---
_id: '12887'
author:
- first_name: Roman
  full_name: Probst, Roman
  id: '69156'
  last_name: Probst
- first_name: Jian
  full_name: Song, Jian
  id: '5297'
  last_name: Song
citation:
  ama: Probst R, Song J. <i>Einfluss von Vibration auf die Mikrobewegung von Steckverbindern</i>.
    (Song J, VDE/VDI-Gesellschaft Mikroelektronik, Mikrosystem- und Feinwerktechnik
    (GMM), Technische Hochschule Ostwestfalen-Lippe, eds.). Labor für Feinsystemtechnik,
    Technische Hochschule Ostwestfalen-Lippe; 2025:222-230.
  apa: 'Probst, R., &#38; Song, J. (2025). Einfluss von Vibration auf die Mikrobewegung
    von Steckverbindern. In J. Song, VDE/VDI-Gesellschaft Mikroelektronik, Mikrosystem-
    und Feinwerktechnik (GMM), &#38; Technische Hochschule Ostwestfalen-Lippe (Eds.),
    <i>Elektrische und optische Verbindungstechnik 2025 : Tagungsband der VDE/VDI
    GMM-Fachtagung : 10. Symposium Connectors</i> (pp. 222–230). Labor für Feinsystemtechnik,
    Technische Hochschule Ostwestfalen-Lippe.'
  bjps: '<b>Probst R and Song J</b> (2025) <i>Einfluss von Vibration auf die Mikrobewegung
    von Steckverbindern</i>, Song J, VDE/VDI-Gesellschaft Mikroelektronik, Mikrosystem-
    und Feinwerktechnik (GMM), and Technische Hochschule Ostwestfalen-Lippe (eds).
    Lemgo: Labor für Feinsystemtechnik, Technische Hochschule Ostwestfalen-Lippe.'
  chicago: 'Probst, Roman, and Jian Song. <i>Einfluss von Vibration auf die Mikrobewegung
    von Steckverbindern</i>. Edited by Jian Song, VDE/VDI-Gesellschaft Mikroelektronik,
    Mikrosystem- und Feinwerktechnik (GMM), and Technische Hochschule Ostwestfalen-Lippe.
    <i>Elektrische und optische Verbindungstechnik 2025 : Tagungsband der VDE/VDI
    GMM-Fachtagung : 10. Symposium Connectors</i>. Lemgo: Labor für Feinsystemtechnik,
    Technische Hochschule Ostwestfalen-Lippe, 2025.'
  chicago-de: 'Probst, Roman und Jian Song. 2025. <i>Einfluss von Vibration auf die
    Mikrobewegung von Steckverbindern</i>. Hg. von Jian Song, VDE/VDI-Gesellschaft
    Mikroelektronik, Mikrosystem- und Feinwerktechnik (GMM), und Technische Hochschule
    Ostwestfalen-Lippe. <i>Elektrische und optische Verbindungstechnik 2025 : Tagungsband
    der VDE/VDI GMM-Fachtagung : 10. Symposium Connectors</i>. Lemgo: Labor für Feinsystemtechnik,
    Technische Hochschule Ostwestfalen-Lippe.'
  din1505-2-1: '<span style="font-variant:small-caps;">Probst, Roman</span> ; <span
    style="font-variant:small-caps;">Song, Jian</span> ; <span style="font-variant:small-caps;">Song,
    J.</span> ; <span style="font-variant:small-caps;">VDE/VDI-Gesellschaft Mikroelektronik,
    Mikrosystem- und Feinwerktechnik (GMM)</span> ; <span style="font-variant:small-caps;">Technische
    Hochschule Ostwestfalen-Lippe</span> (Hrsg.): <i>Einfluss von Vibration auf die
    Mikrobewegung von Steckverbindern</i>. Lemgo : Labor für Feinsystemtechnik, Technische
    Hochschule Ostwestfalen-Lippe, 2025'
  havard: R. Probst, J. Song, Einfluss von Vibration auf die Mikrobewegung von Steckverbindern,
    Labor für Feinsystemtechnik, Technische Hochschule Ostwestfalen-Lippe, Lemgo,
    2025.
  ieee: 'R. Probst and J. Song, <i>Einfluss von Vibration auf die Mikrobewegung von
    Steckverbindern</i>. Lemgo: Labor für Feinsystemtechnik, Technische Hochschule
    Ostwestfalen-Lippe, 2025, pp. 222–230.'
  mla: 'Probst, Roman, and Jian Song. “Einfluss von Vibration auf die Mikrobewegung
    von Steckverbindern.” <i>Elektrische und optische Verbindungstechnik 2025 : Tagungsband
    der VDE/VDI GMM-Fachtagung : 10. Symposium Connectors</i>, edited by Jian Song
    et al., Labor für Feinsystemtechnik, Technische Hochschule Ostwestfalen-Lippe,
    2025, pp. 222–30.'
  short: R. Probst, J. Song, Einfluss von Vibration auf die Mikrobewegung von Steckverbindern,
    Labor für Feinsystemtechnik, Technische Hochschule Ostwestfalen-Lippe, Lemgo,
    2025.
  ufg: '<b>Probst, Roman/Song, Jian</b>: Einfluss von Vibration auf die Mikrobewegung
    von Steckverbindern, hg. von Song, Jian/VDE/VDI-Gesellschaft Mikroelektronik,
    Mikrosystem- und Feinwerktechnik (GMM), Technische Hochschule Ostwestfalen-Lippe,
    Lemgo 2025.'
  van: 'Probst R, Song J. Einfluss von Vibration auf die Mikrobewegung von Steckverbindern.
    Song J, VDE/VDI-Gesellschaft Mikroelektronik, Mikrosystem- und Feinwerktechnik
    (GMM), Technische Hochschule Ostwestfalen-Lippe, editors. Elektrische und optische
    Verbindungstechnik 2025 : Tagungsband der VDE/VDI GMM-Fachtagung : 10. Symposium
    Connectors. Lemgo: Labor für Feinsystemtechnik, Technische Hochschule Ostwestfalen-Lippe;
    2025.'
conference:
  end_date: 2025-03-20
  location: Lemgo
  name: 10. Symposium Connectors
  start_date: 2025-03-19
corporate_editor:
- VDE/VDI-Gesellschaft Mikroelektronik, Mikrosystem- und Feinwerktechnik (GMM)
- Technische Hochschule Ostwestfalen-Lippe
date_created: 2025-05-05T11:19:47Z
date_updated: 2026-04-01T12:40:40Z
department:
- _id: DEP6012
editor:
- first_name: Jian
  full_name: Song, Jian
  id: '5297'
  last_name: Song
language:
- iso: ger
page: 222-230
place: Lemgo
publication: 'Elektrische und optische Verbindungstechnik 2025 : Tagungsband der VDE/VDI
  GMM-Fachtagung : 10. Symposium Connectors'
publication_identifier:
  isbn:
  - 978-3-00-081713-7
publication_status: published
publisher: Labor für Feinsystemtechnik, Technische Hochschule Ostwestfalen-Lippe
status: public
title: Einfluss von Vibration auf die Mikrobewegung von Steckverbindern
type: conference_editor_article
user_id: '83778'
year: '2025'
...
---
_id: '12761'
abstract:
- lang: eng
  text: For modern machines, factories and electric and autonomous vehicles, the importance
    of vreliable electrical connectors cannot be overstated. With an increasing number
    of connectors being used in machines, factories and vehicles, ensuring their reliability
    is crucial for comfort and safety alike. One of the key indicators of reliability
    is the lifetime of connectors. To evaluate the lifetime of electrical connectors,
    a testing method and a model for calculating their lifetime based on the test
    data were developed. The results from these tests were compared to failure analysis
    data from long-term field operations. The findings indicate that the laboratory
    tests can accurately reproduce the main failures observed in the field. However,
    such lifetime tests can be time- and labor-intensive. To address this challenge,
    a data-driven method is proposed that predicts the lifetime of electrical connectors
    using statistical analysis of electrical contact resistance data collected from
    short-term tests. The predictions from this method were compared to actual results
    obtained from long-term tests. A strong correlation was observed between the contact
    resistance development in short-term tests and the number of failures in later
    stages of testing. Thus, apart from predicting the lifetime of connectors, this
    method can also be applied for failure prognosis in real-time operations.
author:
- first_name: Jian
  full_name: Song, Jian
  id: '5297'
  last_name: Song
- first_name: Abhay Rammurti
  full_name: Shukla, Abhay Rammurti
  id: '74188'
  last_name: Shukla
- first_name: Roman
  full_name: Probst, Roman
  id: '69156'
  last_name: Probst
citation:
  ama: Song J, Shukla AR, Probst R. The State of Health of Electrical Connectors.
    <i>Machines</i>. 2024;7(12):474. doi:<a href="https://doi.org/10.3390/machines12070474">https://doi.org/10.3390/machines12070474</a>
  apa: Song, J., Shukla, A. R., &#38; Probst, R. (2024). The State of Health of Electrical
    Connectors. <i>Machines</i>, <i>7</i>(12), 474. <a href="https://doi.org/10.3390/machines12070474">https://doi.org/10.3390/machines12070474</a>
  bjps: <b>Song J, Shukla AR and Probst R</b> (2024) The State of Health of Electrical
    Connectors. <i>Machines</i> <b>7</b>, 474.
  chicago: 'Song, Jian, Abhay Rammurti Shukla, and Roman Probst. “The State of Health
    of Electrical Connectors.” <i>Machines</i> 7, no. 12 (2024): 474. <a href="https://doi.org/10.3390/machines12070474">https://doi.org/10.3390/machines12070474</a>.'
  chicago-de: 'Song, Jian, Abhay Rammurti Shukla und Roman Probst. 2024. The State
    of Health of Electrical Connectors. <i>Machines</i> 7, Nr. 12: 474. doi:<a href="https://doi.org/10.3390/machines12070474">https://doi.org/10.3390/machines12070474</a>,
    .'
  din1505-2-1: '<span style="font-variant:small-caps;">Song, Jian</span> ; <span style="font-variant:small-caps;">Shukla,
    Abhay Rammurti</span> ; <span style="font-variant:small-caps;">Probst, Roman</span>:
    The State of Health of Electrical Connectors. In: <i>Machines</i> Bd. 7. Basel,
    MDPI (2024), Nr. 12, S. 474'
  havard: J. Song, A.R. Shukla, R. Probst, The State of Health of Electrical Connectors,
    Machines. 7 (2024) 474.
  ieee: 'J. Song, A. R. Shukla, and R. Probst, “The State of Health of Electrical
    Connectors,” <i>Machines</i>, vol. 7, no. 12, p. 474, 2024, doi: <a href="https://doi.org/10.3390/machines12070474">https://doi.org/10.3390/machines12070474</a>.'
  mla: Song, Jian, et al. “The State of Health of Electrical Connectors.” <i>Machines</i>,
    vol. 7, no. 12, 2024, p. 474, <a href="https://doi.org/10.3390/machines12070474">https://doi.org/10.3390/machines12070474</a>.
  short: J. Song, A.R. Shukla, R. Probst, Machines 7 (2024) 474.
  ufg: '<b>Song, Jian/Shukla, Abhay Rammurti/Probst, Roman</b>: The State of Health
    of Electrical Connectors, in: <i>Machines</i> 7 (2024), H. 12,  S. 474.'
  van: Song J, Shukla AR, Probst R. The State of Health of Electrical Connectors.
