[{"issue":"12","doi":"https://doi.org/10.3390/machines12070474","date_updated":"2025-06-25T13:03:28Z","quality_controlled":"1","external_id":{"isi":["001277040200001"]},"type":"scientific_journal_article","publisher":"MDPI","keyword":["electrical connectors","accelerated life testing","statistical model","lifetime prognosis","reliability","state of health"],"abstract":[{"lang":"eng","text":"For modern machines, factories and electric and autonomous vehicles, the importance of vreliable electrical connectors cannot be overstated. With an increasing number of connectors being used in machines, factories and vehicles, ensuring their reliability is crucial for comfort and safety alike. One of the key indicators of reliability is the lifetime of connectors. To evaluate the lifetime of electrical connectors, a testing method and a model for calculating their lifetime based on the test data were developed. The results from these tests were compared to failure analysis data from long-term field operations. The findings indicate that the laboratory tests can accurately reproduce the main failures observed in the field. However, such lifetime tests can be time- and labor-intensive. To address this challenge, a data-driven method is proposed that predicts the lifetime of electrical connectors using statistical analysis of electrical contact resistance data collected from short-term tests. The predictions from this method were compared to actual results obtained from long-term tests. A strong correlation was observed between the contact resistance development in short-term tests and the number of failures in later stages of testing. Thus, apart from predicting the lifetime of connectors, this method can also be applied for failure prognosis in real-time operations."}],"page":"474","user_id":"83781","year":"2024","department":[{"_id":"DEP6012"}],"status":"public","title":"The State of Health of Electrical Connectors","author":[{"first_name":"Jian","full_name":"Song, Jian","id":"5297","last_name":"Song"},{"first_name":"Abhay Rammurti","full_name":"Shukla, Abhay Rammurti","last_name":"Shukla","id":"74188"},{"full_name":"Probst, Roman","last_name":"Probst","id":"69156","first_name":"Roman"}],"intvolume":"         7","isi":"1","publication_identifier":{"eissn":["2075-1702 "]},"citation":{"havard":"J. Song, A.R. Shukla, R. Probst, The State of Health of Electrical Connectors, Machines. 7 (2024) 474.","ufg":"<b>Song, Jian/Shukla, Abhay Rammurti/Probst, Roman</b>: The State of Health of Electrical Connectors, in: <i>Machines</i> 7 (2024), H. 12,  S. 474.","chicago-de":"Song, Jian, Abhay Rammurti Shukla und Roman Probst. 2024. The State of Health of Electrical Connectors. <i>Machines</i> 7, Nr. 12: 474. doi:<a href=\"https://doi.org/10.3390/machines12070474\">https://doi.org/10.3390/machines12070474</a>, .","short":"J. Song, A.R. Shukla, R. Probst, Machines 7 (2024) 474.","mla":"Song, Jian, et al. “The State of Health of Electrical Connectors.” <i>Machines</i>, vol. 7, no. 12, 2024, p. 474, <a href=\"https://doi.org/10.3390/machines12070474\">https://doi.org/10.3390/machines12070474</a>.","apa":"Song, J., Shukla, A. R., &#38; Probst, R. (2024). The State of Health of Electrical Connectors. <i>Machines</i>, <i>7</i>(12), 474. <a href=\"https://doi.org/10.3390/machines12070474\">https://doi.org/10.3390/machines12070474</a>","van":"Song J, Shukla AR, Probst R. The State of Health of Electrical Connectors. Machines. 2024;7(12):474.","ama":"Song J, Shukla AR, Probst R. The State of Health of Electrical Connectors. <i>Machines</i>. 2024;7(12):474. doi:<a href=\"https://doi.org/10.3390/machines12070474\">https://doi.org/10.3390/machines12070474</a>","ieee":"J. Song, A. R. Shukla, and R. Probst, “The State of Health of Electrical Connectors,” <i>Machines</i>, vol. 7, no. 12, p. 474, 2024, doi: <a href=\"https://doi.org/10.3390/machines12070474\">https://doi.org/10.3390/machines12070474</a>.","chicago":"Song, Jian, Abhay Rammurti Shukla, and Roman Probst. “The State of Health of Electrical Connectors.” <i>Machines</i> 7, no. 12 (2024): 474. <a href=\"https://doi.org/10.3390/machines12070474\">https://doi.org/10.3390/machines12070474</a>.","bjps":"<b>Song J, Shukla AR and Probst R</b> (2024) The State of Health of Electrical Connectors. <i>Machines</i> <b>7</b>, 474.","din1505-2-1":"<span style=\"font-variant:small-caps;\">Song, Jian</span> ; <span style=\"font-variant:small-caps;\">Shukla, Abhay Rammurti</span> ; <span style=\"font-variant:small-caps;\">Probst, Roman</span>: The State of Health of Electrical Connectors. In: <i>Machines</i> Bd. 7. Basel, MDPI (2024), Nr. 12, S. 474"},"place":"Basel","publication_status":"published","volume":7,"language":[{"iso":"eng"}],"date_created":"2025-04-04T09:23:10Z","_id":"12761","publication":"Machines"},{"abstract":[{"text":"Copper alloy metal strips are widely used to manufacture electrical connectors. These connectors experience stress relaxation during operation. The reduced contact force may lead to contact failure. For the given design of connectors, the contact force is proportional to the Young's modulus which depends on interatomic bonds, alloying elements and the microstructure of metal grains. According to the literature, it is assumed that Young's modulus does not change significantly during long-term mechanical stress and aging at temperatures below the recrystallization temperature of copper alloys. Based on this assumption, the relaxation of connectors from lifetime tests and from long-term used field vehicles can be determined by the comparison of spring deflection of connectors before and after long-term tests or long-term use. The focus of this paper is to answer the question, whether this assumption is accurate. For this purpose, the influence of long-term thermal and mechanical loads on the Young's modulus of various copper alloys is investigated. The temperature in test approximately matches the maximum design temperature of automotive connectors and the mechanical stress is comparable to that in a typical connector.","lang":"eng"}],"conference":{"location":"Annapolis, MD, USA ","start_date":"2024-10-06","end_date":"2024-10-10","name":"69th Holm Conference on Electrical Contacts (HOLM)"},"_id":"12891","keyword":["Young's modulus","thermal and mechanical loads","spring deflection","relaxation"],"status":"public","publication":"\t Electrical contacts - 2024 : proceedings of the Sixty‐Ninth IEEE Holm Conference on Electrical Contacts : 6-10 October 2024, Annapolis, MD, USA ","user_id":"83781","year":"2024","corporate_editor":["Institute of Electrical and Electronics Engineers","IEEE Electronics Packaging Society "],"department":[{"_id":"DEP6000"},{"_id":"DEP6012"}],"date_updated":"2025-05-07T14:03:11Z","doi":"10.1109/holm56222.2024.10768449","title":"The Influence of Long Term Thermal and Mechanical Loads on the Young's Modulus of Cu-Alloys - Determination of Stress Relaxation in Electrical Connectors","citation":{"din1505-2-1":"<span style=\"font-variant:small-caps;\">Bünting, Karolin</span> ; <span style=\"font-variant:small-caps;\">Shukla, Abhay Rammurti</span> ; <span style=\"font-variant:small-caps;\">Song, Jian</span> ; <span style=\"font-variant:small-caps;\">Institute of Electrical and Electronics Engineers</span> ; <span style=\"font-variant:small-caps;\">IEEE Electronics Packaging Society </span> (Hrsg.): <i>The Influence of Long Term Thermal and Mechanical Loads on the Young’s Modulus of Cu-Alloys - Determination of Stress Relaxation in Electrical Connectors</i>. [Piscataway, NJ] : IEEE, 2024","bjps":"<b>Bünting K, Shukla AR and Song J</b> (2024) <i>The Influence of Long Term Thermal and Mechanical Loads on the Young’s Modulus of Cu-Alloys - Determination of Stress Relaxation in Electrical Connectors</i>, Institute of Electrical and Electronics Engineers and IEEE Electronics Packaging Society  (eds). [Piscataway, NJ]: IEEE.","chicago":"Bünting, Karolin, Abhay Rammurti Shukla, and Jian Song. <i>The Influence of Long Term Thermal and Mechanical Loads on the Young’s Modulus of Cu-Alloys - Determination of Stress Relaxation in Electrical Connectors</i>. Edited by Institute of Electrical and Electronics Engineers and IEEE Electronics Packaging Society . <i>  Electrical Contacts - 2024 : Proceedings of the Sixty‐Ninth IEEE Holm Conference on Electrical Contacts : 6-10 October 2024, Annapolis, MD, USA </i>. [Piscataway, NJ]: IEEE, 2024. <a href=\"https://doi.org/10.1109/holm56222.2024.10768449\">https://doi.org/10.1109/holm56222.2024.10768449</a>.","ieee":"K. Bünting, A. R. Shukla, and J. Song, <i>The Influence of Long Term Thermal and Mechanical Loads on the Young’s Modulus of Cu-Alloys - Determination of Stress Relaxation in Electrical Connectors</i>. [Piscataway, NJ]: IEEE, 2024. doi: <a href=\"https://doi.org/10.1109/holm56222.2024.10768449\">10.1109/holm56222.2024.10768449</a>.","van":"Bünting K, Shukla AR, Song J. The Influence of Long Term Thermal and Mechanical Loads on the Young’s Modulus of Cu-Alloys - Determination of Stress Relaxation in Electrical Connectors. Institute of Electrical and Electronics Engineers, IEEE Electronics Packaging Society , editors.   Electrical contacts - 2024 : proceedings of the Sixty‐Ninth IEEE Holm Conference on Electrical Contacts : 6-10 October 2024, Annapolis, MD, USA . [Piscataway, NJ]: IEEE; 2024.","ama":"Bünting K, Shukla AR, Song J. <i>The Influence of Long Term Thermal and Mechanical Loads on the Young’s Modulus of Cu-Alloys - Determination of Stress Relaxation in Electrical Connectors</i>. (Institute of Electrical and Electronics Engineers, IEEE Electronics Packaging Society , eds.). IEEE; 2024. doi:<a href=\"https://doi.org/10.1109/holm56222.2024.10768449\">10.1109/holm56222.2024.10768449</a>","mla":"Bünting, Karolin, et al. “The Influence of Long Term Thermal and Mechanical Loads on the Young’s Modulus of Cu-Alloys - Determination of Stress Relaxation in Electrical Connectors.” <i>  Electrical Contacts - 2024 : Proceedings of the Sixty‐Ninth IEEE Holm Conference on Electrical Contacts : 6-10 October 2024, Annapolis, MD, USA </i>, edited by Institute of Electrical and Electronics Engineers and IEEE Electronics Packaging Society , IEEE, 2024, <a href=\"https://doi.org/10.1109/holm56222.2024.10768449\">https://doi.org/10.1109/holm56222.2024.10768449</a>.","apa":"Bünting, K., Shukla, A. R., &#38; Song, J. (2024). The Influence of Long Term Thermal and Mechanical Loads on the Young’s Modulus of Cu-Alloys - Determination of Stress Relaxation in Electrical Connectors. In Institute of Electrical and Electronics Engineers &#38; IEEE Electronics Packaging Society  (Eds.), <i>  Electrical contacts - 2024 : proceedings of the Sixty‐Ninth IEEE Holm Conference on Electrical Contacts : 6-10 October 2024, Annapolis, MD, USA </i>. IEEE. <a href=\"https://doi.org/10.1109/holm56222.2024.10768449\">https://doi.org/10.1109/holm56222.2024.10768449</a>","short":"K. Bünting, A.R. Shukla, J. Song, The Influence of Long Term Thermal and Mechanical Loads on the Young’s Modulus of Cu-Alloys - Determination of Stress Relaxation in Electrical Connectors, IEEE, [Piscataway, NJ], 2024.","chicago-de":"Bünting, Karolin, Abhay Rammurti Shukla und Jian Song. 2024. <i>The Influence of Long Term Thermal and Mechanical Loads on the Young’s Modulus of Cu-Alloys - Determination of Stress Relaxation in Electrical Connectors</i>. Hg. von Institute of Electrical and Electronics Engineers und IEEE Electronics Packaging Society . <i>  Electrical contacts - 2024 : proceedings of the Sixty‐Ninth IEEE Holm Conference on Electrical Contacts : 6-10 October 2024, Annapolis, MD, USA </i>. [Piscataway, NJ]: IEEE. doi:<a href=\"https://doi.org/10.1109/holm56222.2024.10768449\">10.1109/holm56222.2024.10768449</a>, .","ufg":"<b>Bünting, Karolin/Shukla, Abhay Rammurti/Song, Jian</b>: The Influence of Long Term Thermal and Mechanical Loads on the Young’s Modulus of Cu-Alloys - Determination of Stress Relaxation in Electrical Connectors, hg. von Institute of Electrical and Electronics Engineers, IEEE Electronics Packaging Society , [Piscataway, NJ] 2024.","havard":"K. Bünting, A.R. Shukla, J. Song, The Influence of Long Term Thermal and Mechanical Loads on the Young’s Modulus of Cu-Alloys - Determination of Stress Relaxation in Electrical Connectors, IEEE, [Piscataway, NJ], 2024."