---
_id: '9204'
abstract:
- lang: eng
  text: The development of autonomous vehicles and the integration of new information
    and communication technologies are making the reliability of electrical systems
    and components in modern vehicles increasingly important. Electrical connectors
    are a crucial component in an electrical on-board system. They are exposed to
    a wide variety of influences by the environment and operating conditions. Thus,
    the degradation of electrical connectors can occur. Material and surface analysis
    methods are the tools used to analyze the degradation mechanisms in connectors
    after lifetime tests, as well as in field operations. Within the framework of
    this study, a wide variety of methods from the analytical scope are presented
    and discussed. The connector surfaces degraded by different failure mechanisms
    are analyzed using various material and surface analysis methods. The quality
    and the nature of the analyses results obtained from various analysis methods
    are compared. Also, this study deals with the benefits and limitations, as well
    as the effort and the specific challenges of different material and surface analytical
    methods for the evaluation of failure mechanisms from the point of view of a material
    and surface analyst.
author:
- first_name: Philipp
  full_name: Kolmer, Philipp
  last_name: Kolmer
- first_name: Abhay Rammurti
  full_name: Shukla, Abhay Rammurti
  id: '72757'
  last_name: Shukla
- first_name: Jian
  full_name: Song, Jian
  id: '5297'
  last_name: Song
citation:
  ama: 'Kolmer P, Shukla AR, Song J. Methods of Material and Surface Analysis for
    the Evaluation of Failure Modes for Electrical Connectors. <i>Technologies : open
    access journal</i>. 2022;10(6):124. doi:<a href="https://doi.org/10.3390/technologies10060124">https://doi.org/10.3390/technologies10060124</a>'
  apa: 'Kolmer, P., Shukla, A. R., &#38; Song, J. (2022). Methods of Material and
    Surface Analysis for the Evaluation of Failure Modes for Electrical Connectors.
    <i>Technologies : Open Access Journal</i>, <i>10</i>(6), 124. <a href="https://doi.org/10.3390/technologies10060124">https://doi.org/10.3390/technologies10060124</a>'
  bjps: '<b>Kolmer P, Shukla AR and Song J</b> (2022) Methods of Material and Surface
    Analysis for the Evaluation of Failure Modes for Electrical Connectors. <i>Technologies :
    open access journal</i> <b>10</b>, 124.'
  chicago: 'Kolmer, Philipp, Abhay Rammurti Shukla, and Jian Song. “Methods of Material
    and Surface Analysis for the Evaluation of Failure Modes for Electrical Connectors.”
    <i>Technologies : Open Access Journal</i> 10, no. 6 (2022): 124. <a href="https://doi.org/10.3390/technologies10060124">https://doi.org/10.3390/technologies10060124</a>.'
  chicago-de: 'Kolmer, Philipp, Abhay Rammurti Shukla und Jian Song. 2022. Methods
    of Material and Surface Analysis for the Evaluation of Failure Modes for Electrical
    Connectors. <i>Technologies : open access journal</i> 10, Nr. 6: 124. doi:<a href="https://doi.org/10.3390/technologies10060124">https://doi.org/10.3390/technologies10060124</a>,
    .'
  din1505-2-1: '<span style="font-variant:small-caps;">Kolmer, Philipp</span> ; <span
    style="font-variant:small-caps;">Shukla, Abhay Rammurti</span> ; <span style="font-variant:small-caps;">Song,
    Jian</span>: Methods of Material and Surface Analysis for the Evaluation of Failure
    Modes for Electrical Connectors. In: <i>Technologies : open access journal</i>
    Bd. 10. Basel, MDPI (2022), Nr. 6, S. 124'
  havard: 'P. Kolmer, A.R. Shukla, J. Song, Methods of Material and Surface Analysis
    for the Evaluation of Failure Modes for Electrical Connectors, Technologies :
    Open Access Journal. 10 (2022) 124.'
  ieee: 'P. Kolmer, A. R. Shukla, and J. Song, “Methods of Material and Surface Analysis
    for the Evaluation of Failure Modes for Electrical Connectors,” <i>Technologies :
    open access journal</i>, vol. 10, no. 6, p. 124, 2022, doi: <a href="https://doi.org/10.3390/technologies10060124">https://doi.org/10.3390/technologies10060124</a>.'
  mla: 'Kolmer, Philipp, et al. “Methods of Material and Surface Analysis for the
    Evaluation of Failure Modes for Electrical Connectors.” <i>Technologies : Open
    Access Journal</i>, vol. 10, no. 6, 2022, p. 124, <a href="https://doi.org/10.3390/technologies10060124">https://doi.org/10.3390/technologies10060124</a>.'
