-2-1":"<span style=\"font-variant:small-caps;\">Probst, Roman</span> ; <span style=\"font-variant:small-caps;\">Song, Jian</span>: <i>Influence of Hardness and Fatigue on the Lifetime of a Modified Silver Coating in Fretting Wear and Corrosion Tests</i>, <i>Electrical Contacts-IEEE Holm Conference on Electrical Contacts</i>. [Piscataway, NJ] : IEEE, 2023","bjps":"<b>Probst R and Song J</b> (2023) <i>Influence of Hardness and Fatigue on the Lifetime of a Modified Silver Coating in Fretting Wear and Corrosion Tests</i>. [Piscataway, NJ]: IEEE.","chicago":"Probst, Roman, and Jian Song. <i>Influence of Hardness and Fatigue on the Lifetime of a Modified Silver Coating in Fretting Wear and Corrosion Tests</i>. <i>2023 IEEE 68th Holm Conference on Electrical Contacts (HOLM)</i>. Electrical Contacts-IEEE Holm Conference on Electrical Contacts. [Piscataway, NJ]: IEEE, 2023. <a href=\"https://doi.org/10.1109/holm56075.2023.10352299\">https://doi.org/10.1109/holm56075.2023.10352299</a>.","ieee":"R. Probst and J. Song, <i>Influence of Hardness and Fatigue on the Lifetime of a Modified Silver Coating in Fretting Wear and Corrosion Tests</i>. [Piscataway, NJ]: IEEE, 2023, pp. 88–94. doi: <a href=\"https://doi.org/10.1109/holm56075.2023.10352299\">10.1109/holm56075.2023.10352299</a>.","ama":"Probst R, Song J. <i>Influence of Hardness and Fatigue on the Lifetime of a Modified Silver Coating in Fretting Wear and Corrosion Tests</i>. IEEE; 2023:88-94. doi:<a href=\"https://doi.org/10.1109/holm56075.2023.10352299\">10.1109/holm56075.2023.10352299</a>","van":"Probst R, Song J. Influence of Hardness and Fatigue on the Lifetime of a Modified Silver Coating in Fretting Wear and Corrosion Tests. 2023 IEEE 68th Holm Conference on Electrical Contacts (HOLM). [Piscataway, NJ]: IEEE; 2023. (Electrical Contacts-IEEE Holm Conference on Electrical Contacts)."},"place":"[Piscataway, NJ]","publication_status":"published","date_created":"2024-04-18T10:05:51Z","language":[{"iso":"eng"}],"title":"Influence of Hardness and Fatigue on the Lifetime of a Modified Silver Coating in Fretting Wear and Corrosion Tests","series_title":"Electrical Contacts-IEEE Holm Conference on Electrical Contacts","publication":"2023 IEEE 68th Holm Conference on Electrical Contacts (HOLM)","_id":"11359"},{"_id":"11360","publication":"2023 IEEE 68th Holm Conference on Electrical Contacts (HOLM)","series_title":"Electrical Contacts-IEEE Holm Conference on Electrical Contacts","title":"Advances in Evaluation of State of Health of Electrical Connectors","language":[{"iso":"eng"}],"date_created":"2024-04-18T10:11:50Z","publication_status":"published","place":"[Piscataway, NJ]","citation":{"ieee":"J. Song, A. R. Shukla, and R. Probst, <i>Advances in Evaluation of State of Health of Electrical Connectors</i>. [Piscataway, NJ]: IEEE, 2023, pp. 200–208. doi: <a href=\"https://doi.org/10.1109/holm56075.2023.10352279\">10.1109/holm56075.2023.10352279</a>.","ama":"Song J, Shukla AR, Probst R. <i>Advances in Evaluation of State of Health of Electrical Connectors</i>. IEEE; 2023:200-208. doi:<a href=\"https://doi.org/10.1109/holm56075.2023.10352279\">10.1109/holm56075.2023.10352279</a>","van":"Song J, Shukla AR, Probst R. Advances in Evaluation of State of Health of Electrical Connectors. 2023 IEEE 68th Holm Conference on Electrical Contacts (HOLM). [Piscataway, NJ]: IEEE; 2023. (Electrical Contacts-IEEE Holm Conference on Electrical Contacts).","bjps":"<b>Song J, Shukla AR and Probst R</b> (2023) <i>Advances in Evaluation of State of Health of Electrical Connectors</i>. [Piscataway, NJ]: IEEE.","din1505-2-1":"<span style=\"font-variant:small-caps;\">Song, Jian</span> ; <span style=\"font-variant:small-caps;\">Shukla, Abhay Rammurti</span> ; <span style=\"font-variant:small-caps;\">Probst, Roman</span>: <i>Advances in Evaluation of State of Health of Electrical Connectors</i>, <i>Electrical Contacts-IEEE Holm Conference on Electrical Contacts</i>. [Piscataway, NJ] : IEEE, 2023","chicago":"Song, Jian, Abhay Rammurti Shukla, and Roman Probst. <i>Advances in Evaluation of State of Health of Electrical Connectors</i>. <i>2023 IEEE 68th Holm Conference on Electrical Contacts (HOLM)</i>. Electrical Contacts-IEEE Holm Conference on Electrical Contacts. [Piscataway, NJ]: IEEE, 2023. <a href=\"https://doi.org/10.1109/holm56075.2023.10352279\">https://doi.org/10.1109/holm56075.2023.10352279</a>.","havard":"J. Song, A.R. Shukla, R. Probst, Advances in Evaluation