},"place":"[Piscataway, NJ]","publication_status":"published","date_created":"2025-05-07T09:31:00Z","language":[{"iso":"eng"}],"publisher":"IEEE","author":[{"first_name":"Karolin","id":"62067","last_name":"Bünting","full_name":"Bünting, Karolin"},{"first_name":"Abhay Rammurti","full_name":"Shukla, Abhay Rammurti","last_name":"Shukla","id":"74188"},{"first_name":"Jian","full_name":"Song, Jian","last_name":"Song","id":"5297"}],"type":"conference_editor_article","publication_identifier":{"eisbn":["979-8-3315-2906-2 "],"isbn":["979-8-3315-2907-9"]}},{"_id":"11348","article_number":"115216","publication":"Microelectronics Reliability","title":"Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests","has_accepted_license":"1","author":[{"first_name":"Abhay Rammurti","id":"74188","last_name":"Shukla","full_name":"Shukla, Abhay Rammurti"},{"first_name":"Robert","last_name":"Martin","full_name":"Martin, Robert"},{"full_name":"Probst, Roman","id":"69156","last_name":"Probst","first_name":"Roman"},{"first_name":"Jian","full_name":"Song, Jian","last_name":"Song","id":"5297"}],"intvolume":"       150","isi":"1","publication_identifier":{"issn":["0026-2714"],"unknown":["1872-941X"]},"citation":{"din1505-2-1":"<span style=\"font-variant:small-caps;\">Shukla, Abhay Rammurti</span> ; <span style=\"font-variant:small-caps;\">Martin, Robert</span> ; <span style=\"font-variant:small-caps;\">Probst, Roman</span> ; <span style=\"font-variant:small-caps;\">Song, Jian</span>: Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests. In: <i>Microelectronics Reliability</i> Bd. 150. Amsterdam, Elsevier  (2023)","bjps":"<b>Shukla AR <i>et al.</i></b> (2023) Comparison of Different Statistical Methods for Prediction of Lifetime of Electrical Connectors with Short Term Tests. <i>Microelectronics Reliability</i> <b>150</b>.","chicago":"Shukla, Abhay Rammurti, Robert Martin, Roman Probst, and Jian Song. “Comparison of Different Statistical Methods for Prediction of Lifetime of Electrical Connectors with Short Term Tests.” <i>Microelectronics Reliability</i> 150 (2023). <a href=\"https://doi.org/10.1016/j.microrel.2023.115216\">https://doi.org/10.1016/j.microrel.2023.115216</a>.","ieee":"A. R. Shukla, R. Martin, R. Probst, and J. Song, “Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests,” <i>Microelectronics Reliability</i>, vol. 150, Art. no. 115216, 2023, doi: <a href=\"https://doi.org/10.1016/j.microrel.2023.115216\">10.1016/j.microrel.2023.115216</a>.","ama":"Shukla AR, Martin R, Probst R, Song J. Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests. <i>Microelectronics Reliability</i>. 2023;150. doi:<a href=\"https://doi.org/10.1016/j.microrel.2023.115216\">10.1016/j.microrel.2023.115216</a>","van":"Shukla AR, Martin R, Probst R, Song J. Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests. Microelectronics Reliability. 2023;150.","apa":"Shukla, A. R., Martin, R., Probst, R., &#38; Song, J. (2023). Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests. <i>Microelectronics Reliability</i>, <i>150</i>, Article 115216. <a href=\"https://doi.org/10.1016/j.microrel.2023.115216\">https://doi.org/10.1016/j.microrel.2023.115216</a>","mla":"Shukla, Abhay Rammurti, et al. “Comparison of Different Statistical Methods for Prediction of Lifetime of Electrical Connectors with Short Term Tests.” <i>Microelectronics Reliability</i>, vol. 150, 115216, 2023, <a href=\"https://doi.org/10.1016/j.microrel.2023.115216\">https://doi.org/10.1016/j.microrel.2023.115216</a>.","short":"A.R. Shukla, R. Martin, R. Probst, J. Song, Microelectronics Reliability 150 (2023).","chicago-de":"Shukla, Abhay Rammurti, Robert Martin, Roman Probst und Jian Song. 2023. Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests. <i>Microelectronics Reliability</i> 150. doi:<a href=\"https://doi.org/10.1016/j.microrel.2023.115216\">10.1016/j.microrel.2023.115216</a>, .","ufg":"<b>Shukla, Abhay Rammurti u. a.</b>: Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests, in: <i>Microelectronics Reliability</i> 150 (2023).","havard":"A.R. Shukla, R. Martin, R. Probst, J. Song, Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests, Microelectronics Reliability. 150 (2023)."},"place":"Amsterdam","volume":150,"publication_status":"published","language":[{"iso":"eng"}],"date_created":"2024-04-18T08:55:38Z","keyword":["Electrical and Electronic Engineering","Surfaces","Coatings and Films","Safety","Risk","Reliability and Quality","Condensed Matter Physics","Atomic and Molecular Physics","and Optics","Electronic","Optical and Magnetic Materials"],"abstract":[{"lang":"eng","text":"Lifetime is an important feature defining the reliability of electrical connectors. In general practice, the lifetime tests required for reliability estimation are time and labor intensive. In our previous work, a data driven method using a statistical process, with an application of probability distributions such as standard normal distribution and generalized extreme value (GEV) distribution with negative skewness to predict degradation paths, was introduced for estimation of the lifetime and FIT rate with the help of electrical contact resistance data collected from short term tests. The proposed method proved its significance by showing the possibility of drastic reduction in the lifetime test duration required for reliability determination. In this work, a non-parametric distribution free method using percentiles of actual measured contact resistances is used for determining the lifetime as against the percentiles of probability distribution used in previous work, thereby simplifying the process further and leading to an even more precise estimation. The lifetimes calculated from parametric and non-parametric methods are compared to highlight the significance of distribution free method in reliability estimation."}],"user_id":"83781","year":"2023","department":[{"_id":"DEP6012"}],"status":"public","article_type":"original","date_updated":"2025-06-26T07:51:25Z","doi":"10.1016/j.microrel.2023.115216","external_id":{"isi":["001106942700001"]},"type":"scientific_journal_article","publisher":"Elsevier "},{"_id":"11351","publication":"Elektrische und optische Verbindungstechnik 2023 : Tagungsband der VDE/VDI GMM-Fachtagung : 9. Symposium Connectors","has_accepted_license":"1","title":"Influence of surface roughness on contact behavior.","author":[{"full_name":"Song, Jian","last_name":"Song","id":"5297","first_name":"Jian"},{"first_name":"Abhay Rammurti","last_name":"Shukla","id":"74188","full_name":"Shukla, Abhay Rammurti"}],"publication_identifier":{"eisbn":["978-3-00-074593-5"]},"ddc":["620"],"citation":{"ama":"Song J, Shukla AR. <i>Influence of Surface Roughness on Contact Behavior.</i> (Song J, Labor für Feinsystemtechnik, Technische Hochschule Ostwestfalen-Lippe, eds.). Labor für Feinsystemtechnik, TH OWL; 2023:209-221.","van":"Song J, Shukla AR. Influence of surface roughness on contact behavior. Song J, Labor für Feinsystemtechnik, Technische Hochschule Ostwestfalen-Lippe, editors. Elektrische und optische Verbindungstechnik 2023 : Tagungsband der VDE/VDI GMM-Fachtagung : 9. Symposium Connectors. Lemgo: Labor für Feinsystemtechnik, TH OWL; 2023.","havard":"J. Song, A.R. Shukla, Influence of surface roughness on contact behavior., Labor für Feinsystemtechnik, TH OWL, Lemgo, 2023.","ieee":"J. Song and A. R. Shukla, <i>Influence of surface roughness on contact behavior.