---
_id: '12761'
abstract:
- lang: eng
  text: For modern machines, factories and electric and autonomous vehicles, the importance
    of vreliable electrical connectors cannot be overstated. With an increasing number
    of connectors being used in machines, factories and vehicles, ensuring their reliability
    is crucial for comfort and safety alike. One of the key indicators of reliability
    is the lifetime of connectors. To evaluate the lifetime of electrical connectors,
    a testing method and a model for calculating their lifetime based on the test
    data were developed. The results from these tests were compared to failure analysis
    data from long-term field operations. The findings indicate that the laboratory
    tests can accurately reproduce the main failures observed in the field. However,
    such lifetime tests can be time- and labor-intensive. To address this challenge,
    a data-driven method is proposed that predicts the lifetime of electrical connectors
    using statistical analysis of electrical contact resistance data collected from
    short-term tests. The predictions from this method were compared to actual results
    obtained from long-term tests. A strong correlation was observed between the contact
    resistance development in short-term tests and the number of failures in later
    stages of testing. Thus, apart from predicting the lifetime of connectors, this
    method can also be applied for failure prognosis in real-time operations.
author:
- first_name: Jian
  full_name: Song, Jian
  id: '5297'
  last_name: Song
- first_name: Abhay Rammurti
  full_name: Shukla, Abhay Rammurti
  id: '74188'
  last_name: Shukla
- first_name: Roman
  full_name: Probst, Roman
  id: '69156'
  last_name: Probst
citation:
  ama: Song J, Shukla AR, Probst R. The State of Health of Electrical Connectors.
    <i>Machines</i>. 2024;7(12):474. doi:<a href="https://doi.org/10.3390/machines12070474">https://doi.org/10.3390/machines12070474</a>
  apa: Song, J., Shukla, A. R., &#38; Probst, R. (2024). The State of Health of Electrical
    Connectors. <i>Machines</i>, <i>7</i>(12), 474. <a href="https://doi.org/10.3390/machines12070474">https://doi.org/10.3390/machines12070474</a>
  bjps: <b>Song J, Shukla AR and Probst R</b> (2024) The State of Health of Electrical
    Connectors. <i>Machines</i> <b>7</b>, 474.
  chicago: 'Song, Jian, Abhay Rammurti Shukla, and Roman Probst. “The State of Health
    of Electrical Connectors.” <i>Machines</i> 7, no. 12 (2024): 474. <a href="https://doi.org/10.3390/machines12070474">https://doi.org/10.3390/machines12070474</a>.'
  chicago-de: 'Song, Jian, Abhay Rammurti Shukla und Roman Probst. 2024. The State
    of Health of Electrical Connectors. <i>Machines</i> 7, Nr. 12: 474. doi:<a href="https://doi.org/10.3390/machines12070474">https://doi.org/10.3390/machines12070474</a>,
    .'
  din1505-2-1: '<span style="font-variant:small-caps;">Song, Jian</span> ; <span style="font-variant:small-caps;">Shukla,
    Abhay Rammurti</span> ; <span style="font-variant:small-caps;">Probst, Roman</span>:
    The State of Health of Electrical Connectors. In: <i>Machines</i> Bd. 7. Basel,
    MDPI (2024), Nr. 12, S. 474'
  havard: J. Song, A.R. Shukla, R. Probst, The State of Health of Electrical Connectors,
    Machines. 7 (2024) 474.
  ieee: 'J. Song, A. R. Shukla, and R. Probst, “The State of Health of Electrical
    Connectors,” <i>Machines</i>, vol. 7, no. 12, p. 474, 2024, doi: <a href="https://doi.org/10.3390/machines12070474">https://doi.org/10.3390/machines12070474</a>.'
  mla: Song, Jian, et al. “The State of Health of Electrical Connectors.” <i>Machines</i>,
    vol. 7, no. 12, 2024, p. 474, <a href="https://doi.org/10.3390/machines12070474">https://doi.org/10.3390/machines12070474</a>.
  short: J. Song, A.R. Shukla, R. Probst, Machines 7 (2024) 474.
  ufg: '<b>Song, Jian/Shukla, Abhay Rammurti/Probst, Roman</b>: The State of Health
    of Electrical Connectors, in: <i>Machines</i> 7 (2024), H. 12,  S. 474.'
  van: Song J, Shukla AR, Probst R. The State of Health of Electrical Connectors.
    Machines. 2024;7(12):474.
date_created: 2025-04-04T09:23:10Z
date_updated: 2025-06-25T13:03:28Z
department:
- _id: DEP6012
doi: https://doi.org/10.3390/machines12070474
external_id:
  isi:
  - '001277040200001'
intvolume: '         7'
isi: '1'
issue: '12'
keyword:
- electrical connectors
- accelerated life testing
- statistical model
- lifetime prognosis
- reliability
- state of health
language:
- iso: eng
page: '474'
place: Basel
publication: Machines
publication_identifier:
  eissn:
  - '2075-1702 '
publication_status: published
publisher: MDPI
quality_controlled: '1'
status: public
title: The State of Health of Electrical Connectors
type: scientific_journal_article
user_id: '83781'
volume: 7
year: '2024'
...
---
_id: '12891'
abstract:
- lang: eng
  text: Copper alloy metal strips are widely used to manufacture electrical connectors.
    These connectors experience stress relaxation during operation. The reduced contact
    force may lead to contact failure. For the given design of connectors, the contact
    force is proportional to the Young's modulus which depends on interatomic bonds,
    alloying elements and the microstructure of metal grains. According to the literature,
    it is assumed that Young's modulus does not change significantly during long-term
    mechanical stress and aging at temperatures below the recrystallization temperature
    of copper alloys. Based on this assumption, the relaxation of connectors from
    lifetime tests and from long-term used field vehicles can be determined by the
    comparison of spring deflection of connectors before and after long-term tests
    or long-term use. The focus of this paper is to answer the question, whether this
    assumption is accurate. For this purpose, the influence of long-term thermal and
    mechanical loads on the Young's modulus of various copper alloys is investigated.
    The temperature in test approximately matches the maximum design temperature of
    automotive connectors and the mechanical stress is comparable to that in a typical
    connector.
author:
- first_name: Karolin
  full_name: Bünting, Karolin
  id: '62067'
  last_name: Bünting
- first_name: Abhay Rammurti
  full_name: Shukla, Abhay Rammurti
  id: '74188'
  last_name: Shukla
- first_name: Jian
  full_name: Song, Jian
  id: '5297'
  last_name: Song
citation:
  ama: Bünting K, Shukla AR, Song J. <i>The Influence of Long Term Thermal and Mechanical
    Loads on the Young’s Modulus of Cu-Alloys - Determination of Stress Relaxation
    in Electrical Connectors</i>. (Institute of Electrical and Electronics Engineers,
    IEEE Electronics Packaging Society , eds.). IEEE; 2024. doi:<a href="https://doi.org/10.1109/holm56222.2024.10768449">10.1109/holm56222.2024.10768449</a>
  apa: 'Bünting, K., Shukla, A. R., &#38; Song, J. (2024). The Influence of Long Term
    Thermal and Mechanical Loads on the Young’s Modulus of Cu-Alloys - Determination
    of Stress Relaxation in Electrical Connectors. In Institute of Electrical and
    Electronics Engineers &#38; IEEE Electronics Packaging Society  (Eds.), <i>  Electrical
    contacts - 2024 : proceedings of the Sixty‐Ninth IEEE Holm Conference on Electrical
    Contacts : 6-10 October 2024, Annapolis, MD, USA </i>. IEEE. <a href="https://doi.org/10.1109/holm56222.2024.10768449">https://doi.org/10.1109/holm56222.2024.10768449</a>'
  bjps: '<b>Bünting K, Shukla AR and Song J</b> (2024) <i>The Influence of Long Term
    Thermal and Mechanical Loads on the Young’s Modulus of Cu-Alloys - Determination
    of Stress Relaxation in Electrical Connectors</i>, Institute of Electrical and
    Electronics Engineers and IEEE Electronics Packaging Society  (eds). [Piscataway,
    NJ]: IEEE.'