of State of Health of Electrical Connectors, IEEE, [Piscataway, NJ], 2023.","short":"J. Song, A.R. Shukla, R. Probst, Advances in Evaluation of State of Health of Electrical Connectors, IEEE, [Piscataway, NJ], 2023.","mla":"Song, Jian, et al. “Advances in Evaluation of State of Health of Electrical Connectors.” <i>2023 IEEE 68th Holm Conference on Electrical Contacts (HOLM)</i>, IEEE, 2023, pp. 200–08, <a href=\"https://doi.org/10.1109/holm56075.2023.10352279\">https://doi.org/10.1109/holm56075.2023.10352279</a>.","apa":"Song, J., Shukla, A. R., &#38; Probst, R. (2023). Advances in Evaluation of State of Health of Electrical Connectors. In <i>2023 IEEE 68th Holm Conference on Electrical Contacts (HOLM)</i> (pp. 200–208). IEEE. <a href=\"https://doi.org/10.1109/holm56075.2023.10352279\">https://doi.org/10.1109/holm56075.2023.10352279</a>","ufg":"<b>Song, Jian/Shukla, Abhay Rammurti/Probst, Roman</b>: Advances in Evaluation of State of Health of Electrical Connectors, [Piscataway, NJ] 2023 (Electrical Contacts-IEEE Holm Conference on Electrical Contacts).","chicago-de":"Song, Jian, Abhay Rammurti Shukla und Roman Probst. 2023. <i>Advances in Evaluation of State of Health of Electrical Connectors</i>. <i>2023 IEEE 68th Holm Conference on Electrical Contacts (HOLM)</i>. Electrical Contacts-IEEE Holm Conference on Electrical Contacts. [Piscataway, NJ]: IEEE. doi:<a href=\"https://doi.org/10.1109/holm56075.2023.10352279\">10.1109/holm56075.2023.10352279</a>, ."},"publication_identifier":{"issn":["2158-9992"],"eissn":["2158‐9992"],"isbn":["979‐8‐3503‐4244‐4"],"eisbn":["979‐8‐3503‐4246‐8","979‐8‐3503‐4245‐1 "]},"author":[{"id":"5297","last_name":"Song","full_name":"Song, Jian","first_name":"Jian"},{"first_name":"Abhay Rammurti","id":"74188","last_name":"Shukla","full_name":"Shukla, Abhay Rammurti"},{"first_name":"Roman","id":"69156","last_name":"Probst","full_name":"Probst, Roman"}],"page":"200-208","conference":{"location":"Seattle","start_date":"2023-10-04","end_date":"2023-10-11","name":"68th Holm Conference on Electrical Contacts (HOLM)"},"abstract":[{"lang":"eng","text":"The state of health and lifetime estimation process of electrical connectors via lifetime tests is a time and labor intensive process. In our previous work, a correlation between the contact resistance developments in the early stages of lifetime tests of electrical connectors with the final results was established using a data driven statistical process based on probability distribution. Also, state of health indicators for prognosis of lifetime were introduced. In this work, the state of health indicators have been optimized. The sensitivity analysis is performed with regards to the selection of the appropriate amount of test data based on test duration for the reliable prognosis of the state of health and the characteristic lifetime. Through this the possibility of further reduction of test duration required for the reliable prognosis of state of health is investigated. Based on the results of analysis, a guideline for the determination of the duration of lifetime tests which lead to a reliable prediction of lifetime of connectors can be provided. Also, an assessment of the state of art in the prognosis of the lifetime of electrical connectors has been presented."}],"keyword":["accelerated life testing","test duration","contact resistance","statistical model","connector reliability"],"status":"public","year":"2023","user_id":"83781","date_updated":"2025-06-26T07:54:50Z","doi":"10.1109/holm56075.2023.10352279","publisher":"IEEE","type":"conference_editor_article"},{"status":"public","user_id":"83781","year":"2023","conference":{"location":"Toulouse (France)","start_date":"2023-10-02","end_date":"2023-10-05","name":"34rd European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF)"},"_id":"11361","publication_status":"published","language":[{"iso":"eng"}],"date_created":"2024-04-18T10:18:33Z","citation":{"ama":"Shukla AR, Martin R, Probst R, Song J. <i>Comparison of Different Statistical Methods for Prediction of Lifetime of Electrical Connectors with Short Term Tests</i>.; 2023.","van":"Shukla AR, Martin R, Probst R, Song J. Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests. 2023.","ieee":"A. R. Shukla, R. Martin, R. Probst, and J. Song, <i>Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests</i>. 