    Machines. 2024;7(12):474.
date_created: 2025-04-04T09:23:10Z
date_updated: 2025-06-25T13:03:28Z
department:
- _id: DEP6012
doi: https://doi.org/10.3390/machines12070474
external_id:
  isi:
  - '001277040200001'
intvolume: '         7'
isi: '1'
issue: '12'
keyword:
- electrical connectors
- accelerated life testing
- statistical model
- lifetime prognosis
- reliability
- state of health
language:
- iso: eng
page: '474'
place: Basel
publication: Machines
publication_identifier:
  eissn:
  - '2075-1702 '
publication_status: published
publisher: MDPI
quality_controlled: '1'
status: public
title: The State of Health of Electrical Connectors
type: scientific_journal_article
user_id: '83781'
volume: 7
year: '2024'
...
---
_id: '11347'
abstract:
- lang: eng
  text: he lifetime of electrical contacts is influenced by various factors. Micromotions
    due to fluctuations in temperature and vibration in the field lead to fretting
    wear and fretting corrosion of electrical contacts. In case of the contacts with
    noble coatings, the fretting wear results in the wear through of the coating causing
    the exposure of the underlying non-noble metal to the surrounding atmosphere which
    in turn leads to fretting corrosion. These degradation mechanisms lead to an increase
    in electrical contact resistance and eventual failure of the system. In this study,
    the extent of contact degradation due to fretting war of galvanically silver-plated
    electrical contacts is investigated. To compare the extent of war occurring at
    different stages of the contacts’ lifetime, the fretting tests are conducted up
    to predefined fretting cycles. XRF measurements of the coating thickness before
    after the tests are performed and the wear depth after the given fretting cycles
    is determined via confocal microscopy. The results of two different types of silver
    plating are compared. Based on this, a prognosis regarding the wear behavior and
    expected lifetime of different coating systems can be made possible.
author:
- first_name: Roman
  full_name: Probst, Roman
  id: '69156'
  last_name: Probst
- first_name: Jian
  full_name: Song, Jian
  id: '5297'
  last_name: Song
citation:
  ama: Probst R, Song J. Einfluss der Mikrohärte der Ober- flächenschutzschicht auf
    den Verschleiß und die Lebensdauer von elektrischen Kontakten bei Reibverschleißbelastung.
    <i>Tribologie und Schmierungstechnik</i>. 2023;70(1):32-39. doi:<a href="https://doi.org/10.24053/tus-2023-0005">10.24053/tus-2023-0005</a>
  apa: Probst, R., &#38; Song, J. (2023). Einfluss der Mikrohärte der Ober- flächenschutzschicht
    auf den Verschleiß und die Lebensdauer von elektrischen Kontakten bei Reibverschleißbelastung.
    <i>Tribologie und Schmierungstechnik</i>, <i>70</i>(1), 32–39. <a href="https://doi.org/10.24053/tus-2023-0005">https://doi.org/10.24053/tus-2023-0005</a>
  bjps: <b>Probst R and Song J</b> (2023) Einfluss der Mikrohärte der Ober- flächenschutzschicht
    auf den Verschleiß und die Lebensdauer von elektrischen Kontakten bei Reibverschleißbelastung.
    <i>Tribologie und Schmierungstechnik</i> <b>70</b>, 32–39.
  chicago: 'Probst, Roman, and Jian Song. “Einfluss der Mikrohärte der Ober- flächenschutzschicht
    auf den Verschleiß und die Lebensdauer von elektrischen Kontakten bei Reibverschleißbelastung.”
    <i>Tribologie und Schmierungstechnik</i> 70, no. 1 (2023): 32–39. <a href="https://doi.org/10.24053/tus-2023-0005">https://doi.org/10.24053/tus-2023-0005</a>.'
  chicago-de: 'Probst, Roman und Jian Song. 2023. Einfluss der Mikrohärte der Ober-
    flächenschutzschicht auf den Verschleiß und die Lebensdauer von elektrischen Kontakten
    bei Reibverschleißbelastung. <i>Tribologie und Schmierungstechnik</i> 70, Nr.
    1: 32–39. doi:<a href="https://doi.org/10.24053/tus-2023-0005">10.24053/tus-2023-0005</a>,
    .'
  din1505-2-1: '<span style="font-variant:small-caps;">Probst, Roman</span> ; <span
    style="font-variant:small-caps;">Song, Jian</span>: Einfluss der Mikrohärte der
    Ober- flächenschutzschicht auf den Verschleiß und die Lebensdauer von elektrischen
    Kontakten bei Reibverschleißbelastung. In: <i>Tribologie und Schmierungstechnik</i>
    Bd. 70, Narr Francke Attempto Verlag GmbH + Co. KG (2023), Nr. 1, S. 32–39'
  havard: R. Probst, J. Song, Einfluss der Mikrohärte der Ober- flächenschutzschicht
    auf den Verschleiß und die Lebensdauer von elektrischen Kontakten bei Reibverschleißbelastung,
    Tribologie und Schmierungstechnik. 70 (2023) 32–39.
  ieee: 'R. Probst and J. Song, “Einfluss der Mikrohärte der Ober- flächenschutzschicht
    auf den Verschleiß und die Lebensdauer von elektrischen Kontakten bei Reibverschleißbelastung,”
    <i>Tribologie und Schmierungstechnik</i>, vol. 70, no. 1, pp. 32–39, 2023, doi:
    <a href="https://doi.org/10.24053/tus-2023-0005">10.24053/tus-2023-0005</a>.'
  mla: Probst, Roman, and Jian Song. “Einfluss der Mikrohärte der Ober- flächenschutzschicht
    auf den Verschleiß und die Lebensdauer von elektrischen Kontakten bei Reibverschleißbelastung.”
    <i>Tribologie und Schmierungstechnik</i>, vol. 70, no. 1, 2023, pp. 32–39, <a
    href="https://doi.org/10.24053/tus-2023-0005">https://doi.org/10.24053/tus-2023-0005</a>.
  short: R. Probst, J. Song, Tribologie und Schmierungstechnik 70 (2023) 32–39.
  ufg: '<b>Probst, Roman/Song, Jian</b>: Einfluss der Mikrohärte der Ober- flächenschutzschicht
    auf den Verschleiß und die Lebensdauer von elektrischen Kontakten bei Reibverschleißbelastung,
    in: <i>Tribologie und Schmierungstechnik</i> 70 (2023), H. 1,  S. 32–39.'
  van: Probst R, Song J. Einfluss der Mikrohärte der Ober- flächenschutzschicht auf
    den Verschleiß und die Lebensdauer von elektrischen Kontakten bei Reibverschleißbelastung.
    Tribologie und Schmierungstechnik. 2023;70(1):32–9.
date_created: 2024-04-18T08:47:22Z
date_updated: 2024-05-21T12:27:48Z
department:
- _id: DEP6012
doi: 10.24053/tus-2023-0005
has_accepted_license: '1'
intvolume: '        70'
issue: '1'
keyword:
- Surfaces
- Coatings and Films
- Surfaces and Interfaces
- Mechanical Engineering
- Mechanics of Materials
language:
- iso: ger
page: 32-39
publication: Tribologie und Schmierungstechnik
publication_identifier:
  issn:
  - 0724-3472
publication_status: published
publisher: Narr Francke Attempto Verlag GmbH + Co. KG
status: public
title: Einfluss der Mikrohärte der Ober- flächenschutzschicht auf den Verschleiß und
  die Lebensdauer von elektrischen Kontakten bei Reibverschleißbelastung
type: scientific_journal_article
user_id: '83781'
volume: 70
year: '2023'
...
---
_id: '11348'
abstract:
- lang: eng
  text: Lifetime is an important feature defining the reliability of electrical connectors.
    In general practice, the lifetime tests required for reliability estimation are
    time and labor intensive. In our previous work, a data driven method using a statistical
    process, with an application of probability distributions such as standard normal
    distribution and generalized extreme value (GEV) distribution with negative skewness
    to predict degradation paths, was introduced for estimation of the lifetime and
    FIT rate with the help of electrical contact resistance data collected from short
    term tests. The proposed method proved its significance by showing the possibility
    of drastic reduction in the lifetime test duration required for reliability determination.
    In this work, a non-parametric distribution free method using percentiles of actual
    measured contact resistances is used for determining the lifetime as against the
    percentiles of probability distribution used in previous work, thereby simplifying
    the process further and leading to an even more precise estimation. The lifetimes
    calculated from parametric and non-parametric methods are compared to highlight
    the significance of distribution free method in reliability estimation.
article_number: '115216'
article_type: original
author:
- first_name: Abhay Rammurti
  full_name: Shukla, Abhay Rammurti
  id: '74188'
  last_name: Shukla
- first_name: Robert
  full_name: Martin, Robert
  last_name: Martin
- first_name: Roman
  full_name: Probst, Roman
  id: '69156'
  last_name: Probst
- first_name: Jian
  full_name: Song, Jian
  id: '5297'
  last_name: Song
citation:
  ama: Shukla AR, Martin R, Probst R, Song J. Comparison of different statistical
    methods for prediction of lifetime of electrical connectors with short term tests.
    <i>Microelectronics Reliability</i>. 2023;150. doi:<a href="https://doi.org/10.1016/j.microrel.2023.115216">10.1016/j.microrel.2023.115216</a>
  apa: Shukla, A. R., Martin, R., Probst, R., &#38; Song, J. (2023). Comparison of
    different statistical methods for prediction of lifetime of electrical connectors
    with short term tests. <i>Microelectronics Reliability</i>, <i>150</i>, Article
    115216. <a href="https://doi.org/10.1016/j.microrel.2023.115216">https://doi.org/10.1016/j.microrel.2023.115216</a>
  bjps: <b>Shukla AR <i>et al.</i></b> (2023) Comparison of Different Statistical
    Methods for Prediction of Lifetime of Electrical Connectors with Short Term Tests.
