[{"type":"scientific_journal_article","_id":"9204","page":"124","volume":10,"abstract":[{"text":"The development of autonomous vehicles and the integration of new information and communication technologies are making the reliability of electrical systems and components in modern vehicles increasingly important. Electrical connectors are a crucial component in an electrical on-board system. They are exposed to a wide variety of influences by the environment and operating conditions. Thus, the degradation of electrical connectors can occur. Material and surface analysis methods are the tools used to analyze the degradation mechanisms in connectors after lifetime tests, as well as in field operations. Within the framework of this study, a wide variety of methods from the analytical scope are presented and discussed. The connector surfaces degraded by different failure mechanisms are analyzed using various material and surface analysis methods. The quality and the nature of the analyses results obtained from various analysis methods are compared. Also, this study deals with the benefits and limitations, as well as the effort and the specific challenges of different material and surface analytical methods for the evaluation of failure mechanisms from the point of view of a material and surface analyst.","lang":"eng"}],"place":"Basel","author":[{"first_name":"Philipp","last_name":"Kolmer","full_name":"Kolmer, Philipp"},{"last_name":"Shukla","id":"72757","full_name":"Shukla, Abhay Rammurti","first_name":"Abhay Rammurti"},{"full_name":"Song, Jian","id":"5297","last_name":"Song","first_name":"Jian"}],"status":"public","date_created":"2022-12-11T12:35:54Z","language":[{"iso":"eng"}],"date_updated":"2024-08-05T07:19:56Z","year":"2022","user_id":"83781","publisher":"MDPI","citation":{"van":"Kolmer P, Shukla AR, Song J. Methods of Material and Surface Analysis for the Evaluation of Failure Modes for Electrical Connectors. Technologies : open access journal. 2022;10(6):124.","ieee":"P. Kolmer, A. R. Shukla, and J. Song, “Methods of Material and Surface Analysis for the Evaluation of Failure Modes for Electrical Connectors,” <i>Technologies : open access journal</i>, vol. 10, no. 6, p. 124, 2022, doi: <a href=\"https://doi.org/10.3390/technologies10060124\">https://doi.org/10.3390/technologies10060124</a>.","ufg":"<b>Kolmer, Philipp/Shukla, Abhay Rammurti/Song, Jian</b>: Methods of Material and Surface Analysis for the Evaluation of Failure Modes for Electrical Connectors, in: <i>Technologies : open access journal</i> 10 (2022), H. 6,  S. 124.","havard":"P. Kolmer, A.R. Shukla, J. Song, Methods of Material and Surface Analysis for the Evaluation of Failure Modes for Electrical Connectors, Technologies : Open Access Journal. 10 (2022) 124.","apa":"Kolmer, P., Shukla, A. R., &#38; Song, J. (2022). Methods of Material and Surface Analysis for the Evaluation of Failure Modes for Electrical Connectors. <i>Technologies : Open Access Journal</i>, <i>10</i>(6), 124. <a href=\"https://doi.org/10.3390/technologies10060124\">https://doi.org/10.3390/technologies10060124</a>","ama":"Kolmer P, Shukla AR, Song J. Methods of Material and Surface Analysis for the Evaluation of Failure Modes for Electrical Connectors. <i>Technologies : open access journal</i>. 2022;10(6):124. doi:<a href=\"https://doi.org/10.3390/technologies10060124\">https://doi.org/10.3390/technologies10060124</a>","bjps":"<b>Kolmer P, Shukla AR and Song J</b> (2022) Methods of Material and Surface Analysis for the Evaluation of Failure Modes for Electrical Connectors. <i>Technologies : open access journal</i> <b>10</b>, 124.","chicago-de":"Kolmer, Philipp, Abhay Rammurti Shukla und Jian Song. 2022. Methods of Material and Surface Analysis for the Evaluation of Failure Modes for Electrical Connectors. <i>Technologies : open access journal</i> 10, Nr. 6: 124. doi:<a href=\"https://doi.org/10.3390/technologies10060124\">https://doi.org/10.3390/technologies10060124</a>, .","din1505-2-1":"<span style=\"font-variant:small-caps;\">Kolmer, Philipp</span> ; <span style=\"font-variant:small-caps;\">Shukla, Abhay Rammurti</span> ; <span