  short: 'P. Kolmer, A.R. Shukla, J. Song, Technologies : Open Access Journal 10 (2022)
    124.'
  ufg: '<b>Kolmer, Philipp/Shukla, Abhay Rammurti/Song, Jian</b>: Methods of Material
    and Surface Analysis for the Evaluation of Failure Modes for Electrical Connectors,
    in: <i>Technologies : open access journal</i> 10 (2022), H. 6,  S. 124.'
  van: 'Kolmer P, Shukla AR, Song J. Methods of Material and Surface Analysis for
    the Evaluation of Failure Modes for Electrical Connectors. Technologies : open
    access journal. 2022;10(6):124.'
date_created: 2022-12-11T12:35:54Z
date_updated: 2024-08-05T07:19:56Z
ddc:
- '600'
department:
- _id: DEP6012
doi: https://doi.org/10.3390/technologies10060124
intvolume: '        10'
issue: '6'
keyword:
- electrical connector
- failure modes
- wear
- fretting corrosion
- analysis
- material
- method
language:
- iso: eng
page: '124'
place: Basel
publication: 'Technologies : open access journal'
publication_identifier:
  eissn:
  - '2227-7080 '
publication_status: published
publisher: MDPI
status: public
title: Methods of Material and Surface Analysis for the Evaluation of Failure Modes
  for Electrical Connectors
type: scientific_journal_article
user_id: '83781'
volume: 10
year: '2022'
...
---
_id: '9206'
abstract:
- lang: eng
  text: Failure in time (FIT) is an important measure for the reliability of electrical
    connectors. Due to the very long lifetime of connectors, the tests for the determination
    of FIT rate are time and labour intensive. In this paper a data driven method
    using a statistical process to estimate the FIT rate of electrical connectors
    with data of electrical contact resistance development in short term tests is
    proposed. The results of prediction are then compared with the results from long
    term tests. The study shows a strong correlation between contact resistance development
    in short term tests and the development of the number of failures in later stages
    of tests. In order to predict the development of degradation precisely, the distribution
    of resistance data in many different tests with different connectors is investigated.
    The Generalized Extreme Value Distribution, which reveals an ideal fitting, has
    been implemented for the prediction of the failure rates of connectors, thereby
    enabling a remarkable time-lapse of lifetime tests. This method can also be employed
    in the prognosis and management of system health through the forecast of health
    of connectors in different systems in operation.
article_number: '114684'
author:
- first_name: Jian
  full_name: Song, Jian
  id: '5297'
  last_name: Song
- first_name: Abhay Rammurti
  full_name: Shukla, Abhay Rammurti
  id: '72757'
  last_name: Shukla
- first_name: Roman
  full_name: Probst, Roman
  id: '69156'
  last_name: Probst
citation:
  ama: 'Song J, Shukla AR, Probst R. Prediction of failure in time (FIT) of electrical
    connectors with short term tests. <i>Microelectronics reliability : an internat
    journal &#38; world abstracting service</i>. 2022;138(November 2022). doi:<a href="https://doi.org/10.1016/j.microrel.2022.114684">10.1016/j.microrel.2022.114684</a>'
  apa: 'Song, J., Shukla, A. R., &#38; Probst, R. (2022). Prediction of failure in
    time (FIT) of electrical connectors with short term tests. <i>Microelectronics
    Reliability : An Internat. Journal &#38; World Abstracting Service</i>, <i>138</i>(November
    2022), Article 114684. <a href="https://doi.org/10.1016/j.microrel.2022.114684">https://doi.org/10.1016/j.microrel.2022.114684</a>'
  bjps: '<b>Song J, Shukla AR and Probst R</b> (2022) Prediction of Failure in Time
    (FIT) of Electrical Connectors with Short Term Tests. <i>Microelectronics reliability :
    an internat. journal &#38; world abstracting service</i> <b>138</b>.'
  chicago: 'Song, Jian, Abhay Rammurti Shukla, and Roman Probst. “Prediction of Failure
    in Time (FIT) of Electrical Connectors with Short Term Tests.” <i>Microelectronics
    Reliability : An Internat. Journal &#38; World Abstracting Service</i> 138, no.
    November 2022 (2022). <a href="https://doi.org/10.1016/j.microrel.2022.114684">https://doi.org/10.1016/j.microrel.2022.114684</a>.'
  chicago-de: 'Song, Jian, Abhay Rammurti Shukla und Roman Probst. 2022. Prediction
    of failure in time (FIT) of electrical connectors with short term tests. <i>Microelectronics
    reliability : an internat. journal &#38; world abstracting service</i> 138, Nr.