</i> Lemgo: Labor für Feinsystemtechnik, TH OWL, 2023, pp. 209–221.","ufg":"<b>Song, Jian/Shukla, Abhay Rammurti</b>: Influence of surface roughness on contact behavior., hg. von Song, Jian, Labor für Feinsystemtechnik, Technische Hochschule Ostwestfalen-Lippe, Lemgo 2023.","chicago":"Song, Jian, and Abhay Rammurti Shukla. <i>Influence of Surface Roughness on Contact Behavior.</i> Edited by Jian Song and Labor für Feinsystemtechnik, Technische Hochschule Ostwestfalen-Lippe. <i>Elektrische Und Optische Verbindungstechnik 2023 : Tagungsband Der VDE/VDI GMM-Fachtagung : 9. Symposium Connectors</i>. Lemgo: Labor für Feinsystemtechnik, TH OWL, 2023.","chicago-de":"Song, Jian und Abhay Rammurti Shukla. 2023. <i>Influence of surface roughness on contact behavior.</i> Hg. von Jian Song und Labor für Feinsystemtechnik, Technische Hochschule Ostwestfalen-Lippe. <i>Elektrische und optische Verbindungstechnik 2023 : Tagungsband der VDE/VDI GMM-Fachtagung : 9. Symposium Connectors</i>. Lemgo: Labor für Feinsystemtechnik, TH OWL.","short":"J. Song, A.R. Shukla, Influence of Surface Roughness on Contact Behavior., Labor für Feinsystemtechnik, TH OWL, Lemgo, 2023.","bjps":"<b>Song J and Shukla AR</b> (2023) <i>Influence of Surface Roughness on Contact Behavior.</i>, Song J and Labor für Feinsystemtechnik, Technische Hochschule Ostwestfalen-Lippe (eds). Lemgo: Labor für Feinsystemtechnik, TH OWL.","mla":"Song, Jian, and Abhay Rammurti Shukla. “Influence of Surface Roughness on Contact Behavior.” <i>Elektrische Und Optische Verbindungstechnik 2023 : Tagungsband Der VDE/VDI GMM-Fachtagung : 9. Symposium Connectors</i>, edited by Jian Song and Labor für Feinsystemtechnik, Technische Hochschule Ostwestfalen-Lippe, Labor für Feinsystemtechnik, TH OWL, 2023, pp. 209–21.","apa":"Song, J., &#38; Shukla, A. R. (2023). Influence of surface roughness on contact behavior. In J. Song &#38; Labor für Feinsystemtechnik, Technische Hochschule Ostwestfalen-Lippe (Eds.), <i>Elektrische und optische Verbindungstechnik 2023 : Tagungsband der VDE/VDI GMM-Fachtagung : 9. Symposium Connectors</i> (pp. 209–221). Labor für Feinsystemtechnik, TH OWL.","din1505-2-1":"<span style=\"font-variant:small-caps;\">Song, Jian</span> ; <span style=\"font-variant:small-caps;\">Shukla, Abhay Rammurti</span> ; <span style=\"font-variant:small-caps;\">Song, J.</span> ; <span style=\"font-variant:small-caps;\">Labor für Feinsystemtechnik, Technische Hochschule Ostwestfalen-Lippe</span> (Hrsg.): <i>Influence of surface roughness on contact behavior.</i> Lemgo : Labor für Feinsystemtechnik, TH OWL, 2023"},"place":"Lemgo","publication_status":"published","language":[{"iso":"eng"}],"date_created":"2024-04-18T09:19:49Z","conference":{"end_date":"2023-03-22","start_date":"2023-03-21","name":"VDE/VDI-GMM- Fachtagung „Symposium Connectors“","location":"Lemgo"},"page":"209 - 221","year":"2023","user_id":"83781","corporate_editor":["Labor für Feinsystemtechnik, Technische Hochschule Ostwestfalen-Lippe"],"department":[{"_id":"DEP6012"}],"status":"public","date_updated":"2024-05-13T12:26:24Z","type":"conference_editor_article","editor":[{"first_name":"Jian","last_name":"Song","id":"5297","full_name":"Song, Jian"}],"publisher":"Labor für Feinsystemtechnik, TH OWL"},{"author":[{"first_name":"Abhay Rammurti","full_name":"Shukla, Abhay Rammurti","last_name":"Shukla","id":"74188"},{"first_name":"Jian","full_name":"Song, Jian","last_name":"Song","id":"5297"}],"type":"conference_speech","citation":{"havard":"A.R. Shukla, J. Song, Influence of surface roughness and force on real contact area Busan, n.d.","ufg":"<b>Shukla, Abhay Rammurti/Song, Jian</b>: Influence of surface roughness and force on real contact area Busan, o. O. u. J. .","chicago-de":"Shukla, Abhay Rammurti und Jian Song. <i>Influence of surface roughness and force on real contact area Busan</i>.","short":"A.R. Shukla, J. Song, Influence of Surface Roughness and Force on Real Contact Area Busan, n.d.","apa":"Shukla, A. R., &#38; Song, J. (n.d.). <i>Influence of surface roughness and force on real contact area Busan</i>. 3rd Korea-Tribology International Symposium, Busan.","mla":"Shukla, Abhay Rammurti, and Jian Song. <i>Influence of Surface Roughness and Force on Real Contact Area Busan</i>.","van":"Shukla AR, Song J. Influence of surface roughness and force on real contact area Busan.","ama":"Shukla AR, Song J. <i>Influence of Surface Roughness and Force on Real Contact Area Busan</i>.","ieee":"A. R. Shukla and J. Song, <i>Influence of surface roughness and force on real contact area Busan</i>.","chicago":"Shukla, Abhay Rammurti, and Jian Song. <i>Influence of Surface Roughness and Force on Real Contact Area Busan</i>, n.d.","bjps":"<b>Shukla AR and Song J</b> (n.d.) <i>Influence of Surface Roughness and Force on Real Contact Area Busan</i>. .","din1505-2-1":"<span style=\"font-variant:small-caps;\">Shukla, Abhay Rammurti</span> ; <span style=\"font-variant:small-caps;\">Song, Jian</span>: <i>Influence of surface roughness and force on real contact area Busan</i>"},"language":[{"iso":"eng"}],"date_created":"2024-04-18T09:44:46Z","publication_status":"accepted","date_updated":"2024-05-21T12:32:01Z","title":"Influence of surface roughness and force on real contact area Busan","year":"2023","user_id":"83781","department":[{"_id":"DEP6012"}],"status":"public","_id":"11356","abstract":[{"lang":"eng","text":"• Surface roughness has significant influence on contact area\r\n• Real contact area can be predicted with good precision by simplifying roughness model using core roughness Rk and average groove width RSM\r\n• Higher precision can be achieved by proper selection of material ratio\r\n• The proposed method can be effectively used for predicting contact resistance for given contact conditions"}],"conference":{"location":"Busan","name":"3rd Korea-Tribology International Symposium","start_date":"2023-04-2","end_date":"2023-04-05"}},{"year":"2023","user_id":"83781","status":"public","keyword":["accelerated life testing","test duration","contact resistance","statistical model","connector reliability"],"page":"200-208","conference":{"name":"68th Holm Conference on Electrical Contacts (HOLM)","start_date":"2023-10-04","end_date":"2023-10-11","location":"Seattle"},"abstract":[{"text":"The state of health and lifetime estimation process of electrical connectors via lifetime tests is a time and labor intensive process. In our previous work, a correlation