2023.","chicago":"Shukla, Abhay Rammurti, Robert Martin, Roman Probst, and Jian Song. <i>Comparison of Different Statistical Methods for Prediction of Lifetime of Electrical Connectors with Short Term Tests</i>, 2023.","din1505-2-1":"<span style=\"font-variant:small-caps;\">Shukla, Abhay Rammurti</span> ; <span style=\"font-variant:small-caps;\">Martin, Robert</span> ; <span style=\"font-variant:small-caps;\">Probst, Roman</span> ; <span style=\"font-variant:small-caps;\">Song, Jian</span>: <i>Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests</i>, 2023","bjps":"<b>Shukla AR <i>et al.</i></b> (2023) <i>Comparison of Different Statistical Methods for Prediction of Lifetime of Electrical Connectors with Short Term Tests</i>. .","havard":"A.R. Shukla, R. Martin, R. Probst, J. Song, Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests, 2023.","chicago-de":"Shukla, Abhay Rammurti, Robert Martin, Roman Probst und Jian Song. 2023. <i>Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests</i>.","ufg":"<b>Shukla, Abhay Rammurti u. a.</b>: Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests, o. O. 2023.","mla":"Shukla, Abhay Rammurti, et al. <i>Comparison of Different Statistical Methods for Prediction of Lifetime of Electrical Connectors with Short Term Tests</i>. 2023.","apa":"Shukla, A. R., Martin, R., Probst, R., &#38; Song, J. (2023). <i>Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests</i>. 34rd European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Toulouse (France).","short":"A.R. Shukla, R. Martin, R. Probst, J. Song, Comparison of Different Statistical Methods for Prediction of Lifetime of Electrical Connectors with Short Term Tests, 2023."},"type":"conference_speech","author":[{"first_name":"Abhay Rammurti","id":"74188","last_name":"Shukla","full_name":"Shukla, Abhay Rammurti"},{"last_name":"Martin","full_name":"Martin, Robert","first_name":"Robert"},{"last_name":"Probst","id":"69156","full_name":"Probst, Roman","first_name":"Roman"},{"full_name":"Song, Jian","last_name":"Song","id":"5297","first_name":"Jian"}],"title":"Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests","date_updated":"2024-05-17T14:07:26Z"},{"user_id":"83781","year":"2023","department":[{"_id":"DEP6012"}],"status":"public","_id":"11362","conference":{"name":"International Tribology Conference (ITC)","end_date":"2023-09-30","start_date":"2023-09-25","location":"Fukuoka, Japan "},"author":[{"first_name":"Jian","full_name":"Song, Jian","last_name":"Song","id":"5297"},{"last_name":"Probst","id":"69156","full_name":"Probst, Roman","first_name":"Roman"},{"full_name":"Shukla, Abhay Rammurti","last_name":"Shukla","id":"74188","first_name":"Abhay Rammurti"},{"first_name":"Karolin","full_name":"Bünting, Karolin","last_name":"Bünting","id":"62067"}],"type":"conference_speech","citation":{"short":"J. Song, R. Probst, A.R. Shukla, K. Bünting, Influence of Tribological Properties of Contact Coatings on the Long Term Behavior of Electrical Contacts, 2023.","apa":"Song, J., Probst, R., Shukla, A. R., &#38; Bünting, K. (2023). <i>Influence of tribological properties of contact coatings on the long term behavior of electrical contacts</i>. International Tribology Conference (ITC), Fukuoka, Japan .","mla":"Song, Jian, et al. <i>Influence of Tribological Properties of Contact Coatings on the Long Term Behavior of Electrical Contacts</i>. 2023.","ufg":"<b>Song, Jian u. a.</b>: Influence of tribological properties of contact coatings on the long term behavior of electrical contacts, o. O. 2023.","chicago-de":"Song, Jian, Roman Probst, Abhay Rammurti Shukla und Karolin Bünting. 2023. <i>Influence of tribological properties of contact coatings on the long term behavior of electrical contacts</i>.","havard":"J. Song, R. Probst, A.R. Shukla, K. Bünting, Influence of tribological properties of contact coatings on the long term behavior of electrical contacts, 2023.","bjps":"<b>Song J <i>et al.</i></b> (2023) <i>Influence of Tribological Properties of Contact Coatings on the Long Term Behavior of Electrical Contacts</i>. .","din1505-2-1":"<span style=\"font-variant:small-caps;\">Song, Jian</span> ; <span style=\"font-variant:small-caps;\">Probst, Roman</span> ; <span style=\"font-variant:small-caps;\">Shukla, Abhay Rammurti</span> ; <span style=\"font-variant:small-caps;\">Bünting, Karolin</span>: <i>Influence of tribological properties of contact coatings on the long term behavior of electrical contacts</i>, 2023","chicago":"Song, Jian, Roman Probst, Abhay Rammurti Shukla, and Karolin Bünting. <i>Influence of Tribological Properties of Contact Coatings on the Long Term Behavior of Electrical Contacts</i>, 2023.","ieee":"J. Song, R. Probst, A. R. Shukla, and K. Bünting, <i>Influence of tribological properties of contact coatings on the long term behavior of electrical contacts</i>. 