  chicago: 'Bünting, Karolin, Abhay Rammurti Shukla, and Jian Song. <i>The Influence
    of Long Term Thermal and Mechanical Loads on the Young’s Modulus of Cu-Alloys
    - Determination of Stress Relaxation in Electrical Connectors</i>. Edited by Institute
    of Electrical and Electronics Engineers and IEEE Electronics Packaging Society
    . <i>  Electrical Contacts - 2024 : Proceedings of the Sixty‐Ninth IEEE Holm Conference
    on Electrical Contacts : 6-10 October 2024, Annapolis, MD, USA </i>. [Piscataway,
    NJ]: IEEE, 2024. <a href="https://doi.org/10.1109/holm56222.2024.10768449">https://doi.org/10.1109/holm56222.2024.10768449</a>.'
  chicago-de: 'Bünting, Karolin, Abhay Rammurti Shukla und Jian Song. 2024. <i>The
    Influence of Long Term Thermal and Mechanical Loads on the Young’s Modulus of
    Cu-Alloys - Determination of Stress Relaxation in Electrical Connectors</i>. Hg.
    von Institute of Electrical and Electronics Engineers und IEEE Electronics Packaging
    Society . <i>  Electrical contacts - 2024 : proceedings of the Sixty‐Ninth IEEE
    Holm Conference on Electrical Contacts : 6-10 October 2024, Annapolis, MD, USA
    </i>. [Piscataway, NJ]: IEEE. doi:<a href="https://doi.org/10.1109/holm56222.2024.10768449">10.1109/holm56222.2024.10768449</a>,
    .'
  din1505-2-1: '<span style="font-variant:small-caps;">Bünting, Karolin</span> ; <span
    style="font-variant:small-caps;">Shukla, Abhay Rammurti</span> ; <span style="font-variant:small-caps;">Song,
    Jian</span> ; <span style="font-variant:small-caps;">Institute of Electrical and
    Electronics Engineers</span> ; <span style="font-variant:small-caps;">IEEE Electronics
    Packaging Society </span> (Hrsg.): <i>The Influence of Long Term Thermal and Mechanical
    Loads on the Young’s Modulus of Cu-Alloys - Determination of Stress Relaxation
    in Electrical Connectors</i>. [Piscataway, NJ] : IEEE, 2024'
  havard: K. Bünting, A.R. Shukla, J. Song, The Influence of Long Term Thermal and
    Mechanical Loads on the Young’s Modulus of Cu-Alloys - Determination of Stress
    Relaxation in Electrical Connectors, IEEE, [Piscataway, NJ], 2024.
  ieee: 'K. Bünting, A. R. Shukla, and J. Song, <i>The Influence of Long Term Thermal
    and Mechanical Loads on the Young’s Modulus of Cu-Alloys - Determination of Stress
    Relaxation in Electrical Connectors</i>. [Piscataway, NJ]: IEEE, 2024. doi: <a
    href="https://doi.org/10.1109/holm56222.2024.10768449">10.1109/holm56222.2024.10768449</a>.'
  mla: 'Bünting, Karolin, et al. “The Influence of Long Term Thermal and Mechanical
    Loads on the Young’s Modulus of Cu-Alloys - Determination of Stress Relaxation
    in Electrical Connectors.” <i>  Electrical Contacts - 2024 : Proceedings of the
    Sixty‐Ninth IEEE Holm Conference on Electrical Contacts : 6-10 October 2024, Annapolis,
    MD, USA </i>, edited by Institute of Electrical and Electronics Engineers and
    IEEE Electronics Packaging Society , IEEE, 2024, <a href="https://doi.org/10.1109/holm56222.2024.10768449">https://doi.org/10.1109/holm56222.2024.10768449</a>.'
  short: K. Bünting, A.R. Shukla, J. Song, The Influence of Long Term Thermal and
    Mechanical Loads on the Young’s Modulus of Cu-Alloys - Determination of Stress
    Relaxation in Electrical Connectors, IEEE, [Piscataway, NJ], 2024.
  ufg: '<b>Bünting, Karolin/Shukla, Abhay Rammurti/Song, Jian</b>: The Influence of
    Long Term Thermal and Mechanical Loads on the Young’s Modulus of Cu-Alloys - Determination
    of Stress Relaxation in Electrical Connectors, hg. von Institute of Electrical
    and Electronics Engineers, IEEE Electronics Packaging Society , [Piscataway, NJ]
    2024.'
  van: 'Bünting K, Shukla AR, Song J. The Influence of Long Term Thermal and Mechanical
    Loads on the Young’s Modulus of Cu-Alloys - Determination of Stress Relaxation
    in Electrical Connectors. Institute of Electrical and Electronics Engineers, IEEE
    Electronics Packaging Society , editors.   Electrical contacts - 2024 : proceedings
    of the Sixty‐Ninth IEEE Holm Conference on Electrical Contacts : 6-10 October
    2024, Annapolis, MD, USA . [Piscataway, NJ]: IEEE; 2024.'
conference:
  end_date: 2024-10-10
  location: 'Annapolis, MD, USA '
  name: 69th Holm Conference on Electrical Contacts (HOLM)
  start_date: 2024-10-06
corporate_editor:
- Institute of Electrical and Electronics Engineers
- 'IEEE Electronics Packaging Society '
date_created: 2025-05-07T09:31:00Z
date_updated: 2025-05-07T14:03:11Z
department:
- _id: DEP6000
- _id: DEP6012
doi: 10.1109/holm56222.2024.10768449
keyword:
- Young's modulus
- thermal and mechanical loads
- spring deflection
- relaxation
language:
- iso: eng
place: '[Piscataway, NJ]'
publication: "\t Electrical contacts - 2024 : proceedings of the Sixty‐Ninth IEEE
  Holm Conference on Electrical Contacts : 6-10 October 2024, Annapolis, MD, USA "
publication_identifier:
  eisbn:
  - '979-8-3315-2906-2 '
  isbn:
  - 979-8-3315-2907-9
publication_status: published
publisher: IEEE
status: public
title: The Influence of Long Term Thermal and Mechanical Loads on the Young's Modulus
  of Cu-Alloys - Determination of Stress Relaxation in Electrical Connectors
type: conference_editor_article
user_id: '83781'
year: '2024'
...
---
_id: '11348'
abstract:
- lang: eng
  text: Lifetime is an important feature defining the reliability of electrical connectors.
    In general practice, the lifetime tests required for reliability estimation are
    time and labor intensive. In our previous work, a data driven method using a statistical
    process, with an application of probability distributions such as standard normal
    distribution and generalized extreme value (GEV) distribution with negative skewness
    to predict degradation paths, was introduced for estimation of the lifetime and
    FIT rate with the help of electrical contact resistance data collected from short
    term tests. The proposed method proved its significance by showing the possibility
    of drastic reduction in the lifetime test duration required for reliability determination.