between the contact resistance developments in the early stages of lifetime tests of electrical connectors with the final results was established using a data driven statistical process based on probability distribution. Also, state of health indicators for prognosis of lifetime were introduced. In this work, the state of health indicators have been optimized. The sensitivity analysis is performed with regards to the selection of the appropriate amount of test data based on test duration for the reliable prognosis of the state of health and the characteristic lifetime. Through this the possibility of further reduction of test duration required for the reliable prognosis of state of health is investigated. Based on the results of analysis, a guideline for the determination of the duration of lifetime tests which lead to a reliable prediction of lifetime of connectors can be provided. Also, an assessment of the state of art in the prognosis of the lifetime of electrical connectors has been presented.","lang":"eng"}],"type":"conference_editor_article","publisher":"IEEE","date_updated":"2025-06-26T07:54:50Z","doi":"10.1109/holm56075.2023.10352279","series_title":"Electrical Contacts-IEEE Holm Conference on Electrical Contacts","publication":"2023 IEEE 68th Holm Conference on Electrical Contacts (HOLM)","_id":"11360","publication_identifier":{"eisbn":["979‐8‐3503‐4246‐8","979‐8‐3503‐4245‐1 "],"isbn":["979‐8‐3503‐4244‐4"],"eissn":["2158‐9992"],"issn":["2158-9992"]},"author":[{"first_name":"Jian","full_name":"Song, Jian","id":"5297","last_name":"Song"},{"full_name":"Shukla, Abhay Rammurti","id":"74188","last_name":"Shukla","first_name":"Abhay Rammurti"},{"first_name":"Roman","id":"69156","last_name":"Probst","full_name":"Probst, Roman"}],"publication_status":"published","date_created":"2024-04-18T10:11:50Z","language":[{"iso":"eng"}],"citation":{"short":"J. Song, A.R. Shukla, R. Probst, Advances in Evaluation of State of Health of Electrical Connectors, IEEE, [Piscataway, NJ], 2023.","bjps":"<b>Song J, Shukla AR and Probst R</b> (2023) <i>Advances in Evaluation of State of Health of Electrical Connectors</i>. [Piscataway, NJ]: IEEE.","din1505-2-1":"<span style=\"font-variant:small-caps;\">Song, Jian</span> ; <span style=\"font-variant:small-caps;\">Shukla, Abhay Rammurti</span> ; <span style=\"font-variant:small-caps;\">Probst, Roman</span>: <i>Advances in Evaluation of State of Health of Electrical Connectors</i>, <i>Electrical Contacts-IEEE Holm Conference on Electrical Contacts</i>. [Piscataway, NJ] : IEEE, 2023","apa":"Song, J., Shukla, A. R., &#38; Probst, R. (2023). Advances in Evaluation of State of Health of Electrical Connectors. In <i>2023 IEEE 68th Holm Conference on Electrical Contacts (HOLM)</i> (pp. 200–208). IEEE. <a href=\"https://doi.org/10.1109/holm56075.2023.10352279\">https://doi.org/10.1109/holm56075.2023.10352279</a>","mla":"Song, Jian, et al. “Advances in Evaluation of State of Health of Electrical Connectors.” <i>2023 IEEE 68th Holm Conference on Electrical Contacts (HOLM)</i>, IEEE, 2023, pp. 200–08, <a href=\"https://doi.org/10.1109/holm56075.2023.10352279\">https://doi.org/10.1109/holm56075.2023.10352279</a>.","ufg":"<b>Song, Jian/Shukla, Abhay Rammurti/Probst, Roman</b>: Advances in Evaluation of State of Health of Electrical Connectors, [Piscataway, NJ] 2023 (Electrical Contacts-IEEE Holm Conference on Electrical Contacts).","chicago":"Song, Jian, Abhay Rammurti Shukla, and Roman Probst. <i>Advances in Evaluation of State of Health of Electrical Connectors</i>. <i>2023 IEEE 68th Holm Conference on Electrical Contacts (HOLM)</i>. Electrical Contacts-IEEE Holm Conference on Electrical Contacts. [Piscataway, NJ]: IEEE, 2023. <a href=\"https://doi.org/10.1109/holm56075.2023.10352279\">https://doi.org/10.1109/holm56075.2023.10352279</a>.","chicago-de":"Song, Jian, Abhay Rammurti Shukla und Roman Probst. 2023. <i>Advances in Evaluation of State of Health of Electrical Connectors</i>. <i>2023 IEEE 68th Holm Conference on Electrical Contacts (HOLM)</i>. Electrical Contacts-IEEE Holm Conference on Electrical Contacts. [Piscataway, NJ]: IEEE. doi:<a href=\"https://doi.org/10.1109/holm56075.2023.10352279\">10.1109/holm56075.2023.10352279</a>, .","ieee":"J. Song, A. R. Shukla, and R. Probst, <i>Advances in Evaluation of State of Health of Electrical Connectors</i>. [Piscataway, NJ]: IEEE, 2023, pp. 200–208. doi: <a href=\"https://doi.org/10.1109/holm56075.2023.10352279\">10.1109/holm56075.2023.10352279</a>.","havard":"J. Song, A.R. Shukla, R. Probst, Advances in Evaluation of State of Health of Electrical Connectors, IEEE, [Piscataway, NJ], 2023.","van":"Song J, Shukla AR, Probst R. Advances in Evaluation of State of Health of Electrical Connectors. 2023 IEEE 68th Holm Conference on Electrical Contacts (HOLM). [Piscataway, NJ]: IEEE; 2023. (Electrical Contacts-IEEE Holm Conference on Electrical Contacts).","ama":"Song J, Shukla AR, Probst R. <i>Advances in Evaluation of State of Health of Electrical Connectors</i>. IEEE; 2023:200-208. doi:<a href=\"https://doi.org/10.1109/holm56075.2023.10352279\">10.1109/holm56075.2023.10352279</a>"},"place":"[Piscataway, NJ]","title":"Advances in Evaluation of State of Health of Electrical Connectors"},{"title":"Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests","date_updated":"2024-05-17T14:07:26Z","language":[{"iso":"eng"}],"date_created":"2024-04-18T10:18:33Z","publication_status":"published","citation":{"chicago-de":"Shukla, Abhay Rammurti, Robert Martin, Roman Probst und Jian Song. 2023. <i>Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests</i>.","chicago":"Shukla, Abhay Rammurti, Robert Martin, Roman Probst, and Jian Song. <i>Comparison of Different Statistical Methods for Prediction of Lifetime of Electrical Connectors with Short Term Tests</i>, 2023.","ufg":"<b>Shukla, Abhay Rammurti u. a.</b>: Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests, o. O. 2023.","din1505-2-1":"<span style=\"font-variant:small-caps;\">Shukla, Abhay Rammurti</span> ; <span style=\"font-variant:small-caps;\">Martin, Robert</span> ; <span style=\"font-variant:small-caps;\">Probst, Roman</span> ; <span style=\"font-variant:small-caps;\">Song, Jian</span>: <i>Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests</i>, 2023","mla":"Shukla, Abhay Rammurti, et al. <i>Comparison of Different Statistical Methods for Prediction of Lifetime of Electrical Connectors with Short Term Tests</i>. 2023.","apa":"Shukla, A. R., Martin, R., Probst, R., &#38; Song, J. (2023). <i>Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests</i>. 