    <i>Microelectronics Reliability</i> <b>150</b>.
  chicago: Shukla, Abhay Rammurti, Robert Martin, Roman Probst, and Jian Song. “Comparison
    of Different Statistical Methods for Prediction of Lifetime of Electrical Connectors
    with Short Term Tests.” <i>Microelectronics Reliability</i> 150 (2023). <a href="https://doi.org/10.1016/j.microrel.2023.115216">https://doi.org/10.1016/j.microrel.2023.115216</a>.
  chicago-de: Shukla, Abhay Rammurti, Robert Martin, Roman Probst und Jian Song. 2023.
    Comparison of different statistical methods for prediction of lifetime of electrical
    connectors with short term tests. <i>Microelectronics Reliability</i> 150. doi:<a
    href="https://doi.org/10.1016/j.microrel.2023.115216">10.1016/j.microrel.2023.115216</a>,
    .
  din1505-2-1: '<span style="font-variant:small-caps;">Shukla, Abhay Rammurti</span>
    ; <span style="font-variant:small-caps;">Martin, Robert</span> ; <span style="font-variant:small-caps;">Probst,
    Roman</span> ; <span style="font-variant:small-caps;">Song, Jian</span>: Comparison
    of different statistical methods for prediction of lifetime of electrical connectors
    with short term tests. In: <i>Microelectronics Reliability</i> Bd. 150. Amsterdam,
    Elsevier  (2023)'
  havard: A.R. Shukla, R. Martin, R. Probst, J. Song, Comparison of different statistical
    methods for prediction of lifetime of electrical connectors with short term tests,
    Microelectronics Reliability. 150 (2023).
  ieee: 'A. R. Shukla, R. Martin, R. Probst, and J. Song, “Comparison of different
    statistical methods for prediction of lifetime of electrical connectors with short
    term tests,” <i>Microelectronics Reliability</i>, vol. 150, Art. no. 115216, 2023,
    doi: <a href="https://doi.org/10.1016/j.microrel.2023.115216">10.1016/j.microrel.2023.115216</a>.'
  mla: Shukla, Abhay Rammurti, et al. “Comparison of Different Statistical Methods
    for Prediction of Lifetime of Electrical Connectors with Short Term Tests.” <i>Microelectronics
    Reliability</i>, vol. 150, 115216, 2023, <a href="https://doi.org/10.1016/j.microrel.2023.115216">https://doi.org/10.1016/j.microrel.2023.115216</a>.
  short: A.R. Shukla, R. Martin, R. Probst, J. Song, Microelectronics Reliability
    150 (2023).
  ufg: '<b>Shukla, Abhay Rammurti u. a.</b>: Comparison of different statistical methods
    for prediction of lifetime of electrical connectors with short term tests, in:
    <i>Microelectronics Reliability</i> 150 (2023).'
  van: Shukla AR, Martin R, Probst R, Song J. Comparison of different statistical
    methods for prediction of lifetime of electrical connectors with short term tests.
    Microelectronics Reliability. 2023;150.
date_created: 2024-04-18T08:55:38Z
date_updated: 2025-06-26T07:51:25Z
department:
- _id: DEP6012
doi: 10.1016/j.microrel.2023.115216
external_id:
  isi:
  - '001106942700001'
has_accepted_license: '1'
intvolume: '       150'
isi: '1'
keyword:
- Electrical and Electronic Engineering
- Surfaces
- Coatings and Films
- Safety
- Risk
- Reliability and Quality
- Condensed Matter Physics
- Atomic and Molecular Physics
- and Optics
- Electronic
- Optical and Magnetic Materials
language:
- iso: eng
place: Amsterdam
publication: Microelectronics Reliability
publication_identifier:
  issn:
  - 0026-2714
  unknown:
  - 1872-941X
publication_status: published
publisher: 'Elsevier '
status: public
title: Comparison of different statistical methods for prediction of lifetime of electrical
  connectors with short term tests
type: scientific_journal_article
user_id: '83781'
volume: 150
year: '2023'
...
---
_id: '11349'
author:
- first_name: Roman
  full_name: Probst, Roman
  id: '69156'
  last_name: Probst
- first_name: Jian
  full_name: Song, Jian
  id: '5297'
  last_name: Song
citation:
  ama: Probst R, Song J. <i>Bestimmung der charakteristischen Lebensdauer von Steckverbindern
    aus der Frühphase beschleunigter Lebensdauerprüfungen – State of Health. Tagungsband
    der VDE/VDI-GMM- Fachtagung „Symposium Connectors“, 166 – 177, Lemgo 2023</i>.
    (Song J, Labor für Feinsystemtechnik, Technische Hochschule Ostwestfalen-Lippe,
    eds.). Labor für Feinsystemtechnik, TH OWL; 2023:166-177.
  apa: 'Probst, R., &#38; Song, J. (2023). Bestimmung der charakteristischen Lebensdauer
    von Steckverbindern aus der Frühphase beschleunigter Lebensdauerprüfungen –
    State of Health. Tagungsband der VDE/VDI-GMM- Fachtagung „Symposium Connectors“,
    166 – 177, Lemgo 2023. In J. Song &#38; Labor für Feinsystemtechnik, Technische
    Hochschule Ostwestfalen-Lippe (Eds.), <i>Elektrische und optische Verbindungstechnik
    2023 : Tagungsband der VDE/VDI GMM-Fachtagung : 9. Symposium Connectors</i> (pp.
    166–177). Labor für Feinsystemtechnik, TH OWL.'
  bjps: '<b>Probst R and Song J</b> (2023) <i>Bestimmung der charakteristischen Lebensdauer
    von Steckverbindern aus der Frühphase beschleunigter Lebensdauerprüfungen –
    State of Health. Tagungsband der VDE/VDI-GMM- Fachtagung „Symposium Connectors“,
    166 – 177, Lemgo 2023</i>, Song J and Labor für Feinsystemtechnik, Technische
    Hochschule Ostwestfalen-Lippe (eds). Lemgo: Labor für Feinsystemtechnik, TH OWL.'
  chicago: 'Probst, Roman, and Jian Song. <i>Bestimmung der charakteristischen Lebensdauer
    von Steckverbindern aus der Frühphase beschleunigter Lebensdauerprüfungen –
    State of Health. Tagungsband der VDE/VDI-GMM- Fachtagung „Symposium Connectors“,
    166 – 177, Lemgo 2023</i>. Edited by Jian Song and Labor für Feinsystemtechnik,
    Technische Hochschule Ostwestfalen-Lippe. <i>Elektrische und optische Verbindungstechnik
    2023 : Tagungsband der VDE/VDI GMM-Fachtagung : 9. Symposium Connectors</i>. Lemgo:
    Labor für Feinsystemtechnik, TH OWL, 2023.'
  chicago-de: 'Probst, Roman und Jian Song. 2023. <i>Bestimmung der charakteristischen
    Lebensdauer von Steckverbindern aus der Frühphase beschleunigter Lebensdauerprüfungen
    – State of Health. Tagungsband der VDE/VDI-GMM- Fachtagung „Symposium Connectors“,
    166 – 177, Lemgo 2023</i>. Hg. von Jian Song und Labor für Feinsystemtechnik,
    Technische Hochschule Ostwestfalen-Lippe. <i>Elektrische und optische Verbindungstechnik
    2023 : Tagungsband der VDE/VDI GMM-Fachtagung : 9. Symposium Connectors</i>. Lemgo:
    Labor für Feinsystemtechnik, TH OWL.'
  din1505-2-1: '<span style="font-variant:small-caps;">Probst, Roman</span> ; <span
    style="font-variant:small-caps;">Song, Jian</span> ; <span style="font-variant:small-caps;">Song,
    J.</span> ; <span style="font-variant:small-caps;">Labor für Feinsystemtechnik,
    Technische Hochschule Ostwestfalen-Lippe</span> (Hrsg.): <i>Bestimmung der charakteristischen
    Lebensdauer von Steckverbindern aus der Frühphase beschleunigter Lebensdauerprüfungen
    – State of Health. Tagungsband der VDE/VDI-GMM- Fachtagung „Symposium Connectors“,
    166 – 177, Lemgo 2023</i>. Lemgo : Labor für Feinsystemtechnik, TH OWL, 2023'
  havard: R. Probst, J. Song, Bestimmung der charakteristischen Lebensdauer von Steckverbindern
    aus der Frühphase beschleunigter Lebensdauerprüfungen – State of Health. Tagungsband
    der VDE/VDI-GMM- Fachtagung „Symposium Connectors“, 166 – 177, Lemgo 2023, Labor
    für Feinsystemtechnik, TH OWL, Lemgo, 2023.
  ieee: 'R. Probst and J. Song, <i>Bestimmung der charakteristischen Lebensdauer von
    Steckverbindern aus der Frühphase beschleunigter Lebensdauerprüfungen – State
    of Health. Tagungsband der VDE/VDI-GMM- Fachtagung „Symposium Connectors“, 166
    – 177, Lemgo 2023</i>. Lemgo: Labor für Feinsystemtechnik, TH OWL, 2023, pp. 166–177.'
  mla: 'Probst, Roman, and Jian Song. “Bestimmung der charakteristischen Lebensdauer
    von Steckverbindern aus der Frühphase beschleunigter Lebensdauerprüfungen –
    State of Health. Tagungsband der VDE/VDI-GMM- Fachtagung „Symposium Connectors“,
    166 – 177, Lemgo 2023.” <i>Elektrische und optische Verbindungstechnik 2023 :
    Tagungsband der VDE/VDI GMM-Fachtagung : 9. Symposium Connectors</i>, edited by
    Jian Song and Labor für Feinsystemtechnik, Technische Hochschule Ostwestfalen-Lippe,
    Labor für Feinsystemtechnik, TH OWL, 2023, pp. 166–77.'
  short: R. Probst, J. Song, Bestimmung der charakteristischen Lebensdauer von Steckverbindern
    aus der Frühphase beschleunigter Lebensdauerprüfungen – State of Health. Tagungsband
    der VDE/VDI-GMM- Fachtagung „Symposium Connectors“, 166 – 177, Lemgo 2023, Labor
    für Feinsystemtechnik, TH OWL, Lemgo, 2023.
  ufg: '<b>Probst, Roman/Song, Jian</b>: Bestimmung der charakteristischen Lebensdauer
    von Steckverbindern aus der Frühphase beschleunigter Lebensdauerprüfungen –
    State of Health. Tagungsband der VDE/VDI-GMM- Fachtagung „Symposium Connectors“,
    166 – 177, Lemgo 2023, hg. von Song, Jian, Labor für Feinsystemtechnik, Technische
    Hochschule Ostwestfalen-Lippe, Lemgo 2023.'
  van: 'Probst R, Song J. Bestimmung der charakteristischen Lebensdauer von Steckverbindern
    aus der Frühphase beschleunigter Lebensdauerprüfungen – State of Health. Tagungsband
    der VDE/VDI-GMM- Fachtagung „Symposium Connectors“, 166 – 177, Lemgo 2023. Song
    J, Labor für Feinsystemtechnik, Technische Hochschule Ostwestfalen-Lippe, editors.