2023.","ama":"Song J, Probst R, Shukla AR, Bünting K. <i>Influence of Tribological Properties of Contact Coatings on the Long Term Behavior of Electrical Contacts</i>.; 2023.","van":"Song J, Probst R, Shukla AR, Bünting K. Influence of tribological properties of contact coatings on the long term behavior of electrical contacts. 2023."},"publication_status":"published","language":[{"iso":"eng"}],"date_created":"2024-04-18T10:31:49Z","date_updated":"2024-05-17T14:05:11Z","title":"Influence of tribological properties of contact coatings on the long term behavior of electrical contacts"},{"date_updated":"2024-08-05T07:30:51Z","doi":"10.1016/j.microrel.2022.114684","title":"Prediction of failure in time (FIT) of electrical connectors with short term tests","issue":"November 2022","citation":{"din1505-2-1":"<span style=\"font-variant:small-caps;\">Song, Jian</span> ; <span style=\"font-variant:small-caps;\">Shukla, Abhay Rammurti</span> ; <span style=\"font-variant:small-caps;\">Probst, Roman</span>: Prediction of failure in time (FIT) of electrical connectors with short term tests. In: <i>Microelectronics reliability : an internat. journal &#38; world abstracting service</i> Bd. 138. Amsterdam, Elsevier (2022), Nr. November 2022","bjps":"<b>Song J, Shukla AR and Probst R</b> (2022) Prediction of Failure in Time (FIT) of Electrical Connectors with Short Term Tests. <i>Microelectronics reliability : an internat. journal &#38; world abstracting service</i> <b>138</b>.","chicago":"Song, Jian, Abhay Rammurti Shukla, and Roman Probst. “Prediction of Failure in Time (FIT) of Electrical Connectors with Short Term Tests.” <i>Microelectronics Reliability : An Internat. Journal &#38; World Abstracting Service</i> 138, no. November 2022 (2022). <a href=\"https://doi.org/10.1016/j.microrel.2022.114684\">https://doi.org/10.1016/j.microrel.2022.114684</a>.","ieee":"J. Song, A. R. Shukla, and R. Probst, “Prediction of failure in time (FIT) of electrical connectors with short term tests,” <i>Microelectronics reliability : an internat. journal &#38; world abstracting service</i>, vol. 138, no. November 2022, Art. no. 114684, 2022, doi: <a href=\"https://doi.org/10.1016/j.microrel.2022.114684\">10.1016/j.microrel.2022.114684</a>.","ama":"Song J, Shukla AR, Probst R. Prediction of failure in time (FIT) of electrical connectors with short term tests. <i>Microelectronics reliability : an internat journal &#38; world abstracting service</i>. 2022;138(November 2022). doi:<a href=\"https://doi.org/10.1016/j.microrel.2022.114684\">10.1016/j.microrel.2022.114684</a>","van":"Song J, Shukla AR, Probst R. Prediction of failure in time (FIT) of electrical connectors with short term tests. Microelectronics reliability : an internat journal &#38; world abstracting service. 2022;138(November 2022).","apa":"Song, J., Shukla, A. R., &#38; Probst, R. (2022). Prediction of failure in time (FIT) of electrical connectors with short term tests. <i>Microelectronics Reliability : An Internat. Journal &#38; World Abstracting Service</i>, <i>138</i>(November 2022), Article 114684. <a href=\"https://doi.org/10.1016/j.microrel.2022.114684\">https://doi.org/10.1016/j.microrel.2022.114684</a>","mla":"Song, Jian, et al. “Prediction of Failure in Time (FIT) of Electrical Connectors with Short Term Tests.” <i>Microelectronics Reliability : An Internat. Journal &#38; World Abstracting Service</i>, vol. 138, no. November 2022, 114684, 2022, <a href=\"https://doi.org/10.1016/j.microrel.2022.114684\">https://doi.org/10.1016/j.microrel.2022.114684</a>.","short":"J. Song, A.R. Shukla, R. Probst, Microelectronics Reliability : An Internat. Journal &#38; World Abstracting Service 138 (2022).","chicago-de":"Song, Jian, Abhay Rammurti Shukla und Roman Probst. 2022. Prediction of failure in time (FIT) of electrical connectors with short term tests. <i>Microelectronics reliability : an internat. journal &#38; world abstracting service</i> 138, Nr. November 2022. doi:<a href=\"https://doi.org/10.1016/j.microrel.2022.114684\">10.1016/j.microrel.2022.114684</a>, .","ufg":"<b>Song, Jian/Shukla, Abhay Rammurti/Probst, Roman</b>: Prediction of failure in time (FIT) of electrical connectors with short term tests, in: <i>Microelectronics reliability : an internat. journal &#38; world abstracting service</i> 138 (2022), H. November 2022.","havard":"J. Song, A.R. Shukla, R. Probst, Prediction of failure in time (FIT) of electrical connectors with short term tests, Microelectronics Reliability : An Internat. Journal &#38; World Abstracting Service. 