    In this work, a non-parametric distribution free method using percentiles of actual
    measured contact resistances is used for determining the lifetime as against the
    percentiles of probability distribution used in previous work, thereby simplifying
    the process further and leading to an even more precise estimation. The lifetimes
    calculated from parametric and non-parametric methods are compared to highlight
    the significance of distribution free method in reliability estimation.
article_number: '115216'
article_type: original
author:
- first_name: Abhay Rammurti
  full_name: Shukla, Abhay Rammurti
  id: '74188'
  last_name: Shukla
- first_name: Robert
  full_name: Martin, Robert
  last_name: Martin
- first_name: Roman
  full_name: Probst, Roman
  id: '69156'
  last_name: Probst
- first_name: Jian
  full_name: Song, Jian
  id: '5297'
  last_name: Song
citation:
  ama: Shukla AR, Martin R, Probst R, Song J. Comparison of different statistical
    methods for prediction of lifetime of electrical connectors with short term tests.
    <i>Microelectronics Reliability</i>. 2023;150. doi:<a href="https://doi.org/10.1016/j.microrel.2023.115216">10.1016/j.microrel.2023.115216</a>
  apa: Shukla, A. R., Martin, R., Probst, R., &#38; Song, J. (2023). Comparison of
    different statistical methods for prediction of lifetime of electrical connectors
    with short term tests. <i>Microelectronics Reliability</i>, <i>150</i>, Article
    115216. <a href="https://doi.org/10.1016/j.microrel.2023.115216">https://doi.org/10.1016/j.microrel.2023.115216</a>
  bjps: <b>Shukla AR <i>et al.</i></b> (2023) Comparison of Different Statistical
    Methods for Prediction of Lifetime of Electrical Connectors with Short Term Tests.
    <i>Microelectronics Reliability</i> <b>150</b>.
  chicago: Shukla, Abhay Rammurti, Robert Martin, Roman Probst, and Jian Song. “Comparison
    of Different Statistical Methods for Prediction of Lifetime of Electrical Connectors
    with Short Term Tests.” <i>Microelectronics Reliability</i> 150 (2023). <a href="https://doi.org/10.1016/j.microrel.2023.115216">https://doi.org/10.1016/j.microrel.2023.115216</a>.
  chicago-de: Shukla, Abhay Rammurti, Robert Martin, Roman Probst und Jian Song. 2023.
    Comparison of different statistical methods for prediction of lifetime of electrical
    connectors with short term tests. <i>Microelectronics Reliability</i> 150. doi:<a
    href="https://doi.org/10.1016/j.microrel.2023.115216">10.1016/j.microrel.2023.115216</a>,
    .
  din1505-2-1: '<span style="font-variant:small-caps;">Shukla, Abhay Rammurti</span>
    ; <span style="font-variant:small-caps;">Martin, Robert</span> ; <span style="font-variant:small-caps;">Probst,
    Roman</span> ; <span style="font-variant:small-caps;">Song, Jian</span>: Comparison
    of different statistical methods for prediction of lifetime of electrical connectors
    with short term tests. In: <i>Microelectronics Reliability</i> Bd. 150. Amsterdam,
    Elsevier  (2023)'
  havard: A.R. Shukla, R. Martin, R. Probst, J. Song, Comparison of different statistical
    methods for prediction of lifetime of electrical connectors with short term tests,
    Microelectronics Reliability. 150 (2023).
  ieee: 'A. R. Shukla, R. Martin, R. Probst, and J. Song, “Comparison of different
    statistical methods for prediction of lifetime of electrical connectors with short
    term tests,” <i>Microelectronics Reliability</i>, vol. 150, Art. no. 115216, 2023,
    doi: <a href="https://doi.org/10.1016/j.microrel.2023.115216">10.1016/j.microrel.2023.115216</a>.'
  mla: Shukla, Abhay Rammurti, et al. “Comparison of Different Statistical Methods
    for Prediction of Lifetime of Electrical Connectors with Short Term Tests.” <i>Microelectronics
    Reliability</i>, vol. 150, 115216, 2023, <a href="https://doi.org/10.1016/j.microrel.2023.115216">https://doi.org/10.1016/j.microrel.2023.115216</a>.
  short: A.R. Shukla, R. Martin, R. Probst, J. Song, Microelectronics Reliability
    150 (2023).
  ufg: '<b>Shukla, Abhay Rammurti u. a.</b>: Comparison of different statistical methods
    for prediction of lifetime of electrical connectors with short term tests, in:
    <i>Microelectronics Reliability</i> 150 (2023).'
  van: Shukla AR, Martin R, Probst R, Song J. Comparison of different statistical
    methods for prediction of lifetime of electrical connectors with short term tests.
    Microelectronics Reliability. 2023;150.
date_created: 2024-04-18T08:55:38Z
date_updated: 2025-06-26T07:51:25Z
department:
- _id: DEP6012
doi: 10.1016/j.microrel.2023.115216
external_id:
  isi:
  - '001106942700001'
has_accepted_license: '1'
intvolume: '       150'
isi: '1'
keyword:
- Electrical and Electronic Engineering
- Surfaces
- Coatings and Films
- Safety
- Risk
- Reliability and Quality
- Condensed Matter Physics
- Atomic and Molecular Physics
- and Optics
- Electronic
- Optical and Magnetic Materials
language:
- iso: eng
place: Amsterdam
publication: Microelectronics Reliability
publication_identifier:
  issn:
  - 0026-2714
  unknown:
  - 1872-941X
publication_status: published
publisher: 'Elsevier '
status: public
title: Comparison of different statistical methods for prediction of lifetime of electrical
  connectors with short term tests
type: scientific_journal_article
user_id: '83781'
volume: 150
year: '2023'
...
---
_id: '11351'
author:
- first_name: Jian
  full_name: Song, Jian
  id: '5297'
  last_name: Song
- first_name: Abhay Rammurti
  full_name: Shukla, Abhay Rammurti
  id: '74188'
  last_name: Shukla
citation:
  ama: Song J, Shukla AR. <i>Influence of Surface Roughness on Contact Behavior.</i>
    (Song J, Labor für Feinsystemtechnik, Technische Hochschule Ostwestfalen-Lippe,
    eds.). Labor für Feinsystemtechnik, TH OWL; 2023:209-221.
  apa: 'Song, J., &#38; Shukla, A. R. (2023). Influence of surface roughness on contact
    behavior. In J. Song &#38; Labor für Feinsystemtechnik, Technische Hochschule
    Ostwestfalen-Lippe (Eds.), <i>Elektrische und optische Verbindungstechnik 2023 :
    Tagungsband der VDE/VDI GMM-Fachtagung : 9. Symposium Connectors</i> (pp. 209–221).
    Labor für Feinsystemtechnik, TH OWL.'
  bjps: '<b>Song J and Shukla AR</b> (2023) <i>Influence of Surface Roughness on Contact
    Behavior.</i>, Song J and Labor für Feinsystemtechnik, Technische Hochschule Ostwestfalen-Lippe
    (eds). Lemgo: Labor für Feinsystemtechnik, TH OWL.'
  chicago: 'Song, Jian, and Abhay Rammurti Shukla. <i>Influence of Surface Roughness
    on Contact Behavior.</i> Edited by Jian Song and Labor für Feinsystemtechnik,
    Technische Hochschule Ostwestfalen-Lippe. <i>Elektrische Und Optische Verbindungstechnik
    2023 : Tagungsband Der VDE/VDI GMM-Fachtagung : 9. Symposium Connectors</i>. Lemgo:
    Labor für Feinsystemtechnik, TH OWL, 2023.'
  chicago-de: 'Song, Jian und Abhay Rammurti Shukla. 2023. <i>Influence of surface
    roughness on contact behavior.</i> Hg. von Jian Song und Labor für Feinsystemtechnik,
    Technische Hochschule Ostwestfalen-Lippe. <i>Elektrische und optische Verbindungstechnik
    2023 : Tagungsband der VDE/VDI GMM-Fachtagung : 9. Symposium Connectors</i>. Lemgo:
    Labor für Feinsystemtechnik, TH OWL.'