    Elektrische und optische Verbindungstechnik 2023 : Tagungsband der VDE/VDI GMM-Fachtagung :
    9. Symposium Connectors. Lemgo: Labor für Feinsystemtechnik, TH OWL; 2023.'
conference:
  end_date: 2023-03-22
  location: Lemgo
  name: VDE/VDI-GMM- Fachtagung „Symposium Connectors“
  start_date: 2023-03-21
corporate_editor:
- Labor für Feinsystemtechnik, Technische Hochschule Ostwestfalen-Lippe
date_created: 2024-04-18T09:11:18Z
date_updated: 2024-05-13T12:25:49Z
ddc:
- '620'
department:
- _id: DEP6012
editor:
- first_name: Jian
  full_name: Song, Jian
  id: '5297'
  last_name: Song
has_accepted_license: '1'
language:
- iso: ger
page: 166 - 177
place: Lemgo
publication: 'Elektrische und optische Verbindungstechnik 2023 : Tagungsband der VDE/VDI
  GMM-Fachtagung : 9. Symposium Connectors'
publication_identifier:
  unknown:
  - 978-3-00-074593-5
publication_status: published
publisher: Labor für Feinsystemtechnik, TH OWL
status: public
title: Bestimmung der charakteristischen Lebensdauer von Steckverbindern aus der Frühphase
  beschleunigter Lebensdauerprüfungen – State of Health. Tagungsband der VDE/VDI-GMM-
  Fachtagung „Symposium Connectors“, 166 – 177, Lemgo 2023
type: conference_editor_article
user_id: '83781'
year: '2023'
...
---
_id: '11357'
author:
- first_name: Jian
  full_name: Song, Jian
  id: '5297'
  last_name: Song
- first_name: Roman
  full_name: Probst, Roman
  id: '69156'
  last_name: Probst
citation:
  ama: Song J, Probst R. <i>Einfluss von Schmiermitteln und thermischer Belastung
    auf das Reibkorrosionsverhalten von elektrischen Kontakten</i>. (Gesellschaft
    für Tribologie , ed.). Gesellschaft für Tribologie; 2023:06/1-4.
  apa: 'Song, J., &#38; Probst, R. (2023). Einfluss von Schmiermitteln und thermischer
    Belastung auf das Reibkorrosionsverhalten von elektrischen Kontakten. In Gesellschaft
    für Tribologie  (Ed.), <i>Reibung, Schmierung und Verschleiß : Forschung und praktische
    Anwendungen : 64. Tribologie-Fachtagung : 25. September bis 27. September 2023
    in Göttingen</i> (p. 06/1-4). Gesellschaft für Tribologie.'
  bjps: '<b>Song J and Probst R</b> (2023) <i>Einfluss von Schmiermitteln und thermischer
    Belastung auf das Reibkorrosionsverhalten von elektrischen Kontakten</i>, Gesellschaft
    für Tribologie  (ed.). Jülich: Gesellschaft für Tribologie.'
  chicago: 'Song, Jian, and Roman Probst. <i>Einfluss von Schmiermitteln und thermischer
    Belastung auf das Reibkorrosionsverhalten von elektrischen Kontakten</i>. Edited
    by Gesellschaft für Tribologie . <i>Reibung, Schmierung und Verschleiß : Forschung
    und praktische Anwendungen : 64. Tribologie-Fachtagung : 25. September bis 27.
    September 2023 in Göttingen</i>. Jülich: Gesellschaft für Tribologie, 2023.'
  chicago-de: 'Song, Jian und Roman Probst. 2023. <i>Einfluss von Schmiermitteln und
    thermischer Belastung auf das Reibkorrosionsverhalten von elektrischen Kontakten</i>.
    Hg. von Gesellschaft für Tribologie . <i>Reibung, Schmierung und Verschleiß :
    Forschung und praktische Anwendungen : 64. Tribologie-Fachtagung : 25. September
    bis 27. September 2023 in Göttingen</i>. Jülich: Gesellschaft für Tribologie.'
  din1505-2-1: '<span style="font-variant:small-caps;">Song, Jian</span> ; <span style="font-variant:small-caps;">Probst,
    Roman</span> ; <span style="font-variant:small-caps;">Gesellschaft für Tribologie
    </span> (Hrsg.): <i>Einfluss von Schmiermitteln und thermischer Belastung auf
    das Reibkorrosionsverhalten von elektrischen Kontakten</i>. Jülich : Gesellschaft
    für Tribologie, 2023'
  havard: J. Song, R. Probst, Einfluss von Schmiermitteln und thermischer Belastung
    auf das Reibkorrosionsverhalten von elektrischen Kontakten, Gesellschaft für Tribologie,
    Jülich, 2023.
  ieee: 'J. Song and R. Probst, <i>Einfluss von Schmiermitteln und thermischer Belastung
    auf das Reibkorrosionsverhalten von elektrischen Kontakten</i>. Jülich: Gesellschaft
    für Tribologie, 2023, p. 06/1–4.'
  mla: 'Song, Jian, and Roman Probst. “Einfluss von Schmiermitteln und thermischer
    Belastung auf das Reibkorrosionsverhalten von elektrischen Kontakten.” <i>Reibung,
    Schmierung und Verschleiß : Forschung und praktische Anwendungen : 64. Tribologie-Fachtagung :
    25. September bis 27. September 2023 in Göttingen</i>, edited by Gesellschaft
    für Tribologie , Gesellschaft für Tribologie, 2023, p. 06/1-4.'
  short: J. Song, R. Probst, Einfluss von Schmiermitteln und thermischer Belastung
    auf das Reibkorrosionsverhalten von elektrischen Kontakten, Gesellschaft für Tribologie,
    Jülich, 2023.
  ufg: '<b>Song, Jian/Probst, Roman</b>: Einfluss von Schmiermitteln und thermischer
    Belastung auf das Reibkorrosionsverhalten von elektrischen Kontakten, hg. von
    Gesellschaft für Tribologie , Jülich 2023.'
  van: 'Song J, Probst R. Einfluss von Schmiermitteln und thermischer Belastung auf
    das Reibkorrosionsverhalten von elektrischen Kontakten. Gesellschaft für Tribologie
    , editor. Reibung, Schmierung und Verschleiß : Forschung und praktische Anwendungen :
    64. Tribologie-Fachtagung : 25. September bis 27. September 2023 in Göttingen.
    Jülich: Gesellschaft für Tribologie; 2023.'
conference:
  end_date: 2023-09-27
  location: 'Göttingen '
  name: 64. Tribologie-Fachtagung
  start_date: 2023-09-25
corporate_editor:
- 'Gesellschaft für Tribologie '
date_created: 2024-04-18T09:54:34Z
date_updated: 2024-05-21T12:20:05Z
department:
- _id: DEP6012
language:
- iso: ger
page: 06/1-4
place: Jülich
publication: 'Reibung, Schmierung und Verschleiß : Forschung und praktische Anwendungen
  : 64. Tribologie-Fachtagung : 25. September bis 27. September 2023 in Göttingen'
publication_identifier:
  eisbn:
  - 978-3-9817451-8-4
publication_status: published
publisher: Gesellschaft für Tribologie
status: public
title: Einfluss von Schmiermitteln und thermischer Belastung auf das Reibkorrosionsverhalten
  von elektrischen Kontakten
type: conference_editor_article
user_id: '83781'
year: '2023'
...
---
_id: '11359'
abstract:
- lang: eng
  text: The reliability and lifetime of electrical contacts is an important aspect
    in system reliability and is influenced by numerous factors. Micro motions as
    well as vibrations lead to fretting wear, which can result in wear through of
    the protective coating. If this layer is worn through, the non-noble layer underneath
    is exposed, resulting in the occurrence of fretting corrosion with further relative
    motion. This leads to an increased electrical contact resistance (ECR) and can
    cause the contact to fail. Increasing the hardness of the coating material can
    reduce the wear and in turn increase contacts’ lifetime. The micro hardness, wear
    and lifetime of contacts with modified hard silver coatings are investigated in
    fretting wear and corrosion tests and the results compared to a conventional silver
    coating. Since one of the modifications shows a significant reduction in wear
    and hence improvement in lifetime, further analysis with SEM and FIB is conducted
    in order to identify the key mechanisms leading to this improvement. With a further
    increase in lifetime however, fatigue as well as delamination of the coating are
    revealed to be of high relevance. Both can be main causes of electrical contact
    failure under fretting load. In general, at lower number of cycles, increased
    micro hardness has the greatest effect on lifetime and wear while at the higher
    number of cycles, fatigue is observed to be the dominant failure mechanism.
author:
- first_name: Roman
  full_name: Probst, Roman
  id: '69156'
  last_name: Probst
- first_name: Jian
  full_name: Song, Jian
  id: '5297'
  last_name: Song
citation:
  ama: Probst R, Song J. <i>Influence of Hardness and Fatigue on the Lifetime of a
    Modified Silver Coating in Fretting Wear and Corrosion Tests</i>. IEEE; 2023:88-94.
    doi:<a href="https://doi.org/10.1109/holm56075.2023.10352299">10.1109/holm56075.2023.10352299</a>
  apa: Probst, R., &#38; Song, J. (2023). Influence of Hardness and Fatigue on the
    Lifetime of a Modified Silver Coating in Fretting Wear and Corrosion Tests. In
    <i>2023 IEEE 68th Holm Conference on Electrical Contacts (HOLM)</i> (pp. 88–94).
    IEEE. <a href="https://doi.org/10.1109/holm56075.2023.10352299">https://doi.org/10.1109/holm56075.2023.10352299</a>
  bjps: '<b>Probst R and Song J</b> (2023) <i>Influence of Hardness and Fatigue on
    the Lifetime of a Modified Silver Coating in Fretting Wear and Corrosion Tests</i>.
    [Piscataway, NJ]: IEEE.'
  chicago: 'Probst, Roman, and Jian Song. <i>Influence of Hardness and Fatigue on
    the Lifetime of a Modified Silver Coating in Fretting Wear and Corrosion Tests</i>.