138 (2022)."},"place":"Amsterdam","volume":138,"publication_status":"published","language":[{"iso":"eng"}],"publisher":"Elsevier","date_created":"2022-12-11T13:13:46Z","type":"scientific_journal_article","intvolume":"       138","author":[{"first_name":"Jian","full_name":"Song, Jian","id":"5297","last_name":"Song"},{"last_name":"Shukla","id":"72757","full_name":"Shukla, Abhay Rammurti","first_name":"Abhay Rammurti"},{"first_name":"Roman","last_name":"Probst","id":"69156","full_name":"Probst, Roman"}],"publication_identifier":{"issn":["0026-2714"]},"abstract":[{"text":"Failure in time (FIT) is an important measure for the reliability of electrical connectors. Due to the very long lifetime of connectors, the tests for the determination of FIT rate are time and labour intensive. In this paper a data driven method using a statistical process to estimate the FIT rate of electrical connectors with data of electrical contact resistance development in short term tests is proposed. The results of prediction are then compared with the results from long term tests. The study shows a strong correlation between contact resistance development in short term tests and the development of the number of failures in later stages of tests. In order to predict the development of degradation precisely, the distribution of resistance data in many different tests with different connectors is investigated. The Generalized Extreme Value Distribution, which reveals an ideal fitting, has been implemented for the prediction of the failure rates of connectors, thereby enabling a remarkable time-lapse of lifetime tests. This method can also be employed in the prognosis and management of system health through the forecast of health of connectors in different systems in operation.","lang":"eng"}],"article_number":"114684","_id":"9206","keyword":["Electrical connectors","Prediction of lifetime","FIT","Correlation between data in short and long term tests","Time-lapse of lifetime tests"],"status":"public","publication":"Microelectronics reliability : an internat. journal & world abstracting service","user_id":"83781","year":"2022","department":[{"_id":"DEP6012"}]},{"title":"Korrelation des Kontaktwiderstands elektrischer Kontakte mit dem Verschleiß bei Reibverschleißprüfungen","date_updated":"2024-08-05T07:41:52Z","publisher":"GfT Gesellschaft für Tribologie e.V.","date_created":"2022-12-11T13:40:34Z","language":[{"iso":"ger"}],"publication_status":"published","place":"Aachen","citation":{"short":"R. Probst, J. Song, Korrelation des Kontaktwiderstands elektrischer Kontakte mit dem Verschleiß bei Reibverschleißprüfungen, GfT Gesellschaft für Tribologie e.V., Aachen, 2022.","apa":"Probst, R., &#38; Song, J. (2022). Korrelation des Kontaktwiderstands elektrischer Kontakte mit dem Verschleiß bei Reibverschleißprüfungen. In Gesellschaft für Tribologie (Ed.), <i>Reibung, Schmierung und Verschleiß : Forschung und praktische Anwendungen : 63. Tribologie-Fachtagung 2022, 26. bis 28. September 2022 in Göttingen</i> (p. 57/1-4). GfT Gesellschaft für Tribologie e.V.","mla":"Probst, Roman, and Jian Song. “Korrelation des Kontaktwiderstands elektrischer Kontakte mit dem Verschleiß bei Reibverschleißprüfungen.” <i>Reibung, Schmierung und Verschleiß : Forschung und praktische Anwendungen : 63. Tribologie-Fachtagung 2022, 26. bis 28. September 2022 in Göttingen</i>, edited by Gesellschaft für Tribologie, GfT Gesellschaft für Tribologie e.V., 2022, p. 57/1-4.","ufg":"<b>Probst, Roman/Song, Jian</b>: Korrelation des Kontaktwiderstands elektrischer Kontakte mit dem Verschleiß bei Reibverschleißprüfungen, hg. von Gesellschaft für Tribologie, Aachen 2022.","chicago-de":"Probst, Roman und Jian Song. 2022. <i>Korrelation des Kontaktwiderstands elektrischer Kontakte mit dem Verschleiß bei Reibverschleißprüfungen</i>. Hg. von Gesellschaft für Tribologie. <i>Reibung, Schmierung und Verschleiß : Forschung und praktische Anwendungen : 63. Tribologie-Fachtagung 2022, 26. bis 28. September 2022 in Göttingen</i>. Aachen: GfT Gesellschaft für Tribologie