34rd European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Toulouse (France).","short":"A.R. Shukla, R. Martin, R. Probst, J. Song, Comparison of Different Statistical Methods for Prediction of Lifetime of Electrical Connectors with Short Term Tests, 2023.","bjps":"<b>Shukla AR <i>et al.</i></b> (2023) <i>Comparison of Different Statistical Methods for Prediction of Lifetime of Electrical Connectors with Short Term Tests</i>. .","van":"Shukla AR, Martin R, Probst R, Song J. Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests. 2023.","ama":"Shukla AR, Martin R, Probst R, Song J. <i>Comparison of Different Statistical Methods for Prediction of Lifetime of Electrical Connectors with Short Term Tests</i>.; 2023.","ieee":"A. R. Shukla, R. Martin, R. Probst, and J. Song, <i>Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests</i>. 2023.","havard":"A.R. Shukla, R. Martin, R. Probst, J. Song, Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests, 2023."},"type":"conference_speech","author":[{"id":"74188","last_name":"Shukla","full_name":"Shukla, Abhay Rammurti","first_name":"Abhay Rammurti"},{"first_name":"Robert","full_name":"Martin, Robert","last_name":"Martin"},{"first_name":"Roman","last_name":"Probst","id":"69156","full_name":"Probst, Roman"},{"full_name":"Song, Jian","last_name":"Song","id":"5297","first_name":"Jian"}],"conference":{"location":"Toulouse (France)","name":"34rd European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF)","end_date":"2023-10-05","start_date":"2023-10-02"},"_id":"11361","status":"public","user_id":"83781","year":"2023"},{"_id":"11362","conference":{"name":"International Tribology Conference (ITC)","start_date":"2023-09-25","end_date":"2023-09-30","location":"Fukuoka, Japan "},"department":[{"_id":"DEP6012"}],"year":"2023","user_id":"83781","status":"public","title":"Influence of tribological properties of contact coatings on the long term behavior of electrical contacts","date_updated":"2024-05-17T14:05:11Z","type":"conference_speech","author":[{"full_name":"Song, Jian","last_name":"Song","id":"5297","first_name":"Jian"},{"id":"69156","last_name":"Probst","full_name":"Probst, Roman","first_name":"Roman"},{"first_name":"Abhay Rammurti","id":"74188","last_name":"Shukla","full_name":"Shukla, Abhay Rammurti"},{"last_name":"Bünting","id":"62067","full_name":"Bünting, Karolin","first_name":"Karolin"}],"publication_status":"published","date_created":"2024-04-18T10:31:49Z","language":[{"iso":"eng"}],"citation":{"ieee":"J. Song, R. Probst, A. R. Shukla, and K. Bünting, <i>Influence of tribological properties of contact coatings on the long term behavior of electrical contacts</i>. 2023.","van":"Song J, Probst R, Shukla AR, Bünting K. Influence of tribological properties of contact coatings on the long term behavior of electrical contacts. 2023.","ama":"Song J, Probst R, Shukla AR, Bünting K. <i>Influence of Tribological Properties of Contact Coatings on the Long Term Behavior of Electrical Contacts</i>.; 2023.","din1505-2-1":"<span style=\"font-variant:small-caps;\">Song, Jian</span> ; <span style=\"font-variant:small-caps;\">Probst, Roman</span> ; <span style=\"font-variant:small-caps;\">Shukla, Abhay Rammurti</span> ; <span style=\"font-variant:small-caps;\">Bünting, Karolin</span>: <i>Influence of tribological properties of contact coatings on the long term behavior of electrical contacts</i>, 2023","bjps":"<b>Song J <i>et al.</i></b> (2023) <i>Influence of Tribological Properties of Contact Coatings on the Long Term Behavior of Electrical Contacts</i>. .","chicago":"Song, Jian, Roman Probst, Abhay Rammurti Shukla, and Karolin Bünting. <i>Influence of Tribological Properties of Contact Coatings on the Long Term Behavior of Electrical Contacts</i>, 2023.","havard":"J. Song, R. Probst, A.R. Shukla, K. Bünting, Influence of tribological properties of contact coatings on the long term behavior of electrical contacts, 2023.","apa":"Song, J., Probst, R., Shukla, A. R., &#38; Bünting, K. (2023). <i>Influence of tribological properties of contact coatings on the long term behavior of electrical contacts</i>. International Tribology Conference (ITC), Fukuoka, Japan .","mla":"Song, Jian, et al. <i>Influence of Tribological Properties of Contact Coatings on the Long Term Behavior of Electrical Contacts</i>. 2023.","short":"J. Song, R. Probst, A.R. Shukla, K. Bünting, Influence of Tribological Properties of Contact Coatings on the Long Term Behavior of Electrical Contacts, 2023.","chicago-de":"Song, Jian, Roman Probst, Abhay Rammurti Shukla und Karolin Bünting. 2023. <i>Influence of tribological properties of contact coatings on the long term behavior of electrical contacts</i>.","ufg":"<b>Song, Jian u. a.</b>: Influence of tribological properties of contact coatings on the long term behavior of electrical contacts, o. O. 2023."}},{"_id":"6290","page":"28 - 43","conference":{"location":"Lemgo","name":"VDE/VDI-GMM-Fachtagung „Symposium Connectors“"},"department":[{"_id":"DEP6012"}],"year":2021,"user_id":"74004","publication":"Tagungsband der VDE/VDI-GMM-Fachtagung „Symposium Connectors“","status":"public","title":"Parametric Optimization of Connectors by means of Coupled Simulation","date_updated":"2023-03-15T13:50:05Z","author":[{"first_name":"T.","last_name":"Langer","full_name":"Langer, T."},{"full_name":"Shukla, Abhay Rammurti","id":"74188","last_name":"Shukla","first_name":"Abhay Rammurti"},{"id":"61860","last_name":"Yuan","full_name":"Yuan, Haomiao","first_name":"Haomiao"},{"last_name":"Probst","id":"61449","full_name":"Probst, Roman","first_name":"Roman"},{"first_name":"Steffen","id":"50024","last_name":"Nolte","full_name":"Nolte, Steffen"},{"first_name":"Jian","id":"5297","last_name":"Song","full_name":"Song, Jian"}],"type":"conference","date_created":"2021-09-15T12:53:41Z","language":[{"iso":"eng"}],"citation":{"havard":"T. Langer, A.R. Shukla, H. Yuan, R. Probst, S. Nolte, J. Song, Parametric Optimization of Connectors by means of Coupled Simulation, in: Tagungsband Der VDE/VDI-GMM-Fachtagung „Symposium Connectors“, Lemgo, 2021: pp. 28–43.","ufg":"<b>Langer, T. et. al. (2021)</b>: Parametric Optimization of Connectors by means of Coupled Simulation, in: <i>Tagungsband der VDE/VDI-GMM-Fachtagung „Symposium Connectors“</i>, Lemgo, S. 28–43.","chicago-de":"Langer, T., Abhay Rammurti Shukla, Haomiao Yuan, Roman Probst, Steffen Nolte und Jian Song. 2021. Parametric Optimization of Connectors by means of Coupled Simulation. In: <i>Tagungsband der