    <i>2023 IEEE 68th Holm Conference on Electrical Contacts (HOLM)</i>. Electrical
    Contacts-IEEE Holm Conference on Electrical Contacts. [Piscataway, NJ]: IEEE,
    2023. <a href="https://doi.org/10.1109/holm56075.2023.10352299">https://doi.org/10.1109/holm56075.2023.10352299</a>.'
  chicago-de: 'Probst, Roman und Jian Song. 2023. <i>Influence of Hardness and Fatigue
    on the Lifetime of a Modified Silver Coating in Fretting Wear and Corrosion Tests</i>.
    <i>2023 IEEE 68th Holm Conference on Electrical Contacts (HOLM)</i>. Electrical
    Contacts-IEEE Holm Conference on Electrical Contacts. [Piscataway, NJ]: IEEE.
    doi:<a href="https://doi.org/10.1109/holm56075.2023.10352299">10.1109/holm56075.2023.10352299</a>,
    .'
  din1505-2-1: '<span style="font-variant:small-caps;">Probst, Roman</span> ; <span
    style="font-variant:small-caps;">Song, Jian</span>: <i>Influence of Hardness and
    Fatigue on the Lifetime of a Modified Silver Coating in Fretting Wear and Corrosion
    Tests</i>, <i>Electrical Contacts-IEEE Holm Conference on Electrical Contacts</i>.
    [Piscataway, NJ] : IEEE, 2023'
  havard: R. Probst, J. Song, Influence of Hardness and Fatigue on the Lifetime of
    a Modified Silver Coating in Fretting Wear and Corrosion Tests, IEEE, [Piscataway,
    NJ], 2023.
  ieee: 'R. Probst and J. Song, <i>Influence of Hardness and Fatigue on the Lifetime
    of a Modified Silver Coating in Fretting Wear and Corrosion Tests</i>. [Piscataway,
    NJ]: IEEE, 2023, pp. 88–94. doi: <a href="https://doi.org/10.1109/holm56075.2023.10352299">10.1109/holm56075.2023.10352299</a>.'
  mla: Probst, Roman, and Jian Song. “Influence of Hardness and Fatigue on the Lifetime
    of a Modified Silver Coating in Fretting Wear and Corrosion Tests.” <i>2023 IEEE
    68th Holm Conference on Electrical Contacts (HOLM)</i>, IEEE, 2023, pp. 88–94,
    <a href="https://doi.org/10.1109/holm56075.2023.10352299">https://doi.org/10.1109/holm56075.2023.10352299</a>.
  short: R. Probst, J. Song, Influence of Hardness and Fatigue on the Lifetime of
    a Modified Silver Coating in Fretting Wear and Corrosion Tests, IEEE, [Piscataway,
    NJ], 2023.
  ufg: '<b>Probst, Roman/Song, Jian</b>: Influence of Hardness and Fatigue on the
    Lifetime of a Modified Silver Coating in Fretting Wear and Corrosion Tests, [Piscataway,
    NJ] 2023 (Electrical Contacts-IEEE Holm Conference on Electrical Contacts).'
  van: 'Probst R, Song J. Influence of Hardness and Fatigue on the Lifetime of a Modified
    Silver Coating in Fretting Wear and Corrosion Tests. 2023 IEEE 68th Holm Conference
    on Electrical Contacts (HOLM). [Piscataway, NJ]: IEEE; 2023. (Electrical Contacts-IEEE
    Holm Conference on Electrical Contacts).'
conference:
  end_date: 2023-10-11
  location: 'Seattle '
  name: 68th Holm Conference on Electrical Contacts (HOLM)
  start_date: 2023-10-04
date_created: 2024-04-18T10:05:51Z
date_updated: 2025-06-26T07:54:13Z
department:
- _id: DEP6012
doi: 10.1109/holm56075.2023.10352299
keyword:
- electrical contacts
- lifetime
- silver coating
- fretting corrosion
- fatigue
- wear through
language:
- iso: eng
page: 88 - 94
place: '[Piscataway, NJ]'
publication: 2023 IEEE 68th Holm Conference on Electrical Contacts (HOLM)
publication_identifier:
  eisbn:
  - '979‐8‐3503‐4246‐8 '
  - 979‐8‐3503‐4245‐1
  isbn:
  - 979‐8‐3503‐4244‐4
  issn:
  - 2158‐9992
publication_status: published
publisher: IEEE
series_title: Electrical Contacts-IEEE Holm Conference on Electrical Contacts
status: public
title: Influence of Hardness and Fatigue on the Lifetime of a Modified Silver Coating
  in Fretting Wear and Corrosion Tests
type: conference_editor_article
user_id: '83781'
year: '2023'
...
---
_id: '11360'
abstract:
- lang: eng
  text: The state of health and lifetime estimation process of electrical connectors
    via lifetime tests is a time and labor intensive process. In our previous work,
    a correlation between the contact resistance developments in the early stages
    of lifetime tests of electrical connectors with the final results was established
    using a data driven statistical process based on probability distribution. Also,
    state of health indicators for prognosis of lifetime were introduced. In this
    work, the state of health indicators have been optimized. The sensitivity analysis
    is performed with regards to the selection of the appropriate amount of test data
    based on test duration for the reliable prognosis of the state of health and the
    characteristic lifetime. Through this the possibility of further reduction of
    test duration required for the reliable prognosis of state of health is investigated.
    Based on the results of analysis, a guideline for the determination of the duration
    of lifetime tests which lead to a reliable prediction of lifetime of connectors
    can be provided. Also, an assessment of the state of art in the prognosis of the
    lifetime of electrical connectors has been presented.
author:
- first_name: Jian
  full_name: Song, Jian
  id: '5297'
  last_name: Song
- first_name: Abhay Rammurti
  full_name: Shukla, Abhay Rammurti
  id: '74188'
  last_name: Shukla
- first_name: Roman
  full_name: Probst, Roman
  id: '69156'
  last_name: Probst
citation:
  ama: Song J, Shukla AR, Probst R. <i>Advances in Evaluation of State of Health of
    Electrical Connectors</i>. IEEE; 2023:200-208. doi:<a href="https://doi.org/10.1109/holm56075.2023.10352279">10.1109/holm56075.2023.10352279</a>
  apa: Song, J., Shukla, A. R., &#38; Probst, R. (2023). Advances in Evaluation of
    State of Health of Electrical Connectors. In <i>2023 IEEE 68th Holm Conference
    on Electrical Contacts (HOLM)</i> (pp. 200–208). IEEE. <a href="https://doi.org/10.1109/holm56075.2023.10352279">https://doi.org/10.1109/holm56075.2023.10352279</a>
  bjps: '<b>Song J, Shukla AR and Probst R</b> (2023) <i>Advances in Evaluation of
    State of Health of Electrical Connectors</i>. [Piscataway, NJ]: IEEE.'
  chicago: 'Song, Jian, Abhay Rammurti Shukla, and Roman Probst. <i>Advances in Evaluation
    of State of Health of Electrical Connectors</i>. <i>2023 IEEE 68th Holm Conference
    on Electrical Contacts (HOLM)</i>. Electrical Contacts-IEEE Holm Conference on
    Electrical Contacts. [Piscataway, NJ]: IEEE, 2023. <a href="https://doi.org/10.1109/holm56075.2023.10352279">https://doi.org/10.1109/holm56075.2023.10352279</a>.'
  chicago-de: 'Song, Jian, Abhay Rammurti Shukla und Roman Probst. 2023. <i>Advances
    in Evaluation of State of Health of Electrical Connectors</i>. <i>2023 IEEE 68th
    Holm Conference on Electrical Contacts (HOLM)</i>. Electrical Contacts-IEEE Holm
    Conference on Electrical Contacts. [Piscataway, NJ]: IEEE. doi:<a href="https://doi.org/10.1109/holm56075.2023.10352279">10.1109/holm56075.2023.10352279</a>,
    .'
  din1505-2-1: '<span style="font-variant:small-caps;">Song, Jian</span> ; <span style="font-variant:small-caps;">Shukla,
    Abhay Rammurti</span> ; <span style="font-variant:small-caps;">Probst, Roman</span>:
    <i>Advances in Evaluation of State of Health of Electrical Connectors</i>, <i>Electrical
    Contacts-IEEE Holm Conference on Electrical Contacts</i>. [Piscataway, NJ] : IEEE,
    2023'
  havard: J. Song, A.R. Shukla, R. Probst, Advances in Evaluation of State of Health
    of Electrical Connectors, IEEE, [Piscataway, NJ], 2023.
  ieee: 'J. Song, A. R. Shukla, and R. Probst, <i>Advances in Evaluation of State
    of Health of Electrical Connectors</i>. [Piscataway, NJ]: IEEE, 2023, pp. 200–208.
    doi: <a href="https://doi.org/10.1109/holm56075.2023.10352279">10.1109/holm56075.2023.10352279</a>.'
  mla: Song, Jian, et al. “Advances in Evaluation of State of Health of Electrical
    Connectors.” <i>2023 IEEE 68th Holm Conference on Electrical Contacts (HOLM)</i>,
    IEEE, 2023, pp. 200–08, <a href="https://doi.org/10.1109/holm56075.2023.10352279">https://doi.org/10.1109/holm56075.2023.10352279</a>.
  short: J. Song, A.R. Shukla, R. Probst, Advances in Evaluation of State of Health
    of Electrical Connectors, IEEE, [Piscataway, NJ], 2023.
  ufg: '<b>Song, Jian/Shukla, Abhay Rammurti/Probst, Roman</b>: Advances in Evaluation
    of State of Health of Electrical Connectors, [Piscataway, NJ] 2023 (Electrical
    Contacts-IEEE Holm Conference on Electrical Contacts).'
  van: 'Song J, Shukla AR, Probst R. Advances in Evaluation of State of Health of
    Electrical Connectors. 2023 IEEE 68th Holm Conference on Electrical Contacts (HOLM).
    [Piscataway, NJ]: IEEE; 2023. (Electrical Contacts-IEEE Holm Conference on Electrical
    Contacts).'
conference:
  end_date: 2023-10-11
  location: Seattle
  name: 68th Holm Conference on Electrical Contacts (HOLM)
  start_date: 2023-10-04
date_created: 2024-04-18T10:11:50Z
date_updated: 2025-06-26T07:54:50Z
doi: 10.1109/holm56075.2023.10352279
keyword:
- accelerated life testing
- test duration
- contact resistance
- statistical model
- connector reliability
language:
- iso: eng
page: 200-208
place: '[Piscataway, NJ]'
publication: 2023 IEEE 68th Holm Conference on Electrical Contacts (HOLM)
publication_identifier:
  eisbn:
  - 979‐8‐3503‐4246‐8
  - '979‐8‐3503‐4245‐1 '
  eissn:
  - 2158‐9992
  isbn:
  - 979‐8‐3503‐4244‐4
  issn:
  - 2158-9992
publication_status: published
publisher: IEEE
series_title: Electrical Contacts-IEEE Holm Conference on Electrical Contacts
status: public
title: Advances in Evaluation of State of Health of Electrical Connectors
type: conference_editor_article
user_id: '83781'
year: '2023'
...