style=\"font-variant:small-caps;\">Song, Jian</span>: Methods of Material and Surface Analysis for the Evaluation of Failure Modes for Electrical Connectors. In: <i>Technologies : open access journal</i> Bd. 10. Basel, MDPI (2022), Nr. 6, S. 124","chicago":"Kolmer, Philipp, Abhay Rammurti Shukla, and Jian Song. “Methods of Material and Surface Analysis for the Evaluation of Failure Modes for Electrical Connectors.” <i>Technologies : Open Access Journal</i> 10, no. 6 (2022): 124. <a href=\"https://doi.org/10.3390/technologies10060124\">https://doi.org/10.3390/technologies10060124</a>.","short":"P. Kolmer, A.R. Shukla, J. Song, Technologies : Open Access Journal 10 (2022) 124.","mla":"Kolmer, Philipp, et al. “Methods of Material and Surface Analysis for the Evaluation of Failure Modes for Electrical Connectors.” <i>Technologies : Open Access Journal</i>, vol. 10, no. 6, 2022, p. 124, <a href=\"https://doi.org/10.3390/technologies10060124\">https://doi.org/10.3390/technologies10060124</a>."},"intvolume":"        10","publication":"Technologies : open access journal","doi":"https://doi.org/10.3390/technologies10060124","issue":"6","publication_identifier":{"eissn":["2227-7080 "]},"publication_status":"published","title":"Methods of Material and Surface Analysis for the Evaluation of Failure Modes for Electrical Connectors","department":[{"_id":"DEP6012"}],"keyword":["electrical connector","failure modes","wear","fretting corrosion","analysis","material","method"],"ddc":["600"]},{"date_updated":"2024-08-05T07:30:51Z","year":"2022","article_number":"114684","user_id":"83781","date_created":"2022-12-11T13:13:46Z","language":[{"iso":"eng"}],"place":"Amsterdam","status":"public","author":[{"last_name":"Song","full_name":"Song, Jian","id":"5297","first_name":"Jian"},{"id":"72757","full_name":"Shukla, Abhay Rammurti","last_name":"Shukla","first_name":"Abhay Rammurti"},{"last_name":"Probst","id":"69156","full_name":"Probst, Roman","first_name":"Roman"}],"volume":138,"type":"scientific_journal_article","_id":"9206","abstract":[{"text":"Failure in time (FIT) is an important measure for the reliability of electrical connectors. Due to the very long lifetime of connectors, the tests for the determination of FIT rate are time and labour intensive. In this paper a data driven method using a statistical process to estimate the FIT rate of electrical connectors with data of electrical contact resistance development in short term tests is proposed. The results of prediction are then compared with the results from long term tests. The study shows a strong correlation between contact resistance development in short term tests and the development of the number of failures in later stages of tests. In order to predict the development of degradation precisely, the distribution of resistance data in many different tests with different connectors is investigated. The Generalized Extreme Value Distribution, which reveals an ideal fitting, has been implemented for the prediction of the failure rates of connectors, thereby enabling a remarkable time-lapse of lifetime tests. This method can also be employed in the prognosis and management of system health through the forecast of health of connectors in different systems in operation.","lang":"eng"}],"keyword":["Electrical connectors","Prediction of lifetime","FIT","Correlation between data in short and long term tests","Time-lapse of lifetime tests"],"publication":"Microelectronics reliability : an internat. journal & world abstracting service","issue":"November 2022","doi":"10.1016/j.microrel.2022.114684","title":"Prediction of failure in time (FIT) of electrical connectors with short term tests","department":[{"_id":"DEP6012"}],"publication_status":"published","publication_identifier":{"issn":["0026-2714"]},"intvolume":"       138","publisher":"Elsevier","citation":{"ama":"Song J, Shukla AR, Probst R. Prediction of failure in time (FIT) of electrical connectors with short term tests. <i>Microelectronics reliability : an internat journal &#38; world abstracting service</i>. 