  din1505-2-1: '<span style="font-variant:small-caps;">Song, Jian</span> ; <span style="font-variant:small-caps;">Shukla,
    Abhay Rammurti</span> ; <span style="font-variant:small-caps;">Song, J.</span>
    ; <span style="font-variant:small-caps;">Labor für Feinsystemtechnik, Technische
    Hochschule Ostwestfalen-Lippe</span> (Hrsg.): <i>Influence of surface roughness
    on contact behavior.</i> Lemgo : Labor für Feinsystemtechnik, TH OWL, 2023'
  havard: J. Song, A.R. Shukla, Influence of surface roughness on contact behavior.,
    Labor für Feinsystemtechnik, TH OWL, Lemgo, 2023.
  ieee: 'J. Song and A. R. Shukla, <i>Influence of surface roughness on contact behavior.</i>
    Lemgo: Labor für Feinsystemtechnik, TH OWL, 2023, pp. 209–221.'
  mla: 'Song, Jian, and Abhay Rammurti Shukla. “Influence of Surface Roughness on
    Contact Behavior.” <i>Elektrische Und Optische Verbindungstechnik 2023 : Tagungsband
    Der VDE/VDI GMM-Fachtagung : 9. Symposium Connectors</i>, edited by Jian Song
    and Labor für Feinsystemtechnik, Technische Hochschule Ostwestfalen-Lippe, Labor
    für Feinsystemtechnik, TH OWL, 2023, pp. 209–21.'
  short: J. Song, A.R. Shukla, Influence of Surface Roughness on Contact Behavior.,
    Labor für Feinsystemtechnik, TH OWL, Lemgo, 2023.
  ufg: '<b>Song, Jian/Shukla, Abhay Rammurti</b>: Influence of surface roughness on
    contact behavior., hg. von Song, Jian, Labor für Feinsystemtechnik, Technische
    Hochschule Ostwestfalen-Lippe, Lemgo 2023.'
  van: 'Song J, Shukla AR. Influence of surface roughness on contact behavior. Song
    J, Labor für Feinsystemtechnik, Technische Hochschule Ostwestfalen-Lippe, editors.
    Elektrische und optische Verbindungstechnik 2023 : Tagungsband der VDE/VDI GMM-Fachtagung :
    9. Symposium Connectors. Lemgo: Labor für Feinsystemtechnik, TH OWL; 2023.'
conference:
  end_date: 2023-03-22
  location: Lemgo
  name: VDE/VDI-GMM- Fachtagung „Symposium Connectors“
  start_date: 2023-03-21
corporate_editor:
- Labor für Feinsystemtechnik, Technische Hochschule Ostwestfalen-Lippe
date_created: 2024-04-18T09:19:49Z
date_updated: 2024-05-13T12:26:24Z
ddc:
- '620'
department:
- _id: DEP6012
editor:
- first_name: Jian
  full_name: Song, Jian
  id: '5297'
  last_name: Song
has_accepted_license: '1'
language:
- iso: eng
page: 209 - 221
place: Lemgo
publication: 'Elektrische und optische Verbindungstechnik 2023 : Tagungsband der VDE/VDI
  GMM-Fachtagung : 9. Symposium Connectors'
publication_identifier:
  eisbn:
  - 978-3-00-074593-5
publication_status: published
publisher: Labor für Feinsystemtechnik, TH OWL
status: public
title: Influence of surface roughness on contact behavior.
type: conference_editor_article
user_id: '83781'
year: '2023'
...
---
_id: '11356'
abstract:
- lang: eng
  text: "• Surface roughness has significant influence on contact area\r\n• Real contact
    area can be predicted with good precision by simplifying roughness model using
    core roughness Rk and average groove width RSM\r\n• Higher precision can be achieved
    by proper selection of material ratio\r\n• The proposed method can be effectively
    used for predicting contact resistance for given contact conditions"
author:
- first_name: Abhay Rammurti
  full_name: Shukla, Abhay Rammurti
  id: '74188'
  last_name: Shukla
- first_name: Jian
  full_name: Song, Jian
  id: '5297'
  last_name: Song
citation:
  ama: Shukla AR, Song J. <i>Influence of Surface Roughness and Force on Real Contact
    Area Busan</i>.
  apa: Shukla, A. R., &#38; Song, J. (n.d.). <i>Influence of surface roughness and
    force on real contact area Busan</i>. 3rd Korea-Tribology International Symposium,
    Busan.
  bjps: <b>Shukla AR and Song J</b> (n.d.) <i>Influence of Surface Roughness and Force
    on Real Contact Area Busan</i>. .
  chicago: Shukla, Abhay Rammurti, and Jian Song. <i>Influence of Surface Roughness
    and Force on Real Contact Area Busan</i>, n.d.
  chicago-de: Shukla, Abhay Rammurti und Jian Song. <i>Influence of surface roughness
    and force on real contact area Busan</i>.
  din1505-2-1: '<span style="font-variant:small-caps;">Shukla, Abhay Rammurti</span>
    ; <span style="font-variant:small-caps;">Song, Jian</span>: <i>Influence of surface
    roughness and force on real contact area Busan</i>'
  havard: A.R. Shukla, J. Song, Influence of surface roughness and force on real contact
    area Busan, n.d.
  ieee: A. R. Shukla and J. Song, <i>Influence of surface roughness and force on real
    contact area Busan</i>.
  mla: Shukla, Abhay Rammurti, and Jian Song. <i>Influence of Surface Roughness and
    Force on Real Contact Area Busan</i>.
  short: A.R. Shukla, J. Song, Influence of Surface Roughness and Force on Real Contact
    Area Busan, n.d.
  ufg: '<b>Shukla, Abhay Rammurti/Song, Jian</b>: Influence of surface roughness and
    force on real contact area Busan, o. O. u. J. .'
  van: Shukla AR, Song J. Influence of surface roughness and force on real contact
    area Busan.
conference:
  end_date: 2023-04-05
  location: Busan
  name: 3rd Korea-Tribology International Symposium
  start_date: 2023-04-2
date_created: 2024-04-18T09:44:46Z
date_updated: 2024-05-21T12:32:01Z
department:
- _id: DEP6012
language:
- iso: eng
publication_status: accepted
status: public
title: Influence of surface roughness and force on real contact area Busan
type: conference_speech
user_id: '83781'
year: '2023'
...
---
_id: '11360'
abstract:
- lang: eng
  text: The state of health and lifetime estimation process of electrical connectors
    via lifetime tests is a time and labor intensive process. In our previous work,
    a correlation between the contact resistance developments in the early stages
    of lifetime tests of electrical connectors with the final results was established
    using a data driven statistical process based on probability distribution. Also,
    state of health indicators for prognosis of lifetime were introduced. In this
    work, the state of health indicators have been optimized. The sensitivity analysis
    is performed with regards to the selection of the appropriate amount of test data
    based on test duration for the reliable prognosis of the state of health and the
    characteristic lifetime. Through this the possibility of further reduction of
    test duration required for the reliable prognosis of state of health is investigated.