    November 2022. doi:<a href="https://doi.org/10.1016/j.microrel.2022.114684">10.1016/j.microrel.2022.114684</a>,
    .'
  din1505-2-1: '<span style="font-variant:small-caps;">Song, Jian</span> ; <span style="font-variant:small-caps;">Shukla,
    Abhay Rammurti</span> ; <span style="font-variant:small-caps;">Probst, Roman</span>:
    Prediction of failure in time (FIT) of electrical connectors with short term tests.
    In: <i>Microelectronics reliability : an internat. journal &#38; world abstracting
    service</i> Bd. 138. Amsterdam, Elsevier (2022), Nr. November 2022'
  havard: 'J. Song, A.R. Shukla, R. Probst, Prediction of failure in time (FIT) of
    electrical connectors with short term tests, Microelectronics Reliability : An
    Internat. Journal &#38; World Abstracting Service. 138 (2022).'
  ieee: 'J. Song, A. R. Shukla, and R. Probst, “Prediction of failure in time (FIT)
    of electrical connectors with short term tests,” <i>Microelectronics reliability :
    an internat. journal &#38; world abstracting service</i>, vol. 138, no. November
    2022, Art. no. 114684, 2022, doi: <a href="https://doi.org/10.1016/j.microrel.2022.114684">10.1016/j.microrel.2022.114684</a>.'
  mla: 'Song, Jian, et al. “Prediction of Failure in Time (FIT) of Electrical Connectors
    with Short Term Tests.” <i>Microelectronics Reliability : An Internat. Journal
    &#38; World Abstracting Service</i>, vol. 138, no. November 2022, 114684, 2022,
    <a href="https://doi.org/10.1016/j.microrel.2022.114684">https://doi.org/10.1016/j.microrel.2022.114684</a>.'
  short: 'J. Song, A.R. Shukla, R. Probst, Microelectronics Reliability : An Internat.
    Journal &#38; World Abstracting Service 138 (2022).'
  ufg: '<b>Song, Jian/Shukla, Abhay Rammurti/Probst, Roman</b>: Prediction of failure
    in time (FIT) of electrical connectors with short term tests, in: <i>Microelectronics
    reliability : an internat. journal &#38; world abstracting service</i> 138 (2022),
    H. November 2022.'
  van: 'Song J, Shukla AR, Probst R. Prediction of failure in time (FIT) of electrical
    connectors with short term tests. Microelectronics reliability : an internat journal
    &#38; world abstracting service. 2022;138(November 2022).'
date_created: 2022-12-11T13:13:46Z
date_updated: 2024-08-05T07:30:51Z
department:
- _id: DEP6012
doi: 10.1016/j.microrel.2022.114684
intvolume: '       138'
issue: November 2022
keyword:
- Electrical connectors
- Prediction of lifetime
- FIT
- Correlation between data in short and long term tests
- Time-lapse of lifetime tests
language:
- iso: eng
place: Amsterdam
publication: 'Microelectronics reliability : an internat. journal & world abstracting
  service'
publication_identifier:
  issn:
  - 0026-2714
publication_status: published
publisher: Elsevier
status: public
title: Prediction of failure in time (FIT) of electrical connectors with short term
  tests
type: scientific_journal_article
user_id: '83781'
volume: 138
year: '2022'
...
---
_id: '9211'
abstract:
- lang: eng
  text: Lifetime tests of connectors are time consuming and labor intensive. Our study
    reveals a strong correlation between the statistical characteristics of contact
    resistance development in the early stages of lifetime tests and the final results
    of the tests. This correlation enables a further time lapse of lifetime tests
    and the prediction of the state of the health of connectors which can be utilized
    in the development of diagnostic strategy in sophisticated networks with very
    high number of connectors as well as in a quick classification of connectors with
    respect to their design features. Methods of statistical evaluation are introduced
    and the sensitivity analyses of different characteristics for the state of health
    of connectors are conducted.
author:
- first_name: Jian
  full_name: Song, Jian
  id: '5297'
  last_name: Song
- first_name: Abhay Rammurti
  full_name: Shukla, Abhay Rammurti
  id: '72757'
  last_name: Shukla
- first_name: Roman
  full_name: Probst, Roman
  id: '69156'
  last_name: Probst
citation:
  ama: Song J, Shukla AR, Probst R. <i>State of Health of Connectors – Early Indicators</i>.