---
_id: '11361'
author:
- first_name: Abhay Rammurti
  full_name: Shukla, Abhay Rammurti
  id: '74188'
  last_name: Shukla
- first_name: Robert
  full_name: Martin, Robert
  last_name: Martin
- first_name: Roman
  full_name: Probst, Roman
  id: '69156'
  last_name: Probst
- first_name: Jian
  full_name: Song, Jian
  id: '5297'
  last_name: Song
citation:
  ama: Shukla AR, Martin R, Probst R, Song J. <i>Comparison of Different Statistical
    Methods for Prediction of Lifetime of Electrical Connectors with Short Term Tests</i>.;
    2023.
  apa: Shukla, A. R., Martin, R., Probst, R., &#38; Song, J. (2023). <i>Comparison
    of different statistical methods for prediction of lifetime of electrical connectors
    with short term tests</i>. 34rd European Symposium on Reliability of Electron
    Devices, Failure Physics and Analysis (ESREF), Toulouse (France).
  bjps: <b>Shukla AR <i>et al.</i></b> (2023) <i>Comparison of Different Statistical
    Methods for Prediction of Lifetime of Electrical Connectors with Short Term Tests</i>.
    .
  chicago: Shukla, Abhay Rammurti, Robert Martin, Roman Probst, and Jian Song. <i>Comparison
    of Different Statistical Methods for Prediction of Lifetime of Electrical Connectors
    with Short Term Tests</i>, 2023.
  chicago-de: Shukla, Abhay Rammurti, Robert Martin, Roman Probst und Jian Song. 2023.
    <i>Comparison of different statistical methods for prediction of lifetime of electrical
    connectors with short term tests</i>.
  din1505-2-1: '<span style="font-variant:small-caps;">Shukla, Abhay Rammurti</span>
    ; <span style="font-variant:small-caps;">Martin, Robert</span> ; <span style="font-variant:small-caps;">Probst,
    Roman</span> ; <span style="font-variant:small-caps;">Song, Jian</span>: <i>Comparison
    of different statistical methods for prediction of lifetime of electrical connectors
    with short term tests</i>, 2023'
  havard: A.R. Shukla, R. Martin, R. Probst, J. Song, Comparison of different statistical
    methods for prediction of lifetime of electrical connectors with short term tests,
    2023.
  ieee: A. R. Shukla, R. Martin, R. Probst, and J. Song, <i>Comparison of different
    statistical methods for prediction of lifetime of electrical connectors with short
    term tests</i>. 2023.
  mla: Shukla, Abhay Rammurti, et al. <i>Comparison of Different Statistical Methods
    for Prediction of Lifetime of Electrical Connectors with Short Term Tests</i>.
    2023.
  short: A.R. Shukla, R. Martin, R. Probst, J. Song, Comparison of Different Statistical
    Methods for Prediction of Lifetime of Electrical Connectors with Short Term Tests,
    2023.
  ufg: '<b>Shukla, Abhay Rammurti u. a.</b>: Comparison of different statistical methods
    for prediction of lifetime of electrical connectors with short term tests, o. O.
    2023.'
  van: Shukla AR, Martin R, Probst R, Song J. Comparison of different statistical
    methods for prediction of lifetime of electrical connectors with short term tests.
    2023.
conference:
  end_date: 2023-10-05
  location: Toulouse (France)
  name: 34rd European Symposium on Reliability of Electron Devices, Failure Physics
    and Analysis (ESREF)
  start_date: 2023-10-02
date_created: 2024-04-18T10:18:33Z
date_updated: 2024-05-17T14:07:26Z
language:
- iso: eng
publication_status: published
status: public
title: Comparison of different statistical methods for prediction of lifetime of electrical
  connectors with short term tests
type: conference_speech
user_id: '83781'
year: '2023'
...
---
_id: '11362'
author:
- first_name: Jian
  full_name: Song, Jian
  id: '5297'
  last_name: Song
- first_name: Roman
  full_name: Probst, Roman
  id: '69156'
  last_name: Probst
- first_name: Abhay Rammurti
  full_name: Shukla, Abhay Rammurti
  id: '74188'
  last_name: Shukla
- first_name: Karolin
  full_name: Bünting, Karolin
  id: '62067'
  last_name: Bünting
citation:
  ama: Song J, Probst R, Shukla AR, Bünting K. <i>Influence of Tribological Properties
    of Contact Coatings on the Long Term Behavior of Electrical Contacts</i>.; 2023.
  apa: Song, J., Probst, R., Shukla, A. R., &#38; Bünting, K. (2023). <i>Influence
    of tribological properties of contact coatings on the long term behavior of electrical
    contacts</i>. International Tribology Conference (ITC), Fukuoka, Japan .
  bjps: <b>Song J <i>et al.</i></b> (2023) <i>Influence of Tribological Properties
    of Contact Coatings on the Long Term Behavior of Electrical Contacts</i>. .
  chicago: Song, Jian, Roman Probst, Abhay Rammurti Shukla, and Karolin Bünting. <i>Influence
    of Tribological Properties of Contact Coatings on the Long Term Behavior of Electrical
    Contacts</i>, 2023.
  chicago-de: Song, Jian, Roman Probst, Abhay Rammurti Shukla und Karolin Bünting.
    2023. <i>Influence of tribological properties of contact coatings on the long
    term behavior of electrical contacts</i>.
  din1505-2-1: '<span style="font-variant:small-caps;">Song, Jian</span> ; <span style="font-variant:small-caps;">Probst,
    Roman</span> ; <span style="font-variant:small-caps;">Shukla, Abhay Rammurti</span>
    ; <span style="font-variant:small-caps;">Bünting, Karolin</span>: <i>Influence
    of tribological properties of contact coatings on the long term behavior of electrical
    contacts</i>, 2023'
  havard: J. Song, R. Probst, A.R. Shukla, K. Bünting, Influence of tribological properties
    of contact coatings on the long term behavior of electrical contacts, 2023.
  ieee: J. Song, R. Probst, A. R. Shukla, and K. Bünting, <i>Influence of tribological
    properties of contact coatings on the long term behavior of electrical contacts</i>.
    2023.
  mla: Song, Jian, et al. <i>Influence of Tribological Properties of Contact Coatings
    on the Long Term Behavior of Electrical Contacts</i>. 2023.
  short: J. Song, R. Probst, A.R. Shukla, K. Bünting, Influence of Tribological Properties
    of Contact Coatings on the Long Term Behavior of Electrical Contacts, 2023.
  ufg: '<b>Song, Jian u. a.</b>: Influence of tribological properties of contact coatings
    on the long term behavior of electrical contacts, o. O. 2023.'
  van: Song J, Probst R, Shukla AR, Bünting K. Influence of tribological properties
    of contact coatings on the long term behavior of electrical contacts. 2023.
conference:
  end_date: 2023-09-30
  location: 'Fukuoka, Japan '
  name: International Tribology Conference (ITC)
  start_date: 2023-09-25
date_created: 2024-04-18T10:31:49Z
date_updated: 2024-05-17T14:05:11Z
department:
- _id: DEP6012
language:
- iso: eng
publication_status: published
status: public
title: Influence of tribological properties of contact coatings on the long term behavior
  of electrical contacts
type: conference_speech
user_id: '83781'
year: '2023'
...
---
_id: '9206'
abstract:
- lang: eng
  text: Failure in time (FIT) is an important measure for the reliability of electrical
    connectors. Due to the very long lifetime of connectors, the tests for the determination
    of FIT rate are time and labour intensive. In this paper a data driven method
    using a statistical process to estimate the FIT rate of electrical connectors
    with data of electrical contact resistance development in short term tests is
    proposed. The results of prediction are then compared with the results from long
    term tests. The study shows a strong correlation between contact resistance development
    in short term tests and the development of the number of failures in later stages
    of tests. In order to predict the development of degradation precisely, the distribution
    of resistance data in many different tests with different connectors is investigated.
    The Generalized Extreme Value Distribution, which reveals an ideal fitting, has
    been implemented for the prediction of the failure rates of connectors, thereby
    enabling a remarkable time-lapse of lifetime tests. This method can also be employed
    in the prognosis and management of system health through the forecast of health
    of connectors in different systems in operation.
article_number: '114684'
author:
- first_name: Jian
  full_name: Song, Jian
  id: '5297'
  last_name: Song
- first_name: Abhay Rammurti
  full_name: Shukla, Abhay Rammurti
  id: '72757'
  last_name: Shukla
- first_name: Roman
  full_name: Probst, Roman
  id: '69156'
  last_name: Probst
citation:
  ama: 'Song J, Shukla AR, Probst R. Prediction of failure in time (FIT) of electrical
    connectors with short term tests. <i>Microelectronics reliability : an internat
    journal &#38; world abstracting service</i>. 2022;138(November 2022). doi:<a href="https://doi.org/10.1016/j.microrel.2022.114684">10.1016/j.microrel.2022.114684</a>'
  apa: 'Song, J., Shukla, A. R., &#38; Probst, R. (2022). Prediction of failure in
    time (FIT) of electrical connectors with short term tests. <i>Microelectronics
    Reliability : An Internat. Journal &#38; World Abstracting Service</i>, <i>138</i>(November
    2022), Article 114684. <a href="https://doi.org/10.1016/j.microrel.2022.114684">https://doi.org/10.1016/j.microrel.2022.114684</a>'
  bjps: '<b>Song J, Shukla AR and Probst R</b> (2022) Prediction of Failure in Time
    (FIT) of Electrical Connectors with Short Term Tests. <i>Microelectronics reliability :
    an internat. journal &#38; world abstracting service</i> <b>138</b>.'
  chicago: 'Song, Jian, Abhay Rammurti Shukla, and Roman Probst. “Prediction of Failure
    in Time (FIT) of Electrical Connectors with Short Term Tests.” <i>Microelectronics
    Reliability : An Internat. Journal &#38; World Abstracting Service</i> 138, no.
    November 2022 (2022). <a href="https://doi.org/10.1016/j.microrel.2022.114684">https://doi.org/10.1016/j.microrel.2022.114684</a>.'
  chicago-de: 'Song, Jian, Abhay Rammurti Shukla und Roman Probst. 2022. Prediction
    of failure in time (FIT) of electrical connectors with short term tests. <i>Microelectronics
    reliability : an internat. journal &#38; world abstracting service</i> 138, Nr.