    Based on the results of analysis, a guideline for the determination of the duration
    of lifetime tests which lead to a reliable prediction of lifetime of connectors
    can be provided. Also, an assessment of the state of art in the prognosis of the
    lifetime of electrical connectors has been presented.
author:
- first_name: Jian
  full_name: Song, Jian
  id: '5297'
  last_name: Song
- first_name: Abhay Rammurti
  full_name: Shukla, Abhay Rammurti
  id: '74188'
  last_name: Shukla
- first_name: Roman
  full_name: Probst, Roman
  id: '69156'
  last_name: Probst
citation:
  ama: Song J, Shukla AR, Probst R. <i>Advances in Evaluation of State of Health of
    Electrical Connectors</i>. IEEE; 2023:200-208. doi:<a href="https://doi.org/10.1109/holm56075.2023.10352279">10.1109/holm56075.2023.10352279</a>
  apa: Song, J., Shukla, A. R., &#38; Probst, R. (2023). Advances in Evaluation of
    State of Health of Electrical Connectors. In <i>2023 IEEE 68th Holm Conference
    on Electrical Contacts (HOLM)</i> (pp. 200–208). IEEE. <a href="https://doi.org/10.1109/holm56075.2023.10352279">https://doi.org/10.1109/holm56075.2023.10352279</a>
  bjps: '<b>Song J, Shukla AR and Probst R</b> (2023) <i>Advances in Evaluation of
    State of Health of Electrical Connectors</i>. [Piscataway, NJ]: IEEE.'
  chicago: 'Song, Jian, Abhay Rammurti Shukla, and Roman Probst. <i>Advances in Evaluation
    of State of Health of Electrical Connectors</i>. <i>2023 IEEE 68th Holm Conference
    on Electrical Contacts (HOLM)</i>. Electrical Contacts-IEEE Holm Conference on
    Electrical Contacts. [Piscataway, NJ]: IEEE, 2023. <a href="https://doi.org/10.1109/holm56075.2023.10352279">https://doi.org/10.1109/holm56075.2023.10352279</a>.'
  chicago-de: 'Song, Jian, Abhay Rammurti Shukla und Roman Probst. 2023. <i>Advances
    in Evaluation of State of Health of Electrical Connectors</i>. <i>2023 IEEE 68th
    Holm Conference on Electrical Contacts (HOLM)</i>. Electrical Contacts-IEEE Holm
    Conference on Electrical Contacts. [Piscataway, NJ]: IEEE. doi:<a href="https://doi.org/10.1109/holm56075.2023.10352279">10.1109/holm56075.2023.10352279</a>,
    .'
  din1505-2-1: '<span style="font-variant:small-caps;">Song, Jian</span> ; <span style="font-variant:small-caps;">Shukla,
    Abhay Rammurti</span> ; <span style="font-variant:small-caps;">Probst, Roman</span>:
    <i>Advances in Evaluation of State of Health of Electrical Connectors</i>, <i>Electrical
    Contacts-IEEE Holm Conference on Electrical Contacts</i>. [Piscataway, NJ] : IEEE,
    2023'
  havard: J. Song, A.R. Shukla, R. Probst, Advances in Evaluation of State of Health
    of Electrical Connectors, IEEE, [Piscataway, NJ], 2023.
  ieee: 'J. Song, A. R. Shukla, and R. Probst, <i>Advances in Evaluation of State
    of Health of Electrical Connectors</i>. [Piscataway, NJ]: IEEE, 2023, pp. 200–208.
    doi: <a href="https://doi.org/10.1109/holm56075.2023.10352279">10.1109/holm56075.2023.10352279</a>.'
  mla: Song, Jian, et al. “Advances in Evaluation of State of Health of Electrical
    Connectors.” <i>2023 IEEE 68th Holm Conference on Electrical Contacts (HOLM)</i>,
    IEEE, 2023, pp. 200–08, <a href="https://doi.org/10.1109/holm56075.2023.10352279">https://doi.org/10.1109/holm56075.2023.10352279</a>.
  short: J. Song, A.R. Shukla, R. Probst, Advances in Evaluation of State of Health
    of Electrical Connectors, IEEE, [Piscataway, NJ], 2023.
  ufg: '<b>Song, Jian/Shukla, Abhay Rammurti/Probst, Roman</b>: Advances in Evaluation
    of State of Health of Electrical Connectors, [Piscataway, NJ] 2023 (Electrical
    Contacts-IEEE Holm Conference on Electrical Contacts).'
  van: 'Song J, Shukla AR, Probst R. Advances in Evaluation of State of Health of
    Electrical Connectors. 2023 IEEE 68th Holm Conference on Electrical Contacts (HOLM).
    [Piscataway, NJ]: IEEE; 2023. (Electrical Contacts-IEEE Holm Conference on Electrical
    Contacts).'
conference:
  end_date: 2023-10-11
  location: Seattle
  name: 68th Holm Conference on Electrical Contacts (HOLM)
  start_date: 2023-10-04
date_created: 2024-04-18T10:11:50Z
date_updated: 2025-06-26T07:54:50Z
doi: 10.1109/holm56075.2023.10352279
keyword:
- accelerated life testing
- test duration
- contact resistance
- statistical model
- connector reliability
language:
- iso: eng
page: 200-208
place: '[Piscataway, NJ]'
publication: 2023 IEEE 68th Holm Conference on Electrical Contacts (HOLM)
publication_identifier:
  eisbn:
  - 979‐8‐3503‐4246‐8
  - '979‐8‐3503‐4245‐1 '
  eissn:
  - 2158‐9992
  isbn:
  - 979‐8‐3503‐4244‐4
  issn:
  - 2158-9992
publication_status: published
publisher: IEEE
series_title: Electrical Contacts-IEEE Holm Conference on Electrical Contacts
status: public
title: Advances in Evaluation of State of Health of Electrical Connectors
type: conference_editor_article
user_id: '83781'
year: '2023'
...
---
_id: '11361'
author:
- first_name: Abhay Rammurti
  full_name: Shukla, Abhay Rammurti
  id: '74188'
  last_name: Shukla
- first_name: Robert
  full_name: Martin, Robert
  last_name: Martin
- first_name: Roman
  full_name: Probst, Roman
  id: '69156'
  last_name: Probst
- first_name: Jian
  full_name: Song, Jian
  id: '5297'
  last_name: Song
citation:
  ama: Shukla AR, Martin R, Probst R, Song J. <i>Comparison of Different Statistical
    Methods for Prediction of Lifetime of Electrical Connectors with Short Term Tests</i>.;
    2023.
  apa: Shukla, A. R., Martin, R., Probst, R., &#38; Song, J. (2023). <i>Comparison
    of different statistical methods for prediction of lifetime of electrical connectors
    with short term tests</i>. 34rd European Symposium on Reliability of Electron
    Devices, Failure Physics and Analysis (ESREF), Toulouse (France).
  bjps: <b>Shukla AR <i>et al.</i></b> (2023) <i>Comparison of Different Statistical
    Methods for Prediction of Lifetime of Electrical Connectors with Short Term Tests</i>.
    .
  chicago: Shukla, Abhay Rammurti, Robert Martin, Roman Probst, and Jian Song. <i>Comparison
    of Different Statistical Methods for Prediction of Lifetime of Electrical Connectors
    with Short Term Tests</i>, 2023.
  chicago-de: Shukla, Abhay Rammurti, Robert Martin, Roman Probst und Jian Song. 2023.
    <i>Comparison of different statistical methods for prediction of lifetime of electrical
    connectors with short term tests</i>.
  din1505-2-1: '<span style="font-variant:small-caps;">Shukla, Abhay Rammurti</span>
    ; <span style="font-variant:small-caps;">Martin, Robert</span> ; <span style="font-variant:small-caps;">Probst,
    Roman</span> ; <span style="font-variant:small-caps;">Song, Jian</span>: <i>Comparison
    of different statistical methods for prediction of lifetime of electrical connectors
    with short term tests</i>, 2023'
  havard: A.R. Shukla, R. Martin, R. Probst, J. Song, Comparison of different statistical
    methods for prediction of lifetime of electrical connectors with short term tests,
    2023.
  ieee: A. R. Shukla, R. Martin, R. Probst, and J. Song, <i>Comparison of different
    statistical methods for prediction of lifetime of electrical connectors with short
    term tests</i>. 2023.
  mla: Shukla, Abhay Rammurti, et al. <i>Comparison of Different Statistical Methods
    for Prediction of Lifetime of Electrical Connectors with Short Term Tests</i>.