e.V.","havard":"R. Probst, J. Song, Korrelation des Kontaktwiderstands elektrischer Kontakte mit dem Verschleiß bei Reibverschleißprüfungen, GfT Gesellschaft für Tribologie e.V., Aachen, 2022.","bjps":"<b>Probst R and Song J</b> (2022) <i>Korrelation des Kontaktwiderstands elektrischer Kontakte mit dem Verschleiß bei Reibverschleißprüfungen</i>, Gesellschaft für Tribologie (ed.). Aachen: GfT Gesellschaft für Tribologie e.V.","din1505-2-1":"<span style=\"font-variant:small-caps;\">Probst, Roman</span> ; <span style=\"font-variant:small-caps;\">Song, Jian</span> ; <span style=\"font-variant:small-caps;\">Gesellschaft für Tribologie</span> (Hrsg.): <i>Korrelation des Kontaktwiderstands elektrischer Kontakte mit dem Verschleiß bei Reibverschleißprüfungen</i>. Aachen : GfT Gesellschaft für Tribologie e.V., 2022","chicago":"Probst, Roman, and Jian Song. <i>Korrelation des Kontaktwiderstands elektrischer Kontakte mit dem Verschleiß bei Reibverschleißprüfungen</i>. Edited by Gesellschaft für Tribologie. <i>Reibung, Schmierung und Verschleiß : Forschung und praktische Anwendungen : 63. Tribologie-Fachtagung 2022, 26. bis 28. September 2022 in Göttingen</i>. Aachen: GfT Gesellschaft für Tribologie e.V., 2022.","ieee":"R. Probst and J. Song, <i>Korrelation des Kontaktwiderstands elektrischer Kontakte mit dem Verschleiß bei Reibverschleißprüfungen</i>. Aachen: GfT Gesellschaft für Tribologie e.V., 2022, p. 57/1–4.","ama":"Probst R, Song J. <i>Korrelation des Kontaktwiderstands elektrischer Kontakte mit dem Verschleiß bei Reibverschleißprüfungen</i>. (Gesellschaft für Tribologie, ed.). GfT Gesellschaft für Tribologie e.V.; 2022:57/1-4.","van":"Probst R, Song J. Korrelation des Kontaktwiderstands elektrischer Kontakte mit dem Verschleiß bei Reibverschleißprüfungen. Gesellschaft für Tribologie, editor. Reibung, Schmierung und Verschleiß : Forschung und praktische Anwendungen : 63. Tribologie-Fachtagung 2022, 26. bis 28. September 2022 in Göttingen. Aachen: GfT Gesellschaft für Tribologie e.V.; 2022."},"publication_identifier":{"isbn":[" 978-3-9817451-7-7 "]},"type":"conference_editor_article","author":[{"full_name":"Probst, Roman","id":"69156","last_name":"Probst","first_name":"Roman"},{"last_name":"Song","id":"5297","full_name":"Song, Jian","first_name":"Jian"}],"conference":{"location":"Göttingen","name":"63. Tribologie-Fachtagung","end_date":"2022-09-28","start_date":"2022-09-26"},"page":"57/1-4","_id":"9209","publication":"Reibung, Schmierung und Verschleiß : Forschung und praktische Anwendungen : 63. Tribologie-Fachtagung 2022, 26. bis 28. September 2022 in Göttingen","status":"public","department":[{"_id":"DEP6012"}],"corporate_editor":["Gesellschaft für Tribologie"],"user_id":"83781","year":"2022"},{"keyword":["Nanoparticles","Resistance","Fabrication","Silver","Costs","Contacts","Voltage"],"abstract":[{"lang":"eng","text":"In order to guarantee long lifetime and high performance of electrical contacts, a plating is usually applied on the base material. Silver is a promising plating material because of a good balance between performance and costs. The conventional silver plating is soft; therefore, a thick silver plating should be used to prevent the wear through during the operation. In order to enhance the wear resistance and prolong the lifetime of the silver plating, silver platings are modified by co-depositing nanoparticles with a core/shell structure into the silver matrix. A novel method to prepare the Ag (shell)@Al 2 O 3 (core) nanoparticles by galvanic process is introduced in this paper. The influence of fabrication parameters in the galvanic process such as the concentration of silver nitrate solution and the plating voltage on the silver content in the Ag@Al 2 O 3 nanoparticles is investigated. Afterwards, different concentrations of core/shell nanoparticles are co-deposited into the silver plating to study the effect of nanoparticles on the microhardness, microstructure and the lifetime of the silver plating. As a result, the microhardness and the lifetime of the silver plating are significantly improved and a favorable nanoparticle concentration exists for the longest lifetime. Moreover, the mechanism of the lifetime improvement is determined."