    November 2022. doi:<a href="https://doi.org/10.1016/j.microrel.2022.114684">10.1016/j.microrel.2022.114684</a>,
    .'
  din1505-2-1: '<span style="font-variant:small-caps;">Song, Jian</span> ; <span style="font-variant:small-caps;">Shukla,
    Abhay Rammurti</span> ; <span style="font-variant:small-caps;">Probst, Roman</span>:
    Prediction of failure in time (FIT) of electrical connectors with short term tests.
    In: <i>Microelectronics reliability : an internat. journal &#38; world abstracting
    service</i> Bd. 138. Amsterdam, Elsevier (2022), Nr. November 2022'
  havard: 'J. Song, A.R. Shukla, R. Probst, Prediction of failure in time (FIT) of
    electrical connectors with short term tests, Microelectronics Reliability : An
    Internat. Journal &#38; World Abstracting Service. 138 (2022).'
  ieee: 'J. Song, A. R. Shukla, and R. Probst, “Prediction of failure in time (FIT)
    of electrical connectors with short term tests,” <i>Microelectronics reliability :
    an internat. journal &#38; world abstracting service</i>, vol. 138, no. November
    2022, Art. no. 114684, 2022, doi: <a href="https://doi.org/10.1016/j.microrel.2022.114684">10.1016/j.microrel.2022.114684</a>.'
  mla: 'Song, Jian, et al. “Prediction of Failure in Time (FIT) of Electrical Connectors
    with Short Term Tests.” <i>Microelectronics Reliability : An Internat. Journal
    &#38; World Abstracting Service</i>, vol. 138, no. November 2022, 114684, 2022,
    <a href="https://doi.org/10.1016/j.microrel.2022.114684">https://doi.org/10.1016/j.microrel.2022.114684</a>.'
  short: 'J. Song, A.R. Shukla, R. Probst, Microelectronics Reliability : An Internat.
    Journal &#38; World Abstracting Service 138 (2022).'
  ufg: '<b>Song, Jian/Shukla, Abhay Rammurti/Probst, Roman</b>: Prediction of failure
    in time (FIT) of electrical connectors with short term tests, in: <i>Microelectronics
    reliability : an internat. journal &#38; world abstracting service</i> 138 (2022),
    H. November 2022.'
  van: 'Song J, Shukla AR, Probst R. Prediction of failure in time (FIT) of electrical
    connectors with short term tests. Microelectronics reliability : an internat journal
    &#38; world abstracting service. 2022;138(November 2022).'
date_created: 2022-12-11T13:13:46Z
date_updated: 2024-08-05T07:30:51Z
department:
- _id: DEP6012
doi: 10.1016/j.microrel.2022.114684
intvolume: '       138'
issue: November 2022
keyword:
- Electrical connectors
- Prediction of lifetime
- FIT
- Correlation between data in short and long term tests
- Time-lapse of lifetime tests
language:
- iso: eng
place: Amsterdam
publication: 'Microelectronics reliability : an internat. journal & world abstracting
  service'
publication_identifier:
  issn:
  - 0026-2714
publication_status: published
publisher: Elsevier
status: public
title: Prediction of failure in time (FIT) of electrical connectors with short term
  tests
type: scientific_journal_article
user_id: '83781'
volume: 138
year: '2022'
...
---
_id: '9209'
author:
- first_name: Roman
  full_name: Probst, Roman
  id: '69156'
  last_name: Probst
- first_name: Jian
  full_name: Song, Jian
  id: '5297'
  last_name: Song
citation:
  ama: Probst R, Song J. <i>Korrelation des Kontaktwiderstands elektrischer Kontakte
    mit dem Verschleiß bei Reibverschleißprüfungen</i>. (Gesellschaft für Tribologie,
    ed.). GfT Gesellschaft für Tribologie e.V.; 2022:57/1-4.
  apa: 'Probst, R., &#38; Song, J. (2022). Korrelation des Kontaktwiderstands elektrischer
    Kontakte mit dem Verschleiß bei Reibverschleißprüfungen. In Gesellschaft für
    Tribologie (Ed.), <i>Reibung, Schmierung und Verschleiß : Forschung und praktische
    Anwendungen : 63. Tribologie-Fachtagung 2022, 26. bis 28. September 2022 in Göttingen</i>
    (p. 57/1-4). GfT Gesellschaft für Tribologie e.V.'
  bjps: '<b>Probst R and Song J</b> (2022) <i>Korrelation des Kontaktwiderstands elektrischer
    Kontakte mit dem Verschleiß bei Reibverschleißprüfungen</i>, Gesellschaft für
    Tribologie (ed.). Aachen: GfT Gesellschaft für Tribologie e.V.'
  chicago: 'Probst, Roman, and Jian Song. <i>Korrelation des Kontaktwiderstands elektrischer
    Kontakte mit dem Verschleiß bei Reibverschleißprüfungen</i>. Edited by Gesellschaft
    für Tribologie. <i>Reibung, Schmierung und Verschleiß : Forschung und praktische
    Anwendungen : 63. Tribologie-Fachtagung 2022, 26. bis 28. September 2022 in Göttingen</i>.
    Aachen: GfT Gesellschaft für Tribologie e.V., 2022.'
  chicago-de: 'Probst, Roman und Jian Song. 2022. <i>Korrelation des Kontaktwiderstands
    elektrischer Kontakte mit dem Verschleiß bei Reibverschleißprüfungen</i>. Hg.
    von Gesellschaft für Tribologie. <i>Reibung, Schmierung und Verschleiß : Forschung
    und praktische Anwendungen : 63. Tribologie-Fachtagung 2022, 26. bis 28. September
    2022 in Göttingen</i>. Aachen: GfT Gesellschaft für Tribologie e.V.'
  din1505-2-1: '<span style="font-variant:small-caps;">Probst, Roman</span> ; <span
    style="font-variant:small-caps;">Song, Jian</span> ; <span style="font-variant:small-caps;">Gesellschaft
    für Tribologie</span> (Hrsg.): <i>Korrelation des Kontaktwiderstands elektrischer
    Kontakte mit dem Verschleiß bei Reibverschleißprüfungen</i>. Aachen : GfT Gesellschaft
    für Tribologie e.V., 2022'
  havard: R. Probst, J. Song, Korrelation des Kontaktwiderstands elektrischer Kontakte
    mit dem Verschleiß bei Reibverschleißprüfungen, GfT Gesellschaft für Tribologie
    e.V., Aachen, 2022.
  ieee: 'R. Probst and J. Song, <i>Korrelation des Kontaktwiderstands elektrischer
    Kontakte mit dem Verschleiß bei Reibverschleißprüfungen</i>. Aachen: GfT Gesellschaft
    für Tribologie e.V., 2022, p. 57/1–4.'
  mla: 'Probst, Roman, and Jian Song. “Korrelation des Kontaktwiderstands elektrischer
    Kontakte mit dem Verschleiß bei Reibverschleißprüfungen.” <i>Reibung, Schmierung
    und Verschleiß : Forschung und praktische Anwendungen : 63. Tribologie-Fachtagung
    2022, 26. bis 28. September 2022 in Göttingen</i>, edited by Gesellschaft für
    Tribologie, GfT Gesellschaft für Tribologie e.V., 2022, p. 57/1-4.'
  short: R. Probst, J. Song, Korrelation des Kontaktwiderstands elektrischer Kontakte
    mit dem Verschleiß bei Reibverschleißprüfungen, GfT Gesellschaft für Tribologie
    e.V., Aachen, 2022.
  ufg: '<b>Probst, Roman/Song, Jian</b>: Korrelation des Kontaktwiderstands elektrischer
    Kontakte mit dem Verschleiß bei Reibverschleißprüfungen, hg. von Gesellschaft
    für Tribologie, Aachen 2022.'
  van: 'Probst R, Song J. Korrelation des Kontaktwiderstands elektrischer Kontakte
    mit dem Verschleiß bei Reibverschleißprüfungen. Gesellschaft für Tribologie,
    editor. Reibung, Schmierung und Verschleiß : Forschung und praktische Anwendungen :
    63. Tribologie-Fachtagung 2022, 26. bis 28. September 2022 in Göttingen. Aachen:
    GfT Gesellschaft für Tribologie e.V.; 2022.'
conference:
  end_date: 2022-09-28
  location: Göttingen
  name: 63. Tribologie-Fachtagung
  start_date: 2022-09-26
corporate_editor:
- Gesellschaft für Tribologie
date_created: 2022-12-11T13:40:34Z
date_updated: 2024-08-05T07:41:52Z
department:
- _id: DEP6012
language:
- iso: ger
page: 57/1-4
place: Aachen
publication: 'Reibung, Schmierung und Verschleiß : Forschung und praktische Anwendungen
  : 63. Tribologie-Fachtagung 2022, 26. bis 28. September 2022 in Göttingen'
publication_identifier:
  isbn:
  - ' 978-3-9817451-7-7 '
publication_status: published
publisher: GfT Gesellschaft für Tribologie e.V.
status: public
title: Korrelation des Kontaktwiderstands elektrischer Kontakte mit dem Verschleiß
  bei Reibverschleißprüfungen
type: conference_editor_article
user_id: '83781'
year: '2022'
...
---
_id: '9210'
abstract:
- lang: eng
  text: In order to guarantee long lifetime and high performance of electrical contacts,
    a plating is usually applied on the base material. Silver is a promising plating
    material because of a good balance between performance and costs. The conventional
    silver plating is soft; therefore, a thick silver plating should be used to prevent
    the wear through during the operation. In order to enhance the wear resistance
    and prolong the lifetime of the silver plating, silver platings are modified by
    co-depositing nanoparticles with a core/shell structure into the silver matrix.
    A novel method to prepare the Ag (shell)@Al 2 O 3 (core) nanoparticles by galvanic
    process is introduced in this paper. The influence of fabrication parameters in
    the galvanic process such as the concentration of silver nitrate solution and
    the plating voltage on the silver content in the Ag@Al 2 O 3 nanoparticles is
    investigated. Afterwards, different concentrations of core/shell nanoparticles
    are co-deposited into the silver plating to study the effect of nanoparticles
    on the microhardness, microstructure and the lifetime of the silver plating. As
    a result, the microhardness and the lifetime of the silver plating are significantly
    improved and a favorable nanoparticle concentration exists for the longest lifetime.