    2023.
  short: A.R. Shukla, R. Martin, R. Probst, J. Song, Comparison of Different Statistical
    Methods for Prediction of Lifetime of Electrical Connectors with Short Term Tests,
    2023.
  ufg: '<b>Shukla, Abhay Rammurti u. a.</b>: Comparison of different statistical methods
    for prediction of lifetime of electrical connectors with short term tests, o. O.
    2023.'
  van: Shukla AR, Martin R, Probst R, Song J. Comparison of different statistical
    methods for prediction of lifetime of electrical connectors with short term tests.
    2023.
conference:
  end_date: 2023-10-05
  location: Toulouse (France)
  name: 34rd European Symposium on Reliability of Electron Devices, Failure Physics
    and Analysis (ESREF)
  start_date: 2023-10-02
date_created: 2024-04-18T10:18:33Z
date_updated: 2024-05-17T14:07:26Z
language:
- iso: eng
publication_status: published
status: public
title: Comparison of different statistical methods for prediction of lifetime of electrical
  connectors with short term tests
type: conference_speech
user_id: '83781'
year: '2023'
...
---
_id: '11362'
author:
- first_name: Jian
  full_name: Song, Jian
  id: '5297'
  last_name: Song
- first_name: Roman
  full_name: Probst, Roman
  id: '69156'
  last_name: Probst
- first_name: Abhay Rammurti
  full_name: Shukla, Abhay Rammurti
  id: '74188'
  last_name: Shukla
- first_name: Karolin
  full_name: Bünting, Karolin
  id: '62067'
  last_name: Bünting
citation:
  ama: Song J, Probst R, Shukla AR, Bünting K. <i>Influence of Tribological Properties
    of Contact Coatings on the Long Term Behavior of Electrical Contacts</i>.; 2023.
  apa: Song, J., Probst, R., Shukla, A. R., &#38; Bünting, K. (2023). <i>Influence
    of tribological properties of contact coatings on the long term behavior of electrical
    contacts</i>. International Tribology Conference (ITC), Fukuoka, Japan .
  bjps: <b>Song J <i>et al.</i></b> (2023) <i>Influence of Tribological Properties
    of Contact Coatings on the Long Term Behavior of Electrical Contacts</i>. .
  chicago: Song, Jian, Roman Probst, Abhay Rammurti Shukla, and Karolin Bünting. <i>Influence
    of Tribological Properties of Contact Coatings on the Long Term Behavior of Electrical
    Contacts</i>, 2023.
  chicago-de: Song, Jian, Roman Probst, Abhay Rammurti Shukla und Karolin Bünting.
    2023. <i>Influence of tribological properties of contact coatings on the long
    term behavior of electrical contacts</i>.
  din1505-2-1: '<span style="font-variant:small-caps;">Song, Jian</span> ; <span style="font-variant:small-caps;">Probst,
    Roman</span> ; <span style="font-variant:small-caps;">Shukla, Abhay Rammurti</span>
    ; <span style="font-variant:small-caps;">Bünting, Karolin</span>: <i>Influence
    of tribological properties of contact coatings on the long term behavior of electrical
    contacts</i>, 2023'
  havard: J. Song, R. Probst, A.R. Shukla, K. Bünting, Influence of tribological properties
    of contact coatings on the long term behavior of electrical contacts, 2023.
  ieee: J. Song, R. Probst, A. R. Shukla, and K. Bünting, <i>Influence of tribological
    properties of contact coatings on the long term behavior of electrical contacts</i>.
    2023.
  mla: Song, Jian, et al. <i>Influence of Tribological Properties of Contact Coatings
    on the Long Term Behavior of Electrical Contacts</i>. 2023.
  short: J. Song, R. Probst, A.R. Shukla, K. Bünting, Influence of Tribological Properties
    of Contact Coatings on the Long Term Behavior of Electrical Contacts, 2023.
  ufg: '<b>Song, Jian u. a.</b>: Influence of tribological properties of contact coatings
    on the long term behavior of electrical contacts, o. O. 2023.'
  van: Song J, Probst R, Shukla AR, Bünting K. Influence of tribological properties
    of contact coatings on the long term behavior of electrical contacts. 2023.
conference:
  end_date: 2023-09-30
  location: 'Fukuoka, Japan '
  name: International Tribology Conference (ITC)
  start_date: 2023-09-25
date_created: 2024-04-18T10:31:49Z
date_updated: 2024-05-17T14:05:11Z
department:
- _id: DEP6012
language:
- iso: eng
publication_status: published
status: public
title: Influence of tribological properties of contact coatings on the long term behavior
  of electrical contacts
type: conference_speech
user_id: '83781'
year: '2023'
...
---
_id: '6290'
author:
- first_name: T.
  full_name: Langer, T.
  last_name: Langer
- first_name: Abhay Rammurti
  full_name: Shukla, Abhay Rammurti
  id: '74188'
  last_name: Shukla
- first_name: Haomiao
  full_name: Yuan, Haomiao
  id: '61860'
  last_name: Yuan
- first_name: Roman
  full_name: Probst, Roman
  id: '61449'
  last_name: Probst
- first_name: Steffen
  full_name: Nolte, Steffen
  id: '50024'
  last_name: Nolte
- first_name: Jian
  full_name: Song, Jian
  id: '5297'
  last_name: Song
citation:
  ama: 'Langer T, Shukla AR, Yuan H, Probst R, Nolte S, Song J. Parametric Optimization
    of Connectors by means of Coupled Simulation. In: <i>Tagungsband Der VDE/VDI-GMM-Fachtagung
    „Symposium Connectors“</i>. Lemgo; 2021:28-43.'
  apa: Langer, T., Shukla, A. R., Yuan, H., Probst, R., Nolte, S., &#38; Song, J.
    (2021). Parametric Optimization of Connectors by means of Coupled Simulation.
    In <i>Tagungsband der VDE/VDI-GMM-Fachtagung „Symposium Connectors“</i> (pp. 28–43).
    Lemgo.
  bjps: <b>Langer T <i>et al.</i></b> (2021) Parametric Optimization of Connectors
    by Means of Coupled Simulation. <i>Tagungsband Der VDE/VDI-GMM-Fachtagung „Symposium
    Connectors“</i>. Lemgo, pp. 28–43.
  chicago: Langer, T., Abhay Rammurti Shukla, Haomiao Yuan, Roman Probst, Steffen
    Nolte, and Jian Song. “Parametric Optimization of Connectors by Means of Coupled
    Simulation.” In <i>Tagungsband Der VDE/VDI-GMM-Fachtagung „Symposium Connectors“</i>,
    28–43. Lemgo, 2021.
  chicago-de: 'Langer, T., Abhay Rammurti Shukla, Haomiao Yuan, Roman Probst, Steffen
    Nolte und Jian Song. 2021. Parametric Optimization of Connectors by means of Coupled
    Simulation. In: <i>Tagungsband der VDE/VDI-GMM-Fachtagung „Symposium Connectors“</i>,
    28–43. Lemgo.'
  din1505-2-1: '<span style="font-variant:small-caps;">Langer, T.</span> ; <span style="font-variant:small-caps;">Shukla,
    Abhay Rammurti</span> ; <span style="font-variant:small-caps;">Yuan, Haomiao</span>
    ; <span style="font-variant:small-caps;">Probst, Roman</span> ; <span style="font-variant:small-caps;">Nolte,
    Steffen</span> ; <span style="font-variant:small-caps;">Song, Jian</span>: Parametric
    Optimization of Connectors by means of Coupled Simulation. In: <i>Tagungsband
    der VDE/VDI-GMM-Fachtagung „Symposium Connectors“</i>. Lemgo, 2021, S. 28–43'
  havard: 'T. Langer, A.R. Shukla, H. Yuan, R. Probst, S. Nolte, J. Song, Parametric
    Optimization of Connectors by means of Coupled Simulation, in: Tagungsband Der
    VDE/VDI-GMM-Fachtagung „Symposium Connectors“, Lemgo, 2021: pp. 28–43.'