VDE/VDI-GMM-Fachtagung „Symposium Connectors“</i>, 28–43. Lemgo.","short":"T. Langer, A.R. Shukla, H. Yuan, R. Probst, S. Nolte, J. Song, in: Tagungsband Der VDE/VDI-GMM-Fachtagung „Symposium Connectors“, Lemgo, 2021, pp. 28–43.","apa":"Langer, T., Shukla, A. R., Yuan, H., Probst, R., Nolte, S., &#38; Song, J. (2021). Parametric Optimization of Connectors by means of Coupled Simulation. In <i>Tagungsband der VDE/VDI-GMM-Fachtagung „Symposium Connectors“</i> (pp. 28–43). Lemgo.","mla":"Langer, T., et al. “Parametric Optimization of Connectors by Means of Coupled Simulation.” <i>Tagungsband Der VDE/VDI-GMM-Fachtagung „Symposium Connectors“</i>, 2021, pp. 28–43.","van":"Langer T, Shukla AR, Yuan H, Probst R, Nolte S, Song J. Parametric Optimization of Connectors by means of Coupled Simulation. In: Tagungsband der VDE/VDI-GMM-Fachtagung „Symposium Connectors“. Lemgo; 2021. p. 28–43.","ama":"Langer T, Shukla AR, Yuan H, Probst R, Nolte S, Song J. Parametric Optimization of Connectors by means of Coupled Simulation. In: <i>Tagungsband Der VDE/VDI-GMM-Fachtagung „Symposium Connectors“</i>. Lemgo; 2021:28-43.","ieee":"T. Langer, A. R. Shukla, H. Yuan, R. Probst, S. Nolte, and J. Song, “Parametric Optimization of Connectors by means of Coupled Simulation,” in <i>Tagungsband der VDE/VDI-GMM-Fachtagung „Symposium Connectors“</i>, Lemgo, 2021, pp. 28–43.","chicago":"Langer, T., Abhay Rammurti Shukla, Haomiao Yuan, Roman Probst, Steffen Nolte, and Jian Song. “Parametric Optimization of Connectors by Means of Coupled Simulation.” In <i>Tagungsband Der VDE/VDI-GMM-Fachtagung „Symposium Connectors“</i>, 28–43. Lemgo, 2021.","bjps":"<b>Langer T <i>et al.</i></b> (2021) Parametric Optimization of Connectors by Means of Coupled Simulation. <i>Tagungsband Der VDE/VDI-GMM-Fachtagung „Symposium Connectors“</i>. Lemgo, pp. 28–43.","din1505-2-1":"<span style=\"font-variant:small-caps;\">Langer, T.</span> ; <span style=\"font-variant:small-caps;\">Shukla, Abhay Rammurti</span> ; <span style=\"font-variant:small-caps;\">Yuan, Haomiao</span> ; <span style=\"font-variant:small-caps;\">Probst, Roman</span> ; <span style=\"font-variant:small-caps;\">Nolte, Steffen</span> ; <span style=\"font-variant:small-caps;\">Song, Jian</span>: Parametric Optimization of Connectors by means of Coupled Simulation. In: <i>Tagungsband der VDE/VDI-GMM-Fachtagung „Symposium Connectors“</i>. Lemgo, 2021, S. 28–43"},"place":"Lemgo"},{"title":"Effect of Direction of Motion on Fretting Corrosion Behaviour","date_updated":"2023-03-15T13:50:05Z","type":"conference","author":[{"first_name":"Haomiao","full_name":"Yuan, Haomiao","id":"61860","last_name":"Yuan"},{"first_name":"Dirk","full_name":"Hilmert, Dirk","id":"74212","last_name":"Hilmert"},{"first_name":"Abhay Rammurti","id":"74188","last_name":"Shukla","full_name":"Shukla, Abhay Rammurti"},{"first_name":"Jian","full_name":"Song, Jian","id":"5297","last_name":"Song"}],"language":[{"iso":"eng"}],"date_created":"2021-09-16T08:13:06Z","citation":{"din1505-2-1":"<span style=\"font-variant:small-caps;\">Yuan, Haomiao</span> ; <span style=\"font-variant:small-caps;\">Hilmert, Dirk</span> ; <span style=\"font-variant:small-caps;\">Shukla, Abhay Rammurti</span> ; <span style=\"font-variant:small-caps;\">Song, Jian</span>: Effect of Direction of Motion on Fretting Corrosion Behaviour. In: <i>Proceedings of the 66th IEEE Holm Conference on Electrical Contacts</i>, 2020","bjps":"<b>Yuan H <i>et al.</i></b> (2020) Effect of Direction of Motion on Fretting Corrosion Behaviour. <i>Proceedings of the 66th IEEE Holm Conference on Electrical Contacts</i>.","chicago":"Yuan, Haomiao, Dirk Hilmert, Abhay Rammurti Shukla, and Jian Song. “Effect of Direction of Motion on Fretting Corrosion Behaviour.” In <i>Proceedings of the 66th IEEE Holm Conference on Electrical Contacts</i>, 2020.","ieee":"H. Yuan, D. Hilmert, A. R. Shukla, and J. Song, “Effect of Direction of Motion on Fretting Corrosion Behaviour,” in <i>Proceedings of the 66th IEEE Holm Conference on Electrical Contacts</i>, 2020.","ama":"Yuan H, Hilmert D, Shukla AR, Song J. Effect of Direction of Motion on Fretting Corrosion Behaviour. In: <i>Proceedings of the 66th IEEE Holm Conference on Electrical Contacts</i>. ; 2020.","van":"Yuan H, Hilmert D, Shukla AR, Song J. Effect of Direction of Motion on Fretting Corrosion Behaviour. In: Proceedings of the 66th IEEE Holm Conference on Electrical Contacts. 2020.","apa":"Yuan, H., Hilmert, D., Shukla, A. R., &#38; Song, J. (2020). Effect of Direction of Motion on Fretting Corrosion Behaviour. In <i>Proceedings of the 66th IEEE Holm Conference on Electrical Contacts</i>.","mla":"Yuan, Haomiao, et al. “Effect of Direction of Motion on Fretting Corrosion Behaviour.” <i>Proceedings of the 66th IEEE Holm Conference on Electrical Contacts</i>, 2020.","short":"H. Yuan, D. Hilmert, A.R. Shukla, J. Song, in: Proceedings of the 66th IEEE Holm Conference on Electrical Contacts, 2020.","chicago-de":"Yuan, Haomiao, Dirk Hilmert, Abhay Rammurti Shukla und Jian Song. 2020. Effect of Direction of Motion on Fretting Corrosion Behaviour. In: <i>Proceedings of the 66th IEEE Holm Conference on Electrical Contacts</i>.","ufg":"<b>Yuan, Haomiao et. al. (2020)</b>: Effect of Direction of Motion on Fretting Corrosion Behaviour, in: <i>Proceedings of the 66th IEEE Holm Conference on Electrical Contacts</i>.","havard":"H. Yuan, D. Hilmert, A.R. Shukla, J. Song, Effect of Direction of Motion on Fretting Corrosion Behaviour, in: Proceedings of the 66th IEEE Holm Conference on Electrical Contacts, 2020."},"_id":"6324","conference":{"name":"66th IEEE Holm Conference on Electrical Contacts"},"department":[{"_id":"DEP6012"}],"year":2020,"user_id":"74004","publication":"Proceedings of the 66th IEEE Holm Conference on Electrical Contacts","status":"public"},{"author":[{"first_name":"Jian","id":"5297","last_name":"Song","full_name":"Song, Jian"},{"first_name":"Haomiao","full_name":"Yuan, Haomiao","last_name":"Yuan","id":"61860"},{"first_name":"Abhay Rammurti","full_name":"Shukla, Abhay Rammurti","last_name":"Shukla","id":"74188"}],"type":"conference","date_created":"2021-09-15T12:29:26Z","language":[{"iso":"eng"}],"citation":{"short":"J. Song, H. Yuan, A.R. Shukla, in: Proceedings of 15th Arnold Tross Colloquium, Hamburg, 2019.","bjps":"<b>Song J, Yuan H and Shukla AR</b> (2019) Wear and Fretting Corrosion of Coatings of Electrical Contacts - Some New Aspects. <i>Proceedings of 15th Arnold Tross Colloquium</i>. Hamburg.","din1505-2-1":"<span style=\"font-variant:small-caps;\">Song, Jian</span> ; <span style=\"font-variant:small-caps;\">Yuan, Haomiao</span> ; <span style=\"font-variant:small-caps;\">Shukla, Abhay Rammurti</span>: Wear and fretting corrosion of coatings of electrical contacts - Some new aspects. In: <i>Proceedings of 15th Arnold Tross Colloquium</i>. Hamburg, 2019","mla":"Song, Jian, et al. “Wear and Fretting Corrosion of Coatings of Electrical Contacts - Some New Aspects.” <i>Proceedings of 15th Arnold Tross Colloquium</i>, 2019.","apa":"Song, J., Yuan, H., &#38; Shukla, A. R. (2019). Wear and fretting corrosion of coatings of electrical contacts - Some new aspects. In <i>Proceedings of 15th Arnold Tross Colloquium</i>. Hamburg.","ufg":"<b>Song, Jian et. al. (2019)</b>: Wear and fretting corrosion of coatings of electrical contacts - Some new aspects, in: <i>Proceedings of 15th Arnold Tross Colloquium</i>, Hamburg.","chicago-de":"Song, Jian, Haomiao Yuan und Abhay Rammurti Shukla. 