    Moreover, the mechanism of the lifetime improvement is determined.
author:
- first_name: Haomiao
  full_name: Yuan, Haomiao
  id: '61860'
  last_name: Yuan
- first_name: Roman
  full_name: Probst, Roman
  id: '69156'
  last_name: Probst
- first_name: Jian
  full_name: Song, Jian
  id: '5297'
  last_name: Song
citation:
  ama: Yuan H, Probst R, Song J. <i>Influence of Core/Shell Nanoparticles on the Fretting
    Behavior of Electrical Contacts</i>. IEEE; 2022:166-173. doi:<a href="https://doi.org/10.1109/HLM54538.2022.9969773">10.1109/HLM54538.2022.9969773</a>
  apa: 'Yuan, H., Probst, R., &#38; Song, J. (2022). Influence of Core/Shell Nanoparticles
    on the Fretting Behavior of Electrical Contacts. In <i>Electrical contacts - 2022 :
    proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts</i>
    (pp. 166–173). IEEE. <a href="https://doi.org/10.1109/HLM54538.2022.9969773">https://doi.org/10.1109/HLM54538.2022.9969773</a>'
  bjps: '<b>Yuan H, Probst R and Song J</b> (2022) <i>Influence of Core/Shell Nanoparticles
    on the Fretting Behavior of Electrical Contacts</i>. Piscataway, NJ: IEEE.'
  chicago: 'Yuan, Haomiao, Roman Probst, and Jian Song. <i>Influence of Core/Shell
    Nanoparticles on the Fretting Behavior of Electrical Contacts</i>. <i>Electrical
    Contacts - 2022 : Proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical
    Contacts</i>. Piscataway, NJ: IEEE, 2022. <a href="https://doi.org/10.1109/HLM54538.2022.9969773">https://doi.org/10.1109/HLM54538.2022.9969773</a>.'
  chicago-de: 'Yuan, Haomiao, Roman Probst und Jian Song. 2022. <i>Influence of Core/Shell
    Nanoparticles on the Fretting Behavior of Electrical Contacts</i>. <i>Electrical
    contacts - 2022 : proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical
    Contacts</i>. Piscataway, NJ: IEEE. doi:<a href="https://doi.org/10.1109/HLM54538.2022.9969773">10.1109/HLM54538.2022.9969773</a>,
    .'
  din1505-2-1: '<span style="font-variant:small-caps;">Yuan, Haomiao</span> ; <span
    style="font-variant:small-caps;">Probst, Roman</span> ; <span style="font-variant:small-caps;">Song,
    Jian</span>: <i>Influence of Core/Shell Nanoparticles on the Fretting Behavior
    of Electrical Contacts</i>. Piscataway, NJ : IEEE, 2022'
  havard: H. Yuan, R. Probst, J. Song, Influence of Core/Shell Nanoparticles on the
    Fretting Behavior of Electrical Contacts, IEEE, Piscataway, NJ, 2022.
  ieee: 'H. Yuan, R. Probst, and J. Song, <i>Influence of Core/Shell Nanoparticles
    on the Fretting Behavior of Electrical Contacts</i>. Piscataway, NJ: IEEE, 2022,
    pp. 166–173. doi: <a href="https://doi.org/10.1109/HLM54538.2022.9969773">10.1109/HLM54538.2022.9969773</a>.'
  mla: 'Yuan, Haomiao, et al. “Influence of Core/Shell Nanoparticles on the Fretting
    Behavior of Electrical Contacts.” <i>Electrical Contacts - 2022 : Proceedings
    of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts</i>, IEEE, 2022,
    pp. 166–73, <a href="https://doi.org/10.1109/HLM54538.2022.9969773">https://doi.org/10.1109/HLM54538.2022.9969773</a>.'
  short: H. Yuan, R. Probst, J. Song, Influence of Core/Shell Nanoparticles on the
    Fretting Behavior of Electrical Contacts, IEEE, Piscataway, NJ, 2022.
  ufg: '<b>Yuan, Haomiao/Probst, Roman/Song, Jian</b>: Influence of Core/Shell Nanoparticles
    on the Fretting Behavior of Electrical Contacts, Piscataway, NJ 2022.'
  van: 'Yuan H, Probst R, Song J. Influence of Core/Shell Nanoparticles on the Fretting
    Behavior of Electrical Contacts. Electrical contacts - 2022 : proceedings of the
    Sixty-Seventh IEEE Holm Conference on Electrical Contacts. Piscataway, NJ: IEEE;
    2022.'
conference:
  end_date: 2022-10-26
  location: ' Tampa, FL, USA'
  name: 67th Holm Conference on Electrical Contacts
  start_date: 2022-10-23
date_created: 2022-12-11T13:46:02Z
date_updated: 2024-08-05T08:01:04Z
department:
- _id: DEP6012
doi: 10.1109/HLM54538.2022.9969773
keyword:
- Nanoparticles
- Resistance
- Fabrication
- Silver
- Costs
- Contacts
- Voltage
language:
- iso: eng
page: 166 - 173
place: Piscataway, NJ
publication: 'Electrical contacts - 2022 : proceedings of the Sixty-Seventh IEEE Holm
  Conference on Electrical Contacts'
publication_identifier:
  eissn:
  - 978-1-6654-5965-5
  isbn:
  - 978-1-6654-5966-2
  - 978-1-6654-5967-9
  issn:
  - 2158-9992
publication_status: published
publisher: IEEE
status: public
title: Influence of Core/Shell Nanoparticles on the Fretting Behavior of Electrical
  Contacts
type: conference_editor_article
user_id: '83781'
year: '2022'
...
---
_id: '9211'
abstract:
- lang: eng
  text: Lifetime tests of connectors are time consuming and labor intensive. Our study
    reveals a strong correlation between the statistical characteristics of contact
    resistance development in the early stages of lifetime tests and the final results
    of the tests. This correlation enables a further time lapse of lifetime tests
    and the prediction of the state of the health of connectors which can be utilized
    in the development of diagnostic strategy in sophisticated networks with very
    high number of connectors as well as in a quick classification of connectors with
    respect to their design features. Methods of statistical evaluation are introduced
    and the sensitivity analyses of different characteristics for the state of health
    of connectors are conducted.
author:
- first_name: Jian
  full_name: Song, Jian
  id: '5297'
  last_name: Song
- first_name: Abhay Rammurti
  full_name: Shukla, Abhay Rammurti
  id: '72757'
  last_name: Shukla
- first_name: Roman
  full_name: Probst, Roman
  id: '69156'
  last_name: Probst
citation:
  ama: Song J, Shukla AR, Probst R. <i>State of Health of Connectors – Early Indicators</i>.
    IEEE; 2022:272-278. doi:<a href="https://doi.org/10.1109/HLM54538.2022.9969839">10.1109/HLM54538.2022.9969839</a>
  apa: 'Song, J., Shukla, A. R., &#38; Probst, R. (2022). State of Health of Connectors
    – Early Indicators. In <i>Electrical contacts - 2022 : proceedings of the Sixty-Seventh
    IEEE Holm Conference on Electrical Contacts</i> (pp. 272–278). IEEE. <a href="https://doi.org/10.1109/HLM54538.2022.9969839">https://doi.org/10.1109/HLM54538.2022.9969839</a>'
  bjps: '<b>Song J, Shukla AR and Probst R</b> (2022) <i>State of Health of Connectors
    – Early Indicators</i>. Piscataway, NJ: IEEE.'
  chicago: 'Song, Jian, Abhay Rammurti Shukla, and Roman Probst. <i>State of Health
    of Connectors – Early Indicators</i>. <i>Electrical Contacts - 2022 : Proceedings
    of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts</i>. Piscataway,
    NJ: IEEE, 2022. <a href="https://doi.org/10.1109/HLM54538.2022.9969839">https://doi.org/10.1109/HLM54538.2022.9969839</a>.'
  chicago-de: 'Song, Jian, Abhay Rammurti Shukla und Roman Probst. 2022. <i>State
    of Health of Connectors – Early Indicators</i>. <i>Electrical contacts - 2022 :
    proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts</i>.
    Piscataway, NJ: IEEE. doi:<a href="https://doi.org/10.1109/HLM54538.2022.9969839">10.1109/HLM54538.2022.9969839</a>,
    .'
  din1505-2-1: '<span style="font-variant:small-caps;">Song, Jian</span> ; <span style="font-variant:small-caps;">Shukla,
    Abhay Rammurti</span> ; <span style="font-variant:small-caps;">Probst, Roman</span>:
    <i>State of Health of Connectors – Early Indicators</i>. Piscataway, NJ : IEEE,
    2022'
  havard: J. Song, A.R. Shukla, R. Probst, State of Health of Connectors – Early Indicators,
    IEEE, Piscataway, NJ, 2022.
  ieee: 'J. Song, A. R. Shukla, and R. Probst, <i>State of Health of Connectors –
    Early Indicators</i>. Piscataway, NJ: IEEE, 2022, pp. 272–278. doi: <a href="https://doi.org/10.1109/HLM54538.2022.9969839">10.1109/HLM54538.2022.9969839</a>.'
  mla: 'Song, Jian, et al. “State of Health of Connectors – Early Indicators.” <i>Electrical
    Contacts - 2022 : Proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical
    Contacts</i>, IEEE, 2022, pp. 272–78, <a href="https://doi.org/10.1109/HLM54538.2022.9969839">https://doi.org/10.1109/HLM54538.2022.9969839</a>.'
  short: J. Song, A.R. Shukla, R. Probst, State of Health of Connectors – Early Indicators,
    IEEE, Piscataway, NJ, 2022.
  ufg: '<b>Song, Jian/Shukla, Abhay Rammurti/Probst, Roman</b>: State of Health of
    Connectors – Early Indicators, Piscataway, NJ 2022.'
  van: 'Song J, Shukla AR, Probst R. State of Health of Connectors – Early Indicators.
    Electrical contacts - 2022 : proceedings of the Sixty-Seventh IEEE Holm Conference
    on Electrical Contacts. Piscataway, NJ: IEEE; 2022.'
conference:
  end_date: 2022-10-26
  location: Tampa, FL, USA
  name: 67th Holm Conference on Electrical Contacts
  start_date: 2022-10-23
date_created: 2022-12-11T13:50:30Z
date_updated: 2024-08-05T08:01:22Z
department:
- _id: DEP6012
doi: 10.1109/HLM54538.2022.9969839
keyword:
- Connectors
- Correlation
- Sensitivity analysis
- Contact resistance
- Lifetime estimation
- Reliability
- Electrical resistance measurement
language:
- iso: eng
page: 272 - 278
place: Piscataway, NJ
publication: 'Electrical contacts - 2022 : proceedings of the Sixty-Seventh IEEE Holm
  Conference on Electrical Contacts'
publication_identifier:
  eisbn:
  - 978-1-6654-5965-5
  isbn:
  - 978-1-6654-5966-2
  - 978-1-6654-5967-9
  issn:
  - 2158-9992
publication_status: published
publisher: IEEE
status: public
title: State of Health of Connectors – Early Indicators
type: conference_editor_article
user_id: '83781'
year: '2022'
...