2022;138(November 2022). doi:<a href=\"https://doi.org/10.1016/j.microrel.2022.114684\">10.1016/j.microrel.2022.114684</a>","apa":"Song, J., Shukla, A. R., &#38; Probst, R. (2022). Prediction of failure in time (FIT) of electrical connectors with short term tests. <i>Microelectronics Reliability : An Internat. Journal &#38; World Abstracting Service</i>, <i>138</i>(November 2022), Article 114684. <a href=\"https://doi.org/10.1016/j.microrel.2022.114684\">https://doi.org/10.1016/j.microrel.2022.114684</a>","havard":"J. Song, A.R. Shukla, R. Probst, Prediction of failure in time (FIT) of electrical connectors with short term tests, Microelectronics Reliability : An Internat. Journal &#38; World Abstracting Service. 138 (2022).","ufg":"<b>Song, Jian/Shukla, Abhay Rammurti/Probst, Roman</b>: Prediction of failure in time (FIT) of electrical connectors with short term tests, in: <i>Microelectronics reliability : an internat. journal &#38; world abstracting service</i> 138 (2022), H. November 2022.","ieee":"J. Song, A. R. Shukla, and R. Probst, “Prediction of failure in time (FIT) of electrical connectors with short term tests,” <i>Microelectronics reliability : an internat. journal &#38; world abstracting service</i>, vol. 138, no. November 2022, Art. no. 114684, 2022, doi: <a href=\"https://doi.org/10.1016/j.microrel.2022.114684\">10.1016/j.microrel.2022.114684</a>.","van":"Song J, Shukla AR, Probst R. Prediction of failure in time (FIT) of electrical connectors with short term tests. Microelectronics reliability : an internat journal &#38; world abstracting service. 2022;138(November 2022).","mla":"Song, Jian, et al. “Prediction of Failure in Time (FIT) of Electrical Connectors with Short Term Tests.” <i>Microelectronics Reliability : An Internat. Journal &#38; World Abstracting Service</i>, vol. 138, no. November 2022, 114684, 2022, <a href=\"https://doi.org/10.1016/j.microrel.2022.114684\">https://doi.org/10.1016/j.microrel.2022.114684</a>.","chicago":"Song, Jian, Abhay Rammurti Shukla, and Roman Probst. “Prediction of Failure in Time (FIT) of Electrical Connectors with Short Term Tests.” <i>Microelectronics Reliability : An Internat. Journal &#38; World Abstracting Service</i> 138, no. November 2022 (2022). <a href=\"https://doi.org/10.1016/j.microrel.2022.114684\">https://doi.org/10.1016/j.microrel.2022.114684</a>.","short":"J. Song, A.R. Shukla, R. Probst, Microelectronics Reliability : An Internat. Journal &#38; World Abstracting Service 138 (2022).","din1505-2-1":"<span style=\"font-variant:small-caps;\">Song, Jian</span> ; <span style=\"font-variant:small-caps;\">Shukla, Abhay Rammurti</span> ; <span style=\"font-variant:small-caps;\">Probst, Roman</span>: Prediction of failure in time (FIT) of electrical connectors with short term tests. In: <i>Microelectronics reliability : an internat. journal &#38; world abstracting service</i> Bd. 138. Amsterdam, Elsevier (2022), Nr. November 2022","bjps":"<b>Song J, Shukla AR and Probst R</b> (2022) Prediction of Failure in Time (FIT) of Electrical Connectors with Short Term Tests. <i>Microelectronics reliability : an internat. journal &#38; world abstracting service</i> <b>138</b>.","chicago-de":"Song, Jian, Abhay Rammurti Shukla und Roman Probst. 2022. Prediction of failure in time (FIT) of electrical connectors with short term tests. <i>Microelectronics reliability : an internat. journal &#38; world abstracting service</i> 138, Nr. November 2022. doi:<a href=\"https://doi.org/10.1016/j.microrel.2022.114684\">10.1016/j.microrel.2022.114684</a>, ."}},{"language":[{"iso":"eng"}],"date_created":"2022-12-11T13:50:30Z","user_id":"83781","year":"2022","date_updated":"2024-08-05T08:01:22Z","abstract":[{"lang":"eng","text":"Lifetime tests of connectors are time consuming and labor intensive. Our study reveals a strong correlation between the statistical characteristics of contact resistance development in the early stages of lifetime tests and the final results of the tests. This correlation enables a further time lapse of lifetime tests and the prediction of the state of the health of connectors which can be utilized in the development of diagnostic strategy in sophisticated networks with very high number of connectors as well as in a quick classification of connectors with respect to their design features. Methods of statistical evaluation are introduced and the sensitivity analyses of different characteristics for the state of health of connectors are conducted."