2019. Wear and fretting corrosion of coatings of electrical contacts - Some new aspects. In: <i>Proceedings of 15th Arnold Tross Colloquium</i>. Hamburg.","chicago":"Song, Jian, Haomiao Yuan, and Abhay Rammurti Shukla. “Wear and Fretting Corrosion of Coatings of Electrical Contacts - Some New Aspects.” In <i>Proceedings of 15th Arnold Tross Colloquium</i>. Hamburg, 2019.","ieee":"J. Song, H. Yuan, and A. R. Shukla, “Wear and fretting corrosion of coatings of electrical contacts - Some new aspects,” in <i>Proceedings of 15th Arnold Tross Colloquium</i>, Hamburg, 2019.","havard":"J. Song, H. Yuan, A.R. Shukla, Wear and fretting corrosion of coatings of electrical contacts - Some new aspects, in: Proceedings of 15th Arnold Tross Colloquium, Hamburg, 2019.","van":"Song J, Yuan H, Shukla AR. Wear and fretting corrosion of coatings of electrical contacts - Some new aspects. In: Proceedings of 15th Arnold Tross Colloquium. Hamburg; 2019.","ama":"Song J, Yuan H, Shukla AR. Wear and fretting corrosion of coatings of electrical contacts - Some new aspects. In: <i>Proceedings of 15th Arnold Tross Colloquium</i>. Hamburg; 2019."},"place":"Hamburg","title":"Wear and fretting corrosion of coatings of electrical contacts - Some new aspects","date_updated":"2023-03-15T13:50:05Z","department":[{"_id":"DEP6012"}],"year":2019,"user_id":"74004","publication":"Proceedings of 15th Arnold Tross Colloquium","status":"public","_id":"6310","conference":{"location":"Hamburg","name":"15th Arnold Tross Colloquium"}},{"date_updated":"2023-03-15T13:50:05Z","title":"Correlation of connector contact failures in accelerated testing and in long-term use field vehicles","citation":{"chicago":"Song, Jian, Haomiao Yuan, Abhay Rammurti Shukla, Christian Koch, and Dirk Hilmert. “Correlation of Connector Contact Failures in Accelerated Testing and in Long-Term Use Field Vehicles.” In <i>Proceedings of the 65th IEEE Holm Conference on Electrical Contacts</i>, 2019.","bjps":"<b>Song J <i>et al.</i></b> (2019) Correlation of Connector Contact Failures in Accelerated Testing and in Long-Term Use Field Vehicles. <i>Proceedings of the 65th IEEE Holm Conference on Electrical Contacts</i>.","din1505-2-1":"<span style=\"font-variant:small-caps;\">Song, Jian</span> ; <span style=\"font-variant:small-caps;\">Yuan, Haomiao</span> ; <span style=\"font-variant:small-caps;\">Shukla, Abhay Rammurti</span> ; <span style=\"font-variant:small-caps;\">Koch, Christian</span> ; <span style=\"font-variant:small-caps;\">Hilmert, Dirk</span>: Correlation of connector contact failures in accelerated testing and in long-term use field vehicles. In: <i>Proceedings of the 65th IEEE Holm Conference on Electrical Contacts</i>, 2019","van":"Song J, Yuan H, Shukla AR, Koch C, Hilmert D. Correlation of connector contact failures in accelerated testing and in long-term use field vehicles. In: Proceedings of the 65th IEEE Holm Conference on Electrical Contacts. 2019.","ama":"Song J, Yuan H, Shukla AR, Koch C, Hilmert D. Correlation of connector contact failures in accelerated testing and in long-term use field vehicles. In: <i>Proceedings of the 65th IEEE Holm Conference on Electrical Contacts</i>. ; 2019.","ieee":"J. Song, H. Yuan, A. R. Shukla, C. Koch, and D. Hilmert, “Correlation of connector contact failures in accelerated testing and in long-term use field vehicles,” in <i>Proceedings of the 65th IEEE Holm Conference on Electrical Contacts</i>, Milwaukee, 2019.","ufg":"<b>Song, Jian et. al. (2019)</b>: Correlation of connector contact failures in accelerated testing and in long-term use field vehicles, in: <i>Proceedings of the 65th IEEE Holm Conference on Electrical Contacts</i>.","chicago-de":"Song, Jian, Haomiao Yuan, Abhay Rammurti Shukla, Christian Koch und Dirk Hilmert. 2019. Correlation of connector contact failures in accelerated testing and in long-term use field vehicles. In: <i>Proceedings of the 65th IEEE Holm Conference on Electrical Contacts</i>.","short":"J. Song, H. Yuan, A.R. Shukla, C. Koch, D. Hilmert, in: Proceedings of the 65th IEEE Holm Conference on Electrical Contacts, 2019.","apa":"Song, J., Yuan, H., Shukla, A. R., Koch, C., &#38; Hilmert, D. (2019). Correlation of connector contact failures in accelerated testing and in long-term use field vehicles. In <i>Proceedings of the 65th IEEE Holm Conference on Electrical Contacts</i>. Milwaukee.","mla":"Song, Jian, et al. “Correlation of Connector Contact Failures in Accelerated Testing and in Long-Term Use Field Vehicles.” <i>Proceedings of the 65th IEEE Holm Conference on Electrical Contacts</i>, 2019.","havard":"J. Song, H. Yuan, A.R. Shukla, C. Koch, D. Hilmert, Correlation of connector contact failures in accelerated testing and in long-term use field vehicles, in: Proceedings of the 65th IEEE Holm Conference on Electrical Contacts, 2019."},"language":[{"iso":"eng"}],"date_created":"2021-09-16T08:13:06Z","type":"conference","author":[{"first_name":"Jian","id":"5297","last_name":"Song","full_name":"Song, Jian"},{"full_name":"Yuan, Haomiao","last_name":"Yuan","id":"61860","first_name":"Haomiao"},{"id":"74188","last_name":"Shukla","full_name":"Shukla, Abhay Rammurti","first_name":"Abhay Rammurti"},{"full_name":"Koch, Christian","last_name":"Koch","first_name":"Christian"},{"first_name":"Dirk","last_name":"Hilmert","id":"74212","full_name":"Hilmert, Dirk"}],"conference":{"name":"65th IEEE Holm Conference on Electrical Contacts","location":"Milwaukee"},"_id":"6326","status":"public","publication":"Proceedings of the 65th IEEE Holm Conference on Electrical Contacts","year":2019,"user_id":"74004","department":[{"_id":"DEP6012"}]}]