}],"conference":{"location":" Tampa, FL, USA","name":"67th Holm Conference on Electrical Contacts","end_date":"2022-10-26","start_date":"2022-10-23"},"page":"166 - 173","year":"2022","user_id":"83781","department":[{"_id":"DEP6012"}],"status":"public","date_updated":"2024-08-05T08:01:04Z","doi":"10.1109/HLM54538.2022.9969773","type":"conference_editor_article","publisher":"IEEE","_id":"9210","publication":"Electrical contacts - 2022 : proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts","title":"Influence of Core/Shell Nanoparticles on the Fretting Behavior of Electrical Contacts","author":[{"first_name":"Haomiao","full_name":"Yuan, Haomiao","last_name":"Yuan","id":"61860"},{"first_name":"Roman","full_name":"Probst, Roman","id":"69156","last_name":"Probst"},{"first_name":"Jian","id":"5297","last_name":"Song","full_name":"Song, Jian"}],"publication_identifier":{"eissn":["978-1-6654-5965-5"],"issn":["2158-9992"],"isbn":["978-1-6654-5966-2","978-1-6654-5967-9"]},"citation":{"ieee":"H. Yuan, R. Probst, and J. Song, <i>Influence of Core/Shell Nanoparticles on the Fretting Behavior of Electrical Contacts</i>. Piscataway, NJ: IEEE, 2022, pp. 166–173. doi: <a href=\"https://doi.org/10.1109/HLM54538.2022.9969773\">10.1109/HLM54538.2022.9969773</a>.","ama":"Yuan H, Probst R, Song J. <i>Influence of Core/Shell Nanoparticles on the Fretting Behavior of Electrical Contacts</i>. IEEE; 2022:166-173. doi:<a href=\"https://doi.org/10.1109/HLM54538.2022.9969773\">10.1109/HLM54538.2022.9969773</a>","van":"Yuan H, Probst R, Song J. Influence of Core/Shell Nanoparticles on the Fretting Behavior of Electrical Contacts. Electrical contacts - 2022 : proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts. Piscataway, NJ: IEEE; 2022.","din1505-2-1":"<span style=\"font-variant:small-caps;\">Yuan, Haomiao</span> ; <span style=\"font-variant:small-caps;\">Probst, Roman</span> ; <span style=\"font-variant:small-caps;\">Song, Jian</span>: <i>Influence of Core/Shell Nanoparticles on the Fretting Behavior of Electrical Contacts</i>. Piscataway, NJ : IEEE, 2022","bjps":"<b>Yuan H, Probst R and Song J</b> (2022) <i>Influence of Core/Shell Nanoparticles on the Fretting Behavior of Electrical Contacts</i>. Piscataway, NJ: IEEE.","chicago":"Yuan, Haomiao, Roman Probst, and Jian Song. <i>Influence of Core/Shell Nanoparticles on the Fretting Behavior of Electrical Contacts</i>. <i>Electrical Contacts - 2022 : Proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts</i>. Piscataway, NJ: IEEE, 2022. <a href=\"https://doi.org/10.1109/HLM54538.2022.9969773\">https://doi.org/10.1109/HLM54538.2022.9969773</a>.","havard":"H. Yuan, R. Probst, J. Song, Influence of Core/Shell Nanoparticles on the Fretting Behavior of Electrical Contacts, IEEE, Piscataway, NJ, 2022.","apa":"Yuan, H., Probst, R., &#38; Song, J. (2022). Influence of Core/Shell Nanoparticles on the Fretting Behavior of Electrical Contacts. In <i>Electrical contacts - 2022 : proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts</i> (pp. 166–173). IEEE. <a href=\"https://doi.org/10.1109/HLM54538.2022.9969773\">https://doi.org/10.1109/HLM54538.2022.9969773</a>","mla":"Yuan, Haomiao, et al. “Influence of Core/Shell Nanoparticles on the Fretting Behavior of Electrical Contacts.” <i>Electrical Contacts - 2022 : Proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts</i>, IEEE, 2022, pp. 166–73, <a href=\"https://doi.org/10.1109/HLM54538.2022.9969773\">https://doi.org/10.1109/HLM54538.2022.9969773</a>.","short":"H. Yuan, R. Probst, J. Song, Influence of Core/Shell Nanoparticles on the Fretting Behavior of Electrical Contacts, IEEE, Piscataway, NJ, 2022.","chicago-de":"Yuan, Haomiao, Roman Probst und Jian Song. 2022. <i>Influence of Core/Shell Nanoparticles on the Fretting Behavior of Electrical Contacts</i>. <i>Electrical contacts - 2022 : proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts</i>. Piscataway, NJ: IEEE. doi:<a href=\"https://doi.org/10.1109/HLM54538.2022.9969773\">10.1109/HLM54538.2022.9969773</a>, .","ufg":"<b>Yuan, Haomiao/Probst, Roman/Song, Jian</b>: Influence of Core/Shell Nanoparticles on the Fretting Behavior of Electrical Contacts, Piscataway, NJ 2022."},"place":"Piscataway, NJ","publication_status":"published","date_created":"2022-12-11T13:46:02Z","language":[{"iso":"eng"}]},{"title":"State of Health of Connectors – Early Indicators","citation":{"ufg":"<b>Song, Jian/Shukla, Abhay Rammurti/Probst, Roman</b>: State of Health of Connectors – Early Indicators, Piscataway, NJ 2022.","chicago-de":"Song, Jian, Abhay Rammurti Shukla und Roman Probst. 