    IEEE; 2022:272-278. doi:<a href="https://doi.org/10.1109/HLM54538.2022.9969839">10.1109/HLM54538.2022.9969839</a>
  apa: 'Song, J., Shukla, A. R., &#38; Probst, R. (2022). State of Health of Connectors
    – Early Indicators. In <i>Electrical contacts - 2022 : proceedings of the Sixty-Seventh
    IEEE Holm Conference on Electrical Contacts</i> (pp. 272–278). IEEE. <a href="https://doi.org/10.1109/HLM54538.2022.9969839">https://doi.org/10.1109/HLM54538.2022.9969839</a>'
  bjps: '<b>Song J, Shukla AR and Probst R</b> (2022) <i>State of Health of Connectors
    – Early Indicators</i>. Piscataway, NJ: IEEE.'
  chicago: 'Song, Jian, Abhay Rammurti Shukla, and Roman Probst. <i>State of Health
    of Connectors – Early Indicators</i>. <i>Electrical Contacts - 2022 : Proceedings
    of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts</i>. Piscataway,
    NJ: IEEE, 2022. <a href="https://doi.org/10.1109/HLM54538.2022.9969839">https://doi.org/10.1109/HLM54538.2022.9969839</a>.'
  chicago-de: 'Song, Jian, Abhay Rammurti Shukla und Roman Probst. 2022. <i>State
    of Health of Connectors – Early Indicators</i>. <i>Electrical contacts - 2022 :
    proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts</i>.
    Piscataway, NJ: IEEE. doi:<a href="https://doi.org/10.1109/HLM54538.2022.9969839">10.1109/HLM54538.2022.9969839</a>,
    .'
  din1505-2-1: '<span style="font-variant:small-caps;">Song, Jian</span> ; <span style="font-variant:small-caps;">Shukla,
    Abhay Rammurti</span> ; <span style="font-variant:small-caps;">Probst, Roman</span>:
    <i>State of Health of Connectors – Early Indicators</i>. Piscataway, NJ : IEEE,
    2022'
  havard: J. Song, A.R. Shukla, R. Probst, State of Health of Connectors – Early Indicators,
    IEEE, Piscataway, NJ, 2022.
  ieee: 'J. Song, A. R. Shukla, and R. Probst, <i>State of Health of Connectors –
    Early Indicators</i>. Piscataway, NJ: IEEE, 2022, pp. 272–278. doi: <a href="https://doi.org/10.1109/HLM54538.2022.9969839">10.1109/HLM54538.2022.9969839</a>.'
  mla: 'Song, Jian, et al. “State of Health of Connectors – Early Indicators.” <i>Electrical
    Contacts - 2022 : Proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical
    Contacts</i>, IEEE, 2022, pp. 272–78, <a href="https://doi.org/10.1109/HLM54538.2022.9969839">https://doi.org/10.1109/HLM54538.2022.9969839</a>.'
  short: J. Song, A.R. Shukla, R. Probst, State of Health of Connectors – Early Indicators,
    IEEE, Piscataway, NJ, 2022.
  ufg: '<b>Song, Jian/Shukla, Abhay Rammurti/Probst, Roman</b>: State of Health of
    Connectors – Early Indicators, Piscataway, NJ 2022.'
  van: 'Song J, Shukla AR, Probst R. State of Health of Connectors – Early Indicators.
    Electrical contacts - 2022 : proceedings of the Sixty-Seventh IEEE Holm Conference
    on Electrical Contacts. Piscataway, NJ: IEEE; 2022.'
conference:
  end_date: 2022-10-26
  location: Tampa, FL, USA
  name: 67th Holm Conference on Electrical Contacts
  start_date: 2022-10-23
date_created: 2022-12-11T13:50:30Z
date_updated: 2024-08-05T08:01:22Z
department:
- _id: DEP6012
doi: 10.1109/HLM54538.2022.9969839
keyword:
- Connectors
- Correlation
- Sensitivity analysis
- Contact resistance
- Lifetime estimation
- Reliability
- Electrical resistance measurement
language:
- iso: eng
page: 272 - 278
place: Piscataway, NJ
publication: 'Electrical contacts - 2022 : proceedings of the Sixty-Seventh IEEE Holm
  Conference on Electrical Contacts'
publication_identifier:
  eisbn:
  - 978-1-6654-5965-5
  isbn:
  - 978-1-6654-5966-2
  - 978-1-6654-5967-9
  issn:
  - 2158-9992
publication_status: published
publisher: IEEE
status: public
title: State of Health of Connectors – Early Indicators
type: conference_editor_article
user_id: '83781'
year: '2022'
...