}],"type":"conference_editor_article","_id":"9211","page":"272 - 278","author":[{"full_name":"Song, Jian","id":"5297","last_name":"Song","first_name":"Jian"},{"first_name":"Abhay Rammurti","last_name":"Shukla","id":"72757","full_name":"Shukla, Abhay Rammurti"},{"first_name":"Roman","last_name":"Probst","full_name":"Probst, Roman","id":"69156"}],"status":"public","place":"Piscataway, NJ","doi":"10.1109/HLM54538.2022.9969839","publication_identifier":{"isbn":["978-1-6654-5966-2","978-1-6654-5967-9"],"issn":["2158-9992"],"eisbn":["978-1-6654-5965-5"]},"publication_status":"published","title":"State of Health of Connectors – Early Indicators","department":[{"_id":"DEP6012"}],"conference":{"start_date":"2022-10-23","location":"Tampa, FL, USA","end_date":"2022-10-26","name":"67th Holm Conference on Electrical Contacts"},"publication":"Electrical contacts - 2022 : proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts","keyword":["Connectors","Correlation","Sensitivity analysis","Contact resistance","Lifetime estimation","Reliability","Electrical resistance measurement"],"publisher":"IEEE","citation":{"van":"Song J, Shukla AR, Probst R. State of Health of Connectors – Early Indicators. Electrical contacts - 2022 : proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts. Piscataway, NJ: IEEE; 2022.","ieee":"J. Song, A. R. Shukla, and R. Probst, <i>State of Health of Connectors – Early Indicators</i>. Piscataway, NJ: IEEE, 2022, pp. 272–278. doi: <a href=\"https://doi.org/10.1109/HLM54538.2022.9969839\">10.1109/HLM54538.2022.9969839</a>.","apa":"Song, J., Shukla, A. R., &#38; Probst, R. (2022). State of Health of Connectors – Early Indicators. In <i>Electrical contacts - 2022 : proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts</i> (pp. 272–278). IEEE. <a href=\"https://doi.org/10.1109/HLM54538.2022.9969839\">https://doi.org/10.1109/HLM54538.2022.9969839</a>","ama":"Song J, Shukla AR, Probst R. <i>State of Health of Connectors – Early Indicators</i>. IEEE; 2022:272-278. doi:<a href=\"https://doi.org/10.1109/HLM54538.2022.9969839\">10.1109/HLM54538.2022.9969839</a>","ufg":"<b>Song, Jian/Shukla, Abhay Rammurti/Probst, Roman</b>: State of Health of Connectors – Early Indicators, Piscataway, NJ 2022.","havard":"J. Song, A.R. Shukla, R. Probst, State of Health of Connectors – Early Indicators, IEEE, Piscataway, NJ, 2022.","bjps":"<b>Song J, Shukla AR and Probst R</b> (2022) <i>State of Health of Connectors – Early Indicators</i>. Piscataway, NJ: IEEE.","chicago-de":"Song, Jian, Abhay Rammurti Shukla und Roman Probst. 2022. <i>State of Health of Connectors – Early Indicators</i>. <i>Electrical contacts - 2022 : proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts</i>. Piscataway, NJ: IEEE. doi:<a href=\"https://doi.org/10.1109/HLM54538.2022.9969839\">10.1109/HLM54538.2022.9969839</a>, .","din1505-2-1":"<span style=\"font-variant:small-caps;\">Song, Jian</span> ; <span style=\"font-variant:small-caps;\">Shukla, Abhay Rammurti</span> ; <span style=\"font-variant:small-caps;\">Probst, Roman</span>: <i>State of Health of Connectors – Early Indicators</i>. Piscataway, NJ : IEEE, 2022","chicago":"Song, Jian, Abhay Rammurti Shukla, and Roman Probst. <i>State of Health of Connectors – Early Indicators</i>. <i>Electrical Contacts - 2022 : Proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts</i>. Piscataway, NJ: IEEE, 2022. <a href=\"https://doi.org/10.1109/HLM54538.2022.9969839\">https://doi.org/10.1109/HLM54538.2022.9969839</a>.","short":"J. Song, A.R. Shukla, R. Probst, State of Health of Connectors – Early Indicators, IEEE, Piscataway, NJ, 2022.","mla":"Song, Jian, et al. “State of Health of Connectors – Early Indicators.” <i>Electrical Contacts - 2022 : Proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts</i>, IEEE, 2022, pp. 272–78, <a href=\"https://doi.org/10.1109/HLM54538.2022.9969839\">https://doi.org/10.1109/HLM54538.2022.9969839</a>."}}]