2022. <i>State of Health of Connectors – Early Indicators</i>. <i>Electrical contacts - 2022 : proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts</i>. Piscataway, NJ: IEEE. doi:<a href=\"https://doi.org/10.1109/HLM54538.2022.9969839\">10.1109/HLM54538.2022.9969839</a>, .","short":"J. Song, A.R. Shukla, R. Probst, State of Health of Connectors – Early Indicators, IEEE, Piscataway, NJ, 2022.","mla":"Song, Jian, et al. “State of Health of Connectors – Early Indicators.” <i>Electrical Contacts - 2022 : Proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts</i>, IEEE, 2022, pp. 272–78, <a href=\"https://doi.org/10.1109/HLM54538.2022.9969839\">https://doi.org/10.1109/HLM54538.2022.9969839</a>.","apa":"Song, J., Shukla, A. R., &#38; Probst, R. (2022). State of Health of Connectors – Early Indicators. In <i>Electrical contacts - 2022 : proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts</i> (pp. 272–278). IEEE. <a href=\"https://doi.org/10.1109/HLM54538.2022.9969839\">https://doi.org/10.1109/HLM54538.2022.9969839</a>","havard":"J. Song, A.R. Shukla, R. Probst, State of Health of Connectors – Early Indicators, IEEE, Piscataway, NJ, 2022.","chicago":"Song, Jian, Abhay Rammurti Shukla, and Roman Probst. <i>State of Health of Connectors – Early Indicators</i>. <i>Electrical Contacts - 2022 : Proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts</i>. Piscataway, NJ: IEEE, 2022. <a href=\"https://doi.org/10.1109/HLM54538.2022.9969839\">https://doi.org/10.1109/HLM54538.2022.9969839</a>.","bjps":"<b>Song J, Shukla AR and Probst R</b> (2022) <i>State of Health of Connectors – Early Indicators</i>. Piscataway, NJ: IEEE.","din1505-2-1":"<span style=\"font-variant:small-caps;\">Song, Jian</span> ; <span style=\"font-variant:small-caps;\">Shukla, Abhay Rammurti</span> ; <span style=\"font-variant:small-caps;\">Probst, Roman</span>: <i>State of Health of Connectors – Early Indicators</i>. Piscataway, NJ : IEEE, 2022","ama":"Song J, Shukla AR, Probst R. <i>State of Health of Connectors – Early Indicators</i>. IEEE; 2022:272-278. doi:<a href=\"https://doi.org/10.1109/HLM54538.2022.9969839\">10.1109/HLM54538.2022.9969839</a>","van":"Song J, Shukla AR, Probst R. State of Health of Connectors – Early Indicators. Electrical contacts - 2022 : proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts. Piscataway, NJ: IEEE; 2022.","ieee":"J. Song, A. R. Shukla, and R. Probst, <i>State of Health of Connectors – Early Indicators</i>. Piscataway, NJ: IEEE, 2022, pp. 272–278. doi: <a href=\"https://doi.org/10.1109/HLM54538.2022.9969839\">10.1109/HLM54538.2022.9969839</a>."},"place":"Piscataway, NJ","publication_status":"published","language":[{"iso":"eng"}],"date_created":"2022-12-11T13:50:30Z","author":[{"first_name":"Jian","last_name":"Song","id":"5297","full_name":"Song, Jian"},{"first_name":"Abhay Rammurti","id":"72757","last_name":"Shukla","full_name":"Shukla, Abhay Rammurti"},{"id":"69156","last_name":"Probst","full_name":"Probst, Roman","first_name":"Roman"}],"publication_identifier":{"issn":["2158-9992"],"isbn":["978-1-6654-5966-2","978-1-6654-5967-9"],"eisbn":["978-1-6654-5965-5"]},"_id":"9211","publication":"Electrical contacts - 2022 : proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts","date_updated":"2024-08-05T08:01:22Z","doi":"10.1109/HLM54538.2022.9969839","publisher":"IEEE","type":"conference_editor_article","abstract":[{"text":"Lifetime tests of connectors are time consuming and labor intensive. Our study reveals a strong correlation between the statistical characteristics of contact resistance development in the early stages of lifetime tests and the final results of the tests. This correlation enables a further time lapse of lifetime tests and the prediction of the state of the health of connectors which can be utilized in the development of diagnostic strategy in sophisticated networks with very high number of connectors as well as in a quick classification of connectors with respect to their design features. Methods of statistical evaluation are introduced and the sensitivity analyses of different characteristics for the state of health of connectors are conducted.","lang":"eng"}],"conference":{"location":"Tampa, FL, USA","name":"67th Holm Conference on Electrical Contacts","start_date":"2022-10-23","end_date":"2022-10-26"},"page":"272 - 278","keyword":["Connectors","Correlation","Sensitivity analysis","Contact resistance","Lifetime estimation","Reliability","Electrical resistance measurement"],"status":"public","year":"2022","user_id":"83781","department":[{"_id":"DEP6012"}]}]