  ieee: T. Langer, A. R. Shukla, H. Yuan, R. Probst, S. Nolte, and J. Song, “Parametric
    Optimization of Connectors by means of Coupled Simulation,” in <i>Tagungsband
    der VDE/VDI-GMM-Fachtagung „Symposium Connectors“</i>, Lemgo, 2021, pp. 28–43.
  mla: Langer, T., et al. “Parametric Optimization of Connectors by Means of Coupled
    Simulation.” <i>Tagungsband Der VDE/VDI-GMM-Fachtagung „Symposium Connectors“</i>,
    2021, pp. 28–43.
  short: 'T. Langer, A.R. Shukla, H. Yuan, R. Probst, S. Nolte, J. Song, in: Tagungsband
    Der VDE/VDI-GMM-Fachtagung „Symposium Connectors“, Lemgo, 2021, pp. 28–43.'
  ufg: '<b>Langer, T. et. al. (2021)</b>: Parametric Optimization of Connectors by
    means of Coupled Simulation, in: <i>Tagungsband der VDE/VDI-GMM-Fachtagung „Symposium
    Connectors“</i>, Lemgo, S. 28–43.'
  van: 'Langer T, Shukla AR, Yuan H, Probst R, Nolte S, Song J. Parametric Optimization
    of Connectors by means of Coupled Simulation. In: Tagungsband der VDE/VDI-GMM-Fachtagung
    „Symposium Connectors“. Lemgo; 2021. p. 28–43.'
conference:
  location: Lemgo
  name: VDE/VDI-GMM-Fachtagung „Symposium Connectors“
date_created: 2021-09-15T12:53:41Z
date_updated: 2023-03-15T13:50:05Z
department:
- _id: DEP6012
language:
- iso: eng
page: 28 - 43
place: Lemgo
publication: Tagungsband der VDE/VDI-GMM-Fachtagung „Symposium Connectors“
status: public
title: Parametric Optimization of Connectors by means of Coupled Simulation
type: conference
user_id: '74004'
year: 2021
...
---
_id: '6324'
author:
- first_name: Haomiao
  full_name: Yuan, Haomiao
  id: '61860'
  last_name: Yuan
- first_name: Dirk
  full_name: Hilmert, Dirk
  id: '74212'
  last_name: Hilmert
- first_name: Abhay Rammurti
  full_name: Shukla, Abhay Rammurti
  id: '74188'
  last_name: Shukla
- first_name: Jian
  full_name: Song, Jian
  id: '5297'
  last_name: Song
citation:
  ama: 'Yuan H, Hilmert D, Shukla AR, Song J. Effect of Direction of Motion on Fretting
    Corrosion Behaviour. In: <i>Proceedings of the 66th IEEE Holm Conference on Electrical
    Contacts</i>. ; 2020.'
  apa: Yuan, H., Hilmert, D., Shukla, A. R., &#38; Song, J. (2020). Effect of Direction
    of Motion on Fretting Corrosion Behaviour. In <i>Proceedings of the 66th IEEE
    Holm Conference on Electrical Contacts</i>.
  bjps: <b>Yuan H <i>et al.</i></b> (2020) Effect of Direction of Motion on Fretting
    Corrosion Behaviour. <i>Proceedings of the 66th IEEE Holm Conference on Electrical
    Contacts</i>.
  chicago: Yuan, Haomiao, Dirk Hilmert, Abhay Rammurti Shukla, and Jian Song. “Effect
    of Direction of Motion on Fretting Corrosion Behaviour.” In <i>Proceedings of
    the 66th IEEE Holm Conference on Electrical Contacts</i>, 2020.
  chicago-de: 'Yuan, Haomiao, Dirk Hilmert, Abhay Rammurti Shukla und Jian Song. 2020.
    Effect of Direction of Motion on Fretting Corrosion Behaviour. In: <i>Proceedings
    of the 66th IEEE Holm Conference on Electrical Contacts</i>.'
  din1505-2-1: '<span style="font-variant:small-caps;">Yuan, Haomiao</span> ; <span
    style="font-variant:small-caps;">Hilmert, Dirk</span> ; <span style="font-variant:small-caps;">Shukla,
    Abhay Rammurti</span> ; <span style="font-variant:small-caps;">Song, Jian</span>:
    Effect of Direction of Motion on Fretting Corrosion Behaviour. In: <i>Proceedings
    of the 66th IEEE Holm Conference on Electrical Contacts</i>, 2020'
  havard: 'H. Yuan, D. Hilmert, A.R. Shukla, J. Song, Effect of Direction of Motion
    on Fretting Corrosion Behaviour, in: Proceedings of the 66th IEEE Holm Conference
    on Electrical Contacts, 2020.'
  ieee: H. Yuan, D. Hilmert, A. R. Shukla, and J. Song, “Effect of Direction of Motion
    on Fretting Corrosion Behaviour,” in <i>Proceedings of the 66th IEEE Holm Conference
    on Electrical Contacts</i>, 2020.
  mla: Yuan, Haomiao, et al. “Effect of Direction of Motion on Fretting Corrosion
    Behaviour.” <i>Proceedings of the 66th IEEE Holm Conference on Electrical Contacts</i>,
    2020.
  short: 'H. Yuan, D. Hilmert, A.R. Shukla, J. Song, in: Proceedings of the 66th IEEE
    Holm Conference on Electrical Contacts, 2020.'
  ufg: '<b>Yuan, Haomiao et. al. (2020)</b>: Effect of Direction of Motion on Fretting
    Corrosion Behaviour, in: <i>Proceedings of the 66th IEEE Holm Conference on Electrical
    Contacts</i>.'
  van: 'Yuan H, Hilmert D, Shukla AR, Song J. Effect of Direction of Motion on Fretting
    Corrosion Behaviour. In: Proceedings of the 66th IEEE Holm Conference on Electrical
    Contacts. 2020.'
conference:
  name: 66th IEEE Holm Conference on Electrical Contacts
date_created: 2021-09-16T08:13:06Z
date_updated: 2023-03-15T13:50:05Z
department:
- _id: DEP6012
language:
- iso: eng
publication: Proceedings of the 66th IEEE Holm Conference on Electrical Contacts
status: public
title: Effect of Direction of Motion on Fretting Corrosion Behaviour
type: conference
user_id: '74004'
year: 2020
...
---
_id: '6310'
author:
- first_name: Jian
  full_name: Song, Jian
  id: '5297'
  last_name: Song
- first_name: Haomiao
  full_name: Yuan, Haomiao
  id: '61860'
  last_name: Yuan
- first_name: Abhay Rammurti
  full_name: Shukla, Abhay Rammurti
  id: '74188'
  last_name: Shukla
citation:
  ama: 'Song J, Yuan H, Shukla AR. Wear and fretting corrosion of coatings of electrical
    contacts - Some new aspects. In: <i>Proceedings of 15th Arnold Tross Colloquium</i>.
    Hamburg; 2019.'
  apa: Song, J., Yuan, H., &#38; Shukla, A. R. (2019). Wear and fretting corrosion
    of coatings of electrical contacts - Some new aspects. In <i>Proceedings of 15th
    Arnold Tross Colloquium</i>. Hamburg.
  bjps: <b>Song J, Yuan H and Shukla AR</b> (2019) Wear and Fretting Corrosion of
    Coatings of Electrical Contacts - Some New Aspects. <i>Proceedings of 15th Arnold
    Tross Colloquium</i>. Hamburg.
  chicago: Song, Jian, Haomiao Yuan, and Abhay Rammurti Shukla. “Wear and Fretting
    Corrosion of Coatings of Electrical Contacts - Some New Aspects.” In <i>Proceedings
    of 15th Arnold Tross Colloquium</i>. Hamburg, 2019.
  chicago-de: 'Song, Jian, Haomiao Yuan und Abhay Rammurti Shukla. 2019. Wear and
    fretting corrosion of coatings of electrical contacts - Some new aspects. In:
    <i>Proceedings of 15th Arnold Tross Colloquium</i>. Hamburg.'
  din1505-2-1: '<span style="font-variant:small-caps;">Song, Jian</span> ; <span style="font-variant:small-caps;">Yuan,
    Haomiao</span> ; <span style="font-variant:small-caps;">Shukla, Abhay Rammurti</span>:
    Wear and fretting corrosion of coatings of electrical contacts - Some new aspects.
    In: <i>Proceedings of 15th Arnold Tross Colloquium</i>. Hamburg, 2019'
  havard: 'J. Song, H. Yuan, A.R. Shukla, Wear and fretting corrosion of coatings
    of electrical contacts - Some new aspects, in: Proceedings of 15th Arnold Tross
    Colloquium, Hamburg, 2019.'
  ieee: J. Song, H. Yuan, and A. R. Shukla, “Wear and fretting corrosion of coatings
    of electrical contacts - Some new aspects,” in <i>Proceedings of 15th Arnold Tross
    Colloquium</i>, Hamburg, 2019.
  mla: Song, Jian, et al. “Wear and Fretting Corrosion of Coatings of Electrical Contacts
    - Some New Aspects.” <i>Proceedings of 15th Arnold Tross Colloquium</i>, 2019.
  short: 'J. Song, H. Yuan, A.R. Shukla, in: Proceedings of 15th Arnold Tross Colloquium,
    Hamburg, 2019.'
  ufg: '<b>Song, Jian et. al. (2019)</b>: Wear and fretting corrosion of coatings
    of electrical contacts - Some new aspects, in: <i>Proceedings of 15th Arnold Tross
    Colloquium</i>, Hamburg.'
  van: 'Song J, Yuan H, Shukla AR. Wear and fretting corrosion of coatings of electrical
    contacts - Some new aspects. In: Proceedings of 15th Arnold Tross Colloquium.
    Hamburg; 2019.'
conference:
  location: Hamburg
  name: 15th Arnold Tross Colloquium
date_created: 2021-09-15T12:29:26Z
date_updated: 2023-03-15T13:50:05Z
department:
- _id: DEP6012
language:
- iso: eng
place: Hamburg
publication: Proceedings of 15th Arnold Tross Colloquium
status: public
title: Wear and fretting corrosion of coatings of electrical contacts - Some new aspects
type: conference
user_id: '74004'
year: 2019
...
---
_id: '6326'
author:
- first_name: Jian
  full_name: Song, Jian
  id: '5297'
  last_name: Song
- first_name: Haomiao
  full_name: Yuan, Haomiao
  id: '61860'
  last_name: Yuan
- first_name: Abhay Rammurti
  full_name: Shukla, Abhay Rammurti
  id: '74188'
  last_name: Shukla
- first_name: Christian
  full_name: Koch, Christian
  last_name: Koch
- first_name: Dirk
  full_name: Hilmert, Dirk
  id: '74212'
  last_name: Hilmert
citation:
  ama: 'Song J, Yuan H, Shukla AR, Koch C, Hilmert D. Correlation of connector contact
    failures in accelerated testing and in long-term use field vehicles. In: <i>Proceedings
    of the 65th IEEE Holm Conference on Electrical Contacts</i>. ; 2019.'
  apa: Song, J., Yuan, H., Shukla, A. R., Koch, C., &#38; Hilmert, D. (2019). Correlation
    of connector contact failures in accelerated testing and in long-term use field
    vehicles. In <i>Proceedings of the 65th IEEE Holm Conference on Electrical Contacts</i>.
    Milwaukee.
  bjps: <b>Song J <i>et al.</i></b> (2019) Correlation of Connector Contact Failures
    in Accelerated Testing and in Long-Term Use Field Vehicles. <i>Proceedings of
    the 65th IEEE Holm Conference on Electrical Contacts</i>.
  chicago: Song, Jian, Haomiao Yuan, Abhay Rammurti Shukla, Christian Koch, and Dirk
    Hilmert. “Correlation of Connector Contact Failures in Accelerated Testing and
    in Long-Term Use Field Vehicles.” In <i>Proceedings of the 65th IEEE Holm Conference
    on Electrical Contacts</i>, 2019.
  chicago-de: 'Song, Jian, Haomiao Yuan, Abhay Rammurti Shukla, Christian Koch und
    Dirk Hilmert. 2019. Correlation of connector contact failures in accelerated testing
    and in long-term use field vehicles. In: <i>Proceedings of the 65th IEEE Holm
    Conference on Electrical Contacts</i>.'
  din1505-2-1: '<span style="font-variant:small-caps;">Song, Jian</span> ; <span style="font-variant:small-caps;">Yuan,
    Haomiao</span> ; <span style="font-variant:small-caps;">Shukla, Abhay Rammurti</span>
    ; <span style="font-variant:small-caps;">Koch, Christian</span> ; <span style="font-variant:small-caps;">Hilmert,
    Dirk</span>: Correlation of connector contact failures in accelerated testing
    and in long-term use field vehicles. In: <i>Proceedings of the 65th IEEE Holm
    Conference on Electrical Contacts</i>, 2019'
  havard: 'J. Song, H. Yuan, A.R. Shukla, C. Koch, D. Hilmert, Correlation of connector
    contact failures in accelerated testing and in long-term use field vehicles, in:
    Proceedings of the 65th IEEE Holm Conference on Electrical Contacts, 2019.'
  ieee: J. Song, H. Yuan, A. R. Shukla, C. Koch, and D. Hilmert, “Correlation of connector
    contact failures in accelerated testing and in long-term use field vehicles,”
    in <i>Proceedings of the 65th IEEE Holm Conference on Electrical Contacts</i>,
    Milwaukee, 2019.
  mla: Song, Jian, et al. “Correlation of Connector Contact Failures in Accelerated
    Testing and in Long-Term Use Field Vehicles.” <i>Proceedings of the 65th IEEE
    Holm Conference on Electrical Contacts</i>, 2019.
  short: 'J. Song, H. Yuan, A.R. Shukla, C. Koch, D. Hilmert, in: Proceedings of the
    65th IEEE Holm Conference on Electrical Contacts, 2019.'
  ufg: '<b>Song, Jian et. al. (2019)</b>: Correlation of connector contact failures
    in accelerated testing and in long-term use field vehicles, in: <i>Proceedings
    of the 65th IEEE Holm Conference on Electrical Contacts</i>.'
  van: 'Song J, Yuan H, Shukla AR, Koch C, Hilmert D. Correlation of connector contact
    failures in accelerated testing and in long-term use field vehicles. In: Proceedings
    of the 65th IEEE Holm Conference on Electrical Contacts. 2019.'
conference:
  location: Milwaukee
  name: 65th IEEE Holm Conference on Electrical Contacts
date_created: 2021-09-16T08:13:06Z
date_updated: 2023-03-15T13:50:05Z
department:
- _id: DEP6012
language:
- iso: eng
publication: Proceedings of the 65th IEEE Holm Conference on Electrical Contacts
status: public
title: Correlation of connector contact failures in accelerated testing and in long-term
  use field vehicles
type: